TWI906273B - Silicon nitride powder, and method for producing silicon nitride sintered body - Google Patents
Silicon nitride powder, and method for producing silicon nitride sintered bodyInfo
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本揭示係關於氮化矽粉末、以及氮化矽燒結體之製造方法。This disclosure relates to a method for manufacturing silicon nitride powder and silicon nitride sintered bodies.
氮化矽因為係強度、硬度、韌性、耐熱性、耐腐蝕性、耐熱衝擊性等優異的材料,所以被利用於壓鑄設備及熔解爐等各種產業用之零件、及汽車零件等中。又,因為氮化矽在高溫時的機械特性亦優異,所以已有研究將其採用於要求高溫強度、高溫蠕變特性之燃氣輪機零件中。Silicon nitride is a material with excellent strength, hardness, toughness, heat resistance, corrosion resistance, and thermal shock resistance, making it widely used in parts for various industries, such as die-casting equipment and melting furnaces, as well as automotive parts. Furthermore, because silicon nitride also exhibits excellent mechanical properties at high temperatures, research has been conducted on its application in gas turbine parts requiring high-temperature strength and high-temperature creep resistance.
對於氮化矽燒結體而言要求熱傳導率及機械特性更進一步的改善。例如專利文獻1揭示一種氮化矽質燒結體,其特徵為:在常溫時之熱傳導率為100~300W/(m・K),且在常溫時之3點彎折強度為600~1500MPa。 [先前技術文獻] [專利文獻]Further improvements in thermal conductivity and mechanical properties are required for silicon nitride sintered bodies. For example, Patent 1 discloses a silicon nitride sintered body characterized by a thermal conductivity of 100~300 W/(m·K) at room temperature and a three-point bending strength of 600~1500 MPa at room temperature. [Prior Art Documents] [Patent Documents]
[專利文獻1]日本特開2004-262756號公報[Patent Document 1] Japanese Patent Application Publication No. 2004-262756
[發明所欲解決之課題][The problem the invention aims to solve]
本揭示之一目的為提供可製造彎折強度優異之燒結體的氮化矽粉末。本揭示之又一目的為提供彎折強度優異的氮化矽燒結體的製造方法。 [解決課題之手段]One objective of this disclosure is to provide silicon nitride powder capable of producing sintered bodies with excellent flexural strength. Another objective of this disclosure is to provide a method for manufacturing silicon nitride sintered bodies with excellent flexural strength. [Means for Solving the Problem]
本揭示其中一態樣為提供一種氮化矽粉末,其包含氮化矽之一次粒子,且將藉由雷射繞射散射法測定之體積基準之粒徑的分布曲線中,從小粒徑開始之累積值到達全部的10%及90%時的粒徑分別設為D10及D90時,D90與D10的差值為5.5μm以下。One aspect of this disclosure is to provide a silicon nitride powder containing primary silicon nitride particles, wherein the particle size distribution curve of the volume reference determined by laser diffraction is set as D10 and D90 respectively when the cumulative value from the smallest particle size reaches 10% and 90% of the total particle size, and the difference between D90 and D10 is less than 5.5 μm.
上述氮化矽粉末,因為使D90與D10的差值(D90-D10)為預定值以下,所以可製備粒度分布窄,且具有更緻密的組織的成形體(未煅燒物)。將上述成形體予以煅燒而獲得之氮化矽燒結體,孔隙的產生等受抑制,彎折強度優異。The aforementioned silicon nitride powder, by ensuring that the difference between D90 and D10 (D90-D10) is below a predetermined value, can produce a molded body (uncalcined material) with a narrow particle size distribution and a denser microstructure. The silicon nitride sintered body obtained by calcining the aforementioned molded body exhibits suppressed porosity and excellent flexural strength.
上述氮化矽之D50可為1.5μm以下。若D50之上限值落在上述範圍內,氮化矽粉末會具有適度的粒度分布,所以可更改善一次粒子的填充密度。The D50 of the aforementioned silicon nitride can be below 1.5 μm. If the upper limit of D50 falls within the above range, the silicon nitride powder will have a suitable particle size distribution, thus further improving the filling density of primary particles.
上述氮化矽粉末之D90可為6.0μm以下。若D90之上限值落在上述範圍內,則可充分降低粗大粒子的比例,可更充分地抑制燒結體的密度降低。又,操作性會更優異。The D90 of the aforementioned silicon nitride powder can be below 6.0 μm. If the upper limit of D90 falls within the above range, the proportion of coarse particles can be sufficiently reduced, and the density reduction of the sintered body can be more effectively suppressed. Furthermore, the workability will be superior.
上述氮化矽粉末之BET比表面積可未達9.0m2 /g。The BET specific surface area of the above silicon nitride powder may not reach 9.0 m² /g.
本揭示其中一態樣為提供一種氮化矽燒結體之製造方法,具有將包含上述氮化矽粉末之燒結原料予以成形並煅燒的步驟。One aspect of this disclosure is a method for manufacturing a silicon nitride sintered body, comprising the steps of forming and calcining a sintering raw material containing the aforementioned silicon nitride powder.
