TWI884610B - Vacuum negative pressure detection device for semiconductor packaging - Google Patents
Vacuum negative pressure detection device for semiconductor packaging Download PDFInfo
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Abstract
Description
本發明涉及一種半導體包裝的抽真空裝置,尤指一種半導體包裝的抽真空負壓檢知裝置。The present invention relates to a vacuum pumping device for semiconductor packaging, and more particularly to a vacuum pumping negative pressure detection device for semiconductor packaging.
傳統的半導體包裝技術,主要係以一抽真空裝置連接一真空產生設備及一半導體包裝產品,該真空產生設備透過該抽真空裝置對該半導體包裝產品進行抽真空。Traditional semiconductor packaging technology mainly uses a vacuum pumping device to connect a vacuum generating device and a semiconductor packaging product, and the vacuum generating device vacuumizes the semiconductor packaging product through the vacuum pumping device.
然而,該真空產生設備在每次啟動後均需運作一固定時間,而不同的半導體包裝產品所適用的壓力不盡相同,這導致該真空產生設備容易盲目抽真空,而造成內部產品損壞或該半導體包裝產品破裂。However, the vacuum generating device needs to operate for a fixed time each time it is started, and different semiconductor packaged products have different applicable pressures, which makes it easy for the vacuum generating device to blindly evacuate the product, thereby causing damage to the product inside or rupture of the semiconductor packaged product.
有鑑於上述現有技術的不足,本發明的主要目的在於提供一種半導體包裝的抽真空負壓檢知裝置,其改良半導體包裝的抽真空裝置的構造及技術,以避免盲目抽真空而造成半導體包裝產品破裂。In view of the above-mentioned shortcomings of the prior art, the main purpose of the present invention is to provide a vacuum negative pressure detection device for semiconductor packaging, which improves the structure and technology of the vacuum device for semiconductor packaging to avoid blind vacuuming and causing the semiconductor package product to rupture.
為達成上述目的,本發明所採取的主要技術手段係令前述半導體包裝的抽真空負壓檢知裝置包括: 一本體,係具有一內部空間; 一抽真空模組,設在該本體上; 一管體,係於同一軸向上具有一第一開口及一第二開口,該第一開口與該本體連接,該管體的第一開口及第二開口之間的內部具有一第一通道及一第二通道,該第一通道與該本體的內部空間連通,該第二通道係貫穿該本體; 一檢知模組,設在該本體上,並與該管體的第二通道連接。 To achieve the above-mentioned purpose, the main technical means adopted by the present invention is to make the vacuum negative pressure detection device of the above-mentioned semiconductor package include: A body, which has an internal space; A vacuum module, which is arranged on the body; A tube, which has a first opening and a second opening in the same axial direction, the first opening is connected to the body, and the interior between the first opening and the second opening of the tube has a first channel and a second channel, the first channel is connected to the internal space of the body, and the second channel penetrates the body; A detection module, which is arranged on the body and connected to the second channel of the tube.
本發明透過上述構造,當使用於一半導體包裝產品,藉由該管體的第一通道、該本體的內部空間及該抽真空模組對該半導體包裝產品進行抽真空,該半導體包裝產品內的氣流直接通過該第二通道至該檢知模組,可藉由該檢知模組檢知到異常,以達到避免盲目抽真空而造成半導體包裝產品破裂之目的。Through the above structure, the present invention is used for semiconductor packaged products. The semiconductor packaged products are evacuated through the first channel of the tube, the internal space of the main body and the vacuum module. The airflow in the semiconductor packaged product directly passes through the second channel to the detection module. The detection module can detect abnormalities, thereby achieving the purpose of avoiding blind vacuuming and causing the semiconductor packaged products to rupture.
關於本發明之實施例,提供一種半導體包裝的抽真空負壓檢知裝置,請同時參閱圖1及圖2,其中包括一本體10、一抽真空模組20、一管體30及一檢知模組40,該抽真空模組20、該管體30及該檢知模組40設置在該本體10上;該本體10具有一內部空間11;該管體30係於同一軸向上的前後相對兩端形成一第一開口301及一第二開口302,其中該第一開口301與該本體10連接,並與該內部空間11連通,該管體30的第一開口301及第二開口302之間的內部具有一第一通道C1及一第二通道C2,該第一通道C1與該內部空間11連通;該第二通道C2係貫穿該本體10,且該第二通道C2與該內部空間11係不連通;該檢知模組40與該管體30的第二通道C2連接。In an embodiment of the present invention, a semiconductor package vacuum negative pressure detection device is provided. Please refer to FIG. 1 and FIG. 2 at the same time, which includes a body 10, a vacuum module 20, a tube 30 and a detection module 40. The vacuum module 20, the tube 30 and the detection module 40 are arranged on the body 10; the body 10 has an internal space 11; the tube 30 is formed with a first opening 301 and a second opening at the front and rear opposite ends in the same axial direction. 302, wherein the first opening 301 is connected to the body 10 and communicates with the internal space 11, the interior between the first opening 301 and the second opening 302 of the tube body 30 has a first channel C1 and a second channel C2, the first channel C1 is communicated with the internal space 11; the second channel C2 penetrates the body 10, and the second channel C2 is not connected to the internal space 11; the detection module 40 is connected to the second channel C2 of the tube body 30.
