TWI875589B - Method for separating and grouping substrates - Google Patents
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- TWI875589B TWI875589B TW113117185A TW113117185A TWI875589B TW I875589 B TWI875589 B TW I875589B TW 113117185 A TW113117185 A TW 113117185A TW 113117185 A TW113117185 A TW 113117185A TW I875589 B TWI875589 B TW I875589B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29B—PREPARATION OR PRETREATMENT OF THE MATERIAL TO BE SHAPED; MAKING GRANULES OR PREFORMS; RECOVERY OF PLASTICS OR OTHER CONSTITUENTS OF WASTE MATERIAL CONTAINING PLASTICS
- B29B17/00—Recovery of plastics or other constituents of waste material containing plastics
- B29B17/02—Separating plastics from other materials
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29B—PREPARATION OR PRETREATMENT OF THE MATERIAL TO BE SHAPED; MAKING GRANULES OR PREFORMS; RECOVERY OF PLASTICS OR OTHER CONSTITUENTS OF WASTE MATERIAL CONTAINING PLASTICS
- B29B17/00—Recovery of plastics or other constituents of waste material containing plastics
- B29B17/02—Separating plastics from other materials
- B29B2017/0203—Separating plastics from plastics
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29B—PREPARATION OR PRETREATMENT OF THE MATERIAL TO BE SHAPED; MAKING GRANULES OR PREFORMS; RECOVERY OF PLASTICS OR OTHER CONSTITUENTS OF WASTE MATERIAL CONTAINING PLASTICS
- B29B17/00—Recovery of plastics or other constituents of waste material containing plastics
- B29B17/02—Separating plastics from other materials
- B29B2017/0213—Specific separating techniques
- B29B2017/0217—Mechanical separating techniques; devices therefor
- B29B2017/0237—Mechanical separating techniques; devices therefor using density difference
- B29B2017/0244—Mechanical separating techniques; devices therefor using density difference in liquids
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Abstract
Description
本發明是關於一種基材分選方法,特別是關於快速、安全、成本低、且分選效率高的一種基材分選方法。The present invention relates to a substrate sorting method, in particular to a substrate sorting method which is fast, safe, low-cost and has high sorting efficiency.
電子裝置構成中包含大量基材,傳統廢棄電子裝置處理基材的方法多以焚燒為主,但燃燒法容易造成環境汙染,且無法再利用,目前已開發有基材回收方法,以減少對環境的汙染,符合現今逐漸抬頭的環保意識。一些回收後的基材還可以重新製造為其他再生製品,增加經濟效益。Electronic devices contain a large number of substrates. Traditional methods of disposing of substrates from discarded electronic devices are mainly incineration. However, the incineration method easily causes environmental pollution and cannot be reused. Currently, substrate recycling methods have been developed to reduce environmental pollution, which is in line with the current environmental awareness. Some recycled substrates can also be re-manufactured into other recycled products to increase economic benefits.
而電子裝置的回收處理可能會出現大量混和基材待處理。目前將混合基材進行分類的方式大多需要花費較長時間,且便利性較低。以廢棄偏光板為例,其回收處理後所得到的大量混和基材須要進一步分類與進行再生。目前多以傅立葉轉換紅外光譜儀(FTIR)為混合基材進行膜材的辨識與分類,此方法雖可以有效分類混和基材,但耗時且不便。因此,雖然現有的基材分選方式通常足以滿足它們的預期目的,但是它們在所有方面並不是完全令人滿意的。研發者則不斷持續尋求在各方面更佳的基材分選方式。The recycling of electronic devices may result in a large number of mixed substrates to be processed. Currently, most methods of sorting mixed substrates take a long time and are less convenient. Taking discarded polarizing plates as an example, the large number of mixed substrates obtained after recycling need to be further sorted and regenerated. Currently, Fourier transform infrared spectrometers (FTIR) are mostly used to identify and classify mixed substrates. Although this method can effectively classify mixed substrates, it is time-consuming and inconvenient. Therefore, although existing substrate sorting methods are generally sufficient to meet their intended purposes, they are not completely satisfactory in all aspects. Researchers continue to seek better substrate sorting methods in all aspects.
本揭露的一些實施例提供一種基材分選方法,包括:提供一混合基材,包含不同材料的第一基材與第二基材,其中前述第一基材具有第一密度,前述第二基材具有第二密度,前述第一密度不同於前述第二密度;提供一溶液,此溶液具有第三密度,其中前述第一密度和前述第二密度至少其中一者不同於前述第三密度;以及將前述混合基材加入前述溶液中,使前述第一基材與前述第二基材分離而位於前述溶液中的不同位置。Some embodiments of the present disclosure provide a substrate sorting method, comprising: providing a mixed substrate, comprising a first substrate and a second substrate of different materials, wherein the first substrate has a first density, the second substrate has a second density, and the first density is different from the second density; providing a solution, the solution having a third density, wherein at least one of the first density and the second density is different from the third density; and adding the mixed substrate to the solution, so that the first substrate and the second substrate are separated and located at different positions in the solution.
本揭露的一些實施例提供一種基材分選方法,包括:提供上述之混合基材,且此混合基材具有固體重量;提供一容器,此容器具有底面積和高度;將如上所述之溶液加入容器中;通過下式(1)以得到某一分選率下(例如大於90%)時,分選基材所需的一溶液體積, ....式(1) Some embodiments of the present disclosure provide a method for sorting a substrate, comprising: providing the mixed substrate described above, wherein the mixed substrate has a solid weight; providing a container, wherein the container has a bottom area and a height; adding the solution described above into the container; and obtaining a solution volume required for sorting the substrate at a certain sorting rate (e.g., greater than 90%) by the following formula (1): ....Formula (1)
其中X為裝有前述溶液之一容器的底面積,單位cm 2;Y為前述容器的高度,單位cm;Z為前述混合基材的固體重量,單位kg;V為前述溶液的體積,單位L; Wherein X is the bottom area of a container containing the aforementioned solution, in cm 2 ; Y is the height of the aforementioned container, in cm; Z is the solid weight of the aforementioned mixed substrate, in kg; V is the volume of the aforementioned solution, in L;
將前述混合基材加入前述溶液中,使前述第一基材與前述第二基材分離而位於前述溶液中的不同位置。The mixed substrate is added into the solution, so that the first substrate and the second substrate are separated and located at different positions in the solution.
本揭露的一些實施例提供一種基材分選方法,包括:回收廢棄偏光板並經過一處理製程,以提供如上所述之混合基材;提供如上所述之溶液,且將前述混合基材加入前述溶液中,通過溶液密度與基材密度的差異使前述第一基材與前述第二基材分離,而位於前述溶液中的不同位置。Some embodiments of the present disclosure provide a substrate sorting method, comprising: recycling discarded polarizing plates and subjecting them to a treatment process to provide a mixed substrate as described above; providing a solution as described above, and adding the mixed substrate into the solution, separating the first substrate and the second substrate by the difference between the density of the solution and the density of the substrates, and locating them at different positions in the solution.
根據一些實施例,其中偏光板包括一偏光子和黏附於偏光子相對兩側的第一保護層和第二保護層,且上述處理製程包括去除偏光子的碘和溶解偏光子;去除第一保護層和第二保護層上的接著層;以及清洗第一保護層和第二保護層,以得到乾淨的混合基材。According to some embodiments, the polarizing plate includes a polarizer and a first protective layer and a second protective layer adhered to opposite sides of the polarizer, and the above-mentioned processing process includes removing iodine from the polarizer and dissolving the polarizer; removing the bonding layer on the first protective layer and the second protective layer; and cleaning the first protective layer and the second protective layer to obtain a clean mixed substrate.
