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TWI856318B - Pressure reduction drying device, pressure reduction drying method and storage medium - Google Patents

Pressure reduction drying device, pressure reduction drying method and storage medium Download PDF

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TWI856318B
TWI856318B TW111119144A TW111119144A TWI856318B TW I856318 B TWI856318 B TW I856318B TW 111119144 A TW111119144 A TW 111119144A TW 111119144 A TW111119144 A TW 111119144A TW I856318 B TWI856318 B TW I856318B
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chamber
substrate
lifting
exhaust
unit
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TW202309457A (en
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西岡賢太郎
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日商斯庫林集團股份有限公司
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    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26DRYING
    • F26BDRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B5/00Drying solid materials or objects by processes not involving the application of heat
    • F26B5/04Drying solid materials or objects by processes not involving the application of heat by evaporation or sublimation of moisture under reduced pressure, e.g. in a vacuum
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D3/00Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
    • B05D3/04Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to gases
    • B05D3/0406Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to gases the gas being air
    • H10P72/7612
    • H10P72/7614

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
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  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Drying Of Solid Materials (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
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  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)

Abstract

本發明提供一種減壓乾燥裝置、減壓乾燥方法及程式。本發明的課題在於使形成於基板的上表面的塗膜更均勻地乾燥。在腔室內,支撐部從下方支撐基板,排氣部排出腔室內的氣體環境,供氣部向腔室內供給氣體。在進行利用排氣部的排氣及利用供氣部的供氣中的至少其中一者時,升降部使支撐部反覆升降。 The present invention provides a decompression drying device, a decompression drying method and a program. The subject of the present invention is to dry the coating formed on the upper surface of the substrate more evenly. In the chamber, the support part supports the substrate from below, the exhaust part exhausts the gas environment in the chamber, and the gas supply part supplies gas into the chamber. When at least one of the exhaust part and the gas supply part is used for exhausting and the gas supply part is used for supplying, the lifting part causes the support part to be repeatedly lifted and lowered.

Description

減壓乾燥裝置、減壓乾燥方法及記憶媒體 Pressure-reducing drying device, pressure-reducing drying method and storage medium

本發明是有關於一種通過減壓使形成於基板的上表面的塗膜乾燥的技術。 The present invention relates to a technology for drying a coating formed on the upper surface of a substrate by reducing pressure.

例如,已知有對塗布在各種基板上的光致抗蝕劑等的塗膜進行減壓乾燥的減壓乾燥裝置(例如,專利文獻1等)。對於各種基板,例如可應用用於形成各種元件的半導體晶片、玻璃基板或陶瓷基板等。對於各種元件,例如可應用半導體裝置、顯示面板、磁碟或光碟等。對於顯示面板,例如可應用液晶顯示面板、有機電致發光(Electroluminescence,EL)顯示面板或等離子體顯示面板等。 For example, there is a known decompression drying device for decompression drying of a coating of a photoresist or the like applied on various substrates (e.g., Patent Document 1, etc.). For various substrates, for example, semiconductor chips, glass substrates, or ceramic substrates used to form various components can be applied. For various components, for example, semiconductor devices, display panels, magnetic disks, or optical disks can be applied. For display panels, for example, liquid crystal display panels, organic electroluminescence (EL) display panels, or plasma display panels can be applied.

在使用減壓乾燥裝置乾燥塗膜時,例如,在腔室內多個銷支撐基板的狀態下,經由腔室的底部的排氣口利用真空泵從腔室內進行排氣。然後,例如,當真空度達到規定值時,停止來自腔室內的排氣,通過向腔室內供給氣體而使腔室內恢復成大氣壓。對於氣體,例如可應用氮氣等惰性氣體或空氣等。 When using a decompression drying device to dry a coating, for example, with a substrate supported by multiple pins in a chamber, exhaust is performed from the chamber using a vacuum pump through an exhaust port at the bottom of the chamber. Then, for example, when the vacuum reaches a specified value, exhaust from the chamber is stopped, and the chamber is restored to atmospheric pressure by supplying gas into the chamber. For the gas, for example, an inert gas such as nitrogen or air can be used.

[現有技術文獻] [Prior art literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本專利第4335786號公報 [Patent document 1] Japanese Patent No. 4335786

然而,在減壓乾燥裝置中,例如,在形成於基板的上表面的塗膜中,若乾燥速度根據場所而有所差異,則可能產生與所述乾燥速度的差異相應的乾燥的不均(也稱為乾燥不均)。乾燥不均例如產生乾燥後的塗膜的厚度的偏差等。 However, in a reduced pressure drying device, for example, in a coating formed on the upper surface of a substrate, if the drying speed varies depending on the location, drying unevenness (also called drying unevenness) may occur corresponding to the difference in drying speed. Drying unevenness may cause, for example, a deviation in the thickness of the coating after drying.

例如,在腔室內的減壓時,在經由排氣口利用真空泵對腔室內的氣體進行排氣時,在基板的上方可能產生持續的特定模式的氣流(也稱為第一穩定流)。由此,例如,根據第一穩定流,與場所相應的塗膜的乾燥速度可能產生差異。其結果,例如,在塗膜中的與第一穩定流相應的特定部位可能產生條狀的乾燥不均。此處,第一穩定流例如可能根據腔室的形狀及豎立設置有用於使配置於腔室內的基板升降的多個銷的板的形狀等而產生。 For example, when the pressure in the chamber is reduced, when the gas in the chamber is exhausted by a vacuum pump through the exhaust port, a continuous specific pattern of airflow (also called the first stable flow) may be generated above the substrate. As a result, for example, the drying speed of the coating corresponding to the location may differ according to the first stable flow. As a result, for example, strip-shaped drying unevenness may occur in a specific part of the coating corresponding to the first stable flow. Here, the first stable flow may be generated, for example, according to the shape of the chamber and the shape of a plate with multiple pins vertically arranged for lifting the substrate arranged in the chamber.

另外,例如,在通過在利用排氣的減壓後向腔室內供給氣體而使腔室內恢復成大氣壓時,在基板的上方可能產生持續的特定模式的氣流(也稱為第二穩定流)。由此,例如,若塗膜為半乾狀態,則根據第二穩定流,與場所相應的塗膜的乾燥速度可能產生差異。其結果,例如,在塗膜中的與第二穩定流相應的特定部位可能產生條狀的乾燥不均。此處,第二穩定流例如可能根據腔室的形狀及豎立設置有用於使配置於腔室內的基板升降的多個 銷的板的形狀等而產生。 In addition, for example, when the pressure in the chamber is restored to atmospheric pressure by supplying gas into the chamber after decompression by exhaust, a continuous specific pattern of airflow (also called a second stable flow) may be generated above the substrate. As a result, for example, if the coating is in a semi-dry state, the drying speed of the coating corresponding to the location may differ according to the second stable flow. As a result, for example, strip-shaped drying unevenness may occur in a specific part of the coating corresponding to the second stable flow. Here, the second stable flow may be generated, for example, according to the shape of the chamber and the shape of a plate on which a plurality of pins are vertically arranged for lifting and lowering the substrate arranged in the chamber.

另外,例如,在基板上,由於多個銷的接觸,在由多個銷支撐的部分與其周邊的部分之間可能產生溫度差。由此,例如,根據由多個銷引起的溫度差,塗膜的乾燥速度可能產生差異。其結果,例如,在塗膜上可能產生與多個銷的配置相應的乾燥不均。此處,例如,在塗膜的減壓乾燥時,雖然基板的溫度因溶劑等從塗膜氣化時產生的氣化熱而下降,但是無論是在多個銷的熱容量大的情況還是在多個銷連結於熱容量大的腔室等的情況下,多個銷的溫度均難以變化。因此,例如,在基板上可能產生與多個銷的配置相應的溫度差。 In addition, for example, on a substrate, due to the contact of multiple pins, a temperature difference may occur between a portion supported by multiple pins and a portion surrounding the portion. As a result, for example, a difference may occur in the drying speed of the coating according to the temperature difference caused by the multiple pins. As a result, for example, drying unevenness may occur on the coating corresponding to the arrangement of the multiple pins. Here, for example, during the reduced pressure drying of the coating, although the temperature of the substrate decreases due to the vaporization heat generated when the solvent, etc. vaporizes from the coating, the temperature of the multiple pins is difficult to change regardless of whether the heat capacity of the multiple pins is large or the multiple pins are connected to a chamber with a large heat capacity. Therefore, for example, a temperature difference may occur on the substrate corresponding to the arrangement of the multiple pins.

另外,例如,在腔室內的減壓時,在基板的上表面中的形成有塗膜的區域(也稱為塗布區域)中,塗膜中的溶劑氣化,與此相對,在基板的上表面中的未形成有塗膜的區域(也稱為非塗布區域)中,溶劑不氣化。 In addition, for example, when the pressure in the chamber is reduced, the solvent in the coating vaporizes in the area on the upper surface of the substrate where the coating is formed (also called the coating area), whereas the solvent does not vaporize in the area on the upper surface of the substrate where the coating is not formed (also called the non-coating area).

此處,例如,假定在基板的上表面的大致整個面上形成有塗膜的情況。在此情況下,例如,在塗布區域的端部的上方,蒸發的溶劑的成分容易向基板上的外側等擴散,因此蒸發的溶劑的成分的濃度難以上升,塗布區域的端部的塗膜容易乾燥。另一方面,例如,在塗布區域的中央部的上方,蒸發的溶劑的成分難以擴散,因此蒸發的溶劑的成分的濃度容易上升,塗布區域的中央部的塗膜難以乾燥。由此,例如,在塗布區域中的中央部與端部之間,乾燥速度可能產生差異。其結果,例如,在塗布區域中, 可能產生由中央部與端部之間的乾燥速度的差異引起的乾燥不均。 Here, for example, it is assumed that a coating film is formed on substantially the entire upper surface of the substrate. In this case, for example, above the end of the coating area, the components of the evaporated solvent are easily diffused to the outside of the substrate, so the concentration of the components of the evaporated solvent is difficult to increase, and the coating film at the end of the coating area is easy to dry. On the other hand, for example, above the central part of the coating area, the components of the evaporated solvent are difficult to diffuse, so the concentration of the components of the evaporated solvent is easy to increase, and the coating film at the central part of the coating area is difficult to dry. As a result, for example, a difference in drying speed may occur between the central part and the end of the coating area. As a result, for example, in the coating area, uneven drying may occur due to the difference in drying speed between the center and the end.

此處,例如,假定在基板的上表面中的與多個元件相應的多個區域分別形成有塗膜的情況。在此情況下,例如,在各塗布區域的端部的上方,蒸發的溶劑的成分容易向基板上的外側或非塗布區域上擴散,因此蒸發的溶劑的成分的濃度難以上升,各塗布區域的端部的塗膜容易乾燥。另一方面,例如,在各塗布區域的中央部的上方,蒸發的溶劑的成分難以擴散,因此蒸發的溶劑的成分的濃度容易上升,各塗布區域的中央部的塗膜難以乾燥。由此,例如,在各塗布區域中的中央部與端部之間,乾燥速度可能產生差異。其結果,例如,在各塗布區域中,可能產生由中央部與端部之間的乾燥速度的差異引起的乾燥不均。 Here, for example, it is assumed that a coating film is formed in a plurality of regions corresponding to a plurality of elements in the upper surface of the substrate. In this case, for example, above the end of each coating region, the components of the evaporated solvent are easily diffused to the outer side or non-coating region on the substrate, so the concentration of the components of the evaporated solvent is difficult to increase, and the coating film at the end of each coating region is easy to dry. On the other hand, for example, above the central part of each coating region, the components of the evaporated solvent are difficult to diffuse, so the concentration of the components of the evaporated solvent is easy to increase, and the coating film at the central part of each coating region is difficult to dry. As a result, for example, a difference in drying speed may occur between the central part and the end of each coating region. As a result, for example, in each coating area, uneven drying may occur due to the difference in drying speed between the center and the end.

本發明是鑒於所述問題而成,其目的在於提供一種使形成於基板的上表面的塗膜更均勻地乾燥的技術。 The present invention is made in view of the above-mentioned problem, and its purpose is to provide a technology for drying the coating formed on the upper surface of the substrate more uniformly.

為了解決所述問題,第一實施方式的減壓乾燥裝置是使形成於基板的上表面的塗膜乾燥的減壓乾燥裝置,包括:腔室、支撐部、升降部、排氣部、供氣部、以及控制部。所述腔室收容所述基板。所述支撐部在所述腔室內從下方支撐所述基板。所述升降部在所述腔室內使所述支撐部升降。所述排氣部進行排出所述腔室內的氣體環境的排氣。所述供氣部進行向所述腔室內供給氣體的供氣。所述控制部在進行利用所述排氣部的排氣及利用所 述供氣部的供氣中的至少其中一者時,對所述升降部進行控制,以使所述支撐部反覆升降。 In order to solve the above problem, the decompression drying device of the first embodiment is a decompression drying device for drying a coating formed on the upper surface of a substrate, comprising: a chamber, a support part, a lifting part, an exhaust part, an air supply part, and a control part. The chamber accommodates the substrate. The support part supports the substrate from below in the chamber. The lifting part lifts and lowers the support part in the chamber. The exhaust part exhausts the gas environment in the chamber. The air supply part supplies gas into the chamber. When the control part performs at least one of exhausting the exhaust part and supplying the air by the air supply part, the lifting part controls the lifting part so that the support part is repeatedly lifted and lowered.

第二實施方式的減壓乾燥裝置是第一實施方式的減壓乾燥裝置,其中,所述控制部在分別進行利用所述排氣部的排氣及利用所述供氣部的供氣時,對所述升降部進行控制,以使所述支撐部反覆升降。 The decompression drying device of the second embodiment is the decompression drying device of the first embodiment, wherein the control unit controls the lifting unit when exhausting air using the exhaust unit and supplying air using the air supply unit, so that the support unit repeatedly rises and falls.

第三實施方式的減壓乾燥方法是使用包括腔室、支撐部、升降部、排氣部、以及供氣部的減壓乾燥裝置使形成於所述基板的上表面的塗膜乾燥的減壓乾燥方法,所述腔室收容基板,所述支撐部在所述腔室內從下方支撐所述基板,所述升降部在所述腔室內使所述支撐部升降,所述排氣部排出所述腔室內的氣體環境,所述供氣部向所述腔室內供給氣體,且所述減壓乾燥方法包括排氣步驟、供氣步驟、以及升降步驟。在所述排氣步驟中,在所述腔室內由所述支撐部從下方支撐所述基板的狀態下,通過所述排氣部排出所述腔室內的氣體環境。在所述供氣步驟中,在所述排氣步驟之後,在所述腔室內由所述支撐部從下方支撐所述基板的狀態下,通過所述供氣部向所述腔室內供給氣體。在所述升降步驟中,在執行所述排氣步驟及所述供氣步驟中的至少其中一個步驟時,通過所述升降部使所述支撐部反覆升降。 The decompression drying method of the third embodiment is a decompression drying method for drying a coating formed on the upper surface of the substrate using a decompression drying device including a chamber, a support part, a lifting part, an exhaust part, and an air supply part, wherein the chamber accommodates the substrate, the support part supports the substrate from below in the chamber, the lifting part lifts and lowers the support part in the chamber, the exhaust part exhausts the gas environment in the chamber, and the air supply part supplies gas into the chamber, and the decompression drying method includes an exhaust step, an air supply step, and a lifting step. In the exhaust step, the gas environment in the chamber is exhausted by the exhaust part while the substrate is supported from below by the support part in the chamber. In the gas supply step, after the exhaust step, in the state where the substrate is supported from below by the support part in the chamber, gas is supplied into the chamber through the gas supply part. In the lifting step, when performing at least one of the exhaust step and the gas supply step, the support part is repeatedly lifted and lowered by the lifting part.

