TWI800505B - Applying power to electrodes of plasma reactor - Google Patents
Applying power to electrodes of plasma reactor Download PDFInfo
- Publication number
- TWI800505B TWI800505B TW107111435A TW107111435A TWI800505B TW I800505 B TWI800505 B TW I800505B TW 107111435 A TW107111435 A TW 107111435A TW 107111435 A TW107111435 A TW 107111435A TW I800505 B TWI800505 B TW I800505B
- Authority
- TW
- Taiwan
- Prior art keywords
- electrodes
- plasma reactor
- applying power
- applying
- power
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32155—Frequency modulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32155—Frequency modulation
- H01J37/32165—Plural frequencies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32568—Relative arrangement or disposition of electrodes; moving means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32697—Electrostatic control
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762489344P | 2017-04-24 | 2017-04-24 | |
| US62/489,344 | 2017-04-24 | ||
| US201762523759P | 2017-06-22 | 2017-06-22 | |
| US201762523761P | 2017-06-22 | 2017-06-22 | |
| US201762523763P | 2017-06-22 | 2017-06-22 | |
| US62/523,759 | 2017-06-22 | ||
| US62/523,763 | 2017-06-22 | ||
| US62/523,761 | 2017-06-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201907045A TW201907045A (en) | 2019-02-16 |
| TWI800505B true TWI800505B (en) | 2023-05-01 |
Family
ID=63920395
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW107111435A TWI800505B (en) | 2017-04-24 | 2018-03-31 | Applying power to electrodes of plasma reactor |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP7098654B2 (en) |
| KR (1) | KR102501096B1 (en) |
| CN (1) | CN110603621A (en) |
| TW (1) | TWI800505B (en) |
| WO (1) | WO2018200409A1 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102896968B1 (en) * | 2021-08-26 | 2025-12-09 | 세메스 주식회사 | Substrate treating apparatus |
| US12106938B2 (en) * | 2021-09-14 | 2024-10-01 | Applied Materials, Inc. | Distortion current mitigation in a radio frequency plasma processing chamber |
| JP7431210B2 (en) * | 2021-12-28 | 2024-02-14 | 株式会社Kokusai Electric | Substrate processing equipment, plasma generation equipment, semiconductor device manufacturing method, plasma generation method and program |
| KR20250162638A (en) * | 2024-05-09 | 2025-11-19 | 삼성디스플레이 주식회사 | Electrostatic chuck |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6161499A (en) * | 1997-07-07 | 2000-12-19 | Cvd Diamond Corporation | Apparatus and method for nucleation and deposition of diamond using hot-filament DC plasma |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3907087B2 (en) * | 1996-10-28 | 2007-04-18 | キヤノンアネルバ株式会社 | Plasma processing equipment |
| JP3501668B2 (en) * | 1997-12-10 | 2004-03-02 | キヤノン株式会社 | Plasma CVD method and plasma CVD apparatus |
| TW507256B (en) * | 2000-03-13 | 2002-10-21 | Mitsubishi Heavy Ind Ltd | Discharge plasma generating method, discharge plasma generating apparatus, semiconductor device fabrication method, and semiconductor device fabrication apparatus |
| JP2004055600A (en) * | 2002-07-16 | 2004-02-19 | Tokyo Electron Ltd | Plasma processing apparatus |
| JP2004128159A (en) * | 2002-10-01 | 2004-04-22 | Mitsubishi Heavy Ind Ltd | Device and method for producing high frequency plasma |
| JP3902113B2 (en) * | 2002-10-31 | 2007-04-04 | 三菱重工業株式会社 | Plasma chemical vapor deposition method |
| US8293069B2 (en) * | 2004-03-15 | 2012-10-23 | Sungkyunkwan University | Inductively coupled plasma apparatus |
| JP4634138B2 (en) * | 2004-12-27 | 2011-02-16 | 日本碍子株式会社 | Plasma generating electrode and plasma reactor |
| US20070031609A1 (en) * | 2005-07-29 | 2007-02-08 | Ajay Kumar | Chemical vapor deposition chamber with dual frequency bias and method for manufacturing a photomask using the same |
| JP2008016476A (en) * | 2006-07-03 | 2008-01-24 | Hitachi Kokusai Electric Inc | Semiconductor manufacturing equipment |
| US8372238B2 (en) * | 2008-05-20 | 2013-02-12 | Nordson Corporation | Multiple-electrode plasma processing systems with confined process chambers and interior-bussed electrical connections with the electrodes |
| KR100994502B1 (en) * | 2008-12-10 | 2010-11-15 | 엘아이지에이디피 주식회사 | Plasma treatment apparatus and method |
| KR101552726B1 (en) * | 2009-02-04 | 2015-09-11 | 엘지전자 주식회사 | Plasma enhanced chemical vapor deposition apparatus |
| JP2014049541A (en) * | 2012-08-30 | 2014-03-17 | Mitsubishi Heavy Ind Ltd | Thin film manufacturing device and electrode voltage regulating method thereof |
| US10153133B2 (en) * | 2015-03-23 | 2018-12-11 | Applied Materials, Inc. | Plasma reactor having digital control over rotation frequency of a microwave field with direct up-conversion |
-
2018
- 2018-03-31 TW TW107111435A patent/TWI800505B/en not_active IP Right Cessation
- 2018-04-23 KR KR1020197034555A patent/KR102501096B1/en active Active
- 2018-04-23 WO PCT/US2018/028936 patent/WO2018200409A1/en not_active Ceased
- 2018-04-23 CN CN201880027286.9A patent/CN110603621A/en active Pending
- 2018-04-23 JP JP2019557446A patent/JP7098654B2/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6161499A (en) * | 1997-07-07 | 2000-12-19 | Cvd Diamond Corporation | Apparatus and method for nucleation and deposition of diamond using hot-filament DC plasma |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20190134810A (en) | 2019-12-04 |
| KR102501096B1 (en) | 2023-02-17 |
| JP2020521270A (en) | 2020-07-16 |
| TW201907045A (en) | 2019-02-16 |
| CN110603621A (en) | 2019-12-20 |
| JP7098654B2 (en) | 2022-07-11 |
| WO2018200409A1 (en) | 2018-11-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |