TWI898372B - Device under test socket and method for testing a device under test - Google Patents

Abstract

Embodiments according to the invention comprise a device-under-test socket for testing a device under test, comprising a base structure and a lid. The lid is configured to be fixable to the base structure by a rotation of the lid and the lid is configured to push a pusher towards a device under test portion of the base structure. Furthermore, a central portion of the lid is open and/or comprises a low dielectric constant material. In addition, embodiments comprise a method for testing a device under test.

Description

Device under test socket and method for testing a device under test

Invention Field

Embodiments of the present invention relate to a device under test socket and method for testing a device under test.

Embodiments of the present invention relate to an automated test equipment (ATE) sliding cover socket for remote over-the-air (OTA) testing.

Invention Background

Device testing is a key part of modern electronic device production and development processes. Consequently, a large number of devices must be tested to obtain conclusive test results. Therefore, the impact of the test environment on the test results must be kept as low as possible. Furthermore, to achieve reasonable test throughput, the respective test equipment must be configured to allow for rapid changes in the device under test (DUT) while performing tests in a robust and reliable manner.

For device testing, the physical interface between the DUT and test equipment (e.g., automated test equipment) can be a DUT socket, where the DUT is physically located and provides electrical connections for testing. Furthermore, particularly for over-the-air (OTA) testing, such as testing the antenna characteristics of a device under test (DUT), the socket can significantly impact the obtained results.

Therefore, there is a need for a device under test socket and a method for testing a DUT using the socket, which provides a good compromise between test robustness and accuracy, and complexity and speed, for example, with respect to continuous changes in the DUT to be tested.

This is achieved by the subject matter of the independent claim of this application. Other embodiments according to the present invention are defined by the subject matter of the dependent claims of this application.

Summary of the Invention

Embodiments according to the present invention include a DUT socket for testing (e.g., for holding and/or contacting) a DUT (e.g., a DUT including one or more antenna structures). The DUT socket includes a base structure, e.g., having a DUT recess for mechanically centering the DUT, and a cover, wherein the cover is configured to be secured (e.g., removably secured) to the base structure by, for example, rotating the cover about an axis extending through the DUT recess (e.g., by rotating the cover relative to the base structure). Furthermore, the cover is configured to push a pusher (e.g., a low dielectric constant structure; e.g., an “electromagnetically transparent” structure or an essentially “electromagnetic transparent structure,” e.g., a structure made of Evonik HF71 material, e.g., made of rigid foam or made of closed-cell rigid foam or made of closed-cell rigid foam based on polymethacrylimide chemistry) toward a device under test portion of the base structure (e.g., toward a device under test cavity of the base structure, e.g., in order to push the device under test into the device under test cavity and/or in order to ensure reliable electrical contact between the device under test and one or more electrical contacts (e.g., arranged in the device under test cavity), wherein, for example, the pusher may or may not be part of the cover).

In addition, a central portion of the cover (which, for example, is opposite the DUT portion/DUT cavity when the cover is secured to the base structure) is open and/or comprises a low-permittivity material, for example, having a relative permittivity of less than or equal to 1.2, for example, to achieve substantially distortion-free transmission of electromagnetic waves, for example, for a frequency in the microwave frequency range between 1 GHz and 1000 GHz.

The main idea according to the embodiment is to provide the device under test socket as a socket having two main components (i.e., a base structure and a cover), such that the device under test can be arranged in a volume between (e.g., enclosed by) the base structure and the cover (e.g., in the closed state of the socket, e.g., when the cover is attached to the base structure).

The inventors of the present invention have recognized that such a cover can provide the functionality of a removable cover (e.g., a cap), wherein, on the one hand, the cover can be easily removed to facilitate replacement of the DUT, and wherein, on the other hand, in the closed state (e.g., with the cover attached to a base structure), the DUT is securely held in a test position.

Specifically, the inventors of this invention have recognized that securing via rotational movement can be performed quickly, thereby allowing for rapid replacement of DUTs. Furthermore, to achieve the aforementioned securing or securing of a DUT for testing, for example, the cover is equipped with a pusher, such as an adapter, that pushes the cover and the DUT toward the device under test while simultaneously performing a rotational movement for attachment to a base structure. This can thereby apply force to the DUT and ensure good electrical contact between the DUT and the test equipment. Different pushers can optionally be provided for different DUTs.

Furthermore, in order to provide a good compromise between not only the rapid replaceability of the device explained above and the robustness of the test, but also the accuracy of the test, the inventors of this invention have realized that the central portion of the cover can be open and/or can include or be made of a low-k dielectric material. Thus, the impact on signals radiated or emitted by the DUT (i.e., to be measured for testing purposes) can be kept low.

According to an embodiment of the present invention, the DUT socket includes a pusher configured to push the DUT toward a DUT recess, for example, to push the DUT into the DUT recess. The pusher may include a low-k dielectric material, for example, a material having a relative dielectric constant less than or equal to 1.2, and the cover may be configured to push the pusher toward the DUT recess, for example, to ensure reliable electrical contact between the DUT and one or more electrical contacts (e.g., disposed in the DUT recess). Optionally, the pusher may or may not be part of the cover.

The pusher can function as an adapter or adaptor that translates or moves toward the DUT, for example, based on rotation of the cover, so that the DUT can be pushed onto a contact area, for example, to provide good electrical contact. A pusher composed of a low-k dielectric material can minimize interference with the DUT's transmitted (e.g., OTA) signal.

According to an embodiment of the present invention, the actuator is at least substantially made of a material having a relative dielectric constant less than or equal to 1.2. The inventors have recognized that the use of such a material allows signal interference, such as is particularly useful in OTA antenna testing, to be kept low.

According to an embodiment of the present invention, the pusher is at least substantially made of a rigid foam material (e.g., a closed-cell rigid foam material or a closed-cell rigid foam material based on polymethacrylimide chemistry), such as Evonik HF71. This allows for simple and individual adaptation of the production of such pushers to different DUTs, for example, with different shapes. Consequently, a precisely assembled pusher can be provided for a good fit of the base structure, DUT, pusher, and lid for robust testing.

According to an embodiment of the present invention, the material of the pusher has a tensile modulus greater than 80 MPa. Therefore, the pusher can have sufficient rigidity to achieve good contact and securement of the DUT within the socket.

According to an embodiment of the present invention, the tensile modulus of the material of the pusher is less than one tenth of the tensile modulus of the material of the cover.

According to an embodiment of the present invention, the base structure includes a notch configured to receive the pusher and optionally center the pusher. This provides a good assembly of the base structure, DUT, pusher, and lid for robust testing.

According to an embodiment of the present invention, the cover and pusher are assembled as a single component of the DUT socket. Therefore, the DUT-specific pusher can be easily replaced. Furthermore, a worn pusher can be replaced without having to replace the entire socket.

According to an embodiment of the present invention, the pusher is attached (e.g., glued or screwed or attached using any other connection technique or joining method) to the cover, e.g., to form a single assembly ("monolithic structure"), such that, for example, a single mechanical assembly including the cover and the pusher can be manually secured to the base structure by rotation, and/or, for example, such that when the cover is rotated to secure it to the base structure, the pusher rotates with the cover. Thus, the socket can include fewer parts, which can enable faster replacement of DUTs.

