TWM473898U - Ultrasonic vibration uniforming equipment for wafer polishing slurry - Google Patents
Ultrasonic vibration uniforming equipment for wafer polishing slurry Download PDFInfo
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本創作此種晶圓研磨液超音波震勻設備,係提高震細粒相溶混合,提昇混勻品質,且能更快更節省混勻預定晶圓研磨稀釋液時間之新穎技術者。The creation of such a wafer polishing liquid ultrasonic oscillating device is a novel technique for improving the mixing and mixing of the fine particles, improving the mixing quality, and saving the time for mixing the predetermined wafer grinding diluent faster and more.
現在是微電子時代,很多電子產品因積體電路越發進展,而能做到極輕薄靈瓏小巧便於攜帶,然而,積體電路所需之晶片尺寸是透過講究的晶圓切割研磨做出,因此能對晶圓研磨的晶圓研磨液也必須非常精細講究,否則粗糙的磨製也會浪費很多晶圓材料,使晶片成本大增,也因此研磨晶圓的晶圓研磨液(晶圓研磨液為水性研磨漿液,二氧化矽,業界英文通稱為SLURRY)調配(調配即定量的晶圓研磨原液充份與定量的純水混合混酸)得宜,不使過稀無研磨效果或過濃得產生過量研磨,就非常重要,更由於晶圓研磨原液的比重很重,從晶圓研磨原液到預定拌成之稀釋晶圓研磨液,再送到研磨機的各個管路輸配送階段,靜置時間一久就會明顯地產生沉澱,使管路上層液體濃度比下層液體更濃,導致同批已混攪成之稀釋晶圓研磨液研磨效果不均勻,由此連帶對調配出定量後的充份混和作業也跟著要特別注重,不使供應液調配定量無誤後,卻因混拌不確實或混拌過久,而在同批出液量裏產生忽濃忽稀的缺點,所以業界均在拌成預 定晶圓研磨稀釋液前後流程中,使用循環功能與可防止沉澱的之機構進行運作之專用混拌設備實施拌勻。Nowadays, in the era of microelectronics, many electronic products are becoming more and more compact and easy to carry due to the development of integrated circuits. However, the wafer size required for integrated circuits is made by careful wafer cutting and polishing. The wafer polishing liquid that can grind the wafer must also be very delicate. Otherwise, the rough grinding will waste a lot of wafer material, which will increase the cost of the wafer, and thus the wafer polishing liquid (wafer polishing liquid) It is suitable for the aqueous slurry, cerium oxide, and the industry is known as SLURRY. It is suitable for mixing and quantifying the wafer grinding liquid with the pure water. It does not make the grinding effect too thick or excessive. Grinding is very important, and because the specific gravity of the wafer grinding stock is very heavy, from the wafer grinding stock solution to the predetermined mixing dilution of the wafer polishing liquid, it is sent to the various pipelines of the grinding machine for delivery and distribution, and the standing time is long. Precipitating will be apparent, so that the liquid concentration in the upper layer of the pipeline is more concentrated than that in the lower layer, resulting in uneven grinding effect of the diluted wafer slurry in the same batch. After the quantitative and sufficient mixing operation, it is also necessary to pay special attention to it. After the supply liquid is not quantitatively determined, the mixing is not true or the mixing is too long, and the shortcomings in the same batch of liquid are generated. , so the industry is mixing In the process before and after the wafer grinding and diluting solution, mix it with a special mixing device that operates with a circulation function and a mechanism that prevents precipitation.
