TWI900096B - Apparatus and method for treating polishing slurry - Google Patents
Apparatus and method for treating polishing slurryInfo
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本發明涉及化學機械研磨領域使用的研磨漿;特別是指一種研磨漿的處理裝置及處理方法。The present invention relates to a grinding slurry used in the field of chemical mechanical grinding; in particular, to a grinding slurry processing device and processing method.
化學機械研磨技術廣泛應用在對晶圓片的研磨加工,主要選擇應用研磨墊配合研磨漿執行,其中設有該研磨墊的研磨盤面向著晶圓片,該研磨墊與該晶圓片的表面接觸,該研磨墊與該晶圓片相對運動的同時,對該研磨墊與該晶圓片之間供應該研磨漿,完成對該晶圓片的研磨加工。Chemical mechanical polishing (CMP) is widely used in wafer polishing. It primarily involves the use of a polishing pad and a polishing slurry. A grinding disc, equipped with the polishing pad, faces the wafer, contacting the surface of the wafer. As the pad and wafer move relative to each other, the polishing slurry is fed between them to complete the polishing process.
該研磨漿主要由原液加入適當比例的研磨粒構成,其中該原液係由化學成分構成的濃縮液混合稀釋液調製構成,研磨加工進行時,該研磨粒削除該晶圓片形成研磨作用,該研磨粒的粒徑直接影響該晶圓片被該研磨粒削除的量,控制構成該研磨漿的各該研磨粒的粒徑範圍,有助於控制該晶圓片被研磨後的表面平面度,但是,加入該原液的多數個該研磨粒,其中不乏粒徑過大或過小的該研磨粒,若能使該研磨漿的各該研磨粒的粒徑分布跨度趨於均質化,有助於提高研磨加工的品質。The polishing slurry is mainly composed of a stock solution with abrasive grains added in an appropriate proportion, wherein the stock solution is composed of a concentrated liquid mixed with a diluent composed of chemical components. During the polishing process, the abrasive grains remove the wafer to form a polishing effect. The particle size of the abrasive grains directly affects the amount of the wafer removed by the abrasive grains. Controlling the particle size range of each abrasive grain that constitutes the polishing slurry helps to control the surface flatness of the wafer after polishing. However, among the majority of the abrasive grains added to the stock solution, some have particle sizes that are too large or too small. If the particle size distribution span of each abrasive grain in the polishing slurry can be made more uniform, it will help to improve the quality of the polishing process.
本發明之主要目的,在於提供一種研磨漿的處理裝置及處理方法。The main purpose of the present invention is to provide a grinding slurry processing device and processing method.
為達到前述目的,本發明採用以下技術方案:To achieve the aforementioned objectives, the present invention adopts the following technical solutions:
一種研磨漿的處理裝置,包括一過濾單元、一滲透單元、一傳輸管路及一控制單元,其中該傳輸管路連接該過濾單元及該滲透單元,該控制單元主要由電子電路構成,該控制單元耦接該過濾單元及該滲透單元,據此控制該過濾單元及該滲透單元;A grinding slurry processing device includes a filter unit, a permeation unit, a transmission pipeline, and a control unit, wherein the transmission pipeline connects the filter unit and the permeation unit, and the control unit is mainly composed of an electronic circuit. The control unit is coupled to the filter unit and the permeation unit to control the filter unit and the permeation unit accordingly.
該過濾單元用於過濾來自於外部的研磨漿來源的研磨漿,移除該研磨漿所含有粒徑大於第一尺寸的多個第一粒子,並通過該傳輸管路對該滲透單元傳送過濾處理後的該研磨漿;The filtering unit is used to filter the grinding slurry from an external grinding slurry source, remove a plurality of first particles with a particle size larger than a first size contained in the grinding slurry, and transmit the filtered grinding slurry to the permeation unit through the transmission pipeline;
該滲透單元,包括一滲透器,其中該滲透器的內部設有一滲透膜,一第一通道位於該滲透膜的一側,一第二通道位於該滲透膜的另一側,該第一通道的一端連通一第一管路,該第一管路連通該傳輸管路,該第一通道的另一端連通一第二管路,該第二管路用於連通一外部的儲存槽,該第二通道的一端連通一第三管路,該第三管路用於連通一外部的原液供應源,該第二通道的另一端連通一第四管路,該第四管路用於連通一外部的收容槽;The permeation unit includes a permeator, wherein a permeation membrane is provided inside the permeator, a first channel is located on one side of the permeation membrane, and a second channel is located on the other side of the permeation membrane. One end of the first channel is connected to a first pipeline, which is connected to the transmission pipeline. The other end of the first channel is connected to a second pipeline, which is used to connect to an external storage tank. One end of the second channel is connected to a third pipeline, which is used to connect to an external raw liquid supply source. The other end of the second channel is connected to a fourth pipeline, which is used to connect to an external storage tank.
