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TWI911215B - Storage and delivery of antimony-containing materials to an ion implanter - Google Patents

Storage and delivery of antimony-containing materials to an ion implanter

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Publication number
TWI911215B
TWI911215B TW110116512A TW110116512A TWI911215B TW I911215 B TWI911215 B TW I911215B TW 110116512 A TW110116512 A TW 110116512A TW 110116512 A TW110116512 A TW 110116512A TW I911215 B TWI911215 B TW I911215B
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Taiwan
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volume
antimony
containing material
phase
storage
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TW110116512A
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Chinese (zh)
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TW202215580A (en
Inventor
亞倫 瑞尼克
夏威尼 辛哈
道格拉斯 海德曼
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美商普雷瑟科技股份有限公司
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Priority claimed from US16/871,605 external-priority patent/US11098402B2/en
Application filed by 美商普雷瑟科技股份有限公司 filed Critical 美商普雷瑟科技股份有限公司
Publication of TW202215580A publication Critical patent/TW202215580A/en
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Publication of TWI911215B publication Critical patent/TWI911215B/en

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Abstract

A novel method, composition and storage and delivery container for using antimony-containing dopant materials are provided. The composition is selected with sufficient vapor pressure to flow at a steady, sufficient and sustained flow rate into an arc chamber as part of an ion implant process. The antimony-containing material is represented by a non-carbon containing chemical formula, thereby reducing or eliminating the introduction of carbon-based deposits into the ion chamber. The composition is stored in a storage and delivery vessel under stable conditions, which includes a moisture-free environment that does not contain trace amounts of moisture. The storage and delivery container is specifically designed to allow delivery of high purity, vapor phase antimony-containing dopant material at a steady, sufficient and sustained flow rate.

Description

含銻材料之儲存和輸送至離子植入機Storage and delivery of antimony-containing materials to ion implantation machines

本發明有關用於離子植入之新穎含銻材料的儲存和輸送容器,以及有關用於離子植入程序之儲存和輸送材料的適合條件。 This invention relates to a novel storage and transport container for antimony-containing materials used in ion implantation, and to suitable conditions for storing and transporting materials used in ion implantation procedures.

離子植入是半導體/微電子製造中的關鍵程序。離子植入程序典型而言用於積體電路製作以將摻雜雜質引入半導體晶圓中。一般而言,關於半導體應用,離子植入涉及將來自摻雜氣體(通常也稱為摻雜雜質)的離子引入半導體晶圓中而以所欲方式來更改晶圓的物理、化學和/或電特徵。所欲的摻雜雜質以微量來引入半導體晶圓中而在晶圓表面裡的所欲深度形成摻雜區域。選擇摻雜雜質來與半導體晶圓鍵結以生成電載體,藉此更改半導體晶圓的導電率。引入晶圓中之摻雜雜質的濃度或劑量決定了摻雜區域的導電率。以此方式,生成幾個雜質區域以形成電 晶體結構、隔離結構及其他電子結構,其合起來作用成半導體裝置。 Ion implantation is a key process in semiconductor/microelectronics fabrication. Typically, ion implantation is used in integrated circuit fabrication to introduce dopants into semiconductor wafers. Generally, for semiconductor applications, ion implantation involves introducing ions from a doping gas (often also called a dopant) into the semiconductor wafer to alter the wafer's physical, chemical, and/or electrical characteristics in a desired manner. The desired dopant is introduced in minute quantities into the semiconductor wafer, forming doped regions at a desired depth on the wafer surface. The selected dopant is bonded to the semiconductor wafer to create a charge carrier, thereby altering the semiconductor wafer's conductivity. The concentration or amount of impurities introduced into a wafer determines the conductivity of the doped regions. In this way, several impurity regions are created to form transistor structures, isolation structures, and other electronic structures, which together function to form a semiconductor device.

離子源係用於從來源摻雜氣體產生離子物種的離子束。離子源是離子植入系統的關鍵組件,其用來將摻雜氣體離子化以產生在植入程序期間待植入的特定摻雜離子。離子源室包含陰極,例如由鎢(W)或鎢合金所製成的細絲,將其加熱至其熱離子產生溫度以產生電子。電子加速朝向電弧室壁且與電弧室中的摻雜來源氣體分子碰撞而產生電漿。電漿包含摻雜氣體物種之解離的離子、自由基、及中性原子和分子。將離子物種從電弧室抽取出來,然後基於質量而與其他離子物種分開。該束中只有基於特定質量對電荷比例的離子可以通過過濾器。所選質量的離子含有所欲的離子物種,然後將其指引朝向標靶基板並且以所需深度和劑量植入標靶基板中。 An ion source is an ion beam used to generate ion species from a source doped gas. The ion source is a key component of an ion implantation system, used to ionize the doped gas to generate the specific doped ions to be implanted during the implantation procedure. The ion source chamber contains a cathode, such as a filament made of tungsten (W) or a tungsten alloy, which is heated to its thermal ionization temperature to generate electrons. These electrons are accelerated toward the arc chamber wall and collide with doped source gas molecules in the arc chamber to generate plasma. The plasma contains dissociated ions, radicals, and neutral atoms and molecules from the doped gas species. The ion species is extracted from the arc chamber and then separated from other ion species based on mass. Only ions in the beam with a specific mass-to-charge ratio can pass through a filter. The selected mass of ions containing the desired ion species is then directed toward the target substrate and implanted into the target substrate at the desired depth and dosage.

目前半導體裝置科技利用特定量之各式各樣的摻雜物種來產生p型和n型半導體,此二者視為製造電晶體和二極體電子裝置的建構區塊(building block)積木。p型和n型摻雜物的差異主要是關於引入半導體晶格中的帶電物種。p型摻雜物係用於藉由在價帶中生成電子空缺而在半導體材料中產生「電洞」(electron hole),而n型摻雜物係用於在半導體材料中產生自由電子。銻(Sb)是今日電子裝置所需而通常所用之摻雜物種的範例。Sb是具有許多合宜用途的n型摻雜物,其繼續在半導體產業中獲得興趣。舉例而言,銻化銦是窄能帶間隙的III-V族半導體,其 使用作為紅外線偵測器。銻也用於形成鰭式場發射電晶體(finFET)裝置中的超淺p-n接合、金屬氧化物半導體場發射電晶體(MOSFET)中之通道的閾電壓調節、p型金屬氧化物半導體(MOS)裝置中之擊穿停止鹵素植入、及鍺n型MOSFET中的源極-汲極區域。 Semiconductor device technology currently utilizes specific amounts of various dopants to produce p-type and n-type semiconductors, which are considered building blocks for manufacturing transistors and diodes. The main difference between p-type and n-type dopants lies in the type of charged substance introduced into the semiconductor lattice. P-type dopants are used to create "holes" in semiconductor materials by generating electron vacancies in the valence band, while n-type dopants are used to generate free electrons in semiconductor materials. Antimony (Sb) is an example of a commonly used dopant required for today's electronic devices. Sb, an n-type dopant with many suitable applications, continues to attract interest in the semiconductor industry. For example, indium antimonide (INT) is a narrow bandgap III-V semiconductor used in infrared detectors. INT is also used to form ultra-shallow p-n junctions in finfield field-emitting transistor (FFET) devices, threshold voltage regulation of channels in metal-oxide-semiconductor field-emitting transistors (MOSFETs), breakdown-stop halogen implantation in p-type metal-oxide-semiconductor (MOS) devices, and source-drain regions in germanium-n MOSFETs.

目前而言,Sb的固態源係使用作為摻雜材料。元素態Sb金屬可以藉由將它放置成緊鄰於細絲而用於離子植入。在離子植入期間,細絲的溫度夠高以便輻射性加熱而使Sb蒸發且與電子碰撞以生成用於摻雜的含Sb離子。然而,此方法可以使Sb沉積在室壁或細絲上,這縮短細絲壽命。Sb的固態化合物也使用作為摻雜物源,例如SbF3、SbCl3、Sb2O3,但這些化合物須加熱至160℃以上以產生離子植入所必需的足夠蒸氣量。此外,通常將系統中的所有流動線路加熱以避免Sb固態源在抵達電弧室之前再凝結。 Currently, solid-state sources of Sb are used as dopant materials. Elemental Sb metal can be used for ion implantation by placing it close to a filament. During ion implantation, the filament is heated sufficiently to cause Sb to evaporate and collide with electrons to generate Sb-containing ions for doping. However, this method can cause Sb to deposit on the chamber walls or the filament, shortening the filament's lifespan. Solid-state compounds of Sb are also used as dopant sources, such as SbF₃ , SbCl₃ , and Sb₂O₃ , but these compounds must be heated to above 160°C to generate the sufficient vapor volume required for ion implantation. In addition, all flow lines in the system are typically heated to prevent the Sb solid source from recondensing before reaching the arc chamber.

在Sb固態源所給定之植入含Sb離子的作業挑戰下,已經思及Sb的氣體源。尤其,已經提議SbH3和SbD3作為Sb的氣態源,但這些化合物不穩定且在室溫下分解。 Given the operational challenges of implanting Sb-containing ions with a given solid Sb source, gaseous Sb sources have been considered. In particular, SbH3 and SbD3 have been proposed as gaseous Sb sources, but these compounds are unstable and decompose at room temperature.

基於此等緣故,目前對於可以受控方式來輸送用於離子植入的含銻摻雜組成物之適合含銻材料的儲存和輸送容器有尚未滿足的需求。 For these reasons, there is currently an unmet need for suitable storage and delivery containers for antimony-doped compositions intended for ion implantation, allowing for controlled delivery.

本發明可以多樣組合包括以下任一態樣,並且也可包括下面說明書和附圖所述的任何其他態樣。 This invention may include any of the following embodiments in various combinations, and may also include any other embodiments described in the following specification and accompanying drawings.

本發明關於使用銻摻雜組成物的儲存和輸送系統。已經發現在此揭示的儲存和輸送系統改善了輸送至離子植入程序的容易性且實質減少含Sb沉積物累積在離子室裡。 This invention relates to a storage and transport system using antimony-doped compositions. The storage and transport system disclosed herein has been found to improve the ease of delivery to ion implantation procedures and substantially reduce the accumulation of Sb-containing deposits in the ion chamber.

於第一態樣,一種低於大氣壓之儲存和輸送容器,其建構成輸送高純度的氣相含銻材料,該容器包含:儲存和輸送容器,該儲存和輸送容器建構成在低於大氣壓條件下以液相來貯留該含銻材料,藉此該液相與高純度的氣相含銻材料呈實質平衡,並且該高純度的氣相含銻材料施加小於大氣壓的蒸氣壓,該高純度的氣相基於氣相的總體積則等於約95體積%或更大;該儲存和輸送容器包含多個壁,其具有充分的表面積來接觸液相,並且進一步其中該多個壁展現導熱率以增進對液體的熱傳導;該儲存和輸送容器的特徵在於:在高純度的氣相含銻材料的配送期間,沒有外部加熱且沒有載氣。 In the first scenario, a storage and transport container operating at sub-atmospheric pressure is configured to transport a high-purity vapor-phase antimony-containing material. The container comprises a storage and transport vessel configured to store the antimony-containing material in a liquid phase under sub-atmospheric pressure conditions, whereby the liquid phase is substantially in equilibrium with the high-purity vapor-phase antimony-containing material, and the high-purity vapor-phase antimony-containing material is subjected to evaporation at sub-atmospheric pressure. The high-purity gas phase has a total volume of approximately 95% or greater; the storage and transport container comprises multiple walls with sufficient surface area to contact the liquid phase, and further wherein these walls exhibit thermal conductivity to enhance heat conduction to the liquid; the storage and transport container is characterized by the absence of external heating and carrier gas during the delivery of the high-purity gas-phase antimony-containing material.

於第二態樣,一種低於大氣壓之儲存和輸送容器,其建構成輸送高純度的氣相含銻材料,該容器包含:儲存和輸送容器,該儲存和輸送容器建構成在低於大氣壓條件下以液相來貯留該含銻材料,藉此該液相與佔據儲存和輸送容器中之頭部空間的預定容積之高純度的氣相含銻材料呈實質平衡,並且該高純度的氣相含銻材料施加小於大氣壓的蒸氣壓,該高純度的氣相基於頭部空間的預 定容積則等於約95體積%或更大;調整該頭部空間之預定容積的尺寸以便接收足夠量之高純度的氣相含銻材料;該儲存和輸送容器的特徵在於:在高純度的氣相含銻材料的配送期間,沒有外部加熱且沒有載氣。 In the second embodiment, a storage and transport container operating at sub-atmospheric pressure is configured to transport a high-purity vapor-phase antimony-containing material. The container comprises a storage and transport vessel configured to store the antimony-containing material in a liquid phase under sub-atmospheric pressure conditions, whereby the liquid phase is substantially in equilibrium with a predetermined volume of high-purity vapor-phase antimony-containing material occupying a headspace within the storage and transport vessel. A high-purity vapor-phase antimony material is subjected to a vapor pressure less than atmospheric pressure. The high-purity vapor phase, based on a predetermined volume of the headspace, is approximately 95% by volume or greater. The dimensions of the predetermined volume of the headspace are adjusted to receive a sufficient quantity of the high-purity vapor-phase antimony material. The storage and transport container is characterized by the absence of external heating and carrier gas during the delivery of the high-purity vapor-phase antimony material.

於第三態樣,一種在儲存容器中的高純度含銻材料,其包含液相和氣相,該氣相包含範圍從0到5體積%雜質的氣相雜質總量,其中氣相雜質包含0到4體積%的N2、0到0.5體積%的O2、0到0.49體積%的HF、0到0.01體積%的H2O、其餘是呈氣相的含銻材料。 In the third state, a high-purity antimony-containing material in a storage container comprises a liquid phase and a gas phase, wherein the gas phase contains a total amount of gaseous impurities ranging from 0 to 5 volume %, wherein the gaseous impurities comprise 0 to 4 volume % N 2 , 0 to 0.5 volume % O 2 , 0 to 0.49 volume % HF, 0 to 0.01 volume % H 2 O, and the remainder is the antimony-containing material in the gaseous phase.

於第四態樣,一種在儲存容器中的高純度含銻材料,其包含液相和氣相,該液相包含範圍從0到1體積%雜質的液相雜質總量,其中液相雜質包含0到0.1體積%的N2、0到0.1體積%的O2、0到0.6體積%的HF、0到0.1體積%的SbF3、0到0.1體積%的Sb2O3、其餘是呈液相的含銻材料。 In the fourth state, a high-purity antimony-containing material in a storage container comprises a liquid phase and a gas phase. The liquid phase contains a total amount of liquid impurities ranging from 0 to 1 volume % of impurities, wherein the liquid impurities include 0 to 0.1 volume % of N2 , 0 to 0.1 volume % of O2 , 0 to 0.6 volume % of HF, 0 to 0.1 volume % of SbF3 , 0 to 0.1 volume % of Sb2O3 , and the remainder is the antimony-containing material in the liquid phase.

