TWI732376B - Growth apparatus for continuous czochralski - Google Patents
Growth apparatus for continuous czochralski Download PDFInfo
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- TWI732376B TWI732376B TW108145294A TW108145294A TWI732376B TW I732376 B TWI732376 B TW I732376B TW 108145294 A TW108145294 A TW 108145294A TW 108145294 A TW108145294 A TW 108145294A TW I732376 B TWI732376 B TW I732376B
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- insulation layer
- heat insulation
- crucible
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- 238000010438 heat treatment Methods 0.000 claims abstract description 18
- 238000009413 insulation Methods 0.000 claims description 121
- 239000013078 crystal Substances 0.000 claims description 37
- 238000005192 partition Methods 0.000 claims description 10
- 239000002994 raw material Substances 0.000 claims description 10
- 239000007787 solid Substances 0.000 claims description 8
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 4
- 229910002804 graphite Inorganic materials 0.000 claims description 4
- 239000010439 graphite Substances 0.000 claims description 4
- 239000000725 suspension Substances 0.000 claims description 4
- 229920000049 Carbon (fiber) Polymers 0.000 claims description 3
- 239000004917 carbon fiber Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 claims description 3
- 239000007770 graphite material Substances 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 12
- 229910052710 silicon Inorganic materials 0.000 description 11
- 239000010703 silicon Substances 0.000 description 11
- 238000000034 method Methods 0.000 description 7
- 239000007788 liquid Substances 0.000 description 5
- 239000002210 silicon-based material Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/002—Continuous growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
本發明係與拉晶設備有關;特別是指一種適用於連續直拉法(Continuous Czocharlski,CCz)的拉晶設備。 The present invention is related to crystal pulling equipment; in particular, it refers to a crystal pulling equipment suitable for Continuous Czocharlski (CCz).
已知在典型的CZ法(Czochralski)製程中,係將矽料置於坩堝內,並將矽料在約1416℃之溫度熔化為液態矽後,將具預定結晶取向之矽晶種下降以接觸液態矽之表面,在適當地溫度控制下,液態矽在矽晶種上形成具有與該矽晶種所具預定結晶取向之單晶,接著,旋轉並慢慢提拉矽晶種及坩堝,以在矽晶種下方形成矽晶棒。 It is known that in a typical CZ (Czochralski) process, a silicon material is placed in a crucible, and the silicon material is melted into liquid silicon at a temperature of about 1416°C, and then a silicon seed crystal with a predetermined crystal orientation is lowered to contact On the surface of the liquid silicon, under proper temperature control, the liquid silicon forms a single crystal on the silicon seed crystal with a predetermined crystalline orientation with the silicon seed crystal, and then rotates and slowly pulls the silicon seed crystal and the crucible to A silicon crystal rod is formed under the silicon seed crystal.
在傳統的CZ法下,一個坩堝只能用一次,一次只能產出一根晶棒,為了改善前述問題,業界開始使用連續直拉單晶(Continuous Czocharlski,CCz)法生產晶錠,其係於進行單晶拉製的過程中,連續地或週期性地補充矽料於坩堝中,藉此,在單一坩堝所允許的壽命週期內可完成數根晶棒拉製。 Under the traditional CZ method, a crucible can only be used once, and only one ingot can be produced at a time. In order to improve the aforementioned problems, the industry has begun to use the Continuous Czocharlski (CCz) method to produce ingots. During the single crystal drawing process, the silicon material is continuously or periodically replenished in the crucible, so that the drawing of several crystal rods can be completed within the life cycle allowed by a single crucible.
上述單晶矽的製造過程中,都須使用加熱器提供熔化矽料所需之溫度,而當熱量由連續直拉單晶生長設備逸散至外部時,為了保持足夠的高溫,就需要加大加熱器的功率,從而造成大量熱能的浪費,因此,如何改善熱量從連續直拉單晶生長設備逸散至外部是亟待解決的問題。 In the above-mentioned single crystal silicon manufacturing process, a heater must be used to provide the temperature required to melt the silicon material. When the heat is dissipated from the continuous Czochralski single crystal growth equipment to the outside, in order to maintain a sufficient high temperature, it is necessary to increase the temperature. The power of the heater causes a large amount of waste of heat energy. Therefore, how to improve the heat dissipation from the continuous Czochralski single crystal growth equipment to the outside is an urgent problem to be solved.
