TWI866615B - Testing fixture - Google Patents
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本發明涉及一種檢測治具,屬於板對板連接器檢測技術領域。The invention relates to a testing fixture, belonging to the field of board-to-board connector testing technology.
相關技術中的板對板連接器通常包括絕緣本體以及固定於前述絕緣本體上的複數導電端子。隨著導電端子密度的越來越大,如果對板對板連接器進行檢測,以確保產品在出廠時係合格的係所屬技術領域的技術人員需要解決的技術難題。The board-to-board connector in the related art usually includes an insulating body and a plurality of conductive terminals fixed on the insulating body. As the density of conductive terminals increases, testing the board-to-board connector to ensure that the product is qualified before leaving the factory is a technical problem that needs to be solved by technicians in the relevant technical field.
本發明的目的在於提供一種能夠對板對板連接器進行檢測的檢測治具。The purpose of the present invention is to provide a testing fixture capable of testing a board-to-board connector.
為實現前述目的,本發明採用如下技術方案:一種檢測治具,配置為對板對板連接器進行檢測,前述板對板連接器包括絕緣本體以及固定於前述絕緣本體的複數導電端子,前述絕緣本體包括第一安裝表面以及與前述第一安裝表面相對的第二安裝表面,每一個導電端子包括凸伸出前述第一安裝表面的第一彈性臂以及凸伸出前述第二安裝表面的第二彈性臂,前述檢測治具包括: 第一檢測組件,前述第一檢測組件配置為抵壓前述第一彈性臂使前述第一彈性臂發生彈性變形;前述第一檢測組件包括第一測試治具,前述第一測試治具包括第一導電部,前述第一導電部配置為與對應的第一彈性臂直接或者間接電性連接;以及 第二檢測組件,前述第二檢測組件配置為抵壓前述第二彈性臂使前述第二彈性臂發生彈性變形;前述第二檢測組件包括第二測試治具,前述第二測試治具包括第二導電部,前述第二導電部配置為與對應的第二彈性臂直接或者間接電性連接; 其中,前述第一導電部、前述對應的第一彈性臂、前述對應的第二彈性臂以及前述第二導電部形成檢測電路。To achieve the above-mentioned purpose, the present invention adopts the following technical solutions: a detection fixture configured to detect a board-to-board connector, the board-to-board connector comprising an insulating body and a plurality of conductive terminals fixed to the insulating body, the insulating body comprising a first mounting surface and a second mounting surface opposite to the first mounting surface, each conductive terminal comprising a first elastic arm protruding from the first mounting surface and a second elastic arm protruding from the second mounting surface, the detection fixture comprising: a first detection assembly, the first detection assembly being configured to press against the first elastic arm to cause the first elastic arm to undergo elastic deformation; the first detection assembly comprising a first test fixture, the first test fixture comprising a first conductive portion, the first conductive portion being configured to be directly or indirectly electrically connected to the corresponding first elastic arm; and The second detection assembly is configured to press against the second elastic arm to cause the second elastic arm to deform elastically; the second detection assembly includes a second test fixture, the second test fixture includes a second conductive portion, and the second conductive portion is configured to be directly or indirectly electrically connected to the corresponding second elastic arm; wherein the first conductive portion, the corresponding first elastic arm, the corresponding second elastic arm, and the second conductive portion form a detection circuit.
作為本發明進一步改進的技術方案,前述第一檢測組件配置為以第一下壓量抵壓前述第一彈性臂使前述第一彈性臂發生彈性變形;前述第二檢測組件配置為以第二下壓量抵壓前述第二彈性臂使前述第二彈性臂發生彈性變形。As a further improved technical solution of the present invention, the first detection assembly is configured to press the first elastic arm with a first downward pressure to cause the first elastic arm to undergo elastic deformation; the second detection assembly is configured to press the second elastic arm with a second downward pressure to cause the second elastic arm to undergo elastic deformation.
作為本發明進一步改進的技術方案,前述第一檢測組件設有面向前述第一安裝表面的第一下壓面;當前述第一檢測組件以前述第一下壓量抵壓前述第一彈性臂時,前述第一下壓面與前述第一安裝表面之間具有第一間隙; 前述第二檢測組件設有面向前述第二安裝表面的第二下壓面;當前述第二檢測組件以前述第二下壓量抵壓前述第二彈性臂時,前述第二下壓面與前述第二安裝表面之間具有第二間隙。As a further improved technical solution of the present invention, the first detection assembly is provided with a first downward pressure surface facing the first mounting surface; when the first detection assembly presses against the first elastic arm with the first downward pressure, a first gap is formed between the first downward pressure surface and the first mounting surface; the second detection assembly is provided with a second downward pressure surface facing the second mounting surface; when the second detection assembly presses against the second elastic arm with the second downward pressure, a second gap is formed between the second downward pressure surface and the second mounting surface.
作為本發明進一步改進的技術方案,前述第一測試治具包括第一表面以及與前述第一表面相對的第二表面;前述第一導電部包括沿前述第一測試治具的厚度方向至少部分位於前述第一表面和前述第二表面之間的複數第一導電柱、以及連接相鄰兩個前述第一導電柱的第一連接片;前述第一導電柱遠離前述第一表面的一端與前述對應的第一彈性臂直接電性連接。As a further improved technical solution of the present invention, the first test fixture includes a first surface and a second surface opposite to the first surface; the first conductive portion includes a plurality of first conductive posts at least partially located between the first surface and the second surface along the thickness direction of the first test fixture, and a first connecting piece connecting two adjacent first conductive posts; an end of the first conductive post away from the first surface is directly electrically connected to the corresponding first elastic arm.
作為本發明進一步改進的技術方案,前述第二測試治具包括第三表面以及與前述第三表面相對的第四表面;前述第二導電部包括沿前述第二測試治具的厚度方向至少部分位於前述第三表面和前述第四表面之間的複數第二導電柱、以及連接相鄰兩個前述第二導電柱的第二連接片;前述第二導電柱遠離前述第四表面的一端與前述對應的第二彈性臂直接電性連接。As a further improved technical solution of the present invention, the second test fixture includes a third surface and a fourth surface opposite to the third surface; the second conductive portion includes a plurality of second conductive posts at least partially located between the third surface and the fourth surface along the thickness direction of the second test fixture, and a second connecting piece connecting two adjacent second conductive posts; an end of the second conductive post away from the fourth surface is directly electrically connected to the corresponding second elastic arm.
作為本發明進一步改進的技術方案,前述複數第一導電柱中的一個配置為訊號輸入端,相鄰的兩個前述第一導電柱和一個第一連接片形成第一U型連接路徑; 前述複數第二導電柱中的一個配置為訊號輸出端,相鄰的兩個前述第二導電柱和一個第二連接片形成第二U型連接路徑。As a further improved technical solution of the present invention, one of the aforementioned plurality of first conductive posts is configured as a signal input end, and two adjacent aforementioned first conductive posts and a first connecting piece form a first U-shaped connection path; one of the aforementioned plurality of second conductive posts is configured as a signal output end, and two adjacent aforementioned second conductive posts and a second connecting piece form a second U-shaped connection path.
作為本發明進一步改進的技術方案,前述第一測試治具為第一電路板,前述第一連接片暴露於前述第一表面; 前述第二測試治具為第二電路板,前述第二連接片暴露於前述第四表面。As a further improved technical solution of the present invention, the first test fixture is a first circuit board, and the first connecting piece is exposed on the first surface; the second test fixture is a second circuit board, and the second connecting piece is exposed on the fourth surface.
作為本發明進一步改進的技術方案,前述第一檢測組件包括第一轉接模組,前述第一轉接模組包括複數第一轉接端子,每一個第一轉接端子包括第一固定部以及安裝於前述第一固定部上且能夠相對於前述第一固定部運動的第一活動部;前述第一固定部與前述對應的第一彈性臂直接電性連接; 前述第一測試治具包括第一表面以及與前述第一表面相對的第二表面;前述第一導電部包括沿前述第一測試治具的厚度方向至少部分位於前述第一表面和前述第二表面之間的複數第一導電柱、以及連接相鄰兩個前述第一導電柱的第一連接片;前述第一導電柱遠離前述第一表面的一端與對應的第一活動部相抵接。As a further improved technical solution of the present invention, the first detection assembly includes a first adapter module, the first adapter module includes a plurality of first adapter terminals, each of the first adapter terminals includes a first fixed portion and a first movable portion mounted on the first fixed portion and capable of moving relative to the first fixed portion; the first fixed portion is directly electrically connected to the corresponding first elastic arm; the first test fixture includes a first surface and a second surface opposite to the first surface; the first conductive portion includes a plurality of first conductive posts at least partially located between the first surface and the second surface along the thickness direction of the first test fixture, and a first connecting piece connecting two adjacent first conductive posts; an end of the first conductive post away from the first surface abuts against the corresponding first movable portion.