第四實施方式的減壓乾燥方法是第三實施方式的減壓乾燥方法,其中,所述升降步驟包括:第一升降步驟,在執行所述排氣步驟時通過所述升降部使所述支撐部反覆升降;以及第二升 降步驟,在執行所述供氣步驟時通過所述升降部使所述支撐部反覆升降。 The decompression drying method of the fourth embodiment is the decompression drying method of the third embodiment, wherein the lifting step comprises: a first lifting step, in which the support part is repeatedly lifted and lowered by the lifting part when the exhaust step is performed; and a second lifting step, in which the support part is repeatedly lifted and lowered by the lifting part when the air supply step is performed.

第五實施方式的程式在包括腔室、支撐部、升降部、排氣部、供氣部、以及控制部的使形成於所述基板的上表面的塗膜乾燥的減壓乾燥裝置中,在由所述控制部所包含的處理器執行時,執行排氣步驟、供氣步驟、以及升降步驟,所述腔室收容基板,所述支撐部在所述腔室內從下方支撐所述基板,所述升降部在所述腔室內使所述支撐部升降,所述排氣部排出所述腔室內的氣體環境,所述供氣部向所述腔室內供給氣體,所述控制部對所述排氣部、所述供氣部及所述升降部進行控制。在所述排氣步驟中,所述控制部在所述腔室內由所述支撐部從下方支撐所述基板的狀態下,通過所述排氣部排出所述腔室內的氣體環境。在所述供氣步驟中,所述控制部在所述排氣步驟之後,在所述腔室內由所述支撐部從下方支撐所述基板的狀態下,通過所述供氣部向所述腔室內供給氣體。在所述升降步驟中,所述控制部在執行所述排氣步驟及所述供氣步驟中的至少其中一個步驟時,通過所述升降部使所述支撐部反覆升降。 The program of the fifth embodiment is in a reduced pressure drying device for drying a coating formed on the upper surface of the substrate, which includes a chamber, a support part, a lifting part, an exhaust part, an air supply part, and a control part. When executed by a processor included in the control part, an exhaust step, a air supply step, and a lifting step are executed. The chamber accommodates the substrate, the support part supports the substrate from below in the chamber, the lifting part lifts and lowers the support part in the chamber, the exhaust part exhausts the gas environment in the chamber, the air supply part supplies gas into the chamber, and the control part controls the exhaust part, the air supply part, and the lifting part. In the exhaust step, the control unit exhausts the gas environment in the chamber through the exhaust unit while the substrate is supported from below by the support unit in the chamber. In the gas supply step, after the exhaust step, the control unit supplies gas into the chamber through the gas supply unit while the substrate is supported from below by the support unit in the chamber. In the lifting step, the control unit repeatedly lifts and lowers the support unit through the lifting unit when performing at least one of the exhaust step and the gas supply step.

第六實施方式的程式是第五實施方式的程式,其中,所述升降步驟包括:第一升降步驟,所述控制部在執行所述排氣步驟時通過所述升降部使所述支撐部反覆升降;以及第二升降步驟,所述控制部在執行所述供氣步驟時通過所述升降部使所述支撐部反覆升降。 The program of the sixth embodiment is the program of the fifth embodiment, wherein the lifting step includes: a first lifting step, in which the control unit repeatedly lifts and lowers the support unit through the lifting unit when executing the exhaust step; and a second lifting step, in which the control unit repeatedly lifts and lowers the support unit through the lifting unit when executing the air supply step.

根據第一實施方式的減壓乾燥裝置、第三實施方式的減壓乾燥方法及第五實施方式的程式中的任一者,例如,在進行腔室內的氣體環境的排出及氣體向腔室內的供給中的至少其中一者時,均使基板反覆升降。由此,例如,在排氣時及供氣時中的至少其中一者中,可在腔室內產生氣流的紊亂。其結果,例如,在排氣時及供氣時中的至少其中一者中,在腔室內難以產生持續的特定模式的氣流,並且在塗膜上從塗膜蒸發的溶劑的成分的濃度難以偏向。因此,例如,形成於基板的上表面的塗膜可更均勻地乾燥。 According to any one of the reduced pressure drying device of the first embodiment, the reduced pressure drying method of the third embodiment, and the program of the fifth embodiment, for example, the substrate is repeatedly raised and lowered when at least one of the gas environment in the chamber is exhausted and the gas is supplied to the chamber. As a result, for example, in at least one of the exhaust and the supply, turbulence of the airflow can be generated in the chamber. As a result, for example, in at least one of the exhaust and the supply, it is difficult to generate a continuous specific pattern of airflow in the chamber, and the concentration of the components of the solvent evaporated from the coating is difficult to be biased on the coating. Therefore, for example, the coating formed on the upper surface of the substrate can be dried more uniformly.

根據第二實施方式的減壓乾燥裝置、第四實施方式的減壓乾燥方法、以及第六實施方式的程式中的任一者,例如,在分別進行腔室內的氣體環境的排出及氣體向腔室內的供給時,均使基板反覆升降。由此,例如,無論是在排氣時還是在供氣時,均可在腔室內產生氣流的紊亂。其結果,例如,無論是在排氣時還是在供氣時,在腔室內,均難以產生持續的特定模式的氣流,並且在塗膜上從塗膜蒸發的溶劑的成分的濃度難以偏向。因此,例如,形成於基板的上表面的塗膜可更均勻地乾燥。 According to the decompression drying device of the second embodiment, the decompression drying method of the fourth embodiment, and any one of the procedures of the sixth embodiment, for example, the substrate is repeatedly raised and lowered when the gas environment in the chamber is exhausted and the gas is supplied to the chamber. As a result, for example, whether it is exhausting or supplying, turbulence of the airflow can be generated in the chamber. As a result, for example, whether it is exhausting or supplying, it is difficult to generate a continuous specific pattern of airflow in the chamber, and the concentration of the components of the solvent evaporated from the coating is difficult to be biased on the coating. Therefore, for example, the coating formed on the upper surface of the substrate can be dried more uniformly.

1:減壓乾燥裝置 1: Pressure reduction drying device

9:基板 9: Substrate

10:腔室 10: Chamber

10b:密封材料 10b: Sealing material

10l:蓋部 10l: Cover

10s:內部空間 10s: Inner space

11:底板部 11: Bottom plate

11h、40h:貫通孔 11h, 40h: through hole

12:側壁部 12: Side wall

13:頂板部 13: Top plate

14:搬入搬出口 14: Move in and move out

15:閘門部(閘閥) 15: Gate part (gate valve)

16:開閉驅動部 16: Open and close the drive unit

16a、16b、16c、16d:排氣口 16a, 16b, 16c, 16d: Exhaust port

16f:供氣口 16f: Air supply port

20:支撐部 20: Support part

21:支撐板 21: Support plate

22:支撐銷 22: Support pin

30:排氣部 30: Exhaust section

31:排氣配管 31: Exhaust pipe

31a、31b、31c、31d:單獨配管 31a, 31b, 31c, 31d: Individual piping

31e:主配管 31e: Main pipe

32:真空泵 32: Vacuum pump

40:底面整流板 40: Bottom rectifier plate

41:對角線 41: Diagonal

50:側面整流板 50: Side rectifier plate

60:供氣部 60: Air supply department

61:供氣配管 61: Air supply piping

62:供氣源 62: Air supply source

70:壓力計 70: Pressure gauge

80:控制部 80: Control Department

81:開閉控制部 81: Open/Close control unit

82:升降控制部 82: Lifting control unit

83:切換控制部 83: Switching control unit

84:排氣控制部 84: Exhaust control unit

85:泵控制部 85: Pump control unit

86:供氣控制部 86: Air supply control department

90:塗膜 90: coating

100:升降部 100: Lifting unit

100a:本體部 100a: Main body

100b:移動部 100b: Moving part

801:處理器 801: Processor

802:記憶體 802: Memory

803:記憶部 803: Memory Department

803p:程式(電腦程式) 803p: Program (computer program)

804:輸入部 804: Input Department

805:輸出部 805: Output unit

806:通信部 806: Communications Department

807:驅動器 807:Driver

807m:記憶媒體 807m: Memory media

A1:區域(被形成區域、塗布區域) A1: Area (formed area, painted area)

A2:區域(非塗布區域) A2: Area (non-painted area)

A3:區域(被覆區域) A3: Area (covered area)

A4:區域(露出區域) A4: Area (exposed area)

F1:第一面(上表面) F1: First surface (upper surface)

F2:第二面(下表面) F2: Second side (lower surface)

H1:下降位置 H1: descending position

H2:上升位置 H2: rising position

S1、S2、S3、S4、S5、S6、S7、S8、S9、S10、Sa1、Sa2、Sa3、Sa4、Sa5、Sa6、Sa7、Sa8、Sa9、Sa10、Sb1、Sb2、Sb3、Sb4、Sb5、Sb6、Sb7、Sb8、Sb9、Sb10:步驟 S1, S2, S3, S4, S5, S6, S7, S8, S9, S10, Sa1, Sa2, Sa3, Sa4, Sa5, Sa6, Sa7, Sa8, Sa9, Sa10, Sb1, Sb2, Sb3, Sb4, Sb5, Sb6, Sb7, Sb8, Sb9, Sb10: steps

Va、Vb、Vc、Vd:單獨閥 Va, Vb, Vc, Vd: single valve

Ve:主閥 Ve: Main valve

Vf:供氣閥 Vf: Air supply valve

圖1是表示一實施形態的減壓乾燥裝置的縱剖面的一例的 圖。 FIG1 is a diagram showing an example of a longitudinal section of a reduced pressure drying device in an embodiment.

圖2是表示一實施形態的減壓乾燥裝置的橫剖面的一例的圖。 FIG2 is a diagram showing an example of a cross-section of a reduced pressure drying device in an embodiment.

圖3是表示一實施形態的減壓乾燥裝置的縱剖面的一例的圖。 FIG3 is a diagram showing an example of a longitudinal section of a reduced pressure drying device of an embodiment.

圖4是表示基板的一例的立體圖。 FIG4 is a three-dimensional diagram showing an example of a substrate.

圖5是表示基板的一部分的縱剖面的一例的圖。 FIG5 is a diagram showing an example of a longitudinal cross-section of a portion of a substrate.

圖6是概念性地示出了在控制部中實現的功能的方塊圖。 FIG6 is a block diagram conceptually showing the functions implemented in the control unit.

圖7是表示一實施形態的減壓乾燥處理的流程的一例的流程圖。 FIG7 is a flow chart showing an example of a process of a reduced pressure drying treatment in an implementation form.

圖8是表示一變形例的減壓乾燥處理的流程的一例的流程圖。 FIG8 is a flow chart showing an example of a process of a reduced pressure drying process of a modified example.

圖9是表示一變形例的減壓乾燥處理的流程的一例的流程圖。 FIG9 is a flow chart showing an example of a process of a reduced pressure drying process of a modified example.

圖10是表示一變形例的減壓乾燥裝置的縱剖面的一例的圖。 FIG. 10 is a diagram showing an example of a longitudinal section of a reduced pressure drying device of a modified example.

以下,參照附圖對本發明的一實施形態及各種變形例進行說明。在附圖中,對具有同樣的結構及功能的部分標記相同的符號,在下述說明中省略重複說明。附圖只是示意性地示出,各圖中的各種結構的尺寸及位置關係等並不準確地圖示。 Hereinafter, an embodiment of the present invention and various variations are described with reference to the attached drawings. In the attached drawings, parts with the same structure and function are marked with the same symbols, and repeated descriptions are omitted in the following description. The attached drawings are only schematically shown, and the dimensions and positional relationships of the various structures in each drawing are not accurately illustrated.

<1.減壓乾燥裝置的結構> <1. Structure of pressure-reducing drying device>

圖1是示意性地表示一實施形態的減壓乾燥裝置1的縱剖面的一例的圖。圖2是示意性地表示一實施形態的減壓乾燥裝置1的橫剖面的一例的圖。圖3是示意性地表示一實施形態的減壓乾燥裝置1的縱剖面的一例的圖。圖1的縱剖面與圖3的縱剖面具有從相差約90度的方向觀察的關係。在圖3中,為了避免附圖的複雜化,為了方便起見,省略了與後述的排氣部30、供氣部60、壓力計70及控制部80相關的結構。減壓乾燥裝置1是使形成於基板9的上表面的塗膜90(參照圖5)乾燥的裝置。 FIG. 1 is a diagram schematically showing an example of a longitudinal section of a decompression drying device 1 in an embodiment. FIG. 2 is a diagram schematically showing an example of a transverse section of a decompression drying device 1 in an embodiment. FIG. 3 is a diagram schematically showing an example of a longitudinal section of a decompression drying device 1 in an embodiment. The longitudinal section of FIG. 1 and the longitudinal section of FIG. 3 have a relationship of being observed from directions that differ by about 90 degrees. In FIG. 3, in order to avoid complication of the attached drawings, for the sake of convenience, the structures related to the exhaust section 30, the air supply section 60, the pressure gauge 70 and the control section 80 described later are omitted. The decompression drying device 1 is a device for drying a coating 90 (see FIG. 5) formed on the upper surface of a substrate 9.

對於基板9,例如可應用玻璃基板、半導體晶片或陶瓷基板等。基板9例如是具有作為第一主表面的第一面F1(參照圖4及圖5)與作為與所述第一面相反的第二主表面的第二面F2(參照圖5)的平板狀的基板。例如,在減壓乾燥裝置1中,基板9的第一面F1設為基板9的上表面,基板9的第二面F2設為基板9的下表面。此處,適宜列舉對基板9應用了矩形的玻璃基板的具體例進行說明。在基板9的第一面F1,例如通過預先塗布包含有機材料及溶劑的處理液,部分地形成有塗膜90。處理液的塗布例如是通過狹縫塗布機或噴墨裝置等進行。對於處理液,例如可應用包含聚醯亞胺前體與溶媒的液體(也稱為聚醯亞胺(Polyimide,PI)液)或抗蝕劑液等塗布液。對於聚醯亞胺前體,例如可應用聚醯胺(Polyamide)酸(聚醯胺酸(Polyamic acid))等。對於溶媒,例如可應用NMP(N-甲基-2-吡咯烷酮:N-Methyl-2-Pyrrolidone)。另外,例如,在減壓乾燥裝置1應用於 有機EL顯示器的製造步驟的情況下,也可採用塗膜90通過在減壓乾燥裝置1中被乾燥而成為有機EL顯示面板的空穴注入層、空穴輸送層或發光層的實施方式。 For the substrate 9, for example, a glass substrate, a semiconductor wafer or a ceramic substrate can be applied. The substrate 9 is, for example, a flat substrate having a first surface F1 (refer to FIG. 4 and FIG. 5) as a first main surface and a second surface F2 (refer to FIG. 5) as a second main surface opposite to the first surface. For example, in the reduced pressure drying device 1, the first surface F1 of the substrate 9 is set as the upper surface of the substrate 9, and the second surface F2 of the substrate 9 is set as the lower surface of the substrate 9. Here, it is appropriate to cite a specific example in which a rectangular glass substrate is applied to the substrate 9 for explanation. On the first surface F1 of the substrate 9, for example, a coating film 90 is partially formed by pre-coating a processing liquid containing an organic material and a solvent. The coating of the processing liquid is performed, for example, by a slit coater or an inkjet device. For the treatment liquid, for example, a coating liquid such as a liquid containing a polyimide precursor and a solvent (also called a polyimide (PI) liquid) or an anti-etching agent liquid can be applied. For the polyimide precursor, for example, polyamide acid (polyamic acid) can be applied. For the solvent, for example, NMP (N-methyl-2-pyrrolidone: N-Methyl-2-Pyrrolidone) can be applied. In addition, for example, when the reduced pressure drying device 1 is applied to the manufacturing step of the organic EL display, the coating film 90 can be dried in the reduced pressure drying device 1 to become a hole injection layer, a hole transport layer or a light-emitting layer of the organic EL display panel.

