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TWI882588B - Surface profile and temperature monitoring system for laminate manufacturing - Google Patents

Surface profile and temperature monitoring system for laminate manufacturing Download PDF

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TWI882588B
TWI882588B TW112149326A TW112149326A TWI882588B TW I882588 B TWI882588 B TW I882588B TW 112149326 A TW112149326 A TW 112149326A TW 112149326 A TW112149326 A TW 112149326A TW I882588 B TWI882588 B TW I882588B
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lens group
measured
laser
surface profile
optical lens
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TW202525555A (en
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古季婷
馮奕澂
任國光
林元堯
李晁逵
邱逸仁
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國家中山科學研究院
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Abstract

本發明係提供一種用於積層製造之表面輪廓與溫度監測系統,具備表面輪廓與溫度之監測系統於積層製造加工設備上,由一台計算機單元可選擇使用表面3D量測模式,或使用高溫計量測模式,兼具表面輪廓影像量測與熔池溫度量測功能,節省硬體建置與製造流程成本,提高積層製造加工的精準度及加工之效率。 The present invention provides a surface profile and temperature monitoring system for laminated manufacturing. The surface profile and temperature monitoring system is installed on the laminated manufacturing equipment. A computer unit can choose to use the surface 3D measurement mode or the pyrometer measurement mode. It has both the surface profile image measurement and the molten pool temperature measurement functions, saving hardware construction and manufacturing process costs, and improving the accuracy and efficiency of laminated manufacturing.

Description

用於積層製造之表面輪廓與溫度監測系統 Surface profile and temperature monitoring system for laminate manufacturing

本發明係基於積層製造上搭配光學系統架設表面輪廓與熔池溫度等監測技術,特別係指用於一種利用雷射高功率高能量的特性將平鋪於粉床的金屬粉末融化並融合再一起的粉末床融合成型技術。 This invention is based on layer-by-layer manufacturing with an optical system to set up monitoring technology for surface profile and melt pool temperature, and specifically refers to a powder bed fusion molding technology that utilizes the high power and high energy characteristics of lasers to melt and fuse metal powders laid flat on a powder bed together.

雷射積層加工,尤其在金屬粉材燒結方法是具有高度發展潛力的工業技術,該產業現階段主要開發技術之一在於加工過程的監控技術。因為在雷射積層加工(Selective Laser Melting)過程中,積層製造雷射燒結前之工作區域內的表面鋪粉狀態,與燒結過程中熔池狀態的監測是提升加工品質以及降低加工成本最重要的條件,這個觀念在近年受到許多研究團隊重視,相繼提出新穎的監測方式或高度整合性的合併系統。 Laser stacking, especially metal powder sintering, is an industrial technology with high development potential. One of the main development technologies in this industry at this stage is the monitoring technology of the processing process. Because in the laser stacking process (Selective Laser Melting), the surface powder coating state in the working area before laser sintering and the monitoring of the molten pool state during the sintering process are the most important conditions for improving processing quality and reducing processing costs. This concept has been valued by many research teams in recent years, and new monitoring methods or highly integrated combined systems have been proposed one after another.

先前技術主要透過二個方法來達到積層製造工作區域表面鋪粉狀態監測的目的:(1)透過單個或是多個CCD或CMOS影像偵測器,配合結構光投影技術,以投影光形變的方式計算並建構表面輪廓,結構光投影可透過電腦視覺、三角測量的輔助,還原表面輪廓。(2)利用光學斷層掃描(OCT),以 積層製造系統中的雷射掃描器為基礎,建構干涉儀系統並以低同調光源作干涉量測,利用干涉產生的對比度作為表面起伏判定的依據。 Previous technologies mainly use two methods to achieve the purpose of monitoring the surface powder coating state of the working area of the multilayer manufacturing process: (1) Through a single or multiple CCD or CMOS image detectors, combined with structured light projection technology, the surface contour is calculated and constructed by projecting light deformation. Structured light projection can restore the surface contour with the assistance of computer vision and triangulation. (2) Using optical tomography (OCT), based on the laser scanner in the multilayer manufacturing system, an interferometer system is constructed and low-coherent light sources are used for interference measurement. The contrast generated by interference is used as the basis for determining surface undulation.

在上述的現有技術方法中,有幾種相關延伸問題:(1)以相移結構光投影技術取得多張條紋影像,再依演算方式建立三維表面輪廓之方法,因多張影像需以時間多工方式進行並使亮紋完整覆蓋整個待測物,在時間上多張影像照射需要高速且高解析度的相機才能加速拍攝過程,且解調時間也是必須考慮的因素之一,多影像數量雖然可以提高影像解析度,但需要數倍處理時間以及擷取更多的資訊量,同時以相移影像的方式為基礎必須重新建立光學系統。以雷射積層製造系統為整合標的時,需要在機台處預留較大的空間且雷射積層製造過程中,加工腔體內部因高溫與粉塵等惡劣環境條件影響,不適合將CCD與投影機直接設置在加工腔體內部,必須在腔體結構外開設觀景窗以供投影機與CCD取像,增加加工腔體的結構複雜度與系統整合的困難度。(2)以光學斷層掃描(OCT)的方式作表面形貌探測,在積層製造系統中以雷射掃描器為基礎建構干涉儀系統,以低同調光源作干涉量測並利用干涉產生的對比度作為表面起伏判定的依據,掃描式操作方法較容易將OCT整合到積層製造系統中,且OCT是以干涉方式在光源頻寬大的條件下可以有極佳的解析度,但是干涉式的方法需要較高的系統穩定度,當系統整體尺度規格較大 時,容易因元件與環境振動而產生誤差。 There are several related extension problems in the above-mentioned existing technical methods: (1) The method of obtaining multiple stripe images by phase-shift structured light projection technology and then establishing a three-dimensional surface profile by calculation. Because multiple images need to be processed in a time-multiplexed manner and the bright stripes completely cover the entire object to be tested, multiple images need a high-speed and high-resolution camera to speed up the shooting process, and the demodulation time is also one of the factors that must be considered. Although the number of multiple images can improve the image resolution, it requires several times the processing time and captures more information. At the same time, the optical system must be rebuilt based on the phase-shift imaging method. When the laser lamination manufacturing system is the integration target, a larger space needs to be reserved at the machine. In addition, during the laser lamination manufacturing process, the processing chamber is subject to harsh environmental conditions such as high temperature and dust. It is not suitable to directly set the CCD and projector inside the processing chamber. A viewing window must be opened outside the chamber structure for the projector and CCD to capture images, which increases the structural complexity of the processing chamber and the difficulty of system integration. (2) Use optical tomography (OCT) to detect surface morphology. In the layered manufacturing system, an interferometer system is constructed based on a laser scanner. A low-coherent light source is used for interference measurement and the contrast generated by interference is used as the basis for determining surface undulation. The scanning operation method is easier to integrate OCT into the layered manufacturing system. OCT uses interference to achieve excellent resolution under the condition of a large light source bandwidth. However, the interference method requires higher system stability. When the overall scale of the system is larger, it is easy to produce errors due to component and environmental vibration.

