TWI861963B - Circuit board and method of manufacturing the same - Google Patents
Circuit board and method of manufacturing the same Download PDFInfo
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- TWI861963B TWI861963B TW112123834A TW112123834A TWI861963B TW I861963 B TWI861963 B TW I861963B TW 112123834 A TW112123834 A TW 112123834A TW 112123834 A TW112123834 A TW 112123834A TW I861963 B TWI861963 B TW I861963B
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/181—Printed circuits structurally associated with non-printed electric components associated with surface mounted components
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/107—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by filling grooves in the support with conductive material
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Abstract
Description
本發明是有關於一種電路板及其製造方法,且特別是有關於一種包括電容元件的電路板及製造方法。The present invention relates to a circuit board and a manufacturing method thereof, and in particular to a circuit board including a capacitor element and a manufacturing method thereof.
目前電路板中的內埋式電容元件通常是由兩層金屬層以及夾置於這兩層金屬層之間的介電層所構成,其中這兩層金屬層為電極,並與電路板的線路層平行設置,而且這兩層金屬層之間的距離等於相鄰兩層線路層之間的距離。因此,這兩層金屬層之間的距離難以改變。內埋式電容元件的電容值正比於這兩層金屬層(即電極)之間的重疊面積,加上金屬層與線路層平行設置,以至於電路板需要具有足夠的尺寸,即一定的長度與寬度,才能容置內埋式電容元件。At present, embedded capacitor components in circuit boards are usually composed of two metal layers and a dielectric layer sandwiched between the two metal layers, wherein the two metal layers are electrodes and are arranged in parallel with the circuit layer of the circuit board, and the distance between the two metal layers is equal to the distance between the two adjacent circuit layers. Therefore, the distance between the two metal layers is difficult to change. The capacitance value of the embedded capacitor component is proportional to the overlapping area between the two metal layers (i.e., electrodes), and the metal layer and the circuit layer are arranged in parallel, so that the circuit board needs to have sufficient size, i.e., a certain length and width, to accommodate the embedded capacitor component.
本發明至少一實施例提供一種電路板,其包括電容元件與多個線路層,其中前述電容元件的電極是沿著這些線路層的堆疊方向而延伸。At least one embodiment of the present invention provides a circuit board, which includes a capacitor element and a plurality of circuit layers, wherein the electrodes of the capacitor element extend along the stacking direction of the circuit layers.
本發明另一實施例提供上述電路板的製造方法。Another embodiment of the present invention provides a method for manufacturing the above-mentioned circuit board.
本發明至少一實施例所提供的電路板包括線路結構與電容元件。線路結構包括多個線路層與多個絕緣層,其中這些線路層與這些絕緣層沿著第一方向而堆疊。電容元件設置於線路結構中,並穿過這些線路層與這些絕緣層。電容元件包括第一電極、第二電極與介電材料。第一電極沿著第一方向延伸,並穿過這些線路層與這些絕緣層,其中第一電極連接這些線路層其中至少一層。這些第二電極沿著第一方向排列,並彼此分開,其中這些第二電極每一個與第一電極分開。這些第二電極每一個沿著第二方向與第一電極重疊,其中第二方向與第一方向垂直。這些第二電極每一個連接這些線路層其中至少一層。介電材料設置於第一電極與第二電極之間。The circuit board provided by at least one embodiment of the present invention includes a circuit structure and a capacitor element. The circuit structure includes a plurality of circuit layers and a plurality of insulating layers, wherein the circuit layers and the insulating layers are stacked along a first direction. The capacitor element is arranged in the circuit structure and passes through the circuit layers and the insulating layers. The capacitor element includes a first electrode, a second electrode and a dielectric material. The first electrode extends along the first direction and passes through the circuit layers and the insulating layers, wherein the first electrode is connected to at least one of the circuit layers. The second electrodes are arranged along the first direction and separated from each other, wherein each of the second electrodes is separated from the first electrode. Each of the second electrodes overlaps with the first electrode along a second direction, wherein the second direction is perpendicular to the first direction. Each of the second electrodes is connected to at least one of the circuit layers. A dielectric material is disposed between the first electrode and the second electrode.
