[go: up one dir, main page]

TWI874296B - Adhesive composition and structure for circuit connection - Google Patents

Adhesive composition and structure for circuit connection Download PDF

Info

Publication number
TWI874296B
TWI874296B TW107110867A TW107110867A TWI874296B TW I874296 B TWI874296 B TW I874296B TW 107110867 A TW107110867 A TW 107110867A TW 107110867 A TW107110867 A TW 107110867A TW I874296 B TWI874296 B TW I874296B
Authority
TW
Taiwan
Prior art keywords
group
silane compound
adhesive composition
circuit
mass
Prior art date
Application number
TW107110867A
Other languages
Chinese (zh)
Other versions
TW201840792A (en
Inventor
森尻智樹
杜暁黎
Sunao Kudou
伊澤弘行
田中勝
松田和也
Original Assignee
日商力森諾科股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商力森諾科股份有限公司 filed Critical 日商力森諾科股份有限公司
Publication of TW201840792A publication Critical patent/TW201840792A/en
Application granted granted Critical
Publication of TWI874296B publication Critical patent/TWI874296B/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/54Silicon-containing compounds
    • C08K5/541Silicon-containing compounds containing oxygen
    • C08K5/5415Silicon-containing compounds containing oxygen containing at least one Si—O bond
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J11/00Features of adhesives not provided for in group C09J9/00, e.g. additives
    • C09J11/02Non-macromolecular additives
    • C09J11/06Non-macromolecular additives organic
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J163/00Adhesives based on epoxy resins; Adhesives based on derivatives of epoxy resins
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J171/00Adhesives based on polyethers obtained by reactions forming an ether link in the main chain; Adhesives based on derivatives of such polymers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J9/00Adhesives characterised by their physical nature or the effects produced, e.g. glue sticks
    • C09J9/02Electrically-conducting adhesives
    • H10P10/12
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/312Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Health & Medical Sciences (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)

Abstract

一種接著劑組成物,其含有可陰離子聚合或陽離子聚合的環氧樹脂或氧雜環丁烷樹脂、具有與所述環氧樹脂或氧雜環丁烷樹脂反應的官能基的第1矽烷化合物、以及與所述第1矽烷化合物反應的第2矽烷化合物。 A bonding agent composition, which contains an anionically polymerizable or cationically polymerizable epoxy resin or cyclohexane resin, a first silane compound having a functional group reactive with the epoxy resin or cyclohexane resin, and a second silane compound reactive with the first silane compound.

Description

電路連接用接著劑組成物及結構體 Adhesive compositions and structures for circuit connection

本揭示是有關於一種接著劑組成物及構造體。 This disclosure relates to a bonding agent composition and structure.

在半導體元件及液晶顯示元件(顯示器顯示元件)中,自先前便以使元件中的各種構件結合為目的而使用各種接著劑。接著劑所要求的特性以接著性為首,覆蓋耐熱性、高溫高濕狀態下的可靠性等多個方面。而且,作為接著中所使用的被黏著體,使用印刷配線板、有機基材(聚醯亞胺基材等)、金屬(鈦、銅、鋁等)、具有氧化銦錫(Indium Tin Oxide,ITO)、氧化銦鋅(Indium Zinc Oxide,IZO)、氧化銦鎵鋅(Indium Gallium Zinc Oxide,IGZO)、SiNx、SiO2等表面狀態的基材等,需要根據各被黏著體而進行接著劑的分子設計。 In semiconductor devices and liquid crystal display devices (display devices), various adhesives have been used for the purpose of bonding various components in the device. The properties required of adhesives include adhesiveness, heat resistance, reliability under high temperature and high humidity conditions, and many other aspects. In addition, as the adherends used in the bonding, printed wiring boards, organic substrates (polyimide substrates, etc.), metals (titanium, copper, aluminum, etc.), substrates with surface conditions such as indium tin oxide (ITO), indium zinc oxide (IZO), indium gallium zinc oxide (IGZO), SiNx , SiO2, etc. are used, and it is necessary to design the molecules of the adhesive according to each adherend.

在先前,在半導體元件用接著劑或液晶顯示元件用接著劑中使用顯示出高接著性及高可靠性的熱硬化性樹脂(環氧樹脂、丙烯酸樹脂等)。作為使用環氧樹脂的接著劑的構成成分,一般使用環氧樹脂及潛伏性硬化劑,所述潛伏性硬化劑藉由熱或光而產生對於環氧樹脂具有反應性的陽離子種或陰離子種。潛伏性硬化劑是決定硬化溫度及硬化速度的重要因素,自常溫下的儲存穩定性及加熱時的硬化速度的觀點考慮,可使用各種化合物。在實際的步驟中,例如藉由在溫度為170℃~250℃、10秒~3小時的硬化條件下進行硬化而獲得所期望的接著性。In the past, thermosetting resins (epoxy resins, acrylic resins, etc.) showing high adhesion and high reliability were used in adhesives for semiconductor elements or adhesives for liquid crystal display elements. As the components of adhesives using epoxy resins, epoxy resins and latent curing agents are generally used. The latent curing agent generates cationic species or anionic species reactive to the epoxy resin by heat or light. The latent curing agent is an important factor that determines the curing temperature and curing speed. From the perspective of storage stability at room temperature and curing speed when heated, various compounds can be used. In the actual step, the desired adhesion is obtained by curing at a temperature of 170°C to 250°C for 10 seconds to 3 hours.

而且,近年來存在如下的擔憂:隨著半導體元件的高積體化及液晶顯示元件的高精細化,元件間及配線間的間距狹小化,由於硬化時的熱而對周邊構件造成不良影響。進而,為了低成本化,需要使產量(throughput)提高,要求低溫(90℃~170℃)且短時間(1小時以內、較佳為10秒以內、更佳為5秒以內)的接著,換而言之需要低溫短時間硬化(低溫快速硬化)的接著。已知為了達成該低溫短時間硬化,需要使用活性更高的熱潛伏性觸媒,但非常難以兼具常溫附近的儲存穩定性。In addition, there have been concerns in recent years that as semiconductor components become more integrated and liquid crystal display components become more precise, the spacing between components and wiring becomes smaller, and the heat during curing may have an adverse effect on peripheral components. Furthermore, in order to reduce costs, it is necessary to increase throughput, requiring low-temperature (90°C to 170°C) and short-time (within 1 hour, preferably within 10 seconds, and more preferably within 5 seconds) bonding, in other words, low-temperature and short-time curing (low-temperature rapid curing) bonding. It is known that in order to achieve this low-temperature and short-time curing, it is necessary to use a more active thermal latent catalyst, but it is very difficult to have storage stability near room temperature.

因此,近年來,使用鎓鹽作為熱潛伏性觸媒的環氧樹脂的陽離子硬化系受到關注。陽離子硬化系由於作為反應活性種的陽離子非常富有反應性,因此可短時間硬化,且若為鎓鹽的分解溫度以下,則觸媒穩定地存在,因此是兼顧低溫短時間硬化與儲存穩定性(例如常溫附近的儲存穩定性)的硬化系。作為所述陽離子硬化系的接著劑,例如已知有含有具有可陽離子聚合的官能基(環氧基等)的矽烷化合物(矽烷偶合劑等)的陽離子硬化系接著劑組成物(例如參照下述專利文獻1)。Therefore, in recent years, cationic curing systems of epoxy resins using onium salts as thermal latent catalysts have attracted attention. Cationic curing systems can cure in a short time because cations, which are reactive species, are very reactive, and the catalyst exists stably below the decomposition temperature of the onium salt. Therefore, it is a curing system that takes into account both low-temperature short-time curing and storage stability (for example, storage stability near room temperature). As the cationic curing adhesive, for example, a cationic curing adhesive composition containing a silane compound (silane coupling agent, etc.) having a cationically polymerizable functional group (epoxy group, etc.) is known (for example, refer to the following Patent Document 1).

另一方面,關於先前的例如於溫度170℃~250℃、10秒~3小時的硬化條件下使用的接著劑,為了生產性提高及在庫管理的簡易化,亦開始要求更長期間的儲存穩定性。所述接著劑中,例如已知有含有具有可陰離子聚合的官能基(環氧基等)的矽烷化合物(矽烷偶合劑等)的陰離子硬化系接著劑組成物(例如參照下述專利文獻1)。 [現有技術文獻] [專利文獻]On the other hand, adhesives that were previously used under curing conditions such as a temperature of 170°C to 250°C and a curing time of 10 seconds to 3 hours are also being required to have longer storage stability in order to improve productivity and simplify inventory management. Among the adhesives, for example, anion-curing adhesive compositions containing silane compounds (silane coupling agents, etc.) having anionically polymerizable functional groups (epoxy groups, etc.) are known (for example, refer to the following patent document 1). [Prior Art Document] [Patent Document]

專利文獻1:日本專利第5768676號公報Patent document 1: Japanese Patent No. 5768676

[發明所欲解決之課題] 所述矽烷化合物用於提高接著劑組成物的接著性。然而,在保存僅含有具有利用陽離子或陰離子硬化系反應的官能基的矽烷化合物作為矽烷化合物的先前的接著劑組成物(混合物)的情況下,存在矽烷化合物的特性劣化顯著,接著劑組成物的接著性降低的問題。因此,對於先前的接著劑組成物,要求保存穩定性提高。[Problem to be Solved by the Invention] The silane compound is used to improve the adhesiveness of an adhesive composition. However, when a conventional adhesive composition (mixture) containing only a silane compound having a functional group that utilizes a cation- or anion-curing reaction as a silane compound is stored, there is a problem that the properties of the silane compound are significantly deteriorated, and the adhesiveness of the adhesive composition is reduced. Therefore, it is required that the storage stability of the conventional adhesive composition be improved.

因此,本揭示的目的在於提供具有優異的保存穩定性的接著劑組成物及使用其的結構體。 [解決課題之手段]Therefore, the object of the present disclosure is to provide an adhesive composition having excellent storage stability and a structure using the same. [Means for Solving the Problem]

本發明者等人如下所述地推測關於在先前的接著劑組成物中,矽烷化合物的特性劣化的主要原因。亦即,在接著劑組成物的保存過程中,與矽烷化合物不同的其他起始劑開始聚合反應時,矽烷化合物摻入至該聚合反應中,因此摻入至接著劑組成物的構成材料(樹脂等)的內部。由此而推測可對接著劑組成物與被黏著體的界面起作用的矽烷化合物的分子數減少,因此特性劣化。The inventors of the present invention have speculated as follows about the main reason for the degradation of the properties of the silane compound in the previous adhesive composition. That is, during the storage of the adhesive composition, when other initiators different from the silane compound start the polymerization reaction, the silane compound is mixed into the polymerization reaction, and thus mixed into the inside of the constituent materials (resin, etc.) of the adhesive composition. It is speculated that the number of molecules of the silane compound that can act on the interface between the adhesive composition and the adherend is reduced, so the properties are degraded.

本發明者等人為了於包含矽烷化合物的陰離子或陽離子聚合系(例如,環氧樹脂的陰離子硬化系或環氧樹脂的陽離子硬化系)的接著劑組成物中改善保存穩定性(適用期特性)而重覆進行了努力研究,結果發現於在含有作為環氧基含有化合物的環氧樹脂、或作為氧雜環丁烷基含有化合物的氧雜環丁烷樹脂的接著劑組成物中,併用具有與環氧樹脂或氧雜環丁烷樹脂反應的官能基的第1矽烷化合物、以及與所述第1矽烷化合物反應的第2矽烷化合物的情況下,接著劑組成物的保存穩定性顯著提高。The inventors of the present invention have repeatedly conducted research to improve the storage stability (pot life characteristics) of anionic or cationic polymerization systems containing silane compounds (e.g., anionic curing systems of epoxy resins or cationic curing systems of epoxy resins). As a result, they have found that in epoxy resins containing epoxy groups as epoxy group-containing compounds, In a binder composition of an epoxy resin or an oxycyclobutane resin as an oxycyclobutane resin containing a compound having an oxycyclobutane group, when a first silane compound having a functional group reactive with an epoxy resin or an oxycyclobutane resin and a second silane compound reactive with the first silane compound are used in combination, the storage stability of the binder composition is significantly improved.

亦即,本揭示的一側面提供一種接著劑組成物,其含有可陰離子聚合或陽離子聚合的環氧樹脂或氧雜環丁烷樹脂、具有與所述環氧樹脂或氧雜環丁烷樹脂反應的官能基的第1矽烷化合物、以及與所述第1矽烷化合物反應的第2矽烷化合物。That is, one aspect of the present disclosure provides a bonding agent composition, which contains an anionically polymerizable or cationically polymerizable epoxy resin or cyclohexane resin, a first silane compound having a functional group reactive with the epoxy resin or cyclohexane resin, and a second silane compound reactive with the first silane compound.

本揭示的一側面的接著劑組成物具有比先前更優異的保存穩定性。此種接著劑組成物可抑制接著劑組成物的接著性在保存過程中經時性降低的現象。關於獲得此種效果的主要原因,本發明者等人如下所述地推測。亦即,藉由使具有與環氧樹脂或氧雜環丁烷樹脂反應的官能基的第1矽烷化合物以及與所述第1矽烷化合物反應的第2矽烷化合物存在於接著劑組成物中,即使在保存過程中,第1矽烷化合物藉由陰離子或陽離子硬化系的聚合反應而進行聚合而摻入至聚合物中的情況下,亦可藉由第2矽烷化合物與聚合物中的第1矽烷化合物及被黏著體交聯,從而維持接著劑組成物或其硬化物與被黏著體的接著性。The adhesive composition disclosed in the present invention has better storage stability than before. This adhesive composition can suppress the phenomenon that the adhesiveness of the adhesive composition decreases over time during storage. The inventors of the present invention speculate the main reason for this effect as follows. That is, by allowing the first silane compound having a functional group reactive with an epoxy resin or an oxycyclobutane resin and the second silane compound reactive with the first silane compound to be present in the adhesive composition, even if the first silane compound is polymerized and incorporated into the polymer by a polymerization reaction of an anion or cation curing system during storage, the second silane compound can cross-link with the first silane compound in the polymer and the adherend, thereby maintaining the adhesion between the adhesive composition or its cured product and the adherend.

所述第1矽烷化合物的所述官能基較佳為包含選自由環氧基、氧雜環丁烷基、胺基、酸酐基、異氰酸酯基及巰基所組成的群組中的至少一種。所述第2矽烷化合物較佳為包含選自由烷基、苯基、烷氧基矽烷基、羥基、含氟基、(甲基)丙烯醯基及乙烯基所組成的群組中的至少一種。The functional group of the first silane compound preferably includes at least one selected from the group consisting of an epoxy group, an oxacyclobutane group, an amine group, an acid anhydride group, an isocyanate group, and an alkyl group. The second silane compound preferably includes at least one selected from the group consisting of an alkyl group, a phenyl group, an alkoxysilane group, a hydroxyl group, a fluorine-containing group, a (meth)acryl group, and a vinyl group.

