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TWI846002B - Laser detection system and vehicle - Google Patents

Laser detection system and vehicle Download PDF

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Publication number
TWI846002B
TWI846002B TW111129419A TW111129419A TWI846002B TW I846002 B TWI846002 B TW I846002B TW 111129419 A TW111129419 A TW 111129419A TW 111129419 A TW111129419 A TW 111129419A TW I846002 B TWI846002 B TW I846002B
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light
laser
detection system
scanner
light source
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TW111129419A
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Chinese (zh)
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TW202407381A (en
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曾國峰
楊紹瑋
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鴻海精密工業股份有限公司
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Abstract

The present disclosure provides a laser detection system including a light source module, an optical isolator, a scanner, and a detector. The light source module is used to emit first laser having a first polarization direction. The optical isolator is on an optical path of the first laser and is used to emit second laser according to the first laser from the light source module and prevent the second laser transmitting towards the light source module. The scanner is on an optical path of the second laser for reflecting the second laser to project reference light a target to be measured. The detector is used to receive detection light reflected by the target according to the reference light and generate position information of the target according to the detection light. The present disclosure also provides a vehicle.

Description

雷射探測系統及車輛 Laser detection system and vehicle

本申請涉及雷射探測技術領域,尤其涉及一種雷射探測系統及應用該雷射探測系統的車輛。 This application relates to the field of laser detection technology, and in particular to a laser detection system and a vehicle using the laser detection system.

一種傳統的雷射探測系統包括光源、分光鏡和探測器。光源用於發射探測光至分光鏡。入射至分光鏡的探測光難以全部被引導至探測物體,而存在一小部分探測光在雷射探測系統中多次散射。在雷射探測系統中多次散射的部分探測光可能會重新返回至光源,對光源造成干涉;也可能入射至探測器,影響探測器的探測結果。 A traditional laser detection system includes a light source, a spectroscope and a detector. The light source is used to emit detection light to the spectroscope. It is difficult for all the detection light incident on the spectroscope to be guided to the detection object, and a small part of the detection light is scattered multiple times in the laser detection system. Part of the detection light that is scattered multiple times in the laser detection system may return to the light source and interfere with the light source; it may also be incident on the detector and affect the detection result of the detector.

本申請第一方面提供一種雷射探測系統,包括:光源模組,用於發射第一雷射,所述第一雷射具有第一偏振方向;光隔離器,位於所述第一雷射的光路上,用於透過來自所述光源模組的所述第一雷射以出射第二雷射,還用於阻止朝向所述光源模組傳輸的所述第二雷射;掃描器,位於所述第二雷射的光路上,用於反射所述第二雷射以投射參考光至待測目標;以及探測器,用於接收所述待測目標根據所述參考光反射的探測光,並用於根據所述探測光獲取所述待測目標的位置信息。 The first aspect of the present application provides a laser detection system, comprising: a light source module, used to emit a first laser, the first laser having a first polarization direction; an optical isolator, located on the optical path of the first laser, used to transmit the first laser from the light source module to emit a second laser, and also used to block the second laser from being transmitted toward the light source module; a scanner, located on the optical path of the second laser, used to reflect the second laser to project a reference light to a target to be detected; and a detector, used to receive a detection light reflected by the target to be detected based on the reference light, and used to obtain the position information of the target to be detected based on the detection light.

本申請第二方面提供一種車輛,包括:車輛本體;如上述的雷射探測系統,所述雷射探測系統固定於所述車輛本體,用於探測所述車輛本體行進路徑上是否存在待測目標,並在存在待測目標時,獲取所述待測目標的距離信息。 The second aspect of the present application provides a vehicle, comprising: a vehicle body; a laser detection system as described above, the laser detection system being fixed to the vehicle body and used to detect whether there is a target to be detected on the path of the vehicle body, and when there is a target to be detected, obtaining the distance information of the target to be detected.

上述雷射探測系統,藉由設置光隔離器,使得第一雷射可以從光隔離器透射,從而被應用至後續的雷射探測過程;還使得後續光路中產生的雜散光無法從光隔離器通過,可避免雜散光入射至光源模組產生光線干擾的問題,進而有利於提升獲取到的待測目標的位置信息的準確度。 The above laser detection system, by setting up an optical isolator, allows the first laser to be transmitted through the optical isolator, and thus be applied to the subsequent laser detection process; it also prevents the stray light generated in the subsequent optical path from passing through the optical isolator, which can avoid the problem of stray light incident on the light source module to generate light interference, thereby helping to improve the accuracy of the position information of the target to be detected.

