TWI858926B - Functional testing device - Google Patents

Abstract

The present disclosure relates to a functional testing device, includes a substrate, an input/output module, functional testing modules, a baseboard controller module and a power module. The input/output module is disposed on the substrate and configured to receive a test script. The functional testing modules are pluggably disposed on the substrate. The baseboard controller module is disposed on the substrate and connected to the input/output module and the functional testing modules. The baseboard controller module is configured to control the functional testing modules to output testing signals according to the testing script. The power module is disposed on the substrate and configured to receive and output power to the functional testing modules and the baseboard controller module.

Description

Functional test equipment

The present invention relates to a functional testing device.

In server product manufacturing, the test station that performs function board test (FBT) is the last product verification station. The production process and product function can be confirmed through the test station. The operation of the test station is mainly responsible for connecting the various components required on the server motherboard or peripheral function card to the connector of the test station for testing.

Current test machines require real motherboards for testing, and they must be powered on to the operating system before testing. Moreover, they can only test one server motherboard or peripheral function card at a time. This not only increases the testing time and cost, but also makes it impossible to achieve a balance between supply and demand in the future as the demand for server motherboards or peripheral function cards continues to increase.

In view of the above, the present invention provides a functional testing device to meet the above requirements.

According to an embodiment of the present invention, a functional test device includes: a substrate, an input-output module, a plurality of functional test modules, a substrate management control module, and a power module. The input-output module is arranged on the substrate for receiving a test script. The functional test modules are pluggably arranged on the substrate. The substrate management control module is arranged on the substrate and connected to the input-output module and the functional test modules. The substrate management control module is used to control the functional test modules to output a plurality of test signals according to the test script. The power module is arranged on the substrate for receiving and transmitting power to the functional test modules and the substrate management control module.

According to the functional test device of one or more embodiments above, multiple tests can be performed on one or more DUTs at the same time, thereby reducing the test time. In addition, since the functional test device of the above embodiments does not need to pass through the motherboard, the test cost can be reduced.

The above description of the disclosed content and the following description of the implementation methods are used to demonstrate and explain the spirit and principle of the present invention, and provide a further explanation of the scope of the patent application of the present invention.

The following detailed description of the features and advantages of the present invention is provided in the implementation mode, and the content is sufficient to enable any person skilled in the relevant art to understand the technical content of the present invention and implement it accordingly. Moreover, according to the content disclosed in this specification, the scope of the patent application and the drawings, any person skilled in the relevant art can easily understand the relevant purposes and advantages of the present invention. The following embodiments are to further explain the viewpoints of the present invention in detail, but are not to limit the scope of the present invention by any viewpoint.

The function test device, system and method disclosed in one or more of the following embodiments of the present invention can be applied to a function board test (FBT) station for testing a motherboard or a peripheral function card, especially a motherboard or a peripheral function card of a server.

Please refer to FIG. 1 , which is a block diagram of a functional test device according to an embodiment of the present invention. As shown in FIG. 1 , the functional test device 11 includes a substrate 110, an input-output module 111, a plurality of functional test modules 112a and 112b, a substrate management control module 113, and a power module 114. FIG. 1 exemplarily presents two functional test modules, but the present invention does not limit the number of functional test modules. The input-output module 111, the substrate management control module 113, and the power module 114 are disposed on the substrate 110, and the functional test modules 112a and 112b are pluggably disposed on the substrate 110. The functional test modules 112a and 112b may have different test functions, and each may execute one or more test items. For example, the functional test modules 112a and 112b can be disposed on the substrate 110 via a peripheral component interconnect express (PCIe) port. The functional test modules 112a and 112b can each have a height, width, and length of half-height half-length (HHHL) or a height, width, and length of full-height half-length (FHHL). The baseboard management control module 113 is connected to the input and output module 111, the functional test modules 112a and 112b, and the power module 114.

The input-output module 111 may include one or more communication ports for accessing test scripts. In other words, the input-output module 111 is used to receive test scripts. Specifically, the input-output module 111 can be communicatively connected to a user interface to receive a test script input by a user, or/and communicatively connected to a database server to obtain a test script, wherein the communication connection can be via a wired or wireless method. The test script can indicate test items and corresponding test processes, including the execution sequence of multiple test items of the functional test modules 112a and 112b. The power module 114 is used to receive and transmit power to the functional test modules 112a and 112b and the baseboard management control module 113. Furthermore, the power module 114 can transmit power to the object under test.