圖4是表示基板9的一例的立體圖。圖5是表示基板9的一部分的縱剖面的一例的圖。如圖4所示,基板9例如在俯視時具有縱橫的長度不同的長方形形狀的形態。在基板9的上表面排列有多個供形成元件等的區域(也稱為被形成區域與塗布區域)A1。在圖4的例子中,在基板9的上表面,呈兩行兩列的矩陣狀排列有四個矩形形狀的塗布區域A1。但是,塗布區域A1的形狀、數量、配置並不限定於所述例。塗膜90在利用減壓乾燥裝置1的減壓乾燥步驟之前的塗布步驟中,通過狹縫塗布機或噴墨裝置等,在各塗布區域A1按照所期望的模式形成。對於所期望的模式,例如可應用電路的模式。此處,例如,如圖5所示,各塗布區域A1具有被塗膜90覆蓋的區域(也稱為被覆區域)A3與未被塗膜90覆蓋的露出的區域(也稱為露出區域)A4。另外,相鄰的塗布區域A1之間的區域(也稱為非塗布區域)A2成為未被塗膜90覆蓋的露出的區域(露出區域)A4。 FIG. 4 is a perspective view showing an example of a substrate 9. FIG. 5 is a view showing an example of a longitudinal section of a portion of the substrate 9. As shown in FIG. 4 , the substrate 9 has a rectangular shape with different lengths in the longitudinal and transverse directions when viewed from above. A plurality of areas A1 for forming components and the like (also referred to as formed areas and coating areas) are arranged on the upper surface of the substrate 9. In the example of FIG. 4 , four rectangular coating areas A1 are arranged in a matrix of two rows and two columns on the upper surface of the substrate 9. However, the shape, number, and arrangement of the coating area A1 are not limited to the example described above. The coating film 90 is formed in each coating area A1 according to a desired pattern by a slit coating machine or an inkjet device in a coating step before a decompression drying step using a decompression drying device 1. For the desired pattern, for example, a circuit pattern can be applied. Here, for example, as shown in FIG. 5, each coating area A1 has an area (also referred to as a covered area) A3 covered by the coating film 90 and an exposed area (also referred to as an exposed area) A4 not covered by the coating film 90. In addition, the area (also referred to as a non-coating area) A2 between adjacent coating areas A1 becomes an exposed area (exposed area) A4 not covered by the coating film 90.

如圖1及圖2所示,減壓乾燥裝置1例如包括:腔室10、支撐部20、升降部100、排氣部30、供氣部60、以及控制部80。另外,減壓乾燥裝置1例如包括底面整流板40、側面整流板50、以及壓力計70。 As shown in FIG. 1 and FIG. 2 , the decompression drying device 1 includes, for example, a chamber 10, a support portion 20, a lifting portion 100, an exhaust portion 30, an air supply portion 60, and a control portion 80. In addition, the decompression drying device 1 includes, for example, a bottom straightening plate 40, a side straightening plate 50, and a pressure gauge 70.

腔室10是用於收容基板9的部分。對於腔室10,可應用 具有用於收容基板9的內部空間10s的耐壓容器。腔室10例如固定於省略了圖示的裝置框架上。腔室10的形狀例如為扁平的長方體狀。腔室10例如具有大致正方形形狀的底板部11、四個側壁部12、以及大致正方形形狀的頂板部13。四個側壁部12例如在上下方向上將底板部11的四個端邊與頂板部13的四個端邊連接。例如,在四個側壁部12中的一個側壁部12設置有搬入搬出口14與使所述搬入搬出口14開閉的閘門部(也稱為閘門閥)15。閘門部15例如連接於開閉驅動部16。在圖3中,為了避免附圖的複雜化,概念性地示出了開閉驅動部16。對於開閉驅動部16,例如可應用氣缸等驅動機構。此處,例如,通過開閉驅動部16的動作,閘門部15可在關閉搬入搬出口14的位置(也稱為關閉位置)與打開搬入搬出口14的位置(也稱為打開位置)之間移動。 The chamber 10 is a portion for accommodating the substrate 9. For the chamber 10, a pressure-resistant container having an internal space 10s for accommodating the substrate 9 can be applied. The chamber 10 is fixed to, for example, an apparatus frame which is not shown in the figure. The shape of the chamber 10 is, for example, a flat rectangular parallelepiped. The chamber 10 has, for example, a substantially square bottom plate portion 11, four side wall portions 12, and a substantially square top plate portion 13. The four side wall portions 12 connect, for example, the four end sides of the bottom plate portion 11 and the four end sides of the top plate portion 13 in the up-down direction. For example, a loading/unloading port 14 and a gate portion (also referred to as a gate valve) 15 for opening and closing the loading/unloading port 14 are provided in one of the four side wall portions 12. The gate portion 15 is connected to the opening and closing drive portion 16, for example. In FIG. 3, the opening and closing drive portion 16 is conceptually shown to avoid complication of the attached figure. For the opening and closing drive portion 16, for example, a drive mechanism such as a cylinder can be applied. Here, for example, by the action of the opening and closing drive portion 16, the gate portion 15 can move between a position (also referred to as a closed position) for closing the loading and unloading port 14 and a position (also referred to as an open position) for opening the loading and unloading port 14.

此處,例如,在閘門部15配置於關閉位置的狀態下,將腔室10的內部空間10s密閉。例如,在閘門部15配置於打開位置的狀態下,可經由搬入搬出口14進行基板9向腔室10的內部空間10s的搬入及基板9從腔室10的內部空間10s的搬出。 Here, for example, when the gate portion 15 is configured in the closed position, the internal space 10s of the chamber 10 is sealed. For example, when the gate portion 15 is configured in the open position, the substrate 9 can be moved into the internal space 10s of the chamber 10 and the substrate 9 can be moved out of the internal space 10s of the chamber 10 through the loading and unloading port 14.

支撐部20是在腔室10內從下方支撐基板9的部分。例如,支撐部20位於腔室10的內部空間10s,且可從下方支撐收容於腔室10的內部空間10s的基板9。支撐部20例如具有多個支撐板21與多個支撐銷22。多個支撐板21例如在水平方向上空開間隔地排列。在各支撐板21的上表面豎立設置有多個支撐銷22。基板9例如配置於多個支撐板21的上方,多個支撐銷22的上端部 與基板9的下表面接觸,由此基板9以水平姿勢受到支撐。 The support part 20 is a part that supports the substrate 9 from below in the chamber 10. For example, the support part 20 is located in the internal space 10s of the chamber 10, and can support the substrate 9 accommodated in the internal space 10s of the chamber 10 from below. The support part 20 has, for example, a plurality of support plates 21 and a plurality of support pins 22. The plurality of support plates 21 are arranged at intervals in the horizontal direction, for example. A plurality of support pins 22 are vertically provided on the upper surface of each support plate 21. The substrate 9 is, for example, arranged above the plurality of support plates 21, and the upper ends of the plurality of support pins 22 are in contact with the lower surface of the substrate 9, whereby the substrate 9 is supported in a horizontal posture.

升降部100是在腔室10內使支撐部20升降的部分。換言之,例如,升降部100具有可使位於腔室10的內部空間10s的支撐部20升降的機構(也稱為升降機構)。例如,由支撐部20支撐的基板9能夠通過所述升降部100升降。在圖1中,為了避免附圖的複雜化,概念性地示出了升降部100。如圖3所示,對於升降部100,例如可應用直動型馬達或氣缸等驅動裝置。升降部100例如具有本體部100a與移動部100b。本體部100a例如在腔室10的外部固定於省略了圖示的裝置框架。移動部100b例如可相對於本體部100a沿上下方向移動。對於移動部100b,例如可應用棒狀的構件等。移動部100b例如以插通至腔室10的底板部11的貫通孔11h的狀態存在。而且,例如在移動部100b的上端部固定有支撐部20。此處,例如,若在底板部11的下表面與移動部100b之間設置波紋管等,則能夠密閉底板部11與移動部100b之間的間隙。例如,在支撐部20具有多個支撐板21的情況下,移動部100b具有針對每個支撐板21固定於支撐板21且插通至底板部11的貫通孔11h的棒狀的部分(也稱為棒狀部)、將多個棒狀部連結的部分(也稱為連結部)、以及連接於連結部且能夠滑動地支撐於本體部100a的部分(也稱為滑動部)。 The lifting unit 100 is a part that lifts and lowers the support unit 20 in the chamber 10. In other words, for example, the lifting unit 100 has a mechanism (also referred to as a lifting mechanism) that can lift and lower the support unit 20 located in the internal space 10s of the chamber 10. For example, the substrate 9 supported by the support unit 20 can be lifted and lowered by the lifting unit 100. In FIG1 , in order to avoid the complication of the drawings, the lifting unit 100 is conceptually shown. As shown in FIG3 , for the lifting unit 100, for example, a driving device such as a direct-acting motor or a cylinder can be applied. The lifting unit 100 has, for example, a main body 100a and a moving part 100b. The main body 100a is, for example, fixed to an apparatus frame that is not shown in the figure outside the chamber 10. The moving part 100b can, for example, move in the up and down directions relative to the main body 100a. For example, a rod-shaped member or the like can be applied to the moving part 100b. The moving part 100b exists in a state of being inserted into the through hole 11h of the bottom plate part 11 of the chamber 10, for example. Moreover, for example, a support part 20 is fixed to the upper end of the moving part 100b. Here, for example, if a bellows or the like is provided between the lower surface of the bottom plate part 11 and the moving part 100b, the gap between the bottom plate part 11 and the moving part 100b can be sealed. For example, when the support portion 20 has a plurality of support plates 21, the moving portion 100b has a rod-shaped portion (also referred to as a rod-shaped portion) fixed to the support plate 21 for each support plate 21 and inserted into the through hole 11h of the bottom plate portion 11, a portion connecting the plurality of rod-shaped portions (also referred to as a connecting portion), and a portion connected to the connecting portion and slidably supported on the main body 100a (also referred to as a sliding portion).

此處,例如,當使升降部100運行時,支撐部20在下降位置H1(圖1及圖3中點劃線所示的位置)與比下降位置H1高的上升位置H2(圖1及圖3中雙點劃線所示的位置)之間沿上下 方向升降。此時,例如,多個支撐板21能夠一體地升降。 Here, for example, when the lifting part 100 is operated, the support part 20 is lifted and lowered in the vertical direction between the lowered position H1 (the position indicated by the dotted line in Figures 1 and 3) and the raised position H2 (the position indicated by the double-dotted line in Figures 1 and 3) higher than the lowered position H1. At this time, for example, a plurality of support plates 21 can be lifted and lowered as a whole.

排氣部30是進行排出腔室10內的氣體環境的動作(也稱為排氣)的部分。對於排氣部30,例如可應用從腔室10的內部空間10s抽吸氣體,而使腔室10內的壓力下降的機構。如圖1及圖2所示,在腔室10的底板部11,例如設置有四個排氣口16a、16b、16c、16d。四個排氣口16a、16b、16c、16d例如配置成位於由支撐部20支撐的基板9的下方。另外,四個排氣口16a、16b、16c、16d例如位於後述的底面整流板40的下方。排氣部30例如具有與四個排氣口16a、16b、16c、16d連接的排氣配管31、四個單獨閥Va、Vb、Vc、Vd、主閥Ve、以及真空泵32。排氣配管31例如具有四個單獨配管31a、31b、31c、31d與一個主配管31e。例如,單獨配管31a的一端連接於排氣口16a,單獨配管31b的一端連接於排氣口16b,單獨配管31c的一端連接於排氣口16c,單獨配管31d的一端連接於排氣口16d。例如,四個單獨配管31a、31b、31c、31d各自的另一端合流而連接於主配管31e的一端。例如,主配管31e的另一端連接於真空泵32。例如,單獨閥Va設置於單獨配管31a的路徑上,單獨閥Vb設置於單獨配管31b的路徑上,單獨閥Vc設置於單獨配管31c的路徑上,單獨閥Vd設置於單獨配管31d的路徑上。例如,主閥Ve設置於主配管31e的路徑上。 The exhaust section 30 is a part that performs the operation of exhausting the gas environment in the chamber 10 (also called exhaust). For the exhaust section 30, for example, a mechanism that sucks gas from the internal space 10s of the chamber 10 to reduce the pressure in the chamber 10 can be applied. As shown in Figures 1 and 2, four exhaust ports 16a, 16b, 16c, and 16d are provided on the bottom plate 11 of the chamber 10. The four exhaust ports 16a, 16b, 16c, and 16d are configured to be located below the substrate 9 supported by the support portion 20. In addition, the four exhaust ports 16a, 16b, 16c, and 16d are located, for example, below the bottom surface rectifying plate 40 described later. The exhaust section 30, for example, has an exhaust pipe 31 connected to four exhaust ports 16a, 16b, 16c, and 16d, four individual valves Va, Vb, Vc, and Vd, a main valve Ve, and a vacuum pump 32. The exhaust pipe 31, for example, has four individual pipes 31a, 31b, 31c, and 31d and one main pipe 31e. For example, one end of the individual pipe 31a is connected to the exhaust port 16a, one end of the individual pipe 31b is connected to the exhaust port 16b, one end of the individual pipe 31c is connected to the exhaust port 16c, and one end of the individual pipe 31d is connected to the exhaust port 16d. For example, the other ends of the four individual pipes 31a, 31b, 31c, and 31d merge and are connected to one end of the main pipe 31e. For example, the other end of the main pipe 31e is connected to the vacuum pump 32. For example, the individual valve Va is set on the path of the individual pipe 31a, the individual valve Vb is set on the path of the individual pipe 31b, the individual valve Vc is set on the path of the individual pipe 31c, and the individual valve Vd is set on the path of the individual pipe 31d. For example, the main valve Ve is set on the path of the main pipe 31e.

此處,例如,當在通過閘門部15關閉搬入搬出口14的狀態下,打開四個單獨閥Va、Vb、Vc、Vd的至少一部分與一個 主閥Ve,使真空泵32運行時,腔室10內的氣體經由排氣配管31向腔室10的外部排出。由此,例如,可使腔室10的內部空間10s的壓力下降。 Here, for example, when the loading and unloading port 14 is closed by the gate portion 15, at least a part of the four individual valves Va, Vb, Vc, and Vd and a main valve Ve are opened to operate the vacuum pump 32, and the gas in the chamber 10 is discharged to the outside of the chamber 10 through the exhaust pipe 31. Thus, for example, the pressure of the internal space 10s of the chamber 10 can be reduced.

