TWI701583B - Integrated touch panel and test method thereof - Google Patents

Abstract

A test method suitable for an integrated touch panel, wherein the integrated touch panel includes multiple touch elements and multiple switch groups, the multiple touch elements are arranged as multiple columns, includes the following steps: using the multiple switch groups to receive multiple test signals, wherein the multiple test signals are different from each other; in multiple test periods, sequentially using the multiple switch groups to output the multiple test signals to the multiple touch elements. A first column of the multiple columns includes an under test touch element and other touch elements. The other touch elements are respectively being configured, in at least one of the multiple test periods, to have a voltage level different from a voltage level of the under test touch element by means of the multiple test signals.

Description

Integrated touch panel and test method

This disclosure relates to a test method, especially a test method for judging whether the integrated touch panel is short-circuited.

A full in-cell integrated touch panel integrates a liquid crystal display and a touch module, and the integrated touch panel also includes a matrix of multiple flat electrodes. In the display screen update phase, these flat electrodes provide a common voltage for the liquid crystal display. In the touch phase, the plate electrode can be used as a part of the touch detection element. The fully embedded integrated touch panel usually uses a dual-side drive method to transmit signals to the aforementioned plate electrodes to reduce the influence of the driving line impedance. However, in this wiring method, the plate electrodes and multiple signal transmission lines overlap each other in the vertical direction, so that the multiple plate electrodes may accidentally short-circuit each other through the signal transmission lines. When multiple flat electrodes are short-circuited with each other, the integrated touch panel cannot accurately detect the location of the touch event.

This disclosure document provides a test method suitable for integrated In the touch panel, the integrated touch panel includes multiple touch units and multiple switch groups, and the multiple touch units are arranged in multiple rows. The test method includes the following steps: multiple switch groups are used to receive multiple test signals, where multiple test signals are different from each other; in multiple test stages, multiple switch groups are used to output multiple test signals to multiple touch units in sequence ; A first row of the rows includes a touch unit to be tested and other touch units, and the other touch units are each in at least one test phase through a plurality of test signals are set to have the touch unit to be tested Different voltage levels.

The present disclosure also provides an integrated touch panel. The integrated touch panel includes a plurality of switch groups and a plurality of touch units. The multiple switch groups are used to receive multiple test signals, and the multiple test signals are different from each other. The multiple touch units are arranged in multiple rows. In multiple test stages, the multiple switch groups sequentially output multiple test signals to the multiple touch units. A first row of the rows includes a touch unit to be tested and other touch units, and each of the other touch units is set to be different from the touch unit to be tested in at least one test phase through multiple test signals Voltage level.

The above-mentioned testing method and the integrated touch panel can test whether multiple touch units are short-circuited with each other in the horizontal and vertical directions.

100, 100a, 100b, 100c‧‧‧Integrated touch panel

110‧‧‧Touch Unit

120-1~120-n‧‧‧Switch group

130‧‧‧Joint area

CT-1~CT-n‧‧‧Control signal

TS-1~TS-m‧‧‧Test signal

CP‧‧‧Conductive path

D1‧‧‧First direction

D2‧‧‧Second direction

200、600‧‧‧Test method

S202, S204, S606‧‧‧ process

SW‧‧‧Switch

In order to make the above and other purposes, features, advantages and embodiments of the disclosure document more comprehensible, the description of the accompanying drawings is as follows:

FIG. 1 is a simplified functional block diagram of an integrated touch panel according to an embodiment of the present disclosure.

Figure 2 is a flowchart of a testing method according to an embodiment of the present disclosure.

FIG. 3 is a schematic diagram of the waveforms of the control signal and the test signal according to an embodiment of the disclosure.

4A to 4C are schematic diagrams of test signal distribution in each test phase of the integrated touch panel in an embodiment.

FIG. 5 is a schematic diagram of the waveforms of the control signal and the test signal according to another embodiment of the present disclosure.

FIG. 6 is a flowchart of a testing method according to an embodiment of the present disclosure.

7A to 7C are schematic diagrams of test signal distribution in each test stage of the integrated touch panel in another embodiment.

8A to 8C are schematic diagrams of test signal distribution in each test stage of the integrated touch panel in another embodiment.

Fig. 9 shows one of the switch groups applicable to the embodiment of Figs. 4A to 4C.

FIG. 10 is a simplified functional block diagram of an integrated touch panel according to another embodiment of the present disclosure.