According to an embodiment of the present invention, the pusher is mechanically coupled to the cover in a floating manner (for example, coupled in a rotatable manner so that, for example, the pusher can be moved and/or rotated relative to the cover; and/or, for example, to form a single assembly ("single-piece structure") so that, for example, a single mechanical assembly including the cover and the pusher can be manually fixed to the base structure by rotating the cover; and/or, for example, so that when the cover is rotated to fix the cover to the base structure, the pusher does not rotate with the cover, but is inserted and guided in a recess of the device under test). Thus, as an example, rotation of the lid can result in a reduction in the distance between the lid and the DUT, with the actuator being positioned, for example, in a central position between the lid and the DUT. This allows the actuator to not rotate due to the floating coupling, but to move toward and/or exert a force on the DUT only in a vertical direction (e.g., perpendicular to the rotational plane of the lid's rotational movement, e.g., the normal direction of rotation). Furthermore, relative movement between the actuator and the DUT can be reduced (e.g., compared to rotating the actuator together with the lid), which can protect the DUT, particularly an unpackaged DUT. As an example, the actuator and lid can be coupled such that only translational forces, and no torque, are transmitted to the DUT.

According to an embodiment of the present invention, the pusher is configured to be manually inserted into a notch in a base structure and optionally centered and/or aligned within the notch. Furthermore, the pusher can be configured to be pushed toward the DUT cavity by force from the cover when the cover is secured (e.g., removably secured) to the base structure by rotation. Thus, the socket can be easily assembled with minimal time and effort.

According to an embodiment of the present invention, a protector structure is attached to the pusher in an area adjacent to the cover, for example, the protector structure is positioned between the pusher and the cover. Furthermore, the protector structure can be positioned between the pusher and the cover, for example, in an area where the cover applies a force toward the device under test cavity. For example, the protector structure can comprise a wear-resistant material. The protector can reduce wear on the pusher, for example, due to relative rotational movement of the cover and the pusher.

According to an embodiment of the present invention, a protector structure is attached to the top surface of the pusher, which faces away from the DUT cavity. The protector structure is positioned in the outer region of the pusher's top surface, leaving the center region of the pusher's top surface free. This reduces signal interference with signals transmitted by the DUT.

According to an embodiment of the present invention, the material of the protector structure has higher mechanical stability (e.g., higher tensile modulus, preferably greater than 3500 MPa, and/or higher wear resistance) than the material of the actuator, and/or the material of the protector structure has a relative dielectric constant greater than or equal to 2, and for example, preferably less than or equal to 3.5. As a result, the protector can be robust and wear-resistant while only interfering with the test signal in a very limited manner.

According to an embodiment of the present invention, for example, when viewed in a plane parallel to the plane of the device under test or when viewed in a plane parallel to the main surface of the base structure, the cross-sectional area of the pusher widens continuously or gradually in a direction from the device under test cavity toward the cover. This allows for easier insertion and/or centering of the pusher within the socket.

According to an embodiment of the present invention, for example, the cross-sectional area of the pusher near the cover, when viewed in a plane parallel to the plane of the device under test, is at least twice as large as the cross-sectional area of the pusher near the recess of the device under test. This allows for particularly simple insertion and/or centering of the pusher within the socket.

According to an embodiment of the present invention, the pusher has a circular cross-section near the cover; and/or the pusher has a circular cross-section near the DUT recess, where the DUT recess has a rectangular shape, for example. This allows for particularly simple insertion and/or centering of the pusher within the socket.

According to an embodiment of the present invention, the shape of the pusher is adapted to the shape of the DUT cavity near the DUT cavity, for example, such that the perimeter of the pusher is at least approximately parallel to the perimeter of the DUT cavity, e.g., with a gap therebetween. This provides a good and tight fit and centering for stable and accurate DUT testing.

According to an embodiment of the present invention, a pusher (e.g., a narrow portion of the pusher) is configured to extend into a DUT cavity (and optionally push the pusher toward the DUT cavity) when the lid is attached to the base structure. For example, the portion of the pusher that does not extend into the DUT cavity may be wider (e.g., having at least twice the cross-sectional area) than the portion of the pusher that does extend into the DUT cavity. Alternatively, the pusher is configured not to enter (e.g., extend into) the DUT cavity (and optionally push the pusher toward the DUT cavity) when the lid is attached to the base structure. Thus, embodiments can allow device testing scenarios to be handled in the recessed area with and without a DUT.

According to an embodiment of the present invention, the actuator is configured to cover the DUT when placed in the DUT cavity, and to cover the area surrounding the DUT, for example, to avoid creating a cavity with the same dimensions as the DUT antenna array. Thus, undesirable resonances can be avoided.

According to an embodiment of the present invention, the cover includes, for example, a mechanically rigid support structure (which is preferably an inner portion) surrounding (for example, completely surrounding) a position of the device under test (for example, a device under test cavity) when viewed in a projection perpendicular to the plane in which the support structure is disposed when the cover is secured to the base, or when viewed in a projection perpendicular to a plane of the device under test (for example, a plane in which the device under test or one or more antennas of the device under test are disposed when the device under test is inserted into the device under test cavity) when the cover is secured to the base (for example, having an opening or a low-k material in the central region of the support structure). open), wherein, for example, the opening or the low-k dielectric material in the central region of the support structure may be, for example, larger than the cavity of the device under test, or wherein, for example, the extension of the opening or the low-k dielectric material in the central region of the support structure in two perpendicular directions (for example, in two directions in the plane in which the support structure is arranged) may be, for example, at least 50% larger than the corresponding extension of the cavity of the device under test (for example, in the same two directions), or wherein, for example, the extension of the opening or the low-k dielectric material in the central region of the support structure in two perpendicular directions (for example, in the plane in which the support structure is arranged) may be, for example, at least 50% larger than the corresponding extension of the cavity of the device under test (for example, in the same two directions). The extension of the device under test cavity in two directions in the plane of the device under test may, for example, be at least 100% larger than the corresponding extension of the device under test cavity (for example in the same two directions), or, for example, the opening or the low-k dielectric constant material in the central region of the support structure is so large that radiation emitted from the center of the device under test cavity in the cone passes through the opening in the central region of the support structure or through the low-k dielectric constant material, the axis of the cone is perpendicular to the device under test plane, and the opening angle of the cone is equal to 30 degrees, or, for example, the opening is adapted so that the inner boundary of the opening is 100% from a line (which is perpendicular to the plane of the device under test) The distance between the center of the DUT cavity and the plane in which the support structure is arranged and extending through the center of the DUT cavity is greater than or equal to the distance between the center of the DUT cavity and the plane in which the support structure is arranged. Alternatively, for example, the low-k dielectric material in the central region of the support structure is adapted such that the minimum distance between the outer edge of the low-k dielectric material in the central region of the support structure and a line (perpendicular to the plane in which the support structure is arranged and extending through the center of the DUT cavity) is greater than or equal to the distance between the center of the DUT cavity and the plane in which the support structure is arranged. This allows for providing a secure cover for the socket.

According to an embodiment of the present invention, the support structure includes a material having a relative dielectric constant between 2 and 3.5. As a result, interference with test results, such as for OTA testing, can be kept low.

According to an embodiment of the present invention, the support structure is, for example, at least substantially made of polyetheretherketone (PEEK). The inventors of this application have recognized that this material is well suited to provide a good compromise between a good dielectric constant and a good tensile modulus.

