TWI859062B - Device test system - Google Patents
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- TWI859062B TWI859062B TW113103375A TW113103375A TWI859062B TW I859062 B TWI859062 B TW I859062B TW 113103375 A TW113103375 A TW 113103375A TW 113103375 A TW113103375 A TW 113103375A TW I859062 B TWI859062 B TW I859062B
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Abstract
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本發明係關於一種元件測試系統,並且特別是關於能讓受測元件之複數個電氣接觸點與電連接單元之複數個電氣接觸點達成良好的電氣接觸且皆受到相同的壓力之元件測試系統。The present invention relates to a component testing system, and in particular to a component testing system that enables a plurality of electrical contact points of a component under test and a plurality of electrical contact points of an electrical connection unit to achieve good electrical contact and be subjected to the same pressure.
本發明所稱的元件測試系統泛指針對半導體元件、光電元件、電子元件、磁性元件等多種元件進行測試的系統。上述多種元件在製造完成後皆須進行測試驗證其為妥善的元件。上述多種元件其上包含複數個電氣接觸點。先前技術之元件測試系統皆包含電連接單元。電連接單元其上也包含複數個電氣接觸點。在將受測元件置於電連接單元上進行測試時,受測元件應確保其複數個電氣接觸點與電連接單元之複數個電氣接觸點達成良好的電氣接觸且皆受到相同的壓力。The component testing system referred to in the present invention generally refers to a system for testing various components such as semiconductor components, optoelectronic components, electronic components, magnetic components, etc. After the above-mentioned various components are manufactured, they must be tested to verify that they are proper components. The above-mentioned various components include a plurality of electrical contact points. The component testing systems of the prior art all include an electrical connection unit. The electrical connection unit also includes a plurality of electrical contact points. When the component under test is placed on the electrical connection unit for testing, the component under test should ensure that its multiple electrical contact points achieve good electrical contact with the multiple electrical contact points of the electrical connection unit and are all subjected to the same pressure.
關於先前技術之元件測試系統,在確保讓其抵壓裝置能與置於電連接單元上的受測元件完成抵壓,其多是利用裝設於電連接單元周圍的硬性停止(hard stop)構件,硬性停止構件的抵觸面會高於受測元件的表面。先前技術之元件測試系統的抵壓裝置朝向受測元件移動時,抵壓裝置的外圍會先抵觸到設置於電連接單元周圍的硬性停止構件,此時抵壓裝置中與受測元件接觸的接觸頭存在一控制的距離,用以保護受測元件不致受到過多的壓力而受損。In the component testing system of the prior art, in order to ensure that the pressing device can complete the pressing with the component under test placed on the electrical connection unit, it usually uses a hard stop component installed around the electrical connection unit, and the contact surface of the hard stop component is higher than the surface of the component under test. When the pressing device of the component testing system of the prior art moves toward the component under test, the outer periphery of the pressing device will first contact the hard stop component installed around the electrical connection unit. At this time, there is a controlled distance between the contact head in the pressing device that contacts the component under test, so as to protect the component under test from being damaged by excessive pressure.
然而,可以預見的造成受測元件是否受到完整抵觸的來源來自於幾個方面:硬性停止構件通常是與承載裝置、電連接單元一起鎖固於先前技術之元件測試系統的座體內或其他裝置、構件上,每次固定的位置可能因人為扭轉螺絲的角度或深度而造成誤差;硬性停止構件因其材質、結構可能受到多次下壓力後變形或損壞;以及最常見的狀況為:受測元件在製造、封裝過程中,因材料或製程參數影響,導致每一個受測元件的厚度存在些微差距(譬如,零點幾毫米到個位數毫米的差距)。即便可以在電連接單元裝設彈簧針(pogo pin)以提供電氣接觸點進而藉由彈簧針的壓縮量來掩蓋上述這些無法避免的變異來源,但卻無法保證每個受測元件受力的狀況,更無法能即時調整。However, there are several foreseeable factors that may affect whether the DUT is fully contacted: the hard stop component is usually locked together with the carrier and the electrical connection unit in the seat of the component test system of the prior art or on other devices and components. The fixed position may cause errors due to the angle or depth of the screws that are manually twisted. The hard stop component may be deformed or damaged after being pressed down multiple times due to its material and structure. The most common situation is that during the manufacturing and packaging process of the DUT, due to the influence of material or process parameters, the thickness of each DUT has a slight difference (for example, a difference of a few tenths of a millimeter to a few millimeters). Even though pogo pins can be installed in the electrical connection unit to provide electrical contact points and the compression of the pogo pins can be used to cover the above-mentioned unavoidable sources of variation, it is impossible to guarantee the stress condition of each component under test, and it is even more impossible to adjust in real time.
因此,本發明所欲解決之一技術問題在於提供一種能讓受測元件之複數個電氣接觸點與電連接單元之複數個電氣接觸點達成良好的電氣接觸且皆受到相同的壓力之元件測試系統。Therefore, one technical problem to be solved by the present invention is to provide a component testing system that enables a plurality of electrical contact points of a component under test and a plurality of electrical contact points of an electrical connection unit to achieve good electrical contact and be subjected to the same pressure.
根據本發明之一較佳具體實施例之元件測試系統其定義垂直方向以及橫向方向。根據本發明之較佳具體實施例之元件測試系統包含致動裝置、抵觸構件、第一感壓柱、第一感壓元件、第二感壓柱、第二感壓元件、第三感壓元件、承載裝置、電連接單元、高度差調節裝置以及控制裝置。致動裝置係能被控制沿垂直方向移動。抵觸構件係操作性地連接至致動裝置。第一感壓柱係置於抵觸構件沿橫向方向之第一側旁,並且操作性地連接至致動裝置。第一感壓元件係彈性地設置於第一感壓柱內。第二感壓柱係設置於抵觸構件沿橫向方向與第一側相對之第二側旁,並且操作性地連接至致動裝置。第二感壓元件係彈性地設置於第二感壓柱內。第三感壓元件係彈性地設置於抵觸構件內。承載裝置係可活動地置於抵觸構件之下方。電連接單元係固定於承載裝置上,並且對齊抵觸構件。電連接單元其上包含複數個第一電氣接觸點。抵觸構件之抵觸面面向電連接單元。第一感壓柱之第一受壓面以及第二感壓柱之第二受壓面皆面向承載裝置,並且低於抵觸構件的抵觸面。受測元件其上包含複數個第二電氣接觸點。受測元件係置於電連接單元上,致使受測元件的複數個第二電氣接觸點置於電連接單元的複數個第一電氣接觸點上。承載裝置係操作性地連接至高度差調節裝置。控制裝置係分別電氣連接至致動裝置、第一感壓元件、第二感壓元件、第三感壓元件以及高度差調節裝置。當控制裝置控制致動裝置移動使抵觸構件朝向受測元件移動時,第一感壓柱的第一受壓面以及第二感壓柱的第二受壓面先抵觸承載裝置,進而由第一感壓元件感測到第一壓力值,由第二感壓元件感測到第二壓力值。控制裝置根據第一壓力值以及第二壓力值計算受測元件相對於抵觸面之橫向高度差,進而控制高度差調節裝置以帶動承載裝置進而消除受測元件相對於抵觸面之橫向高度差。控制裝置再行控制致動裝置移動使抵觸構件抵觸受測元件,直至第三感壓元件感測到之第三壓力值落於預定壓力值範圍。藉此,受測元件的複數個第二電氣接觸點與電連接單元的複數個第一電氣接觸點達成電氣接觸,並且皆受到相同的壓力。According to a preferred specific embodiment of the present invention, a component testing system defines a vertical direction and a lateral direction. According to a preferred specific embodiment of the present invention, a component testing system includes an actuating device, a contact member, a first pressure-sensitive column, a first pressure-sensitive element, a second pressure-sensitive column, a second pressure-sensitive element, a third pressure-sensitive element, a supporting device, an electrical connection unit, a height difference adjusting device, and a control device. The actuating device can be controlled to move in a vertical direction. The contact member is operatively connected to the actuating device. The first pressure-sensitive column is disposed on a first side of the contact member along the lateral direction and is operatively connected to the actuating device. The first pressure-sensitive element is elastically disposed in the first pressure-sensitive column. The second pressure-sensing column is disposed on a second side of the contact member opposite to the first side in the lateral direction, and is operatively connected to the actuator. The second pressure-sensing