The baseboard management control module 113 may include a baseboard management controller (BMC) and a memory, wherein the embedded memory of the baseboard management controller may pre-store test commands corresponding to the test items of the functional test modules 112a and 112b, and the memory may be used to store test scripts. Specifically, the embedded memory may be a non-volatile memory such as an embedded multimedia card (eMMC), and the memory may be a volatile memory such as a double data rate fourth generation synchronous dynamic random-access memory (DDR4). The baseboard management control module 113 is used to control the functional test modules 112a and 112b to output multiple test signals according to the test script, wherein the test signals can be output to the DUT. The baseboard management control module 113 can also obtain the response signal of the DUT to the test signal through the functional test modules 112a and 112b, and generate a pass or fail test result accordingly.

After the input-output module 111 receives the test script, the baseboard management controller of the baseboard management control module 113 can store the test script in the memory of the baseboard management controller, and when the test is to be executed, read the test script in the memory, and use at least a portion of the test instructions stored in the embedded memory of the baseboard management controller to control the functional test modules 112a and 112b to output test signals according to the read test script.

For example, the test items may include test items for the interconnection of the quick peripheral components. The test items for the interconnection of the quick peripheral components may include one or more of link transmission speed and width, link speed change test, data transmission performance, receiver lane margin test, receiver eye diagram, packet generator and error injection. The baseboard management control module 113 may obtain the response signal of the quick peripheral component interconnection to the above test items through the functional test modules 112a and 112b, and generate test results accordingly.

In addition, the input-output module 111 can be further used to obtain identification information of the object to be tested. The baseboard management controller of the baseboard management control module 113 requests a test script corresponding to the identification information from the database server through the input-output module 111, and then stores the test script in the memory of the baseboard management controller. The read-only memory (ROM) of the object to be tested can store the identification information of the object to be tested, and the input-output module 111 can obtain the identification information by directly reading the read-only memory of the object to be tested. The identification information can be the name and/or serial number of the object to be tested, etc., and the present invention is not limited thereto.

Please refer to FIG. 1 and FIG. 2 , wherein FIG. 2 is a block diagram of a baseboard management control module according to an embodiment of the present invention. As shown in FIG. 2 , the baseboard management control module 113 may include an expansion board 1130 , a first memory element 1131 , a second memory element 1132 , a control chip 1133 , and a connection port 1134 , wherein the first memory element 1131 , the second memory element 1132 , the control chip 1133 , and the connection port 1134 are disposed on the expansion board 1130 . Specifically, the first memory element 1131 may be the aforementioned memory for storing test scripts, the second memory element 1132 may be the aforementioned memory for storing test instructions corresponding to multiple test items, and the control chip 1133 may be a chip for executing baseboard management control (RunBMC). The control chip 1133 may be connected to the circuit on the substrate 110 through the connection port 1134, and the connection port 1134 is, for example, a dual in-line memory module (DIMM) interface. In other words, the baseboard management control module 113 may be pluggably connected to the substrate 110, but in another embodiment, the baseboard management control module 113 may include a first memory element 1131, a second memory element 1132, and a control chip 1133 directly disposed on the substrate 110.

Please refer to Figures 1 to 3, wherein Figure 3 is a block diagram of an input-output module according to an embodiment of the present invention. As shown in Figure 3, the input-output module 111 may include a first communication port 1111, a second communication port 1112, and a third communication port 1113. The first communication port 1111 is used to connect to the database server A1, the second communication port 1112 is used to connect to the scanning device A2, and the third communication port 1113 is used to connect to the user interface A3. For example, the first communication port 1111 may be RJ45, and the second communication port 1112 may be a universal serial bus (USB) interface. The third communication port 1113 may be one of a universal serial bus interface, RS232, and RS485. The embodiment of FIG. 3 only exemplarily illustrates three types of communication ports. In other embodiments, the functional testing device 11 may include one or two of the three types of communication ports, and the number of each type of communication port is not limited.