有鑑於此,本發明之目的在於提供一種具有隔熱模組之連續直拉單晶生長設備,以改善熱量從連續直拉單晶生長設備逸散至外部的問題。 In view of this, the object of the present invention is to provide a continuous Czochralski single crystal growth equipment with a thermal insulation module to improve the problem of heat escaping from the continuous Czochralski single crystal growth equipment to the outside.
緣以達成上述目的,本發明提供的一種連續直拉單晶生長設備包括有一坩堝、一進料模組、一旋轉軸、一隔熱模組及一加熱模組,該坩堝具有一分隔壁,該分隔壁將該坩堝內部容置空間分隔為一進料區域及一生長區域,該分隔壁上具有至少一通孔連通該進料區域及該生長區域;該進料模組用以提供固體原料至該進料區域;該旋轉軸具有一軸線,該旋轉軸帶動該坩堝以該軸線為軸心旋轉;該隔熱模組包含一第一隔熱層及一第二隔熱層,該第一隔熱層於該軸線方向上具有一第一厚度,該第二隔熱層於該軸線方向上具有一第二厚度,該坩堝設置於該第一隔熱層與該第二隔熱層之間,於該軸線方向上該第一隔熱層至該第二隔熱層間隔一最小距離,該最小距離與該第一厚度之距離比為1:0.2至0.35之間,該最小距離與該第二厚度之距離比為1:0.6至1:0.75之間;該加熱模組設置於該坩堝與該隔熱模組之間。 In order to achieve the above objective, the present invention provides a continuous Czochralski single crystal growth equipment including a crucible, a feeding module, a rotating shaft, a heat insulation module and a heating module, the crucible has a partition wall, The dividing wall divides the internal accommodating space of the crucible into a feeding area and a growth area, the dividing wall has at least one through hole communicating the feeding area and the growth area; the feeding module is used to provide solid raw materials to The feeding area; the rotating shaft has an axis, and the rotating shaft drives the crucible to rotate about the axis; the thermal insulation module includes a first thermal insulation layer and a second thermal insulation layer, the first partition The thermal layer has a first thickness in the axial direction, the second thermal insulation layer has a second thickness in the axial direction, and the crucible is disposed between the first thermal insulation layer and the second thermal insulation layer, There is a minimum distance between the first heat insulation layer and the second heat insulation layer in the axial direction, and the ratio of the distance between the minimum distance and the first thickness is between 1:0.2 and 0.35, and the minimum distance is between 1:0.2 and 0.35. The thickness distance ratio is between 1:0.6 and 1:0.75; the heating module is arranged between the crucible and the heat insulation module.
本發明之效果在於,該加熱模組設置於該坩堝與該隔熱模組之間,且透過該第一隔熱層、該第二隔熱層及該第三隔熱層之設置,能有效阻隔熱能逸散至該連續直拉單晶生長設備外部,能使加熱器的功率下降,進而達成降低生產成本之功效。 The effect of the present invention is that the heating module is arranged between the crucible and the heat insulation module, and through the arrangement of the first heat insulation layer, the second heat insulation layer and the third heat insulation layer, it can be effectively The thermal insulation can escape to the outside of the continuous Czochralski single crystal growth equipment, which can reduce the power of the heater, thereby achieving the effect of reducing the production cost.
〔本發明〕 〔this invention〕
1:連續直拉單晶生長設備 1: Continuous Czochralski single crystal growth equipment
10:腔體 10: Cavity
20:坩堝 20: Crucible
22:分隔壁 22: Partition wall
201:進料區域 201: Feeding area
202:生長區域 202: growth area
221:通孔 221: Through Hole
30:進料模組 30: Feeding module
40:旋轉軸 40: Rotation axis
401:軸線 401: Axis
50:隔熱模組 50: Thermal insulation module
52:第一隔熱層 52: The first insulation layer
521:進料通道 521: Feed Channel
522:開口 522: open
54:第二隔熱層 54: second insulation layer
541:上隔熱層 541: Upper insulation layer
542:下隔熱層 542: Lower Insulation Layer
56:第三隔熱層 56: The third insulation layer
60:加熱模組 60: Heating module
62:第一加熱器 62: The first heater
64:第二加熱器 64: second heater
70:吊線 70: Hanging wire
S:固體原料 S: solid raw material
T1:第一厚度 T1: first thickness
T2:第二厚度 T2: second thickness
D1:最小距離 D1: Minimum distance
D2:最大高度 D2: Maximum height
D3:徑向長度 D3: Radial length
D4:口徑 D4: Caliber
Dd:差值 Dd: Difference
T3:第三厚度 T3: third thickness
圖1為本發明一較佳實施例之連續直拉單晶生長設備的示意圖。 FIG. 1 is a schematic diagram of a continuous Czochralski single crystal growth device according to a preferred embodiment of the present invention.
圖2為上述較佳實施例之連續直拉單晶生長設備的入料示意圖。 Fig. 2 is a schematic diagram of the feeding of the continuous Czochralski single crystal growth equipment of the above preferred embodiment.
為能更清楚地說明本發明,茲舉較佳實施例並配合圖式詳細說明如後。請參圖1至2所示,為本發明一較佳實施例之連續直拉單晶生長設備1,包含有一腔體10、一坩堝20、一進料模組30、一旋轉軸40、一隔熱模組50及一加熱模組60,該坩堝20、該旋轉軸40、該隔熱模組50及該加熱模組60皆設至於該腔體10中。
In order to explain the present invention more clearly, the preferred embodiments are described in detail in conjunction with the drawings as follows. Please refer to Figures 1 to 2, which is a preferred embodiment of the continuous Czochralski single
該腔體10呈一圓桶狀,該隔熱模組50包含一第一隔熱層52、一第二隔熱層54及一第三隔熱層56,該第二隔熱層54填充於該腔體之底部,該第一隔熱層52設置於該腔體10之頂部,該第三隔熱層56則設置於該第一隔熱層52與該第二隔熱層54之間,且該第三隔熱層56沿該腔體10之內壁環繞設置,該坩堝20設置於該第一隔熱層52與該第二隔熱層54之間,該坩堝20設置於該第一隔熱層52之下方及該第二隔熱層54之上方,且該坩堝20之外側壁圍繞設置有該第三隔熱層56。
The
該加熱模組60是設置於該坩堝20與該隔熱模組50之間,該加熱模組60是用以提供該坩堝20內之原料熔解所需之熱能,以將矽原料熔融成液體的狀態來說其溫度約為1416℃,於本實施例中,該加熱模組60包含有一第一加熱器62及一第二加熱器64,該第一加熱器62係圍繞該坩堝20之外側壁設置,且該第一加熱器62位於該坩堝20與該第三隔熱層56之間,該第二加熱器64係設置於靠近該坩堝20底部之位置,且該第二加熱器64位於該坩堝20與該第二隔熱層54之間,