習見拌勻出預定晶圓研磨稀釋液濃度的設備,如第一圖之葉片攪勻晶圓研磨液設備及周圍相關管路設備示意圖所示,該葉片攪勻晶圓研磨液拌設備10係以電動泵20帶動葉片30從底伸進攪拌槽40內中央,於攪拌槽40頂端分別管接外部純水量取筒50及晶圓研磨原液量取筒60送來純水、晶圓研磨原液之注入管70,71,復於攪拌槽40底設有出液管41向外串接過濾器80送往後續的晶圓研磨設備90,及預備出流回堵送回攪拌槽40內進行循環,預防輸送過程沉澱之回流管42所構成,每當預定比例份量的純水與晶圓研磨原液進入攪拌槽40,就啟動電動泵20帶動葉片30攪拌出均勻的預定晶圓研磨稀釋液濃度,然而此種構成,會造成以下數點缺失:The device for mixing the predetermined wafer grinding dilution concentration, as shown in the schematic diagram of the blade stirring slurry wafer polishing device and the surrounding related pipeline equipment in the first figure, the blade is evenly mixed with the wafer grinding liquid mixing device 10 The electric pump 20 drives the blade 30 to extend from the bottom into the center of the agitation tank 40, and respectively connects the external pure water amount take-up cylinder 50 and the wafer polishing raw liquid amount take-up cylinder 60 to the pure water and the wafer grinding stock solution at the top of the stirring tank 40. The tubes 70, 71 are disposed at the bottom of the agitation tank 40, and the outlet pipe 41 is connected to the filter 80 for the subsequent wafer polishing device 90, and the pre-exit flow is returned to the agitation tank 40 for circulation. The returning tube 42 is formed by the precipitation process. When a predetermined proportion of the pure water and the wafer grinding stock enter the stirring tank 40, the electric pump 20 is started to drive the blade 30 to agitate a uniform predetermined wafer grinding diluent concentration. The composition will result in the following missing points:
1.因葉片攪拌存在片緣沾黏、易沉會積亂流多、不利拌勻。1. Because the blade is agitated, the edge of the film is sticky, and it is easy to sink.
2.每次攪拌過程到送出通過過濾器費時約4~5小時,此時間仍然過長,加大晶圓研磨原液顆粒回復沉澱時機,影響晶圓研磨液攪拌品質。2. It takes about 4~5 hours for each stirring process to pass through the filter. This time is still too long, and the timing of the precipitation of the slurry grinding liquid particles is increased, which affects the mixing quality of the wafer polishing liquid.
3.電動泵帶動葉片伸進攪拌槽的結構相對複雜,且葉片直接觸攪圓研磨原液顆粒及水分子,使用一段時間後,不但葉緣會磨損,葉片也會產生微量彎翹變形,影響攪拌性能,得頻繁維修保養這些構件。3. The structure of the electric pump driving the blade into the agitation tank is relatively complicated, and the blade directly contacts the rounding and grinding of the raw liquid particles and water molecules. After using for a period of time, not only the edge of the leaf will wear, but also the blade will produce a slight bending deformation, which will affect the stirring. Performance, these components must be repaired frequently.
4.由於葉片攪拌均勻性差,並無法完全使晶圓研磨液快速混勻增長耐受出流回堵送回攪拌槽之循環時間,加上設備商會加入過濾器,將較大晶圓研磨液顆粒過濾,防止研磨晶片時受到大晶圓研磨液顆粒刮傷,在不具較長時耐受出流回堵送回攪拌槽之循環時間的情況下,必然使 受過濾攔截之大晶圓研磨液顆粒增多,不但是這些被除濾的晶圓研磨液顆粒不再有效用,形成空耗浪費,也會造成過濾器濾堵工作量大,濾芯提早全部阻塞全面堵流,得常常換新過濾器維持正常供應研磨晶圓之晶圓研磨液送流量,使得運作成本提高。4. Due to poor uniformity of blade agitation, it is not possible to completely mix the wafer slurry quickly and grow to withstand the circulation time of the flow back to the agitation tank, and the equipment supplier will add the filter to the larger wafer slurry particles. Filtration prevents the large wafer polishing liquid particles from being scratched when the wafer is polished, and in the case of not having a long time to withstand the circulation time of the flow back to the agitation tank, it is inevitable The large amount of slurry slurry particles that are filtered and intercepted is increased, not only the particles of the filter slurry that are not filtered are used effectively, but also the waste of waste is generated, and the filter plugging workload is large, and the filter element is completely blocked early. In the case of flow, the filter is often replaced with a new filter to maintain the normal supply of the wafer slurry to the flow rate of the wafer, resulting in an increase in operating costs.
鑒於習見拌勻出預定晶圓研磨稀釋液濃度之葉片攪拌設備有上述種種缺失,因而本創作人乃積極研究改進之道,經過一番艱辛的苦思及試驗過程,終於有本創作產生。In view of the above-mentioned various kinds of blade mixing equipment that mixes out the predetermined wafer grinding dilution concentration, the creator is actively researching the improvement method. After some painstaking thinking and testing process, the author finally has this creation.
