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TWI732376B - Growth apparatus for continuous czochralski - Google Patents

Growth apparatus for continuous czochralski Download PDF

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Publication number
TWI732376B
TWI732376B TW108145294A TW108145294A TWI732376B TW I732376 B TWI732376 B TW I732376B TW 108145294 A TW108145294 A TW 108145294A TW 108145294 A TW108145294 A TW 108145294A TW I732376 B TWI732376 B TW I732376B
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Taiwan
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insulation layer
heat insulation
crucible
single crystal
thermal
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TW108145294A
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Chinese (zh)
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TW202122645A (en
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廖思涵
李依晴
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環球晶圓股份有限公司
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Priority to TW108145294A priority Critical patent/TWI732376B/en
Priority to CN202011321051.6A priority patent/CN112941619A/en
Priority to CN202022730358.3U priority patent/CN213951412U/en
Publication of TW202122645A publication Critical patent/TW202122645A/en
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Publication of TWI732376B publication Critical patent/TWI732376B/en

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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/002Continuous growth
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/14Heating of the melt or the crystallised materials
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

A growth apparatus for Continuous Czochralski includes a crucible, a feeding module, a rotating shaft, a thermal-insulating module, and a heating module, wherein the rotating shaft has an axis and drives the crucible to rotate around the axis. The thermal-insulating module includes a first thermal-insulating layer and a second thermal-insulating layer, wherein the first thermal-insulating layer has a first thickness in an axial direction of the axis, and the second thermal-insulating layer has a second thickness in the axial direction of the axis. The crucible is disposed between the first thermal-insulating layer and the second thermal-insulating layer. The first thermal-insulating layer and the second thermal-insulating layer are spaced apart by a minimum distance in the axial direction. A ratio of the minimum distance to the first thickness is between 1:0.2 and 1:0.35, and a ratio of the minimum distance to the second thickness is between 1:0.6 and 1:0.75. The heating module is disposed between the crucible and the thermal-insulating module.

Description

連續直拉單晶生長設備Continuous Czochralski single crystal growth equipment

本發明係與拉晶設備有關;特別是指一種適用於連續直拉法(Continuous Czocharlski,CCz)的拉晶設備。 The present invention is related to crystal pulling equipment; in particular, it refers to a crystal pulling equipment suitable for Continuous Czocharlski (CCz).

已知在典型的CZ法(Czochralski)製程中,係將矽料置於坩堝內,並將矽料在約1416℃之溫度熔化為液態矽後,將具預定結晶取向之矽晶種下降以接觸液態矽之表面,在適當地溫度控制下,液態矽在矽晶種上形成具有與該矽晶種所具預定結晶取向之單晶,接著,旋轉並慢慢提拉矽晶種及坩堝,以在矽晶種下方形成矽晶棒。 It is known that in a typical CZ (Czochralski) process, a silicon material is placed in a crucible, and the silicon material is melted into liquid silicon at a temperature of about 1416°C, and then a silicon seed crystal with a predetermined crystal orientation is lowered to contact On the surface of the liquid silicon, under proper temperature control, the liquid silicon forms a single crystal on the silicon seed crystal with a predetermined crystalline orientation with the silicon seed crystal, and then rotates and slowly pulls the silicon seed crystal and the crucible to A silicon crystal rod is formed under the silicon seed crystal.

在傳統的CZ法下,一個坩堝只能用一次,一次只能產出一根晶棒,為了改善前述問題,業界開始使用連續直拉單晶(Continuous Czocharlski,CCz)法生產晶錠,其係於進行單晶拉製的過程中,連續地或週期性地補充矽料於坩堝中,藉此,在單一坩堝所允許的壽命週期內可完成數根晶棒拉製。 Under the traditional CZ method, a crucible can only be used once, and only one ingot can be produced at a time. In order to improve the aforementioned problems, the industry has begun to use the Continuous Czocharlski (CCz) method to produce ingots. During the single crystal drawing process, the silicon material is continuously or periodically replenished in the crucible, so that the drawing of several crystal rods can be completed within the life cycle allowed by a single crucible.

