TWI881580B - Display apparatus with array of light emitting diodes and method of manufacturing the same - Google Patents
Display apparatus with array of light emitting diodes and method of manufacturing the same Download PDFInfo
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本發明是有關於一種顯示器及其製造方法,且特別是有關於一種具有發光二極體陣列之顯示器及其製造方法。 The present invention relates to a display and a manufacturing method thereof, and in particular to a display having a light-emitting diode array and a manufacturing method thereof.
隨著發光二極體(LED)技術的成熟與演進,直接利用LED達到自發光顯示畫素的全彩LED顯示器或微型(Micro)LED顯示器的技術也正蓬勃發展中,其應用領域相較於TFT-LCD更為廣泛,包含軟性、透明顯示器,為一可行性高的次世代平面顯示器技術。然而在商業化上,仍有不少的成本與技術瓶頸存在,亟待克服。例如,已知之一主動式發光二極體陣列之顯示器,利用於電極上製作接點(bumps)來電性連接一驅動基板與一發光二極體陣列。然而,此連接方式不但製程困難,接點與發光二極體的電極之間的對位也不容易。再者沒有底材支撐於驅動基板與發光二極體陣列之間,因此用以形成發光二極體陣列的基板(例如藍寶石基板)無法移除。而基板的存在會影響像素之間光訊號,造成互相干擾(cross-talk),影響顯示品質。 With the maturity and evolution of light-emitting diode (LED) technology, the technology of full-color LED display or micro LED display that directly uses LED to achieve self-luminous display pixels is also booming. Its application field is wider than TFT-LCD, including flexible and transparent displays. It is a highly feasible next-generation flat-panel display technology. However, in commercialization, there are still many cost and technical bottlenecks that need to be overcome. For example, a display with an active light-emitting diode array is known, which uses contacts (bumps) on the electrodes to electrically connect a driving substrate and a light-emitting diode array. However, this connection method is not only difficult to process, but also difficult to align the contacts with the electrodes of the light-emitting diodes. Furthermore, there is no substrate supporting the driving substrate and the LED array, so the substrate (such as a sapphire substrate) used to form the LED array cannot be removed. The presence of the substrate will affect the optical signal between pixels, causing cross-talk and affecting the display quality.
本發明係有關於一種具有發光二極體陣列之顯示器及其製造方法,實施例中,利用於一驅動基板和一發光二極體陣列之間形成黏結層,使原先用以形成發光二極體陣列的長晶基板可以在設置黏結層之後移除,因而解決像素之間光訊號互相干擾的問題。 The present invention relates to a display having a light-emitting diode array and a manufacturing method thereof. In an embodiment, a bonding layer is formed between a driving substrate and a light-emitting diode array, so that the crystal growth substrate originally used to form the light-emitting diode array can be removed after the bonding layer is set, thereby solving the problem of mutual interference of optical signals between pixels.
根據一實施例,係提出一種顯示器,包括具有複數個電控元件之一基板;一發光二極體陣列(LED array),包括一半導體層和複數個發光單元形成於半導體層上;形成於半導體層上之複數個第一電極;形成於基板和發光二極體陣列之間的一黏結層;和複數個波長轉換元件,形成於半導體層上並與發光單元位於半導體層的不同側,波長轉換元件的位置與發光單元之位置相對應,其中波長轉換元件係彼此相距一距離。 According to one embodiment, a display is provided, comprising a substrate having a plurality of electronically controlled elements; a light emitting diode array (LED array), comprising a semiconductor layer and a plurality of light emitting units formed on the semiconductor layer; a plurality of first electrodes formed on the semiconductor layer; a bonding layer formed between the substrate and the light emitting diode array; and a plurality of wavelength conversion elements formed on the semiconductor layer and located on different sides of the semiconductor layer from the light emitting units, the positions of the wavelength conversion elements corresponding to the positions of the light emitting units, wherein the wavelength conversion elements are separated from each other by a distance.
根據一實施例,係提出一種顯示器,包括:具有複數個電控元件之一基板;一發光二極體陣列(LED array),包括一半導體層和複數個發光單元形成於半導體層上;形成於半導體層上之複數個第一電極;和一黏結層,包括一黏結材料和複數個連接金屬位於黏結材料中,黏結材料填充於基板和發光二極體陣列之間,連接金屬包括:分別對應發光單元的多個第一部份,和對應於第一電極之至少一部分的多個第二部份,其中,該些第一部份之高度係不同於該些第二部份之高度。 According to one embodiment, a display is provided, comprising: a substrate having a plurality of electronic control elements; a light-emitting diode array (LED array), comprising a semiconductor layer and a plurality of light-emitting units formed on the semiconductor layer; a plurality of first electrodes formed on the semiconductor layer; and a bonding layer, comprising a bonding material and a plurality of connecting metals located in the bonding material, the bonding material is filled between the substrate and the light-emitting diode array, and the connecting metal comprises: a plurality of first portions corresponding to the light-emitting units, and a plurality of second portions corresponding to at least a portion of the first electrodes, wherein the height of the first portions is different from the height of the second portions.
根據一實施例,係提出一種顯示器之製造方法,包括:提供一基板,基板具有複數個電控元件;形成複數個連接 導體於基板上,其中連接導體包括複數個第一部份和複數個第二部份;提供一發光二極體陣列,此發光二極體陣列包括一半導體層和複數個發光單元形成於半導體層上;對組發光二極體陣列和基板;形成一黏結層於基板和發光二極體陣列之間;和形成複數個波長轉換元件於半導體層上,且波長轉換元件與發光單元位於該半導體層的不同側,其中波長轉換元件的位置與發光單元之位置相對應,且波長轉換元件係彼此相距一距離。而前述形成黏結層的步驟可以在對組發光二極體陣列和基板的步驟之前或之後進行。 According to an embodiment, a method for manufacturing a display is provided, comprising: providing a substrate having a plurality of electric control elements; forming a plurality of connecting conductors on the substrate, wherein the connecting conductors include a plurality of first portions and a plurality of second portions; providing a light-emitting diode array, wherein the light-emitting diode array includes a semiconductor layer and a plurality of light-emitting units formed on the semiconductor layer; assembling the light-emitting diode array and the substrate; forming a bonding layer between the substrate and the light-emitting diode array; and forming a plurality of wavelength conversion elements on the semiconductor layer, wherein the wavelength conversion elements and the light-emitting units are located on different sides of the semiconductor layer, wherein the positions of the wavelength conversion elements correspond to the positions of the light-emitting units, and the wavelength conversion elements are spaced a distance from each other. The aforementioned step of forming the bonding layer can be performed before or after the step of assembling the LED array and the substrate.
為了對本發明之上述及其他方面有更佳的瞭解,下文特舉實施例,並配合所附圖式詳細說明如下: In order to better understand the above and other aspects of the present invention, the following is a specific example and a detailed description with the attached drawings as follows:
21:基板 21: Substrate
22:接墊 22: Pad
221:第一控制接墊 221: First control pad
222:第二控制接墊 222: Second control pad
31:發光二極體陣列 31: LED array
LU:發光單元 LU: Light emitting unit
310:長晶基板 310: Crystal growth substrate
311、313:半導體層 311, 313: semiconductor layer
311a:第一表面 311a: first surface
311b:第二表面 311b: Second surface
313a:第二導電型半導體層之表面 313a: Surface of the second conductive semiconductor layer
312:活性疊層 312:Active stack
315:絕緣層 315: Insulation layer
316:第一電極 316: First electrode
316P:導電接墊 316P: Conductive pad
316C:連接部 316C:Connection part
3161、3162:走線 3161, 3162: Routing
317:第二電極 317: Second electrode
40、50:黏結層 40, 50: bonding layer
41、51:黏結材料 41, 51: bonding materials
42、52:連接金屬 42, 52: Connecting metal
421、521:第一部份 421, 521: Part 1
422、522:第二部份 422, 522: Part 2
d1:第一部份之高度 d1: Height of the first part
d2、d2’:第二部份之高度 d2, d2’: Height of the second part
45:波長轉換元件 45: Wavelength conversion element
45R:紅色波長轉換元件 45R: Red wavelength conversion element
45G:綠色波長轉換元件 45G: Green wavelength conversion element
45B:藍色波長轉換元件 45B: Blue wavelength conversion element
46:防水層 46: Waterproof layer
410:非導電膠體 410: Non-conductive colloid
420:導電粒子 420: Conductive particles
PR:光阻 PR: Photoresist
PR’:圖案化光阻 PR’: Patterned photoresist
OM:不透明材料 OM: Opaque material
第1圖係繪示根據本發明一實施例之一種發光二極體陣列與電極之上視圖。 Figure 1 shows a top view of a light-emitting diode array and electrodes according to an embodiment of the present invention.
第2圖為本發明一實施例之顯示器之剖面示意圖,其發光二極體陣列與電極係沿第1圖之剖面線2-2所繪示。 Figure 2 is a schematic cross-sectional view of a display according to an embodiment of the present invention, wherein the LED array and the electrode are depicted along the cross-sectional line 2-2 of Figure 1.
第3A-3E圖係繪示本發明一實施例之顯示器的製作方法。 Figures 3A-3E illustrate a method for manufacturing a display according to an embodiment of the present invention.
第4A-4C圖繪示本發明一實施例中一波長轉換元件的其中一種製法示例。 Figures 4A-4C show an example of a method for manufacturing a wavelength conversion element in an embodiment of the present invention.
第5圖係為本發明另一實施例之顯示器之剖面示意圖。 Figure 5 is a schematic cross-sectional view of a display of another embodiment of the present invention.
第6圖係為本發明又一實施例之顯示器之剖面示意圖。 Figure 6 is a cross-sectional schematic diagram of a display of another embodiment of the present invention.
第7圖係為本發明再一實施例之顯示器之剖面示意圖。 Figure 7 is a cross-sectional schematic diagram of a display of another embodiment of the present invention.
第8A、8B圖係繪示本發明一實施例之一接合製程。 Figures 8A and 8B illustrate a bonding process of an embodiment of the present invention.