先前技術主要透過三個方法來達到熔池表面溫度狀態監測的目的:(1)透過單個或是多個CCD或CMOS量測熱影像方式取得即時熔池影像,透過3D影像處理估計熔池狀態;(2)在同軸光路上(雷射路徑上)裝設光偵測器,量測積層製造於雷射燒結時熔池中產生的熱輻射訊號;(3)以電漿監測方式搭配高分辨率光譜儀量測發射光譜以量測溫度。 Previous technologies mainly use three methods to achieve the purpose of monitoring the temperature state of the molten pool surface: (1) obtain real-time molten pool images through single or multiple CCD or CMOS thermal imaging methods, and estimate the molten pool state through 3D image processing; (2) install a photodetector on the coaxial optical path (laser path) to measure the thermal radiation signal generated in the molten pool during laser sintering during layered manufacturing; (3) use plasma monitoring methods with high-resolution spectrometers to measure the emission spectrum to measure temperature.

上述的三種方式中,有幾種相關延伸問題:(1)透過單個或是多個CCD或CMOS量測熱影像方式可取得即時熔池影像,但受到非同調影像以及熱像儀解析度影響,對加熱點無法有效解析出加熱點的熔池溫度,此外高解析度熱像儀的價格昂貴增加了系統購置與操作成本。(2)在同軸光路上裝設光偵測器,量測高溫熔池發出的熱輻射,熱輻射影像可以透過後處理產生溫度影像,此方法之光學架構需要經過特別設計,且除了將高功率紅外光雷射分光外還必須將熱輻射反射,而且此架構中使用之濾波器體積相當大且昂貴以及光偵測器(Photodiode)感應強度可能不足。(3)以電漿光譜監測熔池狀態之方法會與通入氣體的種類以及密度有關,雖具有較高強度且發光波長在可見光較容易量測,但是電漿發光並非直接反應熔池狀態且須建置於真空環境中可能發生相關性不足的情況。 There are several related extension problems in the above three methods: (1) Real-time molten pool images can be obtained through single or multiple CCD or CMOS thermal imaging methods, but due to the incoherent images and the resolution of the thermal imager, the molten pool temperature at the hot spot cannot be effectively resolved. In addition, the high-resolution thermal imager is expensive, which increases the system purchase and operation costs. (2) Install a photodetector on the coaxial optical path to measure the thermal radiation emitted by the high-temperature molten pool. The thermal radiation image can be used to generate a temperature image through post-processing. The optical structure of this method needs to be specially designed, and in addition to splitting the high-power infrared laser, it must also reflect the thermal radiation. In addition, the filter used in this structure is quite large and expensive, and the photodiode sensitivity may be insufficient. (3) The method of monitoring the state of the molten pool by plasma spectroscopy is related to the type and density of the gas introduced. Although it has higher intensity and the luminescence wavelength is easier to measure in visible light, plasma luminescence does not directly reflect the state of the molten pool and must be established in a vacuum environment, which may lead to insufficient correlation.

前述之現有技術在同時建構表面輪廓影像與熔 池溫度成像的整合性需求有所不足,因此有必要開發一種用於積層製造表面輪廓與溫度之監控系統,同時具有量測積層製造腔體內部表面輪廓與熔池溫度的功能,提高積層製造加工的精準度及加工之效率,並降低製造成本。 The aforementioned existing technologies are insufficient in the integration requirements of simultaneously constructing surface profile images and melt pool temperature imaging. Therefore, it is necessary to develop a monitoring system for surface profile and temperature of multilayer manufacturing, which has the function of measuring the internal surface profile of the multilayer manufacturing cavity and the temperature of the melt pool, so as to improve the accuracy and efficiency of multilayer manufacturing processing and reduce manufacturing costs.

為改善先前技術之缺點,本發明係提供一種用於積層製造之表面輪廓與溫度監測系統,本發明可由一台計算機單元選擇使用表面3D量測模式或使用高溫計量測模式,量測表面輪廓以及熔池溫度之功能,以節省硬體建置與製造流程成本,提高積層製造加工的精準度及加工之效率。 In order to improve the shortcomings of the previous technology, the present invention provides a surface profile and temperature monitoring system for multi-layer manufacturing. The present invention can use a computer unit to select the surface 3D measurement mode or the pyrometer measurement mode to measure the surface profile and the molten pool temperature, thereby saving the hardware construction and manufacturing process costs and improving the accuracy and efficiency of multi-layer manufacturing processing.

