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TWI914074B - Test method and test system - Google Patents

Test method and test system

Info

Publication number
TWI914074B
TWI914074B TW113148802A TW113148802A TWI914074B TW I914074 B TWI914074 B TW I914074B TW 113148802 A TW113148802 A TW 113148802A TW 113148802 A TW113148802 A TW 113148802A TW I914074 B TWI914074 B TW I914074B
Authority
TW
Taiwan
Prior art keywords
test
test method
test system
Prior art date
Application number
TW113148802A
Other languages
Chinese (zh)
Other versions
TW202516525A (en
Inventor
朱薏璇
Original Assignee
南亞科技股份有限公司
Filing date
Publication date
Application filed by 南亞科技股份有限公司 filed Critical 南亞科技股份有限公司
Priority to TW113148802A priority Critical patent/TWI914074B/en
Publication of TW202516525A publication Critical patent/TW202516525A/en
Application granted granted Critical
Publication of TWI914074B publication Critical patent/TWI914074B/en

Links

TW113148802A 2023-05-04 Test method and test system TWI914074B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW113148802A TWI914074B (en) 2023-05-04 Test method and test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW113148802A TWI914074B (en) 2023-05-04 Test method and test system

Publications (2)

Publication Number Publication Date
TW202516525A TW202516525A (en) 2025-04-16
TWI914074B true TWI914074B (en) 2026-02-01

Family

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201926353A (en) 2017-12-01 2019-07-01 旺宏電子股份有限公司 Method of calibrating timing of reading/writing data of memory module and system thereof
TW202008356A (en) 2018-07-31 2020-02-16 台灣積體電路製造股份有限公司 Device for providing gated data signals

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201926353A (en) 2017-12-01 2019-07-01 旺宏電子股份有限公司 Method of calibrating timing of reading/writing data of memory module and system thereof
TW202008356A (en) 2018-07-31 2020-02-16 台灣積體電路製造股份有限公司 Device for providing gated data signals

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