TWI856214B - Resin composition, method for producing cured product, cured product, coating, surface protective film, and electronic component - Google Patents
Resin composition, method for producing cured product, cured product, coating, surface protective film, and electronic component Download PDFInfo
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- TWI856214B TWI856214B TW109141865A TW109141865A TWI856214B TW I856214 B TWI856214 B TW I856214B TW 109141865 A TW109141865 A TW 109141865A TW 109141865 A TW109141865 A TW 109141865A TW I856214 B TWI856214 B TW I856214B
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- Prior art keywords
- group
- resin composition
- formula
- cured product
- divalent
- Prior art date
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- 239000011342 resin composition Substances 0.000 title claims abstract description 45
- 238000000576 coating method Methods 0.000 title claims description 20
- 239000011248 coating agent Substances 0.000 title claims description 19
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 230000001681 protective effect Effects 0.000 title claims description 11
- 150000001875 compounds Chemical class 0.000 claims abstract description 28
- 229920001721 polyimide Polymers 0.000 claims abstract description 11
- 239000004642 Polyimide Substances 0.000 claims abstract description 9
- 239000002243 precursor Substances 0.000 claims abstract description 9
- 125000004432 carbon atom Chemical group C* 0.000 claims description 25
- 239000000463 material Substances 0.000 claims description 22
- 125000001931 aliphatic group Chemical group 0.000 claims description 21
- 239000000758 substrate Substances 0.000 claims description 20
- 125000003118 aryl group Chemical group 0.000 claims description 18
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 13
- 239000011347 resin Substances 0.000 claims description 13
- 229920005989 resin Polymers 0.000 claims description 13
- 239000002904 solvent Substances 0.000 claims description 12
- 125000000962 organic group Chemical group 0.000 claims description 10
- 238000010438 heat treatment Methods 0.000 claims description 9
- 238000001035 drying Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 6
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 6
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 claims description 5
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 5
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 claims description 3
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 claims description 3
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 claims description 3
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 claims description 2
- 125000001033 ether group Chemical group 0.000 claims description 2
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 claims description 2
- 125000000101 thioether group Chemical group 0.000 claims description 2
- 239000004848 polyfunctional curative Substances 0.000 claims 1
- 239000003963 antioxidant agent Substances 0.000 abstract description 7
- 230000003078 antioxidant effect Effects 0.000 abstract description 7
- 239000010949 copper Substances 0.000 description 20
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 18
- 125000000217 alkyl group Chemical group 0.000 description 16
- 229910052802 copper Inorganic materials 0.000 description 16
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 15
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 15
- 239000000126 substance Substances 0.000 description 12
- 230000015572 biosynthetic process Effects 0.000 description 7
- 238000003786 synthesis reaction Methods 0.000 description 7
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 6
- 125000002029 aromatic hydrocarbon group Chemical group 0.000 description 6
- 238000002845 discoloration Methods 0.000 description 6
- 238000011156 evaluation Methods 0.000 description 6
- 230000003647 oxidation Effects 0.000 description 6
- 238000007254 oxidation reaction Methods 0.000 description 6
- -1 phenol compound Chemical class 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 150000003536 tetrazoles Chemical group 0.000 description 5
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 125000006615 aromatic heterocyclic group Chemical group 0.000 description 4
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical group [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 4
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 4
- 239000004615 ingredient Substances 0.000 description 4
- 239000003999 initiator Substances 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- 125000001424 substituent group Chemical group 0.000 description 4
- 150000003852 triazoles Chemical group 0.000 description 4
- KJUGUADJHNHALS-UHFFFAOYSA-N 1H-tetrazole Chemical compound C=1N=NNN=1 KJUGUADJHNHALS-UHFFFAOYSA-N 0.000 description 3
- 239000004793 Polystyrene Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 239000002253 acid Substances 0.000 description 3
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000003431 cross linking reagent Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 239000012299 nitrogen atmosphere Substances 0.000 description 3
- 125000004433 nitrogen atom Chemical group N* 0.000 description 3
- 229920002223 polystyrene Polymers 0.000 description 3
- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 description 2
- KKZSDWROKQKKPM-UHFFFAOYSA-N 1-n',12-n'-bis(2-hydroxybenzoyl)dodecanedihydrazide Chemical compound OC1=CC=CC=C1C(=O)NNC(=O)CCCCCCCCCCC(=O)NNC(=O)C1=CC=CC=C1O KKZSDWROKQKKPM-UHFFFAOYSA-N 0.000 description 2
- QWENRTYMTSOGBR-UHFFFAOYSA-N 1H-1,2,3-Triazole Chemical compound C=1C=NNN=1 QWENRTYMTSOGBR-UHFFFAOYSA-N 0.000 description 2
- XOUQAVYLRNOXDO-UHFFFAOYSA-N 2-tert-butyl-5-methylphenol Chemical compound CC1=CC=C(C(C)(C)C)C(O)=C1 XOUQAVYLRNOXDO-UHFFFAOYSA-N 0.000 description 2
- ULRPISSMEBPJLN-UHFFFAOYSA-N 2h-tetrazol-5-amine Chemical compound NC1=NN=NN1 ULRPISSMEBPJLN-UHFFFAOYSA-N 0.000 description 2
- MIIKMZAVLKMOFM-UHFFFAOYSA-N 3,5-dimethyl-1,2,4-triazol-4-amine Chemical compound CC1=NN=C(C)N1N MIIKMZAVLKMOFM-UHFFFAOYSA-N 0.000 description 2
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 2
- VQVIHDPBMFABCQ-UHFFFAOYSA-N 5-(1,3-dioxo-2-benzofuran-5-carbonyl)-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(C(C=2C=C3C(=O)OC(=O)C3=CC=2)=O)=C1 VQVIHDPBMFABCQ-UHFFFAOYSA-N 0.000 description 2
- FJRZOOICEHBAED-UHFFFAOYSA-N 5-methyl-1h-1,2,4-triazol-3-amine Chemical compound CC1=NNC(N)=N1 FJRZOOICEHBAED-UHFFFAOYSA-N 0.000 description 2
- XZGLNCKSNVGDNX-UHFFFAOYSA-N 5-methyl-2h-tetrazole Chemical compound CC=1N=NNN=1 XZGLNCKSNVGDNX-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- 206010034972 Photosensitivity reaction Diseases 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 125000003368 amide group Chemical group 0.000 description 2
- 239000012964 benzotriazole Substances 0.000 description 2
- QUKGYYKBILRGFE-UHFFFAOYSA-N benzyl acetate Chemical compound CC(=O)OCC1=CC=CC=C1 QUKGYYKBILRGFE-UHFFFAOYSA-N 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N butyl acetate Chemical compound CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- BGTOWKSIORTVQH-UHFFFAOYSA-N cyclopentanone Chemical compound O=C1CCCC1 BGTOWKSIORTVQH-UHFFFAOYSA-N 0.000 description 2
- 230000018044 dehydration Effects 0.000 description 2
- 238000006297 dehydration reaction Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 229940116333 ethyl lactate Drugs 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- AMXOYNBUYSYVKV-UHFFFAOYSA-M lithium bromide Chemical compound [Li+].[Br-] AMXOYNBUYSYVKV-UHFFFAOYSA-M 0.000 description 2
- 125000005641 methacryl group Chemical group 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 239000000178 monomer Substances 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- FDPIMTJIUBPUKL-UHFFFAOYSA-N pentan-3-one Chemical compound CCC(=O)CC FDPIMTJIUBPUKL-UHFFFAOYSA-N 0.000 description 2
- 230000036211 photosensitivity Effects 0.000 description 2
- 239000009719 polyimide resin Substances 0.000 description 2
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000007363 ring formation reaction Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- FMCUPJKTGNBGEC-UHFFFAOYSA-N 1,2,4-triazol-4-amine Chemical compound NN1C=NN=C1 FMCUPJKTGNBGEC-UHFFFAOYSA-N 0.000 description 1
- 125000001989 1,3-phenylene group Chemical group [H]C1=C([H])C([*:1])=C([H])C([*:2])=C1[H] 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- 125000001140 1,4-phenylene group Chemical group [H]C1=C([H])C([*:2])=C([H])C([H])=C1[*:1] 0.000 description 1
- OMAFFHIGWTVZOH-UHFFFAOYSA-N 1-methyltetrazole Chemical compound CN1C=NN=N1 OMAFFHIGWTVZOH-UHFFFAOYSA-N 0.000 description 1
- SJIXRGNQPBQWMK-UHFFFAOYSA-N 2-(diethylamino)ethyl 2-methylprop-2-enoate Chemical compound CCN(CC)CCOC(=O)C(C)=C SJIXRGNQPBQWMK-UHFFFAOYSA-N 0.000 description 1
- PTTPXKJBFFKCEK-UHFFFAOYSA-N 2-Methyl-4-heptanone Chemical compound CC(C)CC(=O)CC(C)C PTTPXKJBFFKCEK-UHFFFAOYSA-N 0.000 description 1
- GVSTYPOYHNVKHY-UHFFFAOYSA-N 2-methoxybutanoic acid Chemical compound CCC(OC)C(O)=O GVSTYPOYHNVKHY-UHFFFAOYSA-N 0.000 description 1
- IKEHOXWJQXIQAG-UHFFFAOYSA-N 2-tert-butyl-4-methylphenol Chemical compound CC1=CC=C(O)C(C(C)(C)C)=C1 IKEHOXWJQXIQAG-UHFFFAOYSA-N 0.000 description 1
- XSFHICWNEBCMNN-UHFFFAOYSA-N 2h-benzotriazol-5-amine Chemical compound NC1=CC=C2NN=NC2=C1 XSFHICWNEBCMNN-UHFFFAOYSA-N 0.000 description 1
- WVKWKEWFTVEVCF-UHFFFAOYSA-N 2h-benzotriazole-4-sulfonic acid Chemical compound OS(=O)(=O)C1=CC=CC2=NNN=C12 WVKWKEWFTVEVCF-UHFFFAOYSA-N 0.000 description 1
- QQHNFZBYCQMAOD-UHFFFAOYSA-N 3,5-dipropyl-1,2,4-triazol-4-amine Chemical compound CCCC1=NN=C(CCC)N1N QQHNFZBYCQMAOD-UHFFFAOYSA-N 0.000 description 1
- PCUPXNDEQDWEMM-UHFFFAOYSA-N 3-(diethylamino)propyl 2-methylprop-2-enoate Chemical compound CCN(CC)CCCOC(=O)C(C)=C PCUPXNDEQDWEMM-UHFFFAOYSA-N 0.000 description 1
- XUYDVDHTTIQNMB-UHFFFAOYSA-N 3-(diethylamino)propyl prop-2-enoate Chemical compound CCN(CC)CCCOC(=O)C=C XUYDVDHTTIQNMB-UHFFFAOYSA-N 0.000 description 1
- WWJCRUKUIQRCGP-UHFFFAOYSA-N 3-(dimethylamino)propyl 2-methylprop-2-enoate Chemical compound CN(C)CCCOC(=O)C(C)=C WWJCRUKUIQRCGP-UHFFFAOYSA-N 0.000 description 1
- GPXCORHXFPYJEH-UHFFFAOYSA-N 3-[[3-aminopropyl(dimethyl)silyl]oxy-dimethylsilyl]propan-1-amine Chemical compound NCCC[Si](C)(C)O[Si](C)(C)CCCN GPXCORHXFPYJEH-UHFFFAOYSA-N 0.000 description 1
- KBKNKJFPVHUXCW-UHFFFAOYSA-N 4-amino-3-methyl-1h-1,2,4-triazole-5-thione Chemical compound CC1=NNC(=S)N1N KBKNKJFPVHUXCW-UHFFFAOYSA-N 0.000 description 1
- NSPMIYGKQJPBQR-UHFFFAOYSA-N 4H-1,2,4-triazole Chemical compound C=1N=CNN=1 NSPMIYGKQJPBQR-UHFFFAOYSA-N 0.000 description 1
- MVPKIPGHRNIOPT-UHFFFAOYSA-N 5,6-dimethyl-2h-benzotriazole Chemical compound C1=C(C)C(C)=CC2=NNN=C21 MVPKIPGHRNIOPT-UHFFFAOYSA-N 0.000 description 1
- GONFBOIJNUKKST-UHFFFAOYSA-N 5-ethylsulfanyl-2h-tetrazole Chemical compound CCSC=1N=NNN=1 GONFBOIJNUKKST-UHFFFAOYSA-N 0.000 description 1
- LRUDIIUSNGCQKF-UHFFFAOYSA-N 5-methyl-1H-benzotriazole Chemical compound C1=C(C)C=CC2=NNN=C21 LRUDIIUSNGCQKF-UHFFFAOYSA-N 0.000 description 1
- ZBXNFTFKKOSPLD-UHFFFAOYSA-N 5-methylsulfanyl-2h-tetrazole Chemical compound CSC1=NN=NN1 ZBXNFTFKKOSPLD-UHFFFAOYSA-N 0.000 description 1
- ZGZLYKUHYXFIIO-UHFFFAOYSA-N 5-nitro-2h-tetrazole Chemical compound [O-][N+](=O)C=1N=NNN=1 ZGZLYKUHYXFIIO-UHFFFAOYSA-N 0.000 description 1
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 1
- MDLFQCVYROBFIW-UHFFFAOYSA-N 5-propan-2-yl-1h-1,2,4-triazol-3-amine Chemical compound CC(C)C1=NC(N)=NN1 MDLFQCVYROBFIW-UHFFFAOYSA-N 0.000 description 1
- NLZUEZXRPGMBCV-UHFFFAOYSA-N Butylhydroxytoluene Chemical compound CC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 NLZUEZXRPGMBCV-UHFFFAOYSA-N 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 235000010724 Wisteria floribunda Nutrition 0.000 description 1
- AWJDQCINSGRBDJ-UHFFFAOYSA-N [Li].[Ta] Chemical compound [Li].[Ta] AWJDQCINSGRBDJ-UHFFFAOYSA-N 0.000 description 1
- 230000002730 additional effect Effects 0.000 description 1
- 239000002318 adhesion promoter Substances 0.000 description 1
- 238000004378 air conditioning Methods 0.000 description 1
- 125000002947 alkylene group Chemical group 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 229940007550 benzyl acetate Drugs 0.000 description 1
- 125000002619 bicyclic group Chemical group 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 235000010354 butylated hydroxytoluene Nutrition 0.000 description 1
- 238000011088 calibration curve Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 125000004956 cyclohexylene group Chemical group 0.000 description 1
- 125000004978 cyclooctylene group Chemical group 0.000 description 1
- 125000004979 cyclopentylene group Chemical group 0.000 description 1
- 125000003493 decenyl group Chemical group [H]C([*])=C([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- LTVOKYUPTHZZQH-UHFFFAOYSA-N difluoromethane Chemical group F[C]F LTVOKYUPTHZZQH-UHFFFAOYSA-N 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 125000005066 dodecenyl group Chemical group C(=CCCCCCCCCCC)* 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 239000003480 eluent Substances 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 125000004185 ester group Chemical group 0.000 description 1
- UHKJHMOIRYZSTH-UHFFFAOYSA-N ethyl 2-ethoxypropanoate Chemical compound CCOC(C)C(=O)OCC UHKJHMOIRYZSTH-UHFFFAOYSA-N 0.000 description 1
- 125000000816 ethylene group Chemical group [H]C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- 238000005227 gel permeation chromatography Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- PKWIYNIDEDLDCJ-UHFFFAOYSA-N guanazole Chemical compound NC1=NNC(N)=N1 PKWIYNIDEDLDCJ-UHFFFAOYSA-N 0.000 description 1
- CATSNJVOTSVZJV-UHFFFAOYSA-N heptan-2-one Chemical compound CCCCCC(C)=O CATSNJVOTSVZJV-UHFFFAOYSA-N 0.000 description 1
- 125000005842 heteroatom Chemical group 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 125000000468 ketone group Chemical group 0.000 description 1
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
- 229940018564 m-phenylenediamine Drugs 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 125000001570 methylene group Chemical group [H]C([H])([*:1])[*:2] 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- 125000004957 naphthylene group Chemical group 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 125000002080 perylenyl group Chemical group C1(=CC=C2C=CC=C3C4=CC=CC5=CC=CC(C1=C23)=C45)* 0.000 description 1
- CSHWQDPOILHKBI-UHFFFAOYSA-N peryrene Natural products C1=CC(C2=CC=CC=3C2=C2C=CC=3)=C3C2=CC=CC3=C1 CSHWQDPOILHKBI-UHFFFAOYSA-N 0.000 description 1
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 description 1
- 239000003504 photosensitizing agent Substances 0.000 description 1
- 229920002577 polybenzoxazole Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000007870 radical polymerization initiator Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 125000004434 sulfur atom Chemical group 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/04—Oxygen-containing compounds
- C08K5/13—Phenols; Phenolates
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/16—Nitrogen-containing compounds
- C08K5/20—Carboxylic acid amides
-
- C—CHEMISTRY; METALLURGY
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Abstract
一種樹脂組成物,含有:(A)具有下述式(1)所表示的結構單元的聚醯亞胺前驅物;以及(C)選自由抗氧化劑和具有下述式(21)所表示的結構的化合物所組成的群組中的一種以上。 A resin composition comprises: (A) a polyimide precursor having a structural unit represented by the following formula (1); and (C) one or more selected from the group consisting of an antioxidant and a compound having a structure represented by the following formula (21).
Description
本發明是有關於一種樹脂組成物、硬化物的製造方法、硬化物、覆蓋塗層、表面保護膜和電子零件。The present invention relates to a resin composition, a method for producing a cured product, a cured product, a covering coating, a surface protective film and an electronic component.
聚醯亞胺樹脂由於其耐熱性而主要用作半導體元件的絕緣體,且現在已成為電腦、智慧型手機、汽車、電視等的電子設備中不可缺少的化學材料。 近年來,期待聚醯亞胺樹脂應用於電源模組(power module)。 電源模組被應用於民用設備用途的直流-直流(direct current-direct current,DC-DC)轉換器、車載用途或空調用途等的逆變器、電車或新幹線等交通工具及其輸配電等多種產品,其應用範圍與市場規模在增加。Polyimide resins are mainly used as insulators for semiconductor components due to their heat resistance, and have now become an indispensable chemical material in electronic devices such as computers, smartphones, cars, and TVs. In recent years, polyimide resins are expected to be used in power modules. Power modules are used in a variety of products such as direct current-direct current (DC-DC) converters for civil equipment, inverters for automotive or air conditioning purposes, and transportation vehicles such as trains and Shinkansen and their power transmission and distribution. The scope of application and market size are increasing.
於專利文獻1中記載了一種包含聚醯亞胺前驅物或聚苯並噁唑前驅物、感光劑和酚化合物的樹脂組成物。 [現有技術文獻] [專利文獻]Patent document 1 describes a resin composition comprising a polyimide precursor or a polybenzoxazole precursor, a photosensitizer, and a phenol compound. [Prior art document] [Patent document]
專利文獻1:日本專利特開2009-230098號公報Patent document 1: Japanese Patent Publication No. 2009-230098
本發明的目的在於提供一種能夠形成抑制了硬化後及加壓蒸煮器(pressure cooker)試驗後外觀的變色的硬化物的樹脂組成物、硬化物的製造方法、硬化物、覆蓋塗層、表面保護膜和電子零件。An object of the present invention is to provide a resin composition capable of forming a cured product whose appearance discoloration after curing and after a pressure cooker test is suppressed, a method for producing the cured product, the cured product, a covering coating, a surface protective film, and an electronic component.
於電源模組中,為了達成小型化、低熱阻和高可靠性,正在研究利用銅接腳(pin)來連接半導體晶片與直接銅接合(Direct Copper Bonding,DBC)基板並利用環氧樹脂等進行密封的結構。 於該結構中,利用DCB基板上所形成的銅配線、包含硬化物的半導體晶片和銅接腳形成了配線路徑。因此,本發明者等人發現,於其周邊材料中,於暴露於電源模組的高電壓、高溫條件時,會發生銅上的硬化物的變色和銅的變色中的至少一者。 本發明者等人進行了努力研究,結果發明出了一種藉由特定的成分的組合來抑制銅上的硬化物或銅的變色的樹脂組成物。In order to achieve miniaturization, low thermal resistance and high reliability in power modules, a structure is being studied in which a semiconductor chip is connected to a direct copper bonding (DBC) substrate using copper pins and sealed using epoxy resin or the like. In this structure, a wiring path is formed using copper wiring formed on a DCB substrate, a semiconductor chip including a hardened material, and copper pins. Therefore, the inventors and others have found that in the peripheral materials thereof, when exposed to the high voltage and high temperature conditions of the power module, at least one of discoloration of the hardened material on the copper and discoloration of the copper will occur. The inventors and others have conducted diligent research and have invented a resin composition that suppresses discoloration of the hardened material on the copper or the copper by a combination of specific components.
根據本發明,提供以下的樹脂組成物等。 1.一種樹脂組成物,含有: (A)具有下述式(1)所表示的結構單元的聚醯亞胺前驅物;以及 (C)選自由抗氧化劑和具有下述式(21)所表示的結構的化合物所組成的群組中的一種以上。 [化1] (式(1)中,X1 為具有一個以上的芳香族基的四價基,-COOR1 基與-CONH-基相互處於鄰位,-COOR2 基與-CO-基相互處於鄰位。Y1 為二價有機基。R1 和R2 分別獨立地為氫原子或碳數1~4的脂肪族烴基。) [化2] 2.如1所述的樹脂組成物,其中,R1 和R2 為氫原子。 3.如1或2所述的樹脂組成物,其中,所述抗氧化劑為具有下述式(11)所表示的結構的化合物。 [化3] (式(11)中,R11 為氫原子、碳數1~10的脂肪族烴基或碳數6~30的芳香族烴基。) 4.如1至3中任一項所述的樹脂組成物,其中,所述抗氧化劑為下述式(12)所表示的化合物。 [化4] (式(12)中,R11 為氫原子、碳數1~10的脂肪族烴基或碳數6~30的芳香族烴基。R12 為碳數1~10的脂肪族烴基或碳數6~30的芳香族烴基。於存在兩個以上的R12 的情況下,兩個以上的R12 可相同,亦可不同。n為0~3的整數。) 5.如3或4所述的樹脂組成物,其中,R11 為氫原子。 6.如3所述的樹脂組成物,其中,所述具有式(11)所表示的結構的化合物是具有兩個以上的式(11)所表示的結構的化合物。 7.如1至6中任一項所述的樹脂組成物,更包含溶劑。 8.一種硬化物的製造方法,包括:將如1至7中任一項所述的樹脂組成物塗佈於基板上並進行乾燥而形成樹脂膜的步驟;以及 對所述樹脂膜進行加熱處理的步驟。 9.一種硬化物,將如1至7中任一項所述的樹脂組成物硬化而成。 10.一種覆蓋塗層或表面保護膜,使用如9所述的硬化物製作而成。 11.一種電子零件,包括如10所述的覆蓋塗層或表面保護膜。 12.如11所述的電子零件,其為電源模組。According to the present invention, the following resin compositions and the like are provided. 1. A resin composition comprising: (A) a polyimide precursor having a structural unit represented by the following formula (1); and (C) one or more selected from the group consisting of an antioxidant and a compound having a structure represented by the following formula (21). [Chemical 1] (In formula (1), X1 is a tetravalent group having one or more aromatic groups, -COOR1 and -CONH- are adjacent to each other, and -COOR2 and -CO- are adjacent to each other. Y1 is a divalent organic group. R1 and R2 are independently a hydrogen atom or an aliphatic hydrocarbon group having 1 to 4 carbon atoms.) [Chemistry 2] 2. The resin composition according to 1, wherein R1 and R2 are hydrogen atoms. 3. The resin composition according to 1 or 2, wherein the antioxidant is a compound having a structure represented by the following formula (11). (In formula (11), R 11 is a hydrogen atom, an aliphatic hydrocarbon group having 1 to 10 carbon atoms, or an aromatic hydrocarbon group having 6 to 30 carbon atoms.) 4. The resin composition according to any one of 1 to 3, wherein the antioxidant is a compound represented by the following formula (12). [Chemical 4] (In formula (12), R 11 is a hydrogen atom, an aliphatic alkyl group having 1 to 10 carbon atoms, or an aromatic alkyl group having 6 to 30 carbon atoms. R 12 is an aliphatic alkyl group having 1 to 10 carbon atoms, or an aromatic alkyl group having 6 to 30 carbon atoms. When there are two or more R 12s , the two or more R 12s may be the same or different. n is an integer from 0 to 3.) 5. The resin composition as described in 3 or 4, wherein R 11 is a hydrogen atom. 6. The resin composition as described in 3, wherein the compound having a structure represented by formula (11) is a compound having two or more structures represented by formula (11). 7. The resin composition as described in any one of 1 to 6, further comprising a solvent. 8. A method for producing a cured product, comprising: a step of applying the resin composition described in any one of 1 to 7 on a substrate and drying it to form a resin film; and a step of heat-treating the resin film. 9. A cured product, obtained by curing the resin composition described in any one of 1 to 7. 10. A covering coating or a surface protective film, obtained by using the cured product described in 9. 11. An electronic component, comprising the covering coating or the surface protective film described in 10. 12. The electronic component described in 11, which is a power module.
根據本發明,可提供一種能夠形成抑制了硬化後及加壓蒸煮器試驗後外觀的變色的硬化物的樹脂組成物、硬化物的製造方法、硬化物、覆蓋塗層、表面保護膜和電子零件。According to the present invention, there can be provided a resin composition capable of forming a cured product having suppressed discoloration of appearance after curing and after an autoclave test, a method for producing the cured product, the cured product, a covering coating, a surface protective film, and an electronic component.
以下,對本發明的樹脂組成物、硬化物的製造方法、硬化物、覆蓋塗層、表面保護膜和電子零件的實施形態進行詳細說明。再者,本發明並不受以下的實施形態限定。The resin composition, the method for producing the cured product, the cured product, the coating, the surface protection film, and the electronic component of the present invention are described in detail below. The present invention is not limited to the following embodiments.
