TWI901368B - Gas shower head, vapor deposition equipment and method of use thereof - Google Patents
Gas shower head, vapor deposition equipment and method of use thereofInfo
- Publication number
- TWI901368B TWI901368B TW113137002A TW113137002A TWI901368B TW I901368 B TWI901368 B TW I901368B TW 113137002 A TW113137002 A TW 113137002A TW 113137002 A TW113137002 A TW 113137002A TW I901368 B TWI901368 B TW I901368B
- Authority
- TW
- Taiwan
- Prior art keywords
- gas
- delivery channel
- holes
- gas delivery
- central
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
本發明公開了一種氣體噴淋頭、氣相沉積設備及其使用方法,氣體噴淋頭包括:氣體分配板,多個第一氣體氣孔,多個第二氣體氣孔,第一/二氣體氣孔用於向待處理基片的表面供應第一和第二氣體。位於氣體分配板中心的第一氣體輸送通道稱為中心第一氣體輸送通道,與中心第一氣體輸送通道相鄰的第二氣體輸送通道稱為中心第二氣體輸送通道。多個第二氣體中心補氣孔,多個第二氣體中心補氣孔的出口間隔分佈在中心第一氣體輸送通道所在區域上,向氣體分配板的下方中心區域補充第二氣體。本發明提高了反應腔的中心區域處氣相前驅體分佈的均勻性。The present invention discloses a gas shower head, a vapor deposition device, and a method for using the same. The gas shower head includes a gas distribution plate, a plurality of first gas holes, and a plurality of second gas holes. The first/second gas holes are used to supply the first and second gases to the surface of the substrate to be processed. The first gas delivery channel located at the center of the gas distribution plate is referred to as the central first gas delivery channel, and the second gas delivery channel adjacent to the central first gas delivery channel is referred to as the central second gas delivery channel. A plurality of second gas central replenishing holes are provided, and the outlets of the plurality of second gas central replenishing holes are spaced apart and distributed on the area where the central first gas delivery channel is located, so as to replenish the second gas to the central area below the gas distribution plate. The present invention improves the uniformity of the distribution of the gaseous precursor in the central area of the reaction chamber.
Description
本發明涉及半導體設備技術領域,特別涉及一種氣體噴淋頭、氣相沉積設備及其使用方法。The present invention relates to the field of semiconductor equipment technology, and in particular to a gas shower head, a vapor deposition device, and a method of using the same.
在真空條件下,利用氣相沉積技術在基片表面上生長薄膜是獲得優良力學性能、特殊物理/化學性能薄膜材料的重要途徑,是當今材料科學、物理科學等領域的研究熱點。Growing thin films on substrate surfaces using vapor deposition technology under vacuum conditions is an important approach to obtaining thin film materials with excellent mechanical properties and special physical/chemical properties, and is a current research hotspot in fields such as materials science and physics.
ALD(Atomic Layer Deposition,原子層沉積)技術是目前使用最廣泛的薄膜生長技術之一,其本質上也是屬於化學氣相沉積(CVD)的一種,主要是通過將氣相前驅體脈衝交替地通入反應器並在沉積基體上吸附並利用原子間的化學作用進行反應形成沉積膜。相對於化學氣相沉積,物理氣相沉積(PVD)等薄膜製備方法,ALD由於其獨特的反應機理在生長薄膜的保形性,均勻性方面有著顯著的優勢。ALD (Atomic Layer Deposition) is one of the most widely used thin film growth techniques. Essentially a type of chemical vapor deposition (CVD), it involves alternately pulsed vapor precursors into a reactor, where they adsorb onto a substrate and react chemically between atoms to form a deposited film. Compared to other thin film deposition methods such as CVD and physical vapor deposition (PVD), ALD offers significant advantages in terms of conformality and uniformity of grown films due to its unique reaction mechanism.
在原子層沉積處理期間,要求不同類的氣相前驅體(簡稱為第一氣體和第二氣體)通過氣相沉積設備中的氣體噴淋頭(Showerhead)交替地引入到含有基板的處理腔室中;且需要對基板提供均勻的反應氣體。即要求不同類的氣相前驅體在氣體噴淋頭中,不但不能混合,而且還要求相互隔離,不能串氣。由此現有的氣體噴淋頭的結構包括多個同心圓氣道,多個同心圓氣道包括多個第一氣體輸送通道和第二氣體輸送通道,所述多個第一氣體輸送通道和所述多個第二氣體輸送通道互相交替排佈,同一類氣體的輸送通道在同心圓之間通過位於蓋板上的第三氣道連接。此種氣體噴淋頭的結構中的位於中心圈的氣體輸送通道僅能用於輸送第一氣體,假設中心圈的氣體輸送通道為第一氣體輸送通道,其外側為第二氣體輸送通道,由此會導致反應腔的中心區域處,第二氣體的濃度顯著降低的問題,即第一氣體和第二氣體在反應腔的中心區域處分佈不均勻的問題。During atomic layer deposition (ALD) processing, different types of gaseous precursors (referred to as the first gas and the second gas) are required to be alternately introduced into the processing chamber containing the substrate via a gas showerhead within the VLD equipment. Furthermore, a uniform amount of reactive gas must be provided to the substrate. This requires that the different types of gaseous precursors not only be prevented from mixing within the gas showerhead but also be isolated from each other to prevent crosstalk. Therefore, the structure of existing gas showerheads includes multiple concentric circular gas channels, each of which includes multiple first gas delivery channels and multiple second gas delivery channels. The multiple first gas delivery channels and the multiple second gas delivery channels are arranged alternately with each other, and the delivery channels for the same type of gas are connected between the concentric circles via a third gas channel located on the cover plate. In this type of gas showerhead structure, the gas delivery channels located in the center ring can only be used to transport the first gas. Assuming that the gas delivery channels in the center ring are the first gas delivery channels and the channels outside them are the second gas delivery channels, this will result in a significantly reduced concentration of the second gas in the center area of the reaction chamber, that is, the first gas and the second gas are unevenly distributed in the center area of the reaction chamber.
本發明的目的是提供一種氣體噴淋頭、氣相沉積設備及其使用方法,實現在不同類的氣相前驅體在氣體噴淋頭中相互隔離的情況下,向反應腔內提供均勻分佈的不同類的氣相前驅體。The present invention aims to provide a gas shower head, vapor deposition equipment, and methods for using the same, which enable uniformly distributed delivery of different types of vapor precursors to a reaction chamber while isolating the different types of vapor precursors within the gas shower head.
為了實現以上目的,本發明通過以下技術方案實現:In order to achieve the above objectives, the present invention is implemented through the following technical solutions:
一種氣體噴淋頭,包括:氣體分配板,所述氣體分配板上設有氣體輸送通道,所述氣體輸送通道包括多個用於輸送第一氣體的第一氣體輸送通道和多個用於輸送第二氣體的第二氣體輸送通道,所述多個第一氣體輸送通道和所述多個第二氣體輸送通道互相交替排佈且同心設置。多個第一氣體氣孔,間隔分佈在所述第一氣體輸送通道上。多個第二氣體氣孔,間隔分佈在所述第二氣體輸送通道上,所述第一氣體氣孔和第二氣體氣孔用於向待處理基片的表面供應所述第一氣體和所述第二氣體。A gas showerhead includes a gas distribution plate having gas delivery channels, the gas delivery channels comprising a plurality of first gas delivery channels for delivering a first gas and a plurality of second gas delivery channels for delivering a second gas, the plurality of first gas delivery channels and the plurality of second gas delivery channels being arranged alternately and concentrically with each other; a plurality of first gas holes spaced apart on the first gas delivery channels; and a plurality of second gas holes spaced apart on the second gas delivery channels, the first gas holes and the second gas holes being used to supply the first gas and the second gas to the surface of a substrate to be processed.
