TWI868733B - A detection system for a dram memory module - Google Patents
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Description
本發明係關於一種AMD系統之動態隨機存取記憶體模組的檢測系統的技術領域,尤其是指用於驗證動態隨機存取記憶體模組所包含電子抹除式可複寫唯讀記憶體中之信息寫讀功能驗證的檢測系統。 The present invention relates to the technical field of a detection system for a dynamic random access memory module of an AMD system, and in particular to a detection system for verifying the information write and read functions of an electronically erasable rewritable read-only memory contained in the dynamic random access memory module.
一般來說,通常伺服器或電腦組裝廠商於生產時僅會對記憶體進行讀寫的壓力測試,即測試記憶體的穩定度,以及同時測試記憶體的儲存與檢索資料的能力,然而對於記憶體上燒錄在電子抹除式可複寫唯讀記憶體(Electrically-Erasable Programmable Read-Only Memory;EEPROM)內的串行存在檢測(serial presence detect;SPD)信息卻沒有進行檢測,但串行存在檢測信息上通常記載了記憶體模組一些重要的相關資訊,如記憶體顆粒的種類、序列號、容量、速度、所需電壓、以及製造廠商等等,若可以檢測串行存在檢測信息而得到其中的相關資訊,則在使用記憶體時可將所使用的記憶體模組的存取時序設定在最佳狀態,就更可以確保系統能 正常穩定的運作。 Generally speaking, server or computer assemblers only perform read and write stress tests on memory during production, that is, testing the stability of the memory and its ability to store and retrieve data. However, the serial presence test (SPD) recorded in the electronically erasable programmable read-only memory (EEPROM) on the memory is also a test method. Detect; SPD) information is not detected, but the serial presence detection information usually records some important information about the memory module, such as the type of memory particles, serial number, capacity, speed, required voltage, and manufacturer, etc. If the serial presence detection information can be detected and the relevant information can be obtained, the access timing of the memory module used can be set to the best state when using the memory, which can ensure that the system can operate normally and stably.
如申請號CN201010186093.3,是為了避免因為多個刀鋒式系統共享同一個內部整合電路(Inter-Integrated Circuit;I2C)匯流排而發生通信地址重複衝突等問題,而採用將電子裝置內電子抹除式可複寫唯讀記憶體自動分配不同的I2C通信地址的方法來改善這一情況。 For example, application number CN201010186093.3 is designed to avoid communication address duplication conflicts caused by multiple blade systems sharing the same Inter-Integrated Circuit (I 2 C) bus, and adopts a method of automatically allocating different I 2 C communication addresses to the electronically erasable rewritable read-only memory in the electronic device to improve this situation.
然而在配合AMD系統時,串行存在檢測信息卻沒有被進行檢測,當使用者使用AMD系統時,在初期雖然會覺得其性價比相較理想,但長期使用後會發現其穩定性不強、效能下降很快...等諸多缺點。 However, when used with AMD systems, the serial presence detection information is not detected. When users use AMD systems, although they may find that the price-performance ratio is ideal in the early stage, after long-term use, they will find that it is not stable, the performance drops quickly, and many other shortcomings.
因此,為解決AMD系統部份使用上不良等問題,本發明主要目的在於提供一種AMD系統之動態隨機存取記憶體(Dynamic random-access memory;DRAM)模組的檢測系統,以必要發展理想的技術方式,來解決上述問題。 Therefore, in order to solve the problem of poor use of some AMD systems, the main purpose of this invention is to provide a detection system for the dynamic random-access memory (DRAM) module of the AMD system, so as to develop an ideal technical method to solve the above problems.
有鑒於在先前技術中不會檢測電子抹除式可複寫唯讀記憶體中的信息寫讀功能,緣此,本發明的主要目的在於提供一種AMD系統之動態隨機存取記憶體模組的檢測系統。 In view of the fact that the prior art does not detect the information writing and reading functions in the electronically erasable rewritable read-only memory, the main purpose of the present invention is to provide a detection system for the dynamic random access memory module of the AMD system.
本發明為解決先前技術之問題,所採用的必要技術手段是提供一種AMD系統之動態隨機存取記憶體模組的檢測系統,並且可以透過兩種方式來進行驗 證。 In order to solve the problems of the previous technology, the necessary technical means adopted by this invention is to provide a detection system for the dynamic random access memory module of the AMD system, and it can be verified in two ways.
本發明提供一種AMD系統之動態隨機存取記憶體模組的檢測系統,用於驗證動態隨機存取記憶體模組所包含電子抹除式可複寫唯讀記憶體中之信息寫讀功能,檢測系統包含至少一個記憶體模組插槽、以及處理單元。 The present invention provides a detection system for a dynamic random access memory module of an AMD system, which is used to verify the information writing and reading functions of the electronically erasable rewritable read-only memory contained in the dynamic random access memory module. The detection system includes at least one memory module slot and a processing unit.
記憶體模組插槽用以插入動態隨機存取記憶體模組,而動態隨機存取記憶體模組上具有電子抹除式可複寫唯讀記憶體。 The memory module slot is used to insert the dynamic random access memory module, and the dynamic random access memory module has an electronically erasable rewritable read-only memory.
處理單元包含I2C操作寄存器,I2C操作寄存器可以通過I2C匯流排電性耦接記憶體模組插槽。 The processing unit includes an I 2 C operation register, and the I 2 C operation register can be electrically coupled to the memory module slot via an I 2 C bus.