本創作此種晶圓研磨液超音波震勻設備,即旨在改進習見葉片攪勻晶圓研磨液設備的缺失,其主體為下端伸出入液管上端伸出出液管之封閉筒件,且封閉筒件由至少一槽體層層豎設包圍所構成,封閉筒件內部中央之槽體為混勻槽,使入液管由下端通入混勻槽內空間,出液管由上端通入混勻槽內空間,特別在混勻槽之槽身四周外壁,疊接至少一只超音波震盪頭,由此構成,晶圓研磨原液加水經入液管流入混勻槽後,即受超音波震盪頭傳震到混勻槽內震動和勻,再將槽內震勻後的預定晶圓研磨稀釋液經出液管送往晶圓研磨作業。The creation of such a wafer polishing liquid ultrasonic oscillating device, which is intended to improve the lack of equipment for mixing the wafer polishing liquid in the blade, the main body of which is a closed cylindrical piece projecting from the upper end of the liquid pipe to the upper end of the liquid pipe, and The closed tubular member is composed of at least one trough layer vertically surrounding, and the trough body at the center of the closed cylindrical member is a mixing tank, so that the liquid inlet pipe is introduced into the mixing trough space from the lower end, and the liquid discharging pipe is mixed and mixed from the upper end. The space inside the sluice, especially at the outer wall around the groove of the mixing tank, is superimposed with at least one ultrasonic oscillating head, thereby constituting the wafer grinding liquid and the water flowing into the mixing tank through the liquid inlet tube, and then being ultrasonically oscillated The head is shaken to the vibration and uniformity in the mixing tank, and then the predetermined wafer grinding dilution liquid shaken in the tank is sent to the wafer grinding operation through the liquid discharge pipe.
基於超音波發生較低頻的週波上,各種超音波震盪頭型式產生的超音波周期與振幅變化,受發振機引發傳出超音波震動後,有如第二圖之單一周波圖,第三圖之四周波圖以及第四圖之頻率調變周波圖的不同,加上可同時使用多只兩種以上不同周波型式之超音波震盪頭陣列,產生相混出更複雜亂的波頻變化,達到頻速傳導快的震散多種相混流體分子,達到快速混融的效果,且不管是那種周波型式的超音波振動,都會對 液體瞬間造成「增壓」及「減壓」不同程度的反覆動作,會不斷在液體內產生各種幾近真實的空洞分佈模式,取入溶於液體的氣體成為氣泡,稱為空洞現象,該些氣泡被大氣壓縮擠破消滅時,會產生強大的衝擊波直接破碎週圍顆粒,使粒子更加微分扯碎更容易相混溶合,由此構成達成下述功效。Based on the lower frequency of the ultrasonic wave, the period and amplitude of the ultrasonic wave generated by various types of ultrasonic oscillating heads are changed by the vibration machine, which is like the single cycle diagram of the second figure. The difference between the surrounding wave pattern and the frequency modulation periodogram of the fourth picture, together with the ultrasonic oscillating head array which can simultaneously use more than two different types of cycles, produces a more complicated and chaotic wave frequency variation. The fast transmission of the frequency scatters a variety of mixed fluid molecules to achieve a fast mixing effect, and regardless of the type of ultrasonic vibration of the cycle type, The liquid instantly causes different actions of "boosting" and "decompression". It will continuously produce various near-true void distribution patterns in the liquid, and the gas dissolved in the liquid becomes a bubble, which is called a cavity phenomenon. When the bubbles are squeezed and destroyed by the atmosphere, a strong shock wave is generated to directly break the surrounding particles, so that the particles are more differentially pulverized and more easily mixed, thereby achieving the following effects.
由於本創作此種設備,係將超音波由混勻槽外壁傳震透入到混勻槽內部,混勻槽內完全不存在葉片等轉動機件,因此沒有葉片攪拌造成片緣沾黏、易沉會積亂流多、不利拌勻的缺失,此即為本創作之一目的。Because of the creation of such a device, the ultrasonic wave is transmitted from the outer wall of the mixing tank to the inside of the mixing tank, and there is no rotating member such as a blade in the mixing tank, so that the blade edge is not adhered and the edge is sticky. The sinking of the stagnation and the lack of mixing and unfavorable mixing is one of the purposes of this creation.