據此,該研磨漿由該第一管路通過該第一通道進入該第二管路,該研磨漿所含粒徑小於第二尺寸的多個第二粒子滲透通過該滲透膜進入該第二通道,該原液供應源供應原液由該第三管路通過該第二通道進入該第四管道,並帶引進入該第二通道的各該第二粒子通過該第四管路進入該收容槽。Accordingly, the grinding slurry enters the second pipeline from the first pipeline through the first channel, and multiple second particles with a particle size smaller than the second size contained in the grinding slurry permeate through the permeable membrane and enter the second channel. The raw liquid supply source supplies raw liquid from the third pipeline through the second channel into the fourth pipeline, and leads each of the second particles entering the second channel into the receiving tank through the fourth pipeline.
一種處理方法,其係使用如前所述之研磨漿的處理裝置執行,包括依序執行的下列步驟:A processing method, which is performed using the grinding slurry processing device as described above, comprises the following steps performed in sequence:
導入研磨漿:自該研磨漿來源導引該研磨漿進入該過濾單元;Introducing grinding slurry: guiding the grinding slurry from the grinding slurry source into the filtering unit;
篩選過濾:該過濾單元篩選過濾該研磨漿,移除該研磨漿所含有的粒徑大於該第一尺寸的多個該第一粒子;Screening and filtering: the filtering unit screens and filters the grinding slurry to remove the first particles with a particle size larger than the first size contained in the grinding slurry;
滲透移除:通過該篩選過濾步驟的該研磨漿引入該滲透單元,至少移除該研磨漿所含有的一部分的該第二粒子,據使該研磨漿主要含有粒徑介於該第一尺寸及該第二尺寸之間的第三粒子,從而獲得粒徑跨度均質化的該研磨漿。Osmotic removal: The milled slurry that has passed the screening and filtration step is introduced into the osmotic unit to remove at least a portion of the second particles contained in the milled slurry, so that the milled slurry mainly contains third particles with a particle size between the first size and the second size, thereby obtaining the milled slurry with a homogenized particle size span.
本發明之主要效果與優點,係能夠自該研磨漿移除粒徑大於該第一尺寸的該第一粒子,並自該研磨漿90移除大部分或全部的該第二粒子,使得該研磨漿的該研磨粒的粒徑分布跨度趨於均質化,從而提高應用該研磨漿執行化學機械研磨製程的研磨加工品質,且本發明能夠用於處理調製完成的該研磨漿,也可以用於處理研磨製程中回收含有切屑的該研磨漿。The main effects and advantages of the present invention are that it can remove the first particles having a particle size larger than the first size from the grinding slurry and remove most or all of the second particles from the grinding slurry 90, so that the particle size distribution span of the abrasive particles in the grinding slurry tends to be homogenized, thereby improving the grinding process quality of the chemical mechanical grinding process performed using the grinding slurry. In addition, the present invention can be used to process the prepared grinding slurry and can also be used to process the grinding slurry containing chips recovered during the grinding process.
圖式所示係本發明之較佳實施例,惟此等實施例僅供說明使用,在專利申請上並不受此結構之限制。The drawings show preferred embodiments of the present invention, but these embodiments are for illustrative purposes only and are not intended to limit the scope of the invention in patent applications.