上述單晶矽的製造過程中,都須使用加熱器提供熔化矽料所需之溫度,而當熱量由連續直拉單晶生長設備逸散至外部時,為了保持足夠的高溫,就需要加大加熱器的功率,從而造成大量熱能的浪費,因此,如何改善熱量從連續直拉單晶生長設備逸散至外部是亟待解決的問題。 In the above-mentioned single crystal silicon manufacturing process, a heater must be used to provide the temperature required to melt the silicon material. When the heat is dissipated from the continuous Czochralski single crystal growth equipment to the outside, in order to maintain a sufficient high temperature, it is necessary to increase the temperature. The power of the heater causes a large amount of waste of heat energy. Therefore, how to improve the heat dissipation from the continuous Czochralski single crystal growth equipment to the outside is an urgent problem to be solved.

有鑑於此,本發明之目的在於提供一種具有隔熱模組之連續直拉單晶生長設備,以改善熱量從連續直拉單晶生長設備逸散至外部的問題。 In view of this, the object of the present invention is to provide a continuous Czochralski single crystal growth equipment with a thermal insulation module to improve the problem of heat escaping from the continuous Czochralski single crystal growth equipment to the outside.

緣以達成上述目的,本發明提供的一種連續直拉單晶生長設備包括有一坩堝、一進料模組、一旋轉軸、一隔熱模組及一加熱模組,該坩堝具有一分隔壁,該分隔壁將該坩堝內部容置空間分隔為一進料區域及一生長區域,該分隔壁上具有至少一通孔連通該進料區域及該生長區域;該進料模組用以提供固體原料至該進料區域;該旋轉軸具有一軸線,該旋轉軸帶動該坩堝以該軸線為軸心旋轉;該隔熱模組包含一第一隔熱層及一第二隔熱層,該第一隔熱層於該軸線方向上具有一第一厚度,該第二隔熱層於該軸線方向上具有一第二厚度,該坩堝設置於該第一隔熱層與該第二隔熱層之間,於該軸線方向上該第一隔熱層至該第二隔熱層間隔一最小距離,該最小距離與該第一厚度之距離比為1:0.2至0.35之間,該最小距離與該第二厚度之距離比為1:0.6至1:0.75之間;該加熱模組設置於該坩堝與該隔熱模組之間。 In order to achieve the above objective, the present invention provides a continuous Czochralski single crystal growth equipment including a crucible, a feeding module, a rotating shaft, a heat insulation module and a heating module, the crucible has a partition wall, The dividing wall divides the internal accommodating space of the crucible into a feeding area and a growth area, the dividing wall has at least one through hole communicating the feeding area and the growth area; the feeding module is used to provide solid raw materials to The feeding area; the rotating shaft has an axis, and the rotating shaft drives the crucible to rotate about the axis; the thermal insulation module includes a first thermal insulation layer and a second thermal insulation layer, the first partition The thermal layer has a first thickness in the axial direction, the second thermal insulation layer has a second thickness in the axial direction, and the crucible is disposed between the first thermal insulation layer and the second thermal insulation layer, There is a minimum distance between the first heat insulation layer and the second heat insulation layer in the axial direction, and the ratio of the distance between the minimum distance and the first thickness is between 1:0.2 and 0.35, and the minimum distance is between 1:0.2 and 0.35. The thickness distance ratio is between 1:0.6 and 1:0.75; the heating module is arranged between the crucible and the heat insulation module.

本發明之效果在於,該加熱模組設置於該坩堝與該隔熱模組之間,且透過該第一隔熱層、該第二隔熱層及該第三隔熱層之設置,能有效阻隔熱能逸散至該連續直拉單晶生長設備外部,能使加熱器的功率下降,進而達成降低生產成本之功效。 The effect of the present invention is that the heating module is arranged between the crucible and the heat insulation module, and through the arrangement of the first heat insulation layer, the second heat insulation layer and the third heat insulation layer, it can be effectively The thermal insulation can escape to the outside of the continuous Czochralski single crystal growth equipment, which can reduce the power of the heater, thereby achieving the effect of reducing the production cost.

