TWI777205B - Calibration method of shape measuring device, reference device and detector - Google Patents
Calibration method of shape measuring device, reference device and detector Download PDFInfo
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- TWI777205B TWI777205B TW109125939A TW109125939A TWI777205B TW I777205 B TWI777205 B TW I777205B TW 109125939 A TW109125939 A TW 109125939A TW 109125939 A TW109125939 A TW 109125939A TW I777205 B TWI777205 B TW I777205B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/22—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapers; for testing the alignment of axes
- G01B21/24—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapers; for testing the alignment of axes for testing alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02049—Interferometers characterised by particular mechanical design details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02061—Reduction or prevention of effects of tilts or misalignment
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
[課題] 本發明提供一種形狀測量裝置,其在檢測儀的零點校正中不易產生零點位置的偏差。 [解決手段] 檢測儀包括排成一列之至少三個位移計,並藉由與測量對象物對向配置而檢測從至少三個位移計到測量對象物為止的距離的位移。藉由基準器支撐於支撐構件上而提供檢測儀的校正用基準面。控制裝置校正基準器。基準器具有在至少三個位移計排列之方向上在兩個部位支撐於支撐構件上之支撐結構。控制裝置在使至少三個位移計對向基準面之狀態下校正檢測儀。[Problem] The present invention provides a shape measuring device that is less likely to cause a deviation in the zero point position during zero point calibration of a detector. [Solution] The detector includes at least three displacement gauges arranged in a row, and is arranged to face the measurement object to detect the displacement of the distance from the at least three displacement gauges to the measurement object. A reference plane for calibration of the detector is provided by the reference device being supported on the support member. The control unit calibrates the reference. The reference device has a support structure supported on the support member at two locations in the direction in which the at least three displacement gauges are arranged. The control device calibrates the detectors in a state in which at least three displacement gauges face the reference plane.
Description
本發明係關於形狀測量裝置、搭載於形狀測量裝置上之檢測儀的校正方法及用於校正該檢測儀之基準器。The present invention relates to a shape measuring device, a method for calibrating a detector mounted on the shape measuring device, and a reference device for calibrating the detector.
作為測量研磨對象物亦即工件上表面的直線度之方法,已知有一種在機測量方法,其利用研磨裝置的工件進給功能,在砂輪頭上安裝位移計而掃描加工表面。在機測量方法中,通常利用使用包括三個位移計之檢測儀之逐次三點法(例如專利文獻1)。在逐次三點法中,同時測量位於工件上表面的一條直線上之三點的高度方向的位置,根據測量結果求出平面的局部彎曲程度(曲率)。將該曲率進行二階積分並藉由計算而求出工件上表面的直線度。直線度係指目標形狀從幾何學上正確之直線偏離的程度。測量工件上表面的直線度等同於測量與工件上表面的高度方向有關的凹凸形狀。As a method of measuring the straightness of the upper surface of a workpiece, which is an object to be polished, there is known an on-machine measurement method in which a displacement gauge is attached to a grinding wheel head to scan the machined surface by utilizing the workpiece feeding function of a polishing apparatus. In the machine measurement method, the successive three-point method using a detector including three displacement gauges is generally used (for example, Patent Document 1). In the successive three-point method, the positions in the height direction of three points on a straight line on the upper surface of the workpiece are simultaneously measured, and the local curvature (curvature) of the plane is obtained from the measurement results. The straightness of the upper surface of the workpiece is obtained by calculating the second-order integral of the curvature. Straightness is the degree to which a target shape deviates from a geometrically correct straight line. Measuring the straightness of the upper surface of the workpiece is equivalent to measuring the concavo-convex shape related to the height direction of the upper surface of the workpiece.
為了對測量對象物表面的直線度高精度地進行測量,需要進行檢測儀的零點校正,以使三個位移計的零點位於幾何學上正確之平面上。為了進行檢測儀的零點校正而使用具有高直線度之基準面之基準器。當測量藉由研磨裝置而被研磨之工件上表面的直線度時,例如,在研磨後的工件的上表面放置基準器而進行檢測儀的零點校正,以使三個位移計的零點位於基準面上。 [先前技術文獻]In order to measure the straightness of the surface of the object to be measured with high accuracy, it is necessary to calibrate the zero point of the detector so that the zero points of the three displacement meters are located on a geometrically correct plane. A datum with a highly straight datum surface is used for zero calibration of the detector. When measuring the straightness of the upper surface of the workpiece ground by the grinding device, for example, a reference device is placed on the upper surface of the ground workpiece to perform zero point correction of the detector so that the zero points of the three displacement gauges are located on the reference plane superior. [Prior Art Literature]
[專利文獻1] 日本特開2016-166873號公報[Patent Document 1] Japanese Patent Laid-Open No. 2016-166873
[發明所欲解決之問題][Problems to be Solved by Invention]
在進行檢測儀的零點校正之後,若將基準器設置於工件上的其他位置而測量基準面的直線度,則理想的係直線度的幾何公差成為零。然而,明確得知若改變設置基準器之位置而測量基準面的直線度,則有基準面的直線度的幾何公差不為零的情況。這意味著根據放置基準器的位置而導致在零點校正後的零點的位置上產生偏差。若不進行高精度的零點校正,則會導致工件上表面的直線度的測量精度下降。After the zero point calibration of the detector is performed, if a reference is installed at another position on the workpiece and the straightness of the reference surface is measured, the geometrical tolerance of the ideal straightness becomes zero. However, it is clearly known that when the straightness of the reference plane is measured by changing the position where the reference device is installed, the geometrical tolerance of the straightness of the reference plane may not be zero. This means that there is a deviation in the position of the zero point after zero point correction depending on the position where the datum is placed. If high-precision zero point calibration is not performed, the measurement accuracy of the straightness of the upper surface of the workpiece will decrease.