本揭示的接著劑組成物亦可進而含有導電粒子。The adhesive composition disclosed herein may further contain conductive particles.

本揭示的接著劑組成物亦可用於電路連接(電路連接用接著劑組成物)。The adhesive composition disclosed herein can also be used for circuit connection (adhesive composition for circuit connection).

本揭示的另一側面提供一種結構體,其包含所述本揭示的一側面的接著劑組成物或其硬化物。Another aspect of the present disclosure provides a structure comprising the adhesive composition or a cured product thereof according to one aspect of the present disclosure.

本揭示的另一側面提供一種結構體,其包括:具有第一電路電極的第一電路構件、具有第二電路電極的第二電路構件、及配置於所述第一電路構件及所述第二電路構件之間的電路連接構件,所述第一電路電極及所述第二電路電極電性連接,所述電路連接構件包含所述本揭示的一側面的接著劑組成物或其硬化物。 [發明的效果]Another aspect of the present disclosure provides a structure, which includes: a first circuit component having a first circuit electrode, a second circuit component having a second circuit electrode, and a circuit connection component disposed between the first circuit component and the second circuit component, wherein the first circuit electrode and the second circuit electrode are electrically connected, and the circuit connection component includes the adhesive composition or a cured product thereof of one aspect of the present disclosure. [Effect of the Invention]

藉由本揭示可提供具有比先前更優異的保存穩定性的接著劑組成物及使用其的結構體。The present disclosure can provide an adhesive composition having better storage stability than before and a structure using the same.

藉由本揭示可提供接著劑組成物或其硬化物於結構體或其製造中的應用。藉由本揭示可提供接著劑組成物或其硬化物於電路連接中的應用。藉由本揭示可提供接著劑組成物或其硬化物於電路連接結構體或其製造中的應用。The present disclosure may provide an adhesive composition or a cured product thereof for use in a structure or its manufacture. The present disclosure may provide an adhesive composition or a cured product thereof for use in circuit connection. The present disclosure may provide an adhesive composition or a cured product thereof for use in a circuit connection structure or its manufacture.

以下,對本揭示的實施方式加以說明,但本揭示並不受該些實施方式的任何限定。The following describes the implementation methods of the present disclosure, but the present disclosure is not limited to these implementation methods.

在本說明書中,所謂「(甲基)丙烯酸酯」是表示丙烯酸酯及與其對應的甲基丙烯酸酯的至少一者。在「(甲基)丙烯醯基」、「(甲基)丙烯酸」等其他類似的表現中亦同樣。以下所例示的材料若無特別限制,則可單獨使用一種,亦可組合使用兩種以上。至於組成物中的各成分的含量,在組成物中存在多種相當於各成分的物質的情況下,若無特別說明,則表示組成物中所存在的該多種物質的合計量。使用「~」而表示的數值範圍表示包含「~」的前後所記載的數值而分別作為最小值及最大值的範圍。所謂「A或B」,若包含A及B的任一者即可,亦可包含兩者。所謂「常溫」是表示25℃。In this specification, "(meth)acrylate" means at least one of acrylate and its corresponding methacrylate. The same applies to other similar expressions such as "(meth)acryl", "(meth)acrylic acid", etc. Unless otherwise specified, the materials exemplified below may be used alone or in combination of two or more. As for the content of each component in the composition, when there are multiple substances equivalent to each component in the composition, unless otherwise specified, the total amount of the multiple substances present in the composition is indicated. The numerical range expressed using "~" indicates a range that includes the numerical values recorded before and after "~" as the minimum and maximum values, respectively. The so-called "A or B" may include either A and B, or both. The so-called "normal temperature" means 25°C.

本說明書中階段性地記載的數值範圍中,某階段的數值範圍的上限值或下限值亦可置換為另一階段的數值範圍的上限值或下限值。而且,本說明書中記載的數值範圍中,該數值範圍的上限值或下限值亦可替換為實施例中所示的值。In the numerical ranges recorded in stages in this specification, the upper limit or lower limit of a numerical range in a certain stage may also be replaced by the upper limit or lower limit of a numerical range in another stage. Moreover, in the numerical ranges recorded in this specification, the upper limit or lower limit of the numerical range may also be replaced by the values shown in the embodiments.

<接著劑組成物> 本實施方式的接著劑組成物含有可陰離子聚合或陽離子聚合的環氧樹脂或氧雜環丁烷樹脂(陰離子或陽離子聚合性物質)、具有與所述環氧樹脂或氧雜環丁烷樹脂反應的官能基的第1矽烷化合物、以及與所述第1矽烷化合物反應的第2矽烷化合物。本實施方式的接著劑組成物含有第1矽烷化合物及與所述第1矽烷化合物反應的第2矽烷化合物(相當於所述第1矽烷化合物的化合物除外)作為矽烷化合物,所述第1矽烷化合物具有與環氧樹脂或氧雜環丁烷樹脂反應的官能基(參與陰離子或陽離子硬化系的聚合反應的官能基。在陰離子或陽離子聚合系中可與環氧樹脂或氧雜環丁烷樹脂反應的官能基)。本實施方式的接著劑組成物是陰離子或陽離子硬化系(陰離子聚合系或陽離子聚合系)接著劑組成物。本實施方式的接著劑組成物可作為電路連接用接著劑組成物而適宜使用。以下,關於各成分而加以說明。<Adhesive Composition> The adhesive composition of the present embodiment contains an anionically or cationically polymerizable epoxy resin or cyclohexane resin (anionically or cationically polymerizable substance), a first silane compound having a functional group reactive with the epoxy resin or cyclohexane resin, and a second silane compound reactive with the first silane compound. The adhesive composition of the present embodiment contains a first silane compound and a second silane compound (excluding compounds equivalent to the first silane compound) that reacts with the first silane compound as silane compounds, and the first silane compound has a functional group that reacts with an epoxy resin or an oxycyclobutane resin (a functional group that participates in a polymerization reaction of an anionic or cationic curing system. A functional group that can react with an epoxy resin or an oxycyclobutane resin in an anionic or cationic polymerization system). The adhesive composition of the present embodiment is an anionic or cationic curing system (anionic polymerization system or cationic polymerization system) adhesive composition. The adhesive composition of this embodiment can be suitably used as an adhesive composition for circuit connection. Hereinafter, each component will be described.

(矽烷化合物) 本實施方式的接著劑組成物含有第1矽烷化合物及與所述第1矽烷化合物反應的第2矽烷化合物,所述第1矽烷化合物具有於陰離子或陽離子聚合系中與環氧樹脂或氧雜環丁烷樹脂反應的官能基。第2矽烷化合物是並不相當於第1矽烷化合物的化合物,並不具有於陰離子或陽離子聚合系中與環氧樹脂或氧雜環丁烷樹脂反應的官能基。矽烷化合物亦可為矽烷偶合劑。例如,在第1矽烷化合物及第2矽烷化合物兩者為矽烷偶合劑的情況下,第2矽烷化合物可藉由烷氧基矽烷基的水解·縮合反應而與第1矽烷化合物反應。(Silane compound) The adhesive composition of the present embodiment contains a first silane compound and a second silane compound that reacts with the first silane compound, wherein the first silane compound has a functional group that reacts with an epoxy resin or an oxycyclobutane resin in an anionic or cationic polymerization system. The second silane compound is a compound that is not equivalent to the first silane compound and does not have a functional group that reacts with an epoxy resin or an oxycyclobutane resin in an anionic or cationic polymerization system. The silane compound may also be a silane coupling agent. For example, when both the first silane compound and the second silane compound are silane coupling agents, the second silane compound can react with the first silane compound through a hydrolysis/condensation reaction of an alkoxysilyl group.

作為與環氧樹脂或氧雜環丁烷樹脂反應的官能基,例如可列舉:環氧基、氧雜環丁烷基、胺基、酸酐基、異氰酸酯基及巰基。自獲得更優異的保存穩定性及接著性的觀點考慮,與環氧樹脂或氧雜環丁烷樹脂反應的官能基較佳為選自由環氧基及氧雜環丁烷基所組成的群組中的至少一種,更佳為環氧基。Examples of the functional group that reacts with the epoxy resin or the cyclohexane resin include an epoxy group, a cyclohexane group, an amine group, an acid anhydride group, an isocyanate group, and an alkyl group. From the viewpoint of obtaining better storage stability and adhesion, the functional group that reacts with the epoxy resin or the cyclohexane resin is preferably at least one selected from the group consisting of an epoxy group and a cyclohexane group, and more preferably an epoxy group.

第2矽烷化合物亦可具有不參與陰離子或陽離子聚合反應(於陰離子或陽離子聚合系中與環氧樹脂或氧雜環丁烷樹脂不反應)的官能基。作為不參與陰離子或陽離子聚合反應的官能基,可列舉:烷基、苯基、烷氧基矽烷基、羥基、含氟基、(甲基)丙烯醯基、乙烯基、脲基等。自獲得更優異的保存穩定性的觀點考慮,第2矽烷化合物較佳為具有選自由烷基、苯基及烷氧基矽烷基所組成的群組中的至少一種,更佳為具有烷氧基矽烷基。The second silane compound may also have a functional group that does not participate in anionic or cationic polymerization (does not react with epoxy resin or cyclohexane resin in anionic or cationic polymerization system). Examples of the functional group that does not participate in anionic or cationic polymerization include: alkyl, phenyl, alkoxysilyl, hydroxyl, fluorine-containing group, (meth)acryl, vinyl, urea, etc. From the perspective of obtaining better storage stability, the second silane compound preferably has at least one selected from the group consisting of alkyl, phenyl and alkoxysilyl, and more preferably has an alkoxysilyl.

作為矽烷化合物,可使用下述通式(I)所表示的化合物。式(I)所表示的化合物例如可藉由使有機氯矽烷與醇反應等方法而合成。As the silane compound, a compound represented by the following general formula (I) can be used. The compound represented by the formula (I) can be synthesized by, for example, reacting an organic chlorosilane with an alcohol.

[化1] X-Cs H2s -Si〔R1m 〔OR23-m ···(I) [式中,X表示有機基,R1 及R2 分別獨立地表示烷基,m表示0~2的整數,s表示0以上的整數。在存在多個R1 的情況下,各R1 可彼此相同,亦可不同。在存在多個R2 的情況下,各R2 可彼此相同,亦可不同。R1 、R2 及Cs H2s 各自亦可分支][Chemistry 1] XCsH2s - Si〔 R1mOR23-m ···(I) [wherein X represents an organic group, R1 and R2 each independently represent an alkyl group, m represents an integer of 0 to 2, and s represents an integer greater than 0. When there are multiple R1s , each R1 may be the same as or different from each other. When there are multiple R2s , each R2 may be the same as or different from each other. R1 , R2 and CsH2s may each be branched ]

作為有機基X,可列舉乙烯性不飽和鍵含有基(含有乙烯性不飽和鍵的基)、氮原子含有基(含有氮原子的基)、硫原子含有基(含有硫原子的基)、環氧基等。作為乙烯性不飽和鍵含有基,可列舉(甲基)丙烯醯基、乙烯基、苯乙烯基等。作為氮原子含有基,可列舉胺基、單取代胺基、二取代胺基、異氰酸酯基、咪唑基、脲基、馬來醯亞胺基等。作為單取代胺基,可列舉烷基胺基(甲基胺基等)、苄基胺基、苯基胺基、環烷基胺基(環己基胺基等)等。作為二取代胺基,可列舉非環狀二取代胺基、環狀二取代胺基等。作為非環狀二取代胺基,可列舉二烷基胺基(二甲基胺基等)等。作為環狀二取代胺基,可列舉嗎啉基、哌嗪基等。作為硫原子含有基,可列舉巰基等。環氧基亦可含有於縮水甘油基、縮水甘油氧基等環氧基含有基(含有環氧基的基)中。(甲基)丙烯醯基亦可含有於(甲基)丙烯醯氧基中。As the organic group X, there can be listed an ethylenic unsaturated bond-containing group (a group containing an ethylenic unsaturated bond), a nitrogen atom-containing group (a group containing a nitrogen atom), a sulfur atom-containing group (a group containing a sulfur atom), an epoxide group, etc. As the ethylenic unsaturated bond-containing group, there can be listed a (meth)acryl group, a vinyl group, a styryl group, etc. As the nitrogen atom-containing group, there can be listed an amino group, a monosubstituted amino group, a disubstituted amino group, an isocyanate group, an imidazole group, a urea group, a maleimide group, etc. As the monosubstituted amino group, there can be listed an alkylamino group (a methylamino group, etc.), a benzylamino group, a phenylamino group, a cycloalkylamino group (a cyclohexylamino group, etc.), etc. As the disubstituted amino group, there can be listed a non-cyclic disubstituted amino group, a cyclic disubstituted amino group, etc. Examples of the non-cyclic disubstituted amino group include dialkylamino groups (dimethylamino groups, etc.). Examples of the cyclic disubstituted amino group include morpholinyl groups, piperazinyl groups, etc. Examples of the sulfur atom-containing group include pentyl groups, etc. An epoxy group may be contained in an epoxy group-containing group (an epoxy group-containing group) such as a glycidyl group and a glycidyloxy group. A (meth)acryloyl group may be contained in a (meth)acryloyloxy group.

在使用所述通式(I)所表示的化合物作為第1矽烷化合物的情況下,作為有機基X,自所述中選擇與環氧樹脂或氧雜環丁烷樹脂反應的官能基。而且,在使用所述通式(I)所表示的化合物作為第2矽烷化合物的情況下,作為有機基X,自所述中選擇與環氧樹脂或氧雜環丁烷樹脂不反應(不參與陰離子或陽離子聚合反應)的官能基。When the compound represented by the general formula (I) is used as the first silane compound, a functional group that reacts with an epoxy resin or an oxycyclobutane resin is selected from the above-mentioned organic group X. Furthermore, when the compound represented by the general formula (I) is used as the second silane compound, a functional group that does not react with an epoxy resin or an oxycyclobutane resin (does not participate in anionic or cationic polymerization reaction) is selected from the above-mentioned organic group X.