在本發明至少一實施例中,上述介電材料包括多個填充材料。這些填充材料沿著第一方向而排列,其中這些填充材料每一個夾置於第一電極與這些第二電極其中一個之間。這些填充材料在第二方向上分別與這些第二電極重疊,其中這些填充材料其中至少兩個的介電常數彼此不同。In at least one embodiment of the present invention, the dielectric material includes a plurality of filling materials. The filling materials are arranged along a first direction, wherein each of the filling materials is sandwiched between the first electrode and one of the second electrodes. The filling materials overlap with the second electrodes in a second direction, wherein at least two of the filling materials have different dielectric constants.
在本發明至少一實施例中,這些第二電極在第二方向上與第一電極之間的距離彼此相等。In at least one embodiment of the present invention, the distances between the second electrodes and the first electrode in the second direction are equal to each other.
在本發明至少一實施例中,上述介電材料具有至少一個通孔,而通孔沿著第一方向延伸。In at least one embodiment of the present invention, the dielectric material has at least one through hole, and the through hole extends along the first direction.
在本發明至少一實施例中,上述介電材料具有至少一個盲孔,而盲孔沿著第一方向延伸,其中盲孔的深度小於線路結構的厚度。In at least one embodiment of the present invention, the dielectric material has at least one blind hole extending along a first direction, wherein a depth of the blind hole is less than a thickness of the circuit structure.
本發明至少一實施例還提供一種電路板的製造方法,其包括以下步驟。提供線路基板,其包括兩層核心線路層以及設置於這兩層核心線路層之間的核心絕緣層。之後,在核心絕緣層上形成兩個彼此並列的初始溝槽,其中這兩個初始溝槽分別鄰接核心線路層的側邊。之後,在這兩個初始溝槽中分別形成第一初始電極與第二初始電極。之後,在核心絕緣層的相對兩側形成多個增層線路層與多個增層絕緣層,其中增層絕緣層覆蓋第一初始電極與第二初始電極。之後,移除部分增層絕緣層,以在這些增層絕緣層上形成兩個第一溝槽與兩個第二溝槽,其中這兩個第一溝槽分別位於第一初始電極的相對兩側,並暴露第一初始電極,而這兩個第二溝槽分別位於第二初始電極的相對兩側。第二溝槽的深度小於第一溝槽的深度。之後,在第一溝槽與第二溝槽內沉積金屬材料,以在第一溝槽內形成第一電極,以及在多個第二溝槽內形多個第二電極,其中這些第二電極每一個連接這些增層線路層其中至少一個。At least one embodiment of the present invention also provides a method for manufacturing a circuit board, which includes the following steps. A circuit substrate is provided, which includes two core circuit layers and a core insulation layer disposed between the two core circuit layers. Then, two initial trenches parallel to each other are formed on the core insulation layer, wherein the two initial trenches are respectively adjacent to the sides of the core circuit layer. Then, a first initial electrode and a second initial electrode are respectively formed in the two initial trenches. Then, a plurality of build-up circuit layers and a plurality of build-up insulation layers are formed on opposite sides of the core insulation layer, wherein the build-up insulation layer covers the first initial electrode and the second initial electrode. Afterwards, a portion of the build-up insulating layer is removed to form two first trenches and two second trenches on these build-up insulating layers, wherein the two first trenches are respectively located on opposite sides of the first initial electrode and expose the first initial electrode, and the two second trenches are respectively located on opposite sides of the second initial electrode. The depth of the second trench is less than the depth of the first trench. Afterwards, metal material is deposited in the first trench and the second trench to form a first electrode in the first trench, and a plurality of second electrodes are formed in the plurality of second trenches, wherein each of these second electrodes is connected to at least one of these build-up circuit layers.
在本發明至少一實施例中,還包括在第一電極與第二電極之間的部分增層絕緣層上形成至少一通孔,其中通孔延伸於增層絕緣層與初始絕緣層。In at least one embodiment of the present invention, at least one through hole is formed on a portion of the build-up insulating layer between the first electrode and the second electrode, wherein the through hole extends between the build-up insulating layer and the initial insulating layer.
在本發明至少一實施例中,還包括在第一電極與第二電極之間的部分增層絕緣層上形成至少一盲孔,其中盲孔至少延伸於增層絕緣層。In at least one embodiment of the present invention, at least one blind hole is formed on a portion of the build-up insulating layer between the first electrode and the second electrode, wherein the blind hole at least extends to the build-up insulating layer.