第9圖係繪示本發明另一實施例之顯示器的剖面示意圖。 Figure 9 is a schematic cross-sectional view of a display according to another embodiment of the present invention.
第10A-10F圖係繪示如第9圖所示之顯示器的其中一種製法。 Figures 10A-10F illustrate one method of manufacturing the display shown in Figure 9.
第11A-11G圖係繪示如第9圖所示之顯示器的其中另一種製法。 Figures 11A-11G illustrate another method of manufacturing the display shown in Figure 9.
第12圖係繪示根據本發明另一實施例之發光二極體陣列與電極之上視圖。 Figure 12 shows a top view of a light-emitting diode array and electrodes according to another embodiment of the present invention.
第13圖為本發明一實施例之顯示器之剖面示意圖,其發光二極體陣列與電極係沿第12圖之剖面線13-13所繪示。 FIG. 13 is a schematic cross-sectional view of a display device according to an embodiment of the present invention, wherein the LED array and the electrode are depicted along the cross-sectional line 13-13 of FIG. 12.
在此揭露內容之實施例中,係提出具有發光二極體陣列之顯示器及其製造方法,利用於一驅動基板(例如CMOS基板)和一發光二極體陣列之間形成黏結層,黏結層包括連接金屬和黏結材料,連接金屬可以提供驅動基板和發光二極體陣列之間的電性連接,而黏結材料則填充於驅動基板和發光二極體陣列之間的空隙並提供支撐。因此,於實施例之顯示器中,原先用以形成發光二極體陣列的長晶基板(例如藍寶石基板)可以在設置黏結層之後移除,而後若依應用需求,可在半導體層上不同於發光單元所在的表面上形成波長轉換層(例如包括量子點螢光粉之波 長轉換元件),完成全彩化。因此,相較於傳統結構,實施例所提出之顯示器不但具有黏結材料可以提供驅動基板和發光二極體陣列之間的支撐力,提升整體結構的穩定度(reliability)。由於移除了長晶基板,除了可以減少顯示器的整體厚度,亦可增加顯示器之可撓性,使應用更為廣泛。若應用於微型發光二極體陣列製造(例如各微型發光二極體係相應於一子像素),則如實施例提出之沒有長晶基板的顯示器結構可以避免子像素之間光訊號互相干擾(cross talk)。再者,實施例所提出之製造方法,可以適用於電極水平位置(/水平高度)相同或不同的發光二極體(特別是N電極與P電極有不同水平位置/水平高度)與驅動基板之間的充填與電性導通,而黏結層中連接金屬與黏結材料之形成也不會對結構中的相關層和組件造成損傷,也毋須採用耗時且昂貴的製造程序,因此實施例提出之結構與製法實適合量產。 In an embodiment of the disclosure, a display having an LED array and a manufacturing method thereof are provided, wherein a bonding layer is formed between a driving substrate (e.g., a CMOS substrate) and an LED array. The bonding layer includes a connecting metal and a bonding material. The connecting metal can provide an electrical connection between the driving substrate and the LED array, while the bonding material fills the gap between the driving substrate and the LED array and provides support. Therefore, in the display of the embodiment, the crystal growth substrate (such as a sapphire substrate) originally used to form the LED array can be removed after the bonding layer is set, and then, if required by the application, a wavelength conversion layer (such as a wavelength conversion element including quantum dot fluorescent powder) can be formed on the semiconductor layer on a surface different from the surface where the light-emitting unit is located to achieve full color. Therefore, compared with the traditional structure, the display proposed in the embodiment not only has a bonding material that can provide support between the driving substrate and the LED array, but also improves the reliability of the overall structure. Since the crystal growth substrate is removed, in addition to reducing the overall thickness of the display, the flexibility of the display can also be increased, making it more widely used. If applied to the manufacture of micro-LED arrays (for example, each micro-LED corresponds to a sub-pixel), the display structure without a crystal growth substrate as proposed in the embodiment can avoid cross talk of optical signals between sub-pixels. Furthermore, the manufacturing method proposed in the embodiment can be applied to the filling and electrical conduction between LEDs with the same or different electrode horizontal positions (/horizontal heights) (especially N-electrodes and P-electrodes with different horizontal positions/horizontal heights) and the driving substrate, and the formation of the connecting metal and the bonding material in the bonding layer will not cause damage to the related layers and components in the structure, and there is no need to adopt time-consuming and expensive manufacturing procedures. Therefore, the structure and manufacturing method proposed in the embodiment are suitable for mass production.
此揭露內容之實施例其應用十分廣泛,以下實施例係以具有微型發光二極體陣列(micro-LED array)之顯示器做舉例說明,但本揭露並不以該些態樣為限。以下係提出相關實施例,配合圖示以詳細說明本揭露所提出之顯示器之相關結構及其製造方法。再者,實施例中相同或類似的標號係用以標示相同或類似之部分,以利清楚說明。然而所提出的實施態樣之敘述,如細部結構、製程步驟和材料應用等等,僅為舉例說明之用,本揭露欲保護之範圍並非僅限於所述之態樣。本揭露並非顯示出所有可能的實施例,相關領域者可在不脫離本揭露之精神和範圍內對 實施例之結構和製程加以變化與修飾,以符合實際應用所需。因此,未於本揭露提出的其他實施態樣也可能可以應用。再者,圖式係已簡化以利清楚說明實施例之內容,圖式上的尺寸比例並非按照實際產品等比例繪製。因此,說明書和圖示內容僅作敘述實施例之用,而非作為限縮本揭露保護範圍之用。 The embodiments of this disclosure have a wide range of applications. The following embodiments are illustrated using a display having a micro-LED array, but the disclosure is not limited to these aspects. The following are related embodiments, with illustrations to illustrate in detail the related structures and manufacturing methods of the display proposed in the disclosure. Furthermore, the same or similar numbers in the embodiments are used to indicate the same or similar parts for the sake of clarity. However, the description of the proposed implementation aspects, such as detailed structures, process steps, and material applications, etc., are only for illustrative purposes, and the scope of protection of the disclosure is not limited to the described aspects. This disclosure does not show all possible embodiments. People in the relevant field may change and modify the structure and process of the embodiments within the spirit and scope of this disclosure to meet the needs of actual applications. Therefore, other embodiments not proposed in this disclosure may also be applicable. Furthermore, the drawings have been simplified to facilitate the clear description of the contents of the embodiments, and the size ratios in the drawings are not drawn in proportion to the actual products. Therefore, the instructions and illustrations are only used to describe the embodiments, and are not used to limit the scope of protection of this disclosure.
再者,說明書與請求項中所使用的序數例如”第一”、”第二”...等之用詞,是為了修飾請求項之元件,其本身並不意含及代表該請求元件有任何之前的序數,也不代表某一請求元件與另一請求元件的順序、或是製造方法上的順序,該些序數的使用僅用來使具有某命名的一請求元件得以和另一具有相同命名的請求元件能作出清楚區分。另外,當述及一第一材料層位於一第二材料層上、之上或上方時,除非特別定義,否則可包括第一材料層與第二材料層直接接觸之情形。或者,亦可能間隔有一或更多其它材料層之情形,在此情形中,第一材料層與第二材料層之間可能不直接接觸。 Furthermore, the ordinal numbers used in the specification and the claim, such as "first", "second", etc., are used to modify the elements of the claim. They do not imply or represent any previous ordinal numbers of the claim element, nor do they represent the order of one claim element and another claim element, or the order of the manufacturing method. The use of these ordinal numbers is only used to make a claim element with a certain name clearly distinguishable from another claim element with the same name. In addition, when it is mentioned that a first material layer is located on, above or above a second material layer, unless specifically defined, it may include the situation where the first material layer and the second material layer are in direct contact. Alternatively, there may be a situation where there are one or more other material layers in between, in which case the first material layer and the second material layer may not be in direct contact.
第1圖係繪示根據本發明一實施例之一種發光二極體陣列與電極之上視圖。於此實施例中,係提出如矩陣排列之一發光二極體陣列,例如是但不限於是微型發光二極體陣列(micro-LED array),如圖中所示之多個發光單元LU,並將N電極製作為一金屬網格(n-metal grid)為一示例;N電極例如包括:位於發光二極體陣列之外圍的多個導電接墊316P(例如N接墊,第1圖中以4個導電接墊316P為例,但並不限制於此)以 及位於相鄰發光單元LU之間的複數個延伸部,包括沿著第一方向D1(例如X方向)延伸之金屬走線3161,和沿著第二方向D2(例如Y方向)上延伸之金屬走線3162,且該些延伸部係電性連接至相應的導電接墊316P。網格狀的N電極可以降低串連電阻值,並使各像素電流路徑的串連電阻值達到接近一致。但本揭露並不以此N電極態樣為限制。 Figure 1 is a top view of a light-emitting diode array and electrodes according to an embodiment of the present invention. In this embodiment, a light-emitting diode array arranged in a matrix is proposed, such as but not limited to a micro-LED array, with a plurality of light-emitting units LU as shown in the figure, and the N electrode is made into a metal grid (n-metal). grid) is an example; the N electrode, for example, includes: a plurality of conductive pads 316P (for example, N pads, four conductive pads 316P are used as an example in FIG. 1, but not limited thereto) located outside the light-emitting diode array, and a plurality of extensions located between adjacent light-emitting units LU, including metal traces 3161 extending along a first direction D1 (for example, X direction), and metal traces 3162 extending along a second direction D2 (for example, Y direction), and these extensions are electrically connected to the corresponding conductive pads 316P. The grid-shaped N electrode can reduce the series resistance value and make the series resistance value of each pixel current path reach nearly the same. However, the present disclosure is not limited to this N electrode state.