FIG. 11 is a simplified functional block diagram of an integrated touch panel according to another embodiment of the present disclosure.

FIG. 12 is a simplified functional block diagram of an integrated touch panel according to another embodiment of the present disclosure.

The embodiments of the present disclosure will be described below in conjunction with related drawings. In the drawings, the same reference numerals indicate the same or similar elements or method flows.

FIG. 1 is a simplified functional block diagram of the integrated touch panel 100 according to an embodiment of the present disclosure. The integrated touch panel 100 includes a plurality of touch units 110, a plurality of switch groups 120-1 to 120-n and a bonding area 130. The plurality of touch units 110 are arranged in multiple rows in a direction parallel to the first direction D1 and arranged in multiple columns in a direction parallel to the second direction D2, wherein the first direction D1 is perpendicular to the second direction D2. The multiple switch groups 120-1~120-n are used to receive multiple test signals TS-1~TS-m and multiple control signals CT-1~CT-n. The integrated touch panel 100 includes a display module (not shown in the figure), the display module is disposed in a layered structure above the plurality of touch units 110, and the integrated touch panel 100 can be installed in the display module The active area detects touch events, where the active area is the area where the pixel circuits of the display module are arranged. In order to make the drawing concise and easy to explain, other components and connection relationships in the integrated drive display panel 100 are not shown in the first figure.

In detail, the bonding area 130 can be used for disposing a driver chip, and the bonding area 130 is coupled to a plurality of touch units 110 through a plurality of conductive paths CP. Through the control of the driver chip disposed in the bonding area 130, the touch unit 110 of the integrated touch panel 100 can provide an operating voltage for the pixel circuit coupled to the touch unit 110 during the screen update period of the display module ( For example, the common voltage common in liquid crystal pixel circuits). After the screen update period ends, the touch unit 110 can change to detect touch events during the touch period, and transmit the detection results of the touch events to the junction area 130 through the conductive path CP. Drive the chip.

In this embodiment, one conductive path CP is only coupled to one touch unit 110 to accurately detect the location of the touch event. In order to test whether the integrated touch panel 100 causes the conductive path CP to abnormally short-circuit two or more touch units 110 in the same row due to process factors, the switch groups 120-1~120-n are set to pass through the conductive path The CP is coupled to the multiple touch units 110. The switch groups 120-1 to 120-n can selectively output the test signals TS-1 to TS-m to the plurality of touch units 110 according to the control signals CT-1 to CT-n during the test. In this way, it is possible to detect whether more than two touch units 110 are short-circuited to each other by observing the grayscale brightness of the pixel circuit coupled to the touch unit 110. The detailed test method will be explained in subsequent paragraphs.

In this embodiment, the test signals TS-1 to TS-m are DC signals with a fixed voltage. In addition, the touch unit 110 may be implemented with flat electrodes made of various suitable materials.

The lowercase English indexes 1~n and 1~m in the component numbers and signal numbers used in the description and drawings of this case are just for the convenience of referring to individual components and signals, and are not intended to limit the number of the aforementioned components and signals to a specific number. In the specification and drawings of this case, if a component number or signal number is used without specifying the index of the component number or signal number, it means that the component number or signal number refers to the component group or signal group to which it belongs. Any component or signal of. For example, the object referred to by the element number 120-1 is the switch group 120-1, and the object referred to by the element number 120 is an unspecified arbitrary switch group 120 among the switch groups 120-1 to 120-n. Another example For example, the signal number TS-1 refers to the test signal TS-1, and the signal number TS refers to the unspecified arbitrary test signal TS among the test signals TS-1~TS-m.

FIG. 2 is a flowchart of a testing method 200 according to an embodiment of the present disclosure. The test method 200 is applicable to the integrated touch panel 100 in FIG. 1. In the process S202, each of the switch groups 120-1~120-n receives the test signals TS-1~TS-m, and the test signals TS-1~TS-m have different voltage levels from each other.

Then, in the process S204, the switch groups 120-1~120-n correspond to the reception control signals CT-1~CT-n, and one of the switch groups 120-1~120-n corresponds to the reception control signal CT- One of 1~CT-n. For example, the switch group 120-1 receives the control signal CT-1, the switch group 120-2 receives the control signal CT-2, and so on. The control signals CT-1~CT-n will switch from the disabled level to the enabled level in turn, so that the switch group 120-1~120-n will switch to the enabled state according to the control signals CT-1~CT-n , To output the test signals TS-1~TS-m to a plurality of test units 110.

