TWI825798B - Elastic probe and circuit test device - Google Patents

Abstract

A circuit testing device includes a base, a fixing seat, an elastic probe, and a detection electrode. The base includes a test opening. The fixing base includes a fixing groove. The elastic probe includes a fixed section, a first elastic section, a second elastic section, an extension section, and a contact section in sequence. The fixing section is disposed in the fixing slot and protrudes into the testing slot. The first spring segment is bent in a direction opposite to the test opening. The second elastic segment is bent in the direction of the test opening. The extension extends to the test opening. The contact segment protrudes outwardly from the test opening. The detection electrode is arranged in the base and is electrically connected with the elastic probe. The contact section can supply power to the test electrode of the circuit to be tested and abut and make the test electrode and the test electrode electrically connected.

Description

Flexible probe and circuit test device

The present invention relates to a circuit testing device, in particular to a circuit testing device installed on a testing machine and configured to detect the electrical properties of an integrated circuit.

After the integrated circuit is packaged, electrical testing will be performed to determine whether the circuit containing electronic components in the chip is normal. After packaging, the integrated circuit will have contact electrodes (including metal pins) set up on the outside to provide a testing machine for integrated circuit testing. Electrical testing of circuits.

Please refer to Figure 1 and Figure 2, which is the Patent No. M340580 of the Republic of China, describing a circuit testing device, including a housing 11, a fixed body 12, a positioning block 13, a positioning elastic strip 14, and a pressure-reducing elastic glue. The strips 15, the plurality of load plates 16, and the plurality of elastic electrical contact points 17 are fixed in the plurality of first slots 111 and the second slots 112 of the housing 11 to fix the positions of the plurality of elastic electrical contact points 17 and enable the The plurality of elastic electrical contact points 17 are spaced apart from each other. The fixed body 12 fixes the positioning elastic rubber strip 14 so that it is in contact with the plurality of elastic electrical contact points 17 to provide the elastic force of the plurality of elastic electrical contact points 17 to enable The plurality of elastic electrical contact points 17 are respectively in contact with the plurality of load plates 16. The positioning block 13 fixes the decompression elastic rubber strip 15 so that it is in contact with the plurality of elastic electrical contact points 17. The decompression elastic rubber strip 15 The elastic force of the plurality of elastic electrical contact points 17 is provided to buffer the force of the plurality of elastic electrical contact points 17 being pressed by a component under test 18 .

Although the prior art discloses a circuit testing device that can detect integrated circuits, it still has the following shortcomings in actual use:

1. The distance between test electrodes cannot be reduced:

With the advancement of science and technology, the number of electronic components installed in integrated circuits per unit volume is increasing, and the conductive paths are getting smaller and smaller. As a result, the contact electrodes outside the integrated circuits not only shrink in size, but also become increasingly spaced apart from each other. The smaller, but the setting of the first slot 111 and the second slot 112 of the conventional detection device can only fix one elastic electrical contact 17 to avoid contact with the elastic contact 17 and cause a short circuit. The electrical contact 17 must have a certain wire diameter, and the plurality of first slots 111 and the second slots 112 must be spaced apart from each other. As a result, the installation size of the test device is limited, and it is difficult to reduce the spacing between the plurality of elastic electrical contacts 17. , the types of integrated circuits that can be tested are limited.

2. An additional buffer elastomer must be installed:

The shape of the conventional elastic electrical contact 17 is V-shaped. The left side of the elastic electrical contact 17 is used to bear the downward pressing force of the component under test 18. When the left side of the elastic electrical contact 17 is After being pressed down, the right side of the element will be lifted upward. In order for the elastic electrical contact 17 to buffer the force of pressing down on the component under test 18, an elastic reduction element must be provided on the right end of the elastic electrical contact 17. The rubber strip 15 is used to prevent the left end point of the elastic electrical contact 17 from excessive wear.

3. Poor contact may occur:

It is known that the position of the elastic electrical contact 17 disposed in the first slot 111 and the second slot 112 is not fixed. When the left end of the elastic electrical contact 17 is pressed downward by the component under test 18 When the elastic electrical contact point 17 is reached, the elastic electrical contact point 17 will slide to the right, and when the component under test 18 leaves the left end point of the elastic electrical contact point 17, the elastic force provided by the decompression elastic rubber strip 15 will make the elastic The electrical contact 17 slides to the left. Since the bottom of the elastic electrical contact 17 is in contact with the upper surface of the load plate 16, when the elastic electrical contact 17 slides left and right, the elastic Friction will occur between the electrical contact 17 and the load board 16, which will not only affect the lifespan of the elastic electrical contact 17 and the load board 16, but also cause poor electrical contact, causing signal transmission to be affected. Therefore, the conventional circuit testing device cannot perform more precise electrical measurements.

