TWI785801B - Method and system for testing radiation susceptibility - Google Patents

Abstract

A method for testing radiation susceptibility includes transmitting radiation wave to a device under test, measuring the device under test to obtain a first voltage according to the radiation wave, outputting a reference voltage to a coupling device so that the coupling device generates a second voltage according to the reference voltage, adjusting the reference voltage so that the second voltage approximates the first voltage, storing the adjusted reference voltage, and outputting the second voltage to the device under test according to the adjusted reference voltage to simulate the influence of the radiation wave to the device under test.

Description

Method and system for testing radiation sensitivity

The present invention relates to a method and system for testing radiation sensitivity, in particular to a method and system for testing radiation sensitivity that can simulate the influence of radiation waves on a device under test.

For electronic equipment, such as computers or servers, the test of radiated susceptibility (RS) is very important. Due to the ubiquity of electromagnetic fields, if the radiation sensitivity test fails, the electronic equipment may be disturbed by radiation waves, resulting in functional failure and damage.

At present, in order to test the radiation susceptibility, the electronic equipment must be placed in an anechoic chamber, and radio waves are emitted to the electronic equipment, and then the impact on the electronic equipment is measured. If the result is not passed, it is necessary to use trial and error (trial and error) methods to allow engineering personnel to enter the anechoic chamber, adjust the settings, and then perform relevant operations repeatedly for analysis or debugging.

This process consumes a lot of site resources and operating time, and it is not easy to find out the root cause of the error. In addition, since engineering personnel must often enter high-radiation areas, it is not conducive to the safety and health of engineering personnel.

The embodiment provides a method for testing radiation sensitivity, including transmitting a radiation wave to a device under test; measuring the device under test to obtain a first voltage according to the radiation wave; outputting a reference voltage to a coupling device, so that The coupling device generates a second voltage according to the reference voltage; adjusts the reference voltage so that the second voltage is close to the first voltage; stores the adjusted reference voltage; and outputs the second voltage according to the adjusted reference voltage voltage to the device under test to simulate the radiation wave for the device under test influence.

The embodiment provides a system for testing radiation sensitivity, which includes a coupling device, a signal generator and a device under test. The coupling device includes a first end, a second end and a third end, wherein the first end is used to receive a reference voltage, and the second end is used to output a signal corresponding to a first voltage according to the reference voltage a second voltage. The signal generator is coupled to the first end of the coupling device for outputting the reference voltage. The device under test is coupled to the second end of the coupling device for receiving the second voltage. The first voltage can be measured when a radiation wave is applied to the device under test, and the reference voltage is set so that the second voltage is close to the first voltage to simulate the influence of the radiation wave on the device under test .

110:Anechoic chamber

ANT: Antenna

W: radiation wave

EUT: Equipment under test

MD: measuring device

FC: Faraday Cage

CT: coupling device

VRS: first voltage

SG: signal generator

PD: peripheral control device

Vi: reference voltage

P1: first end

P2: the second end

P3: the third end

V'RS: the second voltage

300: method

310 to 360, 510 to 530: STEP

400: system

T, T1, T2: work table

Sr: measurement result

Sc1: the first control signal

Sc2: Second control signal

610: Choke circuit

A: Amplifier

C: Adapter

Fig. 1 is a schematic diagram of applying radiation waves to the device under test in the embodiment.

Fig. 2 is a schematic diagram of the influence of the simulated radiation wave on the device under test in the embodiment.

Fig. 3 is a flowchart of a method for testing radiation sensitivity in an embodiment.

Fig. 4 is a schematic diagram of a system for testing radiation sensitivity in an embodiment.

Fig. 5 is a flow chart of testing radiation sensitivity using the system in Fig. 4 .

Fig. 6 is a schematic diagram of the coupling device in Fig. 2 and Fig. 4 .

In order to improve the aforementioned deficiencies, embodiments may provide a system and method for testing radiation sensitivity, as described below.

According to an embodiment, the antenna can be used to transmit radiation waves to the device under test in the anechoic chamber, and the device under test can be measured to obtain the corresponding first voltage, and according to the frequency of the radiation waves emitted by the antenna (for example, 100MHz, 125MHz, 250MHz, 400MHz and 1,000MHz, etc.) measurement of the device under test Different first voltages will be obtained. Afterwards, the signal generator is used to provide a reference voltage to generate a second voltage through the coupling device to apply to the device under test. The reference voltage generated by the signal generator can be adjusted so that the second voltage is close to the first voltage. The adjusted reference voltage can be stored for later use; after that, it is no longer necessary to use the anechoic chamber, but the stored reference voltage can be used, and then the second voltage is generated through the coupling device and applied to the device under test to simulate the impact of radiation waves on the device under test. Impact.

