TWM545048U - Glue-free tape - Google Patents
Glue-free tape Download PDFInfo
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- TWM545048U TWM545048U TW106204533U TW106204533U TWM545048U TW M545048 U TWM545048 U TW M545048U TW 106204533 U TW106204533 U TW 106204533U TW 106204533 U TW106204533 U TW 106204533U TW M545048 U TWM545048 U TW M545048U
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- Prior art keywords
- adhesive tape
- film
- tape
- side wall
- wafer
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- 238000005411 Van der Waals force Methods 0.000 claims abstract description 6
- 239000002390 adhesive tape Substances 0.000 claims description 67
- 239000000853 adhesive Substances 0.000 claims description 8
- 230000001070 adhesive effect Effects 0.000 claims description 8
- 239000007788 liquid Substances 0.000 description 18
- 238000000034 method Methods 0.000 description 12
- 239000004065 semiconductor Substances 0.000 description 11
- 239000013078 crystal Substances 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000013007 heat curing Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
Landscapes
- Adhesive Tapes (AREA)
Abstract
Description
本創作係相關於一種無膠膠帶,尤指一種貼附於晶圓以提高半導體製造良率的無膠膠帶。This creation is related to a non-adhesive tape, especially a glue-free tape that is attached to a wafer to increase the yield of semiconductor manufacturing.
在半導體製造方法中,為了將晶圓薄化,會對晶圓進行晶背研磨製程。一般而言,習知的晶背研磨製程是先將膠帶貼附於晶圓正面,之後再對晶圓背面進行研磨。當晶圓背面研磨完成後,晶圓正面上的膠帶會被移除以進行後續的晶圓切割製程。為了避免膠帶於晶圓正面上遺留殘膠而影響晶圓正面上形成之積體電路的良率,先前技術會利用無膠膠帶貼附於晶圓正面上以進行晶背研磨製程。無膠膠帶的表面上具有複數個奈米級凸起結構用以和晶圓正面之間產生凡得瓦力,以使無膠膠帶能貼附於晶圓正面。然而,無膠膠帶上的複數個凸起結構之間具有間隙,這些間隙使得無膠膠帶貼附於晶圓後可能有異物或液體進入無膠膠帶與晶圓之間,進而影響晶圓正面上形成之積體電路的功能,降低了半導體製程的生產良率。In the semiconductor manufacturing method, in order to thin the wafer, the wafer is subjected to a crystal back polishing process. In general, the conventional crystal back grinding process first attaches the tape to the front side of the wafer, and then grinds the back side of the wafer. After the backside polishing of the wafer is completed, the tape on the front side of the wafer is removed for subsequent wafer dicing. In order to avoid the adhesive residue on the front side of the wafer and affect the yield of the integrated circuit formed on the front side of the wafer, the prior art uses a non-adhesive tape attached to the front side of the wafer for the crystal back grinding process. The adhesive-free tape has a plurality of nano-scale raised structures on the surface to create a van der Waals force between the front side of the wafer so that the adhesive-free tape can be attached to the front side of the wafer. However, there is a gap between the plurality of raised structures on the adhesive-free tape, and the gaps may cause foreign matter or liquid to enter between the adhesive-free tape and the wafer after the adhesive tape is attached to the wafer, thereby affecting the front surface of the wafer. The function of the integrated circuit formed reduces the production yield of the semiconductor process.
本創作之目的在於提供一種可防止液體以及異物進入的無膠膠帶,以解決先前技術的問題。The purpose of this creation is to provide a glue-free tape that prevents the entry of liquids and foreign matter to solve the problems of the prior art.
本創作無膠膠帶包含一薄膜、複數個凸起結構以及至少一側牆。該複數個凸起結構形成於該薄膜的表面,用以和一物體之表面接觸以產生凡得瓦力,而使該薄膜藉由凡得瓦力貼附於該物體之表面上。該至少一側牆形成於該薄膜的表面且圍繞該複數個凸起結構,用以於該薄膜和該物體之間形成一密閉空間。The adhesive tape of the present invention comprises a film, a plurality of raised structures and at least one side wall. The plurality of raised structures are formed on a surface of the film for contacting a surface of an object to generate a wattage force, such that the film is attached to the surface of the object by van der Waals. The at least one side wall is formed on the surface of the film and surrounds the plurality of raised structures for forming a confined space between the film and the object.