於第五態樣,一種製備低於大氣壓之儲存和輸送容器的方法,該容器建構成輸送穩定、持續且充分流動之高純度的氣相銻源材料,該方法包含以下步驟:提供具有多個壁的容器,該壁具有5W/m*K的導熱率;對多個壁進行氟鈍化;接著在有惰性氣體下將呈液相的含銻材料引入容器中;生成大於或等於約1L之預定的頭部空間容積,該預定的頭部空間容積具有微量雜質;將充分量的含銻材料蒸發成在預定的頭部空間容積中的氣相,其中該蒸發步驟是以沒有外部加熱來進行;凍結液相的含銻材料以 形成凍結的含銻材料;從預定的頭部空間容積凝結氣相的含銻材料以形成凝結之高純度的氣相;從預定的頭部空間容積排空氮、水氣、惰性氣體及任何其他氣態雜質;允許凝結的氣相的溫度增加以便在預定的頭部空間容積裡形成高純度的氣相;以及允許凍結的含銻材料的溫度增加以再形成液相。 In the fifth aspect, a method for preparing a storage and transport container at sub-atmospheric pressure, the container being configured to transport a stable, continuous, and sufficiently flowing high-purity vapor-phase antimony source material, the method comprising the following steps: providing a container having multiple walls with a thermal conductivity of 5 W/m*K; passivating the multiple walls with fluorine; then introducing a liquid antimony-containing material into the container in the presence of an inert gas; generating a predetermined headspace volume greater than or equal to about 1 L, the predetermined headspace volume containing trace impurities; and evaporating a sufficient amount of the antimony-containing material. The process involves: forming a gaseous phase within a predetermined headspace volume, wherein the evaporation step is performed without external heating; freezing the antimony-containing material in the liquid phase to form a frozen antimony-containing material; condensing the antimony-containing material in the gaseous phase from the predetermined headspace volume to form a condensed high-purity gaseous phase; venting nitrogen, water vapor, inert gases, and any other gaseous impurities from the predetermined headspace volume; allowing the temperature of the condensed gaseous phase to increase in order to form a high-purity gaseous phase within the predetermined headspace volume; and allowing the temperature of the frozen antimony-containing material to increase in order to reform into a liquid phase.

於第六態樣,一種使用填充了高純度含銻材料之低於大氣壓之儲存和輸送容器的方法,其包含:將容器可操作地連接至下游離子植入工具;在低於大氣壓之儲存和輸送容器的下游建立小於佔據容器的預定頭部空間容積之高純度氣相含銻材料的蒸氣壓之壓力;將閥致動至開啟位置;在沒有加熱下從容器的預定頭部空間容積來配送含銻材料,該含銻材料在沒有載氣下以0.1sccm或更大的流率作為高純度的氣相配送;在沒有載氣下以0.1sccm或更大的流率使高純度的氣相含銻材料朝向離子植入工具流動;以及在沒有加熱下從容器中的對應液相蒸發額外的含銻材料,而以0.1sccm或更大的流率從頭部空間繼續供應高純度的氣相含銻材料。 In the sixth aspect, a method for using a storage and delivery container filled with high-purity antimony-containing material at sub-atmospheric pressure includes: operatively connecting the container to a downstream ion implantation tool; establishing a pressure downstream of the sub-atmospheric pressure storage and delivery container at a pressure less than the vapor pressure of the high-purity vapor antimony-containing material occupying a predetermined headspace volume of the container; actuating a valve to an open position; and dispensing from the predetermined headspace volume of the container without heating. An antimony-containing material, delivered as a high-purity gaseous phase at a flow rate of 0.1 sccm or greater without a carrier gas; the high-purity gaseous antimony-containing material flowing toward an ion implantation tool at a flow rate of 0.1 sccm or greater without a carrier gas; and the evaporation of additional antimony-containing material from the corresponding liquid phase in the container without heating, while continuing to supply high-purity gaseous antimony-containing material from the headspace at a flow rate of 0.1 sccm or greater.

100:氣體箱 100: Gas Box

101:含Sb液態源材料 101: Sb-containing liquid source material

102:流動控制裝置 102: Flow control device

103:電弧室 103: Arc Chamber

104:離子束抽取(系統) 104: Ion Beam Extraction (System)

105:質量解析器/過濾器 105: Quality Analyzer/Filter

106:加速/減速 106: Acceleration/Deceleration

107:末端站,植入端站 107: Terminal station, embedded terminal station

108:標靶工件 108: Target workpiece

200:氣體箱 200: Gas Box

201:含Sb液態源材料 201: Sb-containing liquid source materials

202:流動控制裝置 202: Flow control device

203:電漿室 203: Plasma Chamber

204:標靶工件 204: Target workpiece

205:平臺 205: Platform

300:儲存和輸送容器 300: Storage and transport containers

310:入口埠 310: Port of Entry

311:閥 311: Valve

320:出口埠 320: Export Port

321:閥 321: Valve

330:真空致動止回閥 330: Vacuum-actuated check valve

335:頭部空間 335: Headroom

336:頭部空間 336: Headroom

401:頭部空間 401: Headroom

從本發明下列關於附圖之較佳具體實施例的詳述,將更好理解本發明的目的和優點,其中全篇相同的數字表示相同的特徵,並且其中:[圖1]顯示併入本發明原理的束線離子植入系統; [圖2]顯示併入本發明原理的電漿浸沒離子植入系統;[圖3]顯示併入本發明原理的範例性儲存和輸送容器;以及[圖4]顯示併入本發明原理的替代選擇性儲存和輸送容器。 The purpose and advantages of the present invention will be better understood from the following detailed description of preferred embodiments with reference to the accompanying drawings, wherein the same numbers throughout denote the same features, and wherein: [Figure 1] shows a wire-based ion implantation system incorporated into the principles of the present invention; [Figure 2] shows a plasma-immersed ion implantation system incorporated into the principles of the present invention; [Figure 3] shows an exemplary storage and transport container incorporated into the principles of the present invention; and [Figure 4] shows an alternative storage and transport container incorporated into the principles of the present invention.

從以下詳述最能理解本發明之多樣元件的關係和功能。如在本揭示的範圍裡,詳述思及呈多樣排列和組合的特徵、態樣及具體實施例。本揭示因而可能指定成包含這些具體特徵、態樣及具體實施例或其選擇的一或多者之任一此種組合和排列、由其所構成、或基本上由其所構成。 The relationship and function of the various elements of the present invention are best understood from the following detailed description. Within the scope of this disclosure, various arrangements and combinations of features, forms, and specific embodiments are described in detail. This disclosure may therefore be specified as including, constituting, or substantially constituting any such combination and arrangement of, including, or consisting of, one or more of these specific features, forms, and specific embodiments or alternatives thereof.

本發明可能包括以下任一態樣的多樣組合,並且也可能包括下面說明書或附圖所述的任何其他態樣。如在此所用,「具體實施例」(embodiment)一詞意謂藉由範例而用來示範但無限制的具體實施例。 This invention may include various combinations of any of the following embodiments, and may also include any other embodiments described in the following description or accompanying drawings. As used herein, the term "embodiment" means a specific embodiment that is illustrated by way of example but is not limited thereto.

如在此及全篇所用,「含Sb離子」(Sb-containing ion)或「Sb離子」(Sb ion)等詞意謂適合植入基板中的多樣Sb離子物種,包括Sb離子或含Sb離子(例如Sb+或Sb2+)和寡聚離子(例如但不限於Sb2 +)。 As used herein and throughout, the terms “Sb-containing ion” or “Sb ion” mean a variety of Sb ion species suitable for implantation into a substrate, including Sb ions or Sb-containing ions (e.g., Sb + or Sb2 + ) and oligomeric ions (e.g., but not limited to Sb2 + ).

如在此及全篇所用的「基板」(substrate)是指需要離子植入的任何材料,包括但不限於晶圓或其他切 片或非切片式材料或類似的標靶物體,其由任何適合的材料所形成,包括矽、二氧化矽、鍺、砷化鎵及其合金,而例如摻雜離子之別的材料則植入當中。 As used herein and throughout, "substrate" refers to any material to which ion implantation is required, including but not limited to wafers or other sliced or unsliced materials or similar targets, formed of any suitable material, including silicon, silicon dioxide, germanium, gallium arsenide, and their alloys, with other materials such as those doped with ions implanted therein.

應了解「Sb」和「銻」(antimony)將在此及全篇可互換地使用,並且打算具有相同的意義。對「含Sb材料」(Sb-containing material)、「含Sb源材料」(Sb-containing source material)或「Sb源材料」(Sb source material)的參考打算是指本發明的液相銻材料以及與液相呈實質平衡的對應氣相。「含Sb的液態源材料」(Sb-containing liquid source material)打算意謂本發明與對應氣相呈實質平衡的材料。 It should be understood that "Sb" and "antimony" will be used interchangeably herein and throughout the text, and are intended to have the same meaning. Reference to "Sb-containing material," "Sb-containing source material," or "Sb source material" is intended to refer to the liquid-phase antimony material of the present invention and the corresponding gas phase in substantial equilibrium with the liquid phase. "Sb-containing liquid source material" is intended to mean the material of the present invention in substantial equilibrium with the corresponding gas phase.

如在此及全篇所用,「容器」(vessel、container)一詞可互換地使用,並且打算意謂任何類型的儲存、填充、運輸和/或輸送容器,包括但不限於筒、杜瓦瓶(dewar)、瓶、槽、桶、大桶(bulk)及微桶(microbulk),其適合填充、儲存、運輸和/或輸送材料。與此種用法一致的是「儲存和輸送容器」(storage and delivery vessel、storage and delivery container)一詞將在此及全篇可互換地使用,並且打算意謂本發明具體設計的容器,其是適合貯留含銻材料的供應源,其貯留的方式則使容器中之額外的液相含銻材料能夠以等於或大於配送之氣相流率的輸送速率來蒸發至預定的頭部空間容積中。 As used herein and throughout, the term "vessel" (or "container") may be used interchangeably and is intended to mean any type of container suitable for the storage, filling, transport, and/or conveying of materials, including but not limited to cylinders, dewars, bottles, troughs, barrels, bulks, and microbulks. Consistent with this usage, the terms "storage and delivery vessel" and "storage and delivery container" will be used interchangeably herein and throughout the text, and are intended to refer to a container specifically designed for storing a source of antimony-containing material in a manner that allows additional liquid antimony-containing material within the container to evaporate into a predetermined headspace volume at a delivery rate equal to or greater than the gaseous flow rate of the delivery.

如在此及全篇所用的「減少」(reduce、reduced或reduction)係參考離子植入程序,並且打算意謂 (i)縮短、抑制和/或延遲有害事件的開始或發生(譬如減少分解反應、減少離子短路);或(ii)份量下降到不可接受的程度而不能夠達成具體目的(譬如減少流動而不能持續電漿);或(iii)下降至非實質量而不負面地衝擊具體目的(譬如減少寡聚物的量而不破壞進入電弧室的流動穩定性);或(iv)相較於習用實務而減少了顯著量,但這不更改所欲功能(譬如減少隨管加熱[heat tracing]但仍維持材料的氣相而讓該材料不沿著管道再凝結)。 As used herein and throughout, “reduce” (reduced or reduction) refers to ion implantation procedures and is intended to mean: (i) shortening, inhibiting, and/or delaying the onset or occurrence of harmful events (e.g., reducing decomposition reactions, reducing ion short circuits); or (ii) reducing the quantity to an unacceptable level to achieve the intended purpose (e.g., reducing flow to the point of unsustainable plasma); or (iii) reducing the quantity to a non-substantial level without negatively impacting the intended purpose (e.g., reducing the amount of oligomers without compromising flow stability into the arc chamber); or (iv) a significant reduction compared to conventional practice, but without altering the desired function (e.g., reducing heat in the tube). [Tracing] However, it maintains the material's gaseous phase, preventing it from re-condensing along the pipe.

如在此和全篇所用,「約」(about)或「近似」(approximately)當指稱可測量的數值時(例如份量或時間量)係意謂涵蓋偏離指定數值之±20%、±10%、±5%、±1%、±0.1%的變異,因為此種變異是適當的。 As used herein and throughout the text, "about" or "approximately," when referring to measurable values (such as quantities or amounts of time), means to cover variations of ±20%, ±10%, ±5%, ±1%, or ±0.1% from the specified value, as such variations are appropriate.

如在此和全篇所用的「高純度」(high purity)意謂95體積%或更大的純度。 As used here and throughout the text, "high purity" means 95% by volume or greater.

如在此和全篇所用的「周遭條件」(ambient condition)意謂環境的條件,包括周遭溫度和周遭壓力,其係直接接觸填充了本發明之含Sb材料的儲存和輸送容器。 As used herein and throughout, "ambient condition" refers to environmental conditions, including ambient temperature and ambient pressure, that are in direct contact with the storage and transport container filled with the Sb-containing material of this invention.

如在此和全篇所用的「微量」(trace amount)意謂聚集物中之雜質(較佳而言包括水氣、氮及任何其他氣態雜質)的濃度是5體積%或更小。 As used herein and throughout, "trace amount" means that the concentration of impurities (preferably including water vapor, nitrogen, and any other gaseous impurities) in the aggregate is 5% by volume or less.

本揭示全篇可以用範圍格式來呈現本發明的多樣態樣。應了解範圍格式的敘述僅是為了簡便且不應視為對本發明範圍的限制。據此,範圍的敘述應視為已具體 揭示所有可能的次範圍以及該範圍裡的單獨數值。舉例而言,例如從1到6的範圍敘述應視為已經具體揭示次範圍(例如從1到3、1到4、從1到5、從2到4、從2到6、從3到6…等)以及該範圍裡的個別數字(舉例而言為1、2、2.7、3、4、5、5.3、6及其間的任何完整及部分增量)。此不論範圍寬度而皆適用。 This disclosure can be presented in a range format to represent the various aspects of the invention. It should be understood that the range format is for simplicity only and should not be considered a limitation on the scope of the invention. Accordingly, a range description should be considered as specifically disclosing all possible subranges and individual numerical values within that range. For example, a range description from 1 to 6 should be considered as specifically disclosing subranges (e.g., from 1 to 3, 1 to 4, 1 to 5, 2 to 4, 2 to 6, 3 to 6, etc.) and individual numbers within that range (e.g., 1, 2, 2.7, 3, 4, 5, 5.3, 6, and any complete and partial increments therebetween). This applies regardless of the range width.

已經認出利用含銻材料來做離子植入。就此而言,Kasley等人揭示使用SbF5作為銻源,其係將SbF5容器加熱至52℃以在容器中產生SbF5的足夠蒸氣壓而用於將銻植入矽基板中。雖然Kasley等人揭示此種做法在小規模的實驗室設定下是可行的用途,不過當嘗試放大規模於作業用途時,本發明認出此種做法的缺失。具體而言,在作業設定下,在較高溫度(譬如高於周遭溫度的溫度)加熱所產生的SbF5蒸氣具有在下游沿著銻容器和離子植入工具之間所延伸的流動線路而凝結的傾向,因為流動線路典型而言維持在周遭條件。SbF5蒸氣在進入離子植入機前就沿著流動線路凝結,因而無法達成SbF5之穩定、充分且持續的氣相流動。 The use of antimony-containing materials for ion implantation has been recognized. In this regard, Kasley et al. disclosed the use of SbF5 as the antimony source, which involves heating an SbF5 container to 52°C to generate sufficient vapor pressure of SbF5 within the container for antimony implantation into a silicon substrate. While Kasley et al. demonstrated that this approach is feasible for small-scale laboratory settings, this invention recognizes its shortcomings when attempting to scale up for operational applications. Specifically, in operational settings, the SbF5 vapor generated by heating at higher temperatures (e.g., temperatures above ambient temperature) tends to condense downstream along a flow path extending between the antimony container and the ion implantation tool, as the flow path typically remains within ambient conditions. SbF5 vapor condenses along the flow path before entering the ion implanter, thus failing to achieve stable, sufficient, and continuous gas phase flow of SbF5 .