另外,於實際製作時,此發光二極體陣列可以是從含有發光二極體之晶圓(LED wafer)切割出來,例如欲製作出1K*1K的發光二極體陣列時,就需要在陣列的兩個方向上各擺放上1000顆LED;切割後再與一驅動基板(例如一CMOS基板)對接。當然,本揭露並不限制於此,於另一製作例中,亦可整片具有發光二極體之晶圓(LED wafer)和驅動基板(例如CMOS基板)對接。第1圖中發光二極體陣列之外圍,如四個角落處係形成有例如十字形之對準記號(alignment marks),供驅動基板與具有發光二極體之晶圓對接時作為對準之用;於此示例中,對準記號例如是(但不限制地)形成於鄰近導電接墊316P之末端處。 In addition, in actual manufacturing, the LED array can be cut from a wafer (LED wafer) containing LEDs. For example, to produce a 1K*1K LED array, 1000 LEDs need to be placed in both directions of the array. After cutting, the array is then connected to a driving substrate (such as a CMOS substrate). Of course, the present disclosure is not limited to this. In another manufacturing example, a whole wafer (LED wafer) containing LEDs can also be connected to a driving substrate (such as a CMOS substrate). In FIG. 1, the periphery of the LED array, such as the four corners, is formed with cross-shaped alignment marks for alignment when the driver substrate is connected to the wafer with the LEDs; in this example, the alignment marks are formed, for example (but not limited to), at the end of the conductive pad 316P.
第2圖為本發明一實施例之顯示器之剖面示意圖,其發光二極體陣列與電極係沿第1圖之剖面線2-2所繪示。實施例之一顯示器包括一發光二極體陣列(LED array)31,與具有多個電控元件之一基板21接合而成。基板21例如是一互補式金氧半導體背板(CMOS backplane)或任何具有控制電路之基 板,與發光二極體陣列電性連接後可控制各像素之電流。發光二極體陣列31具有一半導體層311和複數個發光單元LU形成於半導體層311上;且複數個第一電極316,例如N電極(N electrodes)係形成於半導體層311上。實施例之顯示器更包括一黏結層40形成於基板21和發光二極體陣列31之間。如第2圖所示,黏結層40包括一黏結材料41(例如非導電膠體)和複數個連接金屬42位於黏結材料41中,黏結材料41係填滿基板21和發光二極體陣列31之間的空隙,可提供基板21和發光二極體陣列31接合後之支撐力,並可適當阻隔水氣侵蝕電極與進入發光二極體之材料層中。 FIG. 2 is a schematic cross-sectional view of a display according to an embodiment of the present invention, wherein the LED array and the electrodes are shown along the section line 2-2 of FIG. 1. A display according to an embodiment includes a LED array 31 bonded to a substrate 21 having a plurality of electronically controlled elements. The substrate 21 is, for example, a complementary metal oxide semiconductor backplane (CMOS backplane) or any substrate having a control circuit, which is electrically connected to the LED array to control the current of each pixel. The LED array 31 has a semiconductor layer 311 and a plurality of light emitting units LU formed on the semiconductor layer 311; and a plurality of first electrodes 316, for example, N electrodes (N electrodes) are formed on the semiconductor layer 311. The display of the embodiment further includes an adhesive layer 40 formed between the substrate 21 and the LED array 31. As shown in FIG. 2, the adhesive layer 40 includes an adhesive material 41 (e.g., a non-conductive gel) and a plurality of connecting metals 42 located in the adhesive material 41. The adhesive material 41 fills the gap between the substrate 21 and the LED array 31, and can provide support after the substrate 21 and the LED array 31 are joined, and can properly prevent moisture from corroding the electrode and entering the material layer of the LED.
於實施例中,連接金屬42可包括與發光單元LU相對應之第一部份421,以及與第一電極316之至少一部分相對應之第二部份422。如第2圖所示,連接金屬42包括複數個第一部份421分別對應於發光單元LU,以及複數個第二部份422係對應第一電極316中位於發光二極體陣列31外圍的導電接墊316P。亦即,連接金屬42之第二部份422係對應導電接墊316P。其中,第一部份421之高度d1係不同於第二部份422之高度d2。 In an embodiment, the connection metal 42 may include a first portion 421 corresponding to the light-emitting unit LU, and a second portion 422 corresponding to at least a portion of the first electrode 316. As shown in FIG. 2, the connection metal 42 includes a plurality of first portions 421 corresponding to the light-emitting units LU, and a plurality of second portions 422 corresponding to the conductive pads 316P located outside the light-emitting diode array 31 in the first electrode 316. That is, the second portion 422 of the connection metal 42 corresponds to the conductive pads 316P. The height d1 of the first portion 421 is different from the height d2 of the second portion 422.
再者,實施例之顯示器更包括複數個第二電極317,例如P電極(P electrodes)分別形成於各發光單元LU上,其中連接金屬42之第一部份421係連接於第二電極317。於此微型發光二極體陣列之示例中,P電極(例如第二電極317) 係形成於各發光單元LU,而N電極(例如第一電極316)則為複數個發光單元LU所共用。第一電極316與第二電極317的材料可以為透明導電材料或金屬材料。透明導電材料包括但不限於氧化銦錫(ITO)、氧化銦(InO)、氧化錫(SnO)、氧化鎘錫(CTO)、氧化銻錫(ATO)、氧化鋁鋅(AZO)、氧化錫鋅(ZTO),氧化鎵鋅(GZO)、氧化銦鎢(IWO)、氧化鋅(ZnO)、砷化鋁鎵(AlGaAs)、氮化鎵(GaN)、磷化鎵(GaP)、砷化鎵(GaAs)、砷化鎵磷化物(GaAsP)、氧化銦鋅(IZO)、和類金剛石碳(DLC)。金屬材料包括但不限於鋁(Al)、鉻(Cr)、銅(Cu)、錫(Sn)、金(Au)、鎳(Ni)、鈦(Ti)、鉑(Pt)、鉛(Pb)、鋅(Zn)、鎘(Cd)、銻(Sb)、鈷(Co)、以及包含上述的合金。 Furthermore, the display of the embodiment further includes a plurality of second electrodes 317, such as P electrodes (P electrodes) formed on each light-emitting unit LU, wherein the first portion 421 of the connection metal 42 is connected to the second electrode 317. In this example of the micro light-emitting diode array, the P electrode (such as the second electrode 317) is formed on each light-emitting unit LU, and the N electrode (such as the first electrode 316) is shared by a plurality of light-emitting units LU. The materials of the first electrode 316 and the second electrode 317 can be transparent conductive materials or metal materials. Transparent conductive materials include but are not limited to indium tin oxide (ITO), indium oxide (InO), tin oxide (SnO), cadmium tin oxide (CTO), antimony tin oxide (ATO), aluminum zinc oxide (AZO), tin zinc oxide (ZTO), gallium zinc oxide (GZO), indium tungsten oxide (IWO), zinc oxide (ZnO), aluminum gallium arsenide (AlGaAs), gallium nitride (GaN), gallium phosphide (GaP), gallium arsenide (GaAs), gallium arsenide phosphide (GaAsP), indium zinc oxide (IZO), and diamond-like carbon (DLC). Metal materials include but are not limited to aluminum (Al), chromium (Cr), copper (Cu), tin (Sn), gold (Au), nickel (Ni), titanium (Ti), platinum (Pt), lead (Pb), zinc (Zn), cadmium (Cd), antimony (Sb), cobalt (Co), and alloys thereof.
於此示例中,基板21(具有控制電路)上例如具有複數個接墊22。黏結層40之連接金屬42的另一端係與基板21上的接墊22連接。如第2圖所示,基板21之接墊可包括複數個第一控制接墊221和複數個第二控制接墊222,其中連接金屬42之各第一部份421係分別電性連接第一控制接墊221和第二電極(例如P電極)317,連接金屬42之各第二部份422係分別電性連接第二控制接墊222和位於發光二極體陣列31外圍之導電接墊316P(亦即第一電極316,例如N電極)。於此示例中,導電接墊316P上例如還有連接部316C(connecting portion),所以連接金屬42之第二部份422例如是透過連接部316C而與導電接墊316P(亦即第一電極316)電性連接。再者,於此示例 中,連接部316C的厚度可以等於或是不等於第二電極317的厚度;例如第2圖所示,連接部316C的厚度係略大於第二電極317的厚度,但本揭露對此並不特別限制。 In this example, the substrate 21 (having the control circuit) has, for example, a plurality of pads 22. The other end of the connection metal 42 of the bonding layer 40 is connected to the pad 22 on the substrate 21. As shown in FIG. 2, the pads of the substrate 21 may include a plurality of first control pads 221 and a plurality of second control pads 222, wherein each first portion 421 of the connection metal 42 is electrically connected to the first control pad 221 and the second electrode (e.g., P electrode) 317, respectively, and each second portion 422 of the connection metal 42 is electrically connected to the second control pad 222 and the conductive pad 316P (i.e., the first electrode 316, e.g., N electrode) located outside the LED array 31. In this example, the conductive pad 316P also has a connecting portion 316C, so the second portion 422 of the connecting metal 42 is electrically connected to the conductive pad 316P (i.e., the first electrode 316) through the connecting portion 316C. Furthermore, in this example, the thickness of the connecting portion 316C may be equal to or different from the thickness of the second electrode 317; for example, as shown in FIG. 2, the thickness of the connecting portion 316C is slightly greater than the thickness of the second electrode 317, but the present disclosure does not specifically limit this.
