TWI704611B - Cutting device and manufacturing method of cut product - Google Patents
Cutting device and manufacturing method of cut product Download PDFInfo
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- TWI704611B TWI704611B TW107144012A TW107144012A TWI704611B TW I704611 B TWI704611 B TW I704611B TW 107144012 A TW107144012 A TW 107144012A TW 107144012 A TW107144012 A TW 107144012A TW I704611 B TWI704611 B TW I704611B
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Abstract
本發明提供一種即使在切斷對象物切斷之後,在工作臺上的保持力也強大的切斷裝置。為了達成所述目的,本發明的切斷裝置特徵在於:包含工作臺(10)、氣壓保持機構和切斷機構(30),藉由工作臺(10)吸引並保持切斷對象物(20),藉由所述氣壓保持機構而將保持有切斷對象物(20)的工作臺(10)外側的氣壓保持為比大氣壓高的氣壓,藉由切斷機構(30)切斷保持於工作臺(10)的切斷對象物(20)。The present invention provides a cutting device that has a strong holding force on a workbench even after a cutting object is cut. In order to achieve the above-mentioned object, the cutting device of the present invention is characterized by including a worktable (10), an air pressure holding mechanism, and a cutting mechanism (30), and the worktable (10) attracts and holds the cutting object (20) , The air pressure outside the table (10) holding the cut object (20) is maintained at a higher pressure than the atmospheric pressure by the air pressure holding mechanism, and the cutting mechanism (30) is cut and held on the table (10) The cutting object (20).
Description
本發明關於一種切斷裝置以及切斷品的製造方法。The present invention relates to a cutting device and a method of manufacturing a cut product.
半導體封裝的製造例如能夠藉由切斷封裝基板進行製造。在封裝基板的切斷中,例如會將基板藉由吸引保持在工作臺上並進行切斷(專利文獻1等)。The semiconductor package can be manufactured by cutting the package substrate, for example. In cutting the package substrate, for example, the substrate is held on a table by suction and cut (Patent Document 1, etc.).
[先前技術文獻] [專利文獻] 專利文獻1 : 特開2011-114145號公報。[Prior Art Document] [Patent Document] Patent Document 1: JP 2011-114145 A.
[發明要解決的課題][Problems to be solved by invention]
但是,若切斷封裝基板所製造的半導體封裝(產品)的尺寸較小,則由吸引而保持至工作臺上的力有可能會不充分。具體而言,切斷後的產品有可能從工作臺上脫落而導致成品率下降、產品不良等。However, if the size of the semiconductor package (product) manufactured by cutting the package substrate is small, the force held on the table by suction may be insufficient. Specifically, the cut product may fall off the workbench, resulting in a decrease in yield and product failure.
於是,本發明的目的是提供一種即使在切斷切斷對象物之後,也會在工作臺上的強大保持力的切斷裝置以及切斷品的製造方法。Therefore, the object of the present invention is to provide a cutting device and a method of manufacturing a cut product that have a strong holding force on the workbench even after cutting the object to be cut.
[用以解決課題之手段][Means to solve the problem]
為了達成所述目的,本發明的切斷裝置特徵在於: 包含工作臺、氣壓保持機構、切斷機構, 藉由所述工作臺吸引並保持切斷對象物, 藉由所述氣壓保持機構使保持有所述切斷對象物的所述工作臺外側的氣壓保持為比大氣壓高的氣壓, 藉由所述切斷機構切斷保持在所述工作臺上的所述切斷對象物。In order to achieve the object, the cutting device of the present invention is characterized in that it includes a table, an air pressure holding mechanism, and a cutting mechanism. The cutting object is sucked and held by the table, and the air pressure holding mechanism is used to hold the cutting object. The air pressure outside the table where the cutting object is located is maintained at an air pressure higher than the atmospheric pressure, and the cutting object held on the table is cut by the cutting mechanism.
本發明的切斷品的製造方法的特徵在於包含: 切斷對象物保持步驟,藉由工作臺吸引並保持切斷對象物; 氣壓保持步驟,將保持有所述切斷對象物的所述工作臺外側的氣壓保持為比大氣壓高的氣壓; 切斷步驟,切斷保持在所述工作臺上的所述切斷對象物。The method for manufacturing a cut product of the present invention is characterized by including: a cutting object holding step, which sucks and holds the cutting object by a table; and an air pressure holding step, which holds the work of the cutting object The air pressure outside the table is maintained at an air pressure higher than the atmospheric pressure; in the cutting step, the cutting object held on the work table is cut.
[發明功效][Invention Effect]
根據本發明能夠提供一種即使在切斷切斷對象物之後,也會在工作臺上具有強大保持力的切斷裝置以及切斷品的製造方法。According to the present invention, it is possible to provide a cutting device and a method of manufacturing a cut product that have a strong holding force on the table even after cutting the cutting object.
接著,藉由舉例更詳細地說明本發明。但是,本發明不限於以下說明。Next, the present invention will be explained in more detail with examples. However, the present invention is not limited to the following description.
本發明的切斷裝置例如可為 進一步包含切斷室, 在所述切斷室中,藉由所述氣壓保持機構,將所述工作臺外側的氣壓保持為比大氣壓高的氣壓的狀態,保持在所述工作臺上的所述切斷對象物被所述切斷機構切斷而製造切斷品的切斷裝置。For example, the cutting device of the present invention may further include a cutting chamber in which the air pressure outside the table is maintained at a higher pressure than the atmospheric pressure by the air pressure maintaining mechanism. The cutting object on the table is cut by the cutting mechanism to produce a cutting device for cutting products.
本發明的切斷裝置例如可為 進一步包含切斷室、加壓室、減壓室, 在所述切斷室內,所述切斷對象物被切斷而製造切斷品, 所述加壓室配置在所述切斷室的切斷對象物搬入側, 所述減壓室配置在所述切斷室的切斷品搬出側, 所述加壓室和所述切斷室連接,並且在所述加壓室以及所述切斷室內部保持為比大氣壓高的氣壓的狀態下,將所述切斷對象物從所述加壓室搬入至所述切斷室, 在所述減壓室和所述切斷室連接的狀態下,所述切斷品從所述切斷室搬出至所述減壓室,然後,斷開所述減壓室和所述切斷室的連接,並且在所述減壓室內部減壓至比所述切斷對象物切斷時更低的氣壓的狀態下,將所述切斷品從所述減壓室的內部搬出至外部的切斷裝置。For example, the cutting device of the present invention may further include a cutting chamber, a pressurizing chamber, and a decompression chamber, in which the cutting object is cut to produce a cut product, and the pressurizing chamber Is arranged on the cutting object carrying-in side of the cutting chamber, the decompression chamber is arranged on the cutting product carrying-out side of the cutting chamber, and the pressurizing chamber is connected to the cutting chamber and is located In a state where the inside of the pressurizing chamber and the cutting chamber are maintained at a pressure higher than atmospheric pressure, the cutting object is carried in from the pressurizing chamber to the cutting chamber, and the decompression chamber and In the state that the cutting chamber is connected, the cut product is carried out from the cutting chamber to the decompression chamber, and then the connection between the decompression chamber and the cutting chamber is disconnected, and in the A cutting device that carries the cut product from the inside of the decompression chamber to the outside in a state where the pressure inside the decompression chamber is reduced to a pressure lower than when the cut object is cut.