以下提出各種實施方法或是範例來實行本揭露內容之不同特徵,其中描述具體的元件及其排列方式以闡述本揭露內容,當然這些僅是範例,且不該以此限定本揭露內容的範圍。例如,在描述中提及第一個元件形成在第二個元件上時,其可以包含第一個元件與第二個元件直接接觸的實施例,也可以包含有其他元件形成於第一個元件與第二個元件之間的實施例,其中第一個元件與第二個元件並未直接接觸。在不同實施例與圖式之中,相同或類似的元件符號用以表示相同或類似的元件,但這些相同或類似的元件符號標示僅為了簡單清楚地敘述本揭露內容,不代表所討論的不同實施例及/或結構之間有特定的關係。值得注意的是,實施例的提出,僅用以例示本揭露內容的技術特徵,並非用以限定本揭露內容的申請專利範圍。所屬技術領域中具有通常知識者,將可根據以下的描述,在不脫離本揭露內容的精神範圍內,作均等的修飾與變化。一些實施例中之圖式省略部份元件,以清楚顯示本揭露內容之技術特點。Various implementation methods or examples are presented below to implement different features of the present disclosure, wherein specific elements and their arrangements are described to illustrate the present disclosure, although these are merely examples and should not be used to limit the scope of the present disclosure. For example, when the description mentions that a first element is formed on a second element, it may include an embodiment in which the first element is in direct contact with the second element, and it may also include an embodiment in which other elements are formed between the first element and the second element, wherein the first element and the second element are not in direct contact. In different embodiments and drawings, the same or similar element symbols are used to represent the same or similar elements, but these same or similar element symbol markings are only for the purpose of simply and clearly describing the present disclosure, and do not represent a specific relationship between the different embodiments and/or structures discussed. It is worth noting that the examples are only used to illustrate the technical features of the present disclosure, and are not used to limit the scope of the patent application of the present disclosure. A person with ordinary knowledge in the relevant technical field will be able to make equal modifications and changes based on the following description without departing from the spirit of the present disclosure. Some of the drawings in some embodiments omit some elements to clearly show the technical features of the present disclosure.
此外,其中可能用到與空間相關的用詞,像是「在…下方」、「在…上方」、「在…之間」及類似的用詞,這些關係詞係為了便於描述圖式中一個(些)元件或特徵與另一個(些)元件或特徵之間的關係,這些空間關係詞包含使用中或操作中的裝置之不同方位,以及圖式中所描述的方位。裝置可能被轉向不同方位,則其中使用的空間相關形容詞也可相同地照著解釋。In addition, spatially relative terms such as "below", "above", "between" and similar terms may be used to facilitate the description of the relationship between one (or some) elements or features and another (or some) elements or features in the drawings. These spatially relative terms include different orientations of the device in use or operation, as well as the orientations described in the drawings. The device may be rotated to different orientations, and the spatially relative adjectives used therein may also be interpreted accordingly.
再者,「約」、「大約」、「大抵」之用語通常表示在一給定值的+/-20%之內,較佳是+/-10%之內,且更佳是+/-5%之內,或+/-3%之內,或+/-2%之內,或+/-1%之內,或0.5%之內。在此給定的數值為大約的數值,亦即在沒有特定說明「約」、「大約」、「大抵」的情況下,此給定的數值仍可隱含「約」、「大約」、「大抵」之含義。Furthermore, the terms "about", "approximately", and "generally" generally mean within +/-20% of a given value, preferably within +/-10%, and more preferably within +/-5%, or within +/-3%, or within +/-2%, or within +/-1%, or within 0.5%. The numerical values given herein are approximate numerical values, that is, in the absence of specific description of "about", "approximately", and "generally", the given numerical values may still imply the meaning of "about", "approximately", and "generally".
以下描述實施例的一些變化。雖然所述的一些實施例中的步驟以特定順序進行,這些步驟亦可以其他合邏輯的順序進行。在實施例所敘述的一些製程步驟之前、之中、及/或之後可能包含進行額外的製程步驟,且一些實施例中所敘述的某些製程步驟可能在另一些實施例之方法中被其他製程步驟所取代或刪除。再者,可以理解的是,本發明例示的實施例中的裝置或系統中可以加入其他的部件,或是可以替換或省略一些部件。Some variations of the embodiments are described below. Although the steps in some of the embodiments described are performed in a particular order, these steps may also be performed in other logical orders. Additional process steps may be performed before, during, and/or after some of the process steps described in the embodiments, and some process steps described in some embodiments may be replaced or deleted by other process steps in the methods of other embodiments. Furthermore, it is understood that other components may be added to the device or system in the embodiments illustrated in the present invention, or some components may be replaced or omitted.
本揭露內容之實施例係提出基材分選方法,其通過濕式密度分選法,可簡單快速且安全地對提供的混合基材(mixture of substrates)進行處理,以使各個種類的基材在適當的分選溶液中分離,利於揀取,以完成基材分選。混合基材可以是任何不同種類的基材。本揭露例如是可應用於廢棄偏光板的回收製程中,將回收偏光板經過處理製程(例如去除碘、偏光子和殘膠),其相關材料層(例如在偏光子上下兩側的保護層,如後敘述,即為實施例的基材)分離後,可通過實施例的基材分選方法以進行此些保護層的分選和回收。除了可以減少對環境的汙染,回收後的基材可以重新製造為其他再生製品。The embodiments of the present disclosure provide a substrate sorting method, which can simply, quickly and safely process the provided mixed substrates (mixture of substrates) through a wet density sorting method, so that each type of substrate is separated in an appropriate sorting solution, which is convenient for picking to complete the substrate sorting. The mixed substrate can be any different type of substrate. For example, the present disclosure can be applied to the recycling process of discarded polarizing plates. After the recycled polarizing plates are subjected to a processing process (for example, to remove iodine, polarizers and residual glue), the related material layers (for example, the protective layers on the upper and lower sides of the polarizers, as described later, which are the substrates of the embodiments) are separated, and then the substrate sorting method of the embodiments can be used to sort and recycle these protective layers. In addition to reducing environmental pollution, the recycled substrate can be re-manufactured into other recycled products.
以下係以偏光板回收為例,說明本揭露一些實施例的基材分選方法中,混合基材的來源與前端處理製程。The following uses polarizing plate recycling as an example to explain the source of mixed substrates and the front-end processing process in the substrate sorting method of some embodiments of the present disclosure.
<混合基材的來源與前端處理製程><Sources of mixed substrates and front-end processing>
第1圖係為一偏光板的剖面簡示圖。偏光板1包括偏光子102和位於偏光子102上下兩側的多個材料層,例如可分別藉由接著層(未示出)貼附於偏光子102相對兩表面上的第一保護層104和第二保護層106。在一實施例中,第一保護層104和第二保護層106在遠離偏光子102的表面上還可包括其他光學膜層、表面保護層、黏著層和離形膜(未示出)。FIG. 1 is a schematic cross-sectional view of a polarizing plate. The polarizing
在一些實施例中,偏光子102可為聚乙烯醇(PVA)樹脂膜,其可藉由皂化聚醋酸乙烯樹脂製得。聚醋酸乙烯樹脂的例子包括醋酸乙烯之單聚合物,即聚醋酸乙烯,以及醋酸乙烯之共聚合物和其他能與醋酸乙烯進行共聚合之單體。其他能與醋酸乙烯進行共聚合之單體的例子包括不飽和羧酸(例如丙烯酸、甲基丙烯酸、丙烯酸乙酯、正丙烯酸丙酯、甲基丙烯酸甲酯)、烯烴(例如乙烯、丙烯、1-丁烯、2-甲丙烯)、乙烯醚(例如乙基乙烯醚、甲基乙烯醚、正丙基乙烯醚、異丙基乙烯醚)、不飽和磺酸(例如乙烯基磺酸、乙烯基磺酸鈉)等等。In some embodiments, the
在一些實施例中,第一保護層104和第二保護層106的材料可選自由聚甲基丙烯酸甲酯(Polymethylmethacrylate;PMMA)、三醋酸纖維素(Triacetyl Cellulose;TAC)、丙烯酸樹脂膜、聚芳香羥樹脂膜、聚醚樹脂膜、環聚烯烴樹脂膜(例如聚冰片烯樹脂膜)、聚對苯二甲酸乙二酯(Polyethylene Terephthalate;PET)、聚丙稀(Polypropylene;PP)、環烯烴聚合物(Cyclo Olefin Polymer;COP)、聚碳酸酯(Polycarbonate;PC)、以及上述任意組合所組成的群組。In some embodiments, the material of the first
接著層可包含水系接著劑,一般例如是使用聚乙烯醇系樹脂或胺基甲酸酯樹脂作為水系接著劑的主成分,且為了提高接著性可以是配合添加異氰酸酯系化合物或環氧化合物般之交聯劑或硬化性化合物而製成之組成物。在一些實施例中,水系接著劑之主成分是聚乙烯醇系樹脂時,除可使用部分皂化聚乙烯醇及完全皂化聚乙烯醇之外,尚可使用如羧基變性聚乙烯醇、乙醯基變性聚乙烯醇、羥甲基變性聚乙烯醇、及胺基變性聚乙烯醇般之經變性之聚乙烯醇系樹脂。The adhesive layer may include a water-based adhesive, generally, for example, a polyvinyl alcohol resin or a urethane resin is used as the main component of the water-based adhesive, and in order to improve the adhesiveness, a crosslinking agent or a curing compound such as an isocyanate compound or an epoxy compound may be added to form a composition. In some embodiments, when the main component of the water-based adhesive is a polyvinyl alcohol resin, in addition to partially saponified polyvinyl alcohol and completely saponified polyvinyl alcohol, a modified polyvinyl alcohol resin such as carboxyl-modified polyvinyl alcohol, acetyl-modified polyvinyl alcohol, hydroxymethyl-modified polyvinyl alcohol, and amino-modified polyvinyl alcohol may be used.