Therefore, how to make the circuit test device detect the electrical properties of integrated circuits with smaller electrode spacing, and perform more precise electrical property measurements, and reduce the wear of metal probes, is an urgent need for relevant technical personnel. goal.

In view of this, the object of the present invention is to provide an elastic probe.

The elastic probe is installed in a testing device, and the testing device is provided with a fixed seat and a testing opening.

The elastic probe includes a fixed section, a second elastic section, an elastic extension section, and a contact section.

The fixed section is fixed on the fixed base.

The second elastic section is connected to the fixed seat, and the structure of the second elastic section is bent toward the direction of the test opening.

The elastic extension section is connected to the second elastic section and extends to the test opening.

The contact segment is connected to the elastic extension segment and protrudes outward from the test opening.

Another technical means of the present invention is that the above-mentioned elastic probe further includes a first elastic section, the first elastic section is arranged between the fixed section and the second elastic section, and the structure of the first elastic section is Bend in the direction opposite to the test opening.

Another technical means of the present invention is that the curvature of the first elastic segment is greater than the curvature of the second elastic segment. The curvature of the first elastic segment is from an angle of 20 degrees to an angle of 90 degrees. The curvature of the two elastic segments is from an angle of 180 degrees to an angle of 270 degrees.

Another technical means of the present invention is that the above-mentioned elastic probe further includes an insulating sleeve provided on the elastic probe.

Another technical means of the present invention is that the above-mentioned insulating sleeve is sleeved on the fixed section, the first elastic section, the second elastic section, the elastic extension section, the contact section, one of the fixed section, the first elastic section, the second elastic section, the contact section, and a combination thereof of the elastic probe.

Another object of the present invention is to provide a circuit testing device.

The circuit testing device is suitable for obtaining the electrical properties of at least one electrode to be tested of a circuit to be tested.

The circuit testing device includes a base, at least one fixed base, at least one elastic probe, and at least one detection electrode.

The base includes at least one test slot surrounded by the base, and at least one test opening provided on the base and connected to the test slot.

The fixing base is disposed in the test slot of the base. The fixing base includes at least one fixing slot surrounded by the fixing base, and the fixing slot is connected to the test slot.

The elastic probe includes a fixed section, a first elastic section, a second elastic section, an elastic extension section, and a contact section in sequence. The fixed section of the elastic probe is disposed in the fixing groove of the fixing base and protrudes. In the test slot, the first elastic section bends in a direction opposite to the test opening, the second elastic section bends in a direction opposite to the test opening, and extends from the elastic extension section to the test opening, and the contact The segment protrudes outward from the test opening and is set in a position that matches the position of the electrode to be tested. The electrode to be tested of the circuit to be tested presses against the contact segment and causes the contact segment to retract in the test opening. The second elasticity The segment can provide elastic force for the contact segment to contact the electrode to be tested of the circuit to be tested.

The detection electrode is electrically connected to an elastic probe disposed in the base. The contact section of the elastic probe provides contact with the electrode under test of the circuit under test so that the detection electrode is electrically connected to the electrode under test.

Another technical means of the present invention is that the opening direction of the above-mentioned test opening is opposite to the opening direction of the fixing groove.

Another technical means of the present invention is that the above-mentioned elastic probe further includes an insulating sleeve arranged on the surface of the elastic probe.

Another technical means of the present invention is that the above-mentioned insulating sleeve is placed on the surface of the fixed section, and the fixing groove of the fixing base fixes the fixed sections of a plurality of elastic probes. The plurality of elastic probes are secured by the insulating sleeve. Insulated from each other.

Another technical means of the present invention is that the above-mentioned insulating sleeve is set on the surface of the contact segment, and the contact segments of a plurality of elastic probes are accommodated in the test opening of the base. The plurality of elastic probes are insulated by the provided set and insulated from each other.

