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TWI875589B - Method for separating and grouping substrates - Google Patents

Method for separating and grouping substrates Download PDF

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Publication number
TWI875589B
TWI875589B TW113117185A TW113117185A TWI875589B TW I875589 B TWI875589 B TW I875589B TW 113117185 A TW113117185 A TW 113117185A TW 113117185 A TW113117185 A TW 113117185A TW I875589 B TWI875589 B TW I875589B
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substrate
solution
density
protective layer
mixed
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TW113117185A
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TW202543735A (en
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郭建生
劉瑜茹
羅翊誠
鍾念臻
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住華科技股份有限公司
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Priority to CN202410873242.5A priority patent/CN118893745A/en
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29BPREPARATION OR PRETREATMENT OF THE MATERIAL TO BE SHAPED; MAKING GRANULES OR PREFORMS; RECOVERY OF PLASTICS OR OTHER CONSTITUENTS OF WASTE MATERIAL CONTAINING PLASTICS
    • B29B17/00Recovery of plastics or other constituents of waste material containing plastics
    • B29B17/02Separating plastics from other materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29BPREPARATION OR PRETREATMENT OF THE MATERIAL TO BE SHAPED; MAKING GRANULES OR PREFORMS; RECOVERY OF PLASTICS OR OTHER CONSTITUENTS OF WASTE MATERIAL CONTAINING PLASTICS
    • B29B17/00Recovery of plastics or other constituents of waste material containing plastics
    • B29B17/02Separating plastics from other materials
    • B29B2017/0203Separating plastics from plastics
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29BPREPARATION OR PRETREATMENT OF THE MATERIAL TO BE SHAPED; MAKING GRANULES OR PREFORMS; RECOVERY OF PLASTICS OR OTHER CONSTITUENTS OF WASTE MATERIAL CONTAINING PLASTICS
    • B29B17/00Recovery of plastics or other constituents of waste material containing plastics
    • B29B17/02Separating plastics from other materials
    • B29B2017/0213Specific separating techniques
    • B29B2017/0217Mechanical separating techniques; devices therefor
    • B29B2017/0237Mechanical separating techniques; devices therefor using density difference
    • B29B2017/0244Mechanical separating techniques; devices therefor using density difference in liquids

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  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Separation, Recovery Or Treatment Of Waste Materials Containing Plastics (AREA)

Abstract

A method for separating and grouping substrates includes providing a mixture of substrates. The mixture of substrates includes a first substrate and a second substrate that are made of different materials. The first substrate has a first density and the second substrate has a second density, wherein the first density is different from the second density. The method further includes providing a solution that has a third density. At least one of the first density and the second density is different from the third density. The method further includes adding the mixture of substrates into the solution, and the first substrate and the second substrate are separated and positioned at different levels of the solution.

Description

基材分選方法Substrate Sorting Method

本發明是關於一種基材分選方法,特別是關於快速、安全、成本低、且分選效率高的一種基材分選方法。The present invention relates to a substrate sorting method, in particular to a substrate sorting method which is fast, safe, low-cost and has high sorting efficiency.

電子裝置構成中包含大量基材,傳統廢棄電子裝置處理基材的方法多以焚燒為主,但燃燒法容易造成環境汙染,且無法再利用,目前已開發有基材回收方法,以減少對環境的汙染,符合現今逐漸抬頭的環保意識。一些回收後的基材還可以重新製造為其他再生製品,增加經濟效益。Electronic devices contain a large number of substrates. Traditional methods of disposing of substrates from discarded electronic devices are mainly incineration. However, the incineration method easily causes environmental pollution and cannot be reused. Currently, substrate recycling methods have been developed to reduce environmental pollution, which is in line with the current environmental awareness. Some recycled substrates can also be re-manufactured into other recycled products to increase economic benefits.

而電子裝置的回收處理可能會出現大量混和基材待處理。目前將混合基材進行分類的方式大多需要花費較長時間,且便利性較低。以廢棄偏光板為例,其回收處理後所得到的大量混和基材須要進一步分類與進行再生。目前多以傅立葉轉換紅外光譜儀(FTIR)為混合基材進行膜材的辨識與分類,此方法雖可以有效分類混和基材,但耗時且不便。因此,雖然現有的基材分選方式通常足以滿足它們的預期目的,但是它們在所有方面並不是完全令人滿意的。研發者則不斷持續尋求在各方面更佳的基材分選方式。The recycling of electronic devices may result in a large number of mixed substrates to be processed. Currently, most methods of sorting mixed substrates take a long time and are less convenient. Taking discarded polarizing plates as an example, the large number of mixed substrates obtained after recycling need to be further sorted and regenerated. Currently, Fourier transform infrared spectrometers (FTIR) are mostly used to identify and classify mixed substrates. Although this method can effectively classify mixed substrates, it is time-consuming and inconvenient. Therefore, although existing substrate sorting methods are generally sufficient to meet their intended purposes, they are not completely satisfactory in all aspects. Researchers continue to seek better substrate sorting methods in all aspects.

本揭露的一些實施例提供一種基材分選方法,包括:提供一混合基材,包含不同材料的第一基材與第二基材,其中前述第一基材具有第一密度,前述第二基材具有第二密度,前述第一密度不同於前述第二密度;提供一溶液,此溶液具有第三密度,其中前述第一密度和前述第二密度至少其中一者不同於前述第三密度;以及將前述混合基材加入前述溶液中,使前述第一基材與前述第二基材分離而位於前述溶液中的不同位置。Some embodiments of the present disclosure provide a substrate sorting method, comprising: providing a mixed substrate, comprising a first substrate and a second substrate of different materials, wherein the first substrate has a first density, the second substrate has a second density, and the first density is different from the second density; providing a solution, the solution having a third density, wherein at least one of the first density and the second density is different from the third density; and adding the mixed substrate to the solution, so that the first substrate and the second substrate are separated and located at different positions in the solution.

本揭露的一些實施例提供一種基材分選方法,包括:提供上述之混合基材,且此混合基材具有固體重量;提供一容器,此容器具有底面積和高度;將如上所述之溶液加入容器中;通過下式(1)以得到某一分選率下(例如大於90%)時,分選基材所需的一溶液體積, ....式(1) Some embodiments of the present disclosure provide a method for sorting a substrate, comprising: providing the mixed substrate described above, wherein the mixed substrate has a solid weight; providing a container, wherein the container has a bottom area and a height; adding the solution described above into the container; and obtaining a solution volume required for sorting the substrate at a certain sorting rate (e.g., greater than 90%) by the following formula (1): ....Formula (1)

其中X為裝有前述溶液之一容器的底面積,單位cm 2;Y為前述容器的高度,單位cm;Z為前述混合基材的固體重量,單位kg;V為前述溶液的體積,單位L; Wherein X is the bottom area of a container containing the aforementioned solution, in cm 2 ; Y is the height of the aforementioned container, in cm; Z is the solid weight of the aforementioned mixed substrate, in kg; V is the volume of the aforementioned solution, in L;

將前述混合基材加入前述溶液中,使前述第一基材與前述第二基材分離而位於前述溶液中的不同位置。The mixed substrate is added into the solution, so that the first substrate and the second substrate are separated and located at different positions in the solution.

本揭露的一些實施例提供一種基材分選方法,包括:回收廢棄偏光板並經過一處理製程,以提供如上所述之混合基材;提供如上所述之溶液,且將前述混合基材加入前述溶液中,通過溶液密度與基材密度的差異使前述第一基材與前述第二基材分離,而位於前述溶液中的不同位置。Some embodiments of the present disclosure provide a substrate sorting method, comprising: recycling discarded polarizing plates and subjecting them to a treatment process to provide a mixed substrate as described above; providing a solution as described above, and adding the mixed substrate into the solution, separating the first substrate and the second substrate by the difference between the density of the solution and the density of the substrates, and locating them at different positions in the solution.

根據一些實施例,其中偏光板包括一偏光子和黏附於偏光子相對兩側的第一保護層和第二保護層,且上述處理製程包括去除偏光子的碘和溶解偏光子;去除第一保護層和第二保護層上的接著層;以及清洗第一保護層和第二保護層,以得到乾淨的混合基材。According to some embodiments, the polarizing plate includes a polarizer and a first protective layer and a second protective layer adhered to opposite sides of the polarizer, and the above-mentioned processing process includes removing iodine from the polarizer and dissolving the polarizer; removing the bonding layer on the first protective layer and the second protective layer; and cleaning the first protective layer and the second protective layer to obtain a clean mixed substrate.

以下提出各種實施方法或是範例來實行本揭露內容之不同特徵,其中描述具體的元件及其排列方式以闡述本揭露內容,當然這些僅是範例,且不該以此限定本揭露內容的範圍。例如,在描述中提及第一個元件形成在第二個元件上時,其可以包含第一個元件與第二個元件直接接觸的實施例,也可以包含有其他元件形成於第一個元件與第二個元件之間的實施例,其中第一個元件與第二個元件並未直接接觸。在不同實施例與圖式之中,相同或類似的元件符號用以表示相同或類似的元件,但這些相同或類似的元件符號標示僅為了簡單清楚地敘述本揭露內容,不代表所討論的不同實施例及/或結構之間有特定的關係。值得注意的是,實施例的提出,僅用以例示本揭露內容的技術特徵,並非用以限定本揭露內容的申請專利範圍。所屬技術領域中具有通常知識者,將可根據以下的描述,在不脫離本揭露內容的精神範圍內,作均等的修飾與變化。一些實施例中之圖式省略部份元件,以清楚顯示本揭露內容之技術特點。Various implementation methods or examples are presented below to implement different features of the present disclosure, wherein specific elements and their arrangements are described to illustrate the present disclosure, although these are merely examples and should not be used to limit the scope of the present disclosure. For example, when the description mentions that a first element is formed on a second element, it may include an embodiment in which the first element is in direct contact with the second element, and it may also include an embodiment in which other elements are formed between the first element and the second element, wherein the first element and the second element are not in direct contact. In different embodiments and drawings, the same or similar element symbols are used to represent the same or similar elements, but these same or similar element symbol markings are only for the purpose of simply and clearly describing the present disclosure, and do not represent a specific relationship between the different embodiments and/or structures discussed. It is worth noting that the examples are only used to illustrate the technical features of the present disclosure, and are not used to limit the scope of the patent application of the present disclosure. A person with ordinary knowledge in the relevant technical field will be able to make equal modifications and changes based on the following description without departing from the spirit of the present disclosure. Some of the drawings in some embodiments omit some elements to clearly show the technical features of the present disclosure.

此外,其中可能用到與空間相關的用詞,像是「在…下方」、「在…上方」、「在…之間」及類似的用詞,這些關係詞係為了便於描述圖式中一個(些)元件或特徵與另一個(些)元件或特徵之間的關係,這些空間關係詞包含使用中或操作中的裝置之不同方位,以及圖式中所描述的方位。裝置可能被轉向不同方位,則其中使用的空間相關形容詞也可相同地照著解釋。In addition, spatially relative terms such as "below", "above", "between" and similar terms may be used to facilitate the description of the relationship between one (or some) elements or features and another (or some) elements or features in the drawings. These spatially relative terms include different orientations of the device in use or operation, as well as the orientations described in the drawings. The device may be rotated to different orientations, and the spatially relative adjectives used therein may also be interpreted accordingly.

再者,「約」、「大約」、「大抵」之用語通常表示在一給定值的+/-20%之內,較佳是+/-10%之內,且更佳是+/-5%之內,或+/-3%之內,或+/-2%之內,或+/-1%之內,或0.5%之內。在此給定的數值為大約的數值,亦即在沒有特定說明「約」、「大約」、「大抵」的情況下,此給定的數值仍可隱含「約」、「大約」、「大抵」之含義。Furthermore, the terms "about", "approximately", and "generally" generally mean within +/-20% of a given value, preferably within +/-10%, and more preferably within +/-5%, or within +/-3%, or within +/-2%, or within +/-1%, or within 0.5%. The numerical values given herein are approximate numerical values, that is, in the absence of specific description of "about", "approximately", and "generally", the given numerical values may still imply the meaning of "about", "approximately", and "generally".

以下描述實施例的一些變化。雖然所述的一些實施例中的步驟以特定順序進行,這些步驟亦可以其他合邏輯的順序進行。在實施例所敘述的一些製程步驟之前、之中、及/或之後可能包含進行額外的製程步驟,且一些實施例中所敘述的某些製程步驟可能在另一些實施例之方法中被其他製程步驟所取代或刪除。再者,可以理解的是,本發明例示的實施例中的裝置或系統中可以加入其他的部件,或是可以替換或省略一些部件。Some variations of the embodiments are described below. Although the steps in some of the embodiments described are performed in a particular order, these steps may also be performed in other logical orders. Additional process steps may be performed before, during, and/or after some of the process steps described in the embodiments, and some process steps described in some embodiments may be replaced or deleted by other process steps in the methods of other embodiments. Furthermore, it is understood that other components may be added to the device or system in the embodiments illustrated in the present invention, or some components may be replaced or omitted.