本發明的目的係在於提供一種在檢測儀的零點校正中不易產生零點位置的偏差之形狀測量裝置及檢測儀的校正方法。本發明的另一個目的係在於提供一種可適用於該校正方法中之基準器。 [解決問題之技術手段]The object of the present invention is to provide a shape measuring device and a calibration method of the detector which are less likely to produce a deviation of the zero point position in the zero point calibration of the detector. Another object of the present invention is to provide a reference device applicable to the calibration method. [Technical means to solve problems]
根據本發明的一觀點,提供一種形狀測量裝置,其具有: 檢測儀,係包括排成一列之至少三個位移計,並藉由與測量對象物對向配置而檢測從前述至少三個位移計到前述測量對象物為止的距離的位移; 基準器,係藉由支撐於支撐構件上而提供前述檢測儀的校正用基準面;以及 控制裝置,係校正前述基準器, 前述基準器具有在前述至少三個位移計排列之方向上在兩個部位支撐於前述支撐構件上之支撐結構, 前述控制裝置在使前述至少三個位移計對向前述基準面之狀態下校正前述檢測儀。According to an aspect of the present invention, there is provided a shape measuring device, which has: a detector comprising at least three displacement gauges arranged in a row, and by being arranged opposite to the measurement object, to detect the displacement of the distance from the at least three displacement gauges to the measurement object; a datum, which is supported on a support member to provide a reference plane for calibration of the aforementioned detector; and control means for calibrating the aforesaid reference device, The reference device has a support structure supported on the support member at two locations in the direction in which the at least three displacement gauges are arranged, The control device calibrates the detector in a state in which the at least three displacement gauges face the reference plane.
根據本發明的另一觀點,提供一種形狀測量裝置,其具有: 檢測儀,係包括排成一列之至少三個位移計,並藉由與測量對象物對向配置而檢測從前述至少三個位移計的每一個到測量對象物為止的距離的位移; 基準器,係藉由支撐於支撐構件上而提供用於校正前述檢測儀的基準面;及 控制裝置,係校正前述基準器, 在將前述基準器支撐於前述支撐構件上之狀態下,因自重而產生撓曲,產生撓曲之狀態下的前述基準面的形狀具有不受前述支撐構件上表面的凹凸的影響之結構, 前述控制裝置在使前述至少三個位移計對向前述基準面之狀態下校正前述檢測儀。According to another aspect of the present invention, there is provided a shape measuring device having: a detector comprising at least three displacement gauges arranged in a row, and by being disposed opposite to the measurement object, to detect the displacement of the distance from each of the at least three displacement gauges to the measurement object; a datum that provides a datum for calibrating the detector by being supported on a support member; and control means for calibrating the aforesaid reference device, In a state where the reference tool is supported on the support member, deflection occurs due to its own weight, and the shape of the reference surface in the state of deflection has a structure that is not affected by the unevenness of the upper surface of the support member. The control device calibrates the detector in a state in which the at least three displacement gauges face the reference plane.
根據本發明的又一觀點,提供一種基準器,其具有: 基準面,係與排成一列之三個位移計相對向;及 三個支腳部,係從與前述基準面相反之一側的底面突出, 前述三個支腳部中的兩個支腳部配置於在前述基準面的長度方向上相同之位置。According to another aspect of the present invention, a reference device is provided, which has: the reference plane, which is opposite to the three displacement gauges arranged in a row; and three leg portions protruding from the bottom surface on the side opposite to the aforementioned reference surface, Two of the said three leg parts are arrange|positioned at the same position in the longitudinal direction of the said reference plane.
根據本發明的又一觀點,提供一種校正方法,其為檢測儀的校正方法,該檢測儀藉由使排成一列之至少三個位移計與測量對象物對向配置而檢測從前述至少三個位移計的每一個到前述測量對象物為止的距離的位移, 在使前述至少三個位移計對向基準器的基準面之姿勢下,使前述基準器在前述至少三個位移計排列之方向上在兩個部位支撐於支撐構件上, 在使前述至少三個位移計對向前述基準面之狀態下校正前述檢測儀。 [發明之效果]According to yet another aspect of the present invention, there is provided a calibration method for a tester that detects at least three displacement gauges by arranging at least three displacement gauges in a line to face an object to be measured. The displacement of the displacement meter for each distance to the aforementioned measurement object, With the at least three displacement gauges facing the reference plane of the reference device, the reference device is supported on the support member at two positions in the direction in which the at least three displacement gauges are arranged, The detector is calibrated in a state in which the at least three displacement gauges face the reference plane. [Effect of invention]
基準器的撓曲形狀不受支撐構件上表面的凹凸的影響。因此,提供當校正檢測儀時形狀偏差小的基準面,其結果,能夠抑制檢測儀的至少三個位移計的零點位置的由設置部位引起之偏差。The deflection shape of the datum is not affected by the unevenness of the upper surface of the support member. Therefore, a reference surface with little shape deviation is provided when the detector is calibrated, and as a result, the deviation of the zero point positions of the at least three displacement gauges of the detector due to the installation position can be suppressed.
參閱圖1A~圖11B,對實施例的形狀測量裝置進行說明。
圖1A係組裝有本實施例的形狀測量裝置之研磨裝置的立體圖。研磨裝置包括可動工作台10、工作台引導機構11、砂輪頭15、砂輪16、導軌18、控制裝置20、輸入輸出裝置21、基準器30及檢測儀40。可動工作台10藉由工作台引導機構11而在水平面內的一方向上往復移動。被研磨物亦即工件12支撐於可動工作台10上。該工件12相當於藉由形狀測量裝置而被測量直線度之測量對象物。Referring to FIGS. 1A to 11B , the shape measuring apparatus of the embodiment will be described.