本發明係為一種用於積層製造之表面輪廓與溫度監測系統,一雷射光源,該雷射光源產生之雷射光束係經過一掃描振鏡後,透過一第一聚焦透鏡傳至一待測表面;一第一光學鏡組,該第一光學鏡組係由雙色鏡與縮束鏡組組成,該第一光學鏡組係接收該雷射光束傳至該待測表面產生之反射光與漫射光,再傳至一繞射光柵;一第二光學鏡組,該第二光學鏡組係由擴束鏡組與偏振片組組成,該第一光學鏡組接收之該反射光與漫射光經過該繞射光柵後進入該第二光學鏡組;一第二聚焦透鏡,該第一光學鏡組接收之該反射光與漫射光經過該繞射光柵後,進入該第二聚焦透鏡,再傳至一光纖陣列;一光電轉換模組,該光電轉換模組係選擇接收從該第二光學鏡組或該光纖陣列傳遞之該反射光與漫射光之光訊號,再 將其轉換成電訊號;一計算機單元,該計算機單元係控制該雷射光源發出之雷射光束形式,以及選擇使用表面3D量測模式、或使用高溫計量測模式,並接收該光電轉換模組輸出之電訊號,藉此建立該待測表面之表面輪廓影像與熔池溫度之資訊。 The present invention is a surface profile and temperature monitoring system for multilayer manufacturing, comprising a laser light source, wherein the laser light source generates a laser beam which passes through a scanning galvanometer and then passes through a first focusing lens to a surface to be measured; a first optical lens group, wherein the first optical lens group is composed of a dichroic lens and a beam shrinking lens group, wherein the first optical lens group receives the reflected light and diffused light generated by the laser beam passing to the surface to be measured, and then transmits the reflected light and diffused light to a diffusing grating; a second optical lens group, wherein the second optical lens group is composed of a beam expander group and a polarizing film group, wherein the reflected light and diffused light received by the first optical lens group passes through the diffusing grating and then enters the second optical lens group; and a second focusing lens group is composed of a dichroic lens group and a beam shrinking lens group. A focusing lens, the reflected light and diffuse light received by the first optical lens group passes through the diffraction grating, enters the second focusing lens, and then transmits to an optical fiber array; a photoelectric conversion module, the photoelectric conversion module selectively receives the optical signal of the reflected light and diffuse light transmitted from the second optical lens group or the optical fiber array, and then converts it into an electrical signal; a computer unit, the computer unit controls the form of the laser beam emitted by the laser light source, and selects to use the surface 3D measurement mode or the pyrometer measurement mode, and receives the electrical signal output by the photoelectric conversion module, thereby establishing the surface profile image of the surface to be measured and the information of the molten pool temperature.

本發明之一實施例中,該雷射光束為波長630~670nm之紅光雷射,或波長800~1100nm之近紅外光雷射。 In one embodiment of the present invention, the laser beam is a red laser with a wavelength of 630-670nm, or a near-infrared laser with a wavelength of 800-1100nm.

本發明之一實施例中,該第一光學鏡組係具有雙色鏡以及縮束鏡組。 In one embodiment of the present invention, the first optical lens group includes a dichroic lens and a focusing lens group.

本發明之一實施例中,該第二光學鏡組係具有擴束鏡組與偏振片組。 In one embodiment of the present invention, the second optical lens group includes a beam expander group and a polarizer group.

本發明之一實施例中,該擴束鏡組係由一凹透鏡與一凸透鏡組成。 In one embodiment of the present invention, the expansion lens assembly is composed of a concave lens and a convex lens.

本發明之一實施例中,該偏振片組係由四個方向偏振片構成,該四個方向偏振片分別為0°、45°、90°及135°。 In one embodiment of the present invention, the polarizer set is composed of four directional polarizers, and the four directional polarizers are 0°, 45°, 90° and 135° respectively.

本發明之一實施例中,該光電轉換模組內部係具有複數光偵測器。 In one embodiment of the present invention, the photoelectric conversion module has a plurality of photodetectors inside.

本發明之一實施例中,該待測表面係指積層製造腔體中鋪設待燒結之材料粉末區域表面。 In one embodiment of the present invention, the surface to be tested refers to the surface of the area where the material powder to be sintered is laid in the laminate manufacturing chamber.

本發明之一實施例中,該表面3D量測模式之表面輪廓影像建立流程為:該計算機單元控制該雷射光源提供一紅光雷射、並選擇使用表面3D量測模式,該紅光雷射傳至該掃描振鏡後,透過該第一聚焦透鏡傳至該待測表面,此時該 待測表面所產生之反射光與漫射光透過原來光路路徑回傳至該第一光學鏡組,經過該第一光學鏡組後傳至該繞射光柵、並傳至該第二光學鏡組,再傳至該光電轉換模組轉換成電訊號後,回傳至該計算機單元,藉此建立該待測表面的表面輪廓影像。 In one embodiment of the present invention, the process of establishing the surface profile image of the surface 3D measurement mode is as follows: the computer unit controls the laser light source to provide a red laser and selects the surface 3D measurement mode. After the red laser is transmitted to the scanning galvanometer, it is transmitted to the surface to be measured through the first focusing lens. At this time, the reflected light and diffuse light generated by the surface to be measured are transmitted back to the first optical lens group through the original optical path, and then transmitted to the diffraction grating and the second optical lens group after passing through the first optical lens group, and then transmitted to the photoelectric conversion module to be converted into an electrical signal, and then transmitted back to the computer unit, thereby establishing the surface profile image of the surface to be measured.

本發明之一實施例中,該高溫計量測模式下之溫度監測資訊建立流程為:該計算機單元控制該雷射光源提供一近紅外光雷射、並選擇使用高溫計量測模式,該近紅外光雷射傳至該掃描振鏡後透過該第一聚焦透鏡傳至該待測表面,此時該待測表面所產生之反射光與漫射光透過原來光路路徑回傳至第一光學鏡組,再傳至繞射光柵、並傳至一第二聚焦透鏡及一光纖陣列,再傳至該光電轉換模組轉換成電訊號後,回傳至該計算機單元,藉此建立該待測表面的溫度監測資訊。 In one embodiment of the present invention, the process of establishing temperature monitoring information in the pyrometer measurement mode is as follows: the computer unit controls the laser light source to provide a near-infrared laser, and selects the pyrometer measurement mode. The near-infrared laser is transmitted to the scanning galvanometer and then to the surface to be measured through the first focusing lens. At this time, the reflected light and diffused light generated by the surface to be measured are transmitted back to the first optical lens group through the original optical path, and then to the diffraction grating, and to a second focusing lens and an optical fiber array, and then to the photoelectric conversion module to convert into an electrical signal, and then transmitted back to the computer unit, thereby establishing the temperature monitoring information of the surface to be measured.