本揭露內容之實施例係提出基材分選方法,其通過濕式密度分選法,可簡單快速且安全地對提供的混合基材(mixture of substrates)進行處理,以使各個種類的基材在適當的分選溶液中分離,利於揀取,以完成基材分選。混合基材可以是任何不同種類的基材。本揭露例如是可應用於廢棄偏光板的回收製程中,將回收偏光板經過處理製程(例如去除碘、偏光子和殘膠),其相關材料層(例如在偏光子上下兩側的保護層,如後敘述,即為實施例的基材)分離後,可通過實施例的基材分選方法以進行此些保護層的分選和回收。除了可以減少對環境的汙染,回收後的基材可以重新製造為其他再生製品。The embodiments of the present disclosure provide a substrate sorting method, which can simply, quickly and safely process the provided mixed substrates (mixture of substrates) through a wet density sorting method, so that each type of substrate is separated in an appropriate sorting solution, which is convenient for picking to complete the substrate sorting. The mixed substrate can be any different type of substrate. For example, the present disclosure can be applied to the recycling process of discarded polarizing plates. After the recycled polarizing plates are subjected to a processing process (for example, to remove iodine, polarizers and residual glue), the related material layers (for example, the protective layers on the upper and lower sides of the polarizers, as described later, which are the substrates of the embodiments) are separated, and then the substrate sorting method of the embodiments can be used to sort and recycle these protective layers. In addition to reducing environmental pollution, the recycled substrate can be re-manufactured into other recycled products.

以下係以偏光板回收為例,說明本揭露一些實施例的基材分選方法中,混合基材的來源與前端處理製程。The following uses polarizing plate recycling as an example to explain the source of mixed substrates and the front-end processing process in the substrate sorting method of some embodiments of the present disclosure.

<混合基材的來源與前端處理製程><Sources of mixed substrates and front-end processing>

第1圖係為一偏光板的剖面簡示圖。偏光板1包括偏光子102和位於偏光子102上下兩側的多個材料層,例如可分別藉由接著層(未示出)貼附於偏光子102相對兩表面上的第一保護層104和第二保護層106。在一實施例中,第一保護層104和第二保護層106在遠離偏光子102的表面上還可包括其他光學膜層、表面保護層、黏著層和離形膜(未示出)。FIG. 1 is a schematic cross-sectional view of a polarizing plate. The polarizing plate 1 includes a polarizer 102 and a plurality of material layers located on the upper and lower sides of the polarizer 102, such as a first protective layer 104 and a second protective layer 106 that can be attached to opposite surfaces of the polarizer 102 by a bonding layer (not shown). In one embodiment, the first protective layer 104 and the second protective layer 106 may further include other optical film layers, surface protective layers, adhesive layers, and release films (not shown) on the surfaces away from the polarizer 102.

在一些實施例中,偏光子102可為聚乙烯醇(PVA)樹脂膜,其可藉由皂化聚醋酸乙烯樹脂製得。聚醋酸乙烯樹脂的例子包括醋酸乙烯之單聚合物,即聚醋酸乙烯,以及醋酸乙烯之共聚合物和其他能與醋酸乙烯進行共聚合之單體。其他能與醋酸乙烯進行共聚合之單體的例子包括不飽和羧酸(例如丙烯酸、甲基丙烯酸、丙烯酸乙酯、正丙烯酸丙酯、甲基丙烯酸甲酯)、烯烴(例如乙烯、丙烯、1-丁烯、2-甲丙烯)、乙烯醚(例如乙基乙烯醚、甲基乙烯醚、正丙基乙烯醚、異丙基乙烯醚)、不飽和磺酸(例如乙烯基磺酸、乙烯基磺酸鈉)等等。In some embodiments, the polarizer 102 may be a polyvinyl alcohol (PVA) resin film, which may be prepared by saponifying polyvinyl acetate resin. Examples of polyvinyl acetate resins include monomers of vinyl acetate, i.e., polyvinyl acetate, and copolymers of vinyl acetate and other monomers that can be copolymerized with vinyl acetate. Examples of other monomers that can be copolymerized with vinyl acetate include unsaturated carboxylic acids (e.g., acrylic acid, methacrylic acid, ethyl acrylate, n-propyl acrylate, methyl methacrylate), alkenes (e.g., ethylene, propylene, 1-butene, 2-methylpropylene), vinyl ethers (e.g., ethyl vinyl ether, methyl vinyl ether, n-propyl vinyl ether, isopropyl vinyl ether), unsaturated sulfonic acids (e.g., vinyl sulfonic acid, sodium vinyl sulfonate), and the like.

在一些實施例中,第一保護層104和第二保護層106的材料可選自由聚甲基丙烯酸甲酯(Polymethylmethacrylate;PMMA)、三醋酸纖維素(Triacetyl Cellulose;TAC)、丙烯酸樹脂膜、聚芳香羥樹脂膜、聚醚樹脂膜、環聚烯烴樹脂膜(例如聚冰片烯樹脂膜)、聚對苯二甲酸乙二酯(Polyethylene Terephthalate;PET)、聚丙稀(Polypropylene;PP)、環烯烴聚合物(Cyclo Olefin Polymer;COP)、聚碳酸酯(Polycarbonate;PC)、以及上述任意組合所組成的群組。In some embodiments, the material of the first protective layer 104 and the second protective layer 106 can be selected from polymethylmethacrylate (PMMA), triacetyl cellulose (TAC), acrylic resin film, polyaromatic hydroxyl resin film, polyether resin film, cycloolefin resin film (e.g., polybornene resin film), polyethylene terephthalate (PET), polypropylene (PP), cycloolefin polymer (COP), polycarbonate (PC), and a group consisting of any combination thereof.

接著層可包含水系接著劑,一般例如是使用聚乙烯醇系樹脂或胺基甲酸酯樹脂作為水系接著劑的主成分,且為了提高接著性可以是配合添加異氰酸酯系化合物或環氧化合物般之交聯劑或硬化性化合物而製成之組成物。在一些實施例中,水系接著劑之主成分是聚乙烯醇系樹脂時,除可使用部分皂化聚乙烯醇及完全皂化聚乙烯醇之外,尚可使用如羧基變性聚乙烯醇、乙醯基變性聚乙烯醇、羥甲基變性聚乙烯醇、及胺基變性聚乙烯醇般之經變性之聚乙烯醇系樹脂。The adhesive layer may include a water-based adhesive, generally, for example, a polyvinyl alcohol resin or a urethane resin is used as the main component of the water-based adhesive, and in order to improve the adhesiveness, a crosslinking agent or a curing compound such as an isocyanate compound or an epoxy compound may be added to form a composition. In some embodiments, when the main component of the water-based adhesive is a polyvinyl alcohol resin, in addition to partially saponified polyvinyl alcohol and completely saponified polyvinyl alcohol, a modified polyvinyl alcohol resin such as carboxyl-modified polyvinyl alcohol, acetyl-modified polyvinyl alcohol, hydroxymethyl-modified polyvinyl alcohol, and amino-modified polyvinyl alcohol may be used.

在一些實施例中,接著層可為紫外線固化型接著劑,材料可列舉例如:丙烯酸系接著劑、環氧系接著劑、胺甲酸酯系接著劑、聚酯系接著劑、聚乙烯醇系接著劑、聚烯烴系接著劑、改質聚烯烴系接著劑、聚乙烯基烷基醚系接著劑、橡膠系接著劑、氯乙烯―乙酸乙烯酯系接著劑、SEBS(苯乙烯―乙烯―丁烯―苯乙烯共聚物)系接著劑、乙烯―苯乙烯共聚物等乙烯系接著劑、乙烯―(甲基)丙烯酸甲酯共聚物、乙烯―(甲基)丙烯酸乙酯共聚物等丙烯酸酯系接著劑等。In some embodiments, the adhesive layer may be a UV-curable adhesive, and the materials may include, for example: acrylic adhesives, epoxy adhesives, urethane adhesives, polyester adhesives, polyvinyl alcohol adhesives, polyolefin adhesives, modified polyolefin adhesives, polyvinyl alkyl ether adhesives, rubber adhesives, vinyl chloride-vinyl acetate adhesives, SEBS (styrene-ethylene-butylene-styrene copolymer) adhesives, ethylene-styrene copolymers and other ethylene-based adhesives, ethylene-(meth)acrylate methyl copolymers, ethylene-(meth)acrylate ethyl copolymers and other acrylate-based adhesives, etc.

黏著層包含壓敏性黏著劑(pressure sensitive adhesive,PSA)、熱敏性黏著劑、溶劑揮發性黏著劑、及/或紫外光可固化黏著劑。在一些實施例中,壓敏性黏著劑可包含天然橡膠、合成橡膠、苯乙烯嵌段共聚物、(甲基)丙烯酸系嵌段共聚物、聚乙烯基醚、聚烯烴、及/或聚(甲基)丙烯酸酯。在一些實施例中,(甲基)丙烯酸(或丙烯酸酯)係指丙烯酸及甲基丙烯酸類二者。在一些實施例中,壓敏性黏著劑可包含(甲基)丙烯酸酯、橡膠、熱塑性彈性體、聚矽氧、胺基甲酸酯、及其組合。在一些實施例中,壓敏性黏著劑係基於(甲基)丙烯酸系壓敏性黏著劑或基於至少一種聚(甲基)丙烯酸酯。The adhesive layer includes a pressure sensitive adhesive (PSA), a heat sensitive adhesive, a solvent volatile adhesive, and/or an ultraviolet light curable adhesive. In some embodiments, the pressure sensitive adhesive may include natural rubber, synthetic rubber, styrene block copolymer, (meth) acrylic block copolymer, polyvinyl ether, polyolefin, and/or poly (meth) acrylate. In some embodiments, (meth) acrylic acid (or acrylate) refers to both acrylic acid and methacrylic acid. In some embodiments, the pressure sensitive adhesive may include (meth) acrylate, rubber, thermoplastic elastomer, polysilicone, urethane, and combinations thereof. In some embodiments, the pressure-sensitive adhesive is based on a (meth)acrylic pressure-sensitive adhesive or on at least one poly(meth)acrylate.

第2圖為根據本揭露一些實施例的廢棄偏光板回收後的處理製程示意圖。此示例中,以包含聚乙烯醇(PVA)偏光子的破碎偏光板201為例做說明。首先可將偏光板破碎化處理。破碎偏光板的尺寸大小和形狀並無特別限制,以方便後續於容器中進行處理即可。在一些實施例中,破碎偏光板的各個破片例如在1cm 2~100cm 2的範圍。 FIG. 2 is a schematic diagram of the processing process of the waste polarizing plate after recycling according to some embodiments of the present disclosure. In this example, a broken polarizing plate 201 containing polyvinyl alcohol (PVA) polarizers is used as an example for explanation. First, the polarizing plate can be broken into pieces. There is no particular limitation on the size and shape of the broken polarizing plate, so as to facilitate subsequent processing in a container. In some embodiments, the broken pieces of the broken polarizing plate are, for example, in the range of 1 cm 2 to 100 cm 2 .

之後,如步驟21,可用水去除破碎偏光板201的碘和溶解PVA。在一些實施例中,例如是將破碎偏光板201浸泡於水中,並保持擾動,以去除碘和溶解PVA,並形成包含有碘和PVA的第一溶液202。在一些實施例中,可通過一攪拌機(未示出)使第一溶液202維持攪拌擾動。值得注意的是,攪拌條件無特別限制,有無攪拌皆可,第一溶液202僅保持擾動亦可,只要可以增加水與破碎偏光板201之間的接觸面積即可。Thereafter, as in step 21, water may be used to remove iodine from the broken polarizer 201 and dissolve PVA. In some embodiments, for example, the broken polarizer 201 is immersed in water and kept agitated to remove iodine and dissolve PVA, and to form a first solution 202 containing iodine and PVA. In some embodiments, the first solution 202 may be kept agitated by a stirrer (not shown). It is worth noting that there is no particular limitation on the stirring conditions, and it is possible to stir or not stir, and the first solution 202 may only be kept agitated, as long as the contact area between the water and the broken polarizer 201 can be increased.

在此示例中,第一溶液202中分散有偏光板的保護層例如第1圖所示之第一保護層104和第二保護層106的破片。為簡化說明,此些保護層的破片在以下敘述中係簡稱混合基材。In this example, the first solution 202 contains fragments of the protective layer of the polarizer, such as the first protective layer 104 and the second protective layer 106 shown in FIG1 . For simplicity of description, these fragments of the protective layer are referred to as mixed substrates in the following description.

再者,上述步驟21中所使用的水體積以可覆蓋被處理物即可。在一些實施例中,破碎偏光板201的固體重量(以公斤計)相對於水的體積(以公升計)的固液比例如(但不限)在1:10~1:200的範圍之間,或是其他合適的固液比範圍。Furthermore, the volume of water used in the above step 21 is sufficient to cover the treated object. In some embodiments, the solid-liquid ratio of the solid weight (in kilograms) of the broken polarizing plate 201 to the volume (in liters) of water is, for example (but not limited to), in the range of 1:10 to 1:200, or other suitable solid-liquid ratio ranges.

再者,上述用以去除碘和溶解PVA的水的溫度並無特別限制,可以是室溫或一高溫。在一些實施例中,用以去除碘和溶解PVA的水的溫度是在25℃~100℃的範圍,或其他合適的溫度範圍。在一示例中,使用90℃的水去除碘和溶解PVA。Furthermore, the temperature of the water used to remove iodine and dissolve PVA is not particularly limited, and can be room temperature or a high temperature. In some embodiments, the temperature of the water used to remove iodine and dissolve PVA is in the range of 25°C to 100°C, or other suitable temperature ranges. In one example, 90°C water is used to remove iodine and dissolve PVA.

當偏光板已失去偏光性(可通過目視或其他任何可行方式判斷),即已去除碘和溶解PVA,在PVA上方和下方的保護層(以下簡稱基材)可分離,可將混合基材203與第一溶液202分離。例如將混合基材203自第一溶液202撈取出來。但此時混合基材203上還殘留有黏著物(例如接著劑和黏著劑)。When the polarizing plate has lost its polarization (which can be determined visually or by any other feasible method), the iodine has been removed and the PVA has been dissolved, and the protective layers above and below the PVA (hereinafter referred to as substrates) can be separated, and the mixed substrate 203 can be separated from the first solution 202. For example, the mixed substrate 203 is taken out of the first solution 202. However, at this time, there are still adhesives (such as adhesives and adhesives) remaining on the mixed substrate 203.