其中,處理單元中的I2C操作寄存器可以通過I2C匯流排訪問動態隨機存取記憶體模組,並且於電子抹除式可複寫唯讀記憶體中可以進行寫入與讀取測試資料。 The I 2 C operation register in the processing unit can access the dynamic random access memory module through the I 2 C bus, and can write and read test data in the electronically erasable rewritable read-only memory.
如以上所述的檢測系統中,所述信息包含了串行存在檢測信息和溫度感測(Temperature Sensor on DIMMs;TSOD)信息。其中,記憶體控制器可以藉由讀取動態隨機存取記憶體模組中的I2C從屬位址,來通過I2C匯流排訪問動態隨機存取記憶體模組,藉以訪問並讀出所述串行存在檢測信息和溫度感測信息。 In the detection system described above, the information includes serial presence detection information and temperature sensor on DIMMs (TSOD) information. The memory controller can access the DRAM module through the I 2 C bus by reading the I 2 C slave address in the DRAM module, thereby accessing and reading the serial presence detection information and temperature sensor information.
如以上所述的檢測系統中,記憶體模組插槽,適合用在結構複雜,元件內容可以重複使用的地方,即在本發明的記憶體模組插槽中可以預留空間,當I2C操作寄存器可以通過I2C匯流排訪問動態隨機存取記憶 體模組時,可以將訪問內容儲存至動態隨機存取記憶體模組上的電子抹除式可複寫唯讀記憶體。 In the detection system described above, the memory module slot is suitable for use in places with complex structures and where component contents can be reused, that is, space can be reserved in the memory module slot of the present invention, and when the I2C operation register can access the dynamic random access memory module through the I2C bus, the access content can be stored in the electronically erasable rewritable read-only memory on the dynamic random access memory module.
接續,如以上所述的檢測系統中,處理單元為AMD中央處理器(Central Processing Unit;CPU),其優勢有高性能運算能力以及可以提升處理器效率,並且因為AMD中央處理器的良率提高,因此生產成本可以降低許多。 Next, in the detection system described above, the processing unit is an AMD central processing unit (CPU), which has the advantages of high-performance computing capabilities and can improve processor efficiency. In addition, because the yield of AMD central processors is improved, the production cost can be greatly reduced.
另外,如以上所述的檢測系統運作時,會透過作業系統來控制AMD中央處理器。 In addition, when the detection system described above is in operation, the AMD central processor will be controlled through the operating system.
在如以上所述的檢測系統中,更包含PCA9546A芯片,PCA9546A芯片具有複數個映射地址,複數個映射地址中又再包含至少一個屬於動態隨機存取記憶體模組的映射地址。當處理單元中的I2C操作寄存器通過PCA9546A芯片訪問屬於動態隨機存取記憶體模組的映射地址,則藉由I2C匯流排訪問全部的動態隨機存取記憶體模組後,並通過全部的動態隨機存取記憶體模組中特定的動態隨機存取記憶體模組所屬的訪問地址,可以訪問特定的動態隨機存取記憶體模組。 In the detection system as described above, a PCA9546A chip is further included. The PCA9546A chip has a plurality of mapping addresses, and the plurality of mapping addresses further include at least one mapping address belonging to a dynamic random access memory module. When the I 2 C operation register in the processing unit accesses the mapping address belonging to the dynamic random access memory module through the PCA9546A chip, all dynamic random access memory modules are accessed through the I 2 C bus, and then the specific dynamic random access memory module can be accessed through the access address to which the specific dynamic random access memory module belongs among all the dynamic random access memory modules.
又如以上所述的檢測系統中,測試資料可以是樣本資料及串行存在檢測信息兩者之一,當檢測系統中尚未具有原始的樣本資料時除了寫入樣本資料於電子抹除式可複寫唯讀記憶體之後再讀出之外,也可改用先寫入串行存在檢測信息,同樣通過I2C從屬位址到動態隨機存取記憶體模組的電子抹除式可複寫唯讀記憶體中,之後可再利用I2C匯流排來讀取動態隨機存取記憶體 模組的電子抹除式可複寫唯讀記憶體中先前寫入的串行存在檢測信息。 As in the detection system described above, the test data can be one of the sample data and the serial presence detection information. When the detection system does not yet have the original sample data, in addition to writing the sample data into the EEPROM and then reading it out, the serial presence detection information can also be written first and then transmitted to the EEPROM of the DRAM module through the I 2 C slave address. Afterwards, the I 2 C bus can be used to read the serial presence detection information previously written in the EEPROM of the DRAM module.
另外,由於電子抹除式可複寫唯讀記憶體的寫讀次數有所限制,所以檢測系統中的測試資料是以少量寫讀的方式來進行驗證,如此可以減少每次需要進行驗證的時間。 In addition, since the number of write and read operations of the electronically erasable rewritable read-only memory is limited, the test data in the detection system is verified by writing and reading a small amount, which can reduce the time required for each verification.
本發明也可以是一種AMD處理器系統之動態隨機存取記憶體模組的檢測系統,用於驗證動態隨機存取記憶體模組所包含的電子抹除式可複寫唯讀記憶體中之信息寫讀功能,檢測系統包含至少一個記憶體模組插槽、以及基板管理控制器(Board Management Controller;BMC)。 The present invention can also be a detection system for a dynamic random access memory module of an AMD processor system, used to verify the information writing and reading functions of the electronically erasable rewritable read-only memory contained in the dynamic random access memory module. The detection system includes at least one memory module slot and a baseboard management controller (Board Management Controller; BMC).
