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TWI898419B - Power module - Google Patents

Power module

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Publication number
TWI898419B
TWI898419B TW113104139A TW113104139A TWI898419B TW I898419 B TWI898419 B TW I898419B TW 113104139 A TW113104139 A TW 113104139A TW 113104139 A TW113104139 A TW 113104139A TW I898419 B TWI898419 B TW I898419B
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Taiwan
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power module
metal layer
current detector
power
layer
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TW113104139A
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Chinese (zh)
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TW202533387A (en
Inventor
吳翰林
賴文上
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台達電子工業股份有限公司
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Priority to TW113104139A priority Critical patent/TWI898419B/en
Publication of TW202533387A publication Critical patent/TW202533387A/en
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Publication of TWI898419B publication Critical patent/TWI898419B/en

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Abstract

The disclosure provides a power module, including a leadless frame substrate including a first metal layer and an insulating layer, wherein the first metal layer forms a circuit trace disposed on the insulating layer and the first metal layer has an extension structure extending out of the insulating layer to serve as an output terminal; at least one semiconductor power device disposed on the first metal layer; a current detector disposed on the output terminal; and a molding compound, completely covering the first metal layer on the insulating layer of the leadless frame substrate and the at least one semiconductor power device, and partially covering the output terminal so that the current detector is completely disposed outside the mold compound.

Description

功率模組Power Module

本揭示是關於一種功率模組,特別是關於一種具有電流檢測器的功率模組。The present disclosure relates to a power module, and more particularly to a power module with a current detector.

現有電路系統應用中功率模組運作時,需要監控功率模組輸出/輸入電流。一種方式是於功率模組的輸出端子上外掛電流檢測器,例如以塑膠架或電路板將電流檢測器固定於該功率模組輸出端的導線架(Lead Frame)或匯流排(Bus Bar)上。In existing circuit system applications, it is necessary to monitor the output and input currents of power modules during operation. One approach is to attach a current detector to the output terminals of the power module, for example, by fixing the current detector to a lead frame or bus bar at the output end of the power module using a plastic frame or circuit board.

對使用者而言,安裝電流檢測器後需要校正電流檢測器的訊號,花費時間冗長。例如,產業下游的電力設備組裝廠商每次在功率模組上安裝電流檢測器後,由於電流檢測器的安裝方式是以人工鎖附或組裝,造成每次安裝後電流檢測器的定位的誤差較大,使得各個功率模組的電流檢測器間的訊號變異較大,因此安裝後需要對訊號進行校正,相當耗時。一種常見的電流檢測器的安裝方式是將電流檢測器設置在電路板上,再將電路板與功率模組的輸出腳位對鎖,並且使用U型環加強磁力線以改善訊號強度,但仍未解決定位不精確造成的訊號變異問題,且U型環的組裝複雜,較佔空間。For users, calibrating the current detector signal after installation is a time-consuming and tedious process. For example, downstream power equipment assemblers often manually attach or assemble current detectors to power modules, leading to significant positioning errors after each installation. This results in significant signal variation between current detectors on each power module, necessitating time-consuming post-installation signal calibration. A common method for mounting current detectors is to place the current detector on a circuit board, align the board with the output pins of the power module, and use a U-shaped ring to strengthen the magnetic field to improve signal strength. However, this still does not solve the problem of signal variation caused by inaccurate positioning. Furthermore, the U-shaped ring is complex to assemble and takes up a lot of space.

為解決上述習知技術之問題,本揭示提供一種功率模組,其可有效地解決現有技術中電流檢測器件定位誤差較大的問題。To solve the above-mentioned problems in the prior art, the present disclosure provides a power module that can effectively solve the problem of large positioning errors of current detection devices in the prior art.

本揭示之一實施例提供一種功率模組,包含:一無導線框架基板、至少一半導體功率器件、一電流檢測器以及一模制化合物。該無導線框架基板包括一第一金屬層及一絕緣層,其中該第一金屬層形成一電路走線設置於該絕緣層上且該第一金屬層具有一延伸結構延伸出該絕緣層以作為一輸出端部。該至少一半導體功率器件設置於該第一金屬層上。該電流檢測器設置於該輸出端部上。該第一金屬層位於該絕緣層上的部分被該模制化合物完全包覆,該至少一半導體功率器件被該模制化合物完全包覆並且該模制化合物部分地包覆該輸出端部讓該電流檢測器完全裸露於該模制化合物外。其中,該功率模組用以將一直流電力轉換為一交流電力,並且經由該輸出端部輸出該交流電力,且藉由該電流檢測器檢測該交流電力。One embodiment of the present disclosure provides a power module comprising: a leadframe-less substrate, at least one semiconductor power device, a current detector, and a molding compound. The leadframe-less substrate includes a first metal layer and an insulating layer, wherein the first metal layer forms a circuit trace disposed on the insulating layer and the first metal layer has an extension structure extending out of the insulating layer to serve as an output terminal. The at least one semiconductor power device is disposed on the first metal layer. The current detector is disposed on the output terminal. The portion of the first metal layer located on the insulating layer is completely covered by the molding compound, the at least one semiconductor power device is completely covered by the molding compound, and the molding compound partially covers the output terminal, leaving the current detector completely exposed outside the molding compound. The power module is used to convert DC power into AC power, output the AC power through the output end, and detect the AC power through the current detector.

本揭示之一實施例所述的功率模組,其中該第一金屬層的磁化率小於1且大於0。In the power module according to one embodiment of the present disclosure, the magnetic susceptibility of the first metal layer is less than 1 and greater than 0.

本揭示之一實施例所述的功率模組,其中該無導線框架基板還包括一第二金屬層設置於該絕緣層下,且該模制化合物部分地包覆該第二金屬層。In the power module according to one embodiment of the present disclosure, the leadframe-free substrate further includes a second metal layer disposed under the insulating layer, and the molding compound partially covers the second metal layer.

本揭示之一實施例所述的功率模組,其中該電流檢測器係以機械手臂輔助的方式固定於所述輸出端部上。In the power module according to one embodiment of the present disclosure, the current detector is fixed on the output end with the assistance of a robotic arm.

本揭示還提供一種功率模組,包含:一無導線框架基板、至少一半導體功率器件、一電流檢測器以及一模制化合物。該無導線框架基板包括一第一金屬層及一絕緣層,其中該第一金屬層形成一電路走線,該電路走線設置於該絕緣層上且具有一輸出端部。該至少一半導體功率器件,設置於該電路走線上。該電流檢測器,設置於該輸出端部上。該模制化合物,完全包覆該無導線框架基板的該第一金屬層、該至少一半導體功率器件及該電流檢測器。其中,該功率模組用以將一直流電力轉換為一交流電力,並且經由該輸出端部輸出該交流電力,且藉由該電流檢測器檢測該交流電力。The present disclosure also provides a power module comprising: a lead frame substrate, at least one semiconductor power device, a current detector, and a molding compound. The lead frame substrate includes a first metal layer and an insulating layer, wherein the first metal layer forms a circuit trace, the circuit trace is arranged on the insulating layer and has an output end. The at least one semiconductor power device is arranged on the circuit trace. The current detector is arranged on the output end. The molding compound completely covers the first metal layer of the lead frame substrate, the at least one semiconductor power device, and the current detector. The power module is used to convert direct current (DC) power into alternating current (AC) power, output the AC power through the output end, and detect the AC power by the current detector.