上述氮化矽燒結體之製造方法因為使用包含上述氮化矽粉末的燒結原料,所以獲得之氮化矽燒結體能展現優異的彎折強度。 [發明之效果]The above-described method for manufacturing silicon nitride sintered bodies utilizes sintering raw materials containing the aforementioned silicon nitride powder, resulting in silicon nitride sintered bodies exhibiting excellent flexural strength. [Effects of the Invention]
根據本揭示,可提供能製造彎折強度優異之燒結體的氮化矽粉末。又根據本揭示,可提供彎折強度優異的氮化矽燒結體的製造方法。According to this disclosure, silicon nitride powder capable of producing sintered bodies with excellent flexural strength can be provided. Furthermore, according to this disclosure, a method for manufacturing silicon nitride sintered bodies with excellent flexural strength can be provided.
以下,針對本揭示之實施形態進行說明。但以下之實施形態係用於說明本揭示之例示,並不代表本揭示受以下內容所限定。The following describes embodiments of this disclosure. However, the embodiments described below are merely illustrative examples of this disclosure and do not imply that this disclosure is limited to the following content.
本說明書中例示之材料除非另有指明,係可單獨使用1種或將2種以上組合使用。組成物中各成分的含量,在相當於組成物中之各成分的物質有多數存在時,除非另有指明,係指在組成物中存在之該多數物質的合計量。本說明書中之「步驟」,可指互相獨立的步驟,亦可指同時進行的步驟。Unless otherwise specified, the materials illustrated in this instruction manual may be used alone or in combination of two or more. The content of each component in a composition, when referring to a plurality of substances equivalent to the presence of each component in the composition, means, unless otherwise specified, the aggregate amount of that plurality of substances present in the composition. The term "step" in this instruction manual may refer to independent steps or steps performed simultaneously.
氮化矽粉末之一實施形態,係包含氮化矽之一次粒子,且將藉由雷射繞射散射法測定之體積基準之粒徑的分布曲線中,從小粒徑開始之累積值到達全部的10%及90%時的粒徑分別設為D10及D90時,D90與D10的差值為5.5μm以下。One embodiment of silicon nitride powder is a primary particle containing silicon nitride, wherein the particle size distribution curve of the volume reference determined by laser diffraction is set as D10 and D90 respectively when the cumulative value from the smallest particle size reaches 10% and 90% of the total particle size, and the difference between D90 and D10 is less than 5.5 μm.
上述D90與D10的差值(D90-D10)的上限值為5.5μm以下,例如可為5.4μm以下、5.2μm以下、5.0μm以下、4.8μm以下、或4.6μm以下。上述差值的上限值若落在上述範圍內,因為將氮化矽粉末進行壓縮成形等而製備出之成形體能具有更緻密的組織,所以更能抑制在燒結時的孔隙的產生等。亦即,能使獲得之氮化矽燒結體的彎折強度更為改善。上述D90與D10的差值的下限值例如可為3.0μm以上、3.2μm以上、或3.4μm以上。若上述差值的下限值落在上述範圍內,因為氮化矽粉末會具有適度的粒度分布,所以能使一次粒子的填充密度更為改善。上述差值能在上述範圍內進行調整,例如可為3.0~5.5μm、3.2~5.4μm、或3.4~4.6μm。上述差值可藉由調整氮化矽粉末在製造時的粉碎條件等來進行控制。The upper limit of the difference between D90 and D10 (D90-D10) is 5.5 μm or less, for example, it can be 5.4 μm or less, 5.2 μm or less, 5.0 μm or less, 4.8 μm or less, or 4.6 μm or less. If the upper limit of the difference falls within the above range, the molded body prepared by compressing silicon nitride powder can have a denser structure, thus better suppressing the generation of porosity during sintering. That is, the flexural strength of the obtained silicon nitride sintered body can be further improved. The lower limit of the difference between D90 and D10 can be, for example, 3.0 μm or more, 3.2 μm or more, or 3.4 μm or more. If the lower limit of the aforementioned difference falls within the aforementioned range, the primary particle packing density can be further improved because silicon nitride powder will have a suitable particle size distribution. The aforementioned difference can be adjusted within the aforementioned range, for example, to 3.0~5.5μm, 3.2~5.4μm, or 3.4~4.6μm. The aforementioned difference can be controlled by adjusting the pulverization conditions during the manufacturing of the silicon nitride powder.
氮化矽粉末之D90的上限值例如可為6.0μm以下、5.8μm以下、5.6μm以下、5.4μm以下、或5.2μm以下。若D90之上限值落在上述範圍內,則可充分降低粗大粒子的比例,可更充分地抑制燒結體的密度降低。D90的下限值例如可為3.5μm以上、3.7μm以上、3.9μm以上、或4.0μm以上。D90可在上述範圍內進行調整,例如可為3.5~6.0μm、或4.0~5.2μm。氮化矽粉末之D90,例如可藉由調整在製造氮化矽粉末時的粉碎條件等來進行控制。The upper limit of the D90 of silicon nitride powder can be, for example, 6.0 μm or less, 5.8 μm or less, 5.6 μm or less, 5.4 μm or less, or 5.2 μm or less. If the upper limit of D90 falls within the above range, the proportion of coarse particles can be sufficiently reduced, and the density reduction of the sintered body can be more effectively suppressed. The lower limit of D90 can be, for example, 3.5 μm or more, 3.7 μm or more, 3.9 μm or more, or 4.0 μm or more. D90 can be adjusted within the above range, for example, from 3.5 to 6.0 μm, or from 4.0 to 5.2 μm. The D90 of silicon nitride powder can be controlled, for example, by adjusting the pulverization conditions during the manufacture of silicon nitride powder.