也就是說,該第一隔熱層52、該第二隔熱層54及該第三隔熱層56共同形成有一隔熱屏蔽,能有效阻隔該加熱模組60提供之熱能逸散至該腔體10外部。
The
於本實施例中,該坩堝20為石英坩堝或含有石英內襯之石墨坩堝,該坩堝20具有一分隔壁22,該分隔壁22將該坩堝內部容置空間分隔為一進料區域201及一生長區域202,該分隔壁22上具有至少一通孔221連通該進料區域201及該生長區域202,該至少一通孔221之數量可以是一個或是複數個,該第一隔熱層52具有一進料通道521,該進料通道521貫穿該第一隔熱層52,該進料模組30與該進料通道521連接,且該進料模組30提供之固體原料S經該進料通道521進入該進料區域201,藉此,該固體原料S經該進料通道521進入該進料區域201,並經該加熱模組60加熱熔融成液體後,由該至少一通孔221流至該生長區域202中,且該至少一通孔221能限制未融熔之固體原料S進入該生長區域中。實務上,該進料模組30能控制進料量或進料速率,在連續直拉單晶(Continuous Czocharlski,CCz)法之單晶拉製的過程中,連續地或週期性地補充矽固體原料於該坩堝20之該進料區域201中,藉此,在單一坩堝所允許的壽命週期內可完成數根晶棒之拉製。
In this embodiment, the
該坩堝20之底部連接有該旋轉軸40,該旋轉軸具有一軸線401,該旋轉軸40能受控制地帶動該坩堝20以該軸線401為軸心旋轉,並控制該坩堝20之旋轉速度,該第一隔熱層52於該軸線401方向上具有一第一厚度T1,該第二隔熱層54於該軸線401方向上具有一第二厚度T2,該坩堝20設置於該第一隔熱層52與該第二隔熱層54之間,於該軸線401方向上該第一隔熱層52至該第二隔熱層54間隔一最小距
離D1,該最小距離D1與該第一厚度T1之距離比為1:0.2至1:0.35之間,該最小距離D1與該第二厚度T2之距離比為1:0.6至1:0.75之間,較佳者,該第一厚度T1與該第二厚度T2之比為1:1.6至1:2.5之間,該坩堝20於該軸線401方向上具有一最大高度D2,該最大高度D2與該最小距離D1之長度比為1:1.5至1:2.3之間,藉此,該第一隔熱層52及該第二隔熱層54能提供設置於該第一隔熱層52及該第二隔熱層54之間之該加熱模組60良好的屏蔽,以避免該加熱模組60所生成之熱能逸散至該腔體10之外。
The bottom of the
該連續直拉單晶生長設備1還包含一吊線70,該吊線70穿過該第一隔熱層52之一開口522,該吊線70連接有晶種,用以將晶種垂降至該生長區域202含有液體矽之表面,並伴隨適當之拉離速率緩慢升起晶種以持續結晶製程,該第一隔熱層52具有一徑向長度D3,該開口522之口徑D4與該徑向長度D3之長度比為1:1.5至1:2之間,藉由限制該開口522之口徑D4與該徑向長度D3之長度比,以有效避免該加熱模組60所生成之熱能自該開口522逸散至該腔體10之外。
The continuous Czochralski single
於本實施例中,該第一隔熱層52及該第二隔熱層54是由碳纖材質製成,該第三隔熱層56是以石墨材質製成,較佳者,該第三隔熱層56為石墨毯,由具有隔熱性及耐熱性的石墨或碳纖之材質製成,能提升該第一隔熱層52、該第二隔熱層54及該第三隔熱層56之隔熱效果,值得一提的是,於本實施例中,該第三隔熱層56之頂部與該第一隔熱層52連接,該第三隔熱層56之底部與該第二隔熱層54連接,藉此能提升該第一隔熱層52、該第二隔熱層54及該第三隔熱層56間密合的程度,以降低熱能由該第一隔熱層52、該第二隔熱層54及該第三隔熱層56彼此間之間隙逸散,除此之外,於本實施例中,該第二隔
熱層54包含一上隔熱層541及一下隔熱層542,該下隔熱層542設置於該腔體10之底部,該上隔熱層541設置於該下隔熱層542之頂部中心處,該上隔熱層541及該下隔熱層542均為圓柱體,且該上隔熱層541之徑向長度小於該下隔熱層542之徑向長度,該第三隔熱層56具有一第三厚度T3為該上隔熱層541之徑向長度與該下隔熱層542之徑向長度之差值Dd,該第三隔熱層56之底部與該下隔熱層542之頂部連接且圍繞該上隔熱層541之外周緣,於其他實施例中,該上隔熱層541及該下隔熱層542也可以是一體成形者,並不以上述為限。
In this embodiment, the
以上所述僅為本發明較佳可行實施例而已,舉凡應用本發明說明書及申請專利範圍所為之等效變化,理應包含在本發明之專利範圍內。 The above are only the preferred and feasible embodiments of the present invention. Any equivalent changes made by applying the specification of the present invention and the scope of the patent application should be included in the patent scope of the present invention.
