TWI841032B - Testing system - Google Patents

Abstract

A testing system includes a first magazine transporting device, a second magazine transporting device, a feeding area, a feeding device, a transporting unit, a testing module and a discharging area. An end of the feeding area is corresponding to a clip of the first magazine transporting device. The feeding device is disposed at a side of the first magazine transporting device for discharging a strip from a magazine. An end of the transporting unit is connected to the other side of the first magazine transporting device for receiving and transporting the strip. The other end of the transporting unit is connected to the second magazine transporting device. The testing module includes two alignment units disposed on opposite sides of the transporting unit, a testing machine and a strip transporting device for transporting the strip between the alignment unit and the testing machine. An end of the discharging area is corresponding to the clip of the second magazine transporting device.

Description

Test system

This case is related to automation systems, and in particular to an automated semiconductor testing system.

As the electronics industry matures, customers have higher and higher requirements for product yield. Therefore, all kinds of semiconductor components must be tested before leaving the factory. After testing, they are classified (bin) according to the test results, and finally shipped or otherwise disposed of according to the classification.

There are many types of semiconductor components. In addition to their different functions, their appearances are also different. Different semiconductor components with different appearances must have different configurations during the testing process. This case focuses on the testing of the test piece contained in the gate, in order to provide a high-efficiency test piece testing system.

The present invention provides a testing system suitable for testing a plurality of test pieces. The plurality of test pieces are placed in a gate spaced apart from each other along the Z direction. The testing system includes a plurality of gate transfer devices, a gate entry area, a feeding device, a conveying unit, a testing module and a gate exit area. The gate transfer devices can be displaced along the X direction perpendicular to the Z direction and include a clamp. The clamp can be displaced along the Z direction and arranged on the gate transfer device. The plurality of gate transfer devices include a first gate transfer device and a second gate transfer device. The gate entry area extends along the X direction and one end of which is opposite to the clamp of the first gate transfer device. The feeding device is arranged on one side of the first gate transfer device and is used to unload the test piece from the gate along the Y direction perpendicular to the X direction and the Z direction. One end of the conveying unit is adjacent to the other side of the first material gate transfer device to receive the test piece and transfer the test piece along the Y direction, and the other end of the conveying unit is adjacent to the second material gate transfer device. The test module includes a regularization unit arranged on both sides of the conveying unit, a test machine, and a test piece transfer unit for transferring the test piece between the regularization unit and the test machine. One end of the gate area is opposite to the clamp of the second material gate transfer device, and the gate area extends along the X direction.

In this way, the gates loaded with the test pieces to be tested can be concentrated in the gate entry area for the first gate transfer device to take out. The feed device unloads the test pieces from the gate on the first gate transfer device and inputs them into the conveying unit. The test piece transfer unit transfers the test pieces on the conveying unit to the regular position of the regular unit and then transfers them into the test machine for testing. The tested test pieces are then taken out by the test piece transfer unit and re-input into the conveying unit. The conveying unit transports the tested test pieces to the gate in the second gate transfer device. After the second gate transfer device collects the tested test pieces, it concentrates the gates in the gate exit area to output the gates. The testing system can automatically feed, test and discharge multiple test pieces contained in the gates, thereby improving the testing efficiency.

In some embodiments, each of the aforementioned material gate transfer devices includes a bottom rail and a vertical rail, the bottom rail extends along the X direction, the vertical rail extends along the Z direction and can be slidably arranged on the bottom rail along the X direction, and the clamp can be slidably arranged on the vertical rail along the Z direction.

In some embodiments, the test system further includes a machine, and the test piece transfer unit includes a base, a top rail, and a transfer device. The base extends along the Z direction and one end is fixed to the machine. The top rail is fixed to the other end of the base and extends along the X direction. The transfer device can be displaced along the X direction and disposed on the top rail.

In some embodiments, the range of the aforementioned top rail in the X direction overlaps the regularization unit and the test machine.

In some embodiments, the aforementioned transfer device includes a first transfer head and a second transfer head, and the first transfer head and the second transfer head are arranged in parallel along the X direction.

In some embodiments, the first transfer head is closer to the regularization unit than the second transfer head in the X direction, and the second transfer head is closer to the testing machine than the first transfer head in the X direction.