According to an embodiment of the present invention, the support structure comprises a substantially rectangular outer perimeter and the support structure comprises an opening with a circular perimeter in a central (e.g., inner) region, such as a circular opening or a rectangular opening, wherein the corners of the rectangle are rounded, and the radius of the rounded corners is greater than one-quarter of the side length.

According to an embodiment of the present invention, a plurality of hooks (e.g., at least three hooks or at least four hooks) are disposed on the lid or on a support structure of the lid (e.g., attached to the support structure or formed integrally with the support structure). Furthermore, the hooks disposed on the lid or on the support structure can be adapted to engage with respective mating hooks (e.g., at least three hooks or at least four hooks) disposed on the base structure (e.g., attached to the base structure or formed integrally with the support structure). Optionally, the hooks can be made of a material having a relative dielectric constant between 2 and 3.5. Optionally, as an example, the hooks can be made of the same material as the support structure of the lid. As another optional feature, the hooks can be made of PEEK. The inventors have recognized that using multiple hooks provides a simple, quick, and secure way to attach the cover to the base structure.

According to an embodiment of the present invention, the hooks (e.g., the hooks disposed on the cover or support structure and/or the hooks disposed on the base structure) are disposed adjacent to the actuator in the area of the DUT socket. This keeps design complexity low, as well as any signal interference under test.

According to an embodiment of the present invention, the hooks (e.g., the hooks disposed on the lid or the support structure and/or the hooks disposed on the base structure) are L-shaped. This allows for easy attachment and detachment of the lid and the base structure.

According to an embodiment of the present invention, the first portions of the hooks disposed on the base structure are configured so that the second portions of the hooks disposed on the base structure are spaced apart from a surface (e.g., a main surface) of the base structure, wherein the first portions of the hooks disposed on the base structure may, for example, extend substantially perpendicularly (e.g., with a tolerance of +/- 5 degrees) to the main surface of the base structure. Furthermore, the inner surfaces of the second portions of the hooks disposed on the base structure (which are spaced apart from the main surface of the base structure, for example, by the first portions) may be configured to allow the hooks disposed on the cover or on the support structure to engage with the inner surfaces of the second portions of the hooks disposed on the base structure, for example. Optionally, the respective hooks arranged on the cover or on the support structure can be moved into the gap between the main surface and the respective inner surface of the base structure, for example when the cover is rotated.

According to an embodiment of the present invention, the first portions of the hooks disposed on the lid or, for example, the support structure of the lid are configured so that the second portions of the hooks disposed on the lid or, for example, the support structure of the lid are spaced apart from a surface (for example, a main surface) of the lid or, for example, the support structure of the lid. Optionally, the first portions of the hooks disposed on the support structure may extend substantially perpendicularly (for example, with a tolerance of +/- 5 degrees) to the main surface of the support structure. Furthermore, the respective inner surfaces of the respective second portions of the hooks disposed on the lid or support structure (separated from the main surface of the lid or support structure, for example, by the respective first portions) can be configured to engage with the respective inner surfaces of the respective hooks disposed on the base structure, for example, so as to move into the gap between the main surface of the base structure and the respective inner surfaces of the hooks disposed on the base structure when the lid is rotated. Optionally, the respective inner surfaces of the respective second portions of the hooks disposed on the base structure can extend substantially parallel to the main surface of the base structure (e.g., with a tolerance of +/- 5 degrees).

Therefore, a precisely defined spatial test setup for the DUT can be provided.

According to an embodiment of the present invention, the hooks (e.g., the hooks disposed on the cover or the support structure and/or the hooks disposed on the base structure) are configured to secure the cover by friction or by a snap-fit functionality that can be achieved by manually rotating the cover. This enables quick and easy replacement of DUTs.

Embodiments according to the present invention include a method for testing a device under test, wherein the method includes inserting the device under test into a test socket, for example, into a device under test cavity of the test socket, wherein the device under test socket includes: a base structure, for example, having a device under test cavity for mechanically centering the device under test; and a cover, wherein a central portion of the cover (which is, for example, opposite the device under test portion/device under test cavity when the cover is secured to the base structure) is open and/or includes a low-dielectric-constant material, for example, having a relative dielectric constant of less than or equal to 1.2 (for example, to achieve substantially distortion-free transmission of electromagnetic waves, for example, for a frequency in the microwave frequency range between 1 GHz and 1000 GHz).

The method further comprises securing (e.g., removably securing) the cover to the base structure by rotating (e.g., manually) the cover (e.g., about an axis extending through the DUT cavity and/or, e.g., by rotating relative to the base structure), wherein the cover pushes a pusher (e.g., a low dielectric constant structure; e.g., an "electromagnetically transparent" structure or a substantially "electromagnetic transparent structure"; e.g., a structure provided by Evonik) toward a DUT portion of the base structure (e.g., toward the DUT cavity of the base structure, e.g., to push the DUT into the DUT cavity and/or to ensure reliable electrical contact between the DUT and one or more electrical contacts (e.g., disposed in the DUT cavity)). HF71 material; for example, a structure made of rigid foam or a closed-cell rigid foam or a closed-cell rigid foam based on polymethacrylimide chemistry). Optionally, the pusher may or may not be part of the cover.

According to an embodiment, the method includes performing an over-the-air test of a device under test, wherein wireless transmission is performed between the device under test (which is pushed into a cavity of the device under test, for example, by the pusher) and a test antenna through a central portion of a cover (which is open and/or comprises a low-k dielectric constant material) and by a pusher.

The method described above can be based on the same considerations as the DUT socket described above. Incidentally, the method can be implemented using all features and functionalities also described with respect to the DUT socket. Vice versa, this applies to the features of the respective methods described with respect to the DUT socket.

100, 200, 600, 900, 1300: Tested device sockets

110, 210, 610, 910, 1210, 1310: Base structure

112, 612, 912, 1312: Gap

115, 215, 915: Interlocking sections

120, 220, 620, 920, 1220, 1320: Cover

122,622: Central part, central area

130, 230, 630, 730, 930, 1230, 1330: Thrusters

140: Device under test

150: Surface

160: Recessed contact area

170, 270, 670: Test device cavity

214,224,619,624,914,924,1314,1324,1334: Hook

214a, 224a: Part 1 of each

214b, 224b: Second part of each

214B, 224B: Respective inner surfaces

216,616: First level

218,618: Second level

222: hole, center part, center area

226: Main section, supporting structure

232,632,1232,1332: Protector structure

280,440,940: Screws

400:Automated testing equipment

410,1000:Carrier board

420: Remote Engineering Socket

422: White actuator material

424: Ring

430: Measurement Antenna

617: Electrical socket

626,1326:Support structure

640:DUT AiP

1100: Simple socket cover

1200: Rotating cover socket, device under test socket

1322: open section, opening, center part, center area

1360: DUT contact area

1370: recessed area, recess, device under test location, device under test cavity