經相同拌勻液量測試,本創作此種設備每次超音波震勻晶圓研磨液過程到送出通過過濾器約2.5小時,而不計算通過過濾器時間,只計算超音波震勻時間只要花費40分鍾,遠比習見用葉片攪拌再過濾費時4到5小時短得多,加快晶圓研磨原液顆粒拌勻輸出速度,及循環再拌效率,減少晶圓研磨液在管路內滯留,沉積生成大晶圓研磨液顆粒時機,得以提高晶圓研磨液拌勻品質及妥用率,此即為本創作之又一目的。After the same mixing liquid amount test, the device generates ultrasonic vibration of the wafer polishing liquid process to send out the filter for about 2.5 hours, without calculating the filter time, only calculating the ultrasonic vibration time. 40 minutes, far less than the use of blade mixing and filtration, it takes 4 to 5 hours to be much shorter, speeding up the wafer grinding of the raw liquid particles and mixing the output speed, and recycling the remixing efficiency, reducing the retention of the wafer slurry in the pipeline, deposition generation The large wafer polishing liquid particle timing can improve the quality and appropriate utilization rate of the wafer polishing liquid, which is another purpose of the creation.
又因為本創作此種設備,沒有電動泵帶動葉片伸進攪拌槽的結構的複雜結構,因此,使用一段時間後,不會有葉緣磨損,葉片也微量彎翹變形,影響攪拌性能問題,使維修保養更加方便,此即為本創作之再一目的。Moreover, because of the creation of such a device, there is no complicated structure of the structure in which the electric pump drives the blade into the agitation tank. Therefore, after a period of use, there is no leaf edge wear, and the blade is also slightly bent and deformed, which affects the stirring performance problem. Maintenance is more convenient, this is another purpose of this creation.
再者,本創作此種設備,能更加微分扯碎混溶混合液內的顆粒,使拌出的晶圓研磨液稀釋濃度,酸度完全均勻,而增長耐受出流回堵送回攪拌槽之循環時間,縱使設備商會加入過濾器,在攪混顆粒更小,且具較長時耐受出流回堵送回攪拌槽之循環時間的情況下,必然使受過濾攔 截之大晶圓研磨液顆粒減少,大大減低這些不再有用空耗浪費,被除濾的晶圓研磨液顆粒數量,也意謂者,降低過濾器濾堵工作量,拉長過濾器濾芯使用壽命,減少為維持正常研磨晶片供流量,而換新過濾器次數,使運作成本大為降低,此即為本創作再進一步的目的。Furthermore, the creation of such a device can more precisely pulverize the particles in the miscible mixture, so that the diluted wafer slurry is diluted in concentration, the acidity is completely uniform, and the growth is resistant to the flow back to the agitation tank. The cycle time, even if the equipment supplier will add the filter, in the case that the mixing particles are smaller, and the circulation time of the flow back to the agitation tank is tolerated when it is long, the filter is inevitably blocked. The large amount of wafer slurry particles is reduced, which greatly reduces the waste of waste that is no longer useful. The number of particles of the wafer slurry that is filtered is also reduced, reducing the filter plugging workload and lengthening the filter filter life. In order to maintain the flow rate of the normal grinding wafer, and the number of new filters is changed, the operating cost is greatly reduced, which is a further objective of the creation.
至於本創作之詳細構造、應用原理、作用與功效,則參照下列依附圖所作之說明即可得到完全的了解。As for the detailed structure, application principle, function and effect of this creation, a complete understanding can be obtained by referring to the following description according to the drawings.
