TWI901112B - Burn-in device - Google Patents
Burn-in deviceInfo
- Publication number
- TWI901112B TWI901112B TW113116809A TW113116809A TWI901112B TW I901112 B TWI901112 B TW I901112B TW 113116809 A TW113116809 A TW 113116809A TW 113116809 A TW113116809 A TW 113116809A TW I901112 B TWI901112 B TW I901112B
- Authority
- TW
- Taiwan
- Prior art keywords
- burn
- chamber
- board
- connector
- temperature
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
[課題] 提供一種燒入裝置,可以增加裝置的每單位占有面積的DUT的測定數量,並且可以抑制訊號的傳輸損失。 [解決手段] 燒入裝置1包括燒入板20、燒入腔室11、藉由壁115a與燒入腔室11隔開並且藉由壁60與外部空氣隔開的絕熱室30、以及功能板50。壁115a包括頂板40,經由連接器23與連接器42嵌合,燒入板20與頂板40電性連接,功能板50介由形成在壁60的開口61而進入絕熱室30的內部,經由連接器52與連接器43嵌合,功能板50與頂板40電性連接。 [Question] A burn-in device is provided that can increase the number of DUTs that can be measured per unit area of the device and suppress signal transmission loss. [Solution] The burn-in device 1 includes a burn-in plate 20, a burn-in chamber 11, an insulating chamber 30 separated from the burn-in chamber 11 by a wall 115a and isolated from the outside air by a wall 60, and a functional board 50. Wall 115a includes a top plate 40. The burn-in plate 20 and the top plate 40 are electrically connected by connector 23 mating with connector 42. The functional board 50 enters the interior of the insulating chamber 30 through an opening 61 formed in the wall 60 and is electrically connected to the top plate 40 by connector 52 mating with connector 43.
Description
本發明關於一種燒入裝置。The present invention relates to a burn-in device.
已知一種燒入裝置,在高溫或低溫環境下進行被測試電子部件(Device Under Test, DUT)的測試,目的為去除具有初始缺陷的電子部件(例如,參考專利文獻1)。 [先前技術文獻] [專利文獻] A burn-in device is known for testing a device under test (DUT) in a high-temperature or low-temperature environment to remove any initial defects (e.g., see Patent Document 1). [Prior Art Document] [Patent Document]
[專利文獻1] 日本特開2022-138609號公報。[Patent Document 1] Japanese Patent Application Publication No. 2022-138609.
[發明所欲解決之問題][Identify the problem you want to solve]
在上述燒入裝置中,加熱層收容燒入板並且將裝配在此燒入板的DUT加熱,為了達成加熱層的絕熱,將燒入板以及驅動器板以中繼板連接。在這樣的燒入裝置中,存在以下問題:中繼板的存在增加了裝置尺寸,並且裝置的每單位占有面積的DUT的測定數量受到限制。又,由於訊號經過中繼板,所以存在在燒入板與驅動器板之間發生訊號傳輸損失的問題。In the aforementioned burn-in system, a heating layer houses the burn-in board and heats the DUT mounted on it. To provide thermal insulation for the heating layer, the burn-in board and driver board are connected via a relay board. However, this burn-in system presents the following issues: the presence of the relay board increases the size of the system, limiting the number of DUTs that can be measured per unit area of the system. Furthermore, because signals pass through the relay board, signal transmission loss between the burn-in board and driver board can occur.
本發明要解決的問題是提供一種燒入裝置,可以增加裝置的每單位占有面積的DUT的測定數量,並且可以抑制訊號的傳輸損失。 [解決問題之手段] The present invention aims to provide a burn-in device that increases the number of DUTs that can be measured per unit area of the device and suppresses signal transmission loss. [Solution]
[1] 本發明的樣態1是一種燒入裝置,包括燒入板、腔室、絕熱室、以及功能板。燒入板包括裝配DUT的插座、安裝前述插座的第一基板、以及安裝在前述第一基板的第一連接器。腔室收容前述燒入板。絕熱室藉由第一壁而與前述腔室隔開,並且藉由第二壁而與外部空氣隔開。功能板包括第二基板、以及安裝在前述第二基板的第二連接器。前述第一壁包括頂板,前述頂板包括第三基板、安裝在前述第三基板的一個主表面的第三連接器、以及安裝在前述第三基板的另一個主表面的第四連接器。經由前述第一連接器與前述第三連接器嵌合,前述燒入板與前述頂板電性連接。前述功能板介由形成在前述第二壁的開口而進入前述絕熱室的內部。經由前述第二連接器與前述第四連接器嵌合,前述功能板與前述頂板電性連接。[1] Aspect 1 of the present invention is a burn-in device comprising a burn-in board, a chamber, an insulating chamber, and a functional board. The burn-in board comprises a socket for mounting a DUT, a first substrate for mounting the socket, and a first connector mounted on the first substrate. The chamber accommodates the burn-in board. The insulating chamber is separated from the chamber by a first wall and from the outside air by a second wall. The functional board comprises a second substrate and a second connector mounted on the second substrate. The first wall comprises a top plate, the top plate comprising a third substrate, a third connector mounted on one main surface of the third substrate, and a fourth connector mounted on the other main surface of the third substrate. The burn-in board is electrically connected to the top plate via the engagement of the first connector and the third connector. The functional board enters the interior of the heat-insulating chamber through the opening formed in the second wall. The functional board is electrically connected to the top plate through the engagement of the second connector and the fourth connector.