〔本發明〕 〔this invention〕

1:連續直拉單晶生長設備 1: Continuous Czochralski single crystal growth equipment

10:腔體 10: Cavity

20:坩堝 20: Crucible

22:分隔壁 22: Partition wall

201:進料區域 201: Feeding area

202:生長區域 202: growth area

221:通孔 221: Through Hole

30:進料模組 30: Feeding module

40:旋轉軸 40: Rotation axis

401:軸線 401: Axis

50:隔熱模組 50: Thermal insulation module

52:第一隔熱層 52: The first insulation layer

521:進料通道 521: Feed Channel

522:開口 522: open

54:第二隔熱層 54: second insulation layer

541:上隔熱層 541: Upper insulation layer

542:下隔熱層 542: Lower Insulation Layer

56:第三隔熱層 56: The third insulation layer

60:加熱模組 60: Heating module

62:第一加熱器 62: The first heater

64:第二加熱器 64: second heater

70:吊線 70: Hanging wire

S:固體原料 S: solid raw material

T1:第一厚度 T1: first thickness

T2:第二厚度 T2: second thickness

D1:最小距離 D1: Minimum distance

D2:最大高度 D2: Maximum height

D3:徑向長度 D3: Radial length

D4:口徑 D4: Caliber

Dd:差值 Dd: Difference

T3:第三厚度 T3: third thickness

圖1為本發明一較佳實施例之連續直拉單晶生長設備的示意圖。 FIG. 1 is a schematic diagram of a continuous Czochralski single crystal growth device according to a preferred embodiment of the present invention.

圖2為上述較佳實施例之連續直拉單晶生長設備的入料示意圖。 Fig. 2 is a schematic diagram of the feeding of the continuous Czochralski single crystal growth equipment of the above preferred embodiment.

為能更清楚地說明本發明,茲舉較佳實施例並配合圖式詳細說明如後。請參圖1至2所示,為本發明一較佳實施例之連續直拉單晶生長設備1,包含有一腔體10、一坩堝20、一進料模組30、一旋轉軸40、一隔熱模組50及一加熱模組60,該坩堝20、該旋轉軸40、該隔熱模組50及該加熱模組60皆設至於該腔體10中。 In order to explain the present invention more clearly, the preferred embodiments are described in detail in conjunction with the drawings as follows. Please refer to Figures 1 to 2, which is a preferred embodiment of the continuous Czochralski single crystal growth equipment 1 of the present invention. It includes a cavity 10, a crucible 20, a feed module 30, a rotating shaft 40, and a The heat insulation module 50 and a heating module 60, the crucible 20, the rotating shaft 40, the heat insulation module 50 and the heating module 60 are all arranged in the cavity 10.

該腔體10呈一圓桶狀,該隔熱模組50包含一第一隔熱層52、一第二隔熱層54及一第三隔熱層56,該第二隔熱層54填充於該腔體之底部,該第一隔熱層52設置於該腔體10之頂部,該第三隔熱層56則設置於該第一隔熱層52與該第二隔熱層54之間,且該第三隔熱層56沿該腔體10之內壁環繞設置,該坩堝20設置於該第一隔熱層52與該第二隔熱層54之間,該坩堝20設置於該第一隔熱層52之下方及該第二隔熱層54之上方,且該坩堝20之外側壁圍繞設置有該第三隔熱層56。 The cavity 10 is in the shape of a barrel. The thermal insulation module 50 includes a first thermal insulation layer 52, a second thermal insulation layer 54 and a third thermal insulation layer 56, and the second thermal insulation layer 54 is filled in the At the bottom of the cavity, the first heat insulation layer 52 is disposed on the top of the cavity 10, and the third heat insulation layer 56 is disposed between the first heat insulation layer 52 and the second heat insulation layer 54, and The third heat-insulating layer 56 is arranged around the inner wall of the cavity 10, the crucible 20 is arranged between the first heat-insulating layer 52 and the second heat-insulating layer 54, and the crucible 20 is arranged on the first insulating layer. Below the thermal layer 52 and above the second heat insulation layer 54, and the outer side wall of the crucible 20 is surrounded by the third heat insulation layer 56.