In some embodiments, the test system further includes at least an extended conveying mechanism, and the number of gate-out areas is plural, the number of second gate transfer devices corresponds to the number of gate-out areas, and the extended conveying mechanism can be slidably disposed along the Z direction on the vertical rails of the remaining second gate transfer devices except the one farthest from the first gate transfer device.

In some embodiments, the aforementioned second material gate transfer device is arranged in parallel along the Y direction.

In some embodiments, the test system further includes a machine, the number of the aforementioned test machines is two, the two test machines are arranged in parallel along the Y direction, the test piece transfer unit includes a base, a top rail and a transfer device, the base extends along the Z direction and one end is fixed to the machine, the top rail is fixed to the other end of the base and extends along the X direction, and the two transfer devices can be respectively arranged on opposite sides of the top rail so as to be displaceable along the X direction.

In some embodiments, the aforementioned gate area includes two gate containers, and the two gate containers are overlapped along the Z direction.

S:Test piece

M: material gate

M1: Top surface

M2: bottom surface

M3: First side

M4: Second side

M5: slot

10: Gate transfer device

10A: First material gate transfer device

10B: Second material gate transfer device

11: Bottom rail

12: Vertical track

13: Clamp

131: Clamping

14: Sliding seat

20: Gate area

21: Gate container

21A: First gate container

21B: Second entry container

30: Feeding device

31: Feeding section

40:Transportation unit

50:Test module

51:Regular unit

52: Testing machine

53: Test piece transfer unit

531: Base

532: Top track

533:Transfer device

5331: First transfer head

5332: Second transfer head

60: Exit area

60A: First exit gate area

60B: Second exit area

60C: The third exit area

61: Gate container

61A: First outlet container

61B: Second outlet container

70: Machine

80: Extended conveying mechanism

X,Y,Z: Direction

Figure 1 is a three-dimensional schematic diagram of one embodiment of the test system of this case.

Figure 2 is a top view of one embodiment of the test system of this case.

Figure 3 is a partial schematic diagram of an embodiment of a second material gate transfer device with an extended conveying mechanism.

Please refer to Figures 1 to 3. Figure 1 is a three-dimensional schematic diagram of an embodiment of the test system of this case; Figure 2 is a top view of an embodiment of the test system of this case; Figure 3 is a partial schematic diagram of an embodiment of the second material gate transfer device with an extended conveying mechanism. The test system of this case is suitable for testing multiple test pieces S, and the test pieces S are placed in the material gate M at intervals along the Z direction before and after the test.

Referring to FIG. 1 , the material gate M (Magazine) is a container for accommodating a plurality of semiconductor strips S (Strips). In some embodiments, the material gate M includes a top surface M1, a bottom surface M2, a first side surface M3, and a second side surface M4, wherein the top surface M1 is opposite to the bottom surface M2, and the first side surface M3 is opposite to the second side surface M4 and connected between the top surface M1 and the bottom surface M2. In these embodiments, the first side surface M3 and the second side surface M4 have a plurality of slots M5 on the sides opposite to each other, and each slot M5 extends between the two ends of the first side surface M3 and the second side surface M4 opposite to each other, and the two ends of each slot M5 are open at the two ends of the first side surface M3 and the second side surface M4. Thus, each test piece S can be slidably inserted into each slot M5 from both ends of the first side surface M3 and the second side surface M4.

Referring to FIG. 1 , the test piece S is the device under test (DUT) of the test system. In some embodiments, the test piece S is a semiconductor element in the form of a thin sheet. In these embodiments, the test piece S is a long rectangular thin sheet structure.

Referring to FIG. 1 and FIG. 2 , the test system includes a plurality of gate transfer devices 10, a gate entry area 20, a material feeding device 30, a conveying unit 40, a test module 50, and a gate exit area 60. Each gate transfer device 10 can be displaced in an X direction perpendicular to the Z direction and includes a clamp 13. The clamp 13 is disposed on the gate transfer device 10 so as to be displaceable in the Z direction. The plurality of gate transfer devices 10 include a first gate transfer device 10A and a second gate transfer device 10B. The gate entry area 20 extends in the X direction and one end thereof is opposite to the clamp 13 of the first gate transfer device 10A. The feeding device 30 is disposed on one side of the first gate transfer device 10A, and is used to unload the test piece S from the gate M along the Y direction perpendicular to the X direction and the Z direction. One end of the conveying unit 40 is adjacent to the other side of the first gate transfer device 10A to receive the test piece S and convey the test piece S along the Y direction, and the other end of the conveying unit 40 is adjacent to the second gate transfer device 10B. The test module 50 includes a regularization unit 51 disposed on both sides of the conveying unit 40, a test machine 52, and a test piece transfer unit 53 for transferring the test piece S between the regularization unit 51 and the test machine 52. One end of the gate area 60 is opposite to the clamp 13 of the second gate transfer device 10B, and the gate area 60 extends along the X direction.

Thereby, the material gate M loaded with the test piece S to be tested can be concentrated in the gate entry area 20 for the first material gate transfer device 10A to take out, the material feeding device 30 unloads the test piece S from the material gate M on the first material gate transfer device 10A and inputs it to the conveying unit 40, the test piece transfer unit 53 transfers the test piece S on the conveying unit 40 to the regular position of the standard unit 51 and then transfers it to the testing machine 52 for testing, the tested test piece S is taken out by the test piece transfer unit 53 and re-input into the conveying unit 40, the conveying unit 40 conveys the tested test piece S to the material gate M in the second material gate transfer device 10B, and after the second material gate transfer device 10B completes collecting the tested test piece S, it concentrates the material gate M in the gate exit area 60 to output the material gate M. It can be seen from this that the testing system can automatically load, test and discharge multiple test pieces S contained in the material gate M, thereby improving the testing efficiency.

Referring to FIG. 1 and FIG. 2 , in some embodiments, the test system includes a machine 70. In these embodiments, each component can be constructed on the machine 70 based on the machine 70, but the present invention is not limited thereto.

Referring to Figures 1 to 3, the gate transfer device 10 is used to transfer the gate M along the Z direction and the X direction perpendicular to the Z direction. In some embodiments, the gate transfer device 10 includes a bottom rail 11, a vertical rail 12, and a clamp 13. In these embodiments, the bottom rail 11 extends along the X direction and is fixedly arranged on the machine 70, the vertical rail 12 extends along the Z direction and can be slidably arranged on the bottom rail 11 along the X direction, and the clamp 13 can be slidably arranged on the vertical rail 12 along the Z direction. Here, the clamp 13 has a clamping mouth 131 to clamp the top surface M1 and the bottom surface M2 of the gate M, and when the gate M is clamped in the clamp 13, the two ends of the slot M5 in the gate M are connected along the Y direction.

Referring to Figures 1 and 2, in some embodiments, the first gate transfer device 10A is used to take the gate M in the gate area 20; and the second gate transfer device 10B is used to take the gate M in the gate area 60. In these embodiments, the clamping mouth 131 of the clamping device 13 of the first gate transfer device 10A faces the gate area 20, and one end of the bottom rail 11 of the first gate transfer device 10A extends to the gate area 20; and the clamping mouth 131 of the clamping device 13 of the second gate transfer device 10B faces the gate area 60, and one end of the bottom rail 11 of the second gate transfer device 10B extends to the gate area 60.

Referring to FIG. 1 and FIG. 2 , in some embodiments, the gate area 20 includes a plurality of gate containers 21, each of which is a long hollow container extending along the X direction for accommodating the gate M. In these embodiments, each gate container 21 is overlapped along the Z direction, and one end of each gate container 21 is adjacent to the first gate transfer device 10A in the X direction. Thus, the vertical rail 12 of the first gate transfer device 10A can be displaced along the X direction on the bottom rail 11 to drive the gripper 13 to the gate container 21 to take out or put in the gate M.

Referring to FIG. 1 , in some embodiments, the plurality of gate containers 21 include a first gate container 21A and a second gate container 21B. The first gate container 21A is used to accommodate a gate M loaded with a test piece S to be tested, and the second gate container 21B is used to accommodate an empty gate M without a test piece S. Thus, an operator can load a plurality of gates M loaded with test pieces S to be tested into the first gate container 21A at one time for the test system to continue testing. When the test pieces S in the gate M taken out by the first gate transfer device 10A are all input into the conveying unit 40 by the feeding device 30 to enter the test process, the first gate transfer device 10A can place the empty gate M into the second gate container 21B for the operator to take away. In this way, during the test process, there is no need to wait for the empty gate M to be taken away before refilling the gate M loaded with the test piece S to be tested, which can improve the test speed and efficiency.

It is worth noting that the number of gate containers 21 in the embodiment shown in FIG. 1 is illustrated by taking two gate containers 21 as an example, but the present invention is not limited to this. The number of gate containers 21 can be determined according to the demand and the displacement range of the clamp 13 of the first material gate transfer device 10A in the Z direction.

Referring to FIG. 1 and FIG. 2 , in some embodiments, the feed device 30 is capable of unloading the test piece S from the material gate M along the Y direction. In these embodiments, the feed device 30 is fixedly mounted on the machine 70 and includes a feed portion 31, which can be displaced along the Y direction. Here, when the material gate M is clamped by the first material gate transfer device 10A, the feed portion 31 of the feed device 30 faces one end of the slot M5 of the material gate M. In this way, the first material gate transfer device 10A only needs to change the position of the clamp 13 in the Z direction, and the feed device 30 can correspond to the position of different test pieces S in the material gate M. As long as the feed portion 31 of the feed device 30 is driven to extend and retract along the Y direction, the test piece S in the material gate M can be unloaded from the material gate M and the test piece S can be sent to the conveying unit 40. In some embodiments, the feeding device 30 is a feeding part 31 of a telescopic rod type driven by a gas/hydraulic cylinder to extend and retract to unload the test piece S, but the present invention is not limited to this.

Referring to FIG. 1 and FIG. 2 , the transport unit 40 transports the test piece S along the Y direction to complete the test. In some embodiments, the transport unit 40 may be a conveyor belt. In these embodiments, the transport unit 40 extends along the Y direction between the first material gate transfer device 10A and the second material gate transfer device 10B.

Referring to FIG. 1 and FIG. 2 , in some embodiments, the calibration unit 51 is disposed on one side of the conveying unit 40 to calibrate the position of the test piece S in the X direction and the Y direction, so that the position of the test piece S in the X direction and the Y direction is at the position for subsequent testing by the testing machine 52 .

Referring to Figures 1 and 2, the test machine 52 is disposed on the other side of the conveying unit 40 for testing the test piece S. In these embodiments, the calibration unit 51 and the test machine 52 are located at the same Y-direction position, so as to facilitate the rapid transfer of the test piece transfer unit 53.

Referring to Figures 1 and 2, the test piece transfer unit 53 is disposed between the calibration unit 51 and the test machine 52, and is used to transfer the untested test piece S from the transport unit 40 to the calibration unit 51 for calibration, transfer the calibrated test piece S from the calibration unit 51 to the test machine 52 for testing, and transfer the tested test piece S in the test machine 52 to the transport unit 40.

In some embodiments, the test piece transfer unit 53 includes a base 531, a top rail 532, and a transfer device 533. In these embodiments, the base 531 extends along the Z direction and one end is fixed to the machine 70, the top rail 532 is fixed to the other end of the base 531 and extends along the X direction, and the transfer device 533 can be disposed on the top rail 532 so as to be displaceable along the X direction.

Referring to FIG. 1 and FIG. 2 , in some embodiments, the range of the top rail 532 extending along the X direction overlaps the standard unit 51 and the test machine 52, so that the transfer device 533 can be moved along the X direction to the standard unit 51 or the test machine 52.

Referring to FIG. 1 and FIG. 2 , in some embodiments, the transfer device 533 includes a first transfer head 5331 and a second transfer head 5332, and the first transfer head 5331 and the second transfer head 5332 can be extended and displaced along the Z direction, and the first transfer head 5331 and the second transfer head 5332 are arranged in parallel along the X direction. In these embodiments, in terms of the position in the X direction, the first transfer head 5331 is closer to the regularization unit 51 than the second transfer head 5332, and the second transfer head 5332 is closer to the testing machine 52 than the first transfer head 5331, and the first transfer head 5331 is used to transfer the untested test piece S, and the second transfer head 5332 is used to transfer the tested test piece S.

