TWI778588B - Inspection connector and inspection unit - Google Patents
Inspection connector and inspection unit Download PDFInfo
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- 229910000679 solder Inorganic materials 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
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Abstract
本發明在於提供一種於測定對象之複數個端子包含信號端子及接地端子之情形時,亦可正確地測定高頻信號之檢查用連接器及檢查用單元。 檢查用連接器具備:第1插口;第1套筒,其包圍第1插口之周圍;第2插口;第2套筒,其包圍第2插口之周圍,且配置於第1套筒之右側;電纜轉接器,其以電性連接於第1套筒及第2套筒之狀態支持第1套筒及第2套筒;第1信號針及第2信號針,其電性連接於第1插口及第2插口,且自第1插口及第2插口朝下方向延伸;第1接地針,其電性連接於電纜轉接器,且於第1信號針之右側且第2信號針之左側沿上下方向延伸。The present invention is to provide an inspection connector and an inspection unit that can accurately measure high-frequency signals even when a plurality of terminals to be measured include a signal terminal and a ground terminal. The connector for inspection includes: a first socket; a first sleeve that surrounds the first socket; a second socket; a second socket that surrounds the second socket and is disposed on the right side of the first socket; A cable adapter, which supports the first sleeve and the second sleeve in the state of being electrically connected to the first sleeve and the second sleeve; the first signal pin and the second signal pin are electrically connected to the first sleeve The socket and the second socket extend downward from the first socket and the second socket; the first ground pin, which is electrically connected to the cable adapter, is on the right side of the first signal pin and the left side of the second signal pin Extend up and down.
Description
本發明係關於一種用於高頻信號之測定之檢查用連接器及檢查用單元。The present invention relates to an inspection connector and an inspection unit for measuring high-frequency signals.
作為先前之檢查用連接器相關之發明,已知有例如專利文獻1所記載之探針。專利文獻1所記載之探針可同時對測定對象之複數個端子之信號進行測定。具體而言,專利文獻1所記載之探針具備複數個中心導體。複數個中心導體分別與測定對象之端子接觸。測定對象之複數個端子為信號端子。
[先前技術文獻]
[專利文獻]As an invention related to a conventional inspection connector, for example, the probe described in
[專利文獻1]日本專利第6380549號公報[Patent Document 1] Japanese Patent No. 6380549
[發明所欲解決之問題][Problems to be Solved by Invention]
然而,於專利文獻1所記載之探針中,測定對象之複數個端子為信號端子。另一方面,有測定對象之複數個端子包含信號端子及接地端子之情形。於此種情形時,亦謀求探針可正確地測定信號。However, in the probe described in
因此,本發明之目的在於提供一種於測定對象之複數個端子包含信號端子及接地端子之情形,亦可正確地測定高頻信號之檢查用連接器及檢查用單元。 [解決問題之技術手段]Therefore, an object of the present invention is to provide an inspection connector and an inspection unit that can accurately measure high-frequency signals even when a plurality of terminals to be measured include a signal terminal and a ground terminal. [Technical means to solve problems]
本發明之一形態之檢查用連接器係連接於第1同軸電纜之端部、及第2同軸電纜之端部者,上述第1同軸電纜具備第1中心導體、包圍上述第1中心導體之周圍之第1外部導體、及將上述第1中心導體與上述第1外部導體絕緣之第1絕緣體;上述第2同軸電纜具備第2中心導體、包圍上述第2中心導體之周圍之第2外部導體、及將上述第2中心導體與上述第2外部導體絕緣之第2絕緣體;且上述檢查用連接器具備: 第1插口,其電性連接於上述第1中心導體; 第1套筒,其電性連接於上述第1外部導體且朝下方向觀察時包圍上述第1插口之周圍; 第2插口,其電性連接於上述第2中心導體; 第2套筒,其為電性連接於上述第2外部導體且朝下方向觀察時包圍上述第2插口之周圍者,且配置於上述第1套筒之右側; 電纜轉接器,其以電性連接於上述第1套筒及上述第2套筒之狀態支持上述第1套筒及上述第2套筒; 第1信號針,其電性連接於上述第1插口,且自上述第1插口朝下方向延伸; 第2信號針,其電性連接於上述第2插口,且自上述第2插口朝下方向延伸;及 第1接地針,其電性連接於上述電纜轉接器,且於上述第1信號針之右側且上述第2信號針之左側沿上下方向延伸。An inspection connector according to one aspect of the present invention is connected to an end of a first coaxial cable and an end of a second coaxial cable, wherein the first coaxial cable includes a first center conductor and surrounds the first center conductor. the first outer conductor, and a first insulator insulating the first center conductor from the first outer conductor; the second coaxial cable includes a second center conductor, a second outer conductor surrounding the second center conductor, and a second insulator insulating the second central conductor and the second outer conductor; and the inspection connector is provided with: a first socket, which is electrically connected to the first center conductor; a first sleeve, which is electrically connected to the first outer conductor and surrounds the circumference of the first socket when viewed downward; a second socket, which is electrically connected to the above-mentioned second center conductor; a second sleeve, which is electrically connected to the second outer conductor, surrounds the periphery of the second socket when viewed downward, and is disposed on the right side of the first sleeve; a cable adapter, which supports the first sleeve and the second sleeve in a state of being electrically connected to the first sleeve and the second sleeve; a first signal pin, which is electrically connected to the first socket and extends downward from the first socket; a second signal pin electrically connected to the second socket and extending downward from the second socket; and The first ground pin is electrically connected to the cable adapter, and extends in the up-down direction on the right side of the first signal pin and the left side of the second signal pin.
以下,對本說明書中用語之定義進行說明。於本說明書中,沿前後方向延伸之軸或構件未必為僅表示與前後方向平行之軸或構件者。沿前後方向延伸之軸或構件意指相對於前後方向於±45°之範圍內傾斜之軸或構件。同樣,沿上下方向延伸之軸或構件意指相對於上下方向於±45°之範圍內傾斜之軸或構件。沿左右方向延伸之軸或構件意指相對於左右方向於±45°之範圍內傾斜之軸或構件。Hereinafter, definitions of terms used in this specification will be described. In this specification, the shaft or member extending in the front-rear direction does not necessarily mean only the shaft or member parallel to the front-rear direction. A shaft or member extending in the front-rear direction means a shaft or member inclined within a range of ±45° with respect to the front-rear direction. Likewise, the shaft or member extending in the up-down direction means the shaft or member inclined within a range of ±45° with respect to the up-down direction. The shaft or member extending in the left-right direction means a shaft or member inclined within a range of ±45° with respect to the left-right direction.