10‧‧‧葉片攪勻晶圓研磨液拌設備10‧‧‧Way the blade stir the wafer grinding liquid mixing equipment
20‧‧‧電動泵20‧‧‧Electric pump
30‧‧‧葉片30‧‧‧ leaves
40‧‧‧攪拌槽40‧‧‧Stirring tank
41‧‧‧出液管41‧‧‧Draining tube
42‧‧‧回流管42‧‧‧Return pipe
50‧‧‧純水量取筒50‧‧‧ pure water volume
60‧‧‧晶圓研磨原液量取筒60‧‧‧ Wafer grinding stock solution
70,71‧‧‧注入管70,71‧‧‧Injection tube
80‧‧‧過濾器80‧‧‧Filter
90‧‧‧晶圓研磨設備90‧‧‧ Wafer grinding equipment
100‧‧‧封閉筒件100‧‧‧Closed cylinder
200‧‧‧入液管200‧‧‧Inlet tube
300‧‧‧出液管300‧‧‧Draining tube
400‧‧‧混勻槽400‧‧‧ mixing tank
401‧‧‧封殼槽401‧‧‧sealing tank
402‧‧‧殼本體402‧‧‧Shell body
403‧‧‧鐵氟龍層403‧‧‧Teflon layer
404‧‧‧包密外槽404‧‧‧包密外槽
405‧‧‧泡綿405‧‧‧foam
500,501,502‧‧‧超音波震盪頭500,501,502‧‧‧Supersonic shock head
第一圖為習見葉片攪勻晶圓研磨液設備及周圍相關管路設備示意圖。The first picture is a schematic diagram of the equipment for mixing the wafer slurry and the surrounding pipeline equipment.
第二圖為發出單一周波型式超音波震盪頭之單一周波圖。The second picture shows a single cycle diagram of a single-cycle type ultrasonic oscillating head.
第三圖為發出四周波型式超音波震盪頭之四周波圖。The third picture shows the surrounding wave pattern of the surrounding wave type ultrasonic oscillating head.
第四圖為發出頻率調變周波型式超音波震盪頭之頻率調變周波圖。The fourth figure is the frequency modulation cycle diagram of the frequency-modulated periodic wave type ultrasonic oscillating head.
第五圖為本創作晶圓研磨液超音波震勻設備之整體立體圖。The fifth picture is an overall perspective view of the ultrasonic polishing device for the wafer polishing liquid.
第六圖為本創作晶圓研磨液超音波震勻設備之結構剖示圖。The sixth figure is a structural sectional view of the ultrasonic vibration device for creating a wafer polishing liquid.
第七圖為本創作晶圓研磨液超音波震勻設備之內璧層構放大剖示圖。The seventh figure is an enlarged cross-sectional view of the inner layer structure of the ultrasonic polishing device for the wafer polishing liquid.
第八圖為本創作晶圓研磨液超音波震勻設備之運作示意圖。The eighth figure is a schematic diagram of the operation of the ultrasonic polishing device for the wafer polishing liquid.
第九圖為本創作晶圓研磨液超音波震勻設備之混勻槽型一。The ninth picture shows the mixing groove type 1 of the ultrasonic polishing device for the wafer polishing liquid.
第十圖為本創作晶圓研磨液超音波震勻設備之混勻槽型二。The tenth figure is the mixing trough type II of the ultrasonic polishing device for creating the wafer polishing liquid.
第十一圖為本創作晶圓研磨液超音波震勻設備之混勻槽型三。The eleventh figure is the mixing trough type III of the ultrasonic polishing device for creating a wafer polishing liquid.
第十二圖為本創作晶圓研磨液超音波震勻設備之混勻槽型四。The twelfth figure is the mixing trough type IV of the ultrasonic polishing device for creating a wafer polishing liquid.
第十三圖為本創作晶圓研磨液超音波震勻設備之混勻槽型五。The thirteenth picture shows the mixing trough type 5 of the ultrasonic polishing device for the wafer polishing liquid.
第十四圖為本創作晶圓研磨液超音波震勻設備之混勻槽型六。The fourteenth figure is the mixing trough type 6 of the ultrasonic polishing device for creating a wafer polishing liquid.
第十五圖為本創作晶圓研磨液超音波震勻設備之另一實施結構剖示圖。The fifteenth figure is a cross-sectional view showing another embodiment of the ultrasonic polishing device for creating a wafer polishing liquid.