FIG. 1A is a perspective view of a polishing apparatus in which the shape measuring apparatus of the present embodiment is assembled. The grinding device includes a movable table 10 , a
砂輪頭15藉由導軌18而可升降地支撐於可動工作台10上的工件12的上方。砂輪頭15在水平面內在與可動工作台10的移動方向正交之方向上能夠移動。如下定義xyz正交坐標系:將可動工作台10的移動方向設為x軸方向,將砂輪頭15的移動方向設為y軸方向,將鉛垂朝下的方向設為z軸的正方向。The
在砂輪頭15的下端部安裝有砂輪16。砂輪16具有圓柱狀形狀,其中心軸與y軸方向平行。使砂輪頭15下降至砂輪16接觸到工件12之程度,並藉由一邊使砂輪16旋轉,一邊使工件12在x軸方向上移動而進行工件12的研磨。藉由使砂輪頭15在y軸方向上移動並重複相同之處理而能夠研磨工件12的上表面的整個區域。A
控制裝置20控制可動工作台10向x軸方向的移動、砂輪頭15向y軸方向的移動及升降、砂輪16的旋轉。各種指令從輸入輸出裝置21輸入到控制裝置20,處理結果等藉由控制裝置20而輸出到輸入輸出裝置21。輸入輸出裝置21例如包括顯示器、定點設備、鍵盤等。The
檢測儀40可裝卸地安裝於砂輪頭15的側面。當研磨時,檢測儀40從砂輪頭15被卸除。當測量工件12的上表面的直線度時,檢測儀40被安裝於砂輪頭15。檢測儀40例如藉由磁鐵的吸引力、螺紋固定等而被安裝於砂輪頭15。以下,參閱圖1B對檢測儀40的結構進行詳述。當校正檢測儀40時,在工件12的上表面配置基準器30。基準器30藉由支撐於工件12的上表面而提供檢測儀40的校正用基準面。工件12作為在零點校正時用於支撐基準器30之支撐構件而發揮作用。The
圖1B係在砂輪頭15上安裝有檢測儀40之狀態下之檢測儀40的側視圖。FIG. 1B is a side view of the
檢測儀40包括安裝於支撐基座41上並在x軸方向上排成一列之第1位移計42a、第2位移計42b、第3位移計42c。作為該等位移計,例如能夠使用非接觸式雷射位移計。由於第1位移計42a、第2位移計42b及第3位移計42c中的每一個與工件12對向配置,因此檢測從每個位移計到工件12為止的距離的位移。更具體而言,測定從各位移計的零點到工件12的上表面的被測定點為止在z軸方向上的距離。在檢測儀40所對向之位置配置有基準器30(圖1A)之狀態下,各位移計檢測基準器30的基準面的在z軸方向上的位移。The
在支撐基座41上還安裝有溫度感測器45。溫度感測器45測定檢測儀40的溫度。第1位移計42a、第2位移計42b及第3位移計42c的測定值及溫度感測器45的測定值被輸入到控制裝置20(圖1A)。A
其次,參閱圖2,對測量工件12的上表面的直線度的方法進行說明。
圖2係表示測量對象亦即工件12的上表面及檢測儀40之示意圖。工件12的上表面與xy面大致平行地配置。另外,在圖2中放大示出工件12的上表面的微小的凹凸。檢測儀40的第1位移計42a、第2位移計42b及第3位移計42c在x軸方向上以間距P排成一列。Next, referring to FIG. 2 , a method of measuring the straightness of the upper surface of the
若進行三個位移計的零點校正,則理想的係第1位移計42a、第2位移計42b及第3位移計42c各自的零點A0
、B0
、C0
在與x軸大致平行的一條直線上以間距P排列。另外,在本實施例中,如以下參閱圖7A及圖7B進行說明,三個零點A0
、B0
、C0
並非嚴格地配置在一條直線上,但是在此假定三個零點A0
、B0
、C0
配置在一條直線上。If the zero point calibration of the three displacement meters is performed, ideally, the zero points A 0 , B 0 , and C 0 of the
第1位移計42a測定從零點A0
到工件12的上表面的被測定點A為止的距離Da
。同樣,第2位移計42b及第3位移計42c分別測定從零點B0
到被測定點B為止的距離Db
、以及從零點C0
到被測定點C為止的距離Dc
。The
將連接被測定點A和C的線段與被測定點B在z軸方向上的距離稱為偏移量g。偏移量g由以下式來表示。 The distance between the line segment connecting the points A and C to be measured and the point B to be measured in the z-axis direction is referred to as the offset amount g. The offset amount g is represented by the following equation.
在第2位移計42b的被測定點B上的工件12的上表面的曲率d2
z/dx2
(x=B)能夠由以下式來表示。 The curvature d 2 z/dx 2 (x=B) of the upper surface of the
一邊使檢測儀40和工件12中的一個相對於另一個在x軸方向上移動,一邊藉由式(1)而測量偏移量g。藉由對使用式(1)及(2)來求出之工件12的上表面的曲率分佈進行二階積分而能夠求出上表面的直線度(亦即,xz剖面中的表面形狀)。While moving one of the
其次,參閱圖3,對檢測儀40的零點校正的原理進行說明。
圖3係表示檢測儀40的第1位移計42a、第2位移計42b、第3位移計42c與基準器30的位置關係之示意圖。Next, referring to FIG. 3 , the principle of zero point calibration of the
將基準器30放置在工件12的上表面上,並使基準面31對向檢測儀40。在該狀態下,將第1位移計42a、第2位移計42b及第3位移計42c各自的基準面31上的被測定點分別設定為第1位移計42a、第2位移計42b及第3位移計42c的零點A0
、B0
、C0
。The
另外,可以一邊使基準器30相對於檢測儀40在x軸方向上移動,一邊進行複數次測定,並根據測定值的平均值來設定零點A0
、B0
、C0
。將一邊使基準器30在x軸方向上移動,一邊進行複數次測定之處理稱為掃描。基準器30的移動係藉由由工作台引導機構11使工件12在x軸方向上移動而實現者。藉由採用該方法,能夠減小由基準面31的表面粗糙引起之零點的偏差。此外,可以改變基準面31上的被測定點在y軸方向上的位置進行複數次掃描,並根據藉由複數次掃描而得到之測定值的平均值來設定零點A0
、B0
、C0
。另外,即使第1位移計42a、第2位移計42b及第3位移計42c在支撐基座41上的安裝位置在z軸方向上偏離,若基準面31係幾何學上正確之平面,則零點A0
、B0
、C0
藉由零點校正而位於一條直線上。In addition, while moving the
其次,參閱圖4A及圖4B,對使用比較例的基準器30來校正檢測儀40之方法進行說明。Next, referring to FIGS. 4A and 4B , a method for calibrating the
圖4A及圖4B係將比較例的基準器30放置在工件12的上表面上之狀態的剖面圖。當校正檢測儀40時,在工件12的上表面上,長方體形狀的基準器30被設置成其長度方向與x軸平行。研磨後的工件12的上表面大致平坦,但是實際上殘留有微小的凹凸。因此基準器30在其長度方向上在大致兩點處支撐於工件12上。基準器30例如由楊氏模量約為130GPa左右的不易變形之陶瓷材料形成,但是以接觸到工件12之部位為支點因自重而稍微產生撓曲。4A and 4B are cross-sectional views of a state in which the
在圖4A所示例中,基準器30在長度方向的兩端附近接觸到工件12而被支撐。此時,在基準器30上產生朝下方凸出形狀的撓曲。在圖4B所示例中,基準器30在長度方向的中央附近接觸到工件12而被支撐。此時,在基準器30上產生朝上方凸出形狀的撓曲。若在基準面31上產生有撓曲之狀態下進行檢測儀40的零點校正,則三個零點A0
、B0
、C0
不位於一條直線上。又,根據設置基準器30之位置,導致在三個零點A0
、B0
、C0
的相對位置關係上產生偏差。In the example shown in FIG. 4A , the
在基準器30上產生之撓曲受到其支撐表面(亦即,工件12的上表面)的凹凸形狀的影響。因此,無法正確地推斷出產生撓曲之狀態下之基準面31的形狀。從而,難以校正三個零點A0