在本創作一實施例中,該至少一側牆是位於該薄膜的邊緣。In an embodiment of the present invention, the at least one side wall is located at an edge of the film.
在本創作一實施例中,該至少一側牆及該複數個凸起結構的高度比是介於1:0.8和1:1之間。In an embodiment of the present invention, the height ratio of the at least one side wall and the plurality of raised structures is between 1:0.8 and 1:1.
在本創作一實施例中,該薄膜和該側牆的總高度是介於50微米和75微米之間。In an embodiment of the present invention, the total height of the film and the sidewall is between 50 microns and 75 microns.
在本創作一實施例中,該複數個凸起結構的寬度與高度比是介於1:2和2:1之間。In an embodiment of the present invention, the width to height ratio of the plurality of raised structures is between 1:2 and 2:1.
在本創作一實施例中,該至少一側牆的寬度與高度比是介於1:2和2:1之間。In an embodiment of the present invention, the width to height ratio of the at least one side wall is between 1:2 and 2:1.
在本創作一實施例中,該複數個凸起結構的寬度與高度分別介於100奈米和1000奈米之間。In an embodiment of the present invention, the width and height of the plurality of raised structures are between 100 nm and 1000 nm, respectively.
在本創作一實施例中,該至少一側牆的寬度與高度分別介於100奈米和1000奈米之間。In an embodiment of the present invention, the width and height of the at least one side wall are between 100 nm and 1000 nm, respectively.
在本創作一實施例中,該複數個凸起結構的底部之間的間隔是介於0奈米和2000奈米之間。In an embodiment of the present invention, the spacing between the bottoms of the plurality of raised structures is between 0 nm and 2000 nm.
在本創作一實施例中,該複數個凸起結構與該至少一側牆的底部之間的間隔是介於0奈米和2000奈米之間。In an embodiment of the present invention, the spacing between the plurality of raised structures and the bottom of the at least one side wall is between 0 nm and 2000 nm.
在本創作一實施例中,該無膠膠帶係包含複數個側牆形成於該薄膜的表面且圍繞該複數個凸起結構,其中該複數個側牆的底部之間的間隔是介於0奈米和2000奈米之間。In an embodiment of the present invention, the adhesive tape comprises a plurality of side walls formed on a surface of the film and surrounding the plurality of raised structures, wherein a spacing between the bottoms of the plurality of side walls is between 0 Between m and 2000 nm.
在本創作一實施例中,該無膠膠帶不包含黏著劑且該無膠膠帶之表面未施加黏著劑。In an embodiment of the present invention, the adhesive tape does not contain an adhesive and the adhesive is not applied to the surface of the adhesive tape.
相較於先前技術,本創作無膠膠帶是利用薄膜上之側牆圍繞凸起結構以使薄膜與所貼附的物體之間形成一密閉空間,因此本創作無膠膠帶可以防止液體及異物進入無膠膠帶與該物體表面之間。另外,當本創作無膠膠帶用於半導體製程時,無膠膠帶可藉由薄膜之凸起結構和晶圓表面之間的凡得瓦力將薄膜貼附於晶圓表面以固定晶圓。薄膜之側牆用以和晶圓表面之間會形成一密閉空間,以防止液體及異物進入。當無膠膠帶貼附於晶圓正面以進行晶背研磨製程時,可以使晶圓正面上形成之積體電路的功能不會受到液體或異物附著的影響,進而提高了半導體裝置的生產良率;當無膠膠帶貼附於晶圓背面以進行晶圓切割製程時,可以使晶圓背面不會受到液體或異物附著的影響,因此在積體電路被封裝材料封裝時,不會因背面附著液體或異物而影響封裝材料和積體電路之間的接合狀態,進而提高了半導體裝置的封裝品質。Compared with the prior art, the present adhesive tape is formed by using a side wall on the film to surround the convex structure to form a sealed space between the film and the attached object. Therefore, the present adhesive tape can prevent liquid and foreign matter from entering. There is no adhesive tape between the surface of the object. In addition, when the present adhesive tape is used in a semiconductor process, the adhesive tape can be used to fix the wafer by attaching the film to the wafer surface by the vanishing force between the convex structure of the film and the surface of the wafer. The side wall of the film forms a confined space with the surface of the wafer to prevent liquid and foreign matter from entering. When the adhesive tape is attached to the front side of the wafer for the crystal back grinding process, the function of the integrated circuit formed on the front side of the wafer can be prevented from being affected by the adhesion of liquid or foreign matter, thereby improving the production yield of the semiconductor device. When the adhesive tape is attached to the back side of the wafer for the wafer dicing process, the back surface of the wafer can be prevented from being affected by the adhesion of liquid or foreign matter, so that the integrated circuit is not attached to the back surface when it is packaged by the package material. The liquid or foreign matter affects the bonding state between the package material and the integrated circuit, thereby improving the package quality of the semiconductor device.