之後,如步驟22,將混合基材203水洗,以去除混合基材203表面上殘留的碘和PVA。在一示例中,例如在室溫下對混合基材203水洗並攪拌數分鐘,之後取出混合基材203。水洗後的混合基材204上仍殘留有黏著物例如接著劑和黏著劑,以下可簡稱殘膠。Then, as in step 22, the mixed substrate 203 is washed with water to remove the iodine and PVA remaining on the surface of the mixed substrate 203. In one example, the mixed substrate 203 is washed with water and stirred for several minutes at room temperature, and then the mixed substrate 203 is taken out. Adhesives such as adhesives and adhesives still remain on the mixed substrate 204 after washing, which may be referred to as residual adhesives hereinafter.

之後,如步驟23,通過一鹼處理,以去除混合基材204(例如第一保護層104和第二保護層106的破片)上的殘膠。例如,將水洗後的混合基材204浸泡於第二溶液205中,且持續加熱靜置一段時間,以溶解去除以去除混合基材204上的殘膠。Then, as in step 23, an alkaline treatment is performed to remove the residual glue on the mixed substrate 204 (e.g., the broken pieces of the first protective layer 104 and the second protective layer 106). For example, the mixed substrate 204 after washing is immersed in the second solution 205, and is continuously heated and left to stand for a period of time to dissolve and remove the residual glue on the mixed substrate 204.

在一些實施例中,上述第二溶液205為一鹼性溶液。此鹼性溶液的pH值例如在8~14的範圍,或其他合適的pH值範圍。In some embodiments, the second solution 205 is an alkaline solution, and the pH value of the alkaline solution is, for example, in the range of 8 to 14, or other suitable pH value ranges.

再者,上述用以去除殘膠的第二溶液205的溫度並無特別限制,可以是室溫至低於其沸點的範圍之間。在一些實施例中,第二溶液205的溫度例如在25℃~100℃的範圍,或其他合適的溫度範圍。Furthermore, the temperature of the second solution 205 for removing the residual glue is not particularly limited, and can be between room temperature and below its boiling point. In some embodiments, the temperature of the second solution 205 is, for example, in the range of 25° C. to 100° C., or other suitable temperature ranges.

再者,上述用以去除殘膠的第二溶液205的濃度並無特別限制,但可以在流程安全性的考量下,使用低濃度的第二溶液205。在一些實施例中,第二溶液205的濃度例如在1%~10%的範圍,或其他合適的濃度範圍。Furthermore, the concentration of the second solution 205 for removing residual glue is not particularly limited, but a second solution 205 with a low concentration can be used in consideration of process safety. In some embodiments, the concentration of the second solution 205 is, for example, in the range of 1% to 10%, or other suitable concentration ranges.

再者,在一些實施例中,第二溶液205為氫氧化鹽溶液、碳酸鹽類、碳酸氫鹽類溶液、或其他合適的鹼性溶液。在一示例中,第二溶液205為氫氧化鉀溶液。Furthermore, in some embodiments, the second solution 205 is a hydroxide solution, a carbonate solution, a bicarbonate solution, or other suitable alkaline solutions. In one example, the second solution 205 is a potassium hydroxide solution.

在靜置一段時間之後,可將混合基材206與第二溶液205分離。例如將混合基材206自第二溶液205撈取出來。但此時混合基材206上還殘留有第二溶液205(例如鹼性溶液)。After standing for a period of time, the mixed substrate 206 can be separated from the second solution 205. For example, the mixed substrate 206 is removed from the second solution 205. However, at this time, the second solution 205 (for example, alkaline solution) still remains on the mixed substrate 206.

之後,如步驟24,清洗混合基材206以去除基材表面殘留的鹼性溶液。在一示例中,例如在室溫下對混合基材206水洗並攪拌數分鐘,之後取出混合基材207。水洗後的混合基材207上沒有膠體和鹼性溶液殘留,可得到乾淨的混合基材207,進而回收。另外,實施例係通過傅立葉轉換紅外線光譜(Fourier-transform infrared spectroscopy;FTIR)法,可確認上述處理方式可去除基材表面的殘膠。Then, as in step 24, the mixed substrate 206 is washed to remove the alkaline solution remaining on the surface of the substrate. In one example, the mixed substrate 206 is washed with water and stirred for several minutes at room temperature, and then the mixed substrate 207 is taken out. After washing, no colloid and alkaline solution remain on the mixed substrate 207, and a clean mixed substrate 207 can be obtained and then recycled. In addition, the embodiment is confirmed by Fourier-transform infrared spectroscopy (FTIR) method that the above treatment method can remove the residual glue on the surface of the substrate.

在此示例中,混合基材207例如包括第1圖所示之第一保護層104和第二保護層106的乾淨破片。而這些乾淨的混合基材207後續可通過實施例的基材分選方法完成分選,以利各種類的基材回收和後續再製。In this example, the mixed substrate 207 includes, for example, clean fragments of the first protective layer 104 and the second protective layer 106 shown in FIG1 . The clean mixed substrates 207 can be subsequently sorted by the substrate sorting method of the embodiment to facilitate various types of substrate recycling and subsequent re-manufacturing.

在上述實施例中,是先用水萃碘方式以去除偏光子的碘,並同時溶解PVA,之後再以鹼液去除殘留接著層或黏著層(例如殘留膠體)。相較於之前以鹼液除碘方式,此示例提出較安全的方法,以水即可進行偏光子除碘和溶解PVA,產生的廢液也較容易處理。以下亦提出實施例的其中一些實驗結果,以例示說明上述偏光板回收的前端處理製程。In the above embodiment, iodine is first extracted with water to remove the iodine of the polarized light and dissolve the PVA at the same time, and then the residual bonding layer or adhesive layer (such as residual colloid) is removed with alkaline solution. Compared with the previous method of removing iodine with alkaline solution, this example proposes a safer method, which can remove iodine from polarized light and dissolve PVA with water, and the waste liquid generated is also easier to handle. The following also presents some experimental results of the embodiment to illustrate the front-end processing process of the above polarized plate recycling.

在一些實驗中,係對不同偏光板的種類進行水萃碘,其實驗條件與結果列於表1。其中表1係列出偏光子上下兩側的保護層材料,且係以環烯烴聚合物(COP)、聚甲基丙烯酸甲酯(PMMA)、三醋酸纖維素(TAC)、聚對苯二甲酸乙二酯(PET)保護層為例進行實驗。In some experiments, water extraction of iodine was performed on different types of polarizers, and the experimental conditions and results are listed in Table 1. Table 1 lists the protective layer materials on the upper and lower sides of the polarizer, and the experiments were conducted using cycloolefin polymer (COP), polymethyl methacrylate (PMMA), triacetate cellulose (TAC), and polyethylene terephthalate (PET) protective layers as examples.

表1 偏光板種類 偏光板尺寸 固液比 溫度 萃碘可行性 萃碘時間 基材分離 實施例1 PMMA/COP 0.4cm *4cm 1:20 90℃ V 4小時 可分離 實施例2 PET/TAC 0.4cm *4cm 1:20 90℃ V 4小時 可分離 實施例3 PET/COP 0.4cm *4cm 1:20 90℃ V 6小時 可分離 實施例4 TAC/ TAC 0.4cm *4cm 1:20 90℃ V 5小時 可分離 Table 1 Polarizing plate type Polarizer size Solid-liquid ratio temperature Feasibility of iodine extraction Iodine extraction time Substrate separation Embodiment 1 PMMA/COP 0.4cm *4cm 1:20 90℃ V 4 hours Separable Embodiment 2 PET/TAC 0.4cm *4cm 1:20 90℃ V 4 hours Separable Embodiment 3 PET/COP 0.4cm *4cm 1:20 90℃ V 6 hours Separable Embodiment 4 TAC/TAC 0.4cm *4cm 1:20 90℃ V 5 hours Separable

根據上述實驗,如表1所例示之結果,不同偏光板的種類都可通過水萃碘方式去除碘和溶解PVA,且去除碘和溶解PVA後,偏光子兩側的基材可分離。According to the above experiments, as shown in the results of Table 1, different types of polarizers can remove iodine and dissolve PVA through water extraction of iodine, and after removing iodine and dissolving PVA, the substrates on both sides of the polarizer can be separated.

再者,一些相關實驗亦提出對不同的偏光板尺寸、形狀進行水萃碘實驗,其實驗條件與結果列於表2。實驗中的固液比是指固體總重量(g)相對於液體體積(ml),例如取10g破碎偏光板加入200ml的水中,則固液比為1:20。Furthermore, some related experiments have also proposed water extraction of iodine for different polarizing plate sizes and shapes, and the experimental conditions and results are listed in Table 2. The solid-liquid ratio in the experiment refers to the total weight of the solid (g) relative to the liquid volume (ml). For example, if 10g of broken polarizing plate is added to 200ml of water, the solid-liquid ratio is 1:20.

表2 偏光板尺寸(cm 2) 固液比 溫度 萃碘可行性 萃碘時間 基材分離 實施例1 0.4 *4 1:20 90℃ V 4小時 可分離 實施例2 1*1 1:20 90℃ V 5小時 可分離 實施例3 2.5*2.5 1:20 90℃ V 8小時 可分離 實施例4 5*5 1:20 90℃ V 10小時 可分離 實施例5 10*10 1:20 90℃ V 15小時 可分離 實施例6 15*15 1:20 90℃ V 20小時 可分離 實施例7 25*25 1:20 90℃ V 30小時 可分離 實施例8 50*50 1:20 90℃ V 45小時 可分離 Table 2 Polarizing plate size (cm 2 ) Solid-liquid ratio temperature Feasibility of iodine extraction Iodine extraction time Substrate separation Embodiment 1 0.4 *4 1:20 90℃ V 4 hours Separable Embodiment 2 1*1 1:20 90℃ V 5 hours Separable Embodiment 3 2.5*2.5 1:20 90℃ V 8 hours Separable Embodiment 4 5*5 1:20 90℃ V 10 hours Separable Embodiment 5 10*10 1:20 90℃ V 15 hours Separable Embodiment 6 15*15 1:20 90℃ V 20 hours Separable Embodiment 7 25*25 1:20 90℃ V 30 hours Separable Embodiment 8 50*50 1:20 90℃ V 45 hours Separable

根據上述實驗,如表2所例示之結果,許多不同尺寸、形狀的偏光板都可通過水萃碘方式去除碘和溶解PVA,且去除碘和溶解PVA後,偏光子兩側的基材可分離。According to the above experiments, as shown in the results of Table 2, many polarizing plates of different sizes and shapes can be removed iodine and PVA can be dissolved by water extraction of iodine, and after removing iodine and dissolving PVA, the substrates on both sides of the polarizer can be separated.

再者,一些相關實驗亦提出在不同的固液比下進行偏光板的水萃碘,其實驗條件與結果列於表3。Furthermore, some related experiments also proposed to extract iodine from polarizing plates with water at different solid-liquid ratios. The experimental conditions and results are listed in Table 3.

表3 偏光板尺寸(cm 2) 固液比 溫度 固體覆蓋率 萃碘可行性 萃碘時間 基材分離 實施例1 0.4 *4 1:7.5 90℃ V V 8小時 可分離 實施例2 0.4 *4 1:10 90℃ V V 6小時 可分離 實施例3 0.4 *4 1:20 90℃ V V 4小時 可分離 實施例4 0.4 *4 1:50 90℃ V V 3小時 可分離 實施例5 0.4 *4 1:100 90℃ V V 2小時 可分離 實施例6 0.4 *4 1:200 90℃ V V 1小時 可分離 比較例1 0.4 *4 1:5 90℃ X V - 不可分離 比較例2 0.4 *4 1:1 90℃ X V - Table 3 Polarizing plate size (cm 2 ) Solid-liquid ratio temperature Solid coverage Feasibility of iodine extraction Iodine extraction time Substrate separation Embodiment 1 0.4 *4 1:7.5 90℃ V V 8 hours Separable Embodiment 2 0.4 *4 1:10 90℃ V V 6 hours Separable Embodiment 3 0.4 *4 1:20 90℃ V V 4 hours Separable Embodiment 4 0.4 *4 1:50 90℃ V V 3 hours Separable Embodiment 5 0.4 *4 1:100 90℃ V V 2 hours Separable Embodiment 6 0.4 *4 1:200 90 V V 1 hour Separable Comparison Example 1 0.4 *4 1:5 90℃ X V - Inseparable Comparison Example 2 0.4 *4 1:1 90℃ X V -

根據上述實驗,如表3所例示之結果,可以在範圍甚廣的固液比下進行偏光板的水萃碘,例如自1:7.5至1:200。但固液比太低,例如比較例提出的1:5和1:1,則有固體高於液面的情形,而無法順利完成偏光板的水萃碘。According to the above experiments, as shown in Table 3, the iodine extraction of polarizing plates can be carried out in a wide range of solid-liquid ratios, such as from 1:7.5 to 1:200. However, if the solid-liquid ratio is too low, such as 1:5 and 1:1 in the comparative example, the solid may be higher than the liquid level, and the iodine extraction of polarizing plates cannot be successfully completed.

再者,一些相關實驗亦提出在不同的溫度下進行偏光板的水萃碘,其實驗條件與結果列於表4。Furthermore, some related experiments also proposed to extract iodine from polarizing plates at different temperatures. The experimental conditions and results are listed in Table 4.