1390: Arrow

The drawings are not necessarily to scale, emphasis instead generally being placed upon illustrating the principles of the invention. In the following description, various embodiments of the present invention are described with reference to the following drawings, in which: FIG1 shows a schematic diagram of a device under test socket according to an embodiment of the present invention; FIG2 shows a schematic 3D rendering of a device under test socket according to an embodiment of the present invention; FIG3a) and FIG3b) show an image of the clamshell cover with the pressure screw of FIG3a), and an image of the lever/cam cover socket of FIG3b); FIG4 shows a photograph of an automated test equipment with an attached carrier board, wherein the remote engineering socket is mounted on the carrier board; FIG5 shows a photograph of the remote engineering socket; FIG6 shows a schematic exploded view of the device under test socket according to an embodiment; FIG7 shows a schematic diagram of a pusher according to an embodiment; and FIG8a) to FIG8d) show a schematic diagram of a pusher according to an embodiment. Schematic diagrams of a device under test (DUT) socket according to an embodiment are shown, wherein the cover is rotated for securing to a base structure; FIG9a) and FIG9b) schematic diagrams of a device under test (DUT) socket according to an embodiment of the present invention in a contacted state (FIG. 9a) and a free state (FIG. 9b); FIG10 to FIG12 show simulation results of remote OTA testing according to an embodiment of the present invention, in the absence of a socket (FIG. 10a) to FIG10c), in the presence of a simple cover (FIG. 11a) to FIG11c), and in the presence of a rotating cover (FIG. 12a) to FIG12d); and FIG13a) to FIG13c) photographs of an exemplary assembly process for a device under test socket according to an embodiment.

Detailed description of the preferred embodiment

Even if the same or equivalent components with the same or equivalent functionality appear in different drawings, the same or equivalent component numbers will be used to represent the same or equivalent components in the following description.

In the following description, numerous details are set forth to provide a more thorough explanation of embodiments of the present invention. However, it will be apparent to those skilled in the art that embodiments of the present invention can be practiced without these specific details. In other instances, well-known structures and devices are shown in block diagram form rather than in detail to avoid obscuring the embodiments of the present invention. Furthermore, unless specifically stated otherwise, features of different embodiments described later in this document may be combined with one another.

FIG1 shows a schematic diagram of a device under test (DUT) socket according to an embodiment of the present invention. FIG1 shows a DUT socket 100 including a base structure 110 and a cover 120. Also shown are a pusher 130 and a DUT 140. As an optional example, the DUT socket 100 is shown as being disposed on a carrier surface 150 having a recessed contact area 160 for the DUT 140, for example including contact pins such as spring-loaded ejector pins or contact pads. However, the surface 150 shown in FIG1 may alternatively be part of the base structure 110, such that the base structure 110 optionally includes the recessed contact area 160, which may form or be part of a DUT cavity 170.

The lid 120 is configured to be secured to the base structure 110 by rotating the lid 120. Therefore, as an example, the base structure 110 and the lid 120 include interlocking portions or sections 115. As an example, the base structure 110 and the lid 120 may include interlocking teeth, hooks, and/or threads. Interlocking by friction may also be possible.

Furthermore, the cover 120 is configured to push the pusher 130 toward the DUT portion of the base structure 110. In the example shown in FIG1 , the DUT portion of the base structure 110 may be the central portion of the base structure 110, with the DUT positioned within or within a projection of the central portion during testing. As one example, in the configuration of FIG1 , the DUT portion is recessed, forming a DUT cavity 170. In other words, as an optional feature, the cover 120 is configured to push the pusher 130 toward the DUT cavity 170. For example, by rotating the cover 120 to attach or mount it to the base structure 110, the distance between the cover 120 and the device under test can be reduced, allowing the actuator 130 to be pushed onto or toward the device under test 140. This allows for better contact between the device under test 140 and the contact area 160.

Additionally, as an optional feature, the central portion 122 of the cover 120 is open. Optionally, portion 122 may comprise a low-k dielectric material. This may allow for substantially distortion-free transmission of OTA signals from the device under test 140 during testing.

As an optional feature, in the assembly shown in FIG. 1 , the base structure 110 includes a notch 112 configured to accommodate the pusher 130 . The notch can be provided as a volume between the lid 120 and the device under test 140 . Optionally, the shapes of the pusher 130 and the notch 112 can correspond to each other, for example, to provide a compact and tight fit for the pusher 130 .

Optionally, the DUT socket 100 may include a pusher 130. For example, the cover 120 and pusher 130 may be two separate parts, as shown in FIG1 . In this arrangement, the pusher 130 can be held in place during testing by friction between the cover 120 and the pusher 130. The force applied may be based on the tension caused by the installation of the cover 120 and the base structure 110 using the interlocking section 115. Thus, the pusher 130 may optionally be mechanically coupled to the cover 120 in a floating manner.

In accordance therewith, as an optional feature, the cover 120 and the pusher 130 can be assembled as separate components of the DUT socket 100. Thus, assembling the DUT socket 100 can, for example, include manually or automatically inserting the pusher 130 into the recess 112 of the base structure. As previously explained, the cover 120 can then be attached, mounted, or secured to the base structure 110 using a rotational motion. For example, using threads, the distance between the cover 120 and the base structure 110 can be reduced when rotated, or alternatively, the cover can be pushed downward and then rotated to, for example, tighten interlocking teeth. In any case, when the cover is tightened to the base structure 110 by rotation of the cover, the pusher 130 can be moved toward, pushed toward, or pressed toward the device under test cavity 170 (e.g., a recessed area) by the force from the cover 120.

Alternatively, for example, the cover 120 and the pusher 130 may be assembled so as to be fixedly attached to each other, for example, via screws or any type of fastening (such as glue). Furthermore, an interlocking mechanism between the cover 120 and the pusher 130 is also possible.

Furthermore, the actuator 130 may optionally comprise a low-dielectric constant material to reduce interference with the OTA signal of the device under test 140 during testing. Thus, as an example, the actuator may comprise, or even be made of, a material having a relative dielectric constant less than or equal to 1.2. Optionally, the actuator 130 may be made of a rigid foam material. As another optional feature, the material of the actuator may have a tensile modulus greater than 80 MPa. Specifically, with respect to the tensile modulus, as an optional feature, the tensile modulus of the material of the actuator 130 may be less than one-tenth of the tensile modulus of the material of the cover 120.

As another optional feature, in FIG1 , the pusher 130 has a cross-sectional area that widens in a direction from the DUT cavity 170 toward the lid 120 , thereby facilitating assembly and insertion of the pusher into the notch 112 . As an example, the pusher 130 may have an inverted stepped pyramid shape and/or a conical shape. As an example, the cross-sectional area of the pusher 130 near the lid 120 may be at least twice as large as the cross-sectional area of the pusher 130 near the DUT cavity 170 . Alternatively, the pusher may have a circular cross-sectional area near the lid 120 and/or a circular cross-sectional area near the DUT cavity 170 . As shown in FIG1 , the shape of the pusher 130 can thus be adapted to the shape of the DUT cavity 170 in the vicinity of the DUT cavity 170 .

Reference is made below to FIG. 2 , for example, regarding the patent proposal. FIG. 2 shows a schematic 3D rendering of a device under test socket according to an embodiment of the present invention. The device under test socket 200 includes a cover 220 and a base structure 210.

As an example, the cover 220 includes a hook 224 attached to a main section 226 (e.g., a support structure) of the cover 220 via screws 280. It should be noted that the hook 224 and the main section 226 can also be made from a single piece, for example, via 3D printing, molding, and/or casting processes. As explained in the context of FIG. 1 , the cover 220 optionally includes an open section, such as a hole 222.

