TWI902505B - Chip - Google Patents
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- TWI902505B TWI902505B TW113140608A TW113140608A TWI902505B TW I902505 B TWI902505 B TW I902505B TW 113140608 A TW113140608 A TW 113140608A TW 113140608 A TW113140608 A TW 113140608A TW I902505 B TWI902505 B TW I902505B
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Abstract
Description
本案係關於一種晶片,特別係關於一種能夠通過單一引腳以配置向量編程的晶片。This case relates to a chip, and more particularly to a chip that can be configured for vector programming via a single pin.
特定應用積體電路常常會通過引腳綑紮進行配置。引腳捆紮配置為採用特定應用積體電路的電路設計人員提供印刷電路板層級的靈活性。舉例而言,電路設計者可能會通過在印刷電路板層級的引腳綑紮電路配置特定應用積體電路的晶片識別碼,從而允許晶片的多種實例擁有不同識別碼。再舉一個例子,引腳捆紮配置用於啟用/停用特定晶片功能,以使終端用戶能夠隨意修改與特定晶片功能相關的撥碼開關。然而,特定應用積體電路常常通過兩個以上的引腳進行多位元向量的配置,這會造成晶片體積以及物料成本增加。 因此,如何提供一種晶片以解決上述問題為本領域中重要的議題。Application-specific integrated circuits (ASICs) are often configured using pin bundling. Pin bundling configurations provide circuit designers using application-specific ASICs with flexibility at the printed circuit board (PCB) level. For example, a circuit designer might configure the chip identifier of an application-specific ASIC in pin-bundled circuitry at the PCB level, allowing multiple instances of the chip to have different identifiers. As another example, pin bundling configurations are used to enable/disable specific chip functions, allowing end users to easily modify DIP switches associated with specific chip functions. However, application-specific integrated circuits often employ multi-bit vector configurations using two or more pins, which increases chip size and material costs. Therefore, providing a chip that solves these problems is an important issue in this field.
本揭示文件提供一種晶片。晶片包含配置引腳、內部上拉電阻、內部下拉電阻、邏輯偵測電路以及配置檢測電路。邏輯偵測電路可以是數位邏輯緩充器(digital logic buffer)、比較器或其他可用於偵測邏輯位準或等義於該邏輯值的電壓位準的電路。配置引腳經由外部電阻電性連接參考電壓端。配置檢測電路電性連接配置引腳、內部上拉電阻、內部下拉電阻以及邏輯偵測電路,其中配置檢測電路用以將邏輯偵測電路的輸入端連接至配置引腳,並且其中配置檢測電路更用以進行下列步驟。將內部上拉電阻以及內部下拉電阻與配置引腳斷連,以使邏輯偵測電路輸出第零檢測邏輯值。將內部上拉電阻以及內部下拉電阻依序連接配置引腳,以使邏輯偵測電路輸出複數個檢測邏輯值。根據第零檢測邏輯值以及該複數個檢測邏輯值決定配置向量。This disclosure provides a chip. The chip includes a configuration pin, an internal pull-up resistor, an internal pull-down resistor, a logic detection circuit, and a configuration detection circuit. The logic detection circuit may be a digital logic buffer, a comparator, or other circuit that can be used to detect a logic level or a voltage level equivalent to that logic value. The configuration pin is electrically connected to a reference voltage terminal via an external resistor. The configuration detection circuit is electrically connected to the configuration pin, the internal pull-up resistor, the internal pull-down resistor, and the logic detection circuit, wherein the configuration detection circuit is used to connect the input terminal of the logic detection circuit to the configuration pin, and wherein the configuration detection circuit is further used to perform the following steps. Disconnect the internal pull-up and pull-down resistors from the configuration pin to cause the logic detection circuit to output the zeroth detection logic value. Connect the internal pull-up and pull-down resistors sequentially to the configuration pin to cause the logic detection circuit to output a plurality of detection logic values. Determine the configuration vector based on the zeroth detection logic value and the plurality of detection logic values.
本揭示文件提供一種晶片。晶片包含配置引腳、內部上拉電阻、內部下拉電阻、邏輯偵測電路以及配置檢測電路。配置檢測電路電性連接邏輯偵測電路、內部上拉電阻以及內部下拉電阻,其中內部上拉電阻以及內部下拉電阻是可變電阻,並且其中配置檢測電路用以進行下列步驟。逐步調整內部上拉電阻以及內部下拉電阻的電阻值至複數個預設電阻值,在該複數個預設電阻值下將內部上拉電阻以及內部下拉電阻依序連接配置引腳,以使數位邏輯偵測電路輸出該複數個檢測邏輯值,並且根據該複數個檢測邏輯值決定配置向量。This disclosure provides a chip. The chip includes a configuration pin, an internal pull-up resistor, an internal pull-down resistor, a logic detection circuit, and a configuration detection circuit. The configuration detection circuit is electrically connected to the logic detection circuit, the internal pull-up resistor, and the internal pull-down resistor, wherein the internal pull-up resistor and the internal pull-down resistor are variable resistors, and wherein the configuration detection circuit is used to perform the following steps: progressively adjusting the resistance values of the internal pull-up resistor and the internal pull-down resistor to a plurality of preset resistance values, at which the internal pull-up resistor and the internal pull-down resistor are sequentially connected to the configuration pin, so that the digital logic detection circuit outputs the plurality of detected logic values, and determines a configuration vector based on the plurality of detected logic values.
綜上所述,本揭示文件的晶片能夠通過單一配置引腳進行配置,從而減少晶片的引腳的數量。In summary, the chip disclosed in this document can be configured through a single configuration pin, thereby reducing the number of pins on the chip.
下列係舉實施例配合所附圖示做詳細說明,但所提供之實施例並非用以限制本揭露所涵蓋的範圍,而結構運作之描述非用以限制其執行順序,任何由元件重新組合之結構,所產生具有均等功效的裝置,皆為本揭露所涵蓋的範圍。另外,圖示僅以說明為目的,並未依照原尺寸作圖。為使便於理解,下述說明中相同元件或相似元件將以相同之符號標示來說明。The following are detailed descriptions of embodiments in conjunction with the accompanying drawings. However, the provided embodiments are not intended to limit the scope of this disclosure, and the description of the structural operation is not intended to limit the order of execution. Any device with equivalent functionality produced by the recombination of components falls within the scope of this disclosure. Furthermore, the drawings are for illustrative purposes only and are not drawn to scale. For ease of understanding, the same or similar components will be labeled with the same symbols in the following description.
在全篇說明書與申請專利範圍所使用之用詞(terms),除有特別註明除外,通常具有每個用詞使用在此領域中、在此揭露之內容中與特殊內容中的平常意義。此外,在本文中所使用的用詞『包含』、『包括』、『具有』、『含有』等等,均為開放性的用語,即意指『包含但不限於』。此外,本文中所使用之『及/或』,包含相關列舉項目中一或多個項目的任意一個以及其所有組合。Unless otherwise specified, all terms used throughout this specification and the scope of the patent application generally have their ordinary meaning in the context of this field, the content disclosed herein, and the specific content. Furthermore, the terms "comprising," "including," "having," "containing," etc., used herein are open-ended terms, meaning "including but not limited to." Additionally, the term "and/or" as used herein includes any one or more of the related listed items and all combinations thereof.
請參閱第1圖,第1圖為依據本揭露一實施例之配置檢測系統100的示意圖。如第1圖所示,配置檢測系統100包含晶片110、外部電阻Rext1及/或Rext0。於一些實施例中,晶片110是積體電路。於一些實施例中,晶片110是特定應用積體電路或其他邏輯積體電路,本案不以此為限。於一些實施例中,通過晶片110的配置引腳102進行功能選擇、晶片啟動、地址選擇、時脈配置或其他行為或功能。於一些實施例中,功能選擇能夠通過配置引腳102選擇不同的功能或模式配置。於一些實施例中,晶片啟動是通過配置引腳102來啟動或復位晶片110。於一些實施例中,地址選擇是通過配置引腳102選擇地址或識別碼。於一些實施例中,時脈配置是通過配置引腳102選擇不同的時脈源或時脈頻率。於一些實施例中,晶片110具有配置引腳102,並且晶片110能夠通過單一配置引腳102進行二位元或多位元的向量配置。Please refer to Figure 1, which is a schematic diagram of a configuration detection system 100 according to an embodiment of this disclosure. As shown in Figure 1, the configuration detection system 100 includes a chip 110, external resistors Rext1 and/or Rext0. In some embodiments, the chip 110 is an integrated circuit. In some embodiments, the chip 110 is an application-specific integrated circuit or other logical integrated circuit, and this invention is not limited thereto. In some embodiments, function selection, chip startup, address selection, clock configuration, or other actions or functions are performed through the configuration pin 102 of the chip 110. In some embodiments, function selection can be performed by selecting different functions or mode configurations through the configuration pin 102. In some embodiments, chip startup is achieved by configuring pin 102 to start or reset chip 110. In some embodiments, address selection is achieved by configuring pin 102 to select an address or identifier. In some embodiments, clock configuration is achieved by configuring pin 102 to select different clock sources or clock frequencies. In some embodiments, chip 110 has configuration pin 102, and chip 110 can perform two-bit or multi-bit vector configuration through a single configuration pin 102.
於一些實施例中,透過將外部上拉電阻(例如,外部電阻Rext1)或外部下拉電阻(例如,外部電阻Rext0)連接至配置引腳102來配置晶片110。於一些實施例中,參考電壓端VDD ext1的電壓(例如,3.3伏特)高於參考電壓端VDD ext0的電壓(例如,0伏特),可將電性連接參考電壓端VDD ext1的外部電阻Rext1視為外部上拉電阻,並且將電性連接參考電壓端VDD ext0的外部電阻Rext0視為下拉電阻。於一些實施例中,參考電壓端VDD ext1的電壓為3.3伏特,且參考電壓端VDD ext0的電壓為0伏特。於一些實施例中,通過將外部電阻Rext1或Rext0與配置引腳102連接,並且通過晶片110檢測涵蓋外部電阻Rext1或Rext0的電阻值所在的區間(例如,該區間/邊界的上界及下界),從而根據外部電阻Rext1或Rext0的電阻值所在的區間判斷配置向量,進而配置晶片110的功能或行為。 In some embodiments, chip 110 is configured by connecting an external pull-up resistor (e.g., external resistor Rext1) or an external pull-down resistor (e.g., external resistor Rext0) to configuration pin 102. In some embodiments, the voltage of reference voltage terminal VDD ext1 (e.g., 3.3 volts) is higher than the voltage of reference voltage terminal VDD ext0 (e.g., 0 volts), and the external resistor Rext1 electrically connected to reference voltage terminal VDD ext1 can be considered as an external pull-up resistor, and the external resistor Rext0 electrically connected to reference voltage terminal VDD ext0 can be considered as a pull-down resistor. In some embodiments, the voltage of reference voltage terminal VDD ext1 is 3.3 volts, and the voltage of reference voltage terminal VDD ext0 is 0 volts. In some embodiments, by connecting an external resistor Rext1 or Rext0 to configuration pin 102, and by detecting the region covering the resistance value of the external resistor Rext1 or Rext0 (e.g., the upper and lower bounds of the region/boundary), the configuration vector is determined based on the region where the resistance value of the external resistor Rext1 or Rext0 is located, thereby configuring the function or behavior of the chip 110.