表4 偏光板尺寸(cm 2) 固液比 溫度 萃碘可行性 萃碘時間 基材分離 實施例1 0.4 *4 1:20 25℃ V 12小時 可分離 實施例2 0.4 *4 1:20 50℃ V 10小時 可分離 實施例3 0.4 *4 1:20 70℃ V 8小時 可分離 實施例4 0.4 *4 1:20 90℃ V 4小時 可分離 實施例5 0.4 *4 1:20 100℃ V 3.5小時 可分離 比較例1 0.4 *4 1:20 10℃ X - 不可分離 比較例2 0.4 *4 1:20 20℃ X - 不可分離 比較例3 0.4 *4 1:20 110℃ X - 不可分離 Table 4 Polarizing plate size (cm 2 ) Solid-liquid ratio temperature Feasibility of iodine extraction Iodine extraction time Substrate separation Embodiment 1 0.4 *4 1:20 25℃ V 12 hours Separable Embodiment 2 0.4 *4 1:20 50℃ V 10 hours Separable Embodiment 3 0.4 *4 1:20 70℃ V 8 hours Separable Embodiment 4 0.4 *4 1:20 90℃ V 4 hours Separable Embodiment 5 0.4 *4 1:20 100℃ V 3.5 hours Separable Comparison Example 1 0.4 *4 1:20 10℃ X - Inseparable Comparison Example 2 0.4 *4 1:20 20℃ X - Inseparable Comparison Example 3 0.4 *4 1:20 110℃ X - Inseparable

根據上述實驗,如表4所例示之結果,在相同的偏光板尺寸和相同的固液比下,室溫約25℃至高溫100℃範圍的水都可以完成偏光板的水萃碘。而太低的水溫,例如比較例1使用的10℃的水或是比較例2使用的20℃的水,則偏光板水萃碘的效果不佳。而過高的水溫,例如比較例3使用的110℃,水有沸騰蒸發現象,偏光板水萃碘的效果亦不佳。According to the above experiments, as shown in Table 4, under the same polarizing plate size and the same solid-liquid ratio, water at room temperature of about 25°C to high temperature of 100°C can complete the extraction of iodine from the polarizing plate. However, too low water temperature, such as 10°C water used in Comparative Example 1 or 20°C water used in Comparative Example 2, does not produce good results in the extraction of iodine from the polarizing plate. Too high water temperature, such as 110°C used in Comparative Example 3, causes the water to boil and evaporate, and the extraction of iodine from the polarizing plate is also not good.

再者,相關實驗中亦進行鹼處理的可行性測試。可通過傅立葉轉換紅外線光譜(FTIR)分析鹼處理之前和之後基材上是否還有黏著層存在。此示例中,係以保護層的一側具有接著劑(例如UV膠)與偏光子連接,且保護層的另一側塗佈有黏著層(例如壓敏性黏著劑(pressure sensitive adhesive,PSA)為樣品,進行相關實驗。Furthermore, the feasibility of alkaline treatment is also tested in the relevant experiments. Fourier transform infrared spectroscopy (FTIR) can be used to analyze whether there is still an adhesive layer on the substrate before and after the alkaline treatment. In this example, a protective layer with a binder (such as UV glue) connected to the polarizer on one side and an adhesive layer (such as pressure sensitive adhesive (PSA)) on the other side is used as a sample for relevant experiments.

第3A圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之前基材上是否存在黏著劑,例如(例如壓敏性黏著劑(pressure sensitive adhesive,PSA)。圖中X軸為波數(cm -1),Y軸為穿透度(%)或吸收值。可以利用傅立葉轉換紅外線光譜上官能基區(Functional group region)的訊號指認後,指紋區(Fringerprint region)訊號針對分子構型差異進一步確認。第3A圖中的上方訊號為鹼處理之前基材上的壓敏性黏著劑訊號,下方訊號為純壓敏性黏著劑訊號(PSA database),比對兩者訊號可確認在鹼處理之前基材上有黏著劑。 FIG. 3A shows some embodiments of the present disclosure, in which a Fourier transform infrared spectrometer (FTIR) is used to detect a substrate to analyze whether there is an adhesive on the substrate before the alkali treatment, such as a pressure sensitive adhesive (PSA). In the figure, the X-axis is the wave number (cm -1 ), and the Y-axis is the transmittance (%) or the absorbance value. After the signal of the functional group region on the Fourier transform infrared spectrum is identified, the fingerprint region signal can be further confirmed for the difference in molecular configuration. The upper signal in FIG. 3A is the signal of the pressure sensitive adhesive on the substrate before the alkali treatment, and the lower signal is the pure pressure sensitive adhesive signal (PSA database). By comparing the two signals, it can be confirmed that there is an adhesive on the substrate before the alkali treatment.

第3B圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之前基材上是否存在接著劑,例如UV膠。圖中的上方訊號為鹼處理之前基材上的UV膠訊號,下方訊號為純UV膠訊號,比對兩者訊號可確認在鹼處理之前基材上有接著劑。FIG. 3B shows some embodiments of the present disclosure, using a Fourier transform infrared spectrometer (FTIR) to detect the substrate to analyze whether there is a bonding agent, such as UV glue, on the substrate before the alkali treatment. The upper signal in the figure is the UV glue signal on the substrate before the alkali treatment, and the lower signal is the pure UV glue signal. Comparing the two signals can confirm that there is a bonding agent on the substrate before the alkali treatment.

第3C圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之後基材上是否存在黏著劑。圖中的上方訊號為鹼處理之後基材的訊號,下方訊號為純基材訊號,比對兩者訊號可確認在鹼處理之後基材上已無黏著劑,是乾淨基材。FIG. 3C shows some embodiments of the present disclosure, using a Fourier transform infrared spectrometer (FTIR) to detect the substrate to analyze whether there is an adhesive on the substrate after the alkali treatment. The upper signal in the figure is the signal of the substrate after the alkali treatment, and the lower signal is the signal of the pure substrate. Comparing the two signals, it can be confirmed that there is no adhesive on the substrate after the alkali treatment, and it is a clean substrate.

第3D圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之後基材上是否存在接著劑。圖中的上方訊號為鹼處理之後基材的訊號,下方訊號為純基材訊號,比對兩者訊號可確認在鹼處理之後基材上已無接著劑,是乾淨基材。FIG. 3D shows some embodiments of the present disclosure, using a Fourier transform infrared spectrometer (FTIR) to detect the substrate to analyze whether there is a bonding agent on the substrate after the alkali treatment. The upper signal in the figure is the signal of the substrate after the alkali treatment, and the lower signal is the pure substrate signal. Comparing the two signals, it can be confirmed that there is no bonding agent on the substrate after the alkali treatment, and it is a clean substrate.

再者,一些相關實驗亦提出在不同的溫度下進行鹼處理,以去除基材殘膠,其實驗條件與結果列於表5。此些實驗可通過傅立葉轉換紅外線光譜(FTIR)分析結果以檢測基材上的膠體是否去除乾淨。Furthermore, some related experiments also proposed to perform alkaline treatment at different temperatures to remove the residual glue on the substrate. The experimental conditions and results are listed in Table 5. These experiments can use Fourier transform infrared spectroscopy (FTIR) to analyze the results to detect whether the colloid on the substrate is completely removed.

表5 鹼溶液種類 溫度 鹼處理可行性 FTIR分析結果 實施例1 氫氧化鉀 25℃ V 乾淨基材 實施例2 氫氧化鉀 50℃ V 乾淨基材 實施例3 氫氧化鉀 70℃ V 乾淨基材 實施例4 氫氧化鉀 90℃ V 乾淨基材 實施例5 氫氧化鉀 100℃ V 乾淨基材 比較例1 氫氧化鉀 10℃ X 基材仍有殘膠 比較例2 氫氧化鉀 20℃ X 基材仍有殘膠 比較例3 氫氧化鉀 110℃ X 基材仍有殘膠 Table 5 Alkaline solution type temperature Alkaline treatment feasibility FTIR analysis results Embodiment 1 Potassium Hydroxide 25℃ V Clean substrate Embodiment 2 Potassium Hydroxide 50℃ V Clean substrate Embodiment 3 Potassium Hydroxide 70℃ V Clean substrate Embodiment 4 Potassium Hydroxide 90℃ V Clean substrate Embodiment 5 Potassium Hydroxide 100℃ V Clean substrate Comparison Example 1 Potassium Hydroxide 10℃ X There is still glue residue on the substrate Comparison Example 2 Potassium Hydroxide 20℃ X There is still glue residue on the substrate Comparison Example 3 Potassium Hydroxide 110℃ X There is still glue residue on the substrate

根據上述實驗,如表5所例示之結果,以不同溫度的氫氧化鉀溶液(例如第2圖中步驟23所示的第二溶液205)進行鹼處理,將混合基材浸泡於25℃~100℃的氫氧化鉀溶液,皆可去除基材殘膠。而低於室溫的鹼液,例如比較例1使用的10℃氫氧化鉀溶液或是比較例2使用的20℃氫氧化鉀溶液,則除膠效果不佳。而過高溫度的鹼液,例如比較例3使用的110℃氫氧化鉀溶液,液體有沸騰現象,除膠效果亦不佳。According to the above experiments, as shown in Table 5, the residual glue on the substrate can be removed by alkali treatment with potassium hydroxide solutions of different temperatures (e.g., the second solution 205 shown in step 23 of FIG. 2), and the mixed substrate is immersed in a potassium hydroxide solution of 25°C to 100°C. However, alkaline solutions below room temperature, such as the 10°C potassium hydroxide solution used in Comparative Example 1 or the 20°C potassium hydroxide solution used in Comparative Example 2, have poor glue removal effects. Alkaline solutions with too high temperatures, such as the 110°C potassium hydroxide solution used in Comparative Example 3, have a boiling phenomenon in the liquid, and the glue removal effect is also poor.

再者,一些相關實驗亦提出使用不同種類的鹼性溶液進行鹼處理,以去除基材殘膠,其實驗條件與結果列於表6。此些實驗可通過傅立葉轉換紅外線光譜(FTIR)分析結果以檢測基材上的膠體是否去除乾淨。Furthermore, some related experiments also proposed using different types of alkaline solutions for alkaline treatment to remove the residual glue on the substrate, and the experimental conditions and results are listed in Table 6. These experiments can use Fourier transform infrared spectroscopy (FTIR) to analyze the results to detect whether the colloid on the substrate is completely removed.

表6 鹼溶液種類 pH值 固液比 溫度 鹼處理可行性 FTIR分析結果 實施例1 氫氧化鉀 14 1:20 90℃ V 乾淨基材 實施例2 氫氧化鈉 13 1:20 90℃ V 乾淨基材 實施例3 氫氧化鈣 12 1:20 90℃ V 乾淨基材 實施例4 氧化鈣 12 1:20 90℃ V 乾淨基材 實施例5 碳酸鉀 10 1:20 90℃ V 乾淨基材 實施例6 碳酸鈉 11 1:20 90℃ V 乾淨基材 實施例7 碳酸氫鉀 8 1:20 90℃ V 乾淨基材 實施例8 碳酸氫鈉 8 1:20 90℃ V 乾淨基材 Table 6 Alkaline solution type pH Solid-liquid ratio temperature Alkaline treatment feasibility FTIR analysis results Embodiment 1 Potassium Hydroxide 14 1:20 90℃ V Clean substrate Embodiment 2 Sodium hydroxide 13 1:20 90℃ V Clean substrate Embodiment 3 Calcium hydroxide 12 1:20 90℃ V Clean substrate Embodiment 4 Calcium oxide 12 1:20 90℃ V Clean substrate Embodiment 5 Potassium carbonate 10 1:20 90℃ V Clean substrate Embodiment 6 Sodium carbonate 11 1:20 90℃ V Clean substrate Embodiment 7 Potassium bicarbonate 8 1:20 90℃ V Clean substrate Embodiment 8 Sodium bicarbonate 8 1:20 90℃ V Clean substrate

根據上述實驗,如表6所例示之結果,使用不同種類的鹼性溶液進行鹼處理。鹼性溶液例如是氫氧化鉀、氫氧化鈉、氫氧化鈣、氧化鈣、碳酸鉀、碳酸鈉、碳酸氫鉀和碳酸氫鈉,其pH值例如在8~14的範圍。此些鹼性溶液的種類較佳的不與基材材料產生化學反應。將混合基材浸泡於高溫(例如90℃)的此些鹼性溶液,皆可去除基材殘膠。According to the above experiments, as shown in Table 6, different types of alkaline solutions are used for alkaline treatment. Alkaline solutions are, for example, potassium hydroxide, sodium hydroxide, calcium hydroxide, calcium oxide, potassium carbonate, sodium carbonate, potassium bicarbonate and sodium bicarbonate, and their pH values are, for example, in the range of 8 to 14. These alkaline solutions preferably do not react chemically with the substrate material. The mixed substrate is immersed in these alkaline solutions at high temperature (for example, 90° C.), and the substrate glue residue can be removed.

再者,一些相關實驗亦提出使用不同種類以及不同濃度的鹼性溶液進行鹼處理,以去除基材殘膠,其實驗條件與結果列於表7。此些實驗可通過傅立葉轉換紅外線光譜(FTIR)分析結果以檢測基材上的膠體是否去除乾淨。Furthermore, some related experiments also proposed using different types and concentrations of alkaline solutions for alkaline treatment to remove the residual glue on the substrate. The experimental conditions and results are listed in Table 7. These experiments can use Fourier transform infrared spectroscopy (FTIR) to analyze the results to detect whether the colloid on the substrate is completely removed.