1:車輛 1: Vehicles

10:車輛本體 10: Vehicle body

11:控制系統 11: Control system

20:雷射探測系統 20: Laser detection system

21:光源模組 21: Light source module

211:雷射源 211: Laser source

212:波片組件 212: Wave plate assembly

213:二分之一波片 213: Half wave plate

214:四分之一波片 214: Quarter wave plate

215:擋光元件 215: Light blocking element

216:通光孔 216: Light hole

217:準直元件 217: Collimation element

22:光隔離器 22: Optical isolator

221:起偏器 221: Polarizer

222:法拉第旋轉器 222: Faraday rotator

223:檢偏器 223: Polarizer

23:掃描器 23: Scanner

24:探測器 24: Detector

25:分束器 25: Beam splitter

251:第一入光面 251: First light incident surface

252:第二入光面 252: Second light-entering surface

253:分光面 253: Spectral surface

26:濾光片 26: Filter

27:聚焦透鏡 27: Focusing lens

2:待測目標 2: Target to be tested

L1:光源光 L1: Light source

L2:第一雷射 L2: First Laser

L3:第二雷射 L3: Second laser

L4:參考光 L4: Reference light

L5:探測光 L5: Detection light

圖1為本申請實施例的車輛與待測目標的結構示意圖。 Figure 1 is a schematic diagram of the structure of the vehicle and the target to be measured in the embodiment of this application.

圖2為圖1中雷射探測系統的結構示意圖。 Figure 2 is a schematic diagram of the structure of the laser detection system in Figure 1.

圖3為圖2中波片組件的結構示意圖。 Figure 3 is a schematic diagram of the structure of the wave plate assembly in Figure 2.

圖4為圖2中擋光元件的結構示意圖。 Figure 4 is a schematic diagram of the structure of the light-blocking element in Figure 2.

圖5為圖2中光隔離器的結構示意圖。 Figure 5 is a schematic diagram of the structure of the optical isolator in Figure 2.

請參閱圖1,本申請提供的車輛1包括車輛本體10和固定於車輛本體10上的雷射探測系統20。 Please refer to Figure 1. The vehicle 1 provided in this application includes a vehicle body 10 and a laser detection system 20 fixed on the vehicle body 10.

在車輛1(或車輛本體10)的行進方向上可能出現障礙物(下稱待測目標2)。車輛1碰到待測目標2會阻礙行駛甚至損壞車輛。在車輛本體10行進過程中,雷射探測系統20用於持續探測車輛本體10行進路徑上是否存在待測目標2,當探測到存在待測目標2時,雷射探測系統20還用於獲取待測目標2的位置信息。本實施例中,距離信息包括待測目標2與車輛本體10之間的距離和待測目標2相對車輛本體的方位。車輛本體10還包括控制系統11,控制系統11可以與雷射探測系統20通信。當雷射探測系統20獲取到待測目標2的位置信息後,控制系統11可以以預設方式(例如圖像或語音)提醒駕駛人員注意待測目標2。因此本申請中的雷射探測系統20可用於在車輛1行進過程中提醒駕駛人員路況,從而有利於避免車輛本體10損壞。 Obstacles (hereinafter referred to as the target to be detected 2) may appear in the direction of travel of the vehicle 1 (or the vehicle body 10). If the vehicle 1 hits the target to be detected 2, it will hinder the driving or even damage the vehicle. During the movement of the vehicle body 10, the laser detection system 20 is used to continuously detect whether there is a target to be detected 2 on the path of the vehicle body 10. When the presence of the target to be detected 2 is detected, the laser detection system 20 is also used to obtain the position information of the target to be detected 2. In this embodiment, the distance information includes the distance between the target to be detected 2 and the vehicle body 10 and the orientation of the target to be detected 2 relative to the vehicle body. The vehicle body 10 also includes a control system 11, and the control system 11 can communicate with the laser detection system 20. When the laser detection system 20 obtains the position information of the target 2 to be detected, the control system 11 can remind the driver to pay attention to the target 2 to be detected in a preset manner (such as image or voice). Therefore, the laser detection system 20 in this application can be used to remind the driver of the road conditions while the vehicle 1 is moving, thereby helping to avoid damage to the vehicle body 10.

於本申請另一實施例中,車輛1為無人駕駛車輛。在該實施例中,控制系統11用於根據雷射探測系統20獲取的待測目標2的位置信息控制自動駕駛車輛本體10,以沿預設路徑行駛,並避開行駛路徑上的待測目標2。 In another embodiment of the present application, the vehicle 1 is an unmanned vehicle. In this embodiment, the control system 11 is used to control the automatic driving vehicle body 10 according to the position information of the target 2 to be detected obtained by the laser detection system 20, so as to drive along a preset path and avoid the target 2 to be detected on the driving path.

請參閱圖2,本實施例的雷射探測系統20,包括光源模組21、光隔離器22、掃描器23及探測器24。 Please refer to Figure 2. The laser detection system 20 of this embodiment includes a light source module 21, an optical isolator 22, a scanner 23 and a detector 24.

本實施例中,光源模組21包括雷射源211和波片組件212。 In this embodiment, the light source module 21 includes a laser source 211 and a wave plate assembly 212.

雷射源211用於發射光源光L1。本實施例中,雷射源211包括至少一個雷射二極體,用於發射紅外雷射。於其他實施例中,雷射源211還可以包括至少一個雷射器。本實施例中,光源光L1中一部分具有第一偏振方向,一部分具有第二偏振方向。也即,部分光源光L1為P偏振光,部分光源光L1為S偏振光。 The laser source 211 is used to emit the light source L1. In this embodiment, the laser source 211 includes at least one laser diode for emitting infrared laser. In other embodiments, the laser source 211 may also include at least one laser. In this embodiment, part of the light source L1 has a first polarization direction, and part has a second polarization direction. That is, part of the light source L1 is P polarized light, and part of the light source L1 is S polarized light.

波片組件212位於光源光L1的光路上,波片組件212用於接收光源光L1並用於轉換光源光L1的偏振方向。也即,當具有第一偏振方向的光源光L1入射至波片組件212時,將被波片組件212轉換為具有第二偏振方向;當具有第二偏振方向的光源光L1入射至波片組件212時,將被波片組件212轉換為具有第一偏振方向。換句話說,波片組件212用於將P偏振光轉換為S偏振光,並用於將S偏振光轉換為P偏振光。 The wave plate assembly 212 is located on the optical path of the light source L1. The wave plate assembly 212 is used to receive the light source L1 and to convert the polarization direction of the light source L1. That is, when the light source L1 with the first polarization direction is incident on the wave plate assembly 212, it will be converted by the wave plate assembly 212 to have the second polarization direction; when the light source L1 with the second polarization direction is incident on the wave plate assembly 212, it will be converted by the wave plate assembly 212 to have the first polarization direction. In other words, the wave plate assembly 212 is used to convert P polarized light into S polarized light, and to convert S polarized light into P polarized light.

本實施例中,由於雷射源211本身的結構特性,其發射的光源光L1中的S偏振光的量遠大於P偏振光的量(98%的S偏振光和2%的P偏振光),但後續光路中主要利用P偏振光,因此本實施例中藉由設置波片組件212轉換光源光L1的偏振方向,以使得經過波片組件212的光幾乎都為P偏振光,可在後續光路中被利用。因此,波片組件212有利於提升光利用率。 In this embodiment, due to the structural characteristics of the laser source 211 itself, the amount of S polarized light in the emitted light source light L1 is much greater than the amount of P polarized light (98% S polarized light and 2% P polarized light), but the subsequent optical path mainly uses P polarized light. Therefore, in this embodiment, the polarization direction of the light source light L1 is converted by setting a wave plate assembly 212 so that the light passing through the wave plate assembly 212 is almost all P polarized light, which can be used in the subsequent optical path. Therefore, the wave plate assembly 212 is conducive to improving the light utilization rate.

本實施例中,波片組件212包括一個二分之一波片213。於其他實施例中,波片組件212也可包括兩個依序設置的四分之一波片214(參圖3)。 In this embodiment, the wave plate assembly 212 includes a half wave plate 213. In other embodiments, the wave plate assembly 212 may also include two quarter wave plates 214 arranged in sequence (see FIG. 3).

本實施例中,光源模組21還包括擋光元件215。擋光元件215位於雷射源211與波片組件212之間。請參閱圖4,本實施例中,擋光元件215包括遮光材料,整體呈平板狀,且在靠近中心區域(幾何中心,例如圓的圓心、正方形的對角線交點)開設有通光孔216。擋光元件215上的通光孔216對應雷射源211設置,以使得光源光L1可從通光孔216透射出去。 In this embodiment, the light source module 21 also includes a light blocking element 215. The light blocking element 215 is located between the laser source 211 and the wave plate assembly 212. Please refer to Figure 4. In this embodiment, the light blocking element 215 includes a light shielding material, which is flat as a whole, and has a light hole 216 near the central area (geometric center, such as the center of a circle, the intersection of the diagonals of a square). The light hole 216 on the light blocking element 215 is set corresponding to the laser source 211, so that the light source light L1 can be transmitted through the light hole 216.

本實施例中,光源光L1從光源模組21出射後,一部分被後續的光路利用以實現雷射探測,另一部分難以被用作雷射探測,會在雷射探測系統20的各個光學元件之間傳播而被損耗,該部分下稱為雜散光。雜散光在傳播過程中,可能會入射至雷射源211而產生光線干擾。 In this embodiment, after the light source light L1 is emitted from the light source module 21, a part of it is used by the subsequent optical path to realize laser detection, and the other part is difficult to be used for laser detection and will be lost when propagating between the optical elements of the laser detection system 20. This part is hereinafter referred to as stray light. During the propagation process, the stray light may be incident on the laser source 211 and generate light interference.

因此本實施例中,擋光元件215上的通光孔216為圓形孔,其尺寸依照雷射源211的尺寸設置。也即,通光孔216的尺寸稍大於雷射源211的尺寸。如此,使得雷射源211發射的光源光L1盡可能都通過通光孔216。並且,由於擋 光元件215包括遮光材料,朝向光源模組21入射的雜散光會被擋光元件215的阻擋,雜散光若要到達雷射源211,必須要穿過通光孔216,而雜散光的傳播路徑比較雜亂,穿過通光孔216的概率極小。因此本實施例中擋光元件215可以一定程度避免雜散光入射至雷射源211而產生光線干擾。 Therefore, in this embodiment, the light hole 216 on the light blocking element 215 is a circular hole, and its size is set according to the size of the laser source 211. That is, the size of the light hole 216 is slightly larger than the size of the laser source 211. In this way, the light source light L1 emitted by the laser source 211 can pass through the light hole 216 as much as possible. In addition, since the light blocking element 215 includes a light shielding material, the stray light incident on the light source module 21 will be blocked by the light blocking element 215. If the stray light wants to reach the laser source 211, it must pass through the light hole 216. However, the propagation path of the stray light is relatively chaotic, and the probability of passing through the light hole 216 is extremely small. Therefore, in this embodiment, the light-blocking element 215 can prevent stray light from entering the laser source 211 and causing light interference to a certain extent.

請再參閱圖2,本實施例中,光源模組21還包括準直元件217。準直元件217位於雷射源211與擋光元件215之間並位於光源光L1的光路上,用於將來自雷射源211的光源光L1進行準直,以減小雷射源211的發散角,使得光源光L1順利通過通光孔216。光源光L1若不能通過通光孔216,將被損失掉。因此準直元件217有利於提升光源光L1的利用率。 Please refer to Figure 2 again. In this embodiment, the light source module 21 also includes a collimating element 217. The collimating element 217 is located between the laser source 211 and the light blocking element 215 and on the optical path of the light source light L1. It is used to collimate the light source light L1 from the laser source 211 to reduce the divergence angle of the laser source 211 so that the light source light L1 can pass through the light hole 216 smoothly. If the light source light L1 cannot pass through the light hole 216, it will be lost. Therefore, the collimating element 217 is conducive to improving the utilization rate of the light source light L1.

請參閱圖5,本實施例中,定義從波片組件212出射的光為第一雷射L2。光隔離器22位於第一雷射L2的光路上,用於接收第一雷射L2並根據第一雷射L2出射第二雷射L3,第二雷射L3相對於第一雷射L2的偏振方向旋轉45°。 Please refer to FIG. 5. In this embodiment, the light emitted from the wave plate assembly 212 is defined as the first laser L2. The optical isolator 22 is located on the optical path of the first laser L2, and is used to receive the first laser L2 and emit the second laser L3 according to the first laser L2. The polarization direction of the second laser L3 is rotated 45° relative to the first laser L2.

本實施例中,光隔離器22包括起偏器221、法拉第旋轉器222及檢偏器223。起偏器221、法拉第旋轉器222及檢偏器223依次位於第一雷射L2的光路上。第一雷射L2通過起偏器221後,轉換為線偏振光。經過法拉第旋轉器222時,第一雷射L2的偏振方向被旋轉45°。檢偏器223與起偏器221呈45°,偏振方向經旋轉後的第一雷射L2剛好可以從檢偏器223通過。定義從檢偏器223通過的光為上述的第二雷射L3。 In this embodiment, the optical isolator 22 includes a polarizer 221, a Faraday rotator 222, and an analyzer 223. The polarizer 221, the Faraday rotator 222, and the analyzer 223 are sequentially located on the optical path of the first laser L2. After passing through the polarizer 221, the first laser L2 is converted into linearly polarized light. When passing through the Faraday rotator 222, the polarization direction of the first laser L2 is rotated by 45°. The analyzer 223 is 45° with the polarizer 221, and the first laser L2 with the polarization direction rotated can just pass through the analyzer 223. The light passing through the analyzer 223 is defined as the second laser L3 mentioned above.