在一些實施例中,接著層可為紫外線固化型接著劑,材料可列舉例如:丙烯酸系接著劑、環氧系接著劑、胺甲酸酯系接著劑、聚酯系接著劑、聚乙烯醇系接著劑、聚烯烴系接著劑、改質聚烯烴系接著劑、聚乙烯基烷基醚系接著劑、橡膠系接著劑、氯乙烯―乙酸乙烯酯系接著劑、SEBS(苯乙烯―乙烯―丁烯―苯乙烯共聚物)系接著劑、乙烯―苯乙烯共聚物等乙烯系接著劑、乙烯―(甲基)丙烯酸甲酯共聚物、乙烯―(甲基)丙烯酸乙酯共聚物等丙烯酸酯系接著劑等。In some embodiments, the adhesive layer may be a UV-curable adhesive, and the materials may include, for example: acrylic adhesives, epoxy adhesives, urethane adhesives, polyester adhesives, polyvinyl alcohol adhesives, polyolefin adhesives, modified polyolefin adhesives, polyvinyl alkyl ether adhesives, rubber adhesives, vinyl chloride-vinyl acetate adhesives, SEBS (styrene-ethylene-butylene-styrene copolymer) adhesives, ethylene-styrene copolymers and other ethylene-based adhesives, ethylene-(meth)acrylate methyl copolymers, ethylene-(meth)acrylate ethyl copolymers and other acrylate-based adhesives, etc.
黏著層包含壓敏性黏著劑(pressure sensitive adhesive,PSA)、熱敏性黏著劑、溶劑揮發性黏著劑、及/或紫外光可固化黏著劑。在一些實施例中,壓敏性黏著劑可包含天然橡膠、合成橡膠、苯乙烯嵌段共聚物、(甲基)丙烯酸系嵌段共聚物、聚乙烯基醚、聚烯烴、及/或聚(甲基)丙烯酸酯。在一些實施例中,(甲基)丙烯酸(或丙烯酸酯)係指丙烯酸及甲基丙烯酸類二者。在一些實施例中,壓敏性黏著劑可包含(甲基)丙烯酸酯、橡膠、熱塑性彈性體、聚矽氧、胺基甲酸酯、及其組合。在一些實施例中,壓敏性黏著劑係基於(甲基)丙烯酸系壓敏性黏著劑或基於至少一種聚(甲基)丙烯酸酯。The adhesive layer includes a pressure sensitive adhesive (PSA), a heat sensitive adhesive, a solvent volatile adhesive, and/or an ultraviolet light curable adhesive. In some embodiments, the pressure sensitive adhesive may include natural rubber, synthetic rubber, styrene block copolymer, (meth) acrylic block copolymer, polyvinyl ether, polyolefin, and/or poly (meth) acrylate. In some embodiments, (meth) acrylic acid (or acrylate) refers to both acrylic acid and methacrylic acid. In some embodiments, the pressure sensitive adhesive may include (meth) acrylate, rubber, thermoplastic elastomer, polysilicone, urethane, and combinations thereof. In some embodiments, the pressure-sensitive adhesive is based on a (meth)acrylic pressure-sensitive adhesive or on at least one poly(meth)acrylate.
第2圖為根據本揭露一些實施例的廢棄偏光板回收後的處理製程示意圖。此示例中,以包含聚乙烯醇(PVA)偏光子的破碎偏光板201為例做說明。首先可將偏光板破碎化處理。破碎偏光板的尺寸大小和形狀並無特別限制,以方便後續於容器中進行處理即可。在一些實施例中,破碎偏光板的各個破片例如在1cm
2~100cm
2的範圍。
FIG. 2 is a schematic diagram of the processing process of the waste polarizing plate after recycling according to some embodiments of the present disclosure. In this example, a broken polarizing
之後,如步驟21,可用水去除破碎偏光板201的碘和溶解PVA。在一些實施例中,例如是將破碎偏光板201浸泡於水中,並保持擾動,以去除碘和溶解PVA,並形成包含有碘和PVA的第一溶液202。在一些實施例中,可通過一攪拌機(未示出)使第一溶液202維持攪拌擾動。值得注意的是,攪拌條件無特別限制,有無攪拌皆可,第一溶液202僅保持擾動亦可,只要可以增加水與破碎偏光板201之間的接觸面積即可。Thereafter, as in
在此示例中,第一溶液202中分散有偏光板的保護層例如第1圖所示之第一保護層104和第二保護層106的破片。為簡化說明,此些保護層的破片在以下敘述中係簡稱混合基材。In this example, the
再者,上述步驟21中所使用的水體積以可覆蓋被處理物即可。在一些實施例中,破碎偏光板201的固體重量(以公斤計)相對於水的體積(以公升計)的固液比例如(但不限)在1:10~1:200的範圍之間,或是其他合適的固液比範圍。Furthermore, the volume of water used in the
再者,上述用以去除碘和溶解PVA的水的溫度並無特別限制,可以是室溫或一高溫。在一些實施例中,用以去除碘和溶解PVA的水的溫度是在25℃~100℃的範圍,或其他合適的溫度範圍。在一示例中,使用90℃的水去除碘和溶解PVA。Furthermore, the temperature of the water used to remove iodine and dissolve PVA is not particularly limited, and can be room temperature or a high temperature. In some embodiments, the temperature of the water used to remove iodine and dissolve PVA is in the range of 25°C to 100°C, or other suitable temperature ranges. In one example, 90°C water is used to remove iodine and dissolve PVA.
