TWI882827B - Tin-based alloy and tin ball - Google Patents
Tin-based alloy and tin ball Download PDFInfo
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Abstract
一種錫基合金,包含以錫基合金的總量為100wt%計,2wt%至5wt%的銀、0.1wt%至2wt%的鉍、0.02wt%至0.07wt%的鎳、0.002wt%至0.006wt%的磷及餘量的錫;且錫基合金不包含鉛、銅及鍺。本發明還提供一種由錫基合金所形成的錫球。本發明錫基合金在不含鉛、銅及鍺的情形下,透過2wt%至5wt%的銀、0.1wt%至2wt%的鉍、0.02wt%至0.07wt%的鎳、0.002wt%至0.006wt%的磷及餘量的錫的相互配合,讓由錫基合金所形成的本發明錫球具有良好抗氧化性;錫球經多次迴焊形成的焊點中僅有一層的界金屬層,從而焊點不易發生電連接失效;焊點具有良好甚至極佳的界面斷裂型態,且保有一定水準以上的熱疲勞抗性,從而焊點具有高可靠度。A tin-based alloy comprises, based on 100 wt% of the total amount of the tin-based alloy, 2 wt% to 5 wt% of silver, 0.1 wt% to 2 wt% of bismuth, 0.02 wt% to 0.07 wt% of nickel, 0.002 wt% to 0.006 wt% of phosphorus, and the remainder of tin; and the tin-based alloy does not contain lead, copper, and germanium. The present invention also provides a tin ball formed of the tin-based alloy. The tin-based alloy of the present invention does not contain lead, copper and germanium. Through the coordination of 2wt% to 5wt% of silver, 0.1wt% to 2wt% of bismuth, 0.02wt% to 0.07wt% of nickel, 0.002wt% to 0.006wt% of phosphorus and the remainder of tin, the tin ball of the present invention formed by the tin-based alloy has good oxidation resistance. The solder joint formed by the tin ball after multiple reflows has only one intermetallic layer, so that the solder joint is not prone to electrical connection failure. The solder joint has good or even excellent interface fracture morphology and maintains a certain level of thermal fatigue resistance, so that the solder joint has high reliability.
Description
本發明是有關於一種用於焊接的合金,特別是指一種不包含鉛、銅及鍺的錫基合金,以及由該錫基合金所形成的錫球。The present invention relates to an alloy for soldering, in particular to a tin-based alloy that does not contain lead, copper and germanium, and a tin ball formed from the tin-based alloy.
台灣專利公告第789165號揭示一種無鉛無銅錫合金,以該無鉛無銅錫合金的總重為100wt%計,該無鉛無銅錫合金包含0.01wt%至3.0wt%的銀(Ag)、2.0wt%至3.0wt%的鉍(Bi)、0wt%至2.0wt%的銻(Sb)、0.005wt%至0.1wt%的鎳(Ni)、0.005wt%至0.02wt%的鍺(Ge)及餘量的錫(Sn)。該無鉛無銅錫合金因為包含上述成分及對應的重量百分比範圍,所以該無鉛無銅錫合金經焊接形成的焊錫凸塊(亦稱焊點)同時具備良好的機械衝擊可靠度、焊接性、延展性、抗氧化能力及冷熱循環可靠度(即熱疲勞抗性)。Taiwan Patent Publication No. 789165 discloses a lead-free copper-free tin alloy. Based on the total weight of the lead-free copper-free tin alloy being 100wt%, the lead-free copper-free tin alloy comprises 0.01wt% to 3.0wt% of silver (Ag), 2.0wt% to 3.0wt% of bismuth (Bi), 0wt% to 2.0wt% of antimony (Sb), 0.005wt% to 0.1wt% of nickel (Ni), 0.005wt% to 0.02wt% of germanium (Ge), and the remainder of tin (Sn). Because the lead-free copper-free tin alloy contains the above-mentioned components and the corresponding weight percentage ranges, the solder bump (also called solder joint) formed by welding the lead-free copper-free tin alloy has good mechanical impact reliability, weldability, ductility, oxidation resistance and thermal cycle reliability (i.e. thermal fatigue resistance).
因此,本發明的第一目的,即在提供一種有別於該無鉛無銅錫合金且組成新穎的錫基合金。Therefore, the first object of the present invention is to provide a tin-based alloy that is different from the lead-free and copper-free tin alloy and has a novel composition.
於是,本發明錫基合金包含以該錫基合金的總量為100wt%計,2wt%至5wt%的銀、0.1wt%至2wt%的鉍、0.02wt%至0.07wt%的鎳、0.002wt%至0.006wt%的磷及餘量的錫;且該錫基合金不包含鉛、銅及鍺。Therefore, the tin-based alloy of the present invention comprises, based on 100wt% of the total amount of the tin-based alloy, 2wt% to 5wt% of silver, 0.1wt% to 2wt% of bismuth, 0.02wt% to 0.07wt% of nickel, 0.002wt% to 0.006wt% of phosphorus, and the balance of tin; and the tin-based alloy does not contain lead, copper, and germanium.
本發明的第二目的,即在提供一種錫球。The second object of the present invention is to provide a solder ball.
於是,本發明錫球是由如上所述的錫基合金所形成。Therefore, the tin ball of the present invention is formed from the tin-based alloy as described above.
本發明的功效在於:本發明錫基合金在不含鉛、銅及鍺的情形下,透過2wt%至5wt%的銀、0.1wt%至2wt%的鉍、0.02wt%至0.07wt%的鎳、0.002wt%至0.006wt%的磷及餘量的錫的相互配合,讓由該錫基合金所形成的本發明錫球具有良好的抗氧化性;該錫球經多次迴焊形成的一焊點中僅有一層的界金屬層,從而該焊點不易發生電連接失效;該焊點具有良好甚至極佳界面斷裂型態,且保有一定水準以上的熱疲勞抗性,從而該焊點具有高可靠度。The efficacy of the present invention is that: the tin-based alloy of the present invention does not contain lead, copper and germanium, but through the cooperation of 2wt% to 5wt% of silver, 0.1wt% to 2wt% of bismuth, 0.02wt% to 0.07wt% of nickel, 0.002wt% to 0.006wt% of phosphorus and the balance of tin, the tin ball of the present invention formed by the tin-based alloy has good oxidation resistance; a solder joint formed by the tin ball after multiple reflows has only one intermetallic layer, so that the solder joint is not prone to electrical connection failure; the solder joint has a good or even excellent interface fracture morphology, and maintains a certain level of thermal fatigue resistance, so that the solder joint has high reliability.