The beneficial effect of the present invention is that the fixing base fixes the fixed section of the elastic probe to stabilize the position of the elastic probe in the test device, and the first elastic section moves in the direction opposite to the test opening. Bending is used to make the curvature of the second elastic segment larger, so that the second elastic segment can effectively buffer the force of the contact segment being pressed by the electrode to be tested of the circuit to be tested, and provide the contact segment with contact The elasticity of the electrode to be measured.

11: Shell

12: Fixed body

13: Positioning block

14: Positioning elastic strip

15: Pressure reducing elastic strip

16:Load board

17: Elastic electrical contact

18: Component under test

21: Circuit to be tested

22: Electrode to be tested

3: base

301: Base plate

302:Side wall

303: Upper cover

304:Lower partition

305: Upper partition

306:Open your mouth

31:Test slot

32: Test opening

33: Filling

4: Fixed seat

41:Fixed slot

5: Elastic probe

51: Fixed segment

52: First elastic section

53: Second elastic section

54: Elastic extension section

55: Contact section

551: gentle extension

56:Insulation sleeve

6: Detection electrode

61:Electrode insulation sleeve

Figure 1 is a structural decomposition schematic diagram illustrating the partial structural decomposition of a circuit test device of Taiwan Patent M340580; Figure 2 is a cross-sectional schematic diagram illustrating a partial cross-section of the circuit test device of Taiwan Patent M340580; Figure 3 is a side view schematic diagram. A first preferred embodiment of the elastic probe and circuit testing device of the present invention illustrates the appearance of the elastic probe; Figure 4 is a cross-sectional schematic diagram illustrating a circuit testing device equipped with the elastic probe in the first preferred embodiment; Figure 5 is a structural exploded schematic diagram illustrating the circuit in the first preferred embodiment. The partial structural exploded state of the testing device; Figure 6 is a schematic cross-sectional view, which is a second preferred embodiment of the elastic probe and circuit testing device of the present invention, illustrating a circuit to be tested and the cross-section of the circuit testing device; Figure 7 is A cross-sectional schematic diagram is a third preferred embodiment of the elastic probe and circuit testing device of the present invention, illustrating the cross-section of a circuit to be tested and the circuit testing device; Figure 8 is a schematic side view of the elastic probe of the present invention. and a fourth preferred embodiment of a circuit testing device, illustrating the appearance of the elastic probe; Figure 9 is a schematic cross-sectional view illustrating that in the fourth preferred embodiment, the elastic probe is disposed on a fixed seat and a A partial cross-sectional view of the base; Figure 10 is a structural exploded schematic diagram illustrating the partial structural exploded state of the circuit testing device in the fourth preferred embodiment; Figure 11 is a side schematic diagram of the elastic probe of the present invention. A fifth preferred embodiment of the needle and circuit testing device illustrates the appearance of the elastic probe; Figure 12 is a partial perspective view illustrating that in the fifth preferred embodiment, a test opening protrudes from a plurality of test probes. The state of the needle; Figure 13 is a partial perspective view, which is a sixth preferred embodiment of the elastic probe and circuit testing device of the present invention, illustrating the contact section of a test opening that accommodates two test probes at the same time; and Figure 14 This is a schematic side view, which is a seventh preferred embodiment of the elastic probe and circuit testing device of the present invention, illustrating the appearance of the elastic probe.

The relevant patented features and technical content of the present invention will be clearly presented in the following detailed description of the six preferred embodiments with reference to the drawings. Before proceeding to the detailed description, it should be noted that similar components are designated with the same number.

Referring to Figures 3, 4, and 5, a first preferred embodiment of a flexible probe and circuit testing device of the present invention is shown. The circuit testing device is suitable for obtaining a plurality of electrodes 22 under test of a circuit 21 under test. Electrically, the plurality of electrodes to be tested 22 is a pin structure disposed on the side of the circuit to be tested 21. In actual implementation, the circuit to be tested 21 may be a ball grid array package (English: Ball Grid Array, BGA), For semiconductor structures such as flip chip technology, the circuit test device can detect the electrical properties of the plurality of electrodes 22 under test provided at the bottom of the circuit under test 21, and should not be limited to this.

The circuit test device includes a base 3, a plurality of fixed bases 4, a plurality of elastic probes 5, and a plurality of detection electrodes 6. In actual implementation, the number of the fixed base 4, the elastic probes 5, and the detection electrodes 6 It is a plurality of electrodes 22 to be tested that match the circuit 21 to be tested, and should not be limited to this.