以下,定義本說明書中構件之位置關係。第1構件至第3構件為檢查用單元之構成。於本說明書中,沿前後方向排列之第1構件及第2構件表示以下狀態。於沿垂直於前後方向之方向觀察第1構件及第2構件時,為第1構件及第2構件之兩者配置於顯示前後方向之任意直線上之狀態。於本說明書中,於沿上下方向觀察時,沿前後方向排列之第1構件及第2構件表示以下狀態。於沿上下方向觀察第1構件及第2構件時,第1構件及第2構件之兩者配置於顯示前後方向之任意直線上。此時,若自與上下方向不同之左右方向觀察第1構件及第2構件,則第1構件及第2構件之任一者亦可不配置於顯示前後方向之任意直線上。另,亦可使第1構件與第2構件接觸。亦可使第1構件與第2構件分離。亦可於第1構件與第2構件之間存在第3構件。該定義亦適用於前後方向以外之方向。Hereinafter, the positional relationship of the members in this specification is defined. The first member to the third member constitute a unit for inspection. In this specification, the 1st member and the 2nd member arranged in the front-back direction show the following states. When the first member and the second member are viewed in the direction perpendicular to the front-rear direction, it is a state in which both the first member and the second member are arranged on an arbitrary straight line showing the front-rear direction. In this specification, the first member and the second member arranged in the front-rear direction when viewed in the vertical direction represent the following states. When the first member and the second member are viewed in the up-down direction, both the first member and the second member are arranged on an arbitrary straight line showing the front-rear direction. At this time, when the first member and the second member are viewed from the left-right direction different from the vertical direction, either the first member or the second member may not be arranged on any straight line showing the front-rear direction. In addition, the first member and the second member may be brought into contact with each other. The first member and the second member may be separated. A third member may be present between the first member and the second member. This definition also applies to directions other than the front-to-rear direction.
於本說明書中,第1構件配置於第2構件之前方意指以下狀態。第1構件之至少一部分配置於第2構件朝前方向平行移動時通過之區域內。藉此,第1構件可收納於第2構件朝前方向平行移動時通過之區域內,亦可自第2構件朝前方向平行移動時通過之區域突出。此時,第1構件及第2構件沿前後方向排列。該定義亦適用於前後方向以外之方向。In this specification, a 1st member is arrange|positioned before a 2nd member, and means the following state. At least a part of the 1st member is arrange|positioned in the area|region which the 2nd member passes when moving in parallel in the forward direction. Thereby, the 1st member can be accommodated in the area|region which the 2nd member passes through when the parallel movement of the front direction is carried out, and can also protrude from the area|region which the 2nd member passes through when it moves parallelly in the front direction. At this time, the first member and the second member are arranged in the front-rear direction. This definition also applies to directions other than the front-to-rear direction.
於本說明書中,沿左右方向觀察時,第1構件配置於第2構件之前方意指以下狀態。沿左右方向觀察時,第1構件與第2構件沿前後方向排列,且沿左右方向觀察時,第1構件之與第2構件對向之部分配置於第2構件之前方。於該定義中,第1構件與第2構件於三維中,亦可不沿前後方向排列。該定義亦適用於前後方向以外之方向。In this specification, when a 1st member is arrange|positioned in front of a 2nd member, when it sees in the left-right direction, it means the following state. When viewed in the left-right direction, the first member and the second member are arranged in the front-rear direction, and when viewed in the left-right direction, the portion of the first member facing the second member is disposed in front of the second member. In this definition, the first member and the second member may not be arranged in the front-rear direction in three dimensions. This definition also applies to directions other than the front-to-rear direction.
於本說明書中,第1構件配置於較第2構件更前方意指以下狀態。In this specification, the arrangement|positioning of a 1st member ahead of a 2nd member means the following state.
第1構件配置於通過第2構件之前端且與前後方向正交之平面之前方。此時,第1構件及第2構件可沿前後方向排列,亦可不沿前後方向排列。該定義亦適用於前後方向以外之方向。The 1st member is arrange|positioned before the plane which passes the front-end|tip of the 2nd member and is orthogonal to the front-back direction. At this time, the first member and the second member may be arranged in the front-rear direction, or may not be arranged in the front-rear direction. This definition also applies to directions other than the front-to-rear direction.
於本說明書中,於無特別說明之情形,第1構件之各部如以下定義。第1構件之前部意指第1構件之前半部分。第1構件之後部意指第1構件之後半部分。第1構件之左部意指第1構件之左半部分。第1構件之右部意指第1構件之右半部分。第1構件之上部意指第1構件之上半部分。第1構件之下部意指第1構件之下半部分。第1構件之前端意指第1構件之前方向之端。第1構件之後端意指第1構件之後方向之端。第1構件之左端意指第1構件之左方向之端。第1構件之右端意指第1構件之右方向之端。第1構件之上端意指第1構件之上方向之端。第1構件之下端意指第1構件之下方向之端。第1構件之前端部意指第1構件之前端及其附近。第1構件之後端部意指第1構件之後端及其附近。第1構件之左端部意指第1構件之左端及其附近。第1構件之右端部意指第1構件之右端及其附近。第1構件之上端部意指第1構件之上端及其附近。第1構件之下端部意指第1構件之下端及其附近。In this specification, unless otherwise specified, each part of the first member is defined as follows. The front part of the first member means the front half of the first member. The rear part of the first member means the rear half of the first member. The left part of the first member means the left half of the first member. The right portion of the first member means the right half of the first member. The upper part of the first member means the upper half of the first member. The lower part of the first member means the lower half of the first member. The front end of the first member means the end in the front direction of the first member. The rear end of the first member means the end in the rear direction of the first member. The left end of the first member means the left end of the first member. The right end of the first member means the end in the right direction of the first member. The upper end of the first member means the end in the upper direction of the first member. The lower end of the first member means the end in the downward direction of the first member. The front end portion of the first member means the front end of the first member and its vicinity. The rear end portion of the first member means the rear end of the first member and its vicinity. The left end of the first member means the left end of the first member and its vicinity. The right end of the first member means the right end of the first member and its vicinity. The upper end portion of the first member means the upper end of the first member and its vicinity. The lower end of the first member means the lower end of the first member and its vicinity.
於將本說明書中任意2個構件定義為第1構件及第2構件之情形,任意2個構件之關係為如以下之語義。於本說明書中,第1構件受第2構件支持意指包含第1構件相對於第2構件無法移動地安裝於第2構件(即,固定)之情形、及第1構件相對於第2構件可移動地安裝於第2構件之情形。又,第1構件受第2構件支持意指包含第1構件直接安裝於第2構件之情形、及第1構件經由第3構件安裝於第2構件之情形之兩者。When defining arbitrary two members as a 1st member and a 2nd member in this specification, the relationship of the arbitrary two members is as the following semantics. In this specification, the fact that the first member is supported by the second member means that the first member is immovably mounted on the second member (that is, fixed) relative to the second member, and the first member is movable relative to the second member. When it is movably attached to the second member. In addition, the fact that the first member is supported by the second member means including both the case where the first member is directly attached to the second member and the case where the first member is attached to the second member via the third member.
於本說明書中,第1構件受第2構件保持意指包含第1構件相對於第2構件無法移動地安裝於第2構件(即,固定)之情形,不包含第1構件相對於第2構件可移動地安裝於第2構件之情形。又,第1構件受第2構件保持意指包含第1構件直接安裝於第2構件之情形、及第1構件經由第3構件安裝於第2構件之情形之兩者。In this specification, the first member is held by the second member means including the case where the first member is immovably mounted on the second member (ie, fixed) relative to the second member, and does not include the first member relative to the second member When it is movably attached to the second member. In addition, a 1st member is hold|maintained by a 2nd member means the case where a 1st member is directly attached to a 2nd member, and the case where a 1st member is attached to a 2nd member via a 3rd member is included.
於本說明書中,「第1構件與第2構件電性連接」意指於第1構件與第2構件之間電性導通。因此,第1構件與第2構件可接觸,第1構件與第2構件亦可不接觸。於第1構件與第2構件未接觸之情形,於第1構件與第2構件之間配置有具有導電性之第3構件。 [發明之效果]In this specification, "the 1st member and the 2nd member are electrically connected" means the electrical conduction between the 1st member and the 2nd member. Therefore, the first member and the second member may be in contact with each other, and the first member and the second member may not be in contact with each other. When the first member and the second member are not in contact with each other, a third member having conductivity is arranged between the first member and the second member. [Effect of invention]
根據本發明之檢查用連接器,於測定對象之複數個端子包含信號端子及接地端子之情形,亦可正確地測定高頻信號。According to the inspection connector of the present invention, even when the plurality of terminals to be measured include the signal terminal and the ground terminal, it is possible to accurately measure high-frequency signals.
(實施形態)
[檢查用單元之構造]
以下,一面參照圖式一面對本發明之實施形態之檢查用單元10之構造進行說明。圖1係檢查用單元10之剖視圖。於圖1中顯示有與前後方向正交之剖面中之檢查用單元10之構造。圖2係檢查用連接器100之剖視圖。圖3係檢查用連接器100之分解立體圖。圖4係檢查用連接器100之放大剖視圖。圖5(A)係襯套124、126及接地針支持構件132之外觀立體圖。圖5(B)係朝上方向觀察接地針支持構件132時之圖。圖6係電纜轉接器105之仰視圖。(Embodiment)
[Construction of inspection unit]
Hereinafter, the structure of the
如圖1至圖4所示,定義上下方向、左右方向及前後方向。其中,上下方向、左右方向及前後方向為用以說明而定義之方向。因此,檢查用單元10之實際使用時之上下方向、左右方向及前後方向可不與圖1至圖4之上下方向、左右方向及前後方向一致。又,上下方向亦可與圖1至圖4之上下方向相反。左右方向亦可與圖1至圖4之左右方向相反。前後方向亦可與圖1至圖4之前後方向相反。As shown in FIGS. 1 to 4 , the up-down direction, the left-right direction, and the front-rear direction are defined. Among them, the up-down direction, the left-right direction, and the front-rear direction are directions defined for illustration. Therefore, the up-down direction, the left-right direction, and the front-rear direction of the
檢查用單元10用於測定於電子機器內傳送之高頻信號。檢查用單元10如圖1所示,具備檢查用連接器100、外部連接用連接器200a~200h及同軸電纜202a~202h。外部連接用連接器200a~200h連接於未圖示之測定機器。外部連接用連接器200a~200h之構造為一般構造,因而省略說明。The
同軸電纜202a(第1同軸電纜)將檢查用連接器100與外部連接用連接器200a電性連接。同軸電纜202b(第2同軸電纜)將檢查用連接器100與外部連接用連接器200b電性連接。同軸電纜202c(第3同軸電纜)將檢查用連接器100與外部連接用連接器200c電性連接。同軸電纜202d~202h分別將檢查用連接器100與外部連接用連接器200d~200h電性連接。同軸電纜202a~202d自左向右依序排列為一行。同軸電纜202e~202h自左向右依序排列為一行。同軸電纜202e~202h配置於同軸電纜202a~202d之前方。同軸電纜202a~202h具有相同構造。列舉同軸電纜202a之構造為例進行說明。The
同軸電纜202a如圖4所示,具備中心導體204a(第1中心導體)、外部導體206a(第1外部導體)、絕緣體208a(第1絕緣體)及被膜210a。中心導體204a為同軸電纜202a之芯線。因此,中心導體204a位於同軸電纜202a之中心。中心導體204a藉由低電阻導體製作。中心導體204a例如藉由銅製作。As shown in FIG. 4 , the
外部導體206a包圍中心導體204a之周圍。因此,外部導體206a於與同軸電纜202a延伸之方向正交之剖面中,具有圓環形狀。此種外部導體206a例如藉由編排較細之導線而製作。外部導體206a藉由低電阻導體製作。外部導體206a例如藉由銅而製作。The
絕緣體208a將中心導體204a與外部導體206a絕緣。絕緣體208a位於中心導體204a與外部導體206a之間。絕緣體208a包圍中心導體204a之周圍。絕緣體208a之周圍藉由外部導體206a包圍。絕緣體208a於與同軸電纜202a延伸之方向正交之剖面中,具有圓環形狀。絕緣體208a藉由具有絕緣性之樹脂而製作。絕緣體208a例如藉由聚乙烯而製作。又,以同軸電纜202a可柔軟變化之方式,於絕緣體208a設置有複數個孔。The
被膜210a包圍外部導體206a之周圍。因此,被膜210a於與同軸電纜202a延伸之方向正交之剖面中,具有圓環形狀。被膜210a藉由具有絕緣性之樹脂製作。被膜210a例如藉由聚乙烯製作。惟,於被膜210a未設置複數個孔,或設置有較絕緣體208a為少之孔。因此,被膜210a較絕緣體208a更不易變形。因此,被膜210a之楊氏模量大於絕緣體208a之楊氏模量。The