為了克服此種缺失,本發明認出使用者須將銻源容器和離子植入工具之間的整條流動線路都維持在高溫。然而,從作業觀點來看,關於需要加熱設備以維持在顯著高之電位(譬如10kV~100kV)的離子植入系統,系統設計和作業變得更為複雜。此種高電位程度可以造成安全風險,而緊鄰於離子植入系統和加熱設備之流動線路裡存在 的毒性、腐蝕性和/或可燃性材料也來造成風險。 To overcome this deficiency, the present invention recognizes that the user must maintain the entire flow path between the antimony source container and the ion implantation tool at high temperatures. However, from an operational perspective, the system design and operation become more complex for ion implantation systems that require heating equipment to maintain significantly high potentials (e.g., 10kV~100kV). This high potential level can pose safety risks, and the presence of toxic, corrosive, and/or flammable materials in the flow path adjacent to the ion implantation system and heating equipment also poses risks.

鑒於缺乏適合用於離子植入之Sb源材料的儲存和輸送系統,已出現本發明。本發明認識且考慮到以上限制來提供獨特解決方案以儲存和輸送含銻材料,其用於離子植入應用以及需要受控且持續的氣相含Sb材料流動至下游程序的其他應用。 The present invention addresses the lack of suitable storage and transport systems for Sb source materials used in ion implantation. Recognizing and considering the aforementioned limitations, the present invention provides a unique solution for storing and transporting antimony-containing materials for ion implantation applications and other applications requiring controlled and continuous flow of gaseous Sb-containing materials to downstream processes.

本發明於一態樣係關於一種用於含銻材料的儲存和輸送容器,該材料適合離子植入作為n型摻雜物,該容器包含以下屬性:(i)含銻材料可以在周遭條件下、以低於大氣壓的條件來儲存成液相,其中儲存條件是在無雜質的環境,其特徵在於容器的頭部空間中沒有微量的水氣、氮及任何其他氣態雜質,這在此定義成基於頭部空間容積而不大於約5體積%;(ii)含銻材料由不含碳的化學式所代表;(iii)儲存和輸送容器具有頭部空間預定容積,其含有與液相呈實質平衡的氣相含銻材料,其中頭部空間預定容積有大於1L的體積;以及(iv)儲存和輸送容器壁是由在周遭條件下之導熱率大於5W/m-K的材料所製成;以及(v)儲存和輸送系統在其用於銻植入程序期間維持在周遭條件。低於大氣壓之儲存和輸送容器能夠如在此所述以95體積%或更大的純度及以持續、充分且穩定的流率來提供持續且充分流動的氣相銻源材料。更佳而言,氣相銻源材料的純度是99%或更大。儲存和輸送容器建構成操作而使得液相含銻材料的蒸發速率可以在沒有外部加熱下、在預定的頭部空間容積中形成對應氣相,該蒸發速率等於或大 於在對應氣相的配送期間從預定的頭部空間容積抽出對應氣相的速率。 This invention relates to a container for storing and transporting antimony-containing materials suitable for ion implantation as n-type dopant. The container possesses the following properties: (i) the antimony-containing material can be stored in a liquid phase under ambient conditions at a pressure below atmospheric pressure, wherein the storage conditions are in an impurity-free environment, characterized by the absence of trace amounts of water vapor, nitrogen, and any other gaseous impurities in the headspace of the container, defined herein as having a headspace volume not exceeding approximately 5 volumes. (ii) the antimony-containing material is represented by a carbon-free chemical formula; (iii) the storage and delivery container has a predetermined headspace volume containing gaseous antimony-containing material in substantial equilibrium with the liquid phase, wherein the predetermined headspace volume has a volume greater than 1 L; and (iv) the walls of the storage and delivery container are made of a material with a thermal conductivity greater than 5 W/m-K under ambient conditions; and (v) the storage and delivery system is maintained under ambient conditions during its use in antimony implantation procedures. The storage and delivery container at subatmospheric pressure can provide a continuous and adequately flowing gaseous antimony source material with a purity of 95% by volume or greater and at a continuous, adequate, and stable flow rate, as described herein. More preferably, the purity of the vapor-phase antimony source material is 99% or greater. The storage and transport containers are configured to operate such that the evaporation rate of the liquid-phase antimony-containing material can form a corresponding vapor phase within a predetermined headspace volume without external heating, and this evaporation rate is equal to or greater than the rate at which the corresponding vapor phase is extracted from the predetermined headspace volume during delivery.

含Sb源材料在儲存條件下具有與對應氣相呈實質平衡的液相。材料在周遭溫度下維持穩定,並且在離子植入使用期間不具有分解的傾向。呈液體的含Sb材料具有適當蒸氣壓,其在此定義成可以對電弧室持續約0.1~100sccm、較佳而言0.3~10sccm、更佳而言1~10sccm、最佳而言1~5sccm之流率的蒸氣量。尤其,氣相含Sb材料的流率是適當的以便在離子植入機的作業期間產生且維持穩定的電漿。穩定的電漿允許Sb離子的植入發生在約50~150V的電弧電壓和跨越抽取電極之約1~300kV的抽取電壓,藉此產生含Sb離子束。含Sb離子束電流的範圍從約10μA到100mA,導致進入基板中的Sb離子劑量是約1x1011至1x1016atom/cm2The Sb-containing source material has a liquid phase in substantial equilibrium with the corresponding gas phase under storage conditions. The material remains stable at ambient temperature and does not tend to decompose during ion implantation. The liquid Sb-containing material has an appropriate vapor pressure, defined herein as a vapor flow rate that can sustainably supply the arc chamber at a rate of approximately 0.1–100 sccm, preferably 0.3–10 sccm, more preferably 1–10 sccm, and most preferably 1–5 sccm. In particular, the flow rate of the gaseous Sb-containing material is appropriate to generate and maintain a stable plasma during operation of the ion implanter. A stable plasma allows Sb ion implantation to occur at an arc voltage of approximately 50–150 V and a extraction voltage of approximately 1–300 kV across the extraction electrode, thereby generating an Sb ion beam. The Sb ion beam current ranges from approximately 10 μA to 100 mA, resulting in an Sb ion dose of approximately 1 x 10¹¹ to 1 x 10¹⁶ atom/ cm² entering the substrate.

於一態樣,本發明的含Sb源材料儲存於容器中而液相與氣相呈實質平衡,藉此氣相是在不須外部加熱施加於容器、在周遭溫度而從容器以高純度來抽出。申請人已發現若外部加熱施加於容器則可能造成問題。尤其,若外部加熱施加於容器且不施加於管線、閥和/或質流控制器,則含Sb材料可以凝結於溫度低於容器的管線、閥和/或質流控制器。此凝結可以使流動不穩定且導致系統組件阻塞而最終避免含Sb材料流動。若外部加熱施加於容器,則申請人發現加熱必須施加至暴露於含Sb材料的所有組件,包括管線、閥、質流控制器,使得管線、閥、質流 控制器的溫度大於或等於容器的溫度。然而,此增添系統設計的複雜度,特別是在離子植入系統,因為加熱設備須維持在顯著為高的電位(10kV~100kV),這造成安全風險。為此緣故,含Sb材料應能夠在周遭溫度下維持穩定且充分的流率而不使用外部加熱。於一範例,周遭溫度的範圍可以從10℃到35℃。在周遭溫度下之可持續、充分且穩定的流動範圍是0.1~100sccm、較佳而言0.3~10sccm、更佳而言1~10sccm、最佳而言1~5sccm。 In one embodiment, the Sb-containing source material of this invention is stored in a container where the liquid and gas phases are in substantial equilibrium, thereby allowing the gas phase to be extracted from the container at ambient temperature without external heating. The applicant has discovered that external heating applied to the container can cause problems. In particular, if external heating is applied to the container but not to the piping, valves, and/or mass flow controllers, the Sb-containing material can condense on the piping, valves, and/or mass flow controllers at temperatures lower than the container. This condensation can cause flow instability and blockage of system components, ultimately preventing the flow of the Sb-containing material. If external heating is applied to the container, the applicant has found that heating must be applied to all components exposed to the Sb-containing material, including piping, valves, and mass flow controllers, such that the temperature of the piping, valves, and mass flow controllers is greater than or equal to the temperature of the container. However, this increases the complexity of the system design, especially in ion implantation systems, because the heating equipment must be maintained at significantly high potentials (10kV~100kV), posing safety risks. For this reason, the Sb-containing material should be able to maintain a stable and sufficient flow rate at ambient temperature without the use of external heating. In one example, the ambient temperature range can be from 10°C to 35°C. The sustainable, sufficient, and stable flow range at ambient temperature is 0.1~100 sccm, preferably 0.3~10 sccm, more preferably 1~10 sccm, and most preferably 1~5 sccm.

於本發明的另一態樣,本發明的含Sb源材料儲存於容器中呈液相而與其氣相呈實質平衡,該氣相佔據容器的頭部空間,而頭部空間具有預定的容積,充分量的液相含銻材料可以蒸發至該容積中以形成對應氣相。氣相的含Sb源材料可以從容器的蒸氣空間以高純度來抽出,並且在周遭溫度條件下沿著管道輸送至離子植入機的電弧室中。有利而言,儲存容器提供的蒸氣頭部空間具有大於1L的預定容積。儲存容器的內壁在周遭條件下具有大於5W/m-K的導熱率,並且內壁適當接觸著液體。以此方式,則充分量的含Sb源材料在周遭溫度下蒸發成氣相,以持續著約0.1~100sccm、較佳而言0.3~10sccm、更佳而言1~10sccm、最佳而言1~5sccm的流率而流動至電弧室中。 In another embodiment of the invention, the Sb-containing source material is stored in a container in a liquid phase in substantial equilibrium with its gaseous phase. This gaseous phase occupies the headspace of the container, which has a predetermined volume into which a sufficient amount of the liquid antimony-containing material can evaporate to form the corresponding gaseous phase. The gaseous Sb-containing source material can be extracted with high purity from the vapor space of the container and transported along a conduit to the arc chamber of the ion implanter under ambient temperature conditions. Advantageously, the vapor headspace provided by the storage container has a predetermined volume greater than 1 L. The inner wall of the storage container has a thermal conductivity greater than 5 W/m-K under ambient conditions and is appropriately in contact with the liquid. In this manner, a sufficient amount of Sb-containing source material evaporates into a gaseous phase at the ambient temperature and flows into the arc chamber at a continuous flow rate of approximately 0.1–100 sccm, preferably 0.3–10 sccm, more preferably 1–10 sccm, and most preferably 1–5 sccm.

申請人已發現須維持液態含Sb源材料的蒸發速率以沿著管道產生至少約0.1sccm或更大的氣相流率到電弧室中。當含Sb源液體的蒸發速率是或低於特定閾值,使得所得之氣相含Sb源材料的流率是或低於約0.1sccm, 則氣相的含Sb材料可能以比容器中所含的含Sb源材料之蒸發速率還快的速率而沿著管道流動至電弧室中。對電弧室的流動可能不是可持續的,並且最終減少到不可接受的低程度或具有變成不穩的傾向。最終而言,在最糟的情境下,流動可能完全停止或減少到離子束變得不穩定且故障的程度,以致須中止整個植入程序。 The applicant has discovered that the evaporation rate of the liquid Sb-containing source material must be maintained to generate a gaseous flow rate of at least about 0.1 sccm or greater into the arc chamber via conduit. When the evaporation rate of the Sb-containing liquid is at or below a certain threshold, resulting in a gaseous flow rate of the Sb-containing source material of at or below about 0.1 sccm, the gaseous Sb-containing material may flow into the arc chamber via conduit at a rate faster than the evaporation rate of the Sb-containing source material contained in the container. The flow into the arc chamber may be unsustainable and eventually decrease to an unacceptably low level or tend to become unstable. Ultimately, in the worst-case scenario, the flow may stop completely or decrease to the point that the ion beam becomes unstable and malfunctions, necessitating the termination of the entire implantation procedure.

於替代選擇性具體實施例,以加速蒸發速率的一種可行手段來說,液態源含Sb材料可能儲存於維持在低於大氣壓條件下的儲存和輸送容器,以使液態源材料能夠以相對較高的速率來蒸發,其係足以形成負責產生對電弧室之約0.1~100sccm、較佳而言0.3~10sccm、更佳而言1~10sccm、最佳而言1~5sccm的所需流率之所需氣相源材料量。據此,液態源的含Sb材料以充分速率蒸發成氣相以補足儲存和輸送容器的頭部空間中及沿著延伸至電弧室之管道中的蒸氣,藉此在離子植入機用於Sb離子植入的作業期間生成且維持含Sb源材料在約0.1~100sccm之間、較佳而言0.3~10sccm、更佳而言1~10sccm、最佳而言1~5sccm的氣相流率。 In an alternative specific embodiment, as a feasible means to accelerate the evaporation rate, the liquid source containing Sb may be stored in a storage and transport container maintained at a pressure below atmospheric pressure so that the liquid source material can evaporate at a relatively high rate, which is sufficient to form the required amount of gaseous source material to generate the required flow rate of about 0.1 to 100 sccm, preferably 0.3 to 10 sccm, more preferably 1 to 10 sccm, and most preferably 1 to 5 sccm to the arc chamber. Accordingly, the Sb-containing material from the liquid source evaporates into a gaseous phase at a sufficient rate to replenish the vapor in the head space of the storage and transport container and along the pipes extending to the arc chamber, thereby generating and maintaining a gaseous flow rate of the Sb-containing source material at approximately 0.1–100 sccm, preferably 0.3–10 sccm, more preferably 1–10 sccm, and most preferably 1–5 sccm during the Sb ion implantation operation in the ion implanter.