作為本發明進一步改進的技術方案,前述第二檢測組件包括第二轉接模組,前述第二轉接模組包括複數第二轉接端子,每一個第二轉接端子包括第二固定部以及安裝於前述第二固定部上且能夠相對於前述第二固定部運動的第二活動部;前述第二固定部與前述對應的第二彈性臂直接電性連接; 前述第二測試治具包括第三表面以及與前述第三表面相對的第四表面;前述第二導電部包括沿前述第二測試治具的厚度方向至少部分位於前述第三表面和前述第四表面之間的複數第二導電柱、以及連接相鄰兩個前述第二導電柱的第二連接片;前述第二導電柱遠離前述第四表面的一端與對應的第二活動部相抵接。As a further improved technical solution of the present invention, the second detection assembly includes a second adapter module, the second adapter module includes a plurality of second adapter terminals, each of the second adapter terminals includes a second fixed portion and a second movable portion mounted on the second fixed portion and capable of moving relative to the second fixed portion; the second fixed portion is directly electrically connected to the corresponding second elastic arm; the second test fixture includes a third surface and a fourth surface opposite to the third surface; the second conductive portion includes a plurality of second conductive posts at least partially located between the third surface and the fourth surface along the thickness direction of the second test fixture, and a second connecting piece connecting two adjacent second conductive posts; an end of the second conductive post away from the fourth surface abuts against the corresponding second movable portion.
作為本發明進一步改進的技術方案,前述複數第一導電柱中的一個配置為訊號輸入端,相鄰的兩個前述第一導電柱和一個第一連接片形成第一U型連接路徑; 前述複數第二導電柱中的一個配置為訊號輸出端,相鄰的兩個前述第二導電柱和一個第二連接片形成第二U型連接路徑; 前述第一測試治具為第一電路板,前述第一連接片暴露於前述第一表面; 前述第二測試治具為第二電路板,前述第二連接片暴露於前述第四表面。As a further improved technical solution of the present invention, one of the aforementioned plurality of first conductive posts is configured as a signal input end, and two adjacent aforementioned first conductive posts and a first connecting piece form a first U-shaped connection path; one of the aforementioned plurality of second conductive posts is configured as a signal output end, and two adjacent aforementioned second conductive posts and a second connecting piece form a second U-shaped connection path; the aforementioned first test fixture is a first circuit board, and the aforementioned first connecting piece is exposed on the aforementioned first surface; the aforementioned second test fixture is a second circuit board, and the aforementioned second connecting piece is exposed on the aforementioned fourth surface.
作為本發明進一步改進的技術方案,前述複數導電端子中的一些沿第一方向排列,另一些沿第二方向排列,前述第一方向與前述第二方向相互垂直; 前述第一導電部包括沿前述第一方向間隔佈置的複數第一開關部,每一個第一開關部包括沿前述第二方向延伸的第一條狀部,前述第一條狀部至少與兩個前述導電端子的前述第一彈性臂相接觸; 前述第二導電部包括沿前述第二方向間隔佈置的複數第二開關部,每一個第二開關部包括沿前述第一方向延伸的第二條狀部,前述第二條狀部至少與兩個前述導電端子的前述第二彈性臂相接觸; 其中,藉由連接兩個前述第一條狀部或者連接兩個前述第二條狀部能夠形成前述檢測電路。As a further improved technical solution of the present invention, some of the plurality of conductive terminals are arranged along a first direction, and the other are arranged along a second direction, and the first direction and the second direction are perpendicular to each other; the first conductive portion includes a plurality of first switch portions arranged at intervals along the first direction, each of the first switch portions includes a first strip portion extending along the second direction, and the first strip portion contacts at least the first elastic arms of two of the conductive terminals; the second conductive portion includes a plurality of second switch portions arranged at intervals along the second direction, each of the second switch portions includes a second strip portion extending along the first direction, and the second strip portion contacts at least the second elastic arms of two of the conductive terminals; wherein the detection circuit can be formed by connecting two of the first strip portions or connecting two of the second strip portions.
作為本發明進一步改進的技術方案,前述第一測試治具包括第一表面以及與前述第一表面相對的第二表面,前述第一開關部靠近前述第二表面;前述第一導電部還包括與前述第一條狀部相連且至少暴露於前述第一表面的第一測試柱;前述第一測試柱沿前述第一測試治具的厚度方向至少部分位於前述第一表面和前述第二表面之間; 前述第二測試治具包括第三表面以及與前述第三表面相對的第四表面,前述第二開關部靠近前述第三表面;前述第二導電部還包括與前述第二條狀部相連且至少暴露於前述第四表面的第二測試柱;前述第二測試柱沿前述第二測試治具的厚度方向至少部分位於前述第三表面和前述第四表面之間。As a further improved technical solution of the present invention, the first test fixture includes a first surface and a second surface opposite to the first surface, the first switch portion is close to the second surface; the first conductive portion further includes a first test post connected to the first strip portion and exposed at least to the first surface; the first test post is at least partially located between the first surface and the second surface along the thickness direction of the first test fixture; the second test fixture includes a third surface and a fourth surface opposite to the third surface, the second switch portion is close to the third surface; the second conductive portion further includes a second test post connected to the second strip portion and exposed at least to the fourth surface; the second test post is at least partially located between the third surface and the fourth surface along the thickness direction of the second test fixture.
作為本發明進一步改進的技術方案,前述複數導電端子中的一些沿第一方向排列,另一些沿第二方向排列,前述第一方向與前述第二方向相互垂直; 前述第一導電部包括一一對應於前述第一彈性臂且與前述第一彈性臂相接觸的複數第一開關測試柱; 前述第二導電部包括本體部,前述本體部與沿前述第一方向以及與沿前述第二方向分佈的至少部分複數導電端子的前述第二彈性臂相接觸; 其中,藉由連接兩個前述第一開關測試柱能夠形成前述檢測電路。As a further improved technical solution of the present invention, some of the plurality of conductive terminals are arranged along a first direction, and the other are arranged along a second direction, wherein the first direction and the second direction are perpendicular to each other; the first conductive portion includes a plurality of first switch test posts corresponding to the first elastic arms one by one and in contact with the first elastic arms; the second conductive portion includes a body portion, and the body portion is in contact with the second elastic arms of at least part of the plurality of conductive terminals distributed along the first direction and along the second direction; wherein the detection circuit can be formed by connecting two of the first switch test posts.
作為本發明進一步改進的技術方案,前述第一測試治具包括第一表面以及與前述第一表面相對的第二表面,前述第一開關測試柱沿前述第一測試治具的厚度方向至少部分位於前述第一表面和前述第二表面之間,且前述第一開關測試柱至少暴露於前述第一表面; 前述第二測試治具包括第三表面以及與前述第三表面相對的第四表面,前述本體部靠近前述第三表面;前述第二導電部還包括與前述本體部相連且至少暴露於前述第四表面的第二測試柱;前述第二測試柱沿前述第二測試治具的厚度方向至少部分位於前述第三表面和前述第四表面之間。As a further improved technical solution of the present invention, the first test fixture includes a first surface and a second surface opposite to the first surface, the first switch test post is at least partially located between the first surface and the second surface along the thickness direction of the first test fixture, and the first switch test post is at least exposed to the first surface; the second test fixture includes a third surface and a fourth surface opposite to the third surface, the body is close to the third surface; the second conductive part further includes a second test post connected to the body and exposed to at least the fourth surface; the second test post is at least partially located between the third surface and the fourth surface along the thickness direction of the second test fixture.
作為本發明進一步改進的技術方案,前述檢測治具包括夾持在前述絕緣本體的兩端的第一夾持塊和第二夾持塊;前述第一檢測組件設有第一定位槽;前述第二檢測組件設有第二定位槽;前述第一夾持塊和前述第二夾持塊均被定位在前述第一定位槽和前述第二定位槽中。As a further improved technical solution of the present invention, the aforementioned detection fixture includes a first clamping block and a second clamping block clamped at the two ends of the aforementioned insulating body; the aforementioned first detection assembly is provided with a first positioning groove; the aforementioned second detection assembly is provided with a second positioning groove; the aforementioned first clamping block and the aforementioned second clamping block are both positioned in the aforementioned first positioning groove and the aforementioned second positioning groove.