element is elastically disposed in the second pressure-sensing column. The third pressure-sensing element is elastically disposed in the contact member. The supporting device is movably disposed below the contact member. The electrical connection unit is fixed on the supporting device and aligned with the contact member. The electrical connection unit includes a plurality of first electrical contact points thereon. The contact surface of the contact member faces the electrical connection unit. The first pressure-bearing surface of the first pressure-sensing column and the second pressure-bearing surface of the second pressure-sensing column both face the supporting device and are lower than the contact surface of the contact member. The tested element includes a plurality of second electrical contact points thereon. The tested element is placed on the electrical connection unit so that the plurality of second electrical contact points of the tested element are placed on the plurality of first electrical contact points of the electrical connection unit. The supporting device is operatively connected to the height difference adjusting device. The control device is electrically connected to the actuating device, the first pressure-sensitive element, the second pressure-sensitive element, the third pressure-sensitive element and the height difference adjusting device, respectively. When the control device controls the actuating device to move so that the abutting member moves toward the tested element, the first pressure-bearing surface of the first pressure-sensitive column and the second pressure-bearing surface of the second pressure-sensitive column first abut against the supporting device, and then the first pressure-sensitive element senses the first pressure value, and the second pressure-sensitive element senses the second pressure value. The control device calculates the lateral height difference of the tested component relative to the contact surface according to the first pressure value and the second pressure value, and then controls the height difference adjustment device to drive the carrier device to eliminate the lateral height difference of the tested component relative to the contact surface. The control device then controls the actuator to move so that the contact member contacts the tested component until the third pressure value sensed by the third pressure-sensitive element falls within a predetermined pressure value range. In this way, the plurality of second electrical contact points of the tested component and the plurality of first electrical contact points of the electrical connection unit achieve electrical contact and are all subjected to the same pressure.
進一步,根據本發明之較佳具體實施例之元件測試系統還包含座體。承載裝置、電連接單元以及高度差調節裝置係設置於座體內。致動裝置包含罩體以及幫浦。抵觸構件、第一感壓柱以及第二感壓柱係固定於罩體之底表面上。罩體係密封地且可移動地與座體匹配以構成密封的腔體。密封的腔體具有至少一抽氣孔。控制裝置係電氣連接至幫浦,並且控制幫浦經由至少一抽氣孔對密封的腔體抽氣,致使罩體朝向座體移動以帶動抵觸構件朝向受測元件移動。Furthermore, the component testing system according to the preferred specific embodiment of the present invention also includes a base. The supporting device, the electrical connection unit and the height difference adjustment device are arranged in the base. The actuating device includes a cover and a pump. The contact member, the first pressure-sensitive column and the second pressure-sensitive column are fixed on the bottom surface of the cover. The cover is sealed and movably matched with the base to form a sealed cavity. The sealed cavity has at least one exhaust hole. The control device is electrically connected to the pump, and controls the pump to exhaust the sealed cavity through at least one exhaust hole, so that the cover moves toward the base to drive the contact member to move toward the component under test.
根據本發明之較佳具體實施例之元件測試系統之一變形,致動裝置包含動力單元。According to a variation of the component testing system of the preferred embodiment of the present invention, the actuating device includes a power unit.
進一步,根據本發明之較佳具體實施例之元件測試系統之另一變形其並且定義縱向方向,並且還包含第三感壓柱、第四感壓元件、第四感壓柱以及第五感壓元件。第三感壓柱係設置於抵觸構件的第一側旁,並且操作性地連接至致動裝置。第三感壓柱與第一感壓柱相距一距離。第四感壓元件係彈性地設置於第三感壓柱內。第四感壓柱係設置於抵觸構件的第二側旁,並且操作性地連接至致動裝置。第四感壓柱與第二感壓柱相距該距離。第五感壓元件係彈性地設置於第四感壓柱內。控制裝置並且分別電氣連接至第四感壓元件以及第五感壓元件。第三感壓柱之第三受壓面以及第四感壓柱之第四受壓面皆面向承載裝置,並且低於抵觸構件的抵觸面。當控制裝置控制致動裝置移動使抵觸構件朝向受測元件移動時,第三感壓柱的第三受壓面、第四感壓柱的第四受壓面也與第一感壓柱的第一受壓面、第二感壓柱的第二受壓面先抵觸承載裝置,進而由第四感壓元件感測到第四壓力值,由第五感壓元件感測到第五壓力值。控制裝置根據第一壓力值、第二壓力值、第四壓力值以及第五壓力值計算受測元件相對於抵觸面之橫向高度差以及縱向高度差,進而控制高度差調節裝置以帶動承載裝置進而消除受測元件相對於抵觸面之橫向高度差以及縱向高度差。Furthermore, according to another variation of the component testing system of the preferred specific embodiment of the present invention, the longitudinal direction is defined, and the third pressure-sensing column, the fourth pressure-sensing element, the fourth pressure-sensing column and the fifth pressure-sensing element are also included. The third pressure-sensing column is arranged on the first side of the contact member and is operatively connected to the actuating device. The third pressure-sensing column is at a distance from the first pressure-sensing column. The fourth pressure-sensing element is elastically arranged in the third pressure-sensing column. The fourth pressure-sensing column is arranged on the second side of the contact member and is operatively connected to the actuating device. The fourth pressure-sensing column is at the distance from the second pressure-sensing column. The fifth pressure-sensing element is elastically arranged in the fourth pressure-sensing column. The control device is electrically connected to the fourth pressure-sensitive element and the fifth pressure-sensitive element respectively. The third pressure-bearing surface of the third pressure-sensitive column and the fourth pressure-bearing surface of the fourth pressure-sensitive column both face the supporting device and are lower than the contact surface of the contact member. When the control device controls the actuator to move so that the contact member moves toward the measured element, the third pressure-bearing surface of the third pressure-sensitive column and the fourth pressure-bearing surface of the fourth pressure-sensitive column also contact the supporting device together with the first pressure-bearing surface of the first pressure-sensitive column and the second pressure-bearing surface of the second pressure-sensitive column, and then the fourth pressure value is sensed by the fourth pressure-sensitive element, and the fifth pressure value is sensed by the fifth pressure-sensitive element. The control device calculates the lateral height difference and the longitudinal height difference of the tested component relative to the contact surface according to the first pressure value, the second pressure value, the fourth pressure value and the fifth pressure value, and then controls the height difference adjustment device to drive the supporting device to eliminate the lateral height difference and the longitudinal height difference of the tested component relative to the contact surface.