為了能夠發生蒸發所需的儲存條件,儲存和輸送容器建構有充分的頭部空間容積來讓充分體積的含Sb源蒸氣可以駐留,以允許有必需的氣相流動到延伸至電弧室的管道中。申請人發現儲存和輸送容器係製備且建構有大於或等於0.5L、較佳而言大於或等於1L、更佳而言大於或等於1.5L、最佳而言大於或等於1.8L的頭部空間預 定容積。附帶而言,含Sb液體有充分表面積暴露於儲存和輸送容器裡的氣相並且液體有與內壁充分接觸的面積是較佳的,以允許隨著對應氣相的含Sb材料沿著管道流動而有必需的蒸發來補足儲存和輸送容器的頭部空間,而以高純度來沿此生成實質穩定且持續的含Sb蒸氣流動至電弧室中。具體而言,組合了如在此所述的液體接觸面積,液體暴露於氣相的表面積較佳而言是至少約16cm2、更佳而言大於或等於約50cm2、最佳而言大於約100cm2。於本發明的另一具體實施例,儲存和輸送容器製備成使得含Sb液體有充分的表面積接觸儲存和輸送容器的內壁,以允許含Sb液體有必需的蒸發至頭部空間的預定容積中。蒸發發生以便隨著含Sb蒸氣離開頭部空間且沿著管道流動而以含銻蒸氣來補足儲存和輸送容器的頭部空間,以在離子植入程序期間沿此生成實質穩定(亦即穩定且持續)和充分流動的含Sb蒸氣而到電弧室中。熱能必須添加至含Sb液體以將給定量的含Sb液體蒸發成蒸氣。當蒸發特定部分的液體而發生此能量轉移時,儲存和輸送容器中之剩餘的含Sb液體可以有局部的溫降,其降低到低於周遭溫度的溫度。然而,若儲存和輸送容器的內壁和儲存和輸送容器裡的含Sb液體之間有充分接觸,則熱可以經由傳導而從暴露於在周遭溫度下、在儲存和輸送容器外面之環境的儲存和輸送容器壁轉移至含Sb液體。結果便是含Sb液體可以維持在近似相同於容器外部溫度的周遭溫度。舉例來說,對於約335mL的液體體積和約1.865L的頭部空間容積而言,液體暴露於內 壁的表面積是至少約110cm2、較佳而言大於或等於約260cm2、更佳而言大於或等於約530cm2。舉另一例來說,對於約112mL的液體體積和約2.088L的頭部空間容積而言,液體暴露於內壁的表面積是至少約50cm2、較佳而言大於或等於約140cm2、更佳而言大於或等於約300cm2。舉另一例來說,對於約1L的液體體積和約1.2L的頭部空間容積而言,液體暴露於壁的表面積較佳而言是至少約300cm2、較佳而言大於或等於約600cm2、更佳而言大於或等於約1000cm2To provide the necessary storage conditions for evaporation, the storage and transport container is constructed with sufficient headspace volume to retain a sufficient volume of Sb-containing source vapor, allowing the necessary gas phase flow into the conduit extending into the arc chamber. The applicant has found that the storage and transport container is manufactured and constructed with a predetermined headspace volume of ≥0.5L, preferably ≥1L, more preferably ≥1.5L, and most preferably ≥1.8L. Incidentally, it is preferable that the Sb-containing liquid has sufficient surface area exposed to the gas phase within the storage and transport container, and that the liquid has sufficient contact area with the inner wall, to allow the necessary evaporation as the corresponding Sb-containing material in the gas phase flows along the conduit to fill the headspace of the storage and transport container, thereby generating a substantial, stable, and continuous flow of Sb-containing vapor with high purity into the arc chamber. Specifically, combining the liquid contact area as described herein, the surface area of the liquid exposed to the gas phase is preferably at least about 16 cm² , more preferably greater than or equal to about 50 cm² , and most preferably greater than about 100 cm² . In another specific embodiment of the invention, the storage and transport container is prepared such that the Sb-containing liquid has sufficient surface area in contact with the inner wall of the storage and transport container to allow the necessary evaporation of the Sb-containing liquid into a predetermined volume of the headspace. Evaporation occurs so that the headspace of the storage and transport container is replenished with antibacterial vapor as the Sb-containing vapor leaves the headspace and flows along the conduit, thereby generating substantially stable (i.e., stable and continuous) and sufficiently flowing Sb-containing vapor into the arc chamber during the ion implantation procedure. Thermal energy must be added to the Sb-containing liquid to evaporate a given amount of the Sb-containing liquid into vapor. When this energy transfer occurs as a specific portion of the liquid evaporates, the remaining Sb-containing liquid in the storage and transport container can experience a localized temperature drop, falling below the ambient temperature. However, if there is sufficient contact between the inner wall of the storage and transport container and the Sb-containing liquid inside, heat can be transferred by conduction from the container wall, which is exposed to the ambient temperature outside the container, to the Sb-containing liquid. As a result, the Sb-containing liquid can be maintained at an ambient temperature approximately the same as the temperature outside the container. For example, for a liquid volume of approximately 335 mL and a headroom volume of approximately 1.865 L, the surface area of the liquid exposed on the inner wall is at least approximately 110 cm² , preferably greater than or equal to approximately 260 cm² , and more preferably greater than or equal to approximately 530 cm² . As another example, for a liquid volume of approximately 112 mL and a headroom volume of approximately 2.088 L, the surface area of the liquid exposed on the inner wall is at least approximately 50 cm² , preferably greater than or equal to approximately 140 cm² , and more preferably greater than or equal to approximately 300 cm² . For another example, for a liquid volume of about 1 L and a headroom volume of about 1.2 L, the surface area of the liquid exposed on the wall is preferably at least about 300 cm² , preferably greater than or equal to about 600 cm² , and more preferably greater than or equal to about 1000 cm² .

為了進一步增加含銻液體接觸容器內壁的表面積,不同的堆疊材料可能添加到儲存和輸送容器的裡面。舉例來說,可以利用多樣形狀的金屬,包括球、磚、薄片、筒、鞍、環、方塊、篩網、粉末。堆疊材料可能至少部分浸沒於液相中。 To further increase the surface area of the antimony-containing liquid in contact with the inner wall of the container, various stacked materials may be added to the inside of the storage and transport containers. For example, metals of various shapes can be used, including spheres, bricks, sheets, cylinders, saddles, rings, cubes, screens, and powders. The stacked material may be at least partially immersed in the liquid phase.

除了與容器的內壁有適當的液體接觸表面積以外,儲存和輸送容器較佳而言還由導熱率足以利於熱傳導至儲存和輸送容器中之含Sb液體的材料所製成,以在液體蒸發成氣相和含Sb材料的流動期間維持在恆定溫度。舉例來說,儲存和輸送容器可能是由碳鋼(在293K為54W/m*K)、不鏽鋼(在293K為12~45W/m*K)、鐵(在300K為80W/m*K)、鋁(在300K為273W/m*K)、銅(在300K為398W/m*K)、金(在300K為315W/m*K)或銀(在300K為424W/m*K)所製成。碳和不鏽鋼的導熱率係得自工程工具箱(Engieering Toolbox)網站,元素導熱率數值則取自 Perry的化學工程手冊。於較佳具體實施例,儲存和輸送容器之壁的導熱率大於或等於含Sb材料的導熱率。於另一具體實施例,儲存和輸送容器之壁的導熱率大於或等於1W/m*K、較佳而言大於5W/m*K、更佳而言大於或等於10W/m*K、最佳而言大於或等於16W/m*K。 In addition to having an appropriate liquid contact surface area with the inner wall of the container, the storage and transport containers are preferably made of a material with sufficient thermal conductivity to facilitate heat conduction to the Sb-containing liquid in the storage and transport containers, so as to maintain a constant temperature during the evaporation of the liquid into the gas phase and the flow of the Sb-containing material. For example, storage and transport containers might be made of carbon steel (54 W/m*K at 293K), stainless steel (12~45 W/m*K at 293K), iron (80 W/m*K at 300K), aluminum (273 W/m*K at 300K), copper (398 W/m*K at 300K), gold (315 W/m*K at 300K), or silver (424 W/m*K at 300K). The thermal conductivity of carbon and stainless steel is obtained from the Engineering Toolbox website, while the elemental thermal conductivity values are taken from Perry's Chemical Engineering Handbook. In a preferred embodiment, the thermal conductivity of the walls of the storage and transport container is greater than or equal to the thermal conductivity of the Sb-containing material. In another preferred embodiment, the thermal conductivity of the walls of the storage and transport container is greater than or equal to 1 W/m*K, more preferably greater than 5 W/m*K, even more preferably greater than or equal to 10 W/m*K, and most preferably greater than or equal to 16 W/m*K.

用於含Sb源材料的其他儲存條件可能使液態源材料的蒸發速率不可接受地低。舉例而言,若含Sb液態源材料儲存於壓力等於或大於大氣壓的儲存和輸送容器中,則氣相含Sb之液態源材料的分壓可能不足,因為空氣、N2或任何其他惰性和/或反應性氣體物種在填充作業之時可能已經不經意地引入儲存和輸送容器的頭部空間中。附帶而言,在此種情境下,氣相含Sb材料被其他汙染物所汙染可以讓材料不適合用於離子植入程序,該程序一般而言無法容忍將汙染物(包括大氣汙染物)引入到電弧室中。 Other storage conditions for Sb-containing source materials may result in unacceptably low evaporation rates of the liquid source material. For example, if Sb-containing liquid source material is stored in a storage and transport container at pressures equal to or greater than atmospheric pressure, the partial pressure of the gaseous Sb-containing liquid source material may be insufficient because air, N2 , or any other inert and/or reactive gas species may be inadvertently introduced into the headspace of the storage and transport container during filling operations. Incidentally, in this scenario, contamination of the gaseous Sb-containing material with other pollutants may render the material unsuitable for ion implantation procedures that generally cannot tolerate the introduction of pollutants (including atmospheric pollutants) into the arc chamber.

於另一態樣,含Sb源材料儲存在具有無雜質之環境的儲存和輸送容器中,該環境不含大於微量的溼氣和其他大氣雜質。在有溼氣時,鹵化的含Sb化合物可以反應而形成Sb2O3、H2、HF或HCl。此種不含微量雜質的無雜質環境可以藉由幾種技術而在儲存容器中達成,其中一種技術包括進行所謂的「凍結-泵抽-解凍」(freeze pump thaw)循環。於凍結-泵抽-解凍的一循環,冷卻含Sb源材料,使得所有含Sb源材料蒸氣從氣相凝結且含Sb液體凍結,而例如溼氣和氮的其他汙染物維持呈氣相。在允許含 Sb源材料有充分時間凝結之後,容器的頭部空間使用幫浦排空,同時容器繼續冷卻,以便移除實質上所有的蒸氣汙染物,並且含Sb材料在容器中維持呈固體、液體或其混合物。當已經移除汙染物時,包封住容器,並且呈固體、液體或其混合物的含Sb材料加熱至周遭溫度以再形成液體和與液體呈實質平衡的蒸氣。以此方式,則避免溼氣和其他雜質(特別是大氣雜質)引入儲存和輸送容器中。替代選擇或附帶而言,其他技術可能用於達成用於含Sb材料之無溼氣和氣體的環境,包括但不限於以氟來鈍化容器的內表面。 Alternatively, Sb-containing source materials are stored in storage and transport containers in an impurity-free environment free from trace amounts of moisture and other atmospheric impurities. In the presence of moisture, halogenated Sb-containing compounds can react to form Sb₂O₃ , H₂ , HF, or HCl. This trace - free environment can be achieved in the storage container using several techniques, one of which involves a so-called "freeze-pump-thaw" cycle. In a freeze-pump-thaw cycle, the Sb-containing source material is cooled, causing all Sb-containing vapors to condense from the gas phase and the Sb-containing liquid to freeze, while other contaminants such as moisture and nitrogen remain in the gas phase. After sufficient time has been allowed for the Sb-containing source material to condense, the headspace of the container is emptied using a pump while the container continues to cool to remove virtually all vapor contaminants, and the Sb-containing material remains in the container as a solid, liquid, or mixture thereof. Once the contaminants have been removed, the container is sealed, and the Sb-containing material, in its solid, liquid, or mixture thereof, is heated to ambient temperature to reform into a liquid and vapors in substantial equilibrium with the liquid. In this way, moisture and other impurities (especially atmospheric impurities) are prevented from being introduced into the storage and transport containers. As an alternative or incidental approach, other technologies may be used to achieve a moisture- and gas-free environment for Sb-containing materials, including but not limited to passivating the inner surface of the container with fluorine.

於一具體實施例,所得的氣相組成物在頭部空間中包括雜質,其不大於5體積%。多樣的氣相雜質包含0到4體積%的N2、0到0.5體積%的O2、0到0.49體積%的HF、0到0.01體積%的H2O;其餘則是構成含銻材料的氣相。高純度含銻材料可以具有液相,其包含不大於1體積%雜質的液相雜質總量,其中液相雜質包含0到0.1體積%的N2、0到0.1體積%的O2、0到0.6體積%的HF、0到0.1體積%的SbF3、0到0.1體積%的Sb2O3;其餘則是構成含銻材料的液相。 In one specific embodiment, the resulting gaseous composition includes impurities in the headspace, which are no more than 5% by volume. The diverse gaseous impurities include 0 to 4% by volume N2 , 0 to 0.5% by volume O2 , 0 to 0.49% by volume HF, and 0 to 0.01% by volume H2O ; the remainder is the gaseous phase constituting the antimony-containing material. High-purity antimony-containing materials can have a liquid phase containing no more than 1% by volume of liquid phase impurities, wherein the liquid phase impurities include 0 to 0.1% by volume N2 , 0 to 0.1% by volume O2 , 0 to 0.6% by volume HF, 0 to 0.1% by volume SbF3 , and 0 to 0.1% by volume Sb2O3 ; the remainder constitutes the liquid phase of the antimony-containing material.

在Sb離子植入期間之碳系沉積物的有害效應較佳而言是由本發明所避免。含Sb源材料是由不含碳之化學式所代表的分子以減少或消除碳系沉積物形成於電弧室中和遍及離子源的其他區域。碳系沉積物的範例包括但不限於C、CF及CCl化合物。碳系沉積物可以沿著離子植入 機的多樣組件(包括抽取板,碳系沉積物在此可以使離子束的形狀扭曲)形成鬚晶或其他多樣形狀的沉積物而減少離子源壽命。替代選擇或附帶而言,碳系沉積物可以沉積且累積成基板上的殘餘顆粒。電漿中存在碳也可以降低Sb的束電流,這是因為形成的含碳離子變得自由可得而稀釋了電漿。據此,本發明較佳而言利用不含碳的化學式所代表的含Sb源材料。以此方式,避免含Sb源材料中的碳則減少或消除引入碳衍生的沉積物而進入電弧室以及關聯的有害效應。 The harmful effects of carbon-based deposits during Sb ion implantation are preferably avoided by this invention. The Sb-containing source material is composed of molecules represented by carbon-free chemical formulas to reduce or eliminate the formation of carbon-based deposits in the arc chamber and throughout other areas of the ion source. Examples of carbon-based deposits include, but are not limited to, C, CF, and CCl compounds. Carbon-based deposits can reduce ion source lifetime by forming fibrous or other diverse shapes of deposits along various components of the ion implanter (including the extraction plate, where carbon-based deposits can distort the shape of the ion beam). Alternatively or incidentally, carbon-based deposits can deposit and accumulate as residual particles on the substrate. The presence of carbon in the plasma can also reduce the Sb beam current because the formed carbon ions become free and available, thus diluting the plasma. Accordingly, the present invention preferably utilizes an Sb-containing source material represented by a carbon-free chemical formula. In this way, avoiding carbon in the Sb-containing source material reduces or eliminates the introduction of carbon-derived deposits into the arc chamber and related harmful effects.

