TWI841623B - Glass, glass powder, conductive paste and solar cell - Google Patents
Glass, glass powder, conductive paste and solar cell Download PDFInfo
- Publication number
- TWI841623B TWI841623B TW108140403A TW108140403A TWI841623B TW I841623 B TWI841623 B TW I841623B TW 108140403 A TW108140403 A TW 108140403A TW 108140403 A TW108140403 A TW 108140403A TW I841623 B TWI841623 B TW I841623B
- Authority
- TW
- Taiwan
- Prior art keywords
- glass
- mass
- electrode
- conductive paste
- solar cell
- Prior art date
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- 239000011521 glass Substances 0.000 title claims abstract description 187
- 239000000843 powder Substances 0.000 title claims abstract description 85
- 239000000758 substrate Substances 0.000 claims abstract description 112
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(iii) oxide Chemical compound O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 claims abstract description 33
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 30
- 238000006243 chemical reaction Methods 0.000 claims abstract description 27
- 239000002245 particle Substances 0.000 claims abstract description 25
- 229910011255 B2O3 Inorganic materials 0.000 claims abstract description 17
- 238000009826 distribution Methods 0.000 claims abstract description 13
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 12
- 235000012239 silicon dioxide Nutrition 0.000 claims abstract description 12
- 229910052681 coesite Inorganic materials 0.000 claims abstract description 11
- 229910052906 cristobalite Inorganic materials 0.000 claims abstract description 11
- 229910052682 stishovite Inorganic materials 0.000 claims abstract description 11
- 229910052905 tridymite Inorganic materials 0.000 claims abstract description 11
- ADCOVFLJGNWWNZ-UHFFFAOYSA-N antimony trioxide Inorganic materials O=[Sb]O[Sb]=O ADCOVFLJGNWWNZ-UHFFFAOYSA-N 0.000 claims abstract description 10
- YEAUATLBSVJFOY-UHFFFAOYSA-N tetraantimony hexaoxide Chemical compound O1[Sb](O2)O[Sb]3O[Sb]1O[Sb]2O3 YEAUATLBSVJFOY-UHFFFAOYSA-N 0.000 claims abstract description 10
- 230000001186 cumulative effect Effects 0.000 claims abstract description 8
- 229910052751 metal Inorganic materials 0.000 claims description 54
- 239000002184 metal Substances 0.000 claims description 54
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 23
- 229910052710 silicon Inorganic materials 0.000 claims description 23
- 239000010703 silicon Substances 0.000 claims description 23
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 14
- 229910052782 aluminium Inorganic materials 0.000 claims description 14
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 14
- 239000011230 binding agent Substances 0.000 claims description 13
- 239000011347 resin Substances 0.000 claims description 13
- 229920005989 resin Polymers 0.000 claims description 13
- 239000002904 solvent Substances 0.000 claims description 11
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 claims description 9
- 229910015902 Bi 2 O 3 Inorganic materials 0.000 claims description 9
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 9
- 229910052802 copper Inorganic materials 0.000 claims description 9
- 229910052709 silver Inorganic materials 0.000 claims description 9
- 229910052737 gold Inorganic materials 0.000 claims description 8
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 8
- 229910052763 palladium Inorganic materials 0.000 claims description 8
- 229910052697 platinum Inorganic materials 0.000 claims description 8
- SOGAXMICEFXMKE-UHFFFAOYSA-N Butylmethacrylate Chemical compound CCCCOC(=O)C(C)=C SOGAXMICEFXMKE-UHFFFAOYSA-N 0.000 claims description 6
- 239000001913 cellulose Substances 0.000 claims description 6
- 229920002678 cellulose Polymers 0.000 claims description 6
- 229910044991 metal oxide Inorganic materials 0.000 claims description 6
- 150000004706 metal oxides Chemical class 0.000 claims description 6
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 6
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical compound CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 claims description 5
- FPZWZCWUIYYYBU-UHFFFAOYSA-N 2-(2-ethoxyethoxy)ethyl acetate Chemical compound CCOCCOCCOC(C)=O FPZWZCWUIYYYBU-UHFFFAOYSA-N 0.000 claims description 4
- 239000004925 Acrylic resin Substances 0.000 claims description 4
- 229920000178 Acrylic resin Polymers 0.000 claims description 4
- 239000001856 Ethyl cellulose Substances 0.000 claims description 4
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 claims description 4
- WUOACPNHFRMFPN-UHFFFAOYSA-N alpha-terpineol Chemical compound CC1=CCC(C(C)(C)O)CC1 WUOACPNHFRMFPN-UHFFFAOYSA-N 0.000 claims description 4
- SQIFACVGCPWBQZ-UHFFFAOYSA-N delta-terpineol Natural products CC(C)(O)C1CCC(=C)CC1 SQIFACVGCPWBQZ-UHFFFAOYSA-N 0.000 claims description 4
- UYAAVKFHBMJOJZ-UHFFFAOYSA-N diimidazo[1,3-b:1',3'-e]pyrazine-5,10-dione Chemical compound O=C1C2=CN=CN2C(=O)C2=CN=CN12 UYAAVKFHBMJOJZ-UHFFFAOYSA-N 0.000 claims description 4
- 235000019325 ethyl cellulose Nutrition 0.000 claims description 4
- 229920001249 ethyl cellulose Polymers 0.000 claims description 4
- 229940116423 propylene glycol diacetate Drugs 0.000 claims description 4
- 229940116411 terpineol Drugs 0.000 claims description 4
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 claims description 3
- 229920002134 Carboxymethyl cellulose Polymers 0.000 claims description 3
- WOBHKFSMXKNTIM-UHFFFAOYSA-N Hydroxyethyl methacrylate Chemical compound CC(=C)C(=O)OCCO WOBHKFSMXKNTIM-UHFFFAOYSA-N 0.000 claims description 3
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 claims description 3
- 239000000020 Nitrocellulose Substances 0.000 claims description 3
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 claims description 3
- 239000001768 carboxy methyl cellulose Substances 0.000 claims description 3
- 235000010948 carboxy methyl cellulose Nutrition 0.000 claims description 3
- 239000008112 carboxymethyl-cellulose Substances 0.000 claims description 3
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 claims description 3
- SUPCQIBBMFXVTL-UHFFFAOYSA-N ethyl 2-methylprop-2-enoate Chemical compound CCOC(=O)C(C)=C SUPCQIBBMFXVTL-UHFFFAOYSA-N 0.000 claims description 3
- 229920000609 methyl cellulose Polymers 0.000 claims description 3
- 239000001923 methylcellulose Substances 0.000 claims description 3
- 235000010981 methylcellulose Nutrition 0.000 claims description 3
- 229920001220 nitrocellulos Polymers 0.000 claims description 3
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 claims description 3
- LNAZSHAWQACDHT-XIYTZBAFSA-N (2r,3r,4s,5r,6s)-4,5-dimethoxy-2-(methoxymethyl)-3-[(2s,3r,4s,5r,6r)-3,4,5-trimethoxy-6-(methoxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6r)-4,5,6-trimethoxy-2-(methoxymethyl)oxan-3-yl]oxyoxane Chemical compound CO[C@@H]1[C@@H](OC)[C@H](OC)[C@@H](COC)O[C@H]1O[C@H]1[C@H](OC)[C@@H](OC)[C@H](O[C@H]2[C@@H]([C@@H](OC)[C@H](OC)O[C@@H]2COC)OC)O[C@@H]1COC LNAZSHAWQACDHT-XIYTZBAFSA-N 0.000 claims description 2
- 229910052787 antimony Inorganic materials 0.000 claims description 2
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 claims description 2
- 230000000379 polymerizing effect Effects 0.000 claims description 2
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 claims description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 abstract description 61
- 239000000126 substance Substances 0.000 abstract description 6
- 239000010410 layer Substances 0.000 description 44
- 239000000203 mixture Substances 0.000 description 19
- 238000010298 pulverizing process Methods 0.000 description 18
- 239000008187 granular material Substances 0.000 description 17
- 238000000034 method Methods 0.000 description 15
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 8
- 239000010949 copper Substances 0.000 description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 239000011810 insulating material Substances 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 239000002994 raw material Substances 0.000 description 7
- 238000002425 crystallisation Methods 0.000 description 6
- 230000008025 crystallization Effects 0.000 description 6
- 229910052809 inorganic oxide Inorganic materials 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 239000000654 additive Substances 0.000 description 5
- 238000002844 melting Methods 0.000 description 5
- 230000008018 melting Effects 0.000 description 5
- 229910021364 Al-Si alloy Inorganic materials 0.000 description 4
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 229910052796 boron Inorganic materials 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 239000000047 product Substances 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 238000005245 sintering Methods 0.000 description 4
- DLYUQMMRRRQYAE-UHFFFAOYSA-N tetraphosphorus decaoxide Chemical compound O1P(O2)(=O)OP3(=O)OP1(=O)OP2(=O)O3 DLYUQMMRRRQYAE-UHFFFAOYSA-N 0.000 description 4
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 3
- 229910000676 Si alloy Inorganic materials 0.000 description 3
- CSDREXVUYHZDNP-UHFFFAOYSA-N alumanylidynesilicon Chemical compound [Al].[Si] CSDREXVUYHZDNP-UHFFFAOYSA-N 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 229910052593 corundum Inorganic materials 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 3
- 238000007650 screen-printing Methods 0.000 description 3
- 229910001845 yogo sapphire Inorganic materials 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- COHDHYZHOPQOFD-UHFFFAOYSA-N arsenic pentoxide Chemical compound O=[As](=O)O[As](=O)=O COHDHYZHOPQOFD-UHFFFAOYSA-N 0.000 description 2
- 239000012461 cellulose resin Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- GNTDGMZSJNCJKK-UHFFFAOYSA-N divanadium pentaoxide Chemical compound O=[V](=O)O[V](=O)=O GNTDGMZSJNCJKK-UHFFFAOYSA-N 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000010304 firing Methods 0.000 description 2
- 239000005357 flat glass Substances 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- 238000002354 inductively-coupled plasma atomic emission spectroscopy Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 description 2
- 239000000155 melt Substances 0.000 description 2
- 239000002923 metal particle Substances 0.000 description 2
- JKQOBWVOAYFWKG-UHFFFAOYSA-N molybdenum trioxide Chemical compound O=[Mo](=O)=O JKQOBWVOAYFWKG-UHFFFAOYSA-N 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- 230000009257 reactivity Effects 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 2
- 239000004408 titanium dioxide Substances 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- QPLDLSVMHZLSFG-UHFFFAOYSA-N CuO Inorganic materials [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 1
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 1
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 1
- FUJCRWPEOMXPAD-UHFFFAOYSA-N Li2O Inorganic materials [Li+].[Li+].[O-2] FUJCRWPEOMXPAD-UHFFFAOYSA-N 0.000 description 1
- KKCBUQHMOMHUOY-UHFFFAOYSA-N Na2O Inorganic materials [O-2].[Na+].[Na+] KKCBUQHMOMHUOY-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- LJCFOYOSGPHIOO-UHFFFAOYSA-N antimony pentoxide Inorganic materials O=[Sb](=O)O[Sb](=O)=O LJCFOYOSGPHIOO-UHFFFAOYSA-N 0.000 description 1
- GHPGOEFPKIHBNM-UHFFFAOYSA-N antimony(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Sb+3].[Sb+3] GHPGOEFPKIHBNM-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- ODINCKMPIJJUCX-UHFFFAOYSA-N calcium oxide Inorganic materials [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 description 1
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 description 1
- 239000011362 coarse particle Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000000110 cooling liquid Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- XUCJHNOBJLKZNU-UHFFFAOYSA-M dilithium;hydroxide Chemical compound [Li+].[Li+].[OH-] XUCJHNOBJLKZNU-UHFFFAOYSA-M 0.000 description 1
- 239000002270 dispersing agent Substances 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000004453 electron probe microanalysis Methods 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- 238000009689 gas atomisation Methods 0.000 description 1
- 238000009616 inductively coupled plasma Methods 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- YEXPOXQUZXUXJW-UHFFFAOYSA-N lead(II) oxide Inorganic materials [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 description 1
- VASIZKWUTCETSD-UHFFFAOYSA-N manganese(II) oxide Inorganic materials [Mn]=O VASIZKWUTCETSD-UHFFFAOYSA-N 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012768 molten material Substances 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 238000001579 optical reflectometry Methods 0.000 description 1
- 239000013618 particulate matter Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- NOTVAPJNGZMVSD-UHFFFAOYSA-N potassium monoxide Inorganic materials [K]O[K] NOTVAPJNGZMVSD-UHFFFAOYSA-N 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- IATRAKWUXMZMIY-UHFFFAOYSA-N strontium oxide Inorganic materials [O-2].[Sr+2] IATRAKWUXMZMIY-UHFFFAOYSA-N 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- ZNOKGRXACCSDPY-UHFFFAOYSA-N tungsten(VI) oxide Inorganic materials O=[W](=O)=O ZNOKGRXACCSDPY-UHFFFAOYSA-N 0.000 description 1
- 238000001132 ultrasonic dispersion Methods 0.000 description 1
- 238000004017 vitrification Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/062—Glass compositions containing silica with less than 40% silica by weight
- C03C3/064—Glass compositions containing silica with less than 40% silica by weight containing boron
- C03C3/066—Glass compositions containing silica with less than 40% silica by weight containing boron containing zinc
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/206—Electrodes for devices having potential barriers
- H10F77/211—Electrodes for devices having potential barriers for photovoltaic cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Conductive Materials (AREA)
- Photovoltaic Devices (AREA)
- Glass Compositions (AREA)
Abstract
本發明提供一種可於太陽能電池等之半導體基板上經由絕緣膜形成電極時抑制電極中產生粒狀物質而使獲得之電極之外觀良好、可保證製品之可靠性、且可提昇太陽能電池之轉換效率之玻璃及包含該玻璃之玻璃粉末、含有該玻璃粉末之導電糊及藉由使用該導電糊而提昇了轉換效率之太陽能電池。該玻璃之特徵在於:以氧化物換算之莫耳%表示時,包含40~60%之B2 O3 、5~25%之Bi2 O3 、20~30%之ZnO、2~7%之SiO2 、1~10%之Sb2 O3 、及0~10%之BaO;且玻璃粉末包含該玻璃,於將累積粒度分佈中之以體積為基準之50%粒徑設為D50 時,D50 為0.5~6.0 μm。The present invention provides a glass which can suppress the generation of granular substances in an electrode when an electrode is formed on a semiconductor substrate of a solar cell through an insulating film, thereby making the obtained electrode have a good appearance, ensuring the reliability of the product, and improving the conversion efficiency of the solar cell, as well as a glass powder containing the glass, a conductive paste containing the glass powder, and a solar cell with improved conversion efficiency by using the conductive paste. The glass is characterized in that, when expressed in mole % converted to oxides, it contains 40-60% B2O3 , 5-25% Bi2O3 , 20-30% ZnO, 2-7% SiO2 , 1-10% Sb2O3 , and 0-10% BaO; and the glass powder contains the glass, and when the 50% particle size based on volume in the cumulative particle size distribution is set as D50 , D50 is 0.5-6.0 μm.
