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TWI834199B - Processing device and method of manufacturing processed product - Google Patents

Processing device and method of manufacturing processed product Download PDF

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Publication number
TWI834199B
TWI834199B TW111122917A TW111122917A TWI834199B TW I834199 B TWI834199 B TW I834199B TW 111122917 A TW111122917 A TW 111122917A TW 111122917 A TW111122917 A TW 111122917A TW I834199 B TWI834199 B TW I834199B
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Taiwan
Prior art keywords
processing
cutting
machining
holding
moving
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TW111122917A
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Chinese (zh)
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TW202308011A (en
Inventor
深井元樹
堀聡子
坂上雄哉
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日商Towa股份有限公司
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Publication of TW202308011A publication Critical patent/TW202308011A/en
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Publication of TWI834199B publication Critical patent/TWI834199B/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/10Arrangements for cooling or lubricating tools or work
    • B23Q11/1076Arrangements for cooling or lubricating tools or work with a cutting liquid nozzle specially adaptable to different kinds of machining operations
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/08Protective coverings for parts of machine tools; Splash guards
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/08Protective coverings for parts of machine tools; Splash guards
    • B23Q11/0816Foldable coverings, e.g. bellows
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/10Arrangements for cooling or lubricating tools or work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q3/00Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
    • B23Q3/02Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine for mounting on a work-table, tool-slide, or analogous part
    • B23Q3/06Work-clamping means
    • B23Q3/08Work-clamping means other than mechanically-actuated
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q3/00Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
    • B23Q3/02Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine for mounting on a work-table, tool-slide, or analogous part
    • B23Q3/06Work-clamping means
    • B23Q3/08Work-clamping means other than mechanically-actuated
    • B23Q3/088Work-clamping means other than mechanically-actuated using vacuum means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q7/00Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting
    • B23Q7/04Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting by means of grippers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00Other grinding machines or devices
    • B24B27/06Grinders for cutting-off
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B55/00Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
    • B24B55/02Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B55/00Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
    • B24B55/06Dust extraction equipment on grinding or polishing machines
    • H10P95/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Dicing (AREA)
  • Auxiliary Devices For Machine Tools (AREA)
  • Jigs For Machine Tools (AREA)
  • Feeding Of Workpieces (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)

Abstract

本發明使裝置結構簡化並且減少佔據面積,同時防止加工液的飛散,本發明包括:加工台,保持密封完畢基板;第一保持機構,為了將密封完畢基板搬送至加工台而保持密封完畢基板;加工機構,對保持於加工台的密封完畢基板進行加工;移載台,移動多個製品;第二保持機構,為了將多個製品自加工台搬送至移載台而保持多個製品;搬送用移動機構,具有沿著加工台及移載台的排列方向延伸且用以使第一保持機構及第二保持機構移動的共用的傳遞軸;加工用移動機構,使加工機構於水平面上於沿著傳遞軸的X方向及與X方向正交的Y方向上分別移動;加工液供給機構,藉由加工用移動機構而與加工機構一起移動,自加工進給方向的前側向加工機構噴射加工液;以及加工液飛散防止機構,相對於加工機構而設置於加工進給方向的後側,並且自較加工台的上表面更靠下側的位置覆蓋上方,防止加工液的飛散。The invention simplifies the structure of the device and reduces the occupied area while preventing the scattering of the processing fluid. The invention includes: a processing table to hold the sealed substrate; a first holding mechanism to hold the sealed substrate in order to transport the sealed substrate to the processing table; The processing mechanism processes the sealed substrate held on the processing table; the transfer table moves the plurality of products; the second holding mechanism holds the plurality of products in order to transfer the plurality of products from the processing table to the transfer table; for transportation The moving mechanism has a common transmission shaft extending along the arrangement direction of the processing table and the transfer table and used to move the first holding mechanism and the second holding mechanism; the moving mechanism for processing makes the processing mechanism move along the horizontal plane. The transmission axis moves in the X direction and the Y direction orthogonal to the X direction respectively; the machining fluid supply mechanism moves together with the machining mechanism by the machining moving mechanism, and injects machining fluid to the machining mechanism from the front side of the machining feed direction; And a machining fluid scattering prevention mechanism is provided on the rear side of the machining mechanism in the machining feed direction, and covers the upper side from a position lower than the upper surface of the machining table to prevent the machining fluid from scattering.

Description

加工裝置、及加工品的製造方法Processing device and method of manufacturing processed product

本發明是有關於一種加工裝置、及加工品的製造方法。 The present invention relates to a processing device and a method for manufacturing processed products.

先前,如專利文獻1所示,於切斷系統中,考慮下述結構,即:條帶拾取器(strip picker)於X軸方向上移動,將半導體條帶自裝載裝置移送至切斷裝置的卡盤台,卡盤台吸附半導體條帶並於Y軸方向上移動至系統後方,之後,藉由心軸將半導體條帶切斷成半導體封裝體。另外,卡盤台設為使用滾珠絲桿(滾珠螺桿機構)而於Y軸方向上移動的結構。 Previously, as shown in Patent Document 1, in a cutting system, a structure in which a strip picker moves in the X-axis direction and transfers a semiconductor strip from a loading device to a cutting device has been considered. The chuck table absorbs the semiconductor strip and moves it to the rear of the system in the Y-axis direction. After that, the semiconductor strip is cut into semiconductor packages by a mandrel. In addition, the chuck table is configured to move in the Y-axis direction using a ball screw (ball screw mechanism).

然而,於所述切斷系統中,由於使用滾珠絲桿使卡盤台移動來進行切斷,因此需要設置保護滾珠絲桿免受加工水或加工屑影響的蛇腹構件,進而需要為了保護蛇腹構件而於蛇腹構件上設置多個板構件。其結果,裝置結構變得複雜。 However, in the cutting system, since the ball screw is used to move the chuck table for cutting, it is necessary to provide an bellows member that protects the ball screw from processing water or processing chips, and furthermore, it is necessary to protect the bellows member. A plurality of plate members are provided on the bellows member. As a result, the device structure becomes complicated.

另外,於所述切斷系統中,不僅於X軸方向上移送半導體條帶,而且為了切斷半導體條帶而於Y軸方向上移送至系統後方,因此裝置的佔據面積(footprint)變大。 In addition, in the cutting system, the semiconductor strip is moved not only in the X-axis direction but also in the Y-axis direction to the rear of the system in order to cut the semiconductor strip, so the footprint of the device becomes larger.

另一方面,如專利文獻2所示,考慮一種加工裝置,其藉由加工進給部件於X軸方向上加工進給切削部件,並且藉由切入進給部件使位置固定的卡盤台於Z軸方向上切入進給,而對保 持於卡盤台上的被加工物進行切削加工。於該加工裝置中,作為對伴隨加工進給的切削水的防水,不需要基於卡盤台周圍的水平配設的蛇腹結構的防水部件。 On the other hand, as shown in Patent Document 2, a processing device is considered in which a cutting member is processed in the X-axis direction by a machining feed member, and a fixed chuck table is positioned in the Z direction by a cutting feed member. Cutting feed in the axial direction, while maintaining Cutting is performed on the workpiece held on the chuck table. In this machining apparatus, a waterproof member based on a bellows structure arranged horizontally around the chuck table is not required to waterproof the cutting water accompanying the machining feed.

但是,於該加工裝置中,雖然可不需要基於卡盤台周圍的水平配設的蛇腹結構的防水部件,但是於切削加工中切削水會飛散至周圍的構成要素,從而有時會成為不良情況。 However, in this machining apparatus, waterproof members based on the bellows structure arranged horizontally around the chuck table are not required. However, cutting water may scatter to surrounding components during cutting, which may cause problems.

[現有技術文獻] [Prior art documents] [專利文獻] [Patent Document]

[專利文獻1] 日本專利特表2007-536727號公報 [Patent Document 1] Japanese Patent Publication No. 2007-536727

[專利文獻2] 日本專利特開2008-140981號公報 [Patent Document 2] Japanese Patent Application Laid-Open No. 2008-140981

因此,本發明是為了解決所述問題點而成,其主要課題在於使裝置結構簡化並且減少佔據面積,同時防止加工液的飛散。 Therefore, the present invention is made in order to solve the above-mentioned problems, and its main subject is to simplify the structure of the device and reduce the occupied area, and to prevent the scattering of the machining fluid.

即,本發明的加工裝置的特徵在於包括:加工台,保持加工對象物;第一保持機構,為了將所述加工對象物搬送至所述加工台而保持所述加工對象物;加工機構,對保持於所述加工台的所述加工對象物進行加工;移載台,移動加工後的所述加工對象物;第二保持機構,為了將加工後的所述加工對象物自所述加工台搬送至所述移載台而保持加工後的所述加工對象物;搬送用移動機構,具有沿著所述加工台及所述移載台的排列方向延伸且 用以使所述第一保持機構及所述第二保持機構移動的共用的傳遞軸;加工用移動機構,使所述加工機構於水平面上於沿著所述傳遞軸的第一方向及與所述第一方向正交的第二方向上分別移動;加工液供給機構,藉由所述加工用移動機構而與所述加工機構一起移動,自加工進給方向的前側向所述加工機構噴射加工液;以及加工液飛散防止機構,相對於所述加工機構而設置於所述加工進給方向的後側,並且自較所述加工台的上表面更靠下側的位置覆蓋上方,防止所述加工液的飛散。 That is, the processing apparatus of the present invention is characterized by including: a processing table that holds an object to be processed; a first holding mechanism that holds the object to be processed in order to transport the object to the processing table; and a processing mechanism that holds the object to be processed. The processing object held on the processing table is processed; the transfer table moves the processed object; and the second holding mechanism is used to transport the processed object from the processing table. The processed object is held on the transfer table; and a transport moving mechanism has a structure extending along the arrangement direction of the processing table and the transfer table. A common transmission shaft used to move the first holding mechanism and the second holding mechanism; a processing moving mechanism to move the processing mechanism on the horizontal plane in the first direction along the transmission shaft and with the The machining fluid supply mechanism moves in a second direction orthogonal to the first direction respectively; the machining fluid supply mechanism moves together with the machining mechanism through the machining moving mechanism, and sprays the machining mechanism to the machining mechanism from the front side of the machining feed direction. liquid; and a machining liquid scattering prevention mechanism, which is provided on the rear side in the machining feed direction with respect to the machining mechanism, and covers the upper side from a position lower than the upper surface of the machining table to prevent the Spraying of machining fluid.

根據如此構成的本發明,可使裝置結構簡化並且減少佔據面積,同時防止加工液的飛散。 According to the present invention configured in this way, the device structure can be simplified and the occupied area can be reduced, while the scattering of the machining fluid can be prevented.

2A、2B:切斷用台(加工台) 2A, 2B: Cutting table (processing table)

3:第一保持機構 3: The first holding mechanism

4:切斷機構(加工機構) 4: Cutting mechanism (processing mechanism)

5:移載台 5:Transfer platform

6:第二保持機構 6: Second holding mechanism

7:搬送用移動機構 7:Moving mechanism for transportation

8:切斷用移動機構(加工用移動機構、移動機構) 8: Moving mechanism for cutting (moving mechanism for processing, moving mechanism)

9A、9B:旋轉機構 9A, 9B: Rotating mechanism

10A、10B:真空泵 10A, 10B: Vacuum pump

11:基板供給機構 11:Substrate supply mechanism

12:切削水供給機構(加工液供給機構) 12: Cutting water supply mechanism (machining fluid supply mechanism)

13:檢查部 13:Inspection Department

14:反轉機構 14:Reversal mechanism

15:蓋構件 15: cover member

15a、15b:開口部 15a, 15b: opening

16、241:蛇腹構件 16. 241: Bellows member

17:加工屑收容部 17: Processing waste collection department

18:第一清潔機構 18:The first cleaning agency

18a、121:噴射噴嘴 18a, 121: Injection nozzle

19:第二清潔機構 19:Second cleaning mechanism

20:分類機構 20:Classification agency

21:托盤 21:Pallet

22:托盤搬送機構 22:Pallet transport mechanism

23:托盤收容部 23:Pallet storage department

24:切削水飛散防止機構(加工液飛散防止機構) 24: Cutting water scattering prevention mechanism (machining fluid scattering prevention mechanism)

31、61:吸附頭 31, 61: Adsorption head

40:旋轉工具 40: Rotary tool

41A、41B:刀片 41A, 41B: Blade

42A、42B:心軸 42A, 42B: Spindle

71:共用的傳遞軸(傳遞軸) 71: Common transmission shaft (transmission shaft)

72:主移動機構 72: Main moving mechanism

73、181、244:升降移動機構 73, 181, 244: Lifting and moving mechanism

73a、831:Z方向導軌 73a, 831: Z direction guide rail

73b:致動器部 73b: Actuator part

74:水平移動機構 74: Horizontal moving mechanism

74a、821:Y方向導軌 74a, 821: Y direction guide rail

74b:彈性體 74b: Elastomer

74c:凸輪機構 74c: Cam mechanism

81:X方向移動部 81:X direction moving part

82:Y方向移動部 82:Y direction moving part

83:Z方向移動部 83:Z direction moving part

100:切斷裝置(加工裝置) 100: Cutting device (processing device)

111:基板收容部 111:Substrate receiving section

112:基板供給部 112:Substrate supply department

113:加熱部 113:Heating part

131:第一檢查部 131:First Inspection Department

132:第二檢查部 132:Second Inspection Department

141:保持台 141:Keeping platform

142:反轉部 142:Reversal Department

151:窗 151:window

171:導引滑槽 171:Guide chute

171X:上部開口 171X: Upper opening

172:回收容器 172:Recycling container

173:分離部 173:Separation Department

242:擋板構件 242:Baffle component

242a:第一突出部 242a: first protrusion

242b:第二突出部 242b: Second protrusion

243A、243B:固定部 243A, 243B: Fixed part

244a:擋板保持部 244a: baffle holding part

244b、721:導軌 244b, 721: Guide rail

244c:驅動部 244c:Drive Department

311、611:吸附部 311, 611: Adsorption department

722:小齒輪機構 722:Pinion mechanism

722a:凸輪齒條 722a: Cam rack

722b:小齒輪 722b: pinion

722b1:滾子本體 722b1:Roller body

722b2:滾子銷 722b2:Roller pin

723:滑動構件 723:Sliding member

811:一對X方向導軌(X方向導軌、導軌) 811: A pair of X-direction guide rails (X-direction guide rail, guide rail)

812:支撐體 812:Support

813:滾珠螺桿機構 813: Ball screw mechanism

822:Y方向滑塊 822:Y direction slider

823:線性馬達 823: Linear motor

832:Z方向滑塊 832:Z direction slider

CTL:控制部 CTL:Control Department

D:下降位置 D: Descending position

P:製品(加工後的加工對象物) P: Product (processed object)

RP:保持位置 RP: maintain position

S:加工屑 S: Processing chips

SD:加工進給方向 SD: processing feed direction

U:上升位置 U: ascending position

W:密封完畢基板(加工對象物) W: Sealed substrate (object to be processed)

X、Y、Z、θ:方向 X, Y, Z, θ: direction

圖1是示意性地表示本發明一實施形態的切斷裝置的結構的圖。 FIG. 1 is a diagram schematically showing the structure of a cutting device according to an embodiment of the present invention.

圖2是示意性地表示所述實施形態的切斷用台及其周邊結構的立體圖。 FIG. 2 is a perspective view schematically showing the cutting table of the embodiment and its surrounding structure.

圖3是示意性地表示所述實施形態的切斷用台及其周邊結構的結構的、自Z方向觀察的圖(平面圖)。 FIG. 3 is a diagram (plan view) viewed from the Z direction, schematically showing the structure of the cutting table and its surrounding structures according to the embodiment.

圖4是示意性地表示所述實施形態的切斷用台及其周邊結構的結構的、自Y方向觀察的圖(正面圖)。 4 is a diagram (front view) viewed from the Y direction, schematically showing the structure of the cutting table and its surrounding structures according to the embodiment.