因此,本發明藉由前述結構,當使用於一半導體包裝產品,藉由該管體30的第一通道C1、該本體10的內部空間11及該抽真空模組20對該半導體包裝產品進行抽真空,而該半導體包裝產品內的氣流將直接通過該第二通道C2至該檢知模組40,可藉由該檢知模組40檢知到異常,避免盲目抽真空而造成半導體包裝產品破裂。Therefore, the present invention, through the aforementioned structure, when used for semiconductor packaged products, vacuum is performed on the semiconductor packaged product through the first channel C1 of the tube 30, the internal space 11 of the main body 10 and the vacuum module 20, and the airflow in the semiconductor packaged product will directly pass through the second channel C2 to the detection module 40, and the abnormality can be detected by the detection module 40, thereby avoiding blind vacuuming and causing the semiconductor packaged product to rupture.
如圖1及圖2所示,在本實施例中,該本體10係呈一矩形,並具有一頂側12、一前側13及一後側14,該抽真空模組20、該管體30及該檢知模組40係分別設置在該本體10的頂側12、前側13及後側14上,該本體10的頂側12、前側13及後側14分別形成一開口,該等開口分別位於該頂側12、該前側13及該後側14的居中位置,並且,該等開口均與該內部空間11連通,該抽真空模組20係與該本體10的頂側12開口相套接,並與該本體10的內部空間11連通。在本實施例中,該管體30的第一開口301係與該本體10的前側13開口相套接,該管體30的第二通道C2係同時貫穿該本體10的前側13開口及該後側14開口,以與該檢知模組40連接。As shown in FIG. 1 and FIG. 2 , in this embodiment, the main body 10 is rectangular and has a top side 12, a front side 13 and a rear side 14. The vacuum module 20, the tube body 30 and the detection module 40 are respectively disposed on the top side 12, the front side 13 and the rear side 14 of the main body 10. The front side 13 and the rear side 14 form an opening respectively, and the openings are respectively located at the center of the top side 12, the front side 13 and the rear side 14, and the openings are all connected to the internal space 11. The vacuum module 20 is connected to the opening of the top side 12 of the body 10 and is connected to the internal space 11 of the body 10. In this embodiment, the first opening 301 of the tube 30 is connected to the opening of the front side 13 of the body 10, and the second channel C2 of the tube 30 passes through the opening of the front side 13 and the opening of the rear side 14 of the body 10 at the same time to connect with the detection module 40.
請參閱圖2,在本實施例中,該管體30進一步包括一中空的外管31及一中空的內管32,該外管31設置在該本體10的前側13上,該內管32穿設在該外管31內,在本實施例中,該外管31與該內管32係可由一體射出成型或由一金屬射出成型。Please refer to Figure 2. In this embodiment, the tube body 30 further includes a hollow outer tube 31 and a hollow inner tube 32. The outer tube 31 is arranged on the front side 13 of the main body 10, and the inner tube 32 is inserted into the outer tube 31. In this embodiment, the outer tube 31 and the inner tube 32 can be formed by integral injection molding or by metal injection molding.
在本實施例中,該外管31具有一第一段311及一第二段312,該第一段311及該第二段312分別具有相對的一前端及一後端,該第一段311的前端與該第二段312的後端連接,該第一段311的後端與該本體10的前側13開口相套接。在本實施例中,該外管31的第一段311的後端形成有一開口,該開口係構成前述該管體30的第一開口301。In this embodiment, the outer tube 31 has a first section 311 and a second section 312. The first section 311 and the second section 312 have a front end and a rear end opposite to each other. The front end of the first section 311 is connected to the rear end of the second section 312. The rear end of the first section 311 is sleeved with the opening of the front side 13 of the body 10. In this embodiment, the rear end of the first section 311 of the outer tube 31 is formed with an opening, which constitutes the first opening 301 of the tube body 30.