記憶體模組插槽可用以插入動態隨機存取記憶體模組,而動態隨機存取記憶體模組上具有電子抹除式可複寫唯讀記憶體。 The memory module slot can be used to insert a dynamic random access memory module, and the dynamic random access memory module has an electronically erasable rewritable read-only memory.
基板管理控制器可以通過I2C匯流排電性耦接記憶體模組插槽。 The baseboard management controller can be electrically coupled to the memory module socket via an I 2 C bus.
其中,基板管理控制器通過I2C匯流排訪問動態隨機存取記憶體模組,並寫入與讀取測試資料於電子抹除式可複寫唯讀記憶體。 The baseboard management controller accesses the dynamic random access memory module through the I 2 C bus and writes and reads test data in the electronically erasable rewritable read-only memory.
如以上所述的檢測系統中,更包含一個PCA9546A芯片,PCA9546A芯片具有複數個映射地址,複數個映射地址包含至少一個屬於動態隨機存取記憶體模組的映射地址。當基板管理控制器通過PCA9546A芯片訪問屬於動態隨機存取記憶體模組的映射地址,則藉由 I2C匯流排訪問全部的動態隨機存取記憶體模組後,並通過全部的動態隨機存取記憶體模組中特定的動態隨機存取記憶體模組所屬的訪問地址,可以訪問特定的動態隨機存取記憶體模組。 The detection system as described above further includes a PCA9546A chip, the PCA9546A chip has a plurality of mapping addresses, and the plurality of mapping addresses include at least one mapping address belonging to a dynamic random access memory module. When the baseboard management controller accesses the mapping address belonging to the dynamic random access memory module through the PCA9546A chip, it accesses all the dynamic random access memory modules through the I 2 C bus, and then accesses the specific dynamic random access memory module through the access address of the specific dynamic random access memory module in all the dynamic random access memory modules.
因此,利用本發明提供一種AMD系統之動態隨機存取記憶體模組的檢測系統,可以透過具有中央處理器的處理單元或是基板管理控制器,通過I2C匯流排來訪問動態隨機存取記憶體模組的電子抹除式可複寫唯讀記憶體,另外可進行寫入與讀取測試資料於電子抹除式可複寫唯讀記憶體中,其中當測試資料不具備樣本資料時,也可採用先寫入後讀取串行存在檢測信息方式來進行驗證。 Therefore, the present invention provides a detection system for a dynamic random access memory module of an AMD system, which can access the electronically erasable rewritable read-only memory of the dynamic random access memory module through an I 2 C bus through a processing unit with a central processor or a baseboard management controller, and can also write and read test data in the electronically erasable rewritable read-only memory. When the test data does not have sample data, a serial presence detection information method of first writing and then reading can be used for verification.
本發明所採用的具體實施例,將藉由以下之實施例及圖式作進一步之說明。 The specific embodiments adopted by the present invention will be further described through the following embodiments and drawings.
1:檢測系統 1: Detection system
2:記憶體模組插槽 2: Memory module slot
3:作業系統 3: Operating system
10:動態隨機存取記憶體模組 10: Dynamic random access memory module
20:處理單元 20: Processing unit
201:AMD中央處理器 201: AMD CPU
202:基板管理控制器 202: Baseboard management controller
22:I2C操作寄存器 22:I 2 C Operation Register
24:I2C匯流排 24:I 2 C bus
30:PCA9546A芯片 30: PCA9546A chip
40:電子抹除式可複寫唯讀記憶體 40: Electronically erasable rewritable read-only memory
第一圖係顯本發明處理單元為中央處理器時檢測系統的功能關聯圖。 The first figure is a functional relationship diagram of the detection system when the processing unit of the present invention is a central processing unit.
第二圖係顯本發明檢測系統以處理單元檢測樣本資料的方法流程圖。 The second figure is a flow chart showing the method of the detection system of the present invention to process unit detection sample data.
第三圖係顯本發明檢測系統以處理單元檢測串行存在檢測信息的方法流程圖。 The third figure is a flow chart showing the method of the detection system of the present invention to detect serial existence detection information by processing unit detection.
第四圖係顯本發明檢測系統又一實施例的功能關聯圖。 The fourth figure is a functional relationship diagram showing another embodiment of the detection system of the present invention.
第五圖係顯本發明以基板管理控制器檢測樣本資料的方 法流程圖。 The fifth figure is a flow chart showing the method of detecting sample data with a baseboard management controller according to the present invention.
第六圖係顯本發明以基板管理控制器時檢測樣本資料的方法示意圖 The sixth figure is a schematic diagram showing the method of detecting sample data when using a baseboard management controller according to the present invention.