當偏光板已失去偏光性(可通過目視或其他任何可行方式判斷),即已去除碘和溶解PVA,在PVA上方和下方的保護層(以下簡稱基材)可分離,可將混合基材203與第一溶液202分離。例如將混合基材203自第一溶液202撈取出來。但此時混合基材203上還殘留有黏著物(例如接著劑和黏著劑)。When the polarizing plate has lost its polarization (which can be determined visually or by any other feasible method), the iodine has been removed and the PVA has been dissolved, and the protective layers above and below the PVA (hereinafter referred to as substrates) can be separated, and the
之後,如步驟22,將混合基材203水洗,以去除混合基材203表面上殘留的碘和PVA。在一示例中,例如在室溫下對混合基材203水洗並攪拌數分鐘,之後取出混合基材203。水洗後的混合基材204上仍殘留有黏著物例如接著劑和黏著劑,以下可簡稱殘膠。Then, as in
之後,如步驟23,通過一鹼處理,以去除混合基材204(例如第一保護層104和第二保護層106的破片)上的殘膠。例如,將水洗後的混合基材204浸泡於第二溶液205中,且持續加熱靜置一段時間,以溶解去除以去除混合基材204上的殘膠。Then, as in
在一些實施例中,上述第二溶液205為一鹼性溶液。此鹼性溶液的pH值例如在8~14的範圍,或其他合適的pH值範圍。In some embodiments, the
再者,上述用以去除殘膠的第二溶液205的溫度並無特別限制,可以是室溫至低於其沸點的範圍之間。在一些實施例中,第二溶液205的溫度例如在25℃~100℃的範圍,或其他合適的溫度範圍。Furthermore, the temperature of the
再者,上述用以去除殘膠的第二溶液205的濃度並無特別限制,但可以在流程安全性的考量下,使用低濃度的第二溶液205。在一些實施例中,第二溶液205的濃度例如在1%~10%的範圍,或其他合適的濃度範圍。Furthermore, the concentration of the
再者,在一些實施例中,第二溶液205為氫氧化鹽溶液、碳酸鹽類、碳酸氫鹽類溶液、或其他合適的鹼性溶液。在一示例中,第二溶液205為氫氧化鉀溶液。Furthermore, in some embodiments, the
在靜置一段時間之後,可將混合基材206與第二溶液205分離。例如將混合基材206自第二溶液205撈取出來。但此時混合基材206上還殘留有第二溶液205(例如鹼性溶液)。After standing for a period of time, the
之後,如步驟24,清洗混合基材206以去除基材表面殘留的鹼性溶液。在一示例中,例如在室溫下對混合基材206水洗並攪拌數分鐘,之後取出混合基材207。水洗後的混合基材207上沒有膠體和鹼性溶液殘留,可得到乾淨的混合基材207,進而回收。另外,實施例係通過傅立葉轉換紅外線光譜(Fourier-transform infrared spectroscopy;FTIR)法,可確認上述處理方式可去除基材表面的殘膠。Then, as in
在此示例中,混合基材207例如包括第1圖所示之第一保護層104和第二保護層106的乾淨破片。而這些乾淨的混合基材207後續可通過實施例的基材分選方法完成分選,以利各種類的基材回收和後續再製。In this example, the
在上述實施例中,是先用水萃碘方式以去除偏光子的碘,並同時溶解PVA,之後再以鹼液去除殘留接著層或黏著層(例如殘留膠體)。相較於之前以鹼液除碘方式,此示例提出較安全的方法,以水即可進行偏光子除碘和溶解PVA,產生的廢液也較容易處理。以下亦提出實施例的其中一些實驗結果,以例示說明上述偏光板回收的前端處理製程。In the above embodiment, iodine is first extracted with water to remove the iodine of the polarized light and dissolve the PVA at the same time, and then the residual bonding layer or adhesive layer (such as residual colloid) is removed with alkaline solution. Compared with the previous method of removing iodine with alkaline solution, this example proposes a safer method, which can remove iodine from polarized light and dissolve PVA with water, and the waste liquid generated is also easier to handle. The following also presents some experimental results of the embodiment to illustrate the front-end processing process of the above polarized plate recycling.
在一些實驗中,係對不同偏光板的種類進行水萃碘,其實驗條件與結果列於表1。其中表1係列出偏光子上下兩側的保護層材料,且係以環烯烴聚合物(COP)、聚甲基丙烯酸甲酯(PMMA)、三醋酸纖維素(TAC)、聚對苯二甲酸乙二酯(PET)保護層為例進行實驗。In some experiments, water extraction of iodine was performed on different types of polarizers, and the experimental conditions and results are listed in Table 1. Table 1 lists the protective layer materials on the upper and lower sides of the polarizer, and the experiments were conducted using cycloolefin polymer (COP), polymethyl methacrylate (PMMA), triacetate cellulose (TAC), and polyethylene terephthalate (PET) protective layers as examples.
表1
根據上述實驗,如表1所例示之結果,不同偏光板的種類都可通過水萃碘方式去除碘和溶解PVA,且去除碘和溶解PVA後,偏光子兩側的基材可分離。According to the above experiments, as shown in the results of Table 1, different types of polarizers can remove iodine and dissolve PVA through water extraction of iodine, and after removing iodine and dissolving PVA, the substrates on both sides of the polarizer can be separated.
再者,一些相關實驗亦提出對不同的偏光板尺寸、形狀進行水萃碘實驗,其實驗條件與結果列於表2。實驗中的固液比是指固體總重量(g)相對於液體體積(ml),例如取10g破碎偏光板加入200ml的水中,則固液比為1:20。Furthermore, some related experiments have also proposed water extraction of iodine for different polarizing plate sizes and shapes, and the experimental conditions and results are listed in Table 2. The solid-liquid ratio in the experiment refers to the total weight of the solid (g) relative to the liquid volume (ml). For example, if 10g of broken polarizing plate is added to 200ml of water, the solid-liquid ratio is 1:20.
表2
根據上述實驗,如表2所例示之結果,許多不同尺寸、形狀的偏光板都可通過水萃碘方式去除碘和溶解PVA,且去除碘和溶解PVA後,偏光子兩側的基材可分離。According to the above experiments, as shown in the results of Table 2, many polarizing plates of different sizes and shapes can be removed iodine and PVA can be dissolved by water extraction of iodine, and after removing iodine and dissolving PVA, the substrates on both sides of the polarizer can be separated.
再者,一些相關實驗亦提出在不同的固液比下進行偏光板的水萃碘,其實驗條件與結果列於表3。Furthermore, some related experiments also proposed to extract iodine from polarizing plates with water at different solid-liquid ratios. The experimental conditions and results are listed in Table 3.
表3
根據上述實驗,如表3所例示之結果,可以在範圍甚廣的固液比下進行偏光板的水萃碘,例如自1:7.5至1:200。但固液比太低,例如比較例提出的1:5和1:1,則有固體高於液面的情形,而無法順利完成偏光板的水萃碘。According to the above experiments, as shown in Table 3, the iodine extraction of polarizing plates can be carried out in a wide range of solid-liquid ratios, such as from 1:7.5 to 1:200. However, if the solid-liquid ratio is too low, such as 1:5 and 1:1 in the comparative example, the solid may be higher than the liquid level, and the iodine extraction of polarizing plates cannot be successfully completed.
再者,一些相關實驗亦提出在不同的溫度下進行偏光板的水萃碘,其實驗條件與結果列於表4。Furthermore, some related experiments also proposed to extract iodine from polarizing plates at different temperatures. The experimental conditions and results are listed in Table 4.
表4
根據上述實驗,如表4所例示之結果,在相同的偏光板尺寸和相同的固液比下,室溫約25℃至高溫100℃範圍的水都可以完成偏光板的水萃碘。而太低的水溫,例如比較例1使用的10℃的水或是比較例2使用的20℃的水,則偏光板水萃碘的效果不佳。而過高的水溫,例如比較例3使用的110℃,水有沸騰蒸發現象,偏光板水萃碘的效果亦不佳。According to the above experiments, as shown in Table 4, under the same polarizing plate size and the same solid-liquid ratio, water at room temperature of about 25°C to high temperature of 100°C can complete the extraction of iodine from the polarizing plate. However, too low water temperature, such as 10°C water used in Comparative Example 1 or 20°C water used in Comparative Example 2, does not produce good results in the extraction of iodine from the polarizing plate. Too high water temperature, such as 110°C used in Comparative Example 3, causes the water to boil and evaporate, and the extraction of iodine from the polarizing plate is also not good.
再者,相關實驗中亦進行鹼處理的可行性測試。可通過傅立葉轉換紅外線光譜(FTIR)分析鹼處理之前和之後基材上是否還有黏著層存在。此示例中,係以保護層的一側具有接著劑(例如UV膠)與偏光子連接,且保護層的另一側塗佈有黏著層(例如壓敏性黏著劑(pressure sensitive adhesive,PSA)為樣品,進行相關實驗。Furthermore, the feasibility of alkaline treatment is also tested in the relevant experiments. Fourier transform infrared spectroscopy (FTIR) can be used to analyze whether there is still an adhesive layer on the substrate before and after the alkaline treatment. In this example, a protective layer with a binder (such as UV glue) connected to the polarizer on one side and an adhesive layer (such as pressure sensitive adhesive (PSA)) on the other side is used as a sample for relevant experiments.
第3A圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之前基材上是否存在黏著劑,例如(例如壓敏性黏著劑(pressure sensitive adhesive,PSA)。圖中X軸為波數(cm -1),Y軸為穿透度(%)或吸收值。可以利用傅立葉轉換紅外線光譜上官能基區(Functional group region)的訊號指認後,指紋區(Fringerprint region)訊號針對分子構型差異進一步確認。第3A圖中的上方訊號為鹼處理之前基材上的壓敏性黏著劑訊號,下方訊號為純壓敏性黏著劑訊號(PSA database),比對兩者訊號可確認在鹼處理之前基材上有黏著劑。 FIG. 3A shows some embodiments of the present disclosure, in which a Fourier transform infrared spectrometer (FTIR) is used to detect a substrate to analyze whether there is an adhesive on the substrate before the alkali treatment, such as a pressure sensitive adhesive (PSA). In the figure, the X-axis is the wave number (cm -1 ), and the Y-axis is the transmittance (%) or the absorbance value. After the signal of the functional group region on the Fourier transform infrared spectrum is identified, the fingerprint region signal can be further confirmed for the difference in molecular configuration. The upper signal in FIG. 3A is the signal of the pressure sensitive adhesive on the substrate before the alkali treatment, and the lower signal is the pure pressure sensitive adhesive signal (PSA database). By comparing the two signals, it can be confirmed that there is an adhesive on the substrate before the alkali treatment.