For ease of description, the period during which the control signal CT is at the enable level is referred to as the test phase below. For example, the period during which the control signal CT-1 is at the enable level, and the control signal CT-2 and the control signal CT-3 are at the disable level is the first test stage. The period during which the control signal CT-2 is at the enable level, and the control signal CT-1 and the control signal CT-3 are at the disable level is the second test stage. The period during which the control signal CT-3 is at the enable level, and the control signal CT-1 and the control signal CT-2 are at the disable level is the third test stage, and so on.

For ease of understanding, an embodiment in which the integrated touch panel 100 only includes three switch groups (for example, switch groups 120-1 to 120-3) and the touch units 110 are arranged in a 4X6 matrix will be further described below. Process S204. In this embodiment, the switch groups 120-1~120-3 receive the control signals CT-1~CT-3, and each of the switch groups 120-1~120-3 is used to output 3 test signals TS (for example, test signals TS-1 to TS-3) to a plurality of touch units 110.

As shown in Figure 3, the control signals CT-1 to CT-3 are correspondingly switched to the enable level during the first test phase, the second test phase, and the third test phase. In addition, among the test signals TS-1~TS-3, the highest voltage level is the test signal TS-1, the second is the test signal TS-2, and the lowest is the test signal TS-3.

In the first test phase, when the switch group 120-1 receives the control signal CT-1 at the enable level, the switch group 120-1 will switch to the enable state, and the test signal TS-1~ TS-3 is output to the touch unit 110. The distribution of the test signals TS-1 to TS-3 output by the switch group 120-1 on the touch unit 110 is as shown in FIG. 4A. At this time, the switch group 120-2 and the switch group 120-3 will be in a disabled state, and the test signals TS-1~TS-3 will not be output.

Similarly, the switch group 120-2 will switch to the enabled state in the second test phase. The distribution of the test signals TS-1 to TS-3 output by the switch group 120-2 on the touch unit 110 is as shown in FIG. 4B. At this time, the switch group 120-1 and the switch group 120-3 are in a disabled state, and the test signals TS-1 to TS-3 are not output.

Then, the switch group 120-3 will switch to the enabled state in the third test phase. The distribution of the test signals TS-1 to TS-3 output by the switch group 120-3 on the touch unit 110 is as shown in FIG. 4C. At this time, the switch group 120-1 and the switch group 120-2 are in a disabled state, and the test signals TS-1 to TS-3 are not output.

As mentioned above, the integrated touch panel 100 includes a pixel circuit coupled to the touch unit 110. Since any two touch units 110 that receive different test signals TS will have different voltage levels, the pixel circuits coupled to any two touch units 110 will have different operating voltages received. Different grayscale brightness.

In other words, if any two touch units 110 receiving different test signals TS are abnormally short-circuited to each other through the conductive path CP, the pixel circuits coupled to the any two touch units 110 will receive similar operations. Voltage, and has similar gray-scale brightness. Therefore, during the test, by observing the display screen of the integrated touch panel 100, it can be detected whether the touch units 110 in the same row are short-circuited with each other.

In the aforementioned process S204, any one touch unit 110 can be selected as the touch unit to be tested, and other touch units 110 located in the same row as the touch unit to be tested will each be in at least one test phase through The test signals TS-1 to TS-m are set to have different voltage levels from the touch unit under test. In this way, when the touch unit 110 to be tested and another touch unit 110 in the same row receive different test signals TS, but the pixel circuits corresponding to the two have similar gray-scale brightness, it means the touch unit 110 to be tested The touch unit 110 and the other touch unit 110 in the same row are short-circuited with each other.

For example, in the embodiment of selecting FIGS. 4A to 4C, the touch unit 110 with the coordinates (1, 6) is the touch unit to be tested. In the first test phase, as shown in Figure 4A, the touch unit to be tested and the touch unit 110 with coordinates (1,5), (1,4), (1,2) and (1,1) have Different voltage levels, but have the same voltage level as the touch unit 110 with coordinates (1, 3) (both receive the test signal TS-1). Therefore, in the first touch stage T1, it can be determined whether the touch unit under test and the touch unit 110 with coordinates (1,5), (1,4), (1,2), and (1,1) are short-circuited to each other , But it cannot be determined whether the touch unit under test and the touch unit 110 with coordinates (1, 3) are short-circuited to each other.

Then, in the second test stage, the touch unit to be tested and the touch unit 110 with coordinates (1, 3) have different voltage levels. Therefore, in the second test phase, it can be determined whether the touch unit to be tested and the touch unit 110 with coordinates (1, 3) are short-circuited with each other.

For another example, the touch unit 110 whose coordinates are (2, 4) is selected as the touch unit to be tested. In the first test stage, as shown in Figure 4A, the touch unit to be tested and the touch unit 110 with coordinates (2,6), (2,5), (2,3) and (2,2) have Different voltage levels have the same voltage level as the touch unit 110 with coordinates (2,1) (both receive the test signal TS-2). Therefore, in the first touch stage T1, it can be determined whether the touch unit to be tested and the touch unit 110 with coordinates (2,6), (2,5), (2,3) and (2,2) are short-circuited to each other , But it is impossible to determine whether the touch unit under test and the touch unit 110 with coordinates (2, 1) are short-circuited to each other.

Then, in the second test stage, the touch unit to be tested and the touch unit 110 with coordinates (2, 1) still have the same voltage level. Therefore, in In the second test stage, it is still not possible to determine whether the touch unit under test and the touch unit 110 with coordinates (2, 1) are short-circuited to each other.

Then, in the second test phase T3, the touch unit to be tested and the touch unit 110 with coordinates (2, 1) have different voltage levels. Therefore, in the third test stage, it can be determined whether the touch unit to be tested and the touch unit 110 with coordinates (2, 1) are short-circuited with each other.

It is worth mentioning that the test signals TS-1~TS-m can also be AC signals with the same average voltage but different amplitudes and symmetrical waveforms. When the pixel circuit of the integrated touch panel 100 is a liquid crystal pixel circuit, by using the test signals TS-1~TS-m in the form of AC signals, the integrated touch panel 100 can be reversed in polarity. The pixel circuit is driven in a way to reduce the DC residue and DC blocking effects. For example, in an embodiment where the integrated touch panel 100 includes only three switch groups 120 (that is, the switch groups 120-1, 120-2, and 120-3), the integrated touch panel 100 can be used with the The control signals CT-1~CT-3 and the test signals TS-1~TS-3 shown in Fig. 5 execute the test method 200. In this embodiment, the average voltage of the test signals TS-1~TS-3 is 0V, and the amplitudes of the test signals TS-1~TS-3 in descending order are the test signal TS-3 and the test signal TS- 2 and test signal TS-1.

The integrated touch panel 100 includes n switch groups 120. Each switch group 120 is used to output m test signals TS. Each row of touch units 110 has x touch units 110, and x is less than or equal to In the case of m to the nth power, the integrated touch panel 100 can be tested using the above-mentioned test method 200, where m, n, and x are positive integers.

In one embodiment, the integrated touch panel 100 only includes three switch groups 120-1 to 120-3, and the switch groups 120-1 to 120-3 are each used to output three test signals (for example, test signals). TS-1 to TS-3), and each row of touch units 110 of the integrated touch panel 100 parallel to the first direction D1 includes 27 touch units 110. In the first test stage to the third test stage, the distribution of the test signals TS-1 to TS-3 on one row of the touch unit 110 in this embodiment is shown in Table 1.

In another embodiment, the integrated touch panel 100 includes three switch groups 120-1 to 120-3, and the switch groups 120-1 to 120-3 are used for each Four test signals (for example, test signals TS-1 to TS-4) are output, and each row of touch units 110 of the integrated touch panel 100 parallel to the first direction D1 includes 64 touch units 110. In the first test stage to the third test stage, the distribution of the test signals TS-1 to TS-4 on one row of the touch unit 110 in this embodiment is shown in Table 2.

In another embodiment, the integrated touch panel 100 includes four switch groups 120-1 to 120-4, and the switch groups 120-1 to 120-4 are each used to output three test signals (for example, test signals). TS-1 to TS-3), and each row of touch units 110 of the integrated touch panel 100 parallel to the first direction D1 includes 81 touch units 110. In the first test stage to the fourth test stage, the distribution of the test signals TS-1 to TS-3 on one row of the touch unit 110 of this embodiment is shown in Table 3.

It can be seen from the above that, since the embodiments of Table 1, Table 2, and Table 3 all meet the aforementioned condition that x is less than or equal to the nth power of m, the distribution of the test signal TS can be arranged so that the touch unit under test and The other touch units 110 in the same row have different voltage levels in at least one test phase, so that it can be detected whether the two are short-circuited with each other.