[2] 本發明的樣態2可以是在樣態1的燒入裝置中的燒入裝置,前述燒入裝置包括乾燥空氣供給裝置,向前述絕熱室供給乾燥空氣。[2] Aspect 2 of the present invention may be a burning device in the burning device of aspect 1, wherein the burning device includes a dry air supply device for supplying dry air to the insulating chamber.
[3] 本發明的樣態3可以是在樣態2的燒入裝置中的燒入裝置,前述燒入裝置包括加熱裝置,加熱前述乾燥空氣。[3] Aspect 3 of the present invention may be a burning device in the burning device of aspect 2, wherein the burning device includes a heating device for heating the dry air.
[4] 本發明的樣態4可以是在樣態3的燒入裝置中的燒入裝置,前述燒入裝置包括測定前述腔室內的溫度的溫度感測器、以及基於前述溫度感測器的測定結果而控制前述加熱裝置的控制裝置。[4] Aspect 4 of the present invention may be a burning device in the burning device of aspect 3, wherein the burning device includes a temperature sensor for measuring the temperature in the chamber, and a control device for controlling the heating device based on the measurement result of the temperature sensor.
[5] 本發明的樣態5可以是在樣態4的燒入裝置中的燒入裝置,在前述腔室內的溫度小於所定溫度的情況下,前述控制裝置控制前述加熱裝置以加熱前述乾燥空氣,在前述腔室內的溫度為前述所定溫度以上的情況下,前述控制裝置控制前述加熱裝置以不加熱前述乾燥空氣。[5] Aspect 5 of the present invention may be a burning device in the burning device of aspect 4, wherein when the temperature in the aforementioned chamber is lower than a predetermined temperature, the aforementioned control device controls the aforementioned heating device to heat the aforementioned dry air, and when the temperature in the aforementioned chamber is higher than the predetermined temperature, the aforementioned control device controls the aforementioned heating device not to heat the aforementioned dry air.
[6] 本發明的樣態6可以是在樣態5的燒入裝置中的燒入裝置,前述所定溫度為0℃以下的溫度值。[6] Aspect 6 of the present invention may be a burning device in the burning device of aspect 5, wherein the aforementioned predetermined temperature is a temperature value below 0°C.
[7] 本發明的樣態7可以是在樣態1-6的燒入裝置中的任一燒入裝置,前述燒入裝置包括將前述第二壁的前述開口與前述功能板之間密封的密封構件。[7] Aspect 7 of the present invention may be any of the burning devices of aspects 1 to 6, wherein the burning device includes a sealing member for sealing the opening of the second wall and the functional plate.
[8] 本發明的樣態8可以是在樣態1-7的燒入裝置中的任一燒入裝置,前述功能板包括介由前述開口而進入前述絕熱室的內部的第一部分、以及位於前述絕熱室的外部的第二部分。[8] Aspect 8 of the present invention may be any of the burning devices of aspects 1-7, wherein the functional panel includes a first portion that enters the interior of the insulating chamber through the opening, and a second portion that is located outside the insulating chamber.
[9] 本發明的樣態9可以是在樣態8的燒入裝置中的燒入裝置,前述燒入裝置包括風扇,送風到前述第二部分而冷卻前述功能板。[9] Aspect 9 of the present invention may be a burning device in the burning device of aspect 8, wherein the burning device includes a fan that supplies air to the second portion to cool the functional panel.
[10] 本發明的樣態10可以是在樣態1-9的燒入裝置中的任一燒入裝置,前述功能板包括安裝在前述第二基板並且向前述DUT輸入以及輸出訊號的控制電路。 [發明效果] [10] Aspect 10 of the present invention may be any of the burn-in devices of aspects 1-9, wherein the functional board includes a control circuit mounted on the second substrate and configured to input and output signals to the DUT. [Effects of the Invention]
在本發明中,燒入板與頂板介由第一連接器以及第三連接器而電性連接,功能板與頂板介由第二連接器以及第四連接器而電性連接。因此,不需要使用用以將燒入板與功能板連接的其他構件,減小燒入裝置的尺寸而可以增加裝置的每單位占有面積的DUT的測定數量。又,由於燒入板以及功能板介由頂板以及第一至第四連接器連接,燒入板與功能板之間的通訊路徑較短,所以可以降低燒入板與功能板之間的訊號的傳輸損失。In the present invention, the burn-in board and the top board are electrically connected via the first and third connectors, and the function board and the top board are electrically connected via the second and fourth connectors. Therefore, there is no need for additional components to connect the burn-in board and the function board, reducing the size of the burn-in device and increasing the number of DUTs that can be measured per unit area of the device. Furthermore, because the burn-in board and the function board are connected via the top board and the first to fourth connectors, the communication path between the burn-in board and the function board is shorter, thereby reducing signal transmission loss between the two boards.
以下基於附圖說明本發明實施形態。The following describes the embodiments of the present invention based on the accompanying drawings.
參考圖1以及圖2的同時說明關於本實施形態的燒入裝置1的整體構成。圖1是本實施形態的燒入裝置的前視圖,圖2是本實施形態的燒入裝置的側剖面圖,圖3是對應於圖2的III-III部分的圖。圖4是對應於圖2的IV部分的放大圖。The overall structure of the burning device 1 of this embodiment will be described with reference to Figures 1 and 2. Figure 1 is a front view of the burning device of this embodiment, Figure 2 is a side sectional view of the burning device of this embodiment, and Figure 3 is a view corresponding to the III-III portion of Figure 2. Figure 4 is an enlarged view corresponding to the IV portion of Figure 2.
