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TWI785535B - Method, device and system for detecting optical film - Google Patents

Method, device and system for detecting optical film Download PDF

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TWI785535B
TWI785535B TW110109055A TW110109055A TWI785535B TW I785535 B TWI785535 B TW I785535B TW 110109055 A TW110109055 A TW 110109055A TW 110109055 A TW110109055 A TW 110109055A TW I785535 B TWI785535 B TW I785535B
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optical film
inspected
optical
image
inspecting
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TW202238116A (en
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吳精文
陳重宇
吳省賢
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住華科技股份有限公司
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Priority to CN202111056750.7A priority patent/CN113933296A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/04Optical benches therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106General arrangement of respective parts
    • G01N2021/0112Apparatus in one mechanical, optical or electronic block
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10004Still image; Photographic image
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20081Training; Learning
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20084Artificial neural networks [ANN]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection

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Abstract

A method for detecting an optical film is provided. The method includes: capturing, by an optical sensor, images to be inspected of an optical film to be inspected, wherein the optical film to be inspected is placed on a platform at three angles; receiving the images to be inspected from the optical sensor; and using a recognition model to detect the images to be inspected to determine the attribute of the optical film to be inspected.

Description

一種檢測光學膜的方法、裝置及系統A method, device and system for detecting optical film

本揭露係有關於一種檢測光學膜的方法、裝置及系統,且特別係有關於利用神經網路技術之一種檢測光學膜的方法、裝置及系統。The present disclosure relates to a method, device and system for inspecting an optical film, and particularly relates to a method, device and system for inspecting an optical film using neural network technology.

由於光學膜製程中裁切機構並無分辨光學膜表面保護膜與離型膜的功能,因此在光學膜裁切後,須藉由生產線人員耗費大量時間以人工目測方式來檢查分類。Since the cutting mechanism in the optical film manufacturing process does not have the function of distinguishing the protective film on the surface of the optical film from the release film, after the optical film is cut, a lot of time must be spent by the production line personnel to visually inspect and classify it.

然而,人工目測檢查光學膜並將其分類容易發生失誤。However, manual visual inspection and classification of optical films is prone to error.

因此,需要一種檢測光學膜的方法、裝置及系統,以取代人工目測方式分辨表面保護膜與離型膜,以提升產能。Therefore, there is a need for a method, device and system for inspecting an optical film to replace manual visual inspection to distinguish between a surface protection film and a release film, so as to increase productivity.

以下揭露的內容僅為示例性的,且不意指以任何方式加以限制。除所述說明方面、實施方式和特徵之外,透過參照附圖和下述具體實施方式,其他方面、實施方式和特徵也將顯而易見。即,以下揭露的內容被提供以介紹概念、重點、益處及本文所描述新穎且非顯而易見的技術優勢。所選擇,非所有的,實施例將進一步詳細描述如下。因此,以下揭露的內容並不意旨在所要求保護主題的必要特徵,也不意旨在決定所要求保護主題的範圍中使用。The following disclosure is exemplary only and is not meant to be limiting in any way. In addition to the illustrated aspects, embodiments and features, further aspects, embodiments and features will be apparent by reference to the drawings and the following detailed description. That is, the following disclosure is provided to introduce the concepts, highlights, benefits, and advantages of the novel and non-obvious technologies described herein. Selected, but not all, examples are described in further detail below. Accordingly, the following disclosure is not intended to be an essential feature of the claimed subject matter, nor is it intended to be used in determining the scope of the claimed subject matter.

因此,本揭露之主要目的即在於提供一種檢測光學膜的方法、裝置及系統,以改善上述缺點。Therefore, the main purpose of the present disclosure is to provide a method, device and system for inspecting an optical film, so as to improve the above disadvantages.

本揭露提出一種檢測光學膜的系統,包括:一平台;一光學感測器,拍攝一待檢測光學膜以三種角度放置於上述平台上之表面以產生三個待檢測影像;以及一計算裝置,執行:接收由上述光學感測器所傳送之上述待檢測影像;以及利用一辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性。The present disclosure proposes a system for inspecting an optical film, including: a platform; an optical sensor that photographs a surface of an optical film to be inspected placed on the platform at three angles to generate three images to be inspected; and a computing device, Execution: receiving the image to be inspected sent by the optical sensor; and using a recognition model to detect the image to be inspected to determine the property of the optical film to be inspected.

本揭露提出一種檢測光學膜的方法,包括:藉由一光學感測器拍攝一待檢測光學膜以三種角度放置於一平台上之待檢測影像;接收上述光學感測器所傳送之上述待檢測影像;以及利用一辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性。This disclosure proposes a method for inspecting an optical film, including: using an optical sensor to take images of an optical film to be inspected placed on a platform at three angles; receiving the image to be inspected sent by the optical sensor an image; and using a recognition model to detect the image to be detected to determine the property of the optical film to be detected.

本揭露提出一種檢測光學膜的裝置,包括:至少一圖形處理器;以及至少一電腦儲存媒體,儲存電腦可讀取指令,其中上述圖形處理器使用上述電腦儲存媒體以執行:接收由一光學感測器拍攝一待檢測光學膜以三種角度放置於一平台上之待檢測影像;以及利用一辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性。The disclosure proposes a device for inspecting an optical film, including: at least one graphics processor; and at least one computer storage medium storing computer-readable instructions, wherein the graphics processor uses the computer storage medium to execute: The tester shoots an image to be inspected of an optical film to be inspected placed on a platform at three angles; and uses a recognition model to detect the image to be inspected to determine the property of the optical film to be inspected.

在下文中將參考附圖對本揭露的各方面進行更充分的描述。然而,本揭露可以具體化成許多不同形式且不應解釋為侷限於貫穿本揭露所呈現的任何特定結構或功能。相反地,提供這些方面將使得本揭露周全且完整,並且本揭露將給本領域技術人員充分地傳達本揭露的範圍。基於本文所教導的內容,本領域的技術人員應意識到,無論是單獨還是結合本揭露的任何其它方面實現本文所揭露的任何方面,本揭露的範圍旨在涵蓋本文中所揭露的任何方面。例如,可以使用本文所提出任意數量的裝置或者執行方法來實現。另外,除了本文所提出本揭露的多個方面之外,本揭露的範圍更旨在涵蓋使用其它結構、功能或結構和功能來實現的裝置或方法。應可理解,其可透過申請專利範圍的一或多個元件具體化本文所揭露的任何方面。Aspects of the disclosure are described more fully hereinafter with reference to the accompanying drawings. This disclosure may, however, be embodied in many different forms and should not be construed as limited to any specific structure or function presented throughout this disclosure. Rather, these aspects are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art. Based on the teachings herein, one skilled in the art will appreciate that the scope of the present disclosure is intended to encompass any aspect disclosed herein, whether implemented alone or in combination with any other aspect of the disclosure. For example, it may be implemented using any number of means or implementations presented herein. In addition, in addition to the various aspects of the disclosure set forth herein, the scope of the disclosure is intended to cover devices or methods implemented using other structures, functions, or both. It should be appreciated that any aspect disclosed herein may be embodied by one or more elements of the claimed claims.

