TWI889269B - Line laser measurement system and method for determining cutting yield and precision - Google Patents
Line laser measurement system and method for determining cutting yield and precision Download PDFInfo
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本發明為一種線雷射量測系統與判斷切割良率及精度的方法,尤指一種利用第一及第二線雷射感測器同時對待測物掃描而取得數據之線雷射量測系統與判斷切割良率及精度的方法。The present invention is a line laser measurement system and a method for judging cutting yield and precision, and in particular, a line laser measurement system and a method for judging cutting yield and precision that use a first and a second line laser sensor to simultaneously scan an object to be measured to obtain data.
一般IC載板的主要功能為承載IC做為載體之用,主要為保護電路、固定線路與導散餘熱,為封裝製程中的關鍵零件,因此其四邊的切割面之差異(又稱為斷面差異/斷差)是否為相當地平整而無太大的起伏差異,也是很重要的。習知的量測載板的切割面之斜角量測的技術為使用單顆電荷耦合元件(CCD)之光學鏡頭,在載板/待測物的四邊的切割面上移動以進行量測,由於CCD 只是單純的將影像轉變成數字訊號,故對厚度只有0.10mm到0.36mm的載板而言,用CCD所取得的模擬切割面相當粗糙,所得到的斜角量測結果之誤差頗大。因此如何取得更加精確且快速的模擬切割面,以降低斜角量測的誤差及縮短時間,實乃必要之舉。The main function of a general IC carrier is to carry IC as a carrier, mainly to protect circuits, fix lines and dissipate excess heat. It is a key component in the packaging process. Therefore, it is also very important whether the difference of the cut surface of the four sides (also known as cross-sectional difference/discontinuity) is quite flat without too much fluctuation. The known technology for measuring the bevel angle of the cut surface of the carrier is to use a single charge coupled device (CCD) optical lens to move on the cut surface of the four sides of the carrier/object to be measured for measurement. Since CCD simply converts the image into a digital signal, for a carrier with a thickness of only 0.10mm to 0.36mm, the analog cut surface obtained by CCD is quite rough, and the error of the obtained bevel angle measurement result is quite large. Therefore, it is necessary to obtain a more accurate and faster simulated cutting surface to reduce the error of bevel measurement and shorten the time.
職是之故,如何解決用CCD所取得的載板之模擬切割面相當粗糙的問題,值得深思。本發明申請鑑於習知技術中的不足,經過悉心試驗與研究,並一本鍥而不捨之精神,終構思出本發明,以下為本發明之簡要說明。Therefore, it is worth pondering how to solve the problem that the simulated cutting surface of the substrate obtained by CCD is quite rough. This invention application is based on the deficiencies in the prior art. After careful testing and research, and with a spirit of perseverance, the present invention is finally conceived. The following is a brief description of the present invention.
本發明之線雷射量測系統係用以量測多邊形的待測物,藉由第一及第二線雷射感測器在相對二邊同時取得的數據,以計算出該多邊形待測物的模擬切割面,可加快蒐集多邊形待測物的厚度斷差及斜角資訊。The line laser measurement system of the present invention is used to measure a polygonal object to be tested. The simulated cutting surface of the polygonal object to be tested is calculated by using data obtained simultaneously by the first and second line laser sensors on two opposite sides, thereby accelerating the collection of thickness discontinuity and bevel information of the polygonal object to be tested.