位於所述氣體分配板中心的所述第一氣體輸送通道為中心第一氣體輸送通道,與所述中心第一氣體輸送通道相鄰的所述第二氣體輸送通道為中心第二氣體輸送通道。The first gas delivery channel located at the center of the gas distribution plate is a central first gas delivery channel, and the second gas delivery channel adjacent to the central first gas delivery channel is a central second gas delivery channel.
多個第二氣體中心補氣孔,多個所述第二氣體中心補氣孔的進口設置在所述中心第二氣體輸送通道上,多個所述第二氣體中心補氣孔的出口間隔分佈在所述中心第一氣體輸送通道的兩個第一氣體氣孔之間,用於向所述氣體分配板的下方中心區域補充所述第二氣體。There are multiple central air supply holes for the second gas, and the inlets of the multiple central air supply holes for the second gas are arranged on the central second gas delivery channel. The outlets of the multiple central air supply holes for the second gas are spaced and distributed between the two first gas holes of the central first gas delivery channel, so as to supply the second gas to the central area below the gas distribution plate.
可選地,所述第一氣體輸送通道和所述第二氣體輸送通道之間存在間隔區,多個所述第二氣體中心補氣孔的出口間隔分佈在所述中心第一氣體輸送通道和所述中心第二氣體輸送通道之間的所述間隔區上,用於向所述氣體分配板的下方中心區域補充所述第二氣體。Optionally, there is a partition between the first gas delivery channel and the second gas delivery channel, and the outlets of multiple second gas central air supply holes are spaced and distributed on the partition between the central first gas delivery channel and the central second gas delivery channel, for supplying the second gas to the central area below the gas distribution plate.
可選地,每一所述第二氣體中心補氣孔的出氣方向朝向所述氣體分配板的中心軸。Optionally, the gas outlet direction of each of the second gas center air supply holes is toward the central axis of the gas distribution plate.
可選地,每一所述第二氣體中心補氣孔的出口與相鄰的兩個所述第一氣體氣孔的出口之間的間距相等。Optionally, the distance between the outlet of each of the second gas center air-filling holes and the outlets of two adjacent first gas holes is equal.
可選地,每一所述第二氣體中心補氣孔的傾斜方向與豎直方向之間的夾角的範圍為30°~60°。Optionally, the angle between the inclined direction and the vertical direction of each of the second gas center air filling holes is in the range of 30° to 60°.
可選地,所述氣體噴淋頭還包含:蓋板,其蓋合在所述氣體分配板上,所述蓋板上設有氣體連通通道,所述氣體連通通道包括多個第一氣體連通通道和多個第二氣體連通通道。所述第一氣體連通通道跨過所述第二氣體輸送通道連通相鄰的兩個第一氣體輸送通道。所述第二氣體連通通道跨過所述第一氣體輸送通道連通相鄰的兩個第二氣體輸送通道。Optionally, the gas shower head further includes a cover plate that covers the gas distribution plate, the cover plate being provided with gas communication channels, the gas communication channels including a plurality of first gas communication channels and a plurality of second gas communication channels. The first gas communication channels span the second gas communication channels to connect to two adjacent first gas delivery channels. The second gas communication channels span the first gas delivery channels to connect to two adjacent second gas delivery channels.
可選地,每一所述第一氣體輸送通道和每一所述第二氣體輸送通道為不連通的C形槽。若干個第一分隔板,每一所述第一分隔板設置在對應的所述第一氣體輸送通道內。若干個第二分隔板,每一所述第二分隔板設置在對應的所述第二氣體輸送通道內。Optionally, each of the first gas delivery channels and each of the second gas delivery channels are disconnected C-shaped grooves. A plurality of first partition plates are provided, each of the first partition plates is disposed within a corresponding first gas delivery channel. A plurality of second partition plates are provided, each of the second partition plates is disposed within a corresponding second gas delivery channel.
多個第一氣體補氣孔,每一所述第一氣體補氣孔的進口位於所述第一氣體輸送通道上,且靠近所述第一分隔板設置;每一所述第一氣體補氣孔的出口位於所述間隔區上,且靠近所述第一分隔板與所述間隔區之間的交匯處設置,以向對應的所述第二氣體輸送通道所在的區域補充所述第一氣體。Multiple first gas replenishing holes, the inlet of each first gas replenishing hole is located on the first gas delivery channel and is arranged close to the first partition plate; the outlet of each first gas replenishing hole is located on the partition area and is arranged close to the intersection between the first partition plate and the partition area to replenish the first gas to the area where the corresponding second gas delivery channel is located.
多個第二氣體補氣孔,每一所述第二氣體補氣孔的進口位於所述第二氣體輸送通道上,且靠近所述第二分隔板設置;每一所述第二氣體補氣孔的出口位於所述間隔區上,且靠近所述第二分隔板與所述間隔區之間的交匯處設置,以向對應的所述第一氣體輸送通道所在的區域補充所述第二氣體。Multiple second gas replenishing holes, the inlet of each second gas replenishing hole is located on the second gas delivery channel and is arranged close to the second partition plate; the outlet of each second gas replenishing hole is located on the partition area and is arranged close to the intersection between the second partition plate and the partition area to replenish the second gas to the area where the corresponding first gas delivery channel is located.
可選地,每一所述第一氣體補氣孔的出口位於對應的所述第二氣體輸送通道上的兩個所述第二氣體氣孔的出口之間。每一所述第二氣體補氣孔的出口位於對應的所述第一氣體輸送通道上的兩個所述第一氣體氣孔的出口之間。Optionally, the outlet of each first gas replenishing hole is located between the outlets of two second gas holes on the corresponding second gas delivery channel. The outlet of each second gas replenishing hole is located between the outlets of two first gas holes on the corresponding first gas delivery channel.
可選地,每一所述第一氣體補氣孔的出口與相鄰的兩個所述第二氣體氣孔的出口之間的間距相等。每一所述第二氣體補氣孔的出口與相鄰的兩個所述第一氣體氣孔的出口之間的間距相等。Optionally, the outlet of each first gas replenishing hole is equal to the outlets of two adjacent second gas holes. The outlet of each second gas replenishing hole is equal to the outlet of two adjacent first gas holes.
可選地,每一所述第一氣體補氣孔和所述第二氣體補氣孔的出氣方向不朝向所述氣體分配板的中心軸。Optionally, the gas outlet direction of each of the first gas replenishing holes and the second gas replenishing holes is not toward the central axis of the gas distribution plate.
可選地,所述第一氣體補氣孔或所述第二氣體補氣孔的傾斜方向與豎直方向之間的夾角小於45°。Optionally, an angle between an inclined direction of the first gas filling hole or the second gas filling hole and a vertical direction is less than 45°.
可選地,所述第一氣體氣孔或所述第二氣體氣孔的傾斜方向與豎直方向之間的夾角為10°~30°。Optionally, an angle between an inclined direction of the first gas pore or the second gas pore and a vertical direction is 10° to 30°.
可選地,所述中心第一氣體輸送通道上設有兩圈所述第一氣體氣孔,其中一圈第一氣體氣孔的進口靠近所述第一氣體輸送通道的內環側壁處設置;另一圈第一氣體氣孔的進口靠近所述第一氣體輸送通道的外環側壁處設置。所述中心第二氣體輸送通道上還設有一圈所述第二氣體氣孔,所述第二氣體氣孔的進口靠近所述第二氣體輸送通道的外環側壁處設置。Optionally, the central first gas delivery channel is provided with two circles of first gas holes, wherein the inlet of one circle of first gas holes is located near the inner annular sidewall of the first gas delivery channel, and the inlet of the other circle of first gas holes is located near the outer annular sidewall of the first gas delivery channel. The central second gas delivery channel is further provided with a circle of second gas holes, wherein the inlet of the second gas holes is located near the outer annular sidewall of the second gas delivery channel.