、B0
、C0
而使其配置在一條直線上。The deflection produced on the
其次,參閱圖5~圖7B,對利用在本實施例的形狀測量裝置中使用之基準器30進行檢測儀40的零點校正之方法進行說明。Next, referring to FIGS. 5 to 7B , a method for performing zero point calibration of the
圖5係從斜下方觀察在實施例的形狀測量裝置中使用之基準器30之立體圖。基準器30包括具有在一方向上長的長方體形狀之主體構件32。主體構件32的上表面被設為基準面31。在主體構件32的與基準面31相反之一側的底面上安裝有三個支腳部33。一個支腳部33被安裝於基準器30的底面的在長度方向上的一個端部,其他兩個支腳部33被安裝於另一個端部。又,該兩個支腳部33在與長度方向正交之寬度方向上隔開間隔地被安裝。亦即,該兩個支腳部33安裝於在長度方向上相同之位置,並且在寬度方向上被安裝於不同的位置。FIG. 5 is a perspective view of the
每個支腳部33具有半球形狀,並在平坦之表面上黏接於主體構件32的底面。在支腳部33的黏接中能夠使用黏接劑或雙面膠帶等。在支腳部33中例如使用氧化鋯等硬質材料。支腳部33的高度例如為2mm以上且15mm以下,典型地為7mm。然而,支腳部33的高度並不限定於該範圍。在將基準器30放置在工件12的上表面上之狀態下,支腳部33的高度只要係基準器30的主體構件32的底面不接觸到工件12的上表面之程度的高度即可。Each
圖6A及圖6B係將在實施例的形狀測量裝置中使用之基準器30放置在工件12的上表面上之狀態的剖面圖。圖6A及圖6B中所示出之工件12的上表面的凹凸形狀分別與圖4A及圖4B中所示出之工件12的上表面的凹凸形狀相同。在圖6A及圖6B中的任一種情況下,基準器30藉由三個支腳部33接觸到工件12的上表面而支撐於工件12的上表面。基準器30在除了三個支腳部33以外的部位不會接觸到工件12。6A and 6B are cross-sectional views showing a state in which the
由於三個支腳部33中的兩個支腳部配置於在長度方向上相同之位置,因此基準器30在長度方向上的兩個部位支撐於工件12的上表面。因此,基準器30具有兩端支撐均布荷重的樑結構。基準器30不取決於支撐表面的凹凸形狀,而始終在長度方向上的兩個部位支撐於支撐表面上,因此基準器30的撓曲的形狀及大小不受支撐表面的凹凸形狀的影響。Since two of the three
圖7A係具有兩端支撐均布荷重的樑結構之基準器30的示意圖。若由L表示基準器30的長度,由w表示每單位長度的荷重,由E表示楊氏模量,由I表示彈性二維力矩,則與一個端部的距離為x的點的撓曲量δ(x)由以下式來表示。 FIG. 7A is a schematic diagram of a
當將基準器30放置在工件12的上表面上時,能夠使用式(3)預先求出在基準面31上產生之撓曲的形狀及大小。定義該撓曲的形狀之資訊被存儲於控制裝置20(圖1A)。When the
圖7B係表示在實施例的形狀測量裝置中使用之基準器30與檢測儀40的位置關係之示意圖。基準面31如圖7A所示撓曲。在圖7B中,撓曲量由實際的撓曲量放大示出。藉由檢測儀40的第1位移計42a、第2位移計42b及第3位移計42c而檢測該基準面31的高度並進行零點校正。藉此,在基準面31上設定有零點A0
、零點B0
及零點C0
。FIG. 7B is a schematic diagram showing the positional relationship between the
將通過零點B0
並平行於z軸之直線與連接零點A0
和零點C0
之線段的交點設為第2位移計42b的真零點B01
。將零點B0
與真零點B01
的距離設為零點偏移量g0
。基準面31的撓曲形狀能夠由式(3)藉由計算而求出,由於定義該形狀之資訊預先存儲在控制裝置20(圖1A)中,因此能夠藉由計算而求出零點偏移量g0
。控制裝置20存儲藉由計算而求出之零點偏移量g0
。為了嚴格地計算真零點B01
處的工件12的上表面的直線度,使用真零點B01
作為第2位移計42b的零點為較佳。亦即,對偏移量g(圖2)進行相當於零點偏移量g0
之校正為較佳。具體而言,由以下式來代替式(1)而計算偏移量g為較佳。 The intersection of the straight line passing through the zero point B 0 and parallel to the z-axis and the line segment connecting the zero point A 0 and the zero point C 0 is defined as the true zero point B 01 of the
其次,參閱圖8A~圖9B,對為了確認基準器30的撓曲形狀不受工件12的上表面的凹凸的影響而進行之評價實驗及其結果進行說明。Next, with reference to FIGS. 8A to 9B , an evaluation experiment and results of an evaluation experiment performed to confirm that the deflection shape of the
圖8A~圖8C係表示當進行評價實驗時的工件12、基準器30及檢測儀40的位置關係之圖。首先,如圖8A所示,將基準器30放置在工件12的區域R1上,並由進行零點校正之檢測儀40使用式(1)來測量偏移量g(圖2)。在區域R1內使基準器30移動,並使用式(1)來測量複數次偏移量g。8A to 8C are diagrams showing the positional relationship of the
其次,如圖8B所示,使基準器30在工件12的區域R2上移動,並以相同之方式複數次測量偏移量g。此外,如圖8C所示,使基準器30在工件12的區域R3上移動,並以相同之方式複數次測量偏移量g。Next, as shown in FIG. 8B, the
圖9A係表示使用不具有支腳部33之長方體形狀的基準器30來測量之偏移量g的分佈之圖表。圖9B係使用在實施例的形狀測量裝置中使用之基準器30(圖5)亦即具有支腳部33之基準器30來測量之偏移量g的分佈之圖表。圖9A及圖9B的圖表的橫軸對應於區域R1、R2、R3,縱軸表示偏移量g。圖表中的一個黑色圓圈符號表示藉由一次測量而計算出之偏移量g。在一個區域內顯示有複數個黑色圓圈符號,係因為在每個區域R1、R2、R3中使基準器30在區域內移動並進行了複數次測量。FIG. 9A is a graph showing the distribution of the offset amount g measured using the
在使用不具有支腳部33之基準器30之情況下,如圖9A所示,在將基準器30放置在區域R1上測量之情況和放置在區域R2或R3上測量之情況下,在偏移量g上產生大的差異。總體上,在偏移量g上產生約0.075μm左右的偏差。這意味著,基準器30撓曲後的基準面31的形狀根據設置基準器30的位置而不同。In the case of using the
相對於此,在使用具有支腳部33之基準器30之情況下,如圖9B所示,即使將基準器30放置在區域R1、R2、R3中的任一個區域上,在偏移量g上亦不會產生大的差異。偏移量g的偏差在0.02μm以下範圍內。這意味著,基準器30撓曲後的基準面31的形狀不取決於設置基準器30的位置而大致恆定。又,偏移量g的計算值與零點偏移量g0
(圖7B)大致相等。On the other hand, when the
根據圖8A~圖9B中所示出之評價實驗確認到,藉由使用具有支腳部33之基準器30,基準器30的撓曲形狀幾乎不取決於支撐基準器30之支撐表面的凹凸形狀。It was confirmed from the evaluation experiments shown in FIGS. 8A to 9B that, by using the
其次,參閱圖10~圖11B,對由實施例的形狀測量裝置來測量工件12(圖1A)的上表面的直線度之方法進行說明。Next, referring to FIGS. 10 to 11B , a method of measuring the straightness of the upper surface of the workpiece 12 ( FIG. 1A ) by the shape measuring apparatus of the embodiment will be described.