詞語「示例性」在本文中用於表示「用作示例、實例或說明」。本揭露的任何方面或本文描述為「示例性」的設計不一定被解釋為優選於或優於本揭露或設計的其他方面。此外,相同的數字在所有若干圖示中指示相同的元件,且除非在描述中另有指定,冠詞「一」和「上述」包含複數的參考。The word "exemplary" is used herein to mean "serving as an example, instance, or illustration." Any aspect of the disclosure or design described herein as "exemplary" is not necessarily to be construed as preferred or superior to other aspects of the disclosure or design. Furthermore, like numerals designate like elements throughout the several drawings, and unless otherwise specified in the description, the articles "a" and "above" include plural references.

可以理解,當元件被稱為被「連接」或「耦接」至另一元件時,該元件可被直接地連接到或耦接至另一元件或者可存在中間元件。相反地,當該元件被稱為被「直接連接」或「直接耦接」至到另一元件時,則不存在中間元件。用於描述元件之間的關係的其他詞語應以類似方式被解釋(例如,「在…之間」與「直接在…之間」、「相鄰」與「直接相鄰」等方式)。It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element or intervening elements may be present. In contrast, when an element is referred to as being "directly connected" or "directly coupled" to another element, there are no intervening elements present. Other words used to describe the relationship between elements should be interpreted in a like fashion (eg, "between" versus "directly between," "adjacent" versus "directly adjacent," etc.).

光學膜100之組成如第1圖所示,其係由表面保護膜102、保護層104、偏光基體106、保護層108、黏著劑層110及離型膜112所組成。在一實施例中表面保護膜102與保護層104之間包含一黏著劑層(圖未顯示)。The composition of the optical film 100 is shown in FIG. 1 , which is composed of a surface protection film 102 , a protection layer 104 , a polarizing substrate 106 , a protection layer 108 , an adhesive layer 110 and a release film 112 . In one embodiment, an adhesive layer (not shown) is included between the surface protection film 102 and the protection layer 104 .

在一些實施例中,偏光基體106的材料可為聚乙烯醇(polyvinyl alcohol,PVA)樹脂膜,其可藉由皂化聚醋酸乙烯樹脂製得。聚醋酸乙烯樹脂的例子包含醋酸乙烯之單聚合物,即聚醋酸乙烯,以及醋酸乙烯之共聚合物和其他能與醋酸乙烯進行共聚合之單體。In some embodiments, the material of the polarizing base 106 can be polyvinyl alcohol (polyvinyl alcohol, PVA) resin film, which can be prepared by saponifying polyvinyl acetate resin. Examples of polyvinyl acetate resins include monopolymers of vinyl acetate, ie, polyvinyl acetate, copolymers of vinyl acetate and other monomers that can be copolymerized with vinyl acetate.

在一些實施例中,可使用聚乙烯醇(polyvinyl alcohol,PVA)經處理後而作為偏光基體106。前述處理包含製備染色液;將聚乙烯浸漬於染色液中;將聚乙烯醇拉伸;以及乾燥。In some embodiments, polyvinyl alcohol (PVA) can be used as the polarizing matrix 106 after being treated. The foregoing treatment includes preparing a dyeing solution; immersing polyethylene in the dyeing solution; stretching polyvinyl alcohol; and drying.

在一些實施例中,保護層104與保護層108可包含對光學之增益、配向、補償、轉向、直交、擴散、保護、防黏、耐刮、抗眩、反射抑制、高折射率等有所助益的膜片。在一些實施例中,保護層104與保護層108可為單層或多層的結構。保護層104與保護層108的材料可例如是透明性、機械強度、熱穩定性、水分阻隔性等優良之熱可塑性樹脂。熱可塑性樹脂可包含纖維素樹脂(例如:三醋酸纖維素(triacetate cellulose,TAC)、二醋酸纖維素(diacetate cellulose,DAC)、乙醯基纖維素)、丙烯酸樹脂(例如:聚甲基丙烯酸甲酯(poly methyl methacrylate,PMMA))、聚酯樹脂(例如,聚對苯二甲酸乙二酯(polyethylene terephthalate,PET)、聚萘二甲酸乙二酯)、烯烴樹脂、聚碳酸酯樹脂、環烯烴樹脂、定向拉伸性聚丙烯(oriented-polypropylene,OPP)、聚乙烯(polyethylene,PE)、聚丙烯(polypropylene,PP)、環烯烴聚合物(cyclic olefin polymer,COP)、環烯烴共聚合物(cyclic olefin copolymer,COC)、或上述之任意組合。In some embodiments, the protective layer 104 and the protective layer 108 can include optical gain, alignment, compensation, steering, orthogonal, diffusion, protection, anti-adhesion, scratch resistance, anti-glare, reflection suppression, high refractive index, etc. Aided diaphragm. In some embodiments, the protective layer 104 and the protective layer 108 can be a single-layer or multi-layer structure. The material of the protective layer 104 and the protective layer 108 can be, for example, a thermoplastic resin with excellent transparency, mechanical strength, thermal stability, and moisture barrier properties. Thermoplastic resins can include cellulose resins (for example: triacetate cellulose (TAC), diacetate cellulose (DAC), acetyl cellulose), acrylic resins (for example: polymethylmethacrylate) Esters (poly methyl methacrylate, PMMA)), polyester resins (e.g., polyethylene terephthalate (PET), polyethylene naphthalate), olefin resins, polycarbonate resins, cycloolefins Resin, oriented-polypropylene (OPP), polyethylene (polyethylene, PE), polypropylene (polypropylene, PP), cyclic olefin polymer (cyclic olefin polymer, COP), cyclic olefin copolymer ( cyclic olefin copolymer, COC), or any combination of the above.

