TWI862818B - Methods and systems for circuit fabrication - Google Patents
Methods and systems for circuit fabrication Download PDFInfo
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- TWI862818B TWI862818B TW110112858A TW110112858A TWI862818B TW I862818 B TWI862818 B TW I862818B TW 110112858 A TW110112858 A TW 110112858A TW 110112858 A TW110112858 A TW 110112858A TW I862818 B TWI862818 B TW I862818B
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- H10W72/0112—
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C26/00—Coating not provided for in groups C23C2/00 - C23C24/00
- C23C26/02—Coating not provided for in groups C23C2/00 - C23C24/00 applying molten material to the substrate
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/20—Bonding
- B23K26/21—Bonding by welding
- B23K26/211—Bonding by welding with interposition of special material to facilitate connection of the parts
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- H10W72/012—
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- H10W72/01223—
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- H10W72/01257—
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- H10W72/07141—
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- H10W72/07173—
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- H10W72/072—
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- H10W72/07234—
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- H10W72/07235—
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- H10W72/07236—
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- H10W72/241—
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- Electric Connection Of Electric Components To Printed Circuits (AREA)
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Abstract
Description
本發明大體上係關於電子裝置之製造,且特定言之係關於用於焊接之方法及系統。 The present invention generally relates to the manufacture of electronic devices, and more particularly to methods and systems for soldering.
在雷射直寫(LDW)技術中,一雷射光束用於藉由受控材料燒蝕或沈積來產生具有空間解析之三維結構之一圖案化表面。雷射誘導之正向轉移(LIFT)係一種LDW技術,其可用於在一表面上沈積微圖案。 In laser direct writing (LDW), a laser beam is used to produce a patterned surface with a spatially resolved three-dimensional structure by controlled material ablation or deposition. Laser-induced forward transfer (LIFT) is a type of LDW technique that can be used to deposit micropatterns on a surface.
在LIFT中,雷射光子提供驅動力以將小體積材料自一供體膜射向一受體基板。典型而言,雷射光束與供體膜之內側相互作用,該供體膜之內側經塗覆至一非吸收性載體基底上。換言之,入射雷射光束在光子由膜之內表面吸收之前傳播通過透明載體基板。超過某一能量臨限值,材料自供體膜朝向受體基板之表面噴射。在適當選擇供體膜及雷射光束脈衝參數之後,雷射脈衝使供體材料之熔融液滴自膜噴出,且接著降落並硬化至受體基板上。 In LIFT, laser photons provide the driving force to eject small volumes of material from a donor film toward a receiver substrate. Typically, the laser beam interacts with the inside of the donor film, which is coated onto a non-absorbing carrier substrate. In other words, the incident laser beam propagates through the transparent carrier substrate before the photons are absorbed by the inner surface of the film. Beyond a certain energy threshold, the material is ejected from the donor film toward the surface of the receiver substrate. After appropriate selection of the donor film and laser beam pulse parameters, the laser pulse causes molten droplets of the donor material to eject from the film, and then land and harden onto the receiver substrate.
LIFT系統特別(儘管不排他)可用於印刷導電金屬滴及跡線用於電子電路製造。例如,在美國專利9,925,797中描述此一LIFT系統,該專利之揭示內容以引用的方式併入本文中。此專利描述一種印刷設備,其包含一供體供應總成,其經組態以提供具有相對第一及第二表面及形成 在第二表面上之一供體膜之一透明供體基板,以將供體膜定位在一受體基板上之一目標區域附近。一光學總成經組態以以一預定空間圖案同時引導多個雷射輻射之輸出光束穿過供體基板之第一表面並照射在供體膜上,以便誘導材料自供體膜噴射至受體基板上,藉此將預定圖案書寫至受體基板之目標區域上。 LIFT systems are particularly, though not exclusively, useful for printing conductive metal drops and traces for electronic circuit fabrication. Such a LIFT system is described, for example, in U.S. Patent 9,925,797, the disclosure of which is incorporated herein by reference. This patent describes a printing apparatus comprising a donor supply assembly configured to provide a transparent donor substrate having opposing first and second surfaces and a donor film formed on the second surface to position the donor film proximate a target area on a receptor substrate. An optical assembly is configured to simultaneously direct multiple output beams of laser radiation in a predetermined spatial pattern through the first surface of the donor substrate and onto the donor film to induce material to be ejected from the donor film onto the receptor substrate, thereby writing the predetermined pattern onto the target area of the receptor substrate.
下文所描述之本發明之實施例提供用於製造電路及裝置之改良方法及系統。 Embodiments of the present invention described below provide improved methods and systems for manufacturing circuits and devices.
因此,根據本發明之一實施例,提供一種用於電路製造之方法,其包含:界定待形成於一受體基板上之一目標位置處之一焊料凸塊,該焊料凸塊包含一指定焊料材料且具有一指定凸塊體積。將具有相對第一及第二表面之一透明供體基板及包含該指定焊料材料之一供體膜定位於該第二表面上,使得該供體膜接近該受體基板上之該目標位置。引導雷射輻射之一脈衝序列穿過該供體基板之該第一表面並照射在該供體膜上,以便誘導自該供體膜噴射該焊料材料之數個熔融液滴至該受體基板上之該目標位置上,使得沈積在該目標位置處之該等液滴累積達成該指定凸塊體積。加熱該目標位置,使得該等沈積液滴熔融並回流以形成該焊料凸塊。 Therefore, according to one embodiment of the present invention, a method for circuit manufacturing is provided, which includes: defining a solder bump to be formed at a target location on a receptor substrate, the solder bump comprising a specified solder material and having a specified bump volume. Positioning a transparent donor substrate having first and second surfaces opposite to each other and a donor film comprising the specified solder material on the second surface such that the donor film is close to the target location on the receptor substrate. Directing a pulse sequence of laser radiation through the first surface of the donor substrate and irradiating the donor film so as to induce a plurality of molten droplets of the solder material to be ejected from the donor film onto the target location on the receptor substrate, such that the droplets deposited at the target location accumulate to achieve the specified bump volume. The target location is heated so that the deposited droplets melt and reflow to form the solder bump.
通常,該等液滴具有取決於該雷射輻射之該等脈衝之一強度之各別液滴體積,且引導該等脈衝之該序列包含回應於該指定凸塊之體積而設定雷射輻射之該等脈衝之該強度及該序列中之該等脈衝之數目。在一所揭示實施例中,該等液滴體積進一步取決於一組脈衝參數,該組脈衝參數包括該雷射輻射之該等脈衝之一光點大小及持續時間,且其中引導該等脈衝之該序列進一步包含藉由改變該等脈衝參數之一或多者來調整該等 液滴體積。 Typically, the droplets have respective droplet volumes that depend on an intensity of the pulses of the laser radiation, and directing the sequence of pulses includes setting the intensity of the pulses of the laser radiation and the number of pulses in the sequence in response to the volume of the designated bump. In one disclosed embodiment, the droplet volumes further depend on a set of pulse parameters, including a spot size and duration of the pulses of the laser radiation, and directing the sequence of pulses further includes adjusting the droplet volumes by varying one or more of the pulse parameters.
在一些實施例中,界定該焊料凸塊包含:在相同受體基板上之不同、各別第一及第二目標位置處,界定具有不同、各別第一及第二凸塊體積之第一及第二焊料凸塊,且引導該脈衝序列包含引導該等脈衝之不同、第一及第二序列通過該供體基板上之不同點,使得該等液滴在該等各別第一及第二目標位置處累積地達成該等不同第一及第二凸塊體積之各者。在一個實施例中,界定該第一焊料凸塊及該第二焊料凸塊包含指定該第一焊料凸塊及該第二焊料凸塊之不同、各別第一及第二組合物,且定位該透明供體基板包含提供包含經選擇以便產生該第一組合物及該第二組合物之複數個不同焊料材料之一或多個供體膜。 In some embodiments, defining the solder bump includes defining first and second solder bumps having different, respective first and second bump volumes at different, respective first and second target locations on the same receptor substrate, and directing the pulse sequence includes directing different, first and second sequences of pulses through different points on the donor substrate such that the droplets cumulatively reach each of the different first and second bump volumes at the respective first and second target locations. In one embodiment, defining the first solder bump and the second solder bump includes specifying different, respective first and second compositions of the first solder bump and the second solder bump, and positioning the transparent donor substrate includes providing one or more donor films including a plurality of different solder materials selected to produce the first composition and the second composition.