請同時參考第1圖至第3圖,第1圖是本創作無膠膠帶的第一實施例的示意圖。第2圖是本創作無膠膠帶的第一實施例的局部示意圖。第3圖是沿第1圖的A-A線的剖面圖。如圖所示,本創作無膠膠帶100包含一薄膜102、複數個第一凸起結構104以及至少一側牆106。複數個第一凸起結構104是形成於薄膜102的表面,用以和一物體之表面(例如晶圓的表面)接觸以產生凡得瓦力,進而使薄膜102藉由凡得瓦力貼附於該物體之表面上。側牆106是一連續牆體形成於薄膜102的表面且圍繞複數個第一凸起結構104。在本實施例中,無膠膠帶100包含二側牆106,且側牆106位於薄膜102的邊緣,但本創作不以此為限。側牆106的位置及數量可以依據需求而調整。當無膠膠帶100被貼附於該物體之表面上時,側牆106會直接接觸該物體之表面,並用以於薄膜102和該物體之間形成一密閉空間,以避免液體及異物經由複數個第一凸起結構104之間的空隙進入,進而達到使無膠膠帶100與所貼附的表面之間防止液體以及異物進入的功效。Please refer to FIG. 1 to FIG. 3 at the same time. FIG. 1 is a schematic view of the first embodiment of the present adhesive tape. Fig. 2 is a partial schematic view showing the first embodiment of the present adhesive tape. Fig. 3 is a cross-sectional view taken along line A-A of Fig. 1. As shown, the present adhesive tape 100 includes a film 102, a plurality of first raised structures 104, and at least one side wall 106. A plurality of first raised structures 104 are formed on the surface of the film 102 for contacting a surface of an object (such as the surface of the wafer) to generate a wattage force, thereby causing the film 102 to be attached by van der Waals force. On the surface of the object. The side wall 106 is a continuous wall formed on the surface of the film 102 and surrounding a plurality of first raised structures 104. In the present embodiment, the glue-free tape 100 includes two side walls 106, and the side wall 106 is located at the edge of the film 102, but the present invention is not limited thereto. The position and number of side walls 106 can be adjusted as needed. When the adhesive tape 100 is attached to the surface of the object, the side wall 106 directly contacts the surface of the object, and is used to form a sealed space between the film 102 and the object to prevent liquid and foreign matter from passing through a plurality of The gap between the first raised structures 104 enters, thereby achieving the effect of preventing liquid and foreign matter from entering between the glueless tape 100 and the attached surface.
依據上述配置,當本創作無膠膠帶100用於半導體製程時,由於無膠膠帶100是利用第一凸起結構104產生的凡得瓦力貼附於晶圓的表面,故無膠膠帶100不需包含黏著劑,且無膠膠帶100之表面亦不需要施加黏著劑,因此在移除貼附於晶圓的無膠膠帶100時不會有黏著劑殘留於晶圓表面上。另一方面,側牆106用以接觸晶圓表面之表面是一平面且不包含缺角,如此可以於薄膜102和晶圓表面之間形成一密閉空間,以避免液體及異物進入無膠膠帶100與晶圓表面之間的間隙,使貼附無膠膠帶的晶圓表面在進行半導體製程(例如晶背研磨及/或晶圓切割等製程)時達到防止液體以及異物進入的功效。According to the above configuration, when the adhesive tape 100 is used for the semiconductor process, since the adhesive tape 100 is attached to the surface of the wafer by the van der Waals force generated by the first convex structure 104, the adhesive tape 100 is not Adhesives need to be included, and no adhesive is applied to the surface of the adhesive-free tape 100. Therefore, no adhesive remains on the wafer surface when the adhesive-free tape 100 attached to the wafer is removed. On the other hand, the surface of the sidewall 106 for contacting the surface of the wafer is a flat surface and does not include a corner, so that a sealed space can be formed between the film 102 and the surface of the wafer to prevent liquid and foreign matter from entering the adhesive-free tape 100. The gap between the surface of the wafer and the surface of the wafer is such that the surface of the wafer to which the adhesive tape is attached is used to prevent liquid and foreign matter from entering the semiconductor process (for example, a process such as crystal back grinding and/or wafer cutting).
