TWI851989B - High specific heat package chip structure - Google Patents
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Abstract
本發明為一種高比熱封裝晶片結構,其包含:一電路基板,該電路基板為具一底部及四周封閉壁,該底部相對位置具一開口,該四周封閉壁圍繞一容置空間;一處理晶片,該處理晶片結合於該電路基板之該底部且於該容置空間內,且該容置空間之體積大於該處理晶片之體積,該處理晶片之高度低於該四周封閉壁之高度,該處理晶片與該四周封閉壁之間存在餘存之容置空間,該餘存之容置空間內設置至少一高比熱物質;一導熱片,該導熱片為至少一層之導熱材料,該導熱材料覆蓋在該處理晶片表面及該四周封閉壁之頂端處;及一金屬片,該金屬片覆蓋在該導熱片表面,並將該電路基板之開口真空封閉。 The present invention is a high specific heat package chip structure, which includes: a circuit substrate, the circuit substrate has a bottom and surrounding closed walls, the bottom has an opening at a relative position, and the surrounding closed walls surround a containing space; a processing chip, the processing chip is combined with the bottom of the circuit substrate and is in the containing space, and the volume of the containing space is larger than the volume of the processing chip, and the height of the processing chip is lower than the surrounding The height of the closed wall, there is a remaining storage space between the processing chip and the surrounding closed walls, and at least one high specific heat material is set in the remaining storage space; a heat conductive sheet, which is at least one layer of heat conductive material, and the heat conductive material covers the surface of the processing chip and the top of the surrounding closed walls; and a metal sheet, which covers the surface of the heat conductive sheet and vacuum seals the opening of the circuit substrate.
Description
本發明涉及用於半導體封裝晶片,將高比熱物質導入真空封裝結構中,以增加晶片所發出廢熱朝橫向導熱之多方向熱擴散,提升其廢熱導除效果。 The present invention relates to a method for semiconductor packaging chips, which introduces high specific heat materials into a vacuum packaging structure to increase the multi-directional heat diffusion of waste heat generated by the chip in the lateral direction, thereby improving its waste heat removal effect.
先前技術針對一種發光封裝結構的製造方法研究,如中華民國專利號TWI692125B所揭露,其包括:實施一準備程序:將發光單元安裝在一基板上;實施一點膠程序:將封膠體塗佈於所述基板的一第一接合區域上;實施一封蓋程序:將一蓋板設置於所述基板上,其中所述蓋板具有一第二接合區域,所述第一接合區域和所述第二接合區域藉由所述封膠體彼此接合;實施一真空程序:將一環境壓力降低至一第一壓力值,所述第一壓力值低於原始的環境壓力;實施一回壓程序:將所述封裝結構周圍的環境壓力調整至一第二壓力值,所述第二壓力值高於所述第一壓力值;實施一固化程序固化所述封膠體。其中實施例還提供一種發光封裝結構。 The prior art is directed to a method for manufacturing a light-emitting package structure, as disclosed in the Republic of China patent number TWI692125B, which includes: implementing a preparation procedure: mounting a light-emitting unit on a substrate; implementing a glue application procedure: applying a sealant body on a first bonding area of the substrate; implementing a capping procedure: placing a cover plate on the substrate, wherein the cover plate has a second bonding area , the first bonding area and the second bonding area are bonded to each other through the encapsulation body; a vacuum process is implemented: an environmental pressure is reduced to a first pressure value, the first pressure value is lower than the original environmental pressure; a back pressure process is implemented: the environmental pressure around the packaging structure is adjusted to a second pressure value, the second pressure value is higher than the first pressure value; a curing process is implemented to cure the encapsulation body. The embodiment also provides a light-emitting packaging structure.