R1 及R2 的烷基的碳數例如為1~20。作為所述烷基的具體例,可列舉甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、十一烷基、十二烷基、十三烷基、十四烷基、十五烷基、十六烷基、十七烷基、十八烷基、十九烷基、二十烷基等。作為R1 及R2 ,可使用所述烷基的各結構異構物。自烷氧基矽烷基部分與被黏著體反應時難以成為立體阻礙,獲得與被黏著體更優異的接著性的觀點考慮,R1 的烷基的碳數較佳為1~10,更佳為1~5。自獲得與被黏著體更優異的接著性的觀點考慮,R2 的烷基的碳數較佳為1~10,更佳為1~5。The carbon number of the alkyl group of R1 and R2 is, for example, 1 to 20. Specific examples of the alkyl group include methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, undecyl, dodecyl, tridecyl, tetradecyl, pentadecyl, hexadecyl, heptadecyl, octadecyl, nonadecyl, eicosyl, etc. As R1 and R2 , each structural isomer of the alkyl group can be used. From the viewpoint that the alkoxysilyl moiety is unlikely to cause stereo hindrance when reacting with the adherend, and better adhesion with the adherend is obtained, the carbon number of the alkyl group of R1 is preferably 1 to 10, and more preferably 1 to 5. From the viewpoint of obtaining better adhesion to an adherend, the carbon number of the alkyl group of R2 is preferably 1 to 10, more preferably 1 to 5.

m為0~2的整數。自烷氧基矽烷基部分與被黏著體反應時難以成為立體阻礙,獲得與被黏著體更優異的接著性的觀點考慮,m較佳為0~1,更佳為0。s為0以上的整數。自獲得更優異的保存穩定性的觀點考慮,s較佳為1~20的整數,更佳為1~10的整數。m is an integer of 0 to 2. From the viewpoint of obtaining better adhesion to the adherend since the alkoxysilyl moiety is less likely to cause stereo hindrance when reacting with the adherend, m is preferably 0 to 1, and more preferably 0. s is an integer greater than 0. From the viewpoint of obtaining better storage stability, s is preferably an integer of 1 to 20, and more preferably an integer of 1 to 10.

作為第1矽烷化合物,可列舉縮水甘油氧基烷基三烷氧基矽烷(例如3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基三乙氧基矽烷、8-縮水甘油氧基辛基三甲氧基矽烷、8-縮水甘油氧基辛基三乙氧基矽烷等)、縮水甘油氧基烷基烷基二烷氧基矽烷(例如3-縮水甘油氧基丙基甲基二甲氧基矽烷、3-縮水甘油氧基丙基甲基二乙氧基矽烷、8-縮水甘油氧基辛基甲基二甲氧基矽烷、8-縮水甘油氧基辛基甲基二乙氧基矽烷等)、N-2-(胺基乙基)-3-胺基丙基甲基二甲氧基矽烷、N-2-(胺基乙基)-3-胺基丙基三甲氧基矽烷、N-2-(胺基乙基)-8-胺基辛基甲基二甲氧基矽烷、N-2-(胺基乙基)-8-胺基辛基三甲氧基矽烷、3-胺基辛基三甲氧基矽烷、3-胺基辛基三乙氧基矽烷、3-三乙氧基矽烷基-N-(1,3-二甲基亞丁基)辛基胺、N-苯基-3-胺基丙基三甲氧基矽烷、N-苯基-8-胺基辛基三甲氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、3-巰基丙基三甲氧基矽烷、8-巰基辛基甲基二甲氧基矽烷、8-巰基辛基三甲氧基矽烷、三甲氧基矽烷基丙基丁二酸酐、三乙氧基矽烷基丙基丁二酸酐、3-[(3-乙基氧雜環丁烷-3-基)甲氧基]丙基三烷氧基矽烷(例如3-[(3-乙基氧雜環丁烷-3-基)甲氧基]丙基(三甲氧基)矽烷、3-[(3-乙基氧雜環丁烷-3-基)甲氧基]丙基(三乙氧基)矽烷等)、異氰酸酯烷基三烷氧基矽烷(例如,3-異氰酸酯丙基三甲氧基矽烷、3-異氰酸酯丙基三乙氧基矽烷、8-異氰酸酯辛基三甲氧基矽烷、8-異氰酸酯辛基三乙氧基矽烷等)、異氰酸酯烷基烷基二烷氧基矽烷等。作為第1矽烷化合物,自獲得更優異的保存穩定性及接著性的觀點考慮,較佳為選自由縮水甘油氧基烷基三烷氧基矽烷及縮水甘油氧基烷基烷基二烷氧基矽烷所組成的群組中的至少一種。第1矽烷化合物可單獨使用一種,亦可組合使用兩種以上。As the first silane compound, there can be mentioned glycidyloxyalkyltrialkoxysilanes (e.g., 3-glycidyloxypropyltrimethoxysilane, 3-glycidyloxypropyltriethoxysilane, 8-glycidyloxyoctyltrimethoxysilane, 8-glycidyloxyoctyltriethoxysilane, etc.), glycidyloxyalkylalkyldialkoxysilanes (e.g., 3-glycidyloxypropylmethyldimethoxysilane, 3-glycidyloxypropylmethyldiethoxysilane, 8-glycidyloxyoctyltrimethoxysilane, etc.), 8-aminooctylmethyldimethoxysilane, 8-glycidyloxyoctylmethyldiethoxysilane, etc.), N-2-(aminoethyl)-3-aminopropylmethyldimethoxysilane, N-2-(aminoethyl)-3-aminopropyltrimethoxysilane, N-2-(aminoethyl)-8-aminooctylmethyldimethoxysilane, N-2-(aminoethyl)-8-aminooctyltrimethoxysilane, 3-aminooctyltrimethoxysilane, 3-aminooctyltriethoxysilane, 3-triethoxysilyl- N-(1,3-dimethylbutylene)octylamine, N-phenyl-3-aminopropyltrimethoxysilane, N-phenyl-8-aminooctyltrimethoxysilane, 3-butylpropylmethyldimethoxysilane, 3-butylpropyltrimethoxysilane, 8-butyloctylmethyldimethoxysilane, 8-butyloctyltrimethoxysilane, trimethoxysilylpropylsuccinic anhydride, triethoxysilylpropylsuccinic anhydride, 3-[(3-ethyloxycyclobutane-3-yl)methoxy]propyltrialkoxy Silane (for example, 3-[(3-ethyloxycyclobutane-3-yl)methoxy]propyl(trimethoxy)silane, 3-[(3-ethyloxycyclobutane-3-yl)methoxy]propyl(triethoxy)silane, etc.), isocyanate alkyltrialkoxysilane (for example, 3-isocyanatepropyltrimethoxysilane, 3-isocyanatepropyltriethoxysilane, 8-isocyanateoctyltrimethoxysilane, 8-isocyanateoctyltriethoxysilane, etc.), isocyanatealkylalkyldialkoxysilane, etc. From the viewpoint of obtaining better storage stability and adhesion, the first silane compound is preferably at least one selected from the group consisting of glycidyloxyalkyltrialkoxysilane and glycidyloxyalkylalkyldialkoxysilane. The first silane compound may be used alone or in combination of two or more.

作為第2矽烷化合物,可列舉:烷基三烷氧基矽烷、二烷基二烷氧基矽烷、苯基三烷氧基矽烷、氟烷基三烷氧基矽烷、氟烷基烷基二烷氧基矽烷、(甲基)丙烯醯氧基烷基三烷氧基矽烷、(甲基)丙烯醯氧基烷基烷基二烷氧基矽烷、(甲基)丙烯醯氧基三烷基烷氧基矽烷、烯基三烷氧基矽烷、烯基烷基二烷氧基矽烷、苯乙烯基三烷氧基矽烷、苯乙烯基烷基三烷氧基矽烷、3-脲基丙基三乙氧基矽烷、8-脲基辛基三乙氧基矽烷等。Examples of the second silane compound include alkyltrialkoxysilane, dialkyldialkoxysilane, phenyltrialkoxysilane, fluoroalkyltrialkoxysilane, fluoroalkylalkyldialkoxysilane, (meth)acryloxyalkyltrialkoxysilane, (meth)acryloxyalkylalkyldialkoxysilane, (meth)acryloxytrialkylalkoxysilane, alkenyltrialkoxysilane, alkenylalkyldialkoxysilane, styryltrialkoxysilane, styrylalkyltrialkoxysilane, 3-ureidopropyltriethoxysilane, 8-ureidooctyltriethoxysilane, and the like.

作為烷基三烷氧基矽烷,可列舉:甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙基三甲氧基矽烷、乙基三乙氧基矽烷、丙基三甲氧基矽烷、丙基三乙氧基矽烷、丁基三甲氧基矽烷、丁基三乙氧基矽烷、戊基三甲氧基矽烷、戊基三乙氧基矽烷、己基三甲氧基矽烷、己基三乙氧基矽烷、庚基三甲氧基矽烷、庚基三乙氧基矽烷、辛基三甲氧基矽烷、辛基三乙氧基矽烷、壬基三甲氧基矽烷、壬基三乙氧基矽烷、癸基三甲氧基矽烷、癸基三乙氧基矽烷等。Examples of the alkyltrialkoxysilane include methyltrimethoxysilane, methyltriethoxysilane, ethyltrimethoxysilane, ethyltriethoxysilane, propyltrimethoxysilane, propyltriethoxysilane, butyltrimethoxysilane, butyltriethoxysilane, pentyltrimethoxysilane, pentyltriethoxysilane, hexyltrimethoxysilane, hexyltriethoxysilane, heptyltrimethoxysilane, heptyltriethoxysilane, octyltrimethoxysilane, octyltriethoxysilane, nonyltrimethoxysilane, nonyltriethoxysilane, decyltrimethoxysilane, decyltriethoxysilane and the like.

作為二烷基二烷氧基矽烷,可列舉:二甲基二甲氧基矽烷、二甲基二乙氧基矽烷、乙基甲基二甲氧基矽烷、乙基甲基二乙氧基矽烷、丙基甲基二甲氧基矽烷、丙基甲基二乙氧基矽烷、丁基甲基二甲氧基矽烷、丁基甲基二乙氧基矽烷、戊基甲基二甲氧基矽烷、戊基甲基二乙氧基矽烷、己基甲基二甲氧基矽烷、己基甲基二乙氧基矽烷、庚基甲基二甲氧基矽烷、庚基甲基二乙氧基矽烷、辛基甲基二甲氧基矽烷、辛基甲基二乙氧基矽烷、壬基甲基二甲氧基矽烷、壬基甲基二乙氧基矽烷、癸基甲基二甲氧基矽烷、癸基甲基二乙氧基矽烷等。Examples of the dialkyldialkoxysilane include dimethyldimethoxysilane, dimethyldiethoxysilane, ethylmethyldimethoxysilane, ethylmethyldiethoxysilane, propylmethyldimethoxysilane, propylmethyldiethoxysilane, butylmethyldimethoxysilane, butylmethyldiethoxysilane, pentylmethyldimethoxysilane, pentylmethyldiethoxysilane, hexylmethyldimethoxysilane, hexylmethyldiethoxysilane, heptylmethyldimethoxysilane, heptylmethyldiethoxysilane, octylmethyldimethoxysilane, octylmethyldiethoxysilane, nonylmethyldimethoxysilane, nonylmethyldiethoxysilane, decylmethyldimethoxysilane, decylmethyldiethoxysilane and the like.

作為苯基三烷氧基矽烷,可列舉苯基三甲氧基矽烷、苯基三乙氧基矽烷等。Examples of the phenyltrialkoxysilane include phenyltrimethoxysilane, phenyltriethoxysilane, and the like.

作為氟烷基三烷氧基矽烷,可列舉三氟丙基三甲氧基矽烷、三氟丙基三乙氧基矽烷等。Examples of the fluoroalkyltrialkoxysilane include trifluoropropyltrimethoxysilane and trifluoropropyltriethoxysilane.

作為氟烷基烷基二烷氧基矽烷,可列舉三氟丙基甲基二甲氧基矽烷、三氟丙基甲基二乙氧基矽烷等。Examples of the fluoroalkylalkyldialkoxysilane include trifluoropropylmethyldimethoxysilane and trifluoropropylmethyldiethoxysilane.

作為(甲基)丙烯醯氧基烷基三烷氧基矽烷,可列舉3-(甲基)丙烯醯氧基丙基三甲氧基矽烷、3-(甲基)丙烯醯氧基丙基三乙氧基矽烷、8-(甲基)丙烯醯氧基辛基三甲氧基矽烷、8-(甲基)丙烯醯氧基辛基三乙氧基矽烷等。Examples of the (meth)acryloxyalkyltrialkoxysilane include 3-(meth)acryloxypropyltrimethoxysilane, 3-(meth)acryloxypropyltriethoxysilane, 8-(meth)acryloxyoctyltrimethoxysilane, and 8-(meth)acryloxyoctyltriethoxysilane.

作為(甲基)丙烯醯氧基烷基烷基二烷氧基矽烷,可列舉3-(甲基)丙烯醯氧基丙基甲基二甲氧基矽烷、3-(甲基)丙烯醯氧基丙基甲基二乙氧基矽烷、8-(甲基)丙烯醯氧基辛基甲基二甲氧基矽烷、8-(甲基)丙烯醯氧基辛基甲基二乙氧基矽烷等。Examples of the (meth)acryloxyalkylalkyldialkoxysilane include 3-(meth)acryloxypropylmethyldimethoxysilane, 3-(meth)acryloxypropylmethyldiethoxysilane, 8-(meth)acryloxyoctylmethyldimethoxysilane, and 8-(meth)acryloxyoctylmethyldiethoxysilane.

作為烯基三烷氧基矽烷,可列舉乙烯基三烷氧基矽烷、辛烯基三烷氧基矽烷等。Examples of the alkenyltrialkoxysilane include vinyltrialkoxysilane, octenyltrialkoxysilane and the like.

作為乙烯基三烷氧基矽烷,可列舉乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷等。Examples of the vinyl trialkoxysilane include vinyl trimethoxysilane and vinyl triethoxysilane.

作為辛烯基三烷氧基矽烷,可列舉7-辛烯基三甲氧基矽烷、7-辛烯基三乙氧基矽烷等。Examples of the octenyltrialkoxysilane include 7-octenyltrimethoxysilane and 7-octenyltriethoxysilane.

作為烯基烷基二烷氧基矽烷,可列舉乙烯基烷基二烷氧基矽烷、辛烯基烷基二烷氧基矽烷等。Examples of the alkenylalkyldialkoxysilane include vinylalkyldialkoxysilane, octenylalkyldialkoxysilane and the like.

作為乙烯基烷基二烷氧基矽烷,可列舉乙烯基甲基二甲氧基矽烷、乙烯基甲基二乙氧基矽烷等。Examples of the vinylalkyldialkoxysilane include vinylmethyldimethoxysilane and vinylmethyldiethoxysilane.