The database server A1 may be a cloud database server, storing multiple test scripts corresponding to different objects to be tested. The scanning device A2 may be a barcode scanning device, which may be used to scan the barcode on the object to be tested to obtain the aforementioned identification information. The user interface A3 may be a keyboard, a mouse, a touch screen, etc., for receiving information input by the user.

The baseboard management control module 113 can request the test script corresponding to the identification information (i.e., corresponding to the object under test) from the database server A1 through the first communication port 1111 according to the identification information. In addition, the third communication port 1113 can also be used to receive the test script from the user interface A3. In other words, the input/output module 111 can include both the first communication port 1111 and the third communication port 1113, or only one of them.

Please refer to FIG. 4 and FIG. 5 together. FIG. 4 is a three-dimensional schematic diagram of a functional test device according to an embodiment of the present invention, and FIG. 5 is a top view of the functional test device of FIG. 4. The substrate 110, the input-output module 111, the functional test modules 112a and 112b, the substrate management control module 113, and the power module 114 shown in FIG. 1 to FIG. 3 can be arranged as shown in FIG. 4 and FIG. 5. In addition, the power module 114 may include a power input port 1141 and a power output port 1142. The power input port 1141 is used to receive power from an external power source to supply power to each module on the substrate 110, and output power to the object under test through the power output port 1142.

Please refer to FIG6 , which is a block diagram of a functional test system according to an embodiment of the present invention. As shown in FIG6 , the functional test system 1 includes a functional test device 11 and a device under test 12 as shown in FIG1 . Functional test modules 112a and 112b are pluggably disposed on a substrate 110 and pluggably connected to the device under test 12. The device under test 12 is connected to a power module 114, which is used to receive and output power to the device under test 12. The input-output module 111 is used to receive a plurality of test scripts corresponding to the device under test 12. The substrate management control module 113 is used to test the device under test 12 through the functional test modules 112a and 112b according to the test scripts. In other words, the baseboard management control module 113 controls the functional test modules 112a and 112b to output the test signals to the DUT 12 according to the test scripts.

Please refer to FIG. 7, which is a block diagram of a functional test system according to another embodiment of the present invention. As shown in FIG. 7, the functional test system 1' includes the functional test device 11 shown in FIG. 1, a plurality of objects to be tested 12a to 12c, and an interface card 13. The number of functional test modules and the number of objects to be tested shown in FIG. 7 are only examples. The number of functional test modules may be greater than 2, and the number of objects to be tested may be between 1 and 3, or may be greater than 3. For example, each of the objects to be tested 12a to 12c may include a non-volatile memory for storing identification information. The interface card 13 is used to connect the functional test modules 112a and 112b to the objects to be tested 12a to 12c. The functional test modules 112a and 112b can be connected to the interface card 13 via a mini cool edge I/O (MCIO) transmission line. Specifically, in the architecture of FIG. 3 , the interface card 13 can be used to transmit the power output by the power module 114 and the test signals output by the functional test modules 112a and 112b to the DUTs 12a to 12c.

Please refer to FIG. 7, FIG. 8A and FIG. 8B together, wherein FIG. 8A is a block diagram of a housing, a power signal input port and a test signal input port of an interface card according to an embodiment of the present invention, and FIG. 8B is a block diagram of a signal output port of an interface card according to an embodiment of the present invention. As shown in FIG. 8A and FIG. 8B, the interface card 13 has a housing 130, a power signal input port 131, one or more test signal input ports 132 and one or more signal output ports 133. The signal output port 133 includes a power signal sub-port 1331 corresponding to the power signal input port 131 and one or more test signal sub-ports 1332 corresponding to the test signal input port 132. The power signal input port 131 is electrically connected to the power module 114 and the power signal sub-port 1331. The test signal input port 132 is electrically connected to the test signal sub-port 1332 and the functional test modules 112a and 112b. Specifically, the power signal input port 131 and the test signal input port 132 can be disposed on the first surface 1301 of the housing 130, and the signal output port 133 can be disposed on the second surface 1302 of the interface card 13. More specifically, the second surface 1302 can be opposite to the first surface 1301. The signal output port 133 can be connected to the object under test through a flat cable. 8A and 8B exemplarily show the locations of the power signal input port 131 , the test signal input port 132 , and the signal output port 133 of the interface card, but the locations of the power signal input port 131 , the test signal input port 132 , and the signal output port 133 of the present invention are not limited thereto.