可選地,與所述第一氣體輸送通道連通的第一入口端,用於向所述第一氣體輸送通道內輸送第一氣體。第一低壓源,與所述第一氣體輸送通道的第一出口端連通,用於向所述第一出口端處提供低壓。與所述第二氣體輸送通道連通的第二入口端,用於向所述第二氣體輸送通道內輸送第二氣體。第二低壓源,與所述第二氣體輸送通道的第二出口端連通,用於向所述第二出口端處提供低壓。Optionally, a first inlet port connected to the first gas delivery channel is used to deliver a first gas into the first gas delivery channel. A first low-pressure source is connected to a first outlet port of the first gas delivery channel and is used to provide a low pressure at the first outlet port. A second inlet port connected to the second gas delivery channel is used to deliver a second gas into the second gas delivery channel. A second low-pressure source is connected to a second outlet port of the second gas delivery channel and is used to provide a low pressure at the second outlet port.
另一方面,本發明還提供一種氣相沉積設備,包括:反應腔;基座,其設置在所述反應腔內部底部,用於支撐基片;如上文所述的氣體噴淋頭,所述氣體噴淋頭設置在所述反應腔頂部,與所述基座相對設置,用於向所述基片的表面提供反應氣體。On the other hand, the present invention also provides a vapor deposition apparatus comprising: a reaction chamber; a susceptor disposed at the bottom of the reaction chamber and configured to support a substrate; and a gas shower head as described above, disposed at the top of the reaction chamber, opposite the susceptor, and configured to provide a reaction gas to the surface of the substrate.
再一方面,本發明還提供一種利用若上文所述的氣相沉積設備的使用方法,包括:步驟a、向所述第一氣體輸送通道內通入第一氣體,第二低壓源處於關閉狀態。On the other hand, the present invention also provides a method of using the vapor deposition apparatus as described above, comprising: step a, introducing the first gas into the first gas delivery channel, and the second low-pressure source is in a closed state.
步驟b、停止通入所述第一氣體,向所述第一氣體輸送通道內通入吹掃氣體,第一低壓源處於開啟狀態。Step b: Stop introducing the first gas, introduce purge gas into the first gas delivery channel, and keep the first low-pressure source on.
步驟c、關閉所述第一低壓源,向所述第二氣體輸送通道內通入第二氣體。通過間隔分佈在與位於所述氣體分配板中心的第一氣體輸送通道相鄰的第二氣體輸送通道上的多個第二氣體中心補氣孔,向位於所述氣體分配板中心的第一氣體輸送通道的下方中心區域補充所述第二氣體。步驟d、停止通入所述第二氣體,向所述第二氣體輸送通道內通入吹掃氣體,第二低壓源處於開啟狀態。重複所述步驟a~d。Step c: Turn off the first low-pressure source and introduce the second gas into the second gas delivery channel. The second gas is replenished into the central area below the first gas delivery channel located at the center of the gas distribution plate through multiple second gas center supply holes spaced apart in the second gas delivery channel adjacent to the first gas delivery channel located at the center of the gas distribution plate. Step d: Stop introducing the second gas and introduce purge gas into the second gas delivery channel, leaving the second low-pressure source on. Repeat steps a-d.
本發明至少具有以下技術效果之一:The present invention has at least one of the following technical effects:
本發明提供的一種氣體噴淋頭,通過設有的第一和二氣體輸送通道,實現在不同類的氣相前驅體在氣體噴淋頭中相互隔離的情況下,向反應腔內提供不同類的氣相前驅體(第一氣體和第二氣體)。The present invention provides a gas shower head that, through first and second gas delivery channels, enables different types of gaseous precursors (a first gas and a second gas) to be supplied to a reaction chamber while being isolated from each other within the gas shower head.
通過設有的多個第二氣體中心補氣孔,實現向所述氣體分配板的下方中心區域補充所述第二氣體,由此解決由於氣體分配板的最中心區域僅有一類氣體輸送通道(例如為第一氣體輸送通道),從而導致氣體分配板的最中心區域的此類氣體(例如第一氣體)濃度過高的,其他類氣體(例如第二氣體)濃度較低,進而導致反應腔的中心區域處氣相前驅體分佈不均勻的問題。By providing a plurality of second gas central gas supply holes, the second gas is supplied to the lower central area of the gas distribution plate, thereby solving the problem that, due to the presence of only one type of gas delivery channel (for example, the first gas delivery channel) in the central area of the gas distribution plate, the concentration of this type of gas (for example, the first gas) in the central area of the gas distribution plate is too high, while the concentration of other types of gas (for example, the second gas) is relatively low, which in turn leads to uneven distribution of the gaseous precursor in the central area of the reaction chamber.
本發明的第二氣體中心補氣孔的出氣方向朝向所述氣體分配板的中心軸,由此可以更好的對所述反應腔的中心區域進行補氣,促進所述反應腔的中心區域處氣相前驅體達到分佈更均勻的目的。The gas outlet direction of the second gas center gas supply hole of the present invention is toward the central axis of the gas distribution plate, thereby better supplying gas to the central area of the reaction chamber and promoting a more uniform distribution of the gas-phase precursor in the central area of the reaction chamber.
本發明的第一氣體補氣孔和第二氣體補氣孔實現對不能開設第一氣體氣孔和第二氣體氣孔的間隔區處進行補氣,實現對對應的所述第一氣體輸送通道和所述第二氣體輸送通道所在的區域進行補氣,提高該區域的氣相前驅體分佈的均勻性。The first gas supply hole and the second gas supply hole of the present invention can supply gas to the interval area where the first gas hole and the second gas hole cannot be opened, and can supply gas to the area where the corresponding first gas delivery channel and the second gas delivery channel are located, thereby improving the uniformity of the gas phase precursor distribution in the area.
以下結合圖式和具體實施方式對本發明提出的一種氣體噴淋頭、氣相沉積設備及其使用方法作進一步詳細說明。根據下面說明,本發明的優點和特徵將更清楚。需要說明的是,圖式採用非常簡化的形式且均使用非精准的比例,僅用以方便、明晰地輔助說明本發明實施方式的目的。為了使本發明的目的、特徵和優點能夠更加明顯易懂,請參閱圖式。須知,本說明書所圖式所繪示的結構、比例、大小等,均僅用以配合說明書所揭示的內容,以供熟悉此技術的人士瞭解與閱讀,並非用以限定本發明實施的限定條件,故不具技術上的實質意義,任何結構的修飾、比例關係的改變或大小的調整,在不影響本發明所能產生的功效及所能達成的目的下,均應仍落在本發明所揭示的技術內容能涵蓋的範圍內。The following, combined with diagrams and specific embodiments, further details the gas shower head, vapor deposition equipment, and methods of use proposed by the present invention. The advantages and features of the present invention will become more apparent from the following description. It should be noted that the diagrams are highly simplified and not to exact scale, and are intended solely to facilitate and clearly illustrate the embodiments of the present invention. Please refer to the diagrams to make the objects, features, and advantages of the present invention more clearly understood. It should be noted that the structures, proportions, sizes, etc. illustrated in the figures of this specification are intended solely to facilitate understanding and reading by those skilled in the art in conjunction with the contents disclosed herein. They are not intended to limit the implementation of the present invention and therefore have no substantive technical significance. Any structural modifications, changes in proportions, or adjustments in size, provided they do not affect the efficacy and objectives of the present invention, shall remain within the scope of the technical content disclosed herein.
如圖1所示,本實施例提供的一種氣體噴淋頭,包括:氣體分配板10,所述氣體分配板10設有氣體輸送通道,所述氣體輸送通道包括多個用於輸送第一氣體的第一氣體輸送通道100和多個用於輸送第二氣體的第二氣體輸送通道200,所述多個第一氣體輸送通道100和所述多個第二氣體輸送通道200互相交替排佈且同心設置。As shown in FIG1 , this embodiment provides a gas shower head, comprising a gas distribution plate 10 having gas delivery channels. The gas delivery channels include a plurality of first gas delivery channels 100 for delivering a first gas and a plurality of second gas delivery channels 200 for delivering a second gas. The plurality of first gas delivery channels 100 and the plurality of second gas delivery channels 200 are alternately arranged and concentrically disposed.