本發明的切斷裝置例如可為 所述氣壓保持機構包含儲存室、操作部, 在所述儲存室內部儲存有所述工作臺和所述切斷機構, 藉由所述操作部,將所述儲存室內部的氣壓保持為比大氣壓高的氣壓的切斷裝置。For the cutting device of the present invention, for example, the air pressure holding mechanism may include a storage chamber and an operation part, the workbench and the cutting mechanism may be stored in the storage chamber, and the operation part may A cutting device that maintains the air pressure inside the storage chamber at an air pressure higher than the atmospheric pressure.
本發明的切斷裝置例如可以藉由所述氣壓保持機構而將保持有所述切斷對象物的所述工作臺外側的氣壓保持在1.1×105 Pa以上。The cutting device of the present invention can maintain the air pressure outside the table where the cutting object is held at 1.1×10 5 Pa or more by the air pressure holding mechanism, for example.
本發明的切斷品的製造方法例如可為 使用切斷室, 在所述切斷室中進行所述切斷步驟的切斷品的製造方法。The method of manufacturing a cut product of the present invention may be, for example, a method of manufacturing a cut product using a cutting chamber and performing the cutting step in the cutting chamber.
本發明的切斷品的製造方法例如可為 使用切斷室、加壓室、減壓室, 在所述切斷室中進行所述切斷步驟, 進一步包含切斷對象物搬入步驟、切斷品搬出步驟, 所述切斷對象物搬入步驟為在所述加壓室和所述切斷室連接且所述加壓室以及所述切斷室內部保持為比大氣壓高的氣壓狀態下,將所述切斷對象物從所述加壓室搬入至所述切斷室的步驟, 所述切斷品搬出步驟為在所述減壓室和所述切斷室連接的狀態下,將在所述切斷步驟中,所述切斷對象物被切斷而成的切斷品從所述切斷室搬出至所述減壓室,然後,斷開所述減壓室和所述切斷室的連接後,在所述減壓室內部減壓至比所述切斷對象物切斷時低的氣壓的狀態下,將所述切斷品從所述減壓室內部搬出至外部的步驟的切斷品的製造方法。The method of manufacturing a cut product of the present invention may be, for example, using a cutting chamber, a pressurized chamber, or a decompression chamber, in which the cutting step is performed in the cutting chamber, and further includes a cutting object carrying-in step and cutting In the product carrying out step, the cutting object carrying in step is to carry out the pressure state in which the pressure chamber and the cutting chamber are connected and the pressure chamber and the cutting chamber are kept at a pressure higher than atmospheric pressure. The step of carrying the object to be cut from the pressurized chamber into the cutting chamber, and the step of carrying out the cut product is in the state where the decompression chamber and the cutting chamber are connected. In the cutting step, the cut product obtained by cutting the cutting object is carried out from the cutting chamber to the decompression chamber, and then the decompression chamber and the cutting chamber are disconnected After the connection of the decompression chamber, the step of carrying the cut product out of the decompression chamber to the outside in a state where the pressure in the decompression chamber is reduced to a pressure lower than when the cut object is cut The manufacturing method of cut products.
在本發明中,“比大氣壓高的氣壓”例如可以是高於1atm (1.01325×105 Pa)的氣壓。並且,所述“比大氣壓高的氣壓”例如可以是比使用本發明的切斷裝置時周圍的環境氣壓(大氣壓)高的氣壓,或比使用本發明的切斷品的製造方法時周圍的環境氣壓(大氣壓)高的氣壓。並且,所述“比大氣壓高的氣壓”只要是比大氣壓稍高的氣壓即可獲得本發明的效果,例如可以是1.1×105 Pa以上、1.2×105 Pa以上、1.3×105 Pa以上、1.4×105 Pa以上、1.5×105 Pa以上、2.0×105 Pa以上、3.0×105 Pa以上或4.0×105 Pa以上,例如也可以是1.0×106 Pa(10MPa)以下、9.0×105 Pa以下、8.0×105 Pa以下、7.0×105 Pa以下、6.0×105 Pa以下或5.0×105 Pa以下。In the present invention, "air pressure higher than atmospheric pressure" may be, for example, a pressure higher than 1 atm (1.01325×10 5 Pa). In addition, the "air pressure higher than atmospheric pressure" may be, for example, a pressure higher than the ambient air pressure (atmospheric pressure) when the cutting device of the present invention is used, or a pressure higher than the surrounding environment when the cutting device manufacturing method of the present invention is used. Atmospheric pressure (atmospheric pressure) High pressure. In addition, the "air pressure higher than atmospheric pressure" can obtain the effect of the present invention as long as the pressure is slightly higher than the atmospheric pressure, for example, it may be 1.1×10 5 Pa or more, 1.2×10 5 Pa or more, or 1.3×10 5 Pa or more. , 1.4×10 5 Pa or more, 1.5×10 5 Pa or more, 2.0×10 5 Pa or more, 3.0×10 5 Pa or more, or 4.0×10 5 Pa or more, for example, it may be 1.0×10 6 Pa (10MPa) or less, 9.0×10 5 Pa or less, 8.0×10 5 Pa or less, 7.0×10 5 Pa or less, 6.0×10 5 Pa or less, or 5.0×10 5 Pa or less.
在本發明中,切斷對象物不被特別限定。例如所述切斷對象物雖可以是封裝基板,但不限於此,可以任意。In the present invention, the object to be cut is not particularly limited. For example, although the object to be cut may be a package substrate, it is not limited to this and may be arbitrary.