習見葉片攪勻晶圓研磨液設備之缺失已如前述,此處不再贅述,第五圖為本創作晶圓研磨液超音波震勻設備整體立體圖,並請同時參照第六圖之結構剖示圖,由該些圖所示可知,本創作此種晶圓研磨液超音波震勻設備主體為下端伸出入液管200上端伸出出液管300之封閉筒件100,且封閉筒件100由至少一槽體層層包圍所構成,封閉筒件100內部中央之豎設槽體為混勻槽400,使入液管200由下端通入混勻槽400內空間,出液管300由上端通入混勻槽400內空間,特別在混勻槽400之槽身四周外壁,疊接至少一只超音波震盪頭500,501,502,而出液管300上可再附設有如前第一圖所示之過濾器80,而此封閉筒件100除中央豎設混勻槽400外,復可在混勻槽400連同所有超音波震盪頭500,501,502外圍再包圍設置一封殼槽401,且封殼槽401殼頂面與混勻槽400殼頂面相疊固接,封殼槽401殼底面與混勻槽400殼頂面相疊固接,將混勻槽400連同所有超音波震盪頭500,501,502全部包入,使該殼401內部防塵防污防撞傷,然而就運作效用而言,封殼槽401並非絕對必要。The lack of the blade to stir the wafer slurry equipment is as described above, and will not be described here. The fifth figure is the overall perspective view of the ultrasonic polishing device for the wafer polishing liquid, and please refer to the structure diagram of the sixth figure at the same time. As can be seen from the figures, the main body of the wafer polishing liquid ultrasonic oscillating device is a closed cylindrical member 100 whose lower end protrudes from the upper end of the liquid pipe 200 and protrudes out of the liquid discharge pipe 300, and the closed cylindrical member 100 is composed of At least one tank layer is surrounded by a layer, and the vertical tank body in the center of the closed cylinder 100 is a mixing tank 400, so that the liquid inlet pipe 200 passes from the lower end into the space inside the mixing tank 400, and the liquid outlet pipe 300 is opened from the upper end. The inner space of the mixing tank 400, particularly the outer wall surrounding the tank body of the mixing tank 400, is superimposed with at least one ultrasonic oscillating head 500, 501, 502, and the filter tube 80 as shown in the first figure can be attached to the liquid outlet tube 300. In addition to the central vertical mixing tank 400, the closed cylinder 100 is further provided with a shell groove 401 in the periphery of the mixing tank 400 together with all the ultrasonic oscillating heads 500, 501, 502, and the top surface of the shell groove 401 is The top surface of the mixing tank 400 is stacked and fixed, and the bottom surface of the sealing groove 401 is mixed with The top surface of the tank 400 is fixedly stacked, and the mixing tank 400 is fully enclosed with all the ultrasonic oscillating heads 500, 501, 502, so that the inside of the shell 401 is dustproof, antifouling and anti-collision. However, in terms of operational utility, the sealing groove 401 is not absolute. necessary.
而此混勻槽400之槽殼壁,如第七圖之內璧層構放大剖示圖所示,為耐酸金屬胎料(例如SUS 304規格之不鏽鋼)之殼本體402,內面可再塗上一鐵氟龍層403之複合層壁,使混勻槽400內壁表面形成各處易沖除黏垢效果,於混勻槽400內部空間受超音波震勻晶圓研磨原液和水時,就能同時受波動沖除碰壁沾黏之晶圓研磨液顆粒,減少晶圓研磨液顆粒沾黏的浪費。The wall of the tank of the mixing tank 400, as shown in the enlarged cross-sectional view of the inner layer of the seventh figure, is the shell body 402 of the acid-resistant metal tire material (for example, SUS 304 stainless steel), and the inner surface can be recoated. The composite layer wall of the previous Teflon layer 403 is formed to make the surface of the inner wall of the mixing tank 400 easy to remove the slimming effect, and when the internal space of the mixing tank 400 is ultrasonically shaken to grind the liquid and the water, It is possible to simultaneously pulsate and remove the particles of the wafer slurry which are stuck to the wall, thereby reducing the waste of the adhesion of the wafer slurry.
運作時如第八圖之運作示意圖所示,研磨原液加水由前端的純水量取筒50及晶圓研磨原液量取筒60送來純水、晶圓研磨原液經入液管200流入混勻槽400後,即受超音波震盪頭500,501,502傳震到混勻槽400內震動和勻,再將混勻槽400內震勻後的預定晶圓研磨稀釋液經出液管300經過濾器80送往後續的晶圓研磨設備90,運作上藉由超音波快速波頻震勻效能,就能比傳統攪拌晶圓研磨液設備更震散細粒相溶混合、提高混勻品質,且能更快更節省混勻預定晶圓研磨稀釋液時間。During the operation, as shown in the operation diagram of the eighth figure, the grinding liquid is added with water from the front pure water metering cylinder 50 and the wafer grinding raw liquid measuring cylinder 60 to send pure water, and the wafer grinding raw liquid flows into the mixing tank through the liquid inlet pipe 200. After 400, the ultrasonic oscillating head 500, 501, 502 is shocked and shaken into the mixing tank 400, and the predetermined wafer grinding dilution which is shaken in the mixing tank 400 is sent to the subsequent through the filter tube 80 through the filter 80. The wafer grinding device 90, by operating the ultrasonic fast wave frequency shaking performance, can be more dispersed and mixed with the traditional stirred wafer polishing equipment, improve the mixing quality, and can be faster and more economical. Mix the predetermined wafer grinding dilution time.