相較於習知技術,本發明的檢測治具包括第一檢測組件和第二檢測組件,其中前述第一檢測組件配置為抵壓前述第一彈性臂使前述第一彈性臂發生彈性變形;前述第二檢測組件配置為抵壓前述第二彈性臂使前述第二彈性臂發生彈性變形,以對前述導電端子的下壓量進行控制。另,前述第一導電部、前述對應的第一彈性臂、前述對應的第二彈性臂以及前述第二導電部形成檢測電路,用以對該檢測電路中的前述導電端子進行檢測,提高了檢測的便利性和精準度。Compared with the prior art, the detection fixture of the present invention includes a first detection assembly and a second detection assembly, wherein the first detection assembly is configured to press against the first elastic arm to cause the first elastic arm to deform elastically; the second detection assembly is configured to press against the second elastic arm to cause the second elastic arm to deform elastically, so as to control the downward pressure of the conductive terminal. In addition, the first conductive part, the corresponding first elastic arm, the corresponding second elastic arm and the second conductive part form a detection circuit for detecting the conductive terminal in the detection circuit, thereby improving the convenience and accuracy of the detection.
下面將結合圖式詳細地對本發明示例性具體實施方式進行說明。如果存在複數具體實施方式,在不衝突的情況下,這些實施方式中的特徵可以相互組合。當描述涉及圖式時,除非另有說明,不同圖式中相同的數字表示相同或相似的要素。以下示例性具體實施方式中所描述的內容並不代表與本發明相一致的所有實施方式;相反,它們僅係與本發明的申請專利範圍中所記載的、與本發明的一些方面相一致的裝置、產品和/或方法的例子。The following will be described in detail with reference to the drawings for exemplary embodiments of the present invention. If there are multiple embodiments, the features of these embodiments can be combined with each other without conflict. When the description involves drawings, unless otherwise stated, the same numbers in different drawings represent the same or similar elements. The contents described in the following exemplary embodiments do not represent all embodiments consistent with the present invention; on the contrary, they are only examples of devices, products and/or methods described in the scope of the patent application of the present invention and consistent with some aspects of the present invention.
在本發明中使用的術語係僅僅出於描述具體實施方式的目的,而非旨在限制本發明的保護範圍。在本發明的說明書和申請專利範圍中所使用的單數形式的“一種”、“前述”或“該”也旨在包括多數形式,除非上下文清楚地表示其他含義。The terms used in the present invention are only for the purpose of describing specific embodiments and are not intended to limit the scope of protection of the present invention. The singular forms "a", "above", or "the" used in the specification and patent application of the present invention are also intended to include plural forms, unless the context clearly indicates other meanings.
應當理解,本發明的說明書以及申請專利範圍中所使用的,例如“第一”、“第二”以及類似的詞語,並不表示任何順序、數量或者重要性,而只是用來區分特徵的命名。同樣,“一個”或者“一”等類似詞語也不表示數量限制,而是表示存在至少一個。除非另行指出,本發明中出現的“前”、“後”、“上”、“下”等類似詞語只是為了便於說明,而並非限於某一特定位置或者一種空間定向。“包括”或者“包含”等類似詞語係一種開放式的表述方式,意指出現在“包括”或者“包含”前面的元件涵蓋出現在“包括”或者“包含”後面的元件及其等同物,這並不排除出現在“包括”或者“包含”前面的元件還可以包含其他元件。本發明中如果出現“複數”,其含義係指兩個以及兩個以上。It should be understood that the words used in the specification and patent application of the present invention, such as "first", "second" and similar words, do not indicate any order, quantity or importance, but are only used to distinguish the names of features. Similarly, "one" or "an" and similar words do not indicate quantitative limitations, but indicate the existence of at least one. Unless otherwise specified, the words "front", "back", "upper", "lower" and similar words appearing in the present invention are only for the convenience of explanation, and are not limited to a specific position or a spatial orientation. "Include" or "comprising" and similar words are an open-ended expression, meaning that the elements appearing before "include" or "comprising" cover the elements and their equivalents appearing after "include" or "comprising", which does not exclude that the elements appearing before "include" or "comprising" may also include other elements. If "plurality" appears in the present invention, its meaning refers to two and more than two.
請參照圖1至圖11所示,本發明第一實施方式中揭示了一種檢測治具,前述檢測治具配置為對板對板連接器100進行檢測。前述板對板連接器100包括絕緣本體1以及固定於前述絕緣本體1的複數導電端子2。前述絕緣本體1包括第一安裝表面11(例如上表面)以及與前述第一安裝表面11相對的第二安裝表面12(例如下表面)。請結合圖8以及圖9所示,每一個導電端子2包括固定於前述絕緣本體1中的固定部20、自前述固定部20的一端延伸且向上凸伸出前述第一安裝表面11的第一彈性臂21、以及自前述固定部20的另一端延伸且向下凸伸出前述第二安裝表面12的第二彈性臂22。在本發明圖式的實施方式中,前述導電端子2大致呈方框狀,其中前述第一彈性臂21的自由端與前述第二彈性臂22的自由端相互靠近。所屬技術領域的技術人員能夠理解,前述第一彈性臂21以及前述第二彈性臂22分別用以與第一安裝電路板上第一金手指(未圖示)以及第二安裝電路板上的第二金手指(未圖示)相抵接。Please refer to Figures 1 to 11, a first embodiment of the present invention discloses a testing fixture, which is configured to test a board-to-board connector 100. The board-to-board connector 100 includes an insulating body 1 and a plurality of conductive terminals 2 fixed to the insulating body 1. The insulating body 1 includes a first mounting surface 11 (e.g., an upper surface) and a second mounting surface 12 (e.g., a lower surface) opposite to the first mounting surface 11. Please refer to Figures 8 and 9, each conductive terminal 2 includes a fixing portion 20 fixed in the insulating body 1, a first elastic arm 21 extending from one end of the fixing portion 20 and protruding upward from the first mounting surface 11, and a second elastic arm 22 extending from the other end of the fixing portion 20 and protruding downward from the second mounting surface 12. In the embodiment of the present invention, the conductive terminal 2 is substantially in the shape of a square frame, wherein the free end of the first elastic arm 21 and the free end of the second elastic arm 22 are close to each other. A person skilled in the art can understand that the first elastic arm 21 and the second elastic arm 22 are used to abut against the first gold finger (not shown) on the first mounting circuit board and the second gold finger (not shown) on the second mounting circuit board, respectively.
請結合圖2所示,在本發明圖式的實施方式中,前述複數導電端子2呈矩陣狀排列,其中一部分前述導電端子2沿第一方向D1-D1(例如左右方向)排列,另一部分前述導電端子2沿第二方向D2-D2(例如前後方向)排列,前述第一方向D1-D1與前述第二方向D2-D2相互垂直。Please refer to FIG. 2 , in the embodiment of the present invention, the plurality of conductive terminals 2 are arranged in a matrix, wherein a portion of the conductive terminals 2 are arranged along a first direction D1-D1 (e.g., left-right direction), and another portion of the conductive terminals 2 are arranged along a second direction D2-D2 (e.g., front-back direction), and the first direction D1-D1 and the second direction D2-D2 are perpendicular to each other.
請結合圖2至圖7所示,前述檢測治具包括第一檢測組件30以及第二檢測組件40。前述第一檢測組件30配置為抵壓前述第一彈性臂21,使前述第一彈性臂21發生彈性變形。前述第一檢測組件30包括第一測試治具31、第一固定座32、將前述第一測試治具31抵壓在前述第一固定座32上的第一壓片33、以及將前述第一壓片33固定於前述第一固定座32的第一緊固件34。前述第一測試治具31包括第一導電部35,前述第一導電部35配置為與對應的第一彈性臂21直接或者間接電性連接。Please refer to Figures 2 to 7, the aforementioned detection fixture includes a first detection component 30 and a second detection component 40. The aforementioned first detection component 30 is configured to press against the aforementioned first elastic arm 21, so that the aforementioned first elastic arm 21 undergoes elastic deformation. The aforementioned first detection component 30 includes a first test fixture 31, a first fixing seat 32, a first pressing plate 33 for pressing the aforementioned first test fixture 31 against the aforementioned first fixing seat 32, and a first fastener 34 for fixing the aforementioned first pressing plate 33 to the aforementioned first fixing seat 32. The aforementioned first test fixture 31 includes a first conductive portion 35, and the aforementioned first conductive portion 35 is configured to be directly or indirectly electrically connected to the corresponding first elastic arm 21.
在本發明的第一實施方式中,前述第一固定座32設有第一中間鏤空槽321以及與前述第一中間鏤空槽321相連通的第一定位槽322。在本發明的第一實施方式中,前述第一定位槽322為兩個且沿前述第一方向D1-D1分別位於前述第一固定座32的兩端。In the first embodiment of the present invention, the first fixing seat 32 is provided with a first middle hollow groove 321 and a first positioning groove 322 connected to the first middle hollow groove 321. In the first embodiment of the present invention, there are two first positioning grooves 322 and they are respectively located at two ends of the first fixing seat 32 along the first direction D1-D1.