在本發明中,切斷品不被特別限定,例如可以是樹脂成型品。所述樹脂成型品不被特別限定,例如可以是僅將樹脂進行成型的樹脂成型品,也可以是將晶片等部件進行樹脂封裝的樹脂成型品。在本發明中,樹脂成型品例如也可以是電子部件等。並且,在本發明中,切斷品例如可以是作為成品的產品,也可以是未完成的半成品。In the present invention, the cut product is not particularly limited, and may be, for example, a resin molded product. The resin molded product is not particularly limited. For example, it may be a resin molded product in which only resin is molded, or a resin molded product in which components such as a wafer are resin-encapsulated. In the present invention, the resin molded product may be, for example, an electronic component. In addition, in the present invention, the cut product may be, for example, a finished product or an unfinished semi-finished product.
在本發明中,作為樹脂不被特別限制,例如可以是環氧樹脂和矽酮樹脂等熱固性樹脂,也可以是熱塑性樹脂。並且,也可以是部分包含熱固性樹脂或熱塑性樹脂的複合材料。In the present invention, the resin is not particularly limited. For example, it may be a thermosetting resin such as epoxy resin and silicone resin, or may be a thermoplastic resin. In addition, it may be a composite material partially containing thermosetting resin or thermoplastic resin.
並且,一般而言,“電子部件”包括進行樹脂封裝前的晶片的情況和將晶片進行了樹脂封裝的狀態的情況,但在本發明中,在僅稱“電子部件”的情況下,除非另外指明,否則指所述晶片被進行了樹脂封裝的電子部件(作為成品的電子部件)。在本發明中,“晶片”指進行樹脂封裝前的晶片,具體而言,例如可舉例積體電路(IC)、半導體晶片、電力控制用半導體元件等晶片。在本發明中,為了使進行樹脂封裝前的晶片區別於樹脂封裝後的電子部件,方便起見稱為“晶片”。但是,本發明的“晶片”只要是進行樹脂封裝前的晶片,則不被特別限定,也可以不是晶片狀。In addition, generally speaking, "electronic components" include the case of a chip before resin encapsulation and the case of a state where the chip is resin encapsulated. However, in the present invention, when only "electronic components" are referred to, unless otherwise stated Specify, otherwise it refers to the electronic component (as a finished electronic component) where the chip is resin-encapsulated. In the present invention, "wafer" refers to a wafer before resin encapsulation. Specifically, for example, an integrated circuit (IC), a semiconductor wafer, a semiconductor element for power control, and the like can be exemplified. In the present invention, in order to distinguish a chip before resin encapsulation from an electronic component after resin encapsulation, it is referred to as a "chip" for convenience. However, the "wafer" of the present invention is not particularly limited as long as it is a wafer before resin encapsulation, and it does not have to be a wafer shape.
在本發明中,例如可以將在矽、化合物半導體等基板上配置有電路元件、微電子機械系統(Micro Electro Mechanical Systems;MEMS)等功能元件的半導體晶片(semiconductor wafer)作為切斷對象物,並將其切斷(單片化)為切斷品。並且,在本發明中,可以例如將包含電阻、電容、感測器、表面聲波裝置等功能元件的陶瓷基板、玻璃基板等作為切斷對象物,並將其切斷(單片化)而製造晶片電阻、晶片電容、晶片型感測器、表面聲波裝置等產品(切斷品)。並且,在本發明中,可以例如將樹脂成型品作為切斷對象物,並將其切斷(單片化)而製造鏡頭、光學模組、導光板等光學部件(切斷品)。並且,在本發明中,可以例如將樹脂成型品作為切斷對象物,並將其切斷(切片)而製造產品(切斷品)。並且,在本發明中,可以例如將玻璃板作為切斷對象物,並將其切斷(單片化)而製造用作各種電子機器蓋板的玻璃板(切斷品)。進一步,在本發明中,切斷對象物不限於此,如上所述可以為任意,切斷品也如上所述不被特別限定,可以為任意。In the present invention, for example, a semiconductor wafer (semiconductor wafer) in which circuit elements and functional elements such as microelectromechanical systems (MEMS) are arranged on a substrate such as silicon and compound semiconductors can be used as the cutting object, and This is cut (singulated) into a cut product. Furthermore, in the present invention, for example, ceramic substrates, glass substrates, etc., including functional elements such as resistors, capacitors, sensors, surface acoustic wave devices, etc., are used as objects to be cut and cut (singulated) to produce Chip resistors, chip capacitors, chip-type sensors, surface acoustic wave devices and other products (cut-off products). In addition, in the present invention, for example, a resin molded product can be used as a cutting object, and this can be cut (singulated) to manufacture optical components (cut products) such as lenses, optical modules, and light guide plates. Furthermore, in the present invention, for example, a resin molded product can be used as a cutting object, and this can be cut (sliced) to produce a product (cut product). Furthermore, in the present invention, for example, a glass plate is used as a cutting object, and this is cut (singulated) to produce glass plates (cut products) used as cover plates for various electronic devices. Furthermore, in the present invention, the object to be cut is not limited to this, and may be arbitrary as described above, and the cut product is not particularly limited as described above, and may be arbitrary.
並且,在本發明中,切斷對象物以及切斷品的形狀也不被特別限定,可以是任意。例如,切斷對象物的形狀可以是具有長度方向和寬度方向的矩形,也可以是正方形、圓形等。In addition, in the present invention, the shapes of the cut object and the cut product are not particularly limited, and may be arbitrary. For example, the shape of the object to be cut may be a rectangle having a length direction and a width direction, or may be a square, a circle, or the like.
並且,在本發明中,“載置”、“配置”或“設置”包含“固定”。In addition, in the present invention, "mounting", "arrangement" or "setting" includes "fixing".
下文中,將基於圖式說明本發明的具體實施例。各圖式為了方便說明,藉由適當省略、誇張等而示意性地描述。Hereinafter, specific embodiments of the present invention will be described based on the drawings. For the convenience of description, the drawings are schematically described with appropriate omissions, exaggerations, etc.
[實施例1][Example 1]
在本實施例中,對成型模以及樹脂成型裝置的一例和使用其的樹脂成型品的製造方法的一例進行說明。In this embodiment, an example of a molding die and a resin molding apparatus and an example of a method of manufacturing a resin molded product using the same will be described.
在圖1~6的步驟剖視圖中示意性地示出本發明切斷裝置的一例中一部分結構和使用所述切斷裝置的切斷品的製造方法中的各步驟。The step sectional views of FIGS. 1 to 6 schematically show a part of the structure of an example of the cutting device of the present invention and each step in the method of manufacturing a cut product using the cutting device.
