TWI778703B - One-site oled panel demura and lirc method - Google Patents

Abstract

An one-site OLED panel demura and LIRC method includes the steps: (A) photograph brightness information of each sub-pixel of the OLED panel in multiple predetermined gray levels; (B) calculating demura compensation value of each gray scale, and selecting the demura compensation value of a specific gray scale for being stored; (C) subtracting the stored demura compensation value of the specific gray scale from the demura compensation value of each gray scale to calculate LIRC compensation parameter of each sub-pixel; (D) based on multiple LIRC regions of the OLED panel, combining the LIRC compensation parameters of each sub-pixel and each gray scale calculated in step (C) to obtain the LIRC compensation parameters of each region.

Description

One-stop OLED panel brightness correction and partial resistance potential drop compensation method of compensation

The present invention relates to the technical field of organic light emitting diode panels, and more particularly, to a one-stop method for brightness correction and partial resistance potential drop compensation of organic light emitting diode panels.

The organic light emitting diode (Organic Light Emitting Diode, OLED) panel has many variations among the sub-pixels in the process, resulting in the random unevenness of the panel brightness (Mura phenomenon), usually in the form of sand (Sandy Mura) and yield In order to solve this problem, it needs to be achieved through optical compensation, that is, brightness correction (Demura) is used to remove the uneven brightness of the panel. In addition, because the OLED panel is powered by the power chip, and the distance of the power traces is different, the voltage (ELVDD) supplied to each sub-pixel has different degrees of resistance potential drop (IR drop), resulting in the gradual unevenness of the in-plane brightness. Instead, local resistance potential drop compensation (Local IR drop compensation, LIRC) is required.

The aforementioned Demura needs to obtain the luminance information of all sub-pixel units when the OLED panel displays different gray-scale colors (R/G/B), and analyze the uneven brightness condition to obtain and store the corresponding information of each sub-pixel unit. Demura compensation value for each color of different grayscales. However, due to the huge amount of data of the aforementioned Demura compensation values, it is generally impossible to store the Demura compensation values of all gray scales, but only a specific one corresponding to each sub-pixel unit is stored. The Demura compensation value of each color of the gray scale, and the Demura compensation value of the other gray scales are obtained by calculation for brightness correction.

The aforementioned LIRC is used in the OLED production process, for each OLED panel, an optical instrument (such as CA-410) is used to measure the brightness of each position in the OLED panel, so as to establish a model of local resistance potential drop (local IR drop) and establish Compensation related parameters. For example, each OLED panel is divided into 2x3=6 areas, and optical instruments are used to measure 3 colors such as R64/ R128/ R192/ R255, G64/ G128/ G192/ G255, and B64/ B128/ B192/ B255 (R /G/B), 4 grayscales (64/128/192/255), the luminance information of 12 images in 6 (=2x3) areas of the OLED panel, that is, a total of 12x6=72 areas need to be measured Brightness information, and the brightness information of the 72 regions are stored to establish the LIRC model and establish the LIRC compensation parameters for local resistance potential drop compensation.

As panel manufacturers and mobile phone manufacturers have increasingly stringent requirements for OLED in-plane uniformity, the number of LIRC compensation zones has also increased, which may be divided into hundreds of zones. In order to obtain the brightness of all zones of all test colors Information, a total of thousands of locations may need to be measured, which is extremely time-consuming and has a serious impact on the panel production speed.

Furthermore, in the data path of the driving chip, LIRC is processed before Demura, so in the existing OLED production process, the operation process of LIRC and Demura is to perform LIRC first to measure the brightness of each partition of the test color required by LIRC, Calculate the compensation parameters of LIRC and perform LIRC compensation; and perform Demura compensation based on the fact that the unevenness of luminance progression in the OLED panel has been compensated.

Since the aforementioned Demura and LIRC need to be photographed with a CCD camera and measured with an optical instrument at the two process stations, it takes a long time and has a serious impact on the production speed of the panel.

Therefore, in the manufacturing process of the conventional display panel, there are still many defects and it is necessary to improve it.

The purpose of the present invention is mainly to provide a one-stop method for brightness correction and partial resistance potential drop compensation of an organic light emitting diode panel, which integrates local resistance potential drop compensation and brightness correction at the same site and can avoid production The cost of equipment and time is increased, and the problem of uneven brightness of the two types of organic light emitting diode panels can be effectively solved.