如圖1至圖3所示,本發明之研磨漿的處理裝置,包括一過濾單元10、一滲透單元20、一傳輸管路30及一控制單元40,其中該傳輸管路30連接該過濾單元10及該滲透單元20,該控制單元40主要由電子電路構成,該控制單元40耦接該過濾單元10及該滲透單元20,據此控制該過濾單元10及該滲透單元20。As shown in Figures 1 to 3, the grinding slurry processing device of the present invention includes a filter unit 10, a permeation unit 20, a transmission pipeline 30 and a control unit 40, wherein the transmission pipeline 30 connects the filter unit 10 and the permeation unit 20, and the control unit 40 is mainly composed of an electronic circuit. The control unit 40 couples the filter unit 10 and the permeation unit 20 to control the filter unit 10 and the permeation unit 20 accordingly.
該過濾單元10用於過濾來自於外部的研磨漿來源(圖未繪示)的研磨漿90,移除該研磨漿90所含有粒徑大於第一尺寸的多個第一粒子(圖未繪示),並通過該傳輸管路30對該滲透單元20傳送過濾處理後的該研磨漿90,該過濾單元10係本發明所屬領域人士能夠直接且無歧異地應用的先前技術,且該過濾單元10與本發明的技術特徵並無必然關聯,恕不詳述該過濾單元10的具體構成。The filter unit 10 is used to filter grinding slurry 90 from an external grinding slurry source (not shown), remove a plurality of first particles (not shown) having a particle size larger than a first size contained in the grinding slurry 90, and transmit the filtered grinding slurry 90 to the permeation unit 20 via the transmission line 30. The filter unit 10 is a prior art that can be directly and unambiguously applied by those skilled in the art to which the present invention pertains, and is not necessarily related to the technical features of the present invention. The specific structure of the filter unit 10 will not be described in detail.
該滲透單元20,包括一滲透器21,其中該滲透器21的內部設有一滲透膜22,一第一通道23位於該滲透膜22的一側,一第二通道24位於該滲透膜22的另一側,本例中,該滲透膜22呈管狀結構,且該滲透膜22環狀圍繞該第一通道23的徑向外周,該第二通道24環繞該滲透膜22的徑向外部。The permeation unit 20 includes a permeabilizer 21, wherein a permeabilizer 21 is provided with a permeable membrane 22 inside. A first channel 23 is located on one side of the permeable membrane 22, and a second channel 24 is located on the other side of the permeable membrane 22. In this example, the permeable membrane 22 has a tubular structure and annularly surrounds the radial periphery of the first channel 23, and the second channel 24 surrounds the radial exterior of the permeable membrane 22.
該第一通道23的一端連通一第一管路25,該第一管路25連通該傳輸管路30,該第一通道23的另一端連通一第二管路26,該第二管路26用於連通一外部的儲存槽(圖未繪示),該第二通道24的一端連通一第三管路27,該第三管路27用於連通一外部的原液供應源(圖未繪示),該第二通道24的另一端連通一第四管路28,該第四管路28用於連通一外部的收容槽(圖未繪示)。One end of the first channel 23 is connected to a first pipeline 25, which is connected to the transmission pipeline 30. The other end of the first channel 23 is connected to a second pipeline 26, which is used to connect to an external storage tank (not shown). One end of the second channel 24 is connected to a third pipeline 27, which is used to connect to an external raw liquid supply source (not shown). The other end of the second channel 24 is connected to a fourth pipeline 28, which is used to connect to an external storage tank (not shown).
該儲存槽係一種用於儲存經過本發明之研磨漿的處理裝置處理後的該研磨漿90的容器,以備該研磨漿90後續應用於化學機械研磨,該原液供應源係一種用於儲存原液91的容器,該原液91係由化學成分構成的濃縮液混合稀釋液調製構成的液體,且該原液91未經添加能夠削除晶圓片或基板形成研磨作用的研磨粒,該收容槽係一種容器,用於收容通過該滲透單元20處理後所產生由該原液91及微細狀的粒子混合而成的漿狀物,所述的粒子可以是該研磨粒,該儲存槽、該原液供應源及該收容槽的具體構成並無特別限定,並與本發明的技術特徵並無必然關聯,本發明所屬技術領域人士能夠直接選用既有的各種容器作為該儲存槽、該原液供應源及該收容槽。The storage tank is a container for storing the polishing slurry 90 after being processed by the polishing slurry processing device of the present invention, so that the polishing slurry 90 can be subsequently used in chemical mechanical polishing. The stock liquid supply source is a container for storing the stock liquid 91. The stock liquid 91 is a liquid prepared by mixing a concentrated liquid and a diluent composed of chemical components. The stock liquid 91 does not contain any abrasive particles that can remove the wafer or substrate to form a polishing effect. The storage tank is A container is provided for containing a slurry formed by mixing the stock solution 91 and fine particles produced after treatment by the permeation unit 20. The particles may be abrasive particles. The specific configurations of the storage tank, the stock solution supply source, and the receiving tank are not particularly limited and are not necessarily related to the technical features of the present invention. Persons skilled in the art to which the present invention relates can directly use various existing containers as the storage tank, the stock solution supply source, and the receiving tank.