於同軸電纜202a之下端部,藉由去除外部導體206a、絕緣體208a及被膜210a,而自同軸電纜202a露出中心導體204a。又,藉由於較露出中心導體204a之部分更上方處去除被膜210a,而自同軸電纜202a露出外部導體206a。另,雖省略詳細說明,但同軸電纜202b具備中心導體204b(第2中心導體)、外部導體206b(第2外部導體)、絕緣體208b(第2絕緣體)及被膜210b。同軸電纜202c具備中心導體204c(第3中心導體)、外部導體206c(第3外部導體)、絕緣體208c(第3絕緣體)及被膜210c。At the lower end of the
檢查用連接器100連接於同軸電纜202a~202h之端部。於本實施形態中,檢查用連接器100連接於同軸電纜202a~202h之下端部。檢查用連接器100如圖2及圖3所示,具備柱塞102、環103、殼體104、電纜轉接器105、凸緣106、彈簧108、隔片109、信號針120a~120h、套筒122a~122h(參照圖4)、插口123a~123h(參照圖4)、襯套124、126、130a~130h(參照圖4)、接地針支持構件132及接地針220a~220h(參照圖4)。惟,對於信號針120e~120h、套筒122e~122h、插口123e~123h、襯套130e~130h及接地針220e~220h未進行圖示。The
插口123a~123h(插口123a為第1插口,插口123b為第2插口,插口123c為第3插口)分別電性連接於中心導體204a~204h。惟,插口123a~123h未分別電性連接於外部導體206a~206h。The
插口123a~123d自左向右依序排列為一行。由此,插口123d配置於插口123c之右側。插口123c配置於插口123b之右側。插口123b配置於插口123a之右側。插口123e~123h自左向右依序排列為一行。插口123e~123h配置於插口123a~123d之前方。插口123a~123h具有相同構造,因而以下針對插口123a進行說明。對於插口123b~123h則省略說明。The
插口123a如圖4所示,安裝於同軸電纜202a之下端部。藉此,插口123a電性連接於中心導體204a。惟,插口123a未電性連接於外部導體206a。更詳細而言,插口123a具有圓筒形狀,該圓筒形狀具有沿上下方向延伸之中心軸線。插口123a之上端部開口。插口123a之下端部未開口。惟,插口123a之下端部亦可開口。中心導體204a於同軸電纜202a之下端部露出。中心導體204a自插口123a之上端部之開口插入至插口123a之內部。中心導體204a藉由焊料而固定於插口123a。藉此,中心導體204a電性連接於插口123a。其中,插口123a未與外部導體206a接觸。藉此,插口123a未電性連接於外部導體206a。具有如以上之構造之插口123a例如藉由黃銅而製作。As shown in FIG. 4, the
套筒122a~122h(套筒122a為第1套筒,套筒122b為第2套筒,套筒122c為第3套筒)分別電性連接於外部導體206a~206h。其中,套筒122a~122h未分別電性連接於中心導體204a~204h。套筒122a~122h於朝下方向觀察時分別包圍插口123a~123h之周圍。The
套筒122a~122d自左向右依序排列為一行。藉此,套筒122d配置於套筒122c之右側。套筒122c配置於套筒122b之右側。套筒122b配置於套筒122a之右側。套筒122e~122h自左向右依序排列為一行。套筒122e~122h配置於套筒122a~122d之前方。套筒122a~122h具有相同構造,因而以下對套筒122a進行說明。對於套筒122b~122h,省略說明。The
插口122a如圖4所示,安裝於同軸電纜202a之下端部。藉此,套筒122a電性連接於外部導體206a。其中,套筒122a未電性連接於中心導體204a。更詳細而言,套筒122a具有圓筒形狀,該圓筒形狀具有沿上下方向延伸之中心軸線。套筒122a之中心軸線與插口123a之中心軸線一致。又,插口123a收納於套筒122a之內部。藉此,套筒122a於朝下方向觀察時包圍插口123a之周圍。插口123a之上端部開口。插口123a之下端部開口。於同軸電纜202a之下端部,外部導體206a露出。外部導體206a自套筒122a之上端部之開口插入至套筒122a之內部。外部導體206a藉由焊料而固定於套筒122a。藉此,外部導體206a電性連接於套筒122a。具有如以上之構造之套筒122a例如藉由黃銅而製作。As shown in FIG. 4, the
襯套130a~130h分別將套筒122a~122h與插口123a~123h絕緣。襯套130a~130d自左向右依序排列為一行。藉此,襯套130d配置於襯套130c之右側。襯套130c配置於襯套130b之右側。襯套130b配置於襯套130a之右側。襯套130e~130h自左向右依序排列為一行。襯套130e~130h配置於襯套130a~130d之前方。襯套130a~130h具有相同構造,因而以下對襯套130a進行說明。對於襯套130b~130h,省略說明。The
襯套130a如圖4所示,安裝於套筒122a之下端部及插口123a之下端部。更詳細而言,襯套130a具有圓筒形狀,該圓筒形狀具有沿上下方向延伸之中心軸線。襯套130a之中心軸線與套筒122a之中心軸線及插口123a之中心軸線一致。插口123a之下端部插入至襯套130a之內部。襯套130a配置於套筒122a之內部之下端部。襯套130a藉由具有絕緣性之樹脂而製作。襯套130a例如藉由環氧樹脂而製作。藉此,套筒122a與插口123a絕緣。As shown in FIG. 4 , the
電纜轉接器105如圖4所示,以與套筒122a~122h電性連接之狀態支持套筒122a~122h。更詳細而言,電纜轉接器105如圖5所示,具有圓柱形狀與長方體形狀組合之形狀。電纜轉接器105之上部具有圓柱形狀,該圓柱形狀具有沿上下方向延伸之中心軸線。電纜轉接器105之下部具有長方體形狀。於電纜轉接器105設置有8個貫通孔。8個貫通孔沿上下方向貫通電纜轉接器105。套筒122a~122h插入至8個貫通孔。藉此,電纜轉接器105保持套筒122a~122h。又,套筒122a~122h之外周面分別與8個貫通孔之內周面接觸。藉此,電纜轉接器105與套筒122a~122h電性連接。電纜轉接器105與接地電位連接。電纜轉接器105藉由導電性高之金屬而製作。電纜轉接器105例如藉由SUS(Stainless Steel:不鏽鋼)而製作。As shown in FIG. 4, the
信號針120a~120h(信號針120a為第1信號針,信號針120b為第2信號針,信號針120c為第3信號針)分別如圖4所示,電性連接於插口123a~123h。其中,信號針120e~120h未顯示於圖4。信號針120a~120h分別自插口123a~123h朝下方向延伸。The signal pins 120a-120h (the
信號針120a~120d如圖2所示,自左向右依序排列為一行。藉此,信號針120d配置於信號針120c之右側。信號針120c配置於信號針120b之右側。信號針120b配置於信號針120a之右側。信號針120e~120h自左向右依序排列為一行。信號針120e~120h配置於信號針120a~120d之前方。信號針120a~120h具有相同構造,因而以下對信號針120a進行說明。對於信號針120b~120h,省略說明。As shown in FIG. 2, the
信號針120a為被施加具有相對較高頻率之高頻信號之端子。具有相對較高頻率之高頻信號為例如具有0.3 GHz~0.3 THz之頻率之毫米波信號或微波信號。信號針120a如圖4所示,為沿上下方向延伸之棒狀構件。信號針120a之上端與插口123a之下端接觸。藉此,信號針120a電性連接於插口123a。The
信號針120a如圖2所示,包含筒部1202a、下針1204a、上針1206a及彈簧1208a。筒部1202a具有圓筒形狀,該圓筒形狀具有沿上下方向延伸之中心軸線。筒部1202a之形狀亦可為六角柱等多角柱形狀。其中,筒部1202a之上端部及下端部之直徑亦可較筒部1202a之剩餘部分之直徑更小。即,筒部1202a具有筒部1202a之上端部及下端部略微收窄之形狀。As shown in FIG. 2 , the