FIG. 6 is a flowchart of a testing method 600 according to an embodiment of the present disclosure. The test method 600 is similar to the test method 200. The difference is that the test method 600 further includes a process S606 after the process S204.

Please refer to Figure 1 and Figure 6 at the same time. In process S606, the whole In at least one test phase of the combined touch panel 100, any two touch units 110 of the plurality of touch units 110 arranged along the second direction D2 and adjacent to each other are arranged through the test signals TS-1 to TS-m Set to have different voltage levels. In this way, in the process S606, by observing the display screen of the composite touch panel 100, it is possible to detect whether any two adjacent touch units 110 in the second direction D2 are short-circuited with each other.

For ease of understanding, an embodiment in which the integrated touch panel 100 only includes three switch groups (for example, switch groups 120-1 to 120-3) and the touch units 110 are arranged in a 4X9 matrix will be further described below. Process S606. In this embodiment, the switch groups 120-1~120-3 receive the control signals CT-1~CT-3, and each of the switch groups 120-1~120-3 is used to output 3 test signals (For example, the test signals TS-1 to TS-3) are sent to a plurality of touch units 110.

In this embodiment, the integrated touch panel 100 can operate according to the signal waveforms shown in FIG. 3 or FIG. 5. In the first test phase, the distribution of the test signals TS-1 to TS-3 on the multiple touch units 110 is as shown in FIG. 7A. In FIG. 7A, any one touch unit 110 and the two adjacent touch units 110 on its left and right receive different test signals TS, and thus have different voltage levels. Therefore, it can be detected whether any two adjacent touch units 110 in the second direction D2 are short-circuited with each other.

It is worth mentioning that the distribution of the test signals TS-1~TS-3 in Figure 7A shows an oblique arrangement from top right to bottom left to ensure that any two adjacent touch units 110 on the left and right have different voltage levels. . In this case, for any one touch unit 110, the two adjacent left and right touch controls The unit 110 has the same voltage level as one of the two touch units 110 adjacent to each other.

For example, for the touch unit 110 with coordinates (2,5), the touch unit 110 with coordinates (1,5) on the left side and the touch unit 110 with coordinates (2,4) on the lower side both receive The test signal TS-2 therefore has the same voltage level. Similarly, for the touch unit 110 with coordinates (2,5), the touch unit 110 with coordinates (3,5) on the right side and the touch unit 110 with coordinates (2,6) on its upper side both receive The test signal TS-3 therefore has the same voltage level.

In addition, in Figure 7A, in order to distribute the test signals TS-1~TS-3 in an oblique arrangement, the touch units 110 in each row receive the test signals TS-1~TS-3 according to the same cyclic rule. . That is, the voltage level of the touch unit 110 in each row is set according to the same cycle rule.

For example, the touch unit 110 with coordinates (2,5) is taken as the loop starting point, and the coordinates are (2,5), (2,4), (2,3), (2,2), (2,1) , (2,9), (2,8), (2,7) and (2,6) touch unit 110 receives the test signal TS according to the following cyclic rule: test signal TS-1, test signal TS-2 , Test signal TS-3, test signal TS-1, test signal TS-2, test signal TS-3, test signal TS-1, test signal TS-2 and test signal TS-3.

For another example, the touch unit 110 with coordinates (1,6) is used as the starting point of the loop, and the coordinates are (1,6), (1,5), (1,4), (1,3), (1,2 ), (1,1), (1,9), (1,8) and (1,7) touch unit 110 receives the test signal TS according to the following cyclic rule: test signal TS-1, test signal TS- 2. Test signal TS-3, test signal TS-1, test signal TS-2, test signal TS-3, test signal TS-1, test signal TS-2 and test signal TS-3.

For another example, take the touch unit 110 with coordinates (3,4) as the loop starting point, and the coordinates are (3,4), (3,3), (3,2), (3,1), (3,9). ), (3,8), (3,7), (3,6) and (3,5) touch unit 110 receives the test signal TS according to the following cyclic rule: test signal TS-1, test signal TS- 2. Test signal TS-3, test signal TS-1, test signal TS-2, test signal TS-3, test signal TS-1, test signal TS-2 and test signal TS-3.