另外,於此示例中,第一電極316如導電接墊316P的水平位置與第二電極317的水平位置不同(例如導電接墊316P的水平位置更接近半導體層311),而導電接墊316P上的連接部316C亦比第二電極317更接近半導體層311,因此如第2圖所示之黏結層40中,連接金屬42的第一部份421之高度d1係小於第二部份422之高度d2。不過,實施例中可應用之發光二極體的電極設置態樣並不僅限於此第2圖之示例,連接金屬42的第一部份421之高度d1與第二部份422之高度d2會受到實際應用時電極配置與相關層厚度之變化而有所調整,而本揭露之實施例實際上係適用高度d1與d2不同甚至相同的任何結構態樣。再者,雖然於此實施例中係以形成連接部316C為例做說明,但於其他實施例中,第一電極上(例如導電接墊316P上),亦可能不具有連接部316C,本揭露對此並不多做限制。 In addition, in this example, the horizontal position of the first electrode 316 such as the conductive pad 316P is different from the horizontal position of the second electrode 317 (for example, the horizontal position of the conductive pad 316P is closer to the semiconductor layer 311), and the connecting portion 316C on the conductive pad 316P is also closer to the semiconductor layer 311 than the second electrode 317. Therefore, in the bonding layer 40 shown in Figure 2, the height d1 of the first portion 421 of the connecting metal 42 is smaller than the height d2 of the second portion 422. However, the electrode configuration of the light-emitting diode applicable in the embodiment is not limited to the example of Figure 2. The height d1 of the first part 421 of the connection metal 42 and the height d2 of the second part 422 will be adjusted according to the changes in the electrode configuration and the thickness of the relevant layers in actual application. The embodiment disclosed in this disclosure is actually applicable to any structural configuration with different or even the same height d1 and d2. Furthermore, although the connection portion 316C is formed as an example in this embodiment, in other embodiments, the first electrode (for example, the conductive pad 316P) may not have the connection portion 316C, and this disclosure does not impose any restrictions on this.
再者,實施例中可應用之發光二極體結構態樣,包括相關半導體層與量子井層之層數與配置、電極設置、各層材料以及材料激發後所發出之光色等等,本揭露並不多做限制,第2圖僅簡單繪示其中一種可應用之發光二極體的結構態樣。如第2圖所示,一示例之半導體層311例如是一第一導電型半導體層,而各發光單元LU係包括一活性疊層312(例如多重量子井 (Multiple Quantum Well,MQW)和一第二導電型半導體層313形成於活性疊層312上,其中第二電極317係分別形成於各發光單元LU之第二導電型半導體層313上。於一示例中,第一導電型和第二導電型例如分別是N型和P型。 Furthermore, the applicable LED structural aspects in the embodiments include the number and configuration of the relevant semiconductor layers and quantum well layers, the electrode settings, the materials of each layer, and the color of light emitted after the materials are excited, etc. The present disclosure does not impose any restrictions, and FIG. 2 simply illustrates one of the applicable LED structural aspects. As shown in FIG. 2, an example semiconductor layer 311 is, for example, a first conductivity type semiconductor layer, and each light emitting unit LU includes an active stack 312 (e.g., multiple quantum wells (MQW)) and a second conductivity type semiconductor layer 313 formed on the active stack 312, wherein the second electrode 317 is formed on the second conductivity type semiconductor layer 313 of each light emitting unit LU. In an example, the first conductivity type and the second conductivity type are, for example, N-type and P-type, respectively.
實施例中,第一導電型半導體層311和第二導電型半導體層313例如為包覆層(cladding layer)或限制層(confinement layer),可分別提供電子、電洞,使電子、電洞於活性疊層312中結合發光。第一導電型半導體層311、活性疊層312、及第二導電型半導體層313可包含III-V族半導體材料,例如AlxInyGa(1-x-y)N或AlxInyGa(1-x-y)P,其中0≦x、y≦1;(x+y)≦1。依據活性疊層312之材料,發光單元LU可發出一峰值介於580nm和700nm之間的紅光,峰值介於530nm及570nm之間的綠光,峰值介於450nm及490nm之間的藍光,或峰值介於380nm及420nm之間,例如是400nm的UV光。於一示例中,第一導電型半導體層311係為N-GaN,活性疊層312係為多重量子井(MQW),一第二導電型半導體層313係為P-GaN,各發光單元LU發出峰值介於450nm及490nm之間的藍光,之後可透過波長轉換元件例如包括量子點螢光粉(Quantum dot phosphors,QD phosphors)之紅色波長轉換元件和綠色波長轉換元件的設置,完成全彩化。 In an embodiment, the first conductive semiconductor layer 311 and the second conductive semiconductor layer 313 are, for example, cladding layers or confinement layers, which can provide electrons and holes respectively, so that the electrons and holes are combined in the active stack 312 to emit light . The first conductive semiconductor layer 311, the active stack 312, and the second conductive semiconductor layer 313 can include III-V semiconductor materials, such as AlxInyGa (1-xy) N or AlxInyGa (1- xy ) P, where 0≦x, y≦1; (x+y)≦1. Depending on the material of the active stack 312, the light emitting unit LU can emit red light with a peak between 580nm and 700nm, green light with a peak between 530nm and 570nm, blue light with a peak between 450nm and 490nm, or UV light with a peak between 380nm and 420nm, such as 400nm. In one example, the first conductive semiconductor layer 311 is N-GaN, the active stack 312 is a multiple quantum well (MQW), and the second conductive semiconductor layer 313 is P-GaN. Each light-emitting unit LU emits blue light with a peak value between 450nm and 490nm. Full colorization can then be achieved through the provision of wavelength conversion elements such as red wavelength conversion elements and green wavelength conversion elements including quantum dot phosphors (QD phosphors).
再者,於一示例中,顯示器更包括一絕緣層315覆蓋半導體層311和發光單元LU,且絕緣層315暴露出各發光 單元LU之第二導電型半導體層313的部分表面313a,各第二電極317(例如P電極)係形成於表面313a上與第二導電型半導體層313接觸,其中黏結層40之連接金屬42的第一部份421係分別連接各發光單元LU的第二電極317,如第2圖所示。 Furthermore, in one example, the display further includes an insulating layer 315 covering the semiconductor layer 311 and the light-emitting unit LU, and the insulating layer 315 exposes a portion of the surface 313a of the second conductive type semiconductor layer 313 of each light-emitting unit LU, and each second electrode 317 (e.g., P electrode) is formed on the surface 313a and contacts the second conductive type semiconductor layer 313, wherein the first portion 421 of the connection metal 42 of the bonding layer 40 is respectively connected to the second electrode 317 of each light-emitting unit LU, as shown in FIG. 2.
根據本揭露提出之實施例,除了黏結層40中的連接金屬42可提供基板21和發光二極體陣列31之間的電性連接,黏結層40中的黏結材料41則填充於基板21和發光二極體陣列31之間的空隙以提供支撐,因此,原先用以形成發光二極體陣列的長晶基板(例如藍寶石基板)可以在形成黏結層40後(包括形成連接金屬42)移除,而後可於半導體層311上不同於發光單元LU所在的表面上形成波長轉換元件45,例如量子點螢光粉(QD phosphors),以完成全彩化。以下係提出一種顯示器之製作方法,以作示例說明。 According to the embodiment disclosed in the present invention, in addition to the connection metal 42 in the bonding layer 40 providing electrical connection between the substrate 21 and the LED array 31, the bonding material 41 in the bonding layer 40 fills the gap between the substrate 21 and the LED array 31 to provide support. Therefore, the crystal growth substrate (such as a sapphire substrate) originally used to form the LED array can be removed after forming the bonding layer 40 (including forming the connection metal 42), and then a wavelength conversion element 45, such as quantum dot phosphors (QD phosphors), can be formed on the semiconductor layer 311 on a surface different from the light-emitting unit LU to complete full colorization. The following is a method for manufacturing a display for example.
第3A-3E圖係繪示本發明一實施例之顯示器的製作方法。第3A-3E圖與第2圖中相同之元件係沿用相同標號,以利清楚說明。如第3A圖所示,係分別提供一基板21(例如一CMOS背板)和一發光組件(例如一LED晶圓),發光組件包括了一長晶基板310以及如前述之發光二極體陣列31、絕緣層315、第一電極316、第二電極317。基板21與發光二極體陣列31所包括之元件配置細節,請參照上述內容,在此不贅述。於一示例中,長晶基板310例如是圖形化之一藍寶石基板,可利用例如有機金屬化學氣相沈積(metal organic chemical-vapor deposition,MOCVD)的方式生長出例如包含有氮化鎵(GaN)的磊晶層。 Figures 3A-3E illustrate a method for manufacturing a display according to an embodiment of the present invention. The same reference numerals are used for the same components as those in Figure 2 for the sake of clarity. As shown in Figure 3A, a substrate 21 (e.g., a CMOS backplane) and a light-emitting component (e.g., an LED wafer) are provided, respectively. The light-emitting component includes a crystal growth substrate 310 and the aforementioned light-emitting diode array 31, an insulating layer 315, a first electrode 316, and a second electrode 317. For the details of the configuration of the components included in the substrate 21 and the light-emitting diode array 31, please refer to the above content and will not be repeated here. In one example, the crystal growth substrate 310 is, for example, a patterned sapphire substrate, and an epitaxial layer including, for example, gallium nitride (GaN) can be grown using, for example, metal organic chemical-vapor deposition (MOCVD).
之後,形成一黏結層40,包括黏結材料41和複數個連接金屬42,於基板21和發光二極體陣列31之間,如第3B圖所示。其中,連接金屬42包括對應發光單元LU的第一部份421,以及對應第一電極例如導電接墊316P的第二部份422。連接金屬42之配置細節,請參照上述內容,在此不贅述。 Afterwards, a bonding layer 40 is formed, including bonding material 41 and a plurality of connection metals 42, between the substrate 21 and the light-emitting diode array 31, as shown in FIG. 3B. The connection metal 42 includes a first portion 421 corresponding to the light-emitting unit LU, and a second portion 422 corresponding to the first electrode, such as the conductive pad 316P. For the configuration details of the connection metal 42, please refer to the above content, which will not be elaborated here.
基板21和包括發光二極體陣列31的發光組件(例如LED晶圓)完成接合後,黏結材料41係填充基板21和發光組件之間的空隙,以做支撐。接著,如第3C圖所示,可移除長晶基板310。一示例中,可利用雷射剝離(Laser lift-off)方式移除長晶基板310。 After the substrate 21 and the light-emitting component (such as an LED wafer) including the light-emitting diode array 31 are bonded, the bonding material 41 fills the gap between the substrate 21 and the light-emitting component for support. Then, as shown in FIG. 3C , the crystal growth substrate 310 can be removed. In one example, the crystal growth substrate 310 can be removed by laser lift-off.