本發明之目的在提供一種AMD系統之動態隨機存取記憶體模組的檢測系統,用於驗證動態隨機存取記憶體模組所包含電子抹除式可複寫唯讀記憶體中之信息寫讀功能,並包含第一實施例以及第二實施例。根據JEDEC固態技術協會的規範電子抹除式可複寫唯讀記憶體包含512字節,分布在兩個儲存頁面中,每個儲存頁面又具有256個字節,每個儲存頁面有2個象限,每個象限有128個字節,因此電子抹除式可複寫唯讀記憶體一共包含512字節。 The purpose of the present invention is to provide a detection system for a dynamic random access memory module of an AMD system, which is used to verify the information writing and reading functions of the electronically erasable rewritable read-only memory contained in the dynamic random access memory module, and includes a first embodiment and a second embodiment. According to the specification of the JEDEC Solid State Technology Association, the electronically erasable rewritable read-only memory contains 512 bytes, which are distributed in two storage pages, each storage page has 256 bytes, each storage page has 2 quadrants, and each quadrant has 128 bytes, so the electronically erasable rewritable read-only memory contains a total of 512 bytes.
請參閱第一圖,其係顯本發明處理單元20為中央處理器時檢測系統1的功能關聯圖。在第一實施例中可見,檢測系統1包含十六個記憶體模組插槽2、以及為AMD中央處理器201的處理單元20。 Please refer to the first figure, which is a functional association diagram of the detection system 1 when the processing unit 20 of the present invention is a central processor. In the first embodiment, it can be seen that the detection system 1 includes sixteen memory module slots 2 and a processing unit 20 which is an AMD central processor 201.
記憶體模組插槽2用以插入動態隨機存取記憶體模組10,所以十六個記憶體模組插槽2可以插上十六個動態隨機存取記憶體模組10,而每一個動態隨機存取記憶體模組10上具有一個電子抹除式可複寫唯讀記憶體40,電子抹除式可複寫唯讀記憶體40可以寫入串行存在檢測信息,所以電子抹除式可複寫唯讀記憶體40即是要檢測信息寫讀功能的地方。 The memory module slot 2 is used to insert the dynamic random access memory module 10, so the sixteen memory module slots 2 can be inserted with sixteen dynamic random access memory modules 10, and each dynamic random access memory module 10 has an electronically erasable rewritable read-only memory 40, and the electronically erasable rewritable read-only memory 40 can write serial presence detection information, so the electronically erasable rewritable read-only memory 40 is the place where the information writing and reading function is to be detected.
處理單元20包含I2C操作寄存器22,I2C操作寄存器22可以通過I2C匯流排24電性耦接每一個記憶體模組插槽2,圖中可見左右各有一個I2C匯流排24,I2C操作寄存器22通過這二個I2C匯流排24分別電性耦接左右共十六個記憶體模組插槽2。 The processing unit 20 includes an I 2 C operation register 22 . The I 2 C operation register 22 can be electrically coupled to each memory module slot 2 via an I 2 C bus 24 . As shown in the figure , there is an I 2 C bus 24 on each side. The I 2 C operation register 22 is electrically coupled to a total of sixteen memory module slots 2 on the left and right sides via the two I 2 C buses 24 .
其中,處理單元20中的I2C操作寄存器22可以通過I2C匯流排24訪問插在記憶體模組插槽2上的動態隨機存取記憶體模組10,並且可以於動態隨機存取記憶體模組10上的電子抹除式可複寫唯讀記憶體40中進行寫入與讀取測試資料。 The I 2 C operation register 22 in the processing unit 20 can access the DRAM module 10 inserted in the memory module slot 2 through the I 2 C bus 24 and can write and read test data in the EEPROM 40 on the DRAM module 10 .
如以上所述的檢測系統1中,所述信息包含了串行存在檢測信息和溫度感測信息。其中,另有記憶體控制器(圖中未示)可以藉由讀取動態隨機存取記憶體模組10所對應的I2C從屬位址,來通過I2C匯流排24訪問動態隨機存取記憶體模組10,藉以訪問並讀出所述串行存在檢測信息和溫度感測信息。 In the detection system 1 described above, the information includes serial presence detection information and temperature sensing information. A memory controller (not shown) can access the dynamic random access memory module 10 through the I 2 C bus 24 by reading the I 2 C slave address corresponding to the dynamic random access memory module 10, so as to access and read the serial presence detection information and temperature sensing information.
又如以上所述的檢測系統1中記憶體模組插槽2適合用在結構複雜、元件內容可以重複使用的電腦裝置中,藉由本發明所述的記憶體模組插槽2可以預留更多可擴增的空間。當I2C操作寄存器22通過I2C匯流排24訪問動態隨機存取記憶體模組10時,可以將樣本資料或串行存在檢測信息等測試資料寫入儲存至動態隨機存取記憶體模組10上的電子抹除式可複寫唯讀記憶體40中,作為後續可訪問的內容。 As mentioned above, the memory module slot 2 in the detection system 1 is suitable for use in a computer device with a complex structure and reusable components. The memory module slot 2 of the present invention can reserve more expandable space. When the I2C operation register 22 accesses the dynamic random access memory module 10 through the I2C bus 24, the sample data or the serial storage detection information and other test data can be written and stored in the electronically erasable rewritable read-only memory 40 on the dynamic random access memory module 10 as the content that can be accessed later.