The base 3 includes a plurality of test slots 31 defined by the base 3, and a plurality of test openings 32 provided on the base 3 and connected to the test slots 31. The plurality of test openings 32 are located in the same position as the plurality of test slots 31. The position of measuring electrode 22 matches.

In the first preferred embodiment, the base 3 is composed of a bottom plate 301, a plurality of side walls 302 surrounding the bottom plate 301, and an upper cover 303 provided on the plurality of side walls 302. A plurality of bottom plates are provided above the bottom plate 301. There are lower partitions 304 arranged at intervals, and a plurality of upper partitions 305 arranged at intervals below the upper cover 303. The plurality of upper partitions 305 respectively abut the plurality of lower partitions 304 and define the plurality of test slots 31. The opening 32 is provided on the upper cover 303 and communicates with the plurality of test slots 31 . Each test slot 31 is provided with an elastic probe 5 .

The plurality of fixing seats 4 are disposed in the test slot 31 of the base 3 and include a plurality of fixing slots 41 surrounded by the fixing seats 4, wherein the fixing slots 41 are connected with the test slot 31, In actual implementation, a fixing base 4 can be provided in each test slot 31, and the fixing base 4 is provided with a fixing groove 41, and should not be limited to this.

The elastic probe 5 is a long strip of conductive material with elasticity, and sequentially includes a fixed section 51, a first elastic section 52, a second elastic section 53, an elastic extension section 54, and a contact section 55 , the fixed section 51 of the elastic probe 5 is disposed in the fixed groove 41 of the fixed base 4 and protrudes into the test groove 31, the first elastic section 52 bends in the direction opposite to the test opening 32, and the second The elastic section 53 bends toward the test opening 32 , and the elastic extension section 54 extends the elastic probe 5 to the test opening 32 .

Among them, the fixed seat 4 is a clamping structure used to clamp the fixed section 51 of the elastic probe 5 and can fix the position of the fixed section 51 of the elastic probe 5 in the test slot 31. For example, The fixing base 4 is provided with an elastic clip in the fixing groove 41. The elastic clip can tightly clamp the fixing section 51 of the elastic probe 5 extending into the fixing groove 41. In actual implementation, the fixing groove 41 Other probe fixing structures can be used and should not be limited to this. Since the probe fixing structure is a common technology and is not the focus of this case, it will not be described in detail here.

In addition, in the elastic probe 5 located on the left side of the base 3, the first elastic section 52 extends downward from the fixed section 51 and then bends to the left in the test slot 31 at an angle of approximately 60 degrees (the arc of the bend is approximately 1 /3 π), the second elastic section 53 extends from the first elastic section 52 and then bends downward and to the right in the test slot 31 at an angle of about 225 degrees (the arc of the bend is about 5/4 π), located at the The elastic probe 5 on the right side of the base 3 is a mirror image of the left side. In actual implementation, the curvature of the first elastic section 52 can range from an angle of 20 degrees to an angle of 90 degrees, and the curvature of the second elastic section 53 can range from 20 degrees to 90 degrees. From an angle of 180 degrees to an angle of 270 degrees, it should not be limited to this.

In the first preferred embodiment, the curvature of the first elastic segment 52 is greater than the curvature of the second elastic segment 53. The curvature of the curve is the tangent direction angle of a certain point on the curve to the arc length. Rotation rate. The greater the curvature, the greater the degree of curvature of the curve. Therefore, the position The elastic probe 5 on the left side of the base 3 protrudes outward from the test slot 31 and is quickly bent to the left with a larger curvature by the first elastic section 52, and then is bent to the left with a larger curvature by the second elastic section 53. The small curvature slowly bends downward and to the right toward the direction of the test opening 32, allowing the second elastic section 53 to assume a larger arc bend shape, because the second elastic section 53 has a larger bending angle and The smaller bending curvature allows the elastic probe 5 to provide better elasticity.