Description
本發明係關於一種玻璃、玻璃粉末、導電糊及太陽能電池,尤其係關於一種適合用於太陽能電池之電極形成之玻璃、玻璃粉末、使用該玻璃粉末之導電糊、及具有藉由該導電糊而形成之電極之太陽能電池。The present invention relates to a glass, a glass powder, a conductive paste and a solar cell, and more particularly to a glass suitable for forming an electrode of a solar cell, a glass powder, a conductive paste using the glass powder, and a solar cell having an electrode formed by the conductive paste.
自先前以來,於矽(Si)等之半導體基板之上形成成為電極之導電層的電子裝置被用於各種用途中。成為該電極之導電層係藉由將使鋁(Al)或銀(Ag)、銅(Cu)等導電性金屬粉末及玻璃粉末分散於有機載體中之導電糊塗佈於半導體基板上、並於形成電極時所需之溫度下焙燒而形成。Electronic devices that have a conductive layer serving as an electrode formed on a semiconductor substrate such as silicon (Si) have been used in various applications. The conductive layer serving as the electrode is formed by applying a conductive paste in which conductive metal powder such as aluminum (Al), silver (Ag), copper (Cu), and glass powder are dispersed in an organic carrier on the semiconductor substrate and baking it at a temperature required for forming an electrode.
以此方式於半導體基板上形成電極時,存在於半導體基板之形成電極之整面上形成絕緣膜、且圖案狀之電極以部分貫通絕緣膜與半導體基板接觸之方式形成之情形。例如,於太陽能電池中,成為受光面之半導體基板上設置有抗反射膜,電極以圖案狀設置於其上。抗反射膜係用於保持充分之可見光透過率並降低表面反射率而提高受光效率者,通常包含氮化矽、二氧化鈦、二氧化矽、氧化鋁等絕緣材料。又,PERC(Passivated Emitter and Rear Contact)等太陽能電池中,於整個背面亦設置有包含與抗反射膜相同之絕緣材料之鈍化膜,且電極以部分與半導體基板接觸之形式形成於該鈍化膜上。When forming electrodes on a semiconductor substrate in this way, there is a case where an insulating film is formed on the entire surface of the semiconductor substrate on which the electrodes are formed, and the patterned electrodes are formed in a manner that partially penetrates the insulating film and contacts the semiconductor substrate. For example, in a solar cell, an anti-reflection film is provided on the semiconductor substrate that becomes the light-receiving surface, and the electrodes are provided thereon in a pattern. The anti-reflection film is used to maintain sufficient visible light transmittance and reduce surface reflectivity to improve light receiving efficiency, and usually includes insulating materials such as silicon nitride, titanium dioxide, silicon dioxide, and aluminum oxide. In solar cells such as PERC (Passivated Emitter and Rear Contact), a passivation film containing the same insulating material as the anti-reflection film is also provided on the entire back side, and an electrode is formed on the passivation film in a form of partially contacting the semiconductor substrate.
此處,形成上述電極時必須以使電極與半導體基板接觸之方式形成,受光面中,絕緣膜去除與電極之圖案對應之部分,於已去除絕緣膜之部分形成電極。又,PERC太陽能電池等之背面中,於可電性接觸之範圍內部分去除絕緣膜,於整個背面上形成電極。Here, when forming the above-mentioned electrode, it is necessary to form it in a manner that the electrode contacts the semiconductor substrate. In the light-receiving surface, the insulating film is removed from the portion corresponding to the electrode pattern, and the electrode is formed in the portion where the insulating film has been removed. In addition, in the back side of the PERC solar cell, the insulating film is partially removed within the range that can be electrically contacted, and the electrode is formed on the entire back side.
作為部分去除絕緣膜之方法,藉由利用雷射等物理地去除、並於已去除絕緣膜之部分形成電極而與半導體接觸,作為太陽能電池進行動作。先前之太陽能電池結構中,若Si等之半導體基板與背面電極整面直接接觸並形成電極,則藉由背面整面之接觸而作為太陽能電池進行動作。另一方面,若成為PERC太陽能電池等之結構,則被去除絕緣膜之部分之面積成為整個背面之中之1~3%左右,背面電極之大部分形成於絕緣膜上。As a method of partially removing the insulating film, the insulating film is physically removed by laser or the like, and an electrode is formed on the portion where the insulating film has been removed to contact the semiconductor, thereby operating as a solar cell. In the previous solar cell structure, if a semiconductor substrate such as Si is directly in contact with the entire surface of the back electrode to form an electrode, the entire back surface is contacted to operate as a solar cell. On the other hand, if a structure such as a PERC solar cell is used, the area of the portion where the insulating film is removed becomes about 1 to 3% of the entire back surface, and most of the back electrode is formed on the insulating film.
於半導體基板上形成電極之上述技術亦應用於在太陽能電池中之pn接合型之半導體基板上形成電極。作為此種含有玻璃粉末之導電糊,例如,專利文獻1中記載有於半導體元件等中形成電極時使用之導電性糊,並揭示有如下玻璃:作為具體的玻璃組成,以氧化物換算為含有29.0莫耳%之B2 O3 、33.8莫耳%之ZnO、30.4莫耳%之Bi2 O3 、6.0莫耳%之Al2 O3 、0.8莫耳%之SiO2 。然而,專利文獻1中記載之玻璃中,未充分地含有B2 O3 ,尤其於形成p型半導體基板中之太陽能電池之背面電極時較多作為載子之硼無法充分地擴散至Si基板中,故存在電氣特性劣化之問題。The above-mentioned technique for forming an electrode on a semiconductor substrate is also applied to forming an electrode on a pn junction type semiconductor substrate in a solar cell. As such a conductive paste containing glass powder, for example, Patent Document 1 describes a conductive paste used when forming an electrode in a semiconductor element, and discloses the following glass: as a specific glass composition, it contains 29.0 mol% B2O3 , 33.8 mol% ZnO, 30.4 mol% Bi2O3 , 6.0 mol% Al2O3 , and 0.8 mol% SiO2 in terms of oxides . However, the glass described in Patent Document 1 does not contain sufficient B 2 O 3 . In particular, when forming the back electrode of a solar cell in a p-type semiconductor substrate, boron, which is a carrier, cannot be sufficiently diffused into the Si substrate, resulting in a problem of deterioration of electrical characteristics.
作為太陽能電池之電極形成用玻璃,專利文獻2中揭示有以氧化物換算為含有66.7莫耳%之B2 O3 、33.3莫耳%之Bi2 O3 之玻璃。然而,專利文獻2中記載之玻璃中,於B2 O3 與Bi2 O3 之合計含量過多之組成中,例如,於背面電極中使用鋁之情形時,存在焙燒時生成具有鋁或鋁-矽合金組成之粒狀物質且焙燒後之背面電極之表面上該粒狀物質突出等產生外觀不良之問題。又,存在將太陽能電池單元進行模組化時以該粒狀物質之突出部位為起點而單元破損之問題。 [先前技術文獻] [專利文獻]Patent Document 2 discloses a glass containing 66.7 mol% B2O3 and 33.3 mol% Bi2O3 in terms of oxides as glass for forming electrodes of solar cells. However, in the glass described in Patent Document 2, when the combined content of B2O3 and Bi2O3 is too high, for example, when aluminum is used in the back electrode, there is a problem of poor appearance due to the generation of granular materials composed of aluminum or aluminum-silicon alloy during baking and the granular materials protruding from the surface of the back electrode after baking. In addition, there is a problem of damage to the cell due to the protruding parts of the granular materials when the solar cell cell is modularized. [Prior Art Document] [Patent Document]
[專利文獻1]日本專利特開2018-6064公報 [專利文獻2]日本專利特開2017-222543公報[Patent document 1] Japanese Patent Publication No. 2018-6064 [Patent document 2] Japanese Patent Publication No. 2017-222543
[發明所欲解決之問題][The problem the invention is trying to solve]
關於形成太陽能電池之電極時使用之B2 O3 -Bi2 O3 系玻璃,如專利文獻1或專利文獻2,大量開發有提昇電極之形成性之技術。然而,尤其是於PERC等太陽能電池中,現狀為,即使調整形成電極時使用之玻璃粉末之玻璃之組成或粉末之粒度分佈,亦不易兼顧一面抑制伴隨電極形成、電極中產生來自上述鋁或鋁-矽合金所代表之電極形成用金屬之粒狀物質,一面降低電極與半導體基板之電阻、提昇太陽能電池之轉換效率。即,兼顧提昇太陽能電池之轉換效率、及抑制形成電極時電極中產生粒狀物質而使外觀保持良好並保證製品之可靠性之技術尚在開發中。Regarding B2O3 - Bi2O3 glass used in forming the electrodes of solar cells, a large number of technologies for improving the formability of electrodes have been developed, such as Patent Document 1 or Patent Document 2. However, in particular in PERC solar cells, even if the glass composition or the particle size distribution of the glass powder used in forming the electrodes is adjusted, it is not easy to simultaneously suppress the generation of granular materials from the electrode forming metal represented by the aluminum or aluminum-silicon alloy mentioned above in the electrodes during the formation of the electrodes and reduce the resistance between the electrodes and the semiconductor substrate to improve the conversion efficiency of the solar cells. That is, the technology that can both improve the conversion efficiency of solar cells and suppress the generation of particulate matter in the electrode during electrode formation so as to maintain a good appearance and ensure the reliability of the product is still under development.