圖5是示意性地表示所述實施形態的第一保持機構及搬送用 移動機構的結構的、自Y方向觀察的圖(正面圖)。 Fig. 5 is a schematic diagram showing the first holding mechanism and the conveying device of the embodiment; The structure of the moving mechanism, viewed from the Y direction (front view).

圖6是示意性地表示所述實施形態的第一保持機構及搬送用移動機構的結構的、自X方向觀察的圖(側面圖)。 6 is a diagram (side view) viewed from the X direction, schematically showing the structure of the first holding mechanism and the transport moving mechanism of the embodiment.

圖7是示意性地表示所述實施形態的齒條與小齒輪(rack and pinion)機構的結構的剖面圖。 7 is a cross-sectional view schematically showing the structure of a rack and pinion mechanism according to the embodiment.

圖8是示意性地表示所述實施形態的第二保持機構及搬送用移動機構的結構的、自Y方向觀察的圖(正面圖)。 8 is a diagram (front view) viewed from the Y direction schematically showing the structures of the second holding mechanism and the transport moving mechanism of the embodiment.

圖9是示意性地表示所述實施形態的加工用移動機構及蓋構件的結構的、自X方向觀察的剖面圖。 9 is a cross-sectional view viewed from the X direction schematically showing the structure of the processing moving mechanism and the cover member of the embodiment.

圖10是示意性地表示所述實施形態的加工用移動機構、蓋構件及切削水飛散防止機構的結構的、自Y方向觀察的剖面圖。 10 is a cross-sectional view viewed from the Y direction schematically showing the structures of the processing moving mechanism, the cover member, and the cutting water scattering prevention mechanism according to the embodiment.

圖11是示意性地表示所述實施形態的加工用移動機構、蓋構件及切削水飛散防止機構的結構的、自Y方向觀察的剖面圖。 11 is a cross-sectional view viewed from the Y direction schematically showing the structures of the processing moving mechanism, the cover member, and the cutting water scattering prevention mechanism according to the embodiment.

圖12是表示所述實施形態的切削水飛散防止機構中的擋板構件的(a)上升位置、及(b)下降位置的示意圖。 12 is a schematic diagram showing (a) an ascending position and (b) a descending position of the baffle member in the cutting water scattering prevention mechanism of the embodiment.

圖13是表示所述實施形態的切削水飛散防止機構的動作的示意圖。 FIG. 13 is a schematic diagram showing the operation of the cutting water scattering prevention mechanism of the embodiment.

圖14是表示所述實施形態的切削水飛散防止機構的動作的示意圖。 FIG. 14 is a schematic diagram showing the operation of the cutting water scattering prevention mechanism of the embodiment.

圖15是表示所述實施形態的切斷裝置的動作的示意圖。 Fig. 15 is a schematic diagram showing the operation of the cutting device according to the embodiment.

接著,舉例對本發明進行更詳細說明。但是,本發明不 由以下的說明限定。 Next, the present invention will be described in more detail using examples. However, the present invention does not Limited by the following description.

如所述般,本發明的加工裝置的特徵在於包括:加工台,保持加工對象物;第一保持機構,為了將所述加工對象物搬送至所述加工台而保持所述加工對象物;加工機構,對保持於所述加工台的所述加工對象物進行加工;移載台,移動加工後的所述加工對象物;第二保持機構,為了將加工後的所述加工對象物自所述加工台搬送至所述移載台而保持加工後的所述加工對象物;搬送用移動機構,具有沿著所述加工台及所述移載台的排列方向延伸且用以使所述第一保持機構及所述第二保持機構移動的共用的傳遞軸;加工用移動機構,使所述加工機構於水平面上於沿著所述傳遞軸的第一方向及與所述第一方向正交的第二方向上分別移動;加工液供給機構,藉由所述加工用移動機構而與所述加工機構一起移動,自加工進給方向的前側向所述加工機構噴射加工液;以及加工液飛散防止機構,相對於所述加工機構而設置於所述加工進給方向的後側,並且自較所述加工台的上表面更靠下側的位置覆蓋上方,防止所述加工液的飛散。 As described above, the processing apparatus of the present invention is characterized by including: a processing table that holds the object to be processed; and a first holding mechanism that holds the object to be processed in order to transport the object to the processing table; a mechanism to process the object to be processed held on the processing table; a transfer table to move the object to be processed; and a second holding mechanism to remove the object to be processed from the object to be processed. The processing table is transported to the transfer table and the processed object is held; a transport moving mechanism extends along the arrangement direction of the processing table and the transfer table and is used to move the first A common transmission axis for movement of the holding mechanism and the second holding mechanism; a moving mechanism for processing to move the processing mechanism on a horizontal plane in a first direction along the transmission axis and orthogonal to the first direction respectively move in the second direction; a machining fluid supply mechanism moves together with the machining mechanism by the machining moving mechanism, and injects machining fluid to the machining mechanism from the front side of the machining feed direction; and prevents machining fluid from scattering A mechanism is provided on the rear side of the processing mechanism in the processing feed direction, and covers the upper side from a position below the upper surface of the processing table to prevent the machining fluid from scattering.

若為所述加工裝置,則採用藉由沿著加工台及移載台的排列方向延伸的共用的傳遞軸使第一保持機構及第二保持機構移動的結構,藉由加工用移動機構使加工機構於水平面上於沿著傳遞軸的第一方向及與所述第一方向正交的第二方向上分別移動,因此無需使加工台於第一方向及第二方向上移動便可對加工對象物進行加工。因此,可不藉由滾珠螺桿機構使加工台移動,而無需用 以保護滾珠螺桿機構的蛇腹構件及用以保護該蛇腹構件的蓋構件。其結果,可使加工裝置的裝置結構簡化。另外,由於成為加工台不於水平面上於第一方向及第二方向上移動的結構,因此可削減加工台的移動空間及其周邊的無用空間,可減少加工裝置的佔據面積。 In the above-mentioned processing device, a structure is adopted in which the first holding mechanism and the second holding mechanism are moved by a common transmission shaft extending along the arrangement direction of the processing table and the transfer table, and the processing movement mechanism is used to perform processing. The mechanism moves respectively in the first direction along the transmission axis and the second direction orthogonal to the first direction on the horizontal plane, so the processing object can be machined without moving the processing table in the first direction and the second direction. Objects are processed. Therefore, the processing table can be moved without using the ball screw mechanism. to protect the bellows member of the ball screw mechanism and a cover member to protect the bellows member. As a result, the device structure of the processing device can be simplified. In addition, since the processing table is configured not to move in the first direction and the second direction on the horizontal plane, the movement space of the processing table and the useless space around it can be reduced, and the occupied area of the processing device can be reduced.

尤其是於本發明中,於自加工進給方向的前側向加工機構噴射加工液的結構中,相對於加工機構而於加工進給方向的後側設置自較加工台的上表面更靠下側的位置覆蓋上方的加工液飛散防止機構,因此可防止加工液的飛散。 In particular, in the present invention, in the structure in which the machining fluid is sprayed toward the processing mechanism from the front side in the machining feed direction, the machining mechanism is provided from the rear side in the machining feed direction lower than the upper surface of the machining table. The position covers the upper machining fluid scattering prevention mechanism, thus preventing the machining fluid from scattering.

為了於追隨利用加工用移動機構進行的加工機構的移動的同時防止加工液的飛散,理想的是所述加工液飛散防止機構具有:蛇腹構件,伴隨所述加工機構的移動而伸縮,覆蓋與所述加工進給方向正交的上方及側方;以及擋板構件,連接有所述蛇腹構件的所述加工進給方向上的後端部,覆蓋所述加工進給方向的後方。 In order to prevent the machining fluid from scattering while following the movement of the machining mechanism using the machining moving mechanism, it is desirable that the machining fluid scattering prevention mechanism has an bellows member that expands and contracts with the movement of the machining mechanism and covers all parts of the machining fluid. The upper and lateral sides orthogonal to the processing feed direction; and a baffle member connected to the rear end of the accordion member in the processing feed direction and covering the rear side in the processing feed direction.

若於利用加工機構對加工對象物進行加工時擋板構件移動,則有無法可靠地防止加工液的飛散的可能性。為了解決該問題,理想的是加工裝置具有於利用所述加工機構對所述加工對象物進行加工時對所述擋板構件進行固定的固定部。 If the baffle member moves when the object to be processed is processed by the processing mechanism, there is a possibility that scattering of the machining fluid cannot be reliably prevented. In order to solve this problem, it is preferable that the processing device has a fixing portion for fixing the baffle member when the object to be processed is processed by the processing mechanism.

為了於一個加工裝置中提高加工對象物的處理能力,理想的是本發明的加工裝置包括多個所述加工台。 In order to improve the processing capability of the object to be processed in one processing device, it is desirable that the processing device of the present invention includes a plurality of the processing tables.

此處,理想的是所述固定部與所述多個加工台分別對應地設 置。若為所述結構,則可使蛇腹構件成為與一個加工台對應的長度,可減小收縮狀態的蛇腹構件的尺寸。另外,可設為根據各加工台對擋板構件進行固定,藉由蛇腹構件覆蓋一個加工台的結構,可提高對未加工的加工台可搬入加工前的加工對象物、或可搬出加工後的加工對象物等的處理能力。 Here, it is desirable that the fixing portion and the plurality of processing tables are respectively provided correspondingly. Set. According to the above structure, the length of the bellows member can be made corresponding to one processing table, and the size of the bellows member in the contracted state can be reduced. In addition, the baffle member can be fixed to each processing table and the structure of covering one processing table with the bellows member can improve the ability to load the unprocessed processing object into the unprocessed processing table and to carry out the processed object. Processing capabilities of processing objects, etc.

為了使擋板構件移動至與多個加工台對應的多個固定部,理想的是所述加工用移動機構使所述擋板構件分別移動至多個所述固定部。 In order to move the baffle member to a plurality of fixed parts corresponding to a plurality of processing tables, it is desirable that the processing moving mechanism moves the baffle member to a plurality of the fixed parts respectively.

若為所述結構,則不需要另外設置移動擋板構件的移動機構,可使移動擋板構件的結構簡略化。 According to the above structure, there is no need to provide a separate moving mechanism for moving the shutter member, and the structure of the moving shutter member can be simplified.

由於擋板構件的下端部設置於較加工台的上表面更低的位置,因此需要使擋板構件在不與加工台發生干擾的情況下移動。因此,理想的是所述擋板構件能夠於其下端部位於較所述加工台的上表面更靠上側處的上升位置、與所述下端部位於較所述加工台的上表面更靠下側處的下降位置之間移動,於所述下降位置上由所述固定部進行固定。 Since the lower end of the baffle member is provided at a lower position than the upper surface of the processing table, it is necessary to move the baffle member without interfering with the processing table. Therefore, it is desirable that the baffle member can have its lower end portion positioned in a raised position above the upper surface of the processing table, and the lower end portion be positioned lower than the upper surface of the processing table. It moves between the lowered positions, and is fixed by the fixing part in the lowered position.

所述加工用移動機構被稱為所謂龍門架(gantry)機構。具體而言,理想的是所述加工用移動機構包括:X方向移動部,使所述加工機構於作為所述第一方向的X方向上直線移動;以及Y方向移動部,使所述加工機構於作為所述第二方向的Y方向上直線移動,所述X方向移動部具有:一對X方向導軌,隔著所述加工台沿著X方向設置;以及支撐體,沿著所述一對X方向導軌 移動並且經由所述Y方向移動部支撐所述加工機構。於所述結構中,共用的傳遞軸以於支撐體的上方橫穿該支撐體的方式配置,共用的傳遞軸及支撐體成為相互交叉的位置關係。 The moving mechanism for processing is called a so-called gantry mechanism. Specifically, it is preferable that the processing moving mechanism includes: an X-direction moving part for linearly moving the processing mechanism in the X direction as the first direction; and a Y-direction moving part for moving the processing mechanism To move linearly in the Y direction as the second direction, the X-direction moving part has: a pair of X-direction guide rails arranged along the X-direction across the processing table; and a support body along the pair of X-direction guide rails. X direction guide rail The processing mechanism is moved and supported via the Y-direction moving part. In the above structure, the common transmission shaft is arranged above the support body and crosses the support body, and the common transmission shaft and the support body have a mutually intersecting positional relationship.

如此,沿著X方向設置的一對X方向導軌隔著加工台而設置,因此可增大一對X方向導軌的間距(間隔)。其結果,可減小X方向導軌彼此的上下方向的位置偏移對加工造成的影響。即,可減小加工機構(例如刀片等旋轉工具)與加工台的正交度的偏移,可提高加工精度。另外,對於X方向導軌,可使用規格較先前低的導軌。 In this way, since the pair of X-direction guide rails provided along the X-direction are provided across the processing table, the pitch (interval) between the pair of X-direction guide rails can be increased. As a result, the influence on processing caused by the positional deviation of the X-direction guide rails in the up-down direction can be reduced. That is, the deviation of the orthogonality between the processing mechanism (for example, a rotating tool such as a blade) and the processing table can be reduced, and processing accuracy can be improved. In addition, for the X-direction guide rail, a guide rail with a lower specification than before can be used.

於所述加工用移動機構中,理想的是沿著所述X方向朝向一側的方向是所述加工進給方向,於所述支撐體中的沿著X方向的其中一側設置有所述加工機構及所述加工液供給機構,於所述支撐體中的沿著X方向的另一側設置有所述加工液飛散防止機構。若為所述結構,則可防止通過了支撐體的下側的加工液於支撐體的沿著X方向的另一側飛散。 In the processing moving mechanism, it is desirable that the direction toward one side along the X direction is the processing feed direction, and the support is provided on one side along the X direction of the support body. In the machining mechanism and the machining fluid supply mechanism, the machining fluid scattering prevention mechanism is provided on the other side of the support body along the X direction. According to this structure, the machining fluid that has passed through the lower side of the support body can be prevented from scattering on the other side of the support body along the X direction.

為了防止支撐體的沿著X方向的其中一側的加工液的飛散,理想的是於所述支撐體的沿著X方向的其中一側設置有收容所述加工機構及所述加工液供給機構的蓋構件。 In order to prevent the machining fluid from scattering on one side of the support body along the X direction, it is desirable to provide the machining mechanism and the machining fluid supply mechanism on one side of the support body along the X direction. cover member.

另外,使用所述加工裝置來製造加工品的、加工品的製造方法亦為本發明的一態樣。 In addition, a method for manufacturing a processed product using the processing device is also an aspect of the present invention.

<本發明的一實施形態> <One embodiment of the present invention>

以下,參照圖式對本發明的加工裝置的一實施形態進行說 明。再者,關於以下所示的任一圖,均為了容易理解而適當省略或誇張地示意性地描繪。對相同的構成要素標註相同符號,適當省略說明。 Hereinafter, an embodiment of the processing device of the present invention will be described with reference to the drawings. bright. In addition, any of the figures shown below are omitted as appropriate or schematically drawn in an exaggerated manner for easy understanding. The same components are labeled with the same symbols, and descriptions are omitted where appropriate.

<加工裝置的整體結構> <Overall structure of processing equipment>

本實施形態的加工裝置100為切斷裝置,所述切斷裝置藉由將作為加工對象物的密封完畢基板W切斷,而單片化為多個製品P。 The processing device 100 of this embodiment is a cutting device that cuts the sealed substrate W as a processing object into individual pieces into a plurality of products P.