如圖2及圖3所示,在本實施例中,該內管32亦具有相對的一前端及一後端,在本實施例中,該內管32的前端係可與該外管31的第二段312的前端齊平;但進一步的,在本實施例中該內管32的前端及後端係可分別凸伸且外露在該外管31之外,且該內管32的後端貫穿該本體10的前側13開口及後側14開口。在本實施例中,該內管32的前端形成有另一開口,並由該內管32前端的開口與該外管31的第二段312的前端構成該管體30的第二開口302。As shown in FIG. 2 and FIG. 3 , in this embodiment, the inner tube 32 also has a front end and a rear end opposite to each other. In this embodiment, the front end of the inner tube 32 can be flush with the front end of the second section 312 of the outer tube 31; but further, in this embodiment, the front end and the rear end of the inner tube 32 can protrude and be exposed outside the outer tube 31, and the rear end of the inner tube 32 passes through the front opening 13 and the rear opening 14 of the body 10. In this embodiment, the front end of the inner tube 32 is formed with another opening, and the opening at the front end of the inner tube 32 and the front end of the second section 312 of the outer tube 31 constitute the second opening 302 of the tube body 30.
在本實施例中,該第一通道C1係由該外管31至該內管32之間所構成,該第二通道C2係由該內管32的內部所構成,本發明在使用時係透過將該外管31的第二段312及該內管32的前端放置於該半導體包裝產品內,藉由該外管31及該內管32之間的第一通道C1、該本體10的內部空間11及該抽真空模組20進行抽真空,同時,該半導體包裝產品內的氣流將直接通過該內管32內的第二通道C2至該檢知模組40,並藉由該檢知模組40檢知到異常,可以預先處理,避免盲目抽真空而造成半導體包裝產品破裂。In this embodiment, the first channel C1 is formed between the outer tube 31 and the inner tube 32, and the second channel C2 is formed by the inside of the inner tube 32. When the present invention is used, the second section 312 of the outer tube 31 and the front end of the inner tube 32 are placed in the semiconductor packaged product, and vacuum is performed through the first channel C1 between the outer tube 31 and the inner tube 32, the internal space 11 of the main body 10 and the vacuum module 20. At the same time, the airflow in the semiconductor packaged product will directly pass through the second channel C2 in the inner tube 32 to the detection module 40, and the abnormality is detected by the detection module 40, which can be processed in advance to avoid blind vacuuming and causing the semiconductor packaged product to rupture.
如圖2及圖3所示,在本實施例中,進一步提供一前保護單元50,該前保護單元50設置在該本體10的前側13上,且該前保護單元50內形成有一通孔,該前保護單元50透過該通孔套設在該外管31上,該前保護單元50係用以保護該外管31,以避免該外管31受外力撞擊而斷裂。As shown in FIG. 2 and FIG. 3 , in the present embodiment, a front protection unit 50 is further provided. The front protection unit 50 is disposed on the front side 13 of the main body 10, and a through hole is formed in the front protection unit 50. The front protection unit 50 is sleeved on the outer tube 31 through the through hole. The front protection unit 50 is used to protect the outer tube 31 to prevent the outer tube 31 from being broken by external force.
如圖2及圖3所示,在本實施例中,該檢知模組40包括一後保護單元41及一連接端子42,該後保護單元41設置在該本體10的後側14上,該連接端子42設置在該後保護單元41上,該後保護單元41具有相對的一前側及一後側,該後保護單元41的前側鄰近該本體10的後側14,該後保護單元41的前側形成有一連接通孔,該後保護單元41的後側形成有一連接口,該連接通孔與該連接口連通,該後保護單元41透過前側的該連接通孔套設在該內管32的後端上,並且,該連接端子42與該連接口相套接,以令該內管32內的第二通道C2與該連接端子42連通。在本實施例中,該後保護單元41係用以保護該內管32,以避免該內管32受外力撞擊而斷裂。As shown in FIG. 2 and FIG. 3, in this embodiment, the detection module 40 includes a rear protection unit 41 and a connection terminal 42. The rear protection unit 41 is disposed on the rear side 14 of the body 10, and the connection terminal 42 is disposed on the rear protection unit 41. The rear protection unit 41 has a front side and a rear side opposite to each other. The front side of the rear protection unit 41 is adjacent to the rear side 14 of the body 10. The front side of the rear protection unit 41 is formed with a connection hole, and the rear side of the rear protection unit 41 is formed with a connection port, the connection hole is connected with the connection port, the rear protection unit 41 is sleeved on the rear end of the inner tube 32 through the connection hole on the front side, and the connection terminal 42 is sleeved with the connection port to make the second channel C2 in the inner tube 32 connected with the connection terminal 42. In this embodiment, the rear protection unit 41 is used to protect the inner tube 32 to prevent the inner tube 32 from being broken by external impact.