作為辛烯基烷基二烷氧基矽烷,可列舉7-辛烯基甲基二甲氧基矽烷、7-辛烯基甲基二乙氧基矽烷等。Examples of the octenylalkyldialkoxysilane include 7-octenylmethyldimethoxysilane and 7-octenylmethyldiethoxysilane.

作為苯乙烯基三烷氧基矽烷,可列舉對苯乙烯基三甲氧基矽烷等。Examples of the styryltrialkoxysilane include p-styryltrimethoxysilane and the like.

作為苯乙烯基烷基三烷氧基矽烷,可列舉對苯乙烯基辛基三甲氧基矽烷等。Examples of the styrylalkyltrialkoxysilane include p-styryloctyltrimethoxysilane and the like.

自獲得更優異的保存穩定性的觀點考慮,第2矽烷化合物較佳為選自由烷基三烷氧基矽烷、苯基三烷氧基矽烷及(甲基)丙烯醯氧基烷基三烷氧基矽烷所組成的群組中的至少一種,更佳為選自由甲基三甲氧基矽烷、及3-(甲基)丙烯醯氧基丙基三甲氧基矽烷所組成的群組中的至少一種。第2矽烷化合物可單獨使用一種,亦可組合使用兩種以上。From the viewpoint of obtaining better storage stability, the second silane compound is preferably at least one selected from the group consisting of alkyltrialkoxysilane, phenyltrialkoxysilane and (meth)acryloxyalkyltrialkoxysilane, and more preferably at least one selected from the group consisting of methyltrimethoxysilane and 3-(meth)acryloxypropyltrimethoxysilane. The second silane compound may be used alone or in combination of two or more.

作為式(I)所表示的化合物以外的第2矽烷化合物,可列舉四烷氧基矽烷、烷基三烷氧基矽烷、二烷基二烷氧基矽烷等。作為此種第2矽烷化合物,可列舉甲基三甲氧基矽烷、甲基三乙氧基矽烷、正丙基三甲氧基矽烷、正丙基三乙氧基矽烷、二甲基二甲氧基矽烷、四甲氧基矽烷、四乙氧基矽烷、苯基三甲氧基矽烷、苯基三乙氧基矽烷等。作為式(I)所表示的化合物以外的第2矽烷化合物,自獲得更優異的保存穩定性的觀點考慮,較佳為選自由烷基三烷氧基矽烷及四烷氧基矽烷所組成的群組中的至少一種,更佳為選自由甲基三甲氧基矽烷、乙基三乙氧基矽烷、四甲氧基矽烷及四乙氧基矽烷所組成的群組中的至少一種。式(I)所表示的化合物以外的第2矽烷化合物可單獨使用一種,亦可組合使用兩種以上。Examples of the second silane compound other than the compound represented by formula (I) include tetraalkoxysilane, alkyltrialkoxysilane, dialkyldialkoxysilane, etc. Examples of such a second silane compound include methyltrimethoxysilane, methyltriethoxysilane, n-propyltrimethoxysilane, n-propyltriethoxysilane, dimethyldimethoxysilane, tetramethoxysilane, tetraethoxysilane, phenyltrimethoxysilane, phenyltriethoxysilane, etc. From the viewpoint of obtaining better storage stability, the second silane compound other than the compound represented by formula (I) is preferably at least one selected from the group consisting of alkyltrialkoxysilanes and tetraalkoxysilanes, and more preferably at least one selected from the group consisting of methyltrimethoxysilane, ethyltriethoxysilane, tetramethoxysilane and tetraethoxysilane. The second silane compound other than the compound represented by formula (I) may be used alone or in combination of two or more.

矽烷化合物(包含第1矽烷化合物、第2矽烷化合物及其他矽烷化合物)的含量並無特別限定,但自容易抑制在被黏著體(電路構件等)與接著劑組成物或其硬化物(電路連接構件等)的界面產生剝離氣泡(於接著劑組成物與被黏著體的界面產生剝離,結果觀察到氣泡的部位)的觀點考慮,以接著劑組成物的接著劑成分(接著劑組成物中的導電粒子以外的固體成分。以下相同)的總質量為基準而言較佳為下述的範圍。矽烷化合物的含量較佳為0.1質量%以上,更佳為0.25質量%以上,進而較佳為0.5質量%以上,特佳為1質量%以上,極佳為2質量%以上,非常佳為3質量%以上。矽烷化合物的含量較佳為20質量%以下,更佳為15質量%以下,進而較佳為10質量%以下,特佳為5質量%以下。自該些觀點考慮,矽烷化合物的含量較佳為0.1質量%~20質量%,更佳為0.25質量%~15質量%,進而較佳為0.5質量%~10質量%,特佳為1質量%~5質量%,極佳為2質量%~5質量%,非常佳為3質量%~5質量%。The content of the silane compound (including the first silane compound, the second silane compound and other silane compounds) is not particularly limited, but from the viewpoint of easily suppressing the generation of peeling bubbles (parts where peeling occurs at the interface between the adhesive composition and the adherend and bubbles are observed as a result) at the interface between the adherend (circuit component, etc.) and the adhesive composition or its cured product (circuit connecting component, etc.), the content is preferably within the following range based on the total mass of the adhesive components of the adhesive composition (solid components other than the conductive particles in the adhesive composition. The same applies hereinafter). The content of the silane compound is preferably 0.1% by mass or more, more preferably 0.25% by mass or more, further preferably 0.5% by mass or more, particularly preferably 1% by mass or more, extremely preferably 2% by mass or more, and very preferably 3% by mass or more. The content of the silane compound is preferably 20% by mass or less, more preferably 15% by mass or less, further preferably 10% by mass or less, and particularly preferably 5% by mass or less. From these viewpoints, the content of the silane compound is preferably 0.1% by mass to 20% by mass, more preferably 0.25% by mass to 15% by mass, further preferably 0.5% by mass to 10% by mass, particularly preferably 1% by mass to 5% by mass, extremely preferably 2% by mass to 5% by mass, and very preferably 3% by mass to 5% by mass.

自容易抑制被黏著體(電路構件等)與接著劑組成物或其硬化物(電路連接構件等)的界面產生剝離氣泡的觀點考慮,第1矽烷化合物的含量較佳的是以接著劑組成物的接著劑成分的總質量為基準而言為下述範圍。第1矽烷化合物的含量較佳為0.1質量%以上,更佳為0.25質量%以上,進而較佳為0.5質量%以上,特佳為1質量%以上,極佳為1.5質量%以上。第1矽烷化合物的含量較佳為20質量%以下,更佳為15質量%以下,進而較佳為10質量%以下,特佳為5質量%以下,極佳為3質量%以下。自該些觀點考慮,第1矽烷化合物的含量較佳為0.1質量%~20質量%,更佳為0.25質量%~15質量%,進而較佳為0.5質量%~10質量%,特佳為1質量%~5質量%,極佳為1.5質量%~3質量%。From the viewpoint of easily suppressing the generation of exfoliation bubbles at the interface between the adherend (circuit component, etc.) and the adhesive composition or its cured product (circuit connection component, etc.), the content of the first silane compound is preferably in the following range based on the total mass of the adhesive component of the adhesive composition. The content of the first silane compound is preferably 0.1 mass% or more, more preferably 0.25 mass% or more, further preferably 0.5 mass% or more, particularly preferably 1 mass% or more, and extremely preferably 1.5 mass% or more. The content of the first silane compound is preferably 20 mass% or less, more preferably 15 mass% or less, further preferably 10 mass% or less, particularly preferably 5 mass% or less, and extremely preferably 3 mass% or less. From these viewpoints, the content of the first silane compound is preferably 0.1 mass % to 20 mass %, more preferably 0.25 mass % to 15 mass %, further preferably 0.5 mass % to 10 mass %, particularly preferably 1 mass % to 5 mass %, and extremely preferably 1.5 mass % to 3 mass %.

自容易抑制被黏著體(電路構件等)與接著劑組成物或其硬化物(電路連接構件等)的界面產生剝離氣泡的觀點考慮,第2矽烷化合物的含量較佳的是以接著劑組成物的接著劑成分的總質量為基準而言為下述範圍。第2矽烷化合物的含量較佳為0.1質量%以上,更佳為0.25質量%以上,進而較佳為0.5質量%以上,特佳為1質量%以上,極佳為1.5質量%以上。第2矽烷化合物的含量較佳為20質量%以下,更佳為15質量%以下,進而較佳為10質量%以下,特佳為5質量%以下,極佳為3質量%以下。自該些觀點考慮,第2矽烷化合物的含量較佳為0.1質量%~20質量%,更佳為0.25質量%~15質量%,進而較佳為0.5質量%~10質量%,特佳為1質量%~5質量%,極佳為1.5質量%~3質量%。From the viewpoint of easily suppressing the generation of exfoliation bubbles at the interface between the adherend (circuit component, etc.) and the adhesive composition or its cured product (circuit connection component, etc.), the content of the second silane compound is preferably in the following range based on the total mass of the adhesive component of the adhesive composition. The content of the second silane compound is preferably 0.1 mass% or more, more preferably 0.25 mass% or more, further preferably 0.5 mass% or more, particularly preferably 1 mass% or more, and extremely preferably 1.5 mass% or more. The content of the second silane compound is preferably 20 mass% or less, more preferably 15 mass% or less, further preferably 10 mass% or less, particularly preferably 5 mass% or less, and extremely preferably 3 mass% or less. From these viewpoints, the content of the second silane compound is preferably 0.1 mass % to 20 mass %, more preferably 0.25 mass % to 15 mass %, further preferably 0.5 mass % to 10 mass %, particularly preferably 1 mass % to 5 mass %, and extremely preferably 1.5 mass % to 3 mass %.

自獲得更優異的保存穩定性及接著性的觀點考慮,第1矽烷化合物的含量相對於第2矽烷化合物的含量的比率(質量比。相對於第2矽烷化合物的含量1的相對值)較佳為0.01以上,更佳為0.1以上,進而較佳為0.2以上,特佳為0.5以上,極佳為1以上。自獲得更優異的保存穩定性及接著性的觀點考慮,所述比率較佳為100以下,更佳為10以下,進而較佳為5以下,特佳為3以下,極佳為2以下。From the viewpoint of obtaining better storage stability and adhesion, the ratio of the content of the first silane compound to the content of the second silane compound (mass ratio. Relative value relative to the content of the second silane compound 1) is preferably 0.01 or more, more preferably 0.1 or more, further preferably 0.2 or more, particularly preferably 0.5 or more, and extremely preferably 1 or more. From the viewpoint of obtaining better storage stability and adhesion, the ratio is preferably 100 or less, more preferably 10 or less, further preferably 5 or less, particularly preferably 3 or less, and extremely preferably 2 or less.

(陰離子或陽離子聚合性成分:可陰離子聚合或陽離子聚合的環氧樹脂或氧雜環丁烷樹脂) 關於作為陰離子或陽離子聚合性成分的可陰離子聚合或陽離子聚合的環氧樹脂,可列舉:雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、萘型環氧樹脂、苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂、雙酚A酚醛清漆型環氧樹脂、雙酚F酚醛清漆型環氧樹脂、脂環式環氧樹脂、縮水甘油酯型環氧樹脂、縮水甘油胺型環氧樹脂、乙內醯脲型環氧樹脂、異三聚氰酸酯型環氧樹脂、脂肪族鏈狀環氧樹脂等。而且,關於作為陰離子或陽離子聚合性成分的可陰離子聚合或陽離子聚合的氧雜環丁烷樹脂,可列舉:3-乙基-3-羥基甲基氧雜環丁烷、2-乙基己基氧雜環丁烷、伸二甲苯基雙氧雜環丁烷、3-乙基-3{[(3-乙基氧雜環丁烷-3-基)甲氧基]甲基}氧雜環丁烷、丙烯酸(3-乙基氧雜環丁烷-3-基)甲酯、甲基丙烯酸(3-乙基氧雜環丁烷-3-基)甲酯等。陰離子或陽離子聚合性成分可經鹵化亦可經氫化。陰離子或陽離子聚合性成分可單獨使用一種,亦可組合使用兩種以上。(Anionic or cationic polymerizable component: anionic or cationic polymerizable epoxy resin or cyclohexane resin) Examples of anionic or cationic polymerizable epoxy resins as anionic or cationic polymerizable components include: bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, naphthalene type epoxy resin, phenol novolac type epoxy resin, cresol novolac type epoxy resin, Epoxy resins, bisphenol A novolac type epoxy resins, bisphenol F novolac type epoxy resins, aliphatic epoxy resins, glycidyl ester type epoxy resins, glycidylamine type epoxy resins, hydantoin type epoxy resins, isocyanurate type epoxy resins, aliphatic chain epoxy resins, etc. Examples of anionically or cationically polymerizable cyclohexane resins as anionically or cationically polymerizable components include 3-ethyl-3-hydroxymethylcyclohexane, 2-ethylhexylcyclohexane, xylylbiscyclohexane, 3-ethyl-3{[(3-ethylcyclohexane-3-yl)methoxy]methyl}cyclohexane, (3-ethylcyclohexane-3-yl)methyl acrylate, and (3-ethylcyclohexane-3-yl)methyl methacrylate. The anionically or cationically polymerizable component may be halogenated or hydrogenated. The anionic or cationic polymerizable components may be used alone or in combination of two or more.

自進而提高與被黏著體的接著性的觀點考慮,陰離子或陽離子聚合性成分的含量較佳的是以接著劑組成物的接著劑成分的總質量為基準而言為下述的範圍。陰離子或陽離子聚合性成分的含量較佳為5質量%以上,更佳為10質量%以上,進而較佳為15質量%以上。陰離子或陽離子聚合性成分的含量較佳為90質量%以下,更佳為80質量%以下,進而較佳為70質量%以下。自該些觀點考慮,陰離子或陽離子聚合性成分的含量較佳為5質量%~90質量%,更佳為10質量%~80質量%,進而較佳為15質量%~70質量%。From the viewpoint of further improving the adhesion to the adherend, the content of the anionic or cationic polymerizable component is preferably in the following range based on the total mass of the adhesive component of the adhesive composition. The content of the anionic or cationic polymerizable component is preferably 5 mass % or more, more preferably 10 mass % or more, and further preferably 15 mass % or more. The content of the anionic or cationic polymerizable component is preferably 90 mass % or less, more preferably 80 mass % or less, and further preferably 70 mass % or less. From these viewpoints, the content of the anionic or cationic polymerizable component is preferably 5% by mass to 90% by mass, more preferably 10% by mass to 80% by mass, and further preferably 15% by mass to 70% by mass.