本實施形態的燒入裝置1是用於實施燒入測試的裝置,燒入測試是篩選測試的一種,以提取半導體積體電路元件等的被測試電子部件(DUT:Device Under Test)的初始缺陷、並且將初始缺陷品去除為目的。The burn-in apparatus 1 of this embodiment is an apparatus for performing a burn-in test. The burn-in test is a type of screening test that aims to extract initial defects of an electronic component under test (DUT) such as a semiconductor integrated circuit element and remove the initial defective products.
如圖1至圖3所示,燒入裝置1包括燒入腔室11、燒入板20、功能板50、以及絕熱室30。燒入板20是包括在基板21上以矩陣狀配置的複數個插座22的配線板,並且允許DUT100可拆卸地裝配在其上。燒入腔室11可收容複數個燒入板20。功能板50是向安裝在燒入板20的DUT100輸入電壓以及訊號的配線板。絕熱室30將燒入腔室11與外部空氣隔離。As shown in Figures 1 to 3, the burn-in apparatus 1 includes a burn-in chamber 11, a burn-in board 20, a functional board 50, and an insulating chamber 30. The burn-in board 20 is a wiring board comprising a plurality of sockets 22 arranged in a matrix on a substrate 21, and allows the DUT 100 to be removably mounted thereon. The burn-in chamber 11 can accommodate a plurality of burn-in boards 20. The functional board 50 is a wiring board that inputs voltage and signals to the DUT 100 mounted on the burn-in board 20. The insulating chamber 30 isolates the burn-in chamber 11 from the outside air.
燒入裝置1經由向裝配在收容於燒入腔室11內的燒入板20的DUT100施加低溫的熱應力(例如,約-55℃至-10℃)的同時,向DUT100施加電源電壓以及訊號,而實行DUT100的篩選。另外,施加在DUT100的熱應力可以是常溫或高溫(例如,約+25℃至+180℃)的熱應力。Burn-in apparatus 1 screens DUT 100 by applying low-temperature thermal stress (e.g., approximately -55°C to -10°C) to DUT 100 mounted on burn-in board 20 housed in burn-in chamber 11 while simultaneously applying power voltage and signals to DUT 100. The thermal stress applied to DUT 100 can be either room temperature or high temperature (e.g., approximately +25°C to +180°C).
如圖1所示,燒入腔室11具有由絕熱壁等區隔並且可收容燒入板20的恆溫室111、以及可開關恆溫室111的門112。在此恆溫室111中,設置有複數個用以保持燒入板20的槽113。各個插槽113具有支持燒入板20左右兩端的一對導軌114。燒入板20在此軌道114上滑動的同時,介由門112而被搬入於恆溫室111內。在恆溫室111內,24個槽113設置有兩列,總共可收容48個燒入板20。As shown in Figure 1, the firing chamber 11 comprises a constant temperature chamber 111, partitioned by insulating walls and other elements, that accommodates the firing panels 20, and a door 112 that allows the constant temperature chamber 111 to be opened and closed. This constant temperature chamber 111 is provided with a plurality of slots 113 for holding the firing panels 20. Each slot 113 has a pair of rails 114 that support the left and right ends of the firing panel 20. The firing panel 20 slides on these rails 114 while being moved into the constant temperature chamber 111 through the door 112. Within the constant temperature chamber 111, 24 slots 113 are arranged in two rows, accommodating a total of 48 firing panels 20.
另外,在同圖中,一個門(圖中右側的門)並未圖示,而圖示了恆溫室111為開放的狀態。相對於此,另一個門112(圖中左側的門)圖示為關閉的狀態,伴隨於此,圖中左側的24個槽113並未圖示。另外,槽113的數量以及配置(即,在恆溫室111內的燒入板20的收容數量以及位置關係)不限於圖1所示的例子,並且可以考慮測試效率而任意設定。In the figure, one door (the door on the right) is not shown, showing constant temperature chamber 111 open. In contrast, the other door 112 (the door on the left) is shown closed, and accordingly, the 24 slots 113 on the left are not shown. The number and arrangement of slots 113 (i.e., the number and positional relationship of burn-in plates 20 within constant temperature chamber 111) are not limited to the example shown in Figure 1 and can be arbitrarily set based on testing efficiency.
此外,燒入腔室11包括由蒸發器116、加熱器117、以及風扇118所構成的溫度調整裝置,可以藉由此溫度調整裝置調整恆溫室111內的溫度。具體而言,恆溫室111內的空氣經由藉由風扇118沿著圖1所示的箭頭方向送風而循環的同時,藉由蒸發器116而被冷卻,並且藉由加熱器117而被加熱,從而進行恆溫室111內的溫度調整。Furthermore, the burning chamber 11 includes a temperature control device comprising an evaporator 116, a heater 117, and a fan 118. This temperature control device can be used to adjust the temperature within the constant temperature chamber 111. Specifically, the air within the constant temperature chamber 111 is circulated by the fan 118 in the direction of the arrows shown in FIG. 1 , while being cooled by the evaporator 116 and heated by the heater 117, thereby regulating the temperature within the constant temperature chamber 111.