本發明為一種線雷射量測系統,用以量測第一待測物,其中該第一待測物具有厚度方向且包括第一、第二、第三及第四切割面,該第一及該第二切割面位於該第一待測物之相對二邊。該線雷射量測系統包括第一及第二線雷射感測器以及分析及計算模組。該第一線雷射感測器之第一位置為第一基準位,該第一位置位於該第一待測物之該第一切割面上方,該第二線雷射感測器位於該第一待測物之該第二切割面上方,且該第一及該第二線雷射感測器被配置用以分別在該第一及該第二切割面上方同時掃描而取得平行於該厚度方向的第一數據及第二數據;以及該分析及計算模組與該第一及該第二線雷射感測器耦接,其中該分析及計算模組被配置用以根據該第一及該第二數據模擬該第一待測物的該第一及該第二切割面以得到第一及第二模擬切割面。The invention is a line laser measurement system for measuring a first object to be measured, wherein the first object to be measured has a thickness direction and includes first, second, third and fourth cutting surfaces, and the first and second cutting surfaces are located on two opposite sides of the first object to be measured. The line laser measurement system includes first and second line laser sensors and an analysis and calculation module. The first position of the first line laser sensor is a first reference position, the first position is located above the first cutting surface of the first object to be tested, the second line laser sensor is located above the second cutting surface of the first object to be tested, and the first and second line laser sensors are configured to scan simultaneously above the first and second cutting surfaces respectively to obtain first data and second data parallel to the thickness direction; and the analysis and calculation module is coupled to the first and second line laser sensors, wherein the analysis and calculation module is configured to simulate the first and second cutting surfaces of the first object to be tested according to the first and second data to obtain first and second simulated cutting surfaces.
又按照一個主要技術的觀點來看,本發明為一種用以量測待測物的線雷射量測模組,其中該待測物包括切割面,且該線雷射量測模組包括線雷射感測器。該線雷射感測器設置於該切割面上方,其中該線雷射感測器被配置用以對該切割面者發射線雷射;取得該切割面之數據;以及將該數據提供至分析及計算模組,俾該分析及計算模組依據該數據模擬該待測物之該切割面以得到模擬切割面。From a main technical point of view, the present invention is a line laser measurement module for measuring an object to be measured, wherein the object to be measured includes a cut surface, and the line laser measurement module includes a line laser sensor. The line laser sensor is disposed above the cut surface, wherein the line laser sensor is configured to emit a line laser to the cut surface; obtain data of the cut surface; and provide the data to an analysis and calculation module, so that the analysis and calculation module simulates the cut surface of the object to be measured according to the data to obtain a simulated cut surface.
再從另一個可實施的角度來看,本發明可以涵蓋到一種線雷射模組,用以量測待測物之平面是否齊平,包括雷射發射器、感測器模組及分析及計算模組。該雷射發射器設置於該平面之一邊之上,用以在垂直於該邊之方向上,發射雷射線;該感測器模組用以同時感測該雷射發射器在相關於該平面之深度上之該雷射線之複數反射;以及分析及計算模組用以分析及計算該複數反射以決定該平面是否為齊平平面。From another practicable perspective, the present invention may include a line laser module for measuring whether the plane of the object to be measured is flat, including a laser emitter, a sensor module, and an analysis and calculation module. The laser emitter is disposed on one side of the plane to emit laser light in a direction perpendicular to the side; the sensor module is used to simultaneously sense the multiple reflections of the laser light of the laser emitter at a depth related to the plane; and the analysis and calculation module is used to analyze and calculate the multiple reflections to determine whether the plane is a flat plane.
本發明又可以為一種判斷待測物的良率及切割精度方法,係使用線雷射量測系統,其中該線雷射量測系統包括第一及第二線雷射感測器、分析及計算模組及比對模組,且該方法包括由切割機切割待切物,得到複數個待測物;移動該第一及該第二線雷射感測器至特定待測物之上方;使該第一及該第二線雷射感測器同時分別取得該特定待測物之第一及第二數據;由該分析及計算模組依據該第一及該第二數據模擬該特定待測物之第一及第二模擬切割面;以及由該比對模組將該第一及該第二模擬切割面與該特定待測物之規格進行比對,俾判斷該特定待測物是否為不合格產品。The present invention can also be a method for determining the yield and cutting accuracy of an object to be tested, using a line laser measurement system, wherein the line laser measurement system includes a first and a second line laser sensor, an analysis and calculation module, and a comparison module, and the method includes cutting the object to be cut by a cutting machine to obtain a plurality of objects to be tested; moving the first and the second line laser sensors to above a specific object to be tested; allowing the first and the second line laser sensors to simultaneously obtain the first and second data of the specific object to be tested respectively; simulating the first and second simulated cutting surfaces of the specific object to be tested according to the first and the second data by the analysis and calculation module; and comparing the first and the second simulated cutting surfaces with the specifications of the specific object to be tested by the comparison module to determine whether the specific object to be tested is a defective product.