在本發明至少一實施例中,還包括移除位於第一電極與第二電極之間的部分增層絕緣層與部分核心絕緣層,以形成開槽,其中開槽暴露第一電極、第二電極以及第二初始電極。之後,填充介電材料於開槽中。In at least one embodiment of the present invention, a portion of the build-up insulating layer and a portion of the core insulating layer between the first electrode and the second electrode are removed to form a groove, wherein the groove exposes the first electrode, the second electrode and the second initial electrode. Thereafter, a dielectric material is filled in the groove.
在本發明至少一實施例中,填充介電材料於開槽中的步驟包括依序填充多個填充材料於開槽中,其中這些填充材料其中一個夾置於第一電極與第二初始電極之間,而這些填充材料其他每一個夾置於第一電極與第二電極其中一個之間。In at least one embodiment of the present invention, the step of filling the trench with dielectric material includes sequentially filling a plurality of filling materials in the trench, wherein one of the filling materials is sandwiched between the first electrode and the second initial electrode, and each of the other filling materials is sandwiched between the first electrode and one of the second electrodes.
在本發明至少一實施例中,這些初始溝槽每一個的側壁與這些核心線路層其中至少一層的側邊切齊。In at least one embodiment of the present invention, the sidewall of each of the initial trenches is aligned with the side edge of at least one of the core circuit layers.
基於上述,以上電容元件的電極(即第一與第二電極)是沿著線路層的堆疊方向(即第一方向)而延伸。因此,相較於習知內埋式電容元件,本發明的電容元件不會佔據太多電路板的尺寸或面積,以滿足現今電子裝置(例如行動裝置)朝向小型化的發展趨勢。Based on the above, the electrodes of the above capacitor element (i.e., the first and second electrodes) extend along the stacking direction of the circuit layer (i.e., the first direction). Therefore, compared with the conventional embedded capacitor element, the capacitor element of the present invention will not occupy too much size or area of the circuit board, so as to meet the development trend of current electronic devices (such as mobile devices) towards miniaturization.
在以下的內文中,為了清楚呈現本案的技術特徵,圖式中的元件(例如層、膜、基板以及區域等)的尺寸(例如長度、寬度、厚度與深度)會以不等比例的方式放大,而且有的元件數量會減少。因此,下文實施例的說明與解釋不受限於圖式中的元件數量以及元件所呈現的尺寸與形狀,而應涵蓋如實際製程及/或公差所導致的尺寸、形狀以及兩者的偏差。例如,圖式所示的平坦表面可以具有粗糙及/或非線性的特徵,而圖式所示的銳角可以是圓的。所以,本案圖式所呈示的元件主要是用於示意,並非旨在精準地描繪出元件的實際形狀,也非用於限制本案的申請專利範圍。In the following text, in order to clearly present the technical features of the present invention, the dimensions (e.g., length, width, thickness, and depth) of the elements (e.g., layers, films, substrates, and regions, etc.) in the drawings will be enlarged in unequal proportions, and the number of some elements will be reduced. Therefore, the description and explanation of the embodiments below are not limited to the number of elements in the drawings and the dimensions and shapes presented by the elements, but should cover the dimensions, shapes, and deviations therefrom caused by actual processes and/or tolerances. For example, the flat surface shown in the drawings may have rough and/or nonlinear features, and the sharp corners shown in the drawings may be rounded. Therefore, the elements presented in the drawings of the present invention are mainly for illustration, and are not intended to accurately depict the actual shapes of the elements, nor are they intended to limit the scope of the patent application of the present invention.