該加熱模組60是設置於該坩堝20與該隔熱模組50之間,該加熱模組60是用以提供該坩堝20內之原料熔解所需之熱能,以將矽原料熔融成液體的狀態來說其溫度約為1416℃,於本實施例中,該加熱模組60包含有一第一加熱器62及一第二加熱器64,該第一加熱器62係圍繞該坩堝20之外側壁設置,且該第一加熱器62位於該坩堝20與該第三隔熱層56之間,該第二加熱器64係設置於靠近該坩堝20底部之位置,且該第二加熱器64位於該坩堝20與該第二隔熱層54之間, 也就是說,該第一隔熱層52、該第二隔熱層54及該第三隔熱層56共同形成有一隔熱屏蔽,能有效阻隔該加熱模組60提供之熱能逸散至該腔體10外部。 The heating module 60 is arranged between the crucible 20 and the heat insulation module 50. The heating module 60 is used to provide the heat energy required for the melting of the raw material in the crucible 20 to melt the silicon raw material into a liquid. In terms of state, the temperature is about 1416°C. In this embodiment, the heating module 60 includes a first heater 62 and a second heater 64. The first heater 62 surrounds the outer side wall of the crucible 20 The first heater 62 is located between the crucible 20 and the third heat insulation layer 56, the second heater 64 is located near the bottom of the crucible 20, and the second heater 64 is located at the bottom of the crucible 20. Between the crucible 20 and the second heat insulation layer 54, That is, the first heat insulation layer 52, the second heat insulation layer 54 and the third heat insulation layer 56 together form a heat insulation shield, which can effectively prevent the heat energy provided by the heating module 60 from escaping to the cavity Body 10 outside.

於本實施例中,該坩堝20為石英坩堝或含有石英內襯之石墨坩堝,該坩堝20具有一分隔壁22,該分隔壁22將該坩堝內部容置空間分隔為一進料區域201及一生長區域202,該分隔壁22上具有至少一通孔221連通該進料區域201及該生長區域202,該至少一通孔221之數量可以是一個或是複數個,該第一隔熱層52具有一進料通道521,該進料通道521貫穿該第一隔熱層52,該進料模組30與該進料通道521連接,且該進料模組30提供之固體原料S經該進料通道521進入該進料區域201,藉此,該固體原料S經該進料通道521進入該進料區域201,並經該加熱模組60加熱熔融成液體後,由該至少一通孔221流至該生長區域202中,且該至少一通孔221能限制未融熔之固體原料S進入該生長區域中。實務上,該進料模組30能控制進料量或進料速率,在連續直拉單晶(Continuous Czocharlski,CCz)法之單晶拉製的過程中,連續地或週期性地補充矽固體原料於該坩堝20之該進料區域201中,藉此,在單一坩堝所允許的壽命週期內可完成數根晶棒之拉製。 In this embodiment, the crucible 20 is a quartz crucible or a graphite crucible containing a quartz lining. The crucible 20 has a partition wall 22 that divides the internal accommodating space of the crucible into a feeding area 201 and a In the growth area 202, the partition wall 22 has at least one through hole 221 that communicates with the feed area 201 and the growth area 202. The number of the at least one through hole 221 may be one or more. The first heat insulation layer 52 has a The feeding channel 521 penetrates the first heat insulation layer 52, the feeding module 30 is connected to the feeding channel 521, and the solid raw material S provided by the feeding module 30 passes through the feeding channel 521 enters the feeding area 201, whereby the solid raw material S enters the feeding area 201 through the feeding channel 521, is heated and melted by the heating module 60, and then flows to the at least one through hole 221 In the growth area 202, and the at least one through hole 221 can restrict the unmelted solid raw material S from entering the growth area. In practice, the feed module 30 can control the feed amount or feed rate, and continuously or periodically replenish the silicon solid during the single crystal drawing process of the Continuous Czocharlski (CCz) method. The raw materials are in the feeding area 201 of the crucible 20, so that several ingots can be drawn within the life cycle allowed by a single crucible.