另外或替代地,界定該焊料凸塊包含界定具有不同、各別第一及第二組合物之第一焊料凸塊及第二焊料凸塊,且定位該透明供體基板包含提供包含複數個不同焊料材料以產生該第一組合物及該第二組合物之一或多個供體膜。 Additionally or alternatively, defining the solder bump includes defining a first solder bump and a second solder bump having different, respective first and second compositions, and positioning the transparent donor substrate includes providing one or more donor films comprising a plurality of different solder materials to produce the first composition and the second composition.
進一步額外或替代地,界定該焊料凸塊包含指定該焊料凸塊之一組合物,該組合物包含不同、第一及第二材料,且定位該透明供體基板包含提供分別包含該第一材料及該第二材料之第一供體膜及第二供體膜,且引導該脈衝序列包含引導該等脈衝之第一序列及第二序列分別照射在該第一供體膜及該第二供體膜上,使得沈積在該目標位置處之該等液滴累積地達成該指定組合物。在一個實施例中,指定該組合物包含指定該焊料凸塊之該組合物中之該等材料之一梯度,且引導該等脈衝之該第一序列及該第二序列包含根據該指定梯度將該第一材料及該第二材料之該等液滴沈積在該目標位置上之多個層中。 Further additionally or alternatively, defining the solder bump includes specifying a composition of the solder bump, the composition including different, first and second materials, and positioning the transparent donor substrate includes providing a first donor film and a second donor film including the first material and the second material, respectively, and directing the sequence of pulses includes directing the first sequence and the second sequence of pulses to irradiate the first donor film and the second donor film, respectively, so that the droplets deposited at the target location cumulatively reach the specified composition. In one embodiment, specifying the composition includes specifying a gradient of the materials in the composition of the solder bump, and directing the first sequence and the second sequence of pulses includes depositing the droplets of the first material and the second material in multiple layers on the target location according to the specified gradient.
在一些實施例中,引導該等脈衝之該序列包含將該等液滴沈積在該目標位置上之多層中,以便達成該指定凸塊體積。在一所揭示實施例中,加熱該目標位置包含多次交替地沈積液滴之一層且加熱該層以熔融該等液滴,直至達成該指定凸塊體積為止。 In some embodiments, directing the sequence of pulses includes depositing the droplets in multiple layers on the target location to achieve the specified bump volume. In one disclosed embodiment, heating the target location includes alternately depositing a layer of droplets multiple times and heating the layer to melt the droplets until the specified bump volume is achieved.
另外或替代地,界定該焊料凸塊包含指定該焊料凸塊之一形狀,且引導該等脈衝之該序列包含以符合該指定形狀之一圖案沈積該等熔融液滴。 Additionally or alternatively, defining the solder bump includes specifying a shape of the solder bump, and directing the sequence of pulses includes depositing the molten droplets in a pattern conforming to the specified shape.
在進一步實施例中,加熱該目標位置包含引導一雷射光束以充分能量照射該目標位置以使該等所沈積液滴熔融並回流。通常,引導該雷射光束包含將一或多個雷射脈衝聚焦至該目標位置上。 In a further embodiment, heating the target location includes directing a laser beam to irradiate the target location with sufficient energy to melt and reflow the deposited droplets. Typically, directing the laser beam includes focusing one or more laser pulses onto the target location.
在一些實施例中,該方法包含使用雷射誘導之正向轉移(LIFT)之一程序在該受體基板上之該目標位置處印刷一導電襯墊,其中引導該等脈衝之該序列包含沈積該焊料材料在該經印刷導電襯墊上之該等熔融液滴。在一所揭示實施例中,印刷該導電襯墊包含在該導電襯墊中形成一凹面用於在該凹面中沈積該等熔融液滴。 In some embodiments, the method includes printing a conductive pad at the target location on the receptor substrate using a laser induced forward transfer (LIFT) process, wherein the sequence of directing the pulses includes depositing the molten droplets of the solder material on the printed conductive pad. In one disclosed embodiment, printing the conductive pad includes forming a concave surface in the conductive pad for depositing the molten droplets in the concave surface.
根據本發明之一實施例,亦提供一種用於電路製造之系統,其包含一控制器,該控制器經組態以接收待形成於一受體基板上之一目標位置處之一焊料凸塊之一界定,該焊料凸塊包含一指定焊料材料且具有一指定凸塊體積。一印刷站包含一透明供體基板,該透明供體基板具有相對第一及第二表面且具有包含安置於該第二表面上之該指定焊料材料之一供體膜,且該透明供體基板經定位使得該供體膜接近該受體基板上之該目標位置。一雷射經組態以引導雷射輻射之一脈衝序列穿過該供體基板之該第一表面並照射在該供體膜上以誘發該焊料材料之熔融液滴自該供體膜 噴射至該受體基板上之該目標位置上。該控制器經組態以驅動該印刷站朝向該目標位置噴射數個液滴,使得沈積在該目標位置處之該等液滴累積地達成該指定凸塊體積。一回流站經組態以加熱該目標位置,使得該沈積液滴熔融並回流以形成該焊料凸塊。 According to an embodiment of the present invention, a system for circuit manufacturing is also provided, which includes a controller configured to receive a definition of a solder bump to be formed at a target location on a receptor substrate, the solder bump including a specified solder material and having a specified bump volume. A printing station includes a transparent donor substrate having first and second opposing surfaces and having a donor film including the specified solder material disposed on the second surface, and the transparent donor substrate is positioned so that the donor film is proximate to the target location on the receptor substrate. A laser is configured to direct a pulse sequence of laser radiation through the first surface of the donor substrate and onto the donor film to induce molten droplets of the solder material to be ejected from the donor film onto the target location on the receptor substrate. The controller is configured to drive the printing station to spray a plurality of droplets toward the target position, so that the droplets deposited at the target position cumulatively achieve the specified bump volume. A reflow station is configured to heat the target position so that the deposited droplets melt and reflow to form the solder bump.
根據本發明之一實施例,額外提供一種用於電路製造之方法,其包含:將一或多個目標位置處之一焊料材料沈積於一電路基板上;及用充分能量將一雷射束之一或多個脈衝聚焦至該等目標位置之各者上以使該等沈積液滴熔融並回流以便形成焊料凸塊。 According to one embodiment of the present invention, a method for circuit manufacturing is additionally provided, which includes: depositing a solder material at one or more target locations on a circuit substrate; and focusing one or more pulses of a laser beam with sufficient energy onto each of the target locations to melt and reflow the deposited droplets to form solder bumps.
在一所揭示實施例中,沈積該焊料材料包含朝向該一或多個目標位置噴射該焊料材料之熔融液滴。 In one disclosed embodiment, depositing the solder material includes ejecting molten droplets of the solder material toward the one or more target locations.
在一些實施例中,該等脈衝具有不大於1ms,且可行地不小於100μs之一脈衝持續時間。 In some embodiments, the pulses have a pulse duration of no more than 1 ms, and preferably no less than 100 μs.
額外或替代地,該等脈衝具有不大於2mJ之一脈衝能量。 Additionally or alternatively, the pulses have a pulse energy of no more than 2 mJ.
額外或替代地,該等脈衝具有不大於3mJ之一脈衝能量。在一所揭示實施例中,聚焦該一或多個脈衝包含將該雷射束之一單一、各別脈衝聚焦至該等目標位置之各者上。 Additionally or alternatively, the pulses have a pulse energy of no greater than 3 mJ. In one disclosed embodiment, focusing the one or more pulses includes focusing a single, individual pulse of the laser beam onto each of the target locations.