下針1204a為沿上下方向延伸之棒狀構件。下針1204a之上部位於筒部1202a之內部。下針1204a之下部位於筒部1202a之外。其中,下針1204a之上部之直徑大於下針1204a之剩餘部分之直徑。藉此,下針1204a無法朝下方向通過筒部1202a。The
上針1206a為沿上下方向延伸之棒狀構件。上針1206a之下部位於筒部1202a之內部。上針1206a之上部位於筒部1202a之外。其中,上針1206a之下部之直徑大於上針1206a之剩餘部分之直徑。藉此,上針1206a無法朝上方向通過筒部1202a。又,上針1206a之上端與插口123a之下端接觸。The
彈簧1208a配置於筒部1202a之內部。彈簧1208a之下端與下針1204a之上端接觸。彈簧1208a之上端與上針1206a之下端接觸。藉此,彈簧1208a朝下方向推壓下針1204a,且朝上方向推壓上針1206a。具有以上構造之信號針120a可沿上下方向伸縮。The
如以上之信號針120a例如藉由黃銅而製作。信號針120a如後述,以與柱塞102絕緣之狀態受柱塞102支持。The signal pins 120a as above are made of brass, for example. The
接地針220a~220h(接地針220a為第1接地針,接地針220b為第2接地針)分別如圖4及圖6所示,電性連接於電纜轉接器105。其中,接地針220e~220h未圖示。接地針220a~220h分別自電纜轉接器105朝下方向延伸。更詳細而言,接地針220a~220h為連接於接地電位之端子。接地針220a~220h為沿上下方向延伸之棒狀構件。接地針220a~220h之上端與電纜轉接器105接觸。於本實施形態中,接地針220a~220h之上端與電纜轉接器105之下表面接觸。藉此,接地針220a電性連接於電纜轉接器105。The ground pins 220a to 220h (the
接地針220a~220d如圖2所示,自左向右依序排列為一行。更正確而言,信號針120a~120d及接地針220a~220d自左向右交替排列為一行。藉此,接地針220a於信號針120a之右側且信號針120b之左側,沿上下方向延伸。接地針220b於信號針120b之右側且信號針120c之左側,沿上下方向延伸。接地針220c於信號針120c之右側且信號針120d之左側,沿上下方向延伸。接地針220d於信號針120d之右側,沿上下方向延伸。接地針220e~220h自左向右依序排列為一行。更正確而言,信號針120e~120h及接地針220e~220h自左向右交替排列為一行。接地針220e~220h配置於接地針220a~220d之前方。另,接地針220a~220d之構造因可使用信號針120a之構造,故省略說明。As shown in FIG. 2, the ground pins 220a-220d are arranged in a row from left to right. More precisely, the
如以上之接地針220a~220h例如藉由黃銅而製作。接地針220a~220h如後述,以電性連接於柱塞102之狀態受柱塞102支持。The above ground pins 220a-220h are made of brass, for example. The ground pins 220 a to 220 h are supported by the
柱塞102如圖2所示,為沿上下方向延伸之筒狀構件。於本實施形態中,柱塞102具有圓筒形狀,該圓筒形狀具有沿上下方向延伸之中心軸線。於柱塞102,設置有沿上下方向延伸之貫通孔H1。貫通孔H1自柱塞102之上端貫通至下端。柱塞102於朝下方向觀察時包圍信號針120a~120h及接地針220a~220h。因此,信號針120a~120h及接地針220a~220h於貫通孔H1中沿上下方向延伸。柱塞102之下端位於較信號針120a~120h之下端及接地針220a~220h之下端更下方。藉此,柱塞102於朝下方向觀察時包圍信號針120a~120h之下端及接地針220a~220h之下端之周圍。其中,柱塞102未電性連接於信號針120a~120h。柱塞102電性連接於接地針220a~220h。柱塞102連接於接地電位。As shown in FIG. 2 , the
又,如圖4所示,於與前後方向正交之剖面中,於信號針120a之左側,存在柱塞102,且未存在針。即,於信號針120a與柱塞102之間,未存在信號針及接地針。Moreover, as shown in FIG. 4, in the cross section orthogonal to the front-back direction, on the left side of the
又,柱塞102電性連接於電纜轉接器105。具體而言,於柱塞102之貫通孔H1之上部,插入有電纜轉接器105。貫通孔H1之內周面與電纜轉接器105之外周面接觸。藉此,柱塞102電性連接於電纜轉接器105。柱塞102藉由導電性高之金屬而製作。柱塞102例如藉由SUS而製作。In addition, the
襯套124、126(絕緣性支持構件)如圖4所示,支持信號針120a~120h及接地針220a~220h。更詳細而言,如圖5所示,襯套124、126分別具有長方體形狀。襯套124配置於襯套126之下。藉由使襯套124與襯套126組合,而形成有長方體形狀之絕緣性支持構件。The
於襯套124、126設置有16個貫通孔。16個貫通孔沿上下方向貫通襯套124、126。信號針120a~120h及接地針220a~220h插入至16個貫通孔。藉此,襯套124、126支持信號針120a~120h及接地針220a~220h。Sixteen through holes are provided in the
襯套124、126如圖2所示,受柱塞102支持。更詳細而言,襯套124、126插入至柱塞102之貫通孔H1之下部。藉此,襯套124、126配置於電纜轉接器105之下。襯套124、126藉由具有絕緣性之樹脂而製作。襯套124、126例如藉由環氧樹脂而製作。因此,柱塞102未與信號針120a~120h電性連接。The
接地針支持構件132如圖5所示,以電性連接於接地針220a~220h之狀態支持接地針220a~220h。接地針支持構件132為導電性構件。更詳細而言,接地針支持構件132為朝上方向觀察時具有長方形狀之板狀構件。接地針支持構件132配置於較接地針220a~220h之上下方向之中央更下方。於本實施形態中,接地針支持構件132固定於襯套124之下表面。此處,接地針220a~220h之下端部各者較接地針220a~220h之下端部之上之部分更細。接地針支持構件132支持接地針220a~220h之下端部。又,接地針支持構件132如圖2所示,與柱塞102接觸。藉此,接地針支持構件132電性連接於柱塞102。接地針支持構件132與接地電位連接。As shown in FIG. 5 , the ground
於接地針支持構件132設置有16個貫通孔。16個貫通孔沿上下方向貫通接地針支持構件132。信號針120a~120h及接地針220a~220h通過16個貫通孔。信號針120a~120h所貫通之8個貫通孔之直徑大於信號針120a~120h之直徑。藉此,接地針支持構件132未與信號針120a~120h接觸。於接地針支持構件132與信號針120a~120h之間,存在著襯套124。因此,信號針120a~120h經由襯套124固定於接地針支持構件132。接地針支持構件132未電性連接於信號針120a~120h。接地針220a~220h所貫通之8個貫通孔之直徑與接地針220a~220h之直徑大致相同。藉此,接地針支持構件132與接地針220a~220h接觸。接地針支持構件132與接地針220a~220h電性連接。Sixteen through holes are provided in the ground
環103如圖2所示,為沿上下方向延伸之筒狀構件。於本實施形態中,環103具有圓筒形狀,該圓筒形狀具有沿上下方向延伸之中心軸線。於環103設置有沿上下方向延伸之貫通孔H4。貫通孔H4自環103之上端貫通至下端。環103以與柱塞102之上端接觸之方式配置於柱塞102之上。環103於朝下方向觀察時包圍同軸電纜202a~202h。因此,同軸電纜202a~202h於貫通孔H4中沿上下方向延伸。惟,環103未電性連接於中心導體204a~204h。環103電性連接於外部導體206a~206h。環103與接地電位連接。環103較佳藉由導電性高之金屬製作。環103例如藉由SUS製作。惟,環103亦可藉由具有絕緣性之樹脂製作。As shown in FIG. 2 , the