第3B圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之前基材上是否存在接著劑,例如UV膠。圖中的上方訊號為鹼處理之前基材上的UV膠訊號,下方訊號為純UV膠訊號,比對兩者訊號可確認在鹼處理之前基材上有接著劑。FIG. 3B shows some embodiments of the present disclosure, using a Fourier transform infrared spectrometer (FTIR) to detect the substrate to analyze whether there is a bonding agent, such as UV glue, on the substrate before the alkali treatment. The upper signal in the figure is the UV glue signal on the substrate before the alkali treatment, and the lower signal is the pure UV glue signal. Comparing the two signals can confirm that there is a bonding agent on the substrate before the alkali treatment.
第3C圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之後基材上是否存在黏著劑。圖中的上方訊號為鹼處理之後基材的訊號,下方訊號為純基材訊號,比對兩者訊號可確認在鹼處理之後基材上已無黏著劑,是乾淨基材。FIG. 3C shows some embodiments of the present disclosure, using a Fourier transform infrared spectrometer (FTIR) to detect the substrate to analyze whether there is an adhesive on the substrate after the alkali treatment. The upper signal in the figure is the signal of the substrate after the alkali treatment, and the lower signal is the signal of the pure substrate. Comparing the two signals, it can be confirmed that there is no adhesive on the substrate after the alkali treatment, and it is a clean substrate.
第3D圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之後基材上是否存在接著劑。圖中的上方訊號為鹼處理之後基材的訊號,下方訊號為純基材訊號,比對兩者訊號可確認在鹼處理之後基材上已無接著劑,是乾淨基材。FIG. 3D shows some embodiments of the present disclosure, using a Fourier transform infrared spectrometer (FTIR) to detect the substrate to analyze whether there is a bonding agent on the substrate after the alkali treatment. The upper signal in the figure is the signal of the substrate after the alkali treatment, and the lower signal is the pure substrate signal. Comparing the two signals, it can be confirmed that there is no bonding agent on the substrate after the alkali treatment, and it is a clean substrate.
再者,一些相關實驗亦提出在不同的溫度下進行鹼處理,以去除基材殘膠,其實驗條件與結果列於表5。此些實驗可通過傅立葉轉換紅外線光譜(FTIR)分析結果以檢測基材上的膠體是否去除乾淨。Furthermore, some related experiments also proposed to perform alkaline treatment at different temperatures to remove the residual glue on the substrate. The experimental conditions and results are listed in Table 5. These experiments can use Fourier transform infrared spectroscopy (FTIR) to analyze the results to detect whether the colloid on the substrate is completely removed.
表5
根據上述實驗,如表5所例示之結果,以不同溫度的氫氧化鉀溶液(例如第2圖中步驟23所示的第二溶液205)進行鹼處理,將混合基材浸泡於25℃~100℃的氫氧化鉀溶液,皆可去除基材殘膠。而低於室溫的鹼液,例如比較例1使用的10℃氫氧化鉀溶液或是比較例2使用的20℃氫氧化鉀溶液,則除膠效果不佳。而過高溫度的鹼液,例如比較例3使用的110℃氫氧化鉀溶液,液體有沸騰現象,除膠效果亦不佳。According to the above experiments, as shown in Table 5, the residual glue on the substrate can be removed by alkali treatment with potassium hydroxide solutions of different temperatures (e.g., the
再者,一些相關實驗亦提出使用不同種類的鹼性溶液進行鹼處理,以去除基材殘膠,其實驗條件與結果列於表6。此些實驗可通過傅立葉轉換紅外線光譜(FTIR)分析結果以檢測基材上的膠體是否去除乾淨。Furthermore, some related experiments also proposed using different types of alkaline solutions for alkaline treatment to remove the residual glue on the substrate, and the experimental conditions and results are listed in Table 6. These experiments can use Fourier transform infrared spectroscopy (FTIR) to analyze the results to detect whether the colloid on the substrate is completely removed.
表6
根據上述實驗,如表6所例示之結果,使用不同種類的鹼性溶液進行鹼處理。鹼性溶液例如是氫氧化鉀、氫氧化鈉、氫氧化鈣、氧化鈣、碳酸鉀、碳酸鈉、碳酸氫鉀和碳酸氫鈉,其pH值例如在8~14的範圍。此些鹼性溶液的種類較佳的不與基材材料產生化學反應。將混合基材浸泡於高溫(例如90℃)的此些鹼性溶液,皆可去除基材殘膠。According to the above experiments, as shown in Table 6, different types of alkaline solutions are used for alkaline treatment. Alkaline solutions are, for example, potassium hydroxide, sodium hydroxide, calcium hydroxide, calcium oxide, potassium carbonate, sodium carbonate, potassium bicarbonate and sodium bicarbonate, and their pH values are, for example, in the range of 8 to 14. These alkaline solutions preferably do not react chemically with the substrate material. The mixed substrate is immersed in these alkaline solutions at high temperature (for example, 90° C.), and the substrate glue residue can be removed.
再者,一些相關實驗亦提出使用不同種類以及不同濃度的鹼性溶液進行鹼處理,以去除基材殘膠,其實驗條件與結果列於表7。此些實驗可通過傅立葉轉換紅外線光譜(FTIR)分析結果以檢測基材上的膠體是否去除乾淨。Furthermore, some related experiments also proposed using different types and concentrations of alkaline solutions for alkaline treatment to remove the residual glue on the substrate. The experimental conditions and results are listed in Table 7. These experiments can use Fourier transform infrared spectroscopy (FTIR) to analyze the results to detect whether the colloid on the substrate is completely removed.
表7
根據上述實驗,如表7所例示之結果,使用例如氫氧化鉀和氫氧化鈉的鹼性溶液,且鹼性溶液濃度分別為1%、5%、10%、45%,以對混合基材進行鹼處理。將混合基材浸泡於高溫(例如90℃)的此些鹼性溶液,皆可去除基材殘膠。濃度越高的鹼性溶液,鹼性溶液除膠所需的時間越短。According to the above experiments, as shown in Table 7, alkaline solutions such as potassium hydroxide and sodium hydroxide are used, and the concentrations of the alkaline solutions are 1%, 5%, 10%, and 45%, respectively, to perform alkaline treatment on the mixed substrate. The mixed substrate is immersed in these alkaline solutions at high temperature (e.g., 90°C), and the residual glue on the substrate can be removed. The higher the concentration of the alkaline solution, the shorter the time required for the alkaline solution to remove the glue.
如上述所取得的乾淨的混合基材207(第2圖),其包括例如第1圖所示之第一保護層104和第二保護層106的乾淨破片,可通過如下說明的實施例之基材分選方法完成分選,以回收不同種類的基材,利於後續再製產品。The clean mixed substrate 207 (FIG. 2) obtained as described above, which includes clean fragments of the first
<基材分選><Base material sorting>
本揭露之實施例係利用濕式密度分選法,以簡單快速、安全性高、成本低、分選效率高且分選速度快的方法進行混和基材的分選。第4圖示出了根據本揭露一些實施例的基材分選方法的流程圖。第5圖示出了根據本揭露一些實施例的基材分選的示意圖。可同時參照第4圖和第5圖。The embodiments of the present disclosure utilize a wet density separation method to separate mixed substrates in a simple, fast, safe, low-cost, high separation efficiency, and fast separation speed method. FIG. 4 shows a flow chart of a substrate separation method according to some embodiments of the present disclosure. FIG. 5 shows a schematic diagram of a substrate separation according to some embodiments of the present disclosure. Reference may be made to FIG. 4 and FIG. 5 at the same time.
根據一些實施例,參照第4圖的步驟401,提供混合基材,其中包含材料不同、密度不同的多種基材。再者,在此示例中,係以兩種基材為例做說明。在一些實施例中,基材的密度例如在約0.87~約1.45的範圍,或是其他密度範圍。According to some embodiments, referring to step 401 of FIG. 4 , a mixed substrate is provided, which includes a plurality of substrates of different materials and densities. Furthermore, in this example, two substrates are used as an example for illustration. In some embodiments, the density of the substrate is, for example, in the range of about 0.87 to about 1.45, or other density ranges.