此處,所謂密封完畢基板W,是對連接有半導體晶片、電阻元件、電容器元件等電子元件的基板,以至少對電子元件進行樹脂密封的方式進行了樹脂成形而成。作為構成密封完畢基板W的基板,可使用引線框架、印刷配線板,除了該些以外,亦可使用半導體製基板(包含矽晶圓等半導體晶圓)、金屬製基板、陶瓷製基板、玻璃製基板、樹脂製基板等。另外,對於構成密封完畢基板W的基板,可實施配線亦可不實施配線。 Here, the sealed substrate W is a substrate to which electronic components such as semiconductor wafers, resistive elements, and capacitor elements are connected, and is formed by resin molding so as to resin seal at least the electronic components. As the substrate constituting the sealed substrate W, a lead frame or a printed wiring board can be used. In addition to these, a semiconductor substrate (including a semiconductor wafer such as a silicon wafer), a metal substrate, a ceramic substrate, a glass substrate can also be used. substrate, resin substrate, etc. In addition, wiring may or may not be implemented on the substrate constituting the sealed substrate W.

另外,本實施形態的密封完畢基板W及製品P的其中一個面成為之後用來安裝的安裝面。於本實施形態的說明中,將之後用來安裝的其中一個面記載「安裝面」,將其相反側的面記載為「相反面」。 In addition, one of the surfaces of the sealed substrate W and product P of this embodiment becomes the mounting surface used for subsequent mounting. In the description of this embodiment, one of the surfaces used for mounting later will be described as the "mounting surface", and the surface on the opposite side will be described as the "opposite surface".

具體而言,如圖1所示,切斷裝置100包括:兩個切斷用台(加工台)2A、2B,保持密封完畢基板W;第一保持機構3,為了將密封完畢基板W搬送至切斷用台2A、切斷用台2B而保持密封完畢基板W;切斷機構(加工機構)4,將保持於切斷用台 2A、切斷用台2B的密封完畢基板W切斷;移載台5,移動多個製品P;第二保持機構6,為了將多個製品P自切斷用台2A、切斷用台2B搬送至移載台5而保持多個製品P;搬送用移動機構7,具有用以使第一保持機構3及第二保持機構6移動的共用的傳遞軸71;以及切斷用移動機構(加工用移動機構)8,使切斷機構4相對於保持於切斷用台2A、切斷用台2B的密封完畢基板W移動。再者,由第一保持機構3及搬送用移動機構7構成搬送密封完畢基板W的搬送機構(裝載機),由第二保持機構6及搬送用移動機構7構成搬送多個製品P的搬送機構(卸載機)。 Specifically, as shown in FIG. 1 , the cutting device 100 includes two cutting tables (processing tables) 2A and 2B that hold the sealed substrate W; and a first holding mechanism 3 that transports the sealed substrate W to The cutting tables 2A and 2B hold the sealed substrate W; the cutting mechanism (processing mechanism) 4 holds the sealed substrate W on the cutting table. 2A. The sealed substrate W is cut on the cutting table 2B; the transfer table 5 moves the plurality of products P; the second holding mechanism 6 is used to remove the plurality of products P from the cutting table 2A and the cutting table 2B. The plurality of products P are transported to the transfer table 5 and held; the transfer moving mechanism 7 has a common transmission shaft 71 for moving the first holding mechanism 3 and the second holding mechanism 6; and the cutting moving mechanism (processing The cutting mechanism 4 is moved relative to the sealed substrate W held by the cutting tables 2A and 2B using a moving mechanism 8 . Furthermore, the first holding mechanism 3 and the conveying moving mechanism 7 constitute a conveying mechanism (loader) for conveying the sealed substrate W, and the second holding mechanism 6 and the conveying moving mechanism 7 constitute a conveying mechanism for conveying the plurality of products P. (Unloader).

於以下的說明中,將沿著切斷用台2A、切斷用台2B的上表面的平面(水平面)內相互正交的方向分別設為作為第一方向的X方向及作為第二方向的Y方向,將與X方向及Y方向正交的鉛垂方向設為Z方向。具體而言,將圖1的左右方向設為X方向,將上下方向設為Y方向。雖將後述,但X方向為支撐體812的移動方向,而且為與門型支撐體812的架設有一對腳部的樑部(橫樑部)的長度方向(樑部延伸的方向)正交的方向(參照圖2及圖3)。 In the following description, the directions orthogonal to each other in the plane (horizontal plane) along the upper surfaces of the cutting tables 2A and 2B are respectively referred to as the X direction as the first direction and the second direction. In the Y direction, let the vertical direction orthogonal to the X direction and the Y direction be the Z direction. Specifically, let the left-right direction in FIG. 1 be the X direction, and let the up-down direction be the Y direction. Although it will be described later, the X direction is the moving direction of the support body 812 and is a direction orthogonal to the longitudinal direction (the direction in which the beam portion extends) of the beam portion (cross beam portion) of the door-shaped support body 812 that spans a pair of legs. (Refer to Figure 2 and Figure 3).

<切斷用台2A、切斷用台2B> <Cutting table 2A, cutting table 2B>

兩個切斷用台2A、2B於X方向、Y方向及Z方向上固定地設置。再者,切斷用台2A能夠藉由設置於切斷用台2A之下的旋轉機構9A於θ方向上旋轉。另外,切斷用台2B能夠藉由設置於切斷用台2B之下的旋轉機構9B於θ方向上旋轉。 The two cutting tables 2A and 2B are fixedly installed in the X direction, the Y direction, and the Z direction. Furthermore, the cutting table 2A can be rotated in the θ direction by the rotation mechanism 9A provided below the cutting table 2A. In addition, the cutting table 2B can be rotated in the θ direction by the rotation mechanism 9B provided below the cutting table 2B.

該些兩個切斷用台2A、2B於水平面上沿著X方向設置。具體而言,兩個切斷用台2A、2B以該些的上表面位於同一水平面上(於Z方向上位於相同高度)的方式配置(參照圖4),並且以該些上表面的中心(具體而言為基於旋轉機構9A、旋轉機構9B的旋轉中心)位於沿X方向延伸的同一直線上的方式配置(參照圖2及圖3)。 These two cutting tables 2A and 2B are installed along the X direction on the horizontal plane. Specifically, the two cutting tables 2A and 2B are arranged so that their upper surfaces are located on the same horizontal plane (at the same height in the Z direction) (see FIG. 4 ), and the centers of the upper surfaces ( Specifically, they are arranged so that the rotation centers of the rotating mechanisms 9A and 9B are located on the same straight line extending in the X direction (see FIGS. 2 and 3 ).

另外,兩個切斷用台2A、2B吸附保持密封完畢基板W,如圖1所示,與兩個切斷用台2A、2B對應地配置有用以吸附保持的兩個真空泵10A、10B。各真空泵10A、10B例如為水封式真空泵。 In addition, the two cutting tables 2A and 2B suction and hold the sealed substrate W. As shown in FIG. 1 , two vacuum pumps 10A and 10B are arranged corresponding to the two cutting tables 2A and 2B for suction and holding. Each of the vacuum pumps 10A and 10B is, for example, a water-sealed vacuum pump.

此處,切斷用台2A、切斷用台2B於XYZ方向上經固定,因此可縮短自真空泵10A、真空泵10B連接於切斷用台2A、切斷用台2B的配管(未圖示),可減少配管的壓力損失,而防止吸附力的降低。其結果,即便為例如1mm見方以下的極小封裝體,亦能可靠地吸附於切斷用台2A、切斷用台2B。另外,可防止配管的壓力損失所致的吸附力的降低,因此可減小真空泵10A、真空泵10B的容量,有助於小型化或成本降低。 Here, since the cutting table 2A and the cutting table 2B are fixed in the XYZ direction, the pipes (not shown) connected from the vacuum pump 10A and the vacuum pump 10B to the cutting table 2A and the cutting table 2B can be shortened. , which can reduce the pressure loss in the piping and prevent the reduction of adsorption force. As a result, even an extremely small package, for example, 1 mm square or less, can be reliably attracted to the cutting tables 2A and 2B. In addition, it is possible to prevent the reduction in adsorption force due to pressure loss in the piping, so that the capacity of the vacuum pump 10A and the vacuum pump 10B can be reduced, which contributes to downsizing and cost reduction.

<第一保持機構3> <First holding mechanism 3>

如圖1所示,第一保持機構3為了將密封完畢基板W自基板供給機構11搬送至切斷用台2A、切斷用台2B而保持密封完畢基板W。如圖5及圖6所示,所述第一保持機構3具有:吸附頭31,設置有用以吸附保持密封完畢基板W的多個吸附部311;以及真 空泵(未圖示),連接於該吸附頭31的吸附部311。而且,吸附頭31藉由後述的搬送用移動機構7等移動至所期望的位置,藉此將密封完畢基板W自基板供給機構11搬送至切斷用台2A、切斷用台2B。 As shown in FIG. 1 , the first holding mechanism 3 holds the sealed substrate W in order to transport the sealed substrate W from the substrate supply mechanism 11 to the cutting stages 2A and 2B. As shown in FIGS. 5 and 6 , the first holding mechanism 3 has: an adsorption head 31 provided with a plurality of adsorption portions 311 for adsorbing and holding the sealed substrate W; and An empty pump (not shown) is connected to the adsorption part 311 of the adsorption head 31 . Then, the suction head 31 is moved to a desired position by the conveyance moving mechanism 7 described below, etc., thereby conveying the sealed substrate W from the substrate supply mechanism 11 to the cutting stages 2A and 2B.

如圖1所示,基板供給機構11具有:基板收容部111,自外部收容多個密封完畢基板W;以及基板供給部112,使收容於該基板收容部111的密封完畢基板W移動至由第一保持機構3吸附保持的保持位置RP。所述保持位置RP是以於X方向上與兩個切斷用台2A、2B成為同行的方式設定。再者,基板供給機構11亦可具有為了使由第一保持機構3吸附的密封完畢基板W為柔軟的狀態以容易吸附而對所述密封完畢基板W進行加熱的加熱部113。 As shown in FIG. 1 , the substrate supply mechanism 11 has: a substrate accommodating part 111 for accommodating a plurality of sealed substrates W from the outside; and a substrate supply part 112 for moving the sealed substrates W accommodated in the substrate accommodating part 111 to a first position. A holding mechanism 3 adsorbs and holds the holding position RP. The holding position RP is set so as to be aligned with the two cutting tables 2A and 2B in the X direction. Furthermore, the substrate supply mechanism 11 may have a heating unit 113 that heats the sealed substrate W adsorbed by the first holding mechanism 3 in order to make the sealed substrate W soft and easy to adsorb.

<切斷機構4> <Cutting mechanism 4>

如圖1、圖2及圖3所示,作為加工機構的切斷機構4具有包含刀片41A、刀片41B及兩個心軸42A、42B的兩個旋轉工具40。兩個心軸42A、42B以該些的旋轉軸沿著Y方向的方式設置,安裝於該些心軸部的刀片41A、刀片41B以相互相向的方式配置(參照圖3)。心軸42A的刀片41A及心軸42B的刀片41B藉由在包含X方向及Z方向的面內旋轉,而將保持於各切斷用台2A、2B的密封完畢基板W切斷。再者,如圖4所示,於本實施形態的切斷裝置100設置有切削水供給機構(加工液供給機構)12,所述切削水供給機構(加工液供給機構)12為了抑制由刀片41A、 刀片41B產生的摩擦熱而噴射作為加工液的切削水。關於所述切削水供給機構12,將於後面敘述。 As shown in FIGS. 1 , 2 and 3 , the cutting mechanism 4 as a processing mechanism has two rotating tools 40 including a blade 41A, a blade 41B and two spindles 42A and 42B. The two spindles 42A and 42B are provided with their rotational axes along the Y direction, and the blades 41A and 41B attached to the spindle portions are arranged to face each other (see FIG. 3 ). The blade 41A of the spindle 42A and the blade 41B of the spindle 42B cut the sealed substrate W held on each of the cutting tables 2A and 2B by rotating in the plane including the X direction and the Z direction. In addition, as shown in FIG. 4 , the cutting device 100 of this embodiment is provided with a cutting water supply mechanism (machining fluid supply mechanism) 12 in order to suppress cutting by the blade 41A. , The friction heat generated by the blade 41B causes cutting water as a machining fluid to be sprayed. The cutting water supply mechanism 12 will be described later.

<移載台5> <Transfer stage 5>

如圖1所示,本實施形態的移載台5為移動由後述的檢查部13進行了檢查的多個製品P的台。所述移載台5被稱為所謂索引台,於將多個製品P分類至各種托盤21之前,暫時載置多個製品P。另外,移載台5於水平面上沿著X方向與兩個切斷用台2A、2B配置成一行。載置於移載台5的多個製品P根據由檢查部13所得的檢查結果(良品、不良品等)而由分類機構20分類至各種托盤21。 As shown in FIG. 1 , the transfer stage 5 of this embodiment is a stage that moves a plurality of products P inspected by an inspection unit 13 to be described later. The transfer table 5 is called a so-called index table and temporarily places a plurality of products P before sorting the products P into various trays 21 . In addition, the transfer table 5 is arranged in line with the two cutting tables 2A and 2B on the horizontal plane along the X direction. The plurality of products P placed on the transfer table 5 are classified into various trays 21 by the classification mechanism 20 based on the inspection results (good products, defective products, etc.) obtained by the inspection unit 13 .

再者,各種托盤21由沿著傳遞軸71移動的托盤搬送機構22搬送至所需的位置,載置由分類機構20所分類的製品P。經分類後,各種托盤21由托盤搬送機構22收容於托盤收容部23。 Furthermore, the various pallets 21 are conveyed to a required position by the pallet conveying mechanism 22 that moves along the transmission shaft 71, and the products P classified by the sorting mechanism 20 are placed thereon. After sorting, the various pallets 21 are accommodated in the pallet accommodating part 23 by the pallet transport mechanism 22 .

<檢查部13> <Inspection Department 13>

此處,如圖1所示,檢查部13設置於切斷用台2A、切斷用台2B與移載台5之間,對保持於第二保持機構6的多個製品P進行檢查。本實施形態的檢查部13具有檢查製品P的相反面的第一檢查部131、以及檢查製品P的安裝面的第二檢查部132。第一檢查部131為具有用以檢查相反面的光學系統的攝像相機,第二檢查部132為具有用以檢查安裝面的光學系統的攝像相機。再者,亦可將第一檢查部131及第二檢查部132設為共用。 Here, as shown in FIG. 1 , the inspection unit 13 is provided between the cutting table 2A, the cutting table 2B, and the transfer table 5 , and inspects a plurality of products P held by the second holding mechanism 6 . The inspection unit 13 of this embodiment includes a first inspection unit 131 that inspects the opposite surface of the product P, and a second inspection unit 132 that inspects the mounting surface of the product P. The first inspection unit 131 is an imaging camera having an optical system for inspecting the opposite surface, and the second inspection unit 132 is an imaging camera having an optical system for inspecting the mounting surface. Furthermore, the first inspection part 131 and the second inspection part 132 may be shared.

另外,為了能夠藉由檢查部13來檢查多個製品P的兩 面,設置有使多個製品P反轉的反轉機構14(參照圖1)。所述反轉機構14具有保持多個製品P的保持台141、以及使該保持台141以成為表背相反的方式反轉的馬達等反轉部142。 In addition, in order to be able to inspect both of the plurality of products P by the inspection unit 13 On the other hand, a reversing mechanism 14 for reversing a plurality of products P is provided (see FIG. 1 ). The reversal mechanism 14 includes a holding base 141 that holds a plurality of products P, and a reversing portion 142 such as a motor that reverses the holding base 141 so that the front and back thereof are reversed.