於較佳具體實施例,五氟化銻(SbF5)是用於進行離子植入的含Sb源材料。SbF5是腐蝕性液體,其為相對為強的路易士酸且可以與溼氣劇烈反應而產生Sb2O3和HF。如此,則SbF5源材料在低於大氣壓條件下儲存於儲存和輸送容器中,該環境含有小於5體積%的溼氣和其他氣態雜質。在可操作地連接至電弧室的儲存和輸送容器中,SbF5可以在約25℃下維持呈液體而具有約10Torr的蒸氣壓。 In a preferred embodiment, antimony pentafluoride ( SbF5 ) is an Sb-containing source material used for ion implantation. SbF5 is a corrosive liquid, a relatively strong Lewis acid, and reacts violently with moisture to produce Sb₂O₃ and HF. Thus, the SbF5 source material is stored in a storage and transport container under sub-atmospheric pressure conditions, in an environment containing less than 5 % by volume of moisture and other gaseous impurities. In the storage and transport container operatively connected to an arc chamber, SbF5 can remain liquid at approximately 25°C with a vapor pressure of approximately 10 Torr.

思及其他的源材料。舉例而言,於本發明的另一具體實施例,SbCl5是適合離子植入的含銻源材料。在可操作地連接至電弧室的儲存和輸送容器中,SbCl5在約30℃下維持呈液體而具有1.7Torr的蒸氣壓。也可能如在此所述而使用依據本發明之可適用準則的其他源材料。 Other source materials are also considered. For example, in another specific embodiment of the invention, SbCl₅ is an antimony-containing source material suitable for ion implantation. In a storage and transport container operatively connected to an arc chamber, SbCl₅ remains liquid at approximately 30°C and has a vapor pressure of 1.7 Torr. Other source materials may also be used according to the applicable criteria of the invention, as described herein.

儘管有SbF5的穩定性和使用基於液體之材料來做Sb離子植入的程序好處,發明人已經認出利用SbF5和 其他含氟Sb化合物的一項設計挑戰:化合物中存在的氟可能導致電漿有過多的氟離子。氟離子可以傳播所謂的「鹵素循環」(halogen cycle),其中過多的鹵素離子可以使鎢室壁蝕刻至陰極上而產生氟化鎢物種(一般而言由WFx所代表),其可以遷移到熱離子源細絲上而可以在此沉積鎢。沉積鎢則具有增加離子源之操作電壓的傾向,這轉而增加W沉積到離子源細絲上,直到離子源可能最終劣化為止。此鹵素循環具有減少離子源壽命的傾向。 Despite the stability of SbF5 and the advantages of using liquid-based materials for Sb ion implantation, the inventors have recognized a design challenge with SbF5 and other fluorinated Sb compounds: the presence of fluorine in the compounds can lead to an excess of fluoride ions in the plasma. Fluoride ions can propagate in what is known as the "halogen cycle," where excess halogen ions can etch the tungsten chamber walls onto the cathode to produce tungsten fluoride species (generally represented by WFx), which can migrate to the hot ion source filaments where tungsten can be deposited. Depositing tungsten tends to increase the operating voltage of the ion source, which in turn increases the amount of W deposited on the ion source filaments until the ion source may eventually degrade. This halogen cycle tends to reduce the lifetime of the ion source.

為了緩解鹵素循環效應,可以在本發明所思及之SbF5或其他含Sb源材料(尤其是含有氟原子或其他鹵素者)的使用期間併入含氫化合物。含氫化合物可以用任何可能的方式引入電弧室中,包括使含氫化合物與本發明的SbF5或其他含Sb源材料依序流動或同時流動。替代選擇而言,含氫化合物可以與本發明所思及的SbF5或其他含Sb源材料儲存成混合物。適合的含氫化合物包括但不限於H2、CH3F、CH2F2、Si2H6、PH3、AsH3、SiH4、GeH4、B2H6、CH4、NH3或H2S及其任何組合。 To mitigate the halogen cycle effect, a hydrogen-containing compound can be introduced during the use of the SbF5 or other Sb-containing source materials (especially those containing fluorine atoms or other halogens) conceived in this invention. The hydrogen-containing compound can be introduced into the arc chamber in any possible manner, including by sequentially or simultaneously flowing the hydrogen-containing compound with the SbF5 or other Sb-containing source materials conceived in this invention. Alternatively, the hydrogen-containing compound can be stored as a mixture with the SbF5 or other Sb-containing source materials conceived in this invention. Suitable hydrogen-containing compounds include, but are not limited to, H2 , CH3F , CH2F2 , Si2H6 , PH3 , AsH3 , SiH4 , GeH4 , B2H6 , CH4 , NH3 , or H2S , and any combination thereof .

引入電弧室中以緩解鹵素循環之含氫化合物的量應是在有效量,其能夠中和或掃除本發明的含Sb源材料所可能含有之氟或其他鹵素的有害效應。當利用SbF5時,含氫化合物的有效量較佳而言為SbF5和含氫化合物之整體組成物的至少約20體積%,以提供適當量的氫原子來緩解鹵素循環的有害效應。如在此和全篇所用的「有效量」(effective amount)一詞意謂達成所述目標(例如在Sb離 子物種之特定配方下的離子植入期間中和或掃除可能由於鹵素循環或其他原因而出現之氟或其他鹵素離子的有害效應)之特殊材料(例如含氫化合物)的所需量。於一範例,緩解鹵素循環所需之含氫化合物的體積%可以是電弧室中所形成的SbF5和含氫化合物之所得組成性混合物的近似50體積%。應了解含氫化合物的有效量可以大於SbF5和含氫化合物之總組成物的約50體積%。 The amount of hydrogen-containing compound introduced into the arc chamber to mitigate the halogen cycle should be an effective amount, capable of neutralizing or eliminating the harmful effects of fluorine or other halogens that may be present in the Sb-containing source material of the present invention. When using SbF5 , the effective amount of hydrogen-containing compound is preferably at least about 20% by volume of the overall composition of SbF5 and the hydrogen-containing compound, to provide an adequate amount of hydrogen atoms to mitigate the harmful effects of the halogen cycle. As used herein and throughout, the term "effective amount" means the amount of a particular material (e.g., a hydrogen-containing compound) required to achieve the stated objective (e.g., neutralizing or eliminating the harmful effects of fluorine or other halogen ions that may arise due to the halogen cycle or other reasons during ion implantation in a specific formulation of an Sb ion species). In one example, the volume percentage of the hydrogen-containing compound required to alleviate the halogen cycle can be approximately 50% of the volume of the constituent mixture of SbF5 and the hydrogen-containing compound formed in the arc chamber. It should be understood that the effective amount of the hydrogen-containing compound can be greater than approximately 50% of the total composition of SbF5 and the hydrogen-containing compound.

使用本發明所思及的液態源材料,其符合在此定義的可適用準則,而於本發明中避免固態含Sb源,則包括了幾個程序好處。舉例而言,當採用本發明的含Sb源材料時,減少或完全避免了過度加熱,其典型而言是適當揮發固態含Sb源和避免其沿著離子植入系統的管道和流動線路而凝結且沉積所需。至少而言,習用的含Sb固態源須加熱儲存和輸送容器與電弧室之間所延伸的管道,以避免被氣化但可能容易在離子植入期間凝結的含Sb固態源凝結。相對而言,本發明減少了隨管加熱量或消除了隨管加熱。本發明也減少或消除本發明之含Sb材料沉積和累積到室壁和/或離子源細絲上的風險。避免此種過度溫度也減少或消除了可以使Sb離子植入程序難以控制之分解和副反應的傾向。 Using the liquid source material conceived in this invention, which conforms to the applicable criteria defined herein, and avoiding solid Sb-containing sources in this invention, includes several procedural advantages. For example, when using the Sb-containing source material of this invention, overheating is reduced or completely avoided, typically to properly volatilize the solid Sb-containing source and prevent its condensation and deposition along the conduits and flow paths of the ion implantation system. At a minimum, conventional Sb-containing solid sources require heating the conduits extending between the storage and transport containers and the arc chamber to prevent the vaporized but potentially easily condensed Sb-containing solid source from condensing. In contrast, this invention reduces or eliminates in-tube heating. This invention also reduces or eliminates the risk of Sb-containing materials depositing and accumulating on the chamber walls and/or ion source filaments. Avoiding such excessive temperatures also reduces or eliminates the tendency for decomposition and side reactions that can make the Sb ion implantation process difficult to control.

再進一步而言,本發明免除了對載氣或反應性氣體的需要。相對而言,舉例來說當固態含Sb源鍍到緊鄰於電弧室的表面上,因此須加熱表面至升高的溫度以使固態含Sb源氣化,則先前已經實施載氣或反應性氣體。載 氣或反應性氣體然後將氣化的含Sb源指引至電弧室中。因為能夠產生穩定、充分且持續流動的含銻蒸氣,本發明有可能免除載氣。附帶而言,消除載氣則能夠輸送高純度的含銻蒸氣。需要載氣來使銻流動的習用程序無法輸送出本發明的高純度。 Furthermore, this invention eliminates the need for a carrier gas or reactive gas. In contrast, for example, when a solid Sb source is plated onto a surface adjacent to the arc chamber, the surface must be heated to an elevated temperature to vaporize the solid Sb source, in which case a carrier gas or reactive gas has already been used. The carrier gas or reactive gas then guides the vaporized Sb source into the arc chamber. Because a stable, sufficient, and continuous flow of antimony vapor can be generated, this invention can potentially eliminate the need for a carrier gas. Incidentally, eliminating the carrier gas allows for the delivery of high-purity antimony vapor. Conventional processes that require a carrier gas to allow antimony flow cannot deliver the high purity achieved by this invention.

參考圖1,顯示的是依據本發明原理的範例性束線離子植入設備。束線離子植入系統係用於進行離子植入程序。束線離子植入系統的組件則顯示於圖1。依據本發明原理來選擇含Sb液態源材料101以便具有適當蒸氣壓。含Sb源材料101儲存於位在氣體箱100裡的儲存和輸送容器中,如圖1所示。含Sb液態源材料101儲存於僅有微量雜質的環境中。含Sb液態源材料101進一步是由不含碳的化學式所代表。於較佳具體實施例,含Sb液態源材料101是SbF5。替代選擇而言,含Sb液態源材料101是SbCl5。一或更多種含氫化合物可能可選擇地包括於氣體箱100中且流動至電弧室103中達有效量,以當利用包括鹵素的含Sb材料(譬如SbF5或SbCl5)時緩解鹵素循環效應。 Referring to Figure 1, an exemplary beam ion implantation device according to the principles of the present invention is shown. The beam ion implantation system is used to perform ion implantation procedures. The components of the beam ion implantation system are shown in Figure 1. The Sb-containing liquid source material 101 is selected to have an appropriate vapor pressure according to the principles of the present invention. The Sb-containing source material 101 is stored in a storage and transport container located in a gas chamber 100, as shown in Figure 1. The Sb-containing liquid source material 101 is stored in an environment with only trace amounts of impurities. The Sb-containing liquid source material 101 is further represented by a carbon-free chemical formula. In a preferred embodiment, the Sb-containing liquid source material 101 is SbF5 . Alternatively, the Sb-containing liquid source material 101 is SbCl5 . One or more hydrogen-containing compounds may optionally be included in the gas chamber 100 and flow into the arc chamber 103 in an effective amount to mitigate the halogen cycle effect when using Sb-containing materials including halogens (such as SbF5 or SbCl5 ).

含Sb液態源材料101儲存成液相,其與佔據儲存和輸送容器之頭部空間的對應氣相呈實質平衡。含Sb源材料101的蒸氣壓係足以減少或消除氣體箱100和電弧室103之間管線的加熱量,藉此能夠如在此之前所述地控制程序穩定性。氣相的含Sb液體材料101建構成回應於氣體箱100下游的真空壓力條件而以實質連續和適當流率呈氣相來流動。蒸氣存在於儲存和輸送容器的頭部空間並且流 動至管道中,然後沿此流動朝向電弧室103。在氣體箱100中的儲存和輸送容器裡之含Sb源材料的蒸氣壓係足以允許氣相的含Sb源材料沿著管道而穩定流動至電弧室103中。氣相的含Sb液體材料101被引入發生材料101之離子化的電弧室103中。能量引入該電弧室103中以使含Sb蒸氣離子化。流動控制裝置102(其可以包括一或更多個質流控制器和對應閥)係用於將蒸氣的流率控制在預定數值。以圖1的程序避免了過度溫度(其典型而言是習用的含固態Sb源所需),而以在此所言的所欲流率來控制蒸氣流動以允許離子植入機有穩定且受控的作業。含Sb材料的離子化可能生成多樣的銻離子。離子束抽取系統104係用於從電弧室103抽取銻離子而呈所欲能量之離子束的形式。抽取可以藉由跨越抽取電極而施加高電壓來進行。該束被運輸穿過質量解析器/過濾器105以選擇待植入的Sb離子物種。離子束然後可以加速/減速106並且運輸到定位於末端站107之標靶工件108(亦即基板)的表面以將Sb離子植入工件108中。工件舉例而言可能是需要離子植入的半導體晶圓或類似的標靶物體。該束的Sb離子碰撞且穿入工件的表面至特定深度以形成具有所欲電和物理性質的摻雜區域。 The Sb-containing liquid source material 101 is stored as a liquid phase, which is substantially in equilibrium with the corresponding gas phase occupying the headspace of the storage and transport container. The vapor pressure of the Sb-containing source material 101 is sufficient to reduce or eliminate the heating of the pipeline between the gas chamber 100 and the arc chamber 103, thereby enabling process stability control as previously described. The gas phase of the Sb-containing liquid material 101 is configured to flow in a substantially continuous and appropriate flow rate in response to the vacuum pressure conditions downstream of the gas chamber 100. The vapor is present in the headspace of the storage and transport container and flows into the pipeline, and then flows along it toward the arc chamber 103. The vapor pressure of the Sb-containing source material in the storage and transport container in the gas chamber 100 is sufficient to allow the gaseous Sb-containing source material to flow steadily along the conduit into the arc chamber 103. The gaseous Sb-containing liquid material 101 is introduced into the arc chamber 103 to ionize the material 101. Energy is introduced into the arc chamber 103 to ionize the Sb-containing vapor. A flow control device 102 (which may include one or more mass flow controllers and corresponding valves) is used to control the vapor flow rate at a predetermined value. The procedure of FIG1 avoids excessive temperature (typically required by conventional solid Sb-containing sources) and controls the vapor flow at the desired flow rate described herein to allow the ion implanter to have stable and controlled operation. Ionization of Sb-containing materials can generate a variety of antimony ions. An ion beam extraction system 104 is used to extract antimony ions from an arc chamber 103 in the form of an ion beam with the desired energy. Extraction can be performed by applying a high voltage across the extraction electrode. The beam is transported through a quality resolver/filter 105 to select the Sb ion species to be implanted. The ion beam can then be accelerated/decelerated 106 and transported to the surface of a target workpiece 108 (i.e., a substrate) positioned at an end station 107 to implant the Sb ions into the workpiece 108. The workpiece may, for example, be a semiconductor wafer or a similar target object requiring ion implantation. The Sb ions in the beam collide with and penetrate the surface of the workpiece to a specific depth to form a doped region with the desired electrical and physical properties.