The elastic extension section 54 supports the contact section 55 so that the contact section 55 protrudes outward from the test opening 32, and the position of the contact section 55 matches the position of the electrode to be tested 22, so that the contact section 55 is When the circuit 21 is close to the base 3, the plurality of electrodes to be measured 22 can be pressed against the contact segments 55 of the plurality of elastic probes 5. Preferably, the contact segments 55 of the elastic probe 5 are close to the elastic extension segment 54. A gently extending portion 551 is used to dispose the contact section 55 of the elastic probe 5 at the position of the corresponding test opening 32. For example, the plurality of test openings 32 are arranged in a matrix on the upper cover 303. Different gentle extensions 551 can set the contact section 55 of the elastic probe 5 in the correct test opening 32. In actual implementation, the contact section 55 does not need to be provided with the gentle extension 551, and should not be limited to this. .

Preferably, the opening direction of the plurality of test openings 32 located in the upper cover 303 is upward, so that the contact section 55 of the elastic probe 5 can be extended upward, and the opening direction of the fixing groove 41 located in the fixing base 4 is downward, so that the contact section 55 of the elastic probe 5 can be extended upward. The fixed section 51 of the elastic probe 5 is extended downward. After the elastic probe 5 protrudes downward from the fixed groove 41, the elastic probe 5 can be connected to the detection through the bending of the first elastic section 52. The electrode 6 contacts, and then turns to the direction of the test opening 32 through the second elastic section 53 and extends from the elastic extension section 54 to the test opening 32, and finally uses the contact section 55 to protrude outward from the test opening 32, because The opening direction of the test opening 32 is opposite to the opening direction of the fixing groove 41, and the large-angle arc shape of the second elastic section 53 can provide the elastic probe 5 with excellent elastic force, wherein the The fixed section 51 and the contact section 55 are arranged on the same section of the second elastic section 53 The side and the direction in which the fixing section 51 connected to the second elastic section 53 protrudes into the fixing groove 41 is the same as the direction in which the contact section 55 protrudes outward from the test opening 32 .

The plurality of detection electrodes 6 are disposed in the base 3 and are electrically connected to a plurality of elastic probes 5 disposed in the base 3 respectively. The contact segments 55 of the plurality of elastic probes 5 provide the circuit to be tested 21 . The measuring electrodes 22 are in contact so that the plurality of detection electrodes 6 are electrically connected to the plurality of electrodes to be measured 22 respectively. In the first preferred embodiment, the plurality of detection electrodes 6 are disposed on the plurality of side walls 302 of the base 3 , the curved first elastic section 52 can make the side edge of the second elastic section 53 contact the surface of the detection electrode 6, and provide the elastic force for the second elastic section 53 to press against the detection electrode 6. In actual implementation, the plurality of The detection electrode 6 can be disposed at other positions of the base 3 . For example, the plurality of detection electrodes 6 can be disposed on the upper surface of the bottom plate 301 so that the bottom edge of the second elastic section 53 can contact the surface of the detection electrode 6 , should not be limited to this.

Please refer to Figure 6, which is a second preferred embodiment of a flexible probe and circuit testing device of the present invention. The second preferred embodiment is substantially the same as the first preferred embodiment, and the similarities will not be described in detail. , the difference is that the plurality of test slots 31 are filled with filler 33. Preferably, the filler 33 is silicone. In actual implementation, it can be filled with other elastic insulating materials and should not be limited to this.

The circuit to be tested 21 is a ball grid array (BGA) package structure, and the plurality of electrodes 22 to be tested are solder balls disposed on the bottom surface of the circuit to be tested 21 and are disposed on the plurality of test electrodes 22 . The position of the contact section 55 of the elastic probe 5 in the opening 32 corresponds to the position of the plurality of circuits 21 to be tested. The bottom plate 301 is provided with a plurality of openings 306, and the plurality of openings 306 can be used for the second elastic section of the elastic probe 5. The bottom edge of 53 protrudes outward for electrical contact with the plurality of detection electrodes 6 of the test platform (not shown in the figure). The circuit test device can be assembled on the test platform, whereby the test platform can obtain the plurality of detection electrodes 6. The electrical properties of the circuit 21 under test.

Please refer to Figure 7, which is a third preferred embodiment of a flexible probe and circuit testing device of the present invention. The third preferred embodiment is substantially the same as the second preferred embodiment, and the similarities will not be described in detail. , the difference is that the plurality of test grooves 31 are filled with fillers 33 and do not fill the entire space of the test grooves 31 .

Preferably, the filler 33 covers the fixed base 4 and fixes the position of the fixed base 4 in the test slot 31 through the filler 33. In addition, the filler 33 and the elastic probe The contact section 55 of 5 can fix the position of the contact section 55 to provide an insulation effect, and can also provide elastic force to the contact section 55 .