The power signal input port 131 is used to receive power from the power module 114 and output the power to the DUTs 12a to 12c via the power signal sub-port 1331. The test signal input port 132 is used to receive test signals from the functional test modules 112a and 112b and output the test signals to the DUTs 12a to 12c via the test signal sub-port 1332. In the embodiments of Figures 8A and 8B, a test signal input port 132 can be used to receive a test signal from one of the functional test modules 112a and 112b, or a test signal input port 132 can be used to receive test signals from both the functional test modules 112a and 112b; a signal output port 133 can be used to output power and a test signal to one of the devices under test 12a to 12c, or a signal output port 133 can be used to output power and a test signal to each of the devices under test 12a to 12c.

Please refer to FIG. 9, which is a block diagram of a functional test device according to another embodiment of the present invention. As shown in FIG. 9, the functional test device 21 includes a substrate 210, an input-output module 211, a plurality of connection ports 212a and 212b, a main control module 213, and a power module 214. FIG. 9 shows two connection ports as an example, but the present invention does not limit the number of connection ports. The substrate 210 and the input-output module 211 of the functional test device 21 can be the same as the substrate 110 and the input-output module 111 of the embodiments of FIGS. 1 to 8, so they are not described here in detail.

The connection ports 212a and 212b and the main control module 213 are disposed on the substrate 210, and the main control module 213 is connected to the connection ports 212a and 212b. The main control module 213 is used to output a plurality of test signals to the connection ports 212a and 212b according to the test script received by the input/output module 211. Furthermore, the connection ports 212a and 212b can be quick peripheral component interconnection connection ports, respectively used to connect to the object to be tested.

Please refer to FIG. 9 and FIG. 10 , where FIG. 10 is a block diagram of a main control module according to an embodiment of the present invention. As shown in FIG. 10 , the main control module 213 includes a processor 2131, a first connection port 2132, and a second connection port 2133. The processor 2131 is connected to the first connection port 2132 and the second connection port 2133. FIG. 10 shows two connection ports as an example, but the present invention does not limit the number of connection ports. The first connection port 2132 can be a quick peripheral component interconnection connection port, and the second connection port 2133 can be an RJ45.

Please refer to FIG. 9 to FIG. 11 , where FIG. 11 is a schematic diagram of the functional test device of FIG. 9 . As shown in FIG. 11 , the input-output module 211 includes a first communication port 2111, a second communication port 2112, and a third communication port 2113, and the power module 214 includes a power input port 2141 and a power output port 2142, wherein the first communication port 2111, the second communication port 2112, and the third communication port 2113 may be respectively the same as the first communication port 1111, the second communication port 1112, and the third communication port 1113 of FIG. 3 to FIG. 5 , and the power input port 2141 and the power output port 2142 may be respectively the same as the power input port 1141 and the power output port 1142 of FIG. 4 and FIG. 5 .

Furthermore, the power module 214 may include a power input port 2141 for receiving power from the outside, supplying the power to the main control module 213, and supplying the power to the DUT via the connection ports 212a and 212b.

In addition, the functional test device 21 can also be connected to the DUT in the manner of one or more embodiments as shown in Figures 6 to 8. In this embodiment, the connection ports 212a and 212b are used to connect to the functional test module, and the power module 214 further includes a power output port 2142 for outputting power to the DUT.

In the functional test device 21, the main control module 213 may be a module with a central processing unit (CPU) as a main computing element, and connected to the circuit of the substrate 210 through a quick peripheral component interconnection port (first connection port 2132). In one embodiment, the main control module 213 may be a module with a baseboard management controller as a main computing element, and connected to the circuit of the substrate 210 through a quick peripheral component interconnection port (first connection port 2132). In addition, the functional test device 21 may further include a slave module 215, which is disposed on the substrate 210, and the slave module 215 may be a baseboard management control module. The implementation method of the baseboard management control module may be the same as the implementation method of FIG. 2.

In addition, the master module 213 may have a first connection port 2132, and the slave module 215 may have another communication port for obtaining a test script, wherein the communication port of the slave module 215 may also be RJ45. The master module 213 may output a test signal to one of the connection ports 212a and 212b according to a portion of the test script, and the slave module 215 may output a test signal to the other of the connection ports 212a and 212b according to another portion of the test script. In other words, the test script can indicate the test content that the master module 213 and the slave module 215 need to execute respectively. The master module 213 and the slave module 215 can obtain the same test script, and the master module 213 and the slave module 215 determine the test signals that they need to output through the connection ports 212a and 212b respectively according to the test script.