本發明錫基合金包含以該錫基合金的總量為100wt%計,2wt%至5wt%的銀(Ag)、0.1wt%至2wt%的鉍(Bi)、0.02wt%至0.07wt%的鎳(Ni)、0.002wt%至0.006wt%的磷(P)及餘量的錫(Sn);且該錫基合金不包含鉛(Pb)、銅(Cu)及鍺(Ge)。The tin-based alloy of the present invention comprises, based on 100wt% of the total amount of the tin-based alloy, 2wt% to 5wt% of silver (Ag), 0.1wt% to 2wt% of bismuth (Bi), 0.02wt% to 0.07wt% of nickel (Ni), 0.002wt% to 0.006wt% of phosphorus (P), and the balance of tin (Sn); and the tin-based alloy does not contain lead (Pb), copper (Cu) and germanium (Ge).
本發明錫球是由該錫基合金所形成,該錫球適用於將一電子元件焊接至一焊墊(例如鎳金基板或銅基板)上而於該電子元件及該焊墊間形成電導通的一焊點。在某些實施態樣中,該錫球的直徑範圍例如但不限於0.05mm至1mm,適用於各種積體電路封裝製程。The solder ball of the present invention is formed by the tin-based alloy, and the solder ball is suitable for soldering an electronic component to a solder pad (such as a nickel-gold substrate or a copper substrate) to form an electrically conductive solder joint between the electronic component and the solder pad. In some embodiments, the diameter of the solder ball ranges from, for example but not limited to, 0.05 mm to 1 mm, and is suitable for various integrated circuit packaging processes.
於本發明,是透過對該錫球進行高溫烘烤測試及高溫高濕測試,從而獲取該錫球的抗氧化性的「良好、尚可及不佳」的評價結果。於本發明,是透過將該錫球與該焊墊進行多次(具體為三次)迴焊形成一焊點,再對該焊點進行推力試驗及溫度循環試驗,從而獲取該焊點的界面斷裂型態及熱疲勞抗性的「極佳、良好、尚可及不佳」的評價結果。In the present invention, the solder ball is subjected to a high temperature baking test and a high temperature and high humidity test, thereby obtaining an evaluation result of "good, acceptable, and poor" for the oxidation resistance of the solder ball. In the present invention, the solder ball and the solder pad are reflowed multiple times (specifically three times) to form a solder joint, and then the solder joint is subjected to a thrust test and a temperature cycle test, thereby obtaining an evaluation result of "excellent, good, acceptable, and poor" for the interface fracture morphology and thermal fatigue resistance of the solder joint.
以下就各成分及含量進行詳細說明。The following is a detailed description of each ingredient and content.
以該錫基合金的總量為100wt%計,該銀的含量範圍介於2wt%至5wt%間,讓該錫基合金形成的該焊點具有良好甚至極佳的焊接強度及界面斷裂型態,及尚可程度以上的熱疲勞抗性。Based on 100wt% of the total amount of the tin-based alloy, the content of the silver is in the range of 2wt% to 5wt%, so that the solder joint formed by the tin-based alloy has good or even excellent soldering strength and interface fracture morphology, and thermal fatigue resistance above a fair level.
以該錫基合金的總量為100wt%計,該鉍的含量範圍介於0.1wt%至2wt%間,讓該錫基合金形成的該焊點具有良好甚至極佳的硬度、焊接強度及界面斷裂型態,及尚可程度以上的熱疲勞抗性。且本發明錫基合金藉由包含含量範圍為0.1wt%至2wt%的該鉍但不包含該銅,讓本發明錫基合金的熔點與業界通用的錫銀銅合金(具體為SAC105~405)的熔點(約217℃)相近,從而讓該錫基合金適用於該錫銀銅合金的迴焊曲線,該錫基合金在使用上無須重新調校迴焊曲線,因此不會產生因調校迴焊曲線而衍生的生產成本。在某些實施態樣中,該錫基合金的熔點範圍為210℃至222℃。Based on 100wt% of the total amount of the tin-based alloy, the content of the bismuth is in the range of 0.1wt% to 2wt%, so that the solder joint formed by the tin-based alloy has good or even excellent hardness, welding strength and interface fracture morphology, and thermal fatigue resistance above a fair level. The tin-based alloy of the present invention includes bismuth in a content range of 0.1wt% to 2wt% but does not include copper, so that the melting point of the tin-based alloy of the present invention is close to the melting point (about 217°C) of the tin-silver-copper alloy commonly used in the industry (specifically SAC105~405), so that the tin-based alloy is suitable for the reflow curve of the tin-silver-copper alloy. The tin-based alloy does not need to re-adjust the reflow curve during use, so there is no production cost derived from adjusting the reflow curve. In some embodiments, the melting point of the tin-based alloy ranges from 210°C to 222°C.
以該錫基合金的總量為100wt%計,該鎳的含量範圍介於0.02wt%至0.07wt%間,讓該錫基合金形成的該焊點具有良好甚至極佳的焊接強度及界面斷裂型態,及尚可程度以上的熱疲勞抗性。Based on 100wt% of the total amount of the tin-based alloy, the nickel content ranges from 0.02wt% to 0.07wt%, so that the solder joint formed by the tin-based alloy has good or even excellent welding strength and interface fracture morphology, and thermal fatigue resistance above a fair level.
以該錫基合金的總量為100wt%計,該磷的含量範圍介於0.002wt%至0.006wt%間,讓該錫基合金形成的該錫球具有緻密性高的抗氧化層,以避免該錫球被外界氧氣氧化而形成SnO及SnO 2組成的氧化層,從而讓該錫球在高溫環境下具備良好的抗氧化性(亦稱抗色變能力)。 Taking the total amount of the tin-based alloy as 100wt%, the phosphorus content ranges from 0.002wt% to 0.006wt%, so that the tin ball formed by the tin-based alloy has a dense anti-oxidation layer to prevent the tin ball from being oxidized by external oxygen to form an oxide layer composed of SnO and SnO2 , thereby allowing the tin ball to have good oxidation resistance (also known as anti-color change ability) in a high temperature environment.