於第二保持機構6自加工台2A、加工台2B保持多個製品P時,製品P的相反面朝向下側。於此狀態下,於自加工台2A、加工台2B向反轉機構14搬送多個製品P的中途,藉由第一檢查部131來檢查製品P的相反面。其後,保持於第二保持機構6的多個製品P由反轉機構14反轉,其後,反轉機構14移動至移載台5的位置。於該移動的期間,藉由第二檢查部132來檢查朝向下側的製品P的安裝面。其後,將製品P交接至移載台5。 When the second holding mechanism 6 holds a plurality of products P from the processing tables 2A and 2B, the opposite surface of the products P faces downward. In this state, while the plurality of products P are being transported from the processing tables 2A and 2B to the reversing mechanism 14 , the opposite surface of the products P is inspected by the first inspection unit 131 . Thereafter, the plurality of products P held by the second holding mechanism 6 are reversed by the reversing mechanism 14 , and then the reversing mechanism 14 moves to the position of the transfer table 5 . During this movement, the mounting surface of the product P facing downward is inspected by the second inspection unit 132 . Thereafter, the product P is transferred to the transfer table 5 .

<第二保持機構6> <Second holding mechanism 6>

如圖1所示,第二保持機構6為了將多個製品P自切斷用台2A、切斷用台2B搬送至反轉機構14而保持多個製品P。如圖8所示,所述第二保持機構6具有:吸附頭61,設置有用以吸附保持多個製品P的多個吸附部611;以及真空泵(未圖示),連接於該吸附頭61的吸附部611。然後,吸附頭61藉由後述的搬送用移動機構7等移動至所期望的位置,藉此將多個製品P自切斷用台2A、切斷用台2B搬送至保持台141。 As shown in FIG. 1 , the second holding mechanism 6 holds a plurality of products P in order to transport the plurality of products P from the cutting table 2A and the cutting table 2B to the reversing mechanism 14 . As shown in FIG. 8 , the second holding mechanism 6 includes: an adsorption head 61 provided with a plurality of adsorption portions 611 for adsorbing and holding a plurality of products P; and a vacuum pump (not shown) connected to the adsorption head 61 . Adsorption part 611. Then, the adsorption head 61 is moved to a desired position by the conveyance moving mechanism 7 described below, etc., thereby conveying the plurality of products P from the cutting table 2A and the cutting table 2B to the holding table 141 .

<搬送用移動機構7> <Moving mechanism 7 for transportation>

如圖1所示,搬送用移動機構7使第一保持機構3至少於基板供給機構11與切斷用台2A、切斷用台2B之間移動,並且使第二保持機構6至少於切斷用台2A、切斷用台2B與保持台141之 間移動。 As shown in FIG. 1 , the transport moving mechanism 7 moves the first holding mechanism 3 to a distance between the substrate supply mechanism 11 and the cutting tables 2A and 2B, and moves the second holding mechanism 6 to a distance between the substrate supply mechanism 11 and the cutting tables 2A and 2B. Between the table 2A, the cutting table 2B and the holding table 141 move between.

而且,如圖1所示,搬送用移動機構7具有共用的傳遞軸71,所述共用的傳遞軸71沿著兩個切斷用台2A、2B及移載台5的排列方向(X方向)呈一直線延伸,用以使第一保持機構3及第二保持機構6移動。 Furthermore, as shown in FIG. 1 , the transport moving mechanism 7 has a common transmission shaft 71 along the arrangement direction (X direction) of the two cutting tables 2A, 2B and the transfer table 5 . Extending in a straight line, it is used to move the first holding mechanism 3 and the second holding mechanism 6 .

所述傳遞軸71設於下述範圍,即:第一保持機構3可移動至基板供給機構11的基板供給部112的上方,並且第二保持機構6可移動至移載台5的上方(參照圖1)。另外,相對於所述傳遞軸71,第一保持機構3、第二保持機構6、切斷用台2A、切斷用台2B及移載台5於俯視時設置於相同側(近前側)。此外,檢查部13、反轉機構14、各種托盤21、托盤搬送機構22、托盤收容部23、後述的第一清潔機構18及第二清潔機構19、回收容器172亦相對於傳遞軸71而設置於相同側(近前側)。 The transmission shaft 71 is provided in a range in which the first holding mechanism 3 can move above the substrate supply part 112 of the substrate supply mechanism 11 and the second holding mechanism 6 can move above the transfer stage 5 (see Figure 1). In addition, with respect to the transmission shaft 71 , the first holding mechanism 3 , the second holding mechanism 6 , the cutting table 2A, the cutting table 2B, and the transfer table 5 are provided on the same side (the near side) in plan view. In addition, the inspection part 13 , the reversing mechanism 14 , various pallets 21 , the pallet transport mechanism 22 , the pallet storage part 23 , the first cleaning mechanism 18 and the second cleaning mechanism 19 described below, and the recovery container 172 are also provided relative to the transmission shaft 71 On the same side (near front side).

進而,如圖5、圖6及圖8所示,搬送用移動機構7具有:主移動機構72,使第一保持機構3及第二保持機構6沿著傳遞軸71於X方向上移動;升降移動機構73,使第一保持機構3及第二保持機構6相對於傳遞軸71於Z方向上升降移動;以及水平移動機構74,使第一保持機構3及第二保持機構6相對於傳遞軸71於Y方向上水平移動。 Furthermore, as shown in FIGS. 5 , 6 and 8 , the transport moving mechanism 7 has: a main moving mechanism 72 for moving the first holding mechanism 3 and the second holding mechanism 6 in the X direction along the transmission shaft 71 ; and a lifting and lowering mechanism. The moving mechanism 73 makes the first holding mechanism 3 and the second holding mechanism 6 move up and down in the Z direction relative to the transmission shaft 71; and the horizontal movement mechanism 74 makes the first holding mechanism 3 and the second holding mechanism 6 move relative to the transmission shaft. 71 moves horizontally in the Y direction.

如圖5~圖8所示,主移動機構72具有:共用的導軌721,設置於傳遞軸71、且導引第一保持機構3及第二保持機構6;以及齒條與小齒輪機構722,使第一保持機構3及第二保持機構6 沿著該導軌721移動。 As shown in Figures 5 to 8, the main moving mechanism 72 has: a common guide rail 721, which is provided on the transmission shaft 71 and guides the first holding mechanism 3 and the second holding mechanism 6; and a rack and pinion mechanism 722, The first holding mechanism 3 and the second holding mechanism 6 Move along the guide rail 721 .

導軌721沿著傳遞軸71於X方向上呈一直線延伸,與傳遞軸71同樣地設於下述範圍,即:第一保持機構3可移動至基板供給機構11的基板供給部112的上方,並且第二保持機構6可移動至移載台5的上方。於所述導軌721,能夠滑動地設置有滑動構件723,所述滑動構件723經由升降移動機構73及水平移動機構74而設置有第一保持機構3及第二保持機構6。此處,導軌721為第一保持機構3及第二保持機構6所共用,但升降移動機構73、水平移動機構74及滑動構件723是針對第一保持機構3及第二保持機構6的各者各別地設置。 The guide rail 721 extends in a straight line in the X direction along the transmission shaft 71 , and is provided in a range where the first holding mechanism 3 can move above the substrate supply part 112 of the substrate supply mechanism 11 , and is similar to the transmission shaft 71 . The second holding mechanism 6 can move above the transfer platform 5 . A sliding member 723 is slidably provided on the guide rail 721 , and the sliding member 723 is provided with a first holding mechanism 3 and a second holding mechanism 6 via a lifting and lowering movement mechanism 73 and a horizontal movement mechanism 74 . Here, the guide rail 721 is common to the first holding mechanism 3 and the second holding mechanism 6 , but the lifting and lowering movement mechanism 73 , the horizontal movement mechanism 74 and the sliding member 723 are specific to each of the first holding mechanism 3 and the second holding mechanism 6 . Set individually.

齒條與小齒輪機構722具有:凸輪齒條722a,為第一保持機構3及第二保持機構6所共用;以及小齒輪722b,分別設置於第一保持機構3及第二保持機構6,藉由致動器(未圖示)旋轉。凸輪齒條722a設置於共用的傳遞軸71,可藉由將多個凸輪齒條要素連結而變更為各種長度。另外,小齒輪722b設置於滑動構件723,被稱為所謂滾子小齒輪(roller pinion),如圖7所示,具有:與馬達的旋轉軸一起旋轉的一對滾子本體722b1;以及於該一對滾子本體722b1之間於圓周方向上等間隔地設置、且設置成能夠相對於滾子本體722b1滾動的多個滾子銷722b2。本實施形態的齒條與小齒輪機構722使用所述滾子小齒輪,因此兩個以上的滾子銷722b2與凸輪齒條722a接觸,於正反方向上不產生背隙(backlash),於使第一保持機構3及第二保持機構6於X方向上 移動時定位精度變良好。 The rack and pinion mechanism 722 has: a cam rack 722a, which is shared by the first holding mechanism 3 and the second holding mechanism 6; and a pinion 722b, which is respectively provided in the first holding mechanism 3 and the second holding mechanism 6. Rotated by an actuator (not shown). The cam rack 722a is provided on the common transmission shaft 71 and can be changed to various lengths by connecting a plurality of cam rack elements. In addition, the pinion 722b is provided on the sliding member 723 and is called a so-called roller pinion. As shown in FIG. 7, it has a pair of roller bodies 722b1 that rotate together with the rotation axis of the motor; A plurality of roller pins 722b2 are provided at equal intervals in the circumferential direction between the pair of roller bodies 722b1 and are configured to be able to roll relative to the roller body 722b1. The rack and pinion mechanism 722 of this embodiment uses the roller pinion. Therefore, two or more roller pins 722b2 are in contact with the cam rack 722a, and no backlash is generated in the forward and reverse directions, making it easier to operate. The first holding mechanism 3 and the second holding mechanism 6 are in the X direction Positioning accuracy becomes better when moving.

如圖5及圖8所示,升降移動機構73與第一保持機構3及第二保持機構6分別對應地設置。如圖5及圖6所示,第一保持機構3的升降移動機構73介隔存在於傳遞軸71(具體而言為主移動機構72)與第一保持機構3之間而設置,具有:Z方向導軌73a,沿著Z方向設置;以及致動器部73b,使第一保持機構3沿著該Z方向導軌73a移動。再者,致動器部73b例如可使用滾珠螺桿機構,亦可使用氣缸,亦可使用線性馬達。再者,如圖8所示,第二保持機構6的升降移動機構73的結構與第一保持機構3的升降移動機構73同樣。 As shown in FIGS. 5 and 8 , the lifting and lowering movement mechanism 73 is provided corresponding to the first holding mechanism 3 and the second holding mechanism 6 respectively. As shown in FIGS. 5 and 6 , the lifting and lowering movement mechanism 73 of the first holding mechanism 3 is interposed between the transmission shaft 71 (specifically, the main movement mechanism 72 ) and the first holding mechanism 3 and has: Z The direction guide rail 73a is provided along the Z direction; and the actuator portion 73b moves the first holding mechanism 3 along the Z direction guide rail 73a. Furthermore, the actuator part 73b may use a ball screw mechanism, a cylinder, or a linear motor, for example. Furthermore, as shown in FIG. 8 , the structure of the lifting and lowering movement mechanism 73 of the second holding mechanism 6 is the same as that of the lifting and lowering movement mechanism 73 of the first holding mechanism 3 .

如圖5及圖8所示,水平移動機構74與第一保持機構3及第二保持機構6分別對應地設置。如圖5及圖6所示,第一保持機構3的水平移動機構74是介隔存在於傳遞軸71(具體而言為升降移動機構73)與第一保持機構3之間而設置,具有:Y方向導軌74a,沿著Y方向設置;彈性體74b,對第一保持機構3向Y方向導軌74a的其中一側賦予力;以及凸輪機構74c,使第一保持機構3向Y方向導軌74a的另一側移動。此處,凸輪機構74c使用偏心凸輪,藉由利用馬達等致動器使該偏心凸輪旋轉,可調整第一保持機構3向Y方向的移動量。 As shown in FIGS. 5 and 8 , the horizontal movement mechanism 74 is provided corresponding to the first holding mechanism 3 and the second holding mechanism 6 respectively. As shown in FIGS. 5 and 6 , the horizontal movement mechanism 74 of the first holding mechanism 3 is interposed between the transmission shaft 71 (specifically, the lifting movement mechanism 73 ) and the first holding mechanism 3 and has: The Y-direction guide rail 74a is provided along the Y-direction; the elastic body 74b applies force to the first holding mechanism 3 to one side of the Y-direction guide rail 74a; and the cam mechanism 74c makes the first holding mechanism 3 move toward one side of the Y-direction guide rail 74a. Move on the other side. Here, an eccentric cam is used as the cam mechanism 74c. By rotating the eccentric cam using an actuator such as a motor, the movement amount of the first holding mechanism 3 in the Y direction can be adjusted.

再者,如圖8所示,第二保持機構6的水平移動機構74的結構與第一保持機構3的升降移動機構73同樣。另外,可設為於第二保持機構6不設置水平移動機構74的結構,亦可設為於第 一保持機構3及第二保持機構6兩者不設置水平移動機構74的結構。進而,水平移動機構74與升降移動機構73同樣地,亦可不使用凸輪機構74c而使用例如滾珠螺桿機構,亦可使用氣缸,亦可使用線性馬達。 Furthermore, as shown in FIG. 8 , the structure of the horizontal movement mechanism 74 of the second holding mechanism 6 is the same as that of the lifting movement mechanism 73 of the first holding mechanism 3 . In addition, the second holding mechanism 6 may not be provided with the horizontal moving mechanism 74 , or the second holding mechanism 6 may be provided with the horizontal moving mechanism 74 . Both the first holding mechanism 3 and the second holding mechanism 6 are not provided with a horizontal moving mechanism 74 . Furthermore, like the up-and-down movement mechanism 73 , the horizontal movement mechanism 74 may not use the cam mechanism 74 c but may use, for example, a ball screw mechanism, a cylinder, or a linear motor.

<切斷用移動機構8(加工用移動機構)> <Moving mechanism for cutting 8 (moving mechanism for processing)>

切斷用移動機構8使兩個心軸42A、42B的各者於X方向、Y方向及Z方向的各方向上直線移動。 The moving mechanism 8 for cutting linearly moves each of the two spindles 42A and 42B in each of the X direction, the Y direction, and the Z direction.

具體而言,如圖2~圖4、圖9~圖11所示,切斷用移動機構8包括:X方向移動部81,使心軸42A、心軸42B於X方向上直線移動;Y方向移動部82,使心軸42A、心軸42B於Y方向上直線移動;以及Z方向移動部83,使心軸42A、心軸42B於Z方向上直線移動。於本實施形態中,利用該切斷用移動機構8的切斷機構4的加工進給方向SD是沿著X方向朝向一側的方向(沿著X方向自另一側朝向其中一側的方向)(參照圖3等)。 Specifically, as shown in FIGS. 2 to 4 and 9 to 11 , the moving mechanism 8 for cutting includes: an X-direction moving part 81 for linearly moving the spindles 42A and 42B in the X direction; The moving part 82 linearly moves the spindles 42A and 42B in the Y direction; and the Z-direction moving part 83 linearly moves the spindles 42A and 42B in the Z direction. In this embodiment, the processing feed direction SD of the cutting mechanism 4 using the cutting moving mechanism 8 is a direction toward one side along the X direction (a direction from the other side toward one of the sides along the X direction). ) (refer to Figure 3, etc.).