將自本發明之實施例之以下[實施方式]連同附圖更全面理解本發明,其中: The present invention will be more fully understood from the following [implementation method] of the present invention together with the attached drawings, wherein:
20:系統 20: System
22:印刷站 22: Printing station
24:回流站 24: Reflow station
26:放置站 26: Placement Station
28:最終回流站 28: Final return station
30:光學總成 30:Optical assembly
32:液滴 32: Droplets
34:受體基板 34: Receptor substrate
36:X-Y平台 36: X-Y platform
38:雷射 38: Laser
40:光束偏轉器 40: Beam deflector
42:聚焦光學器件 42: Focusing optical devices
44:供體箔片 44: Donor foil
46:供體基板 46: Donor substrate
48:供體膜 48: Donor membrane
50:液滴 50: Droplets
51:控制器 51: Controller
52:光學總成 52: Optical assembly
54:雷射 54:Laser
56:光束偏轉器 56: Beam deflector
58:聚焦光學器件 58: Focusing optical devices
60:焊料凸塊 60: Solder bump
62:拾取及放置機器 62: Pick and place machine
64:組件 64:Components
66:熱源 66: Heat source
68:接合 68:Joining
70:基板 70: Substrate
72:接觸襯墊 72: Contact pad
73:跡線 73:Traces
74:液滴集合 74: Droplet collection
75:接觸襯墊 75: Contact pad
76:集合 76: Gathering
77:接觸襯墊 77: Contact pad
82:焊料凸塊 82: Solder bump
84:焊料凸塊 84: Solder bump
86:焊料凸塊 86: Solder bump
92:回流層 92: Reflow layer
94:焊料凸塊 94: Solder bump
96:液滴 96: Droplets
98:液滴 98: Droplets
100:焊料凸塊 100: Solder bump
110:接觸襯墊 110: Contact pad
112:基板 112: Substrate
114:凹面 114: Concave
116:焊料凸塊 116: Solder bump
圖1係示意性地繪示根據本發明之一實施例之用於電子電路製造之一系統的方塊圖;圖2A係根據本發明之一實施例之一印刷電路基板之一示意性前視圖,在該印刷電路基板上已以一LIFT程序沈積焊料液滴; 圖2B係根據本發明之一實施例之在焊料回流之後圖2A之印刷電路基板之一示意性前視圖;圖3A、圖3B、圖3C及圖3D係根據本發明之一實施例之一電路基板之示意性截面圖,其展示一焊料凸塊之沈積及回流之一程序中之連續階段;圖4A係根據本發明之一實施例之一電路基板之一示意性截面圖,在該電路基板上已以一LIFT程序沈積兩種不同焊料材料之液滴;圖4B係根據本發明之一實施例之在焊料材料之回流之後圖4A之電路基板之一示意性前視圖;及圖5A係根據本發明之一實施例之藉由一LIFT程序形成之一接觸襯墊之一顯微照片;及圖5B係根據本發明之一實施例之在圖5A之接觸襯墊上形成之一焊料凸塊之一顯微照片。 FIG. 1 schematically shows a block diagram of a system for manufacturing electronic circuits according to an embodiment of the present invention; FIG. 2A is a schematic front view of a printed circuit substrate according to an embodiment of the present invention, on which solder droplets have been deposited by a LIFT process; FIG. 2B is a schematic front view of the printed circuit substrate of FIG. 2A after solder reflow according to an embodiment of the present invention; FIG. 3A, FIG. 3B, FIG. 3C and FIG. 3D are schematic cross-sectional views of a circuit substrate according to an embodiment of the present invention, showing a deposition and reflow of a solder bump. 4A is a schematic cross-sectional view of a circuit substrate according to an embodiment of the present invention, on which droplets of two different solder materials have been deposited by a LIFT process; FIG. 4B is a schematic front view of the circuit substrate of FIG. 4A after reflow of the solder material according to an embodiment of the present invention; and FIG. 5A is a micrograph of a contact pad formed by a LIFT process according to an embodiment of the present invention; and FIG. 5B is a micrograph of a solder bump formed on the contact pad of FIG. 5A according to an embodiment of the present invention.
在本技術中已知之電子電路製造方法中,將電跡線及接觸襯墊印刷在一電路基板上,且藉由光微影法將一焊料層印刷至接觸襯墊上。接著將電路組件放置在焊料覆蓋之襯墊上,且對電路進行加熱以使焊料熔融並回流,因此在組件與襯墊之間產生導電接合。在此習知方法中,藉由光微影遮罩及焊料沈積程序來固定各接觸襯墊上之襯墊位置及大小以及焊料材料之體積。 In a method of manufacturing electronic circuits known in the art, electrical traces and contact pads are printed on a circuit substrate, and a layer of solder is printed onto the contact pads by photolithography. The circuit components are then placed on the solder-covered pads, and the circuit is heated to melt and reflow the solder, thereby creating a conductive joint between the component and the pad. In this known method, the pad position and size on each contact pad and the volume of solder material are fixed by photolithography masking and solder deposition procedures.
本發明之實施例提供一種基於LIFT之焊料沈積方法,其能夠根據需要產生實質上任何所需大小及形狀且包括實質上任何合適之焊料 材料或材料之一組合之焊料凸塊。此基於LIFT之方法能夠在相同程序步驟中在相同基板上產生具有不同體積、形狀及大小,且甚至包括不同焊料材料及焊料材料之組合之多個凸塊。可藉由設定LIFT參數、供體膜材料及在各目標位置處沈積之液滴數目來精確控制焊料凸塊之體積及組合物,甚至包含不均勻組合物。此外,與習知方法相反,本方法能夠在不均勻基板上以及已放置組件之基板上印刷焊料凸塊。因此,所揭示之實施例比先前技術中已知之技術在電路製造中提供更大可撓性及精度。 Embodiments of the present invention provide a LIFT-based solder deposition method that is capable of producing solder bumps of substantially any desired size and shape and including substantially any suitable solder material or combination of materials as desired. This LIFT-based method is capable of producing multiple bumps of different volumes, shapes, and sizes, and even including different solder materials and combinations of solder materials, on the same substrate in the same process steps. The volume and composition of the solder bumps, even including non-uniform compositions, can be precisely controlled by setting the LIFT parameters, the donor film material, and the number of droplets deposited at each target location. Furthermore, in contrast to conventional methods, the present method is capable of printing solder bumps on non-uniform substrates and on substrates on which components have been placed. Thus, the disclosed embodiments provide greater flexibility and precision in circuit fabrication than techniques known in the prior art.
在下文描述之實施例中,鑑於一指定焊料材料及凸塊體積及待在一受體基板上形成凸塊之一目標位置來界定一焊料凸塊。定位一透明供體基板,該供體基板在其表面之一者上具有包括指定焊料材料之一供體膜,其中供體膜位於受體基板上之目標位置附近。(為方便起見,供體基板靠近受體基板之表面在本文中指稱下表面,而供體基板之相對表面指稱上表面。)一雷射引導雷射輻射之一序列脈衝穿過供體基板之上表面並照射在供體膜上以便誘導許多焊料材料之熔融液滴自供體膜噴射至受體基板上之目標位置上。 In the embodiments described below, a solder bump is defined in view of a specified solder material and bump volume and a target location where the bump is to be formed on a receptor substrate. A transparent donor substrate is positioned, the donor substrate having a donor film including the specified solder material on one of its surfaces, wherein the donor film is located near the target location on the receptor substrate. (For convenience, the surface of the donor substrate close to the receptor substrate is referred to herein as the lower surface, and the opposite surface of the donor substrate is referred to as the upper surface.) A sequence of pulses of a laser-guided laser radiation passes through the upper surface of the donor substrate and impinges on the donor film so as to induce a plurality of molten droplets of solder material to be ejected from the donor film onto the target location on the receptor substrate.
選擇雷射脈衝參數及序列中之脈衝數目,使得沈積在目標位置處之液滴累積達成指定凸塊體積。為了控制液滴體積而可改變之脈衝參數包含脈衝強度,即入射於供體膜上之每單位面積之光功率,以及光點大小及脈衝持續時間。可取決於供體膜中焊料材料之類型及厚度來調整此等參數以給予數量級為0.1pl(皮升),即100μm3或更小之一致液滴體積,並確保液滴之噴射自供體膜以高速度精確定位朝向目標位置。因此,藉由適當選擇脈衝參數及液滴數目,可印刷直徑小至約20μm之精確大小之焊料凸塊。根據本發明之實施例之程序可用於將各種焊料材料(包含低 溫、中溫及高溫焊料)印刷至各種基板上,且亦促進無助焊劑之焊接。 The laser pulse parameters and the number of pulses in the sequence are selected so that the droplet accumulation at the target location achieves a specified bump volume. Pulse parameters that can be varied to control the droplet volume include pulse intensity, i.e., the optical power per unit area incident on the donor film, as well as spot size and pulse duration. These parameters can be adjusted to give consistent droplet volumes on the order of 0.1 pl (picoliter), i.e., 100 μm 3 or less, depending on the type and thickness of solder material in the donor film, and ensure that the ejection of droplets from the donor film is precisely positioned toward the target location at high speed. Thus, by properly selecting the pulse parameters and the number of droplets, precisely sized solder bumps with diameters as small as about 20 μm can be printed. The process according to embodiments of the present invention can be used to print a variety of solder materials (including low-temperature, medium-temperature, and high-temperature solders) onto a variety of substrates, and also facilitates flux-free soldering.