根據一些實施例,參照第4圖的步驟402和第5圖的步驟51,根據欲分選的混和基材,配製具有適當密度的一溶液501(又可稱為分選溶液)。According to some embodiments, referring to step 402 of FIG. 4 and step 51 of FIG. 5 , a solution 501 (also referred to as a separation solution) having an appropriate density is prepared according to the mixed substrate to be separated.
之後,參照第4圖的步驟403和第5圖的步驟52,取適量的混合基材510加入溶液501中,並充分攪拌,使基材均勻分散。Thereafter, referring to step 403 of FIG. 4 and step 52 of FIG. 5 , a proper amount of
在一些示例中,混合基材510可包含材料不同的第一基材511與第二基材512。第一基材511具有第一密度,第二基材512具有第二密度,第一密度不同於第二密度。而所配製的溶液501則具有第三密度。根據一些實施例,第一基材511與第二基材512至少其中一者的密度係不同於溶液501的密度。In some examples, the
之後,參照第5圖的步驟53,靜置一段時間,等待不同密度的基材在溶液501中分層。在一些實施例中,密度小於分選溶液501的基材可漂浮於溶液501的上層,密度大於分選溶液501的基材則沉降於溶液501的底層,而密度接近於分選溶液501的基材則可懸浮在溶液501的中層。靜置時間視待分選基材的尺寸以及基材與溶液501的密度差而不同,例如基材與溶液501的密度差越大,則越快在溶液中浮起或下沉。但相較於傳統的基材分選方式,本揭露的濕式密度分選方式可極快速的完成分選。根據一些實施例,靜置時間不超過3分鐘(例如20秒到120秒)即可在溶液中完成基材分層。Afterwards, referring to step 53 of FIG. 5 , the substrate is left to stand for a period of time to wait for the substrates of different densities to be layered in the
在此示例中,第一基材511的密度小於溶液501的密度,第二基材512的密度大於溶液501的密度,在混合基材510加入溶液501後,第一基材511在溶液501中浮起,第二基材512則沉入溶液501的底部,如第5圖的步驟53所示。In this example, the density of the
之後,參照第5圖的步驟54,撈取漂浮於溶液501上層的密度較小的基材。例如在此示例中,將密度較小而浮在溶液501上層的第一基材511撈取出來,而完成第一基材511的揀選回收。Afterwards, referring to step 54 of FIG. 5 , the substrate with a lower density floating on the upper layer of the
之後,參照第5圖的步驟55,撈取沉降於溶液501底層的密度較大之基材,完成分選。例如在此示例中,將密度較大而沉在溶液501底部的第二基材512撈取出來,而完成第二基材512的揀選回收。Afterwards, referring to step 55 of FIG. 5 , the substrate with a higher density that settles at the bottom of the
當然,本揭露並不以上述示例為限,在一些其他示例中,第一基材511的密度可大致等於溶液501的密度,第二基材512的密度大於溶液501的密度,在混合基材510加入溶液501後,第一基材511懸浮於溶液501的中層,第二基材512則沉入溶液501的底部,亦可達到後續的基材分選。或者,在一些其他示例中,第一基材511的密度可小於溶液501的密度,第二基材512的密度大致等於溶液501的密度,在混合基材510加入溶液501後,第一基材511可浮在溶液501的上層,第二基材512則懸浮於溶液501的中層,亦可達到後續的基材分選。Of course, the present disclosure is not limited to the above examples. In some other examples, the density of the
因此,根據上述,實施例的第一基材511的第一密度小於或等於溶液501的第三密度,第二基材512的第二密度大於或等於溶液501的第三密度,可表示為第一密度≤第三密度≤第二密度,且第一密度不同於第二密度。在混合基材510加入溶液501後,第一基材511在溶液501中的位置高於第二基材512在溶液501中的位置,而達到基材分選。Therefore, according to the above, the first density of the
再者,配置上述溶液501時,溶液501的最大密度亦即飽和溶液狀態下時的密度。在一些實施例中,當溶液501的最大密度大於第一基材511的第一密度及第二基材512的第二密度,則溶液501的第三密度為第一密度和第二密度的密度平均值。Furthermore, when the
若飽和溶液的密度剛好接近或等於欲分選基材的平均密度,則可直接以此飽和溶液作為分選溶液。若飽和溶液的密度大於欲分選基材的第一密度及第二密度,則可通過配製方式配製出等於分選基材的平均密度的分選溶液。If the density of the saturated solution is close to or equal to the average density of the substrate to be sorted, the saturated solution can be directly used as the sorting solution. If the density of the saturated solution is greater than the first density and the second density of the substrate to be sorted, a sorting solution with an average density equal to the sorting substrate can be prepared by a preparation method.
在一些實施例中,當溶液501的最大密度(亦即飽和溶液狀態下時的密度)與第一基材511的第一密度和第二基材512的第二密度的其中一者相等時,則可以此飽和溶液密度為第三密度。亦即第三密度等於與之相等的第一密度或第二密度。In some embodiments, when the maximum density of the solution 501 (i.e., the density in the saturated solution state) is equal to one of the first density of the
適用於濕式密度分選法的分選溶液501的配製方法沒有特別限制,可為任意的鹽類水溶液,僅需為目標密度環境下,為均勻無沉澱物之溶液即可。較佳的,溶液501不含有與基材(例如第一基材511和第二基材512)起化學反應的物質。在一些實施例中,溶液501例如為包括氯化鈉、氯化鈣、其類似物、或前述之組合的鹽類水溶液。There is no particular limitation on the preparation method of the
再者,上述步驟52中所使用的溶液501體積以可覆蓋被處理物即可。在一些實施例中,混合基材510的固體重量(以公斤計)相對於溶液501的體積(以公升計)的固液比例如(但不限)在1:16~1:1000的範圍之間,或是其他合適的固液比範圍。Furthermore, the volume of the
雖然上述示例是以兩種基材為例做說明,但本揭露並不以此為限。實施例的分選方法也可能應用於分選兩種以上的基材。例如用以分選三種基材時,其中一種基材的密度小於第一分選溶液的密度,可先浮在溶液上層被撈取出,沉在下層的其餘兩種基材再以第二分選溶液進行分層撈取。Although the above examples are illustrated with two substrates, the present disclosure is not limited thereto. The separation method of the embodiment may also be applied to separation of more than two substrates. For example, when three substrates are separated, one of the substrates has a density less than that of the first separation solution and can first float on the upper layer of the solution and be removed, and the remaining two substrates that sink to the lower layer are then separated by the second separation solution.
<基材分選相關實驗><Base material sorting related experiments>
在一些實施例中,係以上述回收廢棄偏光板所處理而得的混合基材207(包括如第1圖所示之第一保護層104和第二保護層106的乾淨破片)做為上述基材分選方法中的混合基材510的示例說明。以下係以四種常見的基材COP、PMMA、TAC、PET為例並提出基材分選的一些相關實驗和結果,以做實施例的說明。實驗的基材分選方法的步驟可參照上述說明。
實驗中所提到的名詞定義如下:The definitions of the terms used in the experiment are as follows:
固體單次處理量:單次進行分選的基材投入重量。Solid single processing amount: the weight of substrate input for single sorting.
分選時間:不同密度的基材於分選溶液501中上下分層所需時間。Sorting time: the time required for substrates of different densities to separate into upper and lower layers in the
分選率:分選完成的基材中,經傅立葉轉換紅外線光譜(FTIR)確認後實際為該基材的比例。分選率達>90%,則判定分選可行性OK,否則判定NG。Sorting rate: The proportion of the sorted substrate that is actually the substrate after Fourier transform infrared spectroscopy (FTIR) confirmation. If the sorting rate is > 90%, the sorting feasibility is judged to be OK, otherwise it is judged to be NG.
在一些實驗中,係進行不同種類混和基材的分選與不同分選方法,其結果列於表8。In some experiments, sorting of different types of mixed substrates and different sorting methods were performed, and the results are listed in Table 8.
實施例的濕式密度分選法可參照上述說明。再者,實驗中比較例的其他分選方式及缺點簡述如下:The wet density separation method of the embodiment can refer to the above description. In addition, other separation methods and their disadvantages in the comparative example in the experiment are briefly described as follows:
乾式比重法是依基材部密度進行分選,基材須先經過乾燥。乾式比重法的分離效率較差、處理量較少。The dry specific gravity method is to sort according to the density of the substrate, and the substrate must be dried first. The separation efficiency of the dry specific gravity method is poor and the processing volume is small.