於本說明書中,所謂「A或B」,只要包含A與B的任一者即可,亦可包含兩者。另外,於本說明書中,「步驟」這一用語不僅包含獨立的步驟,即便於無法與其他步驟明確區別的情況下,只要達成該步驟的所期望的作用,則亦包含於本用語中。 使用「~」所表示的數值範圍是表示包含「~」的前後所記載的數值分別作為最小值和最大值的範圍。另外,於本說明書中,關於組成物中的各成分的含量,於在組成物中存在多種相當於各成分的物質的情況下,只要無特別說明,則是指存在於組成物中的該多種物質的合計量。進而,關於例示材料,只要無特別說明,則可單獨使用,亦可組合使用兩種以上。In this specification, "A or B" may include either A or B, or both. In addition, in this specification, the term "step" includes not only independent steps, but also steps that achieve the desired effect of the step even if they cannot be clearly distinguished from other steps. The numerical range represented by "~" indicates a range that includes the numerical values recorded before and after "~" as the minimum and maximum values, respectively. In addition, in this specification, when there are multiple substances equivalent to each component in the composition, unless otherwise specified, the content of each component in the composition refers to the total amount of the multiple substances in the composition. Furthermore, unless otherwise specified, the exemplified materials may be used alone or in combination of two or more.
本發明的樹脂組成物含有: (A)具有下述式(1)所表示的結構單元的聚醯亞胺前驅物(以下,亦稱為「(A)成分」。);以及 (C)選自由抗氧化劑和具有下述式(21)所表示的結構的化合物所組成的群組中的一種以上(以下,亦稱為「(C)成分」。)。 [化5] (式(1)中,X1 為具有一個以上的芳香族基的四價基,-COOR1 基與-CONH-基相互處於鄰位,-COOR2 基與-CO-基相互處於鄰位。Y1 為二價有機基。R1 和R2 分別獨立地為氫原子或碳數1~4的脂肪族烴基。) [化6] The resin composition of the present invention comprises: (A) a polyimide precursor having a structural unit represented by the following formula (1) (hereinafter, also referred to as "component (A)"); and (C) one or more selected from the group consisting of an antioxidant and a compound having a structure represented by the following formula (21) (hereinafter, also referred to as "component (C)"). [Chemistry 5] (In formula (1), X1 is a tetravalent group having one or more aromatic groups, -COOR1 and -CONH- are adjacent to each other, and -COOR2 and -CO- are adjacent to each other. Y1 is a divalent organic group. R1 and R2 are independently a hydrogen atom or an aliphatic hydrocarbon group having 1 to 4 carbon atoms.) [Chemistry 6]
藉此,能夠形成抑制了硬化後及加壓蒸煮器試驗後外觀的變色的硬化物。 作為任意的效果,能夠形成黏接性(例如與Cu的黏接性)優異的硬化物。This makes it possible to form a cured product that suppresses discoloration of the appearance after curing and after the autoclave test. As an additional effect, a cured product with excellent adhesion (for example, adhesion to Cu) can be formed.
於式(1)的X1 的具有一個以上(較佳為一個~三個,更佳為一個或兩個)的芳香族基的四價基中,芳香族基可為芳香族烴基,亦可為芳香族雜環式基。較佳為芳香族烴基。In the tetravalent group having one or more (preferably one to three, more preferably one or two) aromatic groups represented by X1 in formula (1), the aromatic group may be an aromatic alkyl group or an aromatic heterocyclic group. An aromatic alkyl group is preferred.
作為式(1)的X1 的芳香族烴基,可列舉:由苯環形成的二價~四價(二價、三價或四價)的基、由萘形成的二價~四價的基、由苝形成的二價~四價的基等。Examples of the aromatic hydrocarbon group represented by X 1 in the formula (1) include a divalent to tetravalent (divalent, trivalent or tetravalent) group formed from a benzene ring, a divalent to tetravalent group formed from naphthalene, and a divalent to tetravalent group formed from perylene.
作為式(1)的X1 的具有一個以上的芳香族基的四價基,例如可列舉以下的式(6)的四價基,但並不限定於該些。 [化7] (式(6)中,X和Y分別獨立地表示不與各自所鍵結的苯環共軛的二價基或單鍵。Z為羰基(-C(=O)-)、醚基(-O-)或硫醚基(-S-)(較佳為-C(=O)-)。)Examples of the tetravalent group having one or more aromatic groups as X1 in formula (1) include, but are not limited to, the tetravalent groups of formula (6) below. (In formula (6), X and Y each independently represent a divalent group or a single bond that is not conjugated to the benzene ring to which they are bonded. Z is a carbonyl group (-C(=O)-), an ether group (-O-) or a sulfide group (-S-) (preferably -C(=O)-).)
於式(6)中,X和Y的不與各自所鍵結的苯環共軛的二價基較佳為-O-、-S-、亞甲基、雙(三氟甲基)亞甲基、或二氟亞甲基,更佳為-O-。In formula (6), the divalent group of X and Y that is not conjugated to the benzene ring to which each is bonded is preferably -O-, -S-, methylene, bis(trifluoromethyl)methylene, or difluoromethylene, and more preferably -O-.
作為式(1)的Y1 的二價有機基,可列舉具有二矽氧烷結構的二價基、二價脂肪族烴基和二價芳香族基等。Examples of the divalent organic group represented by Y1 in formula (1) include a divalent group having a disiloxane structure, a divalent aliphatic hydrocarbon group, and a divalent aromatic group.
較佳為具有二矽氧烷結構的二價基更包含(較佳為兩個以上的、更佳為兩個)二價脂肪族烴基。 具有二矽氧烷結構的二價基可具有取代基。作為具有二矽氧烷結構的二價基的取代基,可列舉甲基、乙基等。Preferably, the divalent group having a disiloxane structure further includes (preferably two or more, more preferably two) divalent aliphatic hydrocarbon groups. The divalent group having a disiloxane structure may have a substituent. Examples of the substituent of the divalent group having a disiloxane structure include a methyl group, an ethyl group, and the like.
式(1)的Y1 的二價芳香族基可為二價芳香族烴基,亦可為二價芳香族雜環式基。較佳為二價芳香族烴基。The divalent aromatic group represented by Y1 in formula (1) may be a divalent aromatic alkyl group or a divalent aromatic heterocyclic group. Preferably, it is a divalent aromatic alkyl group.
另外,式(1)的Y1 的二價有機基亦可為兩個二價芳香族烴基利用 單鍵; 氧原子、硫原子、氮原子和矽原子等雜原子; 二價脂肪族烴基;或 酮基、酯基和醯胺基等有機基鍵結而成的二價基。In addition, the divalent organic group of Y1 in formula (1) may be a divalent group formed by two divalent aromatic hydrocarbon groups bonded by a single bond; a heteroatom such as an oxygen atom, a sulfur atom, a nitrogen atom, and a silicon atom; a divalent aliphatic hydrocarbon group; or an organic group such as a ketone group, an ester group, and an amide group.
關於式(1)的Y1 的二價有機基,二價脂肪族烴基和二價芳香族烴基可具有取代基。作為二價脂肪族烴基和二價芳香族烴基的取代基,可列舉:甲基、乙基、醯胺基(例如,-C(=O)-NH2 )等。Regarding the divalent organic group represented by Y1 in formula (1), the divalent aliphatic alkyl group and the divalent aromatic alkyl group may have a substituent. Examples of the substituents of the divalent aliphatic alkyl group and the divalent aromatic alkyl group include a methyl group, an ethyl group, and an amide group (e.g., -C(=O) -NH2 ).
關於式(1)的Y1 的二價有機基,二價脂肪族烴基(較佳為碳數1~30,更佳為1~5或5~18)例如可列舉:伸烷基(例如,亞甲基、伸乙基、伸丙基、癸烯基、十二烯基)、伸環戊基、伸環己基、伸環辛基和二價雙環環等。Regarding the divalent organic group represented by Y1 in formula (1), the divalent aliphatic hydrocarbon group (preferably having 1 to 30 carbon atoms, more preferably 1 to 5 or 5 to 18 carbon atoms) includes, for example, an alkylene group (e.g., a methylene group, an ethylene group, a propylene group, a decenyl group, a dodecenyl group), a cyclopentylene group, a cyclohexylene group, a cyclooctylene group, and a divalent bicyclic ring.
另外,關於式(1)的Y1 的二價有機基,作為所述二價芳香族烴基(較佳為碳數6~30),例如可列舉伸苯基(例如,間伸苯基、對伸苯基)、伸萘基等。In addition, as for the divalent organic group represented by Y 1 in formula (1), examples of the divalent aromatic hydrocarbon group (preferably having 6 to 30 carbon atoms) include phenylene groups (e.g., m-phenylene and p-phenylene groups) and naphthylene groups.
式(1)的R1 和R2 較佳為氫原子。 R1 and R2 in formula (1) are preferably hydrogen atoms.
作為式(1)的R1 和R2 的碳數1~4(較佳為1或2)的脂肪族烴基,可列舉:甲基、乙基、正丙基、2-丙基、正丁基等。Examples of the aliphatic hydrocarbon group having 1 to 4 carbon atoms (preferably 1 or 2 carbon atoms) for R1 and R2 in formula (1) include methyl, ethyl, n-propyl, 2-propyl, n-butyl and the like.