在受體基板上沈積一或多層液滴之後,加熱目標位置,使得沈積液滴熔融並回流以形成焊料凸塊。有利地,(例如)藉由雷射照射局部執行加熱,以驅動快速回流並最小化對基板之損壞。此階段中使用之雷射脈衝可狹窄地聚焦在焊料凸塊上,且雷射脈衝之持續時間需要不超過約一毫秒且在大多數情況下,需要不到100微秒,例如幾十微秒(對小焊料凸塊或甚至更少)。因此,此雷射驅動之回流技術可在環境空氣中執行且適用於熱敏性基板。其特別適合與上述基於LIFT之焊料印刷技術結合使用;但亦可將其應用於已藉由其他方法(諸如噴墨式焊料印刷及光微影技術)沈積之回流焊料材料。然而,替代地,回流階段可藉由(例如)在一高溫爐中加熱整個受體基板來執行。在形成焊料凸塊之後,可藉由習知方法將電路組件放置在凸塊上並焊接在適當位置。 After depositing one or more layers of droplets on the receptor substrate, the target location is heated so that the deposited droplets melt and reflow to form solder bumps. Advantageously, the heating is performed locally, for example by laser irradiation, to drive rapid reflow and minimize damage to the substrate. The laser pulse used in this stage can be narrowly focused on the solder bump, and the duration of the laser pulse needs to be no more than about one millisecond and in most cases, less than 100 microseconds, such as tens of microseconds (for small solder bumps or even less). Therefore, this laser-driven reflow technique can be performed in ambient air and is applicable to heat-sensitive substrates. It is particularly suitable for use in conjunction with the above-mentioned LIFT-based solder printing technique; however, it can also be applied to reflow solder material that has been deposited by other methods such as inkjet solder printing and photolithography. Alternatively, however, the reflow stage can be performed by heating the entire receptor substrate, for example in a high temperature furnace. After the solder bumps are formed, the circuit components can be placed on the bumps and soldered in place by known methods.
圖1係根據本發明之一實施例之用於電子電路製造之一系統20之示意性圖示。系統20包括一印刷站22,印刷站22接收待形成於一受體基板34上之目標位置處之焊料凸塊60之一界定,該焊料凸塊60包括指定焊料材料且具有指定凸塊體積。印刷站將所需焊料材料之數個液滴32沈積在各目標位置處,使得液滴累積達成指定凸塊體積。一回流站24加熱目標位置,使得沈積液滴32熔融並回流以形成焊料凸塊60。如圖1中所展示,此加熱程序可局部地集中於凸塊位置上,或取決於焊料材料及基板之性質及其他應用要求可在整個受體基板34上全域執行。 FIG. 1 is a schematic diagram of a system 20 for electronic circuit manufacturing according to an embodiment of the present invention. The system 20 includes a printing station 22 that receives a definition of a solder bump 60 to be formed at a target location on a receptor substrate 34, the solder bump 60 comprising a specified solder material and having a specified bump volume. The printing station deposits a plurality of droplets 32 of the desired solder material at each target location so that the droplets accumulate to achieve the specified bump volume. A reflow station 24 heats the target location so that the deposited droplets 32 melt and reflow to form the solder bump 60. As shown in FIG. 1, this heating process can be locally focused on the bump location, or can be performed globally on the entire receptor substrate 34 depending on the properties of the solder material and the substrate and other application requirements.
通常,在形成焊料凸塊60之後,如本技術中已知,一放置站26(例如)使用一拾取及放置機器62將組件64放置於焊料凸塊上。接 著,在一最終回流站28中之一熱源66加熱焊料凸塊以便在組件與受體基板34之間形成永久性接合68。熱源66可使用(例如)一雷射應用局部加熱,或其可包括一回流烤箱或本技術中已知之任何其他合適類型之加熱器。接合68通常在組件64與受體基板34上之導電跡線之間形成電連接及機械連接兩者。替代地或另外,焊料凸塊60可經配置以形成具有一矩形、圓形或其他形狀之一框架,以便在組件64之邊緣周圍產生一機械密封。此種密封可用於(例如)敏感裝置(諸如微機電系統(MEMS)裝置)之氣密包裝。 Typically, after forming the solder bump 60, a placement station 26 places the component 64 on the solder bump, for example using a pick and place machine 62, as is known in the art. Then, a heat source 66 in a final reflow station 28 heats the solder bump to form a permanent bond 68 between the component and the receptor substrate 34. The heat source 66 may apply localized heating using, for example, a laser, or it may include a reflow oven or any other suitable type of heater known in the art. The bond 68 typically forms both an electrical connection and a mechanical connection between the component 64 and the conductive traces on the receptor substrate 34. Alternatively or in addition, the solder bump 60 may be configured to form a frame having a rectangular, circular, or other shape to create a mechanical seal around the edges of the component 64. Such seals can be used, for example, for hermetic packaging of sensitive devices such as micro-electromechanical systems (MEMS) devices.
參考回至印刷站22,印刷站中之一光學總成30包括一雷射38,其在一控制器51之控制下將短光輻射脈衝以1ns之量級之脈衝持續時間引導朝向一供體箔片44。(如本說明書及申請專利範圍之上下文中所使用,術語「光學輻射」係指在可見、紫外及紅外範圍之任何者內之電磁輻射;而「雷射輻射」係指由一雷射發射之光學輻射。)控制器51通常包括一通用電腦或專用微控制器,該通用電腦或專用微控制器具有至系統20之其他元件之合適介面且以軟體驅動以執行本文中所描述之功能。供體箔片44通常包括一透明供體基板46之一薄、可撓性片,其在受體基板34附近之一側上塗覆有包括一或若干指定焊料材料之一供體膜48。替代地,供體基底可包括一剛性或半剛性材料。受體基板34可包括任何合適材料,諸如玻璃、陶瓷或聚合物,以及其他介電質、半導體或甚至導電材料。 Referring back to the printing station 22, an optical assembly 30 in the printing station includes a laser 38 that directs short pulses of optical radiation with pulse durations on the order of 1 ns toward a donor foil 44 under the control of a controller 51. (As used in the context of this specification and the claims, the term "optical radiation" refers to electromagnetic radiation in any of the visible, ultraviolet, and infrared ranges; and "laser radiation" refers to optical radiation emitted by a laser.) The controller 51 typically comprises a general purpose computer or dedicated microcontroller having appropriate interfaces to the other components of the system 20 and driven by software to perform the functions described herein. The donor foil 44 typically comprises a thin, flexible sheet of a transparent donor substrate 46 coated on one side adjacent to the receptor substrate 34 with a donor film 48 comprising one or more specified solder materials. Alternatively, the donor substrate may comprise a rigid or semi-rigid material. The receptor substrate 34 may comprise any suitable material, such as glass, ceramic or polymer, as well as other dielectric, semiconductor or even conductive materials.
光學總成30包括一光束偏轉器40及聚焦光學器件42,其引導來自雷射38之輻射之一或多個輸出光束穿過供體基板46之上表面且因此在由控制器51判定之一空間圖案之後照射在下表面上之供體膜48上。在一實例實施例中,光束偏轉器40包括一聲光調變器,如上文所提及之美國專利案9,925,797之圖2A或圖2B中所展示且在此專利之行7至8中所描 述。雷射通常受控以輸出一合適波長、持續時間及能量之一脈衝串,以便誘導焊料材料之熔融液滴50自供體膜48噴射至受體基板34上之指定目標位置上。因為液滴50係自供體膜48在垂直於供體基板46之一方向上噴射並以高速噴射,所以供體箔片44可定位成與受體基板34一小距離,例如,在供體膜48與受體基板34之間的達約約0.5mm之一間隔,而非與受體基板接觸。由於液滴50之高速噴射(通常為10m/sec或更大),液滴之飛行時間小於液滴固化所花費之時間,且印刷站22可在周圍大氣條件下操作,而非在真空下。 The optical assembly 30 includes a beam deflector 40 and focusing optics 42 that direct one or more output beams of radiation from the laser 38 through the upper surface of the donor substrate 46 and thereby impinge on the donor film 48 on the lower surface after a spatial pattern determined by the controller 51. In an example embodiment, the beam deflector 40 includes an acousto-optic modulator, as shown in FIG. 2A or FIG. 2B of the above-mentioned U.S. Patent 9,925,797 and described in lines 7 to 8 of this patent. The laser is typically controlled to output a pulse train of appropriate wavelength, duration, and energy to induce molten droplets 50 of solder material to be ejected from the donor film 48 onto a designated target location on the receptor substrate 34. Because the droplets 50 are ejected from the donor film 48 in a direction perpendicular to the donor substrate 46 and at high speed, the donor foil 44 can be positioned at a small distance from the receiver substrate 34, for example, a spacing of up to about 0.5 mm between the donor film 48 and the receiver substrate 34, rather than in contact with the receiver substrate. Due to the high-speed ejection of the droplets 50 (typically 10 m/sec or more), the flight time of the droplets is less than the time it takes for the droplets to solidify, and the printing station 22 can be operated under ambient atmospheric conditions rather than under vacuum.