晶片110包含配置檢測電路120、內部上拉電阻R1、內部下拉電阻R0、輸出驅動器124、開關S0、S1、S2以及S3,以及邏輯偵測電路126。於一些實施例中,內部上拉電阻R1電性連接在參考電壓端VDD int1以及配置檢測電路120之間,並且內部下拉電阻R0電性連接在參考電壓端VDD int0以及配置檢測電路120之間。於一些實施例中,輸出驅動器124可由其它會對配置引腳102造成電阻性負載之電路實施,本案不以此為限。於一些實施例中,邏輯偵測電路126可以是數位邏輯緩充器、比較器或其他可用於偵測邏輯位準的電路,本案不以此為限。於一些實施例中,配置檢測電路120在初始設定(配置向量檢測)期間,根據在各個步驟中的檢測邏輯值V LL(例如,高邏輯或低邏輯)來判斷配置向量。於一些實施例中,配置檢測電路120在初始設定(配置向量檢測)期間,將輸出驅動器124與配置引腳102斷連,並且將邏輯偵測電路126(的輸入端)與配置引腳102連接,以使邏輯偵測電路126檢測配置引腳102的電位並輸出檢測邏輯值V LL(例如,第零檢測邏輯值)。 Chip 110 includes configuration detection circuit 120, internal pull-up resistor R1, internal pull-down resistor R0, output driver 124, switches S0, S1, S2 and S3, and logic detection circuit 126. In some embodiments, the internal pull-up resistor R1 is electrically connected between the reference voltage terminal VDD int1 and the configuration detection circuit 120, and the internal pull-down resistor R0 is electrically connected between the reference voltage terminal VDD int0 and the configuration detection circuit 120. In some embodiments, the output driver 124 may be implemented by other circuits that would create a resistive load on the configuration pin 102, and this invention is not limited to this. In some embodiments, the logic detection circuit 126 may be a digital logic buffer, a comparator, or other circuit that can be used to detect logic levels, and this invention is not limited thereto. In some embodiments, the configuration detection circuit 120 determines the configuration vector during the initial setup (configuration vector detection) based on the detected logic value VLL (e.g., high logic or low logic) in each step. In some embodiments, during initial setup (configuration vector detection), the configuration detection circuit 120 disconnects the output driver 124 from the configuration pin 102 and connects the logic detection circuit 126 (the input terminal) to the configuration pin 102 so that the logic detection circuit 126 detects the potential of the configuration pin 102 and outputs a detection logic value VLL (e.g., the zeroth detection logic value).
於一些實施例中,在初始設定(配置向量檢測)期間,配置檢測電路120用以控制內部上拉電阻R1以及內部下拉電阻R0與配置引腳102之間的連接。於一些實施例中,在初始設定(配置向量檢測)期間,配置檢測電路120依序將內部上拉電阻R1以及內部下拉電阻R0與配置引腳102連接,以使邏輯偵測電路126檢測配置引腳102的電位並輸出檢測邏輯值V LL(例如,複數個檢測邏輯值),進而根據邏輯偵測電路126的輸出判斷配置向量。 In some embodiments, during the initial setup (configuration vector detection), the configuration detection circuit 120 controls the connection between the internal pull-up resistor R1 and the internal pull-down resistor R0 and the configuration pin 102. In some embodiments, during the initial setup (configuration vector detection), the configuration detection circuit 120 sequentially connects the internal pull-up resistor R1 and the internal pull-down resistor R0 to the configuration pin 102, so that the logic detection circuit 126 detects the potential of the configuration pin 102 and outputs a detection logic value VLL (e.g., a plurality of detection logic values), and then determines the configuration vector based on the output of the logic detection circuit 126.
於一些實施例中,配置檢測電路120包含邏輯電路122,邏輯電路122控制開關S0、S1、S2以及S3。於一些實施例中,配置檢測電路120還包含開關S0、S1及S3。於一些實施例中,開關S0電性連接在內部下拉電阻R0以及配置引腳102之間。於一些實施例中,開關S0用以接收控制訊號EN_R0以根據控制訊號EN_R0開啟或關斷。於一些實施例中,開關S0根據控制訊號EN_R0將內部下拉電阻R0與配置引腳102連接或斷連。於一些實施例中,邏輯電路122可以由組合邏輯電路(Combinational logic circuit)以及/或者循序邏輯電路(Sequential logic circuit)實施。於一些實施例中,邏輯電路122電性連接內部上拉電阻R1、內部下拉電阻R0、開關S0~S3的控制端以及邏輯偵測電路126輸出端。於一些實施例中,邏輯電路122用以產生並提供控制訊號EN_R1、EN_R0、EN_OD以及EN_LB至開關S0~S3的控制端,以分別控制開關S0~S3開啟或關斷。In some embodiments, the configuration detection circuit 120 includes a logic circuit 122, which controls switches S0, S1, S2, and S3. In some embodiments, the configuration detection circuit 120 also includes switches S0, S1, and S3. In some embodiments, switch S0 is electrically connected between an internal pull-down resistor R0 and the configuration pin 102. In some embodiments, switch S0 is used to receive a control signal EN_R0 to turn on or off according to the control signal EN_R0. In some embodiments, switch S0 connects or disconnects the internal pull-down resistor R0 from the configuration pin 102 according to the control signal EN_R0. In some embodiments, logic circuit 122 may be implemented as a combinational logic circuit and/or a sequential logic circuit. In some embodiments, logic circuit 122 is electrically connected to internal pull-up resistor R1, internal pull-down resistor R0, the control terminals of switches S0-S3, and the output terminal of logic detection circuit 126. In some embodiments, logic circuit 122 is used to generate and provide control signals EN_R1, EN_R0, EN_OD, and EN_LB to the control terminals of switches S0-S3 to control switches S0-S3 to be turned on or off respectively.
於一些實施例中,開關S1電性連接在內部上拉電阻R1以及配置引腳102之間。於一些實施例中,開關S1用以接收控制訊號EN_R1以根據控制訊號EN_R1開啟或關斷。於一些實施例中,開關S1根據控制訊號EN_R1將內部上拉電阻R1與配置引腳102連接或斷連。In some embodiments, switch S1 is electrically connected between internal pull-up resistor R1 and configuration pin 102. In some embodiments, switch S1 is used to receive control signal EN_R1 to turn on or off according to control signal EN_R1. In some embodiments, switch S1 connects or disconnects internal pull-up resistor R1 from configuration pin 102 according to control signal EN_R1.
於一些實施例中,開關S2電性連接在輸出驅動器124的輸出端以及配置引腳102之間。於一些實施例中,開關S2用以接收控制訊號EN_OD以根據控制訊號EN_OD開啟或關斷。於一些實施例中,開關S2根據控制訊號EN_OD將輸出驅動器124的輸出端與配置引腳102連接或斷連。於一些實施例中,在閒置期間,開關S2根據控制訊號EN_OD將輸出驅動器124的輸出端與配置引腳102連接或斷連;並且在初始設定(配置向量檢測)期間,開關S2根據控制訊號EN_OD將輸出驅動器124的輸出端與配置引腳102斷連。In some embodiments, switch S2 is electrically connected between the output terminal of output driver 124 and configuration pin 102. In some embodiments, switch S2 is used to receive control signal EN_OD to turn on or off according to control signal EN_OD. In some embodiments, switch S2 connects or disconnects the output terminal of output driver 124 from configuration pin 102 according to control signal EN_OD. In some embodiments, during the idle period, switch S2 connects or disconnects the output terminal of output driver 124 from configuration pin 102 according to control signal EN_OD; and during the initial setting (configuration vector detection) period, switch S2 disconnects the output terminal of output driver 124 from configuration pin 102 according to control signal EN_OD.
於一些實施例中,開關S3電性連接在邏輯偵測電路126的輸入端以及配置引腳102之間。於一些實施例中,開關S3用以接收控制訊號EN_LB以根據控制訊號EN_LB開啟或關斷。於一些實施例中,開關S3根據控制訊號EN_LB將邏輯偵測電路126的輸入端與配置引腳102連接或斷連。於一些實施例中,在閒置期間,開關S3根據控制訊號EN_LB將邏輯偵測電路126的輸入端與配置引腳102斷連;並且在初始設定(配置向量檢測)期間,開關S3根據控制訊號EN_LB將邏輯偵測電路126的輸入端與配置引腳102連接。In some embodiments, switch S3 is electrically connected between the input terminal of logic detection circuit 126 and configuration pin 102. In some embodiments, switch S3 is used to receive control signal EN_LB to turn on or off according to control signal EN_LB. In some embodiments, switch S3 connects or disconnects the input terminal of logic detection circuit 126 from configuration pin 102 according to control signal EN_LB. In some embodiments, during the idle period, switch S3 disconnects the input of logic detection circuit 126 from configuration pin 102 according to control signal EN_LB; and during the initial setup (configuration vector detection) period, switch S3 connects the input of logic detection circuit 126 to configuration pin 102 according to control signal EN_LB.
於一些實施例中,內部上拉電阻R1以及內部下拉電阻R0為可變電阻,並且邏輯電路122用以產生並提供控制訊號ADJ_R1以及ADJ_R0至內部上拉電阻R1以及內部下拉電阻R0,以分別控制內部上拉電阻R1以及內部下拉電阻R0的電阻值。In some embodiments, the internal pull-up resistor R1 and the internal pull-down resistor R0 are variable resistors, and the logic circuit 122 is used to generate and provide control signals ADJ_R1 and ADJ_R0 to the internal pull-up resistor R1 and the internal pull-down resistor R0, so as to control the resistance values of the internal pull-up resistor R1 and the internal pull-down resistor R0 respectively.
於一些實施例中,邏輯偵測電路126根據配置引腳102的電位輸出檢測邏輯值V LL至邏輯電路122,以使邏輯電路122根據邏輯偵測電路126的輸出判斷配置向量。 In some embodiments, logic detection circuit 126 detects logic value VLL to logic circuit 122 based on the potential output of configuration pin 102, so that logic circuit 122 determines the configuration vector based on the output of logic detection circuit 126.