Please refer to FIG. 12, which is a block diagram of a functional test system according to another embodiment of the present invention. As shown in FIG. 12, the functional test system 3 includes a substrate 310, an input-output module 311, a plurality of connection ports 312a and 312b, a main control module 313, and a plurality of objects to be tested 32a and 32b. The substrate 310, the input-output module 311, the connection ports 312a and 312b, and the main control module 313 of the functional test system 3 may be the same as the substrate 210, the input-output module 211, the connection ports 212a and 212b, and the main control module 213 of the embodiments of FIGS. 9 to 11, and thus will not be described in detail here. In addition, the functional test system 3 may further include a slave module, and its implementation method may be the same as the embodiment of FIG. 11.

As shown in FIG12 , the DUT 32a is connected to the connection port 312a, and the DUT 32b is connected to the connection port 312b, wherein the DUT 32a and the DUT 32b may be the same or different from each other. As mentioned above, the main control module 313 may be a central processing unit, which is used to output a test signal to the connection ports 312a and 312b according to the test script, so as to output the test signal from the connection ports 312a and 312b to the DUT 32a and 32b respectively.

The functional test system 3 may further include a slave module, which may be the same as the slave module 215 of Figure 11. In other words, the slave module of the functional test system 3 may be a baseboard management control module, the master module 313 and the slave module each correspond to a communication port (e.g., RJ45) of the input/output module 311, for obtaining a test script; and the master module 313 and the slave module may each output a test signal to the connection ports 312a and 312b according to the test script.

In addition, the DUT tested by the master module 313 may be one or more of a network interface card (NIC) and a graphics processor card; the DUT tested by the slave module may be a DUT without active components, such as a riser card. In other words, the master module 313 is used to test the DUT 32a, and the slave module is used to test the DUT 32b, and the DUT 32b does not have active components.

Please refer to FIG. 13, which is a flow chart of a functional test method according to an embodiment of the present invention. The functional test method shown in FIG. 13 is applicable to an object to be tested, and can be executed by a device connected to a functional test module, or can be executed by a device directly connected to the object to be tested. In other words, the functional test method can be executed by the baseboard management control module, the main control module, and the slave module of one or more embodiments, and is applicable to the functional test devices and functional test systems of all the above embodiments. The functional test method is explained below using the functional test system 3 of FIG. 12 as an example. The functional testing method comprises: step S101: obtaining a test script from a cloud database server according to identification information of the object to be tested, wherein the test script comprises a plurality of test items of different types; and step S103: testing the object to be tested according to the test script.

In step S101, the main control module 313 obtains a test script from a cloud database server (e.g., database server A1 in FIG. 3 ) via the input/output module 311 according to the identification information of the object under test. As described above, the main control module 313 may obtain the identification information of the object under test by a scanning device or by reading the read-only memory of the object under test. The test script includes multiple test items of different types, such as a fast peripheral component interconnect interface type test item, a power supply type test item, a network connection type test item, etc.

In step S103, the main control module 313 tests the DUTs 32a and 32b according to the test script. Taking the DUT 32a as an example, the main control module 313 can output a corresponding test signal to the connection port 312a according to the test script to output the test signal to the DUT 32a.

Furthermore, taking the object to be tested 32a as an example, the implementation method of step S103 may also include the main control module 313 controlling the functional test modules (e.g., the functional test modules 112a and 112b of FIG. 1 ) to test the object to be tested 32a according to the test items of the test script, wherein each of the functional test modules can execute at least one of the test items. In addition, the main control module 313 may transmit a plurality of control signals corresponding to the test items to the functional test modules in a time-division multiplexing manner to control the functional test modules to test the object to be tested 32a. In other words, the main control module 313 may control the functional test modules to test the object to be tested 32a in a time-division multiplexing manner.