本揭示之一實施例所述的功率模組,其中該第一金屬層的磁化率小於1且大於0。In the power module according to one embodiment of the present disclosure, the magnetic susceptibility of the first metal layer is less than 1 and greater than 0.

本揭示之一實施例所述的功率模組,其中該無導線框架基板還包括一第二金屬層設置於該絕緣層下,且該模制化合物部分地包覆該第二金屬層。In the power module according to one embodiment of the present disclosure, the leadframe-free substrate further includes a second metal layer disposed under the insulating layer, and the molding compound partially covers the second metal layer.

本揭示之一實施例所述的功率模組,其中該電流檢測器係以機械手臂輔助的方式固定於所述輸出端部上。In the power module according to one embodiment of the present disclosure, the current detector is fixed on the output end with the assistance of a robotic arm.

本揭示之一實施例所述的功率模組,更包括一導線架連接至該輸出端部。The power module according to one embodiment of the present disclosure further includes a lead frame connected to the output end.

本揭示之一實施例所述的功率模組,更包括插針結構設置於該第一金屬層上,其中該電流檢測器為表面貼裝的元件,該元件的訊號端經由該電路走線電連接至該插針結構。The power module described in one embodiment of the present disclosure further includes a pin structure disposed on the first metal layer, wherein the current detector is a surface-mounted component, and the signal end of the component is electrically connected to the pin structure via the circuit trace.

本揭示之一實施例所述的功率模組,其中該電流檢測器的訊號端經由接線(bonding wire)電連接至該第一金屬層。In the power module according to one embodiment of the present disclosure, the signal end of the current detector is electrically connected to the first metal layer via a bonding wire.

本揭示之一實施例所述的功率模組,更包括多層基板電路結構設置於該第一金屬層上。The power module described in one embodiment of the present disclosure further includes a multi-layer substrate circuit structure disposed on the first metal layer.

本揭示之一實施例所述的功率模組,該多層基板電路結構延伸至該模制化合物之外,且該電流檢測器的訊號端經由接線電連接至該多層基板電路結構。In the power module according to one embodiment of the present disclosure, the multi-layer substrate circuit structure extends outside the molding compound, and the signal terminal of the current detector is electrically connected to the multi-layer substrate circuit structure via a wiring.

本揭示之一實施例所述的功率模組,更包括插針結構設置於該多層基板電路結構上,該電流檢測器的訊號端經由接線電連接至該多層基板電路結構且經由該多層基板電路結構電連接至該插針結構。The power module described in one embodiment of the present disclosure further includes a pin structure disposed on the multi-layer substrate circuit structure, and the signal end of the current detector is electrically connected to the multi-layer substrate circuit structure via a wiring and is electrically connected to the pin structure via the multi-layer substrate circuit structure.

相較於先前技術,本揭示的功率模組的結構適用表面貼裝技術(Surface Mount Technology, SMT)等精準的封裝技術,可以精確地將電流檢測器安裝在輸出端部,提供已安裝了電流檢測器的功率模組。由於本揭示的電流檢測器的定位誤差較小,因此可直接適用感測訊號的初始調校數據,不必對每個功率模組的電流檢測器的訊號進行重新校正,有效地避免現有技術中的問題。Compared to prior art, the power module structure disclosed herein utilizes precise packaging technologies such as surface mount technology (SMT), enabling the precise mounting of the current detector at the output terminal, providing a pre-installed power module. Because the current detector's positioning error is minimal, the initial calibration data from the sensed signal can be directly applied, eliminating the need to recalibrate the current detector signal for each power module, effectively avoiding the problems associated with prior art.

為了讓本揭示的特徵、優點能更明顯易懂,下文將特舉本揭示優選實施例,並配合所附圖式,作詳細說明如下。再者,本揭示使用的方向用語是用以說明及理解本揭示,而非用以限制本揭示。在圖中,結構相似的單元是以相同標號表示。To make the features and advantages of this disclosure more readily apparent, preferred embodiments of the disclosure are described below in detail with reference to the accompanying drawings. Furthermore, the directional terms used in this disclosure are intended to facilitate understanding and are not intended to limit this disclosure. In the figures, similarly structured elements are denoted by the same reference numerals.

參照圖2A及圖2B,本揭示之第一實施例提供一種功率模組100,包含無導線框架基板10、至少一半導體功率器件20、電流檢測器30以及模制化合物40。該無導線框架基板10包括一第一金屬層12及一絕緣層14,即,該無導線框架基板10為一複合材質層基板,由多個材料層組成,其中該第一金屬層12形成一電路走線(121、122、16)設置於該絕緣層14上且該第一金屬層12具有一延伸結構122延伸出該絕緣層14以作為一輸出端部16。該至少一半導體功率器件20設置於該第一金屬層12上。該電流檢測器30設置於該輸出端部16上。該模制化合物40完全包覆該無導線框架基板10位於該絕緣層14上的該第一金屬層12及該至少一半導體功率器件20,並且部分地包覆該輸出端部16讓該電流檢測器30完全裸露於該模制化合物40外;其中,該功率模組100用以將一直流電力轉換為一交流電力,並且經由該輸出端部16輸出該交流電力,且藉由該電流檢測器30檢測該交流電力。2A and 2B , a first embodiment of the present disclosure provides a power module 100 comprising a leadframe-less substrate 10, at least one semiconductor power device 20, a current detector 30, and a molding compound 40. The leadframe-less substrate 10 includes a first metal layer 12 and an insulating layer 14. Specifically, the leadframe-less substrate 10 is a composite material substrate composed of multiple material layers. The first metal layer 12 forms a circuit trace (121, 122, 16) disposed on the insulating layer 14, and the first metal layer 12 has an extension structure 122 extending from the insulating layer 14 to serve as an output terminal 16. The at least one semiconductor power device 20 is disposed on the first metal layer 12. The current detector 30 is disposed on the output terminal 16. The molding compound 40 completely covers the first metal layer 12 and the at least one semiconductor power device 20 of the leadframe-free substrate 10 located on the insulating layer 14, and partially covers the output terminal 16, leaving the current detector 30 completely exposed outside the molding compound 40. The power module 100 is configured to convert DC power into AC power, output the AC power through the output terminal 16, and detect the AC power using the current detector 30.