In some embodiments, the first transfer head 5331 and the second transfer head 5332 may be suction heads that can transfer the test piece S by vacuum suction, but the present invention is not limited thereto.

Here, when the test piece S is transported by the transport unit 40 to the position corresponding to the test piece transfer unit 53, the transfer device 533 of the test piece transfer unit 53 moves along the top rail 532 to the position of the first transfer head 5331 corresponding to the transport unit 40, and then the first transfer head 5331 moves along the Z direction close to the transport unit 40 to take away the test piece S on the transport unit 40. After the first transfer head 5331 takes away the untested test piece S on the transport unit 40, the transfer device 533 moves along the top rail 532 to the position of the first transfer head 5331 corresponding to the standardization unit 51, and then the first transfer head 5331 puts the test piece S into the standardization unit 51. The standardization unit 51 can then standardize the position of the test piece S in the X direction and the Y direction, so that the standardized test piece S is in a position that can be tested by the test machine 52.

Next, when the test piece S is aligned in the alignment unit 51, the first transfer head 5331 takes the aligned test piece S out of the alignment unit 51, and the transfer device 533 moves along the top rail 532 to the position of the first transfer head 5331 corresponding to the position of the test machine 52 and places the aligned test piece S into the test machine 52 for testing.

It is worth noting that since the test system is continuously testing, during the cyclic test, there may be a tested specimen S in the test machine 52. In this case, during the process of the first transfer head 5331 moving to the test machine 52, since the position of the second transfer head 5332 in the X direction is closer to the test machine 52 than the first transfer head 5331, the second transfer head 533 2 will be moved earlier than the first transfer head 5331 to the position corresponding to the test machine 52. At this time, the second transfer head 5332 can first take out the test piece S in the test machine 52, and then the first transfer head 5331 continues to move closer to the test machine 52. When the first transfer head 5331 moves to the position corresponding to the test machine 52, the first transfer head 5331 can place the untested test piece S into the test machine 52 for testing.

Then, the transfer device 533 of the test piece transfer unit 53 moves along the top rail 532. When the second transfer head 5332 corresponds to the position of the transport unit 40, the second transfer head 5332 can reload the tested test piece S into the transport unit 40, and the transport unit 40 continues to transport the test piece S along the Y direction. As can be seen from the above, the transfer device 533 of the test piece transfer unit 53 can take out the tested test piece S and then put in the test piece S to be tested without going back and forth to the transport unit 40, thereby reducing the time spent by the test piece transfer unit 53 to go back and forth to the transport unit 40 and improving the test efficiency.

Referring to FIG. 1 and FIG. 2 , in some embodiments, the number of the test machines 52 of the test module 50 can be two, and the two test machines 52 are arranged in parallel along the Y direction. In these embodiments, a transfer device 533 is respectively arranged on both sides of the top rail 532 of the test piece transfer unit 53, thereby being applicable to the simultaneous testing of the two test machines 52.

In some embodiments, the gate-out area 60 includes a plurality of gate-out containers 61, and the gate-out containers 61 have the same structure as the gate-in container 21 and are not described in detail. In these embodiments, each gate-out container 61 is overlapped along the Z direction, and one end of each gate-out container 61 is adjacent to the second gate transfer device 10B in the X direction. Thus, the vertical rail 12 of the second gate transfer device 10B can be displaced along the X direction on the bottom rail 11 to drive the clamp 13 to the gate-out container 61 to take out or put in the gate M.

In some embodiments, the plurality of gate containers 61 include a first gate container 61A and a second gate container 61B. The first gate container 61A is used to accommodate the gate M loaded with the tested test piece S, and the second gate container 61B is used to accommodate the empty gate M without the test piece S loaded. Thus, the operator can load multiple empty gates M without test pieces S in the second gate container 61B at one time for the second gate transfer device 10B to take out the empty gates M to receive the test pieces S sent out by the conveying unit 40. When the gates M taken out by the second gate transfer device 10B are full of the test pieces S, the second gate transfer device 10B can put the gates M full of the test pieces S into the first gate container 61A for the operator to take away. In this way, during the test process, there is no need to wait for the full gates M to be taken away before replenishing the empty gates M, which can improve the test speed and efficiency.