從檢偏器223出射的第二雷射L3在後續的光路中傳播時,可能被部分損耗。被損耗的部分可能會作為雜散光返回至光隔離器22。而當雜散光朝向光隔離器22傳播時,其依次經過檢偏器223、法拉第旋轉器222及起偏器221。此時只有與檢偏器223方向平行的雜散光可以通過檢偏器223並入射至法拉第旋轉器222。雜散光入射至法拉第旋轉器222時,其偏振方向會偏轉45°。如前述的,檢偏器223本身即與起偏器221具有45°夾角,雜散光又被偏轉45°,則從法拉第旋轉器222出射的雜散光與起偏器221的夾角為90°,也即從法拉第旋轉器222出射的雜散光與起偏器221的方向垂直,會被起偏器221阻擋而不會繼續朝向光源模組21傳播。因此本實施例中,用過設置光隔離器22,也可以避免雜散光入射至光源模組21以造成光線干擾。 The second laser L3 emitted from the analyzer 223 may be partially lost when propagating in the subsequent optical path. The lost part may return to the optical isolator 22 as stray light. When the stray light propagates toward the optical isolator 22, it passes through the analyzer 223, the Faraday rotator 222 and the polarizer 221 in sequence. At this time, only the stray light parallel to the direction of the analyzer 223 can pass through the analyzer 223 and enter the Faraday rotator 222. When the stray light enters the Faraday rotator 222, its polarization direction will be deflected by 45°. As mentioned above, the analyzer 223 itself has a 45° angle with the polarizer 221, and the stray light is deflected by 45°, so the stray light emitted from the Faraday rotator 222 has a 90° angle with the polarizer 221, that is, the stray light emitted from the Faraday rotator 222 is perpendicular to the direction of the polarizer 221, and will be blocked by the polarizer 221 and will not continue to propagate toward the light source module 21. Therefore, in this embodiment, by setting the optical isolator 22, stray light can also be prevented from being incident on the light source module 21 to cause light interference.

請再參閱圖2,掃描器23位於第二雷射L3的光路上,用於反射接收到的第二雷射L3。本實施例中,掃描器23還用於對接收到的第二雷射L3進行繞 射以產生參考光L4,參考光L4為結構光。本實施例中的掃描器23為電驅動式的掃描器。也即,藉由改變施加至掃描器23上的電壓值,可以改變掃描器23的旋轉角度。藉由改變掃描器23的旋轉角度,可以調製掃描器23所反射的光的相位,從而調製光發生干涉而產生相應的結構光(即參考光L4)。 Please refer to Figure 2 again. The scanner 23 is located on the optical path of the second laser L3 and is used to reflect the received second laser L3. In this embodiment, the scanner 23 is also used to circumvent the received second laser L3 to generate reference light L4, which is structured light. The scanner 23 in this embodiment is an electrically driven scanner. That is, by changing the voltage value applied to the scanner 23, the rotation angle of the scanner 23 can be changed. By changing the rotation angle of the scanner 23, the phase of the light reflected by the scanner 23 can be modulated, thereby modulating the light to interfere and generate the corresponding structured light (i.e., reference light L4).

如前述的,本申請的雷射探測系統20應用於車輛1上,也即本申請的雷射探測系統20為車載雷射探測系統。車輛在行駛過程中存在頻繁顛簸振動,這使得對掃描器23的抗振動能力要求較高。習知的機械式驅動的掃描器23容易因抖動發生偏轉誤差,而本申請中採用電驅動式的掃描器23,有利於提升掃描器23的工作穩定性。 As mentioned above, the laser detection system 20 of the present application is applied to the vehicle 1, that is, the laser detection system 20 of the present application is a vehicle-mounted laser detection system. The vehicle is frequently bumped and vibrated during driving, which requires a higher vibration resistance of the scanner 23. The known mechanically driven scanner 23 is prone to deflection errors due to jitter, while the electrically driven scanner 23 used in the present application is conducive to improving the working stability of the scanner 23.