先前技術針對晶圓封裝裝置與晶圓封裝方法研究,如中華民國專利號TWI674659B所揭露,一種晶圓封裝裝置,包括密閉腔體、承載台、軟質片體以及大氣進氣控制閥。密閉腔體包括真空槽體及蓋體,真空槽體具有容置槽及 上開口,蓋體對應蓋合於真空槽體之上開口以密閉容置槽,真空槽體開設有抽真空口,蓋體開設有一進氣口。承載台設置於真空槽體之容置槽內,承載台包括有晶圓封裝區。軟質片體設置於密閉腔體內部,軟質片體包括外環部及中央部,外環部氣密的固設於蓋體,中央部對應覆蓋著進氣口,且中央部對應於承載台之晶圓封裝區。大氣進氣控制閥連通於進氣口,大氣進氣控制閥能控制外部大氣氣體流經進氣口進入密閉腔體內的流量。 Prior art has been directed to wafer packaging devices and wafer packaging methods. For example, the Republic of China patent number TWI674659B discloses a wafer packaging device, including a sealed chamber, a carrier, a soft wafer, and an atmospheric air intake control valve. The sealed chamber includes a vacuum tank body and a cover body. The vacuum tank body has a receiving tank and an upper opening. The cover body covers the upper opening of the vacuum tank body to seal the receiving tank. The vacuum tank body is provided with a vacuum pumping port, and the cover body is provided with an air intake port. The carrier is disposed in the receiving tank of the vacuum tank body, and the carrier includes a wafer packaging area. The soft sheet is arranged inside the sealed chamber. The soft sheet includes an outer ring and a central part. The outer ring is fixed to the cover in an airtight manner. The central part corresponds to the air inlet and the central part corresponds to the wafer packaging area of the carrier. The atmospheric air intake control valve is connected to the air inlet. The atmospheric air intake control valve can control the flow of external atmospheric gas flowing through the air inlet into the sealed chamber.
先前技術針對一種具有微型加熱器的薄膜吸氣劑結構及真空封裝結構研究,如中國專利號CN215288005U所揭露,其薄膜吸氣劑結構包括:基板;在所述基板的一個主面一側形成的熱子;以及在所述熱子表面形成的吸氣劑薄膜,其中,所述熱子包括:第一絕緣薄膜;在所述第一絕緣薄膜上表面形成的薄膜電阻;以及覆蓋所述薄膜電阻的第二絕緣薄膜,所述薄膜電阻的兩端為從所述第二絕緣薄膜露出的電極。另一先前技術針對一種真空吸附的穩定化及維護性的改善的PTFE片及晶粒封裝方法研究,如中華民國專利公告號TWI687463B所揭露,其是一種對直徑為1μm以下的PTFE纖維進行紡織而成的PTFE片,PTFE片中,哥雷值為1~3的範圍,加熱至300℃時的與片纏繞方向正交的方向上的收縮率為10%以下,當將晶粒封裝至被封裝體時夾於對晶粒進行加熱的工具與所述晶粒之間而可藉由工具來吸附晶粒,並且抑制將晶粒固定於被封裝體上的黏接構件附著在工具的吸附面或晶粒上。 Prior art has been directed to a thin film getter structure and a vacuum packaging structure with a micro heater, as disclosed in Chinese Patent No. CN215288005U, wherein the thin film getter structure comprises: a substrate; a heater formed on one side of a main surface of the substrate; and a getter film formed on the surface of the heater, wherein the heater comprises: a first insulating film; a thin film resistor formed on the upper surface of the first insulating film; and a second insulating film covering the thin film resistor, wherein both ends of the thin film resistor are electrodes exposed from the second insulating film. Another prior art is a PTFE sheet and die packaging method for improving the stability and maintainability of vacuum adsorption. As disclosed in the Republic of China patent publication number TWI687463B, it is a PTFE sheet spun from PTFE fibers with a diameter of less than 1 μm. The PTFE sheet has a Gore value in the range of 1 to 3, and the shrinkage rate in the direction orthogonal to the sheet winding direction when heated to 300°C is less than 10%. When encapsulating the die into the packaged body, the die is sandwiched between the tool for heating the die and the die, and the die can be adsorbed by the tool, and the adhesive component for fixing the die to the packaged body is prevented from adhering to the adsorption surface of the tool or the die.
先前技術針對一種帶有微熱管散熱架的封裝結構研究,如中國專利號CN205609497U所揭露,其屬於半導體封裝技術領域,其包括基板,所述基板上設置有芯片,所述芯片外罩置有散熱架,所述散熱架電性聯接至基板接地端,所述散熱架和芯片外圍區域包封有塑封料,所述散熱架中心區域設置有微熱管散熱器,所述微熱管散熱器上表面露出塑封料表面。其在散熱架中心區域 處製作微熱管,該結構一方面微熱管內部抽真空,注入乙醇溶液,增強結構中的熱導率,增大散熱量,其相比表面貼裝散熱片的封裝結構可以減小產品尺寸,達到小型化的目的。另一先前技術針對一種具有平板型微熱管散熱器封裝結構研究,如中國專利號CN205609506U所揭露,其屬於半導體封裝技術領域,其包括基板,所述基板上設置有芯片,所述芯片外包封有塑封料,所述塑封料表面設置有平板型微熱管散熱器。其利用微熱管散熱器取代傳統的散熱片,一方面微熱管的內部抽真空,注入乙醇溶液,增強結構中的熱導率,從而增大散熱量,另一方面可以減小散熱片尺寸,達到小型化的目的。再一先前技術針對一種常壓下微熱管真空注液封裝的方法研究,如中國專利號CN101266111B所揭露,其包括注液和封裝兩個過程,由於微熱管腔體及工作液體中殘留的空氣會嚴重影響微熱管的性能,因此其首先採用抽真空與超聲振動相結合的方式,將微熱管工質注滿整個腔體,在封裝過程中,採用加熱-冷卻的方式,使微熱管內部達到汽液動態平衡,可實現注液量可控,最後膠封注液孔。與現有技術相比,其成本低廉、操作簡便、並能保證微熱管腔體的高真空度。 The prior art is directed to a packaging structure with a micro heat pipe heat sink, as disclosed in Chinese patent number CN205609497U, which belongs to the field of semiconductor packaging technology. It includes a substrate, a chip is arranged on the substrate, a heat sink is arranged on the chip cover, the heat sink is electrically connected to the ground end of the substrate, the heat sink and the peripheral area of the chip are encapsulated with plastic packaging material, and a micro heat pipe heat sink is arranged in the central area of the heat sink, and the upper surface of the micro heat pipe heat sink is exposed to the surface of the plastic packaging material. The micro heat pipe is made in the central area of the heat sink. On the one hand, the micro heat pipe is vacuumed inside and an ethanol solution is injected to enhance the thermal conductivity in the structure and increase the heat dissipation. Compared with the packaging structure of the surface mounted heat sink, it can reduce the product size and achieve the purpose of miniaturization. Another prior art is directed to a packaging structure with a flat micro heat pipe radiator, as disclosed in Chinese patent number CN205609506U, which belongs to the field of semiconductor packaging technology, and includes a substrate, a chip is arranged on the substrate, the chip is encapsulated with a plastic encapsulation material, and a flat micro heat pipe radiator is arranged on the surface of the plastic encapsulation material. The micro heat pipe radiator is used to replace the traditional heat sink. On the one hand, the interior of the micro heat pipe is evacuated and an ethanol solution is injected to enhance the thermal conductivity in the structure, thereby increasing the heat dissipation. On the other hand, the size of the heat sink can be reduced to achieve the purpose of miniaturization. Another prior art is a method for vacuum liquid injection packaging of micro heat pipes under normal pressure. As disclosed in Chinese Patent No. CN101266111B, it includes two processes: liquid injection and packaging. Since the residual air in the micro heat pipe cavity and working liquid will seriously affect the performance of the micro heat pipe, it first adopts a combination of vacuum pumping and ultrasonic vibration to fill the entire cavity with the micro heat pipe working fluid. During the packaging process, a heating-cooling method is used to achieve a dynamic vapor-liquid balance inside the micro heat pipe, which can realize a controllable liquid injection amount, and finally the liquid injection hole is sealed with glue. Compared with the existing technology, it is low-cost, easy to operate, and can ensure a high vacuum degree of the micro heat pipe cavity.
本發明乃是一種高比熱封裝晶片結構,其包含:一電路基板,該電路基板為具一底部及四周封閉壁,該底部相對位置具一開口,該四周封閉壁圍繞一容置空間;一處理晶片,該處理晶片結合於該電路基板之該底部且於該容置空間內,且該容置空間之體積大於該處理晶片之體積,該處理晶片之高度低於該四周封閉壁之高度,該處理晶片與該四周封閉壁之間存在餘存之容置空間,該餘存之容置空間內設置至少一高比熱物質;一導熱片,該導熱片為至少一層之導熱材料,該導熱材料覆蓋在該處理晶片表面及該四周封閉壁之頂端處;及一 金屬片,該金屬片覆蓋在該導熱片表面,並將該電路基板之開口真空封閉。其中,該電路基板具有導電線路圖,及披覆於該導電線路圖表面之絕緣樹脂。其中,該電路基板為一硬挺性材料或柔性材料。其中,該處理晶片之外表面具有至少一面之絕緣封裝。其中,該高比熱物質為至少一絕緣液體、絕緣膠體、絕緣凝膠、和絕緣膏狀體,該高比熱物質佔該餘存之容置空間之體積比為5~100%。其中,該導熱片為多層結構,其各層以不同絕緣與非絕緣之導熱材料交互疊合而成。其中,該導熱片與該處理晶片表面及四周封閉壁之頂端處之接觸面為一絕緣黏膠層。其中,該導熱片與該金屬片之接觸面為一絕緣黏膠層。其中,該金屬片之材料為至少一不銹鋼、鋁和銅。其中,該金屬片之面積等於或大於該導熱片之面積,該金屬片與該導熱片相互為整面或局部貼合。本發明之導熱片可以封止高比熱物質,該高比熱物質提升橫向導熱效果,可將處理晶片之熱導除,提升處理晶片之運作效能。其無需熱管之複雜導入程序,有別於過去習知技藝具差異化,其結構之新穎、進步及實用效益無誤。有關本創作所採用之技術、手段及其功效,茲舉一較佳實施例並配合圖式詳細說明於後,相信本創作上述之目的、構造及特徵,當可由之得一深入而具體的瞭解。 The present invention is a high specific heat package chip structure, which comprises: a circuit substrate, the circuit substrate has a bottom and surrounding closed walls, the bottom has an opening at a relative position, and the surrounding closed walls surround a containing space; a processing chip, the processing chip is combined with the bottom of the circuit substrate and is in the containing space, and the volume of the containing space is larger than the volume of the processing chip, and the height of the processing chip is lower than the surrounding closed walls. The height of the surrounding closed wall, there is a remaining storage space between the processing chip and the surrounding closed wall, and at least one high specific heat material is arranged in the remaining storage space; a heat conductive sheet, the heat conductive sheet is at least one layer of heat conductive material, the heat conductive material covers the surface of the processing chip and the top of the surrounding closed wall; and a metal sheet, the metal sheet covers the surface of the heat conductive sheet and vacuum seals the opening of the circuit substrate. The circuit substrate has a conductive circuit pattern and an insulating resin coated on the surface of the conductive circuit pattern. The circuit substrate is a stiff material or a flexible material. The outer surface of the processing chip has at least one side of an insulating package. The high specific heat material is at least one insulating liquid, insulating colloid, insulating gel, and insulating paste, and the volume ratio of the high specific heat material to the remaining storage space is 5-100%. The thermal conductive sheet is a multi-layer structure, and each layer is formed by alternating and overlapping different insulating and non-insulating thermal conductive materials. The contact surface between the thermal conductive sheet and the top of the processing chip surface and the surrounding closed wall is an insulating adhesive layer. The contact surface between the thermal conductive sheet and the metal sheet is an insulating adhesive layer. The material of the metal sheet is at least one of stainless steel, aluminum and copper. The area of the metal sheet is equal to or larger than the area of the heat conducting sheet, and the metal sheet and the heat conducting sheet are bonded to each other in whole or in part. The heat conducting sheet of the present invention can seal high specific heat materials, and the high specific heat materials can enhance the lateral heat conduction effect, remove the heat of the processing chip, and enhance the operation performance of the processing chip. It does not require the complicated introduction process of the heat pipe, which is different from the conventional technology, and its structure is novel, advanced and practical. Regarding the technology, means and effects adopted by this creation, a better embodiment is given and detailed description is provided below with diagrams. It is believed that the above-mentioned purpose, structure and characteristics of this creation can be understood in depth and concretely.
101:電路基板 101: Circuit board
1011:底部 1011: Bottom
1012:四周封閉壁 1012: Closed walls all around
10121:四周封閉壁之頂端處 10121: The top of the surrounding closed wall
1013:容置空間 1013: Storage space
10131:餘存之容置空間 10131: Remaining storage space
1014:開口 1014: Open mouth
201:處理晶片 201: Processing chip
301:導熱片 301: Heat conducting sheet
401:金屬片 401:Metal sheet
501:高比熱物質 501: High specific heat material
第1圖係顯示本創作高比熱封裝晶片結構之透視圖。 Figure 1 is a perspective view showing the structure of the high specific heat package chip of this invention.
第2圖係顯示本創作高比熱封裝晶片結構之分解圖。 Figure 2 is a disassembled diagram showing the structure of the high specific heat package chip of this invention.
第3圖係顯示本創作高比熱封裝晶片結構之剖面圖。 Figure 3 shows the cross-sectional view of the high specific heat package chip structure of this invention.
第4圖係顯示本創作另一實施例高比熱封裝晶片結構之分解圖。 Figure 4 is a disassembled diagram showing another embodiment of the invention, a high specific heat package chip structure.
第5圖係顯示本創作另一實施例高比熱封裝晶片結構之剖面圖。 Figure 5 is a cross-sectional view showing another embodiment of the invention, a high specific heat package chip structure.
以下係藉由特定的具體實施例說明本創作之實施方式,熟習此技藝之人士可由本說明書所揭示之內容輕易地了解本創作之其他優點與功效。本創作亦可藉由其他不同的具體實施例加以施行或應用,本說明書中的各項細節亦可基於不同觀點與應用,在不悖離本創作之精神下進行各種修飾與變更。 The following is a specific implementation example to illustrate the implementation of this creation. People familiar with this art can easily understand the other advantages and effects of this creation from the content disclosed in this manual. This creation can also be implemented or applied through other different specific implementation examples. The details in this manual can also be modified and changed based on different viewpoints and applications without deviating from the spirit of this creation.
首先敬請閱第1圖係顯示本創作高比熱封裝晶片結構之透視圖,搭配第2圖係顯示本創作高比熱封裝晶片結構之分解圖及第3圖係顯示本創作高比熱封裝晶片結構之剖面圖,該剖面圖為第2圖本創作高比熱封裝晶片結構之中央由縱方向剖開,說明一種高比熱封裝晶片結構,其包含:一電路基板101,該電路基板101為具一底部1011及四周封閉壁1012,該底部1011相對位置具一開口1014,該四周封閉壁1012圍繞一容置空間1013;一處理晶片201,該處理晶片201結合於該電路基板101之該底部1011且於該容置空間1013內,且該容置空間1013之體積大於該處理晶片201之體積,該處理晶片201之高度低於該四周封閉壁1012之高度,該處理晶片201與該四周封閉壁1012之間存在餘存之容置空間10131,該餘存之容置空間10131內設置至少一高比熱物質501;一導熱片301,該導熱片301為至少一層之導熱材料,該導熱材料覆蓋在該處理晶片201表面及該四周封閉壁之頂端處10121;及一金屬片401,該金屬片401覆蓋在該導熱片301表面,並將該電路基板101之開口1014真空封閉。其中,該電路基板101具有導電線路圖,及披覆於該導電線路圖表面之絕緣樹脂。其中,該電路基板101為一硬挺性材料或柔性材
料。其中,該處理晶片201之外表面具有至少一面之絕緣封裝。其中,該高比熱物質501為至少一絕緣液體、絕緣膠體、絕緣凝膠、和絕緣膏狀體,該高比熱物質501佔該餘存之容置空間10131之體積比為5~100%。
First, please read Figure 1, which is a perspective view of the high specific heat package chip structure of the present invention, followed by Figure 2, which is an exploded view of the high specific heat package chip structure of the present invention, and Figure 3, which is a cross-sectional view of the high specific heat package chip structure of the present invention. The cross-sectional view is a longitudinal cut of the center of the high specific heat package chip structure of Figure 2, illustrating a high specific heat package chip structure, which includes: a
其中,該導熱片301為多層結構,其各層以不同絕緣與非絕緣之導熱材料交互疊合而成。其中,該導熱片301與該處理晶片201表面及該四周封閉壁之頂端處10121之接觸面為一絕緣黏膠層。其中,該導熱片301與該金屬片401之接觸面為一絕緣黏膠層。其中,該金屬片401之材料為至少一不銹鋼、鋁和銅。其中,該金屬片401之面積大於該導熱片301之面積,該金屬片401與該導熱片301相互為局部貼合,該金屬片401之單側局部無接觸該導熱片301。該導熱片301與該金屬片401為個別獨立元件,其中該導熱片301具有雙面之絕緣膠粘層之表面,該導熱片301與該金屬片401依賴該導熱片301之絕緣膠黏層黏合達成高比熱封裝晶片結構之封裝效果。封裝完成後該金屬片401之外部表面後續可貼合散熱鰭片等外部散熱裝置。
The
為使審查委員更進一步了解本創作另一實施例之際應用情境,如第4圖係顯示本創作另一實施例高比熱封裝晶片結構之分解圖及第5圖係顯示本創作另一實施例高比熱封裝晶片結構之剖面圖,該剖面圖為第4圖本創作另一實施例高比熱封裝晶片結構之中央由縱方向剖開,其說明本發明另一種高比熱封裝晶片結構,其包含:一電路基板101,該電路基板101為具一底部1011及四周封閉壁1012,該底部1011相對位置具一開口1014,該四周封閉壁1012圍繞一容置空間1013;一處理晶片201,該處理晶片201結合於該電路基板101之該底部且於該容置空間1013內,且該容置空間1013之體積大於該處理晶片201之體積,該處理晶片201之高度低於該四周封閉壁1012之高度,該處理晶片201與該四周封閉壁1012之間存在餘存之容置空間10131,該餘存之容置空間10131內設置至少一高
比熱物質501;一導熱片301,該導熱片301為至少一層之導熱材料,該導熱材料覆蓋在該處理晶片201表面及該四周封閉壁之頂端處10121;及一金屬片401,該金屬片401覆蓋在該導熱片301表面,並將該電路基板101之開口1014真空封閉。其中,該電路基板101具有導電線路圖,及披覆於該導電線路圖表面之絕緣樹脂。其中,該電路基板101為一硬挺性材料或柔性材料。其中,該處理晶片201之外表面具有至少一面之絕緣封裝。其中,該高比熱物質501為至少一絕緣液體、絕緣膠體、絕緣凝膠、和絕緣膏狀體,該高比熱物質501佔該餘存之容置空間10131之體積比為5~100%。
In order to make the review committee further understand the application scenario of another embodiment of the present invention, FIG. 4 is an exploded view of another embodiment of the present invention, and FIG. 5 is a cross-sectional view of another embodiment of the present invention. The cross-sectional view is a longitudinal section of the center of another embodiment of the present invention, which illustrates another high specific heat package chip structure of the present invention, comprising: a circuit substrate 101, the circuit substrate 101 has a bottom 1011 and surrounding closed walls 1012, the bottom 1011 has an opening 1014 at a relative position, and the surrounding closed walls 1012 surround a containing space 1013; a processing chip 201, the processing chip 201 is combined with the circuit substrate 10 1 and in the accommodating space 1013, and the volume of the accommodating space 1013 is larger than the volume of the processing chip 201, the height of the processing chip 201 is lower than the height of the surrounding closed wall 1012, and there is a remaining accommodating space 10131 between the processing chip 201 and the surrounding closed wall 1012, and the remaining accommodating space 10131 is provided At least one high specific heat material 501; a heat conductive sheet 301, the heat conductive sheet 301 is at least one layer of heat conductive material, the heat conductive material covers the surface of the processing chip 201 and the top end 10121 of the surrounding closed wall; and a metal sheet 401, the metal sheet 401 covers the surface of the heat conductive sheet 301 and vacuum seals the opening 1014 of the circuit substrate 101. The
