TWI728883B - lighting device - Google Patents
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- TWI728883B TWI728883B TW109125577A TW109125577A TWI728883B TW I728883 B TWI728883 B TW I728883B TW 109125577 A TW109125577 A TW 109125577A TW 109125577 A TW109125577 A TW 109125577A TW I728883 B TWI728883 B TW I728883B
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- 238000005286 illumination Methods 0.000 claims description 32
- 239000000428 dust Substances 0.000 description 11
- 238000003384 imaging method Methods 0.000 description 9
- 238000007689 inspection Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- 230000000007 visual effect Effects 0.000 description 7
- 239000011521 glass Substances 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 230000007547 defect Effects 0.000 description 3
- 239000003086 colorant Substances 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000002310 reflectometry Methods 0.000 description 2
- 238000011179 visual inspection Methods 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 239000000470 constituent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Abstract
本發明的照明設備用以對照明區提供照明,照明設備包括至少兩個照明裝置。至少兩個照明裝置被設置在照明區周圍,且相面對。至少兩個照明裝置的每一個用以將水平排列的多個準直光束垂直匯聚成平行光後再以水平聚焦成照明光來照射照明區。The lighting equipment of the present invention is used to provide lighting to the lighting area, and the lighting equipment includes at least two lighting devices. At least two lighting devices are arranged around the lighting area and face each other. Each of the at least two illuminating devices is used to vertically converge a plurality of collimated light beams arranged horizontally into parallel light and then focus horizontally into illuminating light to illuminate the illuminated area.
Description
本發明與視覺檢查或掃描系統有關,特別是指視覺檢查或掃描系統的照明設備。 The present invention relates to a visual inspection or scanning system, in particular to the lighting equipment of the visual inspection or scanning system.
隨著半導體技術提升,半導體材料(例如晶圓)的結構、尺寸或線路愈來愈精細,各階段製程的檢查也變得愈來愈重要,檢查不僅是對半導體材料檢查,還包括製程中所使用的材料或裝置,例如光罩。 With the improvement of semiconductor technology, the structure, size, or circuit of semiconductor materials (such as wafers) are becoming more and more refined, and inspections at various stages of the process have become more and more important. Inspection is not only the inspection of semiconductor materials, but also includes the inspection of semiconductor materials. The material or device used, such as a photomask.
目前已知的暗區檢查技術是將照明光照(投)射在半導體材料或光罩上,再透過取像設備拍攝已獲得對應的影像,這種技術讓半導體材料或光罩上的粉塵或異物在影像上是明亮,而被發現。 The currently known dark area inspection technology is to project the illumination light (projection) on the semiconductor material or photomask, and then use the imaging device to capture the corresponding image. This technology allows dust or foreign objects on the semiconductor material or photomask to be captured. It is bright in the image, and is found.
目前照明光通常採用一個高強度光源來對光罩提供照明,光罩上由導電路徑所構成的圖案的反射率是比粉塵或異物的反射率更好,目前,照明光照射光罩被檢查區域時,被檢查區域範圍內的微小地粉塵或異物及圖案都會被照亮,但由於圖案的反射率高於微小地粉塵或異物的反射率,因此,將使得圖案的反射光強度大於微小地粉塵或異物的反射光強度,而不利於取像及檢查作業。 At present, illuminating light usually uses a high-intensity light source to illuminate the mask. The reflectivity of the pattern formed by the conductive path on the mask is better than the reflectivity of dust or foreign objects. At present, when the illuminating light illuminates the inspected area of the mask , The small dust or foreign objects and patterns in the inspected area will be illuminated, but because the reflectance of the pattern is higher than that of the small dust or foreign objects, the reflected light intensity of the pattern will be greater than that of the small dust or foreign objects. The intensity of the reflected light of foreign objects is not conducive to image acquisition and inspection operations.
