M326154 八、新型說明： 【新型所屬之技術領域】 本新型係有關於一種萬用探針訊號之轉接座，尤指於 一管體中，彈性地滑設有滑塊，且該滑塊為管體之上、下 限位突緣限制地於管體中滑移，藉由該滑塊之頂端端面與 探針搭接時可獲得初壓測量值，並藉滑塊之頂端端面導引 該探針滑移地與管體之管壁搭接，使探針所測得之電流， 循電阻極小之管體直接傳遞至電流輸出導體者。 【先前技術】 目前運用於萬用探針之轉接座，一般有兩種型式，一 種是於彈簧的一端焊接有導線，藉由該彈簧的另一端與探 針接觸，使探針所測得的電流，可以經由彈黃傳遞至導線， 以測得電量數據，然而此一型式之萬用探針轉接座，採用 彈簧做為傳導電流的媒介，不但阻抗較高，且在接觸時， 無法測出初壓，因此不易獲得正確的測試結果，且彈簧易 斷裂’使用壽命較短。 ’ 另一種萬用探針轉接座，係將一彈簧套置於一管體 中，並於該彈簧之末端連接一導線，藉由該彈簧的另一端 與探針接觸，使探針所測得的電流，，可以經由彈菁傳遞 至導線，以測得電量數據，然而’上述兩種習知之萬用探 針轉接座，皆是應用彈簧直接與探針接觸，除無法測出接 觸瞬間的初壓值外，在應用上，探針常常會刺入彈簧之簧 圈與簧圈的間距，造成彈簧易變型、斷裂， 的测量值，而使誤判率大增，而顯有改進響到_ 本案創作人有鑑於此，乃予以研究創新，揭示出一種 萬用探針訊號之轉接座。 M326154 【新型内容】 本新型之目的旨在提供一種萬用探針訊號之轉接座， 係包括·一管體，於其管壁中，設有一上限位突緣及一下 限位突緣者；-滑塊，滑置於該管體中，形成有一擔肩， α抵靠於該管體之上限位突緣，擋阻該滑塊繼續向上滑移 者，一彈簧，置於該管體中，且其上、下簧端係頂撐於該 j骨塊及下限位突緣間者；以及一電流輸出導體，連接於該 管體之底端者。如是當探針之底端首先觸碰該滑塊之頂端 Φ 端面時，便可於電流輸出導體測得一初電壓，當繼績下壓 該探針後、，該探針便可以順著滑塊之頂端端面，朝管體之 管壁方向滑移’並與該管壁接觸，使探針之電流可順著管 體之管壁流向電流輸出導體，由於管體之電阻低，因而可 測得較為準確之測量值，使誤測率大幅下降。 本新型之可取實體，可由以下之說明及所附各圖式， 而得以明晰之。 【實施方式】 凊參閱第一至五圖所示，本新型係有關於一種萬用探 針訊號之轉接座，係包括：一管體（1〇)，於其管壁（11)中， 設有一上限位突緣（111)及一下限位突緣（112)者；一滑塊 (20) ，滑置於該管體（10)中，並於其外緣，形成有一擂肩 (21) ，以抵靠於該管體（10)之上限位突緣（111)，擋阻該滑 塊（20)繼續向上滑移者；一彈簧（3〇)，置於該管體（1〇)中， 且其上、下簧端（31、32)係頂撐於該滑塊（2〇)及管體（10) 之下限位突緣（112)間者；以及一電流輸出導體（4〇)，連接 於該管體（10)之底端者。如是當一抵住電路板（5〇)之探針 (60，如斜置式探針，此為習知元件，並非本新型專利申請 M326154 標的，故不贅述）的底端首先觸碰該滑塊（20)之頂端端面 (22)時，便可於電流輸出導體（4〇)測得一初電壓，當繼續 下壓該探針（60)後，該探針（60)便可以順著滑塊（2〇)之頂 端端面（22) ’朝官體（1〇)之管壁（11)方向滑移，並與該管 壁（11)接觸，使探針（60)所測得之電路板（50)電子元件的 電流可順著管體（10)之管壁（11)流向電流輸出導體（4〇)， 由於管體（10)係採用銅等低電阻導電材製成，其電阻極 低’因而可以在電流輸出導體（4〇)測得較為準確之電壓 值，使誤測率大幅下降。 Φ 本新型所揭示萬用探針訊號之轉接座，其中該管體 (10) ，係可製自銅、鋁…等等金屬材料，如第一圖所示， 於組裝時，先將滑塊（20)及彈簧（30)置入管體（1〇)後，可 以滾壓方式，於該管體（10)之管壁（11)上，成型該上限位 突緣（111)及下限位突緣（112)，如第二、三圖所示者。 如第三圖所示，本新型所揭示萬用探針訊號之轉接 座，其中該滑塊（20)，係呈一工字型滑塊（2〇)，其中段， 含有一頸部（23)，以容許該管體（1〇)之上限位突緣（111)於 • 該頸部（23)之外緣，相對滑移者。 本新型所揭示萬用探針訊號之轉接座，其中該電流輸 出導體（40)，係以焊錫（41)焊連於該管體（1〇)底部之管壁 (11) 周緣；當然該電流輸出導體（40)也可以焊接於該管體 (10)之外緣，本新型並不予自限。 本新型於應用上，係藉由一治具[圖未示出],同時聯 動多數個本新型所示萬用探針訊號之轉接座，於操作上， 可令多數個萬用探針訊號之轉接座一同上升、下降，以趨 近該探針（60) ’當本新型之滑塊（20)頂部接觸到探針（6〇) 時，由探針（60)所偵測之電路板上電子元件的電流，便可 M326154 以經由滑塊（20)、彈簧（3〇)、與該彈簧（go)接觸之管體（iq) 的下限位突緣（112)傳遞至電流輸出導體（4〇)，使品管人員 可以先行測得一初電壓，如第四圖所示；當萬用探針訊號 之轉接座繼續朝探針（60)方向相對施壓時，如第五圖所 示，該探針（60)便會隨著滑塊（20)之頂端端面（22)，滑向 管體（10)之管壁（11)，此時，探針（6〇)所測得之電流，便 直接經由電阻最小之管體（1〇)傳遞至電流輸出導體（4〇) 上，緣此，本新型可以大大的降低誤測值，使測量更為精 準。 本新型由於以滑塊（20)之頂端端面（22)接觸探針 (60)，其接觸面積極大，因此除了可以適用於不同尺寸之 探針（60),而且也沒有接觸不良的現像，而顯其新穎性。 本新型所揭示萬用探針訊號之轉接座，乃具有以下之 結構特徵及優點，而顯本新型之實用性及新穎性： 1·以滑塊（20)彈性地滑置於管體（10)中，且為管體（1〇)之 上、下限位突緣（111、112)限制於管體（1〇)中滑移者。 2·當滑塊（20)與探針（60)—接觸，操作者便可以在電流輸 出導體（40)上，測得一初電壓，使後續的電流偵測更為 準確。 3·該探針（60)受滑塊（20)之頂端端面（22)之頂堆，而朝向 管體（10)之管壁（11)方向偏移，而與管壁（u)接觸，此 時，探針（60)之電流，便可經由電阻極小的管體（丨〇)， 直接傳遞至電流輸出導體（4〇)，由於電阻極小，因此可 以降低誤測率。 本新型所揭示之結構、形狀，可於不違本新型之精神 及範脅下予以修飾應用，本新型並不予自限。 【圖式簡單說明】 8 M326154 第一圖：係本新型之分解圖。 第二圖：係本新型於組合後之立體圖。 第三圖：係第二圖3-3方向之局部剖面圖。 第四圖：係本新型於應用時，首度接觸探針時之狀態圖。 第五圖：係自第四圖持續朝探針施壓使探針與管體搭接之 狀態圖。 