之後,如第3D圖所示,由於有黏結材料41的支撐,可在半導體層311上於不同發光單元LU所在的表面上形成波長轉換元件45,其材料例如是量子點(Quantum dot,QD,為一種高效的螢光發光晶體)。於一示例中,當QD受到短波長(高能量)的藍光激發後,會放出長波長(低能量)的光子,放出的光子具有狹窄光譜分布與可調控性峰值,可藉由控制QD的製程控制尺寸大小、調整峰值及尺寸的分布,使其具有窄光譜分布特性,因而達到轉換不同光色。例如,在發光單元LU包括藍光GaN層之示例中,可包括多個紅色波長轉換元件45R和多個 綠色波長轉換元件45G。其中一個紅色波長轉換元件45R(發出峰值介於580nm和700nm之間的紅光)設置於一個發光單元LU之上、一個綠色波長轉換元件45G(發出峰值介於530nm及570nm之間的綠光)設置於一個發光單元LU之上和沒有設置波長轉換元件於其上的一個發光單元LU(藍光GaN層發出峰值介於450nm及490nm之間的藍光)構成一個RGB像素,據此形成多個RGB像素,以完成全彩化顯示。於一示例中,半導體層311例如具有相對之第一表面311a和第二表面311b(亦即,上下表面),其中第一表面311a係朝向基板21;而發光單元LU形成於第一表面311a上,波長轉換元件45(例如紅色波長轉換元件45R和綠色波長轉換元件45G)形成於第二表面311b上且分別與不同的發光單元LU之位置相對應,其中該些波長轉換元件45係彼此相距一距離。根據實施例,沒有長晶基板的顯示器結構,可以避免像素之間光訊號互相干擾(cross talk),也可減少顯示器的整體厚度和增加可撓性。 Afterwards, as shown in FIG. 3D, due to the support of the bonding material 41, a wavelength conversion element 45 can be formed on the semiconductor layer 311 on the surface where different light-emitting units LU are located. The material thereof is, for example, a quantum dot (QD, which is a highly efficient fluorescent light-emitting crystal). In one example, when the QD is excited by short-wavelength (high-energy) blue light, it will emit long-wavelength (low-energy) photons. The emitted photons have a narrow spectrum distribution and an adjustable peak value. The size of the QD can be controlled by controlling the process, and the peak value and size distribution can be adjusted to have a narrow spectrum distribution characteristic, thereby achieving conversion of different light colors. For example, in an example where the light-emitting unit LU includes a blue light GaN layer, a plurality of red wavelength conversion elements 45R and a plurality of green wavelength conversion elements 45G can be included. A red wavelength conversion element 45R (emitting red light with a peak value between 580nm and 700nm) is arranged on a light-emitting unit LU, a green wavelength conversion element 45G (emitting green light with a peak value between 530nm and 570nm) is arranged on a light-emitting unit LU, and a light-emitting unit LU without a wavelength conversion element thereon (the blue light GaN layer emits blue light with a peak value between 450nm and 490nm) constitutes an RGB pixel, thereby forming multiple RGB pixels to achieve full-color display. In one example, the semiconductor layer 311 has a first surface 311a and a second surface 311b (i.e., upper and lower surfaces) facing each other, wherein the first surface 311a faces the substrate 21; and the light-emitting unit LU is formed on the first surface 311a, and the wavelength conversion element 45 (e.g., the red wavelength conversion element 45R and the green wavelength conversion element 45G) is formed on the second surface 311b and corresponds to the positions of different light-emitting units LU, respectively, wherein the wavelength conversion elements 45 are separated from each other by a distance. According to the embodiment, the display structure without a crystal growth substrate can avoid cross talk between pixels, and can also reduce the overall thickness of the display and increase flexibility.
接著,如第3E圖所示,係形成一防水層46於半導體層之第二表面311b上並覆蓋波長轉換元件45(45R/45G)。於一示例中,波長轉換元件45例如為量子點(QD)螢光粉材料層,防水層46係為一透明防水膜,其材質例如是環氧樹脂(epoxy)或其他可以阻絕水氣之具有高度透光性(例如對於發光單元所發出的光的穿透係數大於90%)的材料,以保護容易受水氣影響特性的量子點螢光粉材料。 Next, as shown in FIG. 3E , a waterproof layer 46 is formed on the second surface 311b of the semiconductor layer and covers the wavelength conversion element 45 (45R/45G). In one example, the wavelength conversion element 45 is, for example, a quantum dot (QD) fluorescent powder material layer, and the waterproof layer 46 is a transparent waterproof film, the material of which is, for example, epoxy or other materials with high light transmittance (for example, the transmittance coefficient of the light emitted by the light-emitting unit is greater than 90%) that can block water vapor, so as to protect the quantum dot fluorescent powder material whose characteristics are easily affected by water vapor.
再者,於上述如第3D圖所示之步驟中,可利用微影(lithography)製程形成波長轉換元件。請參照第4A-4C圖,其繪示本發明一實施例中一波長轉換元件的一種製法。如第4A圖所示,係形成一光阻PR於半導體層311上;接著,利用曝光顯影形成一圖案化光阻PR’,如第4B圖所示。其中,圖案化光阻PR’包括開口其對應後續形成紅色波長轉換元件45R之位置。然後,形成紅色波長轉換元件45R和去除圖案化光阻PR’,如第4C圖所示。同樣地,可利用如第4A-4C圖之步驟形成綠色波長轉換元件45G,以完成如第3D圖所示之波長轉換元件45之製作。 Furthermore, in the above-mentioned step as shown in FIG. 3D, a wavelength conversion element can be formed by a lithography process. Please refer to FIG. 4A-4C, which illustrates a method for manufacturing a wavelength conversion element in an embodiment of the present invention. As shown in FIG. 4A, a photoresist PR is formed on the semiconductor layer 311; then, a patterned photoresist PR' is formed by exposure and development, as shown in FIG. 4B. Among them, the patterned photoresist PR' includes an opening corresponding to the position of the subsequent formation of the red wavelength conversion element 45R. Then, the red wavelength conversion element 45R is formed and the patterned photoresist PR' is removed, as shown in FIG. 4C. Similarly, the green wavelength conversion element 45G can be formed by the steps of FIG. 4A-4C to complete the manufacture of the wavelength conversion element 45 shown in FIG. 3D.
另外,雖然於上述示例中,係以發光單元LU包括藍光GaN層以及形成紅色波長轉換元件45R和綠色波長轉換元件45G為例做說明(如第2、3A-3E圖),但本揭露並不限制於此態樣。於實際應用中,係依發光單元LU發出之光色做波長轉換元件的適當設置。例如於一應用例中,如發光單元LU包括紫外光(UV)LED,則需設置藍色波長轉換元件,以將非可見光的UV光轉換成藍光。第5圖係為本發明另一實施例之顯示器之剖面示意圖。第5圖與第3D圖中相同元件係標示相同標號,以利清楚說明,且該些元件之內容請參照如上,此處不重複贅述。如第5圖之示例中,於半導體層311上係形成紅色波長轉換元件45、綠色波長轉換元件45G和藍色波長轉換元件45B,據此形成RGB像素,完成全彩化顯示。 In addition, although in the above examples, the light-emitting unit LU includes a blue light GaN layer and forms a red wavelength conversion element 45R and a green wavelength conversion element 45G as an example for explanation (such as Figures 2, 3A-3E), the present disclosure is not limited to this state. In actual applications, the wavelength conversion element is appropriately set according to the color of light emitted by the light-emitting unit LU. For example, in an application example, if the light-emitting unit LU includes an ultraviolet (UV) LED, a blue wavelength conversion element is required to convert non-visible UV light into blue light. Figure 5 is a cross-sectional schematic diagram of a display of another embodiment of the present invention. The same components in Figure 5 and Figure 3D are marked with the same numbers for the sake of clarity, and the contents of these components are referred to above and will not be repeated here. As shown in the example of Figure 5, a red wavelength conversion element 45, a green wavelength conversion element 45G, and a blue wavelength conversion element 45B are formed on the semiconductor layer 311, thereby forming RGB pixels to achieve full-color display.
再者,於一些實施例中,更可於波長轉換元件外圍形成低透光性材料或非透光性材料,例如不透明材料。第6圖係為本發明又一實施例之顯示器之剖面示意圖。第6圖與第3D圖中相同元件係標示相同標號,以利清楚說明,且該些元件之內容請參照如上,此處不重複贅述。如第6圖之示例中,於半導體層311上該些波長轉換元件之外圍係形成不透明材料OM,例如圍繞紅色波長轉換元件45R和綠色波長轉換元件45G的四周,以減少光相互干擾(cross-talk)的情形。不透明材料例如是黑色、白色或其他不透明材料,如:黑色顏料、白色顏料,黑色顏料的材料例如炭黑(Carbon Black),白色顏料例如氧化鈦、二氧化矽、氧化鋁、氧化鎂、氧化鋅、硫化鋅、氧化鋯。 Furthermore, in some embodiments, a low-light-transmittance material or a non-light-transmittance material, such as an opaque material, may be formed on the periphery of the wavelength conversion element. FIG. 6 is a cross-sectional schematic diagram of a display of another embodiment of the present invention. The same components in FIG. 6 and FIG. 3D are labeled with the same reference numerals for the sake of clarity, and the contents of these components are referred to above and are not repeated here. As in the example of FIG. 6, an opaque material OM is formed on the periphery of the wavelength conversion elements on the semiconductor layer 311, such as around the red wavelength conversion element 45R and the green wavelength conversion element 45G, to reduce light cross-talk. Opaque materials are, for example, black, white or other opaque materials, such as black pigment, white pigment, black pigment materials such as carbon black, white pigment materials such as titanium oxide, silicon dioxide, aluminum oxide, magnesium oxide, zinc oxide, zinc sulfide, zirconium oxide.