FIG2 further transparently illustrates the pusher 230 and an optional protector structure 232 attached to the pusher 230 in the area adjacent to the lid. The protector structure 232 is disposed between the pusher 230 and the lid 220. The protector structure 232 can buffer forces and/or torques applied to the pusher 230 from the lid 220. Furthermore, particularly when the lid 220 and the pusher 230 are separate parts, the protector structure 232 can reduce wear on the pusher 230, for example, due to repeated rotational forces from the lid 220 toward the pusher 230 when the lid 220 is mounted to the base structure 210.

As shown in FIG. 2 , as an optional feature, a protector structure 232 can be attached to the top surface of the pusher 230, which faces away from the DUT cavity 270 . The protector structure 232 is disposed in an outer region of the top surface of the pusher 230 , thereby leaving the central region of the top surface of the pusher free. The DUT cavity 270 is visible in FIG. 2 through the transparently displayed pusher 230 .

Based on the hook 224, the base structure includes the hook 214, thereby forming an interlocking section 215 of the device under test socket 200. As an example, the base structure includes a first layer 216 forming the hook 214 and a second layer 218, which are attached to each other using screws 280. It should also be noted that the base section 210 can be a single part, for example molded, cast, or printed, and/or the layers can be attached in any other way, such as by bonding, for example using glue. As an example, the layer 218 can include an opening for the hook 214. However, the hook 224 can also be part of the layer 218. In addition, the hook 224 can be, for example, a separate part that is attached to either layer 216, 218, for example using screws.

Optionally, the material of the protector structure 232 comprises higher mechanical stability than the material of the actuator 230, and/or the material of the protector structure 232 comprises a relative dielectric constant greater than or equal to 2.

Furthermore, as shown in FIG. 2 , optionally, the respective first portions 214a of the hooks 214 disposed on the base structure 210 may be formed so as to maintain a spacing between the respective second portions 214b of the hooks 214 and the surface of the base structure, and the respective inner surfaces 214B of the respective second portions of the hooks disposed on the base structure may be configured to allow the respective hooks 224 to engage with the respective inner surfaces.

Vice versa, as an optional feature, the respective first portions 224a of the hooks disposed on the cover 120, or more specifically, on the support structure 226 in this example, are configured so that the respective second portions 224b of the hooks 224 are spaced apart from the surface of the cover or support structure, and the respective inner surfaces 224B of the respective second portions of the hooks 224 are configured to engage with the respective inner surfaces 214B of the respective hooks 214 disposed on the base structure 210.

As an optional feature, the hooks 214, 224 can be configured to secure the cover 220 by friction or by a snap-fit functionality that can be resolved by manual rotation of the cover (see, for example, FIG. 8 ).

Again, referring to FIG. 2 , it should be noted that, for example, this patent application proposes a manual socket, such as 200, for use in over-the-air (OTA) ATE testing during the engineering phase where the DUT is manually inserted into the socket.

For OTA testing, the top cover of the socket (e.g., 220) is critical in some cases because it should allow and not interfere with the beam generated by the DUT antenna array.

It is also desirable to have, for example, 200 sockets to facilitate easy replacement of DUTs when manually testing a large number of DUTs in a project.

As an example of a proposed socket, a design is shown in FIG2 and will be described in more detail below. According to one aspect, features such as the cover 220 are designed for easy removal and are also designed for optimal performance during OTA testing, for example.

For a better understanding of the embodiments, please refer to the background of the patent proposal company.

In some cases, the OTA socket is platform-independent, meaning it can be used on different platforms, for example. The design presented in this patent application can be used at customer OTA test sites.

Regarding this embodiment, it should be noted that current typical engineering socket options have shortcomings in OTA remote field testing.

First, refer to Figure 3a). Figure 3a shows an image of a clamshell lid with press screws (www.ironwoodelectronics.com/products/lid-tool-socket-accessories).

A typical engineering socket for non-OTA applications, such as that shown in Figure 3a, has an easily opened cover and, for example, a press screw that pushes the device into the socket's electrical contacts. It has been found that in OTA applications, the cover and press screw will be in the antenna beam path.

Next, refer to Figure 3b). Figure 3b shows an image of a lever/cam socket (www.zaxeu.com/test-socket-based-elastomeric-matrix-connectors).

One type of conventional socket that appears well-suited for remote OTA is the one with a lever/cam cover, as shown in Figure 3b), where there is an open area above the top of the DUT for the antenna beam. However, this socket has been found to cause significant problems because a significant portion remains in the beam path, a significant portion is metal, and the socket opening resonates at some frequencies due to being the same size as the antenna array.

For remote OTA testing, refer to Figures 4 and 5. Figure 4 shows a photograph of automated test equipment 400 with an attached carrier board 410, on which a remote engineering socket 420 is mounted. Thus, Figure 4 shows a remote engineering setup. Furthermore, automated test equipment 400 includes a measurement antenna 430. Figure 5 shows a photograph of the remote engineering socket.

Figures 4 and 5 show a simple OTA remote engineering socket 420 currently in use. The white pusher material, such as 422, is made of an electromagnetically transparent material (e.g., HF71). There is a collar, such as 424, made of PEEK (plastic) to provide a certain degree of rigidity. The cover is secured by four screws 440. The socket provides good performance for OTA remote testing, but DUT replacement is cumbersome because it requires manual removal and attachment of four screws.

As an example, the present method for testing a DUT can be performed using a DUT socket of the present invention having the configuration shown in FIG. Thus, a DUT can be inserted into the socket and a cover can be secured to a base structure by rotating the cover, wherein the cover pushes a pusher toward the DUT portion of the base structure. Optionally, over-the-air testing of the DUT can be performed, wherein wireless transmission between the DUT and a test antenna (e.g., 430) is performed through the center portion of the cover (which is open and/or includes a low-k dielectric constant material) and via the pusher.

Next, refer to Figure 6 and Figure 2, which are related to the proposed ATE OTA sliding cover socket design according to an embodiment.

FIG6 shows a schematic exploded view of a DUT socket according to an embodiment. FIG6 shows a DUT socket 600, which includes a base structure 610 (optionally having a notch 612 for a pusher 630) and a cover 620 (optionally having an open center portion 622 and a support structure 626), as well as a pusher 630 and a protector structure 632, which may have features identical to or corresponding to those of the respective components of FIG1 and/or FIG2.

As an optional feature, the cover may comprise or even be made of PEEK, for example having a dielectric constant <3.5 and/or a tensile modulus >3500 MPa. The respective hooks 624 and protector structure 632 may also comprise or even be made of PEEK.

As previously explained, the protector structure can be attached (e.g., mounted, glued, or screwed) to the pusher 630, particularly on the upper surface facing away from the DUT and toward the cover 620, so as to be disposed at the edge and/or edge region of the upper surface of the pusher 630, thereby leaving the central region of the top surface of the pusher free.

Furthermore, as an example, the base structure 610 includes a first layer 616 and a second layer 618. As an example, the layers 616 can be assembled to form an electrical receptacle 617. The hook base forming the hook of the base structure 610 can be part of the layers 616, 618 or a separate component. The hook base can include or even be made of PEEK.

As indicated in FIG6 , the pusher 630 can be implemented as an Evonik HF71, for example. Optionally, the material of the pusher can or should even have, for example, a dielectric constant of <1.2 and/or a tensile modulus of >80 MPa.