首先,如圖1所示,準備工作臺(夾具)10。此處,雖然圖1至圖6圖示的夾具10實際上構成工作臺的一部分,但在參照圖1至圖6的說明中,方便起見記載為“工作臺10”。關於包含夾具10的整個工作臺,省略圖示。如圖所示,工作臺10上部具備槽11,同時具備從上表面(切斷對象物保持面)貫通至下表面的貫通孔12。槽11如後所述,為用於在其內部通過切斷用刀片的槽。並且,貫通孔12如後所述,為用於將切斷對象物以及將其切斷而製造的切斷品吸引並保持在工作臺10的上表面的貫通孔。First, as shown in FIG. 1, a workbench (fixture) 10 is prepared. Here, although the
接著,如圖2所示,在工作臺10的上表面載置封裝基板(切斷對象物)20。如圖所示,就封裝基板20而言,基板21的一個面使用樹脂(固化樹脂)22進行樹脂成型。封裝基板20能夠僅由基板21以及樹脂22進行成型,但也可進一步包含其他構件(部件)。另外,所述其他構件能夠藉由樹脂22進行封裝(樹脂封裝)。作為所述其他構件不被特別限定,例如可以是用於電子部件、半導體部件等的通常構件,具體而言,例如可舉例晶片、引線等。並且,在同圖中,封裝基板20以樹脂22的一側接觸工作臺10的上表面的方式載置。Next, as shown in FIG. 2, the package substrate (cutting object) 20 is placed on the upper surface of the table 10. As shown in the figure, in the case of the
接著,如圖3所示,藉由吸引機構(未圖示)將工作臺10內部的空氣向箭頭X1方向(工作臺10的內部方向)吸引,並將工作臺10的內部進行減壓。由此,將封裝基板20吸引並保持於工作臺10上表面(切斷物保持步驟)。另外,所述吸引機構不被特別限定,例如可以是吸引泵或真空噴射器等。進一步如圖所示,藉由氣壓保持機構(未圖示)將保持有封裝基板20的工作臺10外側的氣壓保持為比大氣壓高的氣壓(氣壓保持步驟)。由此,能夠對封裝基板20施加箭頭Y1方向(工作臺10的方向)的壓力並將其按壓於工作臺10。藉由該箭頭Y1方向的壓力,封裝基板20保持在工作臺10上的保持力進一步增強。Next, as shown in FIG. 3, the air inside the table 10 is sucked in the arrow X1 direction (the inner direction of the table 10) by a suction mechanism (not shown), and the inside of the table 10 is decompressed. Thereby, the
接著,如圖4所示,將旋轉刀30配置在封裝基板20上方的對應槽11的位置。如圖所示,旋轉刀30以刀主體31的兩個面被一對法蘭(固定構件)32夾持的方式構成。旋轉刀30為本實施例的切斷裝置中“切斷機構”的一部分。旋轉刀30安裝於設置在所述切斷機構的旋轉軸(未圖示)的前端。Next, as shown in FIG. 4, the
接著,如圖5所示,藉由使旋轉刀30旋轉而切斷封裝基板20(基板21以及基板22)(切斷步驟)。此時,如圖所示,能夠藉由使刀主體31貫穿封裝基板20並陷入槽11而完全切斷封裝基板20。Next, as shown in FIG. 5, the package substrate 20 (the
然後,如圖6所示,能夠藉由將封裝基板20在所有規定位置(圖中槽11的位置)切斷而製造封裝部件(切斷品)20b。就切斷品20b而言,如圖所示,被切斷的基板21b的一個面由被切斷的樹脂(固化樹脂)22b進行樹脂成型。此時,如圖6所示,貫通孔12的上端依然被切斷品20b堵住(密封)。因此,在切斷品20b上仍舊施加著來自箭頭X1方向(工作臺10的內部方向)的吸引的力。進一步,在切斷品20b上施加有箭頭Y1方向(工作臺10的方向)的壓力,並將其按壓於工作臺10。由此,能夠使切斷品20b於工作臺10上的保持力進一步增強,而抑制或防止切斷品20b從工作臺10上脫落。Then, as shown in FIG. 6, the
另外,切斷品20b可以是直接能夠流通的產品,也可以是未完成的半成品。所述半成品例如能夠藉由進一步加工而成為產品。所述產品不被特別限定,例如可舉例如上所述的電子部件、半導體部件等。In addition, the
在以往的封裝基板的切斷方法(專利文獻1等)中,若切斷後的切斷品(部件)尺寸較小(例如1個邊的長度為2mm以下),則工作臺(夾具)產生的保持力(吸附力)有可能會不充分,切斷品從工作臺脫落導致成品率降低、產品不良等。具體而言,例如出現切斷品的飛濺(飛散)、在封裝基板的角落部的缺損(缺口)等,而這些有可能成為成品率降低、產品不良等的原因。特別是,若有1個切斷品從工作臺上脫落,則由此有可能會使吸引所述切斷品的工作臺上的孔被打開。然後,在工作臺中的空間連接成1個的情況下,由於所述孔的打開,工作臺中的所述空間的減壓被解除,而有可能其他所有切斷品在所述工作臺上的保持力變小。也就是說,即使僅1個切斷品從工作臺上脫落,其他所有切斷品也有可能因此從所述工作臺上脫落。In the conventional cutting method of package substrate (Patent Document 1, etc.), if the size of the cut product (part) after cutting is small (for example, the length of one side is 2mm or less), the workbench (fixture) The holding power (adsorption power) may be insufficient, and the cut product may fall off the table, resulting in a decrease in yield and product defects. Specifically, for example, splashing (scattering) of the cut product, chipping (notch) in the corner portion of the package substrate, etc., and these may cause a decrease in yield and product failure. In particular, if one cut product falls off the table, there is a possibility that the hole in the table that sucks the cut product may be opened. Then, in the case where the space in the workbench is connected into one, due to the opening of the hole, the pressure reduction of the space in the workbench is released, and it is possible that all other cut products are held on the workbench The force becomes smaller. In other words, even if only one cut product falls off the workbench, all other cut products may fall off the workbench as a result.
對此,根據本發明,保持有切斷對象物的工作臺外側的氣壓被保持為比大氣壓高的氣壓。由此,切斷品在所述工作臺上的保持力被強化,即便是小尺寸的切斷品也能夠牢固地保持(固定)。因此,根據本發明,能夠抑制或防止所述成品率降低、產品不良等問題,而能夠提高切斷品的生產率。In this regard, according to the present invention, the air pressure outside the table where the cutting object is held is maintained at an air pressure higher than the atmospheric pressure. As a result, the holding force of the cut product on the table is strengthened, and even a small-sized cut product can be firmly held (fixed). Therefore, according to the present invention, it is possible to suppress or prevent the aforementioned problems such as a decrease in yield and product defects, and it is possible to improve the productivity of cut products.