本實施例中,雷射探測系統20還包括分束器25。分束器25位於第二雷射L3的光路上,用於將第二雷射L3引導至掃描器23。分束器25還位於參考光L4的光路上,用於將參考光L4引導至待測目標2。分束器25具有第一入光面251、第二入光面252及分光面253。本實施例中,第二雷射L3從第一入光面251垂直入射,參考光L4從第二入光面252垂直入射。且本實施例中,第二雷射L3入射至分光面253時部分被反射至掃描器23,另一部分沿原來的光路從分光面253透射。參考光L4入射至分光面253時部分被反射,另一部分沿原來的光路從分光面253透射。 In this embodiment, the laser detection system 20 further includes a beam splitter 25. The beam splitter 25 is located on the optical path of the second laser L3, and is used to guide the second laser L3 to the scanner 23. The beam splitter 25 is also located on the optical path of the reference light L4, and is used to guide the reference light L4 to the target 2 to be measured. The beam splitter 25 has a first light incident surface 251, a second light incident surface 252, and a splitting surface 253. In this embodiment, the second laser L3 is vertically incident from the first light incident surface 251, and the reference light L4 is vertically incident from the second light incident surface 252. In addition, in this embodiment, when the second laser L3 is incident on the splitting surface 253, part of it is reflected to the scanner 23, and the other part is transmitted from the splitting surface 253 along the original optical path. When the reference light L4 is incident on the splitter surface 253, part of it is reflected, and the other part is transmitted from the splitter surface 253 along the original light path.

進一步的,掃描器23還用於藉由分束器25將參考光L4引導至待測目標2上。當參考光L4照射待測目標2時會被待測目標2反射。本實施例中,定義待測目標2所反射的光為探測光L5。 Furthermore, the scanner 23 is also used to guide the reference light L4 to the target 2 to be measured through the beam splitter 25. When the reference light L4 irradiates the target 2 to be measured, it will be reflected by the target 2 to be measured. In this embodiment, the light reflected by the target 2 to be measured is defined as the detection light L5.

本實施例中,探測器24位於探測光L5的光路上,用於接收探測光L5,並根據探測光L5獲取待測目標2的位置信息。本實施例中,探測器24包括複數光電元件(圖未示),每一光電元件用於在接收到探測光L5時進行光電轉換以生成對應於探測光L5的感應電訊號,該感應電訊號可用於計算待測目標2的位置信息。 In this embodiment, the detector 24 is located on the optical path of the detection light L5, and is used to receive the detection light L5 and obtain the position information of the target 2 to be detected according to the detection light L5. In this embodiment, the detector 24 includes a plurality of photoelectric elements (not shown), each of which is used to perform photoelectric conversion when receiving the detection light L5 to generate a sensing electrical signal corresponding to the detection light L5, and the sensing electrical signal can be used to calculate the position information of the target 2 to be detected.

本實施例中,雷射探測系統20還包括濾光片26。濾光片26位於探測光L5的光路上,用於濾除環境光。如前述的,探測器24用於根據接收到的探測光L5獲取待測目標2的位置信息。而與探測光L5一起入射至探測器24上的光可能還包括環境光(雷射探測系統20所處環境中的光線)。但探測器24還接收到 環境光時,其獲取到的待測目標2的位置信息可能產生誤差。因此本實施例中藉由濾光片濾除環境光,有利於提升探測器24獲取的位置信息的精準度。 In this embodiment, the laser detection system 20 also includes a filter 26. The filter 26 is located on the optical path of the detection light L5 and is used to filter out ambient light. As mentioned above, the detector 24 is used to obtain the position information of the target 2 to be detected based on the received detection light L5. The light incident on the detector 24 together with the detection light L5 may also include ambient light (light in the environment where the laser detection system 20 is located). However, when the detector 24 also receives ambient light, the position information of the target 2 to be detected obtained by it may produce errors. Therefore, in this embodiment, filtering the ambient light by the filter is beneficial to improve the accuracy of the position information obtained by the detector 24.

本實施例中,雷射探測系統20還包括聚焦透鏡27。聚焦透鏡27位於探測光L5的光路上,且位於濾光片26與探測器24之間。由於待測目標2反射回的探測光L5存在較大的發散角,難以全部被探測器24接收。本實施例中藉由設置聚焦透鏡27聚焦探測光L5至探測器24,有利於提升探測光L5的光利用率,進而有利於提升位置信息的精準度。 In this embodiment, the laser detection system 20 also includes a focusing lens 27. The focusing lens 27 is located on the optical path of the detection light L5 and between the filter 26 and the detector 24. Since the detection light L5 reflected by the target 2 has a large divergence angle, it is difficult for all of it to be received by the detector 24. In this embodiment, by setting the focusing lens 27 to focus the detection light L5 to the detector 24, it is beneficial to improve the light utilization rate of the detection light L5, and thus to improve the accuracy of the position information.