本發明可利用於有厚度的切割面之斷差,以及有切割面的斜角量測需求之產品,而且所量測到的數據可以再進行分析,並根據數據上之變化,加以判斷上一個製程應該要注意到的事項,例如:切割產品之刀片的耗損程度或切割時之精度設定等(亦即當刀片在一開始使用時,因尚無耗損,自然就可以設定較低的精度,而隨著刀片使用的時間愈久,其耗損的程度跟著提高時,就必須相對地提高對精度的設定)。本發明藉由在相對的二邊同時取得數據,進而加快蒐集的效率,且依據托盤內的複數個待測物之所在位置的不同,本發明可在不改變二個感測器之間距下同時掃描一整列的待測物。The present invention can be used for products that require the measurement of the thickness of the cutting surface and the bevel of the cutting surface. The measured data can be further analyzed, and according to the changes in the data, it can be judged what should be paid attention to in the previous process, such as: the degree of wear of the blade used to cut the product or the precision setting during cutting, etc. (That is, when the blade is first used, it is not worn out yet, so a lower precision can be set naturally. As the blade is used for a longer time, its degree of wear increases, and the precision setting must be relatively improved.) The present invention obtains data on two opposite sides at the same time, thereby speeding up the collection efficiency. According to the different positions of multiple objects to be tested in the tray, the present invention can simultaneously scan a whole row of objects to be tested without changing the distance between the two sensors.
請參閱第一圖至第五圖,其顯示出一種用以量測如第一圖所示的托盤10中的第一待測物11的線雷射量測系統20,其中第一待測物11具有如第三圖所示的厚度方向(Z軸方向)且包括第一切割面31、第二切割面32、第三切割面33及第四切割面34,第一及第二切割面31、32位於第一待測物11之相對二邊。線雷射量測系統20包括如第四圖所示的第一線雷射感測器41及第二線雷射感測器42以及分析及計算模組21。第一線雷射感測器41之第一位置為第一基準位,該第一位置位於第一待測物11之第一切割面31上方,第二線雷射感測器42位於第一待測物11之第二切割面32上方,且第一及第二線雷射感測器41、42被配置用以分別在第一及第二切割面31、32上方同時掃描而取得平行於該厚度方向的第一數據及第二數據。分析及計算模組21與第一及第二線雷射感測器41、42耦接,其中分析及計算模組21被配置用以根據該第一及該第二數據模擬第一待測物11的第一及第二切割面31,32以得到如第五圖所示的第一模擬切割面61及第二模擬切割面62。又第一及第二線雷射感測器41、42的移動方向MD為沿著待測物11的第一邊351及第二邊352的方向(即Y軸的方向),以取得第一及第二切割面31、32完整的數據資料。Please refer to the first to fifth figures, which show a line
在前述實施例中,線雷射量測系統20的第三及第四切割面33、34位於第一待測物11之相對二邊,第一線雷射感測器41之第二位置為第二基準位,該第二位置位於第一待測物11之第三切割面33上方,第二線雷射感測器42位於第一待測物11之第四切割面34上方,且第一及第二線雷射感測器41、42被配置用以分別在第三及第四切割面33、34上方掃描而取得第三及第四數據,第一及第二線雷射感測器41、42將沿著待測物11的第三邊353及第四邊354的方向(即X軸的方向)移動,以取得第三及第四切割面33、34完整的數據資料,且分析及計算模組21用以根據該第三及該第四數據模擬第一待測物11之第三及第四切割面33、34以得到第三模擬切割面63及第四模擬切割面64。In the above-mentioned embodiment, the third and
在前述各實施例中,線雷射量測系統20更包括與分析及計算模組21耦接的比對模組22,其中比對模組22被配置用以將第一及第二模擬切割面61,62或第三及第四模擬切割面63,64與第一待測物11之規格進行比對,俾判斷第一待測物11是否為不合格產品。In the aforementioned embodiments, the line
在前述各實施例中,線雷射量測系統20中各線雷射感測器41,42分別在各切割面31~34上打出線雷射30,就一般的超高精細線上(in-line)輪廓感測器而言,在每一道線雷射中的輪廓之數據數可高達3200個,各該第一至該第四數據分別包括在各切割面31~34上的複數點位之複數個高度,且分析及計算模組21用以依據該複數個高度決定各切割面31~34如第七圖所示的斜角線81,該複數點位之間具有一2.5μm之間距。第一待測物11為多邊形待測物,例如:載板或PCB,而在第一圖中雖以四邊形為例,但在實際的應用上,是可對應到特定多邊形的待測物件,而該載板是為了在未來裝上IC之前,所必經的製程之管控上做好量測,且IC通常是以覆晶方式連接於該載板上,第一及第二線雷射感測器41、42具有如第六圖所示各自的感測器模組71、72,感測器模組71、72用以感測該複數點位之該複數個高度。In the aforementioned embodiments, each