在某些實施態樣中,該錫基合金還包含含量範圍為0.2wt%至1.5wt%的銦(In)。以該錫基合金的總量為100wt%計,該銦的含量範圍介於0.2wt%至1.5wt%間,讓該錫基合金形成的該焊點具有更優異的硬度、焊接強度、界面斷裂型態及熱疲勞抗性。In some embodiments, the tin-based alloy further comprises indium (In) in a content range of 0.2wt% to 1.5wt%. Taking the total amount of the tin-based alloy as 100wt%, the content of the indium is in a range of 0.2wt% to 1.5wt%, so that the solder joint formed by the tin-based alloy has better hardness, welding strength, interface fracture morphology and thermal fatigue resistance.
在積體電路封裝領域中,通常會使用該錫銀銅合金製成的一錫球在一焊墊(例如鎳金基板或銅基板)上進行多次迴焊以形成一焊錫凸塊,當該焊墊為一鎳基板時,該焊錫凸塊中的界金屬化合物包括(CuNi) 6Sn 5及(NiCu) 3Sn 4,所以該焊錫凸塊中會有兩層的界金屬層;當該焊墊為一銅基板時,該焊錫凸塊中的界金屬化合物包括Cu 6Sn 5及Cu 3Sn,所以該焊錫凸塊中會有兩層的界金屬層。由於上述兩種焊錫凸塊中的界金屬層均存在不只一層的情形,很容易因銅濃度效應(Cu concentration effect),而發生其中一層脫離以致該等焊錫凸塊電連接失效。由本發明錫基合金所形成的該錫球於該焊墊上多次迴焊形成的一焊點中僅有一層的界金屬層,從而該焊點不易發生電連接失效的狀況。更具體地說,比如當該焊墊為一鎳金基板時,所形成的一焊點中只有一層由Ni 3Sn 4所形成的界金屬層,如圖1所示。又例如當該焊墊為一銅基板時,所形成的一焊點中只有一層由(CuNi) 6Sn 5所形成的界金屬層,如圖2所示。 In the field of integrated circuit packaging, a solder ball made of the tin-silver-copper alloy is usually used to perform multiple reflows on a solder pad (such as a nickel-gold substrate or a copper substrate) to form a solder bump. When the solder pad is a nickel substrate, the intermetallic compounds in the solder bump include (CuNi) 6 Sn 5 and (NiCu) 3 Sn 4 , so there will be two intermetallic layers in the solder bump; when the solder pad is a copper substrate, the intermetallic compounds in the solder bump include Cu 6 Sn 5 and Cu 3 Sn, so there will be two intermetallic layers in the solder bump. Since there are more than one intermetallic layer in the above two types of solder bumps, it is easy for one layer to be detached due to the Cu concentration effect, resulting in electrical connection failure of the solder bumps. The solder ball formed by the tin-based alloy of the present invention has only one intermetallic layer in a solder joint formed by multiple reflows on the solder pad, so that the solder joint is not prone to electrical connection failure. More specifically, for example, when the solder pad is a nickel-gold substrate, the solder joint formed has only one intermetallic layer formed by Ni 3 Sn 4 , as shown in FIG. 1 . For another example, when the pad is a copper substrate, a solder joint is formed with only one intermetallic layer formed of (CuNi) 6 Sn 5 , as shown in FIG. 2 .
在某些實施態樣中,該錫基合金還包含0.2wt%至1.5wt%的銦,由該錫基合金所形成的該錫球於該焊墊上多次迴焊形成的一焊點中亦僅有一層結構細緻、厚度薄且不易脆化的界金屬層,所以該焊點還具有不易斷裂的優點,從而該焊點更不易發生電連接失效。更具體地說,比如當該焊墊為一鎳金基板時,所形成的一焊點中只有一層由Ni 3(SnIn) 4所形成且結構細緻、厚度薄及不易脆化的界金屬層,如圖3所示。又例如當該焊墊為一銅基板時,所形成的一焊點中只有一層由(CuNi) 6(SnIn) 5所形成且結構細緻、厚度薄及不易脆化的界金屬層,如圖4所示。 In some embodiments, the tin-based alloy further comprises 0.2wt% to 1.5wt% of indium, and the solder ball formed by the tin-based alloy is reflowed on the solder pad multiple times to form a solder joint, which has only one fine-structured, thin-thickness, and non-brittle boundary metal layer, so the solder joint also has the advantage of being difficult to break, and thus the solder joint is less likely to have electrical connection failure. More specifically, for example, when the solder pad is a nickel-gold substrate, the solder joint formed has only one fine-structured, thin-thickness, and non-brittle boundary metal layer formed by Ni 3 (SnIn) 4 , as shown in FIG. 3 . For another example, when the pad is a copper substrate, a solder joint is formed with only one intermetallic layer formed of (CuNi) 6 (SnIn) 5 with a fine structure, a thin thickness and being not easily brittle, as shown in FIG. 4 .
本發明將就以下實施例作進一步說明,但應瞭解的是,所述實施例僅為例示說明用,而不應被解釋為本發明實施的限制。The present invention will be further described with respect to the following embodiments, but it should be understood that the embodiments are only for illustration and description and should not be construed as limitations on the implementation of the present invention.
〈母合金的配製〉〈Preparation of Master Alloy〉
錫銀母合金的配製步驟如下: (1).當一台周波爐的電壓達到150V時,將純錫(購自印尼Timah,純度為3N)與銀金屬(購自韓國)投入該周波爐中; (2).待投料完畢後,將該周波爐的電壓調整為430V並持溫5分鐘,以使該純錫完全熔融成液態,且使該銀金屬均勻分散並融入該純錫中,從而形成錫銀熔融液; (3).使用一台攪拌器對該錫銀熔融液攪拌5秒,接著將該周波爐的電壓調整為500V並持溫2分鐘,以使該錫銀熔融液中的該純錫及該銀金屬更均勻混合,從而形成錫銀混勻液;及 (4).將該周波爐的電壓調整為300V後,將該錫銀混勻液澆鑄成條狀,獲得錫含量為85wt%且銀含量為15wt%的該錫銀母合金。其中,該錫及該銀的含量是利用一台分光儀(廠牌為德國SPECTRO;型號為SPECTROLAB S)對由該錫銀混勻液取少量澆鑄成錠狀的待測物進行檢測而得。 The preparation steps of tin-silver master alloy are as follows: (1). When the voltage of a frequency converter reaches 150V, pure tin (purchased from Timah, Indonesia, with a purity of 3N) and silver metal (purchased from South Korea) are added to the frequency converter; (2). After the feeding is completed, the voltage of the frequency converter is adjusted to 430V and the temperature is maintained for 5 minutes to completely melt the pure tin into liquid state, and to evenly disperse and melt the silver metal into the pure tin, thereby forming a tin-silver molten liquid; (3). Use a stirrer to stir the tin-silver melt for 5 seconds, then adjust the voltage of the oscillating furnace to 500V and keep the temperature for 2 minutes to make the pure tin and the silver metal in the tin-silver melt more evenly mixed to form a tin-silver mixed liquid; and (4). After adjusting the voltage of the oscillating furnace to 300V, cast the tin-silver mixed liquid into strips to obtain the tin-silver master alloy with a tin content of 85wt% and a silver content of 15wt%. The content of tin and silver is obtained by using a spectrometer (brand name: SPECTRO, Germany; model number: SPECTROLAB S) to test a small amount of the object to be tested which is cast into ingot form from the tin-silver mixed solution.