四個單獨閥Va、Vb、Vc、Vd例如是用於各別地調節來自四個排氣口16a、16b、16c、16d的排氣量的閥。對於四個單獨閥Va、Vb、Vc、Vd的各者,例如可應用基於來自控制部80的指令在打開狀態與關閉狀態之間切換的閥(也稱為開閉閥)。主閥Ve例如是用於調整來自四個排氣口16a、16b、16c、16d的合計的排氣量的閥。對於主閥Ve,例如可應用能夠基於來自控制部80的指令調節開度的閥(也稱為開度控制閥)。 The four individual valves Va, Vb, Vc, and Vd are, for example, valves used to adjust the exhaust volume from the four exhaust ports 16a, 16b, 16c, and 16d individually. For each of the four individual valves Va, Vb, Vc, and Vd, for example, a valve that switches between an open state and a closed state based on a command from the control unit 80 (also called an on-off valve) can be applied. The main valve Ve is, for example, a valve used to adjust the total exhaust volume from the four exhaust ports 16a, 16b, 16c, and 16d. For the main valve Ve, for example, a valve that can adjust the opening based on a command from the control unit 80 (also called an opening control valve) can be applied.

此處,例如,通過四個排氣口16a、16b、16c、16d位於由支撐部20支撐的基板9的下方,與在基板9的上方存在排氣口的情況相比,可促進基板9的上方的氣體的流動的均勻化,能夠減少形成於基板9的上表面的塗膜90的乾燥不均的產生。 Here, for example, by locating the four exhaust ports 16a, 16b, 16c, and 16d below the substrate 9 supported by the support portion 20, the uniformity of the flow of gas above the substrate 9 can be promoted, and the occurrence of uneven drying of the coating 90 formed on the upper surface of the substrate 9 can be reduced compared to the case where the exhaust ports are located above the substrate 9.

底面整流板40是用於在利用排氣部30對腔室10內的減壓時限制內部空間10s中的氣體流動的板。例如,底面整流板40配置成位於由支撐部20支撐的基板9與腔室10的底板部11之間。更具體而言,例如,底面整流板40以從配置於下降位置H1的支撐部20空開間隔地存在的方式配置於支撐部20的下側,且以從底板部11的上表面空開間隔地存在的方式配置於底板部11的上側。另外,底面整流板40例如以沿著底板部11的上表面水平地擴展的方式存在。底面整流板40例如經由省略了圖示的多個 支柱固定於腔室10的底板部11。如圖2所示,例如,底面整流板40在俯視時具有正方形形狀的形狀。而且,例如,底面整流板40的俯視時的各邊的長度比長方形形狀的基板9的長邊及短邊中的任一者長。因此,例如,無論配置於支撐部20上的基板9的朝向如何,在俯視時,底面整流板40均比基板9大。另外,底面整流板40例如具有處於插通有升降部100的移動部100b的狀態的貫通孔40h。在貫通孔40h中,底面整流板40與移動部100b空開極小的間隔地存在。 The bottom straightening plate 40 is a plate for limiting the flow of gas in the internal space 10s when the exhaust portion 30 is used to reduce the pressure in the chamber 10. For example, the bottom straightening plate 40 is arranged between the substrate 9 supported by the support portion 20 and the bottom plate portion 11 of the chamber 10. More specifically, for example, the bottom straightening plate 40 is arranged on the lower side of the support portion 20 in a manner that is spaced from the support portion 20 arranged at the descending position H1, and is arranged on the upper side of the bottom plate portion 11 in a manner that is spaced from the upper surface of the bottom plate portion 11. In addition, the bottom straightening plate 40 exists, for example, in a manner that is horizontally extended along the upper surface of the bottom plate portion 11. The bottom straightening plate 40 is fixed to the bottom plate portion 11 of the chamber 10 via a plurality of pillars that are omitted from the figure. As shown in FIG. 2 , for example, the bottom straightening plate 40 has a square shape when viewed from above. Moreover, for example, the length of each side of the bottom straightening plate 40 when viewed from above is longer than any of the long sides and short sides of the rectangular substrate 9. Therefore, for example, regardless of the orientation of the substrate 9 disposed on the support portion 20, the bottom straightening plate 40 is larger than the substrate 9 when viewed from above. In addition, the bottom straightening plate 40 has, for example, a through hole 40h in a state where the moving portion 100b of the lifting portion 100 is inserted. In the through hole 40h, the bottom straightening plate 40 and the moving portion 100b exist with a very small gap.

側面整流板50是與底面整流板40一併用於在利用排氣部30對腔室10內的減壓時限制內部空間10s中的氣體的流動的板。例如,側面整流板50配置成位於由配置於下降位置H1的支撐部20支撐的基板9與腔室10的側壁部12之間。更具體而言,例如,側面整流板50從由配置於下降位置H1的支撐部20支撐的基板9的端部空開間隔地配置於基板9的外側,且以從側壁部12的內表面空開間隔地存在的方式位於側壁部12的內側。此處,例如,以包圍由支撐部20支撐的基板9的周圍的方式配置有四個側面整流板50。各側面整流板50例如以沿著側壁部12的內表面擴展的方式存在。因此,例如,四個側面整流板50作為整體形成包圍基板9的四角筒狀的整流板。另外,例如,底面整流板40及四個側面整流板50作為整體形成有底筒狀的箱狀的整流板。 The side straightening plate 50 is a plate used together with the bottom straightening plate 40 to restrict the flow of gas in the internal space 10s when the pressure in the chamber 10 is reduced by the exhaust portion 30. For example, the side straightening plate 50 is arranged between the substrate 9 supported by the support portion 20 arranged at the lowered position H1 and the side wall portion 12 of the chamber 10. More specifically, for example, the side straightening plate 50 is arranged on the outer side of the substrate 9 at a distance from the end of the substrate 9 supported by the support portion 20 arranged at the lowered position H1, and is located on the inner side of the side wall portion 12 at a distance from the inner surface of the side wall portion 12. Here, for example, four side straightening plates 50 are arranged so as to surround the substrate 9 supported by the support portion 20. Each side straightening plate 50 exists, for example, in a manner extending along the inner surface of the side wall portion 12. Therefore, for example, the four side straightening plates 50 are straightening plates that are formed as a square tube-shaped straightening plate that surrounds the substrate 9 as a whole. In addition, for example, the bottom straightening plate 40 and the four side straightening plates 50 are straightening plates that are formed as a box-shaped straightening plate with a bottom tube shape as a whole.

此處,例如,在利用排氣部30對腔室10內的減壓時,腔室10的內部空間10s的氣體按照所述記載的順序通過側面整流 板50與側壁部12之間的空間、底面整流板40與底板部11之間的空間、及排氣口16a、排氣口16b、排氣口16c、排氣口16d,排出至腔室10的外部。如此,例如,通過氣體在遠離基板9的空間中流動,而在基板9的附近難以形成氣流。而且,在基板9的周緣部難以產生集中的氣流。由此,例如,能夠減少形成於基板9的上表面的塗膜90的乾燥不均的產生。 Here, for example, when the exhaust section 30 is used to reduce the pressure in the chamber 10, the gas in the internal space 10s of the chamber 10 passes through the space between the side straightening plate 50 and the side wall section 12, the space between the bottom straightening plate 40 and the bottom plate section 11, and the exhaust port 16a, the exhaust port 16b, the exhaust port 16c, and the exhaust port 16d in the order described above, and is discharged to the outside of the chamber 10. In this way, for example, the gas flows in the space away from the substrate 9, and it is difficult to form an airflow near the substrate 9. Moreover, it is difficult to generate a concentrated airflow around the substrate 9. As a result, for example, the generation of uneven drying of the coating 90 formed on the upper surface of the substrate 9 can be reduced.

另外,此處,例如,如圖2所示,由底面整流板40及四個側面整流板50形成的箱狀的整流板在俯視時具有正方形形狀的形狀。而且,所述箱狀的整流板的俯視時的各邊的長度比長方形形狀的基板9的長邊及短邊中的任一者長。因此,例如,無論配置於支撐部20上的基板9的朝向如何,在利用排氣部30對腔室10內的減壓時,內部空間10s中的氣體的流動均一,內部空間10s中的氣體的流動難以根據基板9的朝向而不同。 In addition, here, for example, as shown in FIG. 2, the box-shaped rectifying plate formed by the bottom rectifying plate 40 and the four side rectifying plates 50 has a square shape when viewed from above. Moreover, the length of each side of the box-shaped rectifying plate when viewed from above is longer than any of the long sides and short sides of the rectangular substrate 9. Therefore, for example, regardless of the orientation of the substrate 9 arranged on the support portion 20, when the exhaust portion 30 is used to depressurize the chamber 10, the flow of the gas in the internal space 10s is uniform, and the flow of the gas in the internal space 10s is unlikely to differ depending on the orientation of the substrate 9.

另外,此處,例如,如圖2所示,採用在俯視時四個排氣口16a、16b、16c、16d均位於正方形形狀的底面整流板40的對角線41上的結構。在此情況下,例如,通過各排氣口16a、排氣口16b、排氣口16c、排氣口16d,能夠形成相對於底面整流板40的中央(兩條對角線41的交點)對稱的氣流。由此,例如,在腔室10的內部空間10s中,能夠形成更均勻的氣流。 In addition, here, for example, as shown in FIG. 2, a structure is adopted in which the four exhaust ports 16a, 16b, 16c, and 16d are all located on the diagonal 41 of the bottom rectifying plate 40 of a square shape when viewed from above. In this case, for example, through each exhaust port 16a, exhaust port 16b, exhaust port 16c, and exhaust port 16d, a symmetrical airflow relative to the center (intersection of two diagonal lines 41) of the bottom rectifying plate 40 can be formed. As a result, for example, a more uniform airflow can be formed in the internal space 10s of the chamber 10.

另外,此處,例如,四個側面整流板50中的三個側面整流板50固定於腔室10的側壁部12。但是,四個側面整流板50中的其餘的一個側面整流板50例如也可能夠相對於側壁部12及 底面整流板40移動,以確保腔室10與外部之間的基板9的搬入及搬出的路徑。在此情況下,所述一個側面整流板50例如也可構成為與閘門部15一併移動。由此,例如,當閘門部15從關閉位置向打開位置移動時,所述一個側面整流板50也移動,能夠確保腔室10與外部之間的基板9的搬入及搬出的路徑。此處,例如,在能夠移動的側面整流板50配置於正規的位置(構成所述箱狀的整流板的位置)時,若與其他側面整流板50及底面整流板40不接觸,則能夠移動的側面整流板50與其他側面整流板50及底面整流板40不滑接。由此,例如難以產生由構件的滑接而產生的粉塵。另一方面,例如,若在使能夠移動的側面整流板50、其他側面整流板50及底面整流板40相互接觸的狀態下構成箱狀的整流板,則在箱狀的整流板難以產生間隙。在此情況下,例如,在利用排氣部30對腔室10內的減壓時,能夠進一步限制內部空間10s中的氣體的流動。 In addition, here, for example, three of the four side straightening plates 50 are fixed to the side wall portion 12 of the chamber 10. However, the remaining one of the four side straightening plates 50 may be moved relative to the side wall portion 12 and the bottom straightening plate 40, for example, to ensure a path for carrying in and carrying out the substrate 9 between the chamber 10 and the outside. In this case, the one side straightening plate 50 may be configured to move together with the gate portion 15, for example. Thus, for example, when the gate portion 15 moves from the closed position to the open position, the one side straightening plate 50 also moves, and it is possible to ensure a path for carrying in and carrying out the substrate 9 between the chamber 10 and the outside. Here, for example, when the movable side straightening plate 50 is arranged at a regular position (position constituting the box-shaped straightening plate), if it is not in contact with other side straightening plates 50 and the bottom straightening plate 40, the movable side straightening plate 50 does not slide with other side straightening plates 50 and the bottom straightening plate 40. As a result, for example, dust generated by sliding contact of components is unlikely to be generated. On the other hand, for example, if the box-shaped straightening plate is configured in a state where the movable side straightening plate 50, other side straightening plates 50 and the bottom straightening plate 40 are in contact with each other, it is unlikely that a gap will be generated in the box-shaped straightening plate. In this case, for example, when the exhaust portion 30 is used to reduce the pressure in the chamber 10, the flow of gas in the internal space 10s can be further restricted.

供氣部60是進行向腔室10內供給氣體的動作(也稱為供氣)的部分。對於供氣部60,例如可應用用於向通過利用排氣部30的排氣而壓力下降的腔室10的內部空間10s供給氣體,而使腔室10內的壓力恢復成大氣壓的機構。如圖1所示,在腔室10的底板部11,例如設置有供氣口16f。供氣口16f例如位於底面整流板40的下方。供氣部60具有與供氣口16f連接的供氣配管61、供氣閥Vf、以及供氣源62。例如,供氣配管61的一端連接於供氣口16f。例如,供氣配管61的另一端連接於供氣源62。例如, 供氣閥Vf設置於供氣配管61的路徑上。 The air supply section 60 is a portion that performs the operation of supplying gas into the chamber 10 (also referred to as air supply). The air supply section 60 can be applied, for example, to a mechanism for supplying gas to the internal space 10s of the chamber 10 whose pressure has dropped due to exhaust from the exhaust section 30, so as to restore the pressure in the chamber 10 to atmospheric pressure. As shown in FIG. 1 , an air supply port 16f is provided on the bottom plate portion 11 of the chamber 10, for example. The air supply port 16f is located, for example, below the bottom surface straightening plate 40. The air supply section 60 has an air supply pipe 61 connected to the air supply port 16f, an air supply valve Vf, and an air supply source 62. For example, one end of the air supply pipe 61 is connected to the air supply port 16f. For example, the other end of the air supply pipe 61 is connected to the air supply source 62. For example, the air supply valve Vf is provided on the path of the air supply pipe 61.

此處,例如,當打開供氣閥Vf時,從供氣源62經由供氣配管61及供氣口16f向腔室10的內部空間10s供給氣體。由此,可使腔室10內的氣壓上升。從供氣源62供給的氣體例如可為氮氣等惰性氣體,也可為清潔乾燥空氣。清潔乾燥空氣例如能夠通過對一般的環境中的空氣實施去除粒子及水分的淨化而準備。 Here, for example, when the air supply valve Vf is opened, gas is supplied from the air supply source 62 to the internal space 10s of the chamber 10 via the air supply pipe 61 and the air supply port 16f. As a result, the air pressure in the chamber 10 can be increased. The gas supplied from the air supply source 62 can be, for example, an inert gas such as nitrogen, or clean dry air. Clean dry air can be prepared by, for example, purifying the air in a general environment to remove particles and moisture.

壓力計70是測量腔室10的內部空間10s的氣壓的傳感器。如圖1所示,例如,壓力計70安裝於腔室10的一部分。壓力計70例如可測量腔室10的內部空間10s的氣壓,並將其測量結果輸出至控制部80。 The pressure gauge 70 is a sensor for measuring the air pressure of the internal space 10s of the chamber 10. As shown in FIG. 1 , for example, the pressure gauge 70 is installed in a part of the chamber 10. The pressure gauge 70 can measure the air pressure of the internal space 10s of the chamber 10, for example, and output its measurement result to the control unit 80.