於形成電極時使用之玻璃中,本發明之目的在於提供一種可於太陽能電池等之半導體基板上經由絕緣膜形成電極時抑制電極中產生粒狀物質而使獲得之電極之外觀良好、並可保證製品之可靠性、且可提昇太陽能電池之轉換效率之玻璃。本發明之目的在於進而提供一種包含該玻璃之玻璃粉末、含有該玻璃粉末之導電糊及藉由使用該導電糊而使得製品之可靠性及轉換效率提昇之太陽能電池。 [解決問題之技術手段]The purpose of the present invention is to provide a glass used in forming electrodes, which can suppress the generation of granular materials in the electrode when the electrode is formed on a semiconductor substrate such as a solar cell through an insulating film, so that the obtained electrode has a good appearance, can ensure the reliability of the product, and can improve the conversion efficiency of the solar cell. The purpose of the present invention is to further provide a glass powder containing the glass, a conductive paste containing the glass powder, and a solar cell that improves the reliability and conversion efficiency of the product by using the conductive paste. [Technical means for solving the problem]
本發明提供以下構成之玻璃、玻璃粉末、導電糊及太陽能電池。 [1]一種玻璃,其特徵在於:以氧化物換算之莫耳%表示時,包含40%以上60%以下之B2 O3 、5%以上25%以下之Bi2 O3 、20%以上30%以下之ZnO、2%以上7%以下之SiO2 、1%以上10%以下之Sb2 O3 、及0%以上10%以下之BaO。 [2]一種玻璃粉末,其包含如[1]所記載之玻璃,且將累積粒度分佈中之以體積為基準之50%粒徑設為D50 時,D50 為0.5 μm以上6.0 μm以下。 [3]一種導電糊,其含有如[2]所記載之玻璃粉末、導電性金屬粉末、及有機載體。The present invention provides glass, glass powder, conductive paste and solar cell having the following compositions. [1] A glass characterized by comprising, in terms of mole % of oxides, 40% to 60% B2O3, 5% to 25% Bi2O3 , 20 % to 30% ZnO, 2% to 7 % SiO2, 1% to 10% Sb2O3 and 0% to 10% BaO . [2] A glass powder comprising the glass described in [1], wherein D50 is 0.5 μm to 6.0 μm when the 50% particle size based on volume in the cumulative particle size distribution is defined as D50 . [3] A conductive paste comprising the glass powder described in [2], conductive metal powder and an organic carrier.
[4]一種太陽能電池,其具備使用如[3]所記載之導電糊而形成之電極。 [5]一種導電糊,其係包含金屬、玻璃、及有機載體者,其特徵在於:相對於上述導電糊之總質量,包含63.0質量%以上97.9質量%以下之上述金屬,且上述金屬包含選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種,相對於上述金屬100質量份,包含0.1質量份以上9.8質量份以下之上述玻璃,該上述玻璃以氧化物換算之莫耳%表示時,包含40%以上60%以下之B2 O3 、5%以上25%以下之Bi2 O3 、20%以上30%以下之ZnO、2%以上7%以下之SiO2 、1%以上10%以下之Sb2 O3 、及0%以上10%以下之BaO,相對於上述導電糊之總質量,包含2質量%以上30質量%以下之上述有機載體。[4] A solar cell having electrodes formed using the conductive paste as described in [3]. [5] A conductive paste comprising a metal, a glass, and an organic carrier, wherein: the conductive paste comprises 63.0 mass % to 97.9 mass % of the metal, the metal comprising at least one selected from the group consisting of Al, Ag, Cu, Au, Pd, and Pt, the glass comprising 0.1 mass % to 9.8 mass % of the glass, relative to 100 mass % of the metal, and the glass comprising, in terms of mole % converted to oxides, 40 mass % to 60 mass % of B2O3 , 5 mass % to 25 mass % of Bi2O3 , 20 mass % to 30 mass % of ZnO, 2 mass % to 7 mass % of SiO2 , and 1 mass % to 10 mass % of Sb2O3 , and BaO in an amount of not less than 0% and not more than 10%, and the conductive paste contains not less than 2% by mass and not more than 30% by mass of the organic carrier relative to the total mass of the conductive paste.
[6]如[5]所記載之導電糊,其中於將累積粒度分佈中之以體積為基準之50%粒徑設為D50 時,上述玻璃係D50 為0.5 μm以上6.0 μm以下之玻璃粉末。 [7]如[5]或[6]所記載之導電糊,其中上述金屬包含Al。 [8]如[5]至[7]中任一項所記載之導電糊,其中上述有機載體為使有機樹脂黏合劑溶解於溶劑之有機樹脂黏合劑溶液,上述有機樹脂黏合劑包含選自由使選自由甲基丙烯酸甲酯、甲基丙烯酸乙酯、甲基丙烯酸丁酯、甲基丙烯酸2-羥基乙酯、丙烯酸丁酯、及丙烯酸2-羥基乙酯所組成之群中之1種以上聚合而獲得之丙烯酸系樹脂、甲基纖維素、乙基纖維素、羧基甲基纖維素、氧基乙基纖維素、苄基纖維素、丙基纖維素、及硝基纖維素所組成之群中之至少1種,上述溶劑包含選自由二乙二醇單丁醚、松油醇、二乙二醇丁醚乙酸酯、二乙二醇乙醚乙酸酯、丙二醇二乙酸酯、及甲基乙基酮所組成之群中之至少1種。[6] The conductive paste as described in [5], wherein the glass is a glass powder having a D50 of 0.5 μm or more and 6.0 μm or less when the 50% particle size based on volume in the cumulative particle size distribution is set as D50 . [7] The conductive paste as described in [5] or [6], wherein the metal comprises Al. [8] The conductive paste as described in any one of [5] to [7], wherein the organic carrier is an organic resin binder solution in which an organic resin binder is dissolved in a solvent, and the organic resin binder comprises one or more selected from the group consisting of methyl methacrylate, ethyl methacrylate, butyl methacrylate, 2-hydroxyethyl methacrylate, butyl acrylate, and 2-hydroxyethyl acrylate. The present invention relates to an acrylic resin obtained by polymerization, methyl cellulose, ethyl cellulose, carboxymethyl cellulose, oxyethyl cellulose, benzyl cellulose, propyl cellulose, and nitrocellulose, and the solvent comprises at least one selected from the group consisting of diethylene glycol monobutyl ether, terpineol, diethylene glycol butyl ether acetate, diethylene glycol ethyl ether acetate, propylene glycol diacetate, and methyl ethyl ketone.
[9]一種太陽能電池,其係具備:具有太陽光受光面之矽基板、設置於上述矽基板之上述太陽光受光面側之第1絕緣膜、設置於上述矽基板之與上述太陽光受光面為相反側之面之具有至少一個開口部之第2絕緣膜、經由上述第2絕緣膜之上述開口部與上述矽基板部分接觸之第2電極、及貫通上述第1絕緣膜之一部分而與上述矽基板接觸之第1電極者,其特徵在於:上述第2電極包含含有選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種之金屬、及以氧化物換算之莫耳%表示時,包含40%以上60%以下之B2 O3 、5%以上25%以下之Bi2 O3 、20%以上30%以下之ZnO、2%以上7%以下之SiO2 、1%以上10%以下之Sb2 O3 、及0%以上10%以下之BaO之玻璃。[9] A solar cell comprising: a silicon substrate having a solar light receiving surface; a first insulating film disposed on the solar light receiving surface side of the silicon substrate; a second insulating film having at least one opening disposed on the surface of the silicon substrate opposite to the solar light receiving surface; and a first insulating film disposed on the surface of the silicon substrate opposite to the solar light receiving surface. The second electrode in contact with the silicon substrate and the first electrode penetrating a portion of the first insulating film and in contact with the silicon substrate are characterized in that the second electrode comprises a glass containing at least one metal selected from the group consisting of Al, Ag, Cu, Au, Pd and Pt , and, when expressed in mole % converted to oxides, comprises 40% to 60% of B2O3 , 5% to 25% of Bi2O3 , 20% to 30% of ZnO, 2% to 7% of SiO2 , 1 % to 10% of Sb2O3 , and 0% to 10% of BaO.
[10]如[9]所記載之太陽能電池,其中上述第2電極包含90質量%以上99.9質量%以下之上述金屬、包含0.1質量%以上10質量%以下之上述玻璃。 [11]如[9]或[10]所記載之太陽能電池,其中上述第2電極中包含之金屬至少包含Al。 [12]如[9]至[11]中任一項所記載之太陽能電池,其中上述第1電極包含至少含有Ag之金屬。 [13]如[9]至[12]中任一項所記載之太陽能電池,其中上述第1絕緣膜包含氮化矽。 [14]如[9]至[13]中任一項所記載之太陽能電池,其中上述第2絕緣膜具備與上述矽基板之與上述太陽光受光面為相反側之面相接之包含氧化鋁或氧化矽之氧化金屬膜、及進而位於上述氧化金屬膜上之氮化矽膜。 [發明之效果][10] The solar cell described in [9], wherein the second electrode contains 90 mass % to 99.9 mass % of the metal and 0.1 mass % to 10 mass % of the glass. [11] The solar cell described in [9] or [10], wherein the metal contained in the second electrode contains at least Al. [12] The solar cell described in any one of [9] to [11], wherein the first electrode contains a metal containing at least Ag. [13] The solar cell described in any one of [9] to [12], wherein the first insulating film contains silicon nitride. [14] A solar cell as described in any one of [9] to [13], wherein the second insulating film comprises a metal oxide film comprising aluminum oxide or silicon oxide in contact with the surface of the silicon substrate opposite to the solar light receiving surface, and a silicon nitride film located on the metal oxide film. [Effect of the invention]
若將本發明之玻璃、及包含該玻璃之玻璃粉末與導電性成分一同用於導電糊,則於太陽能電池等之半導體基板上經由絕緣膜形成電極時可抑制電極中產生粒狀物質、使獲得之電極之外觀良好、並且可藉由充分地確保與絕緣膜及半導體基板之接觸而保證製品之可靠性。又,本發明之玻璃、及包含該玻璃之玻璃粉末含有硼,形成電極時可使玻璃所含有之硼擴散至半導體基板之例如p型層中,藉此可形成良好的p+層從而提昇太陽能電池之轉換效率。If the glass of the present invention and the glass powder containing the glass are used together with a conductive component in a conductive paste, when forming an electrode through an insulating film on a semiconductor substrate of a solar cell, the generation of granular materials in the electrode can be suppressed, so that the appearance of the obtained electrode is good, and the reliability of the product can be guaranteed by fully ensuring the contact with the insulating film and the semiconductor substrate. In addition, the glass of the present invention and the glass powder containing the glass contain boron, and when forming an electrode, the boron contained in the glass can be diffused into, for example, a p-type layer of the semiconductor substrate, thereby forming a good p+ layer and improving the conversion efficiency of the solar cell.
尤其,已知於PERC太陽能電池等中之使用Al之背面電極中,焙燒時產生具有鋁或鋁-矽合金組成之粒狀物質。於形成此種電極時,藉由本發明之玻璃抑制該粒狀物質之產生之效果顯著。藉此,於使太陽能電池單元模組化時,可抑制源於產生之粒狀物質之突出部位之單元之破損等,可謀求生產性之提昇。In particular, it is known that in the back electrode using Al in PERC solar cells, granular materials having an aluminum or aluminum-silicon alloy composition are generated during firing. When forming such an electrode, the glass of the present invention has a significant effect in suppressing the generation of the granular materials. Thus, when modularizing solar cell units, damage to the unit due to the protruding parts of the generated granular materials can be suppressed, and productivity can be improved.
於本發明中,可提供一種藉由含有該玻璃粉末,從而可伴隨著使用該玻璃粉末之電極形成而提昇太陽能電池之轉換效率之導電糊、及藉由使用該導電糊而使得轉換效率提昇之太陽能電池。The present invention can provide a conductive paste containing the glass powder, thereby improving the conversion efficiency of a solar cell when an electrode is formed using the glass powder, and a solar cell having improved conversion efficiency by using the conductive paste.
以下針對本發明之實施形態進行說明。 <玻璃> 本發明之玻璃以氧化物換算之莫耳%表示時,包含40~60%之B2 O3 、5~25%之Bi2 O3 、20~30%之ZnO、2~7%之SiO2 、1~10%之Sb2 O3 、及0~10%之BaO。於以下說明中,只要無特別聲明,則玻璃之各成分之含量中之「%」之表示為氧化物換算之莫耳%表示。於本說明書中,表示數值範圍之「~」包含上下限。The following is a description of the embodiments of the present invention. <Glass> The glass of the present invention contains 40-60% B2O3 , 5-25% Bi2O3 , 20-30% ZnO , 2-7% SiO2 , 1-10% Sb2O3 , and 0-10% BaO when expressed in mole % in terms of oxide conversion. In the following description, unless otherwise stated, "%" in the content of each component of the glass is expressed in mole % in terms of oxide conversion. In this specification, "~" indicating a numerical range includes both upper and lower limits.
本發明之玻璃中之各成分之含量係根據獲得之玻璃之感應耦合電漿(ICP-AES:Inductively Coupled Plasma-Atomic Emission Spectroscopy)分析或電子探針微量分析器(EPMA:Electron Probe Micro Analyzer)分析之結果而求出。The content of each component in the glass of the present invention is obtained based on the results of inductively coupled plasma (ICP-AES: Inductively Coupled Plasma-Atomic Emission Spectroscopy) analysis or electron probe micro analyzer (EPMA: Electron Probe Micro Analyzer) analysis of the obtained glass.
於本發明之玻璃中,B2 O3 為必需之成分。B2 O3 具有提昇玻璃之軟化流動性、提昇使用含有該玻璃之導電糊而獲得之電極與絕緣膜及半導體基板之接觸性之功能。又,B2 O3 係使玻璃穩定化之成分。以下,於玻璃成分之說明中,「導電糊」意指「含有本發明之玻璃之導電糊」,「電極」意指「使用含有本發明之玻璃之導電糊而獲得之電極」。In the glass of the present invention, B 2 O 3 is an essential component. B 2 O 3 has the function of improving the softening fluidity of the glass and improving the contact between the electrode obtained by using the conductive paste containing the glass and the insulating film and the semiconductor substrate. In addition, B 2 O 3 is a component that stabilizes the glass. Hereinafter, in the description of the glass components, "conductive paste" means "conductive paste containing the glass of the present invention", and "electrode" means "electrode obtained by using the conductive paste containing the glass of the present invention".
進而,B2 O3 藉由使玻璃流動,從而可促進半導體基板與導電糊中之玻璃直接反應。藉此,例如,於半導體基板為pn接合型之Si半導體基板之情形時,玻璃可形成與電極接觸之p+ 層或n+ 層。例如,於形成與p+ 層接觸之電極時,可促進將作為玻璃所含有之成分之B2 O3 作為B擴散至p+ 層,可形成更良好的p+ 層。Furthermore , B2O3 can promote direct reaction between the semiconductor substrate and the glass in the conductive paste by making the glass flow. Thus, for example, when the semiconductor substrate is a pn junction type Si semiconductor substrate, the glass can form a p + layer or n + layer in contact with the electrode. For example, when forming an electrode in contact with the p + layer, B2O3 , which is a component contained in the glass, can be promoted to diffuse into the p + layer as B, and a better p + layer can be formed.
本發明之玻璃以40%以上60%以下之比率含有B2 O3 。若B2 O3 之含量未達40%,則形成電極時無法使B充分地擴散至Si半導體基板中,故例如存在無法提昇太陽能電池中之轉換效率之情況。進而,B2 O3 係玻璃之網狀結構形成成分,若未達40%,則無法進行玻璃化。B2 O3 之含量較佳為45%以上。另一方面,若B2 O3 之含量超過60%,則形成電極時玻璃與半導體基板過度反應而於電極中產生粒狀物質。B2 O3 之含量較佳為59%以下。The glass of the present invention contains B 2 O 3 at a ratio of not less than 40% and not more than 60%. If the content of B 2 O 3 is less than 40%, B cannot be sufficiently diffused into the Si semiconductor substrate when forming an electrode, so, for example, there is a situation where the conversion efficiency in a solar cell cannot be improved. Furthermore, B 2 O 3 is a component that forms the network structure of the glass, and if it does not reach 40%, vitrification cannot be performed. The content of B 2 O 3 is preferably not less than 45%. On the other hand, if the content of B 2 O 3 exceeds 60%, the glass and the semiconductor substrate over-react when forming an electrode to produce granular substances in the electrode. The content of B 2 O 3 is preferably not more than 59%.
於本發明之玻璃中,Bi2 O3 係必需之成分。Bi2 O3 具有提昇玻璃之軟化流動性、提昇電極與絕緣膜及半導體基板之接觸性之功能。又,玻璃中之Bi2 O3 被還原而生成之金屬Bi粒子藉由共晶反應而使導電性金屬之粒子之熔融溫度降低。其結果為,導電性金屬之粒子朝半導體基板擴散而形成p+ 層,或進一步提高p+ 層之性能,有助於太陽能電池中之轉換效率提昇。於導電性金屬為Al之情形時,該效果尤其高。In the glass of the present invention, Bi2O3 is an essential component. Bi2O3 has the function of improving the softening fluidity of the glass and improving the contact between the electrode and the insulating film and the semiconductor substrate. In addition, the metal Bi particles generated by the reduction of Bi2O3 in the glass reduce the melting temperature of the conductive metal particles through the eutectic reaction. As a result, the conductive metal particles diffuse toward the semiconductor substrate to form a p + layer, or further improve the performance of the p + layer, which helps to improve the conversion efficiency in the solar cell. When the conductive metal is Al, the effect is particularly high.
Bi2 O3 進而具有藉由使玻璃流動從而促進半導體基板與玻璃直接反應之功能。藉此,可促進將玻璃中之B2 O3 作為B而擴散至半導體基板之p+ 層,可形成更良好的p+ 層。本發明之玻璃以5%以上25%以下之比率含有Bi2 O3 。若Bi2 O3 之含量未達5%,則玻璃之軟化點變高,故流動性降低,與半導體基板之反應變得不充分。Bi2 O3 之含量較佳為7%以上,更佳為10%以上。另一方面,若Bi2 O3 之含量超過25%,則無法藉由結晶化獲得玻璃。Bi2 O3 之含量較佳為22%以下,更佳為20%以下 。Bi 2 O 3 further has the function of promoting the direct reaction between the semiconductor substrate and the glass by making the glass flow. In this way, the diffusion of B 2 O 3 in the glass as B to the p + layer of the semiconductor substrate can be promoted, and a better p + layer can be formed. The glass of the present invention contains Bi 2 O 3 at a ratio of not less than 5% and not more than 25%. If the content of Bi 2 O 3 is less than 5%, the softening point of the glass becomes higher, so the fluidity decreases and the reaction with the semiconductor substrate becomes insufficient. The content of Bi 2 O 3 is preferably not less than 7%, and more preferably not less than 10%. On the other hand, if the content of Bi 2 O 3 exceeds 25%, glass cannot be obtained by crystallization. The content of Bi 2 O 3 is preferably not more than 22%, and more preferably not more than 20%.
於本發明之玻璃中,ZnO係必需之成分。ZnO係可抑制玻璃之結晶化、提昇玻璃與Si基板等半導體基板上之絕緣膜或Si基板之反應性之成分。本發明之玻璃以20%以上30%以下之比率含有ZnO。若ZnO之含量未達20%,則玻璃與Si基板等半導體基板上之絕緣膜或Si基板之反應性變差,接合強度變弱,電極與半導體基板之電阻變高。ZnO之含量較佳為22%以上。若ZnO之含量超過30%,則形成電極時玻璃與半導體基板過度反應、電極中產生粒狀物質。ZnO之含量較佳為29%以下。In the glass of the present invention, ZnO is an essential component. ZnO is a component that can inhibit the crystallization of glass and enhance the reactivity of glass with insulating films or Si substrates on semiconductor substrates such as Si substrates. The glass of the present invention contains ZnO at a ratio of 20% to 30%. If the ZnO content is less than 20%, the reactivity of glass with insulating films or Si substrates on semiconductor substrates such as Si substrates will deteriorate, the bonding strength will weaken, and the resistance between the electrode and the semiconductor substrate will increase. The ZnO content is preferably 22% or more. If the ZnO content exceeds 30%, the glass and the semiconductor substrate will over-react when the electrode is formed, and granular substances will be generated in the electrode. The ZnO content is preferably 29% or less.
於本發明之玻璃中,SiO2 係必需之成分。藉由含有SiO2 可使玻璃穩定化。本發明之玻璃以2%以上7%以下之比率含有SiO2 。若SiO2 之含量未達2%,則不易藉由結晶化獲得玻璃,作為太陽能電池之特性無法獲得長期可靠性。SiO2 之含量較佳為3%以上,更佳為5%以上。若SiO2 之含量超過7%,則玻璃轉移點上升,故燒結時玻璃變得無法流動。SiO2 之含量較佳為6%以下。In the glass of the present invention, SiO 2 is an essential component. By containing SiO 2 , the glass can be stabilized. The glass of the present invention contains SiO 2 at a ratio of 2% to 7%. If the content of SiO 2 is less than 2%, it is difficult to obtain glass by crystallization, and long-term reliability as a characteristic of solar cells cannot be obtained. The content of SiO 2 is preferably 3% or more, and more preferably 5% or more. If the content of SiO 2 exceeds 7%, the glass transition point rises, so the glass becomes unable to flow during sintering. The content of SiO 2 is preferably 6% or less.
於本發明之玻璃中,Sb2 O3 係必需之成分。藉由含有Sb2 O3 可使玻璃穩定化。本發明之玻璃以1%以上10%以下之比率含有Sb2 O3 。若Sb2 O3 之含量未達1%,則不易藉由結晶化獲得玻璃,作為太陽能電池之特性無法獲得長期可靠性。Sb2 O3 之含量較佳為2%以上,更佳為3%以上。若Sb2 O3 之含量超過10%,則玻璃轉移點上升,故燒結時玻璃變得無法流動。Sb2 O3 之含量較佳為8%以下,更佳為5%以下。In the glass of the present invention, Sb 2 O 3 is an essential component. By containing Sb 2 O 3 , the glass can be stabilized. The glass of the present invention contains Sb 2 O 3 at a ratio of 1% to 10%. If the content of Sb 2 O 3 is less than 1%, it is difficult to obtain glass by crystallization, and long-term reliability as a characteristic of solar cells cannot be obtained. The content of Sb 2 O 3 is preferably 2% or more, and more preferably 3% or more. If the content of Sb 2 O 3 exceeds 10%, the glass transition point increases, so the glass becomes unable to flow during sintering. The content of Sb 2 O 3 is preferably 8% or less, and more preferably 5% or less.
於本發明之玻璃中,BaO係降低電極與半導體基板之接觸電阻成分之成分。又,BaO即使作為玻璃成分亦可作為修飾氧化物使其穩定化。本發明之玻璃中之BaO之含量為0%以上10%以下。BaO之含量較佳為1%以上。若BaO之含量超過10%,則無法藉由結晶化獲得玻璃。BaO之含量較佳為5%以下。In the glass of the present invention, BaO is a component that reduces the contact resistance between the electrode and the semiconductor substrate. Moreover, even if BaO is a glass component, it can also be stabilized as a modified oxide. The content of BaO in the glass of the present invention is 0% to 10%. The content of BaO is preferably 1% or more. If the content of BaO exceeds 10%, it is impossible to obtain glass by crystallization. The content of BaO is preferably 5% or less.
本發明之玻璃還可含有除該等以外之其他任意成分。作為其他任意成分,具體而言,可列舉:PbO、P2 O5 、V2 O5 、Sb2 O5 、As2 O5 、Li2 O、Na2 O、K2 O、ZrO2 、Fe2 O3 、CuO、SnO2 、MgO、CaO、SrO、Al2 O3 、MnO、MnO2 、CeO2 、TiO2 、MoO3 、WO3 等通常玻璃中使用之各種氧化物成分。該等其他任意成分根據目的不同,可單獨使用1種或組合使用2種以上。其他任意成分之含量較佳為合計5%以下。The glass of the present invention may also contain other optional components in addition to the above. Specifically, the other optional components include: PbO, P2O5 , V2O5 , Sb2O5 , As2O5 , Li2O , Na2O , K2O , ZrO2 , Fe2O3 , CuO , SnO2 , MgO, CaO, SrO, Al2O3 , MnO , MnO2 , CeO2 , TiO2 , MoO3 , WO3 and other oxide components commonly used in glass. These other optional components may be used alone or in combination of two or more depending on the purpose. The content of the other optional components is preferably 5 % or less in total.
本發明之玻璃之製造方法並無特別限制。例如,可利用以下所示之方法製造。The manufacturing method of the glass of the present invention is not particularly limited. For example, it can be manufactured by the method shown below.
首先,準備原料混合物。原料只要為製造通常之氧化物系之玻璃時所使用之原料,則並無特別限制。可使用氧化物或碳酸鹽等。於獲得之玻璃中,以成為上述組成範圍之方式適當調整原料之種類及比率製成原料混合物。First, a raw material mixture is prepared. The raw materials are not particularly limited as long as they are raw materials used in the production of ordinary oxide-based glass. Oxides or carbonates can be used. In the obtained glass, the types and ratios of the raw materials are appropriately adjusted so as to obtain a raw material mixture within the above-mentioned composition range.
其次,利用公知之方法加熱原料混合物獲得熔融物。加熱熔融之溫度(熔融溫度)較佳為800~1400℃,更佳為900~1300℃。加熱熔融之時間較佳為30~300分鐘。Next, the raw material mixture is heated by a known method to obtain a melt. The heating and melting temperature (melting temperature) is preferably 800 to 1400° C., more preferably 900 to 1300° C. The heating and melting time is preferably 30 to 300 minutes.
其後,藉由使熔融物冷卻並固化,從而可獲得本發明之玻璃。冷卻方法並無特別限制。亦可選擇藉由滾壓機器、加壓機器、向冷卻液體滴加等而進行急冷之方法。較佳為獲得之玻璃完全為非晶質,即,結晶化度為0%。但,只要為不損害本發明之效果之範圍,則可包含結晶化之部分。Thereafter, the molten material is cooled and solidified to obtain the glass of the present invention. The cooling method is not particularly limited. A method of rapid cooling by a rolling press, a pressurizing machine, or dripping into a cooling liquid may also be selected. It is preferred that the obtained glass is completely amorphous, that is, the degree of crystallization is 0%. However, as long as it does not impair the effect of the present invention, a crystallized portion may be included.
以此方式獲得之本發明之玻璃可為任意形態。例如可為塊狀、板狀、薄板狀(薄片狀)、粉末狀等。The glass of the present invention obtained in this way can be in any form, such as block, plate, thin plate (sheet), powder, etc.
本發明之玻璃具有作為結合劑之功能,較佳為用於導電性糊。含有本發明之玻璃之導電性糊例如適合用於太陽能電池之電極形成。於導電糊中含有本發明之玻璃之情形時,玻璃較佳為粉末。The glass of the present invention has a function as a binder and is preferably used in a conductive paste. The conductive paste containing the glass of the present invention is suitable for forming electrodes of solar cells, for example. When the glass of the present invention is contained in the conductive paste, the glass is preferably in the form of powder.
<玻璃粉末> 本發明之玻璃粉末包含本發明之玻璃,較佳為D50 為0.5 μm以上6.0 μm以下。該D50 之範圍為尤佳適合用於導電糊之範圍。藉由D50 為0.5 μm以上,而使製成導電糊時之分散性進一步提昇。又,藉由D50 為6.0 μm以下,導電性金屬粉末周圍不易產生不存在玻璃粉末之位置,故電極與半導體基板等之接著性進一步提昇。D50 更佳為0.8 μm以上。D50 更佳為5.0 μm以下。<Glass Powder> The glass powder of the present invention includes the glass of the present invention, and preferably has a D 50 of 0.5 μm or more and 6.0 μm or less. This D 50 range is particularly suitable for use in conductive pastes. By having a D 50 of 0.5 μm or more, the dispersibility when making a conductive paste is further improved. In addition, by having a D 50 of 6.0 μm or less, it is less likely that a location without glass powder will be generated around the conductive metal powder, so the adhesion between the electrode and the semiconductor substrate is further improved. D 50 is more preferably 0.8 μm or more. D 50 is more preferably 5.0 μm or less.
於本說明書中,「D50 」表示累積粒度分佈中之以體積為基準之50%粒徑,具體而言,表示於使用雷射繞射/散射式粒度分佈測定裝置測定之粒徑分佈之累積粒度曲線中、該累計量以體積基準計占50%時之粒徑。In this specification, " D50 " means the 50% particle size based on volume in the cumulative particle size distribution. Specifically, it means the particle size at which the cumulative amount accounts for 50% based on volume in the cumulative particle size curve of the particle size distribution measured using a laser diffraction/scattering particle size distribution measuring device.
本發明之玻璃粉末例如可藉由利用乾式粉碎法或濕式粉碎法以具有上述特定之粒度分佈之方式粉碎如上所述製造之玻璃而獲得。The glass powder of the present invention can be obtained, for example, by pulverizing the glass produced as described above in a manner having the above-mentioned specific particle size distribution by dry pulverization or wet pulverization.
用於獲得本發明之玻璃粉末之玻璃之粉碎方法例如較佳為對適當之形狀之玻璃進行乾式粉碎之後進行濕式粉碎之方法。乾式粉碎及濕式粉碎例如可使用輥磨機、球磨機、噴射磨機等粉碎機進行。粒度分佈之調整例如可藉由各粉碎時之粉碎時間或球磨機之球之大小等粉碎機之調整而進行。於濕式粉碎法之情形時,較佳為使用水作為溶劑。濕式粉碎之後,藉由乾燥等去除水分,獲得玻璃粉末。為了調整玻璃粉末之粒徑,除玻璃之粉碎以外,可視需要進行分級。The method for pulverizing glass used to obtain the glass powder of the present invention is preferably a method of dry pulverizing glass of an appropriate shape and then wet pulverizing it. Dry pulverization and wet pulverization can be performed using a pulverizer such as a roller mill, a ball mill, or a jet mill. The particle size distribution can be adjusted by adjusting the pulverization time at each pulverization or the size of the balls of the ball mill, for example. In the case of the wet pulverization method, it is preferred to use water as a solvent. After the wet pulverization, the water is removed by drying, etc. to obtain a glass powder. In order to adjust the particle size of the glass powder, in addition to pulverizing the glass, classification can be performed as needed.
<導電糊> 本發明之玻璃例如可作為玻璃粉末應用於導電糊。利用本發明之玻璃所得之導電糊含有上述本發明之玻璃粉末、導電性金屬粉末及有機載體。<Conductive paste> The glass of the present invention can be used as glass powder for conductive paste. The conductive paste obtained by using the glass of the present invention contains the glass powder of the present invention, conductive metal powder and an organic carrier.
本發明之導電糊所含有之導電性金屬粉末可使用於半導體基板或絕緣性基板等電路基板(包含積層電子零件)上形成之電極中通常使用之金屬之粉末,並無特別限制。作為導電性金屬粉末,具體而言,可列舉:Al、Ag、Cu、Au、Pd、Pt等粉末,該等之中,就生產性之方面而言,較佳為Al粉末。於導電性金屬粉末為Al粉末之情形時,藉由本發明之玻璃,而使得抑制形成電極時電極中產生粒狀物質,並使獲得之電極之外觀良好之效果顯著。The conductive metal powder contained in the conductive paste of the present invention can be used as a metal powder commonly used in electrodes formed on circuit substrates such as semiconductor substrates or insulating substrates (including laminated electronic components) without any particular limitation. Specifically, the conductive metal powder includes powders such as Al, Ag, Cu, Au, Pd, and Pt. Among them, Al powder is preferred in terms of productivity. When the conductive metal powder is Al powder, the glass of the present invention can significantly suppress the generation of granular materials in the electrode when the electrode is formed, and improve the appearance of the obtained electrode.
就凝聚得以抑制、且獲得均勻的分散性之觀點而言,導電性金屬粉末之粒徑較佳為D50 為0.3 μm以上10 μm以下。From the viewpoint of suppressing aggregation and obtaining uniform dispersion, the particle size of the conductive metal powder is preferably 0.3 μm or more and 10 μm or less in D 50 .
相對於導電糊之總質量,導電糊中之導電性金屬粉末之含量較佳設為63.0質量%以上97.9質量%以下。若導電性金屬粉末之含量未達63.0質量%,則導電性金屬粉末進一步燒結、易產生玻璃隆起等。另一方面,若導電性金屬粉末之含量超過97.9質量%,則有無法利用玻璃析出物覆蓋導電性金屬粉末之周圍之虞。又,有電極與半導體基板或絕緣性基板等電路基板之接著性變差之虞。相對於導電糊之總質量,導電性金屬粉末之含量更佳為75.0質量%以上95.0質量%以下。The content of the conductive metal powder in the conductive paste is preferably set to 63.0 mass % or more and 97.9 mass % or less relative to the total mass of the conductive paste. If the content of the conductive metal powder is less than 63.0 mass %, the conductive metal powder is further sintered and glass ridges are easily generated. On the other hand, if the content of the conductive metal powder exceeds 97.9 mass %, there is a risk that the conductive metal powder cannot be covered with glass precipitates. In addition, there is a risk that the adhesion between the electrode and the circuit substrate such as a semiconductor substrate or an insulating substrate will deteriorate. The content of the conductive metal powder is more preferably 75.0 mass % or more and 95.0 mass % or less relative to the total mass of the conductive paste.
相對於導電性金屬粉末100質量份,導電糊中之玻璃粉末之含量例如較佳設為0.1質量份以上9.8質量份以下。若玻璃粉末之含量未達0.1質量份,則有無法利用玻璃析出物覆蓋導電性金屬粉末之周圍之虞。又,有電極與半導體基板或絕緣性基板等電路基板之接著性變差之虞。另一方面,若玻璃粉末之含量超過9.8質量份,則導電性金屬粉末進一步燒結,易產生玻璃隆起等。相對於導電性金屬粉末100質量份,玻璃粉末之含量更佳為0.5質量份以上5質量份以下。The content of the glass powder in the conductive paste is preferably set to, for example, 0.1 to 9.8 parts by mass relative to 100 parts by mass of the conductive metal powder. If the content of the glass powder is less than 0.1 parts by mass, there is a risk that the conductive metal powder cannot be covered with glass precipitates. In addition, there is a risk that the adhesion between the electrode and the circuit substrate such as a semiconductor substrate or an insulating substrate will deteriorate. On the other hand, if the content of the glass powder exceeds 9.8 parts by mass, the conductive metal powder is further sintered, and glass ridges are likely to occur. The content of the glass powder is more preferably 0.5 to 5 parts by mass relative to 100 parts by mass of the conductive metal powder.
作為導電糊所含有之有機載體,可使用使有機樹脂黏合劑溶解於溶劑而獲得之有機樹脂黏合劑溶液。As the organic carrier contained in the conductive paste, an organic resin binder solution obtained by dissolving an organic resin binder in a solvent can be used.
作為用於有機載體之有機樹脂黏合劑,例如使用甲基纖維素、乙基纖維素、羧基甲基纖維素、氧基乙基纖維素、苄基纖維素、丙基纖維素、硝基纖維素等纖維素系樹脂、使甲基丙烯酸甲酯、甲基丙烯酸乙酯、甲基丙烯酸丁酯、甲基丙烯酸2-羥基乙酯、丙烯酸丁酯、丙烯酸2-羥基乙酯等丙烯酸系單體之1種以上聚合而獲得之丙烯酸系樹脂等有機樹脂。As the organic resin binder used for the organic carrier, for example, cellulose resins such as methylcellulose, ethylcellulose, carboxymethylcellulose, oxyethylcellulose, benzylcellulose, propylcellulose, and nitrocellulose, and acrylic resins obtained by polymerizing one or more acrylic monomers such as methyl methacrylate, ethyl methacrylate, butyl methacrylate, 2-hydroxyethyl methacrylate, butyl acrylate, and 2-hydroxyethyl acrylate can be used.
作為用於有機載體之溶劑,於纖維素系樹脂之情形時,較佳使用二乙二醇單丁醚、松油醇、二乙二醇丁醚乙酸酯、二乙二醇乙醚乙酸酯、丙二醇二乙酸酯等溶劑,於丙烯酸系樹脂之情形時,較佳使用甲基乙基酮、松油醇、二乙二醇丁醚乙酸酯、二乙二醇乙醚乙酸酯、丙二醇二乙酸酯等溶劑。As the solvent for the organic carrier, in the case of a cellulose resin, preferably used are solvents such as diethylene glycol monobutyl ether, terpineol, diethylene glycol butyl ether acetate, diethylene glycol ethyl ether acetate, and propylene glycol diacetate, and in the case of an acrylic resin, preferably used are solvents such as methyl ethyl ketone, terpineol, diethylene glycol butyl ether acetate, diethylene glycol ethyl ether acetate, and propylene glycol diacetate.
有機載體中之有機樹脂黏合劑與溶劑之比率並無特別限制,以成為可調整導電糊之黏度之黏度之方式選擇獲得之有機樹脂黏合劑溶液。具體而言,有機樹脂黏合劑:溶劑以所示之質量比計較佳為3:97~15:85左右。The ratio of the organic resin binder to the solvent in the organic carrier is not particularly limited, and the obtained organic resin binder solution is selected so as to have a viscosity that can adjust the viscosity of the conductive paste. Specifically, the organic resin binder:solvent ratio is preferably about 3:97 to 15:85 in terms of the mass ratio shown.
相對於導電糊總量,導電糊中之有機載體之含量較佳為2質量%以上30質量%以下。若有機載體之含量未達2質量%,則導電糊之黏度上升,故導電糊之印刷等塗佈性降低,變得不易形成良好的導電層(電極)。又,若有機載體之含量超過30質量%,則導電糊之固形物成分之含有比率變低,不易獲得足夠的塗佈膜厚。The content of the organic carrier in the conductive paste is preferably 2% by mass or more and 30% by mass or less relative to the total amount of the conductive paste. If the content of the organic carrier is less than 2% by mass, the viscosity of the conductive paste increases, so the coating properties of the conductive paste such as printing decrease, and it becomes difficult to form a good conductive layer (electrode). In addition, if the content of the organic carrier exceeds 30% by mass, the content ratio of the solid components of the conductive paste becomes low, and it is difficult to obtain a sufficient coating film thickness.