為了避免上述單一光源所產生的問題,目前照明光也有透過環狀排列的雷射光束組成的照明光,如圖6所示,圖6是透過環狀排列的八個雷射 光束投射在物件上的受光角度圖,圖中可發現雷射光束是單一角度的大致準直光束,也就是說雷射光束投射的角度可以產生高強度的照明,雷射光束與雷射光束之間的間隔則幾乎沒有照明光。雖然這種照明方式可以增加被檢查區域範圍的受光角度,但仍不足以在360度的範圍中均勻分配照明光,因此,取像設備拍攝時,被檢查區域範圍內的圖案的反射光強度仍可能會特定角度中發生大於微小地粉塵或異物的反射光強度的現像,故也不利於取像及檢查作業。 In order to avoid the above-mentioned problems caused by the single light source, the current illumination light is also composed of laser beams arranged in a ring, as shown in Figure 6, which is through eight lasers arranged in a ring. The light receiving angle diagram of the beam projected on the object, it can be found that the laser beam is a roughly collimated beam with a single angle, that is to say, the projection angle of the laser beam can produce high-intensity illumination. The difference between the laser beam and the laser beam There is almost no illuminating light in the interval between. Although this lighting method can increase the light receiving angle of the inspected area, it is still not enough to evenly distribute the illuminating light in the range of 360 degrees. Therefore, when the imaging device is shooting, the intensity of the reflected light of the pattern in the inspected area is still The intensity of the reflected light from small dust or foreign objects may occur at a specific angle, so it is not conducive to imaging and inspection operations.
本發明的照明設備可以提供更豐富角度及高強度的照明,以清楚地照亮異物或缺陷,而清楚識別異物或缺陷的位置及尺寸。 The lighting device of the present invention can provide more abundant angles and high-intensity lighting to clearly illuminate foreign objects or defects, and clearly identify the location and size of the foreign objects or defects.
為了達成上述目的,本發明的照明設備用以對照明區提供照明,照明設備包括至少兩個照明裝置。至少兩個照明裝置被設置在照明區周圍,且相面對。至少兩個照明裝置的每一個用以將水平排列的多個準直光束垂直匯聚成平行光後再以水平聚焦成照明光來照射照明區。 In order to achieve the above object, the lighting equipment of the present invention is used to provide lighting to the lighting area, and the lighting equipment includes at least two lighting devices. At least two lighting devices are arranged around the lighting area and face each other. Each of the at least two illuminating devices is used to vertically converge a plurality of collimated light beams arranged horizontally into parallel light and then focus horizontally into illuminating light to illuminate the illuminated area.
如此,本發明的照明裝置可以透過多個準直光束聚焦的照明光來提供多角度的照明,並可對照明區提供高照度的照明。 In this way, the illumination device of the present invention can provide multi-angle illumination through the illumination light focused by a plurality of collimated beams, and can provide high-illuminance illumination to the illumination area.
為了達成上述目的,本發明的照明設備用以對照明區提供照明。照明設備包括多個照明裝置。多個照明裝置被環繞設置在照明區周圍。多個照明裝置的每一個用以將水平排列的多個準直光束垂直匯聚成平行光後再以水平聚焦成照明光來照射照明區。 In order to achieve the above object, the lighting device of the present invention is used to provide lighting to the lighting area. The lighting equipment includes a plurality of lighting devices. A plurality of lighting devices are arranged around the lighting area. Each of the multiple illuminating devices is used to vertically converge multiple collimated light beams arranged horizontally into parallel light and then focus horizontally into illuminating light to illuminate the illuminated area.
如此,本發明的照明裝置可以透過多個準直光束提供更多角度及亮度的照明,並透過環繞照明區周圍的照明裝置來提供較廣角度的照明。 In this way, the illumination device of the present invention can provide more angle and brightness illumination through multiple collimated light beams, and provide wider angle illumination through the illumination device surrounding the illumination area.
有關本發明所提供的照明設備的詳細構造、組成、特點、運作或使用方式,將於後續的實施方式詳細說明中予以描述。然而,在本創作領域中具有通常知識者應能瞭解,該等詳細說明以及實施本創作所列舉的特定實施例,僅係用於說明本創作,並非用以限制本發明之專利申請範圍。 The detailed structure, composition, characteristics, operation, or use of the lighting equipment provided by the present invention will be described in the detailed description of the subsequent implementation manners. However, those with ordinary knowledge in the field of creation should be able to understand that these detailed descriptions and specific embodiments listed in the implementation of this creation are only used to illustrate the creation, and are not intended to limit the scope of the patent application of the present invention.