如圖2所示,蓋板11,其蓋合在所述氣體分配板10上,所述蓋板11上設有氣體連通通道,所述氣體連通通道包括多個第一氣體連通通道120和多個第二氣體連通通道220;所述第一氣體連通通道120跨過所述第二氣體輸送通道200連通相鄰的兩個第一氣體輸送通道100;所述第二氣體連通通道220跨過所述第一氣體輸送通道100連通相鄰的兩個第二氣體輸送通道200。As shown in Figure 2, the cover plate 11 is covered on the gas distribution plate 10, and the cover plate 11 is provided with a gas communication channel, which includes a plurality of first gas communication channels 120 and a plurality of second gas communication channels 220; the first gas communication channel 120 crosses the second gas delivery channel 200 to connect with two adjacent first gas delivery channels 100; the second gas communication channel 220 crosses the first gas delivery channel 100 to connect with two adjacent second gas delivery channels 200.
多個第一氣體氣孔(如圖1中標號101和102所示),間隔分佈在所述第一氣體輸送通道100上,所述第一氣體氣孔的進口設置在所述第一氣體輸送通道100上,所述第一氣體氣孔的出口設置在所述第一氣體輸送通道100和所述第二氣體輸送通道200之間的間隔區103上。A plurality of first gas holes (as shown by reference numerals 101 and 102 in FIG. 1 ) are spaced apart on the first gas delivery channel 100 . The inlet of the first gas hole is disposed on the first gas delivery channel 100 , and the outlet of the first gas hole is disposed on the spacer 103 between the first gas delivery channel 100 and the second gas delivery channel 200 .
多個第二氣體氣孔(如圖1中標號203所示,以及圖2中標號204和205所示),間隔分佈在所述第二氣體輸送通道200上,所述第二氣體氣孔的進口設置在所述第二氣體輸送通道200上,所述第二氣體氣孔的出口設置在所述第一氣體輸送通道100和所述第二氣體輸送通道200之間的間隔區103上。所述第一氣體氣孔和第二氣體氣孔用於向待處理基片(圖1中未示出)的表面供應所述第一氣體A和第二氣體B。A plurality of second gas holes (as indicated by reference numeral 203 in FIG. 1 , and reference numerals 204 and 205 in FIG. 2 ) are spaced apart on the second gas delivery channel 200. The inlets of the second gas holes are disposed on the second gas delivery channel 200, and the outlets of the second gas holes are disposed on the spacer 103 between the first gas delivery channel 100 and the second gas delivery channel 200. The first gas holes and the second gas holes are used to supply the first gas A and the second gas B to the surface of a substrate to be processed (not shown in FIG. 1 ).
可以理解的是,為了便於說明,將位於所述氣體分配板10中心的所述第一氣體輸送通道100稱為中心第一氣體輸送通道,與所述中心第一氣體輸送通道相鄰的所述第二氣體輸送通道200稱為中心第二氣體輸送通道。It is understandable that, for the sake of convenience, the first gas delivery channel 100 located at the center of the gas distribution plate 10 is referred to as the central first gas delivery channel, and the second gas delivery channel 200 adjacent to the central first gas delivery channel is referred to as the central second gas delivery channel.
多個第二氣體中心補氣孔201,多個所述第二氣體中心補氣孔201的出口間隔分佈在所述中心第一氣體輸送通道和所述中心第二氣體輸送通道之間的間隙上,用於向所述氣體分配板10的下方中心區域補充所述第二氣體。Multiple second gas central air supply holes 201, the outlets of the multiple second gas central air supply holes 201 are spaced apart and distributed in the gap between the central first gas delivery channel and the central second gas delivery channel, and are used to supply the second gas to the lower central area of the gas distribution plate 10.
請繼續參考圖2所示,在本實施例中,所述氣體分配板10設有相對設置的正面12和背面13,所述背面13設置於反應腔內部,所述正面12遠離反應腔內部設置。所述氣體分配板10的正面12上設有向背面13凹陷的所述氣體輸送通道,所述蓋板11蓋合在所述氣體分配板10的正面12上,且與所述氣體分配板10密封連接,以避免所述第一氣體和所述第二氣體在所述氣體分配板中混合,以及避免所述第一氣體和所述第二氣體從兩者之間的縫隙中擴散到外部大氣環境中,污染環境。Continuing with FIG. 2 , in this embodiment, the gas distribution plate 10 has a front face 12 and a back face 13, which are positioned opposite each other. The back face 13 is positioned within the reaction chamber, while the front face 12 is positioned away from the interior of the reaction chamber. The front face 12 of the gas distribution plate 10 is provided with the gas delivery channel, which is recessed toward the back face 13. The cover plate 11 covers the front face 12 of the gas distribution plate 10 and is sealed to the gas distribution plate 10 to prevent the first gas and the second gas from mixing within the gas distribution plate and from diffusing into the external atmosphere through the gap between the two gas distribution plates, thereby contaminating the environment.
每一所述第一氣體輸送通道100的上開設有兩圈所述第一氣體氣孔,其中一圈的每一所述第一氣體氣孔(如圖2中標號101所示)的進口靠近所述第一氣體輸送通道100的內圈側壁設置,所述第一氣體氣孔(如圖2中標號101所示)的出口開設在所述氣體分配板10的背面13上,且朝向所述氣體分配板10的中心軸。另外一圈的每一第一氣體氣孔(如圖2中標號102所示)的進口靠近所述第一氣體輸送通道100的外圈側壁設置,第一氣體氣孔(如圖2中標號102所示)的出口開設在所述氣體分配板10的背面13上,且背離所述氣體分配板10的中心軸設置。Each of the first gas delivery channels 100 is provided with two circles of first gas holes. The inlet of each of the first gas holes (as shown by the number 101 in FIG. 2 ) in one circle is located near the inner sidewall of the first gas delivery channel 100, and the outlet of the first gas holes (as shown by the number 101 in FIG. 2 ) is located on the back surface 13 of the gas distribution plate 10 and faces the central axis of the gas distribution plate 10. The inlet of each of the first gas holes (as shown by the number 102 in FIG. 2 ) in the other circle is located near the outer sidewall of the first gas delivery channel 100, and the outlet of the first gas holes (as shown by the number 102 in FIG. 2 ) is located on the back surface 13 of the gas distribution plate 10 and faces away from the central axis of the gas distribution plate 10.
請繼續參考圖2所示,在本實施例中,除了中心第二氣體輸送通道,每一所述第二氣體輸送通道200的上開設有兩圈所述第二氣體氣孔(圖2中的標號204和205所示),其中一圈的每一所述第二氣體氣孔(如圖2中標號204所示)的進口靠近所述第二氣體輸送通道200的內圈側壁設置,所述第二氣體氣孔(如圖2中標號204所示)的出口開設在所述氣體分配板10的背面13上,且朝向所述氣體分配板10的中心軸。另外一圈的每一第二氣體氣孔(如圖2中標號205所示)的進口靠近所述第二氣體輸送通道200的外圈側壁設置,第二氣體氣孔(如圖2中標號205所示)的出口開設在所述氣體分配板10的背面13上,且背離所述氣體分配板10的中心軸設置。Please continue to refer to Figure 2. In this embodiment, in addition to the central second gas delivery channel, each of the second gas delivery channels 200 is provided with two circles of second gas holes (as shown by the numbers 204 and 205 in Figure 2), wherein the inlet of each of the second gas holes in one circle (as shown by the number 204 in Figure 2) is arranged close to the inner circle side wall of the second gas delivery channel 200, and the outlet of the second gas hole (as shown by the number 204 in Figure 2) is opened on the back side 13 of the gas distribution plate 10 and faces the center axis of the gas distribution plate 10. The inlet of each second gas hole (as shown by label 205 in Figure 2) in another circle is arranged close to the outer circle side wall of the second gas delivery channel 200, and the outlet of the second gas hole (as shown by label 205 in Figure 2) is opened on the back side 13 of the gas distribution plate 10 and is arranged away from the central axis of the gas distribution plate 10.