FIG. 1 is a schematic diagram of applying radiation waves W to the device under test EUT in the embodiment. Fig. 2 is a schematic diagram of the influence of the simulated radiation wave W on the device under test EUT in the embodiment. FIG. 3 is a flowchart of a method 300 for testing radiation sensitivity in an embodiment. FIG. 1 may correspond to steps 310 to 320 in FIG. 3 , and FIG. 2 may correspond to steps 330 to 360 in FIG. 3 . As shown in FIG. 1 to FIG. 3, the method 300 may include the following steps: Step 310: the antenna ANT emits radiation waves W to the device under test EUT; Step 320: the measuring device MD measures the device under test EUT to measure Obtain the first voltage VRS; step 330: output the reference voltage Vi to the coupling device CT, so that the coupling device CT generates a second voltage V'RS according to the reference voltage Vi; step 340: adjust the reference voltage Vi to make the second voltage V' RS is approximate to the first voltage VRS; step 350: store the adjusted reference voltage Vi; and step 360: output the second voltage V'RS to the device under test according to the adjusted reference voltage Vi, so as to simulate the impact of the radiation wave W on the tested device The influence of the test device EUT.

As shown in FIG. 1 , steps 310 to 320 can be performed in the anechoic chamber 110 , wherein the radiation wave W emitted by the antenna ANT can have a predetermined frequency according to the requirements of the test. For example, the measurement device MD can be an oscilloscope, such as a digital storage oscilloscope (DSO). In Figure 1, the measurement device MD can be placed in a Faraday cage FC to avoid being affected by radiation waves. The EUT of the device under test may include a network cable (CAT cable) and a network connector. For example, the network cable may be a CAT 5E cable, and the network connector Can be RJ45 LAN connector. Therefore, the radiation susceptibility of network cables and connectors can be tested. According to an embodiment, in FIG. 1 , the measuring device MD and the device under test EUT can be placed on the work table T. The working table T may be insulated, for example, a wooden table, so as to comply with test-related specifications.

After measurement and calculation, it can be verified that the second voltage V'RS can indeed simulate the first voltage VRS, and only the waveform has a phase difference. Therefore, it is feasible and accurate to use the second voltage V'RS to simulate the influence of the radiation wave W Spend.

As shown in FIG. 2, in steps 330 to 350, the coupling device CT and the signal generator SG can be used to generate the second voltage V'RS to simulate the influence of the radiation wave W. As shown in Figure 2, the coupling device CT can include a first terminal P1, a second terminal P2 and a third terminal P3, wherein the first terminal P1 can receive a reference voltage Vi, and the second terminal P2 can output a corresponding voltage according to the reference voltage Vi The second voltage V'RS of the first voltage VRS (shown in FIG. 1 ), the third terminal P3 can be coupled to the peripheral control device PD to access the first control signal Sc1. The first control signal Sc1 will be described later. Since the coupling device CT has a first terminal P1 to a third terminal P3, the coupling device CT can be a three-port coupling device.

The signal generator SG can be coupled to the first terminal P1 of the coupling device CT to output the reference voltage Vi. The device under test EUT can be coupled to the second terminal P2 of the coupling device CT to receive the second voltage V'RS. According to an embodiment, the second voltage V'RS may be positively related to the sum of the first voltage VRS and a correction factor (correction factor) CF, as shown in the equation eq-1: Vi=V'RS+CF...eq- 1

As shown in steps 340 to 350, since the first voltage VRS has been obtained in step 320, the reference voltage Vi can be adjusted to make the second voltage V'RS approximate to the first voltage VRS. For example, the difference between the first voltage VRS and the second voltage V'RS may not be greater than 10%, 5% or 1% of the first voltage VRS. As described in step 360, the second voltage V'RS can be output to the device under test EUT according to the adjusted reference voltage Vi, so as to simulate the influence of the radiation wave W on the device under test EUT.

According to an embodiment, steps 310 to 350 may be repeatedly performed to obtain Reference voltage Vi. For example, in step 310, the radiation wave W may have a first frequency, so in steps 340 to 350, the adjusted reference voltage Vi may correspond to the first frequency. Afterwards, the radiation wave W can be adjusted from the first frequency to the second frequency to obtain a reference voltage Vi corresponding to the second frequency, and so on.