As shown in FIG6 , the base structure 610 may form a device cavity 670 in which a DUT (e.g., a DUT AiP 640 (antenna in package)) may be disposed.

For example, socket designs like the 200 and 600 don't require any manual twisting. Just twist the cover like the 220 and 620, making it extremely easy to replace a DUT like the 640.

For example, optionally, the cover design, such as 220, 620, is intentionally made so that the low-k material covers not only the DUT, such as 640, but also the area surrounding the DUT, thereby avoiding the creation of a cavity with the same dimensions as the DUT antenna array.

For example, optionally, a PEEK cover and hooks (e.g., 214, 224, 624, 619) provide mechanical rigidity, but are held sufficiently far away from the DUT antenna array to avoid in-band resonance of the antenna beam, for example.

For example, the manufacturing process is that the DUT (e.g., 640) is first inserted into the electrical socket (e.g., into the cavity 270, 670), then the pusher (e.g., 230, 630) with the protector (e.g., 232, 632) is placed on top in the correct orientation, and finally the cover (e.g., 220, 620) is inserted and rotated to obtain good electrical contact between the DUT and the electrical socket (e.g., 120, 610).

Next, see Figure 8 for an example of a socket cover closing process. Figures 8a) to 8d) show schematic diagrams of a device under test socket according to an embodiment, in which the cover is rotated to be secured to the base structure.

FIG8 a shows the DUT socket 200 in a first position, with the cover 220 not attached to the base structure 110. As shown in FIG8 a , the protector structure 232 and the cover 220 may not be aligned in this position. As shown in FIG8 b , the cover 220 can then be rotated to interlock the latches 224 and 214. FIG8 c and FIG8 d show the socket in an interlocked state. Furthermore, in the interlocked state, the protector structure 232 and the cover 220 can be aligned so that the opening in the cover 220 is aligned with the surface of the pusher 230 not covered by the protector structure 232.

Possible OTA socket variations are discussed below. Therefore, reference is made to FIG. FIG. 7 shows a schematic diagram of a pusher according to an embodiment. In the example of FIG. 7 , the cross-sectional area of pusher 730 widens in the direction from the DUT cavity toward the cover.

One possible alternative socket variation is to make the actuator and cover a single-piece structure. In some cases, this requires a more complex mechanical design with additional parts. In some cases, this more complex design can affect the performance of the DUT antenna array. An example of a high-level concept for such a socket is described below, for example, with reference to Figure 7.

Furthermore, if, for example, the device is square with sufficient margin between the DUT antenna array and the DUT package, a circular pusher can alternatively be used, and in that case the cover can be a single-piece structure.

Furthermore, for example, if the DUT is flush (or flushed) or slightly above the socket cavity, a large circular pusher can be used even if the device is rectangular. In some cases, this socket cavity will be unreliable for processor integration.

In the following, reference is made to FIG9a and FIG9b. FIG9a and FIG9b show schematic diagrams of a socket of a device under test in a contact state (FIG. 9a) and a free state (FIG. 9b) according to an embodiment of the present invention.

Figures 9a and 9b illustrate a device under test socket having a base structure 910 with a hook 914 (optionally having a notch 912 for a pusher 930) and a cover 920 with a hook 924 and pusher 930. Hooks 914 and 924 may form an interlocking section 915. Therefore, elements corresponding to those discussed in the context of Figures 1, 2, 6, 7, and 8 may have the same or corresponding details and/or functionality.

As an example, pusher 930 is fixedly attached to cover 920 using screw 940. Screw 940 may include or optionally be made of PEEK. In other words, additional screw 940 may be configured to capture pusher 930.

FIG9 a shows the DUT socket in a contact state, wherein the cover 920 is attached to the base 910 and the pusher 930 pushes the DUT 140 into the recess 170 so that good contact with the contact area 160 can be provided for testing the DUT.

As shown in FIG9 , the shape of pusher 930 can optionally be adapted to the shape of DUT cavity 170 near the DUT cavity. Thus, pusher 930 can extend into the DUT cavity when the lid is attached to the base structure. Alternatively, it should be noted that pusher 930 can be configured so as not to enter the DUT cavity when the lid 920 is attached to the base structure 910.

In the assembly shown in FIG9 a), as an optional feature, the actuator covers the device under test 140 and the area surrounding the device under test.

Figure 9b) shows the DUT socket 900 in a free state, with the cover 920 removed from the base structure 910. Using screws 940, the pusher 930 is lifted together with the cover 920. As an example, the cover 920 has a fixture for the floating function of the pusher 930, as the pusher is mounted on the socket's recess 170.

Reference is made below to Figures 10, 11, and 12, which illustrate simulation results. These figures show simulation results of remote OTA testing according to an embodiment of the present invention, with no socket in Figure 10, with a simple-cover socket in Figure 11, and with a rotating-cover socket in Figure 12.

Figure 10a) shows a schematic diagram of the far field of the device under test on the download board 1000 at a frequency of 28 GHz without a socket. Figure 10c) shows a schematic diagram of the far field, as shown in Figure 10a) in a side view. Figure 10b) shows a schematic diagram of the main lobe amplitude in dBi at different frequencies for the setup shown in Figure 10a).

Figure 11a) shows a schematic diagram of the far field of the device under test on the simple cover socket 1100 at a frequency of 28 GHz. Figure 11c) shows a schematic diagram of the far field, as shown in Figure 11a) in a side view. Figure 11b) shows a schematic diagram of the main lobe amplitude in dBi at different frequencies for the setup shown in Figure 11a).

Figure 12a) shows a schematic diagram of the far field of a device under test on a rotating lid receptacle 1200 at a frequency of 28 GHz. Figure 12c) shows a schematic diagram of the far field, as shown in Figure 12a) in a side view. Figure 12b) shows a schematic diagram of the main lobe amplitude in dBi at different frequencies for the configuration shown in Figure 12a). Figure 12d) shows a zoomed-in version of Figure 12c). As shown in Figure 12c), the rotating lid receptacle 1200 according to an embodiment includes a lid 1220 and a base structure 110. Also shown are a pusher 1230 and a protector structure 1232.

As can be seen in Figures 10, 11, and 12, there is always an impact on beamforming performance as we make the socket more complex, but as the examples demonstrate, the results remain good for ATE testing according to the embodiment.

In other words, a device under test socket according to an embodiment, such as that shown in FIG. 12 , can provide a good compromise between usability, e.g., with respect to easy DUT replacement, and interference with the antenna beam.

In addition, Figures 13a) to 13c) show photographs of an exemplary assembly process of a socket prototype of a device under test according to an embodiment.

FIG13 a shows the device under test socket 1300 in a disassembled state. As an optional feature, the cover 1320 includes a plurality of L-shaped hooks 1324. As shown in FIG13 a , as an optional feature, the cover 1320 may include a support structure 1326 and an open section 1322. Furthermore, the plurality of hooks 1324 are disposed on the cover 1320, or more precisely, on the support structure 1326 of the cover in this case.

Additionally, as an optional feature, the hook is adapted to engage with a respective mating hook 1314 provided at the base structure 1310 (which, as an optional feature, has a notch 1312 for the pusher 1330).