靜電分離法是利用各種塑膠導電率不同以及電場作用於塑膠上的靜電性能來進行分選。但須先將基材乾燥處理,且設備成本較高。Electrostatic separation uses the different conductivity of various plastics and the electrostatic properties of the electric field acting on the plastics to separate them. However, the substrate must be dried first, and the equipment cost is relatively high.
光學分離法是利用光學性質檢測物料識別出不同材質,顏色或者密度,並通過壓縮空氣將選定物料分選。缺點為基材本身須有顏色上的差異,且設備成本較高、分選率較低。Optical separation uses optical properties to detect materials to identify different materials, colors or densities, and then sorts the selected materials by compressed air. The disadvantage is that the substrate itself must have color differences, and the equipment cost is high and the sorting rate is low.
溶解法是利用不同溶劑將不同種類的基材進行溶解並加以分離。缺點為需要額外使用溶劑,除了會增加廢液回收處理上的困難以外,溶劑成本也會增加。The dissolution method uses different solvents to dissolve and separate different types of substrates. The disadvantage is that additional solvents are required, which not only increases the difficulty of waste liquid recycling, but also increases the cost of solvents.
表8
根據上述實驗,如表8所例示之結果,使用實施例的基材分選方法分選速度快,在少於1分鐘的時間即完成基材分層,並且固體單次處理量(100g)相較於其他分選方式的單次處理量(10g)更大。且使用實施例的基材分選方法可以得到超過95%以上的分選率。According to the above experiments, as shown in Table 8, the substrate separation method of the embodiment has a fast separation speed, and the substrate separation is completed in less than 1 minute, and the single solid processing amount (100g) is larger than the single solid processing amount (10g) of other separation methods. And the substrate separation method of the embodiment can obtain a separation rate of more than 95%.
再者,係對基材的不同尺寸、形狀進行實驗,其結果列於表9。Furthermore, experiments were conducted on substrates of different sizes and shapes, and the results are listed in Table 9.
表9
根據上述實驗,如表9所例示之結果,使用實施例的基材分選方法可以處理許多不同尺寸的基材,基材面積自小於邊長1公分至邊長高達100公分,都可以完成基材分層,並且分選率超過95%以上。再者,根據實驗,越小片的基材尺寸,完成基材分選的時間越短。According to the above experiments, as shown in Table 9, the substrate separation method of the embodiment can process substrates of many different sizes, ranging from substrates with a side length of less than 1 cm to substrates with a side length of up to 100 cm, and can complete substrate separation, and the separation rate exceeds 95%. Furthermore, according to the experiment, the smaller the substrate size, the shorter the time to complete the substrate separation.
再者,實施例亦根據實驗數據推得出混合基材的理論分選率,其公式如下式(1): ....式(1) Furthermore, the embodiment also deduces the theoretical separation rate of the mixed substrate based on experimental data, and its formula is as follows (1): ....Formula (1)
其中X為容器的底面積,單位cm 2; Where X is the bottom area of the container, in cm 2 ;
Y為容器的高度,單位cm;Y is the height of the container, in cm;
Z為混合基材的固體重量,單位kg;Z is the solid weight of the mixed matrix, in kg;
V為溶液的體積,單位L。V is the volume of the solution, in L.
適用於實施例的基材分選法的固液比以可覆蓋被處理物即可,例如(但不限於)1:16~1:1000。The solid-liquid ratio applicable to the substrate separation method of the embodiment can be any ratio that can cover the processed object, for example (but not limited to) 1:16-1:1000.
適用於實施例的基材分選法的容器,其底面積/高度比以可覆蓋被處理物即可。在一些實施例中,容器的底面積/高度例如(但不限於)23~37的範圍。The container applicable to the substrate separation method of the embodiment has a bottom area/height ratio that can cover the processed object. In some embodiments, the bottom area/height ratio of the container is, for example (but not limited to), in the range of 23-37.
適用於實施例的基材分選法的容器,其形狀並不特別限制,可以是任意形狀。The shape of the container used in the substrate separation method of the embodiment is not particularly limited and may be any shape.
上述式(1)的理論分選率的公式說明如下。The theoretical sorting rate formula of the above formula (1) is explained as follows.
關於Y/(Y+X/100)的部分About Y/(Y+X/100)
根據以容器底面積(X)和容器高度(Y)為操縱變因的實驗內容及結果,其中混合基材的固體重量(Z)、分選溶液體積(V)等因素均保持不變而為控制變因,發現分選率(應變變因)會受到容器底面積(X)和容器高度(Y)的影響,其中又以容器高度(Y)的影響最大。公式中X/100的項目,主要是因為X與Y單位上的不同。再者,由於容器底面積(X)的數值一定會比容器高度(Y)的數值還大,因此讓容器底面積(X)的數值變小,以體現容器高度(Y)對分選率的影響大。根據以容器底面積(X)和容器高度(Y)為操縱變因的實驗結果,可得出分選率與Y/(Y+X/100)成比例。According to the experimental content and results with the container bottom area (X) and container height (Y) as the manipulated variables, the solid weight of the mixed matrix (Z), the volume of the separation solution (V) and other factors remain unchanged as the controlled variables. It is found that the separation rate (strain variable) will be affected by the container bottom area (X) and the container height (Y), among which the container height (Y) has the greatest impact. The item X/100 in the formula is mainly due to the difference in the units of X and Y. In addition, since the value of the container bottom area (X) must be larger than the value of the container height (Y), the value of the container bottom area (X) is reduced to reflect the greater impact of the container height (Y) on the separation rate. Based on the experimental results with the container bottom area (X) and container height (Y) as the manipulated variables, it can be concluded that the sorting rate is proportional to Y/(Y+X/100).
根據實驗,在容器底面積(X)例如為100 cm 2~1000000cm 2,容器高度(Y)例如為1cm~10000cm的範圍中,容器底面積(X)/容器高度(Y)例如為23~37的範圍中,分選率與Y/(Y+X/100)成比例的關係皆可成立。 According to experiments, the relationship that the sorting rate is proportional to Y/(Y+X/100) holds true when the container bottom area (X) is, for example, 100 cm 2 ~1000000 cm 2 , the container height (Y) is, for example, 1 cm ~ 10000 cm, and the container bottom area (X) / container height (Y) is, for example, 23 ~ 37.
關於(V-Z)/V的部分About (V-Z)/V
根據以混合基材固體重量(Z)或分選溶液體積(V)為操縱變因的實驗內容及結果,其中容器底面積(X)、容器高度(Y)等因素均保持不變而為控制變因,發現分選率(應變變因)也會受到固體重量(Z)和分選溶液體積(V)的影響。根據實驗結果,在相同分選溶液體積(V)的前提下,若固體重量(Z)增加,則分選率會下降。相反的,在相同分選溶液體積(V)的前提下,若固體重量(Z)下降,則分選率會提高。根據實驗結果,可得出分選率與(V-Z)/V成比例。According to the experimental content and results with the mixed matrix solid weight (Z) or the sorting solution volume (V) as the manipulated variables, the factors such as the container bottom area (X) and the container height (Y) are kept constant as the controlled variables, and it is found that the sorting rate (strain variable) is also affected by the solid weight (Z) and the sorting solution volume (V). According to the experimental results, under the premise of the same sorting solution volume (V), if the solid weight (Z) increases, the sorting rate will decrease. On the contrary, under the premise of the same sorting solution volume (V), if the solid weight (Z) decreases, the sorting rate will increase. According to the experimental results, it can be concluded that the sorting rate is proportional to (V-Z)/V.
根據實驗,在分選溶液體積(V)例如為0.1L~10000 L,混合基材固體重量(Z)例如為0.1kg~10000kg的範圍中,固液比例如為1:16~1:1000的範圍中,分選率與(V-Z)/V成比例的關係皆可成立。According to experiments, when the volume of the sorting solution (V) is, for example, 0.1L~10000L, the weight of the mixed substrate solid (Z) is, for example, 0.1kg~10000kg, and the solid-liquid ratio is, for example, 1:16~1:1000, the relationship that the sorting rate is proportional to (V-Z)/V is established.