在一些實施例中,黏著劑層110包含壓敏性黏著劑(pressure sensitive adhesive,PSA)、熱敏性黏著劑、溶劑揮發性黏著劑、及UV可固化黏著劑,並且不以此為限。在一些實施例中,壓敏性黏著劑包含天然橡膠、合成橡膠、苯乙烯嵌段共聚物、(甲基)丙烯酸系嵌段共聚物、聚乙烯基醚、聚烯烴、及聚(甲基)丙烯酸酯。在一些實施例中,(甲基)丙烯酸(或丙烯酸酯)係指丙烯酸及甲基丙烯酸類二者。在另一些實施例中,壓敏性黏著劑包含(甲基)丙烯酸酯、橡膠、熱塑性彈性體、聚矽氧、胺基甲酸酯、及其組合。在一些實施例中,壓敏性黏著劑係基於(甲基)丙烯酸系壓敏性黏著劑或基於至少一種聚(甲基)丙烯酸酯。In some embodiments, the adhesive layer 110 includes pressure sensitive adhesive (PSA), heat sensitive adhesive, solvent volatile adhesive, and UV curable adhesive, but not limited thereto. In some embodiments, the pressure sensitive adhesive comprises natural rubber, synthetic rubber, styrene block copolymer, (meth)acrylic block copolymer, polyvinyl ether, polyolefin, and poly(meth) Acrylate. In some embodiments, (meth)acrylic (or acrylate) refers to both acrylic and methacrylic. In other embodiments, the pressure sensitive adhesive comprises (meth)acrylate, rubber, thermoplastic elastomer, silicone, urethane, and combinations thereof. In some embodiments, the pressure sensitive adhesive is based on a (meth)acrylic pressure sensitive adhesive or based on at least one poly(meth)acrylate.

在一些實施例中,表面保護膜102與離型膜112的材料可為聚對苯二甲酸乙二酯(polyethylene terephthalate, PET)、聚對苯二甲酸丁二酯、聚碳酸酯、聚芳酸酯、聚酯樹脂、烯烴樹脂、乙酸纖維素樹脂、丙烯酸樹脂、聚乙烯(polyethylene,PE)、聚丙烯(polypropylene,PP)、環烯烴樹脂、聚矽氧或上述之組合。In some embodiments, the material of the surface protection film 102 and the release film 112 can be polyethylene terephthalate (polyethylene terephthalate, PET), polybutylene terephthalate, polycarbonate, polyarylate Esters, polyester resins, olefin resins, cellulose acetate resins, acrylic resins, polyethylene (PE), polypropylene (PP), cycloolefin resins, polysiloxane, or combinations thereof.

第2圖係顯示光學膜的表面保護膜與離型膜之兩表面分別以不同水平旋轉角度拍攝出的影像。如第2圖所示,係將光學膜放置於一平台之上,分別以表面保護膜表面或離型膜表面朝上後,以光學感測器垂直表面保護膜表面或離型膜表面拍攝第一張影像而設定為0度影像後,再將光學膜於平台上水平旋轉45度後拍攝第二張影像而設定為45度影像,最後再將光學膜於平台上水平旋轉45度後拍攝第三張影像而設定為90度影像(亦即拍攝第三張影像時與初始放置角度已水平旋轉90度)。在一實施例中,本揭露拍攝之影像包含光學膜100之完整影像。在一實施例中,本揭露拍攝之影像包含矩形光學膜100之至少三個邊界之影像。如第2圖所示,基於人眼目視的角度,並不容易區分出表面保護膜分別於0度、45度及90度,及離型膜分別於0度、45度及90度之影像的差異。Figure 2 shows the images taken at different horizontal rotation angles on the two surfaces of the surface protection film and the release film of the optical film. As shown in Figure 2, the optical film is placed on a platform, with the surface of the surface protection film or the surface of the release film facing up, and the optical sensor is vertical to the surface of the surface protection film or the surface of the release film to take pictures of the first After one image is set as a 0-degree image, the optical film is rotated horizontally by 45 degrees on the platform to shoot the second image and set as a 45-degree image, and finally the optical film is rotated horizontally by 45 degrees on the platform to shoot the second image Three images are set as 90-degree images (that is, when the third image is taken, it has been horizontally rotated 90 degrees from the initial placement angle). In one embodiment, the image captured in the present disclosure includes a complete image of the optical film 100 . In one embodiment, the image captured in the present disclosure includes images of at least three boundaries of the rectangular optical film 100 . As shown in Figure 2, based on the visual angle of the human eye, it is not easy to distinguish the surface protection film at 0 degrees, 45 degrees and 90 degrees, and the release film at 0 degrees, 45 degrees and 90 degrees respectively. difference.

為減少失誤,並降低判斷錯誤重工之成本,本揭露實施例提供一種檢測光學膜的方法、裝置及系統,利用神經網路技術,以進一步解決生產光學膜作業過程發生錯誤的問題。In order to reduce mistakes and reduce the cost of rework due to wrong judgments, the embodiments of the present disclosure provide a method, device and system for inspecting optical films, using neural network technology to further solve the problem of errors in the production process of optical films.

第3圖係顯示根據本揭露一實施例中檢測光學膜的系統300的示例性示意圖。系統300可至少包括具有一平台310、一識別裝置320及一光學感測器330。FIG. 3 is an exemplary schematic diagram of a system 300 for inspecting an optical film according to an embodiment of the present disclosure. The system 300 may at least include a platform 310 , an identification device 320 and an optical sensor 330 .

平台310可包含一背光,用以供一光學膜350放置。在一實施例中,平台310亦可具有用以旋轉光學膜350之一旋轉機構,其可將光學膜進行水平旋轉。在一實施例中,若平台310無旋轉機構,可改由人工手動水平旋轉光學膜350。在一實施例中,平台310以0度、45度及90度水平旋轉光學膜350。Platform 310 may include a backlight for an optical film 350 to be placed on. In one embodiment, the platform 310 may also have a rotation mechanism for rotating the optical film 350, which can rotate the optical film horizontally. In one embodiment, if the platform 310 has no rotation mechanism, the optical film 350 can be manually rotated horizontally instead. In one embodiment, the platform 310 rotates the optical film 350 horizontally at 0 degrees, 45 degrees and 90 degrees.

在一實施例中,光學膜350之結構與材料與光學膜100相同,不再贅述。In one embodiment, the structure and material of the optical film 350 are the same as those of the optical film 100 , and will not be repeated here.