100:視覺掃描系統 100: Vision scanning system
11,51:照明設備 11, 51: lighting equipment
13:取像設備 13: Acquisition equipment
131:第一照相機 131: The first camera
132,134:濾鏡 132,134: Filter
133:第二照相機 133: second camera
135:分光鏡 135: Spectroscope
137,59:取像區 137, 59: Acquisition area
15,55:照明區 15,55: lighting area
151:反射光 151: Reflected light
17,19,53:照明裝置 17,19,53: lighting installation
171:發光單元 171: Light-emitting unit
172:發光元件 172: Light-emitting element
1721:發散光 1721: divergent light
173:微透鏡陣列 173: Micro lens array
174:微透鏡 174: Micro lens
1741:準直光束 1741: collimated beam
175:第一透鏡 175: The first lens
1751:平行光 1751: Parallel Light
176:第二透鏡 176: second lens
177,57:照明光 177, 57: Illumination light
300:光罩 300: Mask
31:玻璃 31: glass
32:圖案層 32: pattern layer
33:框架 33: Frame
35:膜 35: Membrane
圖1是本發明的照明設備應用在視覺掃描系統以檢查被檢物的示意圖。 Fig. 1 is a schematic diagram of the illumination device of the present invention applied to a visual scanning system to inspect an object.
圖2是圖1中照明設備的其中一照明裝置的光學結構及照明光的俯視示意圖。 Fig. 2 is a schematic top view of the optical structure and illuminating light of one of the illuminating devices of the illuminating device in Fig. 1.
圖3是圖1中照明設備的其中一照明裝置的光學結構及照明光的側視視意圖。 Fig. 3 is a side view of the optical structure and illuminating light of one of the illuminating devices of the illuminating device in Fig. 1.
圖4是圖1中從視覺掃描系統的取像設備觀察照明區,及環狀排列的照明裝置的示意圖。 4 is a schematic diagram of the illumination area and the annular arrangement of the illumination devices viewed from the imaging device of the vision scanning system in FIG. 1.
圖5是應用圖4中照明裝置照射物件,物件受光角度及光強度的關係圖。 FIG. 5 is a diagram showing the relationship between the light receiving angle and light intensity of the object when the lighting device in FIG. 4 is used to illuminate an object.
圖6是應用環狀雷射光束量測物件受光角度及光強度的關係圖。 Fig. 6 is a diagram showing the relationship between the angle of light received by an object and the light intensity measured by a ring-shaped laser beam.
以下,茲配合各圖式列舉對應之較佳實施例來對本發明的照明設備的組成構件及達成功效來作說明。然各圖式中照明設備的構件、尺寸、外觀、照明範圍僅用來說明本發明的技術特徵,而非對本發明構成限制。 Hereinafter, the corresponding preferred embodiments are listed in conjunction with the drawings to illustrate the components and effects of the lighting device of the present invention. However, the components, size, appearance, and lighting range of the lighting equipment in the various drawings are only used to illustrate the technical features of the present invention, but not to limit the present invention.