前述第一壓片33為兩個且分別壓住前述第一測試治具31的兩側。There are two first pressing sheets 33, which press two sides of the first test fixture 31 respectively.
在本發明的第一實施方式中,前述第一測試治具31為第一電路板,其包括第一表面311(例如上表面)以及與前述第一表面311相對的第二表面312(例如下表面)。In the first embodiment of the present invention, the first test fixture 31 is a first circuit board, which includes a first surface 311 (eg, an upper surface) and a second surface 312 (eg, a lower surface) opposite to the first surface 311 .
前述第一導電部35包括沿前述第一測試治具31的厚度方向至少部分位於前述第一表面311和前述第二表面312之間的複數第一導電柱351、以及連接相鄰兩個前述第一導電柱351的第一連接片352。前述第一導電柱351遠離前述第一表面311的一端(例如底端)與前述對應的第一彈性臂21直接電性連接(例如直接接觸)。所屬技術領域的技術人員能夠理解,前述第一導電柱351以及前述第一連接片352可以結合電路板的製程工藝而實現。The first conductive portion 35 includes a plurality of first conductive posts 351 at least partially located between the first surface 311 and the second surface 312 along the thickness direction of the first test fixture 31, and a first connecting piece 352 connecting two adjacent first conductive posts 351. One end (e.g., the bottom end) of the first conductive post 351 away from the first surface 311 is directly electrically connected (e.g., directly in contact) with the corresponding first elastic arm 21. A person skilled in the art will understand that the first conductive post 351 and the first connecting piece 352 can be realized in combination with the process technology of the circuit board.
請結合圖10以及圖11所示,在本發明的第一實施方式中,前述複數第一導電柱351中的一個配置為訊號輸入端Input,相鄰的兩個前述第一導電柱351和一個第一連接片352形成第一U型連接路徑353。所屬技術領域的技術人員能夠理解,前述第一導電部35包括一個作為訊號輸入端Input的第一導電柱351以及複數個間隔設置的第一U型連接路徑353。每一個第一U型連接路徑353的兩個前述第一導電柱351分別與相鄰的兩個導電端子2的第一彈性臂21電性連接。在本發明的第一實施方式中,前述第一連接片352暴露於前述第一表面311。Please refer to FIG. 10 and FIG. 11 . In the first embodiment of the present invention, one of the plurality of first conductive posts 351 is configured as a signal input terminal Input, and two adjacent first conductive posts 351 and a first connecting piece 352 form a first U-shaped connecting path 353. A person skilled in the art will understand that the first conductive portion 35 includes a first conductive post 351 as a signal input terminal Input and a plurality of first U-shaped connecting paths 353 arranged at intervals. The two first conductive posts 351 of each first U-shaped connecting path 353 are electrically connected to the first elastic arms 21 of the two adjacent conductive terminals 2, respectively. In the first embodiment of the present invention, the first connecting piece 352 is exposed to the first surface 311.
類似地,前述第二檢測組件40配置為抵壓前述第二彈性臂22,使前述第二彈性臂22發生彈性變形。前述第二檢測組件40包括第二測試治具41、第二固定座42、將前述第二測試治具41抵壓在前述第二固定座42上的第二壓片43、以及將前述第二壓片43固定於前述第二固定座42的第二緊固件44。前述第二測試治具41包括第二導電部45,前述第二導電部45配置為與對應的第二彈性臂22直接或者間接電性連接。Similarly, the second detection assembly 40 is configured to press against the second elastic arm 22 to cause elastic deformation of the second elastic arm 22. The second detection assembly 40 includes a second test fixture 41, a second fixing seat 42, a second pressing plate 43 for pressing the second test fixture 41 against the second fixing seat 42, and a second fastener 44 for fixing the second pressing plate 43 to the second fixing seat 42. The second test fixture 41 includes a second conductive portion 45, and the second conductive portion 45 is configured to be directly or indirectly electrically connected to the corresponding second elastic arm 22.
在本發明的第一實施方式中,前述第二固定座42設有第二中間鏤空槽421以及與前述第二中間鏤空槽421相連通的第二定位槽422。在本發明的第一實施方式中,前述第二定位槽422為兩個且沿前述第一方向D1-D1分別位於前述第二固定座42的兩端。In the first embodiment of the present invention, the second fixing seat 42 is provided with a second middle hollow groove 421 and a second positioning groove 422 connected to the second middle hollow groove 421. In the first embodiment of the present invention, there are two second positioning grooves 422 and they are respectively located at two ends of the second fixing seat 42 along the first direction D1-D1.
前述第二壓片43為兩個且分別壓住前述第二測試治具41的兩側。There are two second pressing sheets 43, which press two sides of the second test fixture 41 respectively.
在本發明的第一實施方式中,前述第二測試治具41為第二電路板,其包括第三表面411(例如上表面)以及與前述第三表面411相對的第四表面412(例如下表面)。In the first embodiment of the present invention, the second test fixture 41 is a second circuit board, which includes a third surface 411 (eg, an upper surface) and a fourth surface 412 (eg, a lower surface) opposite to the third surface 411 .
前述第二導電部45包括沿前述第二測試治具41的厚度方向至少部分位於前述第三表面411和前述第四表面412之間的複數第二導電柱451、以及連接相鄰兩個前述第二導電柱451的第二連接片452。前述第二導電柱451遠離前述第四表面412的一端(例如頂端)與前述對應的第二彈性臂22直接電性連接(例如直接接觸)。所屬技術領域的技術人員能夠理解,前述第二導電柱451以及前述第二連接片452可以結合電路板的製程工藝而實現。The second conductive portion 45 includes a plurality of second conductive posts 451 at least partially located between the third surface 411 and the fourth surface 412 along the thickness direction of the second test fixture 41, and a second connecting piece 452 connecting two adjacent second conductive posts 451. One end (e.g., the top end) of the second conductive post 451 away from the fourth surface 412 is directly electrically connected (e.g., directly in contact) with the corresponding second elastic arm 22. A person skilled in the art will understand that the second conductive post 451 and the second connecting piece 452 can be realized in combination with the process technology of the circuit board.
請結合圖10以及圖11所示,在本發明的第一實施方式中,前述複數第二導電柱451中的一個配置為訊號輸出端Output,相鄰的兩個前述第二導電柱451和一個第二連接片452形成第二U型連接路徑453。所屬技術領域的技術人員能夠理解,前述第二導電部45包括一個作為訊號輸出端Output的第二導電柱451以及複數個間隔設置的第二U型連接路徑453。每一個第二U型連接路徑453的兩個前述第二導電柱451分別與相鄰的兩個導電端子2的第二彈性臂22電性連接。在本發明的第一實施方式中,前述第二連接片452暴露於前述第四表面412。Please refer to FIG. 10 and FIG. 11 . In the first embodiment of the present invention, one of the plurality of second conductive posts 451 is configured as a signal output terminal Output, and two adjacent second conductive posts 451 and a second connecting piece 452 form a second U-shaped connecting path 453. A person skilled in the art will understand that the second conductive portion 45 includes a second conductive post 451 as a signal output terminal Output and a plurality of second U-shaped connecting paths 453 arranged at intervals. The two second conductive posts 451 of each second U-shaped connecting path 453 are electrically connected to the second elastic arms 22 of the two adjacent conductive terminals 2, respectively. In the first embodiment of the present invention, the second connecting piece 452 is exposed to the fourth surface 412.
為了更好地控制下壓量以及實現壓接的平整度,前述檢測治具包括夾持在前述絕緣本體1的兩端的第一夾持塊13和第二夾持塊14。利用前述第一夾持塊13和前述第二夾持塊14能夠對前述板對板連接器100的基準面進行精確的控制。在本發明圖式的實施方式中,前述第一夾持塊13和前述第二夾持塊14分別為兩個。前述第一夾持塊13和前述第二夾持塊14定位於前述第一固定座32的第一定位槽322以及前述第二固定座42的第二定位槽422中。In order to better control the amount of downward pressure and achieve the flatness of the crimping, the aforementioned testing fixture includes a first clamping block 13 and a second clamping block 14 clamped at both ends of the aforementioned insulating body 1. The aforementioned first clamping block 13 and the aforementioned second clamping block 14 can be used to accurately control the reference surface of the aforementioned board-to-board connector 100. In the embodiment of the diagram of the present invention, the aforementioned first clamping block 13 and the aforementioned second clamping block 14 are two respectively. The aforementioned first clamping block 13 and the aforementioned second clamping block 14 are positioned in the first positioning groove 322 of the aforementioned first fixing seat 32 and the second positioning groove 422 of the aforementioned second fixing seat 42.
