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TWI801202B - 電路驗證方法 - Google Patents

電路驗證方法 Download PDF

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Publication number
TWI801202B
TWI801202B TW111114125A TW111114125A TWI801202B TW I801202 B TWI801202 B TW I801202B TW 111114125 A TW111114125 A TW 111114125A TW 111114125 A TW111114125 A TW 111114125A TW I801202 B TWI801202 B TW I801202B
Authority
TW
Taiwan
Prior art keywords
verification method
circuit verification
circuit
verification
Prior art date
Application number
TW111114125A
Other languages
English (en)
Other versions
TW202340999A (zh
Inventor
羅翊修
陳勇仁
羅幼嵐
高淑怡
Original Assignee
瑞昱半導體股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 瑞昱半導體股份有限公司 filed Critical 瑞昱半導體股份有限公司
Priority to TW111114125A priority Critical patent/TWI801202B/zh
Priority to US18/059,961 priority patent/US12488168B2/en
Application granted granted Critical
Publication of TWI801202B publication Critical patent/TWI801202B/zh
Publication of TW202340999A publication Critical patent/TW202340999A/zh

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/32Circuit design at the digital level
    • G06F30/33Design verification, e.g. functional simulation or model checking
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/32Circuit design at the digital level
    • G06F30/33Design verification, e.g. functional simulation or model checking
    • G06F30/3323Design verification, e.g. functional simulation or model checking using formal methods, e.g. equivalence checking or property checking
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2119/00Details relating to the type or aim of the analysis or the optimisation
    • G06F2119/02Reliability analysis or reliability optimisation; Failure analysis, e.g. worst case scenario performance, failure mode and effects analysis [FMEA]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/20Design optimisation, verification or simulation
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/32Circuit design at the digital level
    • G06F30/33Design verification, e.g. functional simulation or model checking
    • G06F30/3308Design verification, e.g. functional simulation or model checking using simulation
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/36Circuit design at the analogue level
    • G06F30/367Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/39Circuit design at the physical level
    • G06F30/398Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
TW111114125A 2022-04-13 2022-04-13 電路驗證方法 TWI801202B (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW111114125A TWI801202B (zh) 2022-04-13 2022-04-13 電路驗證方法
US18/059,961 US12488168B2 (en) 2022-04-13 2022-11-29 Circuit verification method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW111114125A TWI801202B (zh) 2022-04-13 2022-04-13 電路驗證方法

Publications (2)

Publication Number Publication Date
TWI801202B true TWI801202B (zh) 2023-05-01
TW202340999A TW202340999A (zh) 2023-10-16

Family

ID=87424256

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111114125A TWI801202B (zh) 2022-04-13 2022-04-13 電路驗證方法

Country Status (2)

Country Link
US (1) US12488168B2 (zh)
TW (1) TWI801202B (zh)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120198399A1 (en) * 2011-01-31 2012-08-02 Sean Arash Safarpour System, method and computer program for determining fixed value, fixed time, and stimulus hardware diagnosis
TW202034454A (zh) * 2019-03-06 2020-09-16 瑞昱半導體股份有限公司 電路設計方法及相關的電腦程式產品
TW202117574A (zh) * 2019-10-18 2021-05-01 台灣積體電路製造股份有限公司 基於佈局環境的單元時序特徵分析
CN113988438A (zh) * 2021-11-01 2022-01-28 深圳市卡博尔科技有限公司 一种基于ic载板生产流程的自检方法及系统

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3842489B2 (ja) * 1999-06-30 2006-11-08 株式会社東芝 回路設計装置、回路設計方法および回路設計プログラムを格納したコンピュータ読み取り可能な記録媒体
JP2002082830A (ja) * 2000-02-14 2002-03-22 Mitsubishi Electric Corp インターフェイス回路
JP2012083954A (ja) * 2010-10-12 2012-04-26 Fujitsu Ltd 回路設計支援装置、回路設計支援装置の制御方法および回路設計支援装置の制御プログラム
TWI464569B (zh) * 2012-11-06 2014-12-11 Upi Semiconductor Corp 電壓識別碼參考電壓產生電路與其開機電壓產生方法
WO2016161186A1 (en) * 2015-03-31 2016-10-06 Lutron Electronics Co., Inc. Load control device having stuck relay detection
JP6880403B2 (ja) * 2017-05-24 2021-06-02 富士通株式会社 半導体装置の設計検証支援装置、半導体装置の設計検証支援プログラム及び半導体装置の設計検証支援方法
TWI620873B (zh) * 2017-08-02 2018-04-11 新唐科技股份有限公司 風扇偵測方法、風扇偵測晶片及風扇偵測系統
CN108845558B (zh) * 2018-05-03 2020-07-03 上海兆芯集成电路有限公司 检测控制装置
CN112783817B (zh) * 2021-01-29 2024-01-05 上海联影医疗科技股份有限公司 设备接入检测装置、PCIe路由卡、系统、控制方法及介质
WO2022198630A1 (zh) * 2021-03-26 2022-09-29 华为技术有限公司 信号转接控制方法、信号转接装置、测试系统及平台

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120198399A1 (en) * 2011-01-31 2012-08-02 Sean Arash Safarpour System, method and computer program for determining fixed value, fixed time, and stimulus hardware diagnosis
TW202034454A (zh) * 2019-03-06 2020-09-16 瑞昱半導體股份有限公司 電路設計方法及相關的電腦程式產品
TW202117574A (zh) * 2019-10-18 2021-05-01 台灣積體電路製造股份有限公司 基於佈局環境的單元時序特徵分析
CN113988438A (zh) * 2021-11-01 2022-01-28 深圳市卡博尔科技有限公司 一种基于ic载板生产流程的自检方法及系统

Also Published As

Publication number Publication date
TW202340999A (zh) 2023-10-16
US20230334209A1 (en) 2023-10-19
US12488168B2 (en) 2025-12-02

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