在本創作第一實施例中,複數個第一凸起結構104的寬度W1與高度H1以及側牆106的寬度W2與高度H2是小於1微米,例如介於100奈米和1000奈米之間。複數個第一凸起結構104之間的間隔D1、複數個第一凸起結構104與側牆106之間的間隔D2、以及兩側牆106之間的間隔D3都是小於2微米,例如介於0奈米和2000奈米之間。複數個第一凸起結構104的寬度W1與高度H1的比是介於1:2和2:1之間。側牆106的寬度W2與高度H2的比亦是介於1:2和2:1之間。薄膜102和側牆106的總高度H3可以是介於50微米和75微米之間,且側牆106的高度H2及複數個第一凸起結構104的高度H1的比可以是介於1:0.8和1:1之間。In the first embodiment of the present invention, the widths W1 and H1 of the plurality of first raised structures 104 and the widths W2 and H2 of the side walls 106 are less than 1 micrometer, for example between 100 nanometers and 1000 nanometers. . The interval D1 between the plurality of first protruding structures 104, the interval D2 between the plurality of first protruding structures 104 and the side walls 106, and the interval D3 between the side walls 106 are both less than 2 micrometers, for example, Between 0 nm and 2000 nm. The ratio of the width W1 of the plurality of first raised structures 104 to the height H1 is between 1:2 and 2:1. The ratio of the width W2 of the side wall 106 to the height H2 is also between 1:2 and 2:1. The total height H3 of the film 102 and the side wall 106 may be between 50 micrometers and 75 micrometers, and the ratio of the height H2 of the side wall 106 and the height H1 of the plurality of first convex structures 104 may be 1:0.8. Between 1:1.
請參考第4圖,第4圖是本創作無膠膠帶的第一實施例的另一配置的剖面圖。如圖所示,當複數個第一凸起結構104之間的間隔為0奈米時,複數個第一凸起結構104的底部相連接。當複數個第一凸起結構104與側牆106之間的間隔為0奈米時,相鄰於側牆106的第一凸起結構104的底部與側牆106的底部相連接。另外,當兩側牆106之間的間隔為0奈米時,兩側牆106可形成有一V型(或U型)間隙使得兩側牆的底部相連接。Please refer to FIG. 4, which is a cross-sectional view showing another configuration of the first embodiment of the present adhesive tape. As shown, when the interval between the plurality of first raised structures 104 is 0 nm, the bottoms of the plurality of first raised structures 104 are connected. When the interval between the plurality of first protruding structures 104 and the side walls 106 is 0 nm, the bottom of the first protruding structures 104 adjacent to the side walls 106 is connected to the bottom of the side walls 106. In addition, when the interval between the side walls 106 is 0 nm, the side walls 106 may be formed with a V-shaped (or U-shaped) gap so that the bottoms of the side walls are connected.
請參考第5圖,第5圖是本創作無膠膠帶的第二實施例的局部示意圖。如圖所示,本創作第二實施例的無膠膠帶200包含一薄膜102、複數個第二凸起結構204以及至少一側牆106。本創作第二實施例的無膠膠帶200與本創作第一實施例的無膠膠帶100類似,差別在於本創作第二實施例的無膠膠帶200的第二凸起結構204與無膠膠帶100的第一凸起結構104不同。無膠膠帶100的第一凸起結構104是圓錐狀凸起結構,而無膠膠帶200的第二凸起結構204是沿同一方向延伸的三角形凸起結構。另外,無膠膠帶200的複數個第二凸起結構204以及側牆106的寬度、高度以及間隔的範圍及比例均與無膠膠帶100相同,在此不再加以說明。Please refer to FIG. 5, which is a partial schematic view of a second embodiment of the present adhesive tape. As shown, the glueless tape 200 of the second embodiment of the present invention comprises a film 102, a plurality of second raised structures 204, and at least one side wall 106. The glueless tape 200 of the second embodiment of the present invention is similar to the glueless tape 100 of the first embodiment of the present invention, with the difference that the second raised structure 204 of the glueless tape 200 of the second embodiment of the present invention is different from the adhesive tape 100. The first raised structure 104 is different. The first raised structure 104 of the adhesive tape 100 is a conical convex structure, and the second raised structure 204 of the adhesive tape 200 is a triangular convex structure extending in the same direction. In addition, the width, height, and spacing of the plurality of second protruding structures 204 and the side walls 106 of the adhesive tape 200 are the same as those of the adhesive tape 100, and will not be described here.