請參閱第2A圖至第2D圖,第2A圖至第2D圖為依據本揭露一些實施例之支援二位元配置的晶片110的向量檢測運作200、201、210以及211的示意圖。於一些實施例中,第2A圖至第2D圖的晶片110對應於第1圖的晶片110。於第2A圖至第2D圖的實施例中,晶片110適用於二位元引腳綑紮配置(2-bit pin strapping configuration)。於一些實施例中,二位元引腳綑紮配置允許四種配置(例如,[00]、[01]、[10]及[11])。Please refer to Figures 2A through 2D, which are schematic diagrams illustrating vector detection operations 200, 201, 210, and 211 of a chip 110 supporting a two-bit configuration according to some embodiments of this disclosure. In some embodiments, the chip 110 of Figures 2A through 2D corresponds to the chip 110 of Figure 1. In the embodiments of Figures 2A through 2D, the chip 110 is adapted for a two-bit pin strapping configuration. In some embodiments, the two-bit pin strapping configuration allows four configurations (e.g., [00], [01], [10], and [11]).
在二位元配置的實施例中,晶片110的內部上拉電阻R1的電阻值R R1以及內部下拉電阻R0的電阻值R R0可被固定於電阻值R A。於一些實施例中,配置向量是取決於外部電阻的電阻值以及與外部電阻連接的參考電壓端的電壓的一二位元配置向量。於第2A圖至第2D圖的實施例中,外部電阻Rext00、Rext01、Rext10及Rext11各自的電阻值是選自兩個給定電阻值(例如,1千歐姆及128千歐姆)中之一者,且內部下拉電阻R0以及內部上拉電阻R1的電阻值介於兩個給定電阻值的範圍內。於一些實施例中,在二位元配置下,第2A圖所示的外部電阻Rext00以及第2C圖所示的外部電阻Rext10每一者為外部下拉電阻,其對應於外部電阻Rext0,並且第2B圖所示的外部電阻Rext01以及第2D圖所示的外部電阻Rext11每一者為外部上拉電阻,其對應於外部電阻Rext1。於一些實施例中,外部電阻Rext00的電阻值R 00以及外部電阻Rext01的電阻值R 01可由小於電阻值R A的一給定電阻值實施,並且外部電阻Rext10的電阻值R 10以及外部電阻Rext11的電阻值R 11可由大於電阻值R A的另一給定電阻值實施。如此,通過檢測晶片110的配置引腳102連接的外部電阻的電阻值大於或小於電阻值R A以及外部電阻屬於電性連接參考電壓端VDD ext1的外部上拉電阻或電性連接參考電壓端VDD ext0的外部下拉電阻,便可檢測二位元配置向量(例如,[00]、[01]、[10]或[11])。 In a binary configuration embodiment, the resistance value RR1 of the internal pull-up resistor R1 and the resistance value RR0 of the internal pull-down resistor R0 of chip 110 can be fixed at a resistance value RA . In some embodiments, the configuration vector is a binary configuration vector that depends on the resistance value of the external resistor and the voltage of the reference voltage terminal connected to the external resistor. In the embodiments of Figures 2A to 2D, the resistance values of the external resistors Rext00, Rext01, Rext10, and Rext11 are each selected from two given resistance values (e.g., 1 kΩ and 128 kΩ), and the resistance values of the internal pull-down resistor R0 and the internal pull-up resistor R1 are within the range of the two given resistance values. In some embodiments, in a two-bit configuration, each of the external resistors Rext00 shown in Figure 2A and Rext10 shown in Figure 2C is an external pull-down resistor corresponding to external resistor Rext0, and each of the external resistors Rext01 shown in Figure 2B and Rext11 shown in Figure 2D is an external pull-up resistor corresponding to external resistor Rext1. In some embodiments, the resistance value R00 of external resistor Rext00 and the resistance value R01 of external resistor Rext01 can be implemented by a given resistance value less than the resistance value RA , and the resistance values R10 of external resistor Rext10 and R11 of external resistor Rext11 can be implemented by another given resistance value greater than the resistance value RA . Thus, by detecting whether the resistance value of the external resistor connected to the configuration pin 102 of the chip 110 is greater than or less than the resistance value RA, and whether the external resistor is an external pull-up resistor electrically connected to the reference voltage terminal VDD ext1 or an external pull-down resistor electrically connected to the reference voltage terminal VDD ext0 , a two-bit configuration vector (e.g., [00], [01], [10] or [11]) can be detected.
如第2A圖所示,在向量檢測運作200中,外部電阻Rext00將晶片110的配置引腳102電性連接至參考電壓端VDD ext0。於一些實施例中,向量檢測運作200能夠以[00]的配置向量配置晶片110。 As shown in Figure 2A, in the vector detection operation 200, an external resistor Rext00 electrically connects the configuration pin 102 of the chip 110 to the reference voltage terminal VDD ext0 . In some embodiments, the vector detection operation 200 can configure the chip 110 with a configuration vector of [00].
在向量檢測運作200的第零步驟中,開關S0以及S1斷開內部下拉電阻R0以及內部上拉電阻R1與配置引腳102的連接,由於外部電阻Rext00將配置引腳102連接至參考電壓端VDD ext0(例如,0伏特),配置引腳102的電位被下拉(外部電阻Rext00可被視為外部下拉電阻),邏輯偵測電路126輸出第零檢測邏輯值。當外部電阻Rext00為外部下拉電阻時,第零檢測邏輯值為低邏輯準位L L。 In the zeroth step of vector detection operation 200, switches S0 and S1 disconnect the internal pull-down resistor R0 and internal pull-up resistor R1 from the configuration pin 102. Since the external resistor Rext00 connects the configuration pin 102 to the reference voltage terminal VDD ext0 (e.g., 0 volts), the potential of the configuration pin 102 is pulled down (the external resistor Rext00 can be considered as an external pull-down resistor), and the logic detection circuit 126 outputs the zeroth detection logic value. When the external resistor Rext00 is an external pull-down resistor, the zeroth detection logic value is a low logic level L.
在向量檢測運作200的第一步驟中,開關S0斷開內部下拉電阻R0與配置引腳102的連接,並且開關S1將內部上拉電阻R1(其電阻值R R1為電阻值R A)與配置引腳102連接,由於外部電阻Rext00的電阻值R 00小於電阻值R A且外部電阻Rext00將配置引腳102連接至參考電壓端VDD ext0(例如,0伏特),配置引腳102的電位被下拉,邏輯偵測電路126輸出第一檢測邏輯值 (例如,低邏輯準位L L)。 In the first step of the vector detection operation 200, switch S0 disconnects the internal pull-down resistor R0 from the configuration pin 102, and switch S1 connects the internal pull-up resistor R1 (whose resistance value RA is the same as R1's resistance value RA ) to the configuration pin 102. Since the resistance value R00 of the external resistor Rext00 is less than the resistance value RA and the external resistor Rext00 connects the configuration pin 102 to the reference voltage terminal VDDext0 (e.g., 0 volts), the potential of the configuration pin 102 is pulled down, and the logic detection circuit 126 outputs a first detection logic value (e.g., a low logic level LL ).
在向量檢測運作200的第二步驟中,開關S1斷開內部上拉電阻R1與配置引腳102的連接,並且開關S0將內部下拉電阻R0(其電阻值R R0為電阻值R A)與配置引腳102連接,此時外部電阻Rext00將配置引腳102連接至參考電壓端VDD ext0(例如,0伏特),與內部下拉電阻R0共同提供了下拉的功能,故配置引腳102的電位被下拉,邏輯偵測電路126輸出第二檢測邏輯值 (例如,低邏輯準位L L)。 In the second step of the vector detection operation 200, switch S1 disconnects the internal pull-up resistor R1 from the configuration pin 102, and switch S0 connects the internal pull-down resistor R0 (whose resistance value RA is the same as R0's resistance value RA ) to the configuration pin 102. At this time, external resistor Rext00 connects the configuration pin 102 to the reference voltage terminal VDDext0 (e.g., 0 volts), which, together with the internal pull-down resistor R0, provides the pull-down function. Therefore, the potential of the configuration pin 102 is pulled down, and the logic detection circuit 126 outputs a second detection logic value (e.g., low logic level LL ).
於一些實施例中,若外部電阻Rext00為外部下拉電阻並且外部電阻Rext00的電阻值R 00小於電阻值R A,通過向量檢測運作200的第零步驟至第二步驟,邏輯電路122可獲得三元組(L L,L L,L L),如第2A圖所示。於一些實施例中,三元組(L L,L L,L L) 的配置向量經定義為第一二進位制值,例如,00。於一些實施例中,第一二進位制值代表外部電阻Rext00為外部下拉電阻且外部電阻Rext00具有第一給定電阻值,並且其中該第一給定電阻值小於內部上拉電阻R1以及內部下拉電阻R0的電阻值(例如,電阻值R A)。 In some embodiments, if the external resistor Rext00 is an external pull-down resistor and the resistance value R00 of the external resistor Rext00 is less than the resistance value RA , the logic circuit 122 can obtain a triple ( LL , LL , LL ) through the zeroth to the second step of the vector detection operation 200, as shown in Figure 2A. In some embodiments, the configuration vector of the triple ( LL , LL , LL ) is defined as a first binary value, for example, 00. In some embodiments, the first binary value represents that the external resistor Rext00 is an external pull-down resistor and the external resistor Rext00 has a first given resistance value, and wherein the first given resistance value is less than the resistance values of the internal pull-up resistor R1 and the internal pull-down resistor R0 (for example, resistance value RA ).
如第2B圖所示,在向量檢測運作201中,外部電阻Rext01將晶片110的配置引腳102電性連接至參考電壓端VDD ext1。於一些實施例中,向量檢測運作201能夠以[01]的配置向量配置晶片110。 As shown in Figure 2B, in the vector detection operation 201, the external resistor Rext01 electrically connects the configuration pin 102 of the chip 110 to the reference voltage terminal VDD ext1 . In some embodiments, the vector detection operation 201 can configure the chip 110 with the configuration vector of [01].
在向量檢測運作201的第零步驟中,開關S0以及S1斷開內部下拉電阻R0以及內部上拉電阻R1與配置引腳102的連接,由於外部電阻Rext01將配置引腳102連接至參考電壓端VDD ext1(例如,3.3伏特),配置引腳102的電位被上拉(外部電阻Rext01可被視為外部上拉電阻),邏輯偵測電路126輸出第零檢測邏輯值。當外部電阻Rext01為外部上拉電阻時,第零檢測邏輯值為高邏輯準位L H。 In the zeroth step of vector detection operation 201, switches S0 and S1 disconnect the internal pull-down resistor R0 and the internal pull-up resistor R1 from the configuration pin 102. Since the external resistor Rext01 connects the configuration pin 102 to the reference voltage terminal VDD ext1 (e.g., 3.3 volts), the potential of the configuration pin 102 is pulled up (the external resistor Rext01 can be considered as an external pull-up resistor), and the logic detection circuit 126 outputs the zeroth detection logic value. When the external resistor Rext01 is an external pull-up resistor, the zeroth detection logic value is a high logic level LH .