結合圖1和圖2所示,中心第二氣體輸送通道設有一圈所述第二氣體氣孔(如圖1或2中標號203所示)和一圈所述第二氣體中心補氣孔201。其中,中心第二氣體輸送通道上的所述第二氣體氣孔(如圖2中標號203所示)的進口靠近所述中心第二氣體輸送通道的外圈側壁設置,第二氣體氣孔(如圖2中標號203所示)的出口開設在所述氣體分配板10的背面13上,且背離所述氣體分配板10的中心軸設置。As shown in Figures 1 and 2 , the central second gas delivery channel is provided with a circle of second gas holes (as indicated by reference numeral 203 in Figures 1 or 2 ) and a circle of second gas central replenishment holes 201. The inlets of the second gas holes (as indicated by reference numeral 203 in Figure 2 ) in the central second gas delivery channel are located near the outer sidewall of the central second gas delivery channel, while the outlets of the second gas holes (as indicated by reference numeral 203 in Figure 2 ) are located on the back surface 13 of the gas distribution plate 10 and away from the central axis of the gas distribution plate 10.
每一所述第二氣體中心補氣孔201的進口靠近所述中心第二氣體輸送通道的中心線處設置,所述第二氣體中心補氣孔201的出口開設在所述氣體分配板10的背面13上,且靠近所述氣體分配板10的中心軸設置。The inlet of each of the second gas center air supply holes 201 is arranged near the center line of the central second gas delivery channel, and the outlet of the second gas center air supply hole 201 is opened on the back side 13 of the gas distribution plate 10 and is arranged near the center axis of the gas distribution plate 10.
結合圖1和圖2所示,兩個所述第一氣體輸送通道100和所述第二氣體輸送通道200之間存在間隔區103,多個所述第二氣體中心補氣孔201的出口間隔分佈在所述中心第一氣體輸送通道與所述中心第二氣體輸送通道之間的所述間隔區103上,以向所述氣體分配板10的下方中心區域補充所述第二氣體。所述間隔區103應該儘量小,以滿足能夠安排更多的第一氣體輸送通道100,第二氣體輸送通道200。As shown in Figures 1 and 2 , a partition 103 exists between the two first gas supply channels 100 and the second gas supply channel 200. The outlets of multiple central second gas supply holes 201 are spaced and distributed in this partition 103 between the central first gas supply channel and the central second gas supply channel to supply the second gas to the lower central area of the gas distribution plate 10. The partition 103 should be as small as possible to accommodate more first gas supply channels 100 and second gas supply channels 200.
請繼續參考圖1所示,每一所述第二氣體中心補氣孔201的出氣方向朝向所述氣體分配板10的中心軸。由此可以便於向所述氣體分配板10的下方中心區域補充所述第二氣體,提高補氣效果,提高所述氣體分配板10的下方中心區域中各種氣相前驅體的分佈均勻性。Continuing with Figure 1 , each of the second gas central supply holes 201 directs gas outflow toward the central axis of the gas distribution plate 10. This facilitates the replenishment of the second gas to the lower central region of the gas distribution plate 10, improving the supply efficiency and the uniformity of the distribution of various gaseous precursors in the lower central region of the gas distribution plate 10.
請繼續參考圖1所示,在本實施例中,每一所述第二氣體中心補氣孔201的出口位於所述中心第一氣體輸送通道上的兩個所述第一氣體氣孔(可以參考圖1中標號102)的出口之間。這樣設置的目的是為了保證同一間隔區103間上設置的第一氣體和第二氣體的氣孔出口交替排列,保證氣體分配板10上同一半徑位置的圓周上的氣體出口可以均勻排佈,進而保證第一氣體和第二氣體的分佈均勻性。所述第二氣體中心補氣孔201還能實現對所述兩個所述第一氣體氣孔(可以參考圖1中標號102)的出口之間的區域補氣,由此實現對所述氣體分配板10的下方中心區域中補氣,實現提高此區域中各種氣相前驅體的分佈均勻性。Continuing with Figure 1, in this embodiment, the outlet of each central second gas replenishment hole 201 is located between the outlets of two first gas holes (see reference numeral 102 in Figure 1) in the central first gas delivery channel. This arrangement ensures that the first and second gas outlets within the same partition 103 are arranged alternately, ensuring that the gas outlets within the same radius on the gas distribution plate 10 are evenly arranged, thereby ensuring uniform distribution of the first and second gases. The second gas center air supply hole 201 can also supply air to the area between the outlets of the two first gas holes (refer to the label 102 in Figure 1), thereby supplying air to the lower central area of the gas distribution plate 10, thereby improving the distribution uniformity of various gas-phase precursors in this area.
在本實施例或一些其他的實施例中,每一所述第二氣體中心補氣孔201的出口與相鄰的兩個所述第一氣體氣孔(可以參考圖1中標號102)的出口之間的間距相等。由此可以更好的實現對所述兩個所述第一氣體氣孔(可以參考圖1中標號102)的出口之間的區域進行均勻補氣。In this embodiment or some other embodiments, the outlet of each second central gas supply hole 201 is equidistant from the outlets of two adjacent first gas holes (see reference numeral 102 in FIG. 1 ). This allows for more uniform gas supply to the area between the outlets of the two first gas holes (see reference numeral 102 in FIG. 1 ).
在本實施例或一些其他的實施例中,每一所述第二氣體中心補氣孔201的傾斜方向與豎直方向之間的夾角β1的範圍為30°~60°,所述第二氣體中心補氣孔201的出口朝向氣體分配板10的中心軸方向,由此以更好地向中心區域補充第二氣體。可選地,多個所述第二氣體中心補氣孔201的傾斜角度為其斜孔的中心線與底面的交點剛好落在間隔區103的中心線上。In this embodiment or some other embodiments, the angle β1 between the tilt direction and the vertical direction of each second gas central supply hole 201 ranges from 30° to 60°. The outlet of each second gas central supply hole 201 is oriented toward the central axis of the gas distribution plate 10, thereby better supplying the second gas to the central area. Optionally, the tilt angle of each of the second gas central supply holes 201 is such that the intersection of the centerline of the tilted hole and the bottom surface exactly coincides with the centerline of the partition 103.
如圖3所示,每一所述第一氣體輸送通道100和每一所述第二氣體輸送通道200為不連通的C形槽。由於快速排氣的需要,所述第一氣體輸送通道100和所述第二氣體輸送通道200分別連接至外部各自的低壓源(圖中未示出),為了進一步提高排氣速度,讓每一種輸送氣體從進氣到出氣能夠行程連續,從而實現更快速的排氣,每一所述第一氣體輸送通道100和每一所述第二氣體輸送通道200為不連通的C形槽,相鄰的兩個第一氣體輸送通道100之間通過第一氣體連通通道120連接,相鄰的兩個第二氣體輸送通道200之間通過第二氣體連通通道220連接。As shown in Figure 3, each first gas delivery channel 100 and each second gas delivery channel 200 is a non-connected C-shaped groove. Due to the need for rapid exhaust, the first gas delivery channel 100 and the second gas delivery channel 200 are each connected to an external low-pressure source (not shown). To further increase the exhaust speed and ensure a continuous flow of each transported gas from intake to exhaust, thereby achieving faster exhaust, each first gas delivery channel 100 and each second gas delivery channel 200 is a non-connected C-shaped groove. Two adjacent first gas delivery channels 100 are connected by a first gas connecting channel 120, and two adjacent second gas delivery channels 200 are connected by a second gas connecting channel 220.