【主要元件符號說明】 (10)管體 （11)管壁M326154 VIII. New description: [New technical field] The present invention relates to a universal probe signal adapter, especially in a tube body, which is elastically slidably provided with a slider, and the slider is The upper and lower limit flanges of the tube body are restricted from sliding in the tube body, and the initial pressure measurement value can be obtained by overlapping the top end surface of the slider with the probe, and the probe is guided by the top end surface of the slider. The needle slips and overlaps with the tube wall of the tube body, so that the current measured by the probe is directly transmitted to the current output conductor by the tube with very small resistance. [Prior Art] At present, the adapter for the universal probe is generally of two types, one is that a wire is welded to one end of the spring, and the other end of the spring is in contact with the probe, so that the probe is measured. The current can be transmitted to the wire via the spring to measure the power data. However, this type of universal probe adapter uses a spring as a medium for conducting current, which not only has high impedance, but also cannot be contacted. The initial pressure is measured, so it is difficult to obtain the correct test result, and the spring is easy to break, and the service life is short. Another universal probe adapter is a spring sleeve placed in a tube body, and a wire is connected to the end of the spring, and the probe is measured by contacting the other end of the spring with the probe. The current obtained can be transmitted to the wire via the elastic crystal to measure the electricity data. However, the two conventional universal probe adapters are applied directly to the probe by the application spring, except that the contact moment cannot be measured. In addition to the initial pressure value, in the application, the probe often penetrates the distance between the spring coil and the coil, causing the spring to be easily deformed and broken, and the false positive rate is greatly increased, and the improvement is noticeable. _ The creators of this case have made research and innovation to reveal a universal adapter signal adapter. M326154 [New content] The purpose of the present invention is to provide a universal probe signal adapter, which comprises a tube body, and an upper limit flange and a lower limit flange are arranged in the wall of the tube; a slider that slides into the tube body to form a shoulder, α abuts against the upper limit flange of the tube body, blocks the slider from continuing to slide upward, and a spring is placed in the tube body And the upper and lower spring ends are supported between the j-bone block and the lower limit flange; and a current output conductor is connected to the bottom end of the pipe body. If the bottom end of the probe first touches the end surface of the slider Φ, the initial voltage can be measured on the current output conductor. When the probe is pressed down, the probe can slide smoothly. The top end of the block slides toward the wall of the pipe body and contacts the wall of the pipe, so that the current of the probe can flow along the pipe wall of the pipe body to the current output conductor, and the resistance of the pipe body is low, so that the pipe can be measured A more accurate measurement makes the false positive rate drop significantly. The desirable entities of the present invention can be clarified by the following description and the accompanying drawings. [Embodiment] Referring to Figures 1 to 5, the present invention