以上,對本發明的切斷裝置以及使用其的切斷品的製造方法的一例進行了說明。但是,本發明不僅限於本實施例。例如,在本實施例中,對切斷封裝基板製造電子部件、半導體部件等產品或其半成品的例子進行了說明。但是,在本發明中,就所述切斷對象物而言,如上所述,不限於封裝基板,可適用於任意的切斷對象物。並且,所述切斷品也如上所述,不限於電子部件、半導體部件等,可以是任意。並且,例如本發明的切斷裝置除了藉由所述氣壓保持機構將保持有所述切斷對象物的所述工作臺外側的氣壓保持為比大氣壓高的氣壓以外,可以和通常的切斷裝置相同或為以其為基準的結構。本發明的切斷品的製造方法例如除了進行將保持有所述切斷對象物的所述工作臺外側的氣壓保持為比大氣壓高的氣壓的所述“氣壓保持步驟”以外,可與封裝基板等的通常切斷方法相同或根據其進行。作為封裝基板等的通常切斷方法,例如可為與特開2016-143861號公報等所記載的方法相同或根據其的方法。用於將保持有所述切斷對象物的所述工作臺外側的氣壓保持為比大氣壓高的氣壓的具體裝置的結構、方法也不被特別限定,例如可如後述實施例2或實施例3中所述。In the foregoing, an example of the cutting device of the present invention and the method of manufacturing a cut product using the cutting device has been described. However, the present invention is not limited to this embodiment. For example, in this embodiment, an example in which products such as electronic components and semiconductor components or semi-finished products are manufactured by cutting a package substrate has been described. However, in the present invention, the object to be cut is not limited to the package substrate as described above, and can be applied to any object to be cut. In addition, the cut product is also as described above, and is not limited to electronic components, semiconductor components, etc., and may be arbitrary. Furthermore, for example, the cutting device of the present invention can be combined with a normal cutting device in addition to maintaining the air pressure outside the table where the cutting object is held by the air pressure maintaining mechanism at a pressure higher than the atmospheric pressure. The same or the structure based on it. The method of manufacturing a cut product of the present invention, for example, can be used with the package substrate in addition to the "air pressure maintaining step" in which the air pressure outside the table holding the cutting object is maintained at a pressure higher than atmospheric pressure. The usual cutting method is the same or performed according to it. As a general cutting method of the package substrate etc., for example, it may be the same as or based on the method described in JP 2016-143861 A and the like. The structure and method of the specific device for maintaining the air pressure outside the worktable on which the cutting object is held at a pressure higher than the atmospheric pressure is not particularly limited. For example, it may be as described in Example 2 or Example 3 below. As described in.
本發明例如能夠適合用於一邊為2mm以下或1mm以下等的小尺寸切斷品的製造。但是,本發明不限於此,也可以用於任何大小切斷品的製造中。The present invention can be suitably used, for example, in the production of small-sized cut products having a side of 2 mm or less or 1 mm or less. However, the present invention is not limited to this, and can be used for the production of cut products of any size.
[實施例2][Example 2]
接著,對本發明的其他實施例進行說明。Next, other embodiments of the present invention will be described.
在本實施例中,對本發明的切斷裝置以及切斷品的製造方法的與實施例1不同的一例進行說明。In this embodiment, an example of the cutting device of the present invention and the method of manufacturing a cut product that is different from the embodiment 1 will be described.
圖7的平面圖示意性地示出本實施例切斷裝置的結構。如圖所示,該切斷裝置1000包含A區域、B區域以及C區域3個區域(領域)。A區域包含加壓室1100。B區域包含切斷室1200。C區域包含減壓室1300。加壓室1100配置在切斷室1200的切斷對象物搬入側。減壓室1300配置在切斷室1200的切斷品搬出側。然後,如後所述,在切斷室1200中切斷切斷對象物並製造切斷品。並且,在加壓室1100和切斷室1200連接且加壓室1100以及切斷室1200內部保持為比大氣壓高的氣壓的狀態下,切斷對象物從加壓室1100搬入至切斷室1200。進一步,在減壓室1300和切斷室1200連接的狀態下,所切斷的所述切斷對象物(切斷品)從切斷室1200搬出至減壓室1300。然後,其後,在斷開減壓室1300和切斷室1200的連接後、減壓室1300內部減壓至比所述切斷對象物切斷時低的氣壓的狀態下,所切斷的所述切斷對象物(切斷品)從減壓室1300內部搬出至外部。另外,所述切斷品從減壓室1300內部搬出至外部時的氣壓例如可與大氣壓大致相同。詳情將後述。切斷室1200、加壓室1100以及減壓室1300例如能夠使用和濺射裝置等成膜裝置的真空室、搬入側負載鎖定室以及搬出側負載鎖定室相同的結構。但是,切斷室1200、加壓室1100以及減壓室1300設計為內部空間能夠保持為比大氣壓高的氣壓的形式。Fig. 7 is a plan view schematically showing the structure of the cutting device of this embodiment. As shown in the figure, the