圖10係實施例的形狀測量方法的流程圖。
若工件12的研磨結束,則操作人員將檢測儀40安裝於砂輪頭15(步驟SA01),並將基準器30設置於工件12的上表面(步驟SA02)。然後,利用基準器30的基準面31進行檢測儀40的零點校正。若檢測儀40的零點校正結束,則從工件12的上表面移除基準器30。FIG. 10 is a flowchart of the shape measurement method of the embodiment.
When the grinding of the
使砂輪頭15(圖1A)在y軸方向上移動至工件12的測量部位(步驟SA05)。然後,測量工件12的上表面的沿著平行於x軸方向之一條線之直線度(步驟SA06)。具體而言,控制裝置20(圖1A)一邊使工件12在x軸方向上移動,一邊從檢測儀40的第1位移計42a、第2位移計42b及第3位移計42c以一定的時間間隔獲取測定值。根據所獲取之測定值,並藉由參閱圖2已說明之逐次三點法而求出工件12的上表面的形狀。此時,使用式(4)來計算偏移量g。The grinding wheel head 15 (FIG. 1A) is moved to the measurement position of the
在測量工件12的上表面的沿著一條線之直線度之後,將測量結果輸出到輸入輸出裝置21(圖1A)(步驟SA07)。在測量沿著另一條線之直線度之情況下,重複進行從將基準器30設置於工件12的上表面之製程(步驟SA02)到輸出測量結果之製程(步驟SA07)(步驟SA08)。在測量工件12的上表面的應測量的沿著所有線之直線度之後結束測量。After measuring the straightness along a line of the upper surface of the
圖11A係表示控制裝置20在輸入輸出裝置21的顯示器上顯示之控制窗口的圖像之圖。控制窗口包括測定值顯示視窗22、基本設定視窗23及校正視窗24。此外,在控制窗口上顯示測定開始按鈕26。FIG. 11A is a diagram showing an image of a control window displayed on the display of the input/
在測定值顯示視窗22中包括顯示第1位移計42a、第2位移計42b及第3位移計42c的測定值之輸出字段。在基本設定的視窗23中顯示工件12的長度(x軸方向的尺寸)、測量時可動工作台10的移動速度、輸入測定往復次數的資料輸入字段。測定往復次數例如以下拉選單形式被輸入。在校正視窗24中顯示有顯示零點值之輸出字段及校正開始按鈕25。The measured
若操作人員選擇校正開始按鈕25,則控制裝置20(圖1A)進行檢測儀40的零點校正(步驟SA03)。按鈕的選擇例如藉由將滑鼠的指標對準按鈕點擊滑鼠之操作、觸摸按鈕之操作等而進行。在零點的輸出字段中顯示使用式(1)來計算出之偏移量g值。在進行了零點校正之時刻,由於距離Da
、Db
、Dc
(圖2)全部重置為零,因此在零點的輸出字段中顯示之數值成為0。When the operator selects the
若操作人員選擇測定開始按鈕26,則控制裝置20執行工件12的上表面的沿著一條線之直線度的測量(步驟SA06)。When the operator selects the
圖11B係表示在輸入輸出裝置21的顯示器上顯示之測量結果的圖像的一例之圖。在顯示器上,以圖表形式顯示工件12的上表面在高度方向上的位置。橫軸表示工件12在長度方向(x軸方向)上的位置,縱軸表示表面位移量(z軸方向上的位置)。另外,高度變動的線性成分被去除,表面位移量被校正為使工件12的兩端的高度均成為0。在圖11B中示出中央部分具有比兩端低的形狀之示例。工件12的上表面在從0起的位移量最大的位置(圖11B中曲線的最低點)上的值的絕對值相當於直線度的幾何公差。在圖11B所示例中,直線度的幾何公差約為22μm。FIG. 11B is a diagram showing an example of an image of the measurement result displayed on the display of the input/
其次,對上述實施例的優異之效果進行說明。
在上述實施例中,當零點校正時,基準器30的撓曲形狀不取決於設置基準器30之工件12上的位置而恆定。因此,能夠使三個零點A0
、B0
、C0
的相對位置關係恆定。此外,在上述實施例中,第1位移計42a的零點A0
、第2位移計42b的真零點B01
及第3位移計42c的零點C0
位於一條直線上。藉由以位於一條直線上之三個零點A0
、B01
、C0
為基準而測量工件12的上表面的直線度,能夠提高直線度的測量精度。Next, the excellent effect of the above-mentioned embodiment will be described. In the above-described embodiment, when the zero point is corrected, the deflection shape of the
其次,參閱圖12~圖14,對另一實施例的形狀測量裝置及形狀測量方法進行說明。以下,對於與圖1A~圖11B所示之實施例相同之結構省略進行說明。Next, referring to FIGS. 12 to 14 , a shape measuring apparatus and a shape measuring method according to another embodiment will be described. Hereinafter, descriptions of the same structures as those of the embodiment shown in FIGS. 1A to 11B are omitted.