該坩堝20之底部連接有該旋轉軸40,該旋轉軸具有一軸線401,該旋轉軸40能受控制地帶動該坩堝20以該軸線401為軸心旋轉,並控制該坩堝20之旋轉速度,該第一隔熱層52於該軸線401方向上具有一第一厚度T1,該第二隔熱層54於該軸線401方向上具有一第二厚度T2,該坩堝20設置於該第一隔熱層52與該第二隔熱層54之間,於該軸線401方向上該第一隔熱層52至該第二隔熱層54間隔一最小距 離D1,該最小距離D1與該第一厚度T1之距離比為1:0.2至1:0.35之間,該最小距離D1與該第二厚度T2之距離比為1:0.6至1:0.75之間,較佳者,該第一厚度T1與該第二厚度T2之比為1:1.6至1:2.5之間,該坩堝20於該軸線401方向上具有一最大高度D2,該最大高度D2與該最小距離D1之長度比為1:1.5至1:2.3之間,藉此,該第一隔熱層52及該第二隔熱層54能提供設置於該第一隔熱層52及該第二隔熱層54之間之該加熱模組60良好的屏蔽,以避免該加熱模組60所生成之熱能逸散至該腔體10之外。 The bottom of the crucible 20 is connected with the rotating shaft 40. The rotating shaft has an axis 401. The rotating shaft 40 can be controlled to drive the crucible 20 to rotate around the axis 401 and control the rotation speed of the crucible 20. The first insulation layer 52 has a first thickness T1 in the direction of the axis 401, the second insulation layer 54 has a second thickness T2 in the direction of the axis 401, and the crucible 20 is disposed on the first insulation Between the layer 52 and the second thermal insulation layer 54, the first thermal insulation layer 52 to the second thermal insulation layer 54 are separated by a minimum distance in the direction of the axis 401 From D1, the distance ratio between the minimum distance D1 and the first thickness T1 is between 1:0.2 and 1:0.35, and the distance ratio between the minimum distance D1 and the second thickness T2 is between 1:0.6 and 1:0.75 Preferably, the ratio of the first thickness T1 to the second thickness T2 is between 1:1.6 and 1:2.5, the crucible 20 has a maximum height D2 in the direction of the axis 401, and the maximum height D2 is The length ratio of the minimum distance D1 is between 1:1.5 and 1:2.3, whereby the first heat insulation layer 52 and the second heat insulation layer 54 can be provided on the first heat insulation layer 52 and the second heat insulation layer 52 The heating module 60 between the heat insulation layers 54 is well shielded to prevent the heat generated by the heating module 60 from escaping to the outside of the cavity 10.

該連續直拉單晶生長設備1還包含一吊線70,該吊線70穿過該第一隔熱層52之一開口522,該吊線70連接有晶種,用以將晶種垂降至該生長區域202含有液體矽之表面,並伴隨適當之拉離速率緩慢升起晶種以持續結晶製程,該第一隔熱層52具有一徑向長度D3,該開口522之口徑D4與該徑向長度D3之長度比為1:1.5至1:2之間,藉由限制該開口522之口徑D4與該徑向長度D3之長度比,以有效避免該加熱模組60所生成之熱能自該開口522逸散至該腔體10之外。 The continuous Czochralski single crystal growth apparatus 1 further includes a suspension wire 70, the suspension wire 70 passes through an opening 522 of the first heat insulation layer 52, and the suspension wire 70 is connected with a seed crystal to lower the seed crystal to the growth The area 202 contains the surface of liquid silicon, and the seed crystal is slowly raised with an appropriate pull-off rate to continue the crystallization process. The first heat insulation layer 52 has a radial length D3, a diameter D4 of the opening 522 and the radial length The length ratio of D3 is between 1:1.5 and 1:2. By limiting the length ratio between the diameter D4 of the opening 522 and the radial length D3, the heat energy generated by the heating module 60 can be effectively prevented from the opening 522. Escape to the outside of the cavity 10.