關於(A)成分的分子量,以聚苯乙烯換算的重量平均分子量較佳為10,000~200,000,更佳為15,000~150,000,進而較佳為17,000~120,000。 於所述範圍的情況下,可使樹脂組成物的黏度適當。 重量平均分子量藉由利用凝膠滲透層析法進行測定,並使用標準聚苯乙烯校準曲線進行換算來求出。 另外,重量平均分子量除以數量平均分子量而得的分散度較佳為1.0~4.0,更佳為1.0~3.5。Regarding the molecular weight of component (A), the weight average molecular weight converted to polystyrene is preferably 10,000 to 200,000, more preferably 15,000 to 150,000, and further preferably 17,000 to 120,000. In the case of the above range, the viscosity of the resin composition can be made appropriate. The weight average molecular weight is determined by measuring by gel permeation chromatography and converting using a standard polystyrene calibration curve. In addition, the dispersion obtained by dividing the weight average molecular weight by the number average molecular weight is preferably 1.0 to 4.0, and more preferably 1.0 to 3.5.
本發明的樹脂組成物含有(C)成分。藉此,可抑制銅的氧化。The resin composition of the present invention contains the component (C), thereby suppressing the oxidation of copper.
就抑制銅的氧化的觀點而言,抗氧化劑較佳為具有下述式(11)所表示的結構的化合物。 [化8] (式(11)中,R11 為氫原子、碳數1~10的脂肪族烴基或碳數6~30的芳香族烴基。)From the viewpoint of inhibiting the oxidation of copper, the antioxidant is preferably a compound having a structure represented by the following formula (11). (In formula (11), R 11 is a hydrogen atom, an aliphatic hydrocarbon group having 1 to 10 carbon atoms, or an aromatic hydrocarbon group having 6 to 30 carbon atoms.)
就對銅的黏接性的觀點而言,抗氧化劑較佳為下述式(12)所表示的化合物。 [化9] (式(12)中,R11 為氫原子、碳數1~10的脂肪族烴基或碳數6~30的芳香族烴基。R12 為碳數1~10的脂肪族烴基或碳數6~30的芳香族烴基。於存在兩個以上的R12 的情況下,兩個以上的R12 可相同,亦可不同。n為0~3(較佳為1或2)的整數。)From the viewpoint of adhesion to copper, the antioxidant is preferably a compound represented by the following formula (12). (In formula (12), R 11 is a hydrogen atom, an aliphatic alkyl group having 1 to 10 carbon atoms, or an aromatic alkyl group having 6 to 30 carbon atoms. R 12 is an aliphatic alkyl group having 1 to 10 carbon atoms, or an aromatic alkyl group having 6 to 30 carbon atoms. When there are two or more R 12 , the two or more R 12 may be the same or different. n is an integer of 0 to 3 (preferably 1 or 2).)
就提高對銅的黏接性的觀點而言,R11 較佳為氫原子。From the viewpoint of improving adhesion to copper, R 11 is preferably a hydrogen atom.
關於式(11)和式(12)的R11 ,另外,關於式(12)的R12 ,作為碳數1~10(較佳為1或2,另外較佳為3或4)的脂肪族烴基,可列舉:甲基、乙基、正丙基、2-丙基、正丁基、第三丁基等。Regarding R 11 in formula (11) and formula (12), and regarding R 12 in formula (12), examples of the aliphatic hydrocarbon group having 1 to 10 carbon atoms (preferably 1 or 2, and more preferably 3 or 4) include methyl, ethyl, n-propyl, 2-propyl, n-butyl, and tert-butyl.
關於式(11)和式(12)的R11 ,另外,關於式(12)的R12 ,作為碳數6~30(較佳為6~10)的芳香族烴基,可列舉苯基、萘基等。Regarding R 11 in the formula (11) and the formula (12), and regarding R 12 in the formula (12), examples of the aromatic hydrocarbon group having 6 to 30 (preferably 6 to 10) carbon atoms include phenyl and naphthyl.
就抑制銅的氧化的觀點而言,具有式(11)所表示的結構的化合物較佳為具有兩個以上(較佳為兩個~四個,更佳為兩個)的式(11)所表示的結構的化合物。From the viewpoint of suppressing copper oxidation, the compound having a structure represented by formula (11) is preferably a compound having two or more (preferably two to four, more preferably two) structures represented by formula (11).
具有式(21)所表示的結構的化合物較佳為具有兩個以上(較佳為兩個~四個,更佳為兩個)的式(21)所表示的結構的化合物。 具有式(21)所表示的結構的化合物較佳為更具有下述式(22)所表示的結構。 [化10] (式(22)中,R21 為二價脂肪族烴基。)The compound having the structure represented by formula (21) is preferably a compound having two or more (preferably two to four, more preferably two) structures represented by formula (21). The compound having the structure represented by formula (21) is preferably a compound having the structure represented by the following formula (22). [Chemical 10] (In formula (22), R21 is a divalent aliphatic hydrocarbon group.)
作為式(22)的R21 的二價脂肪族烴基,可列舉與式(1)的Y1 的二價有機基的二價脂肪族烴基相同的基。Examples of the divalent aliphatic hydrocarbon group for R 21 in the formula (22) include the same groups as the divalent aliphatic hydrocarbon group for the divalent organic group for Y 1 in the formula (1).
作為具有式(21)所表示的結構的化合物,可列舉十二烷二酸雙[N2-(2-羥基苯甲醯基)醯肼]等。Examples of the compound having the structure represented by formula (21) include dodecanedioic acid bis[N2-(2-hydroxybenzoyl)hydrazide] and the like.
(C)成分可單獨使用一種,亦可組合兩種以上。The component (C) may be used alone or in combination of two or more.
(C)成分的含量相對於(A)成分100質量份而較佳為0.01質量份~20質量份,更佳為0.1質量份~15質量份,進而較佳為0.3質量份~11質量份。The content of the component (C) is preferably 0.01 to 20 parts by mass, more preferably 0.1 to 15 parts by mass, and further preferably 0.3 to 11 parts by mass, based on 100 parts by mass of the component (A).
本發明的樹脂組成物亦可含有(B)選自由包含三唑結構的化合物和包含四唑結構的化合物所組成的群組中的一種以上(以下,亦稱為「(B)成分」。)。藉此,可進一步抑制銅的氧化。The resin composition of the present invention may also contain (B) one or more selected from the group consisting of compounds containing a triazole structure and compounds containing a tetrazole structure (hereinafter also referred to as "component (B)"). This can further suppress the oxidation of copper.
就於低溫下與銅的表面反應而抑制氧化的觀點而言,(B)成分較佳為含有包含四唑結構(含有一個碳原子和四個氮原子的5員環的芳香族雜環結構)的化合物。 作為包含四唑結構的化合物,可列舉:5-胺基-1H-四唑、5-甲基-1H-四唑、1H-四唑、5-(甲硫基)-1H-四唑、5-(乙硫基)-1H-四唑、5-苯基-1H-四唑、5-硝基-1H-四唑、1-甲基-1H-四唑、5,5'-雙-1H-四唑等。 就保存穩定性的(例如,於室溫下抑制(A)成分的反應)觀點而言,包含四唑結構的化合物較佳為選自由5-胺基-1H-四唑和5-甲基-1H-四唑所組成的群組中的一種以上。From the viewpoint of suppressing oxidation by reacting with the copper surface at low temperature, the component (B) is preferably a compound containing a tetrazole structure (a 5-membered aromatic heterocyclic structure containing one carbon atom and four nitrogen atoms). As compounds containing a tetrazole structure, there can be listed: 5-amino-1H-tetrazole, 5-methyl-1H-tetrazole, 1H-tetrazole, 5-(methylthio)-1H-tetrazole, 5-(ethylthio)-1H-tetrazole, 5-phenyl-1H-tetrazole, 5-nitro-1H-tetrazole, 1-methyl-1H-tetrazole, 5,5'-bis-1H-tetrazole, etc. From the viewpoint of storage stability (for example, inhibition of the reaction of component (A) at room temperature), the compound containing a tetrazole structure is preferably one or more selected from the group consisting of 5-amino-1H-tetrazole and 5-methyl-1H-tetrazole.
(B)成分較佳為含有包含三唑結構(含有兩個碳原子和三個氮原子的5員環的芳香族雜環結構)的化合物和包含四唑結構的化合物。The component (B) preferably contains a compound containing a triazole structure (a 5-membered aromatic heterocyclic structure containing two carbon atoms and three nitrogen atoms) and a compound containing a tetrazole structure.