本發明之一實施例中,該計算機單元係提供一座標資訊,計算出該雷射光束當前所照射區域座標的待測表面之高度影像或溫度監測資訊,彙整該區域全部座標的高度影像或溫度監測資訊後,得到該待測表面之整體表面輪廓影像或整體溫度監測資訊(熱影像)。 In one embodiment of the present invention, the computer unit provides coordinate information to calculate the height image or temperature monitoring information of the surface to be measured of the coordinates of the area currently irradiated by the laser beam, and after integrating the height image or temperature monitoring information of all coordinates of the area, the overall surface contour image or overall temperature monitoring information (thermal image) of the surface to be measured is obtained.

本發明之一實施例中,選擇表面3D量測模式使用之該雷射光束為波長630~670nm之紅光雷射,選擇高溫計量測模式使用之該雷射光束為波長800~1100nm之近紅外光雷射。 In one embodiment of the present invention, the laser beam used in the surface 3D measurement mode is selected to be a red laser with a wavelength of 630-670nm, and the laser beam used in the pyrometer measurement mode is selected to be a near-infrared laser with a wavelength of 800-1100nm.

以上之概述與接下來的詳細說明及附圖,皆是為了能進一步說明本發明達到預定目的所採取的方式、手段及功效。而有關本發明的其他目的及優點,將在後續的說明及圖示中加以闡述。 The above overview and the following detailed description and attached figures are all for the purpose of further explaining the methods, means and effects adopted by the present invention to achieve the intended purpose. Other purposes and advantages of the present invention will be elaborated in the subsequent description and illustrations.

10:雷射光源 10: Laser light source

10A:近紅外光雷射光束 10A: Near infrared laser beam

10B:紅光雷射光束 10B: Red laser beam

11:掃描振鏡 11: Scanning galvanometer

12:第一聚焦透鏡 12: First focusing lens

13:待測表面 13: Surface to be tested

14:第一光學鏡組 14: First optical lens group

14A:雙色鏡 14A: Dichroic mirror

14B:縮束鏡組 14B: Focus lens set

15:繞射光柵 15: Diffused grating

16:第二光學鏡組 16: Second optical lens group

16A:擴束鏡組 16A: Beam expander set

16B:偏振片組 16B: Polarizer set

17:光電轉換模組 17: Photoelectric conversion module

18:計算機單元 18:Computer unit

19:第二聚焦透鏡 19: Second focusing lens

20:光纖陣列 20: Fiber optic array

圖1係為本發明之用於積層製造之表面輪廓與溫度監測系統架構圖。 Figure 1 is a schematic diagram of the surface profile and temperature monitoring system used for layered manufacturing of the present invention.

圖2係為本發明之表面輪廓影像建立流程系統方塊圖。 Figure 2 is a block diagram of the surface profile image creation process system of the present invention.

圖3係為本發明之表面熔池溫度建立流程系統方塊圖。 Figure 3 is a block diagram of the surface molten pool temperature establishment process system of the present invention.

以下係藉由特定的具體實例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點與功效。 The following is a specific example to illustrate the implementation of the present invention. People familiar with this technology can easily understand other advantages and effects of the present invention from the content disclosed in this manual.

光偵測器(photo diode)是將光強度轉換為電流的感測器,可以利用電流電壓轉換器(transimpendence amplifier,TIA)將電流訊號轉成電壓訊號。在高溫計的應用中必須考慮到反應速度以及高響應強度以克服熱輻射經分光後強度不足的問題,在電流電壓轉換器的部分則是選用低輸入電流噪聲(input current noise)的運算放大器以期提升訊躁比。電流電壓轉換器所產生的類比訊號需要經過類比數位轉換器(analog to digital converter)轉換成數位訊號,微處理器依序讀取三個類 比數位轉換器的電壓之後經由USB介面傳送至PC。高溫計是利用比較兩個不同波長的光強度比來推算待測物的溫度,故不同波長的光學系統的穿透率/反射率,光偵測器的量子效率還有電流電壓轉換器的增益都會影響到光強度的比值,因此需要針對每一台高溫計硬體做校正。 Photodiode is a sensor that converts light intensity into current. A transimpendence amplifier (TIA) can be used to convert current signals into voltage signals. In the application of high temperature thermometers, the reaction speed and high response intensity must be considered to overcome the problem of insufficient intensity of thermal radiation after spectral analysis. In the current-to-voltage converter part, an operational amplifier with low input current noise is selected to improve the signal-to-noise ratio. The analog signal generated by the current-to-voltage converter needs to be converted into a digital signal through an analog-to-digital converter. The microprocessor reads the voltages of the three analog-to-digital converters in sequence and transmits them to the PC via the USB interface. The pyrometer uses the ratio of light intensities of two different wavelengths to estimate the temperature of the object to be measured. Therefore, the transmittance/reflectivity of the optical system of different wavelengths, the quantum efficiency of the photodetector, and the gain of the current-to-voltage converter will affect the ratio of light intensities. Therefore, each pyrometer hardware needs to be calibrated.

本發明之用於積層製造之表面輪廓與溫度監測系統係使用光學偏極造影成像技術,來取得積層製造加工程序之中鋪粉程序後的粉床表面輪廓影像。光學偏極造影成像(Optical Polarization Imaging,OPI)是利用電磁波受到介面反射時,反射光的振輻和相位以及反射面的方向有關,不同偏振態的時間響應不同,使得偏振特性可以作為表面法線方向量測的工具,透過偏振處理可以顯現出表面細微結構,不同偏振影像相減可以突顯出表面結構的細微變化可用以解析表面影像。 The surface profile and temperature monitoring system for layered manufacturing of the present invention uses optical polarization imaging technology to obtain the surface profile image of the powder bed after the powder laying process in the layered manufacturing process. Optical polarization imaging (OPI) uses the fact that when electromagnetic waves are reflected by the interface, the oscillation and phase of the reflected light are related to the direction of the reflecting surface. Different polarization states have different time responses, so that the polarization characteristics can be used as a tool for measuring the surface normal direction. The surface microstructure can be displayed through polarization processing. The subtraction of different polarization images can highlight the subtle changes in the surface structure and can be used to analyze the surface image.