在圖7的切斷裝置1000中,A區域進一步包含基板供給機構(切斷對象物供給機構)1010、控制部1020以及閘閥1030。基板供給機構1010上存有封裝基板(切斷對象物)20,並能夠向加壓室1100供給封裝基板20。另外,封裝基板20可與實施例1中所說明的封裝基板20相同。控制部1020能夠控制整個切斷裝置1000的運作。控制部1020所進行的控制方法不被特別限定,例如可使用電腦程式等。閘閥1030以連接加壓室1100和切斷室1200的方式配置。藉由打開閘閥1030能夠連接加壓室1100中的空間和切斷室1200中的空間。藉由關閉閘閥1030能夠斷開加壓室1100中的空間和切斷室1200中的空間並將其分離。In the
B區域中進一步包含工作臺10、氣壓調整器1210、排水減壓器1220、轉軸1230、波紋管1241以及1242、接收板1250、排水流動部1260以及排出口1270。工作臺10和實施例1(圖1~6)中說明的工作臺10相同,連接於所述的吸引機構(未圖示)。氣壓調整器1210例如具備連接於來自外部空氣壓縮系統的配管的、能夠調整壓縮空氣的流入量的調整閥和減壓時使用的開關閥。另外,省略了所述壓縮系統、配管、調整閥以及開關閥的圖示。藉由氣壓調整器1210調整加壓室1100、切斷室1200以及減壓室1300內部的氣壓。藉由氣壓調整器1210,如後所述能夠將保持有封裝基板(切斷對象物)20的工作臺10外側的氣壓(切斷室1200內部的氣壓)保持為比大氣壓高的氣壓。也就是說,氣壓調整器1210以及切斷室1200相當於切斷裝置1000的“氣壓保持機構”。並且,例如在減壓時,能夠打開所述減壓用開關閥,而從設置在安裝有切斷裝置1000的設施上的排氣管進行排氣。在轉軸1230上安裝有實施例1(圖1~6)中說明的旋轉刀30(在圖7中未圖示)。轉軸1230能夠和旋轉刀30一起向前後左右以及上下移動。藉由轉軸1230能夠使旋轉刀30旋轉並切斷封裝基板20。也就是說,轉軸1230和旋轉刀30一起構成切斷裝置1000的“切斷機構”。並且,為了去除旋轉刀30造成的摩擦熱,能夠使用噴嘴(未圖示)將冷卻水噴於旋轉刀30邊冷卻邊進行後述的切斷步驟。所述噴嘴例如能夠安裝在轉軸1230上。所述冷卻水例如可以是室溫(常溫)的水。所述冷卻水能夠使用後作為排水排出至切斷室1200之外。此時,藉由排水減壓器1220減壓所述排水的壓力。波紋管1241的左端以及波紋管1242的右端分別固定在切斷室1200內部。波紋管1241的右端以及波紋管1242的左端分別連接在接收板1250上。接收板1250能夠載置並搬運封裝基板20以及切斷品20b。並且,能夠藉由使波紋管1241以及1242伸縮而使接收板1250向左右方向(與切斷對象物的搬入方向以及切斷品的搬出方向垂直的方向)移動。排水流動部1260是所述排水流動的部分。能夠從排出口1270將所述排水排出至切斷室1200之外。Area B further includes a
C區域進一步包含閘閥1330、檢查台1400以及托盤1500。閘閥1330以連接減壓室1300和切斷室1200的方式配置。藉由打開閘閥1330能夠連接減壓室1300中的空間和切斷室1200中的空間。藉由關閉閘閥1330能夠斷開減壓室1300中的空間和切斷室1200中的空間並將其分離。在檢查台1400上,檢查封裝部件(切斷品)20b,並分離良品和次品。在托盤1500上收納並保存(保管)切斷品20b中的良品。Area C further includes
使用圖7的切斷裝置1000的切斷品的製造方法例如能夠如下進行。首先,使用氣壓調整器1210對切斷室1200中供給壓縮空氣,使切斷室1200內部為比大氣壓高的氣壓。其後,直到後述的切斷步驟結束為止,保持切斷室1200內部為比大氣壓高的氣壓(氣壓保持步驟)。The manufacturing method of the cut product using the
另一方面,藉由基板供給機構1010向加壓室1100內部搬入封裝基板20。此時,由於加壓室1100開放而內部和外部連接,因此加壓室1100內部的壓力和大氣壓相同。On the other hand, the
接著,使加壓室1100成為密閉狀態。之後,使用氣壓調整器1210對加壓室1100中供給壓縮空氣並加壓。由此,使加壓室1100內部的氣壓和切斷室1200內部的氣壓大致相同。當加壓室1100內部的氣壓與切斷室1200內部的氣壓大致相同,則停止藉由氣壓調整器1210供給壓縮空氣。在該狀態下,打開加壓室1100和切斷室1200之間的閘閥1030,並將封裝基板20搬入至切斷室1200中(切斷對象物搬入步驟)。其後,關閉閘閥1030、斷開加壓室1100內部和切斷室1200內部的連接並將其分離。Next, the
接著,將搬入至切斷室1200中的封裝基板(切斷對象物)20藉由工作臺(夾具)10吸引並保持(切斷對象物保持步驟)。其後,將封裝基板20藉由轉軸1230以及旋轉刀30(切斷機構)進行切斷(切斷步驟)。由此,能夠製造封裝基板(切斷對象物)20被切斷而單片化的封裝部件(切斷品)20b。這些切斷對象物保持步驟以及切斷步驟例如能和實施例1(圖1~6)同樣進行,也能夠和通常的封裝基板的切斷方法相同或根據其進行。Next, the package substrate (cutting object) 20 carried in the
另外,所述切斷步驟例如如上所述,能夠使用噴嘴(未圖示)將冷卻水噴於旋轉刀30邊冷卻邊進行。所述冷卻水在使用後如上所述,能夠作為排水流動在排水流動部1260,並從排出口1270排出至切斷室1200之外。In addition, the cutting step can be performed while cooling the
另一方面,使用氣壓調整器1210將壓縮空氣供給到減壓室1300中並加壓。然後,當減壓室1300內部的氣壓與切斷室1200內部的氣壓大致相同,則停止藉由氣壓調整器1210供給壓縮空氣。該操作可以在所述切斷步驟(封裝基板20的切斷)結束之後進行,但是若在所述切斷步驟結束之前(例如,與所述切斷步驟並行)進行,則效率高。On the other hand, the compressed air is supplied into the
然後,所述切斷步驟(封裝基板20的切斷)結束,並且在減壓室1300內部的氣壓和切斷室1200內部的氣壓大致相同的狀態下,打開閘閥1330。在該狀態下,從切斷室1200搬出封裝部件(切斷品)20b,並收納在減壓室1300中。其後,關閉閘閥1330、將減壓室1300中的空間和切斷室1200中的空間的連接斷開並將其分離。進一步使用氣壓調整器1210將減壓室1300中的空氣排出至外部而進行減壓。當減壓室1300中的氣壓與大氣壓大致相同,就將封裝部件(切斷品)20b搬出至減壓室1300的外部(切斷品搬出步驟)。其後,使用檢查台1400檢查封裝部件(切斷品)20b並收納於托盤1500。Then, the cutting step (cutting of the package substrate 20) ends, and the
另外,作為本實施例(實施例2)的變形例,例如能夠為由圖7的切斷裝置1000省略加壓室1100以及減壓室1300的結構。在該情況下,例如藉由閘閥1030以及閘閥1330的開合,能夠連通(連接)或分離切斷室1200內部空間和外部空間。並且,在該情況下,從基板供給機構(切斷對象物供給機構)1010不藉由加壓室1100而將封裝基板(切斷對象物)20搬入至切斷室1200,並且從切斷室1200不藉由減壓室1300而將封裝部件(切斷品)20b搬出至外部。因此,在切斷對象物搬入步驟中,在切斷室1200的內部為大氣壓的狀態下,從設置在切斷室1200的搬入部搬入封裝基板(切斷對象物)20。其後使切斷室1200為密閉狀態,並使用氣壓調整器1210將壓縮空氣供給到切斷室1200中,使切斷室1200中的氣壓為比大氣壓高的狀態。在該切斷室1200中的氣壓比大氣壓高的狀態下,進行所述切斷步驟。就切斷品搬出步驟而言,在所述切斷步驟之後,使用氣壓調整器1210將切斷室1200中的空氣排出至外部進行減壓,當切斷室1200中的氣壓與大氣壓大致相同,將封裝部件(切斷品)20b從設置在切斷室1200的搬出部搬出至外部。除此之外,由圖7的切斷裝置1000省略了加壓室1100以及減壓室1300的變形例中的切斷品的製造方法能夠和使用圖7的切斷裝置1000的切斷品的製造方法同樣地進行。In addition, as a modification of the present embodiment (Embodiment 2), for example, the
[實施例3][Example 3]
接著,對本發明的其他不同的實施例進行說明。Next, other different embodiments of the present invention will be described.