另外,第7圖係為本發明再一實施例之顯示器之剖面示意圖。第7圖與第2圖中相同或類似之元件係標示相同或類似的標號,以利清楚說明。於此示例中,第一電極316(如導電接墊316P)的水平位置與第二電極317的水平位置不同(例如導電接墊316P的水平位置更接近半導體層311)。於此示例中,在第一電極上方,例如導電接墊316P上,並沒有形成連接部316C,因此如第7圖所示之連接金屬42,其第二部份422係直接連接導電接墊316P(亦即第一電極)與基板21之第二控制接墊222;換句話說,第7圖中之第二部份422之高度d2’係大於第2圖中第二部份422之高度d2。當然,實施例中可應用之連接金屬42的第一部份421與第二部份422之設置態樣,以及第一 電極316與第二電極317的相對水平位置並不僅限於如第2、7圖之示例。連接金屬之高度d1與d2不同或者接近,以及第一電極316與第二電極317的水平位置不同或者接近,皆屬本揭露實施例可應用之結構態樣,然而對於第一電極316與第二電極317的水平位置有明顯落差(i.e.連接金屬之高度d1與d2不同)的結構態樣,實施例提出之製法更可以確保基板21和發光二極體陣列之電極的電性導通。以下係提出其中一種黏結層之製法示例。 In addition, FIG. 7 is a cross-sectional schematic diagram of a display according to another embodiment of the present invention. The same or similar components in FIG. 7 and FIG. 2 are labeled with the same or similar reference numerals for the sake of clarity. In this example, the horizontal position of the first electrode 316 (such as the conductive pad 316P) is different from the horizontal position of the second electrode 317 (for example, the horizontal position of the conductive pad 316P is closer to the semiconductor layer 311). In this example, the connection portion 316C is not formed above the first electrode, for example, on the conductive pad 316P, so the second portion 422 of the connection metal 42 shown in FIG. 7 directly connects the conductive pad 316P (i.e., the first electrode) and the second control pad 222 of the substrate 21; in other words, the height d2' of the second portion 422 in FIG. 7 is greater than the height d2 of the second portion 422 in FIG. 2. Of course, the configuration of the first portion 421 and the second portion 422 of the connection metal 42 that can be applied in the embodiment, and the relative horizontal position of the first electrode 316 and the second electrode 317 are not limited to the examples shown in FIGS. 2 and 7. The heights d1 and d2 of the connection metal are different or close, and the horizontal positions of the first electrode 316 and the second electrode 317 are different or close, which are all applicable structural forms of the disclosed embodiment. However, for the structural form in which the horizontal positions of the first electrode 316 and the second electrode 317 have a significant difference (i.e. the heights d1 and d2 of the connection metal are different), the manufacturing method proposed in the embodiment can ensure the electrical conduction between the substrate 21 and the electrodes of the light-emitting diode array. The following is an example of a manufacturing method of one of the bonding layers.
第8A、8B圖係繪示本發明一實施例之一接合製程。其中,第8A圖為接合製程中加熱前之狀態,第8B圖為接合製程中加熱後之狀態。再者,第8A、8B圖與第3A、3B圖中相同之元件係沿用相同標號,以利清楚說明。於此示例中,係於接合製程中使用一自對組導電膠(self-assembly conductive paste,SAP)。 Figures 8A and 8B illustrate a bonding process of an embodiment of the present invention. Figure 8A shows the state before heating in the bonding process, and Figure 8B shows the state after heating in the bonding process. Furthermore, the same components in Figures 8A and 8B and Figures 3A and 3B are labeled with the same reference numerals for the sake of clarity. In this example, a self-assembly conductive paste (SAP) is used in the bonding process.
如前述,係在基板21(例如一CMOS背板)和一發光組件(例如一LED晶圓,包括了一長晶基板310、發光二極體陣列31、絕緣層315、第一電極316、第二電極317等部件)之間,填入一自對組導電膠(SAP),自對組導電膠(SAP)包括一非導電膠體410和複數個導電粒子420,在未進行加熱前導電粒子420係近似均勻地分散於非導電膠體410中,如第8A圖所示;亦即,導電粒子420在非導電膠體410中對應於第一電極316和第二電極317區域的分布密度係與對應電極以外區域的分 布密度相近。接著,於接合製程中對構裝件進行加熱,例如是在一低溫範圍(例如溫度約140℃~180℃)進行快速加熱(例如加熱時間約30秒~3分鐘),則導電粒子420熔融,與電極接合導通,如第8B圖所示,導電粒子420聚集於對應第一電極316/第二電極317處與控制接墊221/222之間,而構成如上述實施例所述之連接金屬42的第一部份421與第二部份422。而非導電膠體410與未形成連接金屬42的導電粒子420則形成如上述實施例所述之黏結層40的黏結材料41。接合製程後的非導電膠體410亦因加熱而固化。 As mentioned above, a self-assembled conductive gel (SAP) is filled between a substrate 21 (e.g., a CMOS backplane) and a light-emitting component (e.g., an LED wafer, including a crystal growth substrate 310, a light-emitting diode array 31, an insulating layer 315, a first electrode 316, a second electrode 317, etc.). The self-assembled conductive gel (SAP) includes a non-conductive gel 410 and a plurality of conductive particles 420. Before heating, the conductive particles 420 are approximately uniformly dispersed in the non-conductive gel 410, as shown in FIG. 8A; that is, the distribution density of the conductive particles 420 in the non-conductive gel 410 corresponding to the first electrode 316 and the second electrode 317 is similar to the distribution density of the area outside the corresponding electrodes. Next, the assembly is heated during the bonding process, for example, it is rapidly heated (for example, for about 30 seconds to 3 minutes) in a low temperature range (for example, a temperature of about 140°C to 180°C), and the conductive particles 420 are melted and connected to the electrodes. As shown in FIG. 8B , the conductive particles 420 are gathered between the corresponding first electrode 316/second electrode 317 and the control pad 221/222, and form the first part 421 and the second part 422 of the connection metal 42 as described in the above embodiment. The non-conductive colloid 410 and the conductive particles 420 that do not form the connection metal 42 form the bonding material 41 of the bonding layer 40 as described in the above embodiment. The non-conductive colloid 410 after the bonding process is also solidified by heating.
其中,導電粒子420包含有熔點低於300℃的金屬材料。金屬材料可以是元素、化合物、或合金,例如:鉍(Bi)、錫(Sn)、銀(Ag)、銦(In)、或其合金(例如:錫鉍銀合金)。當導電粒子420為合金時,導電粒子420的熔點是指合金的共晶點。非導電膠體410可以是熱固性聚合物,例如:環氧樹脂(epoxy)、矽氧樹脂(silicone)、聚甲基丙烯酸甲酯、以及環硫化物(episulfide)。非導電膠體410可以在固化溫度下固化。於示例中,導電粒子420的熔點例如低於非導電膠體410的固化溫度。如第8A圖所示,在加熱步驟之前,導電粒子420的粒徑被定義為導電粒子420的直徑,而兩個相鄰的第二電極317之間的最短距離優選地是導電粒子420的粒徑的兩倍以上。於一示例中,導電粒子420例如是錫球;於一示例中,錫球粒徑係在1μm至50μm範圍之間(1μm錫球粒徑50μm)。但該些數值僅 提出做為舉例說明,而非用以限制本揭露之用。 The conductive particles 420 include a metal material having a melting point lower than 300° C. The metal material may be an element, a compound, or an alloy, such as bismuth (Bi), tin (Sn), silver (Ag), indium (In), or an alloy thereof (e.g., tin-bismuth-silver alloy). When the conductive particles 420 are alloys, the melting point of the conductive particles 420 refers to the eutectic point of the alloy. The non-conductive colloid 410 may be a thermosetting polymer, such as epoxy, silicone, polymethyl methacrylate, and episulfide. The non-conductive colloid 410 may be cured at a curing temperature. In an example, the melting point of the conductive particles 420 is, for example, lower than the curing temperature of the non-conductive colloid 410. As shown in FIG. 8A , before the heating step, the particle size of the conductive particle 420 is defined as the diameter of the conductive particle 420, and the shortest distance between two adjacent second electrodes 317 is preferably more than twice the particle size of the conductive particle 420. In one example, the conductive particle 420 is, for example, a solder ball; in one example, the particle size of the solder ball is in the range of 1 μm to 50 μm (1 μm Tin ball diameter 50 μm). However, these values are only provided as examples and are not intended to limit the present disclosure.
對於第一電極316與第二電極317的水平位置不同(連接金屬之高度d1與d2不同)的結構態樣,若是使用異方性導電膜(ACF)壓合,以分別接合第一電極316/第二電極317與基板21上的控制接墊221/222,則不等高的第一電極316與第二電極317在壓合時可能會有受力不均的現象產生,導致第二電極317與控制基板之間導通不良。因此,相較於傳統於電極上鍍製接點(bumps)、或是使用異方性導電膜(ACF)接合的方式,實施例所提出之黏結層製法,例如利用上述SAP(加熱後可自對組之特性,無須加壓),可以確保基板21和發光二極體電極之間的電性導通,也避免了受力不均的現象產生,特別是第一電極316與第二電極317的水平位置不同(連接金屬之高度d1與d2不同)的結構態樣。再者,也由於SAP具有加熱後可自行組裝之特性,沒有傳統用接點對位不易的問題,製作上亦快速容易,因此適合量產。 For the structural state in which the horizontal positions of the first electrode 316 and the second electrode 317 are different (the heights d1 and d2 of the connecting metal are different), if anisotropic conductive film (ACF) is used for pressing to respectively join the first electrode 316/the second electrode 317 with the control pads 221/222 on the substrate 21, the first electrode 316 and the second electrode 317 of different heights may be subjected to uneven force during pressing, resulting in poor conduction between the second electrode 317 and the control substrate. Therefore, compared with the traditional method of plating contacts (bumps) on the electrodes or using anisotropic conductive film (ACF) for bonding, the bonding layer manufacturing method proposed in the embodiment, such as using the above-mentioned SAP (the characteristic of self-assembly after heating, without pressure), can ensure the electrical conduction between the substrate 21 and the LED electrode, and avoid the phenomenon of uneven force, especially the structural state where the horizontal positions of the first electrode 316 and the second electrode 317 are different (the heights d1 and d2 of the connecting metal are different). Furthermore, because SAP has the characteristic of self-assembly after heating, there is no problem of difficult alignment of traditional contacts, and the manufacturing is also fast and easy, so it is suitable for mass production.