應用在化學機械研磨場合的該研磨漿90,主要由該原液91加入適當比例的該研磨粒構成,其中該研磨粒的粒徑分布曲線大體上如圖6所示,橫軸表示該研磨粒的粒徑尺寸,縱軸表示該研磨粒的數量。The polishing slurry 90 used in chemical mechanical polishing is mainly composed of the stock solution 91 with the abrasive particles added in an appropriate proportion. The particle size distribution curve of the abrasive particles is generally as shown in FIG6 , where the horizontal axis represents the particle size of the abrasive particles and the vertical axis represents the number of the abrasive particles.
如圖5及圖6所示,使用本發明之研磨漿的處理裝置執行的處理方法,包括依序執行的下列步驟:As shown in FIG5 and FIG6, the processing method performed using the grinding slurry processing apparatus of the present invention includes the following steps performed in sequence:
導入研磨漿:自該研磨漿來源導引該研磨漿90進入該過濾單元10。Introducing grinding slurry: guiding the grinding slurry 90 from the grinding slurry source into the filtering unit 10.
篩選過濾:該過濾單元10篩選過濾該研磨漿90,移除該研磨漿90所含有的粒徑大於該第一尺寸的多個該第一粒子。Screening and filtering: The filtering unit 10 screens and filters the grinding slurry 90 to remove the first particles with a particle size larger than the first size contained in the grinding slurry 90.
滲透移除:通過該篩選過濾步驟的該研磨漿90引入該滲透單元20,移除該研磨漿90所含有的一部分或全部的該第二粒子92,據使該研磨漿90主要含有粒徑介於該第一尺寸及該第二尺寸之間的第三粒子94,從而獲得粒徑跨度均質化的該研磨漿90。Osmotic removal: The grinding slurry 90 that has passed the screening and filtration step is introduced into the osmotic unit 20 to remove a portion or all of the second particles 92 contained in the grinding slurry 90, so that the grinding slurry 90 mainly contains third particles 94 with a particle size between the first size and the second size, thereby obtaining the grinding slurry 90 with a homogenized particle size span.
本發明並未限制該第一尺寸及該第二尺寸的具體數值,該第一尺寸及該第二尺寸的具體數值,係依需要預先設定,並依設定的該第一尺寸及該第二尺寸選擇具有相應規格的該過濾單元10及該滲透膜22。The present invention does not limit the specific values of the first size and the second size. The specific values of the first size and the second size are pre-set as needed, and the filter unit 10 and the permeable membrane 22 with corresponding specifications are selected according to the set first size and the second size.
該研磨漿90由該第一管路25通過該第一通道23進入該第二管路26,該研磨漿90所含粒徑小於第二尺寸的多個該第二粒子92滲透通過該滲透膜22進入該第二通道24,該原液供應源供應該原液91由該第三管路27通過該第二通道24進入該第四管路28,並帶引進入該第二通道24的各該第二粒子92通過該第四管路28進入該收容槽。The abrasive slurry 90 enters the second pipe 26 through the first channel 23 from the first pipe 25. The plurality of second particles 92 having a particle size smaller than the second size contained in the abrasive slurry 90 permeate through the permeable membrane 22 and enter the second channel 24. The raw liquid supply source supplies the raw liquid 91 through the third pipe 27 through the second channel 24 and into the fourth pipe 28. The raw liquid 91 is then carried by the second particles 92 that have entered the second channel 24 through the fourth pipe 28 into the receiving tank.