補充說明的是,如以上所述的檢測系統1 運作時,會先透過作業系統3來控制處理單元20開始進行運作,而檢測系統1中的處理單元20為AMD中央處理器201,其優勢有高性能運算能力以及可以提升處理器效率,並且因為AMD中央處理器201的良率提高,因此於生產組建伺服器或筆電時可使成本降低許多。前述即檢測系統1於起始時,會透過作業系統3來控制中央處理器開始進行運作。 It is to be noted that when the detection system 1 described above is in operation, the operating system 3 will be used to control the processing unit 20 to start operation. The processing unit 20 in the detection system 1 is an AMD central processor 201, which has the advantages of high-performance computing capabilities and can improve processor efficiency. In addition, because the yield of the AMD central processor 201 is improved, the cost can be greatly reduced when producing and assembling servers or laptops. The above-mentioned detection system 1 will control the central processor through the operating system 3 to start operation at the beginning.
另外,在如以上所述的檢測系統1中更包含一個PCA9546A芯片30,PCA9546A芯片30具有複數個映射地址,複數個映射地址中包含至少一個屬於動態隨機存取記憶體模組10的映射地址。當處理單元20中的I2C操作寄存器22通過PCA9546A芯片30訪問屬於動態隨機存取記憶體模組10的映射地址,並藉由I2C匯流排24訪問全部的動態隨機存取記憶體模組10後,再通過全部的動態隨機存取記憶體模組10中特定的動態隨機存取記憶體模組10所屬的訪問地址分別來訪問特定的動態隨機存取記憶體模組10。意即PCA9546A芯片30具有至少一個屬於動態隨機存取記憶體模組10的映射地址,當I2C操作寄存器22通過PCA9546A芯片30後,藉由I2C匯流排24訪問所有的動態隨機存取記憶體模組10,可通過動態隨機存取記憶體模組10中特定的動態隨機存取記憶體模組10所屬的訪問地址,據以訪問特定的動態隨機存取記憶體模組10。 In addition, the detection system 1 as described above further includes a PCA9546A chip 30, which has a plurality of mapping addresses, including at least one mapping address belonging to the dynamic random access memory module 10. When the I2C operation register 22 in the processing unit 20 accesses the mapping address belonging to the dynamic random access memory module 10 through the PCA9546A chip 30 and accesses all the dynamic random access memory modules 10 through the I2C bus 24, the specific dynamic random access memory module 10 is accessed through the access address belonging to the specific dynamic random access memory module 10 in all the dynamic random access memory modules 10. That is, the PCA9546A chip 30 has at least one mapping address belonging to the DRAM module 10. When the I2C operation register 22 passes through the PCA9546A chip 30, all DRAM modules 10 are accessed through the I2C bus 24. The specific DRAM module 10 can be accessed through the access address of the specific DRAM module 10 in the DRAM module 10.
又如以上所述的檢測系統1中,測試資料可以是樣本資料或串行存在檢測信息,當檢測系統1中尚 未具有原始的樣本資料時,除了寫入樣本資料於電子抹除式可複寫唯讀記憶體40之後再讀出之外,也可改用先寫入串行存在檢測信息。流程上同樣是通過I2C從屬位址訪問到動態隨機存取記憶體模組10的電子抹除式可複寫唯讀記憶體40中,之後可再利用I2C匯流排24來讀取動態隨機存取記憶體模組10的電子抹除式可複寫唯讀記憶體記憶中40中先前寫入的串行存在檢測信息來檢測寫讀功能。 As in the detection system 1 described above, the test data can be sample data or serial presence detection information. When the detection system 1 does not have the original sample data, in addition to writing the sample data into the EEPROM 40 and then reading it out, the serial presence detection information can also be written first. The process is the same, accessing the EEPROM 40 of the DRAM module 10 through the I 2 C slave address, and then using the I 2 C bus 24 to read the previously written serial presence detection information in the EEPROM 40 of the DRAM module 10 to detect the write-read function.
另外,由於電子抹除式可複寫唯讀記憶體40的寫讀次數有所限制,所以檢測系統1中的測試資料是以少量寫讀的方式來進行驗證,如此可以減少每次進行驗證時,所需的時間與能量。例如於電子抹除式可複寫唯讀記憶體每個象限128個字節中僅寫入3個字節的樣本資料做為寫入與讀取的測試,可以有效節省測試時間以及符合電子抹除式可複寫唯讀記憶體的硬體限制。 In addition, since the number of write and read times of the EEPROM 40 is limited, the test data in the detection system 1 is verified by writing and reading a small amount, which can reduce the time and energy required for each verification. For example, only 3 bytes of sample data are written in each quadrant of the EEPROM as a write and read test, which can effectively save test time and meet the hardware limitations of the EEPROM.
請參閱第二圖,其係本發明檢測系統1以處理單元20檢測樣本資料的方法流程圖,以及第三圖,其係本發明檢測系統1以處理單元20檢測串行存在檢測信息的方法流程圖。於前述第一實施例中,可進一步採用horsea機型的檢測來說明檢測方式,檢測的方法可分為原本有樣本資料的狀態以及原本沒有樣本資料進而讀寫樣本資料或串行存在檢測信息的狀態。 Please refer to the second figure, which is a flow chart of the method of the detection system 1 of the present invention detecting sample data with the processing unit 20, and the third figure, which is a flow chart of the method of the detection system 1 of the present invention detecting serial existence detection information with the processing unit 20. In the aforementioned first embodiment, the detection method can be further described by using the detection of the horsea model. The detection method can be divided into a state where there is sample data originally and a state where there is no sample data originally and then reads and writes sample data or serial existence detection information.