表7 鹼液種類 固液比 濃度 溫度 時間 FTIR分析 實施例1 氫氧化鉀 1:20 45% 90℃ 1小時 乾淨基材 實施例2 氫氧化鉀 1:20 10% 90℃ 2小時 乾淨基材 實施例3 氫氧化鉀 1:20 5% 90℃ 4小時 乾淨基材 實施例4 氫氧化鉀 1:20 1% 90℃ 5小時 乾淨基材 實施例5 氫氧化鈉 1:20 45% 90℃ 1小時 乾淨基材 實施例6 氫氧化鈉 1:20 10% 90℃ 2小時 乾淨基材 實施例7 氫氧化鈉 1:20 5% 90℃ 4小時 乾淨基材 實施例8 氫氧化鈉 1:20 1% 90℃ 5小時 乾淨基材 Table 7 Alkaline solution type Solid-liquid ratio Concentration temperature time FTIR analysis Embodiment 1 Potassium Hydroxide 1:20 45% 90 1 hour Clean substrate Embodiment 2 Potassium Hydroxide 1:20 10% 90℃ 2 hours Clean substrate Embodiment 3 Potassium Hydroxide 1:20 5% 90℃ 4 hours Clean substrate Embodiment 4 Potassium Hydroxide 1:20 1% 90℃ 5 hours Clean substrate Embodiment 5 Sodium hydroxide 1:20 45% 90 1 hour Clean substrate Embodiment 6 Sodium hydroxide 1:20 10% 90℃ 2 hours Clean substrate Embodiment 7 Sodium hydroxide 1:20 5% 90℃ 4 hours Clean substrate Embodiment 8 Sodium hydroxide 1:20 1% 90℃ 5 hours Clean substrate

根據上述實驗,如表7所例示之結果,使用例如氫氧化鉀和氫氧化鈉的鹼性溶液,且鹼性溶液濃度分別為1%、5%、10%、45%,以對混合基材進行鹼處理。將混合基材浸泡於高溫(例如90℃)的此些鹼性溶液,皆可去除基材殘膠。濃度越高的鹼性溶液,鹼性溶液除膠所需的時間越短。According to the above experiments, as shown in Table 7, alkaline solutions such as potassium hydroxide and sodium hydroxide are used, and the concentrations of the alkaline solutions are 1%, 5%, 10%, and 45%, respectively, to perform alkaline treatment on the mixed substrate. The mixed substrate is immersed in these alkaline solutions at high temperature (e.g., 90°C), and the residual glue on the substrate can be removed. The higher the concentration of the alkaline solution, the shorter the time required for the alkaline solution to remove the glue.

如上述所取得的乾淨的混合基材207(第2圖),其包括例如第1圖所示之第一保護層104和第二保護層106的乾淨破片,可通過如下說明的實施例之基材分選方法完成分選,以回收不同種類的基材,利於後續再製產品。The clean mixed substrate 207 (FIG. 2) obtained as described above, which includes clean fragments of the first protective layer 104 and the second protective layer 106 as shown in FIG. 1, can be sorted by the substrate sorting method of the embodiment described below to recycle different types of substrates, which is beneficial for subsequent product remanufacturing.

<基材分選><Base material sorting>

本揭露之實施例係利用濕式密度分選法,以簡單快速、安全性高、成本低、分選效率高且分選速度快的方法進行混和基材的分選。第4圖示出了根據本揭露一些實施例的基材分選方法的流程圖。第5圖示出了根據本揭露一些實施例的基材分選的示意圖。可同時參照第4圖和第5圖。The embodiments of the present disclosure utilize a wet density separation method to separate mixed substrates in a simple, fast, safe, low-cost, high separation efficiency, and fast separation speed method. FIG. 4 shows a flow chart of a substrate separation method according to some embodiments of the present disclosure. FIG. 5 shows a schematic diagram of a substrate separation according to some embodiments of the present disclosure. Reference may be made to FIG. 4 and FIG. 5 at the same time.

根據一些實施例,參照第4圖的步驟401,提供混合基材,其中包含材料不同、密度不同的多種基材。再者,在此示例中,係以兩種基材為例做說明。在一些實施例中,基材的密度例如在約0.87~約1.45的範圍,或是其他密度範圍。According to some embodiments, referring to step 401 of FIG. 4 , a mixed substrate is provided, which includes a plurality of substrates of different materials and densities. Furthermore, in this example, two substrates are used as an example for illustration. In some embodiments, the density of the substrate is, for example, in the range of about 0.87 to about 1.45, or other density ranges.

根據一些實施例,參照第4圖的步驟402和第5圖的步驟51,根據欲分選的混和基材,配製具有適當密度的一溶液501(又可稱為分選溶液)。According to some embodiments, referring to step 402 of FIG. 4 and step 51 of FIG. 5 , a solution 501 (also referred to as a separation solution) having an appropriate density is prepared according to the mixed substrate to be separated.

之後,參照第4圖的步驟403和第5圖的步驟52,取適量的混合基材510加入溶液501中,並充分攪拌,使基材均勻分散。Thereafter, referring to step 403 of FIG. 4 and step 52 of FIG. 5 , a proper amount of mixed substrate 510 is added to solution 501 and stirred sufficiently to make the substrate uniformly dispersed.

在一些示例中,混合基材510可包含材料不同的第一基材511與第二基材512。第一基材511具有第一密度,第二基材512具有第二密度,第一密度不同於第二密度。而所配製的溶液501則具有第三密度。根據一些實施例,第一基材511與第二基材512至少其中一者的密度係不同於溶液501的密度。In some examples, the mixed substrate 510 may include a first substrate 511 and a second substrate 512 of different materials. The first substrate 511 has a first density, the second substrate 512 has a second density, and the first density is different from the second density. The prepared solution 501 has a third density. According to some embodiments, the density of at least one of the first substrate 511 and the second substrate 512 is different from the density of the solution 501.

之後,參照第5圖的步驟53,靜置一段時間,等待不同密度的基材在溶液501中分層。在一些實施例中,密度小於分選溶液501的基材可漂浮於溶液501的上層,密度大於分選溶液501的基材則沉降於溶液501的底層,而密度接近於分選溶液501的基材則可懸浮在溶液501的中層。靜置時間視待分選基材的尺寸以及基材與溶液501的密度差而不同,例如基材與溶液501的密度差越大,則越快在溶液中浮起或下沉。但相較於傳統的基材分選方式,本揭露的濕式密度分選方式可極快速的完成分選。根據一些實施例,靜置時間不超過3分鐘(例如20秒到120秒)即可在溶液中完成基材分層。Afterwards, referring to step 53 of FIG. 5 , the substrate is left to stand for a period of time to wait for the substrates of different densities to be layered in the solution 501. In some embodiments, the substrates with a density less than the sorting solution 501 can float on the upper layer of the solution 501, the substrates with a density greater than the sorting solution 501 can settle on the bottom layer of the solution 501, and the substrates with a density close to the sorting solution 501 can be suspended in the middle layer of the solution 501. The standing time varies depending on the size of the substrate to be sorted and the density difference between the substrate and the solution 501. For example, the greater the density difference between the substrate and the solution 501, the faster it floats or sinks in the solution. However, compared with the traditional substrate sorting method, the wet density sorting method disclosed in the present disclosure can complete the sorting extremely quickly. According to some embodiments, the substrate layering can be completed in the solution by standing for no more than 3 minutes (e.g., 20 seconds to 120 seconds).

在此示例中,第一基材511的密度小於溶液501的密度,第二基材512的密度大於溶液501的密度,在混合基材510加入溶液501後,第一基材511在溶液501中浮起,第二基材512則沉入溶液501的底部,如第5圖的步驟53所示。In this example, the density of the first substrate 511 is less than the density of the solution 501, and the density of the second substrate 512 is greater than the density of the solution 501. After the mixed substrate 510 is added to the solution 501, the first substrate 511 floats in the solution 501, and the second substrate 512 sinks to the bottom of the solution 501, as shown in step 53 of Figure 5.

之後,參照第5圖的步驟54,撈取漂浮於溶液501上層的密度較小的基材。例如在此示例中,將密度較小而浮在溶液501上層的第一基材511撈取出來,而完成第一基材511的揀選回收。Afterwards, referring to step 54 of FIG. 5 , the substrate with a lower density floating on the upper layer of the solution 501 is picked up. For example, in this example, the first substrate 511 with a lower density floating on the upper layer of the solution 501 is picked up, and the first substrate 511 is selected and recycled.

之後,參照第5圖的步驟55,撈取沉降於溶液501底層的密度較大之基材,完成分選。例如在此示例中,將密度較大而沉在溶液501底部的第二基材512撈取出來,而完成第二基材512的揀選回收。Afterwards, referring to step 55 of FIG. 5 , the substrate with a higher density that settles at the bottom of the solution 501 is picked up to complete the sorting. For example, in this example, the second substrate 512 with a higher density that settles at the bottom of the solution 501 is picked up to complete the sorting and recovery of the second substrate 512.

當然,本揭露並不以上述示例為限,在一些其他示例中,第一基材511的密度可大致等於溶液501的密度,第二基材512的密度大於溶液501的密度,在混合基材510加入溶液501後,第一基材511懸浮於溶液501的中層,第二基材512則沉入溶液501的底部,亦可達到後續的基材分選。或者,在一些其他示例中,第一基材511的密度可小於溶液501的密度,第二基材512的密度大致等於溶液501的密度,在混合基材510加入溶液501後,第一基材511可浮在溶液501的上層,第二基材512則懸浮於溶液501的中層,亦可達到後續的基材分選。Of course, the present disclosure is not limited to the above examples. In some other examples, the density of the first substrate 511 may be substantially equal to the density of the solution 501, and the density of the second substrate 512 may be greater than the density of the solution 501. After the mixed substrate 510 is added to the solution 501, the first substrate 511 is suspended in the middle layer of the solution 501, and the second substrate 512 sinks to the bottom of the solution 501, and the subsequent substrate separation can also be achieved. Alternatively, in some other examples, the density of the first substrate 511 may be less than the density of the solution 501, and the density of the second substrate 512 is substantially equal to the density of the solution 501. After the mixed substrate 510 is added to the solution 501, the first substrate 511 may float on the upper layer of the solution 501, and the second substrate 512 may be suspended in the middle layer of the solution 501, and the subsequent substrate separation can also be achieved.

因此,根據上述,實施例的第一基材511的第一密度小於或等於溶液501的第三密度,第二基材512的第二密度大於或等於溶液501的第三密度,可表示為第一密度≤第三密度≤第二密度,且第一密度不同於第二密度。在混合基材510加入溶液501後,第一基材511在溶液501中的位置高於第二基材512在溶液501中的位置,而達到基材分選。Therefore, according to the above, the first density of the first substrate 511 of the embodiment is less than or equal to the third density of the solution 501, and the second density of the second substrate 512 is greater than or equal to the third density of the solution 501, which can be expressed as first density ≤ third density ≤ second density, and the first density is different from the second density. After the mixed substrate 510 is added to the solution 501, the position of the first substrate 511 in the solution 501 is higher than the position of the second substrate 512 in the solution 501, thereby achieving substrate separation.

再者,配置上述溶液501時,溶液501的最大密度亦即飽和溶液狀態下時的密度。在一些實施例中,當溶液501的最大密度大於第一基材511的第一密度及第二基材512的第二密度,則溶液501的第三密度為第一密度和第二密度的密度平均值。Furthermore, when the solution 501 is configured, the maximum density of the solution 501 is the density in the saturated solution state. In some embodiments, when the maximum density of the solution 501 is greater than the first density of the first substrate 511 and the second density of the second substrate 512, the third density of the solution 501 is the average density of the first density and the second density.

若飽和溶液的密度剛好接近或等於欲分選基材的平均密度,則可直接以此飽和溶液作為分選溶液。若飽和溶液的密度大於欲分選基材的第一密度及第二密度,則可通過配製方式配製出等於分選基材的平均密度的分選溶液。If the density of the saturated solution is close to or equal to the average density of the substrate to be sorted, the saturated solution can be directly used as the sorting solution. If the density of the saturated solution is greater than the first density and the second density of the substrate to be sorted, a sorting solution with an average density equal to the sorting substrate can be prepared by a preparation method.

在一些實施例中,當溶液501的最大密度(亦即飽和溶液狀態下時的密度)與第一基材511的第一密度和第二基材512的第二密度的其中一者相等時,則可以此飽和溶液密度為第三密度。亦即第三密度等於與之相等的第一密度或第二密度。In some embodiments, when the maximum density of the solution 501 (i.e., the density in the saturated solution state) is equal to one of the first density of the first substrate 511 and the second density of the second substrate 512, the saturated solution density can be regarded as the third density. That is, the third density is equal to the first density or the second density that is equal to it.

適用於濕式密度分選法的分選溶液501的配製方法沒有特別限制,可為任意的鹽類水溶液,僅需為目標密度環境下,為均勻無沉澱物之溶液即可。較佳的,溶液501不含有與基材(例如第一基材511和第二基材512)起化學反應的物質。在一些實施例中,溶液501例如為包括氯化鈉、氯化鈣、其類似物、或前述之組合的鹽類水溶液。There is no particular limitation on the preparation method of the separation solution 501 used in the wet density separation method. It can be any salt aqueous solution, as long as it is a uniform solution without sediments under the target density environment. Preferably, the solution 501 does not contain substances that react chemically with the substrate (e.g., the first substrate 511 and the second substrate 512). In some embodiments, the solution 501 is, for example, a salt aqueous solution including sodium chloride, calcium chloride, the like, or a combination thereof.