Please refer to Figure 8, Figure 9, and Figure 10, which is a fourth preferred embodiment of a flexible probe and circuit testing device of the present invention. The fourth preferred embodiment is substantially the same as the first preferred embodiment. The similarities will not be described in detail. The difference is that the elastic probe 5 further includes an insulating sleeve 56 provided on the surface of the fixed section 51 , wherein the insulating sleeve 56 provided on the surface of the fixed section 51 extends to the first On the surface of an elastic segment 52, the insulating sleeve 56 is preferably made of soft insulating plastic (Polyimide, PI). In actual implementation, the insulating sleeve 56 can use other insulating materials and does not need to extend to the The surface of the first elastic section 52 should not be limited to this.

A fixing slot 41 is provided on the fixing base 4. The fixing slot 41 can accommodate and fix the fixing sections 51 of six elastic probes 5 at the same time. The elastic extension sections 54 of the plurality of elastic probes 5 are divided in a fan-shaped manner. Extending to the corresponding test opening 32, a structure of a plurality of insulating trenches (not shown) can be provided on the side wall 302 of the base 3, and a detection electrode 6 is provided at the bottom of each insulating trench. The grooves respectively accommodate the plurality of second elastic sections 53 so that the second elastic sections 53 are in electrical contact with the plurality of detection electrodes 6 respectively.

In the fourth preferred embodiment, through the insulating sleeve 56 provided on the surface of the fixed section 51 and the first elastic section 52 of the elastic probe 5, multiple elastic probes can be fixed in one fixing groove 41. The position of the pin 5 and the structure of the fixing base 4 are simpler than the fixing base 4 of the first preferred embodiment, thereby reducing the size of the fixing base 4 and further reducing the size of the circuit testing device.

Please refer to Figure 10, which is a fifth preferred embodiment of a flexible probe and circuit testing device of the present invention. The fifth preferred embodiment is substantially the same as the fourth preferred embodiment, and the similarities will not be detailed here. As mentioned above, the difference is that the outer sides of the fixed section 51, the first elastic section 52, the second elastic section 53, the elastic extension section 54 and the contact section 55 of the plurality of elastic probes 5 are all covered with the insulating sleeve 56, wherein, The end of the contact section 55 of the elastic probe 5 protrudes from the insulating sleeve 56 for a certain length.

In the fifth preferred embodiment, the plurality of detection electrodes 6 are wires connected to the end of the fixed section 51 of the elastic probe 5, and the outer sides of the plurality of detection electrodes 6 are also respectively covered with an electrode insulating sleeve 61. The plurality of detection electrodes 6 can transmit the electrical signals of the plurality of elastic probes 5 to a signal analysis device (not shown) for analyzing the circuit characteristics of the circuit to be tested 21 .

Please refer to Figure 12 together. Through the insulating sleeve 56 provided on the plurality of elastic probes 5, the plurality of elastic probes 5 can be brought close to each other without causing a short circuit. Not only can the fixed sections of the plurality of elastic probes 5 be 51 is fixed in the same fixing groove 41, and the contact segments 55 of the plurality of elastic probes 5 can be disposed in the same test opening 32 at the same time. In the fifth preferred embodiment, the plurality of contact segments 55 are They are arranged in the test opening 32 in a transverse arrangement, and the contact segments 55 of the plurality of elastic probes 5 protrude outward from the test opening 32 to provide electrical contact with the electrodes 22 to be tested of the circuit to be tested 21. Preferably, Each elastic probe 5 provided in the circuit testing device is covered with the insulating sleeve 56. In actual implementation, the elastic probe 5 covered with the insulating sleeve 56 and the elastic probe 5 not covered with the insulating sleeve 56 can be used. The probes 5 are staggered and arranged, which should not be limited to the example of this preferred embodiment.

It is worth mentioning that since the contact segments 55 of the plurality of elastic probes 5 share the same test opening 32, the spacing between the contact segments 55 of the plurality of elastic probes 5 will not be limited by the structure of the plurality of test openings 32, which is suitable for To obtain the electrical properties of a plurality of electrodes 22 to be measured with a small spacing, in actual implementation, only the contact segment 55 of the plurality of elastic probes 5 may be provided with an insulating sleeve. 56 and are close to each other, the plurality of elastic probes 5 are spread out in a fan shape to space the fixed section 51, the first elastic section 52, the second elastic section 53 and the elastic extension section 54 from each other, and the plurality of fixed sections 51 They are provided in a plurality of fixed grooves 41 and should not be limited to this.