於第二圖為原本有原始樣本資料的狀態的方法包含下列步驟: The method shown in the second figure, which is the state with original sample data, includes the following steps:
步驟S01:檢測系統1透過作業系統3來控 制AMD中央處理器201開始進行運作。 Step S01: The detection system 1 controls the AMD central processor 201 through the operating system 3 to start operation.
步驟S02:AMD中央處理器201中的I2C操作寄存器22會藉由I2C匯流排24通過PCA9546A芯片30來電訊耦接記憶體模組插槽2,並根據PCA9546A芯片30上屬於動態隨機存取記憶體模組10的映射地址,來訪問特定動態隨機存取記憶體模組10所對應的I2C從屬位址,藉以訪問特定的動態隨機存取記憶體模組10。 Step S02: The I 2 C operation register 22 in the AMD CPU 201 is coupled to the memory module slot 2 via the I 2 C bus 24 through the PCA9546A chip 30, and accesses the I 2 C slave address corresponding to the specific dynamic random access memory module 10 according to the mapping address of the dynamic random access memory module 10 on the PCA9546A chip 30, so as to access the specific dynamic random access memory module 10.
步驟S03:於動態隨機存取記憶體模組10的電子抹除式可複寫唯讀記憶體40中,讀取電子抹除式可複寫唯讀記憶體40中的原始樣本資料作為測試資料。 Step S03: In the electronically erasable rewritable read-only memory 40 of the dynamic random access memory module 10, read the original sample data in the electronically erasable rewritable read-only memory 40 as test data.
於第三圖檢測樣本資料或是串行存在檢測信息的方法包含以下步驟: The method for detecting sample data or serial existence detection information in the third figure includes the following steps:
步驟S11:檢測系統1透過作業系統3來控制AMD中央處理器201開始進行運作。 Step S11: The detection system 1 controls the AMD central processor 201 through the operating system 3 to start operation.
步驟S12:AMD中央處理器201中的I2C操作寄存器22會藉由I2C匯流排24通過PCA9546A芯片30來電訊耦接記憶體模組插槽2,並根據PCA9546A芯片30上屬於動態隨機存取記憶體模組10的映射地址,來訪問特定動態隨機存取記憶體模組10所對應的I2C從屬位址,藉以訪問特定的動態隨機存取記憶體模組10。 Step S12: The I 2 C operation register 22 in the AMD CPU 201 is coupled to the memory module slot 2 via the I 2 C bus 24 through the PCA9546A chip 30, and accesses the I 2 C slave address corresponding to the specific dynamic random access memory module 10 according to the mapping address of the dynamic random access memory module 10 on the PCA9546A chip 30, so as to access the specific dynamic random access memory module 10.
步驟S13:於動態隨機存取記憶體模組10的電子抹除式可複寫唯讀記憶體40中進行寫入樣本資料或是串行存在檢測信息以作為測試資料。 Step S13: Write sample data or serial presence detection information into the electronically erasable rewritable read-only memory 40 of the dynamic random access memory module 10 as test data.
步驟S14:讀取測試資料於電子抹除式可複寫唯讀記憶體40。 Step S14: Read the test data from the electronically erasable rewritable read-only memory 40.
請參閱第四圖,其係本發明檢測系統1又一實施例的功能關聯圖。在第二實施例中,本發明亦是一種AMD處理器系統之動態隨機存取記憶體模組10的檢測系統1,用於驗證動態隨機存取記憶體模組10所包含的電子抹除式可複寫唯讀記憶體40中之信息寫讀功能,圖中可視檢測系統1包含十六個記憶體模組插槽2、以及基板管理控制器202。 Please refer to the fourth figure, which is a functional association diagram of another embodiment of the detection system 1 of the present invention. In the second embodiment, the present invention is also a detection system 1 of a dynamic random access memory module 10 of an AMD processor system, which is used to verify the information writing and reading functions of the electronically erasable rewritable read-only memory 40 included in the dynamic random access memory module 10. The visible detection system 1 in the figure includes sixteen memory module slots 2 and a baseboard management controller 202.
記憶體模組插槽2可用以插入動態隨機存取記憶體模組10,所以十六個記憶體模組插槽2可以插上十六個動態隨機存取記憶體模組10,而每一個動態隨機存取記憶體模組10上具有一個電子抹除式可複寫唯讀記憶體40,電子抹除式可複寫唯讀記憶體40可以寫入串行存在檢測信息,所以電子抹除式可複寫唯讀記憶體40即是要檢測信息寫讀功能的地方。。 The memory module slot 2 can be used to insert the dynamic random access memory module 10, so the sixteen memory module slots 2 can be inserted with sixteen dynamic random access memory modules 10, and each dynamic random access memory module 10 has an electronically erasable rewritable read-only memory 40, and the electronically erasable rewritable read-only memory 40 can write serial presence detection information, so the electronically erasable rewritable read-only memory 40 is the place where the information writing and reading function is to be detected. .
基板管理控制器202可以通過I2C匯流排24電性耦接每一個記憶體模組插槽2,圖中可見左右各有一個I2C匯流排24,基板管理控制器202通過這二個I2C匯流排24分別電性耦接左右共十六個記憶體模組插槽2。 The baseboard management controller 202 can be electrically coupled to each memory module slot 2 via an I 2 C bus 24 . As shown in the figure, there is an I 2 C bus 24 on each side. The baseboard management controller 202 is electrically coupled to a total of sixteen memory module slots 2 on the left and right sides via the two I 2 C buses 24 .