除了如上述示例之自對組異向性導電膠,亦可選用其他材料與製法,以完成實施例之黏結層40的設置。第9圖係繪示本發明另一實施例之顯示器的剖面示意圖。第9圖與第2圖中相同或相似之元件係沿用相同或相似標號,且相同元件之說明請參照上述,於此不贅述。如第9圖所示,於此示例中,黏結層50可包括黏結材料51和複數個連接金屬52,連接金屬52包括複數個第一部份521和複數個第二部份522,其中第一部份 521對應發光單元LU(第二電極317),第二部份522係對應導電接墊316P(第一電極316)。其連接和設置方式之詳細內容請參照上述如第2圖所示之第一部份421與第二部份422。如第2圖所示之一實施例中,連接金屬42例如是由導電粒子420於加熱步驟中熔融並聚集而形成。而如第9圖所示之一實施例中,連接金屬52例如是以曝光顯影方式形成金屬體或其他導電體。可應用之黏結層50的連接金屬52例如是金屬體(metal dots,例如:銦(In)、錫(Sn))或其他導電體(例如柱體、顆粒等不限形狀之導電物),而黏結層50的黏結材料51例如是具有高度透光性的高分子,例如苯並環丁烯(Benzocyclobutene)類高分子(BCB-based polymers)或樹脂。BCB類高分子是具有低介電特性的熱固型高分子,其具有優良的接合能力、抗化學腐蝕性,以及良好接合強度。樹脂的材料例如包括熱固型高分子以及助焊劑,熱固型高分子例如是環氧樹脂。其他具有高度透光性(例如對於發光單元所發出的光的穿透係數大於90%)並具有黏結特性的材料,亦可以應用,並不僅限於BCB類高分子或樹脂。 In addition to the self-organized anisotropic conductive glue as in the above example, other materials and manufacturing methods can also be used to complete the setting of the bonding layer 40 of the embodiment. FIG. 9 is a cross-sectional schematic diagram of a display of another embodiment of the present invention. The same or similar components in FIG. 9 and FIG. 2 use the same or similar labels, and the description of the same components is referred to above, which is not repeated here. As shown in FIG. 9, in this example, the bonding layer 50 may include a bonding material 51 and a plurality of connecting metals 52, and the connecting metal 52 includes a plurality of first parts 521 and a plurality of second parts 522, wherein the first part 521 corresponds to the light-emitting unit LU (the second electrode 317), and the second part 522 corresponds to the conductive pad 316P (the first electrode 316). For details of the connection and setting method, please refer to the first part 421 and the second part 422 shown in Figure 2. In one embodiment shown in Figure 2, the connecting metal 42 is formed by, for example, melting and aggregating the conductive particles 420 in a heating step. In one embodiment shown in Figure 9, the connecting metal 52 is formed by, for example, a metal body or other conductive body by exposure and development. The connecting metal 52 of the applicable bonding layer 50 is, for example, a metal body (metal dots, such as indium (In), tin (Sn)) or other conductive bodies (such as columns, particles, etc., conductive bodies of unlimited shapes), and the bonding material 51 of the bonding layer 50 is, for example, a polymer with high light transmittance, such as benzocyclobutene (BCB)-based polymers or resins. BCB-type polymers are thermosetting polymers with low dielectric properties. They have excellent bonding ability, chemical corrosion resistance, and good bonding strength. Resin materials include thermosetting polymers and flux, and thermosetting polymers are epoxy resins. Other materials with high light transmittance (for example, the transmittance coefficient of the light emitted by the light-emitting unit is greater than 90%) and bonding properties can also be used, not limited to BCB-type polymers or resins.
關於形成如第9圖所示之顯示器,以下係提出其中兩種製法,以做示例說明。 Regarding the formation of the display shown in Figure 9, two of the manufacturing methods are presented below as examples.
第10A-10F圖係繪示如第9圖所示之顯示器的其中一種製法。第10A-10F圖與第3A-3E圖中相同元件係沿用相同標號,且相關元件之內容可以參考前述相關段落。如第10A圖所示,首先提供一基板21(具有控制電路,例如一CMOS背 板),其上例如具有複數個接墊22(例如第一控制接墊221和第二控制接墊222)。接著,形成光阻PR於基板21上方,如第10B圖所示。對光阻PR進行曝光顯影形成圖案化光阻PR’,而於對應後續欲形成之連接金屬52處形成多個開口,如第10C圖所示。之後,透過開口例如以蒸鍍方式形成金屬體(如銦、錫、銅、金、鋁、銀)或其他導電體,以形成連接金屬52的第一部份521和第二部份522,並移除圖案化光阻PR’,如第10D圖所示。接著,第10D圖中的結構與發光二極體陣列31對接,並於基板21及發光二極體陣列之間填入黏結材料51,如第10E圖所示。然後,形成波長轉換元件45(例如45R/45G或45R/45G/45B,視發光單元的光色而定),如第10F圖所示。 Figures 10A-10F illustrate one method of manufacturing the display shown in Figure 9. The same reference numerals are used for the same components in Figures 10A-10F and Figures 3A-3E, and the contents of the related components can refer to the above-mentioned related paragraphs. As shown in Figure 10A, a substrate 21 (having a control circuit, such as a CMOS backplane) is first provided, on which, for example, a plurality of pads 22 (such as a first control pad 221 and a second control pad 222) are provided. Then, a photoresist PR is formed on the substrate 21, as shown in Figure 10B. The photoresist PR is exposed and developed to form a patterned photoresist PR', and a plurality of openings are formed at locations corresponding to the connection metal 52 to be formed later, as shown in Figure 10C. Afterwards, a metal body (such as indium, tin, copper, gold, aluminum, silver) or other conductive body is formed through the opening, for example, by evaporation, to form the first part 521 and the second part 522 of the connecting metal 52, and the patterned photoresist PR' is removed, as shown in FIG. 10D. Then, the structure in FIG. 10D is connected to the LED array 31, and the bonding material 51 is filled between the substrate 21 and the LED array, as shown in FIG. 10E. Then, a wavelength conversion element 45 (such as 45R/45G or 45R/45G/45B, depending on the light color of the light-emitting unit) is formed, as shown in FIG. 10F.
第11A-11G圖係繪示如第9圖所示之顯示器的其中另一種製法。第11A-11G圖與第3A-3E圖中相同元件係沿用相同標號,且相關元件之內容可以參考前述相關段落。如第11A圖所示,首先提供一基板21(具有控制電路,例如一CMOS背板),其上例如具有複數個接墊22(例如第一控制接墊221和第二控制接墊222)。接著,形成光阻PR於基板21上方,如第11B圖所示。對光阻PR進行曝光顯影形成圖案化光阻PR’,而於對應後續欲形成之連接金屬52的第一部份521和第二部份522處形成多個開口,如第11C圖所示。之後,透過開口例如以蒸鍍方式形成金屬體(如銦、錫、銅、金、鋁、銀)或其他導電體,以形成第一部份521和第二部份522,並移除圖案化光阻 PR’,如第11D圖所示。接著,將尚未固化的黏結材料51形成在基板21上並覆蓋連接金屬52,如第11E圖所示。第11E圖中的結構再與發光二極體陣列31對接,如第11F圖所示;於此步驟中係包含熔融第一部份521和第二部份522,因此,第一部份521和第二部份522例如分別與第二電極317和連接部316C接合。黏結材料51在第一部份521和第二部份522分別與第二電極317和連接部316C接合後被固化。 Figures 11A-11G illustrate another method of manufacturing the display shown in Figure 9. The same components in Figures 11A-11G and Figures 3A-3E use the same labels, and the content of the relevant components can refer to the aforementioned relevant paragraphs. As shown in Figure 11A, first, a substrate 21 (having a control circuit, such as a CMOS backplane) is provided, on which, for example, a plurality of pads 22 (such as a first control pad 221 and a second control pad 222) are provided. Then, a photoresist PR is formed above the substrate 21, as shown in Figure 11B. The photoresist PR is exposed and developed to form a patterned photoresist PR', and a plurality of openings are formed at the first portion 521 and the second portion 522 of the connecting metal 52 to be formed subsequently, as shown in Figure 11C. Afterwards, a metal body (such as indium, tin, copper, gold, aluminum, silver) or other conductive body is formed through the opening, for example, by evaporation, to form the first part 521 and the second part 522, and the patterned photoresist PR' is removed, as shown in FIG. 11D. Next, an uncured bonding material 51 is formed on the substrate 21 and covers the connecting metal 52, as shown in FIG. 11E. The structure in FIG. 11E is then connected to the light-emitting diode array 31, as shown in FIG. 11F; in this step, the first part 521 and the second part 522 are melted, so that the first part 521 and the second part 522 are respectively connected to the second electrode 317 and the connecting part 316C, for example. The bonding material 51 is cured after the first portion 521 and the second portion 522 are bonded to the second electrode 317 and the connecting portion 316C, respectively.
根據上述之示例,可先形成連接金屬42/52,再填入黏結材料41/51,並根據選用黏結材料的特性進行適當製程(例如加熱或照光等)以固化黏結材料41/51,完成實施例之黏結層40/50的設置接合。本揭露對於實施例之黏結層的材料與設置方式,例如黏結材料41/51是在基板21(具有控制電路)與發光二極體陣列31對接之前或之後而設置,並不特別限制。 According to the above example, the connection metal 42/52 can be formed first, and then the bonding material 41/51 can be filled, and the bonding material 41/51 can be cured by appropriate processes (such as heating or irradiation) according to the characteristics of the selected bonding material to complete the bonding of the bonding layer 40/50 of the embodiment. The present disclosure does not specifically limit the material and setting method of the bonding layer of the embodiment, such as whether the bonding material 41/51 is set before or after the substrate 21 (with the control circuit) and the light-emitting diode array 31 are connected.