控制部80是用於對減壓乾燥裝置1的各部的動作進行控制的單元。例如,控制部80可對排氣部30、供氣部60及升降部100等進行控制。控制部80例如包括具有中央處理器(Central Processing Unit,CPU)等處理器801、隨機存取記憶體(Random Access Memory,RAM)等記憶體802及硬碟驅動器的記憶部803的電腦。在記憶部803例如記憶有用於在減壓乾燥裝置1中執行通過減壓使基板9上的塗膜90乾燥的處理(也稱為減壓乾燥處理)的電腦程式(也稱為程式)803p及各種資料。記憶部803例如記憶程式803p,具有作為由電腦可讀取的非暫時的記憶媒體的作用。控制部80例如從記憶部803向記憶體802讀出程式803p及資料,在處理器801中進行按照程式803p及資料的運算處理,由此對減壓乾燥裝置1的各部的動作進行控制。因此,例如,程式 803p通過在減壓乾燥裝置1中由控制部80中所包含的處理器801執行,而可執行減壓乾燥處理。 The control unit 80 is a unit for controlling the operation of each part of the decompression drying device 1. For example, the control unit 80 can control the exhaust unit 30, the air supply unit 60, and the lifting unit 100. The control unit 80 includes, for example, a computer having a processor 801 such as a central processing unit (CPU), a memory 802 such as a random access memory (RAM), and a memory unit 803 of a hard disk drive. The memory unit 803 stores, for example, a computer program (also called a program) 803p and various data for executing a process (also called a decompression drying process) for drying the coating 90 on the substrate 9 by decompression in the decompression drying device 1. The memory unit 803 stores, for example, a program 803p, and functions as a non-temporary memory medium that can be read by a computer. The control unit 80 reads, for example, the program 803p and data from the memory unit 803 to the memory 802, and performs calculations in accordance with the program 803p and the data in the processor 801, thereby controlling the operation of each part of the decompression drying device 1. Therefore, for example, the program 803p can be executed by the processor 801 included in the control unit 80 in the decompression drying device 1 to perform decompression drying processing.

另外,在控制部80例如也可連接有輸入部804、輸出部805、通信部806及驅動器807。輸入部804例如是響應於用戶的動作等將各種訊號輸入至控制部80的部分。輸入部804中例如能夠包括輸入與用戶的操作相應的訊號的操作部、輸入與用戶的聲音相應的訊號的麥克風、及輸入與用戶的運動相應的訊號的各種傳感器等。輸出部805例如是以用戶能夠識別的實施方式輸出各種資訊的部分。輸出部805中例如能夠包括顯示部、投影儀、及揚聲器等。顯示部也可為與輸入部804一體化的觸控螢幕。通信部806例如是通過有線或無線的通信部件等在與伺服器等外部的裝置之間進行各種資訊的收發的部分。例如,也可在記憶部803中記憶通過通信部806從外部的裝置接收的程式803p。驅動器807例如是能夠裝卸磁碟或光碟等可移動的記憶媒體807m的部分。所述驅動器807例如在裝設有記憶媒體807m的狀態下,進行所述記憶媒體807m與控制部80之間的資料的授受。例如,也可通過記憶有程式803p的記憶媒體807m裝設於驅動器807,而從記憶媒體807m讀入程式803p並記憶於記憶部803內。此處,記憶媒體807m例如記憶程式803p,具有作為由電腦可讀取的非暫時的記憶媒體的作用。 In addition, the control unit 80 may be connected to, for example, an input unit 804, an output unit 805, a communication unit 806, and a driver 807. The input unit 804 is, for example, a part that inputs various signals to the control unit 80 in response to the user's actions. The input unit 804 may include, for example, an operation unit that inputs a signal corresponding to the user's operation, a microphone that inputs a signal corresponding to the user's voice, and various sensors that input a signal corresponding to the user's movement. The output unit 805 is, for example, a part that outputs various information in a manner that the user can recognize. The output unit 805 may include, for example, a display unit, a projector, and a speaker. The display unit may also be a touch screen integrated with the input unit 804. The communication unit 806 is, for example, a part that transmits and receives various information with an external device such as a server through a wired or wireless communication component. For example, a program 803p received from an external device through the communication unit 806 may also be stored in the memory unit 803. The drive 807 is, for example, a part that can load and unload a removable storage medium 807m such as a magnetic disk or an optical disk. The drive 807, for example, performs data transmission between the storage medium 807m and the control unit 80 when the storage medium 807m is installed. For example, the storage medium 807m storing the program 803p may be installed in the drive 807, and the program 803p may be read from the storage medium 807m and stored in the storage unit 803. Here, the storage medium 807m, such as the storage program 803p, functions as a non-temporary storage medium that can be read by a computer.

圖6是概念性地示出了在控制部80中實現的功能的方塊圖。如圖6所示,控制部80例如與開閉驅動部16、升降部100、 四個單獨閥Va、Vb、Vc、Vd、主閥Ve、真空泵32、供氣閥Vf、及壓力計70分別電連接。控制部80例如可參照從壓力計70輸出的測量值來對所述各部的動作進行控制。 FIG6 is a block diagram conceptually showing the functions implemented in the control unit 80. As shown in FIG6, the control unit 80 is electrically connected to, for example, the opening and closing drive unit 16, the lifting unit 100, the four individual valves Va, Vb, Vc, Vd, the main valve Ve, the vacuum pump 32, the air supply valve Vf, and the pressure gauge 70. The control unit 80 can control the operation of the above-mentioned parts by referring to the measured value output from the pressure gauge 70, for example.

如圖6中概念性地所示,控制部80例如具有開閉控制部81、升降控制部82、切換控制部83、排氣控制部84、泵控制部85、及供氣控制部86作為所實現的功能性結構。例如,開閉控制部81對開閉驅動部16的動作進行控制。例如,升降控制部82對升降部100的動作進行控制。例如,切換控制部83各別地控制四個單獨閥Va、Vb、Vc、Vd的開閉狀態。例如,排氣控制部84對主閥Ve的開閉狀態及開度進行控制。例如,泵控制部85對真空泵32的動作進行控制。例如,供氣控制部86對供氣閥Vf的開閉狀態進行控制。控制部80的各部的功能例如是通過處理器801進行按照所述程式803p等的運算處理來實現。 As conceptually shown in FIG. 6 , the control unit 80 has, for example, an opening and closing control unit 81, a lifting control unit 82, a switching control unit 83, an exhaust control unit 84, a pump control unit 85, and an air supply control unit 86 as functional structures implemented. For example, the opening and closing control unit 81 controls the operation of the opening and closing drive unit 16. For example, the lifting control unit 82 controls the operation of the lifting unit 100. For example, the switching control unit 83 controls the opening and closing states of four individual valves Va, Vb, Vc, and Vd, respectively. For example, the exhaust control unit 84 controls the opening and closing state and the opening degree of the main valve Ve. For example, the pump control unit 85 controls the operation of the vacuum pump 32. For example, the air supply control unit 86 controls the opening and closing state of the air supply valve Vf. The functions of each part of the control unit 80 are realized by, for example, the processor 801 performing calculations according to the program 803p, etc.

<2.減壓乾燥處理> <2. Pressure reduction and drying treatment>

接著,對使用了減壓乾燥裝置1的基板9的減壓乾燥處理進行說明。圖7是表示一實施形態的減壓乾燥處理的流程的一例的流程圖。所述減壓乾燥處理的流程例如是通過在控制部80中所包含的處理器801中執行程式803p來實現。此處,例如,按照所述順序進行圖7的步驟S1至步驟S10的處理。 Next, the decompression drying process of the substrate 9 using the decompression drying device 1 is described. FIG. 7 is a flow chart showing an example of the process of the decompression drying process in an embodiment. The process of the decompression drying process is implemented, for example, by executing the program 803p in the processor 801 included in the control unit 80. Here, for example, the processing of steps S1 to S10 of FIG. 7 is performed in the order described.

在使用減壓乾燥裝置1進行減壓乾燥處理時,例如,首先,將基板9搬入至腔室10內(步驟S1)。此時,處於在基板9的上表面形成有未乾燥的塗膜90的狀態。在步驟S1中,例如, 首先,開閉控制部81使開閉驅動部16運行,而使閘門部15從關閉位置向打開位置移動,由此打開搬入搬出口14。然後,例如,省略了圖示的搬送機器人在將基板9載置於叉子狀的機械手的同時,經由腔室10的搬入搬出口14將基板9搬入至腔室10的內部空間10s。在此時間點,支撐部20例如配置於下降位置H1。搬送機器人例如在將叉子狀的機械手插入至支撐部20的多個支撐板21之間的同時,將基板9載置於支撐部20上。當將基板9載置於支撐部20上時,搬送機器人退避至腔室10的外部。然後,例如,開閉控制部81再次使開閉驅動部16運行,而使閘門部15從打開位置向關閉位置移動,由此關閉搬入搬出口14。由此,在腔室10的內部空間10s收容基板9。 When the reduced pressure drying device 1 is used to perform the reduced pressure drying process, for example, first, the substrate 9 is moved into the chamber 10 (step S1). At this time, an undried coating 90 is formed on the upper surface of the substrate 9. In step S1, for example, First, the opening and closing control unit 81 operates the opening and closing drive unit 16, and moves the gate unit 15 from the closed position to the open position, thereby opening the loading and unloading port 14. Then, for example, the transport robot, which is not shown in the figure, carries the substrate 9 into the internal space 10s of the chamber 10 through the loading and unloading port 14 of the chamber 10 while placing the substrate 9 on the fork-shaped manipulator. At this point in time, the support unit 20 is, for example, arranged at the lowered position H1. The transport robot, for example, places the substrate 9 on the support portion 20 while inserting a fork-shaped manipulator between the plurality of support plates 21 of the support portion 20. When the substrate 9 is placed on the support portion 20, the transport robot retreats to the outside of the chamber 10. Then, for example, the opening and closing control unit 81 operates the opening and closing drive unit 16 again, and moves the gate unit 15 from the open position to the closed position, thereby closing the loading and unloading port 14. Thus, the substrate 9 is accommodated in the internal space 10s of the chamber 10.

接著,例如,減壓乾燥裝置1開始使支撐部20反覆升降的動作(步驟S2)。此處,例如,升降控制部82通過升降部100開始使支撐部20反覆升降的動作。此時,例如,支撐部20在上下方向上在下降位置H1與上升位置H2之間開始升降。由此,例如,載置於支撐部20上的基板9沿上下方向開始升降。其結果,例如,基板9的上表面與腔室10的頂板部13的距離在長的狀態與短的狀態之間反覆變更。此處,使支撐部20升降的周期(循環)例如設定為幾秒左右。下降位置H1與上升位置H2之間的距離例如設定為10毫米(mm)至100mm左右。 Next, for example, the decompression drying device 1 starts the action of repeatedly lifting and lowering the support part 20 (step S2). Here, for example, the lifting control part 82 starts the action of repeatedly lifting and lowering the support part 20 through the lifting part 100. At this time, for example, the support part 20 starts to be lifted and lowered between the descending position H1 and the ascending position H2 in the vertical direction. As a result, for example, the distance between the upper surface of the substrate 9 and the top plate part 13 of the chamber 10 repeatedly changes between a long state and a short state. Here, the period (cycle) of lifting and lowering the support part 20 is set to, for example, about several seconds. The distance between the descending position H1 and the ascending position H2 is set to, for example, about 10 millimeters (mm) to 100 mm.

接著,例如,減壓乾燥裝置1開始來自腔室10內的排氣(步驟S3)。由此,例如,控制部80執行在腔室10內由支撐部 20從下方支撐基板9的狀態下,通過排氣部30排出腔室10內的氣體環境的步驟(也稱為排氣步驟)。此時,例如,控制部80在執行排氣步驟時,成為執行通過升降部100使支撐部20反覆升降的步驟(也稱為第一升降步驟)的狀態。換言之,控制部80例如在進行利用排氣部30的排氣時,對升降部100進行控制,以使支撐部20反覆升降。 Next, for example, the decompression drying device 1 starts exhausting gas from the chamber 10 (step S3). Thus, for example, the control unit 80 executes a step (also referred to as an exhaust step) of exhausting the gas environment in the chamber 10 through the exhaust unit 30 while the substrate 9 is supported from below by the support unit 20 in the chamber 10. At this time, for example, when the control unit 80 executes the exhaust step, it becomes a state of executing a step (also referred to as a first lifting step) of repeatedly lifting the support unit 20 through the lifting unit 100. In other words, when the control unit 80, for example, performs exhaust using the exhaust unit 30, it controls the lifting unit 100 so that the support unit 20 is repeatedly lifted and lowered.

此處,例如,泵控制部85開始真空泵32的動作,切換控制部83打開多個單獨閥Va、Vb、Vc、Vd的至少一部分,並且排氣控制部84打開主閥Ve。由此,例如,開始氣體從腔室10的內部空間10s向排氣配管31的排出,腔室10內的氣壓從大氣壓開始下降。 Here, for example, the pump control unit 85 starts the operation of the vacuum pump 32, the switching control unit 83 opens at least a part of the plurality of individual valves Va, Vb, Vc, and Vd, and the exhaust control unit 84 opens the main valve Ve. Thus, for example, the gas starts to be discharged from the internal space 10s of the chamber 10 to the exhaust pipe 31, and the air pressure in the chamber 10 starts to drop from the atmospheric pressure.

此處,例如,在來自腔室10內的排氣時,通過反覆進行支撐部20的升降,基板9的上表面與腔室10的頂板部13之間的空間在經縮小的狀態與擴大的狀態之間反覆變更。此時,例如,在腔室10內產生氣流的紊亂。由此,例如,難以產生在塗膜90上產生持續的特定模式的氣流(也稱為第一穩定流)的現象。其結果,例如,在塗膜90中難以產生與場所相應的乾燥速度的差異,難以產生在塗膜90中的特定部位產生條狀的乾燥不均的不良狀況。 Here, for example, when exhausting from the chamber 10, the space between the upper surface of the substrate 9 and the ceiling 13 of the chamber 10 changes repeatedly between a contracted state and an expanded state by repeatedly lifting and lowering the support portion 20. At this time, for example, airflow turbulence occurs in the chamber 10. As a result, for example, it is difficult to produce a phenomenon of a continuous specific pattern of airflow (also called a first stable flow) on the coating 90. As a result, for example, it is difficult to produce a difference in drying speed corresponding to the location in the coating 90, and it is difficult to produce a bad condition of stripe-shaped drying unevenness at a specific location in the coating 90.

另外,例如,即便假設由於多個支撐銷22的存在而在基板9產生溫度差,也能夠通過由氣流的紊亂引起的攪拌作用而減少基板9中的由支撐銷22支撐的部分的正上方的從塗膜90蒸發 的溶劑的成分的濃度與其周邊的從塗膜90蒸發的溶劑的成分的濃度之差。換言之,例如,在塗膜90上從塗膜90蒸發的溶劑的成分的濃度難以偏向。其結果,例如,難以產生在塗膜90中的與支撐銷22的位置相應的部位產生乾燥不均的不良狀況。 In addition, for example, even if a temperature difference occurs in the substrate 9 due to the presence of a plurality of support pins 22, the difference in concentration between the solvent component evaporated from the coating 90 directly above the portion of the substrate 9 supported by the support pins 22 and the solvent component evaporated from the coating 90 around it can be reduced by the stirring effect caused by the turbulence of the airflow. In other words, for example, the concentration of the solvent component evaporated from the coating 90 is unlikely to be biased on the coating 90. As a result, for example, it is unlikely to cause a defective condition of uneven drying at a portion of the coating 90 corresponding to the position of the support pins 22.