氮化矽粉末之D50的上限值例如可為1.5μm以下、或1.4μm以下。若D50之上限值落在上述範圍內,能使氮化矽燒結體的強度更為改善。氮化矽粉末之D50的下限值例如可為1.1μm以上、或1.2μm以上。氮化矽粉末之D50可在上述範圍內進行調整,例如可為1.1~1.5μm、或1.2~1.4μm。The upper limit of the D50 of silicon nitride powder can be, for example, 1.5 μm or less, or 1.4 μm or less. If the upper limit of D50 falls within the above range, the strength of the silicon nitride sintered body can be further improved. The lower limit of the D50 of silicon nitride powder can be, for example, 1.1 μm or more, or 1.2 μm or more. The D50 of silicon nitride powder can be adjusted within the above range, for example, it can be 1.1~1.5 μm, or 1.2~1.4 μm.
本說明書中之D10、D50、及D90係各別代表藉由雷射繞射散射法測定之體積基準之粒徑的分布曲線中,從小粒徑開始之累積值到達全部的10%、50%及90%時的粒徑。雷射解析散射法可依循JIS Z 8825:2013「粒徑解析-雷射繞射散射法」中記載之方法來進行測定。測定時可使用雷射繞射散射法粒度分布測定裝置(貝克曼庫爾特公司製、商品名:LS-13 320)等。另外,D50亦稱作中值粒徑,係指氮化矽粉末之平均粒徑。In this manual, D10, D50, and D90 represent the particle sizes at 10%, 50%, and 90% of the cumulative particle size distribution curve of the volumetric standard determined by laser diffraction scattering, respectively. Laser diffraction scattering can be performed according to the method described in JIS Z 8825:2013 "Particle Size Analysis - Laser Diffraction Scattering". A laser diffraction particle size distribution measuring device (manufactured by Beckman Coulter, trade name: LS-13 320) can be used for measurement. Additionally, D50, also known as the median particle size, refers to the average particle size of silicon nitride powder.
氮化矽粉末之BET比表面積的上限值例如可為未達9.0m2 /g、8.8m2 /g以下、8.6m2 /g以下、或8.5m2 /g以下。氮化矽粉末之BET比表面積的下限值例如可為5.0m2 /g以上、5.1m2 /g以上、5.2m2 /g以上、5.3m2 /g以上、5.4m2 /g以上、5.5m2 /g以上、6.0m2 /g以上、或7.0m2 /g以上。氮化矽粉末之BET比表面積可在上述範圍內進行調整,例如可為5.0~9.0m2 /g、或5.5~8.5m2 /g、或7.0~8.5m2 /g。氮化矽粉末之BET比表面積,例如可藉由調整在製造氮化矽粉末時的粉碎條件等來進行控制。The upper limit of the BET specific surface area of silicon nitride powder can be, for example, less than 9.0 m² /g, less than 8.8 m² /g, less than 8.6 m² /g, or less than 8.5 m² /g. The lower limit of the BET specific surface area of silicon nitride powder can be, for example, 5.0 m² /g or more, 5.1 m²/g or more, 5.2 m² / g or more, 5.3 m² /g or more, 5.4 m²/g or more, 5.5 m² /g or more, 6.0 m² /g or more, or 7.0 m² /g or more. The BET specific surface area of silicon nitride powder can be adjusted within the above ranges, for example, it can be 5.0~9.0 m² /g, or 5.5~8.5 m² /g, or 7.0~8.5 m² /g. The BET specific surface area of silicon nitride powder can be controlled, for example, by adjusting the pulverization conditions during the manufacturing of silicon nitride powder.
本說明書中之BET比表面積係依循JIS Z 8830:2013「利用氣體吸附之粉體(固體)的比表面積測定方法」中記載之方法,使用氮氣並藉由BET一點法所測定之數值。The BET specific surface area in this manual is determined using the method described in JIS Z 8830:2013 "Determination of specific surface area of powder (solid) by gas adsorption", using nitrogen and the BET one-point method.
氮化矽之表面氧量的上限值例如可為2.0質量%以下、1.5質量%以下、或1.3質量%以下。氮化矽之表面氧量的上限值若落在上述範圍內,可更充分地減少在製造氮化矽燒結體時的晶界相。氮化矽之表面氧量的下限值例如可為0.20質量%以上、0.30質量%以上、0.35質量%以上、0.40質量%以上、0.45質量%以上、0.60質量%以上、0.80質量%以上、或1.0質量%以上。若氮化矽之表面氧量的下限值落在上述範圍內,可促進在煅燒氮化矽時的晶粒成長,可使氮化矽燒結體之彎折強度更為改善。氮化矽之表面氧量可在上述範圍內進行調整,例如可為0.20~2.0質量%、0.20~1.5質量%、或1.0~1.5質量%。氮化矽之表面氧量,例如可藉由調整在氮化矽粉末之製造中之煅燒步驟中的氣體環境的成分、還有煅燒溫度及煅燒時間等來進行控制。The upper limit of the surface oxygen content of silicon nitride can be, for example, 2.0% by mass or less, 1.5% by mass or less, or 1.3% by mass or less. If the upper limit of the surface oxygen content of silicon nitride falls within the above range, the grain boundary phase during the manufacture of silicon nitride sintered bodies can be reduced more sufficiently. The lower limit of the surface oxygen content of silicon nitride can be, for example, 0.20% by mass or more, 0.30% by mass or more, 0.35% by mass or more, 0.40% by mass or more, 0.45% by mass or more, 0.60% by mass or more, 0.80% by mass or more, or 1.0% by mass or more. If the lower limit of the surface oxygen content of silicon nitride falls within the above range, grain growth during the calcination of silicon nitride can be promoted, and the flexural strength of the silicon nitride sintered body can be further improved. The surface oxygen content of silicon nitride can be adjusted within the above range, for example, it can be 0.20~2.0% by mass, 0.20~1.5% by mass, or 1.0~1.5% by mass. The surface oxygen content of silicon nitride can be controlled, for example, by adjusting the composition of the gas environment, calcination temperature, and calcination time during the calcination step in the manufacturing of silicon nitride powder.