參照圖1,傳統的功率模組p100是使用導線框架基板(Lead-frame substrate,又稱導線架基板),不同於本揭示無導線框架基板10的多個材質層(如圖2B所示),而其中圖1的習知技術中完全以導線框架p10形成被模制化合物p40包覆的電路走線p12以及伸出模制化合物p40的延伸結構p122,並且延伸結構p122用於作為功率模組的輸入端子p121或輸出端子p16。電流檢測器p30設置於該輸出端子p16上。半導體功率器件p20設置於散熱塊p18上。但導線框架p10係以金屬沖壓方式製造,無法提供本揭示的電流檢測器所需要的精確定位。本發明使用無導線框架基板10 (Lead-off substrate),其特徵主要是在於將複合材質層基板的一金屬面延伸出絕緣層,並形成連接組件以作為功率模組的輸入端子或輸出端子。Referring to Figure 1, the conventional power module p100 uses a lead-frame substrate (also called a lead-frame substrate), which is different from the multiple material layers of the lead-frame substrate 10 disclosed in the present invention (as shown in Figure 2B). In the conventional technology of Figure 1, the circuit trace p12 covered by the molding compound p40 and the extended structure p122 extending out of the molding compound p40 are formed entirely with the lead frame p10, and the extended structure p122 is used as the input terminal p121 or the output terminal p16 of the power module. The current detector p30 is arranged on the output terminal p16. The semiconductor power device p20 is arranged on the heat sink p18. However, the lead frame p10 is manufactured by metal stamping and cannot provide the precise positioning required for the current detector disclosed in the present invention. The present invention uses a lead-off substrate 10, which is characterized by extending a metal surface of a composite material layer substrate beyond the insulating layer to form a connection component to serve as the input or output terminal of the power module.

參照圖2A及圖2B,在一實施例中,無導線框架基板(Lead-off substrate)10為一種陶瓷基板,其第一金屬層12例如為銅、或鋁材質以鑄造與蝕刻的方式形成電路走線,具有較高的定位與形狀精度。其厚度一般介於0.5至0.8mm之間,最高可為1.2mm。相較於一般電路板的電路層而言,第一金屬層12的厚度較厚,可不需下方絕緣層14的支撐而伸出絕緣層14,以作為輸出或輸入的插針或插頭之用。較厚的第一金屬層12也可適用於半導體功率器件較大的操作電壓與電流。絕緣層14例如為陶瓷材質,可兼具絕緣與耐熱性質。無導線框架基板10適於電力領域的高熱與振動等環境中使用。藉由使用無導線框架基板10可以縮小功率模組的體積,並提高功率密度。Referring to Figures 2A and 2B, in one embodiment, the lead-off substrate 10 is a ceramic substrate, and its first metal layer 12 is formed into circuit traces by casting and etching, for example, copper or aluminum, with high positioning and shape accuracy. Its thickness is generally between 0.5 and 0.8 mm, and can be as high as 1.2 mm. Compared to the circuit layer of a conventional circuit board, the first metal layer 12 is thicker and can extend beyond the insulating layer 14 without the support of the underlying insulating layer 14 to serve as an output or input pin or plug. The thicker first metal layer 12 can also be suitable for the larger operating voltages and currents of semiconductor power devices. The insulating layer 14 is made of, for example, ceramic, which provides both insulation and heat resistance. The leadless frame substrate 10 is suitable for use in high-heat and vibration environments in the power industry. Using the leadless frame substrate 10 can reduce the size of power modules and increase power density.

參照圖2A及圖2B,在一實施例中,第一金屬層12形成設置於該絕緣層14上的電路走線(121、122、16),例如包括引進直流電位的兩輸入端部121以提供半導體功率器件20所需的輸入電位,以及延伸出該絕緣層14的延伸結構122以作為將半導體功率器件20輸出的三相交流電引出的三個輸出端部16。具體的電路走線可依實際需求進行設計。半導體功率器件20輸出三相交流電僅為舉例。圖2A所示三個輸出端部16亦僅為舉例,交流電的種類與輸出端部16的數目可以按照需求設計。交流電可以是單相雙線、單相三線,或二相、三相、四相、六相等,本發明不限於此。Referring to Figures 2A and 2B , in one embodiment, the first metal layer 12 forms circuit traces (121, 122, 16) disposed on the insulating layer 14. These traces include, for example, two input terminals 121 for introducing DC potential to provide the input potential required by the semiconductor power device 20, and an extension structure 122 extending from the insulating layer 14 to serve as three output terminals 16 for extracting the three-phase AC power outputted by the semiconductor power device 20. The specific circuit traces can be designed based on actual needs. The semiconductor power device 20 outputting three-phase AC power is merely an example. The three output terminals 16 shown in Figure 2A are also merely an example; the type of AC power and the number of output terminals 16 can be designed as needed. The AC power can be single-phase two-wire, single-phase three-wire, or two-phase, three-phase, four-phase, six-phase, etc., but the present invention is not limited thereto.

參照圖2A及圖2B,半導體功率器件20例如為直流轉交流器件。可利用表面貼裝技術(Surface Mount Technology, SMT)設置於兩個由第一金屬層12形成的輸入端部121上,或以接線(bonding wire,又稱打線)的方式將半導體功率器件20與兩個輸入端部121電連接。並且以接線或表面貼裝的方式將半導體功率器件20的輸出端電連接至對應的輸出端部16,本揭示不限於此(圖2A所示為使用表面貼裝技術將半導體功率器件20設置於兩個輸入端部121上,並以接線的方式將半導體功率器件20的輸出端電連接至對應的輸出端部16上)。半導體功率器件20可依需求設置一個至多個。功率模組100內還可依需求設置其他的電子元件,本揭示不限於此。2A and 2B , the semiconductor power device 20 is, for example, a DC-to-AC converter. It can be mounted on two input terminals 121 formed by the first metal layer 12 using surface mount technology (SMT), or the semiconductor power device 20 can be electrically connected to the two input terminals 121 using bonding wires (also known as wire bonding). The output terminal of the semiconductor power device 20 can be electrically connected to the corresponding output terminal 16 using bonding wires or surface mounting. The present disclosure is not limited to this ( FIG. 2A shows that the semiconductor power device 20 is mounted on the two input terminals 121 using surface mount technology, and the output terminal of the semiconductor power device 20 is electrically connected to the corresponding output terminal 16 using bonding wires). One or more semiconductor power devices 20 can be provided as needed. Other electronic components may be disposed in the power module 100 as required, but the present disclosure is not limited thereto.