另外,例如,能夠通過由氣流的紊亂引起的攪拌作用而減少基板9中的塗布區域A1的中央部的正上方的從塗膜90蒸發的溶劑的成分的濃度與塗布區域A1的端部的正上方的從塗膜90蒸發的溶劑的成分的濃度之差。換言之,例如,在塗膜90上從塗膜90蒸發的溶劑的成分的濃度難以偏向。其結果,例如,難以產生在塗膜90中的與塗布區域A1的形狀相應的部位產生乾燥不均的不良狀況。 In addition, for example, the difference between the concentration of the solvent component evaporated from the coating film 90 just above the center of the coating area A1 in the substrate 9 and the concentration of the solvent component evaporated from the coating film 90 just above the end of the coating area A1 can be reduced by the stirring effect caused by the turbulence of the airflow. In other words, for example, the concentration of the solvent component evaporated from the coating film 90 is unlikely to be biased on the coating film 90. As a result, for example, it is unlikely to cause a defective condition of uneven drying at a portion of the coating film 90 corresponding to the shape of the coating area A1.

因此,例如,在由排氣部30進行來自腔室10內的排氣時,若使支撐部20反覆升降,則形成於基板9的上表面的塗膜90能夠更均勻地乾燥。 Therefore, for example, when the exhaust unit 30 exhausts the air from the chamber 10, if the support unit 20 is repeatedly raised and lowered, the coating 90 formed on the upper surface of the substrate 9 can be dried more evenly.

此外,例如,在進行利用排氣部30的排氣時,可通過排氣控制部84適宜變更主閥Ve的開度,也可通過切換控制部83依次切換四個單獨閥Va、Vb、Vc、Vd的開閉狀態。 In addition, for example, when exhausting the exhaust section 30, the opening of the main valve Ve can be appropriately changed through the exhaust control section 84, and the opening and closing states of the four individual valves Va, Vb, Vc, and Vd can be switched in sequence through the switching control section 83.

接著,例如,減壓乾燥裝置1判定腔室10的內部空間10s是否達到規定的真空度(步驟S4)。此處,例如,控制部80根據利用壓力計70所得的測量結果,判定腔室10的內部空間10s是否下降至與規定的真空度對應的規定的壓力。例如,反覆進行步驟S4的判定,直至內部空間10s達到規定的真空度為止。然後, 當內部空間10s達到規定的真空度時,減壓乾燥裝置1結束來自腔室10內的排氣(步驟S5)。此處,例如,排氣控制部84關閉主閥Ve,並且泵控制部85結束真空泵32的動作。由此,例如,氣體從腔室10的內部空間10s向排氣配管31的排出結束。此處,例如,從排氣的開始至結束為止的時間例如能夠成為300秒至500秒左右。 Next, for example, the decompression drying device 1 determines whether the internal space 10s of the chamber 10 has reached a specified vacuum degree (step S4). Here, for example, the control unit 80 determines whether the internal space 10s of the chamber 10 has dropped to a specified pressure corresponding to the specified vacuum degree based on the measurement result obtained using the pressure gauge 70. For example, the determination of step S4 is repeated until the internal space 10s reaches the specified vacuum degree. Then, when the internal space 10s reaches the specified vacuum degree, the decompression drying device 1 ends the exhaust from the chamber 10 (step S5). Here, for example, the exhaust control unit 84 closes the main valve Ve, and the pump control unit 85 ends the operation of the vacuum pump 32. Thus, for example, the exhaust of gas from the internal space 10s of the chamber 10 to the exhaust pipe 31 is completed. Here, for example, the time from the start to the end of the exhaust can be about 300 seconds to 500 seconds.

接著,例如,減壓乾燥裝置1開始向腔室10內的供氣(步驟S6)。由此,例如,控制部80在排氣步驟之後,執行在腔室10內由支撐部20從下方支撐基板9的狀態下,通過供氣部60向腔室10內供給氣體的步驟(也稱為供氣步驟)。此時,例如,控制部80在執行供氣步驟時,成為執行通過升降部100使支撐部20反覆升降的步驟(也稱為第二升降步驟)的狀態。換言之,控制部80例如在進行利用供氣部60的供氣時,對升降部100進行控制,以使支撐部20反覆升降。 Next, for example, the decompression drying device 1 starts supplying gas into the chamber 10 (step S6). Thus, for example, after the exhaust step, the control unit 80 executes a step of supplying gas into the chamber 10 through the gas supply unit 60 in a state where the substrate 9 is supported from below by the support unit 20 in the chamber 10 (also referred to as a gas supply step). At this time, for example, when the control unit 80 executes the gas supply step, it becomes a state of executing a step of repeatedly raising and lowering the support unit 20 through the lifting unit 100 (also referred to as a second lifting step). In other words, when the control unit 80, for example, performs gas supply using the gas supply unit 60, it controls the lifting unit 100 so that the support unit 20 is repeatedly raised and lowered.

此處,例如,供氣控制部86打開供氣閥Vf。由此,例如,開始從供氣源62通過供氣配管61及供氣口16f向腔室10的內部空間10s供給氣體。此時,腔室10內的氣壓開始向大氣壓上升。在所述供氣步驟中,例如,在腔室10內可能產生相對較強的氣流。與此相對,例如,有時塗膜90處於未充分乾燥的半乾的狀態。 Here, for example, the air supply control unit 86 opens the air supply valve Vf. As a result, for example, gas starts to be supplied from the air supply source 62 to the internal space 10s of the chamber 10 through the air supply pipe 61 and the air supply port 16f. At this time, the air pressure in the chamber 10 starts to rise to the atmospheric pressure. In the air supply step, for example, a relatively strong air flow may be generated in the chamber 10. In contrast, for example, the coating 90 is sometimes in a semi-dry state that is not fully dried.

此處,例如,在向腔室10內的供氣時,通過反覆進行支撐部20的升降,基板9的上表面與腔室10的頂板部13之間的空間在縮小的狀態與擴大的狀態之間反覆變更。此時,例如,在腔 室10內產生氣流的紊亂。由此,例如,難以產生在塗膜90上產生持續的特定模式的氣流(也稱為第二穩定流)的現象。其結果,例如,在塗膜90中難以產生與場所相應的乾燥速度的差異,難以產生在塗膜90中的特定部位產生條狀的乾燥不均的不良狀況。 Here, for example, when supplying air to the chamber 10, the space between the upper surface of the substrate 9 and the ceiling portion 13 of the chamber 10 changes repeatedly between a contracted state and an expanded state by repeatedly raising and lowering the support portion 20. At this time, for example, turbulence of the airflow occurs in the chamber 10. As a result, for example, it is difficult to produce a phenomenon of a continuous specific pattern of airflow (also called a second stable flow) on the coating 90. As a result, for example, it is difficult to produce a difference in drying speed corresponding to the location in the coating 90, and it is difficult to produce a bad condition of stripe-shaped drying unevenness at a specific location in the coating 90.

另外,例如,即便假設由於多個支撐銷22的存在而在基板9產生溫度差,也能夠通過由氣流的紊亂引起的攪拌作用而減少基板9中的由支撐銷22支撐的部分的正上方的從塗膜90蒸發的溶劑的成分的濃度與其周邊的從塗膜90蒸發的溶劑的成分的濃度之差。換言之,例如,在塗膜90上從塗膜90蒸發的溶劑的成分的濃度難以偏向。其結果,例如,難以產生在塗膜90中的與支撐銷22的位置相應的部位產生乾燥不均的不良狀況。 In addition, for example, even if a temperature difference occurs in the substrate 9 due to the presence of a plurality of support pins 22, the difference in concentration between the components of the solvent evaporated from the coating 90 directly above the portion of the substrate 9 supported by the support pins 22 and the components of the solvent evaporated from the coating 90 around it can be reduced by the stirring effect caused by the turbulence of the airflow. In other words, for example, the concentration of the components of the solvent evaporated from the coating 90 is unlikely to be biased on the coating 90. As a result, for example, it is unlikely that the defective condition of uneven drying occurs at the portion of the coating 90 corresponding to the position of the support pins 22.

另外,例如,能夠通過由氣流的紊亂引起的攪拌作用而減少基板9中的塗布區域A1的中央部的正上方的從塗膜90蒸發的溶劑的成分的濃度與塗布區域A1的端部的正上方的從塗膜90蒸發的溶劑的成分的濃度之差。換言之,例如,在塗膜90上從塗膜90蒸發的溶劑的成分的濃度難以偏向。其結果,例如,難以產生在塗膜90中的與塗布區域A1的形狀相應的部位產生乾燥不均的不良狀況。 In addition, for example, the difference between the concentration of the solvent component evaporated from the coating film 90 just above the center of the coating area A1 in the substrate 9 and the concentration of the solvent component evaporated from the coating film 90 just above the end of the coating area A1 can be reduced by the stirring effect caused by the turbulence of the airflow. In other words, for example, the concentration of the solvent component evaporated from the coating film 90 is unlikely to be biased on the coating film 90. As a result, for example, it is unlikely to cause a defective condition of uneven drying at a portion of the coating film 90 corresponding to the shape of the coating area A1.

因此,例如,在通過供氣部60進行向腔室10內的供氣時,若使支撐部20反覆升降,則形成於基板9的上表面的塗膜90能夠更均勻地乾燥。 Therefore, for example, when supplying gas into the chamber 10 through the gas supply unit 60, if the support unit 20 is repeatedly raised and lowered, the coating 90 formed on the upper surface of the substrate 9 can be dried more evenly.

接著,例如,減壓乾燥裝置1判定腔室10的內部空間10s 是否達到大氣壓(步驟S7)。此處,例如,控制部80根據利用壓力計70所得的測量結果,判定腔室10的內部空間10s是否達到大氣壓。例如,反覆進行步驟S7的判定,直至內部空間10s達到大氣壓為止。然後,當內部空間10s達到大氣壓時,減壓乾燥裝置1結束向腔室10內的供氣(步驟S8)。此處,例如,供氣控制部86關閉供氣閥Vf。由此,例如,結束氣體從供氣源62向經由供氣配管61及供氣口16f的腔室10的內部空間10s的供給。此處,例如,從供氣的開始至結束為止的時間例如能夠成為50秒至150秒左右。 Next, for example, the decompression drying device 1 determines whether the internal space 10s of the chamber 10 has reached atmospheric pressure (step S7). Here, for example, the control unit 80 determines whether the internal space 10s of the chamber 10 has reached atmospheric pressure based on the measurement result obtained by the pressure gauge 70. For example, the determination of step S7 is repeated until the internal space 10s reaches atmospheric pressure. Then, when the internal space 10s reaches atmospheric pressure, the decompression drying device 1 ends the air supply to the chamber 10 (step S8). Here, for example, the air supply control unit 86 closes the air supply valve Vf. Thus, for example, the supply of gas from the gas supply source 62 to the internal space 10s of the chamber 10 through the gas supply pipe 61 and the gas supply port 16f is terminated. Here, for example, the time from the start to the end of the gas supply can be about 50 seconds to 150 seconds.

接著,例如,減壓乾燥裝置1結束使支撐部20反覆升降的動作(步驟S9)。此處,例如,升降控制部82結束通過升降部100使支撐部20反覆升降的動作。此時,例如,在支撐部20配置於下降位置H1的狀態下,停止支撐部20的升降。 Next, for example, the decompression drying device 1 ends the action of repeatedly raising and lowering the support part 20 (step S9). Here, for example, the lifting control unit 82 ends the action of repeatedly raising and lowering the support part 20 through the lifting unit 100. At this time, for example, when the support part 20 is arranged at the lowered position H1, the lifting and lowering of the support part 20 is stopped.

然後,例如,最後將基板9從腔室10內搬出(步驟S10)。在步驟S10中,例如,首先,開閉控制部81使開閉驅動部16運行,而使閘門部15從關閉位置向打開位置移動,由此打開搬入搬出口14。然後,例如,省略了圖示的搬送機器人經由腔室10的搬入搬出口14將載置於支撐部20的乾燥完畢的基板9搬出至腔室10的外部。由此,能夠結束對一片基板9的減壓乾燥處理。 Then, for example, the substrate 9 is finally carried out from the chamber 10 (step S10). In step S10, for example, first, the opening and closing control unit 81 operates the opening and closing drive unit 16, and moves the gate unit 15 from the closed position to the open position, thereby opening the loading and unloading port 14. Then, for example, a transport robot (not shown) carries the dried substrate 9 placed on the support unit 20 out of the chamber 10 through the loading and unloading port 14 of the chamber 10. In this way, the decompression drying process of a substrate 9 can be completed.

如此,使用減壓乾燥裝置1使形成於基板9的上表面的塗膜90乾燥的方法(也稱為減壓乾燥方法)例如具有排氣步驟、供氣步驟、第一升降步驟及第二升降步驟。就其他觀點而言,使 用減壓乾燥裝置1的減壓乾燥方法例如具有排氣步驟、供氣步驟、以及包含第一升降步驟及第二升降步驟的、通過升降部100使支撐部20反覆升降的步驟(也稱為升降步驟)。換言之,控制部80例如在分別進行利用排氣部30的排氣及利用供氣部60的供氣時,對升降部100進行控制,以使支撐部20反覆升降。 Thus, the method for drying the coating 90 formed on the upper surface of the substrate 9 using the reduced pressure drying device 1 (also referred to as the reduced pressure drying method) includes, for example, an exhaust step, an air supply step, a first lifting step, and a second lifting step. From another perspective, the reduced pressure drying method using the reduced pressure drying device 1 includes, for example, an exhaust step, an air supply step, and a step of repeatedly lifting the support portion 20 by the lifting portion 100 including the first lifting step and the second lifting step (also referred to as the lifting step). In other words, the control portion 80 controls the lifting portion 100 to repeatedly lift the support portion 20 when, for example, exhausting the exhaust portion 30 and supplying the air by the air supply portion 60 are performed respectively.

如以上所述,在一實施形態的減壓乾燥裝置1中,例如,在分別進行腔室10內的氣體環境的排出及氣體向腔室10內的供給時,使基板9反覆升降。由此,例如,無論是在腔室10內的排氣時還是在向腔室10內的供氣時,均可在腔室10內產生氣流的紊亂。其結果,無論是在腔室10內的排氣時還是在向腔室10內的供氣時,均難以在基板9的上方產生持續的特定模式的氣流,並且在塗膜90上從塗膜90蒸發的溶劑的成分的濃度難以偏向。因此,例如,形成於基板9的上表面的塗膜90能夠更均勻地乾燥。 As described above, in a reduced pressure drying device 1 of one embodiment, for example, the substrate 9 is repeatedly raised and lowered when the gas environment in the chamber 10 is exhausted and the gas is supplied to the chamber 10. Thus, for example, whether the gas is exhausted in the chamber 10 or the gas is supplied to the chamber 10, turbulence of the airflow can be generated in the chamber 10. As a result, whether the gas is exhausted in the chamber 10 or the gas is supplied to the chamber 10, it is difficult to generate a continuous specific pattern of airflow above the substrate 9, and the concentration of the components of the solvent evaporated from the coating 90 is difficult to be biased on the coating 90. Therefore, for example, the coating 90 formed on the upper surface of the substrate 9 can be dried more uniformly.

<3.變形例> <3. Variations>

本發明並不限定於所述的一實施形態,能夠在不脫離本發明的主旨的範圍內進行各種變更、改良等。 The present invention is not limited to the above-mentioned implementation form, and various changes and improvements can be made without departing from the scope of the present invention.