若干個第一分隔板110,每一所述第一分隔板110設置在對應的所述第一氣體輸送通道100內。在本實施例或一些其他的實施例中,所述第一分隔板110可以是與所述第一氣體輸送通道100一體設置的。若干個第二分隔板210,每一所述第二分隔板210設置在對應的所述第二氣體輸送通道200內。在本實施例或一些其他的實施例中,所述第二分隔板210可以是與所述第二氣體輸送通道200一體設置的。在一些實施例中,所述第一氣體連通通道120可以設置在所述第一分隔板的豎直方向上,所述第二氣體連通通道220可以設置在所述第二分隔板210的豎直方向上。A plurality of first partition plates 110 are provided, each of which is disposed in a corresponding first gas transport channel 100. In this embodiment or some other embodiments, the first partition plates 110 may be provided integrally with the first gas transport channel 100. A plurality of second partition plates 210 are provided, each of which is disposed in a corresponding second gas transport channel 200. In this embodiment or some other embodiments, the second partition plates 210 may be provided integrally with the second gas transport channel 200. In some embodiments, the first gas communication channel 120 may be provided in the vertical direction of the first partition plate, and the second gas communication channel 220 may be provided in the vertical direction of the second partition plate 210.
請繼續參考圖3所示,多個第一氣體補氣孔104,每一所述第一氣體補氣孔104的進口位於所述第一氣體輸送通道100內,且靠近所述第一分隔板110設置;每一所述第一氣體補氣孔104的出口位於所述間隔區103上,且靠近所述第一分隔板110與所述間隔區103之間的交匯處設置,以對對應的所述第二氣體輸送通道200所在的區域補充所述第一氣體。Please continue to refer to Figure 3, which shows multiple first gas replenishment holes 104. The inlet of each first gas replenishment hole 104 is located in the first gas delivery channel 100 and is arranged near the first partition plate 110; the outlet of each first gas replenishment hole 104 is located on the partition area 103 and is arranged near the intersection between the first partition plate 110 and the partition area 103 to replenish the first gas in the area where the corresponding second gas delivery channel 200 is located.
多個第二氣體補氣孔202,每一所述第二氣體補氣孔202的進口位於所述第二氣體輸送通道200內,且靠近所述第二分隔板210設置;每一所述第二氣體補氣孔202的出口位於所述間隔區103上,且靠近所述第二分隔板210與所述間隔區103之間的交匯處設置,以對對應的所述第一氣體輸送通道100所在的區域補充所述第二氣體。所述第一氣體補氣孔104和/或第二氣體補氣孔202的設置可以解決先前技術中由於所述第一分隔板110和/或第二分隔板210的存在,使得此分隔板所在的區域不能設有第一氣體氣孔或第二氣體氣孔,即存在跳孔缺陷,進而造成的所述氣相前驅體在此區域處分佈不均勻的問題。Multiple second gas supply holes 202 are provided. The inlet of each second gas supply hole 202 is located within the second gas delivery channel 200 and is disposed near the second partition plate 210. The outlet of each second gas supply hole 202 is located on the partition area 103 and is disposed near the intersection between the second partition plate 210 and the partition area 103, so as to supply the second gas to the corresponding area of the first gas delivery channel 100. The provision of the first gas supply holes 104 and/or the second gas supply holes 202 can solve the problem in the prior art where the presence of the first partition plate 110 and/or the second partition plate 210 prevents the provision of first gas holes or second gas holes in the area where the partition plate is located, i.e., the presence of a jump hole defect, which in turn causes uneven distribution of the gaseous precursor in this area.
請繼續參考圖3所示,每一所述第一氣體補氣孔104的出口位於對應的所述第二氣體輸送通道200上的兩個所述第二氣體氣孔(可以參考圖3中的標號205所示)的出口之間。3 , the outlet of each first gas replenishing hole 104 is located between the outlets of two second gas holes (as shown by reference numeral 205 in FIG. 3 ) on the corresponding second gas delivery channel 200 .
每一所述第二氣體補氣孔202的出口位於對應的所述第一氣體輸送通道100上的兩個所述第一氣體氣孔(可以參考圖3中的標號102所示)的出口之間。The outlet of each second gas replenishing hole 202 is located between the outlets of two first gas holes (refer to the reference numeral 102 in FIG. 3 ) on the corresponding first gas delivery channel 100 .
可以理解的是,本實施例涉及的所有類型的氣孔的出口均是開設在對應的間隔區103上,由此,可以認為每一所述第一氣體補氣孔104的出口位於該間隔區103上的兩個所述第二氣體氣孔(可以參考圖3中的標號205所示)的出口之間。可以認為每一所述第二氣體補氣孔202的出口位於該間隔區103上的兩個所述第一氣體氣孔(可以參考圖3中的標號102所示)的出口之間。It is understood that the outlets of all types of gas holes involved in this embodiment are opened on the corresponding partition 103. Therefore, it can be considered that the outlet of each first gas replenishing hole 104 is located between the outlets of two second gas holes (refer to the number 205 in Figure 3) on the partition 103. It can also be considered that the outlet of each second gas replenishing hole 202 is located between the outlets of two first gas holes (refer to the number 102 in Figure 3) on the partition 103.
在一些實施例中,每一所述第一氣體補氣孔104的出口與相鄰的兩個所述第二氣體氣孔(可以參考圖3中標號205所示)的出口之間的間距相等。In some embodiments, the distances between the outlet of each first gas replenishing hole 104 and the outlets of two adjacent second gas holes (refer to the reference numeral 205 in FIG. 3 ) are equal.
每一所述第二氣體補氣孔202的出口與相鄰的兩個所述第一氣體氣孔(可以參考圖3中標號102所示)的出口之間的間距相等。此設置可以使得所述氣相前驅體在此區域處分佈更均勻的。The outlet of each second gas replenishing hole 202 is equidistant from the outlets of the two adjacent first gas holes (as shown by reference numeral 102 in FIG3 ). This arrangement allows the gaseous precursor to be more evenly distributed in this area.
請繼續參考圖3所示,在本實施例或一些其他的實施例中,每一所述第一氣體補氣孔104和所述第二氣體補氣孔202的出氣方向不朝向所述氣體分配板10的中心軸。可選地,所述第一氣體補氣孔104或所述第二氣體補氣孔202的傾斜方向與豎直方向之間的夾角小於45°。Continuing with FIG. 3 , in this embodiment or some other embodiments, the gas outlet direction of each of the first gas supply holes 104 and the second gas supply holes 202 is not toward the central axis of the gas distribution plate 10. Optionally, the angle between the inclined direction of the first gas supply hole 104 or the second gas supply hole 202 and the vertical direction is less than 45°.
請繼續參考圖4所示,所述第二氣體中心補氣孔201的傾斜方向與豎直方向之間的夾角β1為30°~60°。Continuing to refer to FIG. 4 , the angle β1 between the tilt direction of the second gas center air supply hole 201 and the vertical direction is 30° to 60°.
請繼續參考圖4所示,所述第一氣體氣孔(如圖4中標號101或102所示)或所述第二氣體氣孔(如圖2中標號203所示)的傾斜方向與豎直方向之間的夾角β為10°~30°。傾斜設置且相互交錯的所有類型氣孔的設置,可以避免由於氣孔豎直設置產生氣體幕簾的現象產生,不利於各種不同的氣體在所述反應腔或基片表面的均勻分佈。Continuing with FIG. 4 , the angle β between the tilt direction of the first gas holes (indicated by 101 or 102 in FIG. 4 ) or the second gas holes (indicated by 203 in FIG. 2 ) and the vertical direction is 10° to 30°. The tilted and staggered arrangement of all types of gas holes avoids the formation of a gas curtain caused by vertically oriented holes, which can hinder the uniform distribution of different gases within the reaction chamber or on the substrate surface.