In some embodiments, the number of gate areas 60 is plural so that the gates M can be classified at the same time when they are output. Each gate area 60 contains a gate M with different characteristics (qualified, unqualified, untested) of the test piece S. In these embodiments, each gate area 60 is arranged in parallel along the Y direction, and a second gate transfer device 10B is provided at one end of each gate area 60.

In some embodiments where the number of the gate area 60 and the second gate transfer device 10B is plural, an extended conveying mechanism 80 is further included to enable the tested specimen S from the conveying unit 40 to be displaced to the gate area 60 of the corresponding characteristics. In these embodiments, the extended conveying mechanism 80 can be slidably disposed along the Z direction on the vertical rails 12 of the remaining second gate transfer devices 10B except the one farthest from the first gate transfer device 10A (as shown in FIG. 2 and FIG. 3 ), that is, the number of extended conveying mechanisms 80 is the number of the second gate transfer devices 10B minus one.

Referring to FIG. 3 , specifically, on the second material gate transfer device 10B provided with the extension conveying mechanism 80 , the second material gate transfer device 10B further includes a slide 14 , which can be slidably disposed on the vertical rail 12 along the Z direction, and the extension conveying mechanism 80 and the clamp 13 are disposed on the slide 14 for synchronous displacement. In these embodiments, in the position in the Z direction, the extension conveying mechanism 80 is farther from the bottom rail 11 than the clamp 13.

Referring to FIG. 1 and FIG. 2 , in the embodiments shown in FIG. 1 and FIG. 2 , the number of gate regions 60 is described as three groups, but the present invention is not limited thereto. In these embodiments, the gate region 60 includes a first gate region 60A, a second gate region 60B, and a third gate region 60C arranged in sequence along the Y direction. The first gate region 60A is closer to the gate region 20 than the third gate region 60C.

Here, when the test piece S output by the conveying unit 40 is tested and its characteristics are determined to be the characteristics corresponding to the first gate area 60A, the slide 14 of the second gate transfer device 10B corresponding to the first gate area 60A adjusts the position of the slot M5 of the gate M thereon in the Z direction to the position corresponding to the conveying unit 40 along the Z direction. In this way, the test piece S outputted by the conveying unit 40 can directly enter the gate M held by the second gate transfer device 10B corresponding to the first gate area 60A. After the gate M held by the second gate transfer device 10B corresponding to the first gate area 60A is fully loaded, the second gate transfer device 10B corresponding to the first gate area 60A can input the fully loaded gate M into the first gate area 60A.

When the test piece S outputted by the conveying unit 40 is determined to have the characteristics corresponding to the second gate area 60B after testing, the slide 14 of the second gate transfer device 10B corresponding to the first gate area 60A adjusts the position of the extended conveying mechanism 80 on it in the Z direction to the position corresponding to the conveying unit 40 (as shown in FIG. 1 ), and the slide 14 of the second gate transfer device 10B corresponding to the second gate area 60B adjusts the position of the gate M on it in the Z direction to the position corresponding to the extended conveying mechanism 80. In this way, the test piece S outputted by the conveying unit 40 can enter the gate M clamped by the second gate transfer device 10B corresponding to the second gate area 60B through the extended conveying mechanism 80 across the first gate area 60A.

Referring to FIG. 1 , when the characteristics of the test piece S outputted by the conveying unit 40 are determined to correspond to the characteristics of the third gate area 60C after being tested, the slide 14 of the second gate transfer device 10B corresponding to the first gate area 60A and the second gate area 60B adjusts the position of the extended conveying mechanism 80 thereon in the Z direction to the position corresponding to the conveying unit 40, and the slide 14 of the second gate transfer device 10B corresponding to the third gate area 60C adjusts the position of the slot M5 of the gate M thereon in the Z direction to the position corresponding to the extended conveying mechanism 80. In this way, the test piece S outputted by the conveying unit 40 can pass through the extended conveying mechanism 80 across the first gate area 60A and the second gate area 60B and enter the gate M held by the second gate transfer device 10B corresponding to the third gate area 60C.