於本實施例中,該第一隔熱層52及該第二隔熱層54是由碳纖材質製成,該第三隔熱層56是以石墨材質製成,較佳者,該第三隔熱層56為石墨毯,由具有隔熱性及耐熱性的石墨或碳纖之材質製成,能提升該第一隔熱層52、該第二隔熱層54及該第三隔熱層56之隔熱效果,值得一提的是,於本實施例中,該第三隔熱層56之頂部與該第一隔熱層52連接,該第三隔熱層56之底部與該第二隔熱層54連接,藉此能提升該第一隔熱層52、該第二隔熱層54及該第三隔熱層56間密合的程度,以降低熱能由該第一隔熱層52、該第二隔熱層54及該第三隔熱層56彼此間之間隙逸散,除此之外,於本實施例中,該第二隔 熱層54包含一上隔熱層541及一下隔熱層542,該下隔熱層542設置於該腔體10之底部,該上隔熱層541設置於該下隔熱層542之頂部中心處,該上隔熱層541及該下隔熱層542均為圓柱體,且該上隔熱層541之徑向長度小於該下隔熱層542之徑向長度,該第三隔熱層56具有一第三厚度T3為該上隔熱層541之徑向長度與該下隔熱層542之徑向長度之差值Dd,該第三隔熱層56之底部與該下隔熱層542之頂部連接且圍繞該上隔熱層541之外周緣,於其他實施例中,該上隔熱層541及該下隔熱層542也可以是一體成形者,並不以上述為限。 In this embodiment, the first insulation layer 52 and the second insulation layer 54 are made of carbon fiber material, and the third insulation layer 56 is made of graphite material. Preferably, the third insulation layer The thermal layer 56 is a graphite blanket, which is made of graphite or carbon fiber material with thermal insulation and heat resistance, which can improve the first thermal insulation layer 52, the second thermal insulation layer 54 and the third thermal insulation layer 56. Insulation effect, it is worth mentioning that in this embodiment, the top of the third thermal insulation layer 56 is connected to the first thermal insulation layer 52, and the bottom of the third thermal insulation layer 56 is connected to the second thermal insulation layer. The layers 54 are connected, so as to improve the degree of adhesion between the first heat insulation layer 52, the second heat insulation layer 54 and the third heat insulation layer 56, so as to reduce the heat energy from the first heat insulation layer 52, the first heat insulation layer 52, the third heat insulation layer 56 The gap between the second insulation layer 54 and the third insulation layer 56 escapes. In addition, in this embodiment, the second insulation layer The thermal layer 54 includes an upper insulating layer 541 and a lower insulating layer 542. The lower insulating layer 542 is disposed at the bottom of the cavity 10, and the upper insulating layer 541 is disposed at the top center of the lower insulating layer 542 , The upper heat insulation layer 541 and the lower heat insulation layer 542 are both cylindrical, and the radial length of the upper heat insulation layer 541 is smaller than the radial length of the lower heat insulation layer 542, and the third heat insulation layer 56 has A third thickness T3 is the difference Dd between the radial length of the upper insulating layer 541 and the radial length of the lower insulating layer 542, the bottom of the third insulating layer 56 and the top of the lower insulating layer 542 Connecting and surrounding the outer periphery of the upper heat insulation layer 541, in other embodiments, the upper heat insulation layer 541 and the lower heat insulation layer 542 may also be integrally formed, and are not limited to the above.

以上所述僅為本發明較佳可行實施例而已,舉凡應用本發明說明書及申請專利範圍所為之等效變化,理應包含在本發明之專利範圍內。 The above are only the preferred and feasible embodiments of the present invention. Any equivalent changes made by applying the specification of the present invention and the scope of the patent application should be included in the patent scope of the present invention.

1...連續直拉單晶生長設備 10...腔體 20...坩堝 22...分隔壁            201...進料區域        202...生長區域 221...通孔 30...進料模組 40...旋轉軸 401...軸線 50...隔熱模組 52...第一隔熱層      521...進料通道        522...開口 54...第二隔熱層      541...上隔熱層        542...下隔熱層 56...第三隔熱層 60...加熱模組 62...第一加熱器      64...第二加熱器 70...吊線 T1...第一厚度 T2...第二厚度 D1...最小距離 D2...最大高度 D3...徑向長度 D4...口徑 Dd...差值 T3...第三厚度 1...Continuous Czochralski single crystal growth equipment 10...cavity 20...Crucible 22...partition wall 201...feeding area 202...growth area 221...Through Hole 30...Feeding module 40...Rotation axis 401...axis 50...Insulation module 52...First insulation layer 521...Inlet channel 522...Opening 54...Second insulation layer 541...Upper insulation layer 542...Lower insulation layer 56...The third insulation layer 60...heating module 62...The first heater 64...The second heater 70...Suspended wire T1...First thickness T2...Second thickness D1...Minimum distance D2...Maximum height D3...radial length D4...caliber Dd...Difference T3...the third thickness

Claims (9)