(硬化劑) 本實施方式的接著劑組成物亦可進而包含硬化劑。作為硬化劑,只要為能夠使可陰離子聚合或陽離子聚合的環氧樹脂或氧雜環丁烷樹脂硬化者,則並無特別限定。作為硬化劑,可列舉可藉由熱或光而產生陰離子種的硬化劑(陰離子聚合性的觸媒型硬化劑等)、可藉由熱或光而產生陽離子種的硬化劑(陽離子聚合性的觸媒型硬化劑等)、加成聚合型硬化劑等。硬化劑可單獨使用一種,亦可組合使用兩種以上。自快速硬化性優異且不需要考慮化學當量的觀點考慮,硬化劑較佳為可藉由熱或光而產生陰離子種或陽離子種的硬化劑,更佳為陰離子聚合性或陽離子聚合性的觸媒型硬化劑。(Hardener) The adhesive composition of the present embodiment may further include a hardener. The hardener is not particularly limited as long as it is capable of hardening anionically or cationically polymerizable epoxy resins or cyclohexane resins. Examples of the hardener include hardeners that can generate anionic species by heat or light (cationically polymerizable catalytic hardeners, etc.), hardeners that can generate cationic species by heat or light (cationically polymerizable catalytic hardeners, etc.), and addition polymerization hardeners. The hardener may be used alone or in combination of two or more. From the viewpoint of excellent self-curing property and no need to consider chemical equivalent, the hardener is preferably a hardener that can generate anionic species or cationic species by heat or light, and more preferably a cationic or cationic catalytic hardener.

作為陰離子聚合性的觸媒型硬化劑,可列舉咪唑系硬化劑、醯肼系硬化劑、三氟化硼-胺錯合物、胺醯亞胺、三級胺類、二胺基順丁烯二腈、三聚氰胺及其衍生物、多胺的鹽、二氰二胺(dicyandiamide)等,亦可使用該些的改質物。作為陽離子聚合性的觸媒型硬化劑,可列舉重氮鎓鹽、鋶鹽等,亦可使用該些的改質物。作為加成聚合型硬化劑,可列舉多胺類、聚硫醇類、多酚類、酸酐等。Examples of anionic polymerization catalyst-type hardeners include imidazole-based hardeners, hydrazide-based hardeners, boron trifluoride-amine complexes, amine imides, tertiary amines, diamino cis-butylene dinitrile, melamine and its derivatives, salts of polyamines, dicyandiamide, etc., and their modified products can also be used. Examples of cationic polymerization catalyst-type hardeners include diazonium salts, coronium salts, etc., and their modified products can also be used. Examples of addition polymerization hardeners include polyamines, polythiols, polyphenols, acid anhydrides, etc.

在使用三級胺類、咪唑系硬化劑等作為陰離子聚合性的觸媒型硬化劑的情況下,可藉由以160℃~200℃左右的中溫進行數10秒~數小時左右的加熱而使環氧樹脂或氧雜環丁烷樹脂硬化。因此,可使使用壽命(usable life)(使用期限(pot life))相較而言變長。When using tertiary amines, imidazole-based hardeners, etc. as anionic polymerizable catalytic hardeners, epoxy resins or cyclohexane resins can be hardened by heating at a medium temperature of about 160°C to 200°C for tens of seconds to hours. Therefore, the usable life (pot life) can be relatively long.

作為陽離子聚合性的觸媒型硬化劑,例如較佳為可藉由照射能量線而使環氧樹脂或氧雜環丁烷樹脂硬化的感光性鎓鹽(芳香族重氮鎓鹽、芳香族鋶鹽等)。而且,作為除照射能量線以外藉由熱而進行活性化使環氧樹脂或氧雜環丁烷樹脂硬化者,可列舉脂肪族鋶鹽等。此種硬化劑因具有快速硬化性而較佳。As a catalytic curing agent of cationic polymerization, for example, a photosensitive onium salt (aromatic diazonium salt, aromatic cobalt salt, etc.) that can cure epoxy resin or cyclobutane resin by irradiation with energy rays is preferred. In addition, as a curing agent that can be activated by heat other than irradiation with energy rays to cure epoxy resin or cyclobutane resin, aliphatic cobalt salts can be cited. Such a curing agent is preferred because it has a rapid curing property.

利用高分子物質(聚胺基甲酸酯系、聚酯系等)、金屬(鎳、酮等)薄膜、無機物(矽酸鈣等)等將硬化劑包覆而經微膠囊化的硬化劑可延長使用壽命,因此較佳。It is better to use a hardener that is coated with a polymer (polyurethane, polyester, etc.), a metal (nickel, ketone, etc.) film, an inorganic (calcium silicate, etc.) and then microencapsulated to extend the service life.

自進而提高與被黏著體的接著性的觀點考慮,相對於陰離子或陽離子聚合性成分100質量份而言,硬化劑的含量較佳為下述的範圍。硬化劑的含量較佳為10質量份以上,更佳為20質量份以上,進而較佳為30質量份以上。硬化劑的含量較佳為500質量份以下,更佳為100質量份以下,進而較佳為70質量份以下。自該些觀點考慮,硬化劑的含量較佳為10質量份~500質量份,更佳為20質量份~100質量份,進而較佳為30質量份~70質量份。From the viewpoint of further improving the adhesion to the adherend, the content of the hardener is preferably in the following range relative to 100 parts by mass of the anionic or cationic polymerizable component. The content of the hardener is preferably 10 parts by mass or more, more preferably 20 parts by mass or more, and further preferably 30 parts by mass or more. The content of the hardener is preferably 500 parts by mass or less, more preferably 100 parts by mass or less, and further preferably 70 parts by mass or less. From these viewpoints, the content of the hardener is preferably 10 to 500 parts by mass, more preferably 20 to 100 parts by mass, and further preferably 30 to 70 parts by mass.

(膜形成材料) 本實施方式的接著劑組成物亦可視需要而含有膜形成材料。膜形成材料在使液狀的接著劑組成物固形化為膜狀的情況下,可使通常狀態(常溫常壓)下膜的操作性提高,對膜賦予難以裂開、難以破損、難以黏膩等特性。作為膜形成材料,可列舉苯氧樹脂、聚乙烯甲醛、聚苯乙烯、聚乙烯丁醛、聚酯、聚醯胺、二甲苯樹脂、聚胺基甲酸酯等。自接著性、相溶性、耐熱性及機械強度優異的觀點考慮,該些中較佳為苯氧樹脂。膜形成材料可單獨使用一種,亦可組合使用兩種以上。(Film-forming material) The adhesive composition of the present embodiment may also contain a film-forming material as needed. When the liquid adhesive composition is solidified into a film, the film-forming material can improve the operability of the film under normal conditions (normal temperature and pressure) and give the film properties such as being difficult to crack, difficult to damage, and difficult to get sticky. Examples of the film-forming material include phenoxy resins, polyvinyl formaldehyde, polystyrene, polyvinyl butyral, polyester, polyamide, xylene resins, and polyurethane. From the perspective of excellent self-adhesion, compatibility, heat resistance, and mechanical strength, phenoxy resins are preferred. The film-forming material may be used alone or in combination of two or more.

作為苯氧樹脂,例如可列舉藉由使2官能環氧樹脂與2官能酚類進行加成聚合而獲得的樹脂、及藉由使2官能酚類與表鹵醇進行反應直至高分子化而獲得的樹脂。苯氧樹脂例如可藉由1莫耳2官能酚類與0.985莫耳~1.015莫耳表鹵醇在鹼金屬氫氧化物等觸媒的存在下,在非反應性溶劑中、40℃~120℃的溫度下進行反應而獲得。自樹脂的機械特性及熱特性優異的觀點考慮,苯氧樹脂特佳的是將2官能性環氧樹脂與2官能性酚類的調配當量比設為環氧基/酚性羥基=1/0.9~1/1.1,在鹼金屬化合物、有機磷系化合物、環狀胺系化合物等觸媒的存在下,在沸點為120℃以上的有機溶劑(醯胺系、醚系、酮系、內酯系、醇系等)中,在反應固體成分為50質量%以下的條件下加熱至50℃~200℃進行加成聚合反應而獲得。苯氧樹脂可單獨使用一種,亦可組合使用兩種以上。Examples of phenoxy resins include resins obtained by addition polymerization of bifunctional epoxy resins and bifunctional phenols, and resins obtained by reacting bifunctional phenols with epihalogen alcohols until they are polymerized. Phenoxy resins can be obtained, for example, by reacting 1 mol of bifunctional phenols with 0.985 mol to 1.015 mol of epihalogen alcohols in a non-reactive solvent at a temperature of 40°C to 120°C in the presence of a catalyst such as an alkaline metal hydroxide. From the viewpoint of excellent mechanical and thermal properties of the resin, the phenoxy resin is particularly preferably obtained by setting the equivalent ratio of a bifunctional epoxy resin to a bifunctional phenol to 1/0.9 to 1/1.1, heating to 50°C to 200°C in an organic solvent (amide, ether, ketone, lactone, alcohol, etc.) having a boiling point of 120°C or more under the condition that the reaction solid content is 50% by mass or less, and performing addition polymerization. The phenoxy resin may be used alone or in combination of two or more.

作為2官能環氧樹脂,可列舉雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AD型環氧樹脂、雙酚S型環氧樹脂、聯苯二縮水甘油醚、經甲基取代的聯苯二縮水甘油醚等。2官能酚類是具有2個酚性羥基的化合物。作為2官能酚類,可列舉對苯二酚類、雙酚A、雙酚F、雙酚AD、雙酚S、雙酚茀、經甲基取代的雙酚茀、二羥基聯苯、經甲基取代的二羥基聯苯等雙酚類等。苯氧樹脂亦可經自由基聚合性官能基、或其他反應性化合物改質(例如環氧改質)。Examples of bifunctional epoxy resins include bisphenol A epoxy resins, bisphenol F epoxy resins, bisphenol AD epoxy resins, bisphenol S epoxy resins, biphenyl diglycidyl ether, and methyl-substituted biphenyl diglycidyl ether. Bifunctional phenols are compounds having two phenolic hydroxyl groups. Examples of bifunctional phenols include hydroquinones, bisphenol A, bisphenol F, bisphenol AD, bisphenol S, bisphenol fluorene, methyl-substituted bisphenol fluorene, dihydroxybiphenyl, and methyl-substituted dihydroxybiphenyl. Phenoxy resins can also be modified with free radical polymerizable functional groups or other reactive compounds (e.g. epoxy modification).

膜形成材料的含量以接著劑組成物的接著劑成分總量為基準較佳為10質量%~90質量%,更佳為20質量%~60質量%,進而較佳為30質量%~50質量%。The content of the film-forming material is preferably 10% to 90% by mass, more preferably 20% to 60% by mass, and further preferably 30% to 50% by mass, based on the total amount of the adhesive components of the adhesive composition.

(導電粒子) 本實施方式的接著劑組成物亦可進而含有導電粒子。作為導電粒子的構成材料,可列舉金(Au)、銀(Ag)、鎳(Ni)、銅(Cu)、焊料等金屬、碳等。而且,亦可為以非導電性的樹脂、玻璃、陶瓷、塑膠等為核,於該核上包覆有所述金屬(金屬粒子等)或碳的包覆導電粒子。包覆導電粒子或熱熔融金屬粒子由於加熱加壓而具有變形性,因此在連接時消除電路電極的高度的不均一,在連接時與電極的接觸面積增加,因此可靠性提高而較佳。(Conductive particles) The adhesive composition of the present embodiment may further contain conductive particles. As constituent materials of the conductive particles, metals such as gold (Au), silver (Ag), nickel (Ni), copper (Cu), solder, and carbon may be listed. Furthermore, it may be a coated conductive particle having a non-conductive resin, glass, ceramic, plastic, etc. as a core, on which the metal (metal particles, etc.) or carbon is coated. Coated conductive particles or hot-melt metal particles are deformable due to heating and pressurization, so that the uneven height of the circuit electrode is eliminated during connection, and the contact area with the electrode is increased during connection, so the reliability is improved and it is better.

自分散性及導電性優異的觀點考慮,導電粒子的平均粒徑較佳為1 μm~50 μm,更佳為2 μm~30 μm,進而較佳為3 μm~20 μm。導電粒子的平均粒徑例如可使用雷射繞射法等機器分析而測定。From the viewpoint of excellent self-dispersibility and conductivity, the average particle size of the conductive particles is preferably 1 μm to 50 μm, more preferably 2 μm to 30 μm, and further preferably 3 μm to 20 μm. The average particle size of the conductive particles can be measured by machine analysis such as laser diffraction method.

自導電性優異的觀點考慮,相對於接著劑組成物的接著劑成分的總體積100體積份而言,導電粒子的含量較佳為0.1體積份以上,更佳為1體積份以上。自容易抑制電極(電路電極等)短路的觀點考慮,以接著劑組成物的接著劑成分的總體積為基準而言,導電粒子的含量較佳為50體積份以下,更佳為20體積份以下,進而較佳為10體積份以下,特佳為5體積份以下,極佳為3體積份以下。自該些觀點考慮,導電粒子的含量較佳為0.1體積份~50體積份,更佳為0.1體積份~20體積份,進而較佳為1體積份~20體積份,特佳為1體積份~10體積份,極佳為1體積份~5體積份,非常佳為1體積~3體積份。再者,「體積份」是基於23℃的硬化前的各成分的體積而決定,但各成分的體積亦可利用比重而自質量換算為體積。而且,亦可求出在如下容器中投入對象成分而增加的體積而作為對象成分的體積,所述容器是量筒等放入有並不使對象成分溶解或膨潤、且充分浸濕對象成分的適當的溶劑(水、醇等)的容器。From the viewpoint of excellent conductivity, the content of the conductive particles is preferably 0.1 parts by volume or more, and more preferably 1 part by volume or more, relative to 100 parts by volume of the total volume of the adhesive component of the adhesive composition. From the viewpoint of easily suppressing short circuits of electrodes (circuit electrodes, etc.), the content of the conductive particles is preferably 50 parts by volume or less, more preferably 20 parts by volume or less, further preferably 10 parts by volume or less, particularly preferably 5 parts by volume or less, and extremely preferably 3 parts by volume or less, based on the total volume of the adhesive component of the adhesive composition. From these viewpoints, the content of the conductive particles is preferably 0.1 to 50 parts by volume, more preferably 0.1 to 20 parts by volume, further preferably 1 to 20 parts by volume, particularly preferably 1 to 10 parts by volume, extremely preferably 1 to 5 parts by volume, and very preferably 1 to 3 parts by volume. In addition, "parts by volume" is determined based on the volume of each component before curing at 23°C, but the volume of each component can also be converted from mass to volume using specific gravity. Furthermore, the volume of the target component may be obtained by adding the target component into a container such as a measuring cylinder in which a suitable solvent (water, alcohol, etc.) that does not dissolve or swell the target component but sufficiently wets the target component is placed.