再者,上述步驟52中所使用的溶液501體積以可覆蓋被處理物即可。在一些實施例中,混合基材510的固體重量(以公斤計)相對於溶液501的體積(以公升計)的固液比例如(但不限)在1:16~1:1000的範圍之間,或是其他合適的固液比範圍。Furthermore, the volume of the solution 501 used in the above step 52 can cover the treated object. In some embodiments, the solid-liquid ratio of the solid weight (in kilograms) of the mixed substrate 510 to the volume (in liters) of the solution 501 is, for example (but not limited to), in the range of 1:16 to 1:1000, or other suitable solid-liquid ratio ranges.

雖然上述示例是以兩種基材為例做說明,但本揭露並不以此為限。實施例的分選方法也可能應用於分選兩種以上的基材。例如用以分選三種基材時,其中一種基材的密度小於第一分選溶液的密度,可先浮在溶液上層被撈取出,沉在下層的其餘兩種基材再以第二分選溶液進行分層撈取。Although the above examples are illustrated with two substrates, the present disclosure is not limited thereto. The separation method of the embodiment may also be applied to separation of more than two substrates. For example, when three substrates are separated, one of the substrates has a density less than that of the first separation solution and can first float on the upper layer of the solution and be removed, and the remaining two substrates that sink to the lower layer are then separated by the second separation solution.

<基材分選相關實驗><Base material sorting related experiments>

在一些實施例中,係以上述回收廢棄偏光板所處理而得的混合基材207(包括如第1圖所示之第一保護層104和第二保護層106的乾淨破片)做為上述基材分選方法中的混合基材510的示例說明。以下係以四種常見的基材COP、PMMA、TAC、PET為例並提出基材分選的一些相關實驗和結果,以做實施例的說明。實驗的基材分選方法的步驟可參照上述說明。 基材 成分 密度(g/cm 3) COP Cyclo Olefin Polymer 環烯烴聚合物 1.01 PMMA Polymethylmethacrylate 聚甲基丙烯酸甲酯 1.19 TAC Triacetyl Cellulose 三醋酸纖維素 1.3 PET Polyethylene Terephthalate 聚對苯二甲酸乙二酯 1.38 In some embodiments, the mixed substrate 207 (including the clean fragments of the first protective layer 104 and the second protective layer 106 as shown in FIG. 1 ) obtained by recycling the above-mentioned waste polarizing plate is used as an example of the mixed substrate 510 in the above-mentioned substrate sorting method. The following uses four common substrates COP, PMMA, TAC, and PET as examples and presents some related experiments and results of substrate sorting to illustrate the embodiments. The steps of the experimental substrate sorting method can refer to the above description. Substrate Element Density (g/cm 3 ) COP Cyclo Olefin Polymer 1.01 PMMA Polymethylmethacrylate 1.19 TAC Triacetyl Cellulose 1.3 PET Polyethylene Terephthalate 1.38

實驗中所提到的名詞定義如下:The definitions of the terms used in the experiment are as follows:

固體單次處理量:單次進行分選的基材投入重量。Solid single processing amount: the weight of substrate input for single sorting.

分選時間:不同密度的基材於分選溶液501中上下分層所需時間。Sorting time: the time required for substrates of different densities to separate into upper and lower layers in the sorting solution 501 .

分選率:分選完成的基材中,經傅立葉轉換紅外線光譜(FTIR)確認後實際為該基材的比例。分選率達>90%,則判定分選可行性OK,否則判定NG。Sorting rate: The proportion of the sorted substrate that is actually the substrate after Fourier transform infrared spectroscopy (FTIR) confirmation. If the sorting rate is > 90%, the sorting feasibility is judged to be OK, otherwise it is judged to be NG.

在一些實驗中,係進行不同種類混和基材的分選與不同分選方法,其結果列於表8。In some experiments, sorting of different types of mixed substrates and different sorting methods were performed, and the results are listed in Table 8.

實施例的濕式密度分選法可參照上述說明。再者,實驗中比較例的其他分選方式及缺點簡述如下:The wet density separation method of the embodiment can refer to the above description. In addition, other separation methods and their disadvantages in the comparative example in the experiment are briefly described as follows:

乾式比重法是依基材部密度進行分選,基材須先經過乾燥。乾式比重法的分離效率較差、處理量較少。The dry specific gravity method is to sort according to the density of the substrate, and the substrate must be dried first. The separation efficiency of the dry specific gravity method is poor and the processing volume is small.

靜電分離法是利用各種塑膠導電率不同以及電場作用於塑膠上的靜電性能來進行分選。但須先將基材乾燥處理,且設備成本較高。Electrostatic separation uses the different conductivity of various plastics and the electrostatic properties of the electric field acting on the plastics to separate them. However, the substrate must be dried first, and the equipment cost is relatively high.

光學分離法是利用光學性質檢測物料識別出不同材質,顏色或者密度,並通過壓縮空氣將選定物料分選。缺點為基材本身須有顏色上的差異,且設備成本較高、分選率較低。Optical separation uses optical properties to detect materials to identify different materials, colors or densities, and then sorts the selected materials by compressed air. The disadvantage is that the substrate itself must have color differences, and the equipment cost is high and the sorting rate is low.

溶解法是利用不同溶劑將不同種類的基材進行溶解並加以分離。缺點為需要額外使用溶劑,除了會增加廢液回收處理上的困難以外,溶劑成本也會增加。The dissolution method uses different solvents to dissolve and separate different types of substrates. The disadvantage is that additional solvents are required, which not only increases the difficulty of waste liquid recycling, but also increases the cost of solvents.

表8 分選基材種類 分選方法 固體單次處理量(g) 基材分選可行性 分選時間 分選率 分選可行性 實施例1 PMMA/COP 濕式密度分選 100g V 35秒 95% OK 實施例2 PET/TAC 100g V 45秒 95% OK 實施例3 PET/COP 100g V 20秒 97% OK 實施例4 PMMA/TAC 100g V 40秒 96% OK 實施例5 PMMA/PET 100g V 35秒 95% OK 實施例6 TAC/COP 100g V 35秒 95% OK 比較例1 PMMA/COP 乾式比重分選 10g V 10分鐘 55% NG 比較例2 PET/TAC 10g V 10分鐘 50% NG 比較例3 PET/COP 10g V 10分鐘 60% NG 比較例4 PMMA/TAC 10g V 10分鐘 50% NG 比較例5 PMMA/PET 10g V 10分鐘 55% NG 比較例6 TAC/COP 10g V 10分鐘 55% NG 比較例7 PMMA/COP 靜電分離法 10g X(皆有靜電) NG 比較例8 PET/TAC 10g NG 比較例9 PET/COP 10g NG 比較例10 PMMA/TAC 10g NG 比較例11 PMMA/PET 10g NG 比較例12 TAC/COP 10g NG 比較例13 PMMA/COP 光學分離法 10g X(皆無色) NG 比較例14 PET/TAC 10g NG 比較例15 PET/COP 10g NG 比較例16 PMMA/TAC 10g NG 比較例17 PMMA/PET 10g NG 比較例18 TAC/COP 10g NG 比較例19 PMMA/COP 溶解法 10g X(無法溶解) NG 比較例20 PET/TAC 10g NG 比較例21 PET/COP 10g NG 比較例22 PMMA/TAC 10g NG 比較例23 PMMA/PET 10g NG 比較例24 TAC/COP 10g NG Table 8 Sorting substrate types Sorting method Solid single processing amount (g) Substrate sorting feasibility Sorting time Sorting rate Sorting feasibility Embodiment 1 PMMA/COP Wet density sorting 100g V 35 seconds 95% OK Embodiment 2 PET/TAC 100g V 45 seconds 95% OK Embodiment 3 PET/COP 100g V 20 seconds 97% OK Embodiment 4 PMMA/TAC 100g V 40 seconds 96% OK Embodiment 5 PMMA/PET 100g V 35 seconds 95% OK Embodiment 6 TAC/COP 100g V 35 seconds 95% OK Comparison Example 1 PMMA/COP Dry Gravity Separation 10g V 10 minutes 55% NG Comparison Example 2 PET/TAC 10g V 10 minutes 50% NG Comparison Example 3 PET/COP 10g V 10 minutes 60% NG Comparison Example 4 PMMA/TAC 10g V 10 minutes 50% NG Comparison Example 5 PMMA/PET 10g V 10 minutes 55% NG Comparison Example 6 TAC/COP 10g V 10 minutes 55% NG Comparison Example 7 PMMA/COP Electrostatic separation 10g X(all have static electricity) NG Comparative Example 8 PET/TAC 10g NG Comparative Example 9 PET/COP 10g NG Comparative Example 10 PMMA/TAC 10g NG Comparative Example 11 PMMA/PET 10g NG Comparative Example 12 TAC/COP 10g NG Comparative Example 13 PMMA/COP Optical separation 10g X(all colorless) NG Comparative Example 14 PET/TAC 10g NG Comparative Example 15 PET/COP 10g NG Comparative Example 16 PMMA/TAC 10g NG Comparative Example 17 PMMA/PET 10g NG Comparative Example 18 TAC/COP 10g NG Comparative Example 19 PMMA/COP Dissolution method 10g X(insoluble) NG Comparative Example 20 PET/TAC 10g NG Comparative Example 21 PET/COP 10g NG Comparative Example 22 PMMA/TAC 10g NG Comparative Example 23 PMMA/PET 10g NG Comparative Example 24 TAC/COP 10g NG

根據上述實驗,如表8所例示之結果,使用實施例的基材分選方法分選速度快,在少於1分鐘的時間即完成基材分層,並且固體單次處理量(100g)相較於其他分選方式的單次處理量(10g)更大。且使用實施例的基材分選方法可以得到超過95%以上的分選率。According to the above experiments, as shown in Table 8, the substrate separation method of the embodiment has a fast separation speed, and the substrate separation is completed in less than 1 minute, and the single solid processing amount (100g) is larger than the single solid processing amount (10g) of other separation methods. And the substrate separation method of the embodiment can obtain a separation rate of more than 95%.

再者,係對基材的不同尺寸、形狀進行實驗,其結果列於表9。Furthermore, experiments were conducted on substrates of different sizes and shapes, and the results are listed in Table 9.

表9 基材尺寸(cm*cm =cm 2) 固液比 固體單次處理量(g) 基材分選可行性 分選時間 分選率 分選可行性 實施例1 0.4*4 1:40 100g V 30秒 95% OK 實施例2 1*1 1:40 100g V 40秒 97% OK 實施例3 5*5 1:40 100g V 60秒 98% OK 實施例4 10*10 1:40 100g V 120秒 99% OK 實施例5 15*15 1:40 100g V 145秒 99% OK 實施例6 25*25 1:40 100g V 200秒 99% OK 實施例7 50*50 1:40 100g V 350秒 99% OK 實施例8 100*100 1:40 100g V 400秒 99% OK Table 9 Substrate size (cm*cm =cm 2 ) Solid-liquid ratio Solid single processing amount (g) Substrate sorting feasibility Sorting time Sorting rate Sorting feasibility Embodiment 1 0.4*4 1:40 100g V 30 seconds 95% OK Embodiment 2 1*1 1:40 100g V 40 seconds 97% OK Embodiment 3 5*5 1:40 100g V 60 seconds 98% OK Embodiment 4 10*10 1:40 100g V 120 seconds 99% OK Embodiment 5 15*15 1:40 100g V 145 seconds 99% OK Embodiment 6 25*25 1:40 100g V 200 seconds 99% OK Embodiment 7 50*50 1:40 100g V 350 seconds 99% OK Embodiment 8 100*100 1:40 100g V 400 seconds 99% OK

根據上述實驗,如表9所例示之結果,使用實施例的基材分選方法可以處理許多不同尺寸的基材,基材面積自小於邊長1公分至邊長高達100公分,都可以完成基材分層,並且分選率超過95%以上。再者,根據實驗,越小片的基材尺寸,完成基材分選的時間越短。According to the above experiments, as shown in Table 9, the substrate separation method of the embodiment can process substrates of many different sizes, ranging from substrates with a side length of less than 1 cm to substrates with a side length of up to 100 cm, and can complete substrate separation, and the separation rate exceeds 95%. Furthermore, according to the experiment, the smaller the substrate size, the shorter the time to complete the substrate separation.

再者,實施例亦根據實驗數據推得出混合基材的理論分選率,其公式如下式(1): ....式(1) Furthermore, the embodiment also deduces the theoretical separation rate of the mixed substrate based on experimental data, and its formula is as follows (1): ....Formula (1)

其中X為容器的底面積,單位cm 2Where X is the bottom area of the container, in cm 2 ;

Y為容器的高度,單位cm;Y is the height of the container, in cm;

Z為混合基材的固體重量,單位kg;Z is the solid weight of the mixed matrix, in kg;

V為溶液的體積,單位L。V is the volume of the solution, in L.

適用於實施例的基材分選法的固液比以可覆蓋被處理物即可,例如(但不限於)1:16~1:1000。The solid-liquid ratio applicable to the substrate separation method of the embodiment can be any ratio that can cover the processed object, for example (but not limited to) 1:16-1:1000.

適用於實施例的基材分選法的容器,其底面積/高度比以可覆蓋被處理物即可。在一些實施例中,容器的底面積/高度例如(但不限於)23~37的範圍。The container applicable to the substrate separation method of the embodiment has a bottom area/height ratio that can cover the processed object. In some embodiments, the bottom area/height ratio of the container is, for example (but not limited to), in the range of 23-37.