其中,基板管理控制器202通過I2C匯流排24訪問插在記憶體模組插槽2上的動態隨機存取記憶體模組10,並可以於動態隨機存取記憶體模組10上的電子抹除式可複寫唯讀記憶體40寫入與讀取測試資料。 The baseboard management controller 202 accesses the DRAM module 10 inserted in the memory module slot 2 via the I 2 C bus 24 , and can write and read test data in the EEPROM 40 on the DRAM module 10 .
如以上所述的檢測系統1中,更包含一個PCA9546A芯片30,PCA9546A芯片30具有複數個映射地址,複數個映射地址包含至少一個屬於動態隨機存取記 憶體模組10的映射地址。當基板管理控制器202通過PCA9546A芯片30訪問屬於動態隨機存取記憶體模組10的映射地址,並藉由I2C匯流排24訪問全部的動態隨機存取記憶體模組10後,再通過全部的動態隨機存取記憶體模組10中特定的動態隨機存取記憶體模組10所屬的訪問地址可以分別訪問特定的動態隨機存取記憶體模組10。 As described above, the detection system 1 further includes a PCA9546A chip 30, which has a plurality of mapping addresses, including at least one mapping address belonging to the dynamic random access memory module 10. When the baseboard management controller 202 accesses the mapping address belonging to the dynamic random access memory module 10 through the PCA9546A chip 30 and accesses all the dynamic random access memory modules 10 through the I 2 C bus 24, the specific dynamic random access memory module 10 can be accessed through the access address of the specific dynamic random access memory module 10 in all the dynamic random access memory modules 10.
又如以上所述的檢測系統1中,測試資料也可以是樣本資料或串行存在檢測信息,當檢測系統1中尚未具有原始的樣本資料時,除了寫入樣本資料於電子抹除式可複寫唯讀記憶體40之後再讀出之外,也可改用先寫入串行存在檢測信息。流程上同樣是通過I2C從屬位址訪問到動態隨機存取記憶體模組10的電子抹除式可複寫唯讀記憶體40中,之後可再利用I2C匯流排24來讀取動態隨機存取記憶體模組10的電子抹除式可複寫唯讀記憶體40中先前寫入的串行存在檢測信息來檢測寫讀功能。 As in the detection system 1 described above, the test data may also be sample data or serial presence detection information. When the detection system 1 does not have the original sample data yet, in addition to writing the sample data into the EEPROM 40 and then reading it out, the serial presence detection information may also be written first. The process is the same, accessing the EEPROM 40 of the DRAM module 10 through the I 2 C slave address, and then using the I 2 C bus 24 to read the previously written serial presence detection information in the EEPROM 40 of the DRAM module 10 to detect the write-read function.
另外,由於電子抹除式可複寫唯讀記憶體40的寫讀次數有所限制,所以檢測系統1中的測試資料是以少量寫讀的方式來進行驗證,如此可以減少每次進行驗證時,所需的時間與能量。例如於電子抹除式可複寫唯讀記憶體每個象限128個字節中僅寫入3個字節的樣本資料做為寫入與讀取的測試,可以有效節省測試時間以及符合電子抹除式可複寫唯讀記憶體的硬體限制。又可以在相同時間內,採用多次平均的方式去驗證,以求出最準確的結果,即增加樣本數以求取檢測的平均值來確 認電子抹除式可複寫唯讀記憶體40中之信息寫讀功能是否正常。 In addition, since the number of write and read operations of the EEPROM 40 is limited, the test data in the detection system 1 is verified by writing and reading a small amount of data, which can reduce the time and energy required for each verification. For example, only 3 bytes of sample data are written in each quadrant of the EEPROM as a write and read test, which can effectively save test time and meet the hardware limitations of the EEPROM. In the same time, multiple averages can be used for verification to obtain the most accurate result, that is, the number of samples can be increased to obtain the average value of the test to confirm whether the information writing and reading function in the EEPROM 40 is normal.
請參閱第五圖,其係顯本發明以基板管理控制器202檢測樣本資料的方法流程圖,以及第六圖,其係本發明以基板管理控制器202時檢測樣本資料的方法示意圖。其方法同樣分為原本有樣本資料的狀態以及原本沒有樣本資料進而讀寫樣本資料或串行存在檢測信息的狀態。 Please refer to the fifth figure, which is a flow chart showing the method of detecting sample data by the baseboard management controller 202 of the present invention, and the sixth figure, which is a schematic diagram of the method of detecting sample data by the baseboard management controller 202 of the present invention. The method is also divided into a state where there is sample data originally and a state where there is no sample data originally and then the sample data is read and written or the detection information exists serially.
於原本有原始樣本資料的狀態的方法包含下列步驟: The method in the state where the original sample data is available includes the following steps:
步驟S21:檢測系統1透過作業系統3來控制關閉基板管理控制器202的感應器,以減少基板管理控制器202對於電子抹除式可複寫唯讀記憶體40的影響。 Step S21: The detection system 1 controls the sensor of the baseboard management controller 202 to be turned off through the operating system 3 to reduce the influence of the baseboard management controller 202 on the electronically erasable rewritable read-only memory 40.