本說明書中之「表面氧量」係指藉由以下程序所求得之數值。使用氧氮分析裝置分析氮化矽粉末之氧量及氮量。在氦氣環境中,將測定用之試樣以8℃/秒之昇溫速度從20℃昇溫至2000℃。利用紅外吸收法來檢測伴隨著昇溫而脫離的氧。昇溫一開始,鍵結於氮化矽粉末的表面的氧會脫離。若進一步加熱而溫度到達1400℃附近的話,氮化矽會開始分解。可藉由開始檢測到氮來確認氮化矽的分解開始。若氮化矽開始分解,在氮化矽粉末內部的氧會脫離。因此,在此階段脫離的氧係相當於內部氧量,所以將在檢測到氮之前所檢測、定量的氧量作為表面氧量。The "surface oxygen content" in this manual refers to the value obtained by the following procedure. The oxygen and nitrogen content of silicon nitride powder is analyzed using an oxygen-nitrogen analyzer. In a helium atmosphere, the sample is heated from 20°C to 2000°C at a heating rate of 8°C/second. Infrared absorption is used to detect the oxygen released during heating. Initially, oxygen bonded to the surface of the silicon nitride powder is released during heating. If further heating is applied, reaching a temperature of approximately 1400°C, silicon nitride begins to decompose. The initiation of silicon nitride decomposition can be confirmed by the detection of nitrogen. If silicon nitride begins to decompose, oxygen within the silicon nitride powder is released. Therefore, the oxygen system that is released at this stage is equivalent to the internal oxygen content, so the oxygen content detected and quantified before nitrogen is detected is taken as the surface oxygen content.
上述氮化矽粉末例如可藉由以下方法來製造。氮化矽粉末之製造方法的一實施形態,係具有以下步驟:將矽粉末在包含氮、以及選自於由氫及氨構成之群組中之至少一種的氣體環境下予以煅燒而獲得煅燒物的步驟(以下,亦稱作煅燒步驟);將上述煅燒物予以乾式粉碎而獲得粉碎物的步驟(以下,亦稱作粉碎步驟);將上述粉碎物進行乾式分級的步驟(以下,亦稱作分級步驟)。The aforementioned silicon nitride powder can be manufactured, for example, by the following method. One embodiment of the method for manufacturing silicon nitride powder includes the following steps: calcining silicon powder in a gas environment containing nitrogen and at least one gas selected from the group consisting of hydrogen and ammonia to obtain a calcined product (hereinafter also referred to as the calcination step); dry pulverizing the aforementioned calcined product to obtain a pulverized product (hereinafter also referred to as the pulverization step); and dry classifying the aforementioned pulverized product (hereinafter also referred to as the classification step).
就矽粉末而言,可使用氧濃度低的矽粉末。矽粉末之氧濃度的上限值例如可為0.40質量%以下、0.30質量%以下、或0.20質量%以下。若矽粉末的氧濃度落在上述範圍內,可更減少在獲得之氮化矽粉末內部的氧量。矽粉末之氧濃度的下限值例如可為0.10質量%以上、或0.15質量%以上。矽粉末之氧濃度可在上述範圍內進行調整,例如可為0.10~0.40質量%。Regarding the silicon powder, silicon powder with low oxygen concentration can be used. The upper limit of the oxygen concentration of the silicon powder can be, for example, 0.40% by mass or less, 0.30% by mass or less, or 0.20% by mass or less. If the oxygen concentration of the silicon powder falls within the above range, the amount of oxygen inside the obtained silicon nitride powder can be further reduced. The lower limit of the oxygen concentration of the silicon powder can be, for example, 0.10% by mass or more, or 0.15% by mass or more. The oxygen concentration of the silicon powder can be adjusted within the above range, for example, from 0.10 to 0.40% by mass.
本說明書中之矽粉末的氧濃度,係指利用紅外線吸收法所測得之數值。The oxygen concentration of the silicon powder in this manual refers to the value measured using infrared absorption.
矽粉末可使用市售物,亦可使用另外製備者。矽粉末之氧濃度高的時候,例如可使用包含氫氟酸的前處理液來減少與矽粉末鍵結的氧量。例如上述氮化矽粉末的製造方法亦可更具有使用包含氫氟酸的前處理液來對矽粉末進行前處理,並獲得氧濃度為0.40質量%以下之矽粉末的前處理步驟。Commercially available silicon powder can be used, or it can be prepared separately. When the oxygen concentration of the silicon powder is high, a pretreatment solution containing hydrofluoric acid can be used to reduce the amount of oxygen bonded to the silicon powder. For example, the above-described method for manufacturing silicon nitride powder can also include a pretreatment step of using a pretreatment solution containing hydrofluoric acid to pretreat the silicon powder and obtain silicon powder with an oxygen concentration of less than 0.40% by mass.