在本實施例或一些其他的實施例中,請繼續參考圖3所示,所述第一氣體輸送通道100連通的第一入口端,用於向所述第一氣體輸送通道100內輸送第一氣體。第一低壓源(圖3中未示出),與所述第一氣體輸送通道100的第一出口端連通,用於向所述第一出口端處提供低壓。與所述第二氣體輸送通道200連通的第二入口端,用於向所述第二氣體輸送通道200內輸送第二氣體。第二低壓源(圖3中未示出),與所述第二氣體輸送通道200的第二出口端連通,用於向所述第二出口端處提供低壓。可以理解的是,在一些實施例中,所述第一低壓源和所述第二低壓源可以是抽氣泵。In this embodiment or some other embodiments, please continue to refer to FIG. 3 . The first inlet end of the first gas delivery channel 100 is connected to the first outlet end of the first gas delivery channel 100 and is used to deliver a first gas to the first outlet end. A first low-pressure source (not shown in FIG. 3 ) is connected to the first outlet end of the first gas delivery channel 100 and is used to provide a low pressure to the first outlet end. A second inlet end of the second gas delivery channel 200 is connected to the second outlet end of the second gas delivery channel 200 and is used to deliver a second gas to the second outlet end. It will be understood that in some embodiments, the first low-pressure source and the second low-pressure source may be vacuum pumps.
如圖5所示,本實施例還提供一種氣相沉積設備,包括:反應腔50;基座51,其設置在所述反應腔50內部底部,用於支撐基片53;具有如上述實施例所述的氣體分配板10的氣體噴淋頭52,所述氣體噴淋頭52設置在所述反應腔50頂部,與所述基座51相對設置,用於向所述基片53的表面提供反應氣體。由此可以實現向所述基片53的表面提供均勻的多種反應氣體。As shown in FIG5 , this embodiment further provides a vapor deposition apparatus, comprising: a reaction chamber 50; a susceptor 51 disposed at the bottom of the reaction chamber 50 and configured to support a substrate 53; and a gas showerhead 52 having a gas distribution plate 10 as described in the above embodiment. The gas showerhead 52 is disposed at the top of the reaction chamber 50, opposite the susceptor 51, and configured to supply reactive gases to the surface of the substrate 53. This allows for uniform supply of multiple reactive gases to the surface of the substrate 53.
再一方面,本實施例還提供一種氣相沉積設備的使用方法,包括:In another aspect, this embodiment further provides a method for using the vapor deposition apparatus, comprising:
步驟a、向所述第一氣體輸送通道內通入第一氣體,第二低壓源處於關閉狀態。Step a: introducing the first gas into the first gas delivery channel, and the second low-pressure source is in a closed state.
步驟b、停止通入所述第一氣體,向所述第一氣體輸送通道內通入吹掃氣體,第一低壓源處於開啟狀態。Step b: Stop introducing the first gas, introduce purge gas into the first gas delivery channel, and keep the first low-pressure source on.
步驟c、關閉所述第一低壓源,向所述第二氣體輸送通道內通入第二氣體。Step c: Turn off the first low-pressure source and introduce the second gas into the second gas delivery channel.
通過間隔分佈在與位於所述氣體分配板中心的第一氣體輸送通道相鄰的第二氣體輸送通道上的多個第二氣體中心補氣孔,向位於所述氣體分配板中心的第一氣體輸送通道的下方中心區域補充所述第二氣體。The second gas is replenished to the central area below the first gas delivery channel located at the center of the gas distribution plate through a plurality of second gas central gas replenishing holes spaced apart on the second gas delivery channel adjacent to the first gas delivery channel located at the center of the gas distribution plate.
步驟d、停止通入所述第二氣體,向所述第二氣體輸送通道內通入吹掃氣體,第二低壓源處於開啟狀態。重複所述步驟a~d。Step d: Stop the second gas flow and introduce purge gas into the second gas delivery channel, with the second low-pressure source turned on. Repeat steps a-d.
由此可知,在第一或第二氣體輸送通道內通入吹掃氣體的同時抽真空,可快速去除第一/第二氣體輸送通道中殘留的反應氣體,防止兩種反應氣體反應,在氣體噴淋頭內生成沉積物,還可以在所述第一/第二氣體輸送通道通入相應的反應氣體時,通過設有的多個第二氣體中心補氣孔,向位於所述氣體分配板中心的第一氣體輸送通道的下方中心區域補充所述第二氣體。和/或,通過設有的多個所述第一氣體補氣孔和所述第二氣體補氣孔對所述第一分隔板或第二分隔板所在的區域(或跳孔存在的區域)進行補氣,由此進一步提高所述基片表面的多種反應氣體的分佈均勻性。As can be seen, by simultaneously introducing a purge gas into the first or second gas delivery channel and simultaneously performing a vacuum, residual reactive gas in the first/second gas delivery channel can be quickly removed, preventing the two reactive gases from reacting and forming deposits within the gas showerhead. Furthermore, while the corresponding reactive gas is introduced into the first/second gas delivery channel, the second gas can be replenished through the plurality of central second gas replenishment holes to the central area below the first gas delivery channel located at the center of the gas distribution plate. Furthermore, the plurality of first and second gas replenishment holes can be used to replenish gas to the area where the first or second partition plate is located (or where the jump hole exists), thereby further improving the uniformity of the distribution of the multiple reactive gases on the substrate surface.
需要說明的是,在本文中,諸如第一和第二等之類的關係術語僅僅用來將一個實體或者操作與另一個實體或操作區分開來,而不一定要求或者暗示這些實體或操作之間存在任何這種實際的關係或者順序。而且,術語“包括”、“包含”或者其任何其他變體意在涵蓋非排他性的包含,從而使得包括一系列要素的過程、方法、物品或者設備不僅包括那些要素,而且還包括沒有明確列出的其他要素,或者是還包括為這種過程、方法、物品或者設備所固有的要素。在沒有更多限制的情況下,由語句“包括一個……”限定的要素,並不排除在包括所述要素的過程、方法、物品或者設備中還存在另外的相同要素。It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that includes a list of elements includes not only those elements, but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a..." does not preclude the presence of additional identical elements in the process, method, article, or apparatus that includes the element.
在本發明的描述中,需要理解的是,術語“中心”、“高度”、“厚度”、“上”、“下”、“豎直”、“水平”、“頂”、“底”、“內”、“外”、“軸向”、“徑向”、“周向”等指示的方位或位置關係為基於圖式所示的方位或位置關係,僅是為了便於描述本發明和簡化描述,而不是指示或暗示所指的裝置或元件必須具有特定的方位、以特定的方位構造和操作,因此不能理解為對本發明的限制。在本發明的描述中,除非另有說明,“多個”的含義是兩個或兩個以上。In the description of the present invention, it should be understood that terms such as "center," "height," "thickness," "upper," "lower," "vertical," "horizontal," "top," "bottom," "inner," "outer," "axial," "radial," and "circumferential" indicate positions or locations based on those shown in the drawings. These terms are used solely to facilitate and simplify the description of the present invention and do not indicate or imply that the devices or components referred to must have, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations of the present invention. In the description of the present invention, unless otherwise specified, "plurality" means two or more.
在本發明的描述中,除非另有明確的規定和限定,術語“安裝”、“相連”、“連接”、“固定”應做廣義理解,例如,可以是固定連接,也可以是可拆卸連接,或成一體;可以是機械連接,也可以是電連接;可以是直接相連,也可以通過中間媒介間接相連,可以是兩個元件內部的連通或兩個元件的相互作用關係。對於本領域的具有通常知識者而言,可以具體情況理解上述術語在本發明中的具體含義。In the description of this invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "connected," and "fixed" should be interpreted broadly. For example, they may refer to fixed or removable connections, or integration; mechanical or electrical connections; direct connections or indirect connections through an intermediate medium; and internal connections between two components or interactions between two components. Those skilled in the art will understand the specific meanings of these terms in the context of this invention.