進一步,根據本發明之較佳具體實施例之元件測試系統之另一變形其並且定義縱向方向,並且還包含第五感壓柱、第六感壓元件、第六感壓柱以及第七感壓元件。第五感壓柱係設置於抵觸構件沿縱向方向之第三側旁,並且操作性地連接至致動裝置。第六感壓元件係彈性地設置於第五感壓柱內。第六感壓柱係設置於抵觸構件沿縱向方向與第三側相對之第四側旁,並且操作性地連接至致動裝置。第七感壓元件係彈性地設置於第六感壓柱內。控制裝置並且分別電氣連接至第六感壓元件以及第七感壓元件。第五感壓柱之第五受壓面以及第六感壓柱之第六受壓面皆面向承載裝置,並且低於抵觸構件的抵觸面。當控制裝置控制致動裝置移動使抵觸構件朝向受測元件移動時,第五感壓柱的第五受壓面、第六感壓柱的第六受壓面也與第一感壓柱的第一受壓面、第二感壓柱的第二受壓面先抵觸承載裝置,進而由第六感壓元件感測到第六壓力值,由第七感壓元件感測到第七壓力值。控制裝置根據第一壓力以及第二壓力值計算受測元件相對於抵觸面之橫向高度差,並且根據第六壓力值以及第七壓力值計算受測元件相對於抵觸面之縱向高度差,進而控制高度差調節裝置以帶動承載裝置進而消除受測元件相對於抵觸面之橫向高度差以及縱向高度差。Furthermore, according to another variation of the component testing system of the preferred specific embodiment of the present invention, the longitudinal direction is defined, and the system also includes a fifth pressure-sensing column, a sixth pressure-sensing element, a sixth pressure-sensing column, and a seventh pressure-sensing element. The fifth pressure-sensing column is disposed on the third side of the contact member along the longitudinal direction, and is operatively connected to the actuating device. The sixth pressure-sensing element is elastically disposed in the fifth pressure-sensing column. The sixth pressure-sensing column is disposed on the fourth side of the contact member opposite to the third side along the longitudinal direction, and is operatively connected to the actuating device. The seventh pressure-sensing element is elastically disposed in the sixth pressure-sensing column. The control device is electrically connected to the sixth pressure-sensing element and the seventh pressure-sensing element, respectively. The fifth pressure-bearing surface of the fifth pressure-sensing column and the sixth pressure-bearing surface of the sixth pressure-sensing column both face the support device and are lower than the contact surface of the contact member. When the control device controls the actuator to move so that the contact member moves toward the measured element, the fifth pressure-bearing surface of the fifth pressure-sensing column and the sixth pressure-bearing surface of the sixth pressure-sensing column also contact the support device together with the first pressure-bearing surface of the first pressure-sensing column and the second pressure-bearing surface of the second pressure-sensing column, and then the sixth pressure value is sensed by the sixth pressure-sensing element, and the seventh pressure value is sensed by the seventh pressure-sensing element. The control device calculates the lateral height difference of the tested component relative to the contact surface according to the first pressure value and the second pressure value, and calculates the longitudinal height difference of the tested component relative to the contact surface according to the sixth pressure value and the seventh pressure value, and then controls the height difference adjustment device to drive the supporting device to eliminate the lateral height difference and longitudinal height difference of the tested component relative to the contact surface.
與先前技術不同,根據本發明之元件測試系統能即時調整消除受測元件相對於抵觸構件的抵觸面之橫向高度差以及縱向高度差,進而讓受測元件之複數個電氣接觸點與電連接單元之複數個電氣接觸點達成良好的電氣接觸。並且,根據本發明之元件測試系統能讓受測元件之複數個電氣接觸點皆受到相同的壓力。Different from the prior art, the component testing system according to the present invention can adjust and eliminate the lateral height difference and the longitudinal height difference of the contact surface of the component under test relative to the contact member in real time, so that the multiple electrical contact points of the component under test and the multiple electrical contact points of the electrical connection unit can achieve good electrical contact. In addition, the component testing system according to the present invention can make the multiple electrical contact points of the component under test all receive the same pressure.
關於本發明之優點與精神可以藉由以下的發明詳述及所附圖式得到進一步的瞭解。The advantages and spirit of the present invention can be further understood through the following detailed description of the invention and the attached drawings.
請參閱圖1、圖2及圖3,該等圖式示意地描繪根據本發明之較佳具體實施例之元件測試系統1。圖1係以外觀視圖示意地繪示根據本發明之較佳具體實例之元件測試系統1。圖2係根據本發明之較佳具體實施例之元件測試系統1其抵觸構件11尚未朝向受測元件3移動的剖面視圖。圖3係根據本發明之較佳具體實施例之元件測試系統1其抵觸構件11已移動到抵觸受測元件3的剖面視圖。根據本發明之較佳具體實例之元件測試系統1用以測試受測元件3。於實際應用中,受測元件3可以是半導體元件、光電元件、電子元件、磁性元件等需進行測試的元件。 Please refer to Figures 1, 2 and 3, which schematically depict a component testing system 1 according to a preferred embodiment of the present invention. Figure 1 schematically depicts a component testing system 1 according to a preferred embodiment of the present invention in an exterior view. Figure 2 is a cross-sectional view of the component testing system 1 according to a preferred embodiment of the present invention, wherein the abutment member 11 has not yet moved toward the component under test 3. Figure 3 is a cross-sectional view of the component testing system 1 according to a preferred embodiment of the present invention, wherein the abutment member 11 has moved to abut the component under test 3. The component testing system 1 according to a preferred embodiment of the present invention is used to test the component under test 3. In practical applications, the tested component 3 can be a semiconductor component, an optoelectronic component, an electronic component, a magnetic component, or other component that needs to be tested.
如圖1、圖2及圖3,根據本發明之較佳具體實施例之元件測試系統1其定義垂直方向V以及橫向方向T。於圖1、圖2及圖3圖4中,根據本發明之較佳具體實施例之元件測試系統1其並且定義縱向方向L。根據本發明之較佳具體實施例之元件測試系統1包含致動裝置10、抵觸構件11、第一感壓柱12、第一感壓元件13、第二感壓柱14、第二感壓元件15、第三感壓元件16、承載裝置17、電連接單元18、高度差調節裝置19以及控制裝置(未繪示於圖中)。於一具體實施例中,控制裝置可以是工業電腦、伺服器等,但本發明並不以此為限。 As shown in Fig. 1, Fig. 2 and Fig. 3, the component testing system 1 according to the preferred embodiment of the present invention defines a vertical direction V and a transverse direction T. In Fig. 1, Fig. 2 and Fig. 3 and Fig. 4, the component testing system 1 according to the preferred embodiment of the present invention also defines a longitudinal direction L. The component testing system 1 according to the preferred embodiment of the present invention includes an actuating device 10, a contact member 11, a first pressure-sensitive column 12, a first pressure-sensitive element 13, a second pressure-sensitive column 14, a second pressure-sensitive element 15, a third pressure-sensitive element 16, a supporting device 17, an electrical connection unit 18, a height difference adjusting device 19 and a control device (not shown in the figure). In a specific embodiment, the control device may be an industrial computer, a server, etc., but the present invention is not limited thereto.