再者,根據實驗結果,Y/(Y+X/100)和(V-Z)/V的乘積,是與分選率成一線性關係,據此得出係數1.26,以與實際實驗結果相吻合。亦即,係數1.26與Y/(Y+X/100)和(V-Z)/V的乘積結果(如式(1)),可以使公式計算出的分選率與實驗中的實際分選率結果相吻合。Furthermore, according to the experimental results, the product of Y/(Y+X/100) and (V-Z)/V is linearly related to the sorting rate, and the coefficient 1.26 is obtained based on this, which is consistent with the actual experimental results. In other words, the coefficient 1.26 and the product of Y/(Y+X/100) and (V-Z)/V (such as formula (1)) can make the sorting rate calculated by the formula consistent with the actual sorting rate results in the experiment.
再者,在實施例中,係對不同固液比與容器底面積高度比進行多組實驗,並將部分實驗的實際分選率和理論分選率(如式(1))的結果列於表10。Furthermore, in the embodiment, multiple sets of experiments were conducted for different solid-liquid ratios and container bottom area height ratios, and the actual sorting rates and theoretical sorting rates (such as formula (1)) of some experiments were listed in Table 10.
表10
根據上述實驗,如表10所例示之結果,可以處理範圍甚廣的固液比,例如自1:16至1:1000。並且使用實施例的基材分選方法的分選速度快,即使是高固體含量,例如固液比1:16,也在大約2分鐘完成基材分層。但若如比較例一容器高度過低或是如比較例二處理的固體量過多(或體積過少),則不利於基材分層。再者,根據實驗結果顯示,使用實施例的基材分選方法的實際分選率確實接近上述式(1)之理論分選率。因此,在應用實施例之方法對欲分類的基材進行分選時,當分選率欲達到特定百分比(例如大於90%)時,也可以通過上式(1)得到需要用來完成基材分選的溶液體積。According to the above experiments, as shown in the results of Table 10, a wide range of solid-liquid ratios can be processed, for example, from 1:16 to 1:1000. In addition, the sorting speed of the substrate sorting method using the embodiment is fast. Even with a high solid content, such as a solid-liquid ratio of 1:16, the substrate stratification is completed in about 2 minutes. However, if the height of the container is too low as in Comparative Example 1 or the amount of solid processed is too much (or the volume is too small) as in Comparative Example 2, it is not conducive to substrate stratification. Furthermore, according to the experimental results, the actual sorting rate of the substrate sorting method using the embodiment is indeed close to the theoretical sorting rate of the above formula (1). Therefore, when the method of the embodiment is used to sort the substrates to be classified, when the sorting rate is to reach a certain percentage (for example, greater than 90%), the volume of solution required to complete the substrate sorting can also be obtained by the above formula (1).
再者,係以不同鹽類溶液對基材進行分選。其中分選溶液密度的設定例如:Furthermore, the substrate is sorted using different salt solutions. The density of the sorting solution is set as follows:
假設混和基材A密度=a,混和基材B密度=b,若a和b其中一者大於分選溶液最大密度(即飽和密度)(g/cm 3),另一者小於分選溶液最大密度,則溶液的分選密度為混和基材密度(a+b)/2。若a和b其中一者等於分選溶液最大密度,則分選密度為分選溶液最大密度。一些實驗結果列於表11。 Assuming that the density of mixed substrate A = a, the density of mixed substrate B = b, if one of a and b is greater than the maximum density of the sorting solution (i.e. saturated density) (g/cm 3 ), and the other is less than the maximum density of the sorting solution, then the sorting density of the solution is the density of the mixed substrate (a+b)/2. If one of a and b is equal to the maximum density of the sorting solution, then the sorting density is the maximum density of the sorting solution. Some experimental results are listed in Table 11.
表11
根據上述實驗,如表11所例示之結果,可配置密度在欲分選基板的密度之間的溶液和通過實施例的基材分選方式(如第4、5圖之步驟所示),可快速完成基材分選。According to the above experiments, as shown in the results of Table 11, a solution with a density between the density of the substrate to be sorted can be configured and the substrate sorting method of the embodiment (as shown in the steps of Figures 4 and 5) can be used to quickly complete the substrate sorting.
綜合上述,實施例提出的基材分選方法,係通過濕式密度分選法,以簡單快速、安全性高、成本低、分選效率高且分選速度快的方法進行混合基材的分選。實施例的基材分選方法中,通過將混合基材置入具有適當密度的分選溶液,且利用密度較小的基材可浮在分選溶液的上層,密度較大的基材則沉降在分選溶液的下層,進而達到基材分選的目的。混合基材可以是任何不同種類的基材,例如可以是廢棄偏光板回收處理(例如去除碘、偏光子和殘膠)後的不同保護層。應用實施例的基材分選方法可進行此些保護層的分選和回收,以減少對環境的汙染,回收後的基材亦可以重新製造成其他再生製品,達到環保減碳,增加經濟效益。In summary, the substrate sorting method proposed in the embodiment is to sort the mixed substrate by a wet density sorting method in a simple, fast, safe, low-cost, high-sorting efficiency and fast sorting speed. In the substrate sorting method of the embodiment, the mixed substrate is placed in a sorting solution with an appropriate density, and the substrate with a smaller density can float on the upper layer of the sorting solution, while the substrate with a larger density settles in the lower layer of the sorting solution, thereby achieving the purpose of substrate sorting. The mixed substrate can be any different types of substrates, for example, different protective layers after the recycling of discarded polarizing plates (for example, removing iodine, polarizers and residual glue). The substrate sorting method of the embodiment can be used to sort and recycle these protective layers to reduce environmental pollution. The recycled substrate can also be re-manufactured into other recycled products to achieve environmental protection, carbon reduction, and increase economic benefits.
1:偏光板
102:偏光子
104:第一保護層
106:第二保護層
201:破碎偏光板
202:第一溶液
203,204,206,207,510:混合基材
205:第二溶液
501:溶液(分選溶液)
511:第一基材
512:第二基材
21,22,23,24, 401,402,403,51,52,53,54,55:步驟
1: Polarizing plate
102: Polarizer
104: First protective layer
106: Second protective layer
201: Broken polarizing plate
202: First solution
203,204,206,207,510: Mixed substrate
205: Second solution
501: Solution (sorting solution)
511: First substrate
512:
第1圖係為一偏光板的剖面簡示圖。 第2圖為根據本揭露一些實施例的廢棄偏光板回收後的處理製程示意圖。 第3A圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之前基材上是否存在黏著劑。 第3B圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之前基材上是否存在接著劑。 第3C圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之後基材上是否存在黏著劑。 第3D圖為本揭露一些實施例,以傅立葉轉換紅外線光譜儀(FTIR)檢測基材,以分析在鹼處理之後基材上是否存在接著劑。 第4圖示出了根據本揭露一些實施例的基材分選方法的流程圖。 第5圖示出了根據本揭露一些實施例的基材分選的示意圖。 FIG. 1 is a schematic cross-sectional view of a polarizing plate. FIG. 2 is a schematic diagram of a treatment process of a waste polarizing plate after recycling according to some embodiments of the present disclosure. FIG. 3A is a diagram of some embodiments of the present disclosure, in which a Fourier transform infrared spectrometer (FTIR) is used to detect a substrate to analyze whether an adhesive exists on the substrate before alkaline treatment. FIG. 3B is a diagram of some embodiments of the present disclosure, in which a Fourier transform infrared spectrometer (FTIR) is used to detect a substrate to analyze whether an adhesive exists on the substrate before alkaline treatment. FIG. 3C is a diagram of some embodiments of the present disclosure, in which a Fourier transform infrared spectrometer (FTIR) is used to detect a substrate to analyze whether an adhesive exists on the substrate after alkaline treatment. FIG. 3D shows some embodiments of the present disclosure, where a Fourier transform infrared spectrometer (FTIR) is used to detect the substrate to analyze whether a bonding agent is present on the substrate after the alkali treatment. FIG. 4 shows a flow chart of a substrate sorting method according to some embodiments of the present disclosure. FIG. 5 shows a schematic diagram of substrate sorting according to some embodiments of the present disclosure.
401,402,403:步驟 401,402,403: Steps
Claims (19)
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| CN116037615A (en) * | 2022-12-27 | 2023-05-02 | 江苏融道复合材料产业技术研究院有限公司 | Crushing and recycling device for bio-based materials and working method thereof |
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