光學感測器330能夠接收光訊號,將光訊號轉換為像素等電訊號,並且將電訊號傳送至識別裝置以進行運算。舉例而言,光學感測器330可包括有源像素傳感器(APS)、CMOS圖像傳感器、感光耦合元件(CCD)、紅外線感測元件、光感電晶體、或各種光學鏡頭等。再者,光學感測器可為二維感光元件,也就是說,光學感測器330配合其他裝置、機構或設備,以二維的方式依序取得部分待檢測光學膜350表面子影像,最後集合全部的部分子影像而得到待檢測光學膜350之完整表面影像。在某一實施例中,光學感測器330具有較大之取像範圍,可一次取得待檢測光學膜350之完整表面影像。The optical sensor 330 can receive light signals, convert the light signals into electrical signals such as pixels, and transmit the electrical signals to the identification device for calculation. For example, the optical sensor 330 may include an active pixel sensor (APS), a CMOS image sensor, a photosensitive coupling device (CCD), an infrared sensing element, a photosensitive transistor, or various optical lenses. Moreover, the optical sensor can be a two-dimensional photosensitive element, that is to say, the optical sensor 330 cooperates with other devices, mechanisms or equipment to sequentially acquire part of the sub-images on the surface of the optical film 350 to be detected in a two-dimensional manner, and finally All partial sub-images are combined to obtain a complete surface image of the optical film 350 to be inspected. In a certain embodiment, the optical sensor 330 has a larger imaging range, and can obtain a complete surface image of the optical film 350 to be inspected at one time.

在一些實施例中,光學感測器330至少包括一鏡頭332,其中鏡頭332可選擇性地安裝一偏光鏡(圖未顯示),用以拍攝光學膜350以複數種角度放置於平台310上之表面影像。在一些實施例中,光學感測器330用以拍攝光學膜350以三種角度,例如為以0度、45度及90度放置於平台310上之表面影像。其中0度、45度及90度影像取得方法同前段所述,不再贅述。In some embodiments, the optical sensor 330 includes at least one lens 332, wherein the lens 332 can optionally be equipped with a polarizer (not shown in the figure) to photograph the optical film 350 placed on the platform 310 at multiple angles. surface image. In some embodiments, the optical sensor 330 is used to take images of the surface of the optical film 350 placed on the platform 310 at three angles, such as 0 degrees, 45 degrees and 90 degrees. The methods for obtaining images of 0 degrees, 45 degrees and 90 degrees are the same as those described in the preceding paragraph, and will not be repeated here.

在一些實施例中,光學感測器330為一彩色光學感測器,且包括一鏡頭332,其中鏡頭安裝有一偏光鏡(圖未顯示)。In some embodiments, the optical sensor 330 is a color optical sensor and includes a lens 332 , where a polarizer (not shown) is mounted on the lens.

識別裝置320可包括輸入裝置322,其中,該輸入裝置322被配置為從各種來源接收輸入數據。舉例來說,識別裝置320可以藉由一網路340接收光學感測器330所傳送之影像。識別裝置320也可接收包括光學膜的訓練影像,並基於接收到的訓練影像訓練被配置為識別光學膜屬性的識別器。The recognition device 320 may include an input device 322 configured to receive input data from various sources. For example, the identification device 320 can receive the image transmitted by the optical sensor 330 through a network 340 . The recognition device 320 may also receive training images including the optical film, and train a recognizer configured to recognize properties of the optical film based on the received training images.

識別裝置320還包括圖形處理器324、一神經網路(Neural Network)326及可以存儲程式3282的一記憶體328。此外,影像可儲存在記憶體328中或是儲存在神經網路326中。在一實施例中,神經網路326可由圖形處理器324所實現。在另一實施例中,識別裝置320可與本文所描述之外的其他組件、系統、子系統和/或裝置一起使用。The recognition device 320 also includes a graphics processor 324 , a neural network (Neural Network) 326 and a memory 328 capable of storing a program 3282 . In addition, images can be stored in the memory 328 or in the neural network 326 . In one embodiment, the neural network 326 can be implemented by the GPU 324 . In another embodiment, identification device 320 may be used with other components, systems, subsystems and/or devices than those described herein.

識別裝置320的類型範圍從小型手持裝置(例如,行動電話∕可攜式電腦)到大型主機系統(例如大型電腦)。可攜式電腦的示例包括個人數位助理(PDA)、筆記型電腦等裝置。網路340可包括但不侷限於一或多個區域網(Local Area Network,LAN)和/或廣域網路(Wide Area Network,WAN)。Types of identification devices 320 range from small handheld devices (eg, mobile phones/laptops) to large host systems (eg, mainframe computers). Examples of portable computers include personal digital assistants (PDAs), notebook computers, and other devices. The network 340 may include but not limited to one or more local area networks (Local Area Network, LAN) and/or wide area networks (Wide Area Network, WAN).

應可理解,第3圖所示的識別裝置320係一檢測光學膜的系統300架構的示例。第3圖所示的識別裝置320可經由任何類型的計算裝置來實現,像是參考第7圖描述的計算裝置700,如第7圖所示。It should be understood that the recognition device 320 shown in FIG. 3 is an example of the structure of the system 300 for detecting optical films. The recognition device 320 shown in FIG. 3 may be implemented by any type of computing device, such as the computing device 700 described with reference to FIG. 7 , as shown in FIG. 7 .

第4圖係顯示根據本揭露一實施例所述之檢測光學膜的方法400之流程圖。此方法可執行於如第3圖所示之識別裝置320的圖形處理器324中。FIG. 4 is a flowchart showing a method 400 for inspecting an optical film according to an embodiment of the present disclosure. This method can be implemented in the graphics processor 324 of the recognition device 320 shown in FIG. 3 .

須先注意的是,如本文所使用的,術語「訓練(training)」用於識別用於訓練辨識模型的對象。因此,訓練影像是指用於訓練辨識模型的影像。It should be noted first that, as used herein, the term "training" is used to identify objects used to train a recognition model. Therefore, the training image refers to the image used to train the recognition model.