如圖1所示,本發明的照明設備常被應用在特定製程的視覺掃描系統100,視覺掃描系統100透過拍攝被檢物的被檢表面的部分影像並透過已知影像處理技術來檢查影像對應被檢表面狀態,並在被檢面上標註資訊,例如,被檢面上的粉塵、灰塵、髒污或缺陷的位置。
As shown in Figure 1, the lighting equipment of the present invention is often applied to a
被檢查物例如玻璃、晶圓及光罩等檢查環境。隨後實施例說明中被檢物以光罩300為例。光罩300包括玻璃31、框架33及膜35,玻璃31的表面包括圖案層32。框架33連接玻璃31,且框住圖案層32。膜35連接框架33,用以防止異物(例如粉塵)附著在圖案層32。被檢面是圖案層32。
Inspection environment for objects to be inspected, such as glass, wafers, and photomasks. In the description of the following embodiments, the object to be inspected takes the
視覺掃描系統100包括照明設備11及取像設備13。照明設備11用以對圖案層32的照明區15提供照明,照明區15是圖案層32的部分區域。照明設備11包括二照明裝置17、19。二照明裝置17、19被設置在照明區15周圍,且相面對。取像設備13用以拍攝取像區137內圖案層32的影像,取像區137是取像設備13觀察圖案層32的範圍,如圖中兩虛線界定範圍。照明區15的範圍大致是小於取像區137。取像設備13拍攝照明區15的影像,且包括第一照相機131、第二照相機133及分光鏡135。
The
本實施例中,照明裝置17產生藍色可見光的照明,照明裝置19產生綠色可見光的照明。取像設備13的第一照相機131及第二照相機133分別有濾鏡132、134,第一照相機131的濾鏡132是濾除藍色可見光,以接收綠色可見光,第二照相機133的濾鏡134是濾除綠色可見光,以接收藍色可見光。其他實施例中,照明裝置17、19也可以是其他顏色或全部相同顏色的可見光或不可見光,故照明裝置17、19的照明光線顏色選用不以本實施例所述為限。
In this embodiment, the illuminating
本實施例中,照明區15內照明的反射光151會進入取像設備13內,並通過分光鏡135而分別進入第一照相機131及第二照相機133,以形成對應影像,影像再透過已知的影像處理技術處理來辨別圖案層的狀態。
In this embodiment, the reflected light 151 illuminated in the
因為取像區或照明區15是比圖案層32小,本實施例中,照明區15的尺寸大致是10mm*10mm,因此,為了檢察整個圖案層32,光罩300及視覺掃描系統100會相對移動,例如移動光罩300以讓視覺掃描系統100的檢查整個圖案層32,或者,移動視覺掃描系統100以依序檢查完整個光罩300的圖案層32。
Because the imaging area or the
如圖2及圖3所示,照明裝置17、19是相同的結構,隨後以編號17的照明裝置為例,照明裝置17包括發光單元171、微透鏡陣列173、第一透鏡175及第二透鏡176。發光單元171包括多個發光元件172,以產生多個發散光1721,發光元件172可以是發光二極體(LED)。發光元件172是沿水平線間隔排列,以提供多角度水平排列的發光源。微透鏡陣列173位在發光單元171及聚光透鏡175之間,且包括多個微透鏡174,微透鏡174沿著與發光元件172排列相同的水平線排列,發光元件172及微透鏡174的排列與水平線是平行排列。發光元件172產生的發散光1721一對一通過微透鏡174以輸出水平排列且大致準直光束1741,準直光束1741是沿水平線排列。發光元件172是一對一對準微透鏡174,微透鏡174可以是柱狀。其中,水平排列的準直光束1741大致呈線光源。第一透鏡175包括球面,準直光束1741通過第一透鏡175以垂直匯聚輸出平行光1751,垂直匯聚是透過第一透鏡175限制平行光1751的最高及最低的投射範圍,以使平行光1751匯聚在特定高度的線光源照明。第二透鏡176面對第一透鏡175,且用以供平行光1751通過而水平聚焦輸出照明光177,照明光177最終
聚焦成點光源,如此,照明裝置17、19產生的照明光177可達成多角度共焦且增加亮度的目的的,即擁有高亮度且受光角度豐富的特性。
As shown in Figures 2 and 3, the
如此,本發明的照明裝置17、19可透過將水平排列的準直光束1741透過垂直匯聚成平行光1751後在以水平聚焦成照明光175而提供多角度且高亮度的照明。
In this way, the illuminating
如圖4所示,圖4是取像設備觀看照明區的示意圖。照明設備51包括八個照明裝置53,八個照明裝置53是設置在照明區55周圍,並環繞成360度照明,八個照明裝置53的照明光57是照設在照明區55內,以提供照明區55多角度且高亮度(光強度)的照明,每個照明裝置53的組成及應用與前述照明裝置17相同,於此不在贅述。照明區55在取像區59內,取像區59大致呈圓形。如此,照明設備51可以提供大致涵蓋360度的光線的照明並具備高亮度的特性。
As shown in Fig. 4, Fig. 4 is a schematic diagram of the illumination area viewed by the imaging device. The
如圖5所示,圖5是圖4中物件受光的光強度量測圖。由於本發明的照明設備是將多角度發光源形成的線光源轉換成聚焦的照明光,因此,從圖5中可理解各照明裝置可以提供較廣角度的照明光,以讓物件受光角度更豐富,此外,各照明裝置輸出的聚焦照明光能輸出發光元件的光強度,而有效提升物件表面受光的光強度。 As shown in Fig. 5, Fig. 5 is a measurement diagram of the light intensity of the light received by the object in Fig. 4. Since the lighting device of the present invention converts the linear light source formed by the multi-angle light source into the focused lighting light, it can be understood from FIG. 5 that each lighting device can provide a wider angle of lighting light, so that the light receiving angle of the object is more abundant. In addition, the focused illuminating light output by each illuminating device can output the light intensity of the light-emitting element, thereby effectively increasing the light intensity of the light received on the surface of the object.