近年來偏極造影成像成為機械視覺(machine vision)領域中相當重要的技術之一,主要原因在於偏極資訊取得方式容易,透過偏振片即可以取出特定線性偏振光的強度資訊,而且偏振態對於幾何因素的反應,在影像處理上較為容易。2018年研究Gary A.Atkinson等人指出偏極影像應用在表面形貌量測時,當入射光的偏振改變則反射光(漫反射光)的極化率也會發生改變,且改變量大表示具有高度反應強度的特徵,透過數學模型與影像處理程序即可以計算出表面輪廓 (高度)影像。 In recent years, polarization imaging has become one of the most important technologies in the field of machine vision. The main reason is that polarization information is easy to obtain. The intensity information of specific linear polarized light can be obtained through a polarizer, and the reaction of the polarization state to geometric factors is easier in image processing. In 2018, Gary A. Atkinson et al. pointed out that when polarization imaging is applied to surface morphology measurement, when the polarization of the incident light changes, the polarization rate of the reflected light (diffuse reflected light) will also change, and a large change indicates a high response intensity. The surface profile (height) image can be calculated through mathematical models and image processing programs.

本發明之用於積層製造之表面輪廓與溫度監測系統架構圖如圖1所示,係包括:一雷射光源10,提供一近紅外光雷射光束10A或紅光雷射光束10B,該雷射光束經過掃描振鏡11後,透過第一聚焦透鏡12,將光束傳至一待測表面13,雷射光束照射到待測表面13後會產生反射光與漫射光,該光會依照相同光路路徑回到掃描振鏡11,並經過第一光學鏡組14,該第一光學鏡組14係由雙色鏡14A與縮束鏡組14B組成,光束(反射光與漫射光)經過第一光學鏡組14後傳至繞射光柵15,在表面3D量測模式下光束(反射光與漫射光)經過繞射光柵15後會傳至第二光學鏡組16,該第二光學鏡組係由擴束鏡組16A與偏振片組16B組成,接著傳至光電轉換模組17,並將光源(反射光與漫射光)轉換成電訊號後輸出至計算機單元18;在高溫計量測模式下光束(反射光與漫射光)經過繞射光柵15後會傳至第二聚焦透鏡19,光束(反射光與漫射光)經過第二聚焦透鏡19後會傳至光纖陣列20,再經過光纖陣列20,接著會傳至光電轉換模組17,並將光源(反射光與漫射光)轉換成電訊號後輸出至計算機單元18。計算機單元係控制該雷射光源發出之雷射光源形式以及選擇使用表面3D量測模式或使用高溫計量測模式,接收該光電轉換模組輸出之電訊號,藉此建立該待測表面之表面輪廓影像與熔池溫度等資訊。 The structure diagram of the surface profile and temperature monitoring system for layered manufacturing of the present invention is shown in FIG1 , and includes: a laser light source 10, providing a near-infrared laser beam 10A or a red laser beam 10B, the laser beam passes through a scanning galvanometer 11, and then passes through a first focusing lens 12 to transmit the beam to a surface to be measured 13. After the laser beam irradiates the surface to be measured 13, it will generate reflected light and diffuse light, which will return to the scanning galvanometer 11 along the same optical path, and pass through a first optical lens group 14, the first optical lens group 14 is composed of a dichroic lens 14A and a focusing lens group 14B. The light beam (reflected light and diffuse light) passes through the first optical lens group 14 and is transmitted to a diffraction grating 15. In the surface 3D measurement mode The lower light beam (reflected light and diffused light) passes through the diffraction grating 15 and is transmitted to the second optical lens group 16, which is composed of a beam expander group 16A and a polarizer group 16B, and then is transmitted to the photoelectric conversion module 17, and the light source (reflected light and diffused light) is converted into an electrical signal and then output to the computer unit 18; in the pyrometer measurement mode, the light beam (reflected light and diffused light) passes through the diffraction grating 15 and is transmitted to the second focusing lens 19, and the light beam (reflected light and diffused light) passes through the second focusing lens 19 and is transmitted to the optical fiber array 20, and then passes through the optical fiber array 20, and then is transmitted to the photoelectric conversion module 17, and the light source (reflected light and diffused light) is converted into an electrical signal and then output to the computer unit 18. The computer unit controls the laser light source form emitted by the laser light source and selects the surface 3D measurement mode or the pyrometer measurement mode, receives the electrical signal output by the photoelectric conversion module, and thereby establishes the surface profile image of the surface to be measured and the molten pool temperature and other information.