殼體104為沿上下方向延伸之筒狀構件。於殼體104設置有沿上下方向延伸之貫通孔H2。貫通孔H2自殼體104之上端貫通至下端。殼體104之下端部插入至柱塞102之上部及環103。藉此,殼體104以位於柱塞102之上之方式受柱塞102支持。同軸電纜202a~202h沿上下方向通過殼體104之內部。朝下方向觀察時,貫通孔H1、貫通孔H2、及貫通孔H4重疊。此種殼體104藉由導電性高之金屬製作。殼體104例如藉由SUS製作。The
隔片109於上下方向上配置於電纜轉接器105與殼體104之間。隔片109具有圓板形狀。朝下方向觀察時,於隔片109設置有沿左右方向延伸之2條狹槽。同軸電纜202a~202h沿上下方向通過該等2條狹槽。藉此,隔片109進行同軸電纜202a~202h之前後方向及左右方向上之定位。此種隔片109藉由導電性高之金屬而製作。隔片109例如藉由SUS而製作。The
凸緣106為具有板形狀之構件。凸緣106於朝下方向觀察時具有長方形狀。凸緣106於上下方向上配置於殼體104之上端部附近。於凸緣106,設置有沿上下方向延伸之貫通孔H3。殼體104沿上下方向通過貫通孔H3內。其中,殼體104之上端部之直徑大於凸緣106之貫通孔H3之直徑。因此,殼體104無法朝下方向穿過貫通孔H3。此種凸緣106藉由導電性高之金屬而製作。凸緣106例如藉由SUS而製作。The
彈簧108朝上方向推壓凸緣106。彈簧108朝下方向推壓環103。更詳細而言,彈簧108之上端固定於凸緣106之下表面。彈簧108之下端固定於環103之上端。柱塞102、環103、及殼體104一體化。因此,若朝上方向推壓柱塞102,則彈簧108收縮,柱塞102、環103及殼體104相對於凸緣106朝上方向位移。The
其次,對檢查用單元10之使用方法進行說明。檢查用單元10連接於具備8個信號端子及8個接地端子之連接器。自8個信號端子輸出具有相對較高頻率之高頻信號。8個接地端子連接於接地電位。Next, a method of using the
檢查用連接器100設置於連接器上。且,使檢查用連接器100下降。藉此,信號針120a~120h與連接器之8個信號端子接觸。即,對信號針120a~120h施加具有相對較高頻率之高頻信號。此時,信號針120a~120h由8個信號端子朝上方向推壓。因此,信號針120a~120h相對於柱塞102朝上方向位移。接地針220a~220h與8個接地端子接觸。即,接地針220a~220h連接於接地電位。此時,接地針220a~220h由接地端子朝上方向推壓。因此,接地針220a~220h相對於柱塞102朝上方向位移。藉由以上動作,連接於檢查用連接器100之測定裝置可確保對連接器之連接性,且測定具有相對較高頻率之高頻信號。The
[效果]
根據檢查用連接器100,於測定對象之複數個端子包含信號端子及接地端子之情形,亦可正確地測定高頻信號。更詳細而言,於檢查用連接器100中,套筒122b於朝下方向觀察時包圍插口123b之周圍。進而,套筒122b配置於套筒122a之右側。因此,具有同軸構造之套筒122b及插口123b之組配置於具有同軸構造之套筒122a及插口123a之組之右側。此時,於左右方向上,連接於接地電位之套筒122a、122b位於被施加高頻信號之插口123a與被施加高頻信號之插口123b之間。因此,於檢查用連接器100中,接地針220a於信號針120a之右側且信號針120b之左側,沿上下方向延伸。藉此,連接於接地電位之接地針220a位於被施加高頻信號之信號針120a與被施加高頻信號之信號針120b之間。此處,將被施加高頻信號之導體稱為信號導體。將連接於接地電位之導體稱為接地導體。其結果,設置有信號針120a、120b之區間中之信號導體與接地導體之位置關係,接近設置有插口123a、123b之區間中之信號導體與接地導體之位置關係。設置有信號針120a、120b之區間中之特性阻抗等之電性特性,接近設置有插口123a、123b之區間中之特性阻抗等之電性特性。以上,根據檢查用連接器100,於測定對象之複數個端子包含信號端子及接地端子之情形,亦可正確地測定高頻信號。[Effect]
According to the
又,連接於接地電位之接地針220a位於被施加高頻信號之信號針120a與被施加高頻信號之信號針120b之間。藉此,信號針120a與信號針120b之間之隔離提高。In addition, the
又,根據檢查用連接器100,可謀求檢查用連接器100之小型化。更詳細而言,於檢查用連接器中,於與複數個信號針連接於具有同軸構造之套筒及插口之情況同樣,接地針亦連接於具有同軸構造之套筒及插口之情形,檢查用連接器大型化。另一方面,檢查用連接器100中,連接於接地電位之接地針220a位於被施加高頻信號之信號針120a與被施加高頻信號之信號針120b之間。藉此,接地針220a亦可不連接於具有同軸構造之套筒122a及插口123a。其結果,謀求檢查用連接器100之小型化。In addition, according to the
根據檢查用連接器100,使用接地針220a~220h。因此,接地針220a~220h容易確實地接觸複數個接地端子之各者。其結果,根據檢查用連接器100,於測定對象之複數個端子包含信號端子及接地端子之情形,亦可正確地測定高頻信號。According to the
根據檢查用連接器100,於測定對象之複數個端子包含信號端子及接地端子之情形,亦可正確地測定高頻信號。更詳細而言,於檢查用連接器100中,於與前後方向正交之剖面中,於信號針120a之左側,存在柱塞102,且未存在針。藉此,連接於接地電位之柱塞102位於信號針120a之左側。連接於接地電位之接地針220a位於信號針120a之右側。其結果,信號針120a、柱塞102及接地針220a之剖面構造接近套筒122a及插口123a之剖面構造。設置有信號針120a之區間中之特性阻抗等之電性特性,接近設置有插口123a之區間中之特性阻抗等之電性特性。以上,根據檢查用連接器100,於測定對象之複數個端子包含信號端子及接地端子之情形,亦可正確地測定高頻信號。According to the
根據檢查用連接器100,可抑制接地針220a~220h中產生之共振之影響。以下,列舉接地針220a、220b為例進行說明。於檢查用連接器100未具備接地針支持構件132之情形,接地針220a與接地針220b經由電纜轉接器105電性連接。接地針220a與接地針220b未接觸。接地針220a、220b之整體難以保持為接地電位。即,於接地針220a之上端與接地針220a之下端之間容易產生電位差。於接地針220b之上端與接地針220b之下端之間容易產生電位差。此時,有於接地針220a、220b產生共振之情形。According to the
因此,接地針支持構件132以電性連接於接地針220a及接地針220b之狀態支持接地針220a及接地針220b。藉此,有於接地針支持構件132與接地針220a之下端之間產生電位差之可能性。有於接地針支持構件132與接地針220b之下端之間產生電位差之可能性。其中,設置有接地針支持構件132之情形時容易產生電位差之區間之長度,變得較未設置接地針支持構件132之情形時容易產生電位差之區間之長度更短。若容易產生電位差之區間之長度變短,則電位差變小。其結果,抑制產生無用之共振。以上,根據檢查用連接器100,可抑制接地針220a~220h中產生之共振之影響。此種效果尤其於毫米波頻帶或微波頻帶之高頻信號之傳送中有效。Therefore, the ground
尤其,於檢查用連接器100中,接地針支持構件132配置於較接地針220a~220h之上下方向之中央更下方。於接地針220a~220h中容易產生電位差之區間之長度變得更短。其結果,抑制產生無用之共振。以上,根據檢查用連接器100,可更有效地抑制接地針220a~220h中產生之共振之影響。此種效果尤其於毫米波頻帶或微波頻帶之高頻信號之傳送中有效。In particular, in the