錫鎳母合金的配製步驟與該錫銀母合金的配製步驟相似,差別在於將該步驟(1)的銀金屬改為鎳金屬(購自挪威),獲得錫含量為99wt%且鎳含量為1wt%的該錫鎳母合金。The preparation steps of the tin-nickel master alloy are similar to those of the tin-silver master alloy, except that the silver metal in step (1) is replaced with nickel metal (purchased from Norway) to obtain the tin-nickel master alloy with a tin content of 99 wt% and a nickel content of 1 wt%.
錫銅母合金的配製步驟與該錫銀母合金的配製步驟相似,差別在於將該步驟(1)的銀金屬改為銅金屬(購自日本),獲得錫含量為95wt%且銅含量為5wt%的該錫銅母合金。The preparation steps of the tin-copper master alloy are similar to those of the tin-silver master alloy, except that the silver metal in step (1) is replaced with copper metal (purchased from Japan) to obtain the tin-copper master alloy with a tin content of 95wt% and a copper content of 5wt%.
錫鍺母合金的配製步驟與該錫銀母合金的配製步驟相似,差別在於將該步驟(1)的銀金屬改為鍺金屬(購自美國),獲得錫含量為99wt%且鍺含量為1wt%的該錫鍺母合金。The preparation steps of the tin-germanium master alloy are similar to those of the tin-silver master alloy, except that the silver metal in step (1) is replaced with germanium metal (purchased from the United States) to obtain the tin-germanium master alloy with a tin content of 99 wt% and a germanium content of 1 wt%.
錫鉍母合金的配製步驟如下: (1).將純錫(購自印尼Timah,純度為3N)投入一台熔配爐後加熱至400℃,以使該純錫完全熔融成液態,從而形成錫熔融液; (2).使用該攪拌器對該錫熔融液攪拌10分鐘,接著將鉍金屬(購自台灣)投入該熔配爐中並攪拌30分鐘,形成錫鉍混勻液;及 (3).將該錫鉍混勻液澆鑄成條狀,獲得錫含量為80wt%且鉍含量為20wt%的該錫鉍母合金。其中,該錫及該鉍的含量是利用該分光儀對由該錫鉍混勻液取少量澆鑄成錠狀的待測物進行檢測而得。 The preparation steps of the tin-bismuth master alloy are as follows: (1). Pure tin (purchased from Timah, Indonesia, with a purity of 3N) is placed in a melting furnace and heated to 400°C to completely melt the pure tin into a liquid state, thereby forming a tin melt; (2). The tin melt is stirred for 10 minutes using the stirrer, and then bismuth metal (purchased from Taiwan) is placed in the melting furnace and stirred for 30 minutes to form a tin-bismuth mixed solution; and (3). The tin-bismuth mixed solution is cast into a strip to obtain the tin-bismuth master alloy with a tin content of 80wt% and a bismuth content of 20wt%. The contents of tin and bismuth are obtained by using the spectrometer to test a small amount of the test object cast into a tablet from the tin-bismuth mixed solution.
錫銦母合金的配製步驟與該錫鉍母合金的配製步驟相似,差別在於將該步驟(2)的鉍金屬改為銦金屬(購自台灣),獲得錫含量為95wt%且銦含量為5wt%的該錫銦母合金。The preparation steps of the tin-indium master alloy are similar to those of the tin-bismuth master alloy, except that the bismuth metal in step (2) is replaced with indium metal (purchased from Taiwan) to obtain the tin-indium master alloy with a tin content of 95wt% and an indium content of 5wt%.
錫磷母合金的配製步驟與該錫鉍母合金的配製步驟相似,差別在於將該步驟(2)的鉍金屬改為磷金屬(購自印度),獲得錫含量為99wt%且磷含量為1wt%的錫磷母合金。The preparation steps of the tin-phosphorus master alloy are similar to those of the tin-bismuth master alloy, except that the bismuth metal in step (2) is replaced with phosphorus metal (purchased from India) to obtain a tin-phosphorus master alloy with a tin content of 99 wt% and a phosphorus content of 1 wt%.
〈實施例〈Implementation Example 11 〉〉
錫基合金的配製步驟如下: (1).將純錫(購自印尼Timah,純度為3N)投入該熔配爐後加熱至400℃,以使該純錫完全熔融成液態,從而形成錫熔融液; (2).使用該攪拌器對該錫熔融液攪拌10分鐘,接著將配製好的母合金(具體為該錫銀母合金、該錫鎳母合金、該錫鉍母合金及該錫磷母合金)投入該熔配爐中並攪拌90分鐘,形成錫基混勻液;及 (3).將該熔配爐的溫度調整為300℃後,將該錫基混勻液澆鑄成條狀,獲得錫含量為96.4475wt%、銀含量為2wt%、鉍含量為1.5wt%、鎳含量為0.05wt%且磷含量為0.0025wt%的該錫基合金。其中,該錫、該銀、該鉍、該鎳及該磷的含量是利用該分光儀對由該錫基混勻液取少量澆鑄成錠狀的待測物進行檢測而得。 The preparation steps of the tin-based alloy are as follows: (1). Pure tin (purchased from Timah, Indonesia, with a purity of 3N) is placed in the melting furnace and heated to 400°C to completely melt the pure tin into a liquid state, thereby forming a tin melt; (2). The tin melt is stirred for 10 minutes using the stirrer, and then the prepared master alloy (specifically the tin-silver master alloy, the tin-nickel master alloy, the tin-bismuth master alloy and the tin-phosphorus master alloy) is placed in the melting furnace and stirred for 90 minutes to form a tin-based mixed liquid; and (3). After adjusting the temperature of the melting furnace to 300°C, the tin-based mixed liquid is cast into strips to obtain the tin-based alloy with a tin content of 96.4475wt%, a silver content of 2wt%, a bismuth content of 1.5wt%, a nickel content of 0.05wt% and a phosphorus content of 0.0025wt%. The contents of tin, silver, bismuth, nickel and phosphorus are obtained by using the spectrometer to detect a small amount of the test object cast into ingots from the tin-based mixed liquid.