而混勻槽400除上述圖示及第九圖之混勻槽型一所示,可為只留通上述入液管200、出液管300,呈矩形(可視為多直邊形)截面之密閉槽形外,復可分別如第十、十一、十二、十三圖及十四圖所示,在截面形狀為能供超音波震盪頭發出之振動波傳繞,又不會受超音波波動產生共振噪音之訴求下,也可為多圓弧邊形、類圓形(類圓形包括:正圓形或橢圓形)等各種形狀,只要能達到槽內超音波振動效用,任何試出的混勻槽400截面槽形均可,不應就此說明所述局限必為何種混勻槽400形體。In addition to the above-described drawing and the mixing groove type 1 of the ninth drawing, the mixing tank 400 can only leave the above-mentioned liquid inlet pipe 200 and the liquid discharge pipe 300, and has a rectangular (visible as a straight edge) cross section. In addition to the closed trough shape, the complex can be as shown in the tenth, eleventh, twelfth, thirteenth and fourteenth, respectively, in the cross-sectional shape of the vibration wave that can be used for ultrasonic vibration, and will not be super Under the request of resonance wave noise caused by sound wave fluctuation, it can also be multi-arc-shaped, round-like (circular including: round or elliptical) and other shapes, as long as the ultrasonic vibration effect in the groove can be achieved, any test The mixing tank 400 may have a trough shape, and it should not be described as a limitation of the mixing tank 400 shape.
本創作又可如第十五圖之另一實施結構剖示圖所示實施,該封閉筒件10豎設之槽體,除中央之混勻槽400,及將混勻槽400連同所有超音波震盪頭500,501,502外圍包圍設置之封殼槽401外,復於封殼槽401外圍整個包豎一包密外槽404,於包密外槽404朝向封殼槽401之槽內面各處槽間縫隙,鋪設塞滿泡綿405,以吸收從混勻槽400內傳出的超音波音爆噪音,達到運作靜音效果。The present invention can be implemented as shown in the cross-sectional view of another embodiment of the fifteenth figure. The closed cylindrical member 10 is vertically arranged, except for the central mixing tank 400, and the mixing tank 400 together with all the ultrasonic waves. The outer surface of the oscillating head 500, 501, 502 is surrounded by the sealing groove 401, and the outer periphery of the sealing groove 401 is surrounded by a tight outer groove 404, and the outer groove 404 faces the groove between the inner surface of the sealing groove 401. The foam is filled with 405 to absorb the ultrasonic sound noise emitted from the mixing tank 400 to achieve a silent operation effect.
綜上所述,本創作確實達到所述之功效,而且未見諸公開使用,合於專利法之規定,懇請賜准專利,實為德便。In summary, this creation does achieve the stated effect, and it has not been used publicly. In accordance with the provisions of the Patent Law, it is a matter of granting a patent.
須陳明者,以上所述者乃是本創作較佳具體的實施例,若依本創作之構想所作之改變,或其產生之功能作用,仍未超出說明書與圖示所涵蓋之精神時,均應在本創作之範圍內,合予陳明。It should be noted that the above is a better embodiment of this creation. If the changes made according to the concept of this creation, or the functional functions produced by them, still do not exceed the spirit of the manual and the illustration, All should be included in the scope of this creation, combined with Chen Ming.
100‧‧‧封閉筒件100‧‧‧Closed cylinder
200‧‧‧入液管200‧‧‧Inlet tube
300‧‧‧出液管300‧‧‧Draining tube
400‧‧‧混勻槽400‧‧‧ mixing tank
401‧‧‧封殼槽401‧‧‧sealing tank
500,501,502‧‧‧超音波震盪頭500,501,502‧‧‧Supersonic shock head
Claims (11)
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