Please refer to Figure 13, which is a sixth preferred embodiment of a flexible probe and circuit testing device of the present invention. The sixth preferred embodiment is substantially the same as the fifth preferred embodiment, and the similarities will not be repeated here. To elaborate, the difference is that two contact sections 55 of the elastic probe 5 are provided in the test opening 32, and the two contact sections 55 are arranged in the test opening 32 in a transverse arrangement. In actual implementation, multiple contacts The segments 55 can be arranged in the test opening 32 in different arrangements. For example, a plurality of contact segments 55 can be arranged in the test opening 32 in a matrix manner, and should not be limited to this.

Please refer to Figure 14, which is a seventh preferred embodiment of an elastic probe and circuit testing device of the present invention. The elastic probe 5 includes a fixed section 51, a second elastic section 53 connected to the fixed section 51, An elastic extension section 54 is connected to the second elastic section 53 , and a contact section 55 is connected to the elastic extension section 54 .

The fixed base 4 is connected to the upper cover 303. The fixed base 4 is provided with a downward fixing groove 41. The upper cover 303 is provided with an opening 32. The fixed section 51 of the elastic probe 5 is arranged in the fixed groove of the fixed base 4. 41. The second elastic section 53 extends downward from the fixed section 51 and then turns toward the opening 32. The elastic extension section 54 extends the turned second elastic section 53 to the opening 32. Through the contact section 55 protrudes upward from the opening 32 .

The contact section 55 protruding upward from the opening 32 can be contacted by the electrode 22 of the circuit 21 to be tested. The bottom of the second elastic section 53 is used to contact the detection electrode 6 so that the elastic probe 5 can transmit the electrode 22 to be tested. The electrode 22 and the electrical signal of the detection electrode 6 can buffer the downward force of the circuit to be tested 21 , wherein the space at the bottom of the upper cover 303 can be filled with silicone.

From the above description, it can be seen that the elastic probe and circuit testing device of the present invention indeed have the following effects:

1. Can detect electrodes with small spacing:

The insulating sleeve 56 provided on the surface of the fixed section 51 can enable the fixing groove 41 to simultaneously fix the fixed sections 51 of the plurality of elastic probes 5, or the insulating sleeve 56 provided on the surface of the contact section 55 can enable the test opening 32 to accommodate The contact segments 55 of the plurality of elastic probes 5 are arranged to reduce the spacing between the plurality of elastic probes 5 or even to a close degree so that short circuits will not occur. This can be used to detect a plurality of objects to be tested with smaller spacing. The electrical properties of electrode 22.

2. There is no need to set up additional buffer elastomers:

Since the curvature of the first elastic section 52 of the elastic probe 5 is greater than the curvature of the second elastic section 53, and the curvature of the second elastic section 53 can be between an angle of 180 degrees and an angle of 270 degrees, the The second elastic section 53 provides the elastic probe 5 with better elasticity, so that there is no need to provide an additional buffer elastic body in the circuit testing device.

3. Poor contact will not occur:

The fixing slot 41 of the fixing base 4 can fix the elastic probe 5 in the test slot 31 so that the elastic probe 5 will not slide in the test slot 31, and the first elastic section 52 Bending in the direction opposite to the test opening 32 can make the side edge of the second elastic section 53 contact the detection electrode 6 and provide elastic force for the second elastic section 53 to press against the detection electrode 6. The side edges of the two elastic sections 53 are in tight contact with the detection electrode 6 and will not slip. Therefore, the elastic probe 5 has good electrical contact with the detection electrode 6 and no poor contact will occur.

To sum up, the first elastic section 52 is bent in the direction of the detection electrode 6, so that the side edge of the second elastic section 53 can contact the detection electrode 6, and the fixing base 4 fixes the elastic probe 5. The position of the fixed section 51 can prevent slippage between the second elastic section 53 and the detection electrode 6. When moving, the second elastic section 53 bends toward the direction of the test opening 32 , so that the elastic extension section 54 extends towards the direction of the test opening 32 and the contact section 55 protrudes outward from the test opening 32 . The elastic section 53 has a large bend and radian and a small curvature, which can effectively buffer the pressure of the electrode to be measured 22 against the contact section 55 . The insulating sleeve 56 provided on the elastic probe 5 can make the plurality of elastic probes 5 They are close to each other and insulated from each other, thereby providing a smaller electrode testing distance, so the purpose of the present invention can indeed be achieved.