供體膜48可包括實質上任何合適類型之焊料或焊料材料之組合,包含低溫、中溫及高溫焊料。低溫及中溫焊料包含(例如)錫鉛及錫銀銅(SAC)合金。製造高功率電子裝置中最常用之高溫焊料包含銀(通常為45%至90%)與其他金屬(諸如銅、鋅、錫及鎘)之合金,且通常在700℃至950℃之範圍內之溫度熔融。膜48之厚度及組成以及光學總成30之脈衝參數取決於焊料材料之選擇進行調整,以便使焊料材料之熔融液滴50朝向受體基板34上之目標位置穩定噴射。 The donor film 48 may include substantially any suitable type of solder or combination of solder materials, including low-temperature, medium-temperature, and high-temperature solders. Low-temperature and medium-temperature solders include, for example, tin-lead and tin-silver-copper (SAC) alloys. High-temperature solders, which are most commonly used in the manufacture of high-power electronic devices, include alloys of silver (typically 45% to 90%) with other metals such as copper, zinc, tin, and cadmium, and typically melt at temperatures in the range of 700°C to 950°C. The thickness and composition of the film 48 and the pulse parameters of the optical assembly 30 are adjusted depending on the choice of solder material so that molten droplets 50 of the solder material are stably ejected toward target locations on the receptor substrate 34.
在一些實施例中,可使用多層及結構化供體膜48以便沈積混合組合物之液滴32。例如,供體箔片44可包括多層供體膜,其包括不同、各別焊料組合物,以便產生含有不同材料之大量混合物之熔融液滴50。在(例如)美國專利10,629,442中描述此種多組合LIFT方案,該案以引用的方式併入本文中。 In some embodiments, a multi-layer and structured donor film 48 may be used to deposit droplets 32 of mixed compositions. For example, the donor foil 44 may include multiple layers of donor films that include different, individual solder compositions to produce molten droplets 50 containing a large mixture of different materials. Such multi-combination LIFT schemes are described, for example, in U.S. Patent 10,629,442, which is incorporated herein by reference.
替代地或另外,供體箔片44可包括供體膜48,該供體膜48在供體箔片上之不同位置處包括不同材料。光學總成30引導雷射脈衝序列分別照射在不同供體位置上,使得沈積在一給定目標位置上之不同材料之 液滴32累積達成一指定體積及組成。在下文中參考圖4A/圖4B進一步描述此種混合組合方案。 Alternatively or additionally, the donor foil 44 may include a donor film 48 that includes different materials at different locations on the donor foil. The optical assembly 30 guides the laser pulse sequence to irradiate different donor locations respectively, so that the droplets 32 of different materials deposited at a given target location accumulate to achieve a specified volume and composition. This hybrid combination scheme is further described below with reference to Figure 4A/Figure 4B.
控制器51調整雷射38之脈衝參數及光學總成30之掃描及聚焦參數,以便將所需體積之適當數目個液滴32沈積至各目標位置處,在該目標位置處將在受體基板34上形成一焊料凸塊。如早前所解釋,控制器51設定雷射脈衝參數及焊料材料之熔融液滴數目,使得沈積在各目標位置處之液滴累積達成該位置處之指定凸塊體積。由於可藉由調整雷射脈衝參數來改變液滴體積,因此可藉由沈積較少數目個較大體積之液滴或較大數目個較小體積之液滴來產生一給定凸塊體積。供體膜之厚度38亦對液滴大小有貢獻。然而,鑑於實際液滴體積之固有公差,依賴於大量統計數據,並使用較大數目個較小液滴而非少量較大液滴可為有利的,特別係當處理非常小凸塊時。 The controller 51 adjusts the pulse parameters of the laser 38 and the scanning and focusing parameters of the optical assembly 30 so as to deposit an appropriate number of droplets 32 of a desired volume at each target location where a solder bump will be formed on the receptor substrate 34. As explained earlier, the controller 51 sets the laser pulse parameters and the number of molten droplets of solder material so that the accumulation of droplets deposited at each target location achieves a specified bump volume at that location. Since the droplet volume can be varied by adjusting the laser pulse parameters, a given bump volume can be produced by depositing a smaller number of droplets of larger volume or a larger number of droplets of smaller volume. The thickness 38 of the donor film also contributes to the droplet size. However, given the inherent tolerances in actual droplet volume, it is dependent on a large amount of statistical data, and using a larger number of smaller droplets rather than a smaller number of larger droplets may be advantageous, particularly when processing very small bumps.
印刷站22亦包括一定位總成,其可包括(例如)在其上安裝受體基板34之一X-Y平台36。平台36在印刷站22中相對於光學總成30及供體箔片44移位受體基板34,以便將液滴32沈積在跨受體基板之表面上之不同目標位置處。另外或替代地,定位總成可包括使光學總成30以及供體箔片44(若合適)在受體基板之表面上方移位之運動組件(未展示)。 The printing station 22 also includes a positioning assembly, which may include, for example, an X-Y stage 36 on which the receptor substrate 34 is mounted. The stage 36 displaces the receptor substrate 34 relative to the optical assembly 30 and the donor foil 44 in the printing station 22 so as to deposit the droplets 32 at different target locations across the surface of the receptor substrate. Additionally or alternatively, the positioning assembly may include a motion assembly (not shown) that displaces the optical assembly 30 and, if appropriate, the donor foil 44 over the surface of the receptor substrate.
回流站24包括一光學總成52,其引導一輻射束以便局部熔融液滴32,因此導致液滴聚結成焊料凸塊60。此種局部加熱特別有利於避免損壞敏感受體基板34。在所繪圖實例中之光學總成52包括一雷射54連同一光束偏轉器56及聚焦光學器件58,其引導雷射輻射以充分能量照射目標位置以使沈積液滴熔融並回流至焊料凸塊60中。回流站24亦包括一定位總成,其可基於相同於在印刷站22中之台階36,或一不同台階或 其他運動裝置。 The reflow station 24 includes an optical assembly 52 that directs a radiation beam to locally melt the droplets 32, thereby causing the droplets to coalesce into solder bumps 60. Such localized heating is particularly advantageous in avoiding damage to the sensitive receptor substrate 34. The optical assembly 52 in the illustrated example includes a laser 54 together with a beam deflector 56 and focusing optics 58 that direct the laser radiation to the target location with sufficient energy to cause the deposited droplets to melt and reflow into the solder bumps 60. The reflow station 24 also includes a positioning assembly that can be based on the same stage 36 as in the printing station 22, or a different stage or other motion device.