如圖3所示,在本實施例中,進一步提供一前密封圈60及一後密封圈61,該前密封圈60套設在該外管31上,並位在該前保護單元50及該本體10之間,該後密封圈61套設在該內管32上,並位在該後保護單元41及該本體10之間,該前密封圈60及該後密封圈61係用以防止外部空氣進入該本體10的內部空間11,可提升本發明的抽真空效果。As shown in FIG. 3 , in the present embodiment, a front sealing ring 60 and a rear sealing ring 61 are further provided. The front sealing ring 60 is sleeved on the outer tube 31 and is located between the front protection unit 50 and the main body 10. The rear sealing ring 61 is sleeved on the inner tube 32 and is located between the rear protection unit 41 and the main body 10. The front sealing ring 60 and the rear sealing ring 61 are used to prevent external air from entering the internal space 11 of the main body 10, thereby enhancing the vacuuming effect of the present invention.
請同時參閱圖2及圖5,進一步在本實施例中,該外管31的第一段311的具體形狀係呈圓筒狀,該外管31的第二段312的具體形狀係呈鴨嘴狀,如此結構設計係能增加該外管31的耐壓性,亦令該外管31具有良好的抽真空效果。如圖4及圖5所示,在本實施例中,該第一通道C1係由該外管31的內壁面至該內管32的外壁面之間形成一第一間距及一第二間距所構成,該第一間距為垂直方向的距離,該第二間距為水平方向的距離,當該外管31呈鴨嘴狀,則該第二間距的距離大於該第一間距的距離;該第二通道C2係由該內管32的內徑所構成。Please refer to FIG. 2 and FIG. 5 at the same time. Further, in this embodiment, the specific shape of the first section 311 of the outer tube 31 is cylindrical, and the specific shape of the second section 312 of the outer tube 31 is duck-billed. Such a structural design can increase the pressure resistance of the outer tube 31 and also make the outer tube 31 have a good vacuum effect. As shown in FIG. 4 and FIG. 5, in this embodiment, the first channel C1 is formed by a first distance and a second distance formed between the inner wall surface of the outer tube 31 and the outer wall surface of the inner tube 32. The first distance is the distance in the vertical direction, and the second distance is the distance in the horizontal direction. When the outer tube 31 is duck-billed, the distance of the second distance is greater than the distance of the first distance; the second channel C2 is formed by the inner diameter of the inner tube 32.
如圖5所示,在本實施例中,進一步提供一第一連接部70及一第二連接部71,該本體10進一步具有一右側15及一左側16,該第一連接部70及該第二連接部71分別設置在該本體10的右側15及左側16上,該第一連接部70及該第二連接部71係用以與一機台連接,以令本發明設置在該機台上。在本實施例中,該第一連接部70及該第二連接部71可透過多數螺絲與該機台進行鎖固。As shown in FIG. 5 , in this embodiment, a first connection portion 70 and a second connection portion 71 are further provided. The body 10 further has a right side 15 and a left side 16. The first connection portion 70 and the second connection portion 71 are respectively disposed on the right side 15 and the left side 16 of the body 10. The first connection portion 70 and the second connection portion 71 are used to connect to a machine so that the present invention is disposed on the machine. In this embodiment, the first connection portion 70 and the second connection portion 71 can be locked with the machine through a plurality of screws.
為說明本發明之實施例的具體應用方式,請參考圖6所示,進一步提供一調控模組80及一真空產生器90,該調控模組80連接該檢知模組40的連接端子42及該真空產生器90,該真空產生器90連接該抽真空模組20,在本實施例中,該抽真空模組20係為一氣閥,該真空產生器90係透過該第一通道C1、該內部空間11及該氣閥抽取該半導體包裝產品內的空氣。在本實施例中,該調控模組80包括一檢測器81及一電控比例閥82,該檢測器81連接該檢知模組40的連接端子42及該電控比例閥82,該電控比例閥82連接該真空產生器90。To illustrate the specific application of the embodiment of the present invention, please refer to FIG. 6 , further providing a control module 80 and a vacuum generator 90, the control module 80 is connected to the connection terminal 42 of the detection module 40 and the vacuum generator 90, the vacuum generator 90 is connected to the vacuum pumping module 20, in this embodiment, the vacuum pumping module 20 is a gas valve, the vacuum generator 90 extracts the air in the semiconductor packaged product through the first channel C1, the internal space 11 and the gas valve. In this embodiment, the control module 80 includes a detector 81 and an electric control proportional valve 82, the detector 81 is connected to the connection terminal 42 of the detection module 40 and the electric control proportional valve 82, the electric control proportional valve 82 is connected to the vacuum generator 90.