As an optional feature, the support structure 1326 may comprise a material having a relative dielectric constant between 2 and 3.5. Furthermore, the support structure may optionally be made of polyetheretherketone (PEEK).

As shown, as another optional feature, the support structure 1326 includes a substantially rectangular outer perimeter and includes an opening 1322 having a circular perimeter in the central region.

Additionally, as an optional feature, the base structure 1310 includes a recessed area 1370 that forms a device under test cavity. In the cavity, as an optional feature, a DUT contact area 1360 is configured to provide electrical contact to the DUT for testing.

As an optional feature, a protector structure 1332 is attached to a pusher 1330. In Figure 13a), the pusher is shown in an inverted position. The pusher has a stepped pyramid shape so that the smaller end of the pusher 1330 can apply force to the DUT when placed in a recess 1370 (e.g., a DUT cavity).

FIG. 13 b ) shows an example of a first assembly step, in which the pusher 1330 is arranged on the base structure 1310 . As shown, the hook 1334 (and therefore the hook 1324 in the closed state) is arranged next to the pusher 1330 in the area of the socket of the device under test.

As shown in FIG. 13 a) and FIG. 13 b), the pusher 1330 can be structured into different portions corresponding to recessed areas of the base structure 1310, which allows the pusher 1330 to be easily attached to the base structure 1310 and centered on the base structure (see, for example, arrow 1390).

FIG13c) shows the DUT socket 1300 in a closed and/or fully assembled state. As can be seen in FIG13a), FIG13b), and FIG13c), as an optional feature, the cover 1320 optionally includes a support structure 1326 that surrounds the DUT location 1370 when viewed in a projection perpendicular to the plane in which the support structure is disposed when the cover is secured to the base, or when viewed in a projection perpendicular to the plane of the DUT when the cover is secured to the base.

Various inventive embodiments and aspects are described herein, for example, in the sections relating to: "Patent Proposal," "Proposed ATE OTA Sliding Lid Socket Design," "Socket Lid Closing Process," "Possible OTA Socket Variations," "Examples (Examples)," and "Simulation Results (Examples)." Further embodiments are defined by the accompanying patent claims.

It should be noted that any embodiment defined by the scope of the patent application may optionally be supplemented by any details (features and functionalities and details) described herein, for example, in the above-mentioned section or in any other section.

In addition, the embodiments described in the above-mentioned sections and/or subsections may be used individually and may also be optionally supplemented by any features in any other sections or subsections or by any features included in the scope of the patent application.

Furthermore, it should be noted that the individual aspects described herein can be used individually or in combination. Thus, details may be added to each of these individual aspects without also adding details to another of these aspects.

It should also be noted that this disclosure explicitly or implicitly describes features that can be used in automated test equipment or automated test systems. Therefore, any feature described herein can be used in the context of automated test equipment or automated test systems.

Furthermore, the features and functionality disclosed herein in relation to the methods may also be employed in apparatuses configured to perform such functionality. Furthermore, any features and functionality disclosed herein with respect to the apparatus may also be employed in the corresponding methods. In other words, the methods disclosed herein may optionally be supplemented by any of the features and functionality described with respect to the apparatuses.

Although some aspects have been described in the context of an apparatus, it is apparent that these aspects also represent a description of the corresponding method, where a block or device corresponds to a method step or a feature of a method step. Similarly, aspects described in the context of a method step also represent a description of the corresponding block, item, or feature of the corresponding apparatus.

Depending on certain implementation requirements, embodiments of the present invention can be implemented in hardware or software. Implementation can be performed using a digital storage medium (e.g., a floppy disk, DVD, CD, ROM, PROM, EPROM, EEPROM, or flash memory) having stored thereon electronically readable control signals that cooperate (or are capable of cooperating) with a programmable computer system to cause the execution of the respective method.

Some embodiments according to the invention comprise a data carrier having electronically readable control signals capable of cooperating with a programmable computer system, such that one of the methods described herein is performed.

Generally speaking, embodiments of the present invention may be implemented as a computer program product having program code, which, when the computer program product is run on a computer, is operable to perform one of the methods. The program code may, for example, be stored on a machine-readable carrier.

Other embodiments comprise the computer program for performing one of the methods described herein, stored on a machine-readable carrier.

In other words, an embodiment of the method according to the invention is, therefore, a computer program having a program code for performing one of the methods described herein, when the computer program runs on a computer.

Therefore, another embodiment of the present method is a data carrier (or a digital storage medium, or a computer-readable medium) comprising recorded thereon the computer program for performing one of the methods described herein.

Therefore, a further embodiment of the method according to the invention is a data stream or a signal sequence representing a computer program for performing one of the methods described herein. The data stream or the signal sequence can, for example, be configured to be transmitted via a data communication connection, for example via the Internet.

Another embodiment comprises a processing means, for example a computer or a programmable logic device, configured or adapted to perform one of the methods described herein.

Another embodiment comprises a computer on which is installed the computer program for performing one of the methods described herein.

In some embodiments, a programmable logic device (e.g., a field programmable gate array) may be used to perform some or all of the functionality of the methods described herein. In some embodiments, a field programmable gate array may cooperate with a microprocessor to perform one of the methods described herein. In general, the methods are preferably performed by any hardware device.

The embodiments described above are merely illustrative of the principles of the present invention. It should be understood that modifications and variations of the configurations and details described herein will be apparent to those skilled in the art. Therefore, it is intended that the present invention be limited only by the scope of the claims that follow, rather than by the specific details presented through the description and explanation of the embodiments herein.

100: Device under test socket

110: Base structure

112: Gap

115: Interlocking Section

120: Cover

122: Central part, central area

130:Thruster

140: Device under test

150: Surface

160: Recessed contact area

170: Test device cavity

Claims (32)