圖12係本實施例的形狀測量方法的流程圖。
在圖10所示之實施例中,每次測量工件12的上表面的沿著一條線之直線度時(步驟SA06),在測量之前進行檢測儀40的零點校正(步驟SA03)。相對於此,在圖12所示之實施例中,在基於溫度感測器45(圖1B)之當前時刻的溫度測定值與上一次進行了零點校正時的溫度測定值之差為閾值以下的情況下,省略零點校正處理(步驟SA02~SA04)(步驟SA10)。僅在基於溫度感測器45(圖1B)之當前時刻的溫度測定值與上一次進行了零點校正時的溫度測定值之差超過閾值之情況下,再次執行零點校正處理(步驟SA02~ SA04)。FIG. 12 is a flowchart of the shape measurement method of the present embodiment.
In the embodiment shown in FIG. 10, each time the straightness of the upper surface of the
圖13係表示控制裝置20在輸入輸出裝置21(圖1A)的顯示器上顯示之控制窗口的圖像之圖。在本實施例中,在校正視窗24內,除了零點輸出字段及校正開始按鈕25以外,還顯示分別顯示校正時溫度、校正時刻及當前溫度之輸出字段。還顯示溫度測定按鈕27。FIG. 13 is a diagram showing an image of a control window displayed by the
在校正時溫度的輸出字段中,控制裝置20顯示當最近零點校正時由溫度感測器45測定之溫度測定值。在校正時刻的輸出字段中,控制裝置20顯示最近零點校正時的時刻。在當前溫度的輸出字段中,控制裝置20顯示由溫度感測器45測定之當前時刻的溫度測定值。若操作人員選擇溫度測定按鈕27,則控制裝置20從溫度感測器45獲取當前時刻的溫度測定值,並更新顯示於當前溫度的輸出字段中之測定值。In the output field of the temperature at the time of calibration, the
在最近零點校正時溫度與當前溫度之差超過閾值之情況下,控制裝置20在校正視窗24內顯示督促再次執行零點校正之訊息28。另外,可以代替訊息28而輸出其他警報資訊,例如提高零點校正效率之聲音、警報聲等。When the difference between the temperature during the latest zero-point calibration and the current temperature exceeds the threshold, the
圖14係表示工件12的上表面的直線度的幾何公差的測量結果及由溫度感測器45(圖1B)測定之溫度的測定值的經時變化之圖表。進行10次對工件12的上表面的沿著平行於x軸之六條線L1~L6中的每條線之直線度進行測量之處理,並針對每個測量處理求出直線度的幾何公差。圖14所示之複數個黑色圓圈符號中的每一個表示藉由一次測量處理而得到之直線度的幾何公差的計算結果。FIG. 14 is a graph showing changes over time in the measurement result of the geometrical tolerance of the straightness of the upper surface of the
在測量沿著線L1之直線度之前,進行了檢測儀40的零點校正。然後,從測量沿著線L1之直線度到測量沿著線L5之直線度為止,未進行檢測儀40的零點校正。在測量沿著線L5之直線度之後,在測量沿著線L6之直線度之前進行了檢測儀40的零點校正。Before measuring the straightness along the line L1, a zero point calibration of the
在從開始測量沿著線L1之直線度時到結束測量沿著線L4之直線度為止的期間,基於溫度感測器45之溫度測定值幾乎不變。在從溫度幾乎恆定的期間測量之線L1到線L4為止,沿著每條線之直線度的幾何公差的測量值大致恆定。During the period from when the measurement of the straightness along the line L1 is started to when the measurement of the straightness along the line L4 is completed, the temperature measurement value by the
在測量沿著線L4之直線度之後,溫度因外部因素而開始上升。若在溫度上升之狀態下測量沿著線L5之直線度,則直線度的幾何公差的測量值從在溫度上升之前測量之直線度的幾何公差大幅發生變化。After measuring the straightness along line L4, the temperature starts to rise due to external factors. When the straightness along the line L5 is measured in a state where the temperature rises, the measured value of the geometrical tolerance of the straightness greatly changes from the geometrical tolerance of the straightness measured before the temperature rises.
當再次執行零點校正而測量沿著線L6之直線度的幾何公差時,得到與溫度上升之前測量之沿著線L1~L4中的每條線之直線度的幾何公差的測量值大致相等的測量值。另外,在測量沿著線L5之直線度之後,溫度因外部因素而稍微下降,但是維持比測量沿著線L1~L4中的每條線之直線度時的溫度更高的狀態。When the zero point correction is performed again to measure the geometrical tolerance of the straightness along the line L6, a measurement approximately equal to the measured value of the geometrical tolerance of the straightness along each of the lines L1 to L4 measured before the temperature rise is obtained value. In addition, after measuring the straightness along the line L5, the temperature was slightly lowered due to external factors, but remained higher than when the straightness along each of the lines L1 to L4 was measured.
從圖14所示之測量結果,得到以下兩種見解。
第一,若檢測儀40周圍的溫度沒有變動,則不進行零點校正便能夠高精度地測量直線度。第二,在檢測儀40周圍的溫度發生一定程度的變化之情況下,直線度的測量精度下降,但是藉由再次執行零點校正,能夠使直線度的測量精度恢復到原始的高精度。From the measurement results shown in Fig. 14, the following two insights were obtained.
First, if the temperature around the
其次,對圖12~圖14所示之實施例的優異之效果進行說明。
在本實施例中,如圖13所示,在輸入輸出裝置21(圖1A)的顯示器上顯示最近零點校正時的溫度及當前時刻的溫度。操作人員查看該溫度顯示便能夠容易判斷是否再次進行零點校正。具體而言,若溫度變化超過閾值,則可以再次執行零點校正。該閾值可以根據在直線度的測量中所要求之精度而預先確定。例如,作為閾值,可以設定為0.5℃。又,藉由顯示訊息28以督促進行零點校正,能夠預先防止操作人員忘記執行零點校正的情況。Next, the excellent effects of the embodiments shown in FIGS. 12 to 14 will be described.