在本實施例中,對本發明的切斷裝置以及切斷品的製造方法的、與實施例1以及實施例2不同的一例進行說明。In this embodiment, an example of the cutting device and the method of manufacturing a cut product of the present invention, which is different from Embodiment 1 and Embodiment 2, will be described.
圖8的平面圖示意性地示出本實施例的切斷裝置的結構。如圖所示,該切斷裝置1000b和實施例2(圖7)的切斷裝置同樣地包含A區域、B區域以及C區域3個區域(領域)。該切斷裝置1000b不包含加壓室1100、切斷室1200以及減壓室1300,A區域、B區域以及C區域3個區域連接成1個。因此,該切斷裝置1000b不包含閘閥1030以及1330。並且,就該切斷裝置1000b而言,A區域、B區域以及C區域3個區域整體儲存在儲存室2000內部。氣壓調整器1210以及排水減壓器1220配置在儲存室2000的外側。進一步在儲存室2000的外側配置有操作部2100。藉由操作部2100,儲存室2000內部的氣壓保持為比大氣壓高的氣壓。因此,操作部2100以及儲存室2000相當於切斷裝置1000b中的“氣壓保持機構”。並且,當不實施切斷品的製造方法時,例如能夠藉由操作部 2100使儲存室2000內部的氣壓與大氣壓大致相同。儲存室2000能夠開合。在實施切斷品的製造方法時,能夠關閉儲存室2000而分離儲存室2000內部的空間和外部的空間。另一方面,當不實施切斷品的製造方法時,能夠打開儲存室2000而連接儲存室2000內部的空間和外部的空間。除此之外,圖8的切斷裝置1000b和圖7(實施例2)的切斷裝置1000相同。Fig. 8 is a plan view schematically showing the structure of the cutting device of this embodiment. As shown in the figure, this
儲存室2000例如可以是確保能夠進行內部維護作業的空間的尺寸。具體而言,例如可以是藉由人進入儲存室2000內部,而能夠進行切斷裝置1000b的維護作業。儲存室2000的結構不被特別限定,例如能夠使用與氣密性高的商用冰箱或冰櫃相同的結構。但是,能夠省略非用於維持氣密性的隔熱材料等。並且,操作部2100例如能夠藉由和儲存室2000內部進行無線或有線通訊而操作切斷裝置1000b。具體而言,例如能夠藉由將操作部2100和控制部1020進行無線或有線通訊而控制整個切斷裝置1000b的運作。並且,操作部2100的形態也不被特別限定。例如,在圖8中,操作部2100圖示為安裝在儲存室2000的壁部外側的操作面板。但是,操作部2100不限於此,例如可以是平板終端等。The
使用圖8的切斷裝置1000b的切斷品的製造方法例如能夠將實施例2中所說明的所有步驟在將儲存室2000內部保持為比大氣壓高的氣壓的狀態下實施。例如,可使用氣壓調整機構(未圖示,例如為壓縮泵等)對儲存室2000內部供給壓縮空氣,將儲存室2000內部保持為比大氣壓高的氣壓。如上所述,該切斷裝置1000b不包含加壓室1100、切斷室1200以及減壓室1300,而是A區域、B區域以及C區域3個區域連接成1個區域。因此,當搬運封裝基板(切斷對象物)20以及封裝部件(切斷品)20b時,不需要改變加壓室1100、切斷室1200以及減壓室1300的氣壓的步驟。除此之外,使用圖8的切斷裝置1000b的切斷品的製造方法能夠和使用圖7(實施例2)的切斷裝置1000的切斷品的製造方法同樣地進行。The method of manufacturing a cut product using the
另外,所述氣壓調整機構不被特別限定,例如可使用安裝在設置有切斷裝置1000b的設施(例如工廠等)的現有空氣壓縮系統等。並且,例如除了所述現有的空氣壓縮系統之外,還可以設置包含空氣壓縮機以及儲存罐的空氣壓縮系統。如此一來,由於能夠快速地使儲存室2000內部成為高壓,因此較佳。In addition, the air pressure adjusting mechanism is not particularly limited, and for example, an existing air compression system installed in a facility (for example, a factory, etc.) where the
並且,如上所述,當不實施切斷品的製造方法時,例如能夠藉由操作部2100使儲存室2000內部的氣壓與大氣壓大致相同。例如,當維護切斷裝置1000b時,可使用所述氣壓調整機構將儲存室2000內部的空氣排出至外部並將儲存室2000內部的氣壓減壓至與大氣壓相同的程度。由此,能夠避免維護作業者在高壓室中進行作業。Furthermore, as described above, when the method of manufacturing a cut product is not implemented, for example, the
使用實施例2(圖7)的切斷裝置1000的切斷品的製造方法如上所述,每一次都需要改變加壓室1100、切斷室1200以及減壓室1300氣壓的步驟。相比而言,使用本實施例(圖8)的切斷裝置1000b的切斷品的製造方法如上所述不需要改變加壓室1100、切斷室1200以及減壓室1300氣壓的步驟。因此,根據本實施例(圖8)的切斷裝置1000b,能夠比實施例2(圖7)的切斷裝置1000效率更高地實施切斷品的製造方法。另一方面,本實施例(圖8)的切斷裝置1000b需要用於設置儲存室2000的空間。The method of manufacturing a cut product using the
另外,圖8的儲存室2000如上所述,對確保能夠進行內部維護作業(例如,維護作業者進入)的空間的尺寸進行了說明,但不限於此。也就是說,作為本實施例(實施例3)的變形例,例如可以是設置覆蓋整個切斷裝置主體外側的罩部,並將所述罩部作為“儲存室”,且能夠使其內部成為密閉狀態的結構。In addition, as described above, the
進一步,本發明不限於上述實施例,在不脫離本發明主旨的範圍內,能夠根據需要進行任意且適當的組合、改變或選擇使用。Furthermore, the present invention is not limited to the above-mentioned embodiments, and can be combined, changed, or selected arbitrarily and appropriately as needed within the scope not departing from the gist of the present invention.