應了解本發明之新穎的含Sb材料可以用於其他離子植入系統。舉例而言,也可能利用如圖2所示的電漿浸沒離子植入(plasma immersion ion implant,PIII)系統來植入Sb離子。此種系統包括氣體箱200,其架構類似於束線離子植入設備100。PIII系統的作業類似於圖1的束線 離子植入系統。參見圖2,本發明的氣相含Sb液態源材料藉由流動控制裝置202而從含Sb液態源材料201引入電漿室203中。含Sb液態源材料201代表儲存和輸送容器,其建構成儲存液相的含Sb材料,該液相與佔據儲存和輸送容器之頭部空間的對應氣相呈實質平衡。含Sb液態源材料201儲存於僅有微量雜質的環境中。含Sb液態源材料201進一步是由不含碳的化學式所代表。於較佳具體實施例,含Sb液態源材料201是SbF5。替代選擇而言,含Sb液態源材料201是SbCl5It should be understood that the novel Sb-containing material of this invention can be used in other ion implantation systems. For example, Sb ions can also be implanted using a plasma immersion ion implant (PIII) system as shown in Figure 2. This system includes a gas chamber 200, the structure of which is similar to that of the wire ion implantation device 100. The operation of the PIII system is similar to that of the wire ion implantation system of Figure 1. Referring to Figure 2, the gaseous Sb-containing liquid source material of this invention is introduced from the Sb-containing liquid source material 201 into the plasma chamber 203 by a flow control device 202. Sb-containing liquid source material 201 represents a storage and transport container constructed to store an Sb-containing liquid phase in substantial equilibrium with a corresponding gas phase occupying the headspace of the storage and transport container. Sb-containing liquid source material 201 is stored in an environment with only trace amounts of impurities. Sb-containing liquid source material 201 is further represented by a carbon-free chemical formula. In a preferred embodiment, Sb-containing liquid source material 201 is SbF₅ . Alternatively, Sb-containing liquid source material 201 is SbCl₅ .

含Sb液態源材料201的蒸氣壓係足以減少或消除氣體箱200和電漿室203之間管線的加熱量,藉此能夠如前文所述地控制程序穩定性。氣相的含Sb液態源材料201建構成回應於氣體箱200下游的真空壓力條件而以實質持續且適當的流率呈氣相來流動。氣相存在於儲存和輸送容器的頭部空間且流動至管道中,然後沿著管道流動朝向電漿室203。在氣體箱200中的儲存和輸送容器裡之含Sb源材料的蒸氣壓係足以允許氣相的含Sb源材料沿著管道而穩定流動至電漿室203中。隨著氣相的含Sb液體材料引入電漿室203中,後續提供能量以將含Sb蒸氣離子化且產生Sb離子。電漿中存在的Sb離子被加速朝向標靶工件204。應了解一或更多種含氫化合物可能有選擇地以有效量而包括於氣體箱200中且流動至電漿室203中,以緩解當利用包括鹵素之含Sb材料(譬如SbF5或SbCl5)時的鹵素循環效應。 The vapor pressure of the Sb-containing liquid source material 201 is sufficient to reduce or eliminate the heating of the pipeline between the gas chamber 200 and the plasma chamber 203, thereby enabling process stability control as described above. The gaseous Sb-containing liquid source material 201 is configured to flow in the gas phase at a substantially continuous and appropriate flow rate in response to the vacuum pressure conditions downstream of the gas chamber 200. The gas phase is present in the head space of the storage and transport container and flows into the pipeline, and then flows along the pipeline toward the plasma chamber 203. The vapor pressure of the Sb-containing source material in the storage and transport container in the gas chamber 200 is sufficient to allow the gaseous Sb-containing source material to flow stably along the pipeline into the plasma chamber 203. As the gaseous Sb-containing liquid material is introduced into the plasma chamber 203, energy is subsequently provided to ionize the Sb-containing vapor and generate Sb ions. The Sb ions present in the plasma are accelerated toward the target workpiece 204. It should be understood that one or more hydrogen-containing compounds may be selectively included in an effective amount in the gas chamber 200 and flow into the plasma chamber 203 to mitigate the halogen cycle effect when using Sb-containing materials including halogens (such as SbF5 or SbCl5 ).

於本發明的另一態樣,提供的是一種用於在 此揭示之含Sb源材料的儲存和輸送容器,如圖3所示。儲存和輸送容器允許安全地包裝和輸送本發明的含Sb源材料。本發明的含Sb源材料包含在容器300裡。容器300裝備有入口埠310以允許容器300填充所欲的含Sb源材料。該埠也可以用於在填充所欲的Sb摻雜材料之前先以惰性氣體來吹驅容器300的內部且排空容器300。於一範例,可以利用容器300來進行凍結-泵抽-解凍的循環,以基於頭部空間的總體積而在頭部空間中生成小於5體積%雜質的環境。儲存和輸送容器300(例I)含有預定容積的頭部空間335,並且儲存和輸送容器300(例II)含有預定容積的頭部空間336,其中容器300(例I和II)係依據本發明原理而建構和製備。 In another embodiment of the invention, a storage and transport container for the Sb-containing source material disclosed herein is provided, as shown in Figure 3. The storage and transport container allows for the safe packaging and transport of the Sb-containing source material of the invention. The Sb-containing source material of the invention is contained within a container 300. The container 300 is equipped with an inlet port 310 to allow the container 300 to be filled with the desired Sb-containing source material. This port can also be used to purge the interior of the container 300 with an inert gas and empty the container 300 before filling with the desired Sb-doped material. In one example, the container 300 can be used for a freeze-pump-thaw cycle to create an environment with less than 5% impurities in the headspace based on the total headspace volume. Storage and transport container 300 (Example I) includes a headspace 335 of predetermined volume, and storage and transport container 300 (Example II) includes a headspace 336 of predetermined volume, wherein containers 300 (Examples I and II) are constructed and manufactured in accordance with the principles of the present invention.

設有出口埠320以從容器300的頭部空間抽出氣相的含Sb材料。真空致動止回閥330設在出口埠的上游,其回應於筒300下游所發生的低於大氣壓條件來配送受控流率的含Sb材料。此真空致動止回閥330在處理本發明之多樣的含Sb材料時增進安全性。當閥321開放至大氣壓時,真空致動止回閥330避免將任何空氣或其他汙染物引入容器300裡,因此緩解了佔據容器300之頭部空間的氣相含Sb材料被汙染和分壓降低的二種風險。以此方式,則可以在儲存、輸送和使用期間以安全的方式維持高純度的含Sb材料,藉此抽出的氣相含Sb源材料可以維持適當蒸氣壓以在離子植入期間生成所需流率。真空致動止回閥330可以位在容器300外面(例I)。替代選擇而言,真空致動止 回閥330可以位在容器300裡面(例II)。容器300流體連通於排放流動路徑,其中致動該真空致動止回閥330以允許回應於沿著排放流動路徑所達成的低於大氣壓條件而有來自容器300的內部容積之含Sb源材料的受控流動。 An outlet port 320 is provided to extract gaseous Sb-containing material from the headspace of container 300. A vacuum-actuated check valve 330 is located upstream of the outlet port and responds to sub-atmospheric pressure conditions downstream of container 300 to deliver Sb-containing material at a controlled flow rate. This vacuum-actuated check valve 330 enhances safety when handling the diverse Sb-containing materials of the invention. When valve 321 is open to atmospheric pressure, the vacuum-actuated check valve 330 prevents the introduction of any air or other contaminants into container 300, thus mitigating the risks of contamination of the gaseous Sb-containing material occupying the headspace of container 300 and reduced partial pressure. In this way, high-purity Sb-containing materials can be safely maintained during storage, transportation, and use, thereby maintaining an appropriate vapor pressure for the extracted Sb-containing source material to generate the required flow rate during ion implantation. The vacuum-actuated check valve 330 can be located outside the container 300 (Example I). Alternatively, the vacuum-actuated check valve 330 can be located inside the container 300 (Example II). The container 300 is fluidly connected to an exhaust flow path, wherein the vacuum-actuated check valve 330 is actuated to allow controlled flow of Sb-containing source material from the internal volume of the container 300 in response to sub-atmospheric pressure conditions achieved along the exhaust flow path.

儲存和輸送容器300可能是筒,其在低於大氣壓條件下將含Sb材料貯留成至少部分氣相。含Sb材料以低於大氣壓條件而儲存於當中。含Sb材料在筒300的內部裡維持化學穩定的且不經歷分解。含Sb材料較佳而言在周遭溫度(10~35℃)下儲存成液體。於一具體實施例,蒸氣壓大於約1Torr。於另一具體實施例,蒸氣壓大於約3Torr、更佳而言大於約5Torr。 The storage and transport container 300 may be a cylinder that stores the Sb-containing material as at least a portion of the vapor phase under sub-atmospheric pressure conditions. The Sb-containing material is stored therein under sub-atmospheric pressure conditions. The Sb-containing material remains chemically stable and does not undergo decomposition within the cylinder 300. Preferably, the Sb-containing material is stored as a liquid at the ambient temperature (10–35°C). In one embodiment, the vapor pressure is greater than about 1 Torr. In another embodiment, the vapor pressure is greater than about 3 Torr, more preferably greater than about 5 Torr.

該筒300較佳而言包括機械連通於該筒300的雙埠閥總成。雙埠閥顯示於圖4且包含填充埠閥和排放埠閥,其中填充埠閥流體連通於筒內部以將含Sb摻雜材料引入當中。排放埠閥流體連通於從筒內部延伸到外部的流動排放路徑以由此排放含銻摻雜材料。止回閥330的位置是沿著流動排放路徑,藉此止回閥建構成回應於筒外的低於大氣壓條件而從關閉位置移動到開啟位置。頭部空間401依據本發明原理而具有預定的容積。 The cylinder 300 preferably includes a dual-port valve assembly mechanically connected to it. The dual-port valve, shown in FIG. 4, includes a filling port valve and a discharge port valve, wherein the filling port valve is fluid-connected to the interior of the cylinder to introduce Sb-doped material therein. The discharge port valve is fluid-connected to a flow discharge path extending from the interior of the cylinder to the exterior to discharge the antimony-doped material. A check valve 330 is positioned along the flow discharge path, thereby being configured to move from a closed position to an open position in response to sub-atmospheric pressure conditions outside the cylinder. The head space 401 has a predetermined volume according to the principles of the invention.

思及其他的儲存容器。舉例而言,於替代選擇性具體實施例,含銻摻雜材料可能儲存和配送自基於吸附劑的輸送系統。思及多樣適合的吸附劑,包括但不限於碳系吸收劑或金屬-有機骨架。 Other storage containers are also considered. For example, in alternative selective embodiments, the antimony-doped material may be stored and distributed from an adsorbent-based transport system. A variety of suitable adsorbents are considered, including, but not limited to, carbon-based adsorbents or metal-organic frameworks.

思及對圖3和4之筒的幾種修改而不偏離本發 明的範圍。舉例而言,應了解可以利用圖3和圖4的雙埠閥而不使用止回閥。再者,應了解本發明原理可以用於具有單埠來填充和配送的儲存和輸送容器而不使用止回閥。 Several modifications to the cylinders of Figures 3 and 4 are considered without departing from the scope of the invention. For example, it should be understood that the dual-port valves of Figures 3 and 4 can be used without the use of check valves. Furthermore, it should be understood that the principles of the invention can be used for storage and transport containers with single-port filling and dispensing without the use of check valves.

於又一具體實施例,本發明可能採用UpTime®輸送裝置,其市售可得自Praxair(康乃狄克州Danbury)且如美國專利第5,937,895、6,045,115、6,007,609、7,708,028、7,905,247號和美國專利公開案第2016/0258537號所揭示(其全部以整體引用方式併入本文中),以從容器300安全地輸送受控流率之氣相的含Sb源材料到離子設備來做Sb離子植入。UpTime®輸送裝置之真空致動的止回閥用來避免在大氣壓之空氣和其他氣體的汙染,其可能存在於周圍環境中而穿透至容器中且汙染含Sb前驅材料及減少其分壓。 In another specific embodiment, the present invention may employ the UpTime® delivery device, commercially available from Praxair (Danbury, Connecticut) and as disclosed in U.S. Patent Nos. 5,937,895, 6,045,115, 6,007,609, 7,708,028, 7,905,247 and U.S. Patent Publication No. 2016/0258537 (all of which are incorporated herein by reference in their entirety), to safely deliver a controlled flow rate of Sb-containing gaseous material from container 300 to an ion device for Sb ion implantation. The vacuum-actuated check valve in the UpTime® conveyor is used to prevent contamination from atmospheric air and other gases that may be present in the surrounding environment and penetrate into the container, contaminating Sb-containing precursor materials and reducing their partial pressure.

其他適合的低於大氣壓之輸送裝置可能包括呈多樣排列的壓力調節器、止回閥、限流閥及限流孔口。舉例而言,二個壓力調節器可能串聯配置在筒裡,以將容器裡之氣相含Sb源材料的筒壓力下調至沿著流體排放管線所含之下游質流控制器所可接受的預定壓力。 Other suitable sub-atmospheric pressure conveying devices may include pressure regulators, check valves, flow restrictors, and flow orifices arranged in various configurations. For example, two pressure regulators may be configured in series within the container to reduce the container pressure of the gaseous Sb-containing source material to a predetermined pressure acceptable to a downstream mass flow controller along the fluid discharge line.

容器或筒300連同其所思及的變化例可能建構成與束線離子植入系統組合(圖1),藉此容器或筒300藉由其間所延伸之流動線路或管道的網路而可操作地連接至該系統。有利而言,管道較佳而言的特徵在於:相較於習用的含Sb源而消除或減少了隨管加熱量。 The container or cylinder 300, along with its contemplated variations, may be configured in combination with a wire-connected ion implantation system (Figure 1), whereby the container or cylinder 300 is operatively connected to the system via a network of flow lines or conduits extending therefrom. Advantageously, the conduits are further characterized by eliminating or reducing in-tube heating compared to conventional Sb-containing sources.

替代選擇而言,容器或筒300連同其所思及 的變化例可能建構成與電漿浸沒系統組合(圖2),藉此容器或筒300藉由其間所延伸之流動線路或管道的網路而可操作地連接至該電漿浸沒系統。有利而言,管道較佳而言的特徵在於:相較於習用的含Sb源而消除或減少了隨管加熱量。 Alternatively, the container or cylinder 300, along with its variations, may be configured to be integrated with a plasma immersion system (Figure 2), whereby the container or cylinder 300 is operatively connected to the plasma immersion system via a network of flow lines or conduits extending therefrom. Advantageously, the conduits are further characterized by eliminating or reducing the amount of heat generated in the conduits compared to conventional Sb-containing sources.