前處理液包含氫氟酸,但亦可為例如與鹽酸等酸的混酸,亦可僅由氫氟酸構成。前處理步驟中之前處理液的溫度例如可為40~80℃。又,使前處理液與矽粉末接觸的時間例如可為1~10小時。The pretreatment solution contains hydrofluoric acid, but it can also be a mixture of acids such as hydrochloric acid, or it can consist solely of hydrofluoric acid. The temperature of the pretreatment solution in the pretreatment step can be, for example, 40~80°C. Furthermore, the contact time between the pretreatment solution and the silicon powder can be, for example, 1~10 hours.
在煅燒步驟中將矽粉末在包含氮、以及選自於由氫及氨構成之群組中之至少一種的混合氣體環境下予以煅燒而獲得包含氮化矽的煅燒物。以混合氣體環境全體為基準,混合氣體環境中之氫及氨之合計含量例如可為10~40體積%。煅燒溫度例如可為1100~1450℃、或1200~1400℃。煅燒時間例如可為30~100小時。In the calcination step, silicon powder is calcined in a mixed gas environment containing nitrogen and at least one of the groups selected from hydrogen and ammonia to obtain a calcined product containing silicon nitride. Based on the overall mixed gas environment, the total content of hydrogen and ammonia in the mixed gas environment can be, for example, 10-40% by volume. The calcination temperature can be, for example, 1100-1450°C or 1200-1400°C. The calcination time can be, for example, 30-100 hours.
在粉碎步驟中將在煅燒步驟獲得之上述煅燒物以乾式方法予以粉碎而獲得粉碎物。在本實施形態之氮化矽粉末之製造方法中,粉碎步驟係包含球磨粉碎及振動研磨粉碎步驟這2個步驟。將煅燒物粉碎、並調整粒度,藉此使在之後的分級步驟的控制變容易。包含在煅燒步驟中獲得之氮化矽的煅燒物為塊狀、鑄錠狀等的時候,進行粉碎步驟的效果係更顯著。In the pulverization step, the calcined material obtained in the calcination step is pulverized using a dry method to obtain pulverized material. In the method for manufacturing silicon nitride powder of this embodiment, the pulverization step includes two steps: ball milling and vibratory grinding. Pulverizing the calcined material and adjusting the particle size makes it easier to control in the subsequent classification step. The effect of the pulverization step is more significant when the calcined silicon nitride obtained in the calcination step is in the form of blocks, ingots, etc.
各粉碎亦可分成像是粗粉碎及微粉碎這樣的多階段來進行。粉碎步驟係以乾式粉碎步驟來進行。The grinding process can also be divided into multiple stages, such as coarse grinding and fine grinding. The grinding step is carried out using a dry grinding process.
球磨粉碎步驟中之滾珠對容器之填充率能配合作為目標之氮化矽粉末的粒度分布來進行調整。針對滾珠對容器之填充率的下限值,以容器之容積為基準,例如可為40體積%以上、45體積%以上、50體積%以上、或60體積%以上。針對滾珠對容器之填充率的上限值,以容器之容積為基準,例如可為70體積%以下、或65體積%以下。The ball milling process can adjust the ball filling rate of the container to match the particle size distribution of the target silicon nitride powder. The lower limit of the ball filling rate is based on the container volume and can be, for example, 40% or more, 45% or more, 50% or more, or 60% or more. The upper limit of the ball filling rate is also based on the container volume and can be, for example, below 70% or below 65% or below.
球磨粉碎步驟中之粉碎處理之時間(粉碎時間)的下限值,例如可為5小時以上、6小時以上、7小時以上、或8小時以上。若粉碎時間的下限值落在上述範圍內,可使粉碎物充分細小,可使在以乾式方法進一步粉碎時的粉碎效率更為改善。球磨粉碎步驟中之粉碎處理之時間的上限值例如可為15小時以下、14小時以下、13小時以下、或12小時以下。若粉碎時間之上限值落在上述範圍內,可使煅燒物充分粉碎,可防止過度的粉碎。粉碎時間可在上述範圍內進行調整,例如可為5~15小時、或8~12小時。The lower limit of the grinding time in the ball milling step can be, for example, 5 hours or more, 6 hours or more, 7 hours or more, or 8 hours or more. If the lower limit of the grinding time falls within the above range, the pulverized material can be sufficiently fined, which can further improve the grinding efficiency when further pulverized by dry methods. The upper limit of the grinding time in the ball milling step can be, for example, 15 hours or less, 14 hours or less, 13 hours or less, or 12 hours or less. If the upper limit of the grinding time falls within the above range, the calcined material can be fully pulverized, and over-pulverization can be prevented. The grinding time can be adjusted within the above range, for example, 5 to 15 hours, or 8 to 12 hours.