(其他成分) 本實施方式的接著劑組成物亦可進而含有使選自由(甲基)丙烯酸、(甲基)丙烯酸酯及丙烯腈所組成的群組中的至少一種單體成分聚合而獲得的均聚物或共聚物。自應力緩和優異的觀點考慮,較佳的是本實施方式的接著劑組成物含有丙烯酸橡膠等,所述丙烯酸橡膠是使具有縮水甘油醚基的(甲基)丙烯酸縮水甘油酯聚合而獲得的共聚物。自提高接著劑組成物的凝聚力的觀點考慮,所述丙烯酸橡膠的重量平均分子量較佳為20萬以上。以接著劑組成物的接著劑成分總量為基準而言,丙烯酸橡膠的含量較佳為1質量%~60質量%,更佳為10質量%~50質量%,進而較佳為20質量%~40質量%。(Other components) The adhesive composition of the present embodiment may further contain a homopolymer or copolymer obtained by polymerizing at least one monomer component selected from the group consisting of (meth)acrylic acid, (meth)acrylate and acrylonitrile. From the viewpoint of excellent stress relief, it is preferred that the adhesive composition of the present embodiment contains an acrylic rubber, etc., wherein the acrylic rubber is a copolymer obtained by polymerizing (meth)acrylate having a glycidyl ether group. From the viewpoint of improving the cohesive force of the adhesive composition, the weight average molecular weight of the acrylic rubber is preferably 200,000 or more. Based on the total amount of the adhesive components in the adhesive composition, the content of the acrylic rubber is preferably 1% to 60% by mass, more preferably 10% to 50% by mass, and further preferably 20% to 40% by mass.

本實施方式的接著劑組成物亦可含有所述導電粒子的表面包覆有高分子樹脂等的包覆微粒子。在將此種包覆微粒子與所述導電粒子併用的情況下,即使在導電粒子的含量增加的情況下,亦容易抑制由於導電粒子彼此接觸所造成的短路,因此使鄰接的電路電極間的絕緣性提高。可並不使用導電粒子而單獨使用所述包覆微粒子,亦可將包覆微粒子與導電粒子併用。再者,在接著劑組成物包含包覆微粒子的情況下,本說明書中的「接著劑組成物的接著劑成分」是指接著劑組成物中的導電粒子及包覆微粒子以外的固體成分。The adhesive composition of this embodiment may also contain coated microparticles whose surfaces are coated with a polymer resin or the like. When such coated microparticles are used together with the conductive particles, even when the content of the conductive particles is increased, it is easy to suppress short circuits caused by contact between the conductive particles, thereby improving the insulation between adjacent circuit electrodes. The coated microparticles may be used alone instead of conductive particles, or the coated microparticles may be used together with the conductive particles. Furthermore, when the adhesive composition contains coated microparticles, the "adhesive component of the adhesive composition" in this specification refers to the solid components other than the conductive particles and coated microparticles in the adhesive composition.

本實施方式的接著劑組成物亦可含有橡膠微粒子、填充劑(二氧化矽粒子等)、軟化劑、促進劑、抗老化劑、著色劑、阻燃化劑、觸變劑等。而且,本實施方式的接著劑組成物亦可適宜含有增黏劑、調平劑、耐候性提高劑等添加劑。The adhesive composition of the present embodiment may also contain rubber particles, fillers (such as silicon dioxide particles), softeners, promoters, anti-aging agents, colorants, flame retardants, thiophene agents, etc. In addition, the adhesive composition of the present embodiment may also contain additives such as tackifiers, levelers, and weather resistance enhancers.

橡膠微粒子較佳為具有導電粒子的平均粒徑的2倍以下的平均粒徑、且在常溫下的儲存彈性模數是導電粒子及接著劑組成物在常溫下的儲存彈性模數的1/2以下的粒子。特別是在橡膠微粒子的材質為矽酮、丙烯酸系乳液(acrylic emulsion)、苯乙烯-丁二烯橡膠(Styrene-Butadiene Rubber,SBR)、丁腈橡膠(Nitril-Butadiene Rubber,NBR)或聚丁二烯橡膠的情況下,橡膠微粒子適宜的是單獨使用或將兩種以上混合使用。三維交聯的橡膠微粒子的耐溶劑性優異,容易分散於接著劑組成物中。The rubber particles preferably have an average particle size of less than 2 times the average particle size of the conductive particles, and a storage elastic modulus at room temperature of less than 1/2 of the storage elastic modulus of the conductive particles and the adhesive composition at room temperature. In particular, when the material of the rubber particles is silicone, acrylic emulsion, styrene-butadiene rubber (SBR), nitrile rubber (NBR) or polybutadiene rubber, the rubber particles are preferably used alone or in combination of two or more. The three-dimensionally cross-linked rubber particles have excellent solvent resistance and are easily dispersed in the adhesive composition.

填充劑可使電路電極間的電氣特性(連接可靠性等)提高。作為填充劑,例如可適宜使用具有導電粒子的平均粒徑的1/2以下的平均粒徑的粒子。在將並不具有導電性的粒子與填充劑併用的情況下,可使用並不具有導電性的粒子的平均粒徑以下的粒子作為填充劑。以接著劑組成物的接著劑成分總量為基準而言,填充劑的含量較佳為0.1質量%~60質量%。藉由使所述含量為60質量%以下,存在更充分地獲得連接可靠性的提高效果的傾向。藉由使所述含量為0.1質量%以上,存在充分獲得填充劑的添加效果的傾向。Fillers can improve the electrical properties (connection reliability, etc.) between circuit electrodes. As fillers, for example, particles having an average particle size of less than 1/2 of the average particle size of conductive particles can be appropriately used. When particles that do not have conductivity are used together with fillers, particles having an average particle size less than that of particles that do not have conductivity can be used as fillers. Based on the total amount of the adhesive components of the adhesive composition, the content of the filler is preferably 0.1% by mass to 60% by mass. By making the content less than 60% by mass, there is a tendency to more fully obtain the effect of improving connection reliability. By making the content greater than 0.1% by mass, there is a tendency to fully obtain the effect of adding the filler.

本實施方式的接著劑組成物在常溫下為液狀的情況下,可以糊狀而使用。接著劑組成物在常溫下為固體狀的情況下,除了進行加熱而使用以外,亦可使用溶劑而進行糊化。作為可使用的溶劑,若為對於接著劑組成物中的成分而言並無反應性、且顯示出充分的溶解性的溶劑,則並無特別限制。溶劑較佳為在常壓下的沸點為50℃~150℃的溶劑。沸點若為50℃以上,則在常溫下溶劑的揮發性差,因此即使是開放系統亦可使用。沸點若為150℃以下,則容易使溶劑揮發,因此可在接著後獲得良好的可靠性。When the adhesive composition of the present embodiment is in liquid form at room temperature, it can be used in a paste form. When the adhesive composition is in a solid form at room temperature, in addition to being heated for use, it can also be pasted using a solvent. As a solvent that can be used, there is no particular limitation as long as it is a solvent that is non-reactive with the components in the adhesive composition and shows sufficient solubility. The solvent is preferably a solvent having a boiling point of 50°C to 150°C at normal pressure. If the boiling point is above 50°C, the volatility of the solvent is poor at room temperature, so it can be used even in an open system. If the boiling point is below 150°C, the solvent is easily volatilized, so good reliability can be obtained after bonding.

本實施方式的接著劑組成物亦可為膜狀。可將視需要含有溶劑等的接著劑組成物塗佈於氟樹脂膜、聚對苯二甲酸乙二酯膜、剝離性基材(脫模紙等)上,然後將溶劑等除去,藉此獲得膜狀的接著劑組成物。而且,在不織布等基材中含浸所述溶液而載置於剝離性基材上之後,藉由將溶劑等除去而可獲得膜狀接著劑組成物。若以膜狀使用接著劑組成物,則操作性等優異。The adhesive composition of this embodiment may also be in the form of a film. The adhesive composition containing a solvent or the like as needed may be applied to a fluororesin film, a polyethylene terephthalate film, a release substrate (release paper, etc.), and then the solvent or the like is removed to obtain a film-like adhesive composition. Furthermore, after the solution is impregnated in a substrate such as a nonwoven fabric and placed on a release substrate, the film-like adhesive composition may be obtained by removing the solvent or the like. If the adhesive composition is used in the form of a film, the operability and the like are excellent.

本實施方式的接著劑組成物可藉由與加熱或光照射一同進行加壓而使其接著。藉由併用加熱及光照射,可進而以低溫短時間進行接著。光照射較佳的是照射150 nm~750 nm的波長區域的光。光源可使用低壓水銀燈、中壓水銀燈、高壓水銀燈(超高壓水銀燈等)、氙氣燈、金屬鹵素燈等。照射量可為0.1 J/cm2 ~10 J/cm2 。加熱溫度並無特別限制,較佳為50℃~170℃的溫度。壓力若為並不對被黏著體造成損傷的範圍,則並無特別限制,較佳為0.1 MPa~10 MPa。較佳為在0.5秒~3小時的範圍進行加熱及加壓。The adhesive composition of the present embodiment can be bonded by pressurizing together with heating or light irradiation. By using heating and light irradiation together, bonding can be performed at a low temperature and for a short time. It is preferred that light irradiation is light in the wavelength region of 150 nm to 750 nm. The light source may be a low-pressure mercury lamp, a medium-pressure mercury lamp, a high-pressure mercury lamp (ultra-high-pressure mercury lamp, etc.), a xenon lamp, a metal halogen lamp, etc. The irradiation amount may be 0.1 J/cm 2 to 10 J/cm 2. The heating temperature is not particularly limited, but is preferably a temperature of 50°C to 170°C. The pressure is not particularly limited as long as it does not cause damage to the adherend, but is preferably 0.1 MPa to 10 MPa. The heating and pressurization are preferably performed in the range of 0.5 seconds to 3 hours.

本實施方式的接著劑組成物可作為同一種被黏著體的接著劑而使用,亦可作為熱膨脹係數不同的不同種被黏著體的接著劑而使用。具體而言可作為各向異性導電接著劑、銀糊、銀膜等所代表的電路連接材料;晶片尺寸封裝(Chip Size Package,CSP)用彈性體、CSP用底部填充材料、晶片上引線(Lead on Chip,LOC)膠帶等所代表的半導體元件接著材料等而使用。The adhesive composition of the present embodiment can be used as an adhesive for the same kind of adherends, or as an adhesive for different kinds of adherends with different thermal expansion coefficients. Specifically, it can be used as circuit connection materials represented by anisotropic conductive adhesives, silver pastes, silver films, etc.; semiconductor element bonding materials represented by chip size package (CSP) elastomers, CSP bottom fill materials, lead on chip (LOC) tapes, etc.

<結構體及其製造方法> 本實施方式的結構體包含本實施方式的接著劑組成物或其硬化物。本實施方式的結構體例如為電路連接結構體等半導體裝置。作為本實施方式的結構體的一實施方式,電路連接結構體包含具有第一電路電極的第一電路構件、具有第二電路電極的第二電路構件、及配置在第一電路構件及第二電路構件之間的電路連接構件。第一電路構件例如包含第一基板、與配置在該第一基板上的第一電路電極。第二電路構件例如包含第二基板、與配置在該第二基板上的第二電路電極。第一電路電極及第二電路電極相對向且電性連接。電路連接構件包含本實施方式的接著劑組成物或其硬化物。本實施方式的結構體若包含本實施方式的接著劑組成物或其硬化物即可,亦可使用並不具有電路電極的構件(基板等)而代替所述電路連接結構體的電路構件。<Structure and its manufacturing method> The structure of the present embodiment includes the adhesive composition of the present embodiment or its hardened product. The structure of the present embodiment is, for example, a semiconductor device such as a circuit connection structure. As an embodiment of the structure of the present embodiment, the circuit connection structure includes a first circuit component having a first circuit electrode, a second circuit component having a second circuit electrode, and a circuit connection component arranged between the first circuit component and the second circuit component. The first circuit component includes, for example, a first substrate and a first circuit electrode arranged on the first substrate. The second circuit component includes, for example, a second substrate and a second circuit electrode arranged on the second substrate. The first circuit electrode and the second circuit electrode are opposite to each other and electrically connected. The circuit connection component includes the adhesive composition of the present embodiment or its hardened product. The structure of the present embodiment only needs to include the adhesive composition of the present embodiment or a cured product thereof, and a member (substrate, etc.) not having a circuit electrode may be used instead of the circuit member of the circuit connection structure.

本實施方式的結構體的製造方法包含使本實施方式的接著劑組成物硬化的步驟。作為本實施方式的結構體的製造方法的一實施方式,電路連接結構體的製造方法包含:配置步驟,在具有第一電路電極的第一電路構件與具有第二電路電極的第二電路構件之間配置本實施方式的接著劑組成物,加熱加壓步驟,對第一電路構件與第二電路構件進行加壓而使第一電路電極與第二電路電極電性連接,且對接著劑組成物進行加熱而使其硬化。在配置步驟中,可以第一電路電極與第二電路電極相對向的方式進行配置。在加熱加壓步驟中,可對第一電路構件與第二電路構件相對向的方向進行加壓。The manufacturing method of the structure of the present embodiment includes a step of hardening the adhesive composition of the present embodiment. As an embodiment of the manufacturing method of the structure of the present embodiment, the manufacturing method of the circuit connection structure includes: a configuration step of configuring the adhesive composition of the present embodiment between a first circuit component having a first circuit electrode and a second circuit component having a second circuit electrode, a heating and pressurizing step of pressurizing the first circuit component and the second circuit component to electrically connect the first circuit electrode and the second circuit electrode, and heating the adhesive composition to harden it. In the configuration step, the first circuit electrode and the second circuit electrode can be configured in a manner that they face each other. In the heating and pressurizing step, pressure may be applied in the direction opposite to the first circuit component and the second circuit component.

以下,使用圖式,關於電路連接結構體及其製造方法加以說明而作為本實施方式的一實施方式。圖1是表示結構體的一實施方式的示意剖面圖。圖1中所示的電路連接結構體100a包含相對向的電路構件(第一電路構件)20及電路構件(第二電路構件)30,在電路構件20與電路構件30之間配置有連接該些構件的電路連接構件10。電路連接構件10包含本實施方式的接著劑組成物的硬化物。Hereinafter, a circuit connection structure and a method for manufacturing the same will be described as an embodiment of the present embodiment using drawings. FIG. 1 is a schematic cross-sectional view showing an embodiment of the structure. The circuit connection structure 100a shown in FIG. 1 includes a circuit component (first circuit component) 20 and a circuit component (second circuit component) 30 facing each other, and a circuit connection component 10 for connecting these components is arranged between the circuit component 20 and the circuit component 30. The circuit connection component 10 includes a cured product of the adhesive composition of the present embodiment.