參照圖2A及圖2B,電流檢測器30例如為霍爾電流檢測器或磁阻式(Magneto Impedance, IM)電流檢測器。較佳為採用表面貼裝技術封裝的電流檢測器,適於應用表面貼裝技術或應用半導體晶片(chip)的黏晶(die bond)技術以機械手臂將電流檢測器30設置於輸出端部16上。可顯著提高電流檢測器30的定位精確度。一般電流檢測器分為接觸式(例如霍爾檢測器)與非接觸式(例如磁阻式檢測器)。接觸式的電流檢測器設有檢測電流輸入端與檢測電流輸出端以供待檢測的電流流入電流檢測器。非接觸式的電流檢測器則無需設置檢測電流輸入端與檢測電流輸出端。霍爾電流檢測器的訊號端通常設置4個端子,分別為提供檢測器工作電位的正電位端子與負電位端子(接地),以及輸出檢測訊號的訊號輸出端子與參考電位端子。磁阻式檢測器一般僅需設置訊號輸出端子與參考電位端子即可。但本揭示不限於此,電流檢測器的端子數目可依照實際需求設置。2A and 2B , the current detector 30 is, for example, a Hall effect current detector or a magnetoresistive (IM) current detector. A current detector packaged using surface mount technology is preferred, and the current detector 30 can be placed on the output terminal 16 using a robotic arm using surface mount technology or semiconductor chip die bonding technology. This significantly improves the positioning accuracy of the current detector 30. Current detectors are generally classified as contact-type (e.g., Hall effect detectors) and contactless-type (e.g., magnetoresistive detectors). Contact-type current detectors have a detection current input and a detection current output for the current to be detected to flow into the current detector. Contactless current detectors do not require a detection current input or output terminal. A Hall current detector typically has four signal terminals: a positive terminal and a negative terminal (ground) that provide the detector's operating potential, as well as a signal output terminal and a reference potential terminal for outputting the detection signal. Magnetoresistive detectors generally only require a signal output terminal and a reference potential terminal. However, this disclosure is not limited to this; the number of terminals in a current detector can be adjusted based on actual needs.

參照圖2A及圖2B,在一實施例中,模制(molding)化合物40包括聚合物或是樹酯,例如環氧樹酯(epoxy)、丙烯腈-丁二烯-苯乙烯共聚物(Acrylonitrile Butadiene Styrene, ABS)、聚碳酸酯(Polycarbonate, PC)、聚氨酯(polyurethane, PU)等,本揭示不限於此。模制化合物40完全包覆第一金屬層12位於該絕緣層14上的那部分及半導體功率器件20,以保護第一金屬層12與半導體功率器件20。並且模制化合物40部分地包覆該輸出端部16讓該電流檢測器30完全裸露於該模制化合物40外。2A and 2B , in one embodiment, the molding compound 40 includes a polymer or resin, such as epoxy, acrylonitrile butadiene styrene (ABS), polycarbonate (PC), or polyurethane (PU), although the present disclosure is not limited thereto. The molding compound 40 completely covers the portion of the first metal layer 12 located on the insulating layer 14 and the semiconductor power device 20 to protect them. Furthermore, the molding compound 40 partially covers the output terminal 16, leaving the current detector 30 completely exposed outside the molding compound 40.

參照圖2B,在一實施例中,為了電流檢測器30的定位精準,電流檢測器並非以傳統的方式先固定於電路板上再與功率模組100對鎖,而是採用先將電流檢測器30以表面貼裝或黏晶(die bond)的技術固定於輸出端部16上。再以設置有彈片或夾鉗(clip)結構84的電路板80與電流檢測器30的訊號端壓接以進行電連接,並利用鎖附孔82將電路板80固定。如此可以避免傳統以人工鎖固電路板80時造成的定位不精準連帶造成電流檢測器30的定位差異。Referring to FIG. 2B , in one embodiment, to ensure precise positioning of the current detector 30, the current detector is not conventionally secured to a circuit board and then locked to the power module 100. Instead, the current detector 30 is first secured to the output terminal 16 using surface mounting or die bonding techniques. A circuit board 80 equipped with a spring or clip structure 84 is then press-fitted to the signal terminal of the current detector 30 for electrical connection, and the circuit board 80 is secured using locking holes 82. This avoids the inaccurate positioning of the current detector 30 that can occur when manually locking the circuit board 80.

本揭示之一實施例所述的功率模組100,其中,該第一金屬層12的磁化率小於1且大於0。具體的,為避免第一金屬層12的磁化對電流檢測器件30的訊號造成額外的影響,或是產生磁滯現象造成日後電流檢測器件30的訊號偏離,第一金屬層12較佳選用非鐵金屬,或是磁化率小於1且大於0的導電材質,例如銅、鋁等。In the power module 100 described in one embodiment of the present disclosure, the magnetic susceptibility of the first metal layer 12 is less than 1 and greater than 0. Specifically, to prevent the magnetization of the first metal layer 12 from causing an additional impact on the signal of the current detection device 30 or generating magnetic hysteresis that may cause signal deviation of the current detection device 30 in the future, the first metal layer 12 is preferably made of a non-ferrous metal or a conductive material with a magnetic susceptibility less than 1 and greater than 0, such as copper or aluminum.

參照圖2B,本揭示之一實施例所述的功率模組100,其中,該無導線框架基板10還包括一第二金屬層18設置於該絕緣層14下,且該模制化合物40部分地包覆該第二金屬層18。具體的,第二金屬層可用於接觸散熱器(heat sink)、熱管(heat pipe)、風扇等供功率模組100進行散熱。Referring to FIG. 2B , a power module 100 according to one embodiment of the present disclosure includes a leadframe-free substrate 10 further comprising a second metal layer 18 disposed beneath the insulating layer 14, with the molding compound 40 partially encapsulating the second metal layer 18. Specifically, the second metal layer can be used to contact a heat sink, heat pipe, fan, or the like to dissipate heat from the power module 100.

本揭示之一實施例所述的功率模組,其中,該電流檢測器30係以機械手臂輔助的方式固定於所述輸出端部16上。具體的,配合表面貼裝或黏晶技術,以機械手臂將電流檢測器30固定於所述輸出端部16上。In the power module of one embodiment of the present disclosure, the current detector 30 is fixed to the output terminal 16 with the assistance of a robot. Specifically, the current detector 30 is fixed to the output terminal 16 with the robot using surface mounting or die bonding technology.

黏晶原理為:使用膠水、熱、壓力或超音波等各項製程,將晶粒或元件固定在指定材料上。黏晶技術包含以下幾個類別,例如:黏著劑固晶(adhesive die bonding)或共金製程(eutectic process),共金製程又分為熱壓黏晶(thermos-compression die bonding)或熱壓超音波黏晶(thermo-sonic die bonding)。Die bonding involves attaching a die or component to a specific material using various processes, including adhesive, heat, pressure, or ultrasound. Die bonding techniques include adhesive die bonding and eutectic processes, which are further categorized as thermos-compression die bonding and thermosonic die bonding.

黏著劑固晶通過使用黏合膠材將晶粒(於本揭示為電流檢測器)固定到基板或材料上,黏合膠材特性可以是導電性或非導電性,作業前從低溫冰櫃取出膠材並回溫至常溫使其成為液態狀,再以自動點膠設備將膠材加入基板或材料上,放上晶粒,完成放晶粒後放入烤箱烘烤使黏合膠材乾燥固化,完成黏晶作業。Adhesive bonding involves attaching the die (in this case, the current detector) to a substrate or material using an adhesive material. The adhesive material can be conductive or non-conductive. Before the process, the adhesive is removed from a cryogenic freezer and returned to room temperature to form a liquid. Automatic dispensing equipment is then used to apply the adhesive to the substrate or material, placing the die on top. After the die is placed, the die is placed in an oven to dry and solidify the adhesive, completing the die bonding process.