控制器51調整雷射54之脈衝參數及光學總成52之掃描及聚焦參數,以便施加充分能量來熔融及回流各焊料凸塊60,同時避免損壞受體基板34。選擇脈衝持續時間及能量,使得各凸塊底部處之焊料材料完全熔融,而不會蒸發凸塊頂部處之焊料材料。所需實際功率及脈衝持續時間取決於焊料材料之熔融溫度及熱導率。為此,通常優選短雷射脈衝,因為其等使焊料材料熔融之時間最小化,且因此使氧化最小化並避免損壞受體基板34。因此,回流站24能夠在周圍大氣條件下工作。短而高功率雷射脈沖在實現無助回流及支持高溫焊料材料之使用方面特別有利。聚焦在各焊料凸塊之位置上之此種一單一雷射脈衝通常足以達成小焊料凸塊之完全回流,然可替代地使用多個脈衝,特別係對於較大焊料凸塊。與本技術中已知之熱回流方法相比,所得快速局部回流程序亦有利於減少焊料凸塊與接觸襯墊之間的金屬間化合物之形成,且因此產生一更強焊料接合。 The controller 51 adjusts the pulse parameters of the laser 54 and the scanning and focusing parameters of the optical assembly 52 so as to apply sufficient energy to melt and reflow each solder bump 60 while avoiding damage to the receptor substrate 34. The pulse duration and energy are selected so that the solder material at the bottom of each bump is completely melted without evaporating the solder material at the top of the bump. The actual power and pulse duration required depends on the melting temperature and thermal conductivity of the solder material. For this reason, short laser pulses are generally preferred because they minimize the time the solder material is melted and therefore minimize oxidation and avoid damage to the receptor substrate 34. Thus, the reflow station 24 is able to operate under ambient atmospheric conditions. Short, high-power laser pulses are particularly advantageous in achieving unassisted reflow and supporting the use of high-temperature solder materials. Such a single laser pulse focused on the location of each solder bump is generally sufficient to achieve complete reflow of small solder bumps, although multiple pulses may be used instead, particularly for larger solder bumps. The resulting rapid, localized reflow process also helps reduce the formation of intermetallic compounds between the solder bump and the contact pad, and thus produces a stronger solder joint, compared to thermal reflow methods known in the art.
對於由一厚度為20μm至30μm之錫基焊料之一堆液滴32製成之小焊料凸塊,例如,具有大致10W之一光學功率及50μs至100μs之持續時間之一雷射脈衝通常足以達成完全回流,同時避免大量熱量擴散至基板。各情況下可選擇最佳雷射波長、脈衝功率、持續時間及焦距,以匹配焊料材料之吸收光譜、體積及熱性質。對於小至中等大小之焊料凸塊,脈衝能量需要不大於約2mJ。可基於經驗及/或基於熱及流體動力學模擬來判定最佳雷射參數,例如使用本技術中已知之有限元分析工具。 For a small solder bump made from a pile of droplets 32 of 20μm to 30μm thick tin-based solder, for example, a laser pulse with an optical power of approximately 10W and a duration of 50μs to 100μs is typically sufficient to achieve complete reflow while avoiding significant heat diffusion to the substrate. The optimum laser wavelength, pulse power, duration and focal length may be selected in each case to match the absorption spectrum, volume and thermal properties of the solder material. For small to medium sized solder bumps, the pulse energy needs to be no more than about 2mJ. The optimum laser parameters may be determined empirically and/or based on thermal and fluid dynamics simulations, for example using finite element analysis tools known in the art.
在以下實例中,回流站中24之雷射54可為以1064nm運作之一高功率CW Nd:YAG雷射。替代地,雷射54可為二極體泵浦光纖雷射,例如976nm至1075nm範圍內之連續波光纖雷射及數十瓦之功率(例 如可自IPG獲得)。替代地,雷射54可為一高功率二極體雷射模組,例如由BTW製造之二極體雷射模組。熟習此項技術者將在閱讀本說明書之後明白其他類型之雷射。 In the following example, the laser 54 in the reflow station 24 may be a high power CW Nd:YAG laser operating at 1064nm. Alternatively, the laser 54 may be a diode pumped fiber laser, such as a continuous wave fiber laser in the 976nm to 1075nm range and tens of watts of power (e.g., available from IPG). Alternatively, the laser 54 may be a high power diode laser module, such as a diode laser module manufactured by BTW. Those skilled in the art will understand other types of lasers after reading this specification.
在一實例實施例中,印刷站22使用一錫基焊料印刷凸塊。為使具有約40pl之一體積之凸塊(對應於約50μm之一凸塊直徑)回流,將雷射54設定為輸出具有約0.45mJ至1.6mJ之一脈衝能量及50μs至150μs之持續時間之脈衝。光學總成52將光束聚焦至焊料凸點上之約35μm至50μm之一光點大小。另一方面,對於(例如)具有約15pl(對應於約25μm之一直徑)之一體積之較小凸塊,將回流站24中之雷射54設定為輸出聚焦在焊料凸點上之約15μm至25μm之一光點大小的具有約0.2mJ至0.45mJ之一脈衝能量及10μs至30μs之持續時間之脈衝。 In an example embodiment, the printing station 22 prints bumps using a tin-based solder. To reflow a bump having a volume of about 40 pl (corresponding to a bump diameter of about 50 μm), the laser 54 is set to output a pulse having a pulse energy of about 0.45 mJ to 1.6 mJ and a duration of 50 μs to 150 μs. The optical assembly 52 focuses the beam to a spot size of about 35 μm to 50 μm on the solder bump. On the other hand, for smaller bumps having a volume of, for example, about 15 pl (corresponding to a linear diameter of about 25 μm), the laser 54 in the reflow station 24 is set to output a pulse having a pulse energy of about 0.2 mJ to 0.45 mJ and a duration of 10 μs to 30 μs with a spot size of about 15 μm to 25 μm focused on the solder bump.
在另一實例中,具有約85pl之一體積之回流凸塊(對應於約100μm之一凸塊直徑),將雷射54設定為輸出具有約1mJ至3mJ之一脈衝能量及50μs至150μs之持續時間之脈衝。光學總成52將光束聚焦至焊料凸塊上之約50μm至100μm之一光點大小。 In another example, with a reflowed bump having a volume of about 85 pl (corresponding to a bump diameter of about 100 μm), the laser 54 is set to output a pulse having a pulse energy of about 1 mJ to 3 mJ and a duration of 50 μs to 150 μs. The optical assembly 52 focuses the beam to a spot size of about 50 μm to 100 μm on the solder bump.
熟習此項技術者在閱讀本說明書之後將明白雷射驅動之回流參數之替代選擇。 Those familiar with this technology will understand the alternatives for laser-driven reflow parameters after reading this manual.
在一個實施例中,印刷站22及回流站24組合成一單一操作單元,具為LIFT及回流程序兩者提供雷射輻射之一光學總成。只要雷射源能夠提供LIFT及回流所需之不同範圍之脈衝能量及持續時間,即可為兩個目的使用相同雷射源。替代地,組合站可包含兩個或兩個以上不同雷射源,具有一共用定位總成及可行共用光學器件。 In one embodiment, the printing station 22 and the reflow station 24 are combined into a single operating unit with an optical assembly that provides laser radiation for both LIFT and reflow processes. As long as the laser source can provide the different ranges of pulse energy and duration required for LIFT and reflow, the same laser source can be used for both purposes. Alternatively, the combined station may include two or more different laser sources with a common positioning assembly and possible common optics.
現參考圖2A/圖2B,其等示意性地繪示根據本發明之一實施例之在一印刷電路基板70上形成焊料凸塊之一程序。圖2A係基板70之一前視圖,例如在印刷站22(圖1)中,已藉由一LIFT程序在其上沈積焊料之液滴32,而圖2B係焊料之回流之後之基板70之一示意性前視圖。此實施例繪示本文中所描述之技術在定義及生產焊料凸塊中之用途,該等焊料凸塊在相同受體基板(即,本實例中之基板70)上之不同目標位置處具有不同、各別凸塊體積、形狀及/或焊料材料之組成。 Reference is now made to FIG. 2A/FIG. 2B, which schematically illustrate a process of forming solder bumps on a printed circuit substrate 70 according to an embodiment of the present invention. FIG. 2A is a front view of substrate 70, on which droplets 32 of solder have been deposited by a LIFT process, for example in printing station 22 (FIG. 1), and FIG. 2B is a schematic front view of substrate 70 after reflow of the solder. This embodiment illustrates the use of the techniques described herein in defining and producing solder bumps having different, individual bump volumes, shapes, and/or compositions of solder materials at different target locations on the same recipient substrate (i.e., substrate 70 in this example).