X方向移動部81為兩個切斷用台2A、2B所共用,尤其如圖2及圖3所示,具有:一對X方向導軌811,沿著X方向隔著兩個切斷用台2A、2B而設置;以及支撐體812,沿著該一對X方向導軌811移動並且經由Y方向移動部82及Z方向移動部83支撐心軸42A、心軸42B。一對X方向導軌811設置於沿著X方向設置的兩個切斷用台2A、2B的側方。另外,支撐體812例如為門型,具有沿Y方向延伸的形狀。具體而言,支撐體812具有自一對X方向導軌811向上方延伸的一對腳部、以及架設於該一對 腳部的樑部(橫樑部),該樑部沿Y方向延伸。於該支撐體812中的沿著X方向的其中一側(朝向加工進給方向SD之側)設置有切斷機構4的心軸42A、心軸42B。 The X-direction moving part 81 is shared by the two cutting tables 2A and 2B. As shown in FIGS. 2 and 3 , the X-direction moving part 81 has a pair of X-direction guide rails 811 across the two cutting tables 2A along the X direction. , 2B; and the support body 812 moves along the pair of X-direction guide rails 811 and supports the spindles 42A and 42B via the Y-direction moving part 82 and the Z-direction moving part 83. A pair of X-direction guide rails 811 are provided on the sides of the two cutting tables 2A and 2B provided along the X-direction. In addition, the support body 812 is, for example, gate-shaped and has a shape extending in the Y direction. Specifically, the support body 812 has a pair of legs extending upward from a pair of X-direction guide rails 811, and is installed on the pair of X-direction guide rails 811. The beam portion (crossbeam portion) of the foot portion extends in the Y direction. The spindles 42A and 42B of the cutting mechanism 4 are provided on one side of the support body 812 along the X direction (the side facing the processing feed direction SD).

而且,支撐體812例如藉由沿X方向延伸的滾珠螺桿機構813而於一對X方向導軌811上沿著X方向直線性地往返移動。所述滾珠螺桿機構813由伺服馬達等驅動源(未圖示)驅動。除此以外,支撐體812亦可以藉由線性馬達等其他直動機構而往返移動的方式構成。 Furthermore, the support body 812 linearly reciprocates along the X direction on a pair of X direction guide rails 811 by, for example, a ball screw mechanism 813 extending in the X direction. The ball screw mechanism 813 is driven by a drive source (not shown) such as a servo motor. In addition, the support body 812 may also be configured to reciprocate by a linear motor or other linear motion mechanism.

尤其如圖3所示,Y方向移動部82具有:Y方向導軌821,於支撐體812中沿著Y方向設置;以及Y方向滑塊822,沿著該Y方向導軌821移動。再者,Y方向移動部82設置於支撐體812中的沿著X方向的其中一側(朝向加工進給方向SD之側)。Y方向滑塊822例如由線性馬達823驅動,於Y方向導軌821上直線性地往返移動。於本實施形態中,與兩個心軸42A、42B對應地設置有兩個Y方向滑塊822。藉此,兩個心軸42A、42B能夠相互獨立地於Y方向上移動。除此以外,Y方向滑塊822亦可以藉由使用滾珠螺桿機構的其他直動機構而往返移動的方式構成。 Especially as shown in FIG. 3 , the Y-direction moving part 82 has a Y-direction guide rail 821 provided along the Y-direction in the support body 812 and a Y-direction slider 822 that moves along the Y-direction guide rail 821 . Furthermore, the Y-direction moving part 82 is provided on one side of the support body 812 along the X direction (the side facing the processing feed direction SD). The Y-direction slider 822 is driven by a linear motor 823, for example, and moves linearly back and forth on the Y-direction guide rail 821. In this embodiment, two Y-direction sliders 822 are provided corresponding to the two spindles 42A and 42B. Thereby, the two spindles 42A and 42B can move in the Y direction independently of each other. In addition, the Y-direction slider 822 can also be configured to reciprocate by using other linear motion mechanisms such as ball screw mechanisms.

如圖9~圖11所示,Z方向移動部83具有:Z方向導軌831,於各Y方向滑塊822中沿著Z方向設置;以及Z方向滑塊832,沿著所述Z方向導軌831移動並且支撐心軸42A、心軸42B。即,Z方向移動部83與各心軸42A、42B對應地設置。Z方向滑塊832例如由偏心凸輪機構(未圖示)驅動,於Z方向導軌 831上直線性地往返移動。除此以外,Z方向滑塊832亦可以藉由滾珠螺桿機構等其他直動機構而往返移動的方式構成。 As shown in FIGS. 9 to 11 , the Z-direction moving part 83 has: a Z-direction guide rail 831 provided along the Z direction in each Y-direction slider 822 ; and a Z-direction slider 832 along the Z-direction guide rail 831 The spindles 42A and 42B are moved and supported. That is, the Z-direction moving part 83 is provided corresponding to each of the spindles 42A and 42B. The Z-direction slider 832 is driven by an eccentric cam mechanism (not shown), for example, and moves along the Z-direction guide rail. 831 moves back and forth linearly. In addition, the Z-direction slider 832 can also be configured to move back and forth by other linear motion mechanisms such as a ball screw mechanism.

關於所述切斷用移動機構8與傳遞軸71的位置關係,如圖1及圖4所示,以傳遞軸71於切斷用移動機構8的上方橫穿切斷用移動機構8的方式配置。具體而言,傳遞軸71以於支撐體812的上方橫穿該支撐體812的方式配置,傳遞軸71及支撐體812成為相互交叉的位置關係。 Regarding the positional relationship between the cutting moving mechanism 8 and the transmission shaft 71 , as shown in FIGS. 1 and 4 , the transmission shaft 71 is arranged above the cutting moving mechanism 8 and traverses the cutting moving mechanism 8 . . Specifically, the transmission shaft 71 is disposed above the support body 812 and crosses the support body 812 , and the transmission shaft 71 and the support body 812 have a mutually intersecting positional relationship.

<蓋構件15> <Cover member 15>

如圖3、圖4、圖9~圖11所示,於所述切斷用移動機構8中,於支撐體812設置有收容兩個心軸42A、42B的蓋構件15。再者,於圖2中省略了蓋構件15。該蓋構件15設置於支撐體812中的沿著X方向的其中一側(朝向加工進給方向SD之側),不僅收容切斷機構4的兩個心軸42A、42B,而且收容切削水供給機構12的噴射噴嘴121,以使自噴射噴嘴121噴射的切削水不會向周圍飛散。 As shown in FIGS. 3 , 4 , and 9 to 11 , in the cutting moving mechanism 8 , the support body 812 is provided with a cover member 15 that accommodates the two spindles 42A and 42B. In addition, the cover member 15 is omitted in FIG. 2 . This cover member 15 is provided on one side of the support body 812 along the X direction (the side facing the machining feed direction SD), and accommodates not only the two spindles 42A and 42B of the cutting mechanism 4 but also the cutting water supply. The injection nozzle 121 of the mechanism 12 is configured so that the cutting water injected from the injection nozzle 121 does not scatter around.

具體而言,如圖9~圖11所示,蓋構件15於下表面形成有用以使刀片41A、刀片41B露出的開口部15a。另外,於蓋構件15的上表面形成有開口部15b,以不妨礙心軸42A、心軸42B或切斷用移動機構8的移動。所述上表面的開口部15b被蛇腹構件16封閉,且構成為蛇腹構件16伴隨心軸42A、心軸42B的移動而伸縮。藉由該些蓋構件15及蛇腹構件16,支撐體812中的沿著X方向的其中一側(朝向加工進給方向SD之側)成為心軸42A、 心軸42B的X方向的兩側、Y方向的兩側及上側被覆蓋的結構,自噴射噴嘴121噴射的切削水飛散的範圍受到限制。另外,於蓋構件15的近前側(與支撐體812相反之側)的側壁形成有能夠視認蓋構件15的內部的窗151(參照圖10、圖11)。進而,藉由利用排氣機構(未圖示)對所述蓋構件15的內部進行排氣,可有效果地將液滴(霧)排出至外部。 Specifically, as shown in FIGS. 9 to 11 , the cover member 15 has an opening 15 a formed on the lower surface to expose the blades 41A and 41B. In addition, an opening 15b is formed on the upper surface of the cover member 15 so as not to interfere with the movement of the spindle 42A, the spindle 42B, or the cutting moving mechanism 8 . The opening 15b of the upper surface is closed by the bellows member 16, and the bellows member 16 is configured to expand and contract in accordance with the movement of the spindles 42A and 42B. By these cover members 15 and bellows members 16, one side of the support body 812 along the X direction (the side facing the processing feed direction SD) becomes the spindle 42A, The structure in which both sides of the mandrel 42B in the X direction, both sides in the Y direction, and the upper side are covered limits the range in which the cutting water sprayed from the injection nozzle 121 scatters. In addition, a window 151 through which the inside of the cover member 15 can be viewed is formed on the side wall on the front side of the cover member 15 (the side opposite to the support body 812 ) (see FIGS. 10 and 11 ). Furthermore, by exhausting the inside of the cover member 15 using an exhaust mechanism (not shown), the liquid droplets (mists) can be efficiently exhausted to the outside.

<加工屑收容部17> <Machining waste storage portion 17>

另外,如圖1所示,本實施形態的切斷裝置100更包括加工屑收容部17,所述加工屑收容部17收容因密封完畢基板W的切斷而產生的端材等加工屑S。 In addition, as shown in FIG. 1 , the cutting device 100 of this embodiment further includes a processing waste storage portion 17 that stores processing waste S such as end materials generated when the sealed substrate W is cut.

如圖2~圖4所示,所述加工屑收容部17設置於切斷用台2A、切斷用台2B的下方,具有:導引滑槽171,具有於俯視時包圍切斷用台2A、切斷用台2B的上部開口171X;以及回收容器172,將由該導引滑槽171所導引的加工屑S回收。藉由將加工屑收容部17設置於切斷用台2A、切斷用台2B的下方,可提高加工屑S的回收率。 As shown in FIGS. 2 to 4 , the processing chip storage part 17 is provided below the cutting table 2A and the cutting table 2B, and has a guide chute 171 surrounding the cutting table 2A in plan view. , the upper opening 171X of the cutting table 2B; and the recovery container 172 for recovering the processing chips S guided by the guide chute 171 . By arranging the processing waste storage portion 17 below the cutting tables 2A and 2B, the recovery rate of the processing waste S can be improved.

導引滑槽171將自切斷用台2A、切斷用台2B飛散或掉落的加工屑S引導至回收容器172。本實施形態中,以導引滑槽171的上部開口171X包圍切斷用台2A、切斷用台2B的方式構成(參照圖3),因此不易漏掉加工屑S,可進一步提高加工屑S的回收率。另外,導引滑槽171以包圍設置於切斷用台2A、切斷用台2B之下的旋轉機構9A、旋轉機構9B的方式設置(參照圖4), 以保護旋轉機構9A、旋轉機構9B免受加工屑S及切削水影響的方式構成。 The guide chute 171 guides the processing chips S scattered or dropped from the cutting tables 2A and 2B to the recovery container 172 . In this embodiment, the upper opening 171X of the guide chute 171 is configured to surround the cutting tables 2A and 2B (see FIG. 3 ). Therefore, the processing chips S are less likely to be missed, and the processing chips S can be further increased. recovery rate. In addition, the guide chute 171 is provided to surround the rotating mechanisms 9A and 9B provided under the cutting tables 2A and 2B (see FIG. 4 ). It is configured to protect the rotating mechanism 9A and the rotating mechanism 9B from the influence of machining chips S and cutting water.

於本實施形態中,加工屑收容部17為兩個切斷用台2A、2B所共用,但亦可與切斷用台2A、切斷用台2B分別對應地設置。 In this embodiment, the processing chip receiving part 17 is shared by the two cutting tables 2A and 2B, but may be provided corresponding to the cutting table 2A and the cutting table 2B respectively.

回收容器172將因自重而通過導引滑槽171的加工屑S回收,於本實施形態中,如圖4等所示,與兩個切斷用台2A、2B分別對應地設置。而且,兩個回收容器172配置於傳遞軸的近前側,且以可分別獨立地自切斷裝置100的近前側卸除的方式構成。藉由所述結構,可提高加工屑S的廢棄等的維護性。再者,回收容器172可想到密封完畢基板W的尺寸或加工屑S的尺寸及量、作業性等而於所有切斷用台的下方整體設置一個,亦可設置三個以上。 The recovery container 172 collects the processing chips S that have passed through the guide chute 171 due to its own weight. In the present embodiment, as shown in FIG. 4 and others, the recovery container 172 is provided corresponding to the two cutting tables 2A and 2B. Furthermore, the two recovery containers 172 are arranged on the front side of the transmission shaft, and are configured to be independently detachable from the front side of the cutting device 100 . With this structure, maintenance such as disposal of machining chips S can be improved. Furthermore, one recovery container 172 may be provided under all the cutting tables, or three or more recovery containers 172 may be provided in consideration of the size of the sealed substrate W, the size and amount of the processing chips S, workability, etc.

另外,如圖4等所示,加工屑收容部17具有將切削水與加工屑分離的分離部173。作為所述分離部173的結構,例如可考慮於回收容器172的底面設置使切削水通過的多孔板等過濾器。藉由所述分離部173,可不於在回收容器172蓄積切削水的情況下將加工屑S回收。 In addition, as shown in FIG. 4 etc., the machining chip storage part 17 has the separation part 173 which separates cutting water and machining chips. As a structure of the separation unit 173 , for example, a filter such as a porous plate that allows cutting water to pass is provided on the bottom surface of the recovery container 172 . The separation part 173 makes it possible to collect the machining chips S without accumulating cutting water in the recovery container 172 .

<第一清潔機構18> <First Cleaning Mechanism 18>

另外,如圖1及圖5所示,本發明的切斷裝置100更包括第一清潔機構18,所述第一清潔機構18對保持於切斷用台2A、切斷用台2B的多個製品P的上表面側(安裝面)進行清潔。所述第 一清潔機構18藉由對保持於切斷用台2A、切斷用台2B的多個製品P的上表面噴射洗淨液及/或壓縮空氣的噴射噴嘴18a(參照圖5),來對製品P的上表面側進行清潔。 In addition, as shown in FIGS. 1 and 5 , the cutting device 100 of the present invention further includes a first cleaning mechanism 18 . The first cleaning mechanism 18 cleans a plurality of cutting tables held on the cutting tables 2A and 2B. Clean the upper surface side (mounting surface) of product P. The mentioned A cleaning mechanism 18 cleans the products by injecting cleaning fluid and/or compressed air from the injection nozzle 18a (see FIG. 5 ) onto the upper surfaces of the plurality of products P held on the cutting tables 2A and 2B. Clean the upper surface side of P.

如圖5所示,所述第一清潔機構18構成為能夠與第一保持機構3一起沿著傳遞軸71移動。此處,第一清潔機構18設置於滑動構件723,所述滑動構件723在設置於傳遞軸71的導軌721上滑動。此處,於第一清潔機構18及滑動構件723之間,設置有用以使第一清潔機構18於Z方向上升降移動的升降移動機構181。關於所述升降移動機構181,例如可考慮使用齒條與小齒輪機構,使用滾珠螺桿機構,或使用氣缸等。 As shown in FIG. 5 , the first cleaning mechanism 18 is configured to move along the transmission shaft 71 together with the first holding mechanism 3 . Here, the first cleaning mechanism 18 is provided on the sliding member 723 which slides on the guide rail 721 provided on the transmission shaft 71 . Here, between the first cleaning mechanism 18 and the sliding member 723, an up-and-down movement mechanism 181 for moving the first cleaning mechanism 18 up and down in the Z direction is provided. As the lifting and lowering movement mechanism 181 , for example, it may be considered to use a rack and pinion mechanism, a ball screw mechanism, or a cylinder.

<第二清潔機構19> <Second cleaning mechanism 19>

進而,如圖1所示,本發明的切斷裝置100更包括第二清潔機構19,所述第二清潔機構19對保持於第二保持機構6的多個製品P的下表面側(相反面)進行清潔。所述第二清潔機構19設置於切斷用台2B與檢查部13之間,藉由向保持於第二保持機構6的多個製品P的下表面噴射洗淨液及/或壓縮空氣,而對製品P的下表面側進行清潔。即,於第二保持機構6沿著傳遞軸71移動的中途,第二清潔機構19對製品P的下表面側進行清潔。 Furthermore, as shown in FIG. 1 , the cutting device 100 of the present invention further includes a second cleaning mechanism 19 that cleans the lower surface side (opposite surface) of the plurality of products P held by the second holding mechanism 6 . ) for cleaning. The second cleaning mechanism 19 is provided between the cutting table 2B and the inspection part 13, and injects cleaning liquid and/or compressed air onto the lower surfaces of the plurality of products P held by the second holding mechanism 6. The lower surface side of product P is cleaned. That is, while the second holding mechanism 6 is moving along the transmission shaft 71 , the second cleaning mechanism 19 cleans the lower surface side of the product P.