共金製程是將二種相同或不同金屬鍵結,使其達到電性傳導功能。於本揭示中則是將電流檢測器30封裝上的銲墊與第一金屬層進行金屬鍵結。熱壓黏晶製程是向銲料層提供熱能促使銲料融化成液態,另一焊接點提供恰好低於銲料熔點溫度,液化銲料滲透到另一黏合表面金屬形成金屬鍵結(intermetallic bond),也稱為濕潤(Wetting),為避免液態銲料造成物件位移,當二接點結合同時可以在上方施加壓力固定銲接物件,使用助銲劑可以增加最佳金屬鍵結,熱壓黏晶製程目前業界使用的銲料以金-錫(Gold-Tin)最多。The eutectic process is to bond two identical or different metals to achieve electrical conductivity. In this disclosure, the pads on the current detector 30 package are metal-bonded to the first metal layer. The hot press die bonding process provides heat energy to the solder layer to melt the solder into a liquid state. The other welding point provides a temperature just below the melting point of the solder. The liquefied solder penetrates into the other bonding surface metal to form an intermetallic bond, also known as wetting. To prevent the liquid solder from causing the object to shift, pressure can be applied from above to fix the welded object when the two contacts are bonded. The use of a soldering agent can increase the optimal metal bond. The most commonly used solder in the hot press die bonding process in the industry is gold-tin.

熱壓超音波黏晶是利用機械性超音波震動提供能量使二種金屬結合,常使用的金屬以金對金接合最多,一般熱壓黏晶需要使用>270℃以上的溫度,如此的高溫容易造成基板或一些敏感晶片損壞,熱壓超音波大幅降低黏晶溫度至<150℃,且不需要使用助銲劑及焊接後清洗程序。Hot-press ultrasonic die bonding utilizes mechanical ultrasonic vibrations to provide energy to bond two metals. Gold-to-metal bonding is the most commonly used metal. Conventional hot-press die bonding requires temperatures exceeding 270°C, which can easily damage substrates or sensitive chips. Hot-press ultrasonic bonding significantly reduces the die bonding temperature to less than 150°C, eliminating the need for solder flux and post-solder cleaning procedures.

參照圖3及圖4,本揭示之第二實施例提供一種功率模組200,包含:一無導線框架基板10,包括一第一金屬層12及一絕緣層14,其中該第一金屬層12形成一電路走線(121、15、16)設置於該絕緣層14上且該電路走線(121、15、16)具有一輸出端部16;至少一半導體功率器件20,設置於該電路走線121上;一電流檢測器30,設置於該輸出端部16上;以及一模制化合物40,完全包覆該無導線框架基板10的該第一金屬層12、該至少一半導體功率器件20及該電流檢測器30;其中,該功率模組200用以將一直流電力轉換為一交流電力,並且經由該輸出端部16輸出該交流電力,且藉由該電流檢測器30檢測該交流電力。3 and 4, a second embodiment of the present disclosure provides a power module 200, comprising: a leadless frame substrate 10, including a first metal layer 12 and an insulating layer 14, wherein the first metal layer 12 forms a circuit trace (121, 15, 16) disposed on the insulating layer 14 and the circuit trace (121, 15, 16) has an output end 16; at least one semiconductor power device 20, disposed on the circuit trace 1 21; a current detector 30 disposed on the output terminal 16; and a molding compound 40 completely covering the first metal layer 12 of the leadless frame substrate 10, the at least one semiconductor power device 20, and the current detector 30; wherein the power module 200 is used to convert DC power into AC power, output the AC power through the output terminal 16, and detect the AC power by the current detector 30.

參照圖3及圖4,功率模組200與功率模組100類似,其主要差異在於功率模組200的模制化合物40完全包覆該電流檢測器30。其他與功率模組100類似的元件參照上方對應段落以及圖2A至圖2B的說明,於此不再贅述。模制化合物40完全包覆該電流檢測器30可以提供電流檢測器30結構與定位上的保護。Referring to Figures 3 and 4 , power module 200 is similar to power module 100 , with the primary difference being that mold compound 40 in power module 200 completely encapsulates current detector 30 . Other components similar to those in power module 100 are described in the corresponding paragraphs above and in Figures 2A and 2B , and are not further described here. Complete encapsulation of current detector 30 by mold compound 40 provides structural and positioning protection for current detector 30 .

參照圖3及圖4,本揭示之第二實施例所述的功率模組200,其中,該第一金屬層12的磁化率小於1且大於0。本揭示之一實施例所述的功率模組200,其中,該無導線框架基板10還包括一第二金屬層18設置於該絕緣層14下,且該模制化合物40部分地包覆該第二金屬層18。本揭示之一實施例所述的功率模組200,其中,該電流檢測器30係以機械手臂輔助的方式固定於所述輸出端部16上。3 and 4 , a power module 200 according to a second embodiment of the present disclosure is described, wherein the magnetic susceptibility of the first metal layer 12 is less than 1 and greater than 0. In a power module 200 according to an embodiment of the present disclosure, the leadframe-free substrate 10 further includes a second metal layer 18 disposed beneath the insulating layer 14, and the molding compound 40 partially encapsulates the second metal layer 18. In a power module 200 according to an embodiment of the present disclosure, the current detector 30 is fixed to the output terminal 16 with the assistance of a robot.

參照圖3及圖4,本揭示之第二實施例所述的功率模組200,更包括一導線架50連接至該輸出端部16。具體的,在本實施例中,輸出端部16並未伸出模制化合物40,改以導線架50銲接在輸出端部16上以提供電力的輸出。既可保有電流檢測器30的定位精確度,也可保有導線架50的結構強度。導線架50可以使用焊接或燒結的方式與輸出端部16電性連接並固定在輸出端部16上。Referring to Figures 3 and 4 , the power module 200 described in the second embodiment of the present disclosure further includes a lead frame 50 connected to the output terminal 16 . Specifically, in this embodiment, the output terminal 16 does not extend beyond the molding compound 40 . Instead, the lead frame 50 is welded to the output terminal 16 to provide power output. This ensures both the positioning accuracy of the current detector 30 and the structural strength of the lead frame 50 . The lead frame 50 can be electrically connected to and secured to the output terminal 16 by welding or sintering.

參照圖3及圖4,在一實施例中,功率模組200還包括由第一金屬層12形成的訊號引腳15,用以電連接電流檢測器30的訊號端。圖3與圖4所示為使用接線32連接電流檢測器30的訊號端與訊號引腳15,但本揭示不限於此,也可使用表面貼裝的方式連接電流檢測器30的訊號端與訊號引腳15。Referring to Figures 3 and 4 , in one embodiment, power module 200 further includes a signal pin 15 formed from the first metal layer 12 for electrically connecting to the signal terminal of current detector 30. Figures 3 and 4 illustrate the connection between the signal terminal of current detector 30 and signal pin 15 using a wire 32. However, the present disclosure is not limited to this embodiment; a surface mount method may also be used to connect the signal terminal of current detector 30 and signal pin 15.