〈實施例〈Implementation Example 22 至to 1616 及比較例and Comparison Examples 11 至to 1212 〉〉
實施例2至16及比較例1至12的錫基合金是以與實施例1類似的方式所製得,差別在於改變所使用的母合金以使所製得的錫基合金中各成分的含量改變為如表3及表5所示。The tin-based alloys of Examples 2 to 16 and Comparative Examples 1 to 12 were prepared in a manner similar to that of Example 1, except that the master alloy used was changed so that the contents of the components in the prepared tin-based alloys were changed as shown in Tables 3 and 5.
〈評價項目〉〈Evaluation Items〉
將實施例1至15及比較例1至6的錫基合金分別進行以下評價。為了清楚說明,以下評價項目的檢測流程是以實施例1的錫基合金為例進行描述,其餘實施例及比較例是依據相同的檢測流程進行分析,評價結果如表3所示。The tin-based alloys of Examples 1 to 15 and Comparative Examples 1 to 6 were evaluated as follows. For the sake of clarity, the following evaluation items are described using the tin-based alloy of Example 1 as an example. The remaining Examples and Comparative Examples are analyzed according to the same testing process. The evaluation results are shown in Table 3.
推力試驗:界面斷裂型態的評價Thrust test: Evaluation of interface fracture patterns
取實施例1的錫基合金製成一直徑為220µm的錫球。另準備一焊墊(具體為銅基板),該焊墊包含一直徑為200µm的開口。將該錫球置於該開口中後,對該錫球進行三次的迴焊,以在該焊墊上形成一焊點。每一次的迴焊為在氮氣環境下對該錫球進行升溫降溫循環,該升溫降溫循環是讓該錫球從室溫(25℃)開始升溫,當溫度升高到最大值(245±5℃)時維持40秒至60秒,再以每秒1℃至3℃的速度降溫到回至室溫。Take the tin-based alloy of Example 1 to make a solder ball with a diameter of 220µm. Prepare a solder pad (specifically a copper substrate) that includes an opening with a diameter of 200µm. After placing the solder ball in the opening, reflow the solder ball three times to form a solder joint on the solder pad. Each reflow is to perform a heating and cooling cycle on the solder ball in a nitrogen environment. The heating and cooling cycle is to heat the solder ball from room temperature (25°C), maintain the temperature to the maximum value (245±5°C) for 40 seconds to 60 seconds, and then cool it back to room temperature at a rate of 1°C to 3°C per second.
參照JESD22-B117B(2014年版)規範,藉由一台推拉力機(廠牌為Dage;型號為Dage-4000)對該焊點進行推力試驗,並利用一台顯微鏡(廠牌為Olympus;型號為SZ51)觀察該焊點發生斷裂而形成的一斷面,確認該斷面的焊點殘留量及界金屬層是否完整,再依表1評價實施例1錫基合金形成的焊點的界面斷裂型態。According to the JESD22-B117B (2014 edition) specification, a push test was performed on the solder joint using a push-pull test machine (brand: Dage; model: Dage-4000), and a microscope (brand: Olympus; model: SZ51) was used to observe a section formed by the fracture of the solder joint to confirm the solder joint residue and whether the interface metal layer of the section was intact. Then, the interface fracture type of the solder joint formed by the tin-based alloy in Example 1 was evaluated according to Table 1.
表1
溫度循環試驗:熱疲勞抗性的評價Temperature Cycle Test: Evaluation of Thermal Fatigue Resistance
取實施例1的錫基合金製成一個直徑為220µm的錫球,接著依據JESD22-B111(2003年版)規範,利用該錫球將一電子元件焊接於一焊墊(具體為銅基板)上製得一待測品,該待測品包含該電子元件、該焊墊及一設置在該電子元件及該焊墊間的焊點。A tin ball with a diameter of 220 μm is made from the tin-based alloy of Example 1, and then, according to the JESD22-B111 (2003 edition) specification, an electronic component is soldered to a pad (specifically a copper substrate) using the tin ball to obtain a test product, the test product comprising the electronic component, the pad, and a solder joint disposed between the electronic component and the pad.
參照IPC-9701(2006年版)規範,將該待測品置於溫度循環變化的環境中進行溫度循環試驗,同時利用儀器偵測該待測品的電連接訊號。當該儀器無法偵測到該待測品的電連接訊號時表示該焊點已電連接失效,記錄此時該待測品所歷經的溫度循環變化的總次數,並依表2評價實施例1錫基合金形成的焊點的熱疲勞抗性。其中,每一次的溫度循環變化依序包括升溫階段15分鐘、高溫停留階段15分鐘、降溫階段15分鐘以及低溫停留階段15分鐘,且以室溫(25℃)作為起始溫度,該高溫停留階段的溫度為125℃,該低溫停留階段的溫度為-40℃。According to the IPC-9701 (2006 edition) specification, the test object is placed in a temperature cycle environment for a temperature cycle test, and the electrical connection signal of the test object is detected by an instrument. When the instrument cannot detect the electrical connection signal of the test object, it means that the solder joint has failed in electrical connection. The total number of temperature cycles experienced by the test object at this time is recorded, and the thermal fatigue resistance of the solder joint formed by the tin-based alloy of Example 1 is evaluated according to Table 2. Each temperature cycle includes a heating stage of 15 minutes, a high temperature dwell stage of 15 minutes, a cooling stage of 15 minutes and a low temperature dwell stage of 15 minutes, and takes room temperature (25°C) as the starting temperature, the temperature of the high temperature dwell stage is 125°C, and the temperature of the low temperature dwell stage is -40°C.