1...連續直拉單晶生長設備
10...腔體
20...坩堝
22...分隔壁 201...進料區域 202...生長區域
221...通孔
30...進料模組
40...旋轉軸
401...軸線
50...隔熱模組
52...第一隔熱層 521...進料通道 522...開口
54...第二隔熱層 541...上隔熱層 542...下隔熱層
56...第三隔熱層
60...加熱模組
62...第一加熱器 64...第二加熱器
70...吊線
T1...第一厚度
T2...第二厚度
D1...最小距離
D2...最大高度
D3...徑向長度
D4...口徑
Dd...差值
T3...第三厚度
1...Continuous Czochralski single
Claims (9)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW108145294A TWI732376B (en) | 2019-12-11 | 2019-12-11 | Growth apparatus for continuous czochralski |
| CN202011321051.6A CN112941619A (en) | 2019-12-11 | 2020-11-23 | Continuous czochralski single crystal growth equipment |
| CN202022730358.3U CN213951412U (en) | 2019-12-11 | 2020-11-23 | Continuous czochralski single crystal growth equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW108145294A TWI732376B (en) | 2019-12-11 | 2019-12-11 | Growth apparatus for continuous czochralski |
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|---|---|
| TW202122645A TW202122645A (en) | 2021-06-16 |
| TWI732376B true TWI732376B (en) | 2021-07-01 |
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|---|---|---|---|
| TW108145294A TWI732376B (en) | 2019-12-11 | 2019-12-11 | Growth apparatus for continuous czochralski |
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| CN (2) | CN213951412U (en) |
| TW (1) | TWI732376B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI732376B (en) * | 2019-12-11 | 2021-07-01 | 環球晶圓股份有限公司 | Growth apparatus for continuous czochralski |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201437440A (en) * | 2012-11-29 | 2014-10-01 | Solaicx Inc | Heat shield for improved continuous Czochralski process |
| TWI526584B (en) * | 2010-09-03 | 2016-03-21 | Gtat Ip控股有限責任公司 | Single crystal doped with gallium, indium or aluminum |
| CN109023508A (en) * | 2018-10-23 | 2018-12-18 | 宁夏旭樱新能源科技有限公司 | Single crystal growing furnace new type of continuous feeding device |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100466029B1 (en) * | 2002-11-20 | 2005-01-13 | 주식회사 실트론 | A Grower for single crystalline silicon ingot |
| CN101760773B (en) * | 2010-02-04 | 2011-11-09 | 西安隆基硅材料股份有限公司 | Monocrystal-pulling insulated feeding method and device thereof |
| WO2016021843A1 (en) * | 2014-08-05 | 2016-02-11 | 주식회사 엘지실트론 | Silicon single crystal growing apparatus and silicon single crystal growing method using same |
| TWI732376B (en) * | 2019-12-11 | 2021-07-01 | 環球晶圓股份有限公司 | Growth apparatus for continuous czochralski |
-
2019
- 2019-12-11 TW TW108145294A patent/TWI732376B/en active
-
2020
- 2020-11-23 CN CN202022730358.3U patent/CN213951412U/en active Active
- 2020-11-23 CN CN202011321051.6A patent/CN112941619A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI526584B (en) * | 2010-09-03 | 2016-03-21 | Gtat Ip控股有限責任公司 | Single crystal doped with gallium, indium or aluminum |
| TW201437440A (en) * | 2012-11-29 | 2014-10-01 | Solaicx Inc | Heat shield for improved continuous Czochralski process |
| CN109023508A (en) * | 2018-10-23 | 2018-12-18 | 宁夏旭樱新能源科技有限公司 | Single crystal growing furnace new type of continuous feeding device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN213951412U (en) | 2021-08-13 |
| CN112941619A (en) | 2021-06-11 |
| TW202122645A (en) | 2021-06-16 |
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