<加工液供給機構12(切削水供給機構)及加工液飛散防止機構24(切削水飛散防止機構)> <Machining fluid supply mechanism 12 (cutting water supply mechanism) and machining fluid scattering prevention mechanism 24 (cutting water scattering prevention mechanism)>

於本實施形態中,如上所述,切斷機構4的加工進給方向SD以成為朝向沿著X方向的一側的方向(於圖3中為自紙面上向下 移動的方向,於圖4中為自紙面右向左移動的方向)的方式構成。 In this embodiment, as described above, the processing feed direction SD of the cutting mechanism 4 is directed toward one side along the X direction (in FIG. 3 , downward from the paper surface). The direction of movement is the direction of movement from right to left on the paper in Figure 4).

而且,如圖3、圖4、圖10及圖11所示,本實施形態的切斷裝置100包括:藉由切斷用移動機構8而與切斷機構4一起移動的切削水供給機構12、以及防止切削水的飛散的切削水飛散防止機構24。 Furthermore, as shown in FIGS. 3 , 4 , 10 and 11 , the cutting device 100 of this embodiment includes a cutting water supply mechanism 12 that moves together with the cutting mechanism 4 by a cutting moving mechanism 8 . and a cutting water scattering prevention mechanism 24 that prevents the cutting water from scattering.

此處,於支撐體812中的沿著X方向的其中一側(朝向加工進給方向SD之側)設置有切斷機構4及切削水供給機構12,於支撐體812的沿著X方向的另一側(與加工進給方向SD相反之側)設置有切削水飛散防止機構24。 Here, the cutting mechanism 4 and the cutting water supply mechanism 12 are provided on one side of the support body 812 along the X direction (the side facing the machining feed direction SD). A cutting water scattering prevention mechanism 24 is provided on the other side (the side opposite to the machining feed direction SD).

如圖10及圖11所示,切削水供給機構12具有自加工進給方向SD的前側向切斷機構4的刀片41A、刀片41B噴射切削水的噴射噴嘴121,該噴射噴嘴121例如由Z方向移動部83支撐。具體而言,噴射噴嘴121相對於切斷機構4的刀片41A、刀片41B,自與支撐體812相反之側朝向切斷機構4的刀片41A、刀片41B噴射切削水。 As shown in FIGS. 10 and 11 , the cutting water supply mechanism 12 has an injection nozzle 121 for injecting cutting water from the front side in the machining feed direction SD to the blades 41A and 41B of the cutting mechanism 4 . The injection nozzle 121 sprays cutting water from the Z direction, for example. The moving part 83 supports. Specifically, the injection nozzle 121 injects cutting water toward the blades 41A and 41B of the cutting mechanism 4 from the side opposite to the support 812 .

切削水飛散防止機構24具有相對於切斷機構4而設置於加工進給方向SD的後側,並且自較切斷用台2A、切斷用台2B的上表面更靠下側的位置覆蓋上方的結構。 The cutting water scattering prevention mechanism 24 is provided on the rear side of the cutting mechanism 4 in the machining feed direction SD, and covers the upper side from a position lower than the upper surfaces of the cutting tables 2A and 2B. structure.

具體而言,如圖3、圖4、圖10及圖11所示,切削水飛散防止機構24具有:伴隨切斷機構4的移動而伸縮的蛇腹構件241、以及連接有蛇腹構件241的加工進給方向SD上的後端部的擋板構件242。 Specifically, as shown in FIGS. 3 , 4 , 10 and 11 , the cutting water scattering prevention mechanism 24 includes a bellows member 241 that expands and contracts with the movement of the cutting mechanism 4 , and a machining process member 241 connected to the bellows member 241 . To the baffle member 242 at the rear end in the direction SD.

蛇腹構件241覆蓋與加工進給方向SD正交的上方及側方。具體而言,蛇腹構件241具有覆蓋側方的一對側壁部、以及與該一對側壁部的上端連續地設置並覆蓋上方的上壁部。另外,蛇腹構件241的加工進給方向SD的前端部連接於支撐體812的側面(與加工進給方向SD相反之側的面)。另外,擋板構件242覆蓋加工進給方向SD的後方。藉由該些蛇腹構件241及擋板構件242,通過支撐體812的下方(具體而言為支撐體812的樑部的下方)並相對於支撐體812向與加工進給方向SD相反之側飛散的切削水被封入於由蛇腹構件241及擋板構件242包圍的空間中。此處,藉由利用排氣機構(未圖示)對加工屑收容部17的導引滑槽171的內部進行排氣,可有效果地將液滴(霧)排出至外部。 The bellows member 241 covers the upper side and the side orthogonal to the processing feed direction SD. Specifically, the bellows member 241 has a pair of side wall parts that cover the sides, and an upper wall part that is provided continuously with the upper ends of the pair of side wall parts and covers the upper side. In addition, the front end portion of the bellows member 241 in the processing feed direction SD is connected to the side surface of the support body 812 (the surface on the opposite side to the processing feed direction SD). In addition, the baffle member 242 covers the rear side in the processing feed direction SD. By these bellows members 241 and baffle members 242, the material passes below the support body 812 (specifically, below the beam portion of the support body 812) and is scattered toward the side opposite to the processing feed direction SD with respect to the support body 812. The cutting water is enclosed in the space surrounded by the bellows member 241 and the baffle member 242 . Here, by exhausting the inside of the guide chute 171 of the machining chip storage portion 17 using an exhaust mechanism (not shown), the liquid droplets (mists) can be efficiently exhausted to the outside.

另外,如圖3、圖4、圖10及圖11所示,切削水飛散防止機構24具有於利用切斷機構4切斷密封完畢基板W時將擋板構件242固定於切斷用台2A、切斷用台2B的固定部243A、固定部243B。於本實施形態中,由於具有兩個切斷用台2A、2B,因此固定部243A、固定部243B與兩個切斷用台2A、2B分別對應地設置。具體而言,各固定部243A、243B相對於各切斷用台2A、2B而設置於加工進給方向SD的後側。另外,各固定部243A、243B為了對擋板構件242的Y方向上的兩端部進行固定而沿著Y方向設置有兩個(參照圖3)。 In addition, as shown in FIGS. 3 , 4 , 10 and 11 , the cutting water scattering prevention mechanism 24 has the function of fixing the baffle member 242 to the cutting table 2A when the sealed substrate W is cut by the cutting mechanism 4 . Fixed portion 243A and fixed portion 243B of the cutting table 2B. In this embodiment, since there are two cutting stands 2A and 2B, the fixing portions 243A and 243B are provided corresponding to the two cutting stands 2A and 2B, respectively. Specifically, each fixing portion 243A, 243B is provided on the rear side in the processing feed direction SD with respect to each cutting table 2A, 2B. In addition, two of each of the fixing portions 243A and 243B are provided along the Y direction in order to fix both end portions of the baffle member 242 in the Y direction (see FIG. 3 ).

而且,擋板構件242藉由切斷用移動機構8的X方向移動部81,分別移動至與兩個切斷用台2A、2B分別對應地設置的 固定部243A、固定部243B。 Furthermore, the baffle members 242 are moved by the X-direction moving part 81 of the cutting moving mechanism 8 to respective positions corresponding to the two cutting tables 2A and 2B. Fixed part 243A, fixed part 243B.

此處,擋板構件242的下端部於利用切斷機構4切斷密封完畢基板W時,處於較各切斷用台2A、2B的上表面低的位置。因此,如圖10、圖11及圖12所示,本實施形態的擋板構件242構成為能夠於其下端部位於較切斷用台2A、切斷用台2B的上表面更靠上側處的上升位置U(參照圖10、圖12的(a))、與下端部位於較切斷用台2A、切斷用台2B的上表面更靠下側處的下降位置D(參照圖11、圖12的(b))之間移動。再者,亦可將蛇腹構件241的一對側壁部的下端部配置成處於較各切斷用台2A、2B的上表面低的位置。 Here, when the sealed substrate W is cut by the cutting mechanism 4, the lower end portion of the baffle member 242 is positioned lower than the upper surface of each cutting table 2A, 2B. Therefore, as shown in FIGS. 10 , 11 and 12 , the baffle member 242 of this embodiment is configured so that its lower end can be positioned above the upper surfaces of the cutting tables 2A and 2B. The ascending position U (refer to FIGS. 10 and 12(a)) and the descending position D (refer to FIGS. 11 and 2B) with the lower end located lower than the upper surfaces of the cutting platforms 2A and 2B. 12(b)). Furthermore, the lower end portions of the pair of side wall portions of the bellows member 241 may be disposed at a position lower than the upper surfaces of the cutting stands 2A and 2B.

而且,如圖11及圖12的(b)所示,擋板構件242於下降位置D上由固定部243A、固定部243B進行固定。具體而言,藉由設置於擋板構件242的側面的第一突出部242a與固定部243A、固定部243B的凹部嵌合,擋板構件242於下降位置D上被固定。 Furthermore, as shown in FIGS. 11 and 12(b) , the baffle member 242 is fixed at the lowered position D by the fixing parts 243A and 243B. Specifically, the baffle member 242 is fixed in the lowered position D by fitting the first protruding portion 242a provided on the side surface of the baffle member 242 into the recessed portions of the fixing portions 243A and 243B.

另外,擋板構件242以能夠升降移動的方式連接於蛇腹構件241的後端部,如圖3、圖4、圖10~圖12所示,擋板構件242藉由設置於支撐體812的升降移動機構244而升降移動。 In addition, the baffle member 242 is connected to the rear end of the bellows member 241 in a manner that can move up and down. As shown in FIGS. 3 , 4 , 10 to 12 , the baffle member 242 can be lifted and lowered by the lifting mechanism provided on the support body 812 . The moving mechanism 244 moves up and down.

如圖10~圖12所示,升降移動機構244具有:保持擋板構件242的擋板保持部244a、將該擋板保持部244a相對於支撐體812於上下方向(Z方向)上引導的導軌244b、以及使擋板保持部244a沿著導軌244b移動的例如氣缸等驅動部244c。於本實 施形態中,擋板保持部244a具有與設置於擋板構件242的側面的第二突出部242b嵌合的凹部。 As shown in FIGS. 10 to 12 , the lifting and lowering movement mechanism 244 has a baffle holding part 244 a that holds the baffle member 242 , and a guide rail that guides the baffle holding part 244 a in the up and down direction (Z direction) relative to the support body 812 . 244b, and a driving part 244c such as an air cylinder that moves the baffle holding part 244a along the guide rail 244b. Yu Benshi In the embodiment, the baffle holding part 244a has a recessed part that fits into the second protruding part 242b provided on the side surface of the baffle member 242.

藉由利用驅動部244c使擋板保持部244a上升,擋板保持部244a的凹部與第二突出部242b嵌合,擋板保持部244a抬起擋板構件242,擋板構件242移動至上升位置U(參照圖10、圖12的(a))。再者,上升位置U為擋板保持部244a保持有擋板構件242的狀態,利用固定部243A、固定部243B對擋板構件242的固定被解除。 By raising the baffle holding part 244a by the driving part 244c, the recessed part of the baffle holding part 244a is fitted into the second protruding part 242b, the baffle holding part 244a lifts the baffle member 242, and the baffle member 242 moves to the raised position. U (see (a) of Fig. 10 and Fig. 12 ). In addition, the raised position U is a state in which the baffle member 242 is held by the baffle holding part 244a, and the fixing of the baffle member 242 by the fixing parts 243A and 243B is released.

<伴隨切削的切削水飛散防止機構24的動作> <Operation of the cutting water scattering prevention mechanism 24 accompanying cutting>

接著,考慮於圖4左側的切斷用台2A中切斷密封完畢基板W的情況,參照圖10~圖14對切削水飛散防止機構24的動作進行說明。 Next, considering the case where the sealed substrate W is cut on the cutting table 2A on the left side of FIG. 4 , the operation of the cutting water scattering prevention mechanism 24 will be described with reference to FIGS. 10 to 14 .

首先,使升降移動機構244的擋板保持部244a上升,使擋板保持部244a與擋板構件242的第二突出部242b嵌合,使擋板構件242上升至上升位置U(參照圖10、圖12的(a)、圖13的(a))。另外,藉由搬送用移動機構7使保持有密封完畢基板W的第一保持機構3移動至切斷用台2A,將密封完畢基板W載置於切斷用台2A(參照圖13的(a))。於該狀態下,使切斷用移動機構8的支撐體812向沿著X方向的其中一側移動,使擋板構件242移動至與左側的切斷用台2A對應的固定部243A的上方。於該位置上,若使升降移動機構244的擋板保持部244a下降,則擋板構件242下降至下降位置D,與固定部243A嵌合而被固定(參 照圖12的(b)、圖13的(b))。再者,若使擋板構件242處於下降位置D,則利用擋板保持部244a對擋板構件242的保持被解除。 First, the baffle holding part 244a of the lifting and lowering movement mechanism 244 is raised, the baffle holding part 244a is fitted with the second protruding part 242b of the baffle member 242, and the baffle member 242 is raised to the raised position U (see FIG. 10, Figure 12 (a), Figure 13 (a)). In addition, the first holding mechanism 3 holding the sealed substrate W is moved to the cutting table 2A by the transport moving mechanism 7, and the sealed substrate W is placed on the cutting table 2A (see (a) of FIG. 13 )). In this state, the support body 812 of the cutting moving mechanism 8 is moved to one side along the X direction, and the baffle member 242 is moved above the fixing portion 243A corresponding to the left cutting table 2A. In this position, when the baffle holding part 244a of the lifting and lowering movement mechanism 244 is lowered, the baffle member 242 is lowered to the lowering position D, and is fitted and fixed with the fixing part 243A (see See Figure 12(b) and Figure 13(b)). Furthermore, when the baffle member 242 is placed in the lowered position D, the retaining of the baffle member 242 by the baffle holding portion 244a is released.

於擋板構件242由固定部243A固定之後,一邊自切削水供給機構12的噴射噴嘴121噴射切削水,一邊藉由切斷用移動機構8使切斷機構4於加工進給方向SD上移動,同時切斷密封完畢基板W(參照圖11、圖13的(c))。於該切斷動作中,伴隨切斷機構4及支撐體812的移動,於蛇腹構件241的後端部固定於擋板構件242的狀態下,蛇腹構件241伸縮。藉此,通過支撐體812的下方並飛散的切削水被蛇腹構件241及擋板構件242遮擋,而防止切削水飛散至右側的切斷用台2B等。 After the baffle member 242 is fixed by the fixing part 243A, the cutting mechanism 4 is moved in the machining feed direction SD by the cutting moving mechanism 8 while injecting cutting water from the injection nozzle 121 of the cutting water supply mechanism 12. At the same time, the sealed substrate W is cut (see (c) of FIG. 11 and FIG. 13 ). In this cutting operation, along with the movement of the cutting mechanism 4 and the support body 812, the bellows member 241 expands and contracts while the rear end of the bellows member 241 is fixed to the baffle member 242. Thereby, the cutting water that passes under the support body 812 and scatters is blocked by the bellows member 241 and the baffle member 242 , thereby preventing the cutting water from scattering to the right cutting table 2B and the like.