參照圖3及圖4,在一實施例中,功率模組200還包括一陶瓷基板,例如多層基板電路結構60設置於該第一金屬層12上。多層基板電路結構60例如直接覆銅基板 (Direct Bonded Copper, DBC,又稱覆銅陶瓷基板),或活性金屬硬焊 (Active Metal Brazing, AMB)基板,兩者均屬於陶瓷基板。多層基板電路結構係結合陶瓷之散熱以及金屬之導體特性,將銅箔氧化後,利用高溫燒結將厚銅箔直接披覆在陶瓷基板,再經由曝光顯影方式在銅箔上刻劃出電路圖形。多層基板電路結構60可以交錯重疊設置多層金屬層62與陶瓷層64,例如圖4僅示例繪製一層金屬層62及一層陶瓷層64,但不限於此,陶瓷層64也可形成穿孔以供上下層的金屬層62電連接。功率模組200的電流檢測器30的訊號端與訊號引腳15之間的連接方式採用接線32連接電流檢測器30的訊號端與多層基板電路結構60上的金屬層62,再由多層基板電路結構60(例如,陶瓷層64穿孔中的內連線,圖未繪示)連接訊號引腳15。Referring to Figures 3 and 4 , in one embodiment, power module 200 further includes a ceramic substrate, such as a multi-layer substrate circuit structure 60 disposed on the first metal layer 12. Multi-layer substrate circuit structure 60 can be, for example, a direct bonded copper (DBC) substrate or an active metal brazing (AMB) substrate, both of which are ceramic substrates. Multi-layer substrate circuit structures combine the heat dissipation properties of ceramics with the conductive properties of metals. After oxidizing copper foil, a thick copper foil is directly coated on the ceramic substrate using high-temperature sintering. The circuit pattern is then engraved on the copper foil through exposure and development. The multi-layer substrate circuit structure 60 can be constructed by staggering and overlapping multiple metal layers 62 and ceramic layers 64. For example, FIG4 illustrates only one metal layer 62 and one ceramic layer 64, but the present invention is not limited thereto. The ceramic layer 64 can also have through-holes to electrically connect the upper and lower metal layers 62. The signal terminal of the current detector 30 of the power module 200 is connected to the signal pin 15 by connecting the signal terminal of the current detector 30 to the metal layer 62 on the multi-layer substrate circuit structure 60 via a wire 32. The signal pin 15 is then connected via an interconnection in the multi-layer substrate circuit structure 60 (e.g., an interconnection in the through-hole of the ceramic layer 64, not shown).

參照圖5、圖6與圖7,本揭示之第三實施例所述的功率模組200’與功率模組200不同之處在於功率模組200’沒有設置導線架50,而是直接以輸出端部16延伸出模制化合物40,例如第一金屬層12具有一延伸結構122延伸出該絕緣層14以作為一輸出端部16。在不同的應用例中,加厚的第一金屬層12所形成的輸出端部16已具有足夠的強度,可形成插針或插頭以供電力輸出。其他與功率模組100、200類似的元件參照上方對應段落以及圖2A至圖4的說明,於此不再贅述。Referring to Figures 5, 6, and 7, the power module 200' described in the third embodiment of the present disclosure differs from power module 200 in that power module 200' does not include a lead frame 50. Instead, the output terminal 16 extends directly from the molding compound 40. For example, the first metal layer 12 includes an extension structure 122 extending from the insulating layer 14 to serve as an output terminal 16. In various applications, the output terminal 16 formed by the thickened first metal layer 12 has sufficient strength to form a pin or plug for power output. Other components similar to those of power modules 100 and 200 are described in the corresponding paragraphs above and in Figures 2A to 4 and are not further described here.

參照圖8,本揭示之第四實施例所述的功率模組220與功率模組200’不同之處在於功率模組220於功率模組200’的訊號引腳15位置,改以多層基板電路結構60替代。電流檢測器30以接線32電連接至多層基板電路結構60的金屬層62。除了陶瓷層64有較強的結構力之外,多層基板電路結構60可以適用於較複雜的電路設計。其他與功率模組100、200、200’類似的元件參照上方對應段落以及圖2A至圖7的說明,於此不再贅述。Referring to FIG8 , the power module 220 described in the fourth embodiment of the present disclosure differs from the power module 200′ in that the signal pin 15 of the power module 200′ is replaced with a multi-layer substrate circuit structure 60 in the power module 220. The current detector 30 is electrically connected to the metal layer 62 of the multi-layer substrate circuit structure 60 via a wire 32. In addition to the stronger structural strength of the ceramic layer 64, the multi-layer substrate circuit structure 60 can be applied to more complex circuit designs. Other components similar to those of the power modules 100, 200, and 200′ are described in the corresponding paragraphs above and in FIG2A to FIG7 and are not further described here.

參照圖8,本揭示之第四實施例所述的功率模組220,更包括多層基板電路結構60設置於該第一金屬層12的電路走線124上。本揭示之一實施例所述的功率模組220,該多層基板電路結構60延伸至該模制化合物40之外,且該電流檢測器30的訊號端經由接線32電連接至該多層基板電路結構60。8 , the power module 220 according to the fourth embodiment of the present disclosure further includes a multi-layer substrate circuit structure 60 disposed on the circuit traces 124 of the first metal layer 12. In the power module 220 according to one embodiment of the present disclosure, the multi-layer substrate circuit structure 60 extends outside the molding compound 40, and the signal terminal of the current detector 30 is electrically connected to the multi-layer substrate circuit structure 60 via a wire 32.

參照圖9、圖10、與圖11,本揭示之第五實施例所述的功率模組200”與功率模組200’不同之處在於:功率模組200”以插針結構70設置於該第一金屬層12上以取代功率模組200’的訊號引腳15,其中該電流檢測器30為表面貼裝元件,該電流檢測器30的訊號端經由該電路走線123電連接至該插針結構70。其他與功率模組100、200、200’、220類似的元件參照上方對應段落以及圖2A至圖8的說明,於此不再贅述。9 , 10 , and 11 , the power module 200″ described in the fifth embodiment of the present disclosure differs from the power module 200′ in that the power module 200″ utilizes a pin structure 70 disposed on the first metal layer 12 to replace the signal pin 15 of the power module 200′. The current detector 30 is a surface mount component, and the signal end of the current detector 30 is electrically connected to the pin structure 70 via the circuit trace 123. Other components similar to the power modules 100, 200, 200′, and 220 are described in the corresponding paragraphs above and in Figures 2A to 8 and are not further described here.