在步驟S405中,識別裝置接收由光學感測器拍攝複數光學膜以三種角度放置於具有一背光功能的一平台上之複數訓練影像,其中上述三種角度包括0度、45度及90度。更詳細地說明,光學感測器均需分別以三種角度拍攝光學膜的兩個表面(表面保護膜表面及離型膜表面),以取得表面保護膜表面及離型膜表面於三種角度的訓練影像。In step S405 , the recognition device receives a plurality of training images captured by the optical sensor and placed on a platform with a backlight function at three angles of the plurality of optical films, wherein the above three angles include 0 degree, 45 degree and 90 degree. In more detail, the optical sensor needs to take pictures of the two surfaces of the optical film (the surface of the surface protection film and the surface of the release film) at three angles to obtain the training of the surface of the surface protection film and the surface of the release film at three angles. image.

接著,在步驟S410中,識別裝置訓練一辨識模型分類上述訓練影像中的上述光學膜之屬性,其中上述屬性為一表面保護膜或一離型膜。Next, in step S410 , the recognition device trains a recognition model to classify the attribute of the optical film in the training image, wherein the attribute is a surface protection film or a release film.

再來,在步驟S415中,識別裝置接收由上述光學感測器對一待檢測光學膜擷取上述三種角度之待檢測影像。在步驟S420中,識別裝置利用上述辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性。Next, in step S415 , the identification device receives images to be inspected from the above three angles captured by the optical sensor for an optical film to be inspected. In step S420, the recognition device detects the image to be detected by using the recognition model to determine the property of the optical film to be detected.

在一實施例中,識別裝置在步驟S410中所訓練一辨識模型係基於一卷積神經網路(Convolutional Neural Network,CNN)模型。常見的CNN模型架構有LeNet、AlexNet、VGG、GoogleLeNet、ResNet等。In one embodiment, the recognition model trained by the recognition device in step S410 is based on a Convolutional Neural Network (CNN) model. Common CNN model architectures include LeNet, AlexNet, VGG, GoogleLeNet, ResNet, etc.

在另一實施例中,平台可包括一旋轉機構,用以水平旋轉訓練用的光學膜以及待檢測光學膜,以利取得多次的表面影像。In another embodiment, the platform may include a rotating mechanism for horizontally rotating the optical film for training and the optical film to be inspected, so as to obtain multiple surface images.

以下將詳細說明在步驟S420中,識別裝置如何利用上述辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性。The following will describe in detail in step S420 how the recognition device uses the recognition model to detect the image to be detected to determine the property of the optical film to be detected.

第5圖係顯示根據本揭露一實施例所述之識別裝置利用辨識模型判斷上述待檢測光學膜之屬性的方法500之流程圖。此方法可執行於如第3圖所示之識別裝置320的圖形處理器324中。FIG. 5 is a flowchart showing a method 500 for judging the properties of the optical film to be inspected by the recognition device according to an embodiment of the present disclosure using a recognition model. This method can be implemented in the graphics processor 324 of the recognition device 320 shown in FIG. 3 .

在流程開始之前,識別裝置已先訓練好用以辨識光學膜屬性之一辨識模型。在步驟S505中,識別裝置接收由光學感測器對一待檢測光學膜擷取三種角度之待檢測影像。接著,在步驟S510中,識別裝置利用上述辨識模型取得上述待檢測影像於上述三種角度對應不同屬性的相似度比例。更詳細地說明,當識別裝置訓練完辨識模型後,辨識模型可接受訓練輸入(Training Input)(例如,光學膜影像)並且通過一連串應用層產生輸出(Output)。而此輸出即為光學膜對應一屬性之相似度比例。Before the process starts, the recognition device has trained a recognition model for recognizing the properties of the optical film. In step S505, the identification device receives images to be inspected from three angles captured by the optical sensor for an optical film to be inspected. Next, in step S510 , the recognition device uses the recognition model to obtain similarity ratios of the images to be detected corresponding to different attributes at the above three angles. To describe in more detail, after the recognition device has trained the recognition model, the recognition model can accept training input (eg, optical film image) and generate output through a series of application layers. The output is the similarity ratio of the optical film corresponding to a property.

再來,在步驟S515中,識別裝置判斷是否有對應一屬性之兩個以上相似度比例大於一閾值。當有對應一屬性之兩個以上相似度比例大於上述閾值時(步驟S515中的「是」),在步驟S520中,識別裝置根據上述相似度比例判斷上述待檢測光學膜之屬性。Next, in step S515, the identification device determines whether there are more than two similarity ratios corresponding to an attribute greater than a threshold. When two or more similarity ratios corresponding to an attribute are greater than the threshold ("Yes" in step S515), in step S520, the recognition device judges the attribute of the optical film to be detected according to the similarity ratio.

當不具有對應一屬性之兩個以上相似度比例大於上述閾值時(步驟S515中的「否」),在步驟S525中,識別裝置傳送一錯誤訊息,以通知一使用者上述待檢測光學膜發生異常,其中上述識別裝置可使用相關使用者介面(例如:顯示器、發光二極體(LED)、液晶顯示器(LCD)、麥克風、蜂鳴器(Buzzer)等裝置)提醒使用者此待檢測光學膜發生異常。上述使用者在接收上述錯誤訊息後,可改以一人工方式判斷上述待檢測光學膜之屬性。When two or more similarity ratios that do not correspond to an attribute are greater than the threshold ("No" in step S515), in step S525, the recognition device sends an error message to notify a user that the above-mentioned optical film to be detected has occurred Abnormal, wherein the above identification device can use the relevant user interface (for example: display, light emitting diode (LED), liquid crystal display (LCD), microphone, buzzer (Buzzer) and other devices) to remind the user of the optical film to be detected An exception occurs. After receiving the error message, the above-mentioned user can judge the attribute of the above-mentioned optical film to be detected by a manual method.

第6圖係顯示根據本揭露一實施例之識別光學膜屬性之數據的表格,其依據蒐集到的待檢測影像進行檢測。如表格中所示,辨識裝置識別此待檢測光學膜為表面保護膜0度、45度及90度的相似度比例分別8%、93.2%及84.5%,而識別此待檢測光學膜為離型膜0度、45度及90度的相似度比例分別92%、6.8%及15.5%。在此一實施例中,定義閾值係為0.4(亦即相似度比例為40%)。因此,辨識裝置判斷此待檢測光學膜的表面保護膜或離型膜於0度、45度及90度相似度比例大於閾值0.4的數量是否超過2。如表格中所示,此待檢測光學膜的表面保護膜45度及90度相似度比例大於閾值0.4,因此辨識裝置將判定此待檢測光學膜係為表面保護膜。FIG. 6 is a table showing data for identifying properties of an optical film according to an embodiment of the present disclosure, which is inspected based on collected images to be inspected. As shown in the table, the recognition device recognizes that the optical film to be detected is a surface protection film with a similarity ratio of 0 degrees, 45 degrees and 90 degrees, respectively, 8%, 93.2% and 84.5%, and recognizes that the optical film to be detected is a release type The similarity proportions of 0 degrees, 45 degrees and 90 degrees are 92%, 6.8% and 15.5% respectively. In this embodiment, the defined threshold is 0.4 (that is, the similarity ratio is 40%). Therefore, the identification device judges whether the number of similarity ratios of the surface protection film or release film of the optical film to be detected at 0 degrees, 45 degrees and 90 degrees greater than the threshold value of 0.4 exceeds 2. As shown in the table, the 45-degree and 90-degree similarity ratio of the surface protection film of the optical film to be detected is greater than the threshold value of 0.4, so the identification device will determine that the optical film to be detected is a surface protection film.