其次,本案內容中所出現的「約」、「近似」或「實質上」等這類用字不僅涵蓋明確記載的數值與數值範圍,而且也涵蓋發明所屬技術領域中具有通常知識者所能理解的可允許偏差範圍,其中此偏差範圍可由測量時所產生的誤差來決定,而此誤差例如是起因於測量系統或製程條件兩者的限制。此外,「約」可表示在上述數值的一個或多個標準偏差內,例如±30%、±20%、±10%或±5%內。本案文中所出現的「約」、「近似」或「實質上」等這類用字可依光學性質、蝕刻性質、機械性質或其他性質來選擇可以接受的偏差範圍或標準偏差,並非單以一個標準偏差來套用以上光學性質、蝕刻性質、機械性質以及其他性質等所有性質。Secondly, the words "approximately", "approximately" or "substantially" used in the present case not only cover the numerical values and numerical ranges clearly recorded, but also cover the permissible deviation range that can be understood by a person of ordinary skill in the art to which the invention belongs, wherein the deviation range can be determined by the error generated during measurement, and the error is caused by, for example, the limitation of the measurement system or the process conditions. In addition, "approximately" can mean within one or more standard deviations of the above numerical values, such as ±30%, ±20%, ±10% or ±5%. The words "approximately", "approximately" or "substantially" used in this text may be used to select acceptable deviation ranges or standard deviations according to the optical, etching, mechanical or other properties, and do not apply a single standard deviation to all the above optical, etching, mechanical and other properties.
圖1A是本發明至少一實施例的電路板的俯視示意圖,而圖1B是圖1A中沿線1B-1B剖視的剖面示意圖。請參閱圖1A與圖1B,電路板100包括線路結構110,其中線路結構110包括多個線路層111a與111b以及多個絕緣層112a與112b。這些線路層111a與111b以及這些絕緣層112a與112b皆沿著第一方向D1而堆疊,即第一方向D1為線路層111a、111b與絕緣層112a、112b的堆疊方向。此外,在圖1B中,第一方向D1為垂直方向。FIG. 1A is a schematic top view of a circuit board of at least one embodiment of the present invention, and FIG. 1B is a schematic cross-sectional view taken along
線路層111a與111b以及絕緣層112a與112b可交錯堆疊,以使這些絕緣層112a與112b每一者位於這些線路層111a與111b其中相鄰兩者之間。線路結構110可由核心基板(core substrate)的相對兩側進行增層法(build up)而形成,其中核心基板的核心線路層與核心絕緣層分別是線路層111a與絕緣層112a。The
此外,線路結構110還可包括至少一個導電連接部113,其中導電連接部113連接這些線路層111a與111b其中至少兩層。以圖1B為例,電路板100包括兩個導電連接部113,而各個導電連接部113連接彼此相鄰的線路層111a與111b,以使線路層111a與111b能彼此電性導通。此外,導電連接部113可以是導電盲孔、導電通孔或導電埋孔,其中圖1B是以導電盲孔作為舉例說明,不限制導電連接部113只能是導電盲孔。In addition, the
電路板100還包括至少一個電容元件120,其中電容元件120設置於線路結構110中,並穿過這些線路層111a與111b以及這些絕緣層112a與112b。電容元件120包括第一電極121與至少兩個第二電極122,其中第一電極121沿著第一方向D1延伸,並穿過這些線路層111a與111b以及這些絕緣層112a與112b,而這些第二電極122彼此分開,並沿著第一方向D1排列。The
此外,從圖1B來看,各個第二電極122也是沿著第一方向D1延伸。由此可知,電容元件120的第一電極121與第二電極122皆沿著這些線路層111a與111b的堆疊方向而延伸,其中第一電極121與這些第二電極122不會與線路層111a與111b平行設置。1B , each
第一電極121連接這些線路層111a與111b其中至少一層,而第二電極122每一個連接這些線路層111a與111b其中至少一層。以圖1B為例,電容元件120包括一個第一電極121以及三個第二電極122,其中第一電極121穿過這些線路層111a與111b,並連接所有線路層111a與111b,而第二電極122每一個連接這些線路層111a與111b其中兩層。The