前述第一導電部35、前述對應的第一彈性臂21、前述對應的第二彈性臂22以及前述第二導電部45形成檢測電路(請參考圖11中的加粗箭頭所示的檢測電路)。藉由在前述檢測電路的輸入端輸入電訊號,檢測輸出端的電訊號則可以判斷該檢測電路中的前述導電端子2是否符合設計要求。舉例而言,當前述第一檢測組件30以及前述第二檢測組件40分別安裝設定的下壓量與前述第一彈性臂21以及前述第二彈性臂22抵接時,如果在前述檢測電路的輸入端輸入電訊號,但未在輸出端檢測到電訊號時,則可以判斷該檢測電路中的前述導電端子2中的至少一個未能與前述第一導電部35和/或前述第二導電部45達成接觸,因而屬於不合格產品。The first conductive part 35, the corresponding first elastic arm 21, the corresponding second elastic arm 22 and the second conductive part 45 form a detection circuit (please refer to the detection circuit indicated by the bold arrow in FIG. 11 ). By inputting an electrical signal at the input end of the detection circuit and detecting the electrical signal at the output end, it can be determined whether the conductive terminal 2 in the detection circuit meets the design requirements. For example, when the first detection component 30 and the second detection component 40 are respectively installed with the set downward pressure amount and abut against the first elastic arm 21 and the second elastic arm 22, if an electrical signal is input at the input end of the detection circuit but no electrical signal is detected at the output end, it can be determined that at least one of the conductive terminals 2 in the detection circuit fails to make contact with the first conductive part 35 and/or the second conductive part 45, and thus the detection circuit is a defective product.
請結合圖31所示,在本發明的第一實施方式中,當前述第一檢測組件30以及前述第二檢測組件40未抵壓前述板對板連接器100的導電端子2時,前述導電端子2的第一彈性臂21的第一抵接面與前述第一安裝表面11之間的高度為H1,前述導電端子2的第二彈性臂22的第二抵接面與前述第二安裝表面12之間的高度為H2。Please refer to Figure 31. In the first embodiment of the present invention, when the first detection assembly 30 and the second detection assembly 40 are not pressed against the conductive terminal 2 of the board-to-board connector 100, the height between the first abutting surface of the first elastic arm 21 of the conductive terminal 2 and the first mounting surface 11 is H1, and the height between the second abutting surface of the second elastic arm 22 of the conductive terminal 2 and the second mounting surface 12 is H2.
檢測時,前述第一檢測組件30配置為以第一下壓量抵壓前述第一彈性臂21使前述第一彈性臂21發生彈性變形;前述第二檢測組件40配置為以第二下壓量抵壓前述第二彈性臂22使前述第二彈性臂22發生彈性變形。此時,前述導電端子2的第一彈性臂21的第一抵接面與前述第一安裝表面11之間的高度為H1’,前述導電端子2的第二彈性臂22的第二抵接面與前述第二安裝表面12之間的高度為H2’。所屬技術領域的技術人員能夠理解,前述第一下壓量為H1-H1’,前述第二下壓量為H2-H2’。另,前述第一下壓量與前述第二下壓量均為一個設定的區間(即數值範圍),即前述第一下壓量以及前述第二下壓量到達該設定的區間即可進行檢測。設置該區間的目的在於,不僅避免前述第一檢測組件30以及前述第二檢測組件40分別與前述第一彈性臂21以及前述第二彈性臂22的接觸程度不夠,而且也避免前述第一檢測組件30以及前述第二檢測組件40分別與前述第一彈性臂21以及前述第二彈性臂22發生過度接觸,從而不當破壞了前述導電端子2。所屬技術領域的技術人員能夠理解,一旦前述導電端子2在檢測過程中被破壞,例如前述第一彈性臂21和/或前述第二彈性臂22發生永久變形等,即使測試藉由,該板對板連接器100仍屬於不合格產品。During detection, the first detection assembly 30 is configured to press the first elastic arm 21 with a first downward pressure to cause the first elastic arm 21 to be elastically deformed; the second detection assembly 40 is configured to press the second elastic arm 22 with a second downward pressure to cause the second elastic arm 22 to be elastically deformed. At this time, the height between the first contact surface of the first elastic arm 21 of the conductive terminal 2 and the first mounting surface 11 is H1', and the height between the second contact surface of the second elastic arm 22 of the conductive terminal 2 and the second mounting surface 12 is H2'. A person skilled in the art can understand that the first downward pressure is H1-H1', and the second downward pressure is H2-H2'. In addition, the first pressing amount and the second pressing amount are both within a set interval (i.e., a numerical range), that is, the detection can be performed when the first pressing amount and the second pressing amount reach the set interval. The purpose of setting the interval is not only to avoid the first detection assembly 30 and the second detection assembly 40 from having insufficient contact with the first elastic arm 21 and the second elastic arm 22, but also to avoid the first detection assembly 30 and the second detection assembly 40 from having excessive contact with the first elastic arm 21 and the second elastic arm 22, thereby improperly damaging the conductive terminal 2. Those skilled in the art will understand that once the conductive terminal 2 is damaged during the testing process, such as the first elastic arm 21 and/or the second elastic arm 22 are permanently deformed, the board-to-board connector 100 is still a defective product even if the test is passed.
請結合圖11所示,在本發明的第一實施方式中,前述第一檢測組件30設有面向前述第一安裝表面11的第一下壓面;當前述第一檢測組件30以前述第一下壓量抵壓前述第一彈性臂21時,前述第一下壓面與前述第一安裝表面11之間具有第一間隙G1;前述第二檢測組件40設有面向前述第二安裝表面12的第二下壓面;當前述第二檢測組件40以前述第二下壓量抵壓前述第二彈性臂22時,前述第二下壓面與前述第二安裝表面12之間具有第二間隙G2。Please refer to Figure 11. In the first embodiment of the present invention, the first detection component 30 is provided with a first downward pressure surface facing the first mounting surface 11; when the first detection component 30 presses against the first elastic arm 21 with the first downward pressure, a first gap G1 is provided between the first downward pressure surface and the first mounting surface 11; the second detection component 40 is provided with a second downward pressure surface facing the second mounting surface 12; when the second detection component 40 presses against the second elastic arm 22 with the second downward pressure, a second gap G2 is provided between the second downward pressure surface and the second mounting surface 12.
請結合圖12至圖18所示,在本發明的第二實施方式中,為了改善前述第一測試治具31中用以與前述第一彈性臂21相接觸的前述第一導電柱351的表面共面度控制不易控制的問題,以及為了改善前述第二測試治具41中用以與前述第二彈性臂22相接觸的前述第二導電柱451的表面共面度控制不易控制的問題,前述第一檢測組件30還包括第一轉接模組36,前述第二檢測組件40還包括第二轉接模組46。Please refer to Figures 12 to 18. In the second embodiment of the present invention, in order to improve the problem that the surface coplanarity control of the first conductive column 351 in contact with the first elastic arm 21 in the first test fixture 31 is difficult to control, and in order to improve the problem that the surface coplanarity control of the second conductive column 451 in contact with the second elastic arm 22 in the second test fixture 41 is difficult to control, the first detection assembly 30 further includes a first adapter module 36, and the second detection assembly 40 further includes a second adapter module 46.
前述第一轉接模組36包括第一轉接殼體361以及安裝於前述第一轉接殼體361的複數第一轉接端子362。在本發明圖式的實施方式中,前述第一轉接端子362為Pogo端子。其中每一個第一轉接端子362包括第一固定部3621以及安裝於前述第一固定部3621上且能夠相對於前述第一固定部3621運動的第一活動部3622。前述第一活動部3622能夠在第一彈簧(未圖示)的作用下相對於前述第一固定部3621上下移動。前述第一固定部3621的底面與前述對應的第一彈性臂21直接電性連接(例如直接接觸)。前述第一活動部3622與前述第一導電柱351的底面直接電性連接(例如直接接觸)。The first adapter module 36 includes a first adapter shell 361 and a plurality of first adapter terminals 362 mounted on the first adapter shell 361. In the embodiment of the present invention, the first adapter terminal 362 is a Pogo terminal. Each of the first adapter terminals 362 includes a first fixed portion 3621 and a first movable portion 3622 mounted on the first fixed portion 3621 and capable of moving relative to the first fixed portion 3621. The first movable portion 3622 can move up and down relative to the first fixed portion 3621 under the action of a first spring (not shown). The bottom surface of the first fixed portion 3621 is directly electrically connected to (e.g., directly in contact with) the corresponding first elastic arm 21. The first movable portion 3622 is directly electrically connected to (e.g., directly in contact with) the bottom surface of the first conductive column 351.