在向量檢測運作201的第一步驟中,開關S0斷開內部下拉電阻R0與配置引腳102的連接,並且開關S1將內部上拉電阻R1(其電阻值R R1為電阻值R A)與配置引腳102連接,此時外部電阻Rext01將配置引腳102連接至參考電壓端VDD ext1(例如,3.3伏特),與內部上拉電阻R1共同提供了上拉的功能,故配置引腳102的電位被上拉,邏輯偵測電路126輸出第一檢測邏輯值(例如,高邏輯準位L H)。 In the first step of the vector detection operation 201, switch S0 disconnects the internal pull-down resistor R0 from the configuration pin 102, and switch S1 connects the internal pull-up resistor R1 (whose resistance value R is R<sub> A </sub>) to the configuration pin 102. At this time, external resistor Rext01 connects the configuration pin 102 to the reference voltage terminal VDD ext1 (e.g., 3.3 volts), which, together with the internal pull-up resistor R1, provides the pull-up function. Therefore, the potential of the configuration pin 102 is pulled up, and the logic detection circuit 126 outputs the first detection logic value (e.g., high logic level L<sub>H</sub> ).
在向量檢測運作201的第二步驟中,開關S1斷開內部上拉電阻R1與配置引腳102的連接,並且開關S0將內部下拉電阻R0(其電阻值R R0為電阻值R A)與配置引腳102連接,由於外部電阻Rext01的電阻值R 01小於電阻值R A且外部電阻Rext01將配置引腳102連接至參考電壓端VDD ext1(例如,3.3伏特),配置引腳102的電位被上拉,邏輯偵測電路126輸出第二檢測邏輯值(例如,高邏輯準位L H)。 In the second step of the vector detection operation 201, switch S1 disconnects the internal pull-up resistor R1 from the configuration pin 102, and switch S0 connects the internal pull-down resistor R0 (whose resistance value R0 is the same as the resistance value RA ) to the configuration pin 102. Since the resistance value R01 of the external resistor Rext01 is less than the resistance value RA and the external resistor Rext01 connects the configuration pin 102 to the reference voltage terminal VDDext1 (e.g., 3.3 volts), the potential of the configuration pin 102 is pulled up, and the logic detection circuit 126 outputs a second detection logic value (e.g., a high logic level LH ).
於一些實施例中,若外部電阻Rext01為外部上拉電阻並且外部電阻Rext01的電阻值R 01小於電阻值R A,通過向量檢測運作201的第零步驟至第二步驟,邏輯電路122可獲得三元組(L H,L H,L H),如第2B圖所示。於一些實施例中,三元組(L H,L H,L H)的配置向量經定義為第二二進位制值,例如,01。於一些實施例中,第二二進位制值代表外部電阻Rext01為外部上拉電阻且外部電阻Rext01具有第一給定電阻值,並且其中該第一給定電阻值小於內部上拉電阻R1以及內部下拉電阻R0的電阻值(例如,電阻值R A)。 In some embodiments, if the external resistor Rext01 is an external pull-up resistor and the resistance value R01 of the external resistor Rext01 is less than the resistance value RA , the logic circuit 122 can obtain a triple ( LH , LH , LH ) through steps zero to two of the vector detection operation 201, as shown in Figure 2B. In some embodiments, the configuration vector of the triple ( LH , LH , LH ) is defined as a second binary value, for example, 01. In some embodiments, the second binary value represents that the external resistor Rext01 is an external pull-up resistor and the external resistor Rext01 has a first given resistance value, and wherein the first given resistance value is less than the resistance values of the internal pull-up resistor R1 and the internal pull-down resistor R0 (for example, resistance value RA ).
如第2C圖所示,在向量檢測運作210中,外部電阻Rext10將晶片110的配置引腳102電性連接至參考電壓端VDD ext0。於一些實施例中,向量檢測運作210能夠以[10]的配置向量配置晶片110。 As shown in Figure 2C, in the vector detection operation 210, an external resistor Rext10 electrically connects the configuration pin 102 of the chip 110 to the reference voltage terminal VDD ext0 . In some embodiments, the vector detection operation 210 can configure the chip 110 with the configuration vector of [10].
在向量檢測運作210的第零步驟中,開關S0以及S1斷開內部下拉電阻R0以及內部上拉電阻R1與配置引腳102的連接,由於外部電阻Rext10將配置引腳102連接至參考電壓端VDD ext0(例如,0伏特),配置引腳102的電位被下拉(外部電阻Rext10可被視為外部下拉電阻),邏輯偵測電路126輸出第零檢測邏輯值(例如,低邏輯準位L L)。 In the zeroth step of the vector detection operation 210, switches S0 and S1 disconnect the internal pull-down resistor R0 and the internal pull-up resistor R1 from the configuration pin 102. Since the external resistor Rext10 connects the configuration pin 102 to the reference voltage terminal VDD ext0 (e.g., 0 volts), the potential of the configuration pin 102 is pulled down (the external resistor Rext10 can be regarded as an external pull-down resistor), and the logic detection circuit 126 outputs the zeroth detection logic value (e.g., low logic level L ).
在向量檢測運作210的第一步驟中,開關S0斷開內部下拉電阻R0與配置引腳102的連接,並且開關S1將內部上拉電阻R1(其電阻值R R1為電阻值R A)與配置引腳102連接,由於電阻值R A小於外部電阻Rext10的電阻值R 10,且內部上拉電阻R1將配置引腳102連接至參考電壓端VDD int1(例如,3.3伏特),配置引腳102的電位被上拉,邏輯偵測電路126輸出第一檢測邏輯值(例如,高邏輯準位L H)。 In the first step of the vector detection operation 210, switch S0 disconnects the internal pull-down resistor R0 from the configuration pin 102, and switch S1 connects the internal pull-up resistor R1 (whose resistance value RA is the same as R10 ) to the configuration pin 102. Since the resistance value RA is less than the resistance value R10 of the external resistor Rext10, and the internal pull-up resistor R1 connects the configuration pin 102 to the reference voltage terminal VDD int1 (e.g., 3.3 volts), the potential of the configuration pin 102 is pulled up, and the logic detection circuit 126 outputs a first detection logic value (e.g., a high logic level LH ).
在向量檢測運作210的第二步驟中,開關S1斷開內部上拉電阻R1與配置引腳102的連接,並且開關S0將內部下拉電阻R0(其電阻值R R0為電阻值R A)與配置引腳102連接,此時外部電阻Rext10將配置引腳102連接至參考電壓端VDD ext0(例如,0伏特),與內部下拉電阻R0將配置引腳102連接至參考電壓端VDD int0(例如,0伏特),所以配置引腳102的電位被共同下拉,邏輯偵測電路126輸出第二檢測邏輯值(例如,低邏輯準位L L)。 In the second step of vector detection operation 210, switch S1 disconnects the internal pull-up resistor R1 from the configuration pin 102, and switch S0 connects the internal pull-down resistor R0 (whose resistance value R<sub> R0 </sub> is the same as the resistance value R<sub> A </sub>) to the configuration pin 102. At this time, external resistor Rext10 connects the configuration pin 102 to the reference voltage terminal VDD<sub> ext0 </sub> (e.g., 0 volts), and internal pull-down resistor R0 connects the configuration pin 102 to the reference voltage terminal VDD <sub>int0 </sub> (e.g., 0 volts). Therefore, the potential of the configuration pin 102 is pulled down together, and logic detection circuit 126 outputs a second detection logic value (e.g., low logic level LL ).
於一些實施例中,若外部電阻Rext10為外部下拉電阻並且外部電阻Rext10的電阻值R 10大於電阻值R A,通過向量檢測運作210的第零步驟至第二步驟,邏輯電路122可獲得三元組(L L,L H,L L),如第2C圖所示。於一些實施例中,三元組(L L,L H,L L)的配置向量經定義為第三二進位制值,例如,10。於一些實施例中,第三二進位制值代表外部電阻Rext10為外部下拉電阻且外部電阻Rext10具有第二給定電阻值,並且其中該第二給定電阻值大於內部上拉電阻R1以及內部下拉電阻R0的電阻值(例如,電阻值R A)。 In some embodiments, if the external resistor Rext10 is an external pull-down resistor and the resistance value R10 of the external resistor Rext10 is greater than the resistance value RA , the logic circuit 122 can obtain a triple ( LL , LH , LL ) through steps zero to two of the vector detection operation 210, as shown in Figure 2C. In some embodiments, the configuration vector of the triple ( LL , LH , LL ) is defined as a third binary value, for example, 10. In some embodiments, the third binary value represents that the external resistor Rext10 is an external pull-down resistor and the external resistor Rext10 has a second given resistance value, and wherein the second given resistance value is greater than the resistance values (e.g., resistance value RA ) of the internal pull-up resistor R1 and the internal pull-down resistor R0.
如第2D圖所示,在向量檢測運作211中,外部電阻Rext11將晶片110的配置引腳102電性連接至參考電壓端VDD ext1。於一些實施例中,向量檢測運作211能夠以[11]的配置向量配置晶片110。 As shown in Figure 2D, in the vector detection operation 211, an external resistor Rext11 electrically connects the configuration pin 102 of the chip 110 to the reference voltage terminal VDD ext1 . In some embodiments, the vector detection operation 211 can configure the chip 110 with the configuration vector of [11].
在向量檢測運作211的第零步驟中,開關S0以及S1斷開內部下拉電阻R0以及內部上拉電阻R1與配置引腳102的連接,由於外部電阻Rext11將配置引腳102連接至參考電壓端VDD ext1(例如,3.3伏特),配置引腳102的電位被上拉(外部電阻Rext11可被視為外部上拉電阻),邏輯偵測電路126輸出第零檢測邏輯值 (例如,高邏輯準位L H)。 In the zeroth step of vector detection operation 211, switches S0 and S1 disconnect the internal pull-down resistor R0 and the internal pull-up resistor R1 from the configuration pin 102. Since the external resistor Rext11 connects the configuration pin 102 to the reference voltage terminal VDD ext1 (e.g., 3.3 volts), the potential of the configuration pin 102 is pulled up (the external resistor Rext11 can be regarded as an external pull-up resistor), and the logic detection circuit 126 outputs the zeroth detection logic value (e.g., high logic level LH ).
在向量檢測運作211的第一步驟中,開關S0斷開內部下拉電阻R0與配置引腳102的連接,並且開關S1將內部上拉電阻R1(其電阻值R R1為電阻值R A)與配置引腳102連接,此時外部電阻Rext11將配置引腳102連接至參考電壓端VDD ext1(例如,3.3伏特),且內部上拉電阻R1將配置引腳102連接至參考電壓端VDD int1(例如,3.3伏特),所以配置引腳102的電位被共同上拉,邏輯偵測電路126輸出第一檢測邏輯值 (例如,高邏輯準位L H)。 In the first step of vector detection operation 211, switch S0 disconnects the internal pull-down resistor R0 from the configuration pin 102, and switch S1 connects the internal pull-up resistor R1 (whose resistance value R is R<sub> A </sub>) to the configuration pin 102. At this time, external resistor Rext11 connects the configuration pin 102 to the reference voltage terminal VDD <sub>ext1 </sub> (e.g., 3.3 volts), and internal pull-up resistor R1 connects the configuration pin 102 to the reference voltage terminal VDD<sub> int1 </sub> (e.g., 3.3 volts). Therefore, the potential of the configuration pin 102 is pulled up together, and logic detection circuit 126 outputs the first detection logic value (e.g., high logic level L<sub>H</sub> ).