致動裝置10係能被控制沿垂直方向V移動。抵觸構件11係操作性地連接至致動裝置10。第一感壓柱12係置於抵觸構件11沿橫向方向T之第一側旁,並且操作性地連接至致動裝置10。第一感壓元件13係彈性地設置於第一感壓柱12內。例如,如圖2所示,第一感壓柱12內與第一感壓元件13銜接處設置彈簧。第二感壓柱14係設置於抵觸構件 11沿橫向方向T與第一側相對之第二側旁,並且操作性地連接至致動裝置10。第二感壓元件15係彈性地設置於第二感壓柱14內。例如,如圖2所示,第二感壓柱14內與第二感壓元件15銜接處設置彈簧。第三感壓元件16係彈性地設置於抵觸構件11內。例如,如圖2所示,抵觸構件11內與第三感壓元件16銜接處設置彈簧。第一感壓柱12與第二感壓柱14位於由垂直方向V以及橫向方向T所定義之一平面上。 The actuator 10 can be controlled to move along the vertical direction V. The contact member 11 is operatively connected to the actuator 10. The first pressure-sensitive column 12 is disposed on a first side of the contact member 11 along the transverse direction T and is operatively connected to the actuator 10. The first pressure-sensitive element 13 is elastically disposed in the first pressure-sensitive column 12. For example, as shown in FIG. 2 , a spring is disposed in the first pressure-sensitive column 12 at a joint with the first pressure-sensitive element 13. The second pressure-sensitive column 14 is disposed on a second side of the contact member 11 opposite to the first side along the transverse direction T and is operatively connected to the actuator 10. The second pressure-sensitive element 15 is elastically disposed in the second pressure-sensitive column 14. For example, as shown in FIG2 , a spring is provided in the second pressure-sensitive column 14 at the joint with the second pressure-sensitive element 15. The third pressure-sensitive element 16 is elastically provided in the contact member 11. For example, as shown in FIG2 , a spring is provided in the contact member 11 at the joint with the third pressure-sensitive element 16. The first pressure-sensitive column 12 and the second pressure-sensitive column 14 are located on a plane defined by the vertical direction V and the transverse direction T.
承載裝置17係可活動地置於抵觸構件11之下方。電連接單元18係固定於承載裝置17上,並且對齊抵觸構件11。電連接單元18其上包含複數個第一電氣接觸點(未繪示於圖中)。抵觸構件11之抵觸面110面向電連接單元18。第一感壓柱12之第一受壓面120以及第二感壓柱14之第二受壓面140皆面向承載裝置17,並且低於抵觸構件11的抵觸面110。 The supporting device 17 is movably placed under the contact member 11. The electrical connection unit 18 is fixed on the supporting device 17 and aligned with the contact member 11. The electrical connection unit 18 includes a plurality of first electrical contact points (not shown in the figure). The contact surface 110 of the contact member 11 faces the electrical connection unit 18. The first pressure-bearing surface 120 of the first pressure-sensitive column 12 and the second pressure-bearing surface 140 of the second pressure-sensitive column 14 both face the supporting device 17 and are lower than the contact surface 110 of the contact member 11.
受測元件3其上包含複數個第二電氣接觸點(未繪示於圖中)。受測元件3係置於電連接單元18上,致使受測元件3的複數個第二電氣接觸點置於電連接單元18的複數個第一電氣接觸點上。承載裝置17係操作性地連接至高度差調節裝置19。控制裝置係分別電氣連接至致動裝置10、第一感壓元件13、第二感壓元件15、第三感壓元件16以及高度差調節裝置19。 The tested element 3 includes a plurality of second electrical contacts (not shown in the figure). The tested element 3 is placed on the electrical connection unit 18, so that the plurality of second electrical contacts of the tested element 3 are placed on the plurality of first electrical contacts of the electrical connection unit 18. The carrier device 17 is operatively connected to the height difference adjustment device 19. The control device is electrically connected to the actuator 10, the first pressure-sensitive element 13, the second pressure-sensitive element 15, the third pressure-sensitive element 16 and the height difference adjustment device 19 respectively.
如圖2及圖3所示,當控制裝置控制致動裝置10移動使抵觸構件11朝向受測元件3移動時,第一感壓柱 12的第一受壓面120以及第二感壓柱14的第二受壓面140先抵觸承載裝置17,進而由第一感壓元件13感測到第一壓力值F1,由第二感壓元件15感測到第二壓力值F2。控制裝置根據第一壓力值F1以及第二壓力值F2計算受測元件3相對於抵觸面110之橫向高度差△hT,進而控制高度差調節裝置19以帶動承載裝置17進而消除受測元件3相對於抵觸面110之橫向高度差△hT。因第一感壓柱12與第二感壓柱14位於同一平面上,只要第一感壓元件13所感測到的第一壓力值F1與第二感壓元件15所感測到的第二壓力值F2有差異,及代表受測元件3相對於抵觸面110存在橫向高度差△hT,更可以藉由第一壓力值F1與第二感壓元件15之間的差異計算出受測元件3相對於抵觸面110之橫向高度差△hT。 As shown in FIG2 and FIG3, when the control device controls the actuator 10 to move the contact member 11 toward the device under test 3, the first pressure-bearing surface 120 of the first pressure-sensitive column 12 and the second pressure-bearing surface 140 of the second pressure-sensitive column 14 first contact the supporting device 17, and then the first pressure-sensitive element 13 senses the first pressure value F1, and the second pressure-sensitive element 15 senses the second pressure value F2. The control device calculates the lateral height difference △h T of the device under test 3 relative to the contact surface 110 according to the first pressure value F1 and the second pressure value F2, and then controls the height difference adjustment device 19 to drive the supporting device 17 to eliminate the lateral height difference △h T of the device under test 3 relative to the contact surface 110. Since the first pressure-sensing column 12 and the second pressure-sensing column 14 are located on the same plane, as long as there is a difference between the first pressure value F1 sensed by the first pressure-sensing element 13 and the second pressure value F2 sensed by the second pressure-sensing element 15, and it represents that there is a lateral height difference △h T between the tested component 3 and the contact surface 110, the lateral height difference △h T between the tested component 3 and the contact surface 110 can be calculated by the difference between the first pressure value F1 and the second pressure-sensing element 15.
控制裝置再行控制致動裝置10移動使抵觸構件11抵觸受測元件3,直至第三感壓元件16感測到之第三壓力值F3落於預定壓力值範圍。藉此,受測元件3的複數個第二電氣接觸點與電連接單元18的複數個第一電氣接觸點達成電氣接觸,並且皆受到相同的壓力。 The control device then controls the actuator 10 to move so that the contact member 11 contacts the measured element 3 until the third pressure value F3 sensed by the third pressure-sensitive element 16 falls within the predetermined pressure value range. In this way, the plurality of second electrical contact points of the measured element 3 and the plurality of first electrical contact points of the electrical connection unit 18 are in electrical contact and are all subjected to the same pressure.