From the above, it can be seen that the three touch units 110 with coordinates (1,6), (2,5) and (3,4) as the loop starting point have the same voltage level, and the coordinates are (1,6) The two touch units 110 of and (3, 4) are located in the diagonal direction of the touch unit 110 of coordinates (2, 5).

Since the short circuit defect in the second direction D2 has been detected in the first test stage, in the second test stage and the third test stage, the test signals TS-1 to TS-3 can be distributed in a simpler manner. Figures 7B and 7C respectively represent the distribution of the test signals TS-1 to TS-3 in the plurality of touch units 110 in the second test stage and the third test stage of this embodiment. In the second test phase and the third test phase, it is only necessary to ensure that the other touch units 110 located in the same row as the touch unit to be tested will each be in at least one test phase by the test signals TS-1~TS-3. It is set to have a different voltage level from the touch unit to be tested to detect whether there is a short circuit between the touch units in the same row.

In summary, in order to ensure that the two adjacent touch units 110 in the second direction D2 have different voltage levels to detect short circuit defects in the second direction D2, in the process S606, at least one test phase will The multiple loop starting points of the multi-row touch unit 110 are arranged in the diagonal direction of each other. In this way, the test signals TS-1 to TS-m are distributed in the multiple touch units 110 in an oblique arrangement.

In an embodiment, in the process S606, the test signals TS-1 to TS-3 may be distributed to the plurality of touch units 110 in an oblique arrangement in each test stage. For example, in the integrated touch panel 100 only includes 3 switch groups (for example, switch groups 120-1~120-3), the touch units 110 are arranged in a 4X9 matrix, and the switch groups 120-1~120- When each of 3 is used to output 3 test signals (for example, test signals TS-1~TS-3), the test signals TS-1~TS-3 are used in the first test stage, the second test stage, and the second test stage. The distribution of the three test stages can be shown in Figures 8A, 8B and 8C respectively.

In this way, in the first test stage, the second test stage and the third test stage, in addition to detecting whether there is a short circuit between the touch units in the same row, it can also detect two adjacent touches in the second direction D2. Whether the cells 110 are short-circuited to each other.

In practice, each of the switch groups 120-1 to 120-n can be implemented with multiple switches. The multiple switches in each switch group 120 are used to receive the same control signal CT, so they are turned on and off synchronously. The number of switches in each of the switch groups 120-1 to 120-n will be the same as the number of touch units 110.

For example, FIG. 9 illustrates the switch group 120-1 applicable to the embodiment of FIGS. 4A to 4C. The switch group 120-1 includes a plurality of switches SW. The control end of each switch SW is used to receive the control signal CT-1, and the first end is used When receiving one of the test signals TS-1 to TS-3, the second end is correspondingly connected to a touch unit 110. In the embodiment shown in FIGS. 4A to 4C, the integrated drive panel 100 includes a total of 18 touch units 110, so the switch group 120-1 includes a total of 18 switches SW.

When the control signal CT-1 is switched to the enable level, all the switches SW will be turned on synchronously to output the test signals TS-1 to TS-3 to the multiple touch units 110. In this way, the test signals TS-1 to TS-3 are distributed among the touch units 110 in the manner shown in FIG. 4A. On the other hand, when the control signal CT-1 is switched to the disable level, all the switches SW will be closed synchronously to avoid outputting the test signals TS-1~TS-3.

The switch groups 120-2 and 120-3 applicable to the embodiments of FIGS. 4A to 4C can be implemented in a manner similar to the switch group 120-1. For the sake of brevity, the details are not repeated here.

Please refer to Figure 1 again, one of the switch groups 120-1~120-n (for example, the switch group 120-1) is located on the lower side of the integrated touch panel 100, and the switch groups 120-2~120 -n is located on the upper side of the integrated drive panel 100. That is, the switch group 120-1 and the switch groups 120-2 to 120-n are respectively located on opposite sides of the integrated touch panel 100.

However, the arrangement of the switch groups 120-1 to 120-n in the present disclosure is not limited to the embodiment in FIG. 1. FIG. 10 is a simplified functional block diagram of the integrated touch panel 100a according to an embodiment of the present disclosure. In this embodiment, two of the switch groups 120-1 to 120-n (for example, the switch group 120-1 and the switch group 120-2) are located on the lower side of the integrated touch panel 100a, and the switch group Groups 120-3~120-n are on the integrated drive surface The upper side of the board 100a. That is, the switch groups 120-1 to 120-2 and the switch groups 120-3 to 120-n are respectively located on opposite sides of the integrated touch panel 100a.