表2
界金屬層的成分檢測Composition detection of intermetallic layer
取實施例1的錫基合金製成一直徑為220µm的錫球。另準備一焊墊(具體為鎳金基板或銅基板),該焊墊包含一直徑為200µm的開口。將該錫球置於該開口中後,對該錫球進行三次的迴焊,以在該焊墊上形成一焊點,製得一包含該焊點的待測試片。每一次的迴焊為在氮氣環境下對該錫球進行升溫降溫循環,該升溫降溫循環是讓該錫球從室溫(25℃)開始升溫,當溫度升高到最大值(245±5℃)時維持40秒至60秒,再以每秒1℃至3℃的速度降溫到回至室溫。Take the tin-based alloy of Example 1 to make a tin ball with a diameter of 220µm. Prepare a solder pad (specifically a nickel-gold substrate or a copper substrate), which includes an opening with a diameter of 200µm. After placing the tin ball in the opening, reflow the tin ball three times to form a solder joint on the solder pad, and obtain a test piece to be tested including the solder joint. Each reflow is to perform a heating and cooling cycle on the tin ball in a nitrogen environment. The heating and cooling cycle is to heat the tin ball from room temperature (25°C), maintain the temperature to the maximum value (245±5°C) for 40 seconds to 60 seconds, and then cool it back to room temperature at a rate of 1°C to 3°C per second.
對該待測試片依序進行如下操作:以樹脂進行冷鑲埋(cold mounting)、以砂紙進行研磨、以氧化鋁拋光液進行拋光,製得一加工試片。利用一台掃描式電子顯微鏡(scanning electron microscope,簡稱SEM)(廠牌為Phenom;型號為ProX)觀察該加工試片中焊點的界金屬層,並以一台能量分散式X光分析儀(energy dispersive X-ray analysis,簡稱EDX)(廠牌為Phenom;型號為ProX)分析該界金屬層的成分。The following operations were performed on the test piece in sequence: cold mounting with resin, grinding with sandpaper, and polishing with alumina polishing liquid to obtain a processed test piece. The intermetallic layer of the solder joint in the processed test piece was observed using a scanning electron microscope (SEM) (brand name: Phenom; model name: ProX), and the composition of the intermetallic layer was analyzed using an energy dispersive X-ray analysis (EDX) (brand name: Phenom; model name: ProX).
錫基合金的熔點檢測Melting point detection of tin-based alloys
取實施例1的錫基合金製成一直徑為220µm的錫球。將該錫球置於一台差示掃描量熱儀(differential scanning calorimetry,簡稱DSC)(廠牌為珀金埃爾默;型號為DSC 4000),並記錄該錫球開始熔化的溫度。A tin ball with a diameter of 220 μm was prepared from the tin-based alloy of Example 1. The tin ball was placed in a differential scanning calorimeter (DSC) (PerkinElmer; model DSC 4000), and the temperature at which the tin ball began to melt was recorded.
表3
參閱表3,實施例1至10的錫基合金形成的焊點確實兼具良好甚至極佳的界面斷裂型態及尚可程度以上的熱疲勞抗性。尤其,實施例11至15的錫基合金因還包含0.2wt%至1.5wt%的銦使形成的焊點兼具極佳的界面斷裂型態及熱疲勞抗性。此外,實施例1至10的錫基合金形成的焊點具有一層由Ni 3Sn 4所形成的界金屬層,因為所形成的焊點中僅有一層的界金屬層,所以該焊點不易發生電連接失效的狀況;實施例11至15的錫基合金形成的焊點具有一層由Ni 3(SnIn) 4所形成且結構細緻、厚度薄及不易脆化的界金屬層,所以該焊點還具有不易斷裂的優點,從而該焊點更不易發生電連接失效。又,實施例1至15的錫基合金的熔點介於210℃至222℃間,因為與業界通用的錫銀銅合金的熔點(約217℃)相近,所以適用於該錫銀銅合金的迴焊曲線,從而在使用上無須重新調校迴焊曲線,繼而不會產生因調校迴焊曲線而衍生的生產成本。 Referring to Table 3, the solder joints formed by the tin-based alloys of Examples 1 to 10 do have both good or even excellent interface fracture morphology and acceptable thermal fatigue resistance. In particular, the tin-based alloys of Examples 11 to 15 further contain 0.2 wt % to 1.5 wt % of indium, so that the solder joints formed have both excellent interface fracture morphology and thermal fatigue resistance. In addition, the solder joints formed by the tin-based alloys of Examples 1 to 10 have an intermetallic layer formed by Ni 3 Sn 4. Since the formed solder joints have only one intermetallic layer, the solder joints are less likely to suffer from electrical connection failure. The solder joints formed by the tin-based alloys of Examples 11 to 15 have an intermetallic layer formed by Ni 3 (SnIn) 4 with a fine structure, a thin thickness, and a non-brittleness. Therefore, the solder joints also have the advantage of being non-fracture prone, and thus the solder joints are less likely to suffer from electrical connection failure. Furthermore, the melting point of the tin-based alloys of Examples 1 to 15 is between 210°C and 222°C, which is close to the melting point of the tin-silver-copper alloy commonly used in the industry (about 217°C). Therefore, they are applicable to the reflow curve of the tin-silver-copper alloy, so there is no need to re-adjust the reflow curve during use, and no production cost derived from adjusting the reflow curve will be generated.
相較於比較例1的錫基合金因銀含量大於5wt%而使所形成的焊點的界面斷裂強度及熱疲勞抗性不佳,實施例1至15的錫基合金因銀含量介於2wt%至5wt%間使形成的焊點具有更佳的界面斷裂強度及熱疲勞抗性。Compared to the tin-based alloy of comparative example 1, which has poor interface fracture strength and thermal fatigue resistance of the formed solder joint due to the silver content being greater than 5wt%, the tin-based alloys of embodiments 1 to 15 have better interface fracture strength and thermal fatigue resistance of the formed solder joint due to the silver content being between 2wt% and 5wt%.
相較於比較例2的錫基合金因鉍含量大於2wt%而使所形成的焊點的界面斷裂強度不佳,實施例1至15的錫基合金因鉍含量介於0.1wt%至2wt%間使形成的焊點具有更佳的界面斷裂型態。Compared to the tin-based alloy of comparative example 2, which has poor interfacial fracture strength of the formed solder joint due to the bismuth content being greater than 2wt%, the tin-based alloys of embodiments 1 to 15 have better interfacial fracture morphology of the formed solder joint due to the bismuth content being between 0.1wt% and 2wt%.