同樣如圖1、圖2及圖3所示,進一步,根據本發明之較佳具體實施例之元件測試系統1還包含座體20。承載裝置17、電連接單元18以及高度差調節裝置19係設置於座體20內。致動裝置10包含罩體102以及幫浦(未繪示於圖中)。抵觸構件11、第一感壓柱12以及第二感壓柱14係固定於罩體102之底表面1020上。罩體102係密封地且可移動地與座體20匹配以構成密封的腔體。例如,如圖1、圖2及圖 3所示,座體20包含向上延伸且封閉的肋壁202。第一密封元件104設置於罩體102的襯邊的末端上,第二密封元件204設置於肋壁202上。藉由第一密封元件104及第二密封元件204,罩體102可以密封地與座體20的肋壁202匹配以構成密封的腔體。密封的腔體具有至少一抽氣孔206。例如,如圖1、圖2及圖3所示,座體20上具有抽氣孔206。幫浦藉由管路連通至抽氣孔206。控制裝置係電氣連接至幫浦,並且控制幫浦經由至少一抽氣孔對密封的腔體抽氣,致使罩體102朝向座體20移動以帶動抵觸構件11朝向受測元件3移動。為清楚描繪根據本發明之較佳具體實施例之元件測試系統1,於圖1中,罩體102係繪示其剖面視圖。 As shown in FIGS. 1, 2 and 3, the component testing system 1 according to the preferred embodiment of the present invention further includes a base 20. The carrier 17, the electrical connection unit 18 and the height difference adjustment device 19 are disposed in the base 20. The actuator 10 includes a cover 102 and a pump (not shown in the figure). The contact member 11, the first pressure-sensitive column 12 and the second pressure-sensitive column 14 are fixed on the bottom surface 1020 of the cover 102. The cover 102 is sealed and movably matched with the base 20 to form a sealed cavity. For example, as shown in FIGS. 1, 2 and 3, the base 20 includes a rib wall 202 extending upward and closed. The first sealing element 104 is disposed on the end of the lining of the cover body 102, and the second sealing element 204 is disposed on the rib wall 202. By means of the first sealing element 104 and the second sealing element 204, the cover body 102 can be sealedly matched with the rib wall 202 of the base body 20 to form a sealed cavity. The sealed cavity has at least one exhaust hole 206. For example, as shown in FIGS. 1, 2 and 3, the base body 20 has an exhaust hole 206. The pump is connected to the exhaust hole 206 through a pipeline. The control device is electrically connected to the pump, and controls the pump to exhaust the sealed cavity through at least one exhaust hole, so that the cover body 102 moves toward the base body 20 to drive the contact member 11 to move toward the measured component 3. In order to clearly describe the component testing system 1 according to the preferred embodiment of the present invention, in FIG1 , the cover 102 is shown in a cross-sectional view.
請參閱圖4、圖5、圖6及圖7,該等圖式示意地描繪根據本發明之較佳具體實施例之元件測試系統1之一變形。圖4係以外觀視圖示意地繪示根據本發明之較佳具體實例之元件測試系統1之一變形,於圖4中,部分裝置、元件係以爆炸視圖呈現。圖5係以外觀視圖示意地繪示根據本發明之較佳具體實例之元件測試系統1之一變形。圖6係根據本發明之較佳具體實施例之元件測試系統1之一變形其抵觸構件11尚未朝向受測元件3移動的剖面視圖。圖7係根據本發明之較佳具體實施例之元件測試系統1之一變形其抵觸構件11已移動到抵觸受測元件3的剖面視圖。 Please refer to Figures 4, 5, 6 and 7, which schematically depict a variation of the component testing system 1 according to a preferred embodiment of the present invention. Figure 4 schematically depicts a variation of the component testing system 1 according to a preferred embodiment of the present invention in an exterior view, in which some devices and components are shown in an exploded view. Figure 5 schematically depicts a variation of the component testing system 1 according to a preferred embodiment of the present invention in an exterior view. Figure 6 is a cross-sectional view of a variation of the component testing system 1 according to a preferred embodiment of the present invention, in which the abutment member 11 has not yet moved toward the component under test 3. FIG. 7 is a cross-sectional view of a deformation of a component testing system 1 according to a preferred embodiment of the present invention, wherein the contact member 11 has moved to contact the component under test 3.
如圖4、圖5、圖6及圖7所示,於一具體實施例中,致動裝置10包含動力單元。例如,於圖4、圖5、圖6及圖7所示範例中,致動裝置10包含壓力氣壓缸106。抵觸 構件11裝設於壓力氣壓缸106上。圖4、圖5、圖6及圖7中具有與圖1、圖2及圖3中相同號碼標記之裝置、元件,有相同或類似的結構以及功能,在此不多做贅述。 As shown in Figures 4, 5, 6 and 7, in a specific embodiment, the actuator 10 includes a power unit. For example, in the examples shown in Figures 4, 5, 6 and 7, the actuator 10 includes a pressure cylinder 106. The contact member 11 is installed on the pressure cylinder 106. The devices and components in Figures 4, 5, 6 and 7 with the same number marks as those in Figures 1, 2 and 3 have the same or similar structures and functions, and will not be elaborated here.
請參閱圖8,圖8示意地描繪根據本發明之較佳具體實施例之元件測試系統1之另一變形。圖8係以外觀視圖示意地繪示根據本發明之較佳具體實例之元件測試系統1之另一變形的部分裝置、元件。於圖8中,部分裝置、元件係以爆炸視圖呈現,抵觸構件11係以虛線繪示。 Please refer to FIG. 8, which schematically depicts another variation of the component testing system 1 according to the preferred specific embodiment of the present invention. FIG. 8 schematically depicts part of the devices and components of another variation of the component testing system 1 according to the preferred specific embodiment of the present invention in an external view. In FIG. 8, part of the devices and components are presented in an exploded view, and the contact member 11 is depicted in dotted lines.