FIG. 11 is a simplified functional block diagram of the integrated touch panel 100b according to an embodiment of the present disclosure. In this embodiment, the switch groups 120-1 to 120-n are all located on the lower side of the integrated touch panel 100b. That is, the switch groups 120-1 to 120-n are all located on the same side of the integrated touch panel 100b.

FIG. 12 is a simplified functional block diagram of the integrated touch panel 100c according to an embodiment of the present disclosure. In this embodiment, the switch groups 120-1 to 120-n are all located on the upper side of the integrated touch panel 100c. That is, the switch groups 120-1 to 120-n are all located on the same side of the integrated touch panel 100c.

In summary, using the testing methods 200 and 600 with the integrated touch panels 100, 100a, 100b, and 100c for quality testing can accurately determine whether the multiple touch units 140 are short-circuited in the horizontal and vertical directions.

The execution sequence of the processes in the foregoing flowcharts is only an exemplary embodiment, and does not limit the actual implementation of the present invention. For example, in the foregoing flowcharts, the process S202 and the process S204 can be performed simultaneously. For another example, the process S202, the process S204, and the process S606 can be performed simultaneously.

Certain words are used in the specification and the scope of the patent application to refer to specific elements. However, those with ordinary knowledge in the technical field should understand that the same element may be called by different terms. The specification and the scope of the patent application do not use the difference in name as a way to distinguish components The difference is based on the functional differences of the components. The "including" mentioned in the specification and the scope of the patent application is an open term, so it should be interpreted as "including but not limited to". In addition, "coupling" here includes any direct and indirect connection means. Therefore, if it is described in the text that the first element is coupled to the second element, it means that the first element can be directly connected to the second element through electrical connection, wireless transmission, optical transmission, etc., or through other elements or connections. The means is indirectly connected to the second component electrically or signally.

The size and relative size of some elements in the figure will be enlarged, or the shape of some elements will be simplified, so as to more clearly express the content of the embodiment. Therefore, unless otherwise specified by the applicant, the shape, size, relative size and relative position of each element in the figure are only for convenience of description, and should not be used to limit the patent scope of this disclosure. In addition, the present disclosure can be embodied in many different forms, and when interpreting the present disclosure, it should not be limited to the embodiments presented in this specification. In addition, unless otherwise specified in the specification, any term in the singular case also includes the meaning of the plural case.

The above are only the preferred embodiments of the present disclosure, and all equal changes and modifications made in accordance with the requirements of the present disclosure should fall within the scope of the disclosure.

100‧‧‧Integrated touch panel

110‧‧‧Touch Unit

120-1~120-n‧‧‧Switch group

130‧‧‧Joint area

CT-1~CT-n‧‧‧Control signal

TS-1~TS-m‧‧‧Test signal

CP‧‧‧Conductive path

D1‧‧‧First direction

D2‧‧‧Second direction

Claims (17)