如圖2所示,恆溫室111的內部設置有溫度感測器119,用於測定恆溫室111內部的溫度。又,燒入裝置1包括進行燒入裝置1整體的控制的控制裝置80。溫度感測器119電性連接於控制裝置80,溫度感測器119的偵測訊號向控制裝置80輸出。蒸發器116、加熱器117、以及風扇118的動作藉由控制裝置80對應於以溫度感測器119檢測的恆溫室111內的溫度而控制。As shown in Figure 2, a temperature sensor 119 is installed inside the constant temperature chamber 111 to measure the temperature inside the constant temperature chamber 111. Furthermore, the burning apparatus 1 includes a control device 80 that controls the entire burning apparatus 1. The temperature sensor 119 is electrically connected to the control device 80, and a detection signal from the temperature sensor 119 is output to the control device 80. The operation of the evaporator 116, heater 117, and fan 118 is controlled by the control device 80 in response to the temperature inside the constant temperature chamber 111 detected by the temperature sensor 119.
在區隔恆溫室111的燒入腔室11的壁115中,背面側的壁115a包括將絕熱室30與燒入腔室11隔開的頂板40。從燒入腔室11的正面觀察時,頂板40配置在各槽113的裏側。頂板40是包括基板41、以及設置在基板41的一個主表面的連接器42的配線板,並且此連接器42可以與插入於槽113的燒入板20的連接器23嵌合。藉由連接器23與連接器42嵌合,燒入板20與頂板40電性連接。Among the walls 115 that separate the firing chamber 11 from the constant temperature chamber 111, the back wall 115a includes a top plate 40 that separates the insulating chamber 30 from the firing chamber 11. When viewed from the front of the firing chamber 11, the top plate 40 is positioned inside each slot 113. The top plate 40 is a wiring board that includes a substrate 41 and a connector 42 provided on one main surface of the substrate 41. This connector 42 can be mated with the connector 23 of the firing board 20 inserted into the slot 113. The mating of the connector 23 and the connector 42 electrically connects the firing board 20 to the top plate 40.
又,在頂板40,與設置有連接器42的面相反側的面設置有連接器43。此連接器43可以與後述的功能板50的連接器52嵌合。藉由連接器43與連接器52嵌合,頂板40與功能板50電性連接。Furthermore, a connector 43 is provided on the top panel 40 on the side opposite to the side provided with the connector 42. This connector 43 can be mated with a connector 52 of a function board 50 described later. By mating the connector 43 with the connector 52, the top panel 40 and the function board 50 are electrically connected.
如圖2以及圖3所示,絕熱室30是由燒入腔室11的壁115a以及壁60區隔的大致長方體狀的空間。絕熱室30藉由頂板40而與燒入腔室11的恆溫室111隔開,並且藉由壁60而與外部空氣隔開。在本實施形態中,凹部115b形成在壁115a的一部分,凹部115b朝向恆溫室111的內側(從圖2中的右側朝向左側)凹陷。凹部115b的底面由頂板40構成。壁60是由SUS等的金屬材料構成的板狀構件,設置為與頂板40對向而位於凹部115b的內部。在本實施形態中,由壁115a的凹部115b與壁60劃分出的空間被用作為絕熱室30。從後述的乾燥空氣供給裝置70向絕熱室30供給乾燥空氣。As shown in Figures 2 and 3, the insulating chamber 30 is a roughly rectangular space partitioned by the wall 115a and the wall 60 of the firing chamber 11. The insulating chamber 30 is separated from the constant temperature chamber 111 of the firing chamber 11 by the top plate 40, and is separated from the outside air by the wall 60. In this embodiment, a recess 115b is formed in a portion of the wall 115a, and the recess 115b is recessed toward the inner side of the constant temperature chamber 111 (from the right side to the left side in Figure 2). The bottom surface of the recess 115b is formed by the top plate 40. The wall 60 is a plate-shaped member made of a metal material such as SUS, and is provided so as to face the top plate 40 and be located inside the recess 115b. In this embodiment, the space defined by the recessed portion 115b of the wall 115a and the wall 60 is used as the insulating chamber 30. Dry air is supplied to the insulating chamber 30 from a dry air supply device 70 described later.
另外,在本實施形態中,雖然壁60位於壁115a的凹部115b的內部,但並未特別限定於此。例如,壁60的主表面可以大於凹部115b的開口,並且壁60可以附接到燒入腔室11的壁115a的外側以覆蓋凹部115b。又,構成壁60的材料也並未特別限定於上述材料,例如,也可以由樹脂材料構成壁60。In this embodiment, although the wall 60 is located within the recess 115b of the wall 115a, this is not particularly limiting. For example, the main surface of the wall 60 may be larger than the opening of the recess 115b, and the wall 60 may be attached to the outside of the wall 115a of the firing chamber 11 to cover the recess 115b. Furthermore, the material constituting the wall 60 is not particularly limited to the materials described above; for example, the wall 60 may also be formed of a resin material.
如圖4所示,在壁60形成有開口61,功能板50介由此開口61而進入絕熱室30的內側。雖然並未特別限定,開口61的數量設置為與燒入板20以及功能板50的數量相同。As shown in FIG4 , the wall 60 is formed with an opening 61 through which the functional panel 50 enters the inner side of the insulating chamber 30. Although not particularly limited, the number of the openings 61 is set to be the same as the number of the burning panel 20 and the functional panel 50.