參照圖9、圖10、與圖11,該電流檢測器30的訊號端經由接線32連接至第一金屬層12的電路走線123,而後電連接至設置於電路走線123上的插針結構70。9 , 10 , and 11 , the signal end of the current detector 30 is connected to the circuit trace 123 of the first metal layer 12 via the wiring 32 , and then electrically connected to the pin structure 70 disposed on the circuit trace 123 .

參照圖12,本揭示之第六實施例所述的功率模組240與功率模組200”不同之處在於:功率模組240的插針結構70設置於該多層基板電路結構60上,該電流檢測器30的訊號端經由接線32電連接至該多層基板電路結構60的金屬層62且經由該多層基板電路結構60電連接至該插針結構70。其他與功率模組100、200、200’、220、200”類似的元件參照上方對應段落及圖2A至圖11的說明,於此不再贅述。12 , the power module 240 described in the sixth embodiment of the present disclosure differs from the power module 200 ″ in that the pin structure 70 of the power module 240 is disposed on the multi-layer substrate circuit structure 60 , and the signal end of the current detector 30 is electrically connected to the metal layer 62 of the multi-layer substrate circuit structure 60 via the wiring 32 and is electrically connected to the pin structure 70 via the multi-layer substrate circuit structure 60 . Other components similar to the power modules 100, 200, 200 ′, 220, and 200 ″ are described in the corresponding paragraphs above and in FIG. 2A to FIG. 11 and are not further described here.

相較於先前技術,本揭示的功率模組的結構適用表面貼裝技術等精準的封裝技術,可以精確地將電流檢測器安裝在輸出端部,提供已安裝了電流檢測器的功率模組。由於本揭示的電流檢測器的定位誤差較小,因此可直接適用感測訊號的初始調校數據,不必對每個功率模組的電流檢測器的訊號進行重新校正,有效地避免現有技術中的問題。Compared to prior art, the power module structure disclosed herein utilizes precise packaging technologies such as surface mount technology, enabling the precise installation of the current detector at the output terminal, providing a power module pre-installed with the current detector. Because the current detector's positioning error is minimal, the initial calibration data from the sensed signal can be directly applied, eliminating the need to recalibrate the current detector signal for each power module, effectively avoiding the problems associated with prior art.

以上僅是本揭示的優選實施方式,應當指出,對於本領域普通技術人員,在不脫離本揭示原理的前提下,還可以做出若干改進和潤飾,這些改進和潤飾也應視為本揭示的保護範圍。The above is only a preferred embodiment of the present disclosure. It should be pointed out that ordinary technical personnel in this field can make several improvements and modifications without departing from the principles of the present disclosure. These improvements and modifications should also be considered as the scope of protection of the present disclosure.

100、200、200’、200”、220、240:功率模組 10:無導線框架基板 12:第一金屬層 121:輸入端部 122:延伸結構 123、124:電路走線 14:絕緣層 15:訊號引腳 16:輸出端部 18:第二金屬層 20:半導體功率器件 30:電流檢測器 32:接線 40:模制化合物 60:多層基板電路結構 62:金屬層 64:陶瓷層 70:插針結構 80:電路板 82:鎖附孔 BB’、CC’、DD’、EE’、FF’、GG’:剖面線 p10:導線框架 p100:功率模組 p12:電路走線 p121:輸入端子 p122:延伸結構 p16:輸出端子 p18:散熱塊 p20:半導體功率器件 p30:電流檢測器 p40:模制化合物 100, 200, 200', 200", 220, 240: Power module 10: Leadframe-less substrate 12: First metal layer 121: Input terminal 122: Extension structure 123, 124: Circuit traces 14: Insulation layer 15: Signal pins 16: Output terminal 18: Second metal layer 20: Semiconductor power device 30: Current detector 32: Wiring 40: Molding compound 60: Multi-layer substrate circuit structure 62: Metal layer 64: Ceramic layer 70: Pin structure 80: Circuit board 82: Attachment holes BB', CC', DD', EE', FF', GG': Cross-hatching p10: Leadframe p100: Power module p12: Circuit traces p121: Input terminals p122: Extension structure p16: Output terminals p18: Heat sink p20: Semiconductor power device p30: Current detector p40: Molding compound

圖1顯示習知的功率模組的結構示意圖。FIG1 shows a schematic structural diagram of a conventional power module.

圖2A顯示根據本揭示的第一實施例中的功率模組的結構示意圖。FIG2A is a schematic structural diagram of a power module according to the first embodiment of the present disclosure.

圖2B顯示根據本揭示圖2A的功率模組沿BB’剖面線的剖視圖。FIG2B shows a cross-sectional view of the power module of FIG2A along the BB' section line according to the present disclosure.

圖3顯示根據本揭示的第二實施例中的功率模組的結構示意圖。FIG3 shows a schematic structural diagram of a power module according to a second embodiment of the present disclosure.

圖4顯示根據本揭示圖3的功率模組沿CC’剖面線的剖視圖。FIG4 shows a cross-sectional view of the power module shown in FIG3 along the CC' section line according to the present disclosure.

圖5顯示根據本揭示的第三實施例中的功率模組的結構示意圖。FIG5 is a schematic structural diagram of a power module according to a third embodiment of the present disclosure.

圖6顯示根據本揭示圖5的功率模組沿DD’剖面線的剖視圖。FIG6 shows a cross-sectional view of the power module shown in FIG5 along the DD' section line according to the present disclosure.

圖7顯示根據本揭示圖5的功率模組沿EE’剖面線的剖視圖。FIG7 shows a cross-sectional view of the power module of FIG5 along the EE' section line according to the present disclosure.

圖8顯示根據本揭示的第四實施例中的功率模組的部分剖面結構示意圖。FIG8 is a schematic diagram showing a partial cross-sectional structure of a power module according to a fourth embodiment of the present disclosure.

圖9顯示根據本揭示的第五實施例中的功率模組的結構示意圖。FIG9 is a schematic structural diagram of a power module according to a fifth embodiment of the present disclosure.

圖10顯示根據本揭示圖9的功率模組沿FF’剖面線的剖視圖。FIG10 shows a cross-sectional view of the power module shown in FIG9 along the FF' section line according to the present disclosure.

圖11顯示根據本揭示圖9的功率模組沿GG’剖面線的剖視圖。FIG11 shows a cross-sectional view of the power module of FIG9 along the GG' section line according to the present disclosure.

圖12顯示根據本揭示的第六實施例中的功率模組的部分剖面結構示意圖。FIG12 is a schematic diagram showing a partial cross-sectional structure of a power module according to a sixth embodiment of the present disclosure.