值得注意的是,儘管第6圖中閾值之數值係0.4作為例子,但本揭露並不侷限於第6圖所示之實施方式,亦即本揭露可視拍攝影像之訓練結果定義其他閾值之數值。It should be noted that although the value of the threshold in FIG. 6 is 0.4 as an example, the present disclosure is not limited to the embodiment shown in FIG. 6 , that is, the present disclosure can define other threshold values based on the training results of captured images.

此外,辨識裝置320中之圖形處理器324也可執行記憶體328中之程式3282以呈現上述實施例所述之動作和步驟,或其它在說明書中內容之描述。In addition, the graphics processor 324 in the identification device 320 can also execute the program 3282 in the memory 328 to present the actions and steps described in the above embodiments, or other descriptions in the manual.

因此,透過本揭露檢測光學膜的方法、裝置及系統,可有效避免因人工檢測光學膜所產生的失誤。而在導入自動辨識後,生產線可減少相對應人力,並且提供生產線該光學膜瑕疵分布情況,進而提升良率。此外,更可節約生產檢測成本,進一步降低光學膜誤判的風險,從品質角度上可贏取更多的信譽及商譽。Therefore, through the method, device and system for inspecting optical films disclosed in the present disclosure, errors caused by manual inspection of optical films can be effectively avoided. After the introduction of automatic identification, the production line can reduce the corresponding manpower, and provide the distribution of the optical film defects in the production line, thereby improving the yield rate. In addition, it can save production and inspection costs, further reduce the risk of misjudgment of optical films, and win more reputation and goodwill from the perspective of quality.

對於本揭露已描述的實施例,下文描述了可以實現本揭露實施例的示例性操作環境。具體參考第7圖,第7圖係顯示用以實現本揭露實施例的示例性操作環境,一般可被視為計算裝置700。計算裝置700僅為一合適計算環境的一個示例,並不意圖暗示對本揭露使用或功能範圍的任何限制。計算裝置700也不應被解釋為具有與所示元件任一或組合相關任何的依賴性或要求。With respect to the described embodiments of the present disclosure, the following describes an exemplary operating environment in which embodiments of the present disclosure may be implemented. With particular reference to FIG. 7 , FIG. 7 shows an exemplary operating environment, generally considered a computing device 700 , for implementing embodiments of the present disclosure. Computing device 700 is only one example of a suitable computing environment and is not intended to suggest any limitation as to the scope of use or functionality of the disclosure. Neither should the computing device 700 be interpreted as having any dependency or requirement relating to any one or combination of illustrated elements.

本揭露可在電腦程式碼或機器可使用指令來執行本揭露,指令可為程式模組的電腦可執行指令,其程式模組由電腦或其它機器,例如個人數位助理或其它可攜式裝置執行。一般而言,程式模組包括例程、程式、物件、元件、數據結構等,程式模組指的是執行特定任務或實現特定抽象數據類型的程式碼。本揭露可在各種系統組態中實現,包括可攜式裝置、消費者電子產品、通用電腦、更專業的計算裝置等。本揭露還可在分散式運算環境中實現,處理由通訊網路所連結的裝置。The present disclosure can be executed in computer code or machine-usable instructions, the instructions can be computer-executable instructions of program modules, and the program modules are executed by computers or other machines, such as personal digital assistants or other portable devices . Generally speaking, a program module includes routines, programs, objects, components, data structures, etc., and a program module refers to a program code that executes a specific task or implements a specific abstract data type. The present disclosure can be implemented in a variety of system configurations, including portable devices, consumer electronics, general purpose computers, more professional computing devices, and the like. The present disclosure may also be practiced in distributed computing environments, processing devices that are linked by a communication network.

參考第7圖。計算裝置700包括直接或間接耦接以下裝置的匯流排710、記憶體712、被包括在一或多個處理器(圖未顯示)中的圖形處理器714、一或多個顯示元件716、輸入/輸出(I/O)埠口718、輸入/輸出(I/O)元件720以及說明性電源供應器722。匯流排710表示可為一或多個匯流排之元件(例如,位址匯流排、數據匯流排或其組合)。雖然第7圖的各個方塊為簡要起見以線示出,實際上,各個元件的分界並不是具體的,例如,可將顯示裝置的呈現元件視為I/O元件;圖形處理器可具有記憶體。計算裝置700一般包括各種電腦可讀取媒體。此外,計算裝置700中之圖形處理器714也可執行記憶體712中之程式及指令以呈現上述實施例所述之動作和步驟,或其它在說明書中內容之描述。Refer to Figure 7. Computing device 700 includes a bus 710 for coupling, directly or indirectly, to memory 712, a graphics processor 714 included in one or more processors (not shown), one or more display elements 716, input I/O port 718 , input/output (I/O) element 720 and illustrative power supply 722 . Bus 710 represents an element that may be one or more buses (eg, an address bus, a data bus, or a combination thereof). Although each block in Fig. 7 is shown with a line for the sake of brevity, in fact, the boundary of each element is not specific, for example, the presentation element of the display device can be regarded as an I/O element; the graphics processor can have a memory body. Computing device 700 generally includes various computer-readable media. In addition, the graphics processor 714 in the computing device 700 can also execute the programs and instructions in the memory 712 to present the actions and steps described in the above embodiments, or other descriptions in the manual.

在此所揭露程序之任何具體順序或分層之步驟純為一舉例之方式。基於設計上之偏好,必須了解到程序上之任何具體順序或分層之步驟可在此文件所揭露的範圍內被重新安排。伴隨之方法權利要求以一示例順序呈現出各種步驟之元件,也因此不應被此所展示之特定順序或階層所限制。Any specific order or hierarchy of steps in the processes disclosed herein is by way of example only. Based upon design preferences, it must be understood that any specific order or hierarchy of steps in the procedures may be rearranged within the scope of the disclosure in this document. The accompanying method claims present elements of the various steps in a sample order, and therefore shouldn't be limited to the specific order or hierarchy presented.