作為包含三唑結構的化合物,可列舉:苯並三唑(例如,1,2,3-苯並三唑)、1,2,4-三唑、1,2,3-三唑、1,2,5-三唑、3-巰基-4-甲基-4H-1,2,4-三唑、3-巰基-1,2,4-三唑、4-胺基-3,5-二甲基-4H-1,2,4-三唑、4-胺基-3,5-二丙基-4H-1,2,4-三唑、3-胺基-5-異丙基-1,2,4-三唑、4-胺基-3-巰基-5-甲基-4H-1,2,4-三唑、3-胺基-5-巰基-1,2,4-三唑、3-胺基-5-甲基-4H-1,2,4-三唑、4-胺基-1,2,4-三唑、4-胺基-3,5-二甲基-1,2,4-三唑、4-胺基-5-甲基-4H-1,2,4-三唑-3-硫醇、3,5-二胺基-1H-1,2,4-三唑、5-甲基-1H-苯並三唑、5,6-二甲基苯並三唑、5-胺基-1H-苯並三唑、苯並三唑-4-磺酸等。 就於高溫下加熱時不易發生分解和揮發的觀點而言,包含三唑結構的化合物較佳為苯並三唑。Examples of the compound containing a triazole structure include benzotriazole (e.g., 1,2,3-benzotriazole), 1,2,4-triazole, 1,2,3-triazole, 1,2,5-triazole, 3-ol-4-methyl-4H-1,2,4-triazole, 3-ol-1,2,4-triazole, 4-amino-3,5-dimethyl-4H-1,2,4-triazole, 4-amino-3,5-dipropyl-4H-1,2,4-triazole, 3-amino-5-isopropyl-1,2,4-triazole, 4-amino-3-ol-5-methyl- 4H-1,2,4-triazole, 3-amino-5-methyl-1,2,4-triazole, 3-amino-5-methyl-4H-1,2,4-triazole, 4-amino-1,2,4-triazole, 4-amino-3,5-dimethyl-1,2,4-triazole, 4-amino-5-methyl-4H-1,2,4-triazole-3-thiol, 3,5-diamino-1H-1,2,4-triazole, 5-methyl-1H-benzotriazole, 5,6-dimethylbenzotriazole, 5-amino-1H-benzotriazole, benzotriazole-4-sulfonic acid, etc. From the viewpoint of being less likely to decompose and volatilize when heated at high temperatures, the compound containing a triazole structure is preferably benzotriazole.
(B)成分可單獨使用一種,亦可組合兩種以上。The component (B) may be used alone or in combination of two or more.
(B)成分的含量相對於(A)成分100質量份而較佳為0.01質量份~10質量份,更佳為0.1質量份~5質量份,進而較佳為0.3質量份~4質量份。The content of the component (B) is preferably 0.01 to 10 parts by mass, more preferably 0.1 to 5 parts by mass, and further preferably 0.3 to 4 parts by mass, based on 100 parts by mass of the component (A).
本發明的樹脂組成物可更含有溶劑。The resin composition of the present invention may further contain a solvent.
作為溶劑,通常只要可充分溶解其他成分,則並無特別限制,可列舉:N-甲基-2-吡咯啶酮、γ-丁內酯、乳酸乙酯、丙二醇單甲醚乙酸酯、乙酸苄酯、乙酸正丁酯、丙酸乙氧基乙酯、3-甲基甲氧基丙酸酯、N,N-二甲基甲醯胺、N,N-二甲基乙醯胺、六甲基磷醯胺、四亞甲基碸、環己酮、環戊酮、二乙基酮、二異丁基酮、甲基戊基酮等。 其中,就各成分的溶解性的觀點和塗佈性的觀點而言,較佳為N-甲基-2-吡咯啶酮、γ-丁內酯、乳酸乙酯、丙二醇單甲醚乙酸酯、N,N-二甲基甲醯胺、N,N-二甲基乙醯胺。As the solvent, there is no particular limitation as long as it can fully dissolve other components. Examples include: N-methyl-2-pyrrolidone, γ-butyrolactone, ethyl lactate, propylene glycol monomethyl ether acetate, benzyl acetate, n-butyl acetate, ethoxyethyl propionate, 3-methylmethoxypropionate, N,N-dimethylformamide, N,N-dimethylacetamide, hexamethylphosphatamide, tetramethylene sulfone, cyclohexanone, cyclopentanone, diethyl ketone, diisobutyl ketone, methyl amyl ketone, etc. Among them, from the viewpoint of solubility of each component and the viewpoint of coating properties, N-methyl-2-pyrrolidone, γ-butyrolactone, ethyl lactate, propylene glycol monomethyl ether acetate, N,N-dimethylformamide, and N,N-dimethylacetamide are preferred.
溶劑可為單獨一種,亦可組合兩種以上。The solvent may be a single type or a combination of two or more types.
溶劑的含量並無特別限制,相對於(A)成分100質量份,通常為1質量份~1000質量份,較佳為50質量份~600質量份,更佳為100質量份~500質量份。The content of the solvent is not particularly limited, but is usually 1 to 1000 parts by mass, preferably 50 to 600 parts by mass, and more preferably 100 to 500 parts by mass, based on 100 parts by mass of the component (A).
本發明的樹脂組成物亦可含有具有丙烯醯基或甲基丙烯醯基的胺化合物作為交聯劑。The resin composition of the present invention may also contain an amine compound having an acryl group or a methacryl group as a crosslinking agent.
作為具有丙烯醯基或甲基丙烯醯基的胺化合物,例如可列舉N,N-二乙基胺基丙基甲基丙烯酸酯、N,N-二甲基胺基丙基甲基丙烯酸酯、N,N-二乙基胺基丙基丙烯酸酯、N,N-二乙基胺基乙基甲基丙烯酸酯等,但並不限於該些。Examples of the amine compound having an acryl group or a methacryl group include, but are not limited to, N,N-diethylaminopropyl methacrylate, N,N-dimethylaminopropyl methacrylate, N,N-diethylaminopropyl acrylate, and N,N-diethylaminoethyl methacrylate.
於對本發明的樹脂組成物賦予負型的感光性的情況下,通常較佳為更含有自由基聚合起始劑等光聚合起始劑。 藉此,可對樹脂組成物賦予負型的感光性。 光聚合起始劑相對於(A)成分100質量份而較佳為0.1質量份~20質量份,更佳為0.1質量份~15質量份,進而較佳為0.2質量份~10質量份。In the case of imparting negative photosensitivity to the resin composition of the present invention, it is generally preferred to further contain a photopolymerization initiator such as a free radical polymerization initiator. In this way, negative photosensitivity can be imparted to the resin composition. The photopolymerization initiator is preferably in an amount of 0.1 to 20 parts by mass, more preferably 0.1 to 15 parts by mass, and further preferably 0.2 to 10 parts by mass, relative to 100 parts by mass of component (A).
另外,本發明的樹脂組成物亦可視需要而於不損害耐熱性與機械特性的範圍內含有密接助劑、酸產生劑等其他成分。In addition, the resin composition of the present invention may also contain other components such as an adhesion promoter and an acid generator as needed within a range that does not impair the heat resistance and mechanical properties.
本發明的樹脂組成物除了溶劑以外,本質上由(A)成分和(C)成分、以及任意的(B)成分、交聯劑、光聚合起始劑、密接助劑和酸產生劑構成,且於不損害本發明的效果的範圍內,可包含其他不可避免的雜質。 除了溶劑以外,本發明的樹脂組成物的例如80質量%以上、90質量%以上、95質量%以上、98質量%以上或100質量%可由 (A)成分和(C)成分;或 (A)成分和(C)成分、以及任意的(B)成分、交聯劑、光聚合起始劑、密接助劑和酸產生劑構成。The resin composition of the present invention is essentially composed of (A) component and (C) component, and any (B) component, a crosslinking agent, a photopolymerization initiator, a bonding aid, and an acid generator, in addition to the solvent, and may contain other inevitable impurities within the range that does not impair the effect of the present invention. In addition to the solvent, the resin composition of the present invention may be composed of, for example, 80% by mass or more, 90% by mass or more, 95% by mass or more, 98% by mass or more, or 100% by mass (A) component and (C) component; or (A) component and (C) component, and any (B) component, a crosslinking agent, a photopolymerization initiator, a bonding aid, and an acid generator.
本發明的硬化物可藉由所述樹脂組成物的硬化而獲得。 本發明的硬化物的膜厚較佳為5 μm~30 μm。The cured product of the present invention can be obtained by curing the resin composition. The film thickness of the cured product of the present invention is preferably 5 μm to 30 μm.
於本發明的硬化物的製造方法中,可包括:將所述樹脂組成物塗佈於基板上並進行乾燥而形成樹脂膜的步驟;以及對樹脂膜進行加熱處理的步驟。進而,亦可包括曝光(例如,無圖案方式)步驟。 藉此,可獲得本發明的硬化物。The method for manufacturing the hardened product of the present invention may include: applying the resin composition on a substrate and drying it to form a resin film; and heating the resin film. Furthermore, it may also include an exposure (for example, non-patterned) step. Thereby, the hardened product of the present invention can be obtained.