本申請主張以2018年2月8日申請的日本申請特願2018-21300為基礎的優先權,其公開的全部內容納入本文中。This application claims priority based on Japanese Application Japanese Patent Application No. 2018-21300 filed on February 8, 2018, and the entire contents of the disclosure are incorporated herein.
10‧‧‧工作臺(夾具)11‧‧‧槽12‧‧‧貫通孔20‧‧‧封裝基板(切斷對象物)20b‧‧‧封裝部件(切斷品)21‧‧‧基板21b‧‧‧被切斷的基板22‧‧‧樹脂(固化樹脂)22b‧‧‧被切斷的樹脂(固化樹脂)30‧‧‧旋轉刀(切斷機構)31‧‧‧刀主體32‧‧‧法蘭(固定構件)1000、1000b‧‧‧切斷裝置1010‧‧‧基板供給機構(切斷對象物供給機構)1020‧‧‧控制部1030‧‧‧閘閥1100‧‧‧加壓室1200‧‧‧切斷室(氣壓保持機構)1210‧‧‧氣壓調整器(氣壓保持機構)1220‧‧‧排水減壓器1230‧‧‧轉軸(切斷機構)1241、1242‧‧‧波紋管1250‧‧‧接收板1260‧‧‧排水流動部1270‧‧‧排出口1300‧‧‧減壓室1330‧‧‧閘閥1400‧‧‧檢查台1500‧‧‧托盤2000‧‧‧儲存室(氣壓保持機構)2100‧‧‧操作部(氣壓保持機構)X1‧‧‧表示工作臺10產生的吸引方向的箭頭Y1‧‧‧表示施加於封裝基板20的壓力方向的箭頭10‧‧‧Working table (fixture) 11‧‧‧Slot 12‧‧‧Through hole 20‧‧‧Packaging substrate (cutting object) 20b‧‧‧Packaging component (cutting product) 21‧‧‧Substrate 21b‧ ‧‧Cut off substrate 22‧‧‧Resin (cured resin) 22b‧‧‧Cut off resin (cured resin) 30‧‧‧Rotary knife (cutting mechanism) 31‧‧‧Knife body 32‧‧‧ Flange (fixing member) 1000, 1000b‧‧‧Cutting device 1010‧‧‧Substrate supply mechanism (cutting object supply mechanism) 1020‧‧‧Control unit 1030‧‧‧Gate valve 1100‧‧‧Pressure chamber 1200‧ ‧‧Cutting chamber (air pressure maintaining mechanism) 1210‧‧‧Air pressure regulator (air pressure maintaining mechanism) 1220‧‧‧Drain pressure reducer 1230‧‧‧Rotary shaft (cutting mechanism) 1241, 1242‧‧‧Corrugated pipe 1250‧ ‧‧Receiving plate 1260‧‧‧Drain flow part 1270‧‧‧Exhaust outlet 1300‧‧‧Decompression chamber 1330‧‧‧Gate valve 1400‧‧‧Checking table 1500‧‧‧Tray 2000‧‧‧Storage room (air pressure maintaining mechanism ) 2100‧‧‧Operation part (air pressure maintaining mechanism) X1‧‧‧The arrow indicating the direction of suction generated by the table 10 Y1‧‧‧The arrow indicating the direction of pressure applied to the package substrate 20
圖1為示意性地示出本發明切斷品製造方法一例中一個步驟的步驟剖視圖。Fig. 1 is a step cross-sectional view schematically showing one step in an example of a method for manufacturing a cut product of the present invention.
圖2為示意性地示出和圖1相同的切斷品製造方法中另一個步驟的步驟剖視圖。Fig. 2 is a step sectional view schematically showing another step in the method of manufacturing a cut product that is the same as that of Fig. 1.
圖3為示意性地示出和圖1相同的切斷品製造方法中另一個步驟的步驟剖視圖。Fig. 3 is a step cross-sectional view schematically showing another step in the method of manufacturing the cut product as in Fig. 1.
圖4為示意性地示出和圖1相同的切斷品製造方法中另一個步驟的步驟剖視圖。Fig. 4 is a step cross-sectional view schematically showing another step in the method of manufacturing the cut product as in Fig. 1.
圖5為示意性地示出和圖1相同的切斷品製造方法中另一個步驟的步驟剖視圖。Fig. 5 is a step sectional view schematically showing another step in the method of manufacturing a cut product that is the same as that of Fig. 1.
圖6為示意性地示出和圖1相同的切斷品製造方法中另一個步驟的步驟剖視圖。Fig. 6 is a step sectional view schematically showing another step in the method of manufacturing a cut product that is the same as that of Fig. 1.
圖7為示意性地示出本發明切斷裝置的一例的結構的平面圖。Fig. 7 is a plan view schematically showing the structure of an example of the cutting device of the present invention.
圖8為示意性地示出本發明切斷裝置的另一例的結構的平面圖。Fig. 8 is a plan view schematically showing the structure of another example of the cutting device of the present invention.
10‧‧‧工作臺(夾具) 10‧‧‧Working table (fixture)
11‧‧‧槽 11‧‧‧Slot
12‧‧‧貫通孔 12‧‧‧Through hole
20‧‧‧封裝基板(切斷對象物) 20‧‧‧Packaging substrate (cutting object)
21‧‧‧基板 21‧‧‧Substrate
22‧‧‧樹脂(固化樹脂) 22‧‧‧Resin (cured resin)
30‧‧‧旋轉刀(切斷機構) 30‧‧‧Rotary knife (cutting mechanism)
31‧‧‧刀主體 31‧‧‧Knife body
32‧‧‧法蘭(固定構件) 32‧‧‧Flange (fixed component)
X1‧‧‧表示工作臺10產生的吸引方向的箭頭 X1‧‧‧The arrow indicating the direction of attraction generated by the table 10
Y1‧‧‧表示施加於封裝基板20的壓力方向的箭頭
Y1‧‧‧The arrow indicating the direction of pressure applied to the
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| CN113524463B (en) * | 2021-07-28 | 2025-07-25 | 广东省先进陶瓷材料科技有限公司 | Stamping die and workpiece stamping method |
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| CN110137101A (en) | 2019-08-16 |
| CN110137101B (en) | 2023-03-10 |
| KR20190096266A (en) | 2019-08-19 |
| KR102210994B1 (en) | 2021-02-01 |
| JP2019136810A (en) | 2019-08-22 |
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