在前述各實施例中,線雷射量測系統20的第一待測物11更包括頂面82及底面83,斜角線81為在頂面82及底面83之間的連接線,且斜角線81與該厚度方向形成斜角θ,比對模組22用以判斷斜角θ是否符合該規格,而如第八圖中所示的理想切割面90即為一種90°的垂直面。In the aforementioned embodiments, the first object to be measured 11 of the line
在前述各實施例中,線雷射量測系統20的第一及第二線雷射感測器41、42以不同軸的定位方式裝設在支架73上,且在不改變第一及第二線雷射感測器41、42之間距下完成第一待測物11的掃描,並繼續進行第二待測物12的掃描。In the aforementioned embodiments, the first and second
按照一個主要技術的觀點來看,本發明即為一種用以量測待測物(例如:第一待測物11)的線雷射量測模組(例如:包括第一線雷射感測器41及感測器模組71的模組),其中該待測物包括切割面(例如:第一切割面31),且該線雷射量測模組包括線雷射感測器(例如:第一線雷射感測器41)。該線雷射感測器設置於該切割面上方,其中該線雷射感測器被配置用以對該切割面者發射線雷射30;取得該切割面之數據(例如:該第一數據);以及將該數據提供至分析及計算模組21,俾分析及計算模組21依據該數據模擬待測物11之該切割面以得到模擬切割面(例如:第一模擬切割面61)。From a main technical point of view, the present invention is a line laser measurement module (e.g., a module including a first
再從另一個可實施的角度來看,本發明可以涵蓋到一種線雷射模組,用以量測待測物11之平面(例如:第一切割面31)是否齊平,包括雷射發射器(例如:第一線雷射感測器41)、感測器模組71及分析及計算模組21。該雷射發射器設置於該平面之一邊(例如:第一邊351)之上,用以在垂直於該邊之方向上,發射雷射線(例如:線雷射30);感測器模組71用以同時感測該雷射發射器在相關於該平面之深度上之該雷射線之複數反射;以及分析及計算模組21用以分析及計算該複數反射以決定該平面是否為齊平平面。From another practicable perspective, the present invention may include a line laser module for measuring whether the plane (e.g., the first cutting surface 31) of the object to be measured 11 is flat, including a laser emitter (e.g., the first line laser sensor 41), a
本發明又可以為一種判斷待測物(例如:第一待測物11)的良率及切割精度設定方法,係使用線雷射量測系統20,其中線雷射量測系統20包括第一及第二線雷射感測器41、42、分析及計算模組21及比對模組22,且該方法包括由切割機(圖中未示出)切割待切物(例如:印刷電路板),得到複數個待測物;移動第一及第二線雷射感測器41、42至特定待測物(例如:第一待測物11)之上方;使第一及第二線雷射感測器41、42同時分別取得該特定待測物之第一及第二數據;由分析及計算模組21依據該第一及該第二數據模擬該特定待測物之第一及第二模擬切割面61、62;以及由比對模組22將第一及第二模擬切割面61、62與該特定待測物之規格進行比對,俾判斷該特定待測物是否為不合格產品。The present invention can also be a method for determining the yield and cutting accuracy of a test object (e.g., a first test object 11), using a line
在前述實施例中,該方法更包括第一及第二線雷射感測器41、42取得各該第一及該第二數據後,由分析及計算模組21模擬各該待測物之各該第一及各該第二模擬切割面61、62,並得到該切割機切割該待切物之如第九圖所示的模擬切割線101;以及由比對模組22依據模擬切割線101判斷該切割機之該切割精度。In the aforementioned embodiment, the method further includes that after the first and second
綜上所述,本發明揭露一種新穎的線雷射量測系統,經由第一及第二線雷射感測器的掃描,且使用的分析及計算模組能根據該第一及該第二數據模擬該第一待測物的該第一及該第二切割面,以得到第一及第二模擬切割面,是故具有產業價值,進而達成發展本案所預定之目的。In summary, the present invention discloses a novel line laser measurement system, which can simulate the first and second cutting surfaces of the first object to be measured according to the first and second data through scanning by the first and second line laser sensors, and obtain the first and second simulated cutting surfaces. Therefore, the system has industrial value and achieves the intended purpose of developing the present invention.