Please refer to FIG. 14, which is a flow chart of a method for testing a DUT according to an embodiment of the present invention. FIG. 14 can be regarded as a detailed flow chart of an embodiment of step S103 of FIG. 13. The following is also described by taking the functional test system 3 and the DUT 32a of FIG. 12 as an example. The method for testing the DUT includes: step S201: generating a first packet; step S203: outputting the first packet to the DUT via the rapid peripheral component interconnect interface, wherein the first packet includes a first check code; step S205: receiving a second packet from the DUT via the rapid peripheral component interconnect interface, wherein the second packet includes a second check code; step S207: determining whether the first check code is consistent with the second check code; if the determination result of step S207 is "yes", executing step S209: generating a positive test result about the DUT; and if the determination result of step S207 is "no", executing step S211: generating a negative test result about the DUT.

In step S201, the first packet generated by the main control module 313 may be included in the test signal. The first packet includes a first checksum, wherein the first checksum may be a function of a cyclic redundancy check (CRC). In addition, the first packet may also include data such as a packet sequence number, which is not limited by the present invention.

In step S203, the main control module 313 outputs the first packet to the DUT 32a via the PID interface (connection port 312a), wherein the PID interface can be the connection port 312a. Step S203 is equivalent to outputting the test signal to the DUT via the connection port/functional test module.

In step S205, the main control module 313 receives a second packet from the DUT 32a via the same fast peripheral component interconnect interface. The second packet includes a second verification code, wherein the second verification code can be a function of a cyclic redundancy check. In addition, the second packet can also include data such as a packet sequence number, which is not limited by the present invention.

In step S207, the main control module 313 determines whether the first verification code is consistent with the second verification code. If the first verification code is consistent with the second verification code, the main control module 313 determines that the test of the object under test 32a is successful, so the main control module 313 executes step S209 to generate a positive test result about the object under test 32a. On the contrary, if the first verification code is inconsistent with the second verification code, the main control module 313 determines that the test of the object under test 32a is unsuccessful, so the main control module 313 executes step S211 to generate a negative test result about the object under test 32a.

Please refer to FIG. 15 and FIG. 16 together, wherein FIG. 15 is a flow chart of a method for generating a first packet according to an embodiment of the present invention, and FIG. 16 is a schematic diagram of a functional test method according to an embodiment of the present invention. FIG. 15 can be regarded as a detailed flow chart of an embodiment of step S201 of FIG. 14. The following is also explained by taking the functional test system 3 and its DUT 32a of FIG. 12 as an example. The method for generating a first packet includes: step S301: generating a first checksum from a data link layer; step S303: generating a link layer packet from a data link layer based on a transport layer packet and the first checksum; and step S305: generating a first packet from a physical layer based on a link layer packet.

In step S301, the data link layer of the main control module 313 generates a first check code. In step S303, the data link layer of the main control module 313 generates a link layer packet based on a transaction layer packet and the first check code, wherein the transaction layer packet is generated by the transaction layer of the main control module 313. In other words, in step S303, the main control module 313 adds the first check code to the end of the transaction layer packet to generate a link layer packet, and may add a packet sequence number to the head of the transaction layer packet.

In step S305, the physical layer of the main control module 313 generates a first packet based on the link layer packet. Specifically, the physical layer of the main control module 313 may add a start to the head frame of the link layer packet and an end to the tail frame of the link layer packet to generate the first packet.

The DUT described in the above embodiments may be a server motherboard, a power board, a peripheral component interconnect express (PCIe) interface, a network interface card (NIC), a graphics processor card or an adapter card, etc., and the present invention is not limited thereto.

According to the functional test device, system and method of one or more embodiments, multiple tests can be performed on one or more DUTs at the same time, thereby reducing the test time. In addition, since the functional test device, system and method of one or more embodiments do not need to pass through the motherboard, the test cost can be reduced.

Although the present invention is disclosed as above with the aforementioned embodiments, it is not intended to limit the present invention. Any changes and modifications made without departing from the spirit and scope of the present invention are within the scope of patent protection of the present invention. Please refer to the attached patent application for the scope of protection defined by the present invention.