相較於比較例3的錫基合金因不含鎳而使所形成的焊點的界面斷裂強度不佳,及相較於比較例4的錫基合金因鎳含量大於0.07wt%而使所形成的焊點的界面斷裂強度不佳,實施例1至15的錫基合金因鎳含量介於0.02wt%至0.07wt%間使形成的焊點具有更佳的界面斷裂型態。Compared with the tin-based alloy of Comparative Example 3, which does not contain nickel and thus has poor interfacial fracture strength of the formed solder joint, and compared with the tin-based alloy of Comparative Example 4, which has poor interfacial fracture strength of the formed solder joint due to the nickel content being greater than 0.07wt%, the tin-based alloys of Examples 1 to 15 have a nickel content between 0.02wt% and 0.07wt% and thus have formed solder joints with better interfacial fracture morphology.
相較於比較例5及6的錫基合金因含銅而使所形成的焊點中的界金屬化合物包括(CuNi) 6Sn 5及(NiCu) 3Sn 4而具有兩層的界金屬層,實施例1至15的錫基合金因不含銅使形成的焊點中的界金屬化合物僅具有一層的界金屬層。又,相較於比較例6的錫基合金因含銅而使所形成的焊點的界面斷裂強度不佳,實施例1至15的錫基合金因不含銅使形成的焊點具有更佳的界面斷裂強度。 Compared to the tin-based alloys of Comparative Examples 5 and 6, which contain copper and thus have two intermetallic layers of (CuNi) 6 Sn 5 and (NiCu) 3 Sn 4 in the formed solder joints, the tin-based alloys of Examples 1 to 15 do not contain copper and thus have only one intermetallic layer in the formed solder joints. Furthermore, compared to the tin-based alloy of Comparative Example 6, which has poor interfacial fracture strength in the formed solder joints due to the copper content, the tin-based alloys of Examples 1 to 15 do not contain copper and thus have better interfacial fracture strength in the formed solder joints.
將實施例3及16及比較例7至12的錫基合金進行以下評價。為了清楚說明,以下評價項目的檢測流程是以實施例3的錫基合金為例進行描述,其餘實施例及比較例是依據相同的檢測流程進行分析,評價結果如表5所示。The tin-based alloys of Examples 3 and 16 and Comparative Examples 7 to 12 were evaluated as follows. For the sake of clarity, the following evaluation items are described using the tin-based alloy of Example 3 as an example, and the remaining Examples and Comparative Examples are analyzed according to the same testing process. The evaluation results are shown in Table 5.
抗氧化性的評價Evaluation of antioxidant activity
取實施例3的錫基合金分別製得三組重量為30g的錫球,接著,將其中一組錫球置於溫度為240±5℃的烘箱中進行10分鐘的高溫烘烤測試,將另一組錫球置於溫度為85℃且溼度為85%的恆溫恆濕機(廠牌為GIANT FORCE;型號為GTH-120-00-SP-AR)中進行24小時的高溫高濕測試,將剩餘一組錫球作為對照組,然後依Pantone國際色卡及表4評價由實施例3錫基合金所形成的錫球的抗氧化性。Three groups of 30g tin balls were prepared from the tin-based alloy of Example 3. Then, one group of tin balls was placed in an oven at a temperature of 240±5°C for a 10-minute high-temperature baking test. Another group of tin balls was placed in a constant temperature and humidity machine (brand: GIANT FORCE; model: GTH-120-00-SP-AR) at a temperature of 85°C and a humidity of 85% for a 24-hour high-temperature and high-humidity test. The remaining group of tin balls was used as a control group. The oxidation resistance of the tin balls formed from the tin-based alloy of Example 3 was evaluated according to the Pantone international color card and Table 4.
相較於對照組的錫球表面,若高溫烘烤測試的錫球表面的評價結果為良好且高溫高濕測試的錫球表面的評價結果為良好,則表示由該錫基合金所形成的錫球的抗氧化性為「良好」;若高溫烘烤測試及高溫高濕測試中至少一者的錫球表面的評價結果為尚可,則表示該錫球的抗氧化性為「尚可」;若高溫烘烤測試及高溫高濕測試中至少一者的錫球表面的評價結果為不佳,則表示該錫球的抗氧化性為「不佳」。Compared with the solder ball surface of the control group, if the evaluation result of the solder ball surface in the high temperature baking test is good and the evaluation result of the solder ball surface in the high temperature and high humidity test is good, it means that the oxidation resistance of the solder ball formed by the tin-based alloy is "good"; if the evaluation result of the solder ball surface in at least one of the high temperature baking test and the high temperature and high humidity test is fair, it means that the oxidation resistance of the solder ball is "fair"; if the evaluation result of the solder ball surface in at least one of the high temperature baking test and the high temperature and high humidity test is poor, it means that the oxidation resistance of the solder ball is "poor".
表4
表5
參閱表5,由實施例3及16的錫基合金所形成的錫球在高溫烘烤測試及高溫高濕測試的評價結果皆為良好,顯示由實施例3及16的錫基合金所形成的錫球具有良好的抗氧化性。Referring to Table 5, the evaluation results of the tin balls formed by the tin-based alloys of Examples 3 and 16 in the high temperature baking test and the high temperature and high humidity test are both good, indicating that the tin balls formed by the tin-based alloys of Examples 3 and 16 have good oxidation resistance.
相較於比較例7及8的錫基合金因磷含量小於0.002wt%而使所形成的錫球的抗氧化性不佳,及相較於比較例9的錫基合金因磷含量大於0.006wt%而使所形成的錫球的抗氧化性尚可,實施例3及16的錫基合金因磷含量介於0.002wt%至0.006wt%間使所形成的錫球具有更佳的抗氧化性。Compared with the tin-based alloys of Comparative Examples 7 and 8, which have a phosphorus content of less than 0.002wt%, the oxidation resistance of the formed tin balls is poor, and compared with the tin-based alloy of Comparative Example 9, which has a phosphorus content of more than 0.006wt%, the oxidation resistance of the formed tin balls is fair. The tin-based alloys of Examples 3 and 16 have a phosphorus content between 0.002wt% and 0.006wt%, so the formed tin balls have better oxidation resistance.