在本申請的雷射探測系統20中,分束器25用於反射部分第二雷射L3和透射部分參考光L4,還用於透射另一部分第二雷射L3和反射另一部分參考光L4。其中被透射的另一部分第二雷射L3和被反射的另一部分參考光L4都難以被後續的光路用作雷射探測,而會被損失掉。上述被損失掉的光即作為雜散光在雷射探測系統20中傳播,一部分雜散光甚至會朝向光源模組21傳播,導致形成光線干擾。 In the laser detection system 20 of the present application, the beam splitter 25 is used to reflect part of the second laser L3 and transmit part of the reference light L4, and is also used to transmit another part of the second laser L3 and reflect another part of the reference light L4. The transmitted other part of the second laser L3 and the reflected other part of the reference light L4 are difficult to be used as laser detection by the subsequent optical path, and will be lost. The above-mentioned lost light is propagated in the laser detection system 20 as stray light, and part of the stray light will even propagate toward the light source module 21, resulting in light interference.

而本實施例中,藉由設置光隔離器22,使得第一雷射L2可以從光隔離器22透射,從而被應用至後續的雷射探測過程。還使得雜散光無法從光隔離器通過,可避免雜散光入射至光源模組21產生光線干擾。 In this embodiment, by providing the optical isolator 22, the first laser L2 can be transmitted through the optical isolator 22, and thus be applied to the subsequent laser detection process. It also prevents stray light from passing through the optical isolator, which can prevent stray light from entering the light source module 21 and generating light interference.

進一步的,本實施例中藉由設置擋光元件215,也可從物理結構上阻止雜散光進一步入射至雷射源211。 Furthermore, in this embodiment, by providing the light-blocking element 215, the stray light can be prevented from further incident on the laser source 211 from a physical structure perspective.

綜上,本申請的雷射探測系統20、雷射探測系統20應用的車輛1,可以有效避免雜散光入射至光源模組21產生光線干擾,從而有利於提升獲取到的待測目標2的位置信息的準確度。 In summary, the laser detection system 20 of the present application and the vehicle 1 using the laser detection system 20 can effectively prevent stray light from entering the light source module 21 to generate light interference, thereby helping to improve the accuracy of the position information of the target 2 to be detected.

本技術領域之普通技術人員應當認識到,以上之實施方式僅是用來說明本發明,而並非用作為對本發明之限定,只要於本發明之實質精神範圍之內,對以上實施例所作之適當改變及變化均落於本發明要求保護之範圍之內。 Ordinary technical personnel in this technical field should recognize that the above implementation methods are only used to illustrate the present invention, and are not used as limitations on the present invention. As long as they are within the spirit of the present invention, appropriate changes and modifications to the above implementation examples are within the scope of protection required by the present invention.

20:雷射探測系統 20: Laser detection system

21:光源模組 21: Light source module

211:雷射源 211: Laser source

212:波片組件 212: Wave plate assembly

213:二分之一波片 213: Half wave plate

215:擋光元件 215: Light blocking element

216:通光孔 216: Light hole

217:準直元件 217: Collimation element

22:光隔離器 22: Optical isolator

23:掃描器 23: Scanner

24:探測器 24: Detector

25:分束器 25: Beam splitter

251:第一入光面 251: First light incident surface

252:第二入光面 252: Second light-entering surface

253:分光面 253: Spectral surface

26:濾光片 26: Filter

27:聚焦透鏡 27: Focusing lens

2:待測目標 2: Target to be tested

L1:光源光 L1: Light source

L2:第一雷射 L2: First Laser

L3:第二雷射 L3: Second laser

L4:參考光 L4: Reference light

L5:探測光 L5: Detection light

Claims (9)