功能板(測試器板)50是包括基板51、連接器52、以及控制電路53的配線板。功能板50將電壓以及訊號輸入到裝配在燒入板20的DUT100。The function board (tester board) 50 is a wiring board including a substrate 51, a connector 52, and a control circuit 53. The function board 50 inputs voltage and signals to the DUT 100 mounted on the burn-in board 20.
如圖4所示,功能板50的一部分(第一部分P1)介由壁60的開口61而進入絕熱室30的內部,並且功能板50的連接器52與頂板40的連接器43嵌合。藉由連接器52與連接器43嵌合,功能板50與頂板40電性連接。如圖2所示,控制電路53安裝在基板51,並且控制輸入到燒入板20的電壓以及訊號。控制電路53與控制裝置80電性連接,並且由控制裝置80控制。As shown in Figure 4 , a portion (first portion P1) of the function board 50 enters the interior of the insulating chamber 30 through the opening 61 of the wall 60 , and the connector 52 of the function board 50 engages with the connector 43 of the top plate 40 . With the connector 52 engaged with the connector 43, the function board 50 and the top plate 40 are electrically connected. As shown in Figure 2 , the control circuit 53 is mounted on the substrate 51 and controls the voltage and signals input to the burning plate 20 . The control circuit 53 is electrically connected to the control device 80 and is controlled by the control device 80 .
如圖4所示,在壁60設置有密封構件62,密封構件62將開口61與功能板50之間的間隙密封。作為構成密封構件62的材料並未特別限定,例如可以例示出矽橡膠等的樹脂材料。藉由設置密封構件62,可以進一步達成恆溫室111與外部空氣的絕熱。As shown in Figure 4 , a sealing member 62 is provided on the wall 60 to seal the gap between the opening 61 and the functional board 50. The material constituting the sealing member 62 is not particularly limited; for example, a resin material such as silicone rubber can be used. The provision of the sealing member 62 further insulates the constant temperature chamber 111 from the outside air.
燒入裝置1包括將功能板50冷卻的風扇90。雖然並未特別限定,風扇90設置在殼體91,殼體91設置鄰接於燒入腔室11並且支持複數個功能板50(參考圖2)。風扇90在燒入測試時始終運轉,並且送風到功能板50的第二部分P2中的基板51而冷卻功能板50。風扇90的位置並未特別限定於此,例如,風扇90可以設置在功能板50的基板51上。The burn-in apparatus 1 includes a fan 90 for cooling the functional boards 50. While not specifically limited, the fan 90 is housed in a housing 91 adjacent to the burn-in chamber 11 and supporting the plurality of functional boards 50 (see FIG. 2 ). The fan 90 operates continuously during the burn-in test, supplying air to the base plate 51 in the second portion P2 of the functional board 50 to cool the functional board 50. The location of the fan 90 is not particularly limited; for example, the fan 90 may be located on the base plate 51 of the functional board 50.
回到圖2,燒入裝置1更包括乾燥空氣供給裝置70。乾燥空氣供給裝置70介由供給路徑71而連接於絕熱室30,並且在燒入測試時向絕熱室30供給乾燥空氣。Returning to FIG. 2 , the burn-in apparatus 1 further includes a dry air supply device 70 . The dry air supply device 70 is connected to the insulating chamber 30 via a supply path 71 and supplies dry air to the insulating chamber 30 during the burn-in test.
雖然並未特別限定,由乾燥空氣供給裝置70供給的乾燥空氣的溫度為常溫(25℃)。雖然並未特別限定,在燒入測試時,始終向絕熱室30供給定量的乾燥空氣。藉由向絕熱室30供給乾燥空氣,降低絕熱室30內的露點,並且可以抑制絕熱室30內以及功能板50上產生結露。雖然並未特別限定,乾燥空氣的大氣壓力下的露點溫度為-50℃以下,為-70℃以下較佳。Although not specifically limited, the dry air supplied by the dry air supply device 70 is at room temperature (25°C). Although not specifically limited, a constant amount of dry air is always supplied to the adiabatic chamber 30 during the burn-in test. Supplying dry air to the adiabatic chamber 30 lowers the dew point within the adiabatic chamber 30 and suppresses condensation within the adiabatic chamber 30 and on the functional panel 50. Although not specifically limited, the dew point temperature of the dry air under atmospheric pressure is below -50°C, preferably below -70°C.
加熱裝置72介由供給路徑71而連接到乾燥空氣供給裝置70。即,加熱裝置72設置在連接乾燥空氣供給裝置70與絕熱室30的供給路徑71。經由利用此加熱裝置72加熱乾燥空氣,可以將供給到絕熱室30的乾燥空氣的溫度從常溫在150℃的範圍內調整。藉由向絕熱室30供給加熱後的乾燥空氣,降低絕熱室30內的露點,並且可以加熱功能板50(特別是進入絕熱室30內的第一部分P1)。由此,即使在恆溫室111為低溫的情況下,也可以抑制在絕熱室30內以及功能板50上產生結露。The heating device 72 is connected to the dry air supply device 70 via the supply path 71. Specifically, the heating device 72 is located in the supply path 71 connecting the dry air supply device 70 and the insulating chamber 30. By heating the dry air using the heating device 72, the temperature of the dry air supplied to the insulating chamber 30 can be adjusted from a normal temperature within the range of 150°C. By supplying heated dry air to the insulating chamber 30, the dew point within the insulating chamber 30 is lowered, and the functional panel 50 (particularly the first portion P1 entering the insulating chamber 30) can be heated. This prevents condensation from forming within the insulating chamber 30 and on the functional panel 50, even when the constant temperature chamber 111 is low.