適用於實施例的基材分選法的容器,其形狀並不特別限制,可以是任意形狀。The shape of the container used in the substrate separation method of the embodiment is not particularly limited and may be any shape.

上述式(1)的理論分選率的公式說明如下。The theoretical sorting rate formula of the above formula (1) is explained as follows.

關於Y/(Y+X/100)的部分About Y/(Y+X/100)

根據以容器底面積(X)和容器高度(Y)為操縱變因的實驗內容及結果,其中混合基材的固體重量(Z)、分選溶液體積(V)等因素均保持不變而為控制變因,發現分選率(應變變因)會受到容器底面積(X)和容器高度(Y)的影響,其中又以容器高度(Y)的影響最大。公式中X/100的項目,主要是因為X與Y單位上的不同。再者,由於容器底面積(X)的數值一定會比容器高度(Y)的數值還大,因此讓容器底面積(X)的數值變小,以體現容器高度(Y)對分選率的影響大。根據以容器底面積(X)和容器高度(Y)為操縱變因的實驗結果,可得出分選率與Y/(Y+X/100)成比例。According to the experimental content and results with the container bottom area (X) and container height (Y) as the manipulated variables, the solid weight of the mixed matrix (Z), the volume of the separation solution (V) and other factors remain unchanged as the controlled variables. It is found that the separation rate (strain variable) will be affected by the container bottom area (X) and the container height (Y), among which the container height (Y) has the greatest impact. The item X/100 in the formula is mainly due to the difference in the units of X and Y. In addition, since the value of the container bottom area (X) must be larger than the value of the container height (Y), the value of the container bottom area (X) is reduced to reflect the greater impact of the container height (Y) on the separation rate. Based on the experimental results with the container bottom area (X) and container height (Y) as the manipulated variables, it can be concluded that the sorting rate is proportional to Y/(Y+X/100).

根據實驗,在容器底面積(X)例如為100 cm 2~1000000cm 2,容器高度(Y)例如為1cm~10000cm的範圍中,容器底面積(X)/容器高度(Y)例如為23~37的範圍中,分選率與Y/(Y+X/100)成比例的關係皆可成立。 According to experiments, the relationship that the sorting rate is proportional to Y/(Y+X/100) holds true when the container bottom area (X) is, for example, 100 cm 2 ~1000000 cm 2 , the container height (Y) is, for example, 1 cm ~ 10000 cm, and the container bottom area (X) / container height (Y) is, for example, 23 ~ 37.

關於(V-Z)/V的部分About (V-Z)/V

根據以混合基材固體重量(Z)或分選溶液體積(V)為操縱變因的實驗內容及結果,其中容器底面積(X)、容器高度(Y)等因素均保持不變而為控制變因,發現分選率(應變變因)也會受到固體重量(Z)和分選溶液體積(V)的影響。根據實驗結果,在相同分選溶液體積(V)的前提下,若固體重量(Z)增加,則分選率會下降。相反的,在相同分選溶液體積(V)的前提下,若固體重量(Z)下降,則分選率會提高。根據實驗結果,可得出分選率與(V-Z)/V成比例。According to the experimental content and results with the mixed matrix solid weight (Z) or the sorting solution volume (V) as the manipulated variables, the factors such as the container bottom area (X) and the container height (Y) are kept constant as the controlled variables, and it is found that the sorting rate (strain variable) is also affected by the solid weight (Z) and the sorting solution volume (V). According to the experimental results, under the premise of the same sorting solution volume (V), if the solid weight (Z) increases, the sorting rate will decrease. On the contrary, under the premise of the same sorting solution volume (V), if the solid weight (Z) decreases, the sorting rate will increase. According to the experimental results, it can be concluded that the sorting rate is proportional to (V-Z)/V.

根據實驗,在分選溶液體積(V)例如為0.1L~10000 L,混合基材固體重量(Z)例如為0.1kg~10000kg的範圍中,固液比例如為1:16~1:1000的範圍中,分選率與(V-Z)/V成比例的關係皆可成立。According to experiments, when the volume of the sorting solution (V) is, for example, 0.1L~10000L, the weight of the mixed substrate solid (Z) is, for example, 0.1kg~10000kg, and the solid-liquid ratio is, for example, 1:16~1:1000, the relationship that the sorting rate is proportional to (V-Z)/V is established.

再者,根據實驗結果,Y/(Y+X/100)和(V-Z)/V的乘積,是與分選率成一線性關係,據此得出係數1.26,以與實際實驗結果相吻合。亦即,係數1.26與Y/(Y+X/100)和(V-Z)/V的乘積結果(如式(1)),可以使公式計算出的分選率與實驗中的實際分選率結果相吻合。Furthermore, according to the experimental results, the product of Y/(Y+X/100) and (V-Z)/V is linearly related to the sorting rate, and the coefficient 1.26 is obtained based on this, which is consistent with the actual experimental results. In other words, the coefficient 1.26 and the product of Y/(Y+X/100) and (V-Z)/V (such as formula (1)) can make the sorting rate calculated by the formula consistent with the actual sorting rate results in the experiment.

再者,在實施例中,係對不同固液比與容器底面積高度比進行多組實驗,並將部分實驗的實際分選率和理論分選率(如式(1))的結果列於表10。Furthermore, in the embodiment, multiple sets of experiments were conducted for different solid-liquid ratios and container bottom area height ratios, and the actual sorting rates and theoretical sorting rates (such as formula (1)) of some experiments were listed in Table 10.

表10 固液比 (g: ml) 容器底面積高度比 固體單次處理量 (g) 分選時間 理論分選率 (%) 實際分選率 (%) 分選可行性 實施例1 1:1000 31 5 10秒 100% 99% OK 實施例2 1:200 31 25 10秒 96% 96% OK 實施例3 1:40 31 125 30秒 94% 92% OK 實施例4 1:16 31 312.5 120秒 90% 90% OK 實施例5 1:40 23 125 30秒 100% 100% OK 實施例6 1:40 37 125 45秒 90% 90% OK 比較例1 1:40 5000 125 45秒 2% NG 比較例2 1:1 31 5000 NG Table 10 Solid-liquid ratio (g: ml) Container base area to height ratio Solid single processing amount (g) Sorting time Theoretical sorting rate (%) Actual sorting rate (%) Sorting feasibility Embodiment 1 1:1000 31 5 10 seconds 100% 99% OK Embodiment 2 1:200 31 25 10 seconds 96% 96% OK Embodiment 3 1:40 31 125 30 seconds 94% 92% OK Embodiment 4 1:16 31 312.5 120 seconds 90% 90% OK Embodiment 5 1:40 twenty three 125 30 seconds 100% 100% OK Embodiment 6 1:40 37 125 45 seconds 90% 90% OK Comparison Example 1 1:40 5000 125 45 seconds 2% NG Comparison Example 2 1:1 31 5000 NG

根據上述實驗,如表10所例示之結果,可以處理範圍甚廣的固液比,例如自1:16至1:1000。並且使用實施例的基材分選方法的分選速度快,即使是高固體含量,例如固液比1:16,也在大約2分鐘完成基材分層。但若如比較例一容器高度過低或是如比較例二處理的固體量過多(或體積過少),則不利於基材分層。再者,根據實驗結果顯示,使用實施例的基材分選方法的實際分選率確實接近上述式(1)之理論分選率。因此,在應用實施例之方法對欲分類的基材進行分選時,當分選率欲達到特定百分比(例如大於90%)時,也可以通過上式(1)得到需要用來完成基材分選的溶液體積。According to the above experiments, as shown in the results of Table 10, a wide range of solid-liquid ratios can be processed, for example, from 1:16 to 1:1000. In addition, the sorting speed of the substrate sorting method using the embodiment is fast. Even with a high solid content, such as a solid-liquid ratio of 1:16, the substrate stratification is completed in about 2 minutes. However, if the height of the container is too low as in Comparative Example 1 or the amount of solid processed is too much (or the volume is too small) as in Comparative Example 2, it is not conducive to substrate stratification. Furthermore, according to the experimental results, the actual sorting rate of the substrate sorting method using the embodiment is indeed close to the theoretical sorting rate of the above formula (1). Therefore, when the method of the embodiment is used to sort the substrates to be classified, when the sorting rate is to reach a certain percentage (for example, greater than 90%), the volume of solution required to complete the substrate sorting can also be obtained by the above formula (1).

再者,係以不同鹽類溶液對基材進行分選。其中分選溶液密度的設定例如:Furthermore, the substrate is sorted using different salt solutions. The density of the sorting solution is set as follows:

假設混和基材A密度=a,混和基材B密度=b,若a和b其中一者大於分選溶液最大密度(即飽和密度)(g/cm 3),另一者小於分選溶液最大密度,則溶液的分選密度為混和基材密度(a+b)/2。若a和b其中一者等於分選溶液最大密度,則分選密度為分選溶液最大密度。一些實驗結果列於表11。 Assuming that the density of mixed substrate A = a, the density of mixed substrate B = b, if one of a and b is greater than the maximum density of the sorting solution (i.e. saturated density) (g/cm 3 ), and the other is less than the maximum density of the sorting solution, then the sorting density of the solution is the density of the mixed substrate (a+b)/2. If one of a and b is equal to the maximum density of the sorting solution, then the sorting density is the maximum density of the sorting solution. Some experimental results are listed in Table 11.

表11 鹽類種類 溶液最大密度 實際分選密度 分選基材種類 (密度a/b) 分選時間 分選率 分選可行性 實施例1 氯化鈉 1.17 1.12 PMMA/COP (1.19/1.01) 30秒 95% OK 實施例2 氯化鈣 1.3 1.12 PMMA/COP (1.19/1.01) 40秒 94% OK 實施例3 氯化鈣 1.3 1.3 PET/TAC (1.38/1.3) 40秒 97% OK 實施例4 氯化鈉 1.17 1.17 PET/COP (1.38/1.01) 50秒 98% OK 實施例5 氯化鈣 1.3 1.2 PET/COP (1.38/1.01) 45秒 96% OK Table 11 Salt Type Maximum density of solution Actual sorting density Sorting substrate types (density a/b) Sorting time Sorting rate Sorting feasibility Embodiment 1 Sodium chloride 1.17 1.12 PMMA/COP (1.19/1.01) 30 seconds 95% OK Embodiment 2 Calcium chloride 1.3 1.12 PMMA/COP (1.19/1.01) 40 seconds 94% OK Embodiment 3 Calcium chloride 1.3 1.3 PET/TAC (1.38/1.3) 40 seconds 97% OK Embodiment 4 Sodium chloride 1.17 1.17 PET/COP (1.38/1.01) 50 seconds 98% OK Embodiment 5 Calcium chloride 1.3 1.2 PET/COP (1.38/1.01) 45 seconds 96% OK

根據上述實驗,如表11所例示之結果,可配置密度在欲分選基板的密度之間的溶液和通過實施例的基材分選方式(如第4、5圖之步驟所示),可快速完成基材分選。According to the above experiments, as shown in the results of Table 11, a solution with a density between the density of the substrate to be sorted can be configured and the substrate sorting method of the embodiment (as shown in the steps of Figures 4 and 5) can be used to quickly complete the substrate sorting.

綜合上述,實施例提出的基材分選方法,係通過濕式密度分選法,以簡單快速、安全性高、成本低、分選效率高且分選速度快的方法進行混合基材的分選。實施例的基材分選方法中,通過將混合基材置入具有適當密度的分選溶液,且利用密度較小的基材可浮在分選溶液的上層,密度較大的基材則沉降在分選溶液的下層,進而達到基材分選的目的。混合基材可以是任何不同種類的基材,例如可以是廢棄偏光板回收處理(例如去除碘、偏光子和殘膠)後的不同保護層。應用實施例的基材分選方法可進行此些保護層的分選和回收,以減少對環境的汙染,回收後的基材亦可以重新製造成其他再生製品,達到環保減碳,增加經濟效益。In summary, the substrate sorting method proposed in the embodiment is to sort the mixed substrate by a wet density sorting method in a simple, fast, safe, low-cost, high-sorting efficiency and fast sorting speed. In the substrate sorting method of the embodiment, the mixed substrate is placed in a sorting solution with an appropriate density, and the substrate with a smaller density can float on the upper layer of the sorting solution, while the substrate with a larger density settles in the lower layer of the sorting solution, thereby achieving the purpose of substrate sorting. The mixed substrate can be any different types of substrates, for example, different protective layers after the recycling of discarded polarizing plates (for example, removing iodine, polarizers and residual glue). The substrate sorting method of the embodiment can be used to sort and recycle these protective layers to reduce environmental pollution. The recycled substrate can also be re-manufactured into other recycled products to achieve environmental protection, carbon reduction, and increase economic benefits.