當密封完畢基板W的切斷結束時,使切斷用移動機構8的支撐體812移動至固定部243A的附近,使擋板保持部244a移動至可與擋板構件242的第二突出部242b嵌合的位置。於該狀態下,使升降移動機構244的擋板保持部244a上升,使擋板保持部244a與第二突出部242b嵌合,並且使擋板構件242移動至上升位置U(參照圖12的(a)、圖14的(d))。藉此,利用固定部243A對擋板構件242的固定被解除。然後,使切斷用移動機構8的支撐體812移動至不妨礙多個製品P的搬送的位置。於該狀態下,搬送用移動機構7使第二保持機構6移動至切斷後的切斷用台2A,第二保持機構6吸附保持多個製品P,多個製品P自切斷用台2A被搬送(參照圖14的(e))。 When the cutting of the sealed substrate W is completed, the support body 812 of the cutting moving mechanism 8 is moved to the vicinity of the fixed part 243A, and the baffle holding part 244a is moved to a position where it can connect with the second protruding part 242b of the baffle member 242 The position of the chimera. In this state, the baffle holding part 244a of the lifting and lowering movement mechanism 244 is raised, the baffle holding part 244a is fitted with the second protruding part 242b, and the baffle member 242 is moved to the raised position U (see ( in FIG. 12 a), (d) of Figure 14). Thereby, the fixing of the baffle member 242 by the fixing part 243A is released. Then, the support body 812 of the cutting moving mechanism 8 is moved to a position that does not interfere with the transportation of the plurality of products P. In this state, the conveyance moving mechanism 7 moves the second holding mechanism 6 to the cutting table 2A after cutting, and the second holding mechanism 6 adsorbs and holds the plurality of products P, and the plurality of products P are removed from the cutting table 2A. Transport (see (e) of Fig. 14).

其後,於在右側的切斷用台2B中切斷密封完畢基板W 的情況下,於將密封完畢基板W載置於切斷用台2B之後(參照圖14的(f)),使切斷用移動機構8的支撐體812向沿著X方向的另一側移動,使擋板構件242移動至與右側的切斷用台2B對應的固定部243B的上方。其後的動作與所述動作同樣。 Thereafter, the sealed substrate W is cut on the right cutting table 2B. In the case of , after placing the sealed substrate W on the cutting table 2B (see (f) of FIG. 14 ), the support 812 of the cutting moving mechanism 8 is moved to the other side along the X direction. , the baffle member 242 is moved above the fixing part 243B corresponding to the cutting table 2B on the right side. The subsequent actions are the same as those described above.

<切斷裝置的動作的一例> <An example of the operation of the cutting device>

接著,對切斷裝置100的動作的一例進行說明。於圖15中,示出了切斷裝置100的動作中的第一保持機構3的移動路徑、及第二保持機構6的移動路徑。再者,於本實施形態中,切斷裝置100的動作、例如密封完畢基板W的搬送、密封完畢基板W的切斷、切削水飛散防止機構24的動作、製品P的檢查等所有動作或控制是由控制部CTL(參照圖1)進行。 Next, an example of the operation of the cutting device 100 will be described. In FIG. 15 , the moving path of the first holding mechanism 3 and the moving path of the second holding mechanism 6 during the operation of the cutting device 100 are shown. In addition, in this embodiment, all operations or controls such as the operation of the cutting device 100, such as the transportation of the sealed substrate W, the cutting of the sealed substrate W, the operation of the cutting water scattering prevention mechanism 24, and the inspection of the product P are This is performed by the control unit CTL (see Figure 1).

基板供給機構11的基板供給部112使收容於基板收容部111的密封完畢基板W朝向由第一保持機構3保持的保持位置RP移動。 The substrate supply part 112 of the substrate supply mechanism 11 moves the sealed substrate W accommodated in the substrate accommodating part 111 toward the holding position RP held by the first holding mechanism 3 .

接著,搬送用移動機構7使第一保持機構3移動至保持位置RP,第一保持機構3吸附保持密封完畢基板W。其後,搬送用移動機構7使保持有密封完畢基板W的第一保持機構3移動至切斷用台2A、切斷用台2B,第一保持機構3解除吸附保持,將密封完畢基板W載置於切斷用台2A、切斷用台2B。此時,藉由主移動機構72來調整密封完畢基板W的X方向的位置,藉由水平移動機構74來調整密封完畢基板W的Y方向的位置。而且,切斷用台2A、切斷用台2B吸附保持密封完畢基板W。 Next, the transport moving mechanism 7 moves the first holding mechanism 3 to the holding position RP, and the first holding mechanism 3 absorbs and holds the sealed substrate W. Thereafter, the transport moving mechanism 7 moves the first holding mechanism 3 holding the sealed substrate W to the cutting table 2A and the cutting table 2B, and the first holding mechanism 3 releases the adsorption and holding, and holds the sealed substrate W. Place them on the cutting table 2A and the cutting table 2B. At this time, the X-direction position of the sealed substrate W is adjusted by the main moving mechanism 72 , and the Y-direction position of the sealed substrate W is adjusted by the horizontal moving mechanism 74 . Furthermore, the cutting table 2A and the cutting table 2B adsorb and hold the sealed substrate W.

此處,在使保持有密封完畢基板W的第一保持機構3移動至切斷用台2B的情況下,升降移動機構73使第一保持機構3上升至不與切斷用移動機構8(支撐體812)發生物理干擾的位置為止。再者,於使保持有密封完畢基板W的第一保持機構3移動至切斷用台2B時,在使支撐體812自切斷用台2B向移載台5側退避的情況下,無需如所述般使第一保持機構3升降。 Here, when the first holding mechanism 3 holding the sealed substrate W is moved to the cutting table 2B, the lifting and lowering moving mechanism 73 raises the first holding mechanism 3 to a position where it is not in contact with the cutting moving mechanism 8 (supporting Body 812) to the location where physical interference occurs. Furthermore, when moving the first holding mechanism 3 holding the sealed substrate W to the cutting stage 2B, there is no need to retract the support body 812 from the cutting stage 2B to the transfer stage 5 side. As described above, the first holding mechanism 3 is raised and lowered.

於此狀態下,切斷用移動機構8使兩個心軸42A、42B於X方向及Y方向上依次移動,並且藉由切斷用台2A、2B旋轉,將密封完畢基板W切斷為格子狀而單片化。於將密封完畢基板W切斷成格子狀時,切削水飛散防止機構24進行所述<伴隨切削的切削水飛散防止機構24的動作>所說明的動作。 In this state, the cutting moving mechanism 8 sequentially moves the two spindles 42A and 42B in the X direction and the Y direction, and rotates the cutting tables 2A and 2B to cut the sealed substrate W into a grid. Shape and monolithic. When the sealed substrate W is cut into a grid shape, the cutting water scattering prevention mechanism 24 performs the operation described in the "Operation of the cutting water scattering prevention mechanism 24 accompanying cutting".

於切斷後,搬送用移動機構7使第一清潔機構18移動,對保持於切斷用台2A、切斷用台2B的多個製品P的上表面側(安裝面)進行清潔。所述清潔之後,搬送用移動機構7使第一保持機構3及第一清潔機構18退避至規定位置。 After cutting, the conveyance moving mechanism 7 moves the first cleaning mechanism 18 to clean the upper surfaces (mounting surfaces) of the plurality of products P held on the cutting tables 2A and 2B. After the above cleaning, the transport moving mechanism 7 retracts the first holding mechanism 3 and the first cleaning mechanism 18 to a predetermined position.

接著,搬送用移動機構7使第二保持機構6移動至切斷後的切斷用台2A、切斷用台2B,第二保持機構6吸附保持多個製品P。其後,搬送用移動機構7使保持有多個製品P的第二保持機構6移動至第二清潔機構19。藉此,第二清潔機構19對保持於第二保持機構6的多個製品P的下表面側(相反面)進行清潔。 Next, the conveyance moving mechanism 7 moves the second holding mechanism 6 to the cutting tables 2A and 2B after cutting, and the second holding mechanism 6 absorbs and holds the plurality of products P. Thereafter, the transport moving mechanism 7 moves the second holding mechanism 6 holding the plurality of products P to the second cleaning mechanism 19 . Thereby, the second cleaning mechanism 19 cleans the lower surface side (opposite surface) of the plurality of products P held by the second holding mechanism 6 .

於清潔之後,保持於第二保持機構6的多個製品P藉由檢查部13及反轉機構14進行兩面檢查。其後,搬送用移動機構7 使第二保持機構6移動至移載台5,第二保持機構6解除吸附保持,而將多個製品P載置於移載台5。載置於移載台5的多個製品P根據由檢查部13所得的檢查結果(良品、不良品等)而由分類機構20分類至各種托盤21。 After cleaning, the plurality of products P held in the second holding mechanism 6 are inspected on both sides by the inspection part 13 and the reversing mechanism 14 . Thereafter, the transport moving mechanism 7 The second holding mechanism 6 is moved to the transfer table 5 , the second holding mechanism 6 releases the suction holding, and the plurality of products P are placed on the transfer table 5 . The plurality of products P placed on the transfer table 5 are classified into various trays 21 by the classification mechanism 20 based on the inspection results (good products, defective products, etc.) obtained by the inspection unit 13 .

再者,關於兩面檢查,例如,首先於由第二保持機構6吸附保持的狀態下檢查製品P的其中一個面。接著,自第二保持機構6將製品P移載至反轉機構14的保持台141,於由反轉後的保持台141吸附保持的狀態下檢查製品P的另一個面,藉此可執行兩面檢查。而且,之後的製品P自保持台141向移載台5的搬送可藉由自保持台141移載至第二保持機構6來進行。另外,將保持台141設為能夠於X方向上移動的結構,將保持台141或移載台5的至少其中一者設為能夠於Z方向上移動的結構,使保持台141移動至移載台5的上方,藉此亦可將製品P搬送至移載台5並進行移載。 Furthermore, regarding the double-sided inspection, for example, first one of the surfaces of the product P is inspected while being suction-held by the second holding mechanism 6 . Next, the product P is transferred from the second holding mechanism 6 to the holding table 141 of the reversing mechanism 14, and the other side of the product P is inspected while being adsorbed and held by the reversed holding table 141, whereby both sides can be performed. Check. Furthermore, subsequent transportation of the product P from the holding table 141 to the transfer table 5 can be performed by transferring from the holding table 141 to the second holding mechanism 6 . In addition, the holding table 141 is configured to be movable in the X direction, and at least one of the holding table 141 and the transfer table 5 is made to be movable in the Z direction, so that the holding table 141 is moved to the transfer position. Above the stage 5, the product P can also be transported to the transfer stage 5 and transferred.

<本實施形態的效果> <Effects of this embodiment>

根據本實施形態的切斷裝置100,設為藉由沿著切斷用台2A、切斷用台2B及移載台5的排列方向延伸的共用的傳遞軸71來使第一保持機構3及第二保持機構6的結構,藉由切斷用移動機構8使切斷機構4於水平面上於沿著傳遞軸71的X方向及與X方向正交的Y方向上分別移動,因此無需使切斷用台2A、切斷用台2B於X方向及Y方向上移動便可對密封完畢基板W進行加工。因此,可不藉由滾珠螺桿機構使切斷用台2A、切斷用台2B 移動,而無需用以保護滾珠螺桿機構的蛇腹構件及用以保護該蛇腹構件的蓋構件。其結果,可使切斷裝置100的裝置結構簡化。另外,可設為不使切斷用台2A、切斷用台2B於X方向及Y方向上移動的結構,可減少切斷裝置100的佔據面積。 According to the cutting device 100 of this embodiment, the first holding mechanism 3 and the first holding mechanism 3 are moved by the common transmission shaft 71 extending along the arrangement direction of the cutting table 2A, the cutting table 2B, and the transfer table 5 . The structure of the second holding mechanism 6 allows the cutting mechanism 4 to move on the horizontal plane in the X direction along the transmission axis 71 and in the Y direction orthogonal to the X direction respectively by the cutting moving mechanism 8, so there is no need to move the cutting mechanism 4 The sealed substrate W can be processed by moving the cutting table 2A and the cutting table 2B in the X direction and the Y direction. Therefore, the cutting table 2A and the cutting table 2B can be used without using the ball screw mechanism. Movement without the need for an bellows member to protect the ball screw mechanism and a cover member to protect the bellows member. As a result, the device structure of the cutting device 100 can be simplified. In addition, the cutting table 2A and the cutting table 2B can be configured so as not to move in the X direction and the Y direction, so that the area occupied by the cutting device 100 can be reduced.

另外,於本實施形態中,於自加工進給方向SD的前側向切斷機構4噴射切削水的結構中,由於相對於切斷機構4而於加工進給方向SD的後側設置有自較切斷用台2A、切斷用台2B的上表面更靠下側的位置覆蓋上方的切削水飛散防止機構24,因此可防止切削水的飛散。尤其是於本實施形態中,於在支撐體812的沿著X方向的其中一側設置有切斷機構4及切削水供給機構12的結構中,由於在支撐體812的沿著X方向的另一側設置有切削水飛散防止機構24,因此可防止通過了支撐體812的下側的切削水於支撐體812的沿著X方向的另一側飛散。 In addition, in the present embodiment, in the structure in which cutting water is sprayed toward the cutting mechanism 4 from the front side in the machining feed direction SD, since the cutting mechanism 4 is provided with a self-control device on the rear side in the machining feed direction SD, The lower positions of the upper surfaces of the cutting tables 2A and 2B cover the upper cutting water scattering prevention mechanism 24 , thereby preventing the cutting water from scattering. Especially in this embodiment, in the structure in which the cutting mechanism 4 and the cutting water supply mechanism 12 are provided on one side of the support body 812 along the X direction, since the other side of the support body 812 along the X direction A cutting water scattering prevention mechanism 24 is provided on one side, thereby preventing cutting water that has passed through the lower side of the support body 812 from scattering on the other side of the support body 812 along the X direction.

進而,於本實施形態中,由於切削水飛散防止機構24是使用蛇腹構件241而構成,因此可於追隨利用切斷用移動機構8進行的切斷機構4的移動的同時防止切削水的飛散。此處,由於在蛇腹構件241的加工進給方向SD上的後端部連接擋板構件242,並藉由固定部243A、固定部243B對該擋板構件242進行固定,因此於對密封完畢基板W進行加工時可對由蛇腹構件241及擋板構件242包圍的空間進行固定,能夠可靠地防止切削水的飛散。 Furthermore, in this embodiment, since the cutting water scattering prevention mechanism 24 is configured using the bellows member 241, it can prevent the cutting water from scattering while following the movement of the cutting mechanism 4 by the cutting moving mechanism 8. Here, since the baffle member 242 is connected to the rear end of the bellows member 241 in the processing feed direction SD, and the baffle member 242 is fixed by the fixing portion 243A and the fixing portion 243B, the sealed substrate is When W is being processed, the space surrounded by the bellows member 241 and the baffle member 242 can be fixed, and the scattering of cutting water can be reliably prevented.

另外,由於為兩個以上的切斷用台2A、2B沿著X方向 設置,並且使支撐心軸42A、心軸42B的支撐體812沿著X方向移動的結構,因此可於藉由其中一個切斷用台2A對密封完畢基板W進行處理時,於另一個切斷用台2B中進行搬送等其他處理。而且,於本實施形態中,由於針對每個切斷用台2A、2B設置對擋板構件進行固定的固定部243A、固定部243B,因此可使蛇腹構件241成為與一個切斷用台2A、2B對應的長度,可減小收縮狀態的蛇腹構件241的尺寸。另外,為根據各切斷用台2A、2B對擋板構件242進行固定,藉由蛇腹構件241覆蓋一個切斷用台2A、2B的結構,可提高對未加工的切斷用台2A、切斷用台2B可搬入加工前的密封完畢基板W、或可搬出多個製品P等的處理能力。 In addition, since there are two or more cutting tables 2A and 2B along the X direction, The structure is such that the support body 812 supporting the spindles 42A and 42B is disposed and moved in the X direction. Therefore, when the sealed substrate W is processed by one of the cutting stations 2A, the other cutting table 2A can be cut. Use the station 2B to perform other processing such as transportation. Furthermore, in this embodiment, since the fixing portions 243A and 243B for fixing the baffle members are provided for each of the cutting stands 2A and 2B, the bellows member 241 can be formed into one cutting stand 2A, 2B. The length corresponding to 2B can reduce the size of the bellows member 241 in the contracted state. In addition, in order to fix the baffle member 242 to each of the cutting tables 2A and 2B, one of the cutting tables 2A and 2B is covered with the bellows member 241, so that the unprocessed cutting table 2A and the cutting table 2A can be improved. The cutting station 2B has processing capabilities such as being able to carry in the sealed substrate W before processing, or being able to carry out a plurality of products P, and the like.