作為基板,可列舉: 玻璃基板; 碳化矽基板、鉭酸鋰基板、鈮酸鋰基板、Si基板(矽晶圓)等半導體基板; TiO2 基板、SiO2 基板等金屬氧化物絕緣體基板; 鍍Cu晶圓、氮化矽基板(例如,SiN層形成晶圓)、鋁基板、銅基板、銅合金基板等。As the substrate, there can be listed: glass substrate; semiconductor substrates such as silicon carbide substrate, lithium tantalum substrate, lithium niobate substrate, Si substrate (silicon wafer); metal oxide insulator substrates such as TiO2 substrate, SiO2 substrate; Cu-plated wafer, silicon nitride substrate (for example, SiN layer formed wafer), aluminum substrate, copper substrate, copper alloy substrate, etc.
塗佈方法並無特別限制,可使用旋轉器等來進行。The coating method is not particularly limited, and the coating can be performed using a spinner or the like.
乾燥可使用加熱板、烘箱等來進行。 乾燥溫度較佳為90℃~150℃,就塗佈膜的平坦性的觀點而言,更佳為90℃~120℃。乾燥時間較佳為30秒~5分鐘。 乾燥亦可進行兩次以上。藉此,可獲得將所述樹脂組成物形成為膜狀而得的樹脂膜。Drying can be performed using a heating plate, an oven, etc. The drying temperature is preferably 90°C to 150°C, and more preferably 90°C to 120°C from the perspective of the flatness of the coating film. The drying time is preferably 30 seconds to 5 minutes. Drying can also be performed twice or more. In this way, a resin film can be obtained in which the resin composition is formed into a film.
樹脂膜的膜厚較佳為5 μm~100 μm,更佳為8 μm~50 μm,進而較佳為10 μm~30 μm。The thickness of the resin film is preferably 5 μm to 100 μm, more preferably 8 μm to 50 μm, and further preferably 10 μm to 30 μm.
於曝光步驟中,所照射的光化射線可列舉寬頻光(波長350 nm~450 nm)、i射線等紫外線、可見光線、放射線等,較佳為i射線。 作為曝光裝置,可使用平行曝光機、投影曝光機、步進機、掃描曝光機、接近式曝光機(proximity exposure)等。In the exposure step, the actinic radiation irradiated may include broadband light (wavelength 350 nm to 450 nm), ultraviolet light such as i-ray, visible light, radiation, etc., preferably i-ray. As the exposure device, a parallel exposure machine, a projection exposure machine, a stepper, a scanning exposure machine, a proximity exposure machine, etc. can be used.
藉由對樹脂膜進行加熱處理,可獲得硬化物。 (A)成分的聚醯亞胺前驅物可藉由加熱處理步驟而發生脫水閉環反應,從而成為相對應的聚醯亞胺。By heat-treating the resin film, a hardened material can be obtained. The polyimide precursor of component (A) can undergo a dehydration and ring-closing reaction by the heat treatment step, thereby becoming the corresponding polyimide.
加熱處理的溫度較佳為400℃以下,更佳為180℃~370℃。 藉由為所述範圍內,可將對於基板或器件的損傷抑制得小,且可良率良好地生產器件,並可達成製程的省能量化。The temperature of the heat treatment is preferably below 400°C, and more preferably 180°C to 370°C. By keeping the temperature within the above range, damage to the substrate or device can be minimized, devices can be produced with good yield, and energy saving of the process can be achieved.
加熱處理的時間較佳為5小時以下,更佳為30分鐘~3小時。 藉由為所述範圍內,可充分進行交聯反應或脫水閉環反應。 加熱處理的環境可為大氣中,亦可為氮氣等惰性環境中,但就可防止樹脂膜氧化的觀點而言,較佳為氮氣環境下。The heat treatment time is preferably less than 5 hours, more preferably 30 minutes to 3 hours. By being within the above range, the crosslinking reaction or dehydration and ring closing reaction can be fully carried out. The heat treatment environment can be in the atmosphere or in an inert environment such as nitrogen, but from the perspective of preventing oxidation of the resin film, it is preferably in a nitrogen environment.
作為加熱處理中所使用的裝置,可列舉:石英管爐、加熱板、快速退火爐、垂直式擴散爐、紅外線硬化爐、電子束硬化爐、微波硬化爐等。As the apparatus used in the heat treatment, there can be listed: a quartz tube furnace, a heating plate, a rapid annealing furnace, a vertical diffusion furnace, an infrared hardening furnace, an electron beam hardening furnace, a microwave hardening furnace, etc.
本發明的硬化物可用作鈍化膜、緩衝塗膜、覆蓋塗層或表面保護膜等。 使用選自由所述鈍化膜、緩衝塗膜、覆蓋塗層和表面保護膜等所組成的群組中的一種以上,可製造可靠性高的半導體裝置、多層配線板、各種電子器件、電源模組等電子零件等。 [實施例]The cured product of the present invention can be used as a passivation film, a buffer coating, a cover coating, or a surface protective film. Using one or more selected from the group consisting of the passivation film, the buffer coating, the cover coating, and the surface protective film, it is possible to manufacture highly reliable semiconductor devices, multi-layer wiring boards, various electronic devices, power modules, and other electronic parts. [Example]
以下,基於實施例及比較例來對本發明進行更具體說明。再者,本發明並不限定於下述實施例。Hereinafter, the present invention will be described in more detail based on embodiments and comparative examples. Furthermore, the present invention is not limited to the following embodiments.
合成例1(A1的合成) 於氮氣環境下的200 ml燒瓶中,放入4,4'-氧二苯胺13.0 g、1,3-雙(3-胺基丙基)四甲基二矽氧烷0.9 g、N-甲基-2-吡咯啶酮(NMP)140 g,於室溫下攪拌15分鐘以使單體溶解。然後,加入均苯四酸二酐(PMDA)7.8 g與3,3',4,4'-二苯甲酮四羧酸二酐11.5 g,進一步攪拌60分鐘,獲得聚醯亞胺前驅物A1。 於以下條件下,使用凝膠滲透層析儀(Gel Permeation Chromatograph,GPC)法,並藉由標準聚苯乙烯換算而求出重量平均分子量。A1的重量平均分子量為106,000。Synthesis Example 1 (Synthesis of A1) In a 200 ml flask under a nitrogen atmosphere, 13.0 g of 4,4'-oxydiphenylamine, 0.9 g of 1,3-bis(3-aminopropyl)tetramethyldisiloxane, and 140 g of N-methyl-2-pyrrolidone (NMP) were placed and stirred at room temperature for 15 minutes to dissolve the monomers. Then, 7.8 g of pyromellitic dianhydride (PMDA) and 11.5 g of 3,3',4,4'-benzophenonetetracarboxylic dianhydride were added and stirred for further 60 minutes to obtain polyimide precursor A1. The weight average molecular weight was calculated by using the gel permeation chromatograph (GPC) method under the following conditions and by conversion to standard polystyrene. The weight average molecular weight of A1 is 106,000.
使用相對於0.5 mg的A1而溶劑[四氫呋喃(THF)/二甲基甲醯胺(DMF)=1/1(容積比)]為1 mL的溶液來進行測定。The measurement was performed using 1 mL of a solution of a solvent [tetrahydrofuran (THF)/dimethylformamide (DMF) = 1/1 (volume ratio)] relative to 0.5 mg of A1.
測定裝置:檢測器 日立製作所股份有限公司製造的L4000UV 泵:日立製作所股份有限公司製造的L6000 島津製作所股份有限公司製造的C-R4A 層析儀組件(Chromatopac) 測定條件:管柱Gelpack GL-S300MDT-5×2根 洗脫液:THF/DMF=1/1(容積比) LiBr(0.03 mol/L)、H3 PO4 (0.06 mol/L) 流速:1.0 mL/min,檢測器:UV 270 nmMeasurement equipment: Detector: L4000UV manufactured by Hitachi, Ltd. Pump: L6000 manufactured by Hitachi, Ltd. Chromatopac C-R4A manufactured by Shimadzu Corporation Measurement conditions: Column Gelpack GL-S300MDT-5 × 2 roots Eluent: THF/DMF = 1/1 (volume ratio) LiBr (0.03 mol/L), H 3 PO 4 (0.06 mol/L) Flow rate: 1.0 mL/min, Detector: UV 270 nm
合成例2(A2的合成) 於氮氣環境下的200 ml燒瓶中,放入4,4'-氧二苯胺4.0 g、間苯二胺2.2 g、NMP 164 g,於40℃下加熱攪拌15分鐘以使單體溶解。然後,加入3,3',4,4'-二苯甲酮四羧酸二酐13.0 g,進一步攪拌30分鐘,獲得聚醯亞胺前驅物A2。 於與合成例1相同的條件下,使用GPC法求出重量平均分子量。A2的重量平均分子量為50,000。Synthesis Example 2 (Synthesis of A2) In a 200 ml flask under a nitrogen atmosphere, 4.0 g of 4,4'-oxydiphenylamine, 2.2 g of m-phenylenediamine, and 164 g of NMP were placed, and heated and stirred at 40°C for 15 minutes to dissolve the monomers. Then, 13.0 g of 3,3',4,4'-benzophenonetetracarboxylic dianhydride was added, and further stirred for 30 minutes to obtain polyimide precursor A2. The weight average molecular weight was determined using the GPC method under the same conditions as in Synthesis Example 1. The weight average molecular weight of A2 was 50,000.