如圖2A中所展示,在基板70上沈積焊料凸塊之前,在基板上形成電子跡線73及不同大小及形狀之各種接觸襯墊72、75、77。如本技術中已知,此等襯墊及跡線可使用一光微影程序印刷在基板70上,或其等可替代地直接書寫至基板70上,例如使用一LIFT程序。接觸襯墊之LIFT印刷可有利於增強焊料材料對接觸襯墊之黏著性,如在下文中參考圖5A/圖5B進一步解釋。控制器51經程式化以指定將在不同焊料襯墊上產生之不同焊料凸塊體積。控制器驅動光學總成30以引導不同雷射脈衝序列穿過供體基板上之不同點,使得沈積液滴32累積地達成各個襯墊上之指定凸塊體積。因此,例如,僅一單一液滴32或少量液滴沈積在襯墊72之各者上,而較大液滴集合74沈積在襯墊75上。當需要非常精細接觸時,如襯墊72之情況,亦可將液滴直接沈積至跡線73上之目標位置上,而無需專用接觸襯墊,且因此將組件直接焊接至跡線。 As shown in FIG. 2A , electronic traces 73 and various contact pads 72, 75, 77 of different sizes and shapes are formed on the substrate 70 prior to depositing solder bumps on the substrate. As is known in the art, these pads and traces may be printed on the substrate 70 using a photolithography process, or they may alternatively be written directly onto the substrate 70, for example using a LIFT process. LIFT printing of the contact pads may be beneficial in enhancing the adhesion of the solder material to the contact pads, as further explained below with reference to FIG. 5A / FIG. 5B . The controller 51 is programmed to specify the different solder bump volumes to be produced on the different solder pads. The controller drives the optical assembly 30 to direct different sequences of laser pulses across different points on the donor substrate so that the deposited droplets 32 cumulatively reach a specified bump volume on each pad. Thus, for example, only a single droplet 32 or a small number of droplets is deposited on each of the pads 72, while a larger collection of droplets 74 is deposited on pad 75. When very fine contacts are required, as in the case of pad 72, droplets can also be deposited directly onto target locations on traces 73 without the need for dedicated contact pads, and thus the component is welded directly to the trace.
如早前所提及,藉由適當選擇及組態供體膜48,可控制印刷站22以將焊料材料之不同、各別組成印刷至不同接觸襯墊上。例如,印刷站22可將適於纖細接觸之一低溫焊料印刷至襯墊72上,而將一高溫焊料印刷至襯墊75上,襯墊75經設計成在電路之操作中在基板70上承載更 高工作電流。光學總成30將雷射脈衝引導穿過供體基板46上之適當點以便將適當組成之焊料材料沈積至接觸襯墊或位置之各者上。 As mentioned earlier, by properly selecting and configuring the donor film 48, the printing station 22 can be controlled to print different, individual compositions of solder material onto different contact pads. For example, the printing station 22 can print a low temperature solder suitable for fine contacts onto pad 72, and a high temperature solder onto pad 75, which is designed to carry higher operating currents on substrate 70 during operation of the circuit. The optical assembly 30 directs laser pulses through appropriate points on the donor substrate 46 to deposit the appropriate composition of solder material onto each of the contact pads or locations.
控制器51可另外經程式化以指定不同形狀之焊料凸塊,包含非圓形形狀,諸如由接觸襯墊77界定之細長形狀。控制器51接著驅動光學總成30以引導雷射脈衝序列穿過供體基板,使得液滴32以符合指定形狀之一圖案沈積在各接觸襯墊上。因此,液滴之細長集合76沈積在接觸襯墊77上。焊料接觸可依此方式以實質上任何所需形狀印刷,例如包含環形及成角度形狀。 Controller 51 may additionally be programmed to specify solder bumps of different shapes, including non-circular shapes, such as elongated shapes defined by contact pads 77. Controller 51 then drives optical assembly 30 to direct a sequence of laser pulses across the donor substrate so that droplets 32 are deposited on each contact pad in a pattern conforming to the specified shape. Thus, an elongated collection of droplets 76 is deposited on contact pads 77. Solder contacts may be printed in this manner in virtually any desired shape, including, for example, circular and angled shapes.
在沈積液滴32之後,加熱基板70,使液滴熔融並回流,因此聚結成焊料凸塊82、84、86,如圖2B中所展示。在此階段,液滴之趨勢係聚結成球形,其使表面能最小化。為了使此趨勢最小化,特別係在產生非圓形之焊料凸塊時,回流站24可採用短而強之雷射脈衝以局部熔融焊料凸塊。如上文所解釋。可調整回流站24中之雷射脈衝參數及照射圖案以便達成所需形狀特性。 After the droplets 32 are deposited, the substrate 70 is heated to melt the droplets and reflow, thereby coalescing into solder bumps 82, 84, 86, as shown in FIG. 2B. At this stage, the tendency of the droplets is to coalesce into a spherical shape, which minimizes the surface energy. To minimize this tendency, especially when producing non-circular solder bumps, the reflow station 24 can use short and intense laser pulses to locally melt the solder bumps. As explained above. The laser pulse parameters and the irradiation pattern in the reflow station 24 can be adjusted to achieve the desired shape characteristics.
圖3A、圖3B、圖3C及圖3D係根據本發明之另一實施例之一電路基板之示意性截面圖,其等展示在基板70上之一焊料凸塊94之沈積及回流之一程序中之連續階段。此實施例解決尤其在大焊料凸塊中可能出現之一回流問題:當在一單一階段中執行沈積程序時,可需要高能量之一雷射脈衝以熔融焊料凸塊底部處之液滴32。高脈衝能量增加損壞焊料凸塊周圍之基板之風險。另一方面,若雷射脈衝能量不足,則凸塊底部處之液滴可能無法完全熔融,導致不良接觸完整性及增大電阻。 Figures 3A, 3B, 3C and 3D are schematic cross-sectional views of a circuit substrate according to another embodiment of the present invention, which show successive stages in a process of deposition and reflow of a solder bump 94 on a substrate 70. This embodiment solves a reflow problem that may occur particularly in large solder bumps: when performing a deposition process in a single stage, a high-energy laser pulse may be required to melt the droplets 32 at the bottom of the solder bump. High pulse energy increases the risk of damaging the substrate around the solder bump. On the other hand, if the laser pulse energy is insufficient, the droplets at the bottom of the bump may not be completely melted, resulting in poor contact integrity and increased resistance.
為解決此問題,液滴32在一目標位置上以多層沈積以便達成一指定凸塊體積。基板70多次在印刷站22與回流站24之間穿梭以便交 替沈積一液滴層且接著加熱該層以便熔融液滴,直至達成指定凸塊體積為止。替代地,液滴之LIFT印刷及熔融可在一單一站內執行,其中光學總成具有LIFT印刷及回流所需之能力。在任一情況下,熔融各連續液滴層所必須施加之能量相對較小,且因此降低損壞之風險。 To address this problem, droplets 32 are deposited in multiple layers at a target location to achieve a specified bump volume. Substrate 70 is shuttled between printing station 22 and reflow station 24 multiple times to alternately deposit a layer of droplets and then heat the layer to melt the droplets until the specified bump volume is achieved. Alternatively, LIFT printing and melting of droplets can be performed in a single station, where the optical assembly has the required capabilities for LIFT printing and reflow. In either case, the energy that must be applied to melt each successive layer of droplets is relatively small, and the risk of damage is therefore reduced.
因此,在所繪製之實例中,液滴32之一初始層沈積在基板70上,如圖3A中所展示(或更確切而言,在基板上之一接觸襯墊上)。如圖3B中所展示,此層經加熱且因此熔融以形成一回流層92。一進一步液滴層沈積在回流層92上方,如圖3C中所展示,且接著對其進行加熱以再次回流,如圖3D中所展示。重複此程序達產生焊料凸塊94所需之許多循環為止。 Thus, in the example depicted, an initial layer of droplets 32 is deposited on substrate 70, as shown in FIG3A (or more precisely, on a contact pad on the substrate). This layer is heated and thus melted to form a reflow layer 92, as shown in FIG3B. A further layer of droplets is deposited over reflow layer 92, as shown in FIG3C, and then heated to reflow again, as shown in FIG3D. This process is repeated for as many cycles as are necessary to produce solder bumps 94.
現參考圖4A/圖4B,其示意性地繪示根據本發明之一實施例之在基板70上產生混合組合物之一焊料凸塊100之一程序。圖4A係一截面圖,其展示藉由LIFT程序在印刷站22中沈積之兩種不同、各別焊料材料之液滴96及98。圖4B係在回流站24中之焊料材料回流之後之焊料凸塊100之一前視圖。 Referring now to FIG. 4A/FIG. 4B, a process of producing a solder bump 100 of a mixed composition on a substrate 70 according to an embodiment of the present invention is schematically illustrated. FIG. 4A is a cross-sectional view showing droplets 96 and 98 of two different, respective solder materials deposited in a printing station 22 by a LIFT process. FIG. 4B is a front view of the solder bump 100 after the solder material has been reflowed in a reflow station 24.