However, the above are only six preferred embodiments of the present invention, and should not be used to limit the scope of the present invention. That is, any simple equivalent changes made in accordance with the patent scope of the present invention and the description of the invention are Modifications are still within the scope of the patent of this invention.

21: Circuit to be tested

22: Electrode to be tested

3: base

301: Base plate

302:Side wall

303: Upper cover

31:Test slot

32: Test opening

4: Fixed seat

41:Fixed slot

5: Elastic probe

6: Detection electrode

Claims (10)

An elastic probe is provided in a test device. The test device is provided with a fixed seat and a test opening. The fixed seat is provided with a fixed groove, which includes: a fixed section fixed in the fixed groove of the fixed seat; A second elastic section is connected to the fixed seat and the fixed section. The structure of the second elastic section is to bend in the direction of the test opening; an elastic extension section is connected to the second elastic section and extends to the test opening; and a contact section connected to the elastic extension section and protruding outward from the test opening; wherein the fixed section and the contact section are arranged on the same side of the second elastic section and are connected to the second elastic section. The direction in which the fixed section of the segment connection extends into the fixing groove is the same as the direction in which the contact section protrudes outward from the test opening. The elastic probe according to claim 1 further includes a first elastic section, the first elastic section is arranged between the fixed section and the second elastic section, and the structure of the first elastic section is towards the opposite direction of the test. Bend in the direction of the opening. The elastic probe of claim 1, wherein the curvature of the first elastic segment is greater than the curvature of the second elastic segment, the curvature of the first elastic segment is from an angle of 20 degrees to an angle of 90 degrees, and the curvature of the first elastic segment is from an angle of 20 degrees to an angle of 90 degrees. The curvature of the two elastic segments is from an angle of 180 degrees to an angle of 270 degrees. The elastic probe according to claim 1 further includes an insulating sleeve provided on the surface of the elastic probe. The elastic probe of claim 2, wherein the insulating sleeve is sleeved on the fixed section, the first elastic section, the second elastic section, the elastic extension section, the contact section, one of the fixed section, the first elastic section, the contact section, and a combination thereof. . A circuit testing device suitable for obtaining the electrical properties of at least one electrode to be tested of a circuit to be tested, and includes: a base, including at least one test slot defined by the base, and at least one test slot disposed on the base and a test opening connected to the test slot; at least one fixing seat, which is disposed in the test slot of the base, and includes at least one fixing slot surrounded by the fixing seat, and the fixing slot is connected to the test slot; at least one The elastic probe as described in any one of claims 1 to 5 includes, in order, a fixed section, a first elastic section, a second elastic section, an elastic extension section, and a contact section, and the fixed section of the elastic probe The first elastic segment is arranged in the fixing groove of the fixing base and protrudes into the test slot. The first elastic segment is bent in the direction opposite to the test opening. The second elastic segment is bent in the direction of the test opening and is formed by the The elastic extension section extends to the test opening, the contact section protrudes outward from the test opening and is set in a position that matches the position of the electrode to be tested; and at least one detection electrode is electrically connected to the elastic probe disposed in the base. The contact section of the elastic probe provides contact with the electrode under test of the circuit under test so that the detection electrode and the electrode under test are electrically connected. The circuit testing device of claim 6, wherein the opening direction of the test opening is opposite to the opening direction of the fixing groove. The circuit testing device of claim 6, wherein the elastic probe further includes an insulating sleeve disposed on the surface of the elastic probe. The circuit test device of claim 8, wherein the insulating sleeve is set on the surface of the fixed section, and the fixing groove of the fixing base fixes the fixed section of the plurality of elastic probes, and the plurality of elastic probes are connected through the insulating sleeve. And insulated from each other. The circuit test device of claim 8, wherein the insulating sleeve is set on the surface of the contact section, and the test opening of the base accommodates the contact section of a plurality of elastic probes, and the plurality of elastic probes are arranged by Insulating sleeves to insulate each other.