實施例1~實施例8及比較例1~比較例2 (樹脂組成物的製備) 按照表1和表2所示的成分和調配量製備實施例1~實施例8和比較例1~比較例2的樹脂組成物。表1和表2的調配量是各成分相對於100質量份的A1的質量份。Example 1 to Example 8 and Comparative Example 1 to Comparative Example 2 (Preparation of resin composition) The resin compositions of Example 1 to Example 8 and Comparative Example 1 to Comparative Example 2 were prepared according to the components and blending amounts shown in Table 1 and Table 2. The blending amounts in Table 1 and Table 2 are the mass parts of each component relative to 100 mass parts of A1.
所使用的各成分如下所述。The components used are as follows.
(A)成分 A1:合成例1中所獲得的A1 A2:合成例2中所獲得的A2(A) Components A1: A1 obtained in Synthesis Example 1 A2: A2 obtained in Synthesis Example 2
(C)成分 C1:4-甲基-2-第三丁基苯酚(本州化學工業股份有限公司製造) C2:3-甲基-6-第三丁基苯酚(本州化學工業股份有限公司製造) C3:3,5-二-第三丁基-4-羥基甲苯(富士膠片和光純藥股份有限公司製造) C4:安塔基(ANTAGE)HP-300(川口化學工業股份有限公司製造,N,N'-雙-3-(3,5-二-第三丁基-4-羥基苯基)丙醯基六亞甲基二胺,下述式C4所表示的化合物) [化11] C5:CDA-6(艾迪科(ADEKA)股份有限公司製造,十二烷二酸雙[N2-(2-羥基苯甲醯基)醯肼],下述式C5所表示的化合物) [化12] (C) Component C1: 4-methyl-2-tert-butylphenol (manufactured by Honshu Chemical Industry Co., Ltd.) C2: 3-methyl-6-tert-butylphenol (manufactured by Honshu Chemical Industry Co., Ltd.) C3: 3,5-di-tert-butyl-4-hydroxytoluene (manufactured by Fuji Film Wako Pure Chemical Industries, Ltd.) C4: ANTAGE HP-300 (manufactured by Kawaguchi Chemical Industry Co., Ltd., N,N'-bis-3-(3,5-di-tert-butyl-4-hydroxyphenyl)propionylhexamethylenediamine, a compound represented by the following formula C4) [Chemical 11] C5: CDA-6 (manufactured by ADEKA Co., Ltd., dodecanedioic acid bis[N2-(2-hydroxybenzoyl)hydrazide], a compound represented by the following formula C5) [Chemical 12]
溶劑 NMP:N-甲基-2-吡咯啶酮Solvent NMP: N-methyl-2-pyrrolidone
(硬化物的製造) 使用塗佈裝置Act8(東京電子股份有限公司製造),以硬化後的膜厚成為10 μm的方式將所獲得的樹脂組成物旋塗於鍍Cu晶圓(形成有厚度0.5 μm的Cu鍍層的Si晶圓)上,於100℃下乾燥兩分鐘後,於110℃下乾燥兩分鐘而形成樹脂膜。 繼而,對於所獲得的樹脂膜,使用垂直式擴散爐μ-TF(光洋熱系統(Koyo Thermo Systems)股份有限公司製造)於氮氣環境下以250℃加熱2小時,獲得硬化物(硬化後膜厚為10 μm)。(Production of hardened product) The obtained resin composition was spin-coated on a Cu-plated wafer (Si wafer with a Cu-plated layer of 0.5 μm thickness) using a coating device Act8 (manufactured by Tokyo Electron Co., Ltd.) so that the film thickness after hardening was 10 μm, and then dried at 100°C for 2 minutes and then at 110°C for 2 minutes to form a resin film. Then, the obtained resin film was heated at 250°C for 2 hours in a nitrogen atmosphere using a vertical diffusion furnace μ-TF (manufactured by Koyo Thermo Systems Co., Ltd.) to obtain a hardened product (film thickness after hardening was 10 μm).
(PCT) 對於所述硬化物的製造中所獲得的硬化物,使用加壓蒸煮器試驗(pressure cooker test,PCT)試驗裝置海泰斯特(HASTEST)(平山製作所股份有限公司製造,PC-R8D)以121℃、100%相對濕度(Relative Humidity,RH)、2 atm進行168小時處理。 自PCT試驗裝置取出硬化物,獲得PCT後的硬化物。(PCT) The hardened material obtained in the production of the hardened material was treated for 168 hours at 121°C, 100% relative humidity (RH), and 2 atm using a pressure cooker test (PCT) test device HASTEST (manufactured by Hirayama Seisakusho Co., Ltd., PC-R8D). The hardened material was taken out from the PCT test device to obtain a hardened material after PCT.
(外觀評價) 關於所述硬化物和PCT後的硬化物,藉由目視對外觀進行評價。將與硬化物的製造中進行旋塗、並以110℃乾燥2分鐘後的鍍Cu晶圓上的樹脂膜的顏色相比而未發生變化者評價為〇。將變為黃綠色者評價為△。將變為黑色者評價為×。 將結果示於表1和表2。表中,「-」表示未測定。(Appearance evaluation) The appearance of the hardened product and the hardened product after PCT was evaluated visually. The color of the resin film on the Cu-plated wafer that was spin-coated and dried at 110°C for 2 minutes during the production of the hardened product was evaluated as 0. The color that changed to yellow-green was evaluated as △. The color that changed to black was evaluated as ×. The results are shown in Tables 1 and 2. In the table, "-" means not measured.
(Cu黏接性評價) 關於所述硬化物和PCT後的硬化物,分別依據日本工業標準(Japanese Industrial Standards,JIS)K 5600-5-6規格的網格(crosscut)法,並基於以下的基準評價該些硬化物對鍍Cu晶圓的黏接性。具體而言,對10×10的格子中黏接於鍍Cu晶圓的硬化物的格子數進行評價。將結果示於表1和表2。表中,「-」表示未測定。 「◎」:黏接於鍍Cu晶圓的硬化物的格子數為100 「〇」:黏接於鍍Cu晶圓的硬化物的格子數為80~99 「△」:黏接於鍍Cu晶圓的硬化物的格子數為50~79 「×」:黏接於鍍Cu晶圓的硬化物的格子數為20~49 「××」:黏接於鍍Cu晶圓的硬化物的格子數小於20(Cu Adhesion Evaluation) Regarding the hardened material and the hardened material after PCT, the adhesion of these hardened materials to the Cu-plated wafer was evaluated based on the crosscut method of Japanese Industrial Standards (JIS) K 5600-5-6 and the following criteria. Specifically, the number of grids of the hardened material adhering to the Cu-plated wafer in a 10×10 grid was evaluated. The results are shown in Tables 1 and 2. In the table, "-" means not measured. "◎": The number of grids of the hardened material bonded to the Cu-plated wafer is 100 "0": The number of grids of the hardened material bonded to the Cu-plated wafer is 80 to 99 "△": The number of grids of the hardened material bonded to the Cu-plated wafer is 50 to 79 "×": The number of grids of the hardened material bonded to the Cu-plated wafer is 20 to 49 "××": The number of grids of the hardened material bonded to the Cu-plated wafer is less than 20
[表1]
[表2]
本發明的樹脂組成物可用於覆蓋塗層或表面保護膜等,本發明的覆蓋塗層或表面保護膜可用於電子零件等。本發明的電子零件可用作電源模組等。The resin composition of the present invention can be used for a covering coating or a surface protective film, and the covering coating or the surface protective film of the present invention can be used for electronic parts, etc. The electronic parts of the present invention can be used as a power module, etc.
於上述中對本發明的若干實施形態及/或實施例進行了詳細說明,但本領域技術人員容易於實質上不偏離本發明的新穎教示及效果的情況下,對該些作為例示的實施形態及/或實施例加以多種變更。因而,該些多種變更包含於本發明的範圍內。 引用該說明書中記載的文獻及成為本申請案基於巴黎條約的優先權的基礎的申請的全部內容。In the above, several embodiments and/or examples of the present invention are described in detail, but it is easy for a person skilled in the art to make various changes to the embodiments and/or examples as examples without substantially deviating from the novel teachings and effects of the present invention. Therefore, these various changes are included in the scope of the present invention. The entire contents of the documents described in the specification and the application that is the basis for the priority of this application under the Paris Treaty are cited.
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