於檢查用連接器100中,可抑制設置有信號針120a~120h之區間中之特性阻抗變動。更詳細而言,接地針220a~220h之下端部之各者較接地針220a~220h之下端部之上之部分更細。接地針支持構件132支持接地針220a~220h之下端部。藉此,接地針220a~220h之下端部及接地針支持構件132合計之粗細,接近接地針220a~220h之下端部之上之部分之粗細。接地針支持構件132與信號針120a~120h之距離,接近接地針220a~220h之下端部之上之部分與信號針120a~120h之距離。其結果,於檢查用連接器100中,可抑制設置有信號針120a~120h之區間中之特性阻抗變動。In the
進而,接地針220a~220h變細之部分藉由接地針支持構件132支持。因此,抑制接地針220a~220h破損。Furthermore, the thinned portions of the ground pins 220 a to 220 h are supported by the ground
於檢查用連接器100中,抑制無用輻射之產生。更詳細而言,柱塞102之下端位於較信號針120a~120h之下端及接地針220a~220h之下端更下方。藉此,柱塞102於朝下方向觀察時包圍信號針120a~120h下端及接地針220a~220h之下端之周圍。其結果,抑制自信號針120a~120h及接地針220a~220h向檢查用連接器100外產生無用輻射。又,抑制信號針120a~120h及接地針220a~220h受來自檢查用連接器100外之雜訊之影響。In the
於檢查用連接器100中,於接地針支持構件132與信號針120a~120h之間,存在有襯套124。因此,信號針120a~120h經由襯套124固定於接地針支持構件132。藉此,抑制信號針120a~120h破損。In the
(變化例)
以下,參照圖式說明本發明之變化例之檢查用連接器100a之構造。圖7係檢查用連接器100a之剖視圖。於圖7中顯示有與前後方向正交之剖面中之檢查用連接器100a之構造。圖8係檢查用連接器100a之放大剖視圖。(Variation example)
Hereinafter, the structure of the
檢查用連接器100a如圖7及圖8所示,於襯套130a~130h(襯套130d~130h未圖示)之構造中,與檢查用連接器100不同。更詳細而言,於檢查用連接器100中,襯套130a~130h分別收納於套筒122a~122h之內部。另一方面,於檢查用連接器100a中,襯套130a~130h之一部分分別收納於套筒122a~122h之內部。襯套130a~130h之剩餘部分分別配置於套筒122a~122h之外部。更詳細而言,襯套130a~130h之上部具有圓筒形狀,該圓筒形狀具有沿上下方向延伸之中心軸線。襯套130a~130h之下部具有圓筒形狀,該圓筒形狀具有沿上下方向延伸之中心軸線。襯套130a~130h之下部之外周面之直徑大於襯套130a~130h之上部之外周面之直徑。又,襯套130a~130h之上部之外周面之直徑與套筒122a~122h之內周面之直徑大致相等。藉此,襯套130a~130h之上部插入至套筒122a~122h之下端部。檢查用連接器100a之其他構成因與檢查用連接器100相同,故省略說明。As shown in FIGS. 7 and 8 , the
根據檢查用連接器100a,藉由與檢查用連接器100相同之理由,於測定對象之複數個端子包含信號端子及接地端子之情形,亦可正確地測定高頻信號。又,根據檢查用連接器100a,藉由與檢查用連接器100相同之理由,可抑制接地針220a~220h中產生之共振之影響。According to the
(其他實施形態)
本發明之檢查用連接器未限定於上述實施形態之檢查用連接器100、100a,可於其主旨範圍內變更。(Other Embodiments)
The inspection connector of the present invention is not limited to the
另,亦可使檢查用連接器100、100a之構成任意組合。In addition, the configuration of the
另,於檢查用連接器100、100a中,亦可對除信號針120a~120h接觸襯套124、126之部分之外之襯套124、126之表面實施金屬鍍覆。即,於襯套124、126中,未對信號針120a~120h插入之貫通孔之內周面,實施金屬鍍覆。藉此,接地針220a~220h經由金屬鍍覆而電性連接。其結果,於檢查用連接器100、100a中,可抑制接地針220a~220h中產生之共振之影響。金屬鍍覆為例如鍍金。In addition, in the
另,檢查用連接器100、100a中,信號針120a~120h之數量未限定於8個。檢查用連接器100、100a只要至少具備信號針120a、120b即可。又,於檢查用連接器100、100a中,接地針220a~220h之數量未限定於8個。檢查用連接器100、100a只要至少具備接地針220a即可。In addition, in the
另,於檢查用連接器100、100a中,針亦可存在於信號針120a之左側。In addition, in the
另,於檢查用連接器100、100a中,接地針220a~220h之上端亦可不與電纜轉接器105接觸。接地針220a~220h只要電性連接於電纜轉接器105即可。因此,接地針220a~220h亦可經由其他導電性構件電性連接於電纜轉接器105。In addition, in the
另,檢查用連接器100、100a中,接地針支持構件132並非必須之構成。又,接地針支持構件132亦可配置於較接地針220a~220h之上下方向之中央更上方。In addition, in the
10:檢查用單元
100:檢查用連接器
100a:檢查用連接器
102:柱塞
103:環
104:殼體
105:電纜轉接器
106:凸緣
108:彈簧
109:隔片
120a~120h:信號針
122a~122h:套筒
123a~123h:插口
124:襯套
126:襯套
130a~130h:襯套
132:接地針支持構件
200a~200h:外部連接用連接器
202a~202h:同軸電纜
204a~204h:中心導體
206a~206h:外部導體
208a~208c:絕緣體
210a~210c:被膜
220a~220h:接地針
1202a:筒部
1204a:下針
1206a:上針
1208a:彈簧
H1~H4:貫通孔10: Unit for inspection
100: Connector for
圖1係檢查用單元10之剖視圖。
圖2係檢查用連接器100之剖視圖。
圖3係檢查用連接器100之分解立體圖。
圖4係檢查用連接器100之放大剖視圖。
圖5(A)係襯套124、126及接地針支持構件132之外觀立體圖。圖5(B)係朝上方向觀察接地針支持構件132時之圖。
圖6係電纜轉接器105之仰視圖。
圖7係檢查用連接器100a之剖視圖。
圖8係檢查用連接器100a之放大剖視圖。FIG. 1 is a cross-sectional view of the
102:柱塞 102: Plunger
105:電纜轉接器 105:Cable Adapter
120a~120d:信號針 120a~120d: Signal pin
122a~122d:套筒 122a~122d: Sleeve
123a~123d:插口 123a~123d: Socket
126:襯套 126: Bushing
130a~130d:襯套 130a~130d: Bushing
204a~204d:中心導體 204a~204d: Center conductor
206a~206d:外部導體 206a~206d: Outer conductor
208a~208c:絕緣體 208a~208c: Insulators
210a~210c:被膜 210a~210c: film
220a~220d:接地針 220a~220d: Ground pins
Claims (14)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020075912 | 2020-04-22 | ||
| JP2020-075912 | 2020-04-22 | ||
| WOPCT/JP2021/015483 | 2021-04-14 | ||