1,1’,3: Functional test system 11,21: Functional test device 110,210: Substrate 111,211,311: Input/output module 1111,2111: First communication port 1112,2112: Second communication port 1113,2113: Third communication port 112a,112b: Functional test module 113: Substrate management control module 1130: Expansion board 1131: First memory element 1132: Second memory element 1133: Control chip 1134,212a,212b,312a,312b: Connection port 114,214,314: Power module 1141,2141: Power input port 1142,2142: Power output port 12,12a,12b,12c,32a,32b: Object to be tested 13: Interface card 130: Housing 1301: First side 1302: Second side 131: Power signal input port 132: Test signal input port 133: Signal output port 1331: Power signal sub-port 1332: Test signal sub-port 213,313: Main control module 2131: Processor 2132: First connection port 2133: Second connection port 215: Slave module A1: Database server A2: Scanning device A3: User interface S101, S103, S201, S203, S205, S207, S209, S211, S301, S303, S305: Steps

FIG. 1 is a block diagram of a functional test device according to an embodiment of the present invention. FIG. 2 is a block diagram of a baseboard management control module according to an embodiment of the present invention. FIG. 3 is a block diagram of an input/output module according to an embodiment of the present invention. FIG. 4 is a three-dimensional schematic diagram of a functional test device according to an embodiment of the present invention. FIG. 5 is a top view of the functional test device of FIG. 4. FIG. 6 is a block diagram of a functional test system according to an embodiment of the present invention. FIG. 7 is a block diagram of a functional test system according to another embodiment of the present invention. FIG8A is a block diagram of a housing, a power signal input port, and a test signal input port of an interface card according to an embodiment of the present invention, and FIG8B is a block diagram of a signal output port of an interface card according to an embodiment of the present invention. FIG9 is a block diagram of a functional test device according to another embodiment of the present invention. FIG10 is a block diagram of a main control module according to an embodiment of the present invention. FIG11 is a schematic diagram of the functional test device of FIG9. FIG12 is a block diagram of a functional test system according to another embodiment of the present invention. FIG13 is a flow chart of a functional test method according to an embodiment of the present invention. FIG. 14 is a flow chart of a method for testing an object to be tested according to an embodiment of the present invention. FIG. 15 is a flow chart of a method for generating a first packet according to an embodiment of the present invention. FIG. 16 is a schematic diagram of a functional testing method according to an embodiment of the present invention.

11: Functional test equipment

110: Substrate

111: Input and output module

112a,112b: Functional test module

113: Baseboard management control module

114: Power module

Claims (10)

A functional test device comprises: a substrate; an input/output module disposed on the substrate and used to receive a test script; a plurality of functional test modules disposed on the substrate in a pluggable manner; a substrate management control module disposed on the substrate and connected to the input/output module and the functional test modules, the substrate management control module being used to control the functional test modules to output a plurality of test signals according to the test script; and a power module disposed on the substrate and used to receive and transmit power to the functional test modules and the substrate management control module. The functional test device as described in claim 1, wherein the baseboard management control module comprises: a first memory element; a second memory element for storing a plurality of test instructions; and a control chip connected to the first memory element and the second memory element, the control chip being used to store the test script in the first memory element, read the test script in the first memory element, and use at least a portion of the test instructions to control the functional test modules according to the read test script. The functional test device as described in claim 1, wherein the input-output module is further used to obtain identification information, and the baseboard management control module is further used to request the test script corresponding to the identification information from a database server through the input-output module. A functional test device as described in claim 1, wherein the baseboard management control module includes an expansion board and a connection port, the connection port is arranged on the expansion board, and the baseboard management control module is connected to the input and output module, the functional test modules and the power module through the connection port. The functional test device as described in claim 1, wherein the input-output module comprises: a first communication port for connecting to a database server; and a second communication port for connecting to a scanning device to obtain identification information from the scanning device; wherein the baseboard management control module is further used to request the test script from the database server through the first communication port according to the identification information. A functional test device as described in claim 5, wherein the first communication port is RJ45 and the second communication port is a Universal Serial Bus interface. A functional testing device as described in claim 1, wherein the input-output module includes a communication port for connecting to a user interface to receive the test script from the user interface. A functional test device as described in claim 7, wherein the communication port is one of a USB, RS232, and RS485. The functional test device as described in claim 1, wherein the input-output module comprises: a first communication port for connecting to a database server; and a second communication port for reading identification information; wherein the baseboard management control module is further used to request the test script from the database server through the first communication port according to the identification information. A functional test device as described in claim 1, wherein the functional test modules are arranged on the substrate through a quick peripheral component interconnection port.

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