According to one feature of the present invention, a one-stop method for brightness correction and partial resistance potential drop compensation of an organic light emitting diode panel is proposed, which includes the steps: (A) for each color, photographing the organic light emitting diode panel in multiple The luminance information of each sub-pixel of a predetermined grayscale; (B) for each color, calculate the luminance correction compensation value of each grayscale, and select the luminance correction compensation value of a specific grayscale to store; (C) for each color For a color, subtract the stored brightness correction compensation value of the specific gray level from the brightness correction compensation value of each gray level to calculate the local resistance potential drop compensation parameter of each sub-pixel; and (D) for each color, according to the local resistance The potential drop compensation combines the local resistance potential drop compensation parameters of each sub-pixel and each gray scale calculated in step (C) for the multiple regions distinguished by the organic light emitting diode panel to obtain the local resistance of each region. Potential drop compensation parameters.

The above overview and the following detailed description are exemplary in nature, and are intended to further illustrate the scope of the present invention, and other objects and advantages of the present invention will be explained in the following descriptions and drawings.

S11~S14: Steps

20: Organic Light Emitting Diode Panel

21: Pixel unit

201: Sub-pixel unit

41: Area

FIG. 1 shows the flow of the method for brightness correction and partial resistance potential drop compensation of the one-stop organic light emitting diode panel of the present invention.

FIG. 2 schematically shows the structure of an organic light emitting diode panel.

FIG. 3 schematically shows luminance information of each sub-pixel unit of the organic light emitting diode panel in a plurality of predetermined grayscales.

FIG. 4 schematically shows local resistance potential drop compensation parameters for various regions of an organic light emitting diode panel.

In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the embodiments of the present invention, and are not used to limit the present invention.

FIG. 1 shows the flow of the method for brightness correction and partial resistance potential drop compensation of a one-stop organic light emitting diode (Organic Light Emitting Diode, OLED) panel of the present invention. In the method of the present invention, the local IR drop compensation (LIRC) and the luminance correction (Demura) are integrated and executed at the same site, that is, the steps (A) to (D) of FIG. 1 are: Executed at the same Demura site to obtain the Demura compensation value and the LIRC compensation parameter to perform luminance uneven compensation and LIRC compensation on the OLED panel, wherein, as shown in FIG. A pixel unit 21 includes sub-pixel units 201 of at least one color. In one embodiment and the following description of the present invention, each pixel unit 21 of the OLED panel 20 includes a red color The color (R) sub-pixel unit 201, a green (G) sub-pixel unit 201 and a blue (B) sub-pixel unit 201, that is, the color displayed by the pixel unit 21 of the OLED panel 20 is determined by R/G/ B is a combination of three colors. However, the present invention is not limited to the arrangement and combination of the sub-pixels. In other embodiments, the sub-pixel units in the above-mentioned pixel units may also be arranged and combined in different orders.

As shown in FIG. 1 , in step S11 , for each of the three colors of R/G/B, the luminance information of each sub-pixel unit 201 of the OLED panel 20 in a plurality of predetermined grayscales is captured by a CCD camera. Taking the display of 8-bit color depth as an example, the plurality of predetermined grayscales are, for example, 4 grayscales such as the 64th, the 128th, the 192nd, and the 255th. Therefore, as shown in FIG. 3, step S11 R64/ R128/ R192/ R255, G64/ G128/ G192/ G255, and B64/ B128/ B192/ B255, etc. 3 colors (R/G/B), 4 grayscales (64/ 128/192/255) brightness information of the sub-pixel unit 201 of 12 images in total.

Next, in step S12, for each of the three colors of R/G/B, according to the luminance information of each sub-pixel 201 of the OLED panel 20 in a plurality of predetermined grayscales photographed in step S11, and analyze the luminance unevenness thereof In the situation of , calculate the Demura compensation value of each gray level, and select the Demura compensation value of a specific gray level to store in the flash memory (Flash), and this specific gray level is the best level after luminance analysis; Taking the example shown in the aforementioned step S11 as an example, the Demura compensation value of each gray scale (64/128/192/255) is calculated according to the luminance information of the sub-pixel units 201 of the 12 images in FIG. 3 . Specifically, For each grayscale (64/128/192/255), the red (R) Demura compensation value (Demura_comR), the green (G) Demura compensation value (Demura_comG), and the blue The Demura compensation value (Demura_comB) of (B); and the Demura compensation value of a specific gray level (64) selected from the gray levels (64/128/192/255) is stored in the flash memory, and the specific gray level is stored in the flash memory. Demura compensation values include red (R) specific grayscale Demura compensation value (Demura_comR_sp_scale), green (G) specific grayscale Demura compensation value (Demura_comG_sp_scale), and blue (B) specific grayscale Demura compensation value (Demura_comB_sp_scale) . The relationship between the Demura compensation value obtained in step S12 and the displayed data value is: R'=R+Demura_comR; G'=G+Demura_comG; B'=B+Demura_comB; (Formula 1) where R/G/B is The original red/green/blue display data values to be displayed by the red/green/blue sub-pixel unit 201, Demura_comR/Demura_comG/Demura_comB are the stored or calculated red/green/blue Demura compensation values, R'/G '/B' is the red/green/blue display data value after Demura compensation.