請參考第6圖,第6圖是本創作無膠膠帶的第三實施例的局部示意圖。如圖所示,本創作第三實施例的無膠膠帶300包含一薄膜102、複數個第三凸起結構304以及至少一側牆106。本創作第三實施例的無膠膠帶300與本創作第二實施例的無膠膠帶200類似,差別在於本創作第三實施例的無膠膠帶300的複數個第三凸起結構304與無膠膠帶200的第二凸起結構204不同。無膠膠帶200的第二凸起結構204的剖面為三角形,而無膠膠帶300的第三凸起結構304的剖面為正弦波形。另外,無膠膠帶300的複數個第三凸起結構304以及側牆106的寬度、高度以及間隔的範圍及比例均與無膠膠帶100相同,在此不再加以說明。Please refer to FIG. 6, which is a partial schematic view of a third embodiment of the present adhesive tape. As shown, the adhesive tape 300 of the third embodiment of the present invention comprises a film 102, a plurality of third raised structures 304, and at least one side wall 106. The glue-free tape 300 of the third embodiment of the present invention is similar to the glue-free tape 200 of the second embodiment of the present invention, with the difference that the plurality of third protrusion structures 304 of the glueless tape 300 of the third embodiment of the present invention are glue-free. The second raised structure 204 of the tape 200 is different. The second raised structure 204 of the adhesive tape 200 has a triangular cross section, and the third raised structure 304 of the adhesive tape 300 has a sinusoidal cross section. In addition, the range and ratio of the width, height, and spacing of the plurality of third protruding structures 304 and the side walls 106 of the adhesive tape 300 are the same as those of the adhesive tape 100, and will not be described here.
請參考第7圖,第7圖是本創作無膠膠帶的第四實施例的局部示意圖。如圖所示,本創作第四實施例的無膠膠帶400包含一薄膜102、複數個第四凸起結構404以及至少一側牆106。本創作第四實施例的無膠膠帶400的複數個第四凸起結構404包含複數個沿縱向及橫向延伸和交錯的凸起結構404a、404b,且凸起結構404a、404b的剖面為矩形。其中,無膠膠帶400的複數個第四凸起結構404以及側牆106的寬度、高度以及間隔的範圍及比例均與無膠膠帶100相同(由於複數個第四凸起結構404包含複數個縱向凸起結構404a以及複數個橫向凸起結構404b,因此凸起結構的間隔D1同時代表兩相鄰縱向凸起結構404a之間的間隔,以及代表兩相鄰橫向凸起結構404b之間的間隔),在此不再加以說明。Please refer to FIG. 7, which is a partial schematic view of a fourth embodiment of the present adhesive tape. As shown, the adhesive tape 400 of the fourth embodiment of the present invention comprises a film 102, a plurality of fourth raised structures 404, and at least one side wall 106. The plurality of fourth protruding structures 404 of the adhesive tape 400 of the fourth embodiment of the present invention comprise a plurality of convex structures 404a, 404b extending and staggered in the longitudinal direction and the lateral direction, and the convex structures 404a, 404b have a rectangular cross section. The width, height, and spacing of the plurality of fourth raised structures 404 and the side walls 106 of the adhesive tape 400 are the same as those of the adhesive tape 100 (since the plurality of fourth raised structures 404 include a plurality of longitudinal shapes) The raised structure 404a and the plurality of lateral raised structures 404b, such that the spacing D1 of the raised structures simultaneously represents the spacing between two adjacent longitudinal raised structures 404a and represents the spacing between two adjacent lateral raised structures 404b) , will not be explained here.