須說明的是,在其他實施例中,電容元件120可包括兩個或超過三個第二電極122,其中第一電極121可連接這些線路層111a與111b其中一層、兩層或三層以上,而各個第二電極122可連接這些線路層111a與111b其中一層或三層以上。因此,圖1B所示的電容元件120僅供舉例說明,未限制電容元件120所包括的第二電極122的數量以及第一電極121與第二電極122兩者各自連接線路層111a與111b的數量。It should be noted that in other embodiments, the
各個第二電極122與第一電極121分開,且每個第二電極122沿著第二方向D2與第一電極121重疊,其中第二方向D2與第一方向D1垂直。以圖1B為例,第二方向D2為水平方向。此外,從圖1B來看,第一電極121與第二電極122在第一方向D1上沒有重疊,也無堆疊。第一電極121與第二電極122兩者在第一方向D1上也不與任何線路層111a與111b重疊,如圖1B所示。Each
這些第二電極122在第二方向D2上與第一電極121之間的距離W12彼此相等。換句話說,這些第二電極122彼此共平面,即這些第二電極122的側面彼此切齊,並位於同一平面,而且各個第二電極122與第一電極121平行。須說明的是,這些第二電極122是實質上彼此共平面,且各個第二電極122與第一電極121是實質上平行。詳細而言,在允許的誤差範圍內,這些第二電極122可不共平面,而各個第二電極122與第一電極121可不平行。The distances W12 between the
電容元件120還包括介電材料123,其中介電材料123設置於第一電極121與第二電極122之間。介電材料123可包括多個填充材料F1、F2與F3。這些填充材料F1、F2與F3沿著第一方向D1而排列,而各個填充材料F1、F2與F3夾置於第一電極121與其中一個第二電極122之間,其中這些填充材料F1、F2與F3在第二方向D2上分別與這些第二電極122重疊,如圖1B所示。The
在本實施例中,這些填充材料F1、F2與F3其中至少兩個可彼此不同,以使填充材料F1、F2與F3其中至少兩個的介電常數彼此不同。例如,填充材料F1可為聚醯亞胺(Polyimide,PI),填充材料F2可為環氧樹脂(epoxy),例如FR4或鈦酸鋇填充環氧樹脂,而填充材料F3可為陶瓷,因此介電材料123可具有多個不同的介電常數,以使電容元件120具有多個電容值。In the present embodiment, at least two of the filling materials F1, F2 and F3 may be different from each other, so that the dielectric constants of at least two of the filling materials F1, F2 and F3 are different from each other. For example, the filling material F1 may be polyimide (PI), the filling material F2 may be epoxy, such as FR4 or barium titanium filled epoxy, and the filling material F3 may be ceramic, so that the
由此可知,在電路設計上,電容元件120更具有彈性,以使電容元件120能應用於更多類型的電路。以圖1B中的電容元件120為例,當填充材料F1、F2與F3三者的介電常數彼此不同時,三個第二電極122可分別電性連接三個開關元件(未繪示)。透過這三個開關元件的開啟與關閉,電容元件120能提供八種電容值(包括零)。如此,電容元件120可廣泛應用於多種電路與電子元件。例如,能提供多種電容值(例如八種)的電容元件120適合應用於振盪頻率調變電路,從而有助於天線的匹配。It can be seen that in circuit design, the
除了填充材料F1、F2與F3之外,第一電極121與各個第二電極122兩者的尺寸(例如面積)及第二電極122在第二方向D2上與第一電極121之間的距離W12能決定電容元件120的電容值。相較於習知內埋式電容元件,第二電極122與第一電極121之間的距離W12較易於改變,以使電容元件120能透過距離W12以及第一電極121與第二電極122兩者尺寸來產生預設的電容值。In addition to the filling materials F1, F2 and F3, the sizes (e.g., areas) of the
特別一提的是,在其他實施例中,介電材料123可以只包括單一種填充材料。也就是說,圖1B中的填充材料F1、F2與F3其中兩個可以省略,而剩餘的完全填滿在第一電極121與這些第二電極122之間的空間。因此,介電材料123可以只具有一個介電常數。此外,本實施例中的介電材料123可為固體,但在其他實施例中,介電材料123也可為氣體,例如空氣。或者,填充材料F1、F2與F3其中至少一個可為氣體(例如空氣)。It is particularly worth mentioning that in other embodiments, the
圖2A至圖2G是製造圖1A中的線路板的流程剖面示意圖。須說明的是,電容元件120以外的線路結構110可以採用現行的電路板製程來製造,因此圖2A至圖2G主要描繪電容元件120的製造過程,並省略電容元件120以外的部分線路結構110。請參閱圖2A,首先,提供線路基板10,其包括核心線路層以及核心絕緣層,其中核心絕緣層設置於這兩層核心線路層之間。FIG. 2A to FIG. 2G are schematic cross-sectional views of the process of manufacturing the circuit board in FIG. 1A. It should be noted that the