Next, in step S13, for each of the three colors of R/G/B, the stored Demura compensation value of the specific grayscale is deducted from the Demura compensation value of each grayscale to calculate the LIRC compensation value of each sub-pixel. The offset value parameter, wherein the LIRC is used to divide the OLED panel 20 into a plurality of regions, and measure the luminance information of each region of the OLED panel 20 in a plurality of predetermined grayscales for each color. Step S13 is to calculate the LIRC compensation parameter of each sub-pixel 201 by using the luminance information of each sub-pixel 201 of the OLED panel 20 in a plurality of predetermined grayscales captured in step S11 and the Demura compensation value of each grayscale calculated in step S12 .

In fact, the relationship between the compensation of the uneven brightness of the OLED panel 20 and the display data value by Demura and LIRC is: R'=R+LIRC_offsetR+Demura_comR_sp_scale; G'=G+LIRC_offsetG+Demura_comG_sp_scale; B'=B+LIRC_offsetB+Demura_comB_sp_scale; (Formula 2) where R/G/B is the original red/green/blue to be displayed by the red/green/blue sub-pixel unit 201 Display data values, LIRC_offsetR/ LIRC_offsetG/ LIRC_offsetB are red/green/blue LIRC compensation parameters, Demura_comR_sp_scale/ Demura_comG_sp_scale/ Demura_comB_sp_scale are red/green/blue specific grayscale Demura compensation values, R'/G'/B' is Red/green/blue display data values after LIRC compensation.比較式1與式2，可以得到：Demura_comR=LIRC_offsetR+Demura_comR_sp_scale; Demura_comG=LIRC_offsetG+Demura_comG_sp_scale; Demura_comB=LIRC_offsetB+Demura_comB_sp_scale;亦即：LIRC_offsetR=Demura_comR-Demura_comR_sp_scale; LIRC_offsetG=Demura_comG-Demura_comG_sp_scale; LIRC_offsetB=Demura_comB-Demura_comB_sp_scale;因此It can be obtained that the LIRC compensation parameter of each sub-pixel 201 is equal to the Demura compensation value of each gray level minus the stored Demura compensation value of a specific gray level. For example, assuming that Demura stores the 64th order Demura compensation value, the LIRC compensation parameters of the 128th order of each sub-pixel of the OLED panel 20 can be obtained: LIRC_offsetR[128]=Demura_comR[128]-Demura_comR[64]; LIRC_offsetG[128 ]=Demura_comG[128]-Demura_comR[64]; LIRC_offsetB[128]=Demura_comB[128]-Demura_comR[64]; Among them, LIRC_offsetR[128]/ LIRC_offsetG[128]/ LIRC_offsetB[128] are the 128th order LIRC compensation parameters of red/green/blue, Demura_comR[128]/ Demura_comG[128]/ Demura_comB[128] are red/green / Demura compensation value of the 128th order of blue, Demura_comR[64]/Demura_comG[64]/Demura_comB[64] is the Demura compensation value of the 64th order of red/green/blue.

Therefore, the R64/ R128/ R192/ R255, G64/ G128/ G192/ G255, B64/ B128/ B192/ B255 full-sub-pixel luminance information obtained by the CCD camera at the Demura site in step S11 is the compensation that the LIRC needs to store. The parameters correspond to a plurality of predetermined grayscales (64/128/192/255), and the required LIRC compensation value of each sub-pixel can be obtained by one-stop LIRC and Demura.

Finally, in step S14 , for each of the three colors of R/G/B, according to the LIRC of multiple regions of the OLED panel 20 , each sub-pixel calculated in step S13 is assigned to the LIRC of each gray scale. The compensation parameters are merged to obtain the LIRC compensation parameters of each area, as shown in FIG. 4 , since step S13 is to obtain the LIRC compensation parameters for each sub-pixel 201 of each color, and the LIRC needs to store many OLED panel 20 . Therefore, the LIRC compensation parameters of the sub-pixels 201 belonging to the same region 41 at each gray level are averaged to obtain the LIRC compensation parameters of the multiple regions 41 of the OLED panel 20 .