一種連續直拉單晶生長設備,包括:一坩堝,具有一分隔壁,該分隔壁將該坩堝內部容置空間分隔為一進料區域及一生長區域,該分隔壁上具有至少一通孔連通該進料區域及該生長區域;一進料模組,用以提供固體原料至該進料區域;一旋轉軸,具有一軸線,該旋轉軸帶動該坩堝以該軸線為軸心旋轉;一隔熱模組,包含一第一隔熱層及一第二隔熱層,該第一隔熱層於該軸線方向上具有一第一厚度,該第二隔熱層於該軸線方向上具有一第二厚度,該坩堝設置於該第一隔熱層與該第二隔熱層之間,於該軸線方向上該第一隔熱層至該第二隔熱層間隔一最小距離,該最小距離與該第一厚度之距離比為1:0.2至1:0.35之間,該最小距離與該第二厚度之距離比為1:0.6至1:0.75之間;以及一加熱模組,設置於該坩堝與該隔熱模組之間;其中,該坩堝設置於該第一隔熱層之下方及該第二隔熱層之上方,該第一隔熱層及該第二隔熱層由碳纖材質製成。 A continuous Czochralski single crystal growth equipment, comprising: a crucible with a partition wall, the partition wall partitions the crucible internal accommodating space into a feed area and a growth area, the partition wall has at least one through hole communicating with the The feeding area and the growth area; a feeding module for supplying solid raw materials to the feeding area; a rotating shaft with an axis, and the rotating shaft drives the crucible to rotate with the axis as the axis; a heat insulation The module includes a first insulation layer and a second insulation layer, the first insulation layer has a first thickness in the axial direction, and the second insulation layer has a second insulation in the axial direction Thickness, the crucible is arranged between the first heat insulation layer and the second heat insulation layer, a minimum distance between the first heat insulation layer and the second heat insulation layer in the axial direction, the minimum distance and the The distance ratio of the first thickness is between 1:0.2 and 1:0.35, and the distance ratio between the minimum distance and the second thickness is between 1:0.6 and 1:0.75; and a heating module set between the crucible and Between the thermal insulation modules; wherein, the crucible is arranged below the first thermal insulation layer and above the second thermal insulation layer, the first thermal insulation layer and the second thermal insulation layer are made of carbon fiber material . 如請求項1所述之連續直拉單晶生長設備,包含一吊線穿過該第一隔熱層之一開口,該第一隔熱層具有一徑向長度,該開口之口徑與該徑向長度之長度比為1:1.5至1:2之間。 The continuous Czochralski single crystal growth apparatus according to claim 1, comprising a suspension wire passing through an opening of the first heat insulation layer, the first heat insulation layer having a radial length, and the diameter of the opening is the same as the radial direction. The length to length ratio is between 1:1.5 and 1:2. 如請求項1所述之連續直拉單晶生長設備,其中該第一隔熱層具有一進料通道,該進料通道貫穿該第一隔熱層,該進料模組提供之固體原料經該進料通道進入該進料區域。 The continuous Czochralski single crystal growth equipment according to claim 1, wherein the first heat insulation layer has a feed channel, the feed channel penetrates the first heat insulation layer, and the solid raw material provided by the feed module passes through The feed channel enters the feed zone. 如請求項1所述之連續直拉單晶生長設備,其中該第一厚度與該第二厚度之比為1:1.6至1:2.5之間。 The continuous Czochralski single crystal growth equipment according to claim 1, wherein the ratio of the first thickness to the second thickness is between 1:1.6 and 1:2.5. 如請求項1所述之連續直拉單晶生長設備,其中該坩堝於該軸線方向上具有一最大高度,該最大高度與該最小距離之比為1:1.5至1:2.3之間。 The continuous Czochralski single crystal growth apparatus according to claim 1, wherein the crucible has a maximum height in the axial direction, and the ratio of the maximum height to the minimum distance is between 1:1.5 and 1:2.3. 如請求項1所述之連續直拉單晶生長設備,其中該隔熱模組包含一第三隔熱層,該第三隔熱層設置於圍繞該坩堝之外側壁的位置。 The continuous Czochralski single crystal growth equipment according to claim 1, wherein the thermal insulation module includes a third thermal insulation layer, and the third thermal insulation layer is disposed at a position surrounding the outer side wall of the crucible. 如請求項6所述之連續直拉單晶生長設備,其中該第三隔熱層之頂部與該第一隔熱層連接,該第三隔熱層之底部與該第二隔熱層連接。 The continuous Czochralski single crystal growth equipment according to claim 6, wherein the top of the third heat insulation layer is connected to the first heat insulation layer, and the bottom of the third heat insulation layer is connected to the second heat insulation layer. 如請求項6所述之連續直拉單晶生長設備,其中該第三隔熱層是以石墨材質製成。 The continuous Czochralski single crystal growth device according to claim 6, wherein the third heat insulation layer is made of graphite material. 如請求項8所述之連續直拉單晶生長設備,其中該第三隔熱層為石墨毯。 The continuous Czochralski single crystal growth device according to claim 8, wherein the third heat insulation layer is a graphite blanket.
TW108145294A 2019-12-11 2019-12-11 Growth apparatus for continuous czochralski TWI732376B (en)

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