粉碎步驟係在球磨粉碎步驟之後藉由振動研磨粉碎步驟將上述煅燒物再進行粉碎。振動研磨粉碎步驟中之滾珠對容器之填充率能配合作為目標之氮化矽粉末的粒度分布來進行調整。針對滾珠對容器之填充率的下限值,以容器之容積為基準,例如可為50體積%以上、55體積%以上、或60體積%以上。針對滾珠對容器之填充率的上限值,以容器之容積為基準,例如可為80體積%以下、或75體積%以下。The pulverization step involves further pulverizing the calcined material using a vibratory grinding step after the ball milling step. The ball bearing capacity of the container in the vibratory grinding step can be adjusted to match the particle size distribution of the target silicon nitride powder. The lower limit for the ball bearing capacity is based on the container volume and can be, for example, 50% or more, 55% or more, or 60% or more. The upper limit for the ball bearing capacity is based on the container volume and can be, for example, below 80% or below, or below 75% or below.
振動研磨粉碎步驟中之粉碎處理之時間(粉碎時間)的下限值例如可為8小時以上、9小時以上、10小時以上、或12小時以上。若粉碎時間的下限值落在上述範圍內,可使粉碎物充分細小,可使分級步驟的處理效率更為改善。振動研磨粉碎步驟中之粉碎處理之時間的上限值例如可為20小時以下、19小時以下、18小時以下、或17小時以下。若粉碎時間的上限值落在上述範圍內,可使煅燒物充分粉碎,亦可防止過剩的粉碎。粉碎時間可在上述範圍內進行調整,例如可為8~20小時、或12~17小時。The lower limit of the grinding time in the vibratory grinding step can be, for example, 8 hours or more, 9 hours or more, 10 hours or more, or 12 hours or more. If the lower limit of the grinding time falls within the above range, the pulverized material can be sufficiently fined, and the processing efficiency of the classification step can be further improved. The upper limit of the grinding time in the vibratory grinding step can be, for example, less than 20 hours, less than 19 hours, less than 18 hours, or less than 17 hours. If the upper limit of the grinding time falls within the above range, the calcined material can be sufficiently pulverized, and over-pulverization can be prevented. The grinding time can be adjusted within the above range, for example, from 8 to 20 hours, or from 12 to 17 hours.
在分級步驟中將經過粉碎步驟而製備出之上述粉碎物再以乾式方法進行分級,製備具有所期望之粒度分布的氮化矽粉末。例如可將粗粉除去以調整氮化矽粉末的D90等。乾式分級例如可藉由氣流分級等來進行。氣流分級機例如可使用旋回氣流等來進行分級。一次氣體壓力(入口壓力)例如可為0.2~0.8MPa、或0.3~0.7MPa。In the classification step, the pulverized material obtained from the pulverization step is further classified using a dry method to produce silicon nitride powder with the desired particle size distribution. For example, coarse powder can be removed to adjust the D90 of the silicon nitride powder. Dry classification can be performed, for example, by airflow classification. Airflow classifiers can be used, for example, with swirling airflow. The primary gas pressure (inlet pressure) can be, for example, 0.2~0.8 MPa or 0.3~0.7 MPa.
藉由上述製造方法所獲得之氮化矽粉末係燒結性優異。亦即,上述氮化矽粉末可理想地使用於燒結體原料。The silicon nitride powder obtained by the above manufacturing method has excellent sintering properties. That is, the silicon nitride powder can be ideally used as raw material for sintered bodies.
氮化矽燒結體之製造方法的一實施形態中,具有將包含上述氮化矽粉末的燒結原料予以成形並煅燒的步驟。One embodiment of the method for manufacturing silicon nitride sintered bodies includes a step of forming and calcining a sintering raw material containing the aforementioned silicon nitride powder.
燒結原料除了氮化矽粉末以外亦可含有氧化物系燒結助劑。就氧化物系燒結助劑而言,可列舉如Y2 O3 、MgO及Al2 O3 等。燒結原料中之氧化物系燒結助劑的含量例如可為3~10質量%。In addition to silicon nitride powder , sintering raw materials may also contain oxide-based sintering aids. Examples of oxide-based sintering aids include Y₂O₃ , MgO, and Al₂O₃ . The content of oxide-based sintering aids in the sintering raw materials may be, for example , 3 to 10% by mass.
在上述步驟中將上述燒結原料以例如3.0~30.0MPa的成形壓力進行加壓而獲得成形體。成形體可進行單軸加壓來製作,亦可藉由CIP來製作。又,亦可藉由熱壓來一邊成形一邊煅燒。成形體的煅燒可在氮氣或氬氣等鈍性氣體環境中進行。煅燒時的壓力可為0.7~1.0MPa。煅燒溫度可為1860~2100℃,亦可為1880~2000℃。該煅燒溫度之煅燒時間可為6~20小時,亦可為8~16小時。到煅燒溫度為止的昇溫速度例如可為1.0~10.0℃/小時。In the above steps, the sintering raw material is pressurized at a forming pressure of, for example, 3.0 to 30.0 MPa to obtain a molded body. The molded body can be manufactured by uniaxial pressurization or by CIP (Continuous In-Place Assembly). Alternatively, it can be formed and calcined simultaneously by hot pressing. The calcination of the molded body can be carried out in a passive gas environment such as nitrogen or argon. The calcination pressure can be 0.7 to 1.0 MPa. The calcination temperature can be 1860 to 2100°C or 1880 to 2000°C. The calcination time at this temperature can be 6 to 20 hours or 8 to 16 hours. The heating rate up to the calcination temperature can be, for example, 1.0~10.0℃/hour.
獲得之氮化矽燒結體因為晶界相減少並具有緻密的組織,所以能展現優異的彎折強度。The obtained silicon nitride sintered structure exhibits excellent bending strength due to the reduction of grain boundary phases and the presence of a dense structure.