在所述一實施形態中,例如,控制部80可在進行利用排氣部30的排氣及利用供氣部60的供氣中的至少其中一者時,對升降部100進行控制,以使支撐部20反覆升降。換言之,在使用減壓乾燥裝置1進行減壓乾燥處理時,控制部80可執行在執行排氣步驟時通過升降部100使支撐部20反覆升降的步驟(第一升降步驟)、及在執行供氣步驟時通過升降部100使支撐部20反覆升 降的步驟(第二升降步驟)中的至少其中一者。進而換言之,例如使用了減壓乾燥裝置1的減壓乾燥方法可具有排氣步驟、供氣步驟、以及第一升降步驟,也可具有排氣步驟、供氣步驟、以及第二升降步驟。就其他觀點而言,使用了減壓乾燥裝置1的減壓乾燥方法例如具有排氣步驟、供氣步驟、以及在執行排氣步驟及供氣步驟中的至少其中一個步驟時作為通過升降部100使支撐部20反覆升降的步驟的升降步驟。換言之,升降步驟例如也可包括第一升降步驟及第二升降步驟中的至少其中一者。 In the embodiment, for example, the control unit 80 may control the lifting unit 100 to repeatedly lift the support unit 20 when performing at least one of exhausting air by the exhaust unit 30 and supplying air by the air supply unit 60. In other words, when performing the reduced pressure drying process using the reduced pressure drying device 1, the control unit 80 may perform at least one of a step of repeatedly lifting the support unit 20 by the lifting unit 100 when performing the exhausting step (a first lifting step) and a step of repeatedly lifting the support unit 20 by the lifting unit 100 when performing the air supplying step (a second lifting step). In other words, for example, the decompression drying method using the decompression drying device 1 may have an exhaust step, an air supply step, and a first lifting step, or an exhaust step, an air supply step, and a second lifting step. From another perspective, the decompression drying method using the decompression drying device 1 may have, for example, an exhaust step, an air supply step, and a lifting step as a step of repeatedly lifting the support portion 20 through the lifting portion 100 when performing at least one of the exhaust step and the air supply step. In other words, the lifting step may also include, for example, at least one of the first lifting step and the second lifting step.

此處,例如,在進行腔室10內的氣體環境的排出及氣體向腔室10內的供給中的至少其中一者時,可使基板9反覆升降。由此,例如,在排氣時及供氣時中的至少其中一者中,可在腔室10內產生氣流的紊亂。其結果,例如,在排氣時及供氣時中的至少其中一者中,在腔室10內,難以產生持續的特定模式的氣流,並且在塗膜90上從塗膜90蒸發的溶劑的成分的濃度難以偏向。因此,例如,形成於基板9的上表面的塗膜90能夠更均勻地乾燥。 Here, for example, the substrate 9 can be repeatedly raised and lowered when at least one of the gas environment in the chamber 10 is exhausted and the gas is supplied to the chamber 10. Thus, for example, in at least one of the exhaust and the supply, turbulence of the airflow can be generated in the chamber 10. As a result, for example, in at least one of the exhaust and the supply, it is difficult to generate a continuous specific pattern of airflow in the chamber 10, and the concentration of the components of the solvent evaporated from the coating 90 is difficult to be biased on the coating 90. Therefore, for example, the coating 90 formed on the upper surface of the substrate 9 can be dried more uniformly.

此處,對執行第一升降步驟及第二升降步驟中的第一升降步驟的減壓乾燥處理的一例進行說明。圖8是表示一變形例的減壓乾燥處理的流程的一例的流程圖。所述減壓乾燥處理的流程例如是通過在控制部80中所包含的處理器801中執行程式803p來實現。此處,例如,按照所述記載的順序進行圖8的步驟Sa1至步驟Sa10的處理。 Here, an example of the decompression drying process of the first lifting step in the first lifting step and the second lifting step is described. FIG. 8 is a flowchart showing an example of the process of the decompression drying process of a variant. The process of the decompression drying process is implemented, for example, by executing the program 803p in the processor 801 included in the control unit 80. Here, for example, the processing of steps Sa1 to Sa10 of FIG. 8 is performed in the order described.

首先,將基板9搬入至腔室10內(步驟Sa1)。此處,例 如,進行與所述步驟S1同樣的動作。 First, the substrate 9 is moved into the chamber 10 (step Sa1). Here, for example, the same action as the above step S1 is performed.

接著,例如,減壓乾燥裝置1開始使支撐部20反覆升降的動作(步驟Sa2)。此處,例如,進行與所述步驟S2同樣的動作。 Next, for example, the pressure-reducing drying device 1 starts to repeatedly raise and lower the support portion 20 (step Sa2). Here, for example, the same action as the step S2 is performed.

接著,例如,減壓乾燥裝置1開始來自腔室10內的排氣(步驟Sa3)。此處,例如,進行與所述步驟S3同樣的動作。 Next, for example, the decompression drying device 1 starts exhausting air from the chamber 10 (step Sa3). Here, for example, the same action as the step S3 is performed.

接著,例如,減壓乾燥裝置1判定腔室10的內部空間10s是否達到規定的真空度(步驟Sa4)。此處,例如,進行與所述步驟S4同樣的動作。此處,例如,反覆進行步驟Sa4的判定,直至內部空間10s達到規定的真空度為止,當內部空間10s達到規定的真空度時,減壓乾燥裝置1結束來自腔室10內的排氣(步驟Sa5)。此處,例如,進行與所述步驟S5同樣的動作。 Next, for example, the decompression drying device 1 determines whether the internal space 10s of the chamber 10 reaches a specified vacuum degree (step Sa4). Here, for example, the same action as the step S4 is performed. Here, for example, the determination of step Sa4 is repeated until the internal space 10s reaches the specified vacuum degree. When the internal space 10s reaches the specified vacuum degree, the decompression drying device 1 ends the exhaust from the chamber 10 (step Sa5). Here, for example, the same action as the step S5 is performed.

接著,例如,減壓乾燥裝置1結束使支撐部20反覆升降的動作(步驟Sa6)。此處,例如,進行與所述步驟S9同樣的動作。 Next, for example, the pressure-reducing drying device 1 ends the action of repeatedly raising and lowering the support portion 20 (step Sa6). Here, for example, the same action as the above-mentioned step S9 is performed.

接著,例如,減壓乾燥裝置1開始向腔室10內的供氣(步驟Sa7)。此處,例如,進行與所述步驟S6同樣的動作。 Next, for example, the decompression drying device 1 starts supplying air into the chamber 10 (step Sa7). Here, for example, the same action as the step S6 is performed.

接著,例如,減壓乾燥裝置1判定腔室10的內部空間10s是否達到大氣壓(步驟Sa8)。此處,例如,進行與所述步驟S7同樣的動作。此處,例如,當內部空間10s達到大氣壓時,減壓乾燥裝置1結束向腔室10內的供氣(步驟Sa9)。此處,例如,進行與所述步驟S8同樣的動作。 Next, for example, the decompression drying device 1 determines whether the internal space 10s of the chamber 10 reaches atmospheric pressure (step Sa8). Here, for example, the same action as the step S7 is performed. Here, for example, when the internal space 10s reaches atmospheric pressure, the decompression drying device 1 ends the air supply to the chamber 10 (step Sa9). Here, for example, the same action as the step S8 is performed.

然後,例如,最後將基板9從腔室10內搬出(步驟Sa10)。此處,例如,進行與所述步驟S10同樣的動作。 Then, for example, the substrate 9 is finally taken out of the chamber 10 (step Sa10). Here, for example, the same action as the step S10 is performed.

另外,此處,對執行第一升降步驟及第二升降步驟中的第二升降步驟的減壓乾燥處理的一例進行說明。圖9是表示一變形例的減壓乾燥處理的流程的一例的流程圖。所述減壓乾燥處理的流程例如是通過在控制部80中所包含的處理器801中執行程式803p來實現。此處,例如,按照所述順序進行圖9的步驟Sb1至步驟Sb10的處理。 In addition, here, an example of the decompression drying process of the second lifting step in the first lifting step and the second lifting step is described. FIG. 9 is a flow chart showing an example of the process of the decompression drying process of a variant. The process of the decompression drying process is implemented, for example, by executing the program 803p in the processor 801 included in the control unit 80. Here, for example, the processing of steps Sb1 to Sb10 of FIG. 9 is performed in the order described.

首先,將基板9搬入至腔室10內(步驟Sb1)。此處,例如,進行與所述步驟S1及步驟Sa1同樣的動作。 First, the substrate 9 is moved into the chamber 10 (step Sb1). Here, for example, the same actions as the above-mentioned step S1 and step Sa1 are performed.

接著,例如,減壓乾燥裝置1開始來自腔室10內的排氣(步驟Sb2)。此處,例如,進行與所述步驟S3及步驟Sa3同樣的動作。 Next, for example, the decompression drying device 1 starts exhausting air from the chamber 10 (step Sb2). Here, for example, the same actions as the above-mentioned step S3 and step Sa3 are performed.

接著,例如,減壓乾燥裝置1判定腔室10的內部空間10s是否達到規定的真空度(步驟Sb3)。此處,例如,進行與所述步驟S4及步驟Sa4同樣的動作。此處,例如,反覆進行步驟Sb3的判定,直至內部空間10s達到規定的真空度為止,當內部空間10s達到規定的真空度時,減壓乾燥裝置1結束來自腔室10內的排氣(步驟Sb4)。此處,例如,進行與所述步驟S5及步驟Sa5同樣的動作。 Next, for example, the decompression drying device 1 determines whether the internal space 10s of the chamber 10 reaches a specified vacuum degree (step Sb3). Here, for example, the same actions as the above steps S4 and Sa4 are performed. Here, for example, the determination of step Sb3 is repeated until the internal space 10s reaches the specified vacuum degree. When the internal space 10s reaches the specified vacuum degree, the decompression drying device 1 ends the exhaust from the chamber 10 (step Sb4). Here, for example, the same actions as the above steps S5 and Sa5 are performed.

接著,例如,減壓乾燥裝置1開始使支撐部20反覆升降的動作(步驟Sb5)。此處,例如,進行與所述步驟S2及步驟Sa2同樣的動作。 Next, for example, the pressure-reducing drying device 1 starts to repeatedly raise and lower the support portion 20 (step Sb5). Here, for example, the same actions as the above-mentioned steps S2 and Sa2 are performed.

接著,例如,減壓乾燥裝置1開始向腔室10內的供氣(步 驟Sb6)。此處,例如,進行與所述步驟S6及步驟Sa7同樣的動作。 Next, for example, the decompression drying device 1 starts supplying air into the chamber 10 (step Sb6). Here, for example, the same actions as the above-mentioned step S6 and step Sa7 are performed.

接著,例如,減壓乾燥裝置1判定腔室10的內部空間10s是否達到大氣壓(步驟Sb7)。此處,例如,進行與所述步驟S7及步驟Sa8同樣的動作。此處,例如,當內部空間10s達到大氣壓時,減壓乾燥裝置1結束向腔室10內的供氣(步驟Sb8)。此處,例如,進行與所述步驟S8及步驟Sa9同樣的動作。 Next, for example, the decompression drying device 1 determines whether the internal space 10s of the chamber 10 reaches atmospheric pressure (step Sb7). Here, for example, the same actions as the above-mentioned steps S7 and Sa8 are performed. Here, for example, when the internal space 10s reaches atmospheric pressure, the decompression drying device 1 ends the air supply to the chamber 10 (step Sb8). Here, for example, the same actions as the above-mentioned steps S8 and Sa9 are performed.

接著,例如,減壓乾燥裝置1結束使支撐部20反覆升降的動作(步驟Sb9)。此處,例如,進行與所述步驟S9及步驟Sa6同樣的動作。 Next, for example, the decompression drying device 1 ends the action of repeatedly raising and lowering the support portion 20 (step Sb9). Here, for example, the same action as the above-mentioned step S9 and step Sa6 is performed.

然後,例如,最後將基板9從腔室10內搬出(步驟Sb10)。此處,例如,進行與所述步驟S10及步驟Sa10同樣的動作。 Then, for example, the substrate 9 is finally taken out of the chamber 10 (step Sb10). Here, for example, the same actions as the above-mentioned step S10 and step Sa10 are performed.

在所述一實施形態中,例如,控制部80可在進行利用排氣部30的排氣的期間中的一部分期間中,對升降部100進行控制,以使支撐部20反覆升降。另外,例如,控制部80可在進行利用供氣部60的供氣的期間中的一部分期間中,對升降部100進行控制,以使支撐部20反覆升降。換言之,在使用減壓乾燥裝置1進行減壓乾燥處理時,例如,可在執行排氣步驟的期間中的一部分期間中執行第一升降步驟,也可在執行供氣步驟的期間中的一部分期間中執行第二升降步驟。此處,例如,可在排氣步驟的執行開始之後開始第一升降步驟的執行,也可在排氣步驟的執行結束之前結束第一升降步驟的執行。另外,例如,可在供氣步驟的 執行開始之後開始第二升降步驟的執行,也可在供氣步驟的執行結束之前結束第二升降步驟的執行。 In the embodiment, for example, the control unit 80 may control the lifting unit 100 to repeatedly lift the support unit 20 during a portion of the exhausting period using the exhaust unit 30. Also, for example, the control unit 80 may control the lifting unit 100 to repeatedly lift the support unit 20 during a portion of the air supplying period using the air supply unit 60. In other words, when the reduced pressure drying device 1 is used to perform the reduced pressure drying process, for example, the first lifting step may be performed during a portion of the exhausting period, and the second lifting step may be performed during a portion of the air supplying period. Here, for example, the execution of the first lifting step may be started after the execution of the exhaust step is started, or the execution of the first lifting step may be ended before the execution of the exhaust step is ended. In addition, for example, the execution of the second lifting step may be started after the execution of the air supply step is started, or the execution of the second lifting step may be ended before the execution of the air supply step is ended.

在所述一實施形態中,例如腔室10具有四個排氣口16a、16b、16c、16d,但並不限於此。例如,腔室10所具有的排氣口的數量可為一個至三個及五個以上的任一者。另外,例如也可無單獨閥Va、單獨閥Vb、單獨閥Vc、單獨閥Vd。 In the embodiment, for example, the chamber 10 has four exhaust ports 16a, 16b, 16c, and 16d, but the present invention is not limited thereto. For example, the number of exhaust ports of the chamber 10 may be any one from one to three and five or more. In addition, for example, there may be no separate valve Va, separate valve Vb, separate valve Vc, and separate valve Vd.

在所述一實施形態中,減壓乾燥裝置1通過減壓使基板9上的塗膜90乾燥,但並不限於此。例如,減壓乾燥裝置1也可通過減壓及加熱使基板9上的塗膜90乾燥。 In the embodiment described above, the decompression drying device 1 dries the coating 90 on the substrate 9 by decompression, but is not limited thereto. For example, the decompression drying device 1 may also dry the coating 90 on the substrate 9 by decompression and heating.