線路基板10為核心基板,其中各個核心線路層為線路層111a,而核心絕緣層為絕緣層112a,所以線路基板10所包括的元件會相同於電路板100的一些元件。此外,線路層111a的構成材料可為金屬,例如銅,而絕緣層112a的構成材料可為高分子材料,例如環氧樹脂。The
請參閱圖2B,之後,在絕緣層112a(即核心絕緣層)上形成兩個彼此並列的初始溝槽R20,其中初始溝槽R20可用外型切割(routing)、銑床或雷射燒蝕(laser ablation)來形成。這些初始溝槽R20分別鄰接線路層111a的側邊,其中初始溝槽R20每一個側壁S12可與線路層111a其中至少一層的側邊S11切齊。以圖2B為例,各個初始溝槽R20的側壁S12可以與兩層線路層111a的側邊S11切齊。Please refer to FIG. 2B . Afterwards, two initial trenches R20 are formed in parallel on the insulating
請參閱圖2C,在形成初始溝槽R20之後,在這兩個初始溝槽R20中分別形成第一初始電極121i與第二初始電極122i。第一初始電極121i與第二初始電極122i可利用無電電鍍與有電電鍍來形成。在進行無電電鍍與有電電鍍之前,可以在絕緣層112a的相對兩側分別覆蓋兩層遮罩層29,其中遮罩層29可為顯影後的光阻層,例如乾膜,且遮罩層29不會覆蓋任何初始溝槽R20,以暴露初始溝槽R20。如此,這些遮罩層29能侷限第一初始電極121i與第二初始電極122i僅形成於初始溝槽R20中。Please refer to FIG. 2C . After the initial trenches R20 are formed, a first
在本實施例中,第一初始電極121i與第二初始電極122i可連接線路層111a,以使第一初始電極121i與第二初始電極122i能電性連接線路層111a。不過,在其他實施例中,第一初始電極121i與第二初始電極122i其中至少一者可與任一層線路層111a分開。例如,第一初始電極121i與第二初始電極122i其中至少一者不連接任何線路層111a。因此,第一初始電極121i與第二初始電極122i不限制要連接線路層111a。In this embodiment, the first
請參閱圖2D,之後,在絕緣層112a的相對兩側形成多個增層線路層與多個增層絕緣層,其中增層線路層為線路層111b,而增層絕緣層為絕緣層112b。這些增層線路層(即線路層111b)與這些增層絕緣層(即絕緣層112b)可用增層法來形成,而絕緣層112b會覆蓋第一初始電極121i與第二初始電極122i,如圖2D所示。Please refer to FIG2D. Afterwards, multiple build-up circuit layers and multiple build-up insulation layers are formed on opposite sides of the
請參閱圖2D與圖2E,之後,移除部分這些絕緣層112b,以在這些絕緣層112b上形成兩個第一溝槽R21與兩個第二溝槽R22,其中這兩個第一溝槽R21分別位於第一初始電極121i的相對兩側,並暴露第一初始電極121i。這兩個第二溝槽R22分別位於第二初始電極122i的相對兩側。從圖2E來看,第二溝槽R22的深度小於第一溝槽R21的深度,因此這些第二溝槽R22沒有暴露第二初始電極122i。另外,第一溝槽R21與第二溝槽R22的形成方法可以相同於初始溝槽R20的形成方法。Please refer to FIG. 2D and FIG. 2E. Afterwards, a portion of these insulating
請參閱圖2E與圖2F,之後,在第一溝槽R21與第二溝槽R22內沉積金屬材料,以在第一溝槽R21內形成第一電極121,以及在這些第二溝槽R22內形多個第二電極122。沉積金屬材料的方法可包括無電電鍍與有電電鍍。在進行無電電鍍與有電電鍍以前,可使用兩層遮罩層,例如圖2C所示的遮罩層29,其中這些遮罩層分別覆蓋最外側的絕緣層112b,並暴露這些第一溝槽R21與這些第二溝槽R22。如此,遮罩層能侷限第一電極121與第二電極122僅分別形成於第一溝槽R21與第二溝槽R22中。Please refer to FIG. 2E and FIG. 2F. Afterwards, metal material is deposited in the first trench R21 and the second trench R22 to form a
由於這些第一溝槽R21暴露第一初始電極121i,因此第一電極121含有第一初始電極121i。這些第二溝槽R22沒有暴露第二初始電極122i,以至於第二初始電極122i被絕緣層112a與112b包覆。因此,這些第二電極122會與第二初始電極122i分開。Since the first trenches R21 expose the first
值得一提的是,第二初始電極122i為其中一個第二電極122。詳細而言,在圖1B與圖2F中,位於中間的第二電極122為圖2E中的第二初始電極122i。在圖2F以後的圖式與敘述中,第二初始電極122i會改成第二電極122。此外,除了中間的第二電極122(即原先的第二初始電極122i)以外,各個第二電極122連接至少一個線路層111b。以圖2F為例,各個第二電極122連接這些線路層111b其中兩個。It is worth mentioning that the second