在向量檢測運作210的第二步驟中,開關S1斷開內部上拉電阻R1與配置引腳102的連接,並且開關S0將內部下拉電阻R0(其電阻值R R0為電阻值R A)與配置引腳102連接,由於電阻值R A小於外部電阻Rext11的電阻值R 11,且內部下拉電阻R0將配置引腳102連接至參考電壓端VDD int0(例如,0伏特),配置引腳102的電位被下拉,邏輯偵測電路126輸出第二檢測邏輯值 (例如,低邏輯準位L L)。 In the second step of vector detection operation 210, switch S1 disconnects the internal pull-up resistor R1 from the configuration pin 102, and switch S0 connects the internal pull-down resistor R0 (whose resistance value RA is the same as R0's resistance value RA ) to the configuration pin 102. Since the resistance value RA is less than the resistance value R11 of the external resistor Rext11, and the internal pull-down resistor R0 connects the configuration pin 102 to the reference voltage terminal VDD int0 (e.g., 0 volts), the potential of the configuration pin 102 is pulled down, and the logic detection circuit 126 outputs a second detection logic value (e.g., low logic level LL ).
於一些實施例中,若外部電阻Rext11為外部上拉電阻並且外部電阻Rext11的電阻值R 11大於電阻值R A,通過向量檢測運作211的第零步驟至第二步驟,邏輯電路122可獲得三元組(L H,L H,L L),如第2D圖所示。於一些實施例中,三元組(L H,L H,L L)的配置向量經定義為第四二進位制值,例如,11。於一些實施例中,第四二進位制值代表外部電阻Rext11為外部上拉電阻且外部電阻Rext11具有第二給定電阻值,並且其中該第二給定電阻值大於內部上拉電阻R1以及內部下拉電阻R0的電阻值(例如,電阻值R A)。 In some embodiments, if the external resistor Rext11 is an external pull-up resistor and the resistance value R11 of the external resistor Rext11 is greater than the resistance value RA , the logic circuit 122 can obtain a triple ( LH , LH , LL ) through steps zero to two of the vector detection operation 211, as shown in Figure 2D. In some embodiments, the configuration vector of the triple ( LH , LH , LL ) is defined as a fourth binary value, for example, 11. In some embodiments, the fourth binary value represents that the external resistor Rext11 is an external pull-up resistor and the external resistor Rext11 has a second given resistance value, and wherein the second given resistance value is greater than the resistance values of the internal pull-up resistor R1 and the internal pull-down resistor R0 (e.g., resistance value RA ).
如此,通過向量檢測運作200、201、210或211便可獲取三元組,從而基於三元組獲取一二進位值,進而以二位元的配置向量對晶片110進行配置。Thus, triplets can be obtained through vector detection operations 200, 201, 210 or 211, and binary values can be obtained based on triplets, thereby configuring chip 110 with a binary configuration vector.
請參閱第1圖至第3圖,第3圖為依據本揭露一些實施例支援二位元配置的配置檢測系統100的內部上拉電阻R1、內部下拉電阻R0以及外部電阻Rext1或Rext0的電阻值的示意圖。於一些實施例中,內部上拉電阻R1的電阻值R R1以及內部下拉電阻R0的電阻值R R0經固定於電阻值R A,且電阻值R A可以由32千歐姆實施。於一些實施例中,外部電阻Rext1為外部上拉電阻(例如,第2B圖以及第2D圖的外部電阻Rext01以及Rext11),並且外部電阻Rext0為外部下拉電阻(例如,第2A圖以及第2C圖的外部電阻Rext00以及Rext10)。於一些實施例中,外部電阻Rext00的電阻值R 00以及外部電阻Rext01的電阻值R 01是由小於電阻值R A的給定電阻值(例如,由1千歐姆)實施,並且外部電阻Rext10的電阻值R 10以及外部電阻Rext11的電阻值R 11是由大於電阻值R A的給定電阻值(例如,128千歐姆)實施。 Please refer to Figures 1 through 3. Figure 3 is a schematic diagram of the resistance values of the internal pull-up resistor R1, the internal pull-down resistor R0, and the external resistor Rext1 or Rext0 in a configuration detection system 100 supporting two-bit configuration according to some embodiments of this disclosure. In some embodiments, the resistance value RR1 of the internal pull-up resistor R1 and the resistance value RR0 of the internal pull-down resistor R0 are fixed to the resistance value RA , and the resistance value RA can be implemented with 32 kΩ. In some embodiments, the external resistor Rext1 is an external pull-up resistor (e.g., external resistors Rext01 and Rext11 in Figures 2B and 2D), and the external resistor Rext0 is an external pull-down resistor (e.g., external resistors Rext00 and Rext10 in Figures 2A and 2C). In some embodiments, the resistance value R00 of external resistor Rext00 and the resistance value R01 of external resistor Rext01 are implemented by a given resistance value less than the resistance value RA (e.g., 1 kΩ), and the resistance value R10 of external resistor Rext10 and the resistance value R11 of external resistor Rext11 are implemented by a given resistance value greater than the resistance value RA (e.g., 128 kΩ).
於一些實施例中,基於第1圖、第2A圖至第2D圖以及第3圖的向量檢測運作200、201、210以及211所獲取的二位元的配置向量可以由下列表一表示。
請參閱第4A圖以及第4B圖,第4A圖至第4B圖為依據本揭露一些實施例之支援多位元配置的晶片110的向量檢測運作400a及400b的示意圖。在一些實施例中,第4A圖以及第4B圖的晶片110適用於多位元引腳綑紮配置(multi-bit pin strapping configuration)。於一些實施例中,多位元引腳綑紮配置允許三位元的至少八種配置(例如,[000]、[001]、[010]、[011]、[100]、[101]、[110]及[111])。Please refer to Figures 4A and 4B, which are schematic diagrams of vector detection operations 400a and 400b of a chip 110 supporting multi-bit configuration according to some embodiments of this disclosure. In some embodiments, the chip 110 of Figures 4A and 4B is adapted to a multi-bit pin strapping configuration. In some embodiments, the multi-bit pin strapping configuration allows at least eight configurations of three bits (e.g., [000], [001], [010], [011], [100], [101], [110], and [111]).
在多位元配置的實施例中,晶片110的內部上拉電阻R1以及內部下拉電阻R0為可變電阻,且內部上拉電阻R1的電阻值R R1以及內部下拉電阻R0的電阻值R R0可調整至複數個預設電阻值。於一些實施例中,配置向量是取決於外部電阻的電阻值以及與外部電阻連接的參考電壓端的電壓的一多位元配置向量。於第4A圖至第4B圖的實施例中,外部電阻Rpd、Rpu的電阻值是選自複數個給定電阻值中之一者,其中該複數個給定電阻值為250歐姆、4千歐姆、64千歐姆以及1兆歐姆。於一些實施例中,外部電阻Rpd、Rpu的電阻值是選自複數個給定電阻值範圍中之一者,其中該複數個預設電阻值與該複數個給定電阻值範圍經交錯配置,並且其中該複數個給定電阻值範圍中之最大者的上限小於該複數個預設電阻值中之最大者。於一些實施例中,該複數個給定電阻值範圍的中心值分別為250歐姆、4千歐姆、64千歐姆以及1兆歐姆。於一些實施例中,第4A圖的外部電阻Rpd對應於第1圖的外部電阻Rext0,並且第4B圖的外部電阻Rpu對應於第1圖的外部電阻Rext1。如此,通過檢測晶片110的配置引腳102連接的外部電阻的電阻值大於或小於該複數個內部上拉或下拉電阻的預設電阻值以及外部電阻屬於外部上拉電阻或外部下拉電阻,便可生成多位元的配置向量。 In a multi-bit configuration embodiment, the internal pull-up resistor R1 and internal pull-down resistor R0 of chip 110 are variable resistors, and the resistance values RR1 and RR0 of the internal pull-up resistor R1 and internal pull-down resistor R0 can be adjusted to a plurality of preset resistance values. In some embodiments, the configuration vector is a multi-bit configuration vector that depends on the resistance value of the external resistor and the voltage of the reference voltage terminal connected to the external resistor. In the embodiments of Figures 4A to 4B, the resistance values of the external resistors Rpd and Rpu are selected from one of a plurality of given resistance values, wherein the plurality of given resistance values are 250 ohms, 4 kiloohms, 64 kiloohms, and 1 megaohm. In some embodiments, the resistance values of external resistors Rpd and Rpu are selected from one of a plurality of given resistance value ranges, wherein the plurality of preset resistance values and the plurality of given resistance value ranges are alternately configured, and wherein the upper limit of the largest of the plurality of given resistance value ranges is less than the largest of the plurality of preset resistance values. In some embodiments, the center values of the plurality of given resistance value ranges are 250 ohms, 4 kiloohms, 64 kiloohms, and 1 megaohm, respectively. In some embodiments, the external resistor Rpd in Figure 4A corresponds to the external resistor Rext0 in Figure 1, and the external resistor Rpu in Figure 4B corresponds to the external resistor Rext1 in Figure 1. Thus, by detecting whether the resistance value of the external resistor connected to the configuration pin 102 of the chip 110 is greater than or less than the preset resistance value of the plurality of internal pull-up or pull-down resistors, and whether the external resistor is an external pull-up resistor or an external pull-down resistor, a multi-bit configuration vector can be generated.
如第4A圖所示,在向量檢測運作400a中,外部電阻Rpd將晶片110的配置引腳102電性連接至參考電壓端VDD ext0。於一些實施例中,向量檢測運作400a能夠以[000]、[010]、[100]及 [110]中之任一者的配置向量配置晶片110。 As shown in Figure 4A, in vector detection operation 400a, an external resistor Rpd electrically connects the configuration pin 102 of chip 110 to the reference voltage terminal VDD ext0 . In some embodiments, vector detection operation 400a can configure chip 110 with any of the configuration vectors [000], [010], [100] and [110].