類似地,前述第二轉接模組46包括第二轉接殼體461以及安裝於前述第二轉接殼體461的複數第二轉接端子462。在本發明圖式的實施方式中,前述第二轉接端子462為Pogo端子。其中每一個第二轉接端子462包括第二固定部4621以及安裝於前述第二固定部4621上且能夠相對於前述第二固定部4621運動的第二活動部4622。前述第二活動部4622能夠在第二彈簧(未圖示)的作用下相對於前述第二固定部4621上下移動。前述第二固定部4621的頂面與前述對應的第二彈性臂22直接電性連接(例如直接接觸)。前述第二活動部4622與前述第二導電柱451的頂面直接電性連接(例如直接接觸)。Similarly, the second adapter module 46 includes a second adapter housing 461 and a plurality of second adapter terminals 462 mounted on the second adapter housing 461. In the embodiment of the present invention, the second adapter terminals 462 are Pogo terminals. Each of the second adapter terminals 462 includes a second fixed portion 4621 and a second movable portion 4622 mounted on the second fixed portion 4621 and capable of moving relative to the second fixed portion 4621. The second movable portion 4622 can move up and down relative to the second fixed portion 4621 under the action of a second spring (not shown). The top surface of the second fixed portion 4621 is directly electrically connected to (e.g., directly in contact with) the corresponding second elastic arm 22. The second movable portion 4622 is directly electrically connected to (eg, directly in contact with) the top surface of the second conductive column 451.
所屬技術領域的技術人員能夠理解,由於前述第一活動部3622以及前述第二活動部4622能夠在上下方向上調節一定的高度,從而能夠對接觸平面的共面度進行一定程度的彌補,降低了製造難度。A person skilled in the art will appreciate that since the first movable portion 3622 and the second movable portion 4622 can be adjusted to a certain height in the up and down directions, the coplanarity of the contact plane can be compensated to a certain extent, thereby reducing the difficulty of manufacturing.
為了降低前述第一實施方式和前述第二實施方式中的前述第一測試治具31和前述第二測試治具41的製造難度,本發明提出了一種新的設計思路。請結合圖19至圖25所示,在本發明的第三實施方式中,前述第一檢測組件30包括第一測試治具31。前述第一測試治具31包括第一絕緣基部313以及固定在前述第一絕緣基部313中的第一導電部35。前述第一絕緣基部313包括第一表面311(例如上表面)、與前述第一表面311相對的第二表面312(例如下表面)、以及第一定位槽322。在本發明圖式的實施方式中,前述第一定位槽322為兩個且沿前述第一方向D1-D1分別位於前述第一絕緣基部313的兩端。In order to reduce the manufacturing difficulty of the aforementioned first test fixture 31 and the aforementioned second test fixture 41 in the aforementioned first embodiment and the aforementioned second embodiment, the present invention proposes a new design idea. Please refer to Figures 19 to 25. In the third embodiment of the present invention, the aforementioned first detection assembly 30 includes a first test fixture 31. The aforementioned first test fixture 31 includes a first insulating base 313 and a first conductive part 35 fixed in the aforementioned first insulating base 313. The aforementioned first insulating base 313 includes a first surface 311 (for example, an upper surface), a second surface 312 (for example, a lower surface) opposite to the aforementioned first surface 311, and a first positioning groove 322. In the embodiment of the drawings of the present invention, the aforementioned first positioning groove 322 is two and is respectively located at the two ends of the aforementioned first insulating base 313 along the aforementioned first direction D1-D1.
前述第一導電部35包括沿前述第一方向D1-D1間隔佈置的複數第一開關部354。每一個第一開關部354包括沿前述第二方向D2-D2延伸的第一條狀部3541以及與前述第一條狀部3541相連的第一測試柱3542。前述第一條狀部3541至少與兩個前述導電端子2的前述第一彈性臂21相接觸。前述第一測試柱3542為複數個且至少暴露於前述第一表面311。前述第一測試柱3542沿前述第一測試治具31的厚度方向至少部分位於前述第一表面311和前述第二表面312之間。在本發明圖式的實施方式中,前述第一測試柱3542向上凸出前述第一表面311。The first conductive portion 35 includes a plurality of first switch portions 354 arranged at intervals along the first direction D1-D1. Each first switch portion 354 includes a first strip portion 3541 extending along the second direction D2-D2 and a first test column 3542 connected to the first strip portion 3541. The first strip portion 3541 is in contact with at least the first elastic arms 21 of the two conductive terminals 2. The first test columns 3542 are plural and at least exposed to the first surface 311. The first test columns 3542 are at least partially located between the first surface 311 and the second surface 312 along the thickness direction of the first test fixture 31. In the embodiment of the drawings of the present invention, the first test columns 3542 protrude upward from the first surface 311.
前述第二檢測組件40包括第二測試治具41。前述第二測試治具41包括第二絕緣基部413以及固定在前述第二絕緣基部413中的第二導電部45。前述第二絕緣基部413包括第三表面411(例如上表面)、與前述第三表面411相對的第四表面412(例如下表面)、以及第二定位槽422。在本發明圖式的實施方式中,前述第二定位槽422為兩個且沿前述第一方向D1-D1分別位於前述第二絕緣基部413的兩端。The second detection assembly 40 includes a second test fixture 41. The second test fixture 41 includes a second insulating base 413 and a second conductive portion 45 fixed in the second insulating base 413. The second insulating base 413 includes a third surface 411 (e.g., an upper surface), a fourth surface 412 (e.g., a lower surface) opposite to the third surface 411, and a second positioning groove 422. In the embodiment of the present invention, the second positioning groove 422 is two and is respectively located at two ends of the second insulating base 413 along the first direction D1-D1.
前述第二導電部45包括沿前述第二方向D2-D2間隔佈置的複數第二開關部454。每一個第二開關部454包括沿前述第一方向D1-D1延伸的第二條狀部4541以及與前述第二條狀部4541相連的第二測試柱4542。前述第二條狀部4541至少與兩個前述導電端子2的前述第二彈性臂22相接觸。前述第二測試柱4542為複數個且至少暴露於前述第四表面412。前述第二測試柱4542沿前述第二測試治具41的厚度方向至少部分位於前述第三表面411和前述第四表面412之間。在本發明圖式的實施方式中,前述第二測試柱4542向下凸出前述第四表面412。The second conductive portion 45 includes a plurality of second switch portions 454 arranged at intervals along the second direction D2-D2. Each second switch portion 454 includes a second strip portion 4541 extending along the first direction D1-D1 and a second test column 4542 connected to the second strip portion 4541. The second strip portion 4541 is in contact with at least the second elastic arms 22 of the two conductive terminals 2. The second test columns 4542 are plural and at least exposed to the fourth surface 412. The second test columns 4542 are at least partially located between the third surface 411 and the fourth surface 412 along the thickness direction of the second test fixture 41. In the embodiment of the drawings of the present invention, the second test columns 4542 protrude downward from the fourth surface 412.
藉由連接兩個前述第一條狀部3541或者連接兩個前述第二條狀部4541能夠形成前述檢測電路。前述技術領域的技術人員能夠理解,連接兩個前述第一條狀部3541的方式可以係將兩個前述第一條狀部3541上的第一測試柱3542連接起來;連接兩個前述第二條狀部4541的方式可以係將兩個前述第二條狀部4541上的第二測試柱4542連接起來。The detection circuit can be formed by connecting two of the first strips 3541 or connecting two of the second strips 4541. A person skilled in the art can understand that the two first strips 3541 can be connected by connecting the first test posts 3542 on the two first strips 3541; and the two second strips 4541 can be connected by connecting the second test posts 4542 on the two second strips 4541.
請結合圖26至圖30所示,在本發明的第四實施方式中,前述第一檢測組件30包括第一測試治具31。前述第一測試治具31包括第一絕緣基部313以及固定在前述第一絕緣基部313中的第一導電部35。前述第一絕緣基部313包括第一表面311(例如上表面)、與前述第一表面311相對的第二表面312(例如下表面)、以及第一定位槽322。在本發明圖式的實施方式中,前述第一定位槽322為兩個且沿前述第一方向D1-D1分別位於前述第一絕緣基部313的兩端。Please refer to FIG. 26 to FIG. 30 , in the fourth embodiment of the present invention, the first detection assembly 30 includes a first test fixture 31. The first test fixture 31 includes a first insulating base 313 and a first conductive portion 35 fixed in the first insulating base 313. The first insulating base 313 includes a first surface 311 (e.g., an upper surface), a second surface 312 (e.g., a lower surface) opposite to the first surface 311, and a first positioning groove 322. In the embodiment of the present invention, there are two first positioning grooves 322 and they are respectively located at two ends of the first insulating base 313 along the first direction D1-D1.