使用本發明之研磨漿的處理裝置執行如前所述的處理方法,處理由該原液91加入適當比例的該研磨粒構成的該研磨漿90時,該第一粒子、該第二粒子92及該第三粒子94分別為不同粒徑的該研磨粒。When the polishing slurry processing apparatus of the present invention is used to perform the processing method described above, the polishing slurry 90 composed of the stock solution 91 and the abrasive particles in appropriate proportions is processed. The first particles 92, the second particles 92, and the third particles 94 are the abrasive particles of different particle sizes.
執行該篩選過濾步驟,能夠利用該過濾單元10自該研磨漿90移除粒徑大於該第一尺寸的該第一粒子,執行該滲透移除步驟,能夠利用該滲透單元20自該研磨漿90移除大部分或全部的該第二粒子92,使得該研磨漿90主要由該原液91及該研磨粒構成,且各該研磨粒的粒徑多數為介於該第一尺寸及該第二尺寸之間的該第三粒子94,使得該研磨漿90的該研磨粒的粒徑分布跨度趨於均質化,從而提高應用該研磨漿90執行化學機械研磨製程的研磨加工品質。By performing the screening filtration step, the first particles having a particle size larger than the first size can be removed from the polishing slurry 90 by the filtration unit 10. By performing the penetration removal step, the most or all of the second particles 92 can be removed from the polishing slurry 90 by the penetration unit 20. As a result, the polishing slurry 90 is mainly composed of the stock solution 91 and the abrasive particles, and the particle size of each of the abrasive particles is mostly the third particles 94 between the first size and the second size. This makes the particle size distribution span of the abrasive particles in the polishing slurry 90 tend to be homogenized, thereby improving the polishing quality of the chemical mechanical polishing process performed using the polishing slurry 90.
如圖3所示,該研磨漿90在該第一通道23的流動方向與該原液91在該第二通道24的流動方向相反,如圖4所示,該研磨漿90在該第一通道23的流動方向與該原液91在該第二通道24的流動方向也可以相同,圖3僅為一種例示,不能作為限制本發明的解釋。As shown in FIG3 , the flow direction of the grinding slurry 90 in the first channel 23 is opposite to the flow direction of the stock solution 91 in the second channel 24. As shown in FIG4 , the flow direction of the grinding slurry 90 in the first channel 23 and the flow direction of the stock solution 91 in the second channel 24 may also be the same. FIG3 is merely an example and cannot be used as an explanation to limit the present invention.
該原液91通過該第二通道24帶引該第二粒子92進入該收容槽,該原液91與該第二粒子92混合構成具有不同的粒徑分布範圍之研磨粒的另一種研磨漿,其主要由該原液91及粒徑小於該第二尺寸的研磨粒組成,據此,本發明能夠回收該滲透移除步驟中,自該研磨漿90排除的粒徑小於該第二尺寸的該第二粒子92,並使其能夠應用在化學機械研磨製程,做為更精細研磨製程中使用的所述另一種研磨漿。The stock solution 91 carries the second particles 92 into the receiving tank through the second channel 24. The stock solution 91 and the second particles 92 are mixed to form another type of polishing slurry having abrasive particles with a different particle size distribution range. The polishing slurry is mainly composed of the stock solution 91 and abrasive particles with a particle size smaller than the second size. Accordingly, the present invention can recover the second particles 92 with a particle size smaller than the second size that are removed from the polishing slurry 90 during the permeation removal step, and enable it to be applied in the chemical mechanical polishing process as the other type of polishing slurry used in a more precise polishing process.
利用該過濾單元10執行該篩選過濾步驟,自該研磨漿90移除的該第一粒子同樣能夠回收並調配加入新的該原液91,使其得以應用在化學機械研磨製程,作為較粗糙研磨製程使用的研磨漿。By using the filtering unit 10 to perform the screening step, the first particles removed from the slurry 90 can also be recovered and added to the new stock solution 91, so that it can be applied to the chemical mechanical polishing process as a slurry used in a relatively coarse polishing process.