一種雷射探測系統,其改良在於,包括:光源模組,用於發射第一雷射,所述第一雷射具有第一偏振方向;光隔離器,位於所述第一雷射的光路上,用於透過來自所述光源模組的所述第一雷射以出射第二雷射,還用於阻止朝向所述光源模組傳輸的所述第二雷射,所述第二雷射具有不同於所述第一偏振方向的第二偏振方向;掃描器,位於所述第二雷射的光路上,用於反射所述第二雷射以投射參考光至待測目標,所述掃描器為電驅動式的掃描器,所述參考光為結構光;以及探測器,用於接收所述待測目標根據所述參考光反射的探測光,並用於根據所述探測光獲取所述待測目標的位置信息,所述探測器包括複數光電元件,每一所述光電元件用於在接收到所述探測光時進行光電轉換以生成感應電訊號,所述感應電訊號用於計算所述位置信息;其中,所述掃描器的電壓值用於改變所述掃描器的旋轉角度,所述旋轉角度用於調製所述掃描器反射的光的相位,所述相位用於調製所述掃描器反射的光發生干涉而產生所述結構光。 A laser detection system, which is improved in that it includes: a light source module, used to emit a first laser, the first laser having a first polarization direction; an optical isolator, located in the optical path of the first laser, used to transmit the first laser from the light source module to emit a second laser, and also used to block the second laser from being transmitted toward the light source module, the second laser having a second polarization direction different from the first polarization direction; a scanner, located in the optical path of the second laser, used to reflect the second laser to project a reference light to a target to be detected, the scanner is an electrically driven scanner, and the reference light is a structure light; and a detector for receiving the detection light reflected by the target to be measured according to the reference light, and for obtaining the position information of the target to be measured according to the detection light, the detector comprising a plurality of photoelectric elements, each of which is used to perform photoelectric conversion when receiving the detection light to generate an induction electrical signal, and the induction electrical signal is used to calculate the position information; wherein the voltage value of the scanner is used to change the rotation angle of the scanner, the rotation angle is used to modulate the phase of the light reflected by the scanner, and the phase is used to modulate the interference of the light reflected by the scanner to generate the structured light. 如請求項1所述的雷射探測系統,其中,所述光源模組包括:雷射源,用於發射光源光;以及波片組件,位於所述光源光的光路上,用於將至少部分所述光源光轉換為具有所述第一偏振方向的第一雷射。 The laser detection system as described in claim 1, wherein the light source module comprises: a laser source for emitting light source light; and a wave plate assembly located in the optical path of the light source light, for converting at least part of the light source light into a first laser having the first polarization direction. 如請求項2所述的雷射探測系統,其中,所述波片組件包括一二分之一波片或包括兩個四分之一波片。 A laser detection system as described in claim 2, wherein the wave plate assembly includes a half wave plate or two quarter wave plates. 如請求項2所述的雷射探測系統,其中,所述光源模組還包括擋光元件,所述擋光元件位於所述雷射源與所述波片組件之間;所述擋光元件包括遮光材料,所述擋光元件開設有通光孔,所述光源光從所述通光孔入射至所述波片組件。 The laser detection system as described in claim 2, wherein the light source module further includes a light-shielding element, and the light-shielding element is located between the laser source and the wave plate assembly; the light-shielding element includes a light-shielding material, and the light-shielding element is provided with a light-through hole, and the light from the light source is incident on the wave plate assembly from the light-through hole. 如請求項1或2所述的雷射探測系統,其中,所述第一雷射為P偏振光。 A laser detection system as described in claim 1 or 2, wherein the first laser is P-polarized light. 如請求項1所述的雷射探測系統,其中,還包括分束器,所述分束器位於所述第二雷射的光路上,用於引導部分所述第二雷射至所述掃描器;所述分束器還用於引導部分所述參考光至所述待測目標。 The laser detection system as described in claim 1, further comprising a beam splitter, the beam splitter being located in the optical path of the second laser and used to guide part of the second laser to the scanner; the beam splitter is also used to guide part of the reference light to the target to be detected. 如請求項6所述的雷射探測系統,其中,所述掃描器還用於繞射所接收到的所述第二雷射。 A laser detection system as described in claim 6, wherein the scanner is also used to diffract the received second laser. 如請求項1所述的雷射探測系統,其中,還包括濾光片,所述濾光片位於所述探測光的光路上,用於濾除環境光。 The laser detection system as described in claim 1 further includes a filter, which is located in the optical path of the detection light and is used to filter out ambient light. 一種車輛,其改良在於,包括:車輛本體;如請求項1至8中任一項所述的雷射探測系統,所述雷射探測系統固定於所述車輛本體,用於探測所述車輛本體行進路徑上是否存在待測目標,並在存在待測目標時,獲取所述待測目標的距離信息。 A vehicle, the improvement of which comprises: a vehicle body; a laser detection system as described in any one of claims 1 to 8, wherein the laser detection system is fixed to the vehicle body and is used to detect whether there is a target to be detected on the path of the vehicle body, and when there is a target to be detected, obtain the distance information of the target to be detected.
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