比較例10至12的錫基合金為台灣專利公告第789165號揭示的無鉛無銅錫合金。其中,相較於比較例10至11的錫基合金因不含磷但包含含量範圍介於0.005wt%至0.01wt%間的鍺使所形成的錫球的抗氧化性尚可甚至不佳,實施例3及16的錫基合金透過不包含鍺但包含含量範圍介於0.002wt%至0.006wt%間的磷使所形成的錫球具有更佳的抗氧化性。The tin-based alloys of Comparative Examples 10 to 12 are lead-free and copper-free tin alloys disclosed in Taiwan Patent Publication No. 789165. Compared with the tin-based alloys of Comparative Examples 10 to 11, which do not contain phosphorus but contain germanium in a content range of 0.005wt% to 0.01wt%, so that the oxidation resistance of the formed tin balls is fair or even poor, the tin-based alloys of Examples 3 and 16 do not contain germanium but contain phosphorus in a content range of 0.002wt% to 0.006wt%, so that the formed tin balls have better oxidation resistance.
比較例12的錫基合金不包含磷但包含含量為0.02wt%的鍺能使所形成的錫球具有良好的抗氧化性,實施例3及16的錫基合金不包含鍺但包含含量範圍介於0.002wt%至0.006wt%間的磷能使所形成的錫球具有良好的抗氧化性,由此可知在特定含量下的鍺或磷能賦予錫球具有良好的抗氧化性,且因為所需的磷含量遠低於所需的鍺含量,以及磷的採購成本遠低於鍺金屬的採購成本,所以本發明錫基合金及本發明錫球還具有原料成本低的優點。The tin-based alloy of Comparative Example 12 does not contain phosphorus but contains germanium in an amount of 0.02 wt %, which enables the formed tin ball to have good oxidation resistance. The tin-based alloys of Examples 3 and 16 do not contain germanium but contain phosphorus in an amount ranging from 0.002 wt % to 0.006 wt %, which enables the formed tin ball to have good oxidation resistance. It can be seen that germanium or phosphorus at a specific content can give the tin ball good oxidation resistance, and because the required phosphorus content is much lower than the required germanium content, and the procurement cost of phosphorus is much lower than the procurement cost of germanium metal, the tin-based alloy and the tin ball of the present invention also have the advantage of low raw material cost.
綜上所述,本發明錫基合金在不含鉛、銅及鍺的情形下,透過2wt%至5wt%的銀、0.1wt%至2wt%的鉍、0.02wt%至0.07wt%的鎳、0.002wt%至0.006wt%的磷及餘量的錫的相互配合,讓由該錫基合金所形成的本發明錫球具有良好的抗氧化性;該錫球經多次迴焊形成的一焊點中僅有一層的界金屬層,從而該焊點不易發生電連接失效;該焊點兼具良好甚至極佳的焊接強度及界面斷裂型態,且保有一定水準以上的熱疲勞抗性,從而該焊點具有高可靠度,所以確實能達成本發明的目的。同時,該錫基合金適用於業界通用的錫銀銅合金的迴焊曲線而不會產生因調校迴焊曲線而衍生的生產成本。In summary, the tin-based alloy of the present invention does not contain lead, copper and germanium, and through the cooperation of 2wt% to 5wt% of silver, 0.1wt% to 2wt% of bismuth, 0.02wt% to 0.07wt% of nickel, 0.002wt% to 0.006wt% of phosphorus and the balance of tin, the tin ball of the present invention formed by the tin-based alloy has good oxidation resistance; a solder joint formed by the tin ball after multiple reflows has only one intermetallic layer, so that the solder joint is not prone to electrical connection failure; the solder joint has good or even excellent welding strength and interface fracture morphology, and maintains a certain level of thermal fatigue resistance, so that the solder joint has high reliability, so the purpose of the present invention can be achieved. At the same time, the tin-based alloy is suitable for the reflow curve of the tin-silver-copper alloy commonly used in the industry without incurring production costs derived from adjusting the reflow curve.
值得一提的是,本發明錫基合金透過還包含0.2wt%至1.5wt%的銦,使所形成的焊點中僅有一層結構細緻、厚度薄及不易脆化的界金屬層,從而使該焊點還具有不易斷裂的優點,繼而該焊點更不易發生電連接失效,且該焊點兼具極佳的界面斷裂型態及熱疲勞抗性。It is worth mentioning that the tin-based alloy of the present invention further contains 0.2wt% to 1.5wt% of indium, so that the formed solder joint has only one layer of fine structure, thin thickness and non-brittle interface metal layer, so that the solder joint also has the advantage of being non-fracture-resistant, and then the solder joint is less likely to have electrical connection failure, and the solder joint has both excellent interface fracture morphology and thermal fatigue resistance.
惟以上所述者,僅為本發明的實施例而已,當不能以此限定本發明實施範圍,凡是依本發明申請專利範圍及專利說明書內容所作簡單的等效變化與修飾,皆仍屬本發明專利涵蓋的範圍內。However, the above is only an example of the present invention and should not be used to limit the scope of implementation of the present invention. All simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the content of the patent specification are still within the scope of the present invention.
本發明的其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1為實施例6的錫基合金形成的錫球於一鎳金基板上多次迴焊後所得的SEM圖; 圖2為實施例6的錫基合金形成的錫球於一銅基板上多次迴焊後所得的SEM圖; 圖3為實施例11的錫基合金形成的錫球於該鎳金基板上多次迴焊後所得的SEM圖;及 圖4為實施例11的錫基合金形成的錫球於該銅基板上多次迴焊後所得的SEM圖。Other features and effects of the present invention will be clearly presented in the embodiments with reference to the drawings, wherein: FIG. 1 is a SEM image of a tin ball formed by a tin-based alloy of Example 6 after multiple reflows on a nickel-gold substrate; FIG. 2 is a SEM image of a tin ball formed by a tin-based alloy of Example 6 after multiple reflows on a copper substrate; FIG. 3 is a SEM image of a tin ball formed by a tin-based alloy of Example 11 after multiple reflows on the nickel-gold substrate; and FIG. 4 is a SEM image of a tin ball formed by a tin-based alloy of Example 11 after multiple reflows on the copper substrate.
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| CN109789518A (en) * | 2016-09-12 | 2019-05-21 | 英特福莱电子有限公司 | Lead-free solder alloy comprising Sn, Bi and at least one of Mn, Sb, Cu and use thereof for soldering electronic components to substrates |
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| CN109789518A (en) * | 2016-09-12 | 2019-05-21 | 英特福莱电子有限公司 | Lead-free solder alloy comprising Sn, Bi and at least one of Mn, Sb, Cu and use thereof for soldering electronic components to substrates |
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