該檢測器81根據來自該半導體包裝產品內的氣流產生一檢測訊號,並且,當該檢測器81判斷該檢測訊號超過一預設閾值時,該檢測器81傳送一控制訊號至該電控比例閥82,該電控比例閥82根據該控制訊號調控該真空產生器90,以達到最佳抽真空狀態的一壓力值。藉由該調控模組80及該真空產生器90,可適應不同之半導體包裝產品所適用的壓力,以在使用本發明時大幅減少半導體包裝產品破裂的機會。The detector 81 generates a detection signal according to the airflow from the semiconductor packaged product, and when the detector 81 determines that the detection signal exceeds a preset threshold, the detector 81 transmits a control signal to the electronic proportional valve 82, and the electronic proportional valve 82 adjusts the vacuum generator 90 according to the control signal to achieve a pressure value of the optimal vacuum state. The control module 80 and the vacuum generator 90 can adapt to the pressure applicable to different semiconductor packaged products, so as to greatly reduce the chance of semiconductor packaged products breaking when using the present invention.
10:本體 11:內部空間 12:頂側 13:前側 14:後側 15:右側 16:左側 20:抽真空模組 30:管體 301:第一開口 302:第二開口 31:外管 311:第一段 312:第二段 32:內管 40:檢知模組 41:後保護單元 42:連接端子 50:前保護單元 60:前密封圈 61:後密封圈 70:第一連接部 71:第二連接部 80:調控模組 81:檢測器 82:電控比例閥 90:真空產生器 C1:第一通道 C2:第二通道 10: Main body 11: Internal space 12: Top side 13: Front side 14: Back side 15: Right side 16: Left side 20: Vacuum module 30: Tube body 301: First opening 302: Second opening 31: Outer tube 311: First section 312: Second section 32: Inner tube 40: Detection module 41: Rear protection unit 42: Connection terminal 50: Front protection unit 60: Front sealing ring 61: Rear sealing ring 70: First connection part 71: Second connection part 80: Control module 81: Detector 82: Electronic proportional valve 90: Vacuum generator C1: First channel C2: Second channel
圖1 係本發明之抽真空負壓檢知裝置的實施例的立體圖。 圖2 係本發明的實施例圖1的A-A’側剖面示意圖。 圖3 係本發明的實施例圖2中C部分的局部放大圖。 圖4 係本發明的實施例圖2中D部分的局部放大圖。 圖5 係本發明的實施例圖1的B-B’前剖面示意圖。 圖6 係本發明的實施例之應用狀態的方塊圖。 Figure 1 is a three-dimensional diagram of an embodiment of the vacuum negative pressure detection device of the present invention. Figure 2 is a schematic diagram of the A-A’ side section of the embodiment of Figure 1 of the present invention. Figure 3 is a partial enlarged view of the C part in the embodiment of Figure 2 of the present invention. Figure 4 is a partial enlarged view of the D part in the embodiment of Figure 2 of the present invention. Figure 5 is a schematic diagram of the B-B’ front section of the embodiment of Figure 1 of the present invention. Figure 6 is a block diagram of the application state of the embodiment of the present invention.
10:本體 10: Body
12:頂側 12: Top side
13:前側 13:Front side
14:後側 14: Back side
20:抽真空模組 20: Vacuum module
30:管體 30: Tube body
302:第二開口 302: Second opening
40:檢知模組 40: Detection module
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| TW112146638A TWI884610B (en) | 2023-11-30 | 2023-11-30 | Vacuum negative pressure detection device for semiconductor packaging |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20180346167A1 (en) * | 2017-06-02 | 2018-12-06 | Multivac Sepp Haggenmüller Se & Co. Kg | Tray sealer |
| CN214566410U (en) * | 2021-01-18 | 2021-11-02 | 深圳市帝拓电子有限公司 | Vacuum device capable of automatically taking off line |
| TWM654500U (en) * | 2023-11-30 | 2024-04-21 | 易發精機股份有限公司 | Vacuum evacuation and negative pressure detection device for semiconductor packaging |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20180346167A1 (en) * | 2017-06-02 | 2018-12-06 | Multivac Sepp Haggenmüller Se & Co. Kg | Tray sealer |
| CN214566410U (en) * | 2021-01-18 | 2021-11-02 | 深圳市帝拓电子有限公司 | Vacuum device capable of automatically taking off line |
| TWM654500U (en) * | 2023-11-30 | 2024-04-21 | 易發精機股份有限公司 | Vacuum evacuation and negative pressure detection device for semiconductor packaging |
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