化學研磨製程中,該晶圓片被該研磨粒削除的部分破碎形成的粒徑微細的粒子狀切屑,隨同流動的該研磨漿90流動而帶離該晶圓片或該基板表面,所述切屑在研磨過程中破碎,執行前述處理方法,並依需要選擇該第二尺寸的數值設定,能夠至少將大多數的該切屑自該研磨漿90中移除,使該研磨漿90能夠在化學研磨製程中循環使用,此時,該第一粒子、該第二粒子92及該第三粒子94用於表示不同粒徑的該研磨粒或該切屑。During the chemical polishing process, the portion of the wafer removed by the abrasive grains is broken into fine particle-shaped chips, which are carried away from the wafer or substrate surface along with the flowing polishing slurry 90. The chips are broken during the polishing process. By executing the aforementioned processing method and selecting the value of the second size as needed, at least most of the chips can be removed from the polishing slurry 90, allowing the polishing slurry 90 to be recycled in the chemical polishing process. At this time, the first particles, the second particles 92, and the third particles 94 are used to represent the abrasive grains or chips of different particle sizes.
執行本發明之處理方法,能夠將該切屑自該研磨漿90移除,該研磨漿90循環使用時,能夠降低該切屑沉積在提供該研磨漿90循環流動通過的管路,降低該切屑堆積而彼此黏結形成結塊現象的機率,有助於提高研磨加工的品質及效率。The processing method of the present invention can remove the chips from the grinding slurry 90. When the grinding slurry 90 is circulated, the chips can be reduced from being deposited in the pipe through which the grinding slurry 90 circulates. This reduces the probability of the chips accumulating and agglomerating, thereby helping to improve the quality and efficiency of the grinding process.
復如圖1所示,該第一管路25設有一第一泵浦252,用於泵送該研磨漿90通過該第一通道23進入該第二管路26,該第三管路27設有一第三泵浦272,用於泵送該原液91通過該第二通道24進入該第四管路28,該控制單元40耦接該第一泵浦252及該第三泵浦272,控制該第一泵浦252及該第三泵浦272的運轉,據使該第二管路26的壓力大於或等於該第三管路27的壓力。As shown in Figure 1 again, the first pipeline 25 is provided with a first pump 252 for pumping the grinding slurry 90 through the first channel 23 into the second pipeline 26. The third pipeline 27 is provided with a third pump 272 for pumping the raw liquid 91 through the second channel 24 into the fourth pipeline 28. The control unit 40 couples the first pump 252 and the third pump 272 to control the operation of the first pump 252 and the third pump 272 so that the pressure in the second pipeline 26 is greater than or equal to the pressure in the third pipeline 27.
該滲透移除步驟中,該研磨漿90通過位於該滲透膜22一側的該第一通道23之壓力,大於位於該滲透膜22另一側之該第二通道24的壓力,據使該第二粒子92滲透通過該滲透膜22進入該第二通道24,進入該第二通道24的該第二粒子92無法逆滲透通過該滲透膜22進入該第一通道23。During the osmotic removal step, the pressure of the polishing slurry 90 passing through the first channel 23 located on one side of the permeable membrane 22 is greater than the pressure of the second channel 24 located on the other side of the permeable membrane 22, thereby causing the second particles 92 to permeate through the permeable membrane 22 and enter the second channel 24. The second particles 92 that have entered the second channel 24 cannot reversely permeate through the permeable membrane 22 and enter the first channel 23.
該第二管路26設有一第二泵浦262,用於汲引該研磨漿90通過該第一通道23,並對該儲存槽泵送含有多個粒徑界於該第一尺寸及該第二尺寸之間的多個該第三粒子94的該研磨漿90,該第四管路28設有一第四泵浦282,用於汲引含有多個該第二粒子92的該原液91通過該第二通道24,並對該收容槽泵送含有多個該第二粒子92的該原液91,該控制單元40耦接控制該第二泵浦262及該第四泵浦282。The second pipeline 26 is provided with a second pump 262 for drawing the polishing slurry 90 through the first channel 23 and pumping the polishing slurry 90 containing a plurality of third particles 94 having a particle size between the first size and the second size to the storage tank. The fourth pipeline 28 is provided with a fourth pump 282 for drawing the stock solution 91 containing a plurality of second particles 92 through the second channel 24 and pumping the stock solution 91 containing a plurality of second particles 92 to the storage tank. The control unit 40 is coupled to control the second pump 262 and the fourth pump 282.