請參閱圖2F與圖2G,之後,移除位於第一電極121與第二電極122(包括原先的第二初始電極122i)之間的部分絕緣層112a與112b,以形成開槽(未標示),其中此開槽暴露第一電極121以及所有第二電極122。之後,填充介電材料123於開槽中,其中介電材料123可以直接接觸第一電極121與所有第二電極122。至此,電路板100基本上已完成製造。Please refer to FIG. 2F and FIG. 2G . Afterwards, the insulating
介電材料123可包括填充材料F1、F2與F3,而填充介電材料123於開槽中的步驟可包括依序填充這些填充材料F1、F2與F3於開槽中,其中填充材料F1、F2與F3分別夾置於第一電極121與這些第二電極122之間。以圖2G為例,填充材料F2夾置於第一電極121與中間的第二電極122(即第二初始電極122i)之間,而其他填充材料F1與F3每一個夾置於第一電極121與其中一個第二電極122之間。例如,填充材料F1夾置於第一電極121與下方的第二電極122之間,而填充材料F2夾置於第一電極121與上方的第二電極122之間。The
請參閱圖2F,特別一提的是,在其他實施例中,第一電極121與這些第二電極122之間的部分絕緣層112a與112b可以不用移除,以使夾置於第一電極121與所有第二電極122之間的部分絕緣層112a與112b作為介電材料,從而形成包括部分絕緣層112a與112b的電容元件,如圖2F所示。因此,部分絕緣層112a與112b可作為電容元件的介電材料,其不限制要包括填充材料F1、F2與F3。Please refer to FIG. 2F , and it is particularly noted that in other embodiments, the partial insulating
圖3A是本發明另一實施例的電路板的俯視示意圖,而圖3B是圖3A中沿線1B-1B剖視的剖面示意圖。請參閱圖3A與圖3B,本實施例的電路板300與前述實施例的電路板100相似。例如,電路板300包括電容元件330、多個線路層111a、111b以及多個絕緣層112a、112b,其中電容元件330包括第一電極121以及多個第二電極122。以下主要敘述電路板300與100之間的差異,而兩者相同特徵基本上不再重複敘述。FIG. 3A is a schematic top view of a circuit board of another embodiment of the present invention, and FIG. 3B is a schematic cross-sectional view taken along
電容元件330不同於電容元件120,其中電容元件330所包括的介電材料323不同於前述介電材料123。具體而言,介電材料323具有至少一個通孔T3與至少一個盲孔V3,其中通孔T3與盲孔V3可以在第一電極121與這些第二電極122形成之後(請參考圖2F)而形成。此外,在本實施例中,介電材料323可具有多個通孔T3與多個盲孔V3,但本發明不限制介電材料323所具有的通孔T3與盲孔V3的數量,其中介電材料323也可僅具有通孔T3與盲孔V3其中一種。The
也就是說,在第一電極121與這些第二電極122形成之後,可在第一電極121與這些第二電極122之間的部分絕緣層112b上形成至少一個通孔T3以及至少一個盲孔V3,其中通孔T3沿著第一方向D1而延伸於絕緣層112a與112b,盲孔V3則沿著第一方向D1而至少延伸於絕緣層112b。以圖3B為例,盲孔V3延伸於絕緣層112a以及一些絕緣層112b。從圖3B來看,盲孔V3的深度顯然小於電容元件330的線路結構(未標示)的厚度,也小於通孔T3的深度。That is, after the
另外,電容元件330還可包括多個填充材料321與322,其中填充材料321與322分別填入於通孔T3與盲孔V3,而填充材料321與322可相同於前述實施例中的填充材料F1、F2與F3(請參考圖1B)。例如,填充材料321與322可分別相同於填充材料F1與F2。此外,填充材料321與322至少一者可以是氣體,例如空氣。In addition, the
綜上所述,在本發明至少一實施例所揭示的電路板中,電容元件的電極(即第一與第二電極)是沿著線路層的堆疊方向(即第一方向)而延伸。因此,相較於習知內埋式電容元件,本發明至少一實施例中的電容元件的電極不會與線路層平行設置,即電容元件不會佔據太多電路板的尺寸或面積,以使本發明至少一實施例的電路板能滿足現今電子裝置(例如行動裝置)朝向小型化的發展趨勢。In summary, in the circuit board disclosed in at least one embodiment of the present invention, the electrodes of the capacitor element (i.e., the first and second electrodes) extend along the stacking direction of the circuit layer (i.e., the first direction). Therefore, compared with the conventional embedded capacitor element, the electrodes of the capacitor element in at least one embodiment of the present invention will not be arranged parallel to the circuit layer, that is, the capacitor element will not occupy too much size or area of the circuit board, so that the circuit board of at least one embodiment of the present invention can meet the development trend of current electronic devices (such as mobile devices) towards miniaturization.