在本發明中,除非另有明確的規定和限定,第一特徵在第二特徵之“上”或之“下”可以包括第一和第二特徵直接接觸,也可以包括第一和第二特徵不是直接接觸而是通過它們之間的另外的特徵接觸。而且,第一特徵在第二特徵“之上”、“上方”和“上面”包括第一特徵在第二特徵正上方和斜上方,或僅僅表示第一特徵水平高度高於第二特徵。第一特徵在第二特徵“之下”、“下方”和“下面”包括第一特徵在第二特徵正下方和斜下方,或僅僅表示第一特徵水平高度小於第二特徵。In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or the first and second features not being in direct contact but being in contact via another feature between them. Furthermore, the phrases "above," "above," and "above" a first feature include the phrases "directly above" and "diagonally above" the second feature, or simply indicate that the first feature is higher in level than the second feature. The phrases "below," "below," and "below" a first feature being "directly below" and "diagonally below" the second feature, or simply indicate that the first feature is lower in level than the second feature.
儘管本發明的內容已經通過上述優選實施例作了詳細介紹,但應當認識到上述的描述不應被認為是對本發明的限制。在本領域技術人員閱讀了上述內容後,對於本發明的多種修改和替代都將是顯而易見的。因此,本發明的保護範圍應由所附的申請專利範圍來限定。Although the present invention has been described in detail through the preferred embodiments described above, it should be understood that the above description should not be considered as limiting the present invention. After reading the above description, various modifications and alternatives to the present invention will be apparent to those skilled in the art. Therefore, the scope of protection of the present invention is defined by the attached patent application.
10:氣體分配板 11:蓋板 50:反應腔 51:基座 52:氣體噴淋頭 53:基片 100:第一氣體輸送通道 101、102:標號 103:間隔區 104:第一氣體補氣孔 110:第一分隔板 120:第一氣體連通通道 200:第二氣體輸送通道 201:第二氣體中心補氣孔 202:第二氣體補氣孔 203、204、205:標號 210:第二分隔板 220:第二氣體連通通道 A:第一氣體 B:第二氣體 β:夾角 β1:夾角 10: Gas distribution plate 11: Cover plate 50: Reaction chamber 51: Base 52: Gas showerhead 53: Substrate 100: First gas delivery channel 101, 102: Reference numbers 103: Spacer 104: First gas refill hole 110: First partition plate 120: First gas communication channel 200: Second gas delivery channel 201: Second gas center refill hole 202: Second gas refill hole 203, 204, 205: Reference numbers 210: Second partition plate 220: Second gas communication channel A: First gas B: Second gas β: Intersection angle β1: Intersection angle
圖1為本發明一實施例提供的氣體噴淋頭的中心區域的俯視結構示意圖; 圖2為本發明一實施例提供的氣體噴淋頭的縱向剖面結構示意圖; 圖3本發明一實施例提供的氣體噴淋頭的俯視結構示意圖; 圖4為本發明一實施例提供的各類氣孔的縱向剖面結構示意圖; 圖5為本發明一實施例提供的氣相沉積設備的結構示意圖。 Figure 1 is a schematic top view of the central region of a gas shower head provided in accordance with an embodiment of the present invention; Figure 2 is a schematic longitudinal cross-sectional view of a gas shower head provided in accordance with an embodiment of the present invention; Figure 3 is a schematic top view of a gas shower head provided in accordance with an embodiment of the present invention; Figure 4 is a schematic longitudinal cross-sectional view of various types of air holes provided in accordance with an embodiment of the present invention; Figure 5 is a schematic structural diagram of a vapor deposition apparatus provided in accordance with an embodiment of the present invention.
10:氣體分配板 10: Gas distribution plate
100:第一氣體輸送通道 100: First gas delivery channel
101:標號 101: Label
102:標號 102: Label
103:間隔區 103: Interval area
110:第一分隔板 110: First partition plate
200:第二氣體輸送通道 200: Second gas delivery channel
201:第二氣體中心補氣孔 201: Second gas center air hole
202:第二氣體補氣孔 202: Second gas filling hole
203:標號 203: Label
210:第二分隔板 210: Second partition
A:第一氣體 A: First Gas
B:第二氣體 B: Second gas
Claims (16)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311758692.1A CN120174347A (en) | 2023-12-19 | 2023-12-19 | Gas shower head, vapor deposition equipment and use method thereof |
| CN2023117586921 | 2023-12-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202528581A TW202528581A (en) | 2025-07-16 |
| TWI901368B true TWI901368B (en) | 2025-10-11 |
Family
ID=96042462
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW113137002A TWI901368B (en) | 2023-12-19 | 2024-09-27 | Gas shower head, vapor deposition equipment and method of use thereof |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN120174347A (en) |
| TW (1) | TWI901368B (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW202235676A (en) * | 2021-01-29 | 2022-09-16 | 荷蘭商Asm Ip私人控股有限公司 | Reactor, gas flow control ring, and substrate processing apparatus |
| TW202302907A (en) * | 2021-05-12 | 2023-01-16 | 荷蘭商Asm Ip私人控股有限公司 | Cvd apparatus and film forming method |
| TW202326905A (en) * | 2021-10-27 | 2023-07-01 | 荷蘭商Asm Ip私人控股有限公司 | Plasma deposition apparatus |
-
2023
- 2023-12-19 CN CN202311758692.1A patent/CN120174347A/en active Pending
-
2024
- 2024-09-27 TW TW113137002A patent/TWI901368B/en active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW202235676A (en) * | 2021-01-29 | 2022-09-16 | 荷蘭商Asm Ip私人控股有限公司 | Reactor, gas flow control ring, and substrate processing apparatus |
| TW202302907A (en) * | 2021-05-12 | 2023-01-16 | 荷蘭商Asm Ip私人控股有限公司 | Cvd apparatus and film forming method |
| TW202326905A (en) * | 2021-10-27 | 2023-07-01 | 荷蘭商Asm Ip私人控股有限公司 | Plasma deposition apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202528581A (en) | 2025-07-16 |
| CN120174347A (en) | 2025-06-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US11420217B2 (en) | Showerhead for ALD precursor delivery | |
| CN108070846B (en) | Gas supply unit and substrate processing apparatus including gas supply unit | |
| KR101804597B1 (en) | Film forming apparatus | |
| TWI438300B (en) | Atomic layer deposition system and method | |
| CN101322226B (en) | Substrate processing apparatus and processing gas ejection mechanism | |
| JP6379550B2 (en) | Deposition equipment | |
| CN100505175C (en) | Gas processing apparatus and film-forming apparatus | |
| US20120199067A1 (en) | Film-forming apparatus | |
| US20100272895A1 (en) | Film deposition apparatus, film deposition method, storage medium, and gas supply apparatus | |
| JP6503730B2 (en) | Film deposition system | |
| JP2017226863A (en) | Gas mixing apparatus and substrate processing apparatus | |
| CN101772833A (en) | gas supply device | |
| KR100574569B1 (en) | Thin film deposition apparatus having thin film deposition method and separated purge gas injection hole | |
| TW200932945A (en) | Gas supplying apparatus | |
| CN101374973A (en) | Substrate processing apparatus and substrate mounting table | |
| JP2013209722A (en) | Film-forming apparatus | |
| US11725281B2 (en) | Gas introduction structure, thermal processing apparatus and gas supply method | |
| TWI901368B (en) | Gas shower head, vapor deposition equipment and method of use thereof | |
| TW202109798A (en) | Apparatus for supplying gas and apparatus for processing substrate using the same | |
| TWI502096B (en) | Reaction device and reaction process for chemical vapor deposition | |
| KR100422398B1 (en) | Apparatus for depositing a thin film | |
| TW202141664A (en) | Flush fixture for flushing components of showerhead assembly or showerhead plate of semiconductor processing device, system for flushing showerhead assembly, and method of flushing components of showerhead assembly | |
| JP4773469B2 (en) | Thin film forming apparatus and thin film forming method | |
| CN221480063U (en) | Gas spray head and vapor deposition equipment | |
| KR101464202B1 (en) | Apparatus for processing substrate |