如圖8所示,進一步,根據本發明之較佳具體實施例之元件測試系統1之另一變形還包含第三感壓柱21、第四感壓元件22、第四感壓柱23以及第五感壓元件24。第三感壓柱21係設置於抵觸構件11的第一側旁,並且操作性地連接至致動裝置10。第三感壓柱21與第一感壓柱12相距一距離。第一感壓柱12與第三感壓柱21位於由垂直方向V以及縱向方向L所定義之一平面上。第四感壓元件22係彈性地設置於第三感壓柱21內。第四感壓柱23係設置於抵觸構件11的第二側旁,並且操作性地連接至致動裝置10。第四感壓柱23與第二感壓柱14相距該距離。第二感壓柱14與第四感壓柱23位於由垂直方向V以及縱向方向L所定義之另一平面上。第五感壓元件24係彈性地設置於第四感壓柱23內。控制裝置並且分別電氣連接至第四感壓元件22以及第五感壓元件24。第三感壓柱21之第三受壓面210以及第四感壓柱23之第四受壓面230皆面向承載裝置17,並且低於抵觸構件11的抵觸面110。當控制裝置控制致動裝置10移動使抵觸構件 11朝向受測元件3移動時,第三感壓柱21的第三受壓面210、第四感壓柱23的第四受壓面230也與第一感壓柱12的第一受壓面120、第二感壓柱14的第二受壓面140先抵觸承載裝置17,進而由第四感壓元件22感測到第四壓力值F4,由第五感壓元件24感測到第五壓力值F5。控制裝置根據第一壓力值F1、第二壓力值F2、第四壓力值F4以及第五壓力值F5計算受測元件3相對於抵觸面110之橫向高度差△hT以及縱向高度差△hL,進而控制高度差調節裝置19以帶動承載裝置17進而消除受測元件3相對於抵觸面110之橫向高度差△hT以及縱向高度差△hL。 As shown in FIG8 , further, another variation of the component testing system 1 according to the preferred specific embodiment of the present invention further includes a third pressure-sensing column 21, a fourth pressure-sensing element 22, a fourth pressure-sensing column 23 and a fifth pressure-sensing element 24. The third pressure-sensing column 21 is disposed on a first side of the contact member 11 and is operatively connected to the actuating device 10. The third pressure-sensing column 21 is spaced a distance from the first pressure-sensing column 12. The first pressure-sensing column 12 and the third pressure-sensing column 21 are located on a plane defined by a vertical direction V and a longitudinal direction L. The fourth pressure-sensing element 22 is elastically disposed in the third pressure-sensing column 21. The fourth pressure-sensing column 23 is disposed on a second side of the contact member 11 and is operatively connected to the actuating device 10. The fourth pressure-sensing column 23 is at the distance from the second pressure-sensing column 14. The second pressure-sensing column 14 and the fourth pressure-sensing column 23 are located on another plane defined by the vertical direction V and the longitudinal direction L. The fifth pressure-sensing element 24 is elastically disposed in the fourth pressure-sensing column 23. The control device is electrically connected to the fourth pressure-sensing element 22 and the fifth pressure-sensing element 24, respectively. The third pressure-receiving surface 210 of the third pressure-sensing column 21 and the fourth pressure-receiving surface 230 of the fourth pressure-sensing column 23 both face the supporting device 17 and are lower than the contact surface 110 of the contact member 11. When the control device controls the actuator 10 to move so that the contact member 11 moves toward the measured element 3, the third pressure-bearing surface 210 of the third pressure-sensitive column 21 and the fourth pressure-bearing surface 230 of the fourth pressure-sensitive column 23 also firstly contact the bearing device 17 together with the first pressure-bearing surface 120 of the first pressure-sensitive column 12 and the second pressure-bearing surface 140 of the second pressure-sensitive column 14, and then the fourth pressure-sensitive element 22 senses the fourth pressure value F4, and the fifth pressure-sensitive element 24 senses the fifth pressure value F5. The control device calculates the lateral height difference △h T and the longitudinal height difference △h L of the tested component 3 relative to the contact surface 110 according to the first pressure value F1, the second pressure value F2, the fourth pressure value F4 and the fifth pressure value F5, and then controls the height difference adjustment device 19 to drive the supporting device 17 to eliminate the lateral height difference △h T and the longitudinal height difference △h L of the tested component 3 relative to the contact surface 110.
請參閱圖9,圖9示意地描繪根據本發明之較佳具體實施例之元件測試系統1之另一變形。圖9係以外觀視圖示意地繪示根據本發明之較佳具體實例之元件測試系統1之另一變形的部分裝置、元件。於圖9中,部分裝置、元件係以爆炸視圖呈現,抵觸構件11係以虛線繪示。 Please refer to FIG. 9, which schematically depicts another variation of the component testing system 1 according to the preferred specific embodiment of the present invention. FIG. 9 schematically depicts part of the devices and components of another variation of the component testing system 1 according to the preferred specific embodiment of the present invention in an external view. In FIG. 9, part of the devices and components are presented in an exploded view, and the contact member 11 is depicted in dotted lines.
如圖9所示,進一步,根據本發明之較佳具體實施例之元件測試系統1之另一變形還包含第五感壓柱25、第六感壓元件26、第六感壓柱27以及第七感壓元件28。第五感壓柱25係設置於抵觸構件11沿縱向方向L之第三側旁,並且操作性地連接至致動裝置10。第六感壓元件26係彈性地設置於第五感壓柱25內。第六感壓柱27係設置於抵觸構件11沿縱向方向L與第三側相對之第四側旁,並且操作性地連接至致動裝置10。第七感壓元件28係彈性地設置於第六感壓柱27內。第五感壓柱25與第六感壓柱27位於由垂直方向V 以及縱向方向L所定義之一平面上。控制裝置並且分別電氣連接至第六感壓元件26以及第七感壓元件28。第五感壓柱25之第五受壓面250以及第六感壓柱27之第六受壓面270皆面向承載裝置17,並且低於抵觸構件11的抵觸面110。當控制裝置控制致動裝置10移動使抵觸構件11朝向受測元件3移動時,第五感壓柱25的第五受壓面250、第六感壓柱27的第六受壓面270也與第一感壓柱12的第一受壓面120、第二感壓柱14的第二受壓面140先抵觸承載裝置17,進而由第六感壓元件26感測到第六壓力值F6,由第七感壓元件28感測到第七壓力值F7。控制裝置根據第一壓力F1以及第二壓力值F2計算受測元件3相對於抵觸面110之橫向高度差△hT,並且根據第六壓力值F6以及第七壓力值F7計算受測元件3相對於抵觸面110之縱向高度差△hL,進而控制高度差調節裝置19以帶動承載裝置17進而消除受測元件3相對於抵觸面110之橫向高度差△hT以及縱向高度差△hL。 As shown in FIG9 , further, another variation of the component testing system 1 according to the preferred embodiment of the present invention further comprises a fifth pressure-sensitive column 25, a sixth pressure-sensitive element 26, a sixth pressure-sensitive column 27 and a seventh pressure-sensitive element 28. The fifth pressure-sensitive column 25 is disposed on the third side of the contact member 11 along the longitudinal direction L, and is operatively connected to the actuator 10. The sixth pressure-sensitive element 26 is elastically disposed in the fifth pressure-sensitive column 25. The sixth pressure-sensitive column 27 is disposed on the fourth side of the contact member 11 along the longitudinal direction L opposite to the third side, and is operatively connected to the actuator 10. The seventh pressure-sensitive element 28 is elastically disposed in the sixth pressure-sensitive column 27. The fifth pressure-sensing column 25 and the sixth pressure-sensing column 27 are located on a plane defined by the vertical direction V and the longitudinal direction L. The control device is electrically connected to the sixth pressure-sensing element 26 and the seventh pressure-sensing element 28, respectively. The fifth pressure-receiving surface 250 of the fifth pressure-sensing column 25 and the sixth pressure-receiving surface 270 of the sixth pressure-sensing column 27 both face the supporting device 17 and are lower than the contact surface 110 of the contact member 11. When the control device controls the actuator 10 to move so that the contact member 11 moves toward the measured element 3, the fifth pressure-bearing surface 250 of the fifth pressure-sensitive column 25 and the sixth pressure-bearing surface 270 of the sixth pressure-sensitive column 27 also first contact the bearing device 17 together with the first pressure-bearing surface 120 of the first pressure-sensitive column 12 and the second pressure-bearing surface 140 of the second pressure-sensitive column 14, and then the sixth pressure-sensitive element 26 senses the sixth pressure value F6, and the seventh pressure-sensitive element 28 senses the seventh pressure value F7. The control device calculates the lateral height difference △h T of the tested component 3 relative to the contact surface 110 according to the first pressure value F1 and the second pressure value F2, and calculates the longitudinal height difference △h L of the tested component 3 relative to the contact surface 110 according to the sixth pressure value F6 and the seventh pressure value F7, and then controls the height difference adjustment device 19 to drive the supporting device 17 to eliminate the lateral height difference △h T and the longitudinal height difference △h L of the tested component 3 relative to the contact surface 110.