再者,上述示例中,例如第2-9圖,其連接金屬42/52之側壁係直線繪製以做說明,但實際應用時連接金屬42/52的剖面形狀並不侷限於如第2-9圖中所繪之直線形側壁,連接金屬42/52之側壁(或最外側表面)可能呈彎曲形狀或其他例如不規則形狀,係視黏結層的材料選擇和/或製程步驟而定,例如選用SAP作為黏結層時導電粒子420受熱而熔融並聚集於電極處所構成的連接金屬42其側壁可能呈彎曲狀,或者固化黏結材料41/51時可能會使連接金屬42/52的剖面形狀產生變化。因此,實施例所例舉之圖示僅作說明之用,並非用以限制本揭 露。 Furthermore, in the above examples, such as Figure 2-9, the side walls of the connecting metal 42/52 are drawn as straight lines for illustration. However, in actual applications, the cross-sectional shape of the connecting metal 42/52 is not limited to the straight side walls as shown in Figure 2-9. The side walls (or the outermost surface) of the connecting metal 42/52 may be curved or other shapes such as irregular shapes, depending on the material selection and/or process steps of the bonding layer. For example, when SAP is used as the bonding layer, the side walls of the connecting metal 42 formed by the conductive particles 420 being heated and melted and gathered at the electrode may be curved, or the cross-sectional shape of the connecting metal 42/52 may change when the bonding material 41/51 is cured. Therefore, the illustrations in the embodiments are for illustrative purposes only and are not intended to limit the present disclosure.
另外,上述示例,例如第2-9圖係以如第1圖所示之網格狀N電極為例,以做其中實施例之說明,但本揭露並不侷限於此。非網格狀之N電極亦可應用本揭露之實施例。以下係提出其中一種非網格狀之N電極態樣做另一示例之說明。 In addition, the above examples, such as Figures 2-9, use the grid-shaped N electrode shown in Figure 1 as an example to illustrate the embodiments, but the present disclosure is not limited to this. Non-grid-shaped N electrodes can also be applied to the embodiments of the present disclosure. The following is a non-grid-shaped N electrode state as another example.
第12圖係繪示根據本發明另一實施例之發光二極體陣列與電極之上視圖。第13圖為本發明一實施例之顯示器之剖面示意圖,其發光二極體陣列與電極係沿第12圖之剖面線13-13所繪示。請同時參照第12、13圖。第12、13圖與第1、2圖中相同或相似之元件係沿用相同或相似標號,且相同元件之說明請參照上述,於此不贅述。不同於第1圖之網格狀第一電極(例如N電極),如第12圖所示之第一電極係包含位於發光二極體陣列外圍的導電接墊316P(例如N接墊),而沒有設置如第1圖之延伸部例如沿著第一方向D1、第二方向D2(例如X、Y方向)延伸之金屬走線3161、3162。因此如第13圖所示之發光二極體陣列中,並沒有延伸部位於兩兩相鄰的發光單元LU之間。雖然如第12圖示例之非網格狀N電極,其電阻值大於第1圖之網格狀N電極,但亦屬本揭露可應用之N電極態樣其中之一。本揭露並沒有對可應用之N電極態樣多做限制。 FIG. 12 is a top view of an array of light-emitting diodes and electrodes according to another embodiment of the present invention. FIG. 13 is a cross-sectional view of a display according to an embodiment of the present invention, wherein the array of light-emitting diodes and electrodes are depicted along the section line 13-13 of FIG. 12. Please refer to FIG. 12 and FIG. 13 simultaneously. The same or similar components in FIG. 12 and FIG. 13 and FIG. 1 and FIG. 2 are marked with the same or similar reference numerals, and the description of the same components is referred to above, and will not be repeated here. Different from the grid-shaped first electrode (e.g., N electrode) in FIG. 1, the first electrode shown in FIG. 12 includes a conductive pad 316P (e.g., N pad) located outside the LED array, and does not have an extension portion such as metal traces 3161, 3162 extending along the first direction D1 and the second direction D2 (e.g., X and Y directions) as shown in FIG. 1. Therefore, in the LED array shown in FIG. 13, there is no extension portion between two adjacent light-emitting units LU. Although the non-grid-shaped N electrode shown in FIG. 12 has a greater resistance value than the grid-shaped N electrode in FIG. 1, it is also one of the N electrode forms that can be applied in the present disclosure. The present disclosure does not impose many restrictions on the applicable N electrode forms.
根據上述,實施例係提出具有發光二極體陣列之顯示器,包括一驅動基板(例如CMOS基板)、一發光二極體陣列和一黏結層形成於兩者之間,其中黏結層包括連接金屬和黏結 材料,連接金屬可以提供驅動基板和發光二極體陣列之間的電性連接,而黏結材料則填充於驅動基板和發光二極體陣列之間的空隙以提供支撐,並可適當阻隔水氣侵蝕電極與進入發光二極體的材料層中。據此,原先用以形成發光二極體陣列的長晶基板(例如藍寶石基板)可以在設置黏結層之後移除,因此實施例之顯示器不具有長晶基板。若應用於微型發光二極體陣列製造,各微型發光二極體係相應於一子像素,則如實施例提出之沒有長晶基板的顯示器結構可以避免子像素之間光訊號互相干擾。而且沒有長晶基板亦可以減少顯示器的整體厚度,增加顯示器之可撓性,使應用更為廣泛。再者,實施例所提出之製造方法,特別適合用於電極水平位置(/水平高度)不同的發光二極體與驅動基板之間的充填與電性導通,而黏結層中連接金屬與黏結材料之形成也不會對結構中的相關層和組件造成損傷,也毋須採用耗時且昂貴的製造程序,因此實施例提出之結構與製法實適合量產。 According to the above, the embodiment proposes a display with a light-emitting diode array, including a driving substrate (such as a CMOS substrate), a light-emitting diode array and a bonding layer formed therebetween, wherein the bonding layer includes a connection metal and a bonding material, the connection metal can provide electrical connection between the driving substrate and the light-emitting diode array, and the bonding material is filled in the gap between the driving substrate and the light-emitting diode array to provide support, and can properly block moisture from corroding the electrode and entering the material layer of the light-emitting diode. Accordingly, the crystal growth substrate (such as a sapphire substrate) originally used to form the light-emitting diode array can be removed after the bonding layer is set, so the display of the embodiment does not have a crystal growth substrate. If applied to the manufacture of micro-LED arrays, each micro-LED corresponds to a sub-pixel, then the display structure without a crystal growth substrate as proposed in the embodiment can avoid mutual interference of optical signals between sub-pixels. Moreover, the absence of a crystal growth substrate can also reduce the overall thickness of the display, increase the flexibility of the display, and make the application more extensive. Furthermore, the manufacturing method proposed in the embodiment is particularly suitable for filling and electrical conduction between LEDs with different electrode horizontal positions (/horizontal heights) and driving substrates, and the formation of connecting metals and bonding materials in the bonding layer will not cause damage to the relevant layers and components in the structure, and there is no need to adopt time-consuming and expensive manufacturing procedures. Therefore, the structure and manufacturing method proposed in the embodiment are suitable for mass production.
如上述圖示之結構和步驟,是用以敘述本揭露之部分實施例或應用例,本揭露並不限制於上述結構和步驟之範圍與應用態樣。其他不同結構態樣之實施例,例如不同內部組件的已知構件都可能可以應用,其示例之結構和步驟可根據實際應用之條件需求或材料選擇而調整。因此圖示之結構僅為舉例說明之用,而非限制之用。通常知識者當知,應用本揭露之相關結構和步驟過程,例如發光二極體陣列、電極、控制基板等相關元件和層的配置,或是製造步驟等,都可能以依實際應用樣態所需而可 能有相應的調整和變化。 The structures and steps shown in the above diagrams are used to describe some embodiments or application examples of the present disclosure. The present disclosure is not limited to the scope and application of the above structures and steps. Other embodiments with different structural aspects, such as known components of different internal components, may be applicable, and the exemplified structures and steps may be adjusted according to the actual application conditions or material selection. Therefore, the illustrated structure is only for illustrative purposes, not for limitation. Generally speaking, the knowledgeable person should know that the relevant structures and step processes of the present disclosure, such as the configuration of related components and layers such as light-emitting diode arrays, electrodes, control substrates, or manufacturing steps, may be adjusted and changed accordingly according to the actual application requirements.
綜上所述,雖然本發明已以實施例揭露如上,然其並非用以限定本發明。本發明所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾。因此,本發明之保護範圍當視後附之申請專利範圍所界定者為準。 In summary, although the present invention has been disclosed as above by the embodiments, it is not intended to limit the present invention. Those with common knowledge in the technical field to which the present invention belongs can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be subject to the scope of the patent application attached hereto.
21:基板 21: Substrate
221:第一控制接墊 221: First control pad
31:發光二極體陣列 31: LED array
311、313:半導體層 311, 313: semiconductor layer
311b:第二表面 311b: Second surface
312:活性疊層 312:Active stack
316:第一電極 316: First electrode
3162:走線 3162: Routing
317:第二電極 317: Second electrode
41:黏結材料 41: Bonding material
421:第一部份 421: Part 1
d1:第一部份之高度 d1: Height of the first part
45:波長轉換元件 45: Wavelength conversion element
45G:綠色波長轉換元件 45G: Green wavelength conversion element
22:接墊 22: Pad
222:第二控制接墊 222: Second control pad
LU:發光單元 LU: Light emitting unit
311a:第一表面 311a: first surface
313a:第二導電型半導體層之表面 313a: Surface of the second conductive semiconductor layer
315:絕緣層 315: Insulation layer
316P:導電接墊 316P: Conductive pad
316C:連接部 316C:Connection part
40:黏結層 40: Adhesive layer
42:連接金屬 42: Connecting metal
422:第二部份 422: Part 2
d2:第二部份之高度 d2: Height of the second part
45R:紅色波長轉換元件 45R: Red wavelength conversion element
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