請參考第8圖,第8圖是本創作無膠膠帶的第五實施例的俯視圖。如圖所示,本創作第五實施例的無膠膠帶500的複數個第五凸起結構504包含複數個同心圓凸起結構504a以及複數個輻射狀配置的直線凸起結構504b。在本實施例中,同心圓凸起結構504a也可視為一側牆並用以於薄膜102和物體之間形成一密閉空間。另外,無膠膠帶500的複數個第五凸起結構504以及側牆106的寬度、高度以及間隔的範圍及比例均與無膠膠帶100相同(由於複數個第五凸起結構504包含複數個同心圓凸起結構504a以及複數個直線凸起結構504b,因此凸起結構的間隔D1同時代表兩相鄰同心圓凸起結構504a之間的間隔,以及代表兩相鄰直線凸起結構504b之間的最小間隔),在此不再加以說明。Please refer to Fig. 8. Fig. 8 is a plan view showing a fifth embodiment of the present adhesive tape. As shown, the plurality of fifth raised structures 504 of the glueless tape 500 of the fifth embodiment of the present invention comprise a plurality of concentric convex structures 504a and a plurality of radially disposed linear raised structures 504b. In the present embodiment, the concentric convex structure 504a can also be regarded as a side wall and used to form a closed space between the film 102 and the object. In addition, the width, height, and spacing of the plurality of fifth raised structures 504 and the side walls 106 of the adhesive tape 500 are the same as those of the adhesive tape 100 (since the plurality of fifth raised structures 504 include a plurality of concentricities) The circular convex structure 504a and the plurality of linear convex structures 504b, so that the interval D1 of the convex structure simultaneously represents the interval between two adjacent concentric convex structures 504a, and represents between the two adjacent linear convex structures 504b. Minimum interval), will not be described here.
另一方面,本創作無膠膠帶100、200、300、400、500可以是利用模具壓印於液態樹脂,並利用光或熱固化液態樹脂而形成,但本創作不以此為限。再者,上述第一至第五凸起結構104、204、304、404、504的形狀(或剖面)及配置只是舉例,本創作凸起結構的形狀(或剖面)及配置不限於上述實施例。On the other hand, the present adhesive-free tapes 100, 200, 300, 400, and 500 may be formed by imprinting on a liquid resin using a mold and using a light or heat-curing liquid resin, but the present invention is not limited thereto. Furthermore, the shapes (or cross sections) and configurations of the first to fifth convex structures 104, 204, 304, 404, and 504 are merely examples, and the shape (or cross section) and configuration of the present convex structure are not limited to the above embodiments. .
相較於先前技術,本創作無膠膠帶是利用薄膜上之側牆圍繞凸起結構以使薄膜與所貼附的物體之間形成一密閉空間,因此當本創作無膠膠帶可以防止液體及異物進入無膠膠帶與該物體表面之間。另外,當本創作無膠膠帶用於半導體製程時,無膠膠帶可藉由薄膜之凸起結構和晶圓表面之間的凡得瓦力將薄膜貼附於晶圓表面以固定晶圓。薄膜之側牆和晶圓表面之間會形成一密閉空間,以防止液體及異物進入。當無膠膠帶貼附於晶圓正面以進行晶背研磨製程時,可以保護晶圓正面之積體電路,使其不會受到液體或異物附著的影響,進而提高了半導體裝置的生產良率;當無膠膠帶貼附於晶圓背面以進行晶圓切割製程時,可以使晶圓背面不會受到液體或異物附著的影響,因此在積體電路被封裝材料封裝時,不會因背面附著液體或異物而影響封裝材料和積體電路之間的接合狀態,進而提高了半導體裝置的封裝品質。Compared with the prior art, the present adhesive tape is formed by using a side wall on the film to surround the convex structure to form a sealed space between the film and the attached object, so that the present adhesive tape can prevent liquid and foreign matter. Enter the gap between the adhesive tape and the surface of the object. In addition, when the present adhesive tape is used in a semiconductor process, the adhesive tape can be used to fix the wafer by attaching the film to the wafer surface by the vanishing force between the convex structure of the film and the surface of the wafer. A confined space is formed between the side wall of the film and the surface of the wafer to prevent liquid and foreign matter from entering. When the adhesive tape is attached to the front side of the wafer for the crystal back grinding process, the integrated circuit on the front side of the wafer can be protected from liquid or foreign matter adhesion, thereby improving the production yield of the semiconductor device; When the adhesive tape is attached to the back side of the wafer for the wafer dicing process, the back surface of the wafer can be prevented from being affected by the adhesion of liquid or foreign matter. Therefore, when the integrated circuit is packaged by the package material, the liquid is not attached to the back surface. Or foreign matter affects the bonding state between the package material and the integrated circuit, thereby improving the package quality of the semiconductor device.