relates to an adapter for a universal probe signal, comprising: a tube body (1〇) in its tube wall (11), An upper limit flange (111) and a lower limit flange (112) are provided; a slider (20) is slidably disposed in the tube body (10), and a shoulder is formed on the outer edge thereof (21) ) to abut against the upper limit flange (111) of the pipe body (10), blocking the slider (20) to continue to slide upward; a spring (3〇), placed in the pipe body (1〇) And the upper and lower spring ends (31, 32) are supported between the slider (2〇) and the lower limit flange (112) of the tube body (10); and a current output conductor (4) 〇), connected to the bottom of the tube (10). If the probe (60, such as an oblique probe, which is a conventional component, which is not the subject of the new patent application M326154, is not mentioned), the bottom end of the circuit board (5〇) is first touched by the slider. (20) At the top end face (22), an initial voltage can be measured at the current output conductor (4〇), and the probe (60) can be slid down after continuing to press the probe (60). The top end face (22) of the block (2〇) slides in the direction of the pipe wall (11) of the body (1〇) and contacts the pipe wall (11) to make the circuit measured by the probe (60) The current of the electronic component of the board (50) can flow along the pipe wall (11) of the pipe body (10) to the current output conductor (4〇), and the pipe body (10) is made of a low-resistance conductive material such as copper. Very low' so that a relatively accurate voltage value can be measured at the current output conductor (4〇), so that the false positive rate is greatly reduced. Φ The adapter for the universal probe signal disclosed in the present invention, wherein the tube body (10) can be made of metal materials such as copper, aluminum, etc., as shown in the first figure, when assembled, first slide After the block (20) and the spring (30) are placed in the pipe body (1〇), the upper limit flange (111) and the lower limit can be formed on the pipe wall (11) of the pipe body (10) by rolling. The bit flange (112) is as shown in the second and third figures. As shown in the third figure, the adapter for the universal probe signal disclosed in the present invention, wherein the slider (20) is an I-shaped slider (2〇), wherein the segment has a neck ( 23), to allow the upper limit flange (111) of the pipe body (1) to be relative to the outer edge of the neck (23). The adapter for the universal probe signal disclosed in the present invention, wherein the current output conductor (40) is soldered to the periphery of the pipe wall (11) at the bottom of the pipe body (1); The current output conductor (40) can also be soldered to the outer edge of the tube body (10), and the present invention is not limited. In the application, the utility model adopts a fixture (not shown), and simultaneously links a plurality of adapters of the universal probe signal shown in the present invention, and can operate a plurality of universal probe signals in operation. The adapter is raised and lowered together to approach the probe (60). When the top of the slider (20) of the present invention contacts the