在所述一實施形態中,在腔室10的側壁部12設置有基板9的搬入搬出口14,但並不限於此。例如,也可採用腔室10的四個側壁部12及頂板部13構成一體的蓋部10l,且所述蓋部10l可從底板部11分離而向上方退避的結構。圖10是示意性地表示一變形例的減壓乾燥裝置1的縱剖面的一例的圖。此處,例如,如圖10所示,若蓋部10l處於經由O形環等密封材料10b與底板部11接觸的狀態,則腔室10的內部空間10s處於關閉的狀態。此處,例如,通過利用開閉驅動部16而使蓋部10l向上方移動,從而從底板部11向上方分離,腔室10的內部空間10s打開。此時,例如,可進行基板9向腔室10的內部空間10s的搬入及基板9從腔室10的內部空間10s的搬出。另外,例如,通過利用開閉驅動部16而使蓋部10l向下方移動,從而所述蓋部10l推壓至底板部11上的密封材料10b,由此腔室10的內部空間10s關閉。另 外,此處,例如,四個側面整流板50固定於蓋部10l,也能夠與蓋部10l一併向上方移動。在採用此種結構的情況下,例如,容易減小內部空間10s,從排氣的開始至結束為止的時間能夠成為60秒至100秒左右,從供氣的開始至結束為止的時間能夠成為10秒至30秒左右。 In the embodiment described above, the side wall portion 12 of the chamber 10 is provided with a loading and unloading port 14 for the substrate 9, but the present invention is not limited thereto. For example, a cover portion 101 formed as a whole by the four side wall portions 12 and the top plate portion 13 of the chamber 10 may be adopted, and the cover portion 101 may be separated from the bottom plate portion 11 and retreated upward. FIG. 10 is a diagram schematically showing an example of a longitudinal section of a modified example of a reduced pressure drying device 1. Here, for example, as shown in FIG. 10, if the cover portion 101 is in contact with the bottom plate portion 11 via a sealing material 10b such as an O-ring, the internal space 10s of the chamber 10 is in a closed state. Here, for example, by using the opening and closing drive unit 16 to move the cover 101 upward, the cover 101 is separated upward from the bottom plate 11, and the internal space 10s of the chamber 10 is opened. At this time, for example, the substrate 9 can be carried into the internal space 10s of the chamber 10 and the substrate 9 can be carried out from the internal space 10s of the chamber 10. In addition, for example, by using the opening and closing drive unit 16 to move the cover 101 downward, the cover 101 is pressed against the sealing material 10b on the bottom plate 11, and the internal space 10s of the chamber 10 is closed. In addition, here, for example, four side rectifying plates 50 are fixed to the cover 101, and can also be moved upward together with the cover 101. When this structure is adopted, for example, it is easy to reduce the internal space by 10s, and the time from the start to the end of exhaust can be reduced to about 60 seconds to 100 seconds, and the time from the start to the end of air supply can be reduced to about 10 seconds to 30 seconds.

在所述一實施形態中,例如,支撐部20可具有各種形態。例如,多個支撐板21也可為一體的一個支撐板21。 In the embodiment, for example, the support portion 20 may have various shapes. For example, the plurality of support plates 21 may also be a single integrated support plate 21.

在所述一實施形態中,例如,可無底面整流板40,也可無側面整流板50。 In the embodiment described above, for example, the bottom straightening plate 40 and the side straightening plate 50 may be omitted.

在所述一實施形態中,例如,減壓乾燥裝置1中的各種動作例如也可響應於用戶對輸入部804的動作或從外部的裝置對通信部806輸入的訊號等而開始或結束。 In the embodiment, for example, various actions in the pressure reduction drying device 1 may also be started or ended in response to a user's action on the input unit 804 or a signal input from an external device to the communication unit 806.

在所述一實施形態中,例如,在控制部80中,所實現的功能性結構的至少一部分也可包括專用的電子電路的硬件。 In one embodiment, for example, in the control unit 80, at least a portion of the implemented functional structure may also include hardware of a dedicated electronic circuit.

此外,當然能夠將分別構成所述一實施形態及各種變形例的全部或一部分適宜在不矛盾的範圍內進行組合。 In addition, of course, all or part of the embodiments and various variations that constitute the above-mentioned embodiment can be appropriately combined within the scope of non-contradiction.

S1、S2、S3、S4、S5、S6、S7、S8、S9、S10:步驟 S1, S2, S3, S4, S5, S6, S7, S8, S9, S10: Steps

Claims (6)

一種減壓乾燥裝置,是使形成於基板的上表面的塗膜乾燥的減壓乾燥裝置,包括:腔室,收容所述基板;支撐部,在所述腔室內從下方支撐所述基板;升降部,在所述腔室內使所述支撐部在下降位置與比所述下降位置高的上升位置之間沿上下方向升降;排氣部,進行從設置在所述腔室的底板部的排氣口排出所述腔室內的氣體環境的排氣;供氣部,進行從設置在所述腔室的底板部的供氣口向所述腔室內供給氣體的供氣;底面整流板,配置成位於由所述支撐部支撐的基板與所述腔室的底板部之間;多個側面整流板,在由配置於所述下降位置的所述支撐部支撐的基板與所述腔室的側壁部之間以從所述側壁部的內表面空開間隔地存在的方式位於所述側壁部的內側,且以包圍由配置於所述下降位置的所述支撐部支撐的基板的周圍的方式配置;以及控制部,在進行利用所述排氣部的排氣及利用所述供氣部的供氣中的至少其中一者時,在水平方向上在由所述支撐部支撐的基板與所述側壁部之間存在所述多個側面整流板的所述下降位置、與由所述支撐部支撐的基板位於比所述多個側面整流板上方的所述上升位置之間,對所述升降部進行控制,以使所述支撐部 反覆升降。 A decompression drying device is a decompression drying device for drying a coating formed on the upper surface of a substrate, comprising: a chamber for accommodating the substrate; a support portion for supporting the substrate from below in the chamber; a lifting portion for lifting the support portion in the chamber between a descending position and a rising position higher than the descending position in the vertical direction; an exhaust portion for exhausting the gas environment in the chamber from an exhaust port provided on the bottom plate of the chamber; an air supply portion for supplying gas into the chamber from an air supply port provided on the bottom plate of the chamber; a bottom rectifying plate arranged to be located between the substrate supported by the support portion and the bottom plate of the chamber; a plurality of side rectifying plates arranged on the descending portion; The substrate supported by the support portion at the lowered position is located inside the side wall portion in a manner that the substrate is spaced apart from the inner surface of the side wall portion, and is arranged in a manner that surrounds the substrate supported by the support portion arranged at the lowered position; and the control portion controls the lifting portion between the lowered position where the plurality of side straightening plates exist between the substrate supported by the support portion and the side wall portion, and the raised position where the substrate supported by the support portion is located above the plurality of side straightening plates in the horizontal direction, when performing at least one of exhausting air by the exhaust portion and supplying air by the air supply portion, so that the support portion is repeatedly raised and lowered. 如請求項1所述的減壓乾燥裝置,其中,所述控制部在分別進行利用所述排氣部的排氣及利用所述供氣部的供氣時,在所述下降位置與所述上升位置之間,對所述升降部進行控制,以使所述支撐部反覆升降。 The decompression drying device as described in claim 1, wherein the control unit controls the lifting unit between the descending position and the ascending position when exhausting air using the exhaust unit and supplying air using the air supply unit, so that the support unit repeatedly rises and falls. 一種減壓乾燥方法,是使用包括腔室、支撐部、升降部、排氣部、供氣部、底面整流板以及多個側面整流板的減壓乾燥裝置使形成於基板的上表面的塗膜乾燥的減壓乾燥方法,所述腔室收容所述基板,所述支撐部在所述腔室內從下方支撐所述基板,所述升降部在所述腔室內使所述支撐部在下降位置與比所述下降位置高的上升位置之間沿上下方向升降,所述排氣部從設置在所述腔室的底板部的排氣口排出所述腔室內的氣體環境,所述供氣部從設置在所述腔室的底板部的供氣口向所述腔室內供給氣體,所述底面整流板配置成位於由所述支撐部支撐的基板與所述腔室的底板部之間,所述多個側面整流板在由配置於所述下降位置的所述支撐部支撐的基板與所述腔室的側壁部之間以從所述側壁部的內表面空開間隔地存在的方式位於所述側壁部的內側,且以包圍由配置於所述下降位置的所述支撐部支撐的基板的周圍的方式配置,且所述減壓乾燥方法包括:排氣步驟,在所述腔室內由所述支撐部從下方支撐所述基板的狀態下,通過所述排氣部排出所述腔室內的氣體環境;供氣步驟,在所述排氣步驟之後,在所述腔室內由所述支撐 部從下方支撐所述基板的狀態下,通過所述供氣部向所述腔室內供給氣體;以及升降步驟,在執行所述排氣步驟及所述供氣步驟中的至少其中一個步驟時,在水平方向上在由所述支撐部支撐的基板與所述側壁部之間存在所述多個側面整流板的所述下降位置、與由所述支撐部支撐的基板位於比所述多個側面整流板上方的所述上升位置之間,通過所述升降部使所述支撐部反覆升降。 A decompression drying method is a decompression drying method for drying a coating formed on the upper surface of a substrate using a decompression drying device including a chamber, a support part, a lifting part, an exhaust part, an air supply part, a bottom face rectifying plate, and a plurality of side face rectifying plates, wherein the chamber accommodates the substrate, the support part supports the substrate from below in the chamber, and the lifting part lifts the support part in the chamber between a lowered position and an ascending position higher than the lowered position in a vertical direction. The exhaust part exhausts the gas environment in the chamber from the exhaust port provided on the bottom plate of the chamber, the gas supply part supplies gas into the chamber from the gas supply port provided on the bottom plate of the chamber, the bottom surface rectifying plate is arranged to be located between the substrate supported by the supporting part and the bottom plate of the chamber, and the plurality of side rectifying plates are arranged between the substrate supported by the supporting part arranged at the descending position and the side wall of the chamber to leave a space from the inner surface of the side wall. The side wall is located at an interval and is arranged to surround the substrate supported by the support portion arranged at the descending position, and the decompression drying method includes: an exhaust step, in which the gas environment in the chamber is exhausted through the exhaust portion while the substrate is supported from below by the support portion in the chamber; and a gas supply step, after the exhaust step, in which the substrate is supported from below by the support portion in the chamber. In the state, gas is supplied into the chamber through the gas supply part; and a lifting step, when performing at least one of the exhaust step and the gas supply step, the support part is repeatedly lifted and lowered by the lifting part between the lowered position where the plurality of side straightening plates exist between the substrate supported by the support part and the side wall part in the horizontal direction and the raised position where the substrate supported by the support part is located above the plurality of side straightening plates. 如請求項3所述的減壓乾燥方法,其中,所述升降步驟包括:第一升降步驟,在執行所述排氣步驟時通過所述升降部使所述支撐部在所述下降位置與所述上升位置之間反覆升降;以及第二升降步驟,在執行所述供氣步驟時通過所述升降部使所述支撐部在所述下降位置與所述上升位置之間反覆升降。 The reduced pressure drying method as described in claim 3, wherein the lifting step includes: a first lifting step, in which the support part is repeatedly lifted and lowered between the lowered position and the raised position by the lifting part when the exhaust step is performed; and a second lifting step, in which the support part is repeatedly lifted and lowered between the lowered position and the raised position by the lifting part when the air supply step is performed. 一種記憶媒體,其對程式進行記憶,在包括腔室、支撐部、升降部、排氣部、供氣部、底面整流板、多個側面整流板以及控制部的使形成於基板的上表面的塗膜乾燥的減壓乾燥裝置中,所述程式在由所述控制部所包含的處理器執行時,執行以下步驟,所述腔室收容所述基板,所述支撐部在所述腔室內從下方支撐所述基板,所述升降部在所述腔室內使所述支撐部在下降位置與比所述下降位置高的上升位置之間沿上下方向升降,所述排氣部從設置在所述腔室的底板部的排氣口排出所述腔室內的氣體環境,所述供氣部從設置在所述腔室的底板部的供氣口向所述腔 室內供給氣體,所述底面整流板配置成位於由所述支撐部支撐的基板與所述腔室的底板部之間,所述多個側面整流板在由配置於所述下降位置的所述支撐部支撐的基板與所述腔室的側壁部之間以從所述側壁部的內表面空開間隔地存在的方式位於所述側壁部的內側,且以包圍由配置於所述下降位置的所述支撐部支撐的基板的周圍的方式配置,所述控制部對所述排氣部、所述供氣部及所述升降部進行控制,即:排氣步驟,所述控制部在所述腔室內由所述支撐部從下方支撐所述基板的狀態下,通過所述排氣部排出所述腔室內的氣體環境;供氣步驟,所述控制部在所述排氣步驟之後,在所述腔室內由所述支撐部從下方支撐所述基板的狀態下,通過所述供氣部向所述腔室內供給氣體;以及升降步驟,所述控制部在執行所述排氣步驟及所述供氣步驟中的至少其中一個步驟時,在水平方向上在由所述支撐部支撐的基板與所述側壁部之間存在所述多個側面整流板的所述下降位置、與由所述支撐部支撐的基板位於比所述多個側面整流板上方的所述上升位置之間,通過所述升降部使所述支撐部反覆升降。 A storage medium stores a program, and in a pressure-reducing drying device for drying a coating formed on an upper surface of a substrate, the program includes a chamber, a support portion, a lifting portion, an exhaust portion, an air supply portion, a bottom rectifying plate, a plurality of side rectifying plates, and a control portion, the program, when executed by a processor included in the control portion, executes the following steps: the chamber accommodates the substrate, the support portion supports the substrate from below in the chamber, and the lifting portion moves the support portion in the chamber between a lowered position and a position lower than the lowered position. The exhaust part discharges the gas environment in the chamber from the exhaust port provided on the bottom plate of the chamber, and the gas supply part supplies gas into the chamber from the gas supply port provided on the bottom plate of the chamber. The bottom rectifying plate is arranged between the substrate supported by the supporting part and the bottom plate of the chamber, and the plurality of side rectifying plates are arranged between the substrate supported by the supporting part arranged at the descending position and the side wall of the chamber to supply gas from the inner surface of the side wall. The control unit is located at an inner side of the side wall portion in a spaced manner and is arranged in a manner of surrounding the substrate supported by the support portion arranged in the descending position. The control unit controls the exhaust unit, the air supply unit and the lifting unit, namely: in an exhaust step, the control unit exhausts the gas environment in the chamber through the exhaust unit when the substrate is supported from below by the support portion in the chamber; in an air supply step, the control unit supplies air to the support portion in the chamber after the exhaust step. In a state where the substrate is supported from below, gas is supplied into the chamber through the gas supply unit; and a lifting step, when the control unit performs at least one of the exhaust step and the gas supply step, the support unit is repeatedly lifted and lowered by the lifting unit between the lowered position where the plurality of side straightening plates exist between the substrate supported by the support unit and the side wall in the horizontal direction and the raised position where the substrate supported by the support unit is located above the plurality of side straightening plates. 如請求項5所述的記憶媒體,其中,所述升降步驟包括:第一升降步驟,所述控制部在執行所述排氣步驟時通過所述升降部使所述支撐部在所述下降位置與所述上升位置之間反覆升降;以及第二升降步驟,所述控制部在執行 所述供氣步驟時通過所述升降部使所述支撐部在所述下降位置與所述上升位置之間反覆升降。 The storage medium as described in claim 5, wherein the lifting step includes: a first lifting step, in which the control unit causes the support unit to repeatedly lift and lower between the lowered position and the raised position through the lifting unit when executing the exhaust step; and a second lifting step, in which the control unit causes the support unit to repeatedly lift and lower between the lowered position and the raised position through the lifting unit when executing the air supply step.
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