乾燥空氣供給裝置70及加熱裝置72分別電性連接到控制裝置80,並且由控制裝置80控制。另外,雖然在圖2中乾燥空氣供給裝置70與加熱裝置72分別地被圖示,但是並未特別限定於此,乾燥空氣供給裝置70與加熱裝置72可以是一體的裝置。The dry air supply device 70 and the heating device 72 are each electrically connected to a control device 80 and controlled by the control device 80. Furthermore, although the dry air supply device 70 and the heating device 72 are shown separately in FIG. 2 , this is not particularly limiting, and the dry air supply device 70 and the heating device 72 may be a single integrated device.
控制裝置80例如由電腦構成。雖然並未特別圖示,此電腦是包括CPU(處理器)、主儲存裝置(RAM等)、輔助儲存裝置(硬碟、SSD等)、以及介面等的電子計算機。以下說明的控制例如經由此控制裝置80實行程式而功能性地實現。另外,此控制裝置80也可以取代電腦而由電路基板構成。The control device 80 is comprised of, for example, a computer. Although not specifically illustrated, this computer is an electronic computer that includes a CPU (processor), primary storage (RAM, etc.), secondary storage (hard drive, SSD, etc.), and an interface. The control described below is functionally implemented, for example, by executing programs in the control device 80. Alternatively, the control device 80 may be comprised of a circuit board instead of a computer.
除了對DUT100的施加電壓、施加訊號的控制以及恆溫室111內的溫度調整的控制之外,控制裝置80將在燒入測試期間具有異常反應的DUT100判斷為缺陷品,儲存此DUT100的序號(例如與槽113的號碼以及燒入板20上的位置對應者),而回饋測試結果。In addition to controlling the applied voltage and signal to the DUT 100 and the temperature adjustment within the constant temperature chamber 111, the control device 80 determines that a DUT 100 with an abnormal response during the burn-in test is a defective product, stores the serial number of the DUT 100 (e.g., corresponding to the number of the slot 113 and the position on the burn-in board 20), and feeds back the test results.
又,控制裝置80對應恆溫室111的溫度而如下控制乾燥空氣供給裝置70以及加熱裝置72。Furthermore, the control device 80 controls the dry air supply device 70 and the heating device 72 as follows according to the temperature of the constant temperature chamber 111.
即,在以溫度感測器119測定的恆溫室111內的溫度Tc在所定溫度T1以上的情況下(Tc≥T1),控制裝置80判斷恆溫室111內的溫度為高溫,並且控制乾燥空氣供給裝置70以及加熱裝置72,以向絕熱室30供給常溫的乾燥空氣。即,在這種情況下,控制裝置80控制乾燥空氣供給裝置70以及加熱裝置72,以將乾燥空氣從乾燥空氣供給裝置70供給到絕熱室30,但是不加熱此乾燥空氣。Specifically, when the temperature Tc within constant temperature chamber 111 measured by temperature sensor 119 is higher than predetermined temperature T1 (Tc ≥ T1), control device 80 determines that the temperature within constant temperature chamber 111 is high and controls dry air supply device 70 and heating device 72 to supply dry air at room temperature to insulating chamber 30. Specifically, in this case, control device 80 controls dry air supply device 70 and heating device 72 to supply dry air from dry air supply device 70 to insulating chamber 30 without heating the dry air.
另一方面,在以溫度感測器119測定的恆溫室111內的溫度Tc小於所定溫度T1的情況下(Tc<T1),控制裝置80判斷恆溫室111內的溫度為低溫,並且控制乾燥空氣供給裝置70以及加熱裝置72,以向絕熱室30供給加熱的乾燥空氣。即,在這種情況下,控制裝置80控制乾燥空氣供給裝置70以及加熱裝置72,以將乾燥空氣從乾燥空氣供給裝置70供給到絕熱室30,並且加熱此乾燥空氣。On the other hand, if the temperature Tc within constant temperature chamber 111 measured by temperature sensor 119 is less than predetermined temperature T1 (Tc < T1), control device 80 determines that the temperature within constant temperature chamber 111 is low and controls dry air supply device 70 and heating device 72 to supply heated dry air to insulating chamber 30. Specifically, in this case, control device 80 controls dry air supply device 70 and heating device 72 to supply dry air from dry air supply device 70 to insulating chamber 30 and heat the dry air.
雖然並未特別限定,上述的所定溫度T1為0℃以下的溫度(T1≤0℃),為-5℃以下較佳,為-10℃以下更佳。作為加熱後的乾燥空氣的溫度T2的一例,例如,為40℃以上(T2≥40℃)。另外,加熱後的乾燥空氣的溫度T2比常溫高的話,並未特別限定於上述,可以對應於恆溫室111內的溫度而適當調整。這樣,藉由將對應於恆溫室111內的溫度Tc而被適切地溫度調整的乾燥空氣供給到絕熱室30,控制絕熱室30內的露點,可以加溫功能板50,並且可以進一步抑制絕熱室30內以及功能板50上產生結露。Although not particularly limited, the predetermined temperature T1 is a temperature below 0°C (T1≤0°C), preferably below -5°C, and more preferably below -10°C. As an example of the temperature T2 of the heated dry air, for example, it is above 40°C (T2≥40°C). In addition, if the temperature T2 of the heated dry air is higher than the normal temperature, it is not particularly limited to the above, and can be appropriately adjusted corresponding to the temperature in the constant temperature chamber 111. In this way, by supplying dry air whose temperature is appropriately adjusted corresponding to the temperature Tc in the constant temperature chamber 111 to the insulating chamber 30, the dew point in the insulating chamber 30 is controlled, the functional panel 50 can be heated, and condensation in the insulating chamber 30 and on the functional panel 50 can be further suppressed.