本發明之一實施例中,係透過兩個量測模式互相 切換,由使用者自行選擇表面3D量測模式(建立待測表面輪廓影像)或高溫計量測模式(建立表面熔池溫度監測狀態資訊),於一積層製造加工設備上搭載具備量測表面輪廓影像系統以及表面溫度熱成像系統的功能。本發明之表面輪廓影像建立流程系統方塊圖如圖2所示,該計算機單元18控制該雷射光源10提供波長為630~670nm之紅光雷射源(雷射光束)10B、並選擇使用表面3D量測模式,該紅光雷射10B傳至該掃描振鏡11後,透過該第一聚焦透鏡12傳至該待測表面13,此時該待測表面所產生之反射光與漫射光透過原來光路路徑回傳至該第一光學鏡組14,經過該第一光學鏡組14後傳至該繞射光柵15、並傳至該第二光學鏡組16,再傳至該光電轉換模組17轉換成電訊號後,回傳至該計算機單元18,藉此建立該待測表面13全域的表面輪廓影像。 In one embodiment of the present invention, two measurement modes are switched mutually, and the user can select the surface 3D measurement mode (establishing the profile image of the surface to be measured) or the pyrometer measurement mode (establishing the surface molten pool temperature monitoring status information) by himself, and a multi-layer manufacturing and processing equipment is equipped with the functions of the surface profile image measurement system and the surface temperature thermal imaging system. The block diagram of the surface profile image establishment process system of the present invention is shown in Figure 2. The computer unit 18 controls the laser light source 10 to provide a red laser source (laser beam) 10B with a wavelength of 630~670nm, and selects to use the surface 3D measurement mode. After the red laser 10B is transmitted to the scanning galvanometer 11, it is transmitted to the surface to be measured 13 through the first focusing lens 12. At this time, the reflected light and diffused light generated by the surface to be measured are transmitted back to the first optical lens group 14 through the original optical path, and then transmitted to the diffraction grating 15 and the second optical lens group 16 after passing through the first optical lens group 14, and then transmitted to the photoelectric conversion module 17 to be converted into an electrical signal, and then transmitted back to the computer unit 18, thereby establishing a surface profile image of the entire surface to be measured 13.

本發明之表面熔池溫度狀態資訊建立流程系統方塊圖如圖3所示,該計算機單元18控制該雷射光源10提供波長為800~1100nm之近紅外光雷射源(雷射光束)10A、並選擇使用高溫計量測模式,該近紅外光雷射10A傳至該掃描振鏡11後透過該第一聚焦透鏡12傳至該待測表面13,此時該待測表面13所產生之反射光與漫射光透過原來光路路徑回傳至第一光學鏡組14,再傳至繞射光柵15、並傳至一第二聚焦透鏡19及一光纖陣列20,再傳至該光電轉換模組17轉換成電訊號後,回傳至該計算機單元18,藉此建立該待測表面全域的溫度監測資 訊。表面熔池係指積層製造腔體中鋪設待燒結之材料粉末區域,經雷射燒結加工後的熔融狀態表面。 The system block diagram of the surface molten pool temperature state information establishment process of the present invention is shown in FIG3. The computer unit 18 controls the laser light source 10 to provide a near-infrared laser source (laser beam) 10A with a wavelength of 800-1100 nm, and selects the high temperature meter measurement mode. The near-infrared laser 10A is transmitted to the scanning galvanometer 11 and then transmitted to the to-be-measured through the first focusing lens 12. Surface 13, at this time, the reflected light and diffuse light generated by the surface 13 to be measured are transmitted back to the first optical lens group 14 through the original optical path, and then to the diffraction grating 15, and then to a second focusing lens 19 and an optical fiber array 20, and then to the photoelectric conversion module 17 to be converted into an electrical signal, and then transmitted back to the computer unit 18, thereby establishing the temperature monitoring information of the entire surface to be measured. The surface molten pool refers to the area of the material powder to be sintered in the lamination manufacturing cavity, and the molten state surface after laser sintering.

本發明之一實施例中,該計算機單元根據該掃描振鏡提供一座標資訊,計算出該雷射光束當前所照射區域座標的待測表面高度,當雷射光束完成整個工作區域待測表面的掃描工作後由計算機單元彙整該工作區域全部座標區域的高度,結合運算建立該工作區域內的待測表面之整體表面輪廓影像,再進一步將該整體表面輪廓影像的數據反饋給計算機單元,用以微調不同工作區域的工作參數設定,藉以提高積層製造工件成品的品質與良率。本發明所量測到的表面高度與熔池溫度同時可做為回饋指標,讓使用者可以即時得知成果好壞,作為後續製程參數調整與裝置改進設計的參考。 In one embodiment of the present invention, the computer unit calculates the height of the surface to be measured of the coordinates of the area currently irradiated by the laser beam based on the coordinate information provided by the scanning galvanometer. When the laser beam completes the scanning of the surface to be measured in the entire working area, the computer unit summarizes the height of all coordinate areas of the working area, combines the calculation to establish the overall surface profile image of the surface to be measured in the working area, and further feeds back the data of the overall surface profile image to the computer unit for fine-tuning the working parameter settings of different working areas, so as to improve the quality and yield of the finished product of the multilayer manufacturing workpiece. The surface height and molten pool temperature measured by the present invention can also be used as feedback indicators, so that users can know the results in real time, which can be used as a reference for subsequent process parameter adjustment and device improvement design.

本發明之一實施例中,該雷射光源係可與積層製造製程所使用的燒結用雷射共用光路路徑,一般積層製造燒結用雷射裝置會設置在工作腔體外部,以避免受到腔體內粉塵與高溫等不利環境因素影響其工作精度與效率,因此本發明所需要的雷射光源只需沿用燒結用的雷射路徑設計及安裝表面輪廓與熔池溫度監測設備,可以減少重複裝設硬體的成本 In one embodiment of the present invention, the laser light source can share the optical path with the sintering laser used in the multilayer manufacturing process. Generally, the laser device for sintering in multilayer manufacturing is installed outside the working chamber to avoid adverse environmental factors such as dust and high temperature in the chamber affecting its working accuracy and efficiency. Therefore, the laser light source required by the present invention only needs to use the laser path design for sintering and install the surface profile and molten pool temperature monitoring equipment, which can reduce the cost of repeated hardware installation.

本發明之一實施例中,不論是使用表面3D量測模式或使用高溫計量測模式,都是利用比較數個不同偏極或不同波長的光強度比來推算待測物的溫度,故不同偏極或波 長的光學系統的穿透率/反射率或是光偵測器的量子效率還有電流電壓轉換器的增益都會影響到光強度的比值,因此需要針對每一台高溫計硬體做校正,校正後的等效參數則儲存於計算機單元中,經計算機單元讀出訊號後判讀以及軟體後處理,可以產生表面輪廓與熔池溫度影像。 In one embodiment of the present invention, whether using the surface 3D measurement mode or the pyrometer measurement mode, the temperature of the object to be measured is estimated by comparing the light intensity ratio of several different polarizations or different wavelengths. Therefore, the transmittance/reflectivity of the optical system with different polarizations or wavelengths, the quantum efficiency of the photodetector, and the gain of the current-to-voltage converter will affect the light intensity ratio. Therefore, it is necessary to calibrate the hardware of each pyrometer. The calibrated equivalent parameters are stored in the computer unit. After the computer unit reads the signal and interprets it and performs software post-processing, the surface profile and the molten pool temperature image can be generated.