在向量檢測運作400a的第零步驟中,開關S0以及S1斷開內部下拉電阻R0以及內部上拉電阻R1與配置引腳102的連接,由於外部電阻Rpd將配置引腳102連接至參考電壓端VDD ext0(例如,0伏特),配置引腳102的電位被下拉(外部電阻Rpd可被視為外部下拉電阻),邏輯偵測電路126輸出低邏輯準位L L。 In the zeroth step of the vector detection operation 400a, switches S0 and S1 disconnect the internal pull-down resistor R0 and the internal pull-up resistor R1 from the configuration pin 102. Since the external resistor Rpd connects the configuration pin 102 to the reference voltage terminal VDD ext0 (e.g., 0 volts), the potential of the configuration pin 102 is pulled down (the external resistor Rpd can be regarded as an external pull-down resistor), and the logic detection circuit 126 outputs a low logic level LL .
於一些實施例中,當開關S0以及S1斷開內部下拉電阻R0以及內部上拉電阻R1與配置引腳102的連接,並且邏輯偵測電路126輸出低邏輯準位L L時,可判斷連接至配置引腳102的外部電阻為外部下拉電阻,並且於後續操作中可根據內部上拉電阻R1經調整後的電阻值判斷配置向量。因此,於後續運作中可維持內部上拉電阻R1與配置引腳102的連接,並且維持內部下拉電阻R0與配置引腳102的斷路。 In some embodiments, when switches S0 and S1 disconnect the internal pull-down resistor R0 and internal pull-up resistor R1 from the configuration pin 102, and the logic detection circuit 126 outputs a low logic level LL , it can be determined that the external resistor connected to the configuration pin 102 is an external pull-down resistor. Furthermore, in subsequent operations, the configuration vector can be determined based on the adjusted resistance value of the internal pull-up resistor R1. Therefore, in subsequent operations, the connection between the internal pull-up resistor R1 and the configuration pin 102 can be maintained, and the open circuit between the internal pull-down resistor R0 and the configuration pin 102 can be maintained.
於一些實施例中,當開關S1將內部上拉電阻R1與配置引腳102連接並且開關S0將內部下拉電阻R0與配置引腳102斷路時,若內部上拉電阻R1的電阻值R R1為小於外部電阻Rpd的電阻值R Rpd的預設電阻值R A1,配置引腳102的電位被上拉,邏輯偵測電路126輸出高邏輯準位L H。 In some embodiments, when switch S1 connects the internal pull-up resistor R1 to the configuration pin 102 and switch S0 disconnects the internal pull-down resistor R0 from the configuration pin 102, if the resistance value R1 of the internal pull-up resistor R1 is less than the resistance value Rpd of the external resistor Rpd, the potential of the configuration pin 102 is pulled up, and the logic detection circuit 126 outputs a high logic level LH .
接續,將內部上拉電阻R1的電阻值R R1調整為預設電阻值R A2,若預設電阻值R A2小於外部電阻Rpd的電阻值R Rpd,配置引腳102的電位被上拉,邏輯偵測電路126輸出高邏輯準位L H。 Next, the resistance value RA1 of the internal pull-up resistor R1 is adjusted to the preset resistance value RA2 . If the preset resistance value RA2 is less than the resistance value Rpd of the external resistor Rpd, the potential of the configuration pin 102 is pulled up, and the logic detection circuit 126 outputs a high logic level LH .
於一些實施例中,內部上拉電阻R1的電阻值R R1以複數個預設電阻值逐步調整/增加至電阻值R An,直到邏輯偵測電路126輸出低邏輯準位L L。於一些實施例中,邏輯偵測電路126輸出低邏輯準位L L代表電阻值R An大於外部電阻R pd的電阻值R Rpd,使配置引腳102的電位被下拉。 In some embodiments, the resistance value R<sub>R1</sub> of the internal pull-up resistor R<sub>1</sub> is gradually adjusted/increased by a plurality of preset resistance values to the resistance value R <sub>An </sub> until the logic detection circuit 126 outputs a low logic level LL . In some embodiments, the low logic level LL output by the logic detection circuit 126 represents that the resistance value R<sub> An </sub> is greater than the resistance value R<sub> Rpd </sub> of the external resistor R<sub> pd </sub>, causing the potential of the configuration pin 102 to be pulled down.
如此,若外部電阻Rpd為外部下拉電阻,通過向量檢測運作400a,邏輯電路122可獲得對應於(n+1)元組(L
L,L
H...L
H,L
L)的配置向量,如第4A圖所示。於一些實施例中,根據第(n+1)元組/邏輯準位所對應的內部上拉電阻R1經調整後電阻值R
An,便可獲得外部電阻Rpd的電阻值R
Rpd所在的區間,(例如,該區間/邊界的上界及下界),從而根據外部電阻R
pd的電阻值R
Rpd所在的區間判斷配置向量,進而配置晶片110的功能或行為。於一些實施例中,基於第4A圖的向量檢測運作400a所獲取的多位元配置向量可以由下列表二表示。
於一些實施例中,電阻值1kΩ、16kΩ、256kΩ以及4MΩ分別是外部下拉電阻的電阻值R Rpd的給定電阻值250Ω、4kΩ、64kΩ以及1MΩ的上界。 In some embodiments, the resistance values of 1kΩ, 16kΩ, 256kΩ and 4MΩ are the upper limits of the given resistance values of the external pull-down resistor Rpd, which are 250Ω, 4kΩ, 64kΩ and 1MΩ, respectively.
如第4B圖所示,在向量檢測運作400b中,外部電阻Rpu將晶片110的配置引腳102電性連接至參考電壓端VDD ext1。於一些實施例中,向量檢測運作400b能夠以[001]、[011]、[101]及 [111]中之任一者的配置向量配置晶片110。 As shown in Figure 4B, in the vector detection operation 400b, an external resistor Rpu electrically connects the configuration pin 102 of the chip 110 to the reference voltage terminal VDD ext1 . In some embodiments, the vector detection operation 400b can configure the chip 110 with any of the configuration vectors [001], [011], [101], and [111].
在向量檢測運作400b的第零步驟中,開關S0以及S1斷開內部下拉電阻R0以及內部上拉電阻R1與配置引腳102的連接,由於外部電阻Rpu將配置引腳102連接至參考電壓端VDD ext1(例如,3.3伏特),配置引腳102的電位被上拉(外部電阻Rpu可被視為外部上拉電阻),邏輯偵測電路126輸出高邏輯準位L H。 In step zero of the vector detection operation 400b, switches S0 and S1 disconnect the internal pull-down resistor R0 and the internal pull-up resistor R1 from the configuration pin 102. Since the external resistor Rpu connects the configuration pin 102 to the reference voltage terminal VDD ext1 (e.g., 3.3 volts), the potential of the configuration pin 102 is pulled up (the external resistor Rpu can be regarded as an external pull-up resistor), and the logic detection circuit 126 outputs a high logic level LH .
於一些實施例中,當開關S0以及S1斷開內部下拉電阻R0以及內部上拉電阻R1與配置引腳102的連接,並且邏輯偵測電路126輸出高邏輯準位L H時,可判斷連接至配置引腳102的外部電阻為外部上拉電阻,並且於後續操作中可根據內部下拉電阻R0經調整後電阻值判斷配置向量。因此,於後續運作中可維持內部下拉電阻R0與配置引腳102的連接,並且維持內部上拉電阻R1與配置引腳102的斷路。 In some embodiments, when switches S0 and S1 disconnect the internal pull-down resistor R0 and internal pull-up resistor R1 from the configuration pin 102, and the logic detection circuit 126 outputs a high logic level LH , it can be determined that the external resistor connected to the configuration pin 102 is an external pull-up resistor. Furthermore, in subsequent operations, the configuration vector can be determined based on the adjusted resistance value of the internal pull-down resistor R0. Therefore, in subsequent operations, the connection between the internal pull-down resistor R0 and the configuration pin 102 can be maintained, and the connection between the internal pull-up resistor R1 and the configuration pin 102 can be kept open.
於一些實施例中,當開關S0將內部下拉電阻R0與配置引腳102連接並且開關S1將內部上拉電阻R1與配置引腳102斷開時,若內部下拉電阻R0的電阻值R R0為小於外部電阻Rpu的電阻值R Rpu的預設電阻值R A1,配置引腳102的電位被下拉,邏輯偵測電路126輸出低邏輯準位L L。 In some embodiments, when switch S0 connects the internal pull-down resistor R0 to the configuration pin 102 and switch S1 disconnects the internal pull-up resistor R1 from the configuration pin 102, if the resistance value R0 of the internal pull-down resistor R0 is less than the resistance value Rpu of the external resistor Rpu (the default resistance value R1 ) , the potential of the configuration pin 102 is pulled down, and the logic detection circuit 126 outputs a low logic level LL .
接續,將內部下拉電阻R0的電阻值R R0調整為預設電阻值R A2,若預設電阻值R A2小於外部電阻Rpu的電阻值R Rpu,配置引腳102的電位被下拉,邏輯偵測電路126輸出低邏輯準位L L。 Next, the resistance value RA0 of the internal pull-down resistor R0 is adjusted to the preset resistance value RA2 . If the preset resistance value RA2 is less than the resistance value RApu of the external resistor Rpu, the potential of the configuration pin 102 is pulled down, and the logic detection circuit 126 outputs a low logic level LL .
於一些實施例中,內部下拉電阻R0的電阻值R R0以複數個預設電阻值逐步調整/增加至電阻值R An,直到邏輯偵測電路126輸出高邏輯準位L H。於一些實施例中,邏輯偵測電路126輸出高邏輯準位L H代表電阻值R An大於外部電阻Rpu的電阻值R Rpu,使配置引腳102的電位被上拉。 In some embodiments, the internal pull-down resistor R0 is gradually adjusted/increased by a plurality of preset resistance values to a resistance value RAn , until the logic detection circuit 126 outputs a high logic level LH . In some embodiments, the high logic level LH output by the logic detection circuit 126 represents that the resistance value RAn is greater than the resistance value RRpu of the external resistor Rpu, causing the potential of the configuration pin 102 to be pulled up.
如此,若外部電阻Rpu為外部上拉電阻,通過向量檢測運作400b,邏輯電路122可獲得對應於(n+1)元組 (L
H,L
L...L
L,L
H)的配置向量,如第4B圖所示。於一些實施例中,根據第(n+1)元組/邏輯準位所對應的內部下拉電阻R0經調整後電阻值R
An,便可獲得外部電阻Rpu的電阻值R
Rpu所在的區間,(例如,該區間/邊界的上界及下界),從而根據外部電阻Rpu的電阻值所在的區間判斷配置向量,進而配置晶片110的功能或行為。於一些實施例中,基於第4B圖的向量檢測運作400b所獲取的多位元配置向量可以由下列表三表示。
於一些實施例中,電阻值1kΩ、16kΩ、256kΩ以及4MΩ分別是給定電阻值250Ω、4kΩ、64kΩ以及1MΩ的上界(upper bounds),其中給定電阻值250Ω、4kΩ、64kΩ以及1MΩ中之任一者可以是外部上拉電阻的電阻值R Rpu。如此,根據上述表二以及表三便可獲取多位元的配置向量。 In some embodiments, the resistance values 1kΩ, 16kΩ, 256kΩ, and 4MΩ are the upper bounds of the given resistance values 250Ω, 4kΩ, 64kΩ, and 1MΩ, respectively, where any one of the given resistance values 250Ω, 4kΩ, 64kΩ, and 1MΩ can be the resistance value R <sub>pu</sub> of the external pull-up resistor. Thus, the multi-bit configuration vector can be obtained according to Tables 2 and 3 above.