100:功率模組 100: Power module

10:無導線框架基板 10: Lead-less frame substrate

12:第一金屬層 12: First metal layer

121:輸入端部 121: Input terminal

122:延伸結構 122: Extended Structure

14:絕緣層 14: Insulating layer

16:輸出端部 16: Output terminal

20:半導體功率器件 20: Semiconductor power devices

30:電流檢測器 30: Current detector

40:模制化合物 40: Molding compound

80:電路板 80: Circuit board

82:鎖附孔 82: Locking hole

Claims (14)

一種功率模組,包含: 一無導線框架基板,該無導線框架基板系一複合材質層基板,由多個材料層組成,不包括導線框架,該無導線框架基板的該多個材料層包括一絕緣層以及以鑄造與蝕刻方式設置於該絕緣層上的一第一金屬層,其中該第一金屬層形成一電路走線設置於該絕緣層上,且該第一金屬層具有一延伸結構延伸出該絕緣層以作為一輸出端部; 至少一半導體功率器件,設置於該第一金屬層上; 一電流檢測器,設置於該輸出端部上;以及 一模制化合物,該第一金屬層位於該絕緣層上的部分被該模制化合物完全包覆,該至少一半導體功率器件被該模制化合物完全包覆,並且該模制化合物部分地包覆該輸出端部讓該電流檢測器完全裸露於該模制化合物外; 其中,該功率模組用以將一直流電力轉換為一交流電力,並且經由該輸出端部輸出該交流電力,且藉由該電流感測器檢測該交流電力。 A power module comprises: A leadframe-less substrate, which is a composite material layer substrate composed of multiple material layers and does not include a leadframe. The multiple material layers of the leadframe-less substrate include an insulating layer and a first metal layer disposed on the insulating layer by casting and etching, wherein the first metal layer forms a circuit trace disposed on the insulating layer, and the first metal layer has an extension structure extending from the insulating layer to serve as an output terminal; At least one semiconductor power device disposed on the first metal layer; A current detector disposed on the output terminal; and A molding compound is provided, wherein the portion of the first metal layer located above the insulating layer is completely encapsulated by the molding compound, the at least one semiconductor power device is completely encapsulated by the molding compound, and the molding compound partially encapsulates the output terminal, leaving the current detector completely exposed outside the molding compound. The power module is configured to convert DC power into AC power, output the AC power through the output terminal, and detect the AC power using the current detector. 如請求項1所述的功率模組,其中該第一金屬層的磁化率小於1且大於0。The power module of claim 1, wherein the magnetic susceptibility of the first metal layer is less than 1 and greater than 0. 如請求項1所述的功率模組,其中該無導線框架基板還包括一第二金屬層設置於該絕緣層下,且該模制化合物部分地包覆該第二金屬層。The power module of claim 1, wherein the leadframe-free substrate further comprises a second metal layer disposed under the insulating layer, and the molding compound partially encapsulates the second metal layer. 如請求項1所述的功率模組,其中該電流檢測器係以機械手臂輔助的方式固定於所述輸出端部上。A power module as described in claim 1, wherein the current detector is fixed to the output end with the assistance of a robotic arm. 一種功率模組,包含: 一無導線框架基板,該無導線框架基板系一複合材質層基板,由多個材料層組成,不包括導線框架,該無導線框架基板的該多個材料層包括一絕緣層以及以鑄造與蝕刻方式設置於該絕緣層上的一第一金屬層,其中該第一金屬層形成一電路走線,該電路走線設置於該絕緣層上且具有一輸出端部; 至少一半導體功率器件,設置於該電路走線上; 一電流檢測器,設置於該輸出端部上;以及 一模制化合物,完全包覆該無導線框架基板的該第一金屬層、該至少一半導體功率器件及該電流檢測器; 其中,該功率模組用以將一直流電力轉換為一交流電力,並且經由該輸出端部輸出該交流電力,且藉由該電流感測器檢測該交流電力。 A power module comprises: A leadframe-less substrate, which is a composite material layer substrate composed of multiple material layers and does not include a leadframe. The multiple material layers of the leadframe-less substrate include an insulating layer and a first metal layer disposed on the insulating layer by casting and etching, wherein the first metal layer forms a circuit trace disposed on the insulating layer and having an output terminal; At least one semiconductor power device disposed on the circuit trace; A current detector disposed on the output terminal; and A molding compound completely encapsulating the first metal layer of the leadframe-less substrate, the at least one semiconductor power device, and the current detector. The power module is used to convert DC power into AC power, output the AC power through the output terminal, and detect the AC power through the inductive force sensor. 如請求項5所述的功率模組,其中該第一金屬層的磁化率小於1且大於0。The power module as described in claim 5, wherein the magnetic susceptibility of the first metal layer is less than 1 and greater than 0. 如請求項5所述的功率模組,其中該無導線框架基板還包括一第二金屬層設置於該絕緣層下,且該模制化合物部分地包覆該第二金屬層。The power module of claim 5, wherein the leadframe-free substrate further comprises a second metal layer disposed under the insulating layer, and the molding compound partially encapsulates the second metal layer. 如請求項5所述的功率模組,其中該電流檢測器係以機械手臂輔助的方式固定於所述輸出端部上。A power module as described in claim 5, wherein the current detector is fixed to the output end with the assistance of a robotic arm. 如請求項5所述的功率模組,更包括一導線架,連接至該輸出端部。The power module as described in claim 5 further includes a lead frame connected to the output end. 如請求項5所述的功率模組,更包括插針結構,設置於該第一金屬層上,其中該電流檢測器為表面貼裝的元件,該元件的訊號端經由該電路走線電連接至該插針結構。The power module as described in claim 5 further includes a pin structure disposed on the first metal layer, wherein the current detector is a surface-mounted component, and the signal end of the component is electrically connected to the pin structure via the circuit trace. 如請求項5所述的功率模組,其中該電流檢測器的訊號端經由接線電連接至該第一金屬層。The power module as described in claim 5, wherein the signal terminal of the current detector is electrically connected to the first metal layer via a wiring. 如請求項5所述的功率模組,更包括多層基板電路結構設置於該第一金屬層上。The power module as described in claim 5 further includes a multi-layer substrate circuit structure disposed on the first metal layer. 如請求項12所述的功率模組,該多層基板電路結構延伸至該模制化合物之外,且該電流檢測器的訊號端經由接線電連接至該多層基板電路結構。In the power module of claim 12, the multi-layer substrate circuit structure extends outside the molding compound, and the signal terminal of the current detector is electrically connected to the multi-layer substrate circuit structure via a wiring. 如請求項12所述的功率模組,更包括插針結構設置於該多層基板電路結構上,該電流檢測器的訊號端經由接線電連接至該多層基板電路結構,且經由該多層基板電路結構電連接至該插針結構。The power module as described in claim 12 further includes a pin structure arranged on the multi-layer substrate circuit structure, and the signal end of the current detector is electrically connected to the multi-layer substrate circuit structure via a wiring, and is electrically connected to the pin structure via the multi-layer substrate circuit structure.
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US20190067251A1 (en) * 2017-08-31 2019-02-28 Renesas Electronics Corporation Electronic device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201709437A (en) * 2015-08-31 2017-03-01 台達電子企業管理(上海)有限公司 Power encapsulation module of multi-power chip and manufacturing method of power chip unit
US20190067251A1 (en) * 2017-08-31 2019-02-28 Renesas Electronics Corporation Electronic device

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