本案雖以較佳實施例揭露如上,然其並非用以限定本案的範圍,任何熟習此項技藝者,在不脫離本案之精神和範圍內所作之變動與修飾,皆應屬本案之涵蓋範圍。Although the present invention is disclosed as above with the preferred embodiments, it is not intended to limit the scope of the present invention. Any changes and modifications made by a person skilled in the art without departing from the spirit and scope of the present invention should fall within the scope of the present invention.
10:托盤 11:第一待測物
12:第二待測物 20:線雷射量測系統
21:分析及計算模組 22:比對模組
30:線雷射 31:第一切割面
32:第二切割面 33:第三切割面
34:第四切割面 351:第一邊
352:第二邊 353:第三邊
354:第四邊 41:第一線雷射感測器
42:第二線雷射感測器 61:第一模擬切割面
62:第二模擬切割面 MD:移動方向
63:第三模擬切割面 64:第四模擬切割面
71、72:感測器模組 73:支架
81:斜角線 82:頂面
83:底面 θ:角度
90:理想切割面 101:模擬切割線
10: tray 11: first object to be measured
12: second object to be measured 20: line laser measurement system
21: analysis and calculation module 22: comparison module
30: line laser 31: first cutting surface
32: second cutting surface 33: third cutting surface
34: fourth cutting surface 351: first side
352: second side 353: third side
354: fourth side 41: first line laser sensor
42: second line laser sensor 61: first simulated cutting surface
62: second simulated cutting surface MD: moving direction
63: third simulated cutting surface 64: fourth simulated
第一圖:是本發明之較佳實施例所用的托盤及其中的待測物之立體示意圖; 第二圖:是本發明較佳實施例的線雷射量測系統的架構示意圖; 第三圖:是第二圖中的線雷射量測系統之線雷射感測器打出一道線雷射的立體示意圖; 第四圖:是第二圖中的第一及第二線雷射感測器裝設在支架上之立體示意圖; 第五圖:是第一圖中的待測物之第一及第二模擬切割面的立體示意圖; 第六圖:是第四圖中的第一及第二線雷射感測器之仰視的立體示意圖; 第七圖:是位於第一圖中的待測物之頂面及底面間的斜角線之示意圖; 第八圖:是第一圖中的待測物之頂面及底面間的理想切割面之示意圖;以及 第九圖:是利用第二圖中的系統以獲得切割機之切割待切物的模擬切割線之示意圖。 Figure 1: is a three-dimensional schematic diagram of the tray used in the preferred embodiment of the present invention and the object to be tested therein; Figure 2: is a schematic diagram of the structure of the line laser measurement system of the preferred embodiment of the present invention; Figure 3: is a three-dimensional schematic diagram of the line laser sensor of the line laser measurement system in Figure 2 shooting a line laser; Figure 4: is a three-dimensional schematic diagram of the first and second line laser sensors in Figure 2 installed on the bracket; Figure 5: is a three-dimensional schematic diagram of the first and second simulated cutting surfaces of the object to be tested in Figure 1; Figure 6: is a three-dimensional schematic diagram of the first and second line laser sensors in Figure 4 viewed from above; Figure 7: is a schematic diagram of the oblique line between the top and bottom surfaces of the object to be tested in Figure 1; Figure 8: is a schematic diagram of the ideal cutting surface between the top and bottom surfaces of the object to be tested in Figure 1; and Figure 9: is a schematic diagram of using the system in Figure 2 to obtain a simulated cutting line of the object to be cut by the cutting machine.