作為本發明之導電糊之一態樣,可列舉如下導電糊:相對於導電糊之總質量,該導電糊包含63.0~97.9質量%之含有選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種之金屬,相對於上述金屬100質量份,包含0.1~9.8質量份之以氧化物換算之莫耳%表示時,包含40~60%之B2 O3 、5~25%之Bi2 O3 、20~30%之ZnO、2~7%之SiO2 、1~10%之Sb2 O3 、及0~10%之BaO之玻璃,且相對於導電糊之總質量,包含2~30質量%之有機載體。本態樣中之玻璃為本發明之玻璃。關於本態樣之導電糊所含有之玻璃、金屬及有機載體,組成、種類、形態、含量等較佳之態樣可與上述相同。As one aspect of the conductive paste of the present invention, the following conductive paste can be cited: the conductive paste contains 63.0-97.9 mass % of at least one metal selected from the group consisting of Al, Ag, Cu, Au, Pd and Pt, and 0.1-9.8 mass % of glass containing 40-60% B2O3 , 5-25 % Bi2O3 , 20-30% ZnO, 2-7% SiO2 , 1-10% Sb2O3, and 0-10 % BaO, expressed as mol% of oxide conversion, relative to 100 mass % of the above metals, and contains 2-30 mass % of an organic carrier relative to the total mass of the conductive paste. The glass in this aspect is the glass of the present invention. The preferred aspects of the glass, metal and organic carrier contained in the conductive paste of this aspect, such as composition, type, form, content, etc., can be the same as those mentioned above.
於本發明之導電糊中,除上述之玻璃粉末、導電性金屬粉末、及有機載體以外,可視需要、且於不違反本發明之目的之限度內調配公知之添加劑。In the conductive paste of the present invention, in addition to the above-mentioned glass powder, conductive metal powder, and organic carrier, known additives may be mixed as needed within the limits that do not violate the purpose of the present invention.
作為此種添加劑,例如可列舉各種無機氧化物。作為無機氧化物,具體而言可列舉:B2 O3 、ZnO、SiO2 、Al2 O3 、TiO2 、MgO、ZrO2 、Sb2 O3 、及該等之複合氧化物等。該等無機氧化物有焙燒導電糊時緩和導電性金屬粉末之燒結之效果,藉此,具有調整焙燒後之接合強度之作用。包含該等無機氧化物之添加劑之大小並無特別限制,例如可較佳地使用D50 為10 μm以下者。As such additives, for example, various inorganic oxides can be cited. Specifically , inorganic oxides include B2O3 , ZnO , SiO2 , Al2O3 , TiO2 , MgO, ZrO2 , Sb2O3 , and composite oxides thereof. These inorganic oxides have the effect of slowing down the sintering of the conductive metal powder when the conductive paste is baked , thereby having the function of adjusting the bonding strength after baking. The size of the additives including these inorganic oxides is not particularly limited, and for example, those with a D50 of 10 μm or less can be preferably used.
導電糊中之無機氧化物之含量根據目的不同而適當設定,但相對於玻璃粉末,較佳為10質量%以下,更佳為7質量%以下。若相對於玻璃粉末,無機氧化物之含量超過10質量%,則有形成電極時導電糊之流動性降低且電極與半導體基板或絕緣性基板等電路基板之接著強度降低之虞。又,為了獲得實用的調配效果(焙燒後之接合強度之調整),上述含量之下限值較佳為0.5質量%,更佳為1.0質量%。The content of inorganic oxide in the conductive paste is appropriately set according to different purposes, but is preferably 10% by mass or less, and more preferably 7% by mass or less relative to the glass powder. If the content of inorganic oxide exceeds 10% by mass relative to the glass powder, there is a risk that the fluidity of the conductive paste will decrease when forming an electrode and the bonding strength between the electrode and a circuit substrate such as a semiconductor substrate or an insulating substrate will decrease. In addition, in order to obtain a practical formulation effect (adjustment of the bonding strength after baking), the lower limit of the above content is preferably 0.5% by mass, and more preferably 1.0% by mass.
於導電糊中,可添加如消泡劑或分散劑般導電糊中公知之添加物。再者,上述有機載體及該等添加物通常為電極形成之過程中消失之成分。對於導電糊之製備,可應用使用具備攪拌葉之旋轉式之混合機或碾碎機、輥磨機、球磨機等之公知之方法。In the conductive paste, known additives such as defoamers or dispersants may be added. Furthermore, the organic carrier and the additives are usually components that disappear during the electrode formation process. For the preparation of the conductive paste, a known method using a rotary mixer with a stirring blade, a grinder, a roller mill, a ball mill, etc. may be applied.
於半導體基板或絕緣性基板等電路基板上進行導電糊之塗佈及焙燒時可藉由與先前之形成電極時之塗佈、焙燒相同之方法進行。作為塗佈方法,可列舉網版印刷、點膠法。焙燒溫度係取決於含有之導電性金屬粉末之種類、表面狀態等,可例示大概500~1000℃之溫度。焙燒時間可根據欲形成之電極之形狀、厚度等適當調整。又,可於導電糊之塗佈與焙燒之間設置80~200℃左右下之乾燥處理。The conductive paste can be applied and baked on a circuit substrate such as a semiconductor substrate or an insulating substrate by the same method as the application and baking for forming the electrode. Screen printing and dispensing can be cited as the application method. The baking temperature depends on the type of conductive metal powder contained, the surface state, etc., and can be exemplified by a temperature of about 500 to 1000°C. The baking time can be appropriately adjusted according to the shape and thickness of the electrode to be formed. In addition, a drying treatment at about 80 to 200°C can be provided between the application and baking of the conductive paste.
<太陽能電池> 本發明之太陽能電池具備使用此種本發明之導電糊形成之電極,具體而言,具備燒附於半導體基板上之電極。本發明之太陽能電池例如較佳為具備使用本發明之導電糊形成之電極作為PERC太陽能電池等單面受光型太陽能電池之背面電極。PERC太陽能電池通常於受光面具有包含絕緣材料之抗反射膜,背面中除一部分以外之整體上亦具有包含與該抗反射膜相同之絕緣材料之絕緣膜。<Solar cell> The solar cell of the present invention has an electrode formed using the conductive paste of the present invention, specifically, an electrode sintered onto a semiconductor substrate. The solar cell of the present invention preferably has an electrode formed using the conductive paste of the present invention as a back electrode of a single-sided light-receiving solar cell such as a PERC solar cell. PERC solar cells usually have an anti-reflection film containing an insulating material on the light-receiving surface, and an insulating film containing the same insulating material as the anti-reflection film on the entire back surface except for a portion.
於PERC太陽能電池等中,本發明之太陽能電池較佳為具備使用本發明之導電糊形成之電極作為於設置於背面上之絕緣膜上以部分與半導體基板接觸之形式形成之電極。該電極例如以於按如下方式形成之開口部中與半導體基板接觸之方式形成於絕緣膜上之整面上。若使用本發明之導電糊,則可獲得於半導體基板上經由絕緣膜形成電極時充分地確保與已去除絕緣膜之部分之半導體基板之接觸的電極,且為藉由抑制電極中產生粒狀物質並確保獲得之電極表面之平坦性而具有較高之可靠性的電極。In PERC solar cells and the like, the solar cell of the present invention is preferably provided with an electrode formed using the conductive paste of the present invention as an electrode formed on an insulating film provided on the back surface in a form of partially contacting a semiconductor substrate. The electrode is formed on the entire surface of the insulating film in a form of contacting the semiconductor substrate in an opening formed as follows. If the conductive paste of the present invention is used, an electrode can be obtained that fully ensures contact with the portion of the semiconductor substrate from which the insulating film has been removed when the electrode is formed on the semiconductor substrate via the insulating film, and an electrode having higher reliability by suppressing the generation of granular substances in the electrode and ensuring the flatness of the obtained electrode surface.
如上所述,本發明之導電糊較佳為含有Al粉末作為導電性金屬粉末。即,本發明之導電糊較佳用於Al電極之形成。更佳為,為了於半導體基板上形成絕緣膜、例如藉由雷射而去除絕緣膜之一部分從而製成具有開口部之絕緣膜之後、於該絕緣膜上以經由開口部與半導體基板部分接觸之形式形成Al電極而使用本發明之導電糊。As described above, the conductive paste of the present invention preferably contains Al powder as the conductive metal powder. That is, the conductive paste of the present invention is preferably used for forming an Al electrode. More preferably, the conductive paste of the present invention is used to form an insulating film on a semiconductor substrate, for example, after removing a portion of the insulating film by laser to form an insulating film having an opening, and then forming an Al electrode on the insulating film in a form that is in contact with the semiconductor substrate through the opening.
作為於具有開口部之絕緣膜上以經由該開口部與半導體基板接觸之形式設置之Al電極,例如可列舉:使用p型Si基板之PERC太陽能電池之背面電極、使用n型Si基板之PERT(Passivated Emitter,Rear Totally diffused)太陽能電池之背面電極、使用n型Si基板或p型Si基板之兩面受光太陽能電池之設置於p層或p+ 層側之電極、後接觸型太陽能電池之一電極等。Examples of Al electrodes disposed on an insulating film having an opening in contact with a semiconductor substrate via the opening include: a back electrode of a PERC solar cell using a p-type Si substrate, a back electrode of a PERT (Passivated Emitter, Rear Totally Diffused) solar cell using an n-type Si substrate, an electrode disposed on the p-layer or p + layer side of a double-sided light-receiving solar cell using an n-type Si substrate or a p-type Si substrate, and one electrode of a rear contact solar cell.
作為本發明之太陽能電池之一實施形態,可列舉如下一種太陽能電池,其具備:具有太陽光受光面之矽基板、設置於矽基板之太陽光受光面側之第1絕緣膜、設置於矽基板之與太陽光受光面為相反側之面之具有至少一個開口部之第2絕緣膜、經由第2絕緣膜之開口部與矽基板部分接觸之第2電極、及貫通第1絕緣膜之一部分而與矽基板接觸之第1電極;且該太陽能電池之第2電極包含含有選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種之金屬、及以氧化物換算之莫耳%表示時,包含40~60%之B2 O3 、5~25%之Bi2 O3 、20~30%之ZnO、2~7%之SiO2 、1~10%之Sb2 O3 、及0~10%之BaO之玻璃。As an embodiment of the solar cell of the present invention, the following solar cell can be cited, which comprises: a silicon substrate having a solar light receiving surface, a first insulating film provided on the solar light receiving surface side of the silicon substrate, a second insulating film provided on the surface of the silicon substrate opposite to the solar light receiving surface and having at least one opening, and a second insulating film extending through the opening of the second insulating film. A second electrode partially contacts the silicon substrate, and a first electrode penetrates a portion of the first insulating film and contacts the silicon substrate; and the second electrode of the solar cell comprises a glass containing at least one metal selected from the group consisting of Al, Ag, Cu, Au, Pd and Pt, and containing 40-60% of B2O3 , 5-25% of Bi2O3 , 20-30% of ZnO , 2-7% of SiO2 , 1-10% of Sb2O3 , and 0-10% of BaO when expressed in mole % converted to oxides.
再者,第2絕緣膜之開口部係指自第2絕緣膜之表面貫通至矽基板之與太陽光受光面為相反側之面設置之部分。於以下說明中,「開口部」之用詞以與上述相同之意義使用。Furthermore, the opening of the second insulating film refers to a portion extending from the surface of the second insulating film to the surface of the silicon substrate opposite to the solar light receiving surface. In the following description, the term "opening" is used with the same meaning as above.
開口部之形狀並無特別限制,但可為線狀或圓狀。於形狀為線狀之情形時,較佳為線寬為30~100 μm,於圓狀之情形時,較佳為其直徑為30~100 μm。相對於矽基板之與太陽光受光面為相反側之面之總面積,開口部之面積較佳為1~3%。The shape of the opening is not particularly limited, but may be linear or circular. In the case of a linear shape, the width is preferably 30 to 100 μm, and in the case of a circular shape, the diameter is preferably 30 to 100 μm. The area of the opening is preferably 1 to 3% of the total area of the surface of the silicon substrate opposite to the solar light receiving surface.
第1電極較佳為包含含有選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種之金屬,該金屬較佳為至少包含Ag。又,第1絕緣膜例如包含氮化矽、二氧化鈦、氧化矽、氧化鋁等絕緣材料,較佳為包含氮化矽。The first electrode preferably includes at least one metal selected from the group consisting of Al, Ag, Cu, Au, Pd and Pt, and the metal preferably includes at least Ag. The first insulating film includes an insulating material such as silicon nitride, titanium dioxide, silicon oxide, aluminum oxide, and preferably includes silicon nitride.