該第一管路25設有一第一流量壓力感測器254位於該第一泵浦252與該滲透器21之間,用於感測該研磨漿90通過該第一管路25的壓力,該第二管路26設有一第二流量壓力感測器264位於該第二泵浦262與該滲透器21之間,用於感測該研磨漿90通過該第二管路26的壓力,該第三管路27設有一第三流量壓力感測器274位於該第三泵浦272與該滲透器21之間,用於感測該原液91通過該第三管路27的壓力,該第四管路28設有一第四流量壓力感測器284位於該第四泵浦282與該滲透器21之間,用於感測該原液91通過該第四管路28的壓力,該第一流量壓力感測器254、該第二流量壓力感測器264、該第三流量壓力感測器274及該第四流量壓力感測器284分別耦接該控制單元40,據此,該控制單元40能夠依據該第一流量壓力感測器254、該第二流量壓力感測器264、該第三流量壓力感測器274及該第四流量壓力感測器284偵測所得,分別控制該第一泵浦252、該第二泵浦262、該第三泵浦272及該第四泵浦282運轉,從而使該研磨漿90通過位於該滲透膜22一側的該第一通道23之壓力,大於位於該滲透膜22另一側之該第二通道24的壓力。The first pipe 25 is provided with a first flow pressure sensor 254 located between the first pump 252 and the permeabilizer 21 for sensing the pressure of the grinding slurry 90 passing through the first pipe 25. The second pipe 26 is provided with a second flow pressure sensor 264 located between the second pump 262 and the permeabilizer 21 for sensing the pressure of the grinding slurry 90 passing through the second pipe. 26, the third pipeline 27 is provided with a third flow pressure sensor 274 located between the third pump 272 and the permeabilizer 21, for sensing the pressure of the raw liquid 91 passing through the third pipeline 27, the fourth pipeline 28 is provided with a fourth flow pressure sensor 284 located between the fourth pump 282 and the permeabilizer 21, for sensing the pressure of the raw liquid 91 passing through the third pipeline 27. The pressure of the four pipes 28, the first flow pressure sensor 254, the second flow pressure sensor 264, the third flow pressure sensor 274 and the fourth flow pressure sensor 284 are respectively coupled to the control unit 40, thereby, the control unit 40 can be based on the first flow pressure sensor 254, the second flow pressure sensor 264, the third flow pressure sensor The flow sensor 274 and the fourth flow pressure sensor 284 detect the flow and respectively control the operation of the first pump 252, the second pump 262, the third pump 272 and the fourth pump 282, so that the pressure of the polishing slurry 90 passing through the first channel 23 located on one side of the permeable membrane 22 is greater than the pressure of the second channel 24 located on the other side of the permeable membrane 22.
該第二管路26設有一第二流量計266位於該第二泵浦262與該第二流量壓力感測器264之間,用於感測通過該第二管路26的該研磨漿90的流量,該第四管路28設有一第四流量計286位於該第四泵浦282與該第四流量壓力感測器284之間,用於感測通過該第四管路28的該原液91的流量,該第二流量計266及該第四流量計286分別耦接該控制單元40,據使該控制單元40依據該第二流量計266及該第四流量計286偵測所得的流量,透過控制該第二泵浦262及該第四泵浦282,調節通過該滲透器21的該研磨漿90及該原液91的流量。The second pipeline 26 is provided with a second flow meter 266 located between the second pump 262 and the second flow pressure sensor 264 for sensing the flow of the grinding slurry 90 passing through the second pipeline 26. The fourth pipeline 28 is provided with a fourth flow meter 286 located between the fourth pump 282 and the fourth flow pressure sensor 284 for sensing the flow of the raw liquid 91 passing through the fourth pipeline 28. The second flow meter 266 and the fourth flow meter 286 are respectively coupled to the control unit 40, so that the control unit 40 adjusts the flow of the grinding slurry 90 and the raw liquid 91 passing through the permeabilizer 21 by controlling the second pump 262 and the fourth pump 282 according to the flow rates detected by the second flow meter 266 and the fourth flow meter 286.