於本發明之一範例中,電連接單元18裝設彈簧針以提供第一電氣接觸點。關於第三壓力值F3的預定壓力值範圍與彈簧針的材質、彈簧針的壓縮量以及電連接單元18上複數根彈簧針的根數有關。根據彈簧針的製造廠商所建議的合理壓縮量,譬如單根彈簧針的合理壓縮量為20%~40%,彈簧針的彈力為30g~60g。請參閱圖10,圖10為電連接單元18上裝設88根彈簧針時第三壓力值F3與彈簧針的壓縮量之關係圖。圖10顯示第三壓力值F3與彈簧針的壓縮量成直線變化。電連接單元18上裝設88根彈簧針,則合理的彈簧針回 饋力量讀取值(第三壓力值F3)應為2.64~5.28Kg。因此,於此範例中,第三壓力值F3的預定壓力值範圍為2.64~5.28Kg。若第三感壓元件16感測到的第三壓力值F3超過安全範圍(例如,超過5.28kg),控制裝置判斷可能發生彈簧針的壓縮行程過大,高度差調節裝置19可即時調整,增大抵觸構件11與承載裝置17的相對位置,直到受力重新落在安全的範圍之內後,高度差調節裝置19即停止作動。 In one example of the present invention, the electrical connection unit 18 is equipped with a spring pin to provide a first electrical contact point. The predetermined pressure value range of the third pressure value F3 is related to the material of the spring pin, the compression amount of the spring pin, and the number of the plurality of spring pins on the electrical connection unit 18. According to the reasonable compression amount recommended by the manufacturer of the spring pin, for example, the reasonable compression amount of a single spring pin is 20%~40%, and the spring force of the spring pin is 30g~60g. Please refer to Figure 10, which is a relationship diagram between the third pressure value F3 and the compression amount of the spring pin when 88 spring pins are installed on the electrical connection unit 18. FIG. 10 shows that the third pressure value F3 varies in a straight line with the compression of the spring pin. If 88 spring pins are installed on the electrical connection unit 18, the reasonable spring pin feedback force reading value (third pressure value F3) should be 2.64~5.28Kg. Therefore, in this example, the predetermined pressure value range of the third pressure value F3 is 2.64~5.28Kg. If the third pressure value F3 sensed by the third pressure-sensing element 16 exceeds the safety range (for example, exceeds 5.28kg), the control device determines that the compression stroke of the spring pin may be too large, and the height difference adjustment device 19 can be adjusted immediately to increase the relative position of the contact member 11 and the supporting device 17 until the force falls back into the safe range, and the height difference adjustment device 19 stops operating.
請參閱圖11,圖11為本發明之另一範例其第一感壓柱12抵觸承載裝置17後第一感壓元件13感測到的第一壓力值F1隨時間的變化圖。第一感壓元件13的第一壓力值F1隨時間的變化呈現二段式的變化,在第二階段的斜率小於第一階段的斜率。因此,除了可以利用第一感壓元件13與第二感壓元件15的壓力曲線來調整來消除橫向高度差△hT之外,由受力曲線的第二段變化,也可以作為判斷抵觸構件11是否升降動作的根據。 Please refer to FIG. 11, which is another example of the present invention, showing the change of the first pressure value F1 sensed by the first pressure-sensitive element 13 over time after the first pressure-sensitive column 12 contacts the support device 17. The first pressure value F1 of the first pressure-sensitive element 13 changes over time in two stages, and the slope in the second stage is smaller than the slope in the first stage. Therefore, in addition to using the pressure curves of the first pressure-sensitive element 13 and the second pressure-sensitive element 15 to adjust and eliminate the lateral height difference Δh T , the change in the second stage of the force curve can also be used as a basis for judging whether the contact member 11 is lifting or lowering.
於實際應用中,根據本發明之較佳具體實施例之元件測試系統1可以包含複數個抵觸構件11以及複數個電連接單元18。複數個電連接單元18係固定於一個承載裝置17上。每一個電連接單元18上放置一個受測元件3。藉由根據本發明之較佳具體實施例之元件測試系統1可以即時調整消除每一個受測元件3相對於抵觸構件11的抵觸面110之橫向高度差△hT以及縱向高度差△hL。即便複數個受測元件3的厚度存在些微差距,藉由根據本發明之較佳具體實施例之元件測試系統1可以讓每一受測元件3之複數個電氣接觸點皆受 到相同的壓力,且受壓壓力落於預定壓力值範圍。 In practical applications, the component testing system 1 according to the preferred specific embodiment of the present invention may include a plurality of abutment members 11 and a plurality of electrical connection units 18. The plurality of electrical connection units 18 are fixed on a carrier 17. A component under test 3 is placed on each electrical connection unit 18. The component testing system 1 according to the preferred specific embodiment of the present invention can instantly adjust and eliminate the lateral height difference Δh T and the longitudinal height difference Δh L of each component under test 3 relative to the abutment surface 110 of the abutment member 11. Even if there is a slight difference in thickness among the plurality of components under test 3, the component testing system 1 according to the preferred embodiment of the present invention can make the plurality of electrical contact points of each component under test 3 be subjected to the same pressure, and the pressure falls within a predetermined pressure value range.
藉由以上對本發明之詳述,可以清楚了解根據本發明之元件測試系統能即時調整消除受測元件相對於抵觸構件的抵觸面之橫向高度差以及縱向高度差,進而讓受測元件之複數個電氣接觸點與電連接單元之複數個電氣接觸點達成良好的電氣接觸。並且,根據本發明之元件測試系統能讓受測元件之複數個電氣接觸點皆受到相同的壓力,且受壓壓力落於預定壓力值範圍。 Through the above detailed description of the present invention, it can be clearly understood that the component testing system according to the present invention can instantly adjust and eliminate the lateral height difference and longitudinal height difference of the contact surface of the component under test relative to the contact member, thereby allowing the multiple electrical contact points of the component under test to achieve good electrical contact with the multiple electrical contact points of the electrical connection unit. In addition, the component testing system according to the present invention can make the multiple electrical contact points of the component under test all receive the same pressure, and the pressure falls within the predetermined pressure value range.
藉由以上較佳具體實施例之詳述,係希望能更加清楚描述本發明之特徵與精神,而並非以上述所揭露的較佳具體實施例來對本發明之面向加以限制。相反地,其目的是希望能涵蓋各種改變及具相等性的安排於本發明所欲申請之專利範圍的面向內。因此,本發明所申請之專利範圍的面向應該根據上述的說明作最寬廣的解釋,以致使其涵蓋所有可能的改變以及具相等性的安排。 The above detailed description of the preferred specific embodiments is intended to more clearly describe the features and spirit of the present invention, and is not intended to limit the scope of the present invention by the preferred specific embodiments disclosed above. On the contrary, the purpose is to cover various changes and arrangements with equivalents within the scope of the patent that the present invention intends to apply for. Therefore, the scope of the patent applied for by the present invention should be interpreted in the broadest sense according to the above description, so as to cover all possible changes and arrangements with equivalents.