於一些實施例中,配置檢測電路120更用以逐步調整內部上拉電阻R1的電阻值R
R1以及內部下拉電阻R0的電阻值R
R0至複數個預設電阻值(例如,預設電阻值R
A1~R
An),在該複數個預設電阻值下將內部上拉電阻R1以及內部下拉電阻R0依序連接配置引腳102,以使邏輯偵測電路126輸出該複數個檢測邏輯值,並且根據該複數個檢測邏輯值(及第零個檢測邏輯值)決定該配置向量。於一些實施例中,若配置引腳102連接外部電阻Rpd,基於上述方式,邏輯偵測電路126的輸出可以由下列表四表示。
於一些實施例中,若配置引腳102連接外部電阻Rpu,基於上述方式,邏輯偵測電路126的輸出可以由下列表五表示。
於一些實施中,當外部電阻與配置引腳102斷連(亦即,配置引腳102未與任何外部電阻連接)且配置引腳102為浮接引腳時,配置檢測電路120根據該複數個檢測邏輯值決定配置向量是一預設值。舉例而言,若配置引腳102未與任何外部電阻連接,則配置引腳102的電阻值為無限大,超過內部上拉電阻R1及/或內部下拉電阻R0的預設電阻值中之最大者。此時,邏輯偵測電路126的輸出可以由下列表六表示。
如此,通過未將任何外部電阻連接至配置引腳102,可更多配置一組配置向量(例如,預設值),從而減少材料成本。In this way, by not connecting any external resistors to configuration pin 102, a larger set of configuration vectors (e.g., default values) can be configured, thereby reducing material costs.
請參閱第1圖、第4A圖至第4B圖以及第5圖,第5圖為依據本揭露一些實施例支援多位元配置的配置檢測系統100的內部上拉電阻R1的電阻值R R1、內部下拉電阻R0的電阻值R R0以及外部電阻Rpu的電阻值R Rpu以及外部電阻R pd的電阻值R Rpd的示意圖。於一些實施例中,內部上拉電阻R1以及內部下拉電阻R0為可變電阻。於一些實施例中,內部上拉電阻R1的電阻值R R1可以被維持在固定數值或隨時間改變。於一些實施例中,內部上拉電阻R1的電阻值R R1是變數,所述變數可以是複數個預設電阻值R A1~R A4中至少一者。於一些實施例中,內部上拉電阻R1的電阻值R R1可在一最小值以及一最大值之間的範圍內改變,所述範圍包含複數個預設電阻值R A1~R A4。於一些實施例中,內部下拉電阻R0的電阻值R R0可以被維持在固定數值或隨時間改變。於一些實施例中內部下拉電阻R0的電阻值R R0是變數,所變數可以是複數個預設電阻值R A1~R A4中至少一者。於一些實施例中,內部下拉電阻R0的電阻值R R0可在一最小值以及一最大值之間的範圍內改變,所述範圍包含複數個預設電阻值R A1~R A4。於一些實施例中,外部電阻Rext1為外部上拉電阻(例如,第4B圖的外部電阻Rpu),並且外部電阻Rext0為外部下拉電阻(例如,第4A圖的外部電阻Rpd)。於一些實施例中,外部電阻Rpu的電阻值R Rpu是選自複數個給定電阻值中之一者,而該複數個給定電阻值的每一個電阻值,分別選自一對應之給定電阻值範圍(如第5圖所示的虛線框中的數值範圍)。於一些實施例中,外部電阻Rpd的電阻值R Rpd是選自複數個給定電阻值中之一者,而該複數個給定電阻值的每一個電阻值,分別選自一對應之給定電阻值範圍(如第5圖所示的虛線框中的數值範圍)。於一些實施例中,該複數個給定電阻值(例如,250歐姆、4K歐姆、64K歐姆及1M歐姆)、複數個給定電阻值範圍(如第5圖所示的虛線框中的數值範圍)與前述預設電阻值交錯配置,而使預設電阻值能夠分別成為給定電阻值的邊界(例如,該邊界/區間的上界及/或下界)。 Please refer to Figures 1, 4A to 4B, and 5. Figure 5 is a schematic diagram of the resistance values RR1 of the internal pull-up resistor R1, RR0 of the internal pull-down resistor R0, RRpu of the external resistor Rpu, and RRpd of the external resistor Rpd in a configuration detection system 100 supporting multi-bit configuration according to some embodiments of this disclosure. In some embodiments, the internal pull-up resistor R1 and the internal pull-down resistor R0 are variable resistors. In some embodiments, the resistance value RR1 of the internal pull-up resistor R1 can be maintained at a fixed value or change over time. In some embodiments, the resistance value RR1 of the internal pull-up resistor R1 is a variable, which can be at least one of a plurality of preset resistance values RA1 to RA4 . In some embodiments, the resistance value RR1 of the internal pull-up resistor R1 can vary within a range between a minimum and a maximum value, said range including a plurality of preset resistance values RA1 to RA4 . In some embodiments, the resistance value RR0 of the internal pull-down resistor R0 can be maintained at a fixed value or vary over time. In some embodiments, the resistance value RR0 of the internal pull-down resistor R0 is a variable, which can be at least one of a plurality of preset resistance values RA1 to RA4 . In some embodiments, the resistance value RR0 of the internal pull-down resistor R0 can vary within a range between a minimum and a maximum value, said range including a plurality of preset resistance values RA1 to RA4 . In some embodiments, the external resistor Rext1 is an external pull-up resistor (e.g., the external resistor Rpu in Figure 4B), and the external resistor Rext0 is an external pull-down resistor (e.g., the external resistor Rpd in Figure 4A). In some embodiments, the resistance value RRpu of the external resistor Rpu is selected from one of a plurality of given resistance values, and each of the plurality of given resistance values is selected from a corresponding range of given resistance values (as shown in the dashed box in Figure 5). In some embodiments, the resistance value RRpd of the external resistor Rpd is selected from one of a plurality of given resistance values, and each of the plurality of given resistance values is selected from a corresponding range of given resistance values (as shown in the dashed box in Figure 5). In some embodiments, the plurality of given resistance values (e.g., 250 ohms, 4K ohms, 64K ohms and 1M ohms) and the plurality of given resistance value ranges (such as the numerical range in the dashed box shown in Figure 5) are interleaved with the aforementioned preset resistance values, so that the preset resistance values can respectively become the boundaries of the given resistance values (e.g., the upper and/or lower boundaries of the boundary/range).
請參閱第6圖,第6圖為依據本揭露一些實施例之晶片110的配置向量的檢測方法600的流程圖。於一些實施例中,檢測方法600包含步驟S610~S660。於一些實施例中,步驟S610~S660可以由配置檢測電路120執行。於一些實施例中,配置檢測電路120可通過硬體及/或軟體執行步驟S610~S660,本案不以此為限。Please refer to Figure 6, which is a flowchart of a method 600 for detecting the configuration vector of a chip 110 according to some embodiments of this disclosure. In some embodiments, the detection method 600 includes steps S610 to S660. In some embodiments, steps S610 to S660 can be performed by the configuration detection circuit 120. In some embodiments, the configuration detection circuit 120 can perform steps S610 to S660 through hardware and/or software; this invention is not limited to these.
於步驟S610,在閒置期間,根據功能模式提供控制訊號。In step S610, during the idle period, control signals are provided according to the function mode.
於步驟S620,在初始設定期間,將輸出驅動器與配置引腳斷路,並且將邏輯偵測電路連接至配置引腳。In step S620, during the initial setup period, disconnect the output driver from the configuration pin and connect the logic detection circuit to the configuration pin.
於步驟S630,設定或調整內部電阻的電阻值,並且設定或調整內部電阻與配置引腳的連接。In step S630, set or adjust the resistance value of the internal resistor, and set or adjust the connection between the internal resistor and the configuration pin.
於步驟S640,偵測並記錄對應於配置引腳的電位的檢測邏輯值。In step S640, the detection logic value corresponding to the potential of the configuration pin is detected and recorded.
於步驟S650,判斷是否蒐集到能夠判斷配置向量的足夠的資訊。若是,執行步驟S660;若否,執行步驟S630。In step S650, determine whether sufficient information has been collected to determine the configuration vector. If yes, proceed to step S660; otherwise, proceed to step S630.
於步驟S660,鎖存配置向量。In step S660, latch the configuration vector.
綜上所述,本揭示文件的晶片110能夠通過單一配置引腳102以二位元或多位元的配置向量進行配置,從而減少晶片的引腳的數量,且降低物料成本。In summary, the chip 110 of this disclosure can be configured with a single configuration pin 102 in a two-bit or multi-bit configuration vector, thereby reducing the number of chip pins and lowering material costs.
在多位元配置的實施例中,晶片110的內部上拉電阻R1若不存在或斷連,在電性上此條件等同於內部上拉電阻R1的電阻值R
R1極大(或無限大)。此時內部下拉電阻R0的電阻值R
R0,搭配外部電阻Rext1對應於第4B圖的電阻Rpu實施檢測,參考前述有關表三的實施例中的步驟/操作,可得到如下表七的結果。此時不需外部電阻Rext0,而外部電阻Rext0的電阻值等同於極大(或無限大)。此條件下仍可得到二元配置。故內部上拉電阻R1與外部電阻Rext0不存在之情形,屬於本揭露之特例與發明範圍。
在多位元配置的實施例中,晶片110的內部下拉電阻R0若不存在或斷連,在電性上此條件等同於內部下拉電阻R0的電阻值R
R0極大(或無限大)。此時內部上拉電阻R1的電阻值R
R1,搭配外部電阻Rext0對應於第4A圖的電阻Rpd實施檢測,參考前述有關表二的實施例中的步驟/操作,可得到如下表八的結果。此時不需外部電阻Rext1,而外部電阻Rext1的電阻值等同於極大(或無限大)。此條件下仍可得到二元配置。故內部下拉電阻R0與外部電阻Rext1不存在之情形,屬於本揭露之特例與發明範圍。
雖然本揭露之實施例中,配置檢測電路120可控制開關S3為連接或斷連,使邏輯偵測電路126的輸入端連接至配置引腳102,或切斷邏輯偵測電路126的輸入端與配置引腳102的連接。然而,實務上根據需求可設計為邏輯偵測電路126的輸入端與配置引腳102永遠為連接的狀態,此時控制開關S3之電路不存在,或開關S3永遠呈現連接的狀態,此時配置檢測電路120不需控制開關S3之連接或斷連,且不妨礙配置檢測。故本揭露之實施例中,關於開關S3之存在與功能,以及配置檢測電路120控制開關S3之描述,並非用以限定本揭露。Although in the embodiments disclosed herein, the configuration detection circuit 120 can control the switch S3 to be connected or disconnected, connecting the input terminal of the logic detection circuit 126 to the configuration pin 102, or disconnecting the input terminal of the logic detection circuit 126 from the configuration pin 102. However, in practice, it can be designed so that the input terminal of the logic detection circuit 126 is always connected to the configuration pin 102, in which case the circuit controlling the switch S3 is not present, or the switch S3 is always connected. In this case, the configuration detection circuit 120 does not need to control the connection or disconnection of the switch S3, and configuration detection is not hindered. Therefore, the description of the existence and function of switch S3 and the configuration of detection circuit 120 to control switch S3 in the embodiments disclosed herein are not intended to limit this disclosure.