前述第一導電部35為一一對應於前述第一彈性臂21且與前述第一彈性臂21相接觸的複數第一開關測試柱355。在本發明圖式的實施方式中,每一個第一開關測試柱355的底面與相應的第一彈性臂21相接觸,每一個第一開關測試柱355具有向上開放的開孔3551,以便於後續藉由插入導電連接件將不同的第一開關測試柱355連接起來。前述第一開關測試柱355沿前述第一測試治具31的厚度方向至少部分位於前述第一表面311和前述第二表面312之間,且前述第一開關測試柱355至少暴露於前述第一表面311。在本發明圖式的實施方式中,前述第一開關測試柱355向上凸出前述第一表面311。The first conductive portion 35 is a plurality of first switch test posts 355 corresponding to the first elastic arm 21 and contacting the first elastic arm 21. In the embodiment of the present invention, the bottom surface of each first switch test post 355 contacts the corresponding first elastic arm 21, and each first switch test post 355 has an opening 3551 open upward, so that different first switch test posts 355 can be connected by inserting a conductive connector. The first switch test posts 355 are at least partially located between the first surface 311 and the second surface 312 along the thickness direction of the first test fixture 31, and the first switch test posts 355 are at least exposed to the first surface 311. In the embodiment of the present invention, the first switch test posts 355 protrude upward from the first surface 311.
前述第二檢測組件40包括第二測試治具41。前述第二測試治具41包括第二絕緣基部413以及固定在前述第二絕緣基部413中的第二導電部45。前述第二絕緣基部413包括第三表面411(例如上表面)、與前述第三表面411相對的第四表面412(例如下表面)、以及第二定位槽422。在本發明圖式的實施方式中,前述第二定位槽422為兩個且沿前述第一方向D1-D1分別位於前述第二絕緣基部413的兩端。The second detection assembly 40 includes a second test fixture 41. The second test fixture 41 includes a second insulating base 413 and a second conductive portion 45 fixed in the second insulating base 413. The second insulating base 413 includes a third surface 411 (e.g., an upper surface), a fourth surface 412 (e.g., a lower surface) opposite to the third surface 411, and a second positioning groove 422. In the embodiment of the present invention, the second positioning groove 422 is two and is respectively located at two ends of the second insulating base 413 along the first direction D1-D1.
前述第二導電部45包括複數第二開關部454。每一個第二開關部454包括本體部455以及與前述本體部455相連的第二測試柱4542。前述第二測試柱4542沿前述第二測試治具41的厚度方向至少部分位於前述第三表面411和前述第四表面412之間。在本發明圖式的實施方式中,前述第二測試柱4542向下凸出前述第四表面412。前述本體部455與沿前述第一方向D1-D1以及與沿前述第二方向D2-D2分佈的至少部分複數導電端子2的前述第二彈性臂22相接觸。藉由連接兩個前述第一開關測試柱355能夠形成前述檢測電路。The second conductive portion 45 includes a plurality of second switch portions 454. Each second switch portion 454 includes a body portion 455 and a second test column 4542 connected to the body portion 455. The second test column 4542 is at least partially located between the third surface 411 and the fourth surface 412 along the thickness direction of the second test fixture 41. In the embodiment of the diagram of the present invention, the second test column 4542 protrudes downward from the fourth surface 412. The body portion 455 contacts the second elastic arm 22 of at least a portion of the plurality of conductive terminals 2 distributed along the first direction D1-D1 and along the second direction D2-D2. The detection circuit can be formed by connecting two of the first switch test columns 355.
所屬技術領域的技術人員能夠理解,由於前述第一開關測試柱355係相互獨立的,藉由前述導電連接件將不同的第一開關測試柱355連接起來,該檢測電路上的導電端子2容易被鎖定。是以,一旦前述檢測電路的輸出訊號出現問題,便能夠精準地判斷出究竟係哪個導電端子2發生了異常,有利於提高檢測的精準度。Those skilled in the art will understand that since the first switch test posts 355 are independent of each other, the conductive connectors are used to connect different first switch test posts 355, so that the conductive terminals 2 on the detection circuit can be easily locked. Therefore, once the output signal of the detection circuit has a problem, it can be accurately determined which conductive terminal 2 has an abnormality, which is conducive to improving the accuracy of the detection.
相較於習知技術,本發明的檢測治具包括第一檢測組件30和第二檢測組件40,其中前述第一檢測組件30配置為抵壓前述第一彈性臂21使前述第一彈性臂21發生彈性變形;前述第二檢測組件40配置為抵壓前述第二彈性臂22使前述第二彈性臂22發生彈性變形,以對前述導電端子2的下壓量進行控制。另,前述第一導電部35、前述對應的第一彈性臂21、前述對應的第二彈性臂22以及前述第二導電部45形成檢測電路(例如串聯形成檢測電路),用以對該檢測電路中的前述導電端子2進行檢測,提高了檢測的便利性和精準度。Compared with the prior art, the detection fixture of the present invention includes a first detection assembly 30 and a second detection assembly 40, wherein the first detection assembly 30 is configured to press the first elastic arm 21 to cause the first elastic arm 21 to be elastically deformed; the second detection assembly 40 is configured to press the second elastic arm 22 to cause the second elastic arm 22 to be elastically deformed, so as to control the downward pressure of the conductive terminal 2. In addition, the first conductive part 35, the corresponding first elastic arm 21, the corresponding second elastic arm 22 and the second conductive part 45 form a detection circuit (for example, a detection circuit formed in series), which is used to detect the conductive terminal 2 in the detection circuit, thereby improving the convenience and accuracy of the detection.
以上實施方式僅用於說明本發明而並非限制本發明所描述的技術方案,對本發明的理解應該以所屬技術領域的技術人員為基礎,儘管本說明書參照前述的實施方式對本發明已進行了詳細的說明,惟,本領域的普通技術人員應當理解,所屬技術領域的技術人員仍然可以對本發明進行修改或者等同替換,而一切不脫離本發明的精神和範圍的技術方案及其改進,均應涵蓋在本發明的申請專利範圍內。The above embodiments are only used to illustrate the present invention and are not intended to limit the technical solutions described in the present invention. The understanding of the present invention should be based on the technical personnel in the relevant technical field. Although this specification has described the present invention in detail with reference to the aforementioned embodiments, ordinary technical personnel in the relevant technical field should understand that the technical personnel in the relevant technical field can still modify or replace the present invention with equivalents, and all technical solutions and improvements thereof that do not deviate from the spirit and scope of the present invention should be covered within the scope of the patent application of the present invention.