思及本發明有許多好處。舉例而言,利用本發明之基於液體的含Sb前驅物來輸送用於Sb離子植入的含Sb氣相、接著再切換成不同的氣態摻雜物源,相較於利用供Sb離子植入之基於固體的含Sb前驅物、然後再利用不同的氣態摻雜物源,則一般而言需較少時間。具體而言,相較於固態含Sb源,利用本發明之基於液體的含Sb前驅物來輸送含Sb氣相,則減少切換成用於離子植入之不同摻雜物種所需的起始時間,藉此導致植入機有最大的晶圓產出率。舉例來說,使用固態砷(As)或固態磷(P)作為源材料以植入其個別離子物種的植入機可以預期需約30分鐘來調節離子束,而使用氣態AsH3或氣態PH3源材料一般而言可以預期僅需約4分鐘來調節其離子束。如在此和全篇所用的「調節」(tuning或tune)一詞意謂產生一束僅具有特定束電流和尺寸之標靶離子物種的程序。相較而言,關於固態含Sb源材料,對電弧室的質流是由昇華所需的氣化機溫度來控制,當中儲存了含Sb源以確保固態源在輸送至電弧室前被充分加熱成氣相。當考慮將固態含Sb源材料加熱成其氣相、調節該束、後續在完成離子植入程序時將固態含Sb源冷卻下來的時間,總時間可以是約30~90分鐘以切換至另 一摻雜物種;而輸送衍生自含Sb液態前驅物的氣態摻雜物源可以需約5~10分鐘的時間。淨結果可以是本發明顯著增加產出率。 This invention offers numerous advantages. For example, using the liquid-based Sb-containing precursor of this invention to deliver the Sb-containing gas phase for Sb ion implantation, followed by switching to different gaseous dopant sources, generally requires less time compared to using a solid-based Sb-containing precursor for Sb ion implantation followed by different gaseous dopant sources. Specifically, using the liquid-based Sb-containing precursor of this invention to deliver the Sb-containing gas phase, compared to a solid Sb source, reduces the start-up time required to switch to different dopant species for ion implantation, thereby resulting in maximum wafer yield for the implantation machine. For example, an implanter using solid arsenic (As) or solid phosphorus (P) as source material to implant specific ion species can be expected to take approximately 30 minutes to tune the ion beam, while using gaseous AsH3 or gaseous PH3 source material can generally be expected to take only about 4 minutes. The term "tuning" or "tuning" as used here and throughout refers to a procedure that produces a beam of target ion species with only a specific beam current and size. In contrast, with solid Sb-containing source materials, the mass flow in the arc chamber is controlled by the vaporizer temperature required for sublimation, where the Sb-containing source is stored to ensure that the solid source is sufficiently heated into the gas phase before being delivered to the arc chamber. When considering the time required to heat the solid Sb-containing source material into its gaseous phase, regulate the beam, and then cool the solid Sb-containing source during the ion implantation procedure, the total time can be approximately 30–90 minutes to switch to another dopant species; while transporting the gaseous dopant source derived from the Sb-containing liquid precursor can take approximately 5–10 minutes. The net result can be a significant increase in yield.

附帶而言,本發明基於液體的含Sb前驅物可以與其他摻雜物源置於同一氣體箱中(譬如圖1和2所示)而無需額外加熱。相對而言,含Sb固態源則需分開的氣化機,其沿著延伸至電弧室的管道而定位,目的在於確保含Sb蒸氣不會再凝結,這便需要多於可能可得的空間,並且進一步增添離子植入程序的複雜度和花費。 Incidentally, the liquid-based Sb-containing precursor of this invention can be placed in the same gas chamber as other doped sources (e.g., as shown in Figures 1 and 2) without additional heating. In contrast, Sb-containing solid sources require a separate vaporizer positioned along a conduit extending to the arc chamber to ensure that the Sb-containing vapor does not condense again. This requires more space than is possible and further increases the complexity and cost of the ion implantation procedure.

<實驗敘述> <Experimental Description>

建造流動測試系統以測試五氟化銻SbF5的流動能力,其在室溫下存在成液體而25℃的蒸氣壓為10Torr。對於各實驗而言,流動系統由以下所構成:歧管,其具有連接至歧管的壓力傳感器以讀取筒頭部空間中之SbF5蒸氣所施加的壓力;質流控制器,其在歧管中以測量和控制蒸氣的流動;粗抽真空幫浦,其維持質流控制器的下游在小於1x10-2Torr的真空壓力。用於各實驗的筒是由碳鋼所製成且配備有由填充埠和使用埠所構成的雙埠閥。該筒連接至歧管。 A flow test system was constructed to test the flowability of antimony pentafluoride (SbF5 ) , which is liquid at room temperature and has a vapor pressure of 10 Torr at 25°C. For each experiment, the flow system consisted of: a manifold with a pressure sensor connected to it to read the pressure exerted by the SbF5 vapor in the headspace; a mass flow controller within the manifold to measure and control the vapor flow; and a roughing vacuum pump to maintain a vacuum pressure downstream of the mass flow controller at less than 1 x 10⁻² Torr. The cylinders used in each experiment were made of carbon steel and equipped with a two-port valve consisting of a filling port and a usage port. The cylinder was connected to the manifold.

一般而言,填充了液態SbF5以做流動測試的各筒係製備如下。各筒是在N2的大氣下填充液態SbF5以確保液態SbF5不會與大氣中的水氣反應。液態SbF5的純度是99體積%。為了從筒的頭部空間移除N2、水氣及任何其他 氣態雜質達到微量,在各筒上進行如在此之前所述的二次凍結-泵抽-解凍的循環。於一凍結-泵抽-解凍循環,將筒置於冰浴超過20分鐘以使SbF5蒸氣從氣相凝結成液體並且凍結SbF5液體,而N2、水氣及任何其他氣態雜質在筒的頭部空間裡維持呈氣相。然後開啟該筒且以真空幫浦排空大於1分鐘以從頭部空間移除N2、水氣及任何其他氣態雜質達到微量。後續而言,將該筒關閉且與幫浦隔離。在隔離該筒之後,移除冰浴以允許筒暖化至周遭溫度,藉此允許再形成液態SbF5和對應的SbF5蒸氣。 Generally, the cartridge systems filled with liquid SbF5 for flow testing are prepared as follows. Each cartridge is filled with liquid SbF5 under an atmosphere of N2 to ensure that the liquid SbF5 does not react with atmospheric water vapor. The purity of the liquid SbF5 is 99% by volume. To remove N2 , water vapor, and any other gaseous impurities from the headspace of the cartridge to a trace amount, a two-stage freeze-pump-thaw cycle is performed on each cartridge as described previously. In one freeze-pump-thaw cycle, the cartridge is placed in an ice bath for more than 20 minutes to allow the SbF5 vapor to condense from the gas phase into liquid and to freeze the SbF5 liquid, while N2 , water vapor, and any other gaseous impurities remain in the gas phase in the headspace of the cartridge. The cylinder was then opened and evacuated with a vacuum pump for more than one minute to remove trace amounts of N2 , water vapor, and any other gaseous impurities from the headspace. The cylinder was then closed and isolated from the pump. After isolation, the ice bath was removed to allow the cylinder to warm to ambient temperature, thereby allowing the re-formation of liquid SbF5 and the corresponding SbF5 vapor.

在開始各實驗之前,開啟筒閥以允許SbF5蒸氣經由使用埠而從頭部空間離開,並且進入和填充歧管區段而到質流控制器。使SbF5蒸氣佔據歧管,則壓力傳感器能夠讀取當中的壓力,其代表筒中之SbF5的蒸氣壓。 Before starting each experiment, open the cylinder valve to allow SbF5 vapor to exit the headspace through the usage port and enter and fill the manifold section to the mass flow controller. With SbF5 vapor filling the manifold, the pressure sensor can read the pressure therein, which represents the vapor pressure of SbF5 in the cylinder.

其次,進行流動測試以決定是否可能從該筒達成穩定、持續且充分流動的SbF5蒸氣,各測試的關鍵細節和對應結果如下所述。 Next, flow tests were conducted to determine whether it was possible to achieve a stable, continuous, and adequate flow of SbF5 vapor from the cylinder. The key details and corresponding results of each test are described below.

<比較例1> <Comparative Example 1>

420mL的碳鋼筒填充了300g(亦即100mL)的液態SbF5。筒中的頭部空間容積是320mL。該筒和流動歧管維持在25℃的周遭溫度,其造成如壓力傳感器所讀取之10Torr的SbF5蒸氣壓。沒有利用外部加熱。沒有利用載氣。測試該筒的持續流動特徵。該筒無法維持SbF5之大於0.3sccm的持續流動。 A 420 mL carbon steel canister was filled with 300 g (100 mL) of liquid SbF5 . The headspace volume within the canister was 320 mL. The canister and flow manifold were maintained at an ambient temperature of 25°C, resulting in an SbF5 vapor pressure of 10 Torr as read by a pressure sensor. No external heating was used. No carrier gas was used. The continuous flow characteristics of the canister were tested. The canister could not maintain a continuous flow of SbF5 greater than 0.3 sccm.

<比較例2> <Comparative example 2>

2.2L的碳鋼筒填充了1kg(亦即335mL)的液態SbF5。筒中的頭部空間容積是1.865L。該筒和閥加熱至40℃以增加蒸氣壓,其造成如壓力傳感器所讀取之15Torr的SbF5蒸氣壓。沒有利用載氣。歧管和質流控制器不加熱且維持在22℃的周遭溫度。測試該筒的持續流動特徵。該筒無法維持SbF5之大於0.3sccm的持續流動,因為SbF5蒸氣凝結而導致流動線路中形成阻礙。 A 2.2L carbon steel canister was filled with 1 kg (335 mL) of liquid SbF5 . The headspace volume of the canister was 1.865 L. The canister and valve were heated to 40°C to increase the vapor pressure, resulting in an SbF5 vapor pressure of 15 Torr as read by the pressure sensor. No carrier gas was used. The manifold and mass flow controller were not heated and maintained at an ambient temperature of 22°C. The continuous flow characteristics of the canister were tested. The canister could not maintain a continuous flow of SbF5 greater than 0.3 sccm because SbF5 vapor condensation caused obstruction in the flow path.

<實施例1> <Implementation Example 1>

2.2L的碳鋼筒填充了1kg(亦即335mL)的液態SbF5。筒中的頭部空間容積是1.865L。該筒和流動歧管維持在25℃的周遭溫度,其造成如壓力傳感器所讀取之10Torr的SbF5蒸氣壓。沒有利用外部加熱。沒有利用載氣。測試該筒的持續流動特徵。該筒能夠維持SbF5之2sccm的持續流動。 A 2.2L carbon steel canister was filled with 1 kg (335 mL) of liquid SbF5 . The headspace volume of the canister was 1.865 L. The canister and flow manifold were maintained at an ambient temperature of 25°C, resulting in an SbF5 vapor pressure of 10 Torr as read by a pressure sensor. No external heating was used. No carrier gas was used. The continuous flow characteristics of the canister were tested. The canister was able to maintain a continuous flow of SbF5 at 2 sccm.

<實施例2> <Implementation Example 2>

2.2L的碳鋼筒填充了1kg(亦即335mL)的液態SbF5。筒中的頭部空間容積是1.865L。該筒和流動歧管維持在22℃的周遭溫度,其造成如壓力傳感器所讀取之7Torr的SbF5蒸氣壓。沒有利用外部加熱。沒有利用載氣。測試該筒的持續流動特徵。該筒能夠維持SbF5之2sccm的 持續流動。 A 2.2L carbon steel canister was filled with 1 kg (335 mL) of liquid SbF5 . The headspace volume of the canister was 1.865 L. The canister and flow manifold were maintained at an ambient temperature of 22°C, resulting in an SbF5 vapor pressure of 7 Torr as read by a pressure sensor. No external heating was used. No carrier gas was used. The continuous flow characteristics of the canister were tested. The canister was able to maintain a continuous flow of SbF5 at 2 sccm.

<實施例3> <Implementation Example 3>

2.2L的碳鋼筒填充了335g(亦即112mL)的液態SbF5。筒中的頭部空間容積是2.088L。該筒和流動歧管維持在22℃的周遭溫度,其造成如壓力傳感器所讀取之7Torr的SbF5蒸氣壓。沒有利用外部加熱。沒有利用載氣。測試該筒的持續流動特徵。該筒能夠維持SbF5之2sccm的持續流動。 A 2.2L carbon steel canister was filled with 335g (112mL) of liquid SbF5 . The headspace volume of the canister was 2.088L. The canister and flow manifold were maintained at an ambient temperature of 22°C, resulting in an SbF5 vapor pressure of 7 Torr as read by a pressure sensor. No external heating was used. No carrier gas was used. The continuous flow characteristics of the canister were tested. The canister was able to maintain a continuous flow of SbF5 at 2 sccm.

<實施例4> <Implementation Example 4>

2.2L的碳鋼筒填充了335g(亦即112mL)的液態SbF5。筒中的頭部空間容積是2.088L。該筒和流動歧管維持在25℃的周遭溫度,其造成如壓力傳感器所讀取之10Torr的SbF5蒸氣壓。沒有利用外部加熱。沒有利用載氣。測試該筒的持續流動特徵。該筒能夠維持SbF5之2sccm的持續流動。 A 2.2L carbon steel canister was filled with 335g (112mL) of liquid SbF5 . The headspace volume of the canister was 2.088L. The canister and flow manifold were maintained at an ambient temperature of 25°C, resulting in an SbF5 vapor pressure of 10 Torr as read by a pressure sensor. No external heating was used. No carrier gas was used. The continuous flow characteristics of the canister were tested. The canister was able to maintain a continuous flow of SbF5 at 2 sccm.

<實施例5> <Implementation Example 5>

2.2L的碳鋼筒填充了1kg(亦即335mL)的液態SbF5。筒中的頭部空間容積是2.088L。該筒和流動歧管維持在18℃的周遭溫度,其造成如壓力傳感器所讀取之5Torr的SbF5蒸氣壓。沒有利用外部加熱。沒有利用載氣。測試該筒的持續流動特徵。該筒能夠維持SbF5之2.5sccm 的持續流動。 A 2.2L carbon steel canister was filled with 1 kg (335 mL) of liquid SbF5 . The headspace volume of the canister was 2.088 L. The canister and flow manifold were maintained at an ambient temperature of 18°C, resulting in an SbF5 vapor pressure of 5 Torr as read by a pressure sensor. No external heating was used. No carrier gas was used. The continuous flow characteristics of the canister were tested. The canister was able to maintain a continuous flow of SbF5 at 2.5 sccm.

如所可見,本發明就一態樣而言針對用於離子植入的含Sb源而提供可行的解法,該含Sb源包括因為低蒸氣壓和有限的熱穩定性而難以一致地輸送至電弧室中的含Sb固態源。 As can be seen, this invention provides a feasible solution, in one respect, for Sb-containing sources used in ion implantation, including Sb-containing solid-state sources that are difficult to deliver consistently into the arc chamber due to low vapor pressure and limited thermal stability.

應了解本發明原理可以應用於除了離子植入以外而需要充分、持續且穩定的流動氣相含銻材料的其他程序。 It should be understood that the principles of this invention can be applied to other procedures besides ion implantation that require sufficient, continuous, and stable flow of gaseous antimony-containing materials.