A test method is applicable to a touch panel, wherein the touch panel includes a plurality of touch units and a plurality of switch groups, and the plurality of touch units are arranged in a plurality of rows. The test method includes: using the plurality of The switch group receives a plurality of test signals, wherein the test signals are different from each other; and in a plurality of test stages, the plurality of the switch groups are used to output the test signals to the plurality of touch units in sequence; wherein A first row of the rows includes a touch unit to be tested and other touch units, and each of the other touch units is set to touch the touch unit to be tested through the plurality of test signals in at least one test phase. The cells have different voltage levels. The multiple switch groups include N switch groups, the multiple test signals include M test signals, and each row of touch units includes X touch units, M, N, and X It is a positive integer greater than 1, and X is less than or equal to the Nth power of M. According to the test method of claim 1, wherein the plurality of rows extend along a first direction, the test method further includes: in at least one test phase, the plurality of touch units are moved along one of the plurality of touch units through the plurality of test signals Any two touch units arranged in the second direction and adjacent to each other are arranged to have different voltage levels, wherein the first direction is perpendicular to the second direction. Such as the test method of claim 2, where any two The touch unit includes a first touch unit and a second touch unit, the plurality of touch units further include a third touch unit and a fourth touch unit, the second touch unit, the third touch unit The touch unit and the fourth touch unit are arranged along the first direction, the second touch unit is adjacent to the third touch unit and the fourth touch unit, wherein, in at least one test phase, The voltage level of the first touch unit is the same as the voltage level of the third touch unit or the fourth touch unit. Such as the test method of claim 2, wherein the voltage level of the touch unit of each row is set according to a cyclic rule, wherein a second row of the plurality of rows is adjacent to the first row, and the loop start point of the first row is A first touch unit, the loop starting point of the second row is a second touch unit, the first touch unit is located in the diagonal direction of the second touch unit, and the first touch unit and the The second touch units have the same voltage level. Such as the test method of claim 1, wherein in a plurality of test stages, the process of sequentially using the plurality of switch groups to output the plurality of test signals to the plurality of touch units includes: using the plurality of switch groups to receive A plurality of control signals, wherein one of the plurality of switch groups corresponds to one of the plurality of control signals, and the plurality of control signals are different from each other, wherein the plurality of switch groups are based on the plurality of control signals Switch to the uniform energy state one by one to output the multiple test signals. Such as the test method of claim 5, wherein the multiple control signals are sequentially switched from a disabled level to a uniform level. Such as the test method of claim 1, wherein the plurality of test signals are all DC signals, or the plurality of test signals are all AC signals with symmetrical waveforms. An integrated touch panel includes: a plurality of switch groups for receiving a plurality of test signals, wherein the plurality of test signals are different from each other; and a plurality of touch units arranged in a plurality of rows, wherein in a plurality of test stages In, the plurality of switch groups sequentially output the plurality of test signals to the plurality of touch units; wherein a first row of the plurality of rows includes a touch unit to be tested and other touch units, and the other touch units Each of the control units is set to have a different voltage level from the touch unit under test through the plurality of test signals in at least one test phase, wherein the plurality of switch groups include N switch groups, and the plurality of test signals The signal includes m test signals, each row of touch units includes x touch units, m, n, and x are positive integers greater than 1, and x is less than or equal to the nth power of m. For example, the integrated touch panel of claim 8, further comprising: a bonding area located on a first side of the integrated touch panel and used for arranging a driving chip; One of the plurality of switch groups is located on the first side, the remaining switch groups of the plurality of switch groups are located on a second side of the integrated touch panel, and the first side and the second side The sides are opposite to each other. For example, the integrated touch panel of claim 8, further comprising: a bonding area located on a first side of the integrated touch panel and used for setting a driving chip; wherein two of the plurality of switch groups Located on the first side, the remaining switch groups of the plurality of switch groups are located on a second side of the integrated touch panel, and the first side and the second side are opposite to each other. For example, the integrated touch panel of claim 8, further comprising: a bonding area located on a first side of the integrated touch panel and used for arranging a driving chip; wherein the plurality of switch groups are all located on the first side One side or the plurality of switch groups are all located on a second side of the integrated touch panel, and the first side and the second side are opposite to each other. The integrated touch panel of claim 8, wherein the rows extend along a first direction, and in at least one test phase, among the plurality of touch units arranged along a second direction and adjacent to each other Any two touch units have different voltage levels, and the first direction is perpendicular to the second direction. Such as the integrated touch panel of claim 12, in which, The any two touch units include a first touch unit and a second touch unit, the plurality of touch units further include a third touch unit and a fourth touch unit, the second touch unit , The third touch unit and the fourth touch unit are arranged along the first direction, and the second touch unit is adjacent to the third touch unit and the fourth touch unit, wherein at least In a test phase, the voltage level of the first touch unit is the same as the voltage level of the third touch unit or the fourth touch unit. For example, the integrated touch panel of claim 12, wherein the voltage level of the touch unit of each row is set according to a cyclic rule, wherein a second row of the plurality of rows is adjacent to the first row, and the voltage level of the first row The loop starting point is a first touch unit, and the loop starting point of the second row is a second touch unit, and the first touch unit is located in a diagonal direction of the second touch unit. For example, the integrated touch panel of claim 8, wherein the plurality of switch groups are used for receiving a plurality of control signals, wherein one of the plurality of switch groups corresponds to receiving one of the plurality of control signals, and The plurality of control signals are different from each other, and the plurality of switch groups are sequentially switched to a uniform energy state according to the plurality of control signals to output the plurality of test signals. For example, the integrated touch panel of claim 8, wherein the plurality of control signals are sequentially switched from a disabled level to a uniform level. For example, the integrated touch panel of claim 8, wherein the plurality of test signals are all DC signals, or the plurality of test signals are all AC signals with symmetrical waveforms.

Images