第2電極較佳為包含90~99.9質量%之上述金屬,包含0.1~10質量%之上述玻璃。第2電極所含有之玻璃為本發明之玻璃,較佳之組成如上述所說明般。第2電極所包含之金屬較佳為至少包含Al。於該金屬包含Al之情形時,顯著獲得利用本發明之玻璃所帶來之效果,即,形成電極時抑制電極中產生粒狀物質、使獲得之電極之外觀良好。The second electrode preferably contains 90-99.9 mass % of the above metal and 0.1-10 mass % of the above glass. The glass contained in the second electrode is the glass of the present invention, and the preferred composition is as described above. The metal contained in the second electrode preferably contains at least Al. When the metal contains Al, the effect brought by the use of the glass of the present invention is significantly obtained, that is, when the electrode is formed, the generation of granular materials in the electrode is suppressed, so that the appearance of the obtained electrode is good.
第2絕緣膜較佳為多層膜,較佳為具備與矽基板之與太陽光受光面為相反側之面相接之包含氧化鋁或氧化矽之氧化金屬膜、及進而位於該氧化金屬膜上之氮化矽膜的多層膜之構成。The second insulating film is preferably a multi-layer film, and preferably has a multi-layer film structure including a metal oxide film containing aluminum oxide or silicon oxide in contact with the surface of the silicon substrate opposite to the solar light receiving surface, and a silicon nitride film further located on the metal oxide film.
以下,以利用本發明之導電糊形成p型Si基板單面受光型之太陽能電池之電極之情形為例進行說明。圖1係模式地表示使用本發明之導電糊形成電極之p型Si基板單面受光型太陽能電池之一例之剖面之圖。The following is an example of using the conductive paste of the present invention to form electrodes of a p-type Si substrate single-sided light-receiving type solar cell. FIG1 is a schematic cross-sectional view of an example of a p-type Si substrate single-sided light-receiving type solar cell with electrodes formed using the conductive paste of the present invention.
圖1所示之太陽能電池10具有:p型Si基板1;及設置於其上表面之絕緣膜2A;設置於下表面之具有開口部7之絕緣膜2B;形成於絕緣膜2B上之整面、並經由開口部7與p型Si基板部分接觸之Al電極4;及貫通絕緣膜2A之一部分而與p型Si基板1接觸之Ag電極3。p型Si基板1之上表面具有例如使用濕式蝕刻法而形成之如可降低光反射率之凹凸結構。再者,圖式之上下並不一定表示使用時之上下。又,視需要,p型Si基板之兩表面可具有凹凸結構。The solar cell 10 shown in FIG. 1 has: a p-type Si substrate 1; an insulating film 2A disposed on the upper surface thereof; an insulating film 2B disposed on the lower surface and having an opening 7; an Al electrode 4 formed on the entire surface of the insulating film 2B and partially in contact with the p-type Si substrate via the opening 7; and an Ag electrode 3 penetrating a portion of the insulating film 2A and in contact with the p-type Si substrate 1. The upper surface of the p-type Si substrate 1 has a concave-convex structure formed, for example, by wet etching to reduce light reflectivity. Furthermore, the up and down of the figure does not necessarily represent the up and down during use. Also, if necessary, both surfaces of the p-type Si substrate may have a concave-convex structure.
p型Si基板1自上依序包含n+ 層1a、p層1b,Al電極4與p層1b接觸,Ag電極3與n+ 層1a接觸。此處,n+ 層1a可藉由於形成上述凹凸結構之表面中例如摻雜P、Sb、As等而形成。The p-type Si substrate 1 includes an n + layer 1a and a p layer 1b in order from the top, an Al electrode 4 contacts the p layer 1b, and an Ag electrode 3 contacts the n + layer 1a. Here, the n + layer 1a can be formed by doping the surface of the above-mentioned concavo-convex structure with P, Sb, As, etc.
Al電極4及Ag電極3分別使用含有玻璃粉末及Al粉末之Al電極形成用導電糊、含有玻璃粉末及Ag粉末之Ag電極形成用導電糊並按以下之方式而形成。The Al electrode 4 and the Ag electrode 3 are formed in the following manner using a conductive paste for forming an Al electrode containing glass powder and Al powder and a conductive paste for forming an Ag electrode containing glass powder and Ag powder, respectively.
即,設置於p型Si基板1之上表面之絕緣膜2A係於形成Ag電極3之前無間隙地存在於整面,藉由於焙燒該導電糊時僅使塗佈有用於形成Ag電極3之上述Ag電極形成用導電糊之部分熔融,而形成貫通絕緣膜2A並與p型Si基板1接觸之Ag電極3。That is, the insulating film 2A provided on the upper surface of the p-type Si substrate 1 exists on the entire surface without gaps before the Ag electrode 3 is formed, and by melting only a portion of the conductive paste for forming the Ag electrode 3 applied when the conductive paste is baked, the Ag electrode 3 is formed which penetrates the insulating film 2A and contacts the p-type Si substrate 1.
另一方面,絕緣膜2B無間隙地設置於p型Si基板1之下表面之整面之後,為了形成Al電極4,利用雷射物理地去除其中一部分,從而成為具有開口部7之構成。藉由於具有開口部7之絕緣膜2B上之整面上塗佈上述Al電極形成用導電糊並進行焙燒,而形成覆蓋絕緣膜2B之整面並利用開口部7與半導體部分接觸之Al電極4。On the other hand, after the insulating film 2B is provided without gaps on the entire lower surface of the p-type Si substrate 1, a portion of it is physically removed by laser to form the Al electrode 4, thereby forming a structure having an opening 7. By applying the above-mentioned conductive paste for forming the Al electrode on the entire surface of the insulating film 2B having the opening 7 and baking it, the Al electrode 4 covering the entire surface of the insulating film 2B and contacting the semiconductor part through the opening 7 is formed.
再者,形成Al電極4時,藉由利用開口部7使得Al電極形成用導電糊與p型Si基板1之p層1b接觸後,於焙燒時熔融,從而使得Al自Al電極擴散至p層1b內,於Al電極正上方形成Al-Si合金層5。進而於Al-Si合金層5之正上方獲得作為p+ 層之BSF(Back Surface Field)層6。Furthermore, when forming the Al electrode 4, the conductive paste for forming the Al electrode is brought into contact with the p-layer 1b of the p-type Si substrate 1 by utilizing the opening 7, and melts during sintering, thereby causing Al to diffuse from the Al electrode into the p-layer 1b, and forming an Al-Si alloy layer 5 directly above the Al electrode. Furthermore, a BSF (Back Surface Field) layer 6 as a p + layer is obtained directly above the Al-Si alloy layer 5.
上述中,本發明之導電糊可用作Ag電極形成用導電糊及Al電極形成用導電糊,但如上所述,尤佳為用作Al電極形成用導電糊。In the above, the conductive paste of the present invention can be used as a conductive paste for forming an Ag electrode and a conductive paste for forming an Al electrode, but as mentioned above, it is particularly preferably used as a conductive paste for forming an Al electrode.
藉由使用含有本發明之玻璃之粉末及Al粉末之本發明之導電糊作為Al電極形成用導電糊,從而於經由絕緣膜形成電極時,可充分地確保電極與絕緣膜及半導體基板之接觸,從而獲得與p型Si基板1充分地接觸之Al電極4。又,可抑制形成電極時電極中產生粒狀物質、使獲得之電極之外觀良好。By using the conductive paste of the present invention containing the glass powder of the present invention and Al powder as the conductive paste for forming the Al electrode, when forming the electrode through the insulating film, the contact between the electrode and the insulating film and the semiconductor substrate can be sufficiently ensured, thereby obtaining the Al electrode 4 that is in sufficient contact with the p-type Si substrate 1. In addition, the generation of granular materials in the electrode during the electrode formation can be suppressed, and the appearance of the obtained electrode can be improved.
再者,太陽能電池所具有之絕緣膜具有抗反射之功能,可抑制半導體載體之再結合。作為構成該絕緣膜之絕緣材料,可使用上述列舉之絕緣材料。絕緣膜可為單層膜,亦可為多層膜。本發明之導電糊尤其是經由具有包含氮化矽之層及包含氧化鋁、或氧化矽之層的絕緣膜形成電極時,可充分地確保電極與絕緣膜及部分地形成之半導體基板之接觸,從而具有較高之太陽能電池特性。Furthermore, the insulating film of the solar cell has an anti-reflection function and can suppress the recombination of the semiconductor carrier. As the insulating material constituting the insulating film, the insulating materials listed above can be used. The insulating film can be a single-layer film or a multi-layer film. The conductive paste of the present invention, in particular, can fully ensure the contact between the electrode and the insulating film and the partially formed semiconductor substrate when forming an electrode through an insulating film having a layer containing silicon nitride and a layer containing aluminum oxide or silicon oxide, thereby having higher solar cell characteristics.
於本發明之太陽能電池、尤其是於PERC太陽能電池中,於背面,在可電性接觸之範圍內部分去除絕緣膜而形成含有本發明之玻璃之粉末之電極時可形成如下電極結構:於整個絕緣膜上形成電極,同時,部分去除絕緣膜後之部分可確保與半導體基板之接觸。藉由使用該導電糊,可提供一種可於形成電極時抑制電極中產生粒狀物質、可形成外觀良好的該電極、且可實現高可靠性與高電池特性之太陽能電池。 [實施例]In the solar cell of the present invention, especially in the PERC solar cell, when the insulating film is partially removed on the back side within the range of electrical contact to form an electrode containing the glass powder of the present invention, the following electrode structure can be formed: the electrode is formed on the entire insulating film, and at the same time, the portion after the insulating film is partially removed can ensure contact with the semiconductor substrate. By using the conductive paste, a solar cell can be provided that can suppress the generation of granular materials in the electrode when forming the electrode, can form the electrode with good appearance, and can achieve high reliability and high battery characteristics. [Example]
以下參照實施例針對本發明進一步詳細地說明,但本發明並不限定於實施例。例1~8為實施例,例9及10為比較例。The present invention is further described in detail below with reference to the embodiments, but the present invention is not limited to the embodiments. Examples 1 to 8 are embodiments, and Examples 9 and 10 are comparative examples.
(例1~10) 利用以下方法將玻璃製造為薄板狀玻璃,並自薄板狀玻璃製造玻璃粉末。(Examples 1 to 10) Glass is manufactured into thin plate-shaped glass by the following method, and glass powder is manufactured from the thin plate-shaped glass.
<玻璃(薄板狀玻璃)之製造> 以成為表1所述之組成之方式調配原料粉末並加以混合,於800~1400℃之電氣爐中使用坩堝熔融30分鐘至2小時,使包含表1所示之組成之玻璃之薄板狀玻璃成形。<Manufacturing of glass (thin plate glass)> Raw material powders are prepared and mixed in a manner to obtain the composition shown in Table 1, and melted in a crucible in an electric furnace at 800 to 1400°C for 30 minutes to 2 hours to form a thin plate glass containing the glass composition shown in Table 1.
<玻璃粉末之製造> 於各例中,組合使用乾式粉碎與濕式粉碎而以如下方式對獲得之薄板狀玻璃進行粉碎並調整粒度分佈。<Production of glass powder> In each example, the obtained thin plate-shaped glass was pulverized and the particle size distribution was adjusted in the following manner using a combination of dry pulverization and wet pulverization.
首先利用球磨機對玻璃進行乾式粉碎之後,進而利用球磨機使用水對已去除粗粒之玻璃粉末進行濕式粉碎,獲得玻璃之漿料。進行該濕式粉碎時,為了獲得特定之D50 而使用直徑5 mm之鋁製球,利用粉碎時間調整D50 。其後,過濾利用濕式粉碎獲得之漿料,去除大部分水分之後,為了調整水分量而藉由乾燥機使其於130℃下乾燥,製造玻璃粉末。First, the glass is dry-pulverized using a ball mill, and then the coarse particles are removed and wet-pulverized using water in a ball mill to obtain glass slurry. During the wet pulverization, aluminum balls with a diameter of 5 mm are used to obtain a specific D 50 , and the D 50 is adjusted by the pulverization time. After that, the slurry obtained by wet pulverization is filtered to remove most of the water, and then it is dried at 130°C in a dryer to adjust the water content to produce glass powder.
<評價> 針對各例之玻璃利用以下方法評價玻璃粉末之D50 。將結果與組成一同示於表1。再者,玻璃組成之各成分之欄中之空欄表示含量「0%」。<Evaluation> The D 50 of the glass powder of each example was evaluated by the following method. The results are shown in Table 1 together with the composition. In addition, the blank column in the column of each component of the glass composition indicates the content "0%".