雖然已顯示和描述了視為本發明的特定具體實施例,但當然將了解可以在形式和細節上輕易做出多樣的修飾和改變,而不偏離本發明的精神和範圍。因而本發明打算不限於在此所示和所述的精確形式和細節,也不限於小於在此揭示和下文所請求之發明整體的任一者。 While specific embodiments considered to be part of the invention have been shown and described, it will be understood that a variety of modifications and changes in form and detail can be easily made without departing from the spirit and scope of the invention. Therefore, the invention is not intended to be limited to the precise forms and details shown and described herein, nor to any part smaller than the overall invention disclosed herein and claimed below.

100:氣體箱 100: Gas Box

101:含Sb源材料 101: Materials containing Sb source material

102:流動控制裝置 102: Flow control device

103:離子源室 103: Ion Source Chamber

104:離子束抽取 104: Ion Beam Extraction

105:質量解析器/過濾器 105: Quality Analyzer/Filter

106:加速/減速 106: Acceleration/Deceleration

107:植入端站 107: Embedded in the client application

108:標靶工件 108: Target workpiece

Claims (11)

一種低於大氣壓之儲存和輸送容器,其建構成輸送高純度的氣相含銻材料,該容器包含:儲存和輸送容器,該儲存和輸送容器建構成在低於大氣壓條件下以液相來貯留該含銻材料,藉此該液相與該高純度的氣相含銻材料呈實質平衡,並且該高純度的氣相含銻材料施加小於大氣壓的蒸氣壓,該高純度的氣相基於該氣相的總體積則等於約95體積%或更大;該儲存和輸送容器包含多個壁,其具有充分的表面積來接觸該液相,並且進一步其中該多個壁展現導熱率以增進對該液相的熱傳導;該儲存和輸送容器的特徵在於:在該高純度的氣相含銻材料的配送期間,沒有外部加熱且沒有載氣;其中該液相包含範圍從0到1體積%雜質的液相雜質總量,並且進一步其中該液相雜質包含0到0.1體積%的N2、0到0.1體積%的O2、0到0.6體積%的HF、0到0.1體積%的SbF3、0到0.1體積%的Sb2O3、及其餘是呈該液相的該含銻材料。 A subatmospheric pressure storage and transport container configured to transport high-purity vapor-phase antimony-containing materials, comprising: a storage and transport vessel configured to store the antimony-containing material in a liquid phase under subatmospheric pressure conditions, wherein the liquid phase is substantially in equilibrium with the high-purity vapor-phase antimony-containing material, and the high-purity vapor-phase antimony-containing material is subjected to a vapor pressure less than atmospheric pressure, wherein the high-purity vapor phase has a total volume of approximately 95% or more. The storage and transport container comprises multiple walls having sufficient surface area to contact the liquid phase, and further wherein the multiple walls exhibit thermal conductivity to enhance thermal conduction to the liquid phase; the storage and transport container is characterized in that: during the delivery of the high-purity gaseous antimony-containing material, there is no external heating and no carrier gas; wherein the liquid phase contains a total liquid phase impurity amount ranging from 0 to 1 volume % impurities, and further wherein the liquid phase impurities contain 0 to 0.1 volume % N. 2. 0 to 0.1% by volume of O2 , 0 to 0.6% by volume of HF, 0 to 0.1% by volume of SbF3 , 0 to 0.1% by volume of Sb2O3 , and the remainder being the antimony-containing material in the liquid phase. 如請求項1的低於大氣壓之儲存和輸送容器,其中該含銻材料是由不含碳的化學式所代表,以減少或消除碳系沉積物形成於離子植入機的電弧室中和遍及離子源的其他區域。 As in claim 1, a storage and transport container operating at sub-atmospheric pressure, wherein the antimony-containing material is represented by a carbon-free chemical formula to reduce or eliminate the formation of carbonaceous deposits in the arc chamber of the ion implanter and throughout other areas of the ion source. 如請求項2的低於大氣壓之儲存和輸送容器,其中該多個壁的導熱率範圍從1到425W/m-K,並且該 含銻材料是由不含碳的化學式所代表,以減少或消除碳系沉積物形成於該電弧室中和遍及該離子源的其他區域。 As in claim 2, a storage and transport container operating at sub-atmospheric pressure, wherein the thermal conductivity of the plurality of walls ranges from 1 to 425 W/m-K, and the antimony-containing material is represented by a carbon-free chemical formula to reduce or eliminate the formation of carbonaceous deposits in the arc chamber and throughout other areas of the ion source. 一種低於大氣壓之儲存和輸送容器,其建構成輸送高純度的氣相含銻材料,該容器包含:儲存和輸送容器,該儲存和輸送容器建構成在低於大氣壓條件下以液相來貯留該含銻材料,藉此該液相與佔據該儲存和輸送容器中之頭部空間的預定容積之該高純度的氣相含銻材料呈實質平衡,並且該高純度的氣相含銻材料施加小於大氣壓的蒸氣壓,該高純度的氣相基於該頭部空間的該預定容積則等於約95體積%或更大;調整該頭部空間之該預定容積的尺寸以便接收充分量之該高純度的氣相含銻材料;該儲存和輸送容器的特徵在於:在該高純度的氣相含銻材料的配送期間,沒有外部加熱且沒有載氣;其中該液相包含範圍從0到1體積%雜質的液相雜質總量,並且進一步其中該液相雜質包含0到0.1體積%的N2、0到0.1體積%的O2、0到0.6體積%的HF、0到0.1體積%的SbF3、0到0.1體積%的Sb2O3、及其餘是呈該液相的該含銻材料。 A subatmospheric pressure storage and transport container configured to transport high-purity vapor-phase antimony-containing materials, the container comprising: a storage and transport vessel configured to store the antimony-containing material in a liquid phase under subatmospheric pressure conditions, wherein the liquid phase is substantially in equilibrium with the high-purity vapor-phase antimony-containing material occupying a predetermined volume of the headspace within the storage and transport vessel, and the high-purity vapor-phase antimony-containing material is subjected to a vapor pressure less than atmospheric pressure. The predetermined volume of the head space is approximately 95% by volume or greater; the dimensions of the predetermined volume of the head space are adjusted to receive a sufficient amount of the high-purity vapor-phase antimony-containing material; the storage and transport container is characterized in that: during the delivery of the high-purity vapor-phase antimony-containing material, there is no external heating and no carrier gas; wherein the liquid phase contains a total amount of liquid phase impurities ranging from 0 to 1% by volume, and further wherein the liquid phase impurities contain 0 to 0.1% by volume N. 2. 0 to 0.1% by volume of O2 , 0 to 0.6% by volume of HF, 0 to 0.1% by volume of SbF3 , 0 to 0.1% by volume of Sb2O3 , and the remainder being the antimony-containing material in the liquid phase. 如請求項4的低於大氣壓之儲存和輸送容器,其中該液相暴露於該高純度的氣相的表面積是至少約50cm2,並且進一步其中該頭部空間的該預定容積是1L或更大。 As in claim 4, a storage and transport container at subatmospheric pressure, wherein the surface area of the liquid phase exposed to the high-purity gas phase is at least about 50 cm² , and further wherein the predetermined volume of the headspace is 1 L or greater. 如請求項4的低於大氣壓之儲存和輸送容 器,其進一步包含吸附劑。 The storage and transport containers for pressures below atmospheric pressure, as described in claim 4, further include an adsorbent. 如請求項4的低於大氣壓之儲存和輸送容器,其中該頭部空間中的壓力大於或等於1Torr。 Such as the storage and transport container below atmospheric pressure in claim 4, wherein the pressure in the headspace is greater than or equal to 1 Torr. 一種在儲存容器中的高純度含銻材料,其包含液相和氣相,該氣相包含範圍從0到5體積%雜質的氣相雜質總量,其中該氣相雜質包含0到4體積%的N2、0到0.5體積%的O2、0到0.49體積%的HF、0到0.01體積%的H2O、及其餘是呈該氣相的該含銻材料;其中該液相包含範圍從0到1體積%雜質的液相雜質總量,其中該液相雜質包含0到0.1體積%的N2、0到0.1體積%的O2、0到0.6體積%的HF、0到0.1體積%的SbF3、0到0.1體積%的Sb2O3、及其餘是呈該液相的該含銻材料。 A high-purity antimony-containing material for storage containers comprises a liquid phase and a gas phase. The gas phase contains a total amount of gaseous impurities ranging from 0 to 5 volume %, wherein the gaseous impurities include 0 to 4 volume % N₂ , 0 to 0.5 volume % O₂ , 0 to 0.49 volume % HF, 0 to 0.01 volume % H₂O , and the remainder being the antimony-containing material in the gas phase. The liquid phase contains a total amount of liquid impurities ranging from 0 to 1 volume %, wherein the liquid phase impurities include 0 to 0.1 volume % N₂ , 0 to 0.1 volume % O₂ , 0 to 0.6 volume % HF, and 0 to 0.1 volume % SbF₃ . The antimony-containing material comprises 0 to 0.1% by volume of Sb₂O₃ and the remainder in the liquid phase . 一種製備低於大氣壓之儲存和輸送容器的方法,該容器建構成輸送穩定、持續且充分流動之高純度的氣相銻源材料,該方法包含以下步驟:提供具有多個壁的容器,該壁具有5W/m*K的導熱率;對該多個壁進行氟鈍化;接著在有惰性氣體下將呈液相的含銻材料引入該容器中;生成大於或等於約1L之預定的頭部空間容積,該預定的頭部空間容積具有微量雜質;將充分量的該含銻材料蒸發成在該預定的頭部空間容積中的該氣相,其中該蒸發步驟是以沒有外部加熱來進 行;凍結該液相的含銻材料以形成凍結的含銻材料;從該預定的頭部空間容積凝結該氣相的含銻材料以形成凝結之高純度的氣相;從該預定的頭部空間容積排空氮、水氣、該惰性氣體及任何其他氣態雜質;允許該凝結的氣相的溫度增加以便在該預定的頭部空間容積裡形成該高純度的氣相;以及允許該凍結的含銻材料的溫度增加以再形成該液相,其中該液相包含範圍從0到1體積%雜質的液相雜質總量,其中該液相雜質包含0到0.1體積%的N2、0到0.1體積%的O2、0到0.6體積%的HF、0到0.1體積%的SbF3、0到0.1體積%的Sb2O3、及其餘是呈該液相的該含銻材料。 A method for preparing a storage and transport container at sub-atmospheric pressure, the container being configured to transport a stable, continuous, and sufficiently flowing high-purity vapor-phase antimony source material, the method comprising the following steps: providing a container having multiple walls having a thermal conductivity of 5 W/m*K; passivating the multiple walls with fluorine; then introducing a liquid antimony-containing material into the container in the presence of an inert gas; generating a predetermined headspace volume greater than or equal to about 1 L, the predetermined headspace volume containing trace impurities; and evaporating a sufficient amount of the antimony-containing material into the vapor phase within the predetermined headspace volume, wherein the evaporation step is performed without... The process is carried out by external heating; freezing the antimony-containing material in the liquid phase to form frozen antimony-containing material; condensing the antimony-containing material in the gaseous phase from the predetermined headspace volume to form a condensed high-purity gaseous phase; venting nitrogen, water vapor, the inert gas, and any other gaseous impurities from the predetermined headspace volume; allowing the temperature of the condensed gaseous phase to increase in order to form the high-purity gaseous phase in the predetermined headspace volume; and allowing the temperature of the frozen antimony-containing material to increase in order to reform the liquid phase, wherein the liquid phase contains a total liquid phase impurity amount ranging from 0 to 1 volume % impurities, wherein the liquid phase impurities contain 0 to 0.1 volume % N. 2. 0 to 0.1% by volume of O2 , 0 to 0.6% by volume of HF, 0 to 0.1% by volume of SbF3 , 0 to 0.1% by volume of Sb2O3 , and the remainder being the antimony-containing material in the liquid phase. 如請求項9的方法,其進一步包含進行以下各步驟:(i)凝結、(ii)排空、(iii)允許該凝結的高純度氣相和該凍結的含銻材料暖化,以便再形成該液相且在該預定的頭部空間容積裡再形成該高純度的氣相;其中該步驟(i)、(ii)、(iii)中的各者進行二或更多次以在該頭部空間中達成包含0到4體積%的N2、0到0.5體積%的O2、0到0.49體積%的HF、及0到0.01體積%的H2O的氣相雜質,其中該氣相雜質的總量是5體積%或更低。 The method of claim 9 further comprises performing the following steps: (i) condensation, (ii) venting, and (iii) allowing the condensed high-purity gas phase and the frozen antimony-containing material to warm up in order to re-form the liquid phase and the high-purity gas phase in the predetermined headspace volume; wherein each of steps (i), (ii), and (iii) is performed two or more times to achieve a gaseous impurity in the headspace comprising 0 to 4 volume% N2 , 0 to 0.5 volume% O2 , 0 to 0.49 volume% HF, and 0 to 0.01 volume% H2O , wherein the total amount of the gaseous impurity is 5 volume% or less. 一種使用填充了高純度含銻材料之如請求項1或4之低於大氣壓之儲存和輸送容器的方法,其包 含:將該容器可操作地連接至下游離子植入工具;在該低於大氣壓之儲存和輸送容器的下游建立小於佔據該容器的預定頭部空間容積之該高純度氣相含銻材料的蒸氣壓之壓力;將閥致動至開啟位置;在沒有加熱下從該容器的該預定頭部空間容積來配送該含銻材料,該含銻材料在沒有載氣下以0.1sccm或更大的流率呈高純度的氣相配送;以及在沒有該載氣下以0.1sccm或更大的該流率使該高純度的氣相含銻材料流動朝向該離子植入工具;以及在沒有該加熱下從該容器中的對應液相蒸發額外的含銻材料,而以0.1sccm或更大的該流率從該頭部空間繼續供應該高純度的氣相含銻材料。 A method of using a storage and delivery container, as claimed in claim 1 or 4, at sub-atmospheric pressure and filled with a high-purity antimony-containing material, comprising: operably connecting the container to a downstream ion implantation tool; establishing a pressure downstream of the sub-atmospheric pressure storage and delivery container at a pressure less than the vapor pressure of the high-purity vapor-phase antimony-containing material occupying a predetermined headspace volume of the container; actuating a valve to an open position; and dispensing the high-purity antimony-containing material from the predetermined headspace volume of the container without heating. An antimony-containing material, delivered in a high-purity gaseous phase at a flow rate of 0.1 sccm or greater without a carrier gas; and the high-purity gaseous antimony-containing material flowing toward the ion implantation tool at a flow rate of 0.1 sccm or greater without the carrier gas; and the evaporation of additional antimony-containing material from the corresponding liquid phase in the container without heating, while the high-purity gaseous antimony-containing material continues to be supplied from the head space at a flow rate of 0.1 sccm or greater.
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WO2007085008A2 (en) 2006-01-20 2007-07-26 Advanced Technology Materials, Inc. Apparatus and method for use of indium chloride to deliver indium vapor to ion source

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Publication number Priority date Publication date Assignee Title
WO2007085008A2 (en) 2006-01-20 2007-07-26 Advanced Technology Materials, Inc. Apparatus and method for use of indium chloride to deliver indium vapor to ion source

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