電路構件20包含基板(第一基板)21與配置在基板21的主表面21a上的電路電極(第一電路電極)22。在基板21的主表面21a上,亦可根據情況配置絕緣層(未圖示)。The circuit component 20 includes a substrate (first substrate) 21 and a circuit electrode (first circuit electrode) 22 disposed on a main surface 21a of the substrate 21. An insulating layer (not shown) may also be disposed on the main surface 21a of the substrate 21 as required.

電路構件30包含基板(第二基板)31與配置在基板31的主表面31a上的電路電極(第二電路電極)32。在基板31的主表面31a上,亦可根據情況而配置絕緣層(未圖示)。The circuit component 30 includes a substrate (second substrate) 31 and a circuit electrode (second circuit electrode) 32 disposed on a main surface 31a of the substrate 31. An insulating layer (not shown) may be disposed on the main surface 31a of the substrate 31 as required.

電路連接構件10含有絕緣性物質(除導電粒子以外的成分的硬化物)10a及導電粒子10b。導電粒子10b至少配置在相對向的電路電極22與電路電極32之間。在電路連接結構體100a中,電路電極22及電路電極32經由導電粒子10b而電性連接。The circuit connection member 10 includes an insulating material (a hardened material of components other than conductive particles) 10a and conductive particles 10b. The conductive particles 10b are disposed at least between the opposing circuit electrodes 22 and 32. In the circuit connection structure 100a, the circuit electrodes 22 and 32 are electrically connected via the conductive particles 10b.

電路構件20及電路構件30具有單個或多個電路電極(連接端子)。作為電路構件20及電路構件30,例如可使用包含需要電性連接的電極的構件。作為電路構件,可使用半導體晶片(IC晶片)、電阻器晶片、電容器晶片等晶片零件;印刷基板、半導體搭載用基板等基板等。作為電路構件20及電路構件30的組合,例如可使用半導體晶片及半導體搭載用基板。作為基板的材質,例如可列舉半導體、玻璃、陶瓷等無機物;聚醯亞胺、聚對苯二甲酸乙二酯、聚碳酸酯、(甲基)丙烯酸樹脂、環狀烯烴樹脂等有機物;玻璃與環氧等的複合物等。基板亦可為塑膠基板。The circuit components 20 and the circuit components 30 have a single or multiple circuit electrodes (connection terminals). As the circuit components 20 and the circuit components 30, for example, components including electrodes that need to be electrically connected can be used. As the circuit components, chip parts such as semiconductor chips (IC chips), resistor chips, and capacitor chips; substrates such as printed circuit boards and semiconductor mounting substrates can be used. As a combination of the circuit components 20 and the circuit components 30, for example, semiconductor chips and semiconductor mounting substrates can be used. As the material of the substrate, for example, inorganic substances such as semiconductors, glass, and ceramics; organic substances such as polyimide, polyethylene terephthalate, polycarbonate, (meth) acrylic resin, and cyclic olefin resin; composites of glass and epoxy, etc. can be listed. The substrate can also be a plastic substrate.

圖2是表示結構體的另一實施方式的示意剖面圖。圖2所示的電路連接結構體100b除電路連接構件10不含導電粒子10b以外,具有與電路連接結構體100a同樣的構成。在圖2所示的電路連接結構體100b中,電路電極22與電路電極32並不經由導電粒子而直接接觸,從而電性連接。FIG2 is a schematic cross-sectional view showing another embodiment of the structure. The circuit connection structure 100b shown in FIG2 has the same structure as the circuit connection structure 100a except that the circuit connection member 10 does not contain the conductive particles 10b. In the circuit connection structure 100b shown in FIG2, the circuit electrode 22 and the circuit electrode 32 are directly in contact without the conductive particles, thereby being electrically connected.

電路連接結構體100a及電路連接結構體100b例如可藉由以下的方法而製造。首先,在接著劑組成物為糊狀的情況下,塗佈接著劑組成物及進行乾燥,藉此在電路構件20上配置含有接著劑組成物的樹脂層。在接著劑組成物為膜狀的情況下,將膜狀接著劑組成物貼附於電路構件20上,藉此在電路構件20上配置含有接著劑組成物的樹脂層。繼而,以電路電極22與電路電極32對向配置的方式,在電路構件20上所配置的樹脂層上載置電路構件30。其次,對含有接著劑組成物的樹脂層進行加熱處理或光照射,藉此使接著劑組成物硬化而獲得硬化物(電路連接構件10)。藉由以上而獲得電路連接結構體100a及電路連接結構體100b。 [實施例]The circuit connection structure 100a and the circuit connection structure 100b can be manufactured, for example, by the following method. First, when the adhesive composition is in a paste state, the adhesive composition is applied and dried, thereby configuring a resin layer containing the adhesive composition on the circuit component 20. When the adhesive composition is in a film state, the film-like adhesive composition is attached to the circuit component 20, thereby configuring a resin layer containing the adhesive composition on the circuit component 20. Then, the circuit component 30 is placed on the resin layer configured on the circuit component 20 in a manner that the circuit electrode 22 and the circuit electrode 32 are configured opposite to each other. Next, the resin layer containing the adhesive composition is subjected to a heat treatment or light irradiation to cure the adhesive composition and obtain a cured product (circuit connection member 10). In this way, circuit connection structures 100a and 100b are obtained. [Embodiment]

以下,列舉實施例及比較例,對本揭示進行更具體的說明。但,本揭示並不限定於以下的實施例。The present disclosure is described in more detail below with reference to the following embodiments and comparative examples, but the present disclosure is not limited to the following embodiments.

[實施例1~實施例14及比較例1~比較例11] (導電粒子的製作) 在聚苯乙烯粒子的表面形成厚度為0.2 μm的鎳層。進而,在該鎳層的外側形成厚度為0.04 μm的金層。藉此而製作平均粒徑為4 μm的導電粒子。[Example 1 to Example 14 and Comparative Example 1 to Comparative Example 11] (Production of Conductive Particles) A nickel layer with a thickness of 0.2 μm was formed on the surface of polystyrene particles. Furthermore, a gold layer with a thickness of 0.04 μm was formed on the outer side of the nickel layer. In this way, conductive particles with an average particle size of 4 μm were produced.

(膜狀接著劑的製作) 將表1及表2中所示的成分以表1及表2中所示的質量比(固體成分)加以混合而獲得混合物。使所述導電粒子以1.5體積份的比例(基準:相對於接著劑組成物的接著劑成分的總體積100體積份的比例)分散於該混合物中,獲得用以形成膜狀接著劑的塗敷液。使用塗敷裝置將該塗敷液塗佈在厚50 μm的聚對苯二甲酸乙二酯(PET)膜上。在70℃下對塗膜進行10分鐘熱風乾燥而形成厚度為18 μm的實施例1~實施例14及比較例1~比較例11的膜狀接著劑。(Preparation of film-like adhesive) The components shown in Tables 1 and 2 are mixed at the mass ratios (solid content) shown in Tables 1 and 2 to obtain a mixture. The conductive particles are dispersed in the mixture at a ratio of 1.5 parts by volume (basic: ratio relative to 100 parts by volume of the total volume of the adhesive components of the adhesive composition) to obtain a coating liquid for forming a film-like adhesive. The coating liquid is applied on a polyethylene terephthalate (PET) film having a thickness of 50 μm using a coating device. The coating film is hot-air dried at 70°C for 10 minutes to form film-like adhesives of Examples 1 to 14 and Comparative Examples 1 to 11 having a thickness of 18 μm.

再者,表1及表2中所示的各成分的詳細情況如下所示。 苯氧基樹脂:以將PKHC(聯合碳化合物(Union Carbide)股份有限公司製造,商品名,重量平均分子量45000)40 g溶解於甲基乙基酮60 g而製備的固體成分40質量%的溶液的形態來使用。 丙烯酸橡膠:以準備作為橡膠成分的丙烯酸橡膠(丙烯酸丁酯40質量份-丙烯酸乙酯30質量份-丙烯腈30質量份-甲基丙烯酸縮水甘油酯3質量份的共聚物、重量平均分子量80萬)且將該丙烯酸橡膠溶解於甲苯/乙酸乙酯=50/50(質量比)的混合溶劑中而製備的固體成分15質量%的溶液的形態使用。 含硬化劑的環氧樹脂:使用以質量比34:49:17而含有微膠囊型潛伏性硬化劑(經微膠囊化的胺系硬化劑)、雙酚F型環氧樹脂與萘型環氧樹脂的液狀的含硬化劑的環氧樹脂(環氧當量:202)。The details of the components shown in Tables 1 and 2 are as follows. Phenoxy resin: 40 g of PKHC (trade name, manufactured by Union Carbide Co., Ltd., weight average molecular weight 45,000) was dissolved in 60 g of methyl ethyl ketone to prepare a solution having a solid content of 40% by mass. Acrylic rubber: Acrylic rubber (a copolymer of 40 parts by mass of butyl acrylate, 30 parts by mass of ethyl acrylate, 30 parts by mass of acrylonitrile, and 3 parts by mass of glycidyl methacrylate, weight average molecular weight 800,000) was prepared as a rubber component and the acrylic rubber was dissolved in a mixed solvent of toluene/ethyl acetate = 50/50 (mass ratio) to prepare a solution having a solid content of 15% by mass. Epoxy resin containing hardener: A liquid epoxy resin containing hardener (epoxy equivalent: 202) containing a microencapsulated latent hardener (microencapsulated amine hardener), a bisphenol F type epoxy resin, and a naphthalene type epoxy resin in a mass ratio of 34:49:17 was used.

<第1矽烷化合物> 矽烷化合物A1:使用3-縮水甘油氧基丙基甲基二甲氧基矽烷(商品名:KBM-402、信越化學工業股份有限公司製造)。 矽烷化合物A2:使用3-縮水甘油氧基丙基三甲氧基矽烷(商品名:KBM-403、信越化學工業股份有限公司製造)。 矽烷化合物A3:使用3-縮水甘油氧基丙基甲基二乙氧基矽烷(商品名:KBE-402、信越化學工業股份有限公司製造)。 矽烷化合物A4:使用3-縮水甘油氧基丙基三乙氧基矽烷(商品名:KBE-403、信越化學工業股份有限公司製造)。<First Silane Compound> Silane Compound A1: 3-Glycidyloxypropylmethyldimethoxysilane (trade name: KBM-402, manufactured by Shin-Etsu Chemical Co., Ltd.) was used. Silane Compound A2: 3-Glycidyloxypropyltrimethoxysilane (trade name: KBM-403, manufactured by Shin-Etsu Chemical Co., Ltd.) was used. Silane Compound A3: 3-Glycidyloxypropylmethyldiethoxysilane (trade name: KBE-402, manufactured by Shin-Etsu Chemical Co., Ltd.) was used. Silane Compound A4: 3-Glycidyloxypropyltriethoxysilane (trade name: KBE-403, manufactured by Shin-Etsu Chemical Co., Ltd.) was used.

<第2矽烷化合物> 矽烷化合物B1:使用甲基三甲氧基矽烷(商品名:KBM-13、信越化學工業股份有限公司製造)。 矽烷化合物B2:使用3-甲基丙烯醯氧基丙基三甲氧基矽烷(商品名:KBM-503、信越化學工業股份有限公司製造)。 矽烷化合物B3:使用四乙氧基矽烷(商品名:KBE-04、信越化學工業股份有限公司製造)。<Second Silane Compound> Silane Compound B1: Methyltrimethoxysilane (trade name: KBM-13, manufactured by Shin-Etsu Chemical Co., Ltd.) was used. Silane Compound B2: 3-Methacryloyloxypropyltrimethoxysilane (trade name: KBM-503, manufactured by Shin-Etsu Chemical Co., Ltd.) was used. Silane Compound B3: Tetraethoxysilane (trade name: KBE-04, manufactured by Shin-Etsu Chemical Co., Ltd.) was used.

(連接體的製作) 使用實施例1~實施例14及比較例1~比較例11的膜狀接著劑而將具有2200根線寬為75 μm、間距為150 μm(間隙為75 μm)及厚度為18 μm的銅電路的可撓性電路基板(FPC),與包含玻璃基板及形成在玻璃基板上的厚度為0.2 μm的氮化矽(SiNx )薄層的SiNx 基板(厚度為0.7 mm)連接。連接是使用熱壓接裝置(加熱方式:恆溫(constant heat)型,東麗工程(Toray Engineering)股份有限公司製造),在200℃、5 MPa下藉由15秒的加熱及加壓進行。藉此製作藉由膜狀接著劑的硬化物以1.5 mm的寬度將FPC與SiNx 基板連接而成的連接體。將壓接面積設為0.495 cm2 而計算加壓的壓力。(Production of Connectors) A flexible printed circuit board (FPC) having 2,200 copper circuits with a line width of 75 μm, a pitch of 150 μm (a gap of 75 μm), and a thickness of 18 μm was connected to a SiN x substrate (thickness 0.7 mm) including a glass substrate and a 0.2 μm thick silicon nitride (SiN x ) thin layer formed on the glass substrate using the film adhesive of Examples 1 to 14 and Comparative Examples 1 to 11. The connection was performed by heating and pressing at 200°C and 5 MPa for 15 seconds. In this way, a connection body is produced in which the FPC and the SiN x substrate are connected with a width of 1.5 mm by using a cured film adhesive. The pressure applied is calculated by setting the press-bonded area to 0.495 cm 2 .

(剝離評價) 使用光學顯微鏡觀察將所述連接體在85℃、85%RH的恆溫恆濕槽中放置250小時後(高溫高濕試驗後)的連接外觀。測定間隙部分在SiNx 基板與硬化物的界面產生剝離的面積(剝離面積),評價剝離的有無。將剝離面積佔間隙整體的比例超過30%的情況評價為「B」(存在剝離),將剝離面積的比例為30%以下的情況評價為「A」(無剝離)。將所述評價結果作為未處理膜的剝離評價結果表示於表1及表2中。(Peeling evaluation) Use an optical microscope to observe the appearance of the connection after placing the connection body in a constant temperature and humidity chamber at 85°C and 85% RH for 250 hours (after the high temperature and high humidity test). Measure the area of the gap part where peeling occurs at the interface between the SiNx substrate and the hardened material (peeling area) to evaluate the presence or absence of peeling. When the ratio of the peeling area to the total gap exceeds 30%, it is evaluated as "B" (peeling exists), and when the ratio of the peeling area is less than 30%, it is evaluated as "A" (no peeling). The evaluation results are shown in Tables 1 and 2 as the peeling evaluation results of the untreated film.