(D50 ) 針對各例之玻璃,向20 cc水中混合0.02 g玻璃粉末,藉由超音波分散使其分散1分鐘從而製成試樣。向Microtrac測定機(雷射繞射、散射式粒度分佈測定裝置)中放入試樣,獲得D50 之值。(D 50 ) For each glass example, 0.02 g of glass powder was mixed into 20 cc of water and dispersed by ultrasonic dispersion for 1 minute to prepare a sample. The sample was placed in a Microtrac measuring machine (laser diffraction, scattering type particle size distribution measuring device) to obtain the D 50 value.
<導電糊之製造> 利用以下方法製作分別含有上述中製作之各例之玻璃粉末的Al電極形成用導電糊。<Production of conductive paste> The conductive paste for forming an Al electrode containing the glass powder of each example produced above was produced by the following method.
首先,使用分散裝置(分散機)將100質量份藉由氣體霧化法生成之D50 為6.0 μm之鋁粉末及1.5質量份各例之玻璃粉末於35質量份使乙基纖維素溶解於二乙二醇丁醚乙酸酯所得之樹脂液中糊化。藉此,製成Al電極形成用導電糊。First, 100 parts by mass of aluminum powder with a D50 of 6.0 μm produced by gas atomization and 1.5 parts by mass of the glass powder of each example were paste-formed in 35 parts by mass of a resin solution prepared by dissolving ethyl cellulose in diethylene glycol butyl ether acetate using a dispersing device (disperser). Thus, a conductive paste for forming an Al electrode was prepared.
<太陽能電池中之Al電極之製作及外觀與電池特性之評價> (太陽能電池之製造) 使用上述中製作之各例之Al電極形成用導電糊及作為市售品之Ag電極形成用導電糊,以如下方式製造圖1所示之構成之太陽能電池10,針對獲得之太陽能電池中之Al電極之外觀與電池特性進行評價。太陽能電池10之構成為:於p型Si半導體基板1上之非受光面上經由包含氧化鋁層與氮化矽層該2層膜之絕緣膜2B而具有作為背面電極之Al電極4,且於受光面上經由包含氮化矽層之絕緣膜2A而具有作為表面電極之Ag電極3。<Production of Al electrodes in solar cells and evaluation of appearance and battery characteristics> (Production of solar cells) The Al electrode-forming conductive pastes of the above-described examples and the commercially available Ag electrode-forming conductive pastes were used to produce solar cells 10 having the structure shown in FIG. 1 in the following manner, and the appearance and battery characteristics of the Al electrodes in the obtained solar cells were evaluated. The solar cell 10 is constructed as follows: an Al electrode 4 as a back electrode is provided on a non-light-receiving surface on a p-type Si semiconductor substrate 1 via an insulating film 2B including two layers of aluminum oxide and silicon nitride, and an Ag electrode 3 as a surface electrode is provided on a light-receiving surface via an insulating film 2A including a silicon nitride layer.
首先,Si半導體基板之受光面側及非受光面側上分別形成有包含氮化矽層之絕緣膜2A、及自基板之非受光面側依序包含氧化鋁層與氮化矽層該2層膜之絕緣膜2B。進而,絕緣膜2B中,於特定之部位利用雷射形成有開口部7。其次,將使用上述各例之玻璃粉末而獲得之Al電極形成用導電糊藉由網版印刷而塗佈於非受光面側之表面之整面、即絕緣膜2B之表面與面向藉由雷射而部分地去除絕緣膜2B之開口部7之半導體基板之表面,並於100℃下使其乾燥。First, an insulating film 2A including a silicon nitride layer and an insulating film 2B including the two layers of aluminum oxide and silicon nitride in order from the non-light-receiving side of the Si semiconductor substrate are formed on the light-receiving side and the non-light-receiving side, respectively. Furthermore, an opening 7 is formed in a specific position in the insulating film 2B by laser. Next, a conductive paste for forming an Al electrode obtained by using the glass powder of each of the above examples is applied by screen printing to the entire surface of the non-light-receiving side, that is, the surface of the insulating film 2B and the surface of the semiconductor substrate facing the opening 7 of the insulating film 2B partially removed by laser, and dried at 100°C.
其次,藉由網版印刷以線狀將Ag電極形成用導電糊塗佈於Si半導體基板1之絕緣膜2A之整個表面。其後,使用紅外光加熱式帶式爐於峰溫度800℃下進行60秒鐘焙燒,形成表面Ag電極3、背面Al電極4,完成太陽能電池10。再者,表面Ag電極3貫通絕緣膜2A而形成。Next, a conductive paste for forming an Ag electrode is applied in lines on the entire surface of the insulating film 2A of the Si semiconductor substrate 1 by screen printing. Then, an infrared light heating belt furnace is used to bake at a peak temperature of 800°C for 60 seconds to form a surface Ag electrode 3 and a back Al electrode 4, thereby completing the solar cell 10. Furthermore, the surface Ag electrode 3 is formed through the insulating film 2A.
(1)外觀評價 對於上述中獲得之背面Al電極4之外觀,以是否可不產生粒狀物質地形成Al電極之觀點而言,藉由以下基準以肉眼進行評價。將結果示於表1。(1) Appearance Evaluation The appearance of the back Al electrode 4 obtained above was evaluated visually based on the following criteria from the perspective of whether the Al electrode can be formed without generating granular materials. The results are shown in Table 1.
○;Al電極上未產生粒狀物質。 ×;Al電極上產生粒狀物質。 再者,Al電極上之粒狀物質若粒徑為大概20 μm以上,則可以肉眼辨識。○; No granular material is generated on the Al electrode. ×; Granular material is generated on the Al electrode. Furthermore, if the particle size of the granular material on the Al electrode is approximately 20 μm or more, it can be identified with the naked eye.
(2)太陽能電池之轉換效率之測定 使用太陽模擬器測定使用分別含有上述各例之玻璃粉末之Al電極形成用導電糊製造之太陽能電池之轉換效率。具體而言,於太陽模擬器上設置太陽能電池,藉由分光特性AM1.5G之基準太陽光線、依據JIS C8912:2011測定電流電壓特性,推導出各太陽能電池之轉換效率。將獲得之轉換效率之結果示於表1。(2) Determination of conversion efficiency of solar cells The conversion efficiency of solar cells made of conductive paste for forming Al electrodes containing the glass powder of each example above was measured using a solar simulator. Specifically, a solar cell was placed on the solar simulator, and the current-voltage characteristics were measured in accordance with JIS C8912:2011 using reference solar light with spectral characteristics of AM1.5G, and the conversion efficiency of each solar cell was derived. The obtained conversion efficiency results are shown in Table 1.
再者,表1中之記號表示以下意義。 Isc(A):短路狀態之短路電流 Voc(mV):開路狀態之開路電壓 FF(%):填充因數 Eff(%):轉換效率Furthermore, the symbols in Table 1 represent the following meanings. Isc(A): short-circuit current in short-circuit state Voc(mV): open-circuit voltage in open-circuit state FF(%): fill factor Eff(%): conversion efficiency
[表1]
據表1之結果可知,於具有使用採用了本發明之特定之玻璃之作為實施例之例1~8之糊組合物而形成之電極的太陽能電池之情形時,獲得較高之轉換效率,並且抑制電極表面產生粒狀物質。另一方面,可知於使用未使用本發明之特定之玻璃之作為比較例之例9、10之糊組合物之情形時,就轉換效率或焙燒外觀之方面而言,不及作為實施例之例1~8之糊組合物。玻璃中之Bi2 O3 含量超過25莫耳%之例9中,電極表面產生粒狀物質,不含有Bi2 O3 之例10中,轉換效率(Eff(%))遠低於21.0%。According to the results in Table 1, in the case of a solar cell having an electrode formed by using the paste composition of Examples 1 to 8 as embodiments using the specific glass of the present invention, a higher conversion efficiency is obtained and the generation of granular substances on the electrode surface is suppressed. On the other hand, in the case of using the paste composition of Examples 9 and 10 as comparative examples without using the specific glass of the present invention, it is known that the conversion efficiency and firing appearance are inferior to the paste composition of Examples 1 to 8 as embodiments. In Example 9, in which the Bi 2 O 3 content in the glass exceeds 25 mol%, granular substances are generated on the electrode surface, and in Example 10, which does not contain Bi 2 O 3 , the conversion efficiency (Eff(%)) is much lower than 21.0%.
雖參照特定之實施態樣詳細地說明了本發明,但業者知悉可於不脫離本發明之精神與範圍之條件下施加各種變更或修正。 本申請係基於2018年11月9日申請之日本專利申請2018-211600者,此處引用其內容作為參照。Although the present invention has been described in detail with reference to specific embodiments, the industry recognizes that various changes or modifications may be made without departing from the spirit and scope of the present invention. This application is based on Japanese Patent Application No. 2018-211600 filed on November 9, 2018, and its contents are cited here for reference.
1:p型Si半導體基板 1a:n+層 1b:p層 2A:絕緣膜 2B:絕緣膜 3:Ag電極 4:Al電極 5:Al-Si合金層 6:BSF層 7:開口部 10:太陽能電池 1: p-type Si semiconductor substrate 1a: n + layer 1b: p layer 2A: insulating film 2B: insulating film 3: Ag electrode 4: Al electrode 5: Al-Si alloy layer 6: BSF layer 7: opening 10: solar cell
圖1係模式地表示使用本發明之導電糊形成電極之p型Si基板單面受光型太陽能電池之一例之剖面之圖。FIG. 1 is a schematic cross-sectional view of an example of a p-type Si substrate single-sided light-receiving type solar cell in which electrodes are formed using the conductive paste of the present invention.
1:p型Si半導體基板 1: p-type Si semiconductor substrate
1a:n+層 1a:n + layer
1b:p層 1b: p layer
2A:絕緣膜 2A: Insulation film
2B:絕緣膜 2B: Insulation film
3:Ag電極 3: Ag electrode
4:Al電極 4:Al electrode
5:Al-Si合金層 5: Al-Si alloy layer
6:BSF層 6:BSF layer
7:開口部 7: Opening
10:太陽能電池 10: Solar cells
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| JP2018211600A JP7088811B2 (en) | 2018-11-09 | 2018-11-09 | Glass, glass powder, conductive paste and solar cells |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201219336A (en) * | 2010-08-17 | 2012-05-16 | Nippon Electric Glass Co | Glass for formation of electrode and material for formation of electrode using the same |
| TW201313649A (en) * | 2011-09-29 | 2013-04-01 | Noritake Co Ltd | Lead-free conductive paste composition for solar cells |
| TW201700430A (en) * | 2015-05-01 | 2017-01-01 | Toyo Aluminium Kk | PERC type aluminum paste composition for solar cells |
| JP2017222543A (en) * | 2016-06-16 | 2017-12-21 | 旭硝子株式会社 | Glass powder, conductive paste, and solar battery |
| TW201811704A (en) * | 2016-06-29 | 2018-04-01 | 納美仕有限公司 | Conductive paste and solar cell |
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| JP2005041734A (en) * | 2003-05-26 | 2005-02-17 | Nippon Electric Glass Co Ltd | Glass for dielectric formation and dielectric formation material for plasma display panel |
| JP2008030994A (en) * | 2006-07-28 | 2008-02-14 | Nihon Yamamura Glass Co Ltd | Bismuth-based lead-free powdered glass |
| JP5888493B2 (en) | 2011-02-10 | 2016-03-22 | セントラル硝子株式会社 | Conductive paste and solar cell element using the conductive paste |
| JP2013018666A (en) * | 2011-07-08 | 2013-01-31 | Nippon Electric Glass Co Ltd | Electrode formation glass and electrode formation material |
| WO2013148783A1 (en) * | 2012-03-30 | 2013-10-03 | Corning Incorporated | Bismuth borate glass encapsulant for led phosphors |
| JP2014015384A (en) * | 2012-06-15 | 2014-01-30 | Ohara Inc | Optical glass, preform and optical element |
| CN106981522B (en) * | 2017-03-03 | 2018-07-10 | 浙江爱旭太阳能科技有限公司 | PERC solar cells of photoelectric conversion efficiency and preparation method thereof can be improved |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201219336A (en) * | 2010-08-17 | 2012-05-16 | Nippon Electric Glass Co | Glass for formation of electrode and material for formation of electrode using the same |
| TW201313649A (en) * | 2011-09-29 | 2013-04-01 | Noritake Co Ltd | Lead-free conductive paste composition for solar cells |
| TW201700430A (en) * | 2015-05-01 | 2017-01-01 | Toyo Aluminium Kk | PERC type aluminum paste composition for solar cells |
| JP2017222543A (en) * | 2016-06-16 | 2017-12-21 | 旭硝子株式会社 | Glass powder, conductive paste, and solar battery |
| TW201811704A (en) * | 2016-06-29 | 2018-04-01 | 納美仕有限公司 | Conductive paste and solar cell |
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| CN111180106A (en) | 2020-05-19 |
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| TW202030160A (en) | 2020-08-16 |
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