A device under test socket (100, 200, 600, 900, 1200, 1300) for testing a device under test (140), comprising: a base structure (110, 210, 610, 910, 1210, 1310) having a device under test cavity for mechanically centering the device under test; and a cover (120, 220, 620, 920, 1220, 1320); wherein the cover is configured to be fixed to the base structure by rotating the cover about an axis extending through the device under test cavity; The cover is configured to push a pusher (130, 230, 630, 930, 1230, 1330) toward a device under test portion of the base structure, and a central portion (122, 222, 622, 1322) of the cover is open and/or comprises a low-k dielectric material. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the device under test socket includes a pusher (130, 230, 630, 930, 1230, 1330) configured to push the device under test (140) toward the device under test cavity (170, 270, 670, 1370), wherein the pusher includes a low dielectric constant material; and wherein the cover (120, 220, 620, 920, 1220, 1320) is configured to push the pusher toward the device under test cavity. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the actuator (130, 230, 630, 930, 1230, 1330) is made of a material having a relative dielectric constant less than or equal to 1.2. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the actuator (130, 230, 630, 930, 1230, 1330) is made of a rigid foam material. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the material of the actuator (130, 230, 630, 930, 1230, 1330) has a tensile modulus greater than 80 MPa. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein a tensile modulus of the material of the actuator (130, 230, 630, 930, 1230, 1330) is less than one tenth of a tensile modulus of a material of the cover (120, 220, 620, 920, 1220, 1320). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the base structure (110, 210, 610, 910, 1210, 1310) includes a notch (112, 612, 912, 1312) configured to receive the pusher (130, 230, 630, 930, 1230, 1330). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the cover (120, 220, 620, 920, 1220, 1320) and the actuator (130, 230, 630, 930, 1230, 1330) are assembled as separate components of the device under test socket. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the actuator (130, 230, 630, 930, 1230, 1330) is attached to the cover (120, 220, 620, 920, 1220, 1320). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the actuator (130, 230, 630, 930, 1230, 1330) is mechanically coupled to the cover (120, 220, 620, 920, 1220, 1320) in a floating manner. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the pusher (130, 230, 630, 930, 1230, 1330) is configured to be manually inserted into a notch (112, 612, 912, 1312) of the base structure (110, 210, 610, 910, 1210, 1310), and wherein the pusher is configured to be pushed toward the device under test cavity (170, 270, 670, 1370) by a force from the cover when the cover (120, 220, 620, 920, 1220, 1320) is secured to the base structure by the rotation of the cover. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein a protector structure (232, 632, 1232, 1332) is attached to the pusher in an area of the pusher (130, 230, 630, 930, 1230, 1330) adjacent to the cover (120, 220, 620, 920, 1220, 1320), wherein the protector structure is configured to be between the pusher and the cover. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein a protector structure (232, 632, 1232, 1332) is attached to a top surface of the pusher (130, 230, 630, 930, 1230, 1330), the top surface facing away from the device under test cavity (170, 270, 670, 1370), and wherein the protector structure is disposed in an outer region of the top surface of the pusher, thereby leaving a central region of the top surface of the pusher unoccupied. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 12, wherein a material of the protector structure (232, 632, 1232, 1332) comprises a higher mechanical stability than a material of the actuator (130, 230, 630, 930, 1230, 1330), and/or wherein a material of the protector structure (232, 632, 1232, 1332) comprises a relative dielectric constant greater than or equal to 2. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein a cross-sectional area of the actuator (130, 230, 630, 930, 1230, 1330) widens in a direction from the device under test cavity (170, 270, 670, 1370) toward the cover (120, 220, 620, 920, 1220, 1320). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein a cross-sectional area of the pusher (130, 230, 630, 930, 1230, 1330) near the cover (120, 220, 620, 920, 1220, 1320) is at least twice greater than a cross-sectional area of the pusher near the device under test cavity (170, 270, 670, 1370). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the pusher (130, 230, 630, 930, 1230, 1330) comprises a circular cross-section near the cover; and/or wherein the pusher (130, 230, 630, 930, 1230, 1330) comprises a circular cross-section near the device under test cavity (170, 270, 670, 1370). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein a shape of the actuator (130, 230, 630, 930, 1230, 1330) is adapted to a shape of the device under test cavity (170, 270, 670, 1370) near the device under test cavity. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the actuator (130, 230, 630, 930, 1230, 1330) is configured to extend into the device under test cavity (170, 270, 670, 1370) when the cover (120, 220, 620, 920, 1220, 1320) is attached to the base structure (110, 210, 610, 910, 1210, 1310); or The pusher (130, 230, 630, 930, 1230, 1330) is configured so as not to enter the device under test cavity (170, 270, 670, 1370) when the cover (120, 220, 620, 920, 1220, 1320) is attached to the base structure (110, 210, 610, 910, 1210, 1310). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the actuator (130, 230, 630, 930, 1230, 1330) is configured to cover the device under test (140) and an area around the device under test. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein the cover (120, 220, 620, 920, 1220, 1320) includes a support structure (226, 626, 1326) surrounding a device under test location when viewed in a projection perpendicular to a plane on which the support structure is disposed when the cover is secured to the base structure (110, 210, 610, 910, 1210, 1310), or when viewed in a projection perpendicular to a device under test plane when the cover is secured to the base structure (110, 210, 610, 910, 1210, 1310). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 21, wherein the support structure (226, 626, 1326) comprises a material having a relative dielectric constant between 2 and 3.5. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 21, wherein the support structure (226, 626, 1326) is made of polyetheretherketone (PEEK). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 21, wherein the support structure (226, 626, 1326) includes a substantially rectangular outer perimeter and wherein the support structure includes an opening having a circular perimeter in a central region (122, 222, 622, 1322). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 1, wherein a plurality of hooks (224, 624, 924, 1324) are disposed on the cover (120, 220, 620, 920, 1220, 1320) or a support structure (226, 626, 1326) of the cover, wherein the hooks disposed on the cover or the support structure are adapted to engage with respective mating hooks (214, 619, 914, 1314) disposed on the base structure (110, 210, 610, 910, 1210, 1310). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 25, wherein the hooks (214, 619, 914, 1314) are arranged in an area adjacent to the pusher (130, 230, 630, 930, 1230, 1330) of the device under test socket. For example, the socket (100, 200, 600, 900, 1200, 1300) of the device under test of claim 25, wherein the hooks (214, 224, 619, 624, 914, 924, 1314, 1324) are L-shaped. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 25, wherein the first portions of the hooks (214, 619, 914, 1314) disposed at the base structure (110, 210, 610, 910, 1210, 1310) are configured so that the second portions of the hooks disposed at the base structure are spaced apart from a surface of the base structure, and The respective inner surfaces of the respective second parts of the hooks (214, 619, 914, 1314) disposed at the base structure are configured to allow the respective hooks (224, 624, 924, 1324) disposed at the cover (120, 220, 620, 920, 1220, 1320) or at the support structure (226, 626, 1326) to engage with the respective inner surfaces. The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 25, wherein the first portions of the hooks (224, 624, 924, 1324) disposed at the cover (120, 220, 620, 920, 1220, 1320) or the support structure (226, 626, 1326) are configured so that the second portions of the hooks (224, 624, 924, 1324) disposed at the cover or the support structure maintain a distance from a surface of the cover or the support structure, and The respective inner surfaces of the respective second parts of the respective hooks (224, 624, 924, 1324) disposed at the cover or the support structure are assembled to engage with the respective inner surfaces of the respective hooks (214, 619, 914, 1314) disposed at the base structure (110, 210, 610, 910, 1210, 1310). The device under test socket (100, 200, 600, 900, 1200, 1300) of claim 25, wherein the hooks (214, 224, 624, 624, 924, 924, 1314, 1324) are configured to secure the cover (120, 220, 620, 920, 1220, 1320) by friction or by a snap-fit functionality that can be achieved by manual rotation of the cover. A method for testing a device under test (140), wherein the method includes inserting a device under test into a test socket, wherein the device under test socket (100, 200, 600, 900, 1200, 1300) includes: a base structure (110, 210, 610, 910, 1210, 1310) having a device under test recess for mechanically centering the device under test, and a cover (120, 220, 620, 920, 1220, 1320), wherein a central portion (122, 222, 622, 1322) of the cover is open and/or includes a low dielectric constant material; and The cover is secured to the base structure by rotating the cover about an axis extending through the DUT cavity, wherein the cover pushes a pusher (130, 230, 630, 930, 1230, 1330) toward a DUT portion of the base structure. The method of claim 31, wherein the method includes performing an over-the-air test of the device under test (140), wherein a wireless transmission is performed between the device under test and a test antenna through the central portion of the cover (120, 220, 620, 920, 1220, 1320) and through the actuator (130, 230, 630, 930, 1230, 1330), the central portion of the cover being open and/or comprising a low dielectric constant material.