Through multiple calibrations and operations, a comparison table of multiple frequencies and multiple reference voltages Vi can be obtained. After that, if you want to apply a radiation wave W of a predetermined frequency to the device under test EUT, you can directly use the method in Figure 2, Using the corresponding reference voltage Vi to output the second voltage V'RS to the device under test EUT for simulation. For example, the multiple frequencies corresponding to the multiple reference voltages Vi of the look-up table can range from tens to hundreds of million hertz (MHz), but less than 1 gigahertz (GHz), so as to avoid confusion when the frequency is too high. Too many messages. According to the embodiment, in FIG. 2 , the data transmission of the peripheral control device PD, the coupling device CT and the device under test EUT may use a local area network (Local Area Network, LAN).

FIG. 4 is a schematic diagram of a system 400 for testing radiation sensitivity in an embodiment. The system 400 may include the coupling device CT, the signal generator SG, the device under test EUT, the peripheral control device PD and the measuring device MD shown in FIG. 2 . The peripheral control device PD can be coupled to the third terminal P3 of the coupling device CT for accessing the first control signal Sc1. The measurement device MD can be coupled to the peripheral control device PD and the device under test EUT for accessing the second control signal Sc2 between the measurement device MD and the peripheral control device PD, and when the coupling device CT outputs the second voltage V'RS When arriving at the EUT, measure the EUT to obtain the measurement result Sr.

According to an embodiment, the first control signal Sc1 may be correlated with the second control signal Sc2, and the second control signal Sc2 may be correlated with the measurement result Sr. The first control signal Sc1 and the second control signal Sc2 can be used to perform related control and data transmission. The measurement result Sr corresponds to the effect of the simulated radiation wave W on the device under test EUT. Therefore, the influence and interference of the radiation wave W on the device under test EUT can be analyzed according to the measurement result Sr.

According to an embodiment, as shown in FIG. 4 , the system 400 may optionally include an adapter C coupled between the peripheral control device PD and the measurement device MD. For example, adapter C can be a universal serial bus An adapter between Universal Serial Bus (USB) and General Purpose Interface Bus (GPIB). The system 400 may optionally include an amplifier A coupled between the signal generator SG and the first terminal P1 of the coupling device CT for amplifying the reference voltage Vi.

According to an embodiment, the peripheral control device PD may include a desktop computer, a server, a notebook computer, a tablet computer and/or a computing device for related control. The measuring device MD may comprise an oscilloscope, such as a digital storage oscilloscope.

In Fig. 4, the path between the signal generator SG and the measuring device MD may for example use a general purpose interface bus (GPIB) interface. The path between the signal generator SG and the coupling device CT may be a voltage charging path for transmitting the reference voltage Vi and the amplified reference voltage Vi.

The path between the coupling device CT and the peripheral control device PD, and the path between the coupling device CT and the device under test EUT may be test paths for accessing test-related signals and voltages. For example, the second voltage V'RS can be carried on a signal of a local area network (LAN) on the path between the coupling device CT and the device under test EUT.

The path between the peripheral control device PD and the measurement device MD, and the path between the signal generator SG and the measurement device MD can be control paths for controlling and monitoring the signal generator SG and the measurement device by the peripheral control device PD MD.

The path between the measurement device MD and the device under test EUT may be a measurement path, for example, the device under test EUT may be measured by an oscilloscope probe.

According to the embodiment, as shown in FIG. 4, the signal generator SG, the amplifier A and the coupling device CT can be arranged on the work table T1, and the device under test EUT, the peripheral control device PD, the adapter C and the measuring device MD Set up at work table T2 for simulation test of radiation sensitivity.

FIG. 5 is a flow chart of testing radiation sensitivity using the system 400 in FIG. 4, which may include the following steps: Step 510: Access the first control signal between the coupling device CT and the peripheral control device PD Sc1; step 520: access the second control signal Sc2 between the measuring device MD and the peripheral control device PD; and step 530: when the coupling device CT outputs the second voltage V'RS to the device under test EUT, the measuring device MD measures The device under test EUT to obtain the measurement result Sr.

Steps 510 to 530 can be included in step 360 of FIG. 3 , by using the peripheral control device PD to perform related control, the reference voltage Vi can be used to generate the second voltage V'RS to simulate the radiation sensitivity test.

Fig. 6 is a schematic diagram of the coupling device CT in Fig. 2 and Fig. 4 . According to an embodiment, the coupling device CT may include a set of capacitors and a set of resistors coupled to the first terminal P1. The coupling device CT may further include a choke circuit 610 coupled to the third terminal P3. The choke circuit 610 may, for example, include a common mode choke. The choke circuit 610 can reduce or even block the interference of the second voltage VR'S to the peripheral control device PD. For example, an SMA (SubMiniature version A) connector can be coupled to the first terminal P1, a first RJ45 connector can be coupled to the second terminal P2, and a second RJ45 connector can be coupled to the third terminal P3. The external structure of the coupling device CT can be, for example, a cube, provided with suitable cooling holes. For example, the length, width and height of the coupling device CT can be (but not limited to) 180 mm, 180 mm and 50 mm, and the RJ45 connectors of the second end P2 and the third end P3 can be located on the same side of the cube. noodle. According to the embodiment, by modifying the coupling device CT, it is not limited to the use of RJ45 connectors, but also applicable to other connectors, such as Universal Serial Bus (USB) connectors.