氮化矽燒結體之彎折強度在室溫中例如可設定為550MPa以上、600MPa以上、或650MPa以上。本說明書中之氮化矽燒結體的彎折強度,係指依循JIS R 1601:2008來製作強度測定用試驗片,並在室溫中所測得之3點彎折強度。The flexural strength of silicon nitride sintered bodies can be set to 550 MPa or higher, 600 MPa or higher, or 650 MPa or higher at room temperature. The flexural strength of silicon nitride sintered bodies in this specification refers to the 3-point flexural strength measured at room temperature using a strength test piece prepared in accordance with JIS R 1601:2008.
以上,針對幾個實施形態進行了說明,但本揭示並不受上述實施形態任何限定。又,關於上述實施形態之說明內容係可互相採用。 [實施例]The above description addresses several embodiments, but this disclosure is not limited to any of these embodiments. Furthermore, the descriptions of the above embodiments are interchangeable. [Examples]
以下,參照實施例及比較例對本揭示內容進行更詳細的說明。但本揭示並不受下列實施例所限定。The contents of this disclosure will now be described in more detail with reference to embodiments and comparative examples. However, this disclosure is not limited to the following embodiments.
(實施例1) <氮化矽粉末之製備> 將市售之矽粉末(比表面積:3.0m2 /g)浸漬於溫度調整為60℃且包含氯化氫及氟化氫的混酸中,維持在60℃,施以2小時之前處理。上述混酸係使用市售之鹽酸(濃度:35質量%)與氫氟酸(濃度:55質量%)以10:1的質量比進行混合所成者。之後,將矽粉末從混酸取出並以水洗淨,在氮氣環境下進行乾燥。乾燥後之矽粉末的氧濃度為0.4質量%。此氧濃度係藉由紅外線吸收法進行測定。(Example 1) <Preparation of Silicon Nitride Powder> Commercially available silicon powder (specific surface area: 3.0 m² /g) was immersed in a mixed acid containing hydrogen chloride and hydrogen fluoride at a temperature adjusted to 60°C and maintained at 60°C for 2 hours. The mixed acid was prepared by mixing commercially available hydrochloric acid (concentration: 35% by mass) and hydrofluoric acid (concentration: 55% by mass) in a mass ratio of 10:1. Afterward, the silicon powder was removed from the mixed acid and washed with water, and then dried under a nitrogen atmosphere. The oxygen concentration of the dried silicon powder was 0.4% by mass. This oxygen concentration was determined by infrared absorption method.
使用乾燥後之矽粉末製作成形體(容積密度:1.4g/cm3 )。將獲得之成形體靜置於電爐內,以1400℃經過60小時的煅燒來製作包含氮化矽的煅燒體。就煅燒時的氣體環境而言,係供給氮與氫的混合氣體(以使N2 與H2 在標準狀態下的體積比為80:20的方式進行混合所成之混合氣體)。將獲得之煅燒體予以粗粉碎後,以球磨機進行乾式粉碎。就球磨粉碎而言,係將滾珠對容器之填充率設為60體積%,並將粉碎時間設為8小時。再以振動研磨進行乾式粉碎,將滾珠對容器之填充率設為70體積%,並將粉碎時間設為15小時。A molded body (bulk density: 1.4 g/ cm³ ) was prepared using dried silicon powder. The resulting molded body was then placed in an electric furnace and calcined at 1400°C for 60 hours to produce a calcined body containing silicon nitride. The gas environment during calcination was a mixture of nitrogen and hydrogen (a mixture of N₂ and H₂ at a standard volume ratio of 80:20). The resulting calcined body was coarsely pulverized and then dry-milled using a ball mill. For ball milling, the ball filling rate to the container was set to 60% by volume, and the milling time was set to 8 hours. Then, dry grinding was carried out by vibratory grinding, with the ball filling rate of the container set to 70% by volume and the grinding time set to 15 hours.
將進行乾式粉碎而獲得之氮化矽粉末以一次氣體壓力為0.4MPa的條件進行分級,獲得氮化矽粉末。Silicon nitride powder obtained by dry grinding is classified under a primary gas pressure of 0.4 MPa to obtain silicon nitride powder.
<氮化矽粉末之評價:D10、D50、及D90的測定> 依循JIS Z 8825:2013「粒徑解析-雷射繞射散射法」中記載之方法以雷射解析散射法來測定氮化矽粉末之D10、D50、及D90。測定係使用雷射繞射散射法粒度分布測定裝置(貝克曼庫爾特公司製、商品名:LS-13 320)。<Evaluation of Silicon Nitride Powder: Determination of D10, D50, and D90> Following the method described in JIS Z 8825:2013 "Particle Size Analysis - Laser Diffraction Scattering," the D10, D50, and D90 of silicon nitride powder were determined by laser analytical scattering. The determination was performed using a laser diffraction particle size distribution measuring apparatus (Beckman Coulter, trade name: LS-13 320).
<氮化矽粉末之評價:BET比表面積的測定> BET比表面積係依循JIS Z 8803:2013並使用氮氣藉由BET一點法所測定。將結果顯示於表1。<Evaluation of Silicon Nitride Powder: Determination of BET Specific Surface Area> The BET specific surface area was determined by the BET one-point method using nitrogen, in accordance with JIS Z 8803:2013. The results are shown in Table 1.