Although the present disclosure has been disclosed as above with some embodiments, it is not intended to limit the present disclosure. Anyone with ordinary knowledge in the relevant technical field may make some changes and modifications without departing from the spirit and scope of the present disclosure. Therefore, the scope of patent protection of this case shall be subject to the scope of the patent application attached to this specification.

S:Test piece

M: material gate

M1: Top surface

M2: bottom surface

M3: First side

M4: Second side

M5: slot

10: Gate transfer device

10A: First material gate transfer device

10B: Second material gate transfer device

12: Vertical track

13: Clamp

131: Clamping

20: Gate area

21: Gate container

21A: First gate container

21B: Second entry container

30: Feeding device

31: Feeding section

40:Transportation unit

50:Test module

51:Regular unit

52: Testing machine

53: Test piece transfer unit

531: Base

532: Top track

533:Transfer device

5331: First transfer head

5332: Second transfer head

60: Exit area

60A: First exit gate area

60B: Second exit area

60C: The third exit area

61: Gate container

61A: First outlet container

61B: Second outlet container

70: Machine

80: Extended conveying mechanism

X,Y,Z: Direction

Claims (9)

A testing system is provided, which is suitable for testing a plurality of test pieces. The plurality of test pieces are placed in a material gate at intervals along a Z direction. The testing system comprises: a plurality of material gate transfer devices, each comprising a bottom rail, a vertical rail and a clamp, wherein the bottom rail extends along an X direction perpendicular to the Z direction, the vertical rail extends along the Z direction and can be slidably arranged on the bottom rail along the X direction, the clamp can be slidably arranged on the vertical rail of the material gate transfer device along the Z direction, and the plurality of material gate transfer devices comprises a first material gate transfer device and a second material gate transfer device; a gate entry area, which extends along the X direction and has one end opposite to the clamp of the first material gate transfer device; an entry area; A material device is arranged on one side of the first material gate transfer device, and is used to unload the test piece from the material gate along a Y direction perpendicular to the X direction and the Z direction; a conveying unit, one end of which is adjacent to the other side of the first material gate transfer device to receive the test piece and convey the test piece along the Y direction, and the other end of the conveying unit is adjacent to the second material gate transfer device; a test module, including a regular unit arranged on both sides of the conveying unit, a test machine, and a test piece transfer unit for transferring the test piece between the regular unit and the test machine; and a gate exit area, one end of which is opposite to the clamp of the second material gate transfer device, and the gate exit area extends along the X direction. The test system as described in claim 1 further includes a machine, and the test piece transfer unit includes a base, a top rail and a transfer device, the base extends along the Z direction and one end is fixed to the machine, the top rail is fixed to the other end of the base and extends along the X direction, and the transfer device can be displaced along the X direction on the top rail. A test system as described in claim 2, wherein the range of the top rail in the X direction overlaps the standard unit and the test machine. The test system as described in claim 2, wherein the transfer device comprises a first transfer head and a second transfer head, and the first transfer head and the second transfer head are arranged in parallel along the X direction. A test system as described in claim 4, wherein the first transfer head is closer to the standard unit than the second transfer head in the X direction, and the second transfer head is closer to the test machine than the first transfer head in the X direction. The test system as described in claim 1 further comprises at least one extended conveying mechanism, and the number of the gate-out areas is plural, the number of the second gate transfer devices corresponds to the number of the gate-out areas, and the extended conveying mechanism can be slidably disposed along the Z direction on the vertical rails of the second gate transfer devices except the one farthest from the first gate transfer device. A test system as described in claim 6, wherein the plurality of second material gate transfer devices are arranged in parallel along the Y direction. The test system as described in claim 1 further includes a machine, and the number of the test machines is two, the two test machines are arranged in parallel along the Y direction, the test piece transfer unit includes a base, a top rail and two transfer devices, the base extends along the Z direction and one end is fixed to the machine, the top rail is fixed to the other end of the base and extends along the X direction, and the two transfer devices can be respectively arranged on opposite sides of the top rail so as to be displaceable along the X direction. A test system as described in claim 1, wherein the gate area includes two gate containers, and the two gate containers are overlapped along the Z direction.

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