In this embodiment, as shown in FIG. 13 , the temperature at the time of the latest zero point correction and the temperature at the current time are displayed on the display of the input/output device 21 ( FIG. 1A ). The operator can easily judge whether to perform zero calibration again by viewing the temperature display. Specifically, if the temperature change exceeds the threshold, the zero point correction can be performed again. The threshold value can be predetermined according to the required accuracy in the measurement of straightness. For example, as the threshold value, it can be set to 0.5°C. In addition, by displaying the
又,在本實施例中,顯示最近進行了零點校正之時刻。在檢測儀40具有因某種因素而隨著時間的經過在測定值中產生浮動之特性之情況下,操作人員根據從最近進行了零點校正之時刻起的經過時間,能夠判斷是否應該再次執行零點校正。In addition, in this embodiment, the time when the zero point correction was performed most recently is displayed. When the
此外,在本實施例中,如圖12所示,在溫度變化為閾值以下的情況下不進行零點校正,而測量工件12的上表面的沿著下一條線之直線度,因此能夠縮短在測量一個工件12的上表面的直線度時所需的總時間。In addition, in this embodiment, as shown in FIG. 12 , when the temperature change is below the threshold value, the zero point correction is not performed, and the straightness of the upper surface of the
其次,參閱圖15A及圖15B,對又一實施例的形狀測量裝置進行說明。以下,對於與圖1A~圖11B所示之實施例相同之結構省略進行說明。Next, referring to FIGS. 15A and 15B , a shape measuring apparatus according to another embodiment will be described. Hereinafter, descriptions of the same structures as those of the embodiment shown in FIGS. 1A to 11B are omitted.
圖15A係表示控制裝置20在輸入輸出裝置21(圖1A)的顯示器上顯示之控制窗口的圖像之圖。在本實施例中,在控制窗口內顯示過去測量結果的視窗29。在過去測量結果的視窗29內顯示“選擇過去測量結果”按鈕。FIG. 15A is a diagram showing an image of a control window displayed by the
若操作人員選擇“選擇過去測量結果”按鈕,則控制裝置20(圖1A)將過去測量並存儲之直線度的測量資料的存儲位置的列表顯示於顯示器。操作人員能夠從該列表中選擇至少一個直線度的測量資料。If the operator selects the button of "select past measurement results", the control device 20 (FIG. 1A) displays a list of storage locations of the measurement data of the straightness measured in the past and stored on the display. The operator can select at least one straightness measurement from this list.
圖15B係表示在輸入輸出裝置21(圖1A)的顯示器上顯示之圖像的一例之圖。在圖11B所示之實施例中,相當於在當前時刻測量之直線度之表面形狀以圖表形式顯示於顯示器。相對於此,在本實施例中,在當前時刻測量之直線度和操作人員選擇之過去測量之直線度作為表面位移量的分佈而重疊顯示於一個圖表上。在圖15B中,粗實線及細實線分別表示在當前時刻測量之直線度及過去測量之直線度。FIG. 15B is a diagram showing an example of an image displayed on the display of the input/output device 21 ( FIG. 1A ). In the embodiment shown in FIG. 11B, the surface shape corresponding to the straightness measured at the current time is displayed on the display in the form of a graph. On the other hand, in this embodiment, the straightness measured at the current time and the straightness measured in the past selected by the operator are superimposed and displayed on one graph as the distribution of the surface displacement amount. In FIG. 15B , the thick solid line and the thin solid line represent the straightness measured at the current moment and the straightness measured in the past, respectively.
其次,對本實施例的優異之效果進行說明。
在本實施例中,操作人員能夠容易比較在當前時刻測量之工件12的上表面的直線度和過去測量之工件12的上表面的直線度。例如,在對一個工件12進行第一次研磨加工之後,增大砂輪16的切入深度而進行第二次研磨加工之情況下,能夠容易比較第一次研磨加工之後的直線度和第二次研磨加工之後的直線度。該比較結果作為推定追加研磨加工的必要性、或進行追加研磨加工時之加工條件例如砂輪16的追加切入深度之基礎資訊係有利的。Next, the excellent effects of the present embodiment will be described.
In the present embodiment, the operator can easily compare the straightness of the upper surface of the
其次,參閱圖16A~圖16D,對圖5所示之實施例的變形例的基準器30進行說明。Next, referring to FIGS. 16A to 16D , the
圖16A~圖16D係從斜下方觀察圖5所示之實施例的變形例的基準器30之立體圖。在圖5所示之實施例中,半球狀的三個支腳部33被安裝於主體構件32的底面的在長度方向上的兩端。相對於此,在圖16A所示之變形例中,三個支腳部33安裝在比主體構件32的底面的在長度方向上的兩端稍微靠內側的位置。與圖5所示之實施例同樣,三個支腳部33中的兩個支腳部33安裝於在長度方向上相同之位置。因此,基準器30在長度方向上的兩個部位支撐於工件12的上表面。16A to 16D are perspective views of the
在圖16B所示之變形例中,支腳部33具有在主體構件32的寬度方向上長的長方體形狀。兩個支腳部33分別被安裝於主體構件32的底面的在長度方向上的兩端。即使在圖16B所示之變形例中,基準器30亦在長度方向上的兩個部位支撐於工件12的上表面。In the modification shown in FIG. 16B , the
在圖16C所示之變形例中,支腳部33具有在主體構件32的寬度方向上長的半圓柱形狀。兩個支腳部33以圓柱面朝下方的姿勢分別安裝於主體構件32的底面的在長度方向上的兩端。即使在圖16C所示之變形例中,基準器30亦在長度方向上的兩個部位支撐於工件12的上表面。另外,在圖16B所示之變形例中,支腳部33面接觸於工件12,但是在圖16C所示之變形例中,支腳部33線接觸於工件12。因此,在圖16C所示之變形例中,與圖16B所示之變形例相比,能夠將基準器30更穩定地支撐於工件12的上表面。另外,支腳部33的形狀未必一定是半圓柱狀,只要是在與主體構件32的寬度方向平行之直線上與平面線接觸之形狀即可。In the modification shown in FIG. 16C , the
在圖16D所示之變形例中,半球狀的四個支腳部33被安裝於主體構件32的底面的四個角。即使在圖16D所示之變形例中,基準器30在長度方向上的兩個部位支撐於工件12的上表面。In the modification shown in FIG. 16D , four
如上前述,即使在圖16A~圖16D所示之變形例中,基準器30亦具有在長度方向上的兩個部位支撐之支撐結構。因此,與圖5所示之實施例的情況同樣,在設置於工件12的上表面上之狀態下,基準面31的撓曲形狀不取決於工件12的上表面的凹凸形狀。因此,藉由使用基準器30以參閱圖7B已說明之方法進行檢測儀40的零點校正,能夠將零點偏移量g0
確定為使三個第1位移計42a的零點A0
、第2位移計42b的真零點B01
及第3位移計42c的零點C0
位於一條直線上。As described above, even in the modified example shown in FIGS. 16A to 16D , the
其次,參閱圖17A及圖17B,對圖5所示之實施例的另一變形例的基準器30進行說明。Next, referring to FIGS. 17A and 17B , a
圖17A係失重狀態下之基準器30的側視圖,圖17B係設置於工件12的上表面上之狀態下之基準器30的側視圖。在圖5所示之實施例中,在將基準器30設置於工件12的上表面上之狀態下,在基準面31上產生朝下方凸出之撓曲。相對於此,在本變形例中,在失重狀態下,基準面31(圖17A)以朝上方凸出之方式彎曲。若將基準器30設置於工件12的上表面上,則因自重而在基準器30上產生撓曲。撓曲後的基準面31(圖17B)的形狀成為在幾何學上正確之平面。FIG. 17A is a side view of the
在圖17A及圖17B所示之變形例中,在將基準器30設置於工件12的上表面上之狀態下,基準面31成為平面,因此檢測儀40的零點偏移量g0
成為0。因此,不使用式(4)而能夠使用式(1)來計算偏移量g。In the modification shown in FIGS. 17A and 17B , the
在上述實施例中,檢測儀40具有第1位移計42a、第2位移計42b及第3位移計42c共計三個位移計,但是亦可構成為具有四個以上的位移計。In the above-described embodiment, the
上述各實施例及變形例係示例,當然,在不同實施例中所示結構能夠部分替換或組合。關於複數個實施例的基於相同結構的相同之作用效果,對每個實施例不逐一說明。此外,本發明並非係受上述實施例的限制者。對於本領域技術人員而言,很顯然能夠進行各種變更、改進、組合等。The above embodiments and modifications are examples. Of course, the structures shown in different embodiments can be partially replaced or combined. The same functions and effects based on the same structure of the plurality of embodiments will not be described one by one for each embodiment. In addition, the present invention is not limited by the above-mentioned embodiments. It will be apparent to those skilled in the art that various alterations, improvements, combinations and the like can be made.
