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TWI800056B - 線路裸板的檢測設備 - Google Patents

線路裸板的檢測設備 Download PDF

Info

Publication number
TWI800056B
TWI800056B TW110139927A TW110139927A TWI800056B TW I800056 B TWI800056 B TW I800056B TW 110139927 A TW110139927 A TW 110139927A TW 110139927 A TW110139927 A TW 110139927A TW I800056 B TWI800056 B TW I800056B
Authority
TW
Taiwan
Prior art keywords
circuit board
inspection apparatus
bare circuit
bare
inspection
Prior art date
Application number
TW110139927A
Other languages
English (en)
Other versions
TW202317994A (zh
Inventor
李信宏
簡俊賢
謝育忠
方一修
曾子章
Original Assignee
欣興電子股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 欣興電子股份有限公司 filed Critical 欣興電子股份有限公司
Priority to TW110139927A priority Critical patent/TWI800056B/zh
Priority to US17/647,012 priority patent/US11579178B1/en
Application granted granted Critical
Publication of TWI800056B publication Critical patent/TWI800056B/zh
Publication of TW202317994A publication Critical patent/TW202317994A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas
    • G01R29/105—Radiation diagrams of antennas using anechoic chambers; Chambers or open field sites used therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/101—Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW110139927A 2021-10-27 2021-10-27 線路裸板的檢測設備 TWI800056B (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW110139927A TWI800056B (zh) 2021-10-27 2021-10-27 線路裸板的檢測設備
US17/647,012 US11579178B1 (en) 2021-10-27 2022-01-04 Inspection apparatus for bare circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW110139927A TWI800056B (zh) 2021-10-27 2021-10-27 線路裸板的檢測設備

Publications (2)

Publication Number Publication Date
TWI800056B true TWI800056B (zh) 2023-04-21
TW202317994A TW202317994A (zh) 2023-05-01

Family

ID=85198802

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110139927A TWI800056B (zh) 2021-10-27 2021-10-27 線路裸板的檢測設備

Country Status (2)

Country Link
US (1) US11579178B1 (zh)
TW (1) TWI800056B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116027119A (zh) * 2021-10-27 2023-04-28 欣兴电子股份有限公司 线路裸板的检测设备

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7721868B2 (ja) * 2020-03-26 2025-08-13 ニデックアドバンステクノロジー株式会社 基板検査装置
KR102858506B1 (ko) * 2020-05-13 2025-09-10 동우 화인켐 주식회사 안테나 검사 장치 및 방법
TWI804309B (zh) * 2022-05-11 2023-06-01 量崴科技股份有限公司 天線測試系統
TWI851079B (zh) * 2023-03-14 2024-08-01 欣興電子股份有限公司 線路裸板的檢測系統及其檢測方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107247192A (zh) * 2017-06-12 2017-10-13 深圳市信维通信股份有限公司 一种移动终端天线测试系统及方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004152916A (ja) * 2002-10-29 2004-05-27 Nec Corp 半導体デバイス検査装置及び検査方法
US8907694B2 (en) * 2009-12-17 2014-12-09 Xcerra Corporation Wiring board for testing loaded printed circuit board
US8686736B2 (en) * 2010-11-23 2014-04-01 Infineon Technologies Ag System and method for testing a radio frequency integrated circuit
JP6267918B2 (ja) * 2013-10-09 2018-01-24 ローム株式会社 ノイズ源を含むデバイスの評価方法
TW201528712A (zh) * 2013-12-09 2015-07-16 Patrick Antoine Rada 無線發送器及無線接收器之無線耦合射頻校準及測試方法
US10852349B2 (en) 2018-04-09 2020-12-01 Mediatek Inc. Wireless test system for testing microelectronic devices integrated with antenna
TWI693414B (zh) 2019-09-10 2020-05-11 矽品精密工業股份有限公司 檢測設備及其測試裝置
TWM595760U (zh) 2020-02-07 2020-05-21 中華精測科技股份有限公司 封裝積體電路之測試裝置及自動化測試設備

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107247192A (zh) * 2017-06-12 2017-10-13 深圳市信维通信股份有限公司 一种移动终端天线测试系统及方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116027119A (zh) * 2021-10-27 2023-04-28 欣兴电子股份有限公司 线路裸板的检测设备

Also Published As

Publication number Publication date
US11579178B1 (en) 2023-02-14
TW202317994A (zh) 2023-05-01

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