(保存穩定性(適用期特性)的評價) 在40℃的恆溫槽中對所述膜狀接著劑進行3天處理。使用該膜狀接著劑,藉由與所述同樣的方法製作連接體後,利用與所述同樣的方法進行高溫高濕試驗,而進行剝離評價。將所述評價結果作為40℃、3天處理膜的剝離評價結果表示於表1及表2中。(Evaluation of storage stability (shelf life characteristics)) The film adhesive was treated in a constant temperature bath at 40°C for 3 days. A joint body was prepared using the film adhesive in the same manner as described above, and then a high temperature and high humidity test was performed in the same manner as described above to evaluate the peeling performance. The evaluation results are shown in Tables 1 and 2 as the peeling evaluation results of the film treated at 40°C for 3 days.

[表1] [Table 1]

[表2] [Table 2]

根據表1及表2,可確認實施例的膜狀接著劑與比較例的膜狀接著劑相比而言,即使於使用在40℃的恆溫槽中處理3天後的膜狀接著劑而製作連接體並進行高溫高濕處理的情況下,亦可良好地保持在基板(無機物基板)表面上的密接力,保存穩定性優異。According to Tables 1 and 2, it can be confirmed that the film adhesive of the embodiment can maintain good adhesion on the surface of the substrate (inorganic substrate) and has excellent storage stability compared to the film adhesive of the comparative example, even when a connector is made using the film adhesive treated in a constant temperature bath at 40°C for 3 days and subjected to high temperature and high humidity treatment.

10‧‧‧電路連接構件10a‧‧‧絕緣性物質10b‧‧‧導電粒子20‧‧‧第一電路構件21‧‧‧第一基板21a、31a‧‧‧主表面22‧‧‧第一電路電極30‧‧‧第二電路構件31‧‧‧第二基板32‧‧‧第二電路電極100a、100b‧‧‧電路連接結構體10‧‧‧Circuit connection member 10a‧‧‧Insulating material 10b‧‧‧Conductive particles 20‧‧‧First circuit member 21‧‧‧First substrate 21a, 31a‧‧‧Main surface 22‧‧‧First circuit electrode 30‧‧‧Second circuit member 31‧‧‧Second substrate 32‧‧‧Second circuit electrode 100a, 100b‧‧‧Circuit connection structure

圖1是表示本揭示的結構體的一實施方式的示意剖面圖。 圖2是表示本揭示的結構體的另一實施方式的示意剖面圖。Fig. 1 is a schematic cross-sectional view showing one embodiment of a structure of the present disclosure. Fig. 2 is a schematic cross-sectional view showing another embodiment of a structure of the present disclosure.

10:電路連接構件 10: Circuit connection components

10a:絕緣性物質 10a: Insulating substances

10b:導電粒子 10b: Conductive particles

20:第一電路構件 20: First circuit component

21:第一基板 21: First substrate

21a、31a:主表面 21a, 31a: Main surface

22:第一電路電極 22: First circuit electrode

30:第二電路構件 30: Second circuit component

31:第二基板 31: Second substrate

32:第二電路電極 32: Second circuit electrode

100a:電路連接結構體 100a: Circuit connection structure

Claims (5)

一種電路連接用接著劑組成物,其含有:可陰離子聚合或陽離子聚合的環氧樹脂或氧雜環丁烷樹脂、具有與所述環氧樹脂或氧雜環丁烷樹脂反應的官能基的第1矽烷化合物、與所述第1矽烷化合物反應,且相當於所述第1矽烷化合物的化合物除外的第2矽烷化合物、苯氧樹脂、導電粒子、以及使選自由(甲基)丙烯酸、(甲基)丙烯酸酯及丙烯腈所組成的群組中的至少一種單體成分聚合而獲得的均聚物或共聚物,所述第1矽烷化合物及所述第2矽烷化合物的至少一者為下述通式(I)所表示的化合物,X-CsH2s-Si〔R1m〔OR23-m…(I)式中,X表示有機基,當所述第1矽烷化合物為所述通式(I)所表示的化合物時,所述有機基為與所述環氧樹脂或所述氧雜環丁烷樹脂反應的官能基,當所述第2矽烷化合物為所述通式(I)所表示的化合物時,所述有機基為不與所述環氧樹脂或所述氧雜環丁烷樹脂反應的官能基,R1及R2分別獨立地表示烷基,m表示0~2的整數,s表示0以上的整數;在存在多個R1的情況下,各 R1可彼此相同,亦可不同;在存在多個R2的情況下,各R2可彼此相同,亦可不同;R1、R2及CsH2s各自亦可分支。 A circuit connection adhesive composition comprising: an anionically or cationically polymerizable epoxy resin or cyclohexane resin, a first silane compound having a functional group reactive with the epoxy resin or cyclohexane resin, a second silane compound other than a compound reactive with the first silane compound and equivalent to the first silane compound, a phenoxy resin, conductive particles, and a homopolymer or copolymer obtained by polymerizing at least one monomer component selected from the group consisting of (meth)acrylic acid, (meth)acrylate, and acrylonitrile, wherein at least one of the first silane compound and the second silane compound is a compound represented by the following general formula (I): XCsH2s - Si〔 R1mOR23-m …(I) wherein X represents an organic group; when the first silane compound is a compound represented by the general formula (I), the organic group is a functional group that reacts with the epoxy resin or the cyclohexane resin; when the second silane compound is a compound represented by the general formula (I), the organic group is a functional group that does not react with the epoxy resin or the cyclohexane resin; R1 and R2 each independently represent an alkyl group; m represents an integer of 0 to 2; and s represents an integer greater than 0; when there are multiple R1s , each R1 may be the same as or different from each other; when there are multiple R2s , each R2 may be the same as or different from each other; and R1 , R2 and CsH2s may each be branched. 如申請專利範圍第1項所述的電路連接用接著劑組成物,其中所述第1矽烷化合物的所述官能基包含選自由環氧基、氧雜環丁烷基、胺基、酸酐基、異氰酸酯基及巰基所組成的群組中的至少一種。 As described in item 1 of the patent application scope, the circuit connection adhesive composition, wherein the functional group of the first silane compound includes at least one selected from the group consisting of epoxy group, cyclohexane group, amine group, acid anhydride group, isocyanate group and butyl group. 如申請專利範圍第1項或第2項所述的電路連接用接著劑組成物,其中所述第2矽烷化合物包含選自由烷基、苯基、烷氧基矽烷基、羥基、含氟基、(甲基)丙烯醯基及乙烯基所組成的群組中的至少一種。 As described in item 1 or 2 of the patent application scope, the second silane compound contains at least one selected from the group consisting of alkyl, phenyl, alkoxysilane, hydroxyl, fluorine-containing, (meth)acryl and vinyl. 一種結構體,其包含如申請專利範圍第1項至第3項中任一項所述的電路連接用接著劑組成物或其硬化物。 A structure comprising a circuit connection adhesive composition or a cured product thereof as described in any one of items 1 to 3 of the patent application scope. 一種結構體,其包括:具有第一電路電極的第一電路構件;具有第二電路電極的第二電路構件;以及配置於所述第一電路構件及所述第二電路構件之間的電路連接構件,所述第一電路電極及所述第二電路電極電性連接,所述電路連接構件包含如申請專利範圍第1項至第3項中任一項所述的電路連接用接著劑組成物或其硬化物。 A structure, comprising: a first circuit component having a first circuit electrode; a second circuit component having a second circuit electrode; and a circuit connection component disposed between the first circuit component and the second circuit component, wherein the first circuit electrode and the second circuit electrode are electrically connected, and the circuit connection component comprises a circuit connection adhesive composition or a hardened product thereof as described in any one of items 1 to 3 of the patent application scope.
TW107110867A 2017-03-29 2018-03-29 Adhesive composition and structure for circuit connection TWI874296B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-066012 2017-03-29
JP2017066012 2017-03-29

Publications (2)

Publication Number Publication Date
TW201840792A TW201840792A (en) 2018-11-16
TWI874296B true TWI874296B (en) 2025-03-01

Family

ID=63676215

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107110867A TWI874296B (en) 2017-03-29 2018-03-29 Adhesive composition and structure for circuit connection

Country Status (5)

Country Link
JP (1) JP7172990B2 (en)
KR (2) KR102837107B1 (en)
CN (1) CN110461982B (en)
TW (1) TWI874296B (en)
WO (1) WO2018181536A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112930261A (en) * 2018-11-09 2021-06-08 昭和电工材料株式会社 Temporary protective film for manufacturing semiconductor device, reel body, and method for manufacturing semiconductor device
PH12021552880A1 (en) 2019-06-19 2022-07-25 Resonac Corp Temporary protective film for semiconductor encapsulation molding, lead frame with temporary protective film, encapsulation molded body with temporary protective film, and method for manufacturing semiconductor device
CN120349739A (en) * 2020-06-11 2025-07-22 株式会社力森诺科 Adhesive film for circuit connection, circuit connection structure, and method for manufacturing same
JP7608800B2 (en) * 2020-11-30 2025-01-07 株式会社レゾナック Adhesive for circuit connection, connection structure, and method for producing the connection structure
JP7608801B2 (en) * 2020-11-30 2025-01-07 株式会社レゾナック Adhesive for circuit connection, connection structure, and method for producing the connection structure

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201211195A (en) * 2010-03-15 2012-03-16 Shinetsu Chemical Co Adhesive composition and semiconductor wafer-protective sheet

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2257660A1 (en) * 1973-10-05 1975-08-08 Hitachi Ltd Organic adhesive compsns. contg. silanes - capable of coupling with (in)organic matls., pref. for liq. crystal indicators
JPH0662738B2 (en) * 1988-01-26 1994-08-17 住友ベークライト株式会社 Conductive resin paste
JP2000080341A (en) * 1998-06-22 2000-03-21 Toshiba Chem Corp Anisotrropic conductive adhesive and on-board device
JP3404390B2 (en) * 2000-12-18 2003-05-06 コニシ株式会社 One-part moisture-curable epoxy resin composition
JP2002285103A (en) * 2001-03-26 2002-10-03 Sumitomo Bakelite Co Ltd Anisotropic electroconductive adhesive
TWI232467B (en) * 2001-11-30 2005-05-11 Mitsui Chemicals Inc Paste for circuit connection, anisotropic conductive paste and uses thereof
JP4896366B2 (en) * 2003-09-02 2012-03-14 ソニーケミカル&インフォメーションデバイス株式会社 Adhesive and method for producing the same
KR100601341B1 (en) * 2004-06-23 2006-07-14 엘에스전선 주식회사 Anisotropic conductive adhesive and adhesive film using the same
JP4604577B2 (en) * 2004-07-05 2011-01-05 日立化成工業株式会社 Adhesive composition, film-like adhesive and circuit connecting material using the same, circuit member connecting structure, and manufacturing method thereof
KR101260535B1 (en) * 2005-03-15 2013-05-06 닛뽄 가야쿠 가부시키가이샤 Epoxy resin, epoxy resin composition, and utilizing the same, prepreg and laminated plate
JP2007142117A (en) * 2005-11-17 2007-06-07 Kyocera Chemical Corp Die-bonding paste and semiconductor device using same
JP2007317563A (en) * 2006-05-26 2007-12-06 Sumitomo Electric Ind Ltd Adhesive for circuit connection
JP2007321130A (en) * 2006-06-05 2007-12-13 Shin Etsu Chem Co Ltd Adhesive composition and adhesive film
KR100902714B1 (en) * 2006-12-29 2009-06-15 제일모직주식회사 Semi thermosetting anisotropic conductive film composition
WO2009020005A1 (en) * 2007-08-08 2009-02-12 Hitachi Chemical Company, Ltd. Adhesive composition, film-like adhesive, and connection structure for circuit member
JP5297418B2 (en) * 2010-06-21 2013-09-25 デクセリアルズ株式会社 Anisotropic conductive material and method for manufacturing the same, and mounting body and method for manufacturing the same
JP5317002B2 (en) * 2011-10-26 2013-10-16 セメダイン株式会社 Laminated glass and display device using the laminated glass
JP5768676B2 (en) 2011-11-18 2015-08-26 デクセリアルズ株式会社 Anisotropic conductive film, manufacturing method thereof, connection structure and manufacturing method thereof
TWI493007B (en) * 2012-02-24 2015-07-21 Arakawa Chem Ind A polyimide-based adhesive composition, a hardened product, an adhesive sheet, a laminate, and a flexible printed substrate
KR101774616B1 (en) * 2013-12-04 2017-09-04 주식회사 엘지화학 Composition for forming adhesive film, adhesive film before light curing for further processing, adhesive film and electronic paper display
KR102325095B1 (en) * 2014-10-01 2021-11-11 나믹스 가부시끼가이샤 Resin composition
JP6558055B2 (en) * 2015-04-30 2019-08-14 味の素株式会社 Resin composition

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201211195A (en) * 2010-03-15 2012-03-16 Shinetsu Chemical Co Adhesive composition and semiconductor wafer-protective sheet

Also Published As

Publication number Publication date
CN110461982B (en) 2022-12-27
KR20240005192A (en) 2024-01-11
KR20190133022A (en) 2019-11-29
KR102837107B1 (en) 2025-07-22
WO2018181536A1 (en) 2018-10-04
TW201840792A (en) 2018-11-16
JPWO2018181536A1 (en) 2020-02-06
CN110461982A (en) 2019-11-15
JP7172990B2 (en) 2022-11-16

Similar Documents

Publication Publication Date Title
TWI874296B (en) Adhesive composition and structure for circuit connection
JP2011202177A (en) Adhesive for semiconductor bonding, adhesive film for semiconductor bonding, method for mounting semiconductor chip, and semiconductor device
TWI836720B (en) Adhesive compositions and structures for circuit connection
WO2013157378A1 (en) Circuit connection material, and manufacturing method for assembly using same
TWI718199B (en) Adhesive composition and structure
JP2021165397A (en) Adhesive composition and structure
TWI781158B (en) Adhesive composition and structure
JP6181825B2 (en) Anisotropic conductive film and method of manufacturing mounting body using the same
JP2018090705A (en) Anisotropic conductive film, laminated film containing the same, and production method thereof
CN121358818A (en) Thermally conductive die bonding film
CN116635956A (en) Adhesive film for circuit connection, connection structure, and method for manufacturing connection structure
TW201503169A (en) Anisotropic conductive film