又,在高溫的熱應力施加到DUT100的情況下,可以將冷卻的乾燥空氣供給到絕熱室30。即,在恆溫室111內的溫度Tc為100℃以上(Tc≥100℃)的情況下,可以將冷卻的乾燥空氣供給到絕熱室30。作為冷卻的乾燥空氣的溫度T3的一例,例如為-10℃以下(T3≤-10℃)。Furthermore, when high-temperature thermal stress is applied to the DUT 100, cooled dry air can be supplied to the insulating chamber 30. Specifically, when the temperature Tc within the constant-temperature chamber 111 is 100°C or higher (Tc ≥ 100°C), cooled dry air can be supplied to the insulating chamber 30. An example of the temperature T3 of the cooled dry air is -10°C or lower (T3 ≤ -10°C).
如上所述,在本實施形態的燒入裝置1中,不使用用於將燒入板20與功能板50連接的中繼板、中繼電纜等,並且燒入板20與功能板50介由頂板40以及連接器23、42、43、52而連接。因此,無需在裝置內設置用於收容中繼板、中繼電纜的空間,並且可以增加燒入裝置1的每單位占有面積的DUT100的測定數量。As described above, the burn-in apparatus 1 of this embodiment does not use relay boards or relay cables to connect the burn-in board 20 and the functional board 50. Instead, the burn-in board 20 and the functional board 50 are connected via the top board 40 and connectors 23, 42, 43, and 52. Therefore, there is no need to provide space within the apparatus to accommodate relay boards or relay cables, and the number of DUTs 100 that can be measured per unit area occupied by the burn-in apparatus 1 can be increased.
又,在本實施形態中,不介由中繼板、中繼電纜而將燒入板20與功能板50電性連接,並且由於燒入板20與功能板50之間的通訊路徑比包括中繼板等的習知的燒入裝置短,所以可以降低從功能板50往燒入板20的訊號的傳輸損失。In addition, in this embodiment, the burn-in board 20 and the functional board 50 are electrically connected without the intervention of a relay board or a relay cable, and since the communication path between the burn-in board 20 and the functional board 50 is shorter than that of a known burn-in device including a relay board, the transmission loss of the signal from the functional board 50 to the burn-in board 20 can be reduced.
又,在本實施形態中,藉由向絕熱室30供給加熱的乾燥空氣,加溫功能板50,並且可以進一步抑制功能板50上產生結露。因此,在本實施形態中,即使功能板50構成為功能板50的一部分(P1)進入絕熱室30,而不使用將燒入板20與功能板50中繼的其他構件,也可以抑制功能板50上產生結露。這樣,在本實施形態中,省略了將燒入板20與功能板50中繼的其他構件,而減小了燒入裝置1的裝置尺寸,並且,可以抑制功能板50上產生結露。Furthermore, in this embodiment, by supplying heated dry air to the insulating chamber 30, the functional board 50 is heated, and condensation on the functional board 50 can be further suppressed. Therefore, in this embodiment, even if the functional board 50 is configured as a portion (P1) of the functional board 50 that enters the insulating chamber 30, and no other component is used to connect the burning plate 20 and the functional board 50, condensation on the functional board 50 can be suppressed. In this way, in this embodiment, by omitting other components to connect the burning plate 20 and the functional board 50, the device size of the burning device 1 is reduced, and condensation on the functional board 50 can be suppressed.
另外,以上說明的實施形態是為了便於理解本發明而記載的,而不是為了限定本發明而記載的。因此,上述的實施形態所揭露的各元件旨在包括落入本發明的技術範圍內的所有設計變化以及均等物。In addition, the embodiments described above are recorded to facilitate understanding of the present invention, rather than to limit the present invention. Therefore, the various elements disclosed in the embodiments described above are intended to include all design variations and equivalents that fall within the technical scope of the present invention.
1:燒入裝置 11:燒入腔室 20:燒入板 21,41,51:基板 22:插座 23,42,43,52:連接器 30:絕熱室 40:頂板 50:功能板 53:控制電路 60,115,115a:壁 61:開口 62:密封構件 70:乾燥空氣供給裝置 71:供給路徑 72:加熱裝置 80:控制裝置 90,118:風扇 91:殼體 100:被測試電子部件/DUT 111:恆溫室 112:門 113:槽 114:導軌 115b:凹部 116:蒸發器 117:加熱器 119:溫度感測器 P1:第一部分 P2:第二部分 1: Burning device 11: Burning chamber 20: Burning plate 21, 41, 51: Baseboard 22: Socket 23, 42, 43, 52: Connector 30: Insulated chamber 40: Top plate 50: Function board 53: Control circuit 60, 115, 115a: Wall 61: Opening 62: Sealing member 70: Dry air supply device 71: Supply path 72: Heating device 80: Control device 90, 118: Fan 91: Housing 100: Electronic component under test/DUT 111: Constant temperature chamber 112: Door 113: Slot 114: Guide rail 115b: Recess 116: Evaporator 117: Heater 119: Temperature sensor P1: First section P2: Second section
圖1是示出本發明實施形態的燒入裝置的前視圖。 圖2是本發明實施形態的燒入裝置的側剖面圖。 圖3是對應於圖2的III-III部分的圖。 圖4是對應於圖2的IV部分的放大圖。 Figure 1 is a front view of a burning device according to an embodiment of the present invention. Figure 2 is a side sectional view of the burning device according to an embodiment of the present invention. Figure 3 is a view corresponding to the III-III portion of Figure 2. Figure 4 is an enlarged view corresponding to the IV portion of Figure 2.