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,本發明所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed as above by way of embodiments, they are not intended to limit the present invention. A person having ordinary knowledge in the technical field to which the present invention belongs may make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the scope defined in the attached patent application.
10:線路基板
29:遮罩層
100、300:電路板
110:線路結構
111a、111b:線路層
112a、112b:絕緣層
113:導電連接部
120、330:電容元件
121:第一電極
121i:第一初始電極
122:第二電極
122i:第二初始電極
123、323:介電材料
321、322、F1、F2、F3:填充材料
D1:第一方向
D2:第二方向
R20:初始溝槽
R21:第一溝槽
R22:第二溝槽
S11:側邊
S12:側壁
T3:通孔
V3:盲孔
W12:距離10: Circuit substrate
29:
圖1A是本發明至少一實施例的電路板的俯視示意圖。
圖1B是圖1A中沿線1B-1B剖視的剖面示意圖。
圖2A至圖2G是製造圖1A中的線路板的流程剖面示意圖。
圖3A是本發明另一實施例的電路板的俯視示意圖。
圖3B是圖3A中沿線3B-3B剖視的剖面示意圖。
FIG. 1A is a schematic diagram of a circuit board of at least one embodiment of the present invention from above.
FIG. 1B is a schematic diagram of a cross section taken along
100:電路板 100: Circuit board
110:線路結構 110: Circuit structure
111a、111b:線路層 111a, 111b: Circuit layer
112a、112b:絕緣層 112a, 112b: Insulating layer
113:導電連接部 113: Conductive connection part
120:電容元件 120: Capacitor components
121:第一電極 121: First electrode
122:第二電極 122: Second electrode
123:介電材料 123: Dielectric materials
F1、F2、F3:填充材料 F1, F2, F3: filling materials
D1:第一方向 D1: First direction
D2:第二方向 D2: Second direction
W12:距離 W12: Distance
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| CN101763942A (en) * | 2009-12-30 | 2010-06-30 | 华为技术有限公司 | Capacitor, circuit board and method for manufacturing circuit board |
| CN114023744A (en) * | 2022-01-10 | 2022-02-08 | 长鑫存储技术有限公司 | Semiconductor structure, preparation method of semiconductor structure and semiconductor memory |
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| CN101763942A (en) * | 2009-12-30 | 2010-06-30 | 华为技术有限公司 | Capacitor, circuit board and method for manufacturing circuit board |
| CN114023744A (en) * | 2022-01-10 | 2022-02-08 | 长鑫存储技术有限公司 | Semiconductor structure, preparation method of semiconductor structure and semiconductor memory |
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|---|---|
| CN119183241A (en) | 2024-12-24 |
| TW202502104A (en) | 2025-01-01 |
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