本發明之表面輪廓與溫度監測系統將偏極光強度數據轉換成偏極造影成像,再經運算產生積層製造加工區域的表面輪廓影像資訊的做法,在現有技術文獻有多種方式可以選用,並不限於本發明所舉例的文獻作法。 The surface profile and temperature monitoring system of the present invention converts polarized light intensity data into polarized imaging, and then generates surface profile image information of the layered manufacturing processing area through calculation. There are many ways to choose from in the existing technical literature, and it is not limited to the literature method cited in the present invention.

本發明之一實施例中,光纖陣列為等間距並排之光纖元件,基於較長波長的繞射光具有較大的繞射角,熱輻射中不同的波長成份分別進入光纖陣列中的不同通道,各通道後端光纖分別接到光偵測器量測即時資訊,形成高溫計的基礎,選用光纖而非自由空間導光到光偵測器,是為了增加空間彈性與降低背景干擾。 In one embodiment of the present invention, the optical fiber array is an optical fiber element arranged side by side at equal intervals. Based on the fact that diffracted light with a longer wavelength has a larger diffraction angle, different wavelength components in thermal radiation enter different channels in the optical fiber array respectively. The optical fibers at the rear end of each channel are connected to a photodetector to measure real-time information, forming the basis of a high temperature thermometer. Optical fibers are used instead of free space to guide light to the photodetector in order to increase spatial flexibility and reduce background interference.

本發明係提供一種表面輪廓與溫度監測系統,可針對不同光源於兩種不同量測模式下進行切換,提高待測表面的監測精確度,有效增加積層加工之效率並且降低製造成本,透過第二聚焦透鏡與光纖陣列之設計,可節省光學系統於積層製造設備上架設多個光學設備所需的空間,能提升同軸式系統光源收取的穩定性,也較容易調整待測表面相關輻射特性,增加系統的可調性,本發明之表面輪廓與溫度監測系統 係可整合進積層製造系統內,沿用積層製造系統原有雷射光路路徑,不須增加額外的光路設計與硬體成本。 The present invention provides a surface profile and temperature monitoring system that can switch between two different measurement modes for different light sources, improve the monitoring accuracy of the surface to be measured, effectively increase the efficiency of multilayer processing and reduce manufacturing costs. Through the design of the second focusing lens and the optical fiber array, the space required for the optical system to set up multiple optical devices on the multilayer manufacturing equipment can be saved, and the stability of the light source collected by the coaxial system can be improved. It is also easier to adjust the radiation characteristics related to the surface to be measured, and increase the adjustability of the system. The surface profile and temperature monitoring system of the present invention can be integrated into the multilayer manufacturing system, and the original laser optical path of the multilayer manufacturing system is used, without adding additional optical path design and hardware costs.

上述之實施例僅為例示性說明本發明之特點及其功效,而非用於限制本發明之實質技術內容的範圍。任何熟習此技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修飾與變化。因此,本發明之權利保護範圍,應如後述之申請專利範圍所列。 The above embodiments are only for illustrative purposes to illustrate the features and effects of the present invention, and are not intended to limit the scope of the substantial technical content of the present invention. Anyone familiar with this art may modify and change the above embodiments without violating the spirit and scope of the present invention. Therefore, the scope of protection of the present invention should be as listed in the scope of the patent application described below.

10:雷射光源 10: Laser light source

10A:近紅外光雷射光束 10A: Near infrared laser beam

10B:紅光雷射光束 10B: Red laser beam

11:掃描振鏡 11: Scanning galvanometer

12:第一聚焦透鏡 12: First focusing lens

13:待測表面 13: Surface to be tested

14:第一光學鏡組 14: First optical lens group

14A:雙色鏡 14A: Dichroic mirror

14B:縮束鏡組 14B: Focus lens set

15:繞射光柵 15: Diffused grating

16:第二光學鏡組 16: Second optical lens group

16A:擴束鏡組 16A: Beam expander set

16B:偏振片組 16B: Polarizer set

17:光電轉換模組 17: Photoelectric conversion module

18:計算機單元 18:Computer unit

19:第二聚焦透鏡 19: Second focusing lens

20:光纖陣列 20: Fiber optic array

Claims (7)