<氮化矽粉末之評價:表面氧量的測定> 表面氧量係使用氧/氮同時分析裝置(堀場製作所公司製、裝置名:EMGA-920)進行測定。具體而言,藉由在氦氣環境中,將氮化矽粉末以昇溫速度8℃/秒從20℃加熱至2000℃,將檢測到氮之前的氧量予以定量以測定。<Evaluation of Silicon Nitride Powder: Determination of Surface Oxygen Content> Surface oxygen content was measured using a simultaneous oxygen/nitrogen analyzer (manufactured by Horiba Seisakusho, device name: EMGA-920). Specifically, silicon nitride powder was heated from 20°C to 2000°C at a heating rate of 8°C/second in a helium atmosphere, and the amount of oxygen before nitrogen detection was quantified.
[氮化矽燒結體之製造] 秤取製備出之氮化矽粉末90質量份、平均粒徑為1.5μm之Y2 O3 粉末5質量份、及平均粒徑為1.2μm之Yb2 O3 粉末5質量份於容器中,加入甲醇,濕式混合4小時。之後,將乾燥而獲得之混合粉末(煅燒原料)以10MPa的壓力進行模具成形,之後,再以25MPa的壓力進行冷均壓(CIP)成形。將獲得之成形體與由氮化矽粉末及BN粉末之混合粉末構成的填充粉一併設置於碳製坩堝中,在1MPa的氮加壓氣體環境下,以溫度1900℃煅燒12小時以製造氮化矽燒結體。[Manufacturing of Silicon Nitride Sintered Body] Weigh 90 parts by weight of the prepared silicon nitride powder, 5 parts by weight of Y₂O₃ powder with an average particle size of 1.5 μm, and 5 parts by weight of Yb₂O₃ powder with an average particle size of 1.2 μm into a container, add methanol, and wet mix for 4 hours. Then, the dried mixed powder (calcined raw material) is molded under a pressure of 10 MPa, and then cold homogenized pressing (CIP) is performed under a pressure of 25 MPa. The obtained molded body and the filler powder composed of a mixture of silicon nitride powder and BN powder are placed together in a carbon crucible and calcined at 1900°C for 12 hours under a nitrogen pressurization gas environment of 1 MPa to produce a silicon nitride sintered body.
<氮化矽燒結體之彎折強度測定、及評價> 依循JIS R1601:2008由氮化矽燒結體製作強度測定用之試驗片,測定在室溫中之3點彎折強度。依據基準從測定結果進行評價。將結果顯示於表1。另外,表1中彎折強度之測定結果,係以將在後述之比較例1製備出之氮化矽燒結體作為基準而獲得之相對值來表示。 A:彎折強度(相對值)為1.10以上。 B:彎折強度(相對值)為1.05以上且未達1.10。 C:彎折強度(相對值)未達1.05。<Determination and Evaluation of Flexural Strength of Silicon Nitride Sintered Structures> Following JIS R1601:2008, test pieces for strength testing were prepared from silicon nitride sintered structures, and the flexural strength at three points at room temperature was measured. The test results were evaluated against a reference standard. The results are shown in Table 1. Furthermore, the flexural strength test results in Table 1 are relative values obtained using the silicon nitride sintered structure prepared in Comparative Example 1 (described later) as a reference. A: Flexural strength (relative value) is 1.10 or higher. B: Flexural strength (relative value) is 1.05 or higher but less than 1.10. C: Flexural strength (relative value) is less than 1.05.
(實施例2) 將乾式粉碎之振動研磨條件變更為表1記載之條件,除此以外,與實施例1同樣地進行,製備氮化矽粉末。針對獲得之氮化矽粉末與實施例1同樣地進行評價。將結果顯示於表1。(Example 2) The vibratory grinding conditions of the dry pulverizer were changed to the conditions recorded in Table 1, and silicon nitride powder was prepared in the same manner as in Example 1. The obtained silicon nitride powder was evaluated in the same manner as in Example 1. The results are shown in Table 1.
(實施例3) 將乾式粉碎之球磨粉碎條件變更為表1記載之條件,除此以外,與實施例1同樣地進行,製備氮化矽粉末。針對獲得之氮化矽粉末與實施例1同樣地進行評價。將結果顯示於表1。(Example 3) The dry grinding ball milling conditions were changed to those recorded in Table 1, and silicon nitride powder was prepared in the same manner as in Example 1. The obtained silicon nitride powder was evaluated in the same manner as in Example 1. The results are shown in Table 1.
(比較例1) 將乾式分級之條件變更為表1記載之條件,除此以外,與實施例1同樣地進行,製備氮化矽粉末。針對獲得之氮化矽粉末與實施例1同樣地進行評價。將結果顯示於表1。(Comparative Example 1) The conditions for dry grading were changed to those described in Table 1, and silicon nitride powder was prepared in the same manner as in Example 1. The obtained silicon nitride powder was evaluated in the same manner as in Example 1. The results are shown in Table 1.
[表1]
根據本揭示,可提供能製造彎折強度優異之燒結體的氮化矽粉末。又根據本揭示,可提供彎折強度優異的氮化矽燒結體的製造方法。According to this disclosure, silicon nitride powder capable of producing sintered bodies with excellent flexural strength can be provided. Furthermore, according to this disclosure, a method for manufacturing silicon nitride sintered bodies with excellent flexural strength can be provided.
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