步驟S22:依次切換PCA9546A芯片30到0、1、2、3通道,基板管理控制器202會藉由I2C匯流排24通過PCA9546A芯片30來電訊耦接記憶體模組插槽2,並根據PCA9546A芯片30上屬於動態隨機存取記憶體模組10的映射地址,來訪問特定動態隨機存取記憶體模組10所對應的I2C從屬位址,藉以訪問特定的動態隨機存取記憶體模組10。 Step S22: Switch the PCA9546A chip 30 to channels 0, 1, 2, and 3 in sequence. The baseboard management controller 202 will communicate with the memory module slot 2 through the PCA9546A chip 30 via the I 2 C bus 24, and access the I 2 C slave address corresponding to the specific dynamic random access memory module 10 according to the mapping address of the dynamic random access memory module 10 on the PCA9546A chip 30, so as to access the specific dynamic random access memory module 10.
步驟S23:於動態隨機存取記憶體模組10的電子抹除式可複寫唯讀記憶體40中,讀取電子抹除式可複寫唯讀記憶體40中的原始樣本資料作為測試資料。 Step S23: In the electronically erasable rewritable read-only memory 40 of the dynamic random access memory module 10, read the original sample data in the electronically erasable rewritable read-only memory 40 as test data.
步驟S24:測試完後,再打開基板管理控制器202的感應器。 Step S24: After the test, turn on the sensor of the baseboard management controller 202.
以讀寫樣本資料或串行存在檢測信息作為測試資料的方法包含以下步驟: The method of using read and write sample data or serial presence detection information as test data includes the following steps:
步驟S31:檢測系統1透過作業系統3來控制關閉基板管理控制器202的感應器,以減少基板管理控制器202對於電子抹除式可複寫唯讀記憶體40的影響。 Step S31: The detection system 1 controls the sensor of the baseboard management controller 202 to be turned off through the operating system 3 to reduce the influence of the baseboard management controller 202 on the electronically erasable rewritable read-only memory 40.
步驟S32:依次切換PCA9546A芯片30到0、1、2、3通道,基板管理控制器202會藉由I2C匯流排24通過PCA9546A芯片30來電訊耦接記憶體模組插槽2,並根據PCA9546A芯片30上屬於動態隨機存取記憶體模組10的映射地址,來訪問特定動態隨機存取記憶體模組10所對應的I2C從屬位址,藉以訪問特定的動態隨機存取記憶體模組10。 Step S32: Switch the PCA9546A chip 30 to channels 0, 1, 2, and 3 in sequence. The baseboard management controller 202 will communicate with the memory module slot 2 through the PCA9546A chip 30 via the I 2 C bus 24, and access the I 2 C slave address corresponding to the specific dynamic random access memory module 10 according to the mapping address of the dynamic random access memory module 10 on the PCA9546A chip 30, so as to access the specific dynamic random access memory module 10.
步驟S33:於動態隨機存取記憶體模組10的電子抹除式可複寫唯讀記憶體40中進行寫入樣本資料或串行存在檢測信息作為測試資料。 Step S33: Write sample data or serial presence detection information into the electronically erasable rewritable read-only memory 40 of the dynamic random access memory module 10 as test data.
步驟S34:讀取測試資料於電子抹除式可複寫唯讀記憶體40。 Step S34: Read the test data from the electronically erasable rewritable read-only memory 40.
步驟S35:測試完後,再打開基板管理控制器202的感應器。 Step S35: After the test, turn on the sensor of the baseboard management controller 202.
因此,本發明提供一種AMD系統之動態隨機存取記憶體模組10的檢測系統1,可以透過為AMD中央處理器的處理單元20或是基板管理控制器202,通過I2C匯流排24來訪問動態隨機存取記憶體模組10,進一步可進行寫入與讀取測試資料於電子抹除式可複寫唯讀記憶體40中,其中當測試資料不具備樣本資料時,則可採 用先寫入後讀取樣本資料或串行存在檢測信息方式來進行驗證。 Therefore, the present invention provides a detection system 1 for a dynamic random access memory module 10 of an AMD system, which can access the dynamic random access memory module 10 through an I 2 C bus 24 via a processing unit 20 of an AMD central processor or a baseboard management controller 202, and further can write and read test data in an electronically erasable rewritable read-only memory 40. When the test data does not have sample data, the sample data can be written first and then read, or the serial presence detection information method can be adopted for verification.
藉由以上較佳具體實施例之詳述,係希望能更加清楚描述本發明之特徵與精神,而並非以上述所揭露的較佳具體實施例來對本發明之範疇加以限制。相反地,其目的是希望能涵蓋各種改變及具相等性的安排於本發明所欲申請之專利範圍的範疇內。 The above detailed description of the preferred specific embodiments is intended to more clearly describe the features and spirit of the present invention, but is not intended to limit the scope of the present invention by the preferred specific embodiments disclosed above. On the contrary, the purpose is to cover various changes and arrangements with equivalents within the scope of the patent that the present invention intends to apply for.
1:檢測系統 1: Detection system
2:記憶體模組插槽 2: Memory module slot
3:作業系統 3: Operating system
10:動態隨機存取記憶體模組 10: Dynamic random access memory module
20:處理單元 20: Processing unit
201:AMD中央處理器 201: AMD CPU
22:I2C操作寄存器 22:I 2 C Operation Register
24:I2C匯流排 24:I 2 C bus
30:PCA9546A芯片 30: PCA9546A chip
40:電子抹除式可複寫唯讀記憶體 40: Electronically erasable rewritable read-only memory
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