11:第一待測物 11: The first object to be tested
30:線雷射 30: Line laser
31:第一切割面 31: First cutting surface
32:第二切割面 32: Second cutting surface
33:第三切割面 33: The third cutting surface
34:第四切割面 34: Fourth cutting surface
351:第一邊 351: First side
352:第二邊 352: Second side
353:第三邊 353: The third side
354:第四邊 354: The fourth side
41:第一線雷射感測器 41: First-line laser sensor
MD:移動方向 MD: moving direction
Claims (10)
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| TW113112494A TWI889269B (en) | 2024-04-02 | 2024-04-02 | Line laser measurement system and method for determining cutting yield and precision |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW113112494A TWI889269B (en) | 2024-04-02 | 2024-04-02 | Line laser measurement system and method for determining cutting yield and precision |
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| Publication Number | Publication Date |
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| TWI889269B true TWI889269B (en) | 2025-07-01 |
| TW202540600A TW202540600A (en) | 2025-10-16 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6219585B1 (en) * | 1994-07-21 | 2001-04-17 | Silvatech Corporation | Three dimensional log scanning device for a log positioning and saw system |
| US20040246473A1 (en) * | 2003-03-18 | 2004-12-09 | Hermary Terrance John | Coded-light dual-view profile scanning apparatus |
| CN110631519A (en) * | 2019-09-29 | 2019-12-31 | 东莞市庆颖智能自动化科技有限公司 | A kind of flatness and verticality detection equipment and detection method of solar crystal column |
| WO2020223594A2 (en) * | 2019-05-02 | 2020-11-05 | Kodak Alaris, Inc | Automated 360-degree dense point object inspection |
-
2024
- 2024-04-02 TW TW113112494A patent/TWI889269B/en active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6219585B1 (en) * | 1994-07-21 | 2001-04-17 | Silvatech Corporation | Three dimensional log scanning device for a log positioning and saw system |
| US20040246473A1 (en) * | 2003-03-18 | 2004-12-09 | Hermary Terrance John | Coded-light dual-view profile scanning apparatus |
| WO2020223594A2 (en) * | 2019-05-02 | 2020-11-05 | Kodak Alaris, Inc | Automated 360-degree dense point object inspection |
| CN110631519A (en) * | 2019-09-29 | 2019-12-31 | 东莞市庆颖智能自动化科技有限公司 | A kind of flatness and verticality detection equipment and detection method of solar crystal column |
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| Publication number | Publication date |
|---|---|
| TW202540600A (en) | 2025-10-16 |
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