在進行暗區檢查時,本發明的照明裝置的照明光可避免光罩的圖案產生較強的反射光,並可提高粉塵或異物的反射光強度,而更適合辨別粉塵或異物的位置及尺寸等,以提高視覺掃描系統的識別能力。 When performing dark area inspection, the illuminating light of the illuminating device of the present invention can prevent the pattern of the mask from producing strong reflected light, and can increase the reflected light intensity of dust or foreign objects, and is more suitable for distinguishing the position and size of dust or foreign objects Etc., in order to improve the recognition ability of the visual scanning system.
最後,再次強調,本發明於前揭實施例中所揭露的構成元件,僅為舉例說明,並非用來限制本案之範圍,其他等效元件的替代或變化,亦應為本案之申請專利範圍所涵蓋。 Finally, it is emphasized again that the constituent elements disclosed in the previously disclosed embodiments of the present invention are only examples and are not used to limit the scope of the case. The substitution or change of other equivalent elements shall also be subject to the scope of the patent application of this case. Covered.
100:視覺掃描系統 100: Vision scanning system
11:照明設備 11: lighting equipment
13:取像設備 13: Acquisition equipment
131:第一照相機 131: The first camera
132,134:濾鏡 132,134: Filter
133:第二照相機 133: second camera
135:分光鏡 135: Spectroscope
137:取像區 137: Acquisition area
15:照明區 15: lighting area
151:反射光 151: Reflected light
17,19:照明裝置 17,19: Lighting installation
300:光罩 300: Mask
31:玻璃 31: glass
32:圖案層 32: pattern layer
33:框架 33: Frame
35:膜 35: Membrane
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109125577A TWI728883B (en) | 2020-07-29 | 2020-07-29 | lighting device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109125577A TWI728883B (en) | 2020-07-29 | 2020-07-29 | lighting device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI728883B true TWI728883B (en) | 2021-05-21 |
| TW202204812A TW202204812A (en) | 2022-02-01 |
Family
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|---|---|---|---|
| TW109125577A TWI728883B (en) | 2020-07-29 | 2020-07-29 | lighting device |
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| Country | Link |
|---|---|
| TW (1) | TWI728883B (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101142806A (en) * | 2005-03-18 | 2008-03-12 | 株式会社理光 | Illumination device, illumination method, image reading device, image reading method, image forming device, and image forming method |
| TW200839227A (en) * | 2007-03-05 | 2008-10-01 | 3I Systems Corp | Automatic inspection system for flat panel substrate |
| CN105793774A (en) * | 2013-12-11 | 2016-07-20 | 佳能株式会社 | Illumination optical system, image projection apparatus, and control method thereof |
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2020
- 2020-07-29 TW TW109125577A patent/TWI728883B/en active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101142806A (en) * | 2005-03-18 | 2008-03-12 | 株式会社理光 | Illumination device, illumination method, image reading device, image reading method, image forming device, and image forming method |
| TW200839227A (en) * | 2007-03-05 | 2008-10-01 | 3I Systems Corp | Automatic inspection system for flat panel substrate |
| CN105793774A (en) * | 2013-12-11 | 2016-07-20 | 佳能株式会社 | Illumination optical system, image projection apparatus, and control method thereof |
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| TW202204812A (en) | 2022-02-01 |
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