100,200,300,400,500‧‧‧無膠膠帶
102‧‧‧薄膜
104‧‧‧第一凸起結構
106‧‧‧側牆
204‧‧‧第二凸起結構
304‧‧‧第三凸起結構
404‧‧‧第四凸起結構
404a‧‧‧縱向凸起結構
404b‧‧‧橫向凸起結構
504‧‧‧第五凸起結構
504a‧‧‧同心圓凸起結構
504b‧‧‧直線凸起結構
H1,H2,H3‧‧‧高度
W1,W2‧‧‧寬度
D1,D2,D3‧‧‧間隔100,200,300,400,500‧‧‧No adhesive tape
102‧‧‧film
104‧‧‧First raised structure
106‧‧‧Side wall
204‧‧‧second raised structure
304‧‧‧3rd raised structure
404‧‧‧4th raised structure
404a‧‧‧Longitudinal raised structure
404b‧‧‧lateral raised structure
504‧‧‧5th raised structure
504a‧‧‧Concentric raised structure
504b‧‧‧Linear raised structure
H1, H2, H3‧‧‧ height
W1, W2‧‧‧ width
D1, D2, D3‧‧ ‧ interval
第1圖是本創作無膠膠帶的第一實施例的俯視圖。 第2圖是本創作無膠膠帶的第一實施例的局部示意圖。 第3圖是沿第1圖的A-A線的剖面圖。 第4圖是本創作無膠膠帶的第一實施例的另一配置的剖面圖。 第5圖是本創作無膠膠帶的第二實施例的局部示意圖。 第6圖是本創作無膠膠帶的第三實施例的局部示意圖。 第7圖是本創作無膠膠帶的第四實施例的局部示意圖。 第8圖是本創作無膠膠帶的第五實施例的俯視圖。Fig. 1 is a plan view showing a first embodiment of the present adhesive tape. Fig. 2 is a partial schematic view showing the first embodiment of the present adhesive tape. Fig. 3 is a cross-sectional view taken along line A-A of Fig. 1. Fig. 4 is a cross-sectional view showing another configuration of the first embodiment of the present adhesive tape. Figure 5 is a partial schematic view of a second embodiment of the present adhesive tape. Figure 6 is a partial schematic view of a third embodiment of the present adhesive tape. Figure 7 is a partial schematic view of a fourth embodiment of the present adhesive tape. Fig. 8 is a plan view showing a fifth embodiment of the present adhesive tape.
100‧‧‧無膠膠帶 100‧‧‧No adhesive tape
102‧‧‧薄膜 102‧‧‧film
104‧‧‧第一凸起結構 104‧‧‧First raised structure
106‧‧‧側牆 106‧‧‧Side wall
Claims (13)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW106204533U TWM545048U (en) | 2017-03-31 | 2017-03-31 | Glue-free tape |
| CN201720424757.2U CN206685362U (en) | 2017-03-31 | 2017-04-21 | Adhesive-free adhesive tape |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW106204533U TWM545048U (en) | 2017-03-31 | 2017-03-31 | Glue-free tape |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM545048U true TWM545048U (en) | 2017-07-11 |
Family
ID=60049368
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW106204533U TWM545048U (en) | 2017-03-31 | 2017-03-31 | Glue-free tape |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN206685362U (en) |
| TW (1) | TWM545048U (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102020004438A1 (en) * | 2020-07-23 | 2022-01-27 | Gottlieb Binder Gmbh & Co. Kg | fastening system |
-
2017
- 2017-03-31 TW TW106204533U patent/TWM545048U/en not_active IP Right Cessation
- 2017-04-21 CN CN201720424757.2U patent/CN206685362U/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN206685362U (en) | 2017-11-28 |
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