It can be seen from the above description that the present invention obtains the luminance information of all sub-pixels on the entire surface by taking pictures of the Demura site, which can be used to calculate the luminance information of the corresponding LIRC partitions, and has sufficient flexibility to be applicable to different numbers of LIRC partitions. There is no need to re-measure. Therefore, unlike the prior art, the present invention does not require dual stations to deal with the uneven brightness of the two types of OLED panels, and can avoid the increase in production equipment and time costs.

The above-mentioned embodiments are only examples for the convenience of description, and the present invention claims The scope of rights should be subject to the scope of the patent application, rather than being limited to the above-mentioned embodiments.

S11~S14: Steps

Claims (9)

A method for brightness correction and partial resistance potential drop compensation of a one-stop organic light emitting diode panel, the organic light emitting diode panel has a plurality of pixel units, each pixel unit includes at least one color sub-pixel unit, the method Including steps: (A) for each color, photographing luminance information of each sub-pixel of the organic light emitting diode panel in a plurality of predetermined grayscales; (B) for each color, according to the luminance information obtained in step (A), Calculate the brightness correction compensation value of each gray level, and select the brightness correction compensation value of a specific gray level to store; (C) for each color, deduct the stored brightness correction compensation value of the specific gray level from the brightness correction compensation value of each gray level. and (D) for each color, compensating a plurality of regions of the organic light emitting diode panel according to the local resistance potential drop compensation, and applying the steps (C) The calculated local resistance potential drop compensation parameters of each sub-pixel at each gray level are fused to obtain the local resistance potential drop compensation parameters of each region. The one-stop OLED panel brightness correction and local resistance potential drop compensation method as claimed in claim 1, wherein, in step (A), a CCD camera is used to photograph the OLED panel on multiple luminance information of each sub-pixel of a predetermined grayscale. The one-stop OLED panel brightness correction and partial resistance potential drop compensation method as claimed in claim 1, wherein each pixel unit includes a red sub-pixel unit, a green sub-pixel unit and a blue sub-pixel unit sub-pixel unit. The one-stop OLED panel brightness correction and partial resistance potential drop compensation method as claimed in claim 3, wherein step (B) is to calculate the value of each grayscale The red brightness correction compensation value, the green brightness correction compensation value, and the blue brightness correction compensation value, and the relationship between the brightness correction compensation value and the display data value is: R'=R+Demura_comR; G'=G+ Demura_comG; B'=B+Demura_comB; Among them, R/G/B is the original red/green/blue display data value to be displayed by the red/green/blue sub-pixel unit, Demura_comR/ Demura_comG/ Demura_comB is red/green/ The blue brightness correction compensation value, R'/G'/B' is the red/green/blue display data value after the brightness correction compensation. The one-stop OLED panel brightness correction and local resistance potential drop compensation method as claimed in claim 4, wherein the local resistance potential drop compensation parameter of each sub-pixel is obtained according to the following relationship: LIRC_offsetR =Demura_comR-Demura_comR_sp_scale; LIRC_offsetG=Demura_comG-Demura_comG_sp_scale; LIRC_offsetB=Demura_comB-Demura_comB_sp_scale; Among them, LIRC_offsetR/ LIRC_offsetG/ LIRC_offsetB is the red/green/blue local resistance potential drop compensation parameter, Demura_comR_sp_m/ Demura_comB_comG Color-specific grayscale brightness correction compensation value. The one-stop OLED panel brightness correction and local resistance potential drop compensation method as claimed in claim 4, wherein, in step (D), sub-pixels belonging to the same region are assigned to each gray level The local resistance potential drop compensation parameters are averaged to obtain local resistance potential drop compensation parameters for multiple regions of the organic light emitting diode surface. The one-stop OLED panel brightness correction and local resistance potential drop compensation method as claimed in claim 1, wherein steps (A) to (D) are performed at a brightness correction site. The one-stop OLED panel brightness correction and local resistance potential drop compensation method as claimed in claim 1, wherein, in step (B), the selected specific grayscale is optimized through brightness analysis the first order. The one-stop method for brightness correction and partial resistance potential drop compensation of an organic light emitting diode panel as claimed in claim 1, wherein, in step (B), the brightness correction compensation value of the specific grayscale is stored to a flash memory.

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