In summary, with the method 300 and system 400 for testing radiation sensitivity provided by the embodiment, the initial measurement and calibration can be performed in the anechoic chamber 110, and then the signal generator SG can be used to generate the corresponding reference voltage Vi , so as to generate the second voltage V'RS to simulate the interference and influence of the radiation wave W on the device under test EUT. Since it is no longer necessary to repeatedly enter the anechoic chamber 110 for operation, it can improve the health and safety of personnel, reduce the cost of equipment and time, and facilitate debugging and failure analysis. It is really helpful for solving long-term problems in this field. The method for testing radiation sensitivity of the present invention can be used for servo The server is tested to reduce the interference of the server by electromagnetic radiation, improve the stability and reliability of the server, and make the server more suitable for artificial intelligence (AI) computing, edge computing (Edge Computing), or It can be used as a 5G server, cloud server or Internet of Vehicles server.

The above descriptions are only preferred embodiments of the present invention, and all equivalent changes and modifications made according to the scope of the patent application of the present invention shall fall within the scope of the present invention.

300: method

310 to 360: Steps

Claims (10)

A method for testing radiation sensitivity, comprising: emitting a radiation wave to a device under test; measuring the device under test to obtain a first voltage according to the radiation wave; outputting a reference voltage to a coupling device to make the coupling The device generates a second voltage according to the reference voltage; adjusts the reference voltage so that the second voltage is close to the first voltage; stores the adjusted reference voltage in at least one of a peripheral control device and a signal generator; and outputting the second voltage to the device under test according to the adjusted reference voltage to simulate the influence of the radiation wave on the device under test. The method for testing radiation sensitivity as claimed in item 1, wherein: the radiation wave has a first frequency, and the adjusted reference voltage corresponds to the first frequency; the method further includes: converting the radiation wave from the The first frequency is adjusted to a second frequency to obtain the reference voltage corresponding to the second frequency. The method for testing radiation sensitivity as claimed in claim 1, wherein the reference voltage is substantially positively correlated with the sum of the second voltage and a correction factor. The method for testing radiation sensitivity as described in Claim 1 further includes: accessing a first control signal between the coupling device and the peripheral control device; accessing a first control signal between a measurement device and the peripheral control device the second control signal; and When the coupling device outputs the second voltage to the device under test, the measuring device measures the device under test to obtain a measurement result; wherein the first control signal is related to the second control signal, and the second control signal is related to In the measurement result, and the measurement result corresponds to the influence of the radiation wave on the device under test. A system for testing radiation sensitivity, comprising: a coupling device, including a first terminal for receiving a reference voltage, and a second terminal for outputting a second voltage corresponding to a first voltage according to the reference voltage , and a third end; a signal generator, coupled to the first end of the coupling device, for outputting the reference voltage; and a device under test, coupled to the second end of the coupling device, for to receive the second voltage; wherein the first voltage can be measured when a radiation wave is applied to the device under test, and the reference voltage is set so that the second voltage is similar to the first voltage to simulate the radiation The effect of waves on the device under test. The system for testing radiation susceptibility as described in Claim 5 further includes: a peripheral control device coupled to the third end of the coupling device for accessing a first control signal; and a measurement device coupled to connected between the peripheral control device and the device under test, for accessing a second control signal between the measurement device and the peripheral control device, and when the coupling device outputs the second voltage to the device under test , measure the device under test to obtain a measurement result; wherein the first control signal is related to the second control signal, the second control signal is related to the measurement result, and the measurement result corresponds to the radiation wave’s effect on the subject The influence of the measuring device. The system for testing radiation sensitivity as claimed in claim 6, wherein: The peripheral control device includes a desktop computer, a server, a notebook computer, a tablet computer and/or a computing device; and the measuring device includes an oscilloscope. The system for testing radiation sensitivity as claimed in claim 5, wherein the device under test includes a network cable and a network connector. The system for testing radiation sensitivity as claimed in item 5, wherein the coupling device comprises: an SMA connector coupled to the first end; a first RJ45 connector coupled to the second end; a second RJ45 connector coupled connected to the third end; and a choke circuit coupled to the third end. The system for testing radiation susceptibility as described in claim 5 further includes: an amplifier coupled between the signal generator and the first end of the coupling device for amplifying the reference voltage.

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