| PCT/JP2021/015483 WO2021215334A1 (en) | 2020-04-22 | 2021-04-14 | Inspection connector and inspection unit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202210841A TW202210841A (en) | 2022-03-16 |
| TWI778588B true TWI778588B (en) | 2022-09-21 |
Family
ID=78269296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW110114119A TWI778588B (en) | 2020-04-22 | 2021-04-20 | Inspection connector and inspection unit |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7327659B2 (en) |
| CN (1) | CN218938344U (en) |
| TW (1) | TWI778588B (en) |
| WO (1) | WO2021215334A1 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2023100074A (en) * | 2022-01-05 | 2023-07-18 | I-Pex株式会社 | probe |
| JP7786408B2 (en) * | 2022-03-10 | 2025-12-16 | 株式会社村田製作所 | Inspection Connector |
| DE102022106991A1 (en) | 2022-03-24 | 2023-09-28 | Ingun Prüfmittelbau Gmbh | High frequency test pen device |
| JP2023182281A (en) * | 2022-06-14 | 2023-12-26 | 株式会社村田製作所 | Inspection connector |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020132514A1 (en) * | 2001-03-13 | 2002-09-19 | 3M Innovative Properties Company | Method and apparatus for retaining a spring probe |
| TW201429079A (en) * | 2012-12-21 | 2014-07-16 | Murata Manufacturing Co | Inspection coaxial connector |
| US20160104956A1 (en) * | 2014-10-10 | 2016-04-14 | Samtec, Inc. | Cable assembly |
| TW201621323A (en) * | 2014-11-07 | 2016-06-16 | Murata Manufacturing Co | Probe |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001042002A (en) * | 1999-07-30 | 2001-02-16 | Advantest Corp | Contact board for calibrating timing of semiconductor device tester and probe touching contact board |
| US6515499B1 (en) * | 2000-09-28 | 2003-02-04 | Teradyne, Inc. | Modular semiconductor tester interface assembly for high performance coaxial connections |
| US20030062914A1 (en) * | 2001-09-28 | 2003-04-03 | Cosmin Iorga | Surface mating compliant contact assembly with fixed signal path length |
| JP2008070146A (en) * | 2006-09-12 | 2008-03-27 | Yokowo Co Ltd | Socket for inspection |
| DE112008003702T5 (en) * | 2008-02-07 | 2010-11-25 | Advantest Corporation | Device-dependent replacement unit and manufacturing process |
| JP2010133763A (en) * | 2008-12-03 | 2010-06-17 | Yokogawa Electric Corp | Coaxial probe structure |
| KR101882209B1 (en) * | 2016-03-23 | 2018-07-27 | 리노공업주식회사 | Coaxial Test Socket Assembly |
| WO2019069576A1 (en) | 2017-10-06 | 2019-04-11 | 株式会社村田製作所 | Probe |
-
2021
- 2021-04-14 WO PCT/JP2021/015483 patent/WO2021215334A1/en not_active Ceased
- 2021-04-14 JP JP2022517001A patent/JP7327659B2/en active Active
- 2021-04-14 CN CN202190000326.8U patent/CN218938344U/en active Active
- 2021-04-20 TW TW110114119A patent/TWI778588B/en active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020132514A1 (en) * | 2001-03-13 | 2002-09-19 | 3M Innovative Properties Company | Method and apparatus for retaining a spring probe |
| CN1555489A (en) * | 2001-03-13 | 2004-12-15 | 3M | Method and apparatus for retaining a spring probe |
| TW201429079A (en) * | 2012-12-21 | 2014-07-16 | Murata Manufacturing Co | Inspection coaxial connector |
| US20160104956A1 (en) * | 2014-10-10 | 2016-04-14 | Samtec, Inc. | Cable assembly |
| TW201621323A (en) * | 2014-11-07 | 2016-06-16 | Murata Manufacturing Co | Probe |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2021215334A1 (en) | 2021-10-28 |
| CN218938344U (en) | 2023-04-28 |
| TW202210841A (en) | 2022-03-16 |
| WO2021215334A1 (en) | 2021-10-28 |
| JP7327659B2 (en) | 2023-08-16 |
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| GD4A | Issue of patent certificate for granted invention patent |