申請專利範圍中用以修飾元件之「第一」、「第二」、「第三」等序數詞之使用本身未暗示任何優先權、優先次序、各元件之間之先後次序、或方法所執行之步驟之次序,而僅用作標識來區分具有相同名稱(具有不同序數詞)之不同元件。The use of ordinal numerals such as "first", "second", and "third" used to modify elements in the claims does not imply any priority, order of priority, order of priority among elements, or implementation of the method The order of the steps in the sequence is used only as an identification to distinguish between different elements with the same name (with different ordinal numbers).

雖然本揭露已以實施範例揭露如上,然其並非用以限定本案,任何熟悉此項技藝者,在不脫離本揭露之精神和範圍內,當可做些許更動與潤飾,因此本案之保護範圍當視後附之申請專利範圍所界定者為準。Although this disclosure has disclosed the above with the implementation example, it is not used to limit this case. Anyone who is familiar with this technology can make some changes and modifications without departing from the spirit and scope of this disclosure. Therefore, the protection scope of this case should be Depends on what is defined in the appended patent application scope.

100:光學膜 102:表面保護膜 104:保護層 106:偏光基體 108:保護層 110:黏著劑層 112:離型膜 300:系統 310:平台 320:識別裝置 322:輸入裝置 324:圖形處理器 326:神經網路 328:記憶體 3282:程式 330:光學感測器 332:鏡頭 340:網路 350:光學膜 400:方法 S405,S410,S415,S420:步驟 500:方法 S505,S510,S515,S520,S525:步驟 700:計算裝置 710:匯流排 712:記憶體 714:圖形處理器 716:顯示元件 718:I/O埠口 720:I/O元件 722:電源供應器 100: Optical film 102: Surface protection film 104: protective layer 106: Polarizing substrate 108: protective layer 110: Adhesive layer 112: Release film 300: system 310: platform 320: identification device 322: input device 324: graphics processor 326: Neural Networks 328: memory 3282:program 330: Optical sensor 332: Lens 340: Network 350: optical film 400: method S405, S410, S415, S420: steps 500: method S505, S510, S515, S520, S525: steps 700: computing device 710: busbar 712:Memory 714: graphics processor 716: display components 718:I/O port 720: I/O components 722: Power supply

第1圖係顯示光學膜組成之示意圖。 第2圖係顯示光學膜的表面保護膜或離型膜以不同角度拍攝的影像。 第3圖係顯示根據本揭露一實施例中檢測光學膜的系統的示例性示意圖。 第4圖係顯示根據本揭露一實施例所述之檢測光學膜的方法之流程圖。 第5圖係顯示根據本揭露一實施例所述之識別裝置利用辨識模型判斷上述待檢測光學膜之屬性的方法之流程圖。 第6圖係顯示根據本揭露一實施例之識別光學膜屬性之數據的表格。 第7圖係顯示用以實現本揭露實施例的示例性操作環境。 Figure 1 is a schematic diagram showing the composition of the optical film. Figure 2 shows images taken from different angles of the surface protection film or release film of the optical film. FIG. 3 is an exemplary schematic diagram of a system for inspecting an optical film according to an embodiment of the present disclosure. FIG. 4 is a flowchart showing a method for inspecting an optical film according to an embodiment of the present disclosure. FIG. 5 is a flowchart showing a method for judging the properties of the optical film to be detected by the recognition device according to an embodiment of the present disclosure using a recognition model. FIG. 6 is a table showing data identifying properties of an optical film according to an embodiment of the present disclosure. FIG. 7 shows an exemplary operating environment for implementing embodiments of the present disclosure.

400:方法 S405,S410,S415,S420:步驟 400: method S405, S410, S415, S420: steps

Claims (18)