1:絕緣本體 100:板對板連接器 11:第一安裝表面 12:第二安裝表面 13:第一夾持塊 14:第二夾持塊 2:導電端子 20:固定部 21:第一彈性臂 22:第二彈性臂 30:第一檢測組件 31:第一測試治具 311:第一表面 312:第二表面 313:第一絕緣基部 32:第一固定座 321:第一中間鏤空槽 322:第一定位槽 33:第一壓片 34:第一緊固件 35:第一導電部 351:第一導電柱 352:第一連接片 353:第一U型連接路徑 354:第一開關部 3541:第一條狀部 3542:第一測試柱 355:第一開關測試柱 3551:開孔 36:第一轉接模組 361:第一轉接殼體 362:第一轉接端子 3621:第一固定部 3622:第一活動部 40:第二檢測組件 41:第二測試治具 411:第三表面 412:第四表面 413:第二絕緣基部 42:第二固定座 421:第二中間鏤空槽 422:第二定位槽 43:第二壓片 44:第二緊固件 45:第二導電部 451:第二導電柱 452:第二連接片 453:第二U型連接路徑 454:第二開關部 4541:第二條狀部 4542:第二測試柱 455:本體部 46:第二轉接模組 461:第二轉接殼體 462:第二轉接端子 4621:第二固定部 4622:第二活動部 A-A,C-C,E-E,G-G:線 B:圖10中畫框部分 D:圖17中畫框部分 D1-D1:第一方向 D2-D2:第二方向 F:圖24中畫框部分 G1:第一間隙 G2:第二間隙 H:圖29中畫框部分 H1,H2, H1’, H2’:高度 H1-H1’:第一下壓量 H2-H2’:第二下壓量 Input:訊號輸入端 Output:訊號輸出端1: Insulating body 100: Board-to-board connector 11: First mounting surface 12: Second mounting surface 13: First clamping block 14: Second clamping block 2: Conductive terminal 20: Fixing part 21: First elastic arm 22: Second elastic arm 30: First detection assembly 31: First test fixture 311: First surface 312: Second surface 313: First insulating base 32: First fixing seat 321: First middle hollow groove 322: First positioning groove 33: First pressing plate 34: First fastener 35: First conductive part 351: First conductive column 352: First connecting piece 353: first U-shaped connection path 354: first switch part 3541: first strip part 3542: first test column 355: first switch test column 3551: opening 36: first adapter module 361: first adapter housing 362: first adapter terminal 3621: first fixed part 3622: first movable part 40: second detection assembly 41: second test fixture 411: third surface 412: fourth surface 413: second insulating base 42: second fixing seat 421: second middle hollow groove 422: second positioning groove 43: second pressing plate 44: second fastener 45: second conductive part 451: second conductive column 452: Second connecting piece 453: Second U-shaped connecting path 454: Second switch part 4541: Second strip part 4542: Second test column 455: Main body 46: Second adapter module 461: Second adapter housing 462: Second adapter terminal 4621: Second fixed part 4622: Second movable part A-A, C-C, E-E, G-G: Line B: Picture frame part in Figure 10 D: Picture frame part in Figure 17 D1-D1: First direction D2-D2: Second direction F: Picture frame part in Figure 24 G1: First gap G2: Second gap H: Picture frame part in Figure 29 H1, H2, H1’, H2’: Height H1-H1’: First downward pressure H2-H2’: Second pressure drop Input: Signal input terminal Output: Signal output terminal
圖1係本發明第一實施方式中的檢測治具與板對板連接器組裝在一起時的立體示意圖。 圖2係圖1的部分立體分解圖。 圖3係圖2另一角度的部分立體分解圖。 圖4係圖2進一步的部分立體分解圖。 圖5係圖4另一角度的部分立體分解圖。 圖6係圖4進一步的立體分解圖。 圖7係圖6另一角度的立體分解圖。 圖8係圖6中一個導電端子的立體示意圖。 圖9係圖8另一角度的立體示意圖。 圖10係沿圖1中A-A線的剖面示意圖。 圖11係圖10中畫框部分B的局部放大圖。 圖12係本發明第二實施方式中的檢測治具與板對板連接器組裝在一起時的立體示意圖。 圖13係圖12的部分立體分解圖。 圖14係圖13另一角度的部分立體分解圖。 圖15係圖13進一步的部分立體分解圖。 圖16係圖15另一角度的部分立體分解圖。 圖17係沿圖12中C-C線的剖面示意圖。 圖18係圖17中畫框部分D的局部放大圖。 圖19係本發明第三實施方式中的檢測治具與板對板連接器組裝在一起時的立體示意圖。 圖20係圖19的部分立體分解圖。 圖21係圖20另一角度的部分立體分解圖。 圖22係圖20進一步的部分立體分解圖。 圖23係圖22另一角度的部分立體分解圖。 圖24係沿圖19中E-E線的剖面示意圖。 圖25係圖24中畫框部分F的局部放大圖。 圖26係本發明第四實施方式中的檢測治具與板對板連接器組裝在一起時的立體示意圖。 圖27係圖26的部分立體分解圖。 圖28係圖27另一角度的部分立體分解圖。 圖29係沿圖26中G-G線的剖面示意圖。 圖30係圖29中畫框部分H的局部放大圖。 圖31係本發明第一實施方式中的前述板對板連接器的一個導電端子在被前述檢測治具下壓前和下壓後的對比示意圖。FIG1 is a three-dimensional schematic diagram of the detection fixture and the board-to-board connector in the first embodiment of the present invention when they are assembled together. FIG2 is a partial three-dimensional exploded view of FIG1. FIG3 is a partial three-dimensional exploded view of FIG2 from another angle. FIG4 is a further three-dimensional exploded view of FIG2. FIG5 is a partial three-dimensional exploded view of FIG4 from another angle. FIG6 is a further three-dimensional exploded view of FIG4. FIG7 is a three-dimensional exploded view of FIG6 from another angle. FIG8 is a three-dimensional schematic diagram of a conductive terminal in FIG6. FIG9 is a three-dimensional schematic diagram of FIG8 from another angle. FIG10 is a cross-sectional schematic diagram along the A-A line in FIG1. FIG11 is a partial enlarged view of the frame portion B in FIG10. FIG12 is a three-dimensional schematic diagram of the detection fixture and the board-to-board connector in the second embodiment of the present invention when they are assembled together. FIG13 is a partial three-dimensional exploded view of FIG12. Fig. 14 is a partial three-dimensional exploded view from another angle of Fig. 13. Fig. 15 is a further partial three-dimensional exploded view of Fig. 13. Fig. 16 is a partial three-dimensional exploded view from another angle of Fig. 15. Fig. 17 is a schematic cross-sectional view along line C-C in Fig. 12. Fig. 18 is a partial enlarged view of the frame portion D in Fig. 17. Fig. 19 is a schematic three-dimensional view of the detection fixture and the board-to-board connector in the third embodiment of the present invention when assembled together. Fig. 20 is a partial three-dimensional exploded view of Fig. 19. Fig. 21 is a partial three-dimensional exploded view from another angle of Fig. 20. Fig. 22 is a further partial three-dimensional exploded view of Fig. 20. Fig. 23 is a partial three-dimensional exploded view from another angle of Fig. 22. Fig. 24 is a schematic cross-sectional view along line E-E in Fig. 19. Fig. 25 is a partial enlarged view of the frame portion F in Fig. 24. FIG26 is a three-dimensional schematic diagram of the detection fixture and the board-to-board connector in the fourth embodiment of the present invention when assembled together. FIG27 is a partial three-dimensional exploded view of FIG26. FIG28 is a partial three-dimensional exploded view of FIG27 from another angle. FIG29 is a cross-sectional schematic diagram along the G-G line in FIG26. FIG30 is a partial enlarged view of the frame portion H in FIG29. FIG31 is a comparative schematic diagram of a conductive terminal of the board-to-board connector in the first embodiment of the present invention before and after being pressed down by the detection fixture.
1:絕緣本體 1: Insulation body
100:板對板連接器 100: Board-to-board connector
11:第一安裝表面 11: First mounting surface
12:第二安裝表面 12: Second mounting surface
2:導電端子 2: Conductive terminal
21:第一彈性臂 21: First elastic arm
22:第二彈性臂 22: Second elastic arm
31:第一測試治具 31: The first test fixture
311:第一表面 311: First surface
312:第二表面 312: Second surface
351:第一導電柱 351: First conductive column
352:第一連接片 352: First connecting piece
353:第一U型連接路徑 353: First U-shaped connection path
41:第二測試治具 41: Second test fixture
411:第三表面 411: Third surface
412:第四表面 412: The fourth surface
451:第二導電柱 451: Second conductive column
452:第二連接片 452: Second connecting piece
453:第二U型連接路徑 453: Second U-shaped connection path
B:圖10中畫框部分 B: The frame part in Figure 10
G1:第一間隙 G1: First gap
G2:第二間隙 G2: Second gap
Input:訊號輸入端 Input: signal input terminal
Claims (15)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW112144346A TWI866615B (en) | 2023-11-16 | 2023-11-16 | Testing fixture |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW112144346A TWI866615B (en) | 2023-11-16 | 2023-11-16 | Testing fixture |
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| Publication Number | Publication Date |
|---|---|
| TWI866615B true TWI866615B (en) | 2024-12-11 |
| TW202522621A TW202522621A (en) | 2025-06-01 |
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| Application Number | Title | Priority Date | Filing Date |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWM263666U (en) * | 2004-09-15 | 2005-05-01 | Hannstar Electronics Corp | Board-to-board connector |
| TW202104922A (en) * | 2019-07-17 | 2021-02-01 | 美商第一檢測有限公司 | Chip testing system |
| TW202144800A (en) * | 2020-05-22 | 2021-12-01 | 美商第一檢測有限公司 | Environmental control device and chip testing system |
| TWM621736U (en) * | 2021-07-19 | 2022-01-01 | 捷創科技股份有限公司 | Detection equipment and anti-deflection device thereof |
| TWM634402U (en) * | 2022-05-23 | 2022-11-21 | 久元電子股份有限公司 | Test kits and test equipment |
-
2023
- 2023-11-16 TW TW112144346A patent/TWI866615B/en active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWM263666U (en) * | 2004-09-15 | 2005-05-01 | Hannstar Electronics Corp | Board-to-board connector |
| TW202104922A (en) * | 2019-07-17 | 2021-02-01 | 美商第一檢測有限公司 | Chip testing system |
| TW202144800A (en) * | 2020-05-22 | 2021-12-01 | 美商第一檢測有限公司 | Environmental control device and chip testing system |
| TWM621736U (en) * | 2021-07-19 | 2022-01-01 | 捷創科技股份有限公司 | Detection equipment and anti-deflection device thereof |
| TWM634402U (en) * | 2022-05-23 | 2022-11-21 | 久元電子股份有限公司 | Test kits and test equipment |
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| TW202522621A (en) | 2025-06-01 |
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