雖然本揭露之實施例中,配置檢測電路120可控制開關S2為連接或斷開,使輸出驅動器124的輸出端與配置引腳102連接或斷開。然而,實務上依配置引腳102之定義與功能屬性需求,輸出驅動器124或其它會對配置引腳102造成電阻性負載之電路可能不存在,或輸出驅動器124的輸出端與配置引腳102在設計上永遠為斷開的狀態,此時配置檢測電路120不需控制開關S2之連接或斷連,且不妨礙配置檢測。故本揭露之實施例中,關於輸出驅動器124與開關S2之存在與功能,以及配置檢測電路120控制開關S2之描述,並非用以限定本揭露。Although in the embodiments disclosed herein, the configuration detection circuit 120 can control the switch S2 to be connected or disconnected, so that the output terminal of the output driver 124 is connected or disconnected from the configuration pin 102, in practice, according to the definition and functional requirements of the configuration pin 102, the output driver 124 or other circuits that would cause a resistive load to the configuration pin 102 may not exist, or the output terminal of the output driver 124 may always be disconnected from the configuration pin 102 by design. In this case, the configuration detection circuit 120 does not need to control the connection or disconnection of the switch S2, and configuration detection is not hindered. Therefore, the description of the existence and function of the output driver 124 and the switch S2, and the configuration of the detection circuit 120 to control the switch S2 in the embodiments disclosed herein, are not intended to limit this disclosure.
參考前述實施例中向量檢測運作400a的說明,當內部上拉電阻R1的電阻值R
R1等於最大預設電阻值R
A4時,內部上拉電阻R1的電阻值R
R1大於外部電阻Rpd的每一個給定電阻值。邏輯偵測電路126輸出低邏輯準位L
L時,可判斷連接至配置引腳102的外部電阻為外部下拉電阻。故設定內部上拉電阻R1的電阻值為最大預設電阻值,而且此最大預設電阻值大於外部電阻Rpd的每一個給定電阻值時,邏輯偵測電路126的輸出等同於第零步驟之結果,如下列表九所示。
參考前述實施例中向量檢測運作400b的說明,當內部下拉電阻R0的電阻值R
R0等於最大預設電阻值R
A4時,內部下拉電阻R0的電阻值R
R0大於外部電阻Rpu的每一個給定電阻值。邏輯偵測電路126輸出高邏輯準位L
H時,可判斷連接至配置引腳102的外部電阻為外部上拉電阻。故設定內部下拉電阻R0的電阻值為最大預設電阻值,而且此最大預設電阻值大於外部電阻Rpu的每一個給定電阻值時,邏輯偵測電路126的輸出等同於第零步驟之結果,如下列表十所示。
雖然本揭露已以實施方式揭露如上,然其並非用以限定本揭露,任何本領域具通常知識者,在不脫離本揭露之精神和範圍內,當可作各種之更動與潤飾,因此本揭露之保護範圍當視後附之申請專利範圍所界定者為準。Although this disclosure has been made in practice as described above, it is not intended to limit this disclosure. Anyone skilled in the art may make various modifications and alterations without departing from the spirit and scope of this disclosure. Therefore, the scope of protection of this disclosure shall be determined by the scope of the appended patent application.
為使本揭露之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附符號之說明如下: 100:配置檢測系統 102:配置引腳 110:晶片 120:配置檢測電路 122:邏輯電路 124:輸出驅動器 126:邏輯偵測電路 200,201,210,211,400a,400b:向量檢測運作 600:檢測方法 R0,R1,Rpd,Rpu:電阻 S0,S1,S2,S3:開關 V LL:檢測邏輯值 L H:高邏輯準位 L L:低邏輯準位 ADJ_R0,ADJ_R1:控制訊號 EN_R0,EN_R1, EN_OD, EN_LB:控制訊號 VDD int1,VDD ext1,VDD int0,VDD ext0:參考電壓端 Rext0,Rext1:外部電阻 Rext00,Rext01,Rext10,Rext11:外部電阻 R R1,R R0,R A,R 00,R 01,R 10,R 11:電阻值 R A1,R A2,R A3,R A4,R An,R pd,R pu,R Rpd,R Rpu:電阻值 S610,S620,S630,S640,S650,S660:步驟 To make the above and other objects, features, advantages and embodiments of this disclosure more apparent, the symbols are explained as follows: 100: Configuration detection system; 102: Configuration pin; 110: Chip; 120: Configuration detection circuit; 122: Logic circuit; 124: Output driver; 126: Logic detection circuit; 200, 201, 210, 211, 400a, 400b: Vector detection operation; 600: Detection method; R0, R1, Rpd, Rpu: Resistors; S0, S1, S2, S3: Switches; VLL : Detection logic value; LH : High logic level; LL : Low logic level; ADJ_R0, ADJ_R1: Control signals; EN_R0, EN_R1, EN_OD, EN_LB: Control signal VDD int1 , VDD ext1 , VDD int0 , VDD ext0 : Reference voltage terminals Rext0, Rext1: External resistors Rext00, Rext01, Rext10, Rext11 : External resistors RR1 , RR0 , RA , R00, R01, R10 , R11 : Resistance values RA1 , RA2 , RA3 , RA4 , RAAn, Rpd, Rpu , RRpd , RRpu : Resistance values S610, S620, S630 , S640, S650, S660: Steps
為使本揭露之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下: 第1圖為依據本揭露一實施例之配置檢測系統的示意圖。 第2A圖至第2D圖為依據本揭露一些實施例之支援二位元配置的晶片的向量檢測運作的示意圖。 第3圖為依據本揭露一些實施例支援二位元配置的配置檢測系統的內部上拉電阻、內部下拉電阻以及外部電阻的電阻值的示意圖。 第4A圖至第4B圖為依據本揭露一些實施例之支援多位元配置的晶片的向量檢測運作的示意圖。 第5圖為依據本揭露一些實施例支援多位元配置的配置檢測系統的內部上拉電阻、內部下拉電阻以及外部電阻的電阻值的示意圖。 第6圖為依據本揭露一些實施例之晶片的配置向量的檢測方法的流程圖。 To make the above and other objects, features, advantages, and embodiments of this disclosure more apparent, the accompanying drawings are explained as follows: Figure 1 is a schematic diagram of a configuration detection system according to an embodiment of this disclosure. Figures 2A to 2D are schematic diagrams of vector detection operation of a chip supporting two-bit configuration according to some embodiments of this disclosure. Figure 3 is a schematic diagram of the resistance values of the internal pull-up resistor, internal pull-down resistor, and external resistor in a configuration detection system supporting two-bit configuration according to some embodiments of this disclosure. Figures 4A and 4B are schematic diagrams of vector detection operation of a chip supporting multi-bit configuration according to some embodiments of this disclosure. Figure 5 is a schematic diagram of the resistance values of the internal pull-up resistor, internal pull-down resistor, and external resistor in a configuration detection system supporting multi-bit configuration according to some embodiments of this disclosure. Figure 6 is a flowchart of a method for detecting the configuration vector of a chip according to some embodiments of this disclosure.
國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic Storage Information (Please record in order of storage institution, date, and number) None International Storage Information (Please record in order of storage country, institution, date, and number) None
100:配置檢測系統 100: Configure the detection system
102:配置引腳 102: Configure headers
110:晶片 110: Chip
120:配置檢測電路 120: Configure the detection circuit
122:邏輯電路 122: Logic Circuits
124:輸出驅動器 124: Output Driver
126:邏輯偵測電路 126: Logic Detection Circuit
R0,R1:電阻 R0, R1: Resistors Practice resistors ...
Rext0,Rext1:外部電阻 Rext0, Rext1: External resistors
S0,S1,S2,S3:開關 S0, S1, S2, S3: Switches
VLL:檢測邏輯值 VLL : Detection logic value
ADJ_R0,ADJ_R1:控制訊號 ADJ_R0, ADJ_R1: Control signals
EN_R0,EN_R1,EN_OD,EN_LB:控制訊號 EN_R0, EN_R1, EN_OD, EN_LB: Control signals
VDDint1,VDDext1,VDDint0,VDDext0:參考電壓端 VDD int1 , VDD ext1 , VDD int0 , VDD ext0 : Reference voltage terminals
Claims (10)
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20200127626A1 (en) * | 2018-10-17 | 2020-04-23 | International Business Machines Corporation | Charge-scaling multiplier circuit with digital-to-analog converter |
| TW202226760A (en) * | 2020-12-21 | 2022-07-01 | 美商凱普勒運算公司 | Majority logic gate based sequential circuit |
| TW202310328A (en) * | 2017-09-12 | 2023-03-01 | 成真股份有限公司 | Logic drive based on standard commodity fpga ic chips using non-volatile memory cells |
| US20230137979A1 (en) * | 2021-11-02 | 2023-05-04 | Samsung Electronics Co., Ltd. | Electronic circuit performing analog built-in self test and operating method thereof |
| TW202415004A (en) * | 2018-02-01 | 2024-04-01 | 成真股份有限公司 | Logic drive using standard commodity programmable logic ic chips comprising non-volatile random access memory cells |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW202310328A (en) * | 2017-09-12 | 2023-03-01 | 成真股份有限公司 | Logic drive based on standard commodity fpga ic chips using non-volatile memory cells |
| TW202415004A (en) * | 2018-02-01 | 2024-04-01 | 成真股份有限公司 | Logic drive using standard commodity programmable logic ic chips comprising non-volatile random access memory cells |
| US20200127626A1 (en) * | 2018-10-17 | 2020-04-23 | International Business Machines Corporation | Charge-scaling multiplier circuit with digital-to-analog converter |
| TW202226760A (en) * | 2020-12-21 | 2022-07-01 | 美商凱普勒運算公司 | Majority logic gate based sequential circuit |
| US20230137979A1 (en) * | 2021-11-02 | 2023-05-04 | Samsung Electronics Co., Ltd. | Electronic circuit performing analog built-in self test and operating method thereof |
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