一種檢測光學膜的系統,包括:一平台;一光學感測器,拍攝一待檢測光學膜以三種角度放置於上述平台上之表面以產生三個待檢測影像;以及一計算裝置,執行:接收由上述光學感測器所傳送之上述待檢測影像;以及利用一辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性;其中在上述計算裝置接收上述待檢測影像之前,上述計算裝置更接收由上述光學感測器拍攝複數光學膜以上述三種角度放置於上述平台上之複數訓練影像,並訓練上述辨識模型分類上述訓練影像中的上述光學膜之屬性。 A system for inspecting an optical film, comprising: a platform; an optical sensor, photographing a surface of an optical film to be inspected placed on the above-mentioned platform at three angles to generate three images to be inspected; and a computing device, executing: receiving The image to be detected transmitted by the optical sensor; and a recognition model is used to detect the image to be detected to determine the properties of the optical film to be detected; wherein before the computing device receives the image to be detected, the calculation The device further receives a plurality of training images captured by the optical sensor and placed on the platform at the above three angles, and trains the identification model to classify the attributes of the optical films in the training images. 如請求項1所述之檢測光學膜的系統,其中上述利用上述辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性之步驟更包括:利用上述辨識模型取得上述待檢測影像於上述三種角度對應不同屬性的相似度比例;判斷是否有對應一屬性之兩個以上相似度比例大於一閾值;以及當有對應一屬性之兩個以上相似度比例大於上述閾值時,根據上述相似度比例判斷上述待檢測光學膜之屬性。 The system for detecting optical films as described in Claim 1, wherein the step of using the identification model to detect the image to be inspected to determine the properties of the optical film to be inspected further includes: using the identification model to obtain the image to be inspected in The above three angles correspond to the similarity ratios of different attributes; judge whether there are more than two similarity ratios corresponding to an attribute greater than a threshold; and when there are more than two similarity ratios corresponding to an attribute greater than the above threshold, according to the above similarity The ratio judges the property of the optical film to be detected above. 如請求項2所述之檢測光學膜的系統,上述方法更包括:當不具有對應一屬性之兩個以上相似度比例大於上述閾值時,傳送一錯誤訊息,以通知上述待檢測光學膜發生異常。 In the system for detecting an optical film as described in Claim 2, the method further includes: when two or more similarity ratios that do not have a corresponding attribute are greater than the threshold, sending an error message to notify that the optical film to be detected is abnormal . 如請求項1所述之檢測光學膜的系統,其中上述光學感測器係一彩色光學感測器,且至少包括一鏡頭,其中上述鏡頭安裝有一偏光鏡。 The system for inspecting an optical film according to claim 1, wherein the optical sensor is a color optical sensor and includes at least one lens, wherein the lens is equipped with a polarizer. 如請求項1所述之檢測光學膜的系統,其中上述平台更包括一背光,及/或用以旋轉上述待檢測光學膜之一旋轉機構。 The system for inspecting an optical film according to claim 1, wherein the platform further includes a backlight, and/or a rotating mechanism for rotating the optical film to be inspected. 如請求項1所述之檢測光學膜的系統,其中上述三種角度包括0度、45度及90度。 The system for inspecting an optical film according to claim 1, wherein the above three angles include 0 degree, 45 degree and 90 degree. 如請求項1所述之檢測光學膜的系統,其中上述屬性為一表面保護膜或一離型膜。 The system for inspecting an optical film as claimed in claim 1, wherein the property is a surface protection film or a release film. 一種檢測光學膜的方法,包括:藉由一光學感測器拍攝一待檢測光學膜以三種角度放置於一平台上之待檢測影像;接收由上述光學感測器拍攝複數光學膜以上述三種角度放置於上述平台上之複數訓練影像,並訓練上述辨識模型分類上述訓練影像中的上述光學膜之屬性;接收上述光學感測器所傳送之上述待檢測影像;以及利用一辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性。 A method for inspecting an optical film, comprising: photographing an image to be inspected of an optical film to be inspected placed on a platform at three angles by an optical sensor; placing multiple training images on the above-mentioned platform, and training the above-mentioned recognition model to classify the attributes of the above-mentioned optical film in the above-mentioned training images; receiving the above-mentioned to-be-detected image sent by the above-mentioned optical sensor; and using a recognition model to classify the above-mentioned to-be-detected image The image is detected to determine the property of the above-mentioned optical film to be detected. 如請求項8所述之檢測光學膜的方法,其中上述利用上述辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性之步驟更包括:利用上述辨識模型取得上述待檢測影像於上述三種角度對應不同屬性的相似度比例;判斷是否有對應一屬性之兩個以上相似度比例大於一閾值;以及當有對應一屬性之兩個以上相似度比例大於上述閾值時,根據上述相似度比例判斷上述待檢測光學膜之屬性。 The method for inspecting an optical film as described in Claim 8, wherein the step of using the identification model to detect the image to be inspected to determine the properties of the optical film to be inspected further includes: using the identification model to obtain the image to be inspected in The above three angles correspond to the similarity ratios of different attributes; judge whether there are more than two similarity ratios corresponding to an attribute greater than a threshold; and when there are more than two similarity ratios corresponding to an attribute greater than the above threshold, according to the above similarity The ratio judges the property of the optical film to be detected above. 如請求項9所述之檢測光學膜的方法,上述方法更包括:當不具有對應一屬性之兩個以上相似度比例大於上述閾值時,傳送一錯誤訊息,以通知上述待檢測光學膜發生異常。 The method for inspecting an optical film as described in claim 9, the above method further includes: when two or more similarity ratios that do not have a corresponding attribute are greater than the above threshold value, sending an error message to notify that the optical film to be inspected is abnormal . 如請求項8所述之檢測光學膜的方法,其中上述光學感測器係一彩色光學感測器,且至少包括一鏡頭,其中上述鏡頭安裝有一偏光鏡。 The method for inspecting an optical film according to claim 8, wherein the optical sensor is a color optical sensor and includes at least one lens, wherein the lens is equipped with a polarizer. 如請求項8所述之檢測光學膜的方法,其中上述平台更包括一背光,及/或用以旋轉上述待檢測光學膜之一旋轉機構。 The method for inspecting an optical film according to claim 8, wherein the platform further includes a backlight, and/or a rotating mechanism for rotating the optical film to be inspected. 如請求項8所述之檢測光學膜的方法,其中上述三種角度包括0度、45度及90度。 The method for inspecting an optical film as claimed in claim 8, wherein the above three angles include 0 degree, 45 degree and 90 degree. 如請求項8所述之檢測光學膜的方法,其中上述屬性為一表面保護膜或一離型膜。 The method for inspecting an optical film as claimed in claim 8, wherein the property is a surface protection film or a release film. 一種檢測光學膜的裝置,包括: 至少一圖形處理器;以及至少一電腦儲存媒體,儲存電腦可讀取指令,其中上述圖形處理器使用上述電腦儲存媒體以執行:接收由一光學感測器拍攝一待檢測光學膜以三種角度放置於一平台上之待檢測影像;以及利用一辨識模型對上述待檢測影像進行檢測以判斷上述待檢測光學膜之屬性;其中在接收上述待檢測影像之前,上述圖形處理器更接收由上述光學感測器拍攝複數光學膜以上述三種角度放置於上述平台上之複數訓練影像,並訓練上述辨識模型分類上述訓練影像中的上述光學膜之屬性。 A device for detecting an optical film, comprising: At least one graphics processor; and at least one computer storage medium storing computer-readable instructions, wherein the above-mentioned graphics processor uses the above-mentioned computer storage medium to execute: receive images taken by an optical sensor and place an optical film to be inspected at three angles An image to be inspected on a platform; and a recognition model is used to detect the image to be inspected to determine the properties of the optical film to be inspected; wherein before receiving the image to be inspected, the graphics processor further receives the image from the optical sensor The tester shoots multiple training images of multiple optical films placed on the platform at the above three angles, and trains the recognition model to classify the properties of the optical films in the training images. 如請求項15所述之檢測光學膜的裝置,其中上述光學感測器係一彩色光學感測器,且至少包括一鏡頭,其中上述鏡頭安裝有一偏光鏡。 The device for inspecting optical films according to claim 15, wherein the optical sensor is a color optical sensor and includes at least one lens, wherein the lens is equipped with a polarizer. 如請求項15所述之檢測光學膜的裝置,其中上述平台更包括一背光,及/或用以旋轉上述待檢測光學膜之一旋轉機構。 The device for inspecting an optical film according to claim 15, wherein the platform further includes a backlight, and/or a rotating mechanism for rotating the optical film to be inspected. 如請求項15所述之檢測光學膜的裝置,其中上述屬性為一表面保護膜或一離型膜。 The device for inspecting an optical film as claimed in claim 15, wherein the property is a surface protection film or a release film.
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