於本實施形態中,設置於X方向的一對X方向導軌811隔著切斷用台2A、切斷用台2B而設置,因此可增大一對X方向導軌811的間距。其結果,可減小X方向導軌811彼此於Z方向上的位置偏移對加工造成的影響。進而,藉由一對導軌811的間距增大而X方向移動部81的直進性提高,其結果,刀片41A、刀片41B的刀尖的晃動變小,切斷時的切削阻力等變小,從而可提高加工精度。另外,X方向導軌811可使用規格較先前低的構件。 In this embodiment, the pair of X-direction guide rails 811 provided in the X-direction are provided across the cutting table 2A and the cutting table 2B. Therefore, the distance between the pair of X-direction guide rails 811 can be increased. As a result, the influence on processing caused by the positional deviation of the X-direction guide rails 811 in the Z-direction can be reduced. Furthermore, as the distance between the pair of guide rails 811 increases, the straightness of the X-direction moving part 81 improves. As a result, the wobbling of the blade tips of the blades 41A and 41B becomes smaller, and the cutting resistance during cutting becomes smaller, thereby reducing the cutting resistance. Can improve processing accuracy. In addition, the X-direction guide rail 811 can use components with lower specifications than before.

於本實施形態中,由於兩個以上的切斷用台2A、2B於切斷時不於Y方向移動,因此可一併調整相對於兩個以上的切斷用台2A、2B而言的移動機構8(X方向移動部81)於X方向上的平行度。即,在切斷時切斷用台移動的現有裝置中設置兩個切斷用台的情況下,需要調整兩個切斷用台於X方向上的平行度, 進而對所述調整後的於X方向上的平行度與刀片於X方向上的平行度進行調整(具體而言,需要進行兩次調整),於本實施形態中,兩個切斷用台2A、2B於切斷時不於X方向上移動,因此僅調整刀片41A、刀片41B於X方向上的平行度即可(具體而言,調整一次即可)。 In this embodiment, since the two or more cutting tables 2A and 2B do not move in the Y direction during cutting, the movement of the two or more cutting tables 2A and 2B can be adjusted simultaneously. The parallelism of the mechanism 8 (X-direction moving part 81) in the X-direction. That is, when two cutting tables are installed in a conventional device that moves the cutting table during cutting, it is necessary to adjust the parallelism of the two cutting tables in the X direction. Furthermore, the adjusted parallelism in the X direction and the parallelism of the blade in the X direction are adjusted (specifically, two adjustments are required). In this embodiment, the two cutting tables 2A , 2B does not move in the X direction during cutting, so only the parallelism of the blades 41A and 41B in the X direction can be adjusted (specifically, it can be adjusted once).

<其他變形實施形態> <Other modified embodiments>

再者,本發明並不限於所述實施形態。 In addition, the present invention is not limited to the above-described embodiment.

例如,於所述實施形態中,對雙切割台方式且雙心軸結構的切斷裝置進行了說明,但並不限於此,亦可為單切割台方式且單心軸結構的切斷裝置、或單切割台方式且雙心軸結構的切斷裝置等。另外,亦可為具有三個以上的切斷用台的結構。即便在此情況下,亦成為與三個以上的切斷用台分別對應地具有三個以上的固定部的結構。 For example, in the above-described embodiment, a cutting device with a double cutting table type and a double mandrel structure has been described, but the invention is not limited thereto. A cutting device with a single cutting table type and a single mandrel structure may also be used. Or a cutting device with a single cutting table type and a double mandrel structure, etc. In addition, a structure having three or more cutting stages may be used. Even in this case, it is a structure which has three or more fixing parts corresponding to three or more cutting stands respectively.

另外,所述實施形態的移載台5為於分類至各種托盤21之前暫時載置的索引台,但亦可將移載台5設為反轉機構14的保持台141。 In addition, the transfer table 5 in the above embodiment is an index table that is temporarily placed before sorting into various pallets 21 , but the transfer table 5 may also be used as the holding table 141 of the reversal mechanism 14 .

進而,於所述實施形態中,為自移載台5分類至托盤21的結構(亦稱為「托盤收容」),但可為將多個製品P貼附於具有黏接面的貼附構件來收容(亦稱為「環收容」)的結構,亦可為使多個製品P落下至收容箱中並以零散的狀態收容(亦稱為「散裝收容」)的結構,亦可為將多個製品P自筒狀容器的一端開口部插入來收容(亦稱為「管收容」)的結構。 Furthermore, in the above-mentioned embodiment, it is a structure in which the transfer stage 5 is sorted into the tray 21 (also called "tray storage"). However, a plurality of products P may be attached to an attachment member having an adhesive surface. It may be a structure in which multiple products P are dropped into a storage box and stored in a scattered state (also called "bulk storage"), or a structure in which multiple products P are dropped into a storage box and stored in a scattered state (also called "bulk storage"). A structure in which the individual product P is inserted into the opening at one end of the cylindrical container and stored (also called "tube storage").

而且,於所述實施形態的結構中,亦可設為下述結構,即:於切斷用台2A、切斷用台2B中不將密封完畢基板切斷,而是形成槽。在此情況下,例如亦可設為下述結構,即:於切斷用台2A、切斷用台2B實施了槽加工的密封完畢基板W藉由第一保持機構3及搬送用移動機構7而返回至基板供給部112。另外,亦可設為下述結構,即:將返回至所述基板供給部112的密封完畢基板W收容於基板收容部111。 Moreover, in the structure of the said embodiment, you may make it a structure which forms a groove|channel in the cutting table 2A and the cutting table 2B, without cutting the sealed substrate. In this case, for example, a structure may be adopted in which the sealed substrate W subjected to groove processing on the cutting tables 2A and 2B is moved by the first holding mechanism 3 and the transport moving mechanism 7 and returns to the substrate supply unit 112 . In addition, a structure may be adopted in which the sealed substrate W returned to the substrate supply part 112 is accommodated in the substrate accommodating part 111 .

另外,構成傳遞軸71的凸輪齒條要素可將多個連結而構成,因此例如可將切斷裝置(加工裝置)100設為於第二清潔機構19與檢查部13之間能夠分離及連結(能夠裝卸)的模組結構。在此情況下,例如可於第二清潔機構19側的模組與檢查部13側的模組之間,追加進行與檢查部13中的檢查為不同種類的檢查的模組。再者,除了此處例示的結構以外,亦可將切斷裝置(加工裝置)100設為於某處能夠分離及連結(能夠裝卸)的模組結構,亦可將追加的模組設為檢查以外的各種功能的模組。 In addition, since the cam rack element constituting the transmission shaft 71 can be configured by connecting a plurality of them, for example, the cutting device (processing device) 100 can be configured to be separable and connectable between the second cleaning mechanism 19 and the inspection part 13 ( Modular structure that can be attached and detached). In this case, for example, a module that performs a different type of inspection from the inspection in the inspection unit 13 may be added between the module on the second cleaning mechanism 19 side and the module on the inspection unit 13 side. Furthermore, in addition to the structure illustrated here, the cutting device (processing device) 100 may be configured as a module that can be separated and connected (removable) somewhere, or an additional module may be used as an inspection unit. Modules with various functions other than.

另外,本發明的加工裝置亦可進行切斷以外的加工,例如亦可進行切削或磨削等其他機械加工。 In addition, the processing device of the present invention can also perform processing other than cutting, for example, it can also perform other mechanical processing such as cutting or grinding.

除此以外,本發明不限於所述實施形態,當然能夠於不偏離其主旨的範圍進行各種變形。 In addition, the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the gist of the invention.

[產業上的可利用性] [Industrial availability]

根據本發明,可使裝置結構簡化並且減少佔據面積,同時防止加工液的飛散。 According to the present invention, the device structure can be simplified and the occupied area can be reduced, while the scattering of the machining fluid can be prevented.

2A、2B:切斷用台(加工台) 2A, 2B: Cutting table (processing table)

9A、9B:旋轉機構 9A, 9B: Rotating mechanism

12:切削水供給機構(加工液供給機構) 12: Cutting water supply mechanism (machining fluid supply mechanism)

15:蓋構件 15: cover member

16、241:蛇腹構件 16. 241: Bellows member

17:加工屑收容部 17: Processing waste collection department

24:切削水飛散防止機構(加工液飛散防止機構) 24: Cutting water scattering prevention mechanism (machining fluid scattering prevention mechanism)

41A:刀片 41A: Blade

42A:心軸 42A: mandrel

71:共用的傳遞軸(傳遞軸) 71: Common transmission shaft (transmission shaft)

81:X方向移動部 81:X direction moving part

82:Y方向移動部 82:Y direction moving part

83:Z方向移動部 83:Z direction moving part

121:噴射噴嘴 121:Jet nozzle

171:導引滑槽 171:Guide chute

171X:上部開口 171X: Upper opening

172:回收容器 172:Recycling container

173:分離部 173:Separation Department

242:擋板構件 242:Baffle component

243A、243B:固定部 243A, 243B: Fixed part

244:升降移動機構 244: Lifting and moving mechanism

811:一對X方向導軌(X方向導軌、導軌) 811: A pair of X-direction guide rails (X-direction guide rail, guide rail)

812:支撐體 812:Support

822:Y方向滑塊 822:Y direction slider

832:Z方向滑塊 832:Z direction slider

S:加工屑 S: Processing chips

SD:加工進給方向 SD: processing feed direction

W:密封完畢基板(加工對象物) W: Sealed substrate (object to be processed)

X、Y、Z:方向 X, Y, Z: direction

Claims (10)

一種加工裝置,包括:加工台,保持加工對象物;第一保持機構,為了將所述加工對象物搬送至所述加工台而保持所述加工對象物;加工機構,對保持於所述加工台的所述加工對象物進行加工;移載台,移動加工後的所述加工對象物;第二保持機構,為了將加工後的所述加工對象物自所述加工台搬送至所述移載台而保持加工後的所述加工對象物;搬送用移動機構,具有沿著所述加工台及所述移載台的排列方向延伸且用以使所述第一保持機構及所述第二保持機構移動的共用的傳遞軸;加工用移動機構,使所述加工機構於水平面上於沿著所述傳遞軸的第一方向及與所述第一方向正交的第二方向上分別移動;加工液供給機構,藉由所述加工用移動機構而與所述加工機構一起移動,自加工進給方向的其中一側向所述加工機構噴射加工液;以及加工液飛散防止機構,相對於所述加工機構而設置於所述加工進給方向的另一側,並且自較所述加工台的上表面更靠下側的位置覆蓋上方,防止所述加工液的飛散。 A processing device includes: a processing table that holds a processing object; a first holding mechanism that holds the processing object in order to transport the processing object to the processing table; and a processing mechanism that holds the processing object on the processing table. the processing object is processed; a transfer table moves the processed object; and a second holding mechanism is used to transport the processed object from the processing table to the transfer table and retaining the processed object; a transport moving mechanism extending along the arrangement direction of the processing table and the transfer table and used to move the first holding mechanism and the second holding mechanism A common transmission axis that moves; a moving mechanism for processing that moves the processing mechanism in a first direction along the transmission axis and a second direction orthogonal to the first direction on the horizontal plane; machining fluid a supply mechanism that moves together with the processing mechanism by the processing moving mechanism, and injects processing fluid to the processing mechanism from one side of the processing feed direction; and a processing fluid scattering prevention mechanism, relative to the processing The mechanism is provided on the other side in the machining feed direction, and covers the upper surface from a position lower than the upper surface of the machining table to prevent the machining fluid from scattering. 如請求項1所述的加工裝置,其中,所述加工液飛散防止機構具有: 蛇腹構件,伴隨所述加工機構的移動而伸縮,覆蓋與所述加工進給方向正交的上方及側方;以及擋板構件,連接有所述蛇腹構件的所述加工進給方向上的後端部,覆蓋所述加工進給方向的後方。 The processing device according to claim 1, wherein the machining fluid scattering prevention mechanism has: an accordion member that expands and contracts with the movement of the processing mechanism to cover the upper and side sides orthogonal to the processing feed direction; and a baffle member connected to the rear end of the accordion member in the processing feed direction. The end covers the rear of the processing feed direction. 如請求項2所述的加工裝置,具有固定部,所述固定部於利用所述加工機構對所述加工對象物進行加工時將所述擋板構件固定於所述加工台。 The processing device according to claim 2, further comprising a fixing portion that fixes the baffle member to the processing table when the processing mechanism processes the object. 如請求項3所述的加工裝置,包括多個所述加工台,所述固定部與所述多個加工台分別對應地設置。 The processing device according to claim 3 includes a plurality of the processing tables, and the fixing portions are provided corresponding to the plurality of processing tables. 如請求項4所述的加工裝置,其中,所述加工用移動機構使所述擋板構件分別移動至多個所述固定部。 The processing apparatus according to claim 4, wherein the processing moving mechanism moves the baffle member to each of the plurality of fixing parts. 如請求項3至請求項5中任一項所述的加工裝置,其中,所述擋板構件能夠於其下端部位於較所述加工台的上表面更靠上側處的上升位置、與所述下端部位於較所述加工台的上表面更靠下側處的下降位置之間移動,於所述下降位置上由所述固定部進行固定。 The processing device according to any one of Claims 3 to 5, wherein the baffle member is capable of being positioned at a raised position above the upper surface of the processing table at its lower end, and in contact with the processing table. The lower end portion moves between lowered positions located below the upper surface of the processing table, and is fixed by the fixing portion at the lowered position. 如請求項1至請求項5中任一項所述的加工裝置,其中,所述加工用移動機構包括:X方向移動部,使所述加工機構於作為所述第一方向的X方向上直線移動;以及Y方向移動部,使所述加工機構於作為所述第二方向的Y方向上直線移動,所述X方向移動部具有:一對X方向導軌,隔著所述加工台沿著X方向設置;以及支撐體,沿著所述一對X方向導軌移動並 且經由所述Y方向移動部支撐所述加工機構。 The processing device according to any one of claims 1 to 5, wherein the processing moving mechanism includes an X-direction moving part that moves the processing mechanism in a straight line in the X direction as the first direction. Move; and a Y-direction moving part to linearly move the processing mechanism in the Y direction as the second direction, the X-direction moving part having a pair of X-direction guide rails that move along the X-direction across the processing table direction setting; and the support body moves along the pair of X-direction guide rails and And the processing mechanism is supported via the Y-direction moving part. 如請求項7所述的加工裝置,其中,沿著所述X方向朝向一側的方向是所述加工進給方向,於所述支撐體中的沿著X方向的其中一側設置有所述加工機構及所述加工液供給機構,於所述支撐體中的沿著X方向的另一側設置有所述加工液飛散防止機構。 The processing device according to claim 7, wherein the direction toward one side along the X direction is the processing feed direction, and the support is provided on one side along the X direction of the support body. In the machining mechanism and the machining fluid supply mechanism, the machining fluid scattering prevention mechanism is provided on the other side of the support body along the X direction. 如請求項8所述的加工裝置,其中,於所述支撐體中的沿著X方向的其中一側設置有收容所述加工機構及所述加工液供給機構的蓋構件。 The processing device according to claim 8, wherein a cover member for accommodating the processing mechanism and the processing fluid supply mechanism is provided on one side of the support body along the X direction. 一種加工品的製造方法,使用如請求項1至請求項9中任一項所述的加工裝置來製造加工品。A method of manufacturing a processed product using the processing device according to any one of claims 1 to 9.
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