1:偏光板 102:偏光子 104:第一保護層 106:第二保護層 201:破碎偏光板 202:第一溶液 203,204,206,207,510:混合基材 205:第二溶液 501:溶液(分選溶液) 511:第一基材 512:第二基材 21,22,23,24, 401,402,403,51,52,53,54,55:步驟 1: Polarizing plate 102: Polarizer 104: First protective layer 106: Second protective layer 201: Broken polarizing plate 202: First solution 203,204,206,207,510: Mixed substrate 205: Second solution 501: Solution (sorting solution) 511: First substrate 512: Second substrate 21,22,23,24, 401,402,403,51,52,53,54,55: Steps

第1圖係為一偏光板的剖面簡示圖。 第2圖為根據本揭露一些實施例的廢棄偏光板回收後的處理製程示意圖。 第3A圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之前基材上是否存在黏著劑。 第3B圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之前基材上是否存在接著劑。 第3C圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之後基材上是否存在黏著劑。 第3D圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之後基材上是否存在接著劑。 第4圖示出了根據本揭露一些實施例的基材分選方法的流程圖。 第5圖示出了根據本揭露一些實施例的基材分選的示意圖。 FIG. 1 is a schematic cross-sectional view of a polarizing plate. FIG. 2 is a schematic diagram of a treatment process of a waste polarizing plate after recycling according to some embodiments of the present disclosure. FIG. 3A is a diagram of some embodiments of the present disclosure, in which a Fourier transform infrared spectrometer (FTIR) is used to detect a substrate to analyze whether an adhesive exists on the substrate before alkaline treatment. FIG. 3B is a diagram of some embodiments of the present disclosure, in which a Fourier transform infrared spectrometer (FTIR) is used to detect a substrate to analyze whether an adhesive exists on the substrate before alkaline treatment. FIG. 3C is a diagram of some embodiments of the present disclosure, in which a Fourier transform infrared spectrometer (FTIR) is used to detect a substrate to analyze whether an adhesive exists on the substrate after alkaline treatment. FIG. 3D shows some embodiments of the present disclosure, where a Fourier transform infrared spectrometer (FTIR) is used to detect the substrate to analyze whether a bonding agent is present on the substrate after the alkali treatment. FIG. 4 shows a flow chart of a substrate sorting method according to some embodiments of the present disclosure. FIG. 5 shows a schematic diagram of substrate sorting according to some embodiments of the present disclosure.

401,402,403:步驟 401,402,403: Steps

Claims (19)

一種基材分選方法,包括: 提供一混合基材,包含不同材料的第一基材與第二基材,其中該第一基材具有第一密度,該第二基材具有第二密度,該第一密度不同於該第二密度; 提供一溶液,該溶液具有第三密度,其中該第一密度和該第二密度至少其中一者不同於該第三密度;以及 將該混合基材加入該溶液中,使該第一基材與該第二基材分離而位於該溶液中的不同位置, 其中該第一密度小於或等於該第三密度,該第二密度大於或等於該第三密度,在該混合基材加入該溶液後,該第一基材在該溶液中浮起,該第二基材則沉入該溶液底部, 其中該第一基材與該第二基材為選自由聚甲基丙烯酸甲酯、三醋酸纖維素、丙烯酸樹脂膜、聚芳香羥樹脂膜、聚醚樹脂膜、環聚烯烴樹脂膜、聚對苯二甲酸乙二酯、聚丙稀、環烯烴聚合物、聚碳酸酯、以及上述任意組合所組成的群組中的不同材料。 A substrate sorting method comprises: providing a mixed substrate, comprising a first substrate and a second substrate of different materials, wherein the first substrate has a first density, the second substrate has a second density, and the first density is different from the second density; providing a solution, the solution has a third density, wherein at least one of the first density and the second density is different from the third density; and adding the mixed substrate to the solution, so that the first substrate and the second substrate are separated and located at different positions in the solution, wherein the first density is less than or equal to the third density, the second density is greater than or equal to the third density, after the mixed substrate is added to the solution, the first substrate floats in the solution, and the second substrate sinks to the bottom of the solution, The first substrate and the second substrate are different materials selected from the group consisting of polymethyl methacrylate, cellulose triacetate, acrylic resin film, polyaromatic hydroxyl resin film, polyether resin film, cycloolefin resin film, polyethylene terephthalate, polypropylene, cycloolefin polymer, polycarbonate, and any combination thereof. 如請求項1之基材分選方法,其中該第三密度為該第一密度和該第二密度的一平均密度。A substrate sorting method as claimed in claim 1, wherein the third density is an average density of the first density and the second density. 如請求項1之基材分選方法,其中該第一密度和該第二密度的另一者與該第三密度相同,則該溶液的該第三密度為該溶液在其飽和溶液狀態下時的密度。In the substrate sorting method of claim 1, wherein the other of the first density and the second density is the same as the third density, the third density of the solution is the density of the solution in its saturated solution state. 如請求項1之基材分選方法,其中該溶液為一鹽類水溶液,且該鹽類水溶液不含有與該基材起化學反應的物質。A substrate separation method as claimed in claim 1, wherein the solution is an aqueous salt solution, and the aqueous salt solution does not contain a substance that chemically reacts with the substrate. 如請求項1之基材分選方法,其中該溶液包括氯化鈉、氯化鈣、前述之組合。A substrate separation method as claimed in claim 1, wherein the solution comprises sodium chloride, calcium chloride, or a combination thereof. 如請求項1之基材分選方法,其中該第一基材的該第一密度和該第二基材的該第二密度皆在0.87~1.45的範圍。A substrate sorting method as claimed in claim 1, wherein the first density of the first substrate and the second density of the second substrate are both in the range of 0.87 to 1.45. 如請求項1之基材分選方法,其中該混合基材的固體重量(以公斤計)與該溶液體積(以公升計)的比例在1:16~1:1000的範圍之間。The substrate separation method of claim 1, wherein the ratio of the solid weight of the mixed substrate (in kilograms) to the volume of the solution (in liters) is in the range of 1:16 to 1:1000. 如請求項1之基材分選方法,其中該混合基材的分選率為下式(1): ....式(1) 其中X為裝有該溶液之一容器的底面積,單位cm 2; Y為該容器的高度,單位cm; Z為該混合基材的固體重量,單位kg;以及 V為該溶液的體積,單位L。 The substrate sorting method of claim 1, wherein the sorting rate of the mixed substrate is the following formula (1): ....Formula (1) wherein X is the bottom area of a container containing the solution, in cm 2 ; Y is the height of the container, in cm; Z is the solid weight of the mixed matrix, in kg; and V is the volume of the solution, in L. 如請求項1之基材分選方法,其中提供該混合基材的步驟還包括: 回收廢棄偏光板,其中該偏光板包括一聚乙烯醇(polyvinyl alcohol,PVA)層和黏附於該PVA層相對兩側之一第一保護層和一第二保護層; 去除碘、該PVA層和接著層,使該第一保護層和該第二保護層與該PVA層分離;以及 清洗該第一保護層和該第二保護層,其中該第一保護層和該第二保護層係分別為該混合基材的該第一基材與該第二基材。 The substrate sorting method of claim 1, wherein the step of providing the mixed substrate further includes: Recycling a waste polarizing plate, wherein the polarizing plate includes a polyvinyl alcohol (PVA) layer and a first protective layer and a second protective layer adhered to opposite sides of the PVA layer; Removing iodine, the PVA layer and the bonding layer to separate the first protective layer and the second protective layer from the PVA layer; and Cleaning the first protective layer and the second protective layer, wherein the first protective layer and the second protective layer are the first substrate and the second substrate of the mixed substrate, respectively. 一種基材分選方法,包括: 提供如請求項1所述之該混合基材,且該混合基材具有一固體重量; 提供一容器,該容器具有一底面積和一高度; 將如請求項1所述之該溶液加入該容器中; 通過下式(1)以得到分選率大於90%時,分選基材所需的一溶液體積, ....式(1) 其中X為該容器的該底面積,單位cm 2; Y為該容器的該高度,單位cm; Z為該混合基材的該固體重量,單位kg;和 V為該溶液體積,單位L;以及 將該混合基材加入該溶液中,使該第一基材與該第二基材分離而位於該溶液中的不同位置。 A method for separating substrates, comprising: providing the mixed substrate as described in claim 1, wherein the mixed substrate has a solid weight; providing a container, wherein the container has a bottom area and a height; adding the solution as described in claim 1 into the container; obtaining a solution volume required for separating substrates when the separation rate is greater than 90% by the following formula (1): ....Formula (1) wherein X is the bottom area of the container, in cm2 ; Y is the height of the container, in cm; Z is the solid weight of the mixed substrate, in kg; and V is the volume of the solution, in L; and the mixed substrate is added to the solution so that the first substrate and the second substrate are separated and located at different positions in the solution. 如請求項10之基材分選方法,其中該容器的該底面積(X)/該容器的該高度(Y)為23~37。A substrate sorting method as claimed in claim 10, wherein the bottom area (X) of the container/the height (Y) of the container is 23~37. 一種基材分選方法,包括: 回收廢棄偏光板並經過一處理製程,以提供如請求項1所述之該混合基材; 提供如請求項1所述之該溶液, 將該混合基材加入該溶液中,使該第一基材與該第二基材分離而位於該溶液中的不同位置。 A substrate sorting method, comprising: Recycling waste polarizing plates and subjecting them to a treatment process to provide the mixed substrate as described in claim 1; Providing the solution as described in claim 1, Adding the mixed substrate to the solution, so that the first substrate and the second substrate are separated and located at different positions in the solution. 如請求項12之基材分選方法,其中該偏光板包括一偏光子和黏附於該偏光子相對兩側之一第一保護層和一第二保護層,該處理製程包括去除該偏光子和接著層,使該第一保護層和該第二保護層與該偏光子分離, 其中該第一保護層和該第二保護層係分別為該第一基材與該第二基材。 The substrate sorting method of claim 12, wherein the polarizing plate includes a polarizer and a first protective layer and a second protective layer adhered to opposite sides of the polarizer, and the processing process includes removing the polarizer and the connecting layer to separate the first protective layer and the second protective layer from the polarizer, wherein the first protective layer and the second protective layer are the first substrate and the second substrate, respectively. 如請求項13之基材分選方法,其中該偏光子為PVA層,該處理製程包括: 去除碘和該PVA層; 去除該第一保護層和該第二保護層上的接著層;以及 清洗該第一保護層和該第二保護層,以得到乾淨的該混合基材。 In the substrate sorting method of claim 13, wherein the polarizer is a PVA layer, the processing process includes: Removing iodine and the PVA layer; Removing the first protective layer and the connecting layer on the second protective layer; and Cleaning the first protective layer and the second protective layer to obtain a clean mixed substrate. 如請求項14之基材分選方法,其中在去除碘和該PVA層之前,該處理製程還包括將該偏光板破碎化處理,其中去除碘和該PVA層之步驟包括: 將破碎偏光板浸泡於水中並維持擾動,以去除碘和溶解PVA,並形成包含碘和PVA的第一溶液,該第一溶液中分散有該第一保護層和該第二保護層; 將該第一保護層和該第二保護層與該第一溶液分離;以及 水洗該第一保護層和該第二保護層。 The substrate sorting method of claim 14, wherein before removing the iodine and the PVA layer, the treatment process further includes fragmenting the polarizing plate, wherein the step of removing the iodine and the PVA layer includes: Soaking the fragmented polarizing plate in water and maintaining agitation to remove the iodine and dissolve the PVA, and forming a first solution containing iodine and PVA, wherein the first protective layer and the second protective layer are dispersed in the first solution; Separating the first protective layer and the second protective layer from the first solution; and Washing the first protective layer and the second protective layer with water. 如請求項15之基材分選方法,其中去除碘和溶解PVA的水的溫度係在25℃~100℃的範圍。In the substrate sorting method of claim 15, the temperature of the water for removing iodine and dissolving PVA is in the range of 25°C to 100°C. 如請求項15之基材分選方法,其中前述破碎偏光板的固體重量(以公斤計)相對於水的體積(以公升計)的固液比在1:10~1:200的範圍之間。The substrate separation method of claim 15, wherein the solid-liquid ratio of the solid weight (in kilograms) of the broken polarizing plates to the volume (in liters) of water is in the range of 1:10 to 1:200. 如請求項15之基材分選方法,其中將水洗後的該第一保護層和該第二保護層混合並浸泡於第二溶液中,且持續加熱靜置一段時間,以去除該第一保護層和該第二保護層上的接著層; 將該第一保護層和該第二保護層與該第二溶液分離;以及 水洗該第一保護層和該第二保護層, 其中水洗後的該第一保護層和該第二保護層係分別為該混合基材的該第一基材與該第二基材。 The substrate separation method of claim 15, wherein the washed first protective layer and the second protective layer are mixed and immersed in a second solution, and are continuously heated and left to stand for a period of time to remove the bonding layer on the first protective layer and the second protective layer; The first protective layer and the second protective layer are separated from the second solution; and The first protective layer and the second protective layer are washed, wherein the washed first protective layer and the second protective layer are the first substrate and the second substrate of the mixed substrate, respectively. 如請求項18之基材分選方法,其中該第二溶液為一鹼性溶液,且該鹼性溶液的pH值範圍為8~14,及/或該鹼性溶液的溫度係在25℃~100℃的範圍,及/或該鹼性溶液的濃度係在1%~10%的範圍,及/或該鹼性溶液為氫氧化鹽溶液、碳酸鹽類、碳酸氫鹽類溶液。A substrate sorting method as claimed in claim 18, wherein the second solution is an alkaline solution, and the pH value of the alkaline solution is in the range of 8-14, and/or the temperature of the alkaline solution is in the range of 25°C-100°C, and/or the concentration of the alkaline solution is in the range of 1%-10%, and/or the alkaline solution is a hydroxide solution, a carbonate solution, or a bicarbonate solution.
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CN101239795A (en) * 2008-02-20 2008-08-13 云南锡业集团(控股)有限责任公司 Rocking bed filling material and preparation method thereof
CN116037615A (en) * 2022-12-27 2023-05-02 江苏融道复合材料产业技术研究院有限公司 Crushing and recycling device for bio-based materials and working method thereof

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101239795A (en) * 2008-02-20 2008-08-13 云南锡业集团(控股)有限责任公司 Rocking bed filling material and preparation method thereof
CN116037615A (en) * 2022-12-27 2023-05-02 江苏融道复合材料产业技术研究院有限公司 Crushing and recycling device for bio-based materials and working method thereof

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