probe (6〇), the circuit detected by the probe (60) The current of the on-board electronic component can be transmitted to the current output conductor via the slider (20), the spring (3〇), and the lower limit flange (112) of the body (iq) in contact with the spring (go). (4〇), so that the quality control personnel can first measure the initial voltage, as shown in the fourth figure; when the universal probe signal adapter continues to press the direction of the probe (60), such as the fifth As shown in the figure, the probe (60) will slide toward the tube wall (11) of the tube body (10) along with the tip end surface (22) of the slider (20). At this time, the probe (6〇) The measured current is directly transmitted to the current output conductor (4〇) via the tube with the smallest resistance (1〇). Therefore, the novel can greatly reduce the false detection value and make the measurement more precise. . Since the contact lens (60) is contacted by the tip end surface (22) of the slider (20), the contact area is extremely large, so that it can be applied to probes (60) of different sizes, and there is no bad contact phenomenon. Show its novelty. The adapter for the universal probe signal disclosed in the present invention has the following structural features and advantages, and exhibits the practicability and novelty of the novel: 1. The slider (20) is elastically slid into the tube body ( In 10), above the pipe body (1〇), the lower limit flange (111, 112) is limited to the slip in the pipe body (1〇). 2. When the slider (20) is in contact with the probe (60), the operator can measure the initial voltage on the current output conductor (40) to make the subsequent current detection more accurate. 3. The probe (60) is piled up by the top end surface (22) of the slider (20), and is displaced toward the tube wall (11) of the tube body (10), and is in contact with the tube wall (u). At this time, the current of the probe (60) can be directly transmitted to the current output conductor (4〇) via the tube body having a very small resistance, and since the resistance is extremely small, the false detection rate can be reduced. The structure and shape disclosed in the present invention can be modified and applied without departing from the spirit and scope of the present invention, and the present invention is not limited. [Simple description of the diagram] 8 M326154 First picture: This is an exploded view of the new model. The second picture is a perspective view of the new type after combination. Figure 3: A partial cross-sectional view of the second Figure 3-3 direction. The fourth picture: the state diagram of the new type when the probe is first contacted. Figure 5: A diagram showing the state in which the probe is pressed against the tube from the fourth figure. [Main component symbol description] (10) Tube body (11) Tube wall
(111)上限位突緣 （112)下限位突緣 (20)滑塊 (22)頂端端面 (30)彈簧 (32)下簧端 (21)擋肩 (23)頸部 (31)上簧端 (40)電流輸出導體 (41)焊鍚 （50)電路板 (60)探針(111) upper limit flange (112) lower limit flange (20) slider (22) top end face (30) spring (32) lower spring end (21) shoulder (23) neck (31) upper spring end (40) Current Output Conductor (41) Soldering (50) Circuit Board (60) Probe