1:元件測試系統 1: Component testing system
10:致動裝置 10: Actuator
102:罩體 102: mask body
1020:底表面 1020: Bottom surface
104:第一密封元件 104: First sealing element
106:壓力氣壓缸 106: Pressure cylinder
11:抵觸構件 11: Contact components
110:抵觸面 110:Contact surface
12:第一感壓柱 12: The first pressure-sensing column
120:第一受壓面 120: First pressure surface
13:第一感壓元件 13: First pressure sensing element
14:第二感壓柱 14: Second pressure-sensing column
140:第二受壓面 140: Second pressure surface
15:第二感壓元件 15: Second pressure-sensitive element
16:第三感壓元件 16: The third pressure-sensitive element
17:承載裝置 17: Carrier device
18:電連接單元 18: Electrical connection unit
19:高度差調節裝置 19: Height difference adjustment device
20:座體 20: Seat
202:肋壁 202: Rib wall
204:第二密封元件 204: Second sealing element
206:抽氣孔 206: Exhaust hole
21:第三感壓柱 21: The third pressure-sensing column
210:第三受壓面 210: The third pressure surface
22:第四感壓元件 22: The fourth pressure-sensitive element
23:第四感壓柱 23: The fourth pressure-sensing column
230:第四受壓面 230: Fourth pressure surface
24:第五感壓元件 24: Fifth pressure sensing element
25:第五感壓柱 25: The fifth pressure column
250:第五受壓面 250: Fifth pressure surface
26:第六感壓元件 26: Sixth pressure sensing element
27:第六感壓柱 27: Sixth Sense Pressure Column
270:第六受壓面 270: Sixth pressure surface
28:第七感壓元件 28: Seventh pressure sensing element
3:受測元件 3: Tested components
V:垂直方向 V: vertical direction
T:橫向方向 T: Horizontal direction
L:縱向方向 L: Longitudinal direction
圖1係根據本發明之較佳具體實施例之元件測試系統的外觀視圖。 圖2係根據本發明之較佳具體實施例之元件測試系統其抵觸構件尚未朝向受測元件移動的剖面視圖。 圖3係根據本發明之較佳具體實施例之元件測試系統其抵觸構件已移動到抵觸受測元件的剖面視圖。 圖4係根據本發明之較佳具體實施例之元件測試系統之一變形的外觀視圖及部分裝置、元件的爆炸視圖。 圖5係根據本發明之較佳具體實施例之元件測試系統之一變形的外觀視圖。 圖6係根據本發明之較佳具體實施例之元件測試系統之一變形其抵觸構件尚未朝向受測元件移動的剖面視圖。 圖7係根據本發明之較佳具體實施例之元件測試系統之一變形其抵觸構件已移動到抵觸受測元件的剖面視圖。 圖8係根據本發明之較佳具體實施例之元件測試系統之另一變形的部分裝置、元件的外觀視圖。 圖9係根據本發明之較佳具體實施例之元件測試系統之另一變形的部分裝置、元件的外觀視圖。 圖10係本發明之一範例根據本發明之元件測試系統其電連接單元上裝設88根彈簧針時第三壓力值與彈簧針的壓縮量之關係圖。 圖11為本發明之另一範例根據本發明之元件測試系統其第一感壓柱抵觸承載裝置後第一感壓元件感測到的第一壓力值隨時間的變化圖。 FIG. 1 is an external view of a component test system according to a preferred embodiment of the present invention. FIG. 2 is a cross-sectional view of a component test system according to a preferred embodiment of the present invention, wherein the abutment member has not yet moved toward the component under test. FIG. 3 is a cross-sectional view of a component test system according to a preferred embodiment of the present invention, wherein the abutment member has moved to abut the component under test. FIG. 4 is a deformed external view of a component test system according to a preferred embodiment of the present invention and an exploded view of some devices and components. FIG. 5 is a deformed external view of a component test system according to a preferred embodiment of the present invention. FIG. 6 is a cross-sectional view of a deformation of a component test system according to a preferred specific embodiment of the present invention, in which the abutment member has not yet moved toward the component under test. FIG. 7 is a cross-sectional view of a deformation of a component test system according to a preferred specific embodiment of the present invention, in which the abutment member has moved to abut the component under test. FIG. 8 is an external view of a partial device and a component of another deformation of a component test system according to a preferred specific embodiment of the present invention. FIG. 9 is an external view of a partial device and a component of another deformation of a component test system according to a preferred specific embodiment of the present invention. FIG. 10 is a diagram showing the relationship between the third pressure value and the compression amount of the spring pins when 88 spring pins are installed on the electrical connection unit of the component test system according to one example of the present invention. FIG. 11 is a diagram showing the change of the first pressure value sensed by the first pressure-sensitive element over time after the first pressure-sensitive column of the component test system according to another example of the present invention contacts the carrier device.
1:元件測試系統 1: Component testing system
10:致動裝置 10: Actuator
102:罩體 102: mask body
1020:底表面 1020: Bottom surface
104:第一密封元件 104: First sealing element
11:抵觸構件 11: Contact components
110:抵觸面 110:Contact surface
12:第一感壓柱 12: The first pressure-sensing column
120:第一受壓面 120: First pressure surface
13:第一感壓元件 13: First pressure sensing element
14:第二感壓柱 14: Second pressure-sensing column
140:第二受壓面 140: Second pressure surface
15:第二感壓元件 15: Second pressure-sensitive element
16:第三感壓元件 16: The third pressure-sensitive element
17:承載裝置 17: Carrier device
18:電連接單元 18: Electrical connection unit
19:高度差調節裝置 19: Height difference adjustment device
20:座體 20: Seat
202:肋壁 202: Rib wall
204:第二密封元件 204: Second sealing element
206:抽氣孔 206: Exhaust hole
3:受測元件 3: Tested components
V:垂直方向 V: vertical direction
T:橫向方向 T: Horizontal direction
Claims (5)
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| TW113103375A TWI859062B (en) | 2024-01-29 | 2024-01-29 | Device test system |
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| TW113103375A TWI859062B (en) | 2024-01-29 | 2024-01-29 | Device test system |
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| TWI859062B true TWI859062B (en) | 2024-10-11 |
| TW202530710A TW202530710A (en) | 2025-08-01 |
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| Application Number | Title | Priority Date | Filing Date |
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| TW113103375A TWI859062B (en) | 2024-01-29 | 2024-01-29 | Device test system |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108469583A (en) * | 2018-05-28 | 2018-08-31 | 格力电器(郑州)有限公司 | ICT tester |
| CN109655469A (en) * | 2018-12-27 | 2019-04-19 | 深圳市燕麦科技股份有限公司 | A kind of the docking test device and its docking test method of flexible circuit board |
| US11029370B1 (en) * | 2020-05-22 | 2021-06-08 | Allegro Microsystems, Llc | Sensor output control methods and apparatus |
| US11448695B2 (en) * | 2007-12-19 | 2022-09-20 | Aehr Test Systems | System for testing an integrated circuit of a device and its method of use |
| CN217689166U (en) * | 2022-05-11 | 2022-10-28 | 纳峰真空镀膜(上海)有限公司 | Automatic test equipment for contact resistance |
-
2024
- 2024-01-29 TW TW113103375A patent/TWI859062B/en active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11448695B2 (en) * | 2007-12-19 | 2022-09-20 | Aehr Test Systems | System for testing an integrated circuit of a device and its method of use |
| CN108469583A (en) * | 2018-05-28 | 2018-08-31 | 格力电器(郑州)有限公司 | ICT tester |
| CN109655469A (en) * | 2018-12-27 | 2019-04-19 | 深圳市燕麦科技股份有限公司 | A kind of the docking test device and its docking test method of flexible circuit board |
| US11029370B1 (en) * | 2020-05-22 | 2021-06-08 | Allegro Microsystems, Llc | Sensor output control methods and apparatus |
| CN217689166U (en) * | 2022-05-11 | 2022-10-28 | 纳峰真空镀膜(上海)有限公司 | Automatic test equipment for contact resistance |
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| Publication number | Publication date |
|---|---|
| TW202530710A (en) | 2025-08-01 |
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