一種用於積層製造之表面輪廓與溫度監測系統,係包括:一雷射光源,該雷射光源產生之雷射光束係經過一掃描振鏡後,透過一第一聚焦透鏡傳至一待測表面;一第一光學鏡組,該第一光學鏡組係由雙色鏡與縮束鏡組組成,該第一光學鏡組係接收該雷射光束傳至該待測表面產生之反射光與漫射光,再傳至一繞射光柵;一第二光學鏡組,該第二光學鏡組係由擴束鏡組與偏振片組組成,該第一光學鏡組接收之該反射光與漫射光經過該繞射光柵後進入該第二光學鏡組;一第二聚焦透鏡,該第一光學鏡組接收之該反射光與漫射光經過該繞射光柵後,進入該第二聚焦透鏡,再傳至一光纖陣列;一光電轉換模組,該光電轉換模組係選擇接收從該第二光學鏡組或該光纖陣列傳遞之該反射光與漫射光之光訊號,再將其轉換成電訊號;一計算機單元,該計算機單元係控制該雷射光源發出之雷射光束形式,以及選擇使用表面3D量測模式、或使用高溫計量測模式,並接收該光電轉換模組輸出之電訊號,藉此建立該待測表面之表面輪廓影像與熔池溫度之資訊;其中該表面3D量測模式之表面輪廓影像建立流程為:該計算機單元控制該雷射光源提供一紅光雷射、並選擇使用表 面3D量測模式,該紅光雷射傳至該掃描振鏡後,透過該第一聚焦透鏡傳至該待測表面,此時該待測表面所產生之反射光與漫射光透過原來光路路徑回傳至該第一光學鏡組,經過該第一光學鏡組後傳至該繞射光柵、並傳至該第二光學鏡組,再傳至該光電轉換模組轉換成電訊號後,回傳至該計算機單元,藉此建立該待測表面的表面輪廓影像;其中該高溫計量測模式下之溫度監測資訊建立流程為:該計算機單元控制該雷射光源提供一近紅外光雷射、並選擇使用高溫計量測模式,該近紅外光雷射傳至該掃描振鏡後透過該第一聚焦透鏡傳至該待測表面,此時該待測表面所產生之反射光與漫射光透過原來光路路徑回傳至第一光學鏡組,再傳至繞射光柵、並傳至一第二聚焦透鏡及一光纖陣列,再傳至該光電轉換模組轉換成電訊號後,回傳至該計算機單元,藉此建立該待測表面的溫度監測資訊。 A surface profile and temperature monitoring system for multilayer manufacturing includes: a laser light source, the laser light source generates a laser beam which passes through a scanning galvanometer and then passes through a first focusing lens to a surface to be measured; a first optical lens group, the first optical lens group is composed of a dichroic lens and a beam shrinking lens group, the first optical lens group receives the reflected light and diffused light generated by the laser beam passing to the surface to be measured, and then transmits it to a diffraction grating; a second optical lens group, the second optical lens group is composed of a beam expander group and a polarizer group, the reflected light and diffused light received by the first optical lens group passes through the diffraction grating and enters the second optical lens group. a second focusing lens, the reflected light and the diffused light received by the first optical lens group enter the second focusing lens after passing through the diffraction grating, and then are transmitted to an optical fiber array; a photoelectric conversion module, the photoelectric conversion module selectively receives the optical signal of the reflected light and the diffused light transmitted from the second optical lens group or the optical fiber array, and then converts it into an electrical signal; a computer unit, the computer unit controls the form of the laser beam emitted by the laser light source, selects to use the surface 3D measurement mode or the pyrometer measurement mode, and receives the electrical signal output by the photoelectric conversion module, thereby establishing a surface profile image of the surface to be measured and the temperature of the molten pool; wherein the process of establishing the surface profile image of the surface 3D measurement mode is as follows: the computer unit controls the laser light source to provide a red laser, and selects the surface 3D measurement mode. After the red laser is transmitted to the scanning galvanometer, it is transmitted to the surface to be measured through the first focusing lens. At this time, the reflected light and diffuse light generated by the surface to be measured are transmitted back to the first optical lens group through the original optical path, and then transmitted to the diffraction grating and the second optical lens group after passing through the first optical lens group, and then transmitted to the photoelectric conversion module to be converted into an electrical signal, and then transmitted back to the computer unit, thereby establishing the surface to be measured. Surface profile image; wherein the process of establishing temperature monitoring information in the pyrometer measurement mode is as follows: the computer unit controls the laser light source to provide a near-infrared laser, and selects the pyrometer measurement mode. The near-infrared laser is transmitted to the scanning galvanometer and then to the surface to be measured through the first focusing lens. At this time, the reflected light and diffuse light generated by the surface to be measured are transmitted back to the first optical lens group through the original optical path, and then to the diffraction grating, and to a second focusing lens and an optical fiber array, and then to the photoelectric conversion module to convert into an electrical signal, and then transmitted back to the computer unit, thereby establishing the temperature monitoring information of the surface to be measured. 如請求項1所述之用於積層製造之表面輪廓與溫度監測系統,其中選擇表面3D量測模式使用之該雷射光束為波長630~670nm之紅光雷射。 A surface profile and temperature monitoring system for layered manufacturing as described in claim 1, wherein the laser beam used in the surface 3D measurement mode is a red laser with a wavelength of 630~670nm. 如請求項1所述之用於積層製造之表面輪廓與溫度監測系統,其中選擇高溫計量測模式使用之該雷射光束為波長800~1100nm之近紅外光雷射。 A surface profile and temperature monitoring system for layered manufacturing as described in claim 1, wherein the laser beam used in the pyrometer measurement mode is a near-infrared laser with a wavelength of 800-1100nm. 如請求項1所述之用於積層製造之表面輪廓與溫度監測系統,其中該偏振片組係具有四個方向之偏振片,該四個方向偏振片方向分別為0°、45°、90°及135°。 A surface profile and temperature monitoring system for multilayer manufacturing as described in claim 1, wherein the polarizer set has polarizers in four directions, and the directions of the four polarizers are 0°, 45°, 90° and 135° respectively. 如請求項1所述之用於積層製造之表面輪廓與溫度監測系統,其中該擴束鏡組係由一凹透鏡與一凸透鏡組成。 A surface profile and temperature monitoring system for layered manufacturing as described in claim 1, wherein the beam expander assembly is composed of a concave lens and a convex lens. 如請求項1所述之用於積層製造之表面輪廓與溫度監測系統,其中該計算機單元係提供一座標資訊,計算出該雷射光束當前所照射區域座標的待測表面之高度影像,彙整該區域全部座標的高度影像後,得到該待測表面之整體表面輪廓影像。 As described in claim 1, the surface profile and temperature monitoring system for laminated manufacturing, wherein the computer unit provides coordinate information, calculates the height image of the surface to be measured of the coordinates of the area currently irradiated by the laser beam, and after integrating the height images of all coordinates of the area, obtains the overall surface profile image of the surface to be measured. 如請求項1所述之用於積層製造之表面輪廓與溫度監測系統,其中該光電轉換模組內部係具有複數光偵測器。 A surface profile and temperature monitoring system for multilayer manufacturing as described in claim 1, wherein the photoelectric conversion module has a plurality of photodetectors inside.
TW112149326A 2023-12-15 2023-12-15 Surface profile and temperature monitoring system for laminate manufacturing TWI882588B (en)

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