其中,該導熱片301為多層結構,其各層以不同絕緣與非絕緣之導熱材料交互疊合而成。其中,該導熱片301與該處理晶片201表面及該四周封閉壁之頂端處10121之接觸面為一絕緣黏膠層。其中,該導熱片301與該金屬片401之接觸面為一絕緣黏膠層。其中,該金屬片401之材料為至少一不銹鋼、鋁和銅。其中,該金屬片401之面積等於該導熱片301之面積,該金屬片401與該導熱片301為整面貼合。該導熱片301與該金屬片401為一體化之元件,其中該導熱片301與該金屬片401貼合的另一側面具絕緣膠粘層,可將其一體化之元件之該導熱片301之絕緣膠粘層之表面直接黏合於該處理晶片201表面及該四周封閉壁之該頂端處10121,以達成高比熱封裝晶片結構之封裝效果。封裝完成後該金屬片401可取代外部散熱其片等外部散熱裝置,或者該金屬片401之外部表面後續可貼合散熱鰭片等外部散熱裝置。
The
本發明乃是一種高比熱封裝晶片結構,本發明結構特徵有利於真空封裝之簡化結構,其有別於過去習知技藝具差異化,其新穎、進步及實用效益無誤。故可有效改進習知缺失,使用上有相當大之實用性。 The present invention is a high specific heat package chip structure. The structural features of the present invention are conducive to the simplified structure of vacuum packaging. It is different from the previous known technologies and is novel, advanced and practical. Therefore, it can effectively improve the lack of knowledge and has considerable practicality in use.
綜觀上述,本創作實施例所揭露之具體構造,確實能提供該處理晶
片201之熱導除應用,本發明之該導熱片301可以封止該高比熱物質501,該高比熱物質501提升橫向導熱效果,可提升該處理晶片201之運作效能,且無需熱管之複雜導入程序,封裝程序所花費時間大幅縮短,以其整體結構而言,既未曾見諸於同類產品中,申請前亦未見公開,誠已符合專利法之法定要件,爰依法提出發明專利申請。
In summary, the specific structure disclosed in the embodiment of the present invention can indeed provide the heat conduction application of the
惟以上所述者,僅為本創作之一較佳實施例而已,當不能以此限定本創作實施之範圍,即大凡依本創作申請專利範圍及創作說明書內容所作之等效變化與修飾,皆應仍屬本創作專利涵蓋之範圍內。 However, the above is only a preferred embodiment of this creation, and it cannot be used to limit the scope of implementation of this creation. In other words, all equivalent changes and modifications made according to the scope of the patent application of this creation and the content of the creation specification should still fall within the scope of the patent of this creation.
101:電路基板 101: Circuit board
201:處理晶片 201: Processing chip
301:導熱片 301: Heat conducting sheet
401:金屬片 401:Metal sheet
501:高比熱物質 501: High specific heat material
Claims (8)
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| CN104813758A (en) * | 2012-11-21 | 2015-07-29 | 株式会社钟化 | heat dissipation structure |
| CN110168718A (en) * | 2017-02-24 | 2019-08-23 | 美光科技公司 | Semiconductor device assembly with electrically functional heat transfer structure |
| TWM615078U (en) * | 2021-03-04 | 2021-08-01 | 宸寰科技有限公司 | Thinned encapsulation binding structure |
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| CN104813758A (en) * | 2012-11-21 | 2015-07-29 | 株式会社钟化 | heat dissipation structure |
| CN110168718A (en) * | 2017-02-24 | 2019-08-23 | 美光科技公司 | Semiconductor device assembly with electrically functional heat transfer structure |
| TWM615078U (en) * | 2021-03-04 | 2021-08-01 | 宸寰科技有限公司 | Thinned encapsulation binding structure |
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