控制器51接收焊料凸塊100之一規格,其指示焊料凸塊將以一定比例包含兩種(或多種)不同材料。例如,為了提高機械強度及/或導電性,焊料凸塊可包括與一錫焊料混合之銅顆粒,或與SAC焊料混合之鈀顆粒。在一些情況下,將不同材料以一指定材料梯度在焊料凸塊內不均勻地分佈亦可為有利的。例如,該等材料之一種(諸如液滴96中之材料)在焊料凸塊之底部處可具有一較高濃度,相對於液滴98中之材料,朝向焊料凸塊之頂部之濃度減小。鈀及銅之此種梯度組合物(在凸塊之底部處具有較高鈀濃度)視作改良焊點之強度,如(例如)在美國專利9,607,936中所揭 示。 Controller 51 receives a specification for solder bump 100 indicating that the solder bump will include two (or more) different materials in a certain ratio. For example, to improve mechanical strength and/or conductivity, the solder bump may include copper particles mixed with a tin solder, or palladium particles mixed with a SAC solder. In some cases, it may also be advantageous to distribute the different materials unevenly within the solder bump with a specified material gradient. For example, one of the materials (such as the material in droplet 96) may have a higher concentration at the bottom of the solder bump, with the concentration decreasing toward the top of the solder bump relative to the material in droplet 98. Such a gradient composition of palladium and copper, with a higher palladium concentration at the bottom of the bump, is believed to improve the strength of the solder joint, as disclosed, for example, in U.S. Patent 9,607,936.
在圖4A中所展示之實例中,供體箔片44包括兩個供體膜48,其包括兩種不同供體材料,諸如上文所提及之不同種類之材料。光學總成30將雷射脈衝朝向供體膜之一者引導以在基板70上沈積液滴96,並朝向另一供體膜引導以沈積液滴98。選擇引導朝向供體膜之各者之脈衝數目,使得液滴96及98以適當比例沈積並累積達成指定組合物及總焊料凸塊體積。為了產生一梯度組合物,引導朝向兩個供體膜之脈衝比例,及因此液滴96與液滴98之比例自液滴之底部至頂部逐層變化,如圖4A中所展示。在回流站24中對小滴96及98之集合之快速加熱將導緻液滴在最小混合之情況下聚結成焊料凸塊100,使得維持指定梯度,如圖4B中示意性繪示。 In the example shown in FIG. 4A , the donor foil 44 includes two donor films 48 that include two different donor materials, such as the different types of materials mentioned above. The optical assembly 30 directs laser pulses toward one of the donor films to deposit droplets 96 on the substrate 70, and toward the other donor film to deposit droplets 98. The number of pulses directed toward each of the donor films is selected so that droplets 96 and 98 are deposited and accumulated in the appropriate proportion to achieve a specified composition and total solder bump volume. In order to produce a gradient composition, the ratio of pulses directed toward the two donor films, and therefore the ratio of droplets 96 to droplets 98, varies layer by layer from the bottom to the top of the droplet, as shown in FIG. 4A . Rapid heating of the collection of droplets 96 and 98 in the reflow station 24 causes the droplets to coalesce into solder bump 100 with minimal mixing, such that the specified gradient is maintained, as schematically illustrated in FIG. 4B .
此種多種材料之焊料凸塊沈積亦可在其他應用中使用。例如,可藉由印刷改良或替代地限制焊料潤濕之一材料之液滴來製造一焊料凸塊之底層。作為另一實例,可選擇底層以改良基板與焊料材料之間的熱膨脹係數之匹配。可藉由混合兩種具有不同熱膨脹係數之材料來微調此屬性,以便匹配基板之熱膨脹係數。 This multi-material solder bump deposition can also be used in other applications. For example, the base layer of a solder bump can be made by printing droplets of one material that improves or alternatively confines the solder wetting. As another example, the base layer can be selected to improve the matching of the coefficients of thermal expansion between the substrate and the solder material. This property can be fine-tuned by mixing two materials with different coefficients of thermal expansion in order to match the coefficient of thermal expansion of the substrate.
圖5A係根據本發明之一實施例之藉由一LIFT程序形成在一基板112上之一接觸襯墊110之一顯微照片。換言之,例如,使用一合適銅供體膜48藉由LIFT將接觸襯墊直接書寫至基板112上,而非藉由習知光微影印刷來產生接觸襯墊。接觸襯墊110之LIFT印刷可用於控制接觸襯墊之形狀及紋理以便提高焊料凸塊對襯墊之黏著性。因此,如圖中所展示,接觸襯墊110具有一粗糙表面,在襯墊之中心具有一凹面114。 FIG. 5A is a micrograph of a contact pad 110 formed on a substrate 112 by a LIFT process according to an embodiment of the present invention. In other words, for example, a suitable copper donor film 48 is used to write the contact pad directly onto the substrate 112 by LIFT, rather than producing the contact pad by conventional photolithography. LIFT printing of the contact pad 110 can be used to control the shape and texture of the contact pad in order to improve the adhesion of the solder bump to the pad. Thus, as shown in the figure, the contact pad 110 has a rough surface with a concave surface 114 in the center of the pad.
圖5B係展示根據本發明之一實施例之形成在接觸襯墊110 上之一焊料凸塊116之一顯微照片。焊料凸塊116由印刷站22依上述方式形成,藉由在凹面114中沈積焊料材料液滴,接著在回流站24中使液滴熔融。接觸襯墊之粗糙度增加用於焊料材料對襯墊之黏著性之表面積,且與凹面一起協助確保良好電及機械接觸。 FIG. 5B is a micrograph showing a solder bump 116 formed on a contact pad 110 according to an embodiment of the present invention. The solder bump 116 is formed by the printing station 22 in the manner described above by depositing droplets of solder material in the recessed surface 114 and then melting the droplets in the reflow station 24. The roughness of the contact pad increases the surface area for adhesion of the solder material to the pad and, together with the recessed surface, helps ensure good electrical and mechanical contact.
將瞭解,上述實施例係藉由實例引用,且本發明不限於以上已具體展示及描述之內容。相反,本發明之範疇包含上述各種特徵之組合及子組合,以及熟習此項技術者在閱讀前述說明之後將想到之且其在先前技術中未揭示之其變型及修改。 It will be understood that the above embodiments are cited by way of example, and the present invention is not limited to what has been specifically shown and described above. On the contrary, the scope of the present invention includes combinations and sub-combinations of the various features described above, as well as variations and modifications thereof that will occur to a person skilled in the art after reading the foregoing description and which are not disclosed in the prior art.
20:系統 20: System
22:印刷站 22: Printing station
24:回流站 24: Reflow station
26:放置站 26: Placement station
28:最終回流站 28: Final return station
30:光學總成 30:Optical assembly
32:液滴 32: Droplets
34:受體基板 34: Receptor substrate
36:X-Y平台 36: X-Y platform
38:雷射 38: Laser
40:光束偏轉器 40: Beam deflector
42:聚焦光學器件 42: Focusing optical devices
44:供體箔片 44: Donor foil
46:供體基板 46: Donor substrate
48:供體膜 48: Donor membrane
50:液滴 50: Droplets
51:控制器 51: Controller
52:光學總成 52: Optical assembly
54:雷射 54:Laser
56:光束偏轉器 56: Beam deflector
58:聚焦光學器件 58: Focusing optical devices
60:焊料凸塊 60: Solder bump
62:拾取及放置機器 62: Pick and place machine
64:組件 64:Components
66:熱源 66: Heat source
68:接合 68:Joining
Claims (29)
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| US202063034422P | 2020-06-04 | 2020-06-04 | |
| US63/034,422 | 2020-06-04 | ||
| US17/162,835 US11627667B2 (en) | 2021-01-29 | 2021-01-29 | High-resolution soldering |
| US17/162,835 | 2021-01-29 |
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| TW202146255A TW202146255A (en) | 2021-12-16 |
| TWI862818B true TWI862818B (en) | 2024-11-21 |
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| KR102668012B1 (en) | 2024-05-21 |
| JP2023529317A (en) | 2023-07-10 |
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| WO2021245467A1 (en) | 2021-12-09 |
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