10:過濾單元 20:滲透單元 21:滲透器 22:滲透膜 23:第一通道 24:第二通道 25:第一管路 252:第一泵浦 254:第一流量壓力感測器 26:第二管路 262:第二泵浦 264:第二流量壓力感測器 266:第二流量計 27:第三管路 272:第三泵浦 274:第三流量壓力感測器 28:第四管路 282:第四泵浦 284:第四流量壓力感測器 286:第四流量計 30:傳輸管路 40:控制單元 90:研磨漿 91:原液 92:第二粒子 94:第三粒子 10: Filter unit 20: Osmometer unit 21: Osmometer 22: Osmotic membrane 23: First channel 24: Second channel 25: First pipeline 252: First pump 254: First flow rate and pressure sensor 26: Second pipeline 262: Second pump 264: Second flow rate and pressure sensor 266: Second flow meter 27: Third pipeline 272: Third pump 274: Third flow rate and pressure sensor 28: Fourth pipeline 282: Fourth pump 284: Fourth flow rate and pressure sensor 286: Fourth flow meter 30: Transmission pipeline 40: Control unit 90: Grinding slurry 91: Stock solution 92: Second particle 94: The Third Particle
圖1係本發明較佳實施例之研磨漿的處理裝置的系統架構圖。 圖2係本發明較佳實施例之滲透器的軸向剖視示意圖。 圖3係本發明較佳實施例之滲透器的使用狀態示意圖。 圖4係本發明較佳實施例之滲透器的另一種使用狀態示意圖。 圖5係本發明較佳實施例之研磨漿的處理裝置執行的處理方法的流程圖。 圖6係研磨漿所含研磨粒的粒徑分布曲線圖。 Figure 1 is a system architecture diagram of a grinding slurry processing apparatus according to a preferred embodiment of the present invention. Figure 2 is a schematic axial cross-sectional view of a penetrator according to a preferred embodiment of the present invention. Figure 3 is a schematic diagram of the penetrator according to a preferred embodiment of the present invention in use. Figure 4 is a schematic diagram of the penetrator according to a preferred embodiment of the present invention in another state of use. Figure 5 is a flow chart of the processing method performed by the grinding slurry processing apparatus according to a preferred embodiment of the present invention. Figure 6 is a graph showing the particle size distribution of abrasive particles contained in the grinding slurry.
10:過濾單元 10: Filter unit
20:滲透單元 20: Penetration unit
21:滲透器 21: Penetrant
25:第一管路 25: First pipeline
252:第一泵浦 252: First Pump
254:第一流量壓力感測器 254: First flow pressure sensor
26:第二管路 26: Second pipeline
262:第二泵浦 262: Second Pump
264:第二流量壓力感測器 264: Second flow pressure sensor
266:第二流量計 266: Second flow meter
27:第三管路 27: Third pipeline
272:第三泵浦 272: Third Pump
274:第三流量壓力感測器 274: Third flow pressure sensor
28:第四管路 28: Fourth pipeline
282:第四泵浦 282: The Fourth Pump
284:第四流量壓力感測器 284: Fourth flow pressure sensor
286:第四流量計 286: Fourth flow meter
30:傳輸管路 30: Transmission pipeline
40:控制單元 40: Control unit
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| TW201041688A (en) * | 2009-03-25 | 2010-12-01 | Applied Materials Inc | Point of use recycling system for CMP slurry |
| TWM632665U (en) * | 2022-05-12 | 2022-10-01 | 英萊特國際有限公司 | System for recycling polishing slurry waste |
| TW202302208A (en) * | 2021-06-11 | 2023-01-16 | 日商杰富意鋼鐵股份有限公司 | Reuse method of unused gas in membrane reactor |
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| TW201041688A (en) * | 2009-03-25 | 2010-12-01 | Applied Materials Inc | Point of use recycling system for CMP slurry |
| TW202302208A (en) * | 2021-06-11 | 2023-01-16 | 日商杰富意鋼鐵股份有限公司 | Reuse method of unused gas in membrane reactor |
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