11:燒入腔室 20:燒入板 21,41,51:基板 22:插座 23,42,43,52:連接器 30:絕熱室 40:頂板 50:功能板 53:控制電路 60,115,115a:壁 61:開口 70:乾燥空氣供給裝置 71:供給路徑 72:加熱裝置 80:控制裝置 90:風扇 91:殼體 100:被測試電子部件/DUT 111:恆溫室 115b:凹部 119:溫度感測器 11: Burning chamber 20: Burning plate 21, 41, 51: Baseboard 22: Socket 23, 42, 43, 52: Connector 30: Insulated chamber 40: Top plate 50: Function board 53: Control circuit 60, 115, 115a: Wall 61: Opening 70: Dry air supply unit 71: Supply path 72: Heating unit 80: Control unit 90: Fan 91: Housing 100: Electronic component under test/DUT 111: Constant temperature chamber 115b: Recess 119: Temperature sensor
Claims (9)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023123639A JP2025019811A (en) | 2023-07-28 | 2023-07-28 | Burn-in Equipment |
| JP2023-123639 | 2023-07-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202519886A TW202519886A (en) | 2025-05-16 |
| TWI901112B true TWI901112B (en) | 2025-10-11 |
Family
ID=94435414
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW113116809A TWI901112B (en) | 2023-07-28 | 2024-05-07 | Burn-in device |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2025019811A (en) |
| KR (1) | KR20250018079A (en) |
| CN (1) | CN119438741A (en) |
| TW (1) | TWI901112B (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200632346A (en) * | 2005-02-15 | 2006-09-16 | Advantest Corp | Burn-in apparatus |
| TW202305379A (en) * | 2021-07-21 | 2023-02-01 | 日商阿德潘鐵斯特股份有限公司 | Test carrier and electronic component testing apparatus |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7441192B2 (en) | 2021-03-10 | 2024-02-29 | エスペック株式会社 | burn-in equipment |
-
2023
- 2023-07-28 JP JP2023123639A patent/JP2025019811A/en active Pending
-
2024
- 2024-05-07 TW TW113116809A patent/TWI901112B/en active
- 2024-05-24 CN CN202410653565.3A patent/CN119438741A/en active Pending
- 2024-05-30 KR KR1020240070528A patent/KR20250018079A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200632346A (en) * | 2005-02-15 | 2006-09-16 | Advantest Corp | Burn-in apparatus |
| TW202305379A (en) * | 2021-07-21 | 2023-02-01 | 日商阿德潘鐵斯特股份有限公司 | Test carrier and electronic component testing apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202519886A (en) | 2025-05-16 |
| JP2025019811A (en) | 2025-02-07 |
| CN119438741A (en) | 2025-02-14 |
| KR20250018079A (en) | 2025-02-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI405970B (en) | Interface elements, test unit and electronic components test device | |
| US4374317A (en) | Burn-in chamber | |
| US7650762B2 (en) | Cooling air flow control valve for burn-in system | |
| JP2007525672A (en) | Equipment and method for energization test | |
| TWI892751B (en) | Testing apparatus and method of testing one or more electronic devices | |
| US20090082907A1 (en) | Mechanically isolated environmental test chamber | |
| CN102236071A (en) | Test apparatus and connection device | |
| US5385487A (en) | Apparatus for electrically operating devices in a controlled environment | |
| US7457117B2 (en) | System for controlling the temperature of electronic devices | |
| US20240302451A1 (en) | Method and system for thermal control of devices in an electronics tester | |
| JP6124770B2 (en) | Test apparatus and secondary battery evaluation method | |
| KR20000048926A (en) | Modular, Semicanductor Reliability Test System | |
| TWI901112B (en) | Burn-in device | |
| CN101852551A (en) | Furnaces for high temperature testing of electronic components | |
| US6154042A (en) | Uniform temperature environmental testing apparatus for semiconductor devices | |
| CN108895874A (en) | A kind of cooling device for proton beam irradiation experiment test target | |
| JP5747697B2 (en) | Test apparatus, test method and test board | |
| KR101013520B1 (en) | Test Handler Chamber Rapid Temperature Control | |
| CN118033186A (en) | Wafer-level aging test fixture and wafer-level aging test device | |
| JP2020118475A (en) | Burn-in board and burn-in equipment | |
| KR20090126084A (en) | Cold Chamber of Semiconductor Inspection Equipment | |
| CN114660430A (en) | Apparatus and method for testing objects in dry gas environment | |
| KR100904747B1 (en) | Test apparatus and heating / cooling method of test components using the same | |
| JPH03188383A (en) | Heating tester for semiconductor element | |
| KR20210124666A (en) | Heater system for burn-in inspection of semiconductor devices |