10:可動工作台
11:工作台引導機構
12:工件
15:砂輪頭
16:砂輪
18:導軌
20:控制裝置
21:輸入輸出裝置
22:測定顯示視窗
23:基本設定視窗
24:校正視窗
25:校正開始按鈕
26:測定開始按鈕
27:溫度測定按鈕
28:督促零點校正之訊息
29:過去測量結果視窗
30:基準器
31:基準面
32:主體構件
33:支腳部
40:檢測儀
41:支撐基座
42a:第1位移計
42b:第2位移計
42c:第3位移計
45:溫度感測器10: Movable workbench
11: Workbench guide mechanism
12: Workpiece
15: Wheel head
16: Grinding wheel
18: Rails
20: Control device
21: Input and output device
22: Measurement display window
23: Basic Settings Window
24: Correction window
25: Calibration start button
26: Measurement start button
27: Temperature measurement button
28: Message to urge zero point calibration
29: Past measurement results window
30: Benchmark
31: Datum plane
32: Main components
33: Legs
40: Detector
41:
[圖1A]係組裝有實施例的形狀測量裝置之研磨裝置的立體圖,[圖1B]係在砂輪頭上安裝有檢測儀之狀態下之檢測儀的側視圖。 [圖2]係表示測量對象亦即工件的上表面及檢測儀之示意圖。 [圖3]係表示檢測儀的第1位移計、第2位移計、第3位移計與基準器的位置關係之示意圖。 [圖4A]及[圖4B]係在將比較例的檢測儀的校正方法中使用之基準器放置在工件上表面上之狀態的剖面圖。 [圖5]係從斜下方觀察在實施例的形狀測量裝置中使用之基準器之立體圖。 [圖6A]及[圖6B]係將在實施例的形狀測量裝置中使用之基準器放置在工件的上表面上之狀態的剖面圖。 [圖7A]係具有兩端支撐均布荷重的樑結構之基準器的示意圖,[圖7B]係表示在實施例的形狀測量裝置中使用之基準器與檢測儀的位置關係之示意圖。 [圖8A~圖8C]係評價實驗中之工件、基準器及檢測儀的位置關係之圖。 [圖9A]係表示使用不具有支腳部之長方體形狀的基準器來測量之偏移量g的分佈之圖表,[圖9B]係表示使用在實施例的形狀測量裝置中使用之基準器(圖5)亦即具有支腳部之基準器來測量之偏移量g的分佈之圖表。 [圖10]係實施例的形狀測量方法的流程圖。 [圖11A]係表示控制裝置在輸入輸出裝置的顯示器上顯示之控制窗口的圖像之圖,[圖11B]係表示在輸入輸出裝置的顯示器上顯示之測量結果的圖像的一例之圖。 [圖12]係另一實施例的形狀測量方法的流程圖。 [圖13]係表示圖12所示之實施例的控制裝置在輸入輸出裝置(圖1A)的顯示器上顯示之控制窗口的圖像的一例之圖。 [圖14]係表示工件上表面的直線度的幾何公差的測量結果、及由溫度感測器(圖1B)測定之溫度測定值的經時變化之圖表。 [圖15A]係表示又一實施例的形狀測量裝置的控制裝置在輸入輸出裝置(圖1A)的顯示器上顯示之控制窗口的圖像的一例之圖,[圖15B]係在輸入輸出裝置(圖1A)的顯示器上顯示之圖像的一例之圖。 [圖16A~圖16D]係從斜下方觀察圖5所示之實施例的變形例的基準器之立體圖。 [圖17A]係圖5所示之實施例的另一變形例的基準器在失重狀態下之側視圖,[圖17B]係設置於工件上表面上之狀態下的基準器的側視圖。FIG. 1A is a perspective view of a grinding device incorporating the shape measuring device of the embodiment, and FIG. 1B is a side view of the tester in a state where the tester is attached to the grinding wheel head. Fig. 2 is a schematic diagram showing the upper surface of the workpiece, which is the measurement object, and the detector. Fig. 3 is a schematic diagram showing the positional relationship between the first displacement gauge, the second displacement gauge, the third displacement gauge, and the reference device of the detector. [ Fig. 4A ] and [ Fig. 4B ] are cross-sectional views of a state in which a reference device used in the calibration method of the detector of the comparative example is placed on the upper surface of the workpiece. [ Fig. 5] Fig. 5 is a perspective view of the reference tool used in the shape measuring device of the embodiment as viewed obliquely from below. [ Fig. 6A ] and [ Fig. 6B ] are cross-sectional views of a state in which the reference tool used in the shape measuring device of the embodiment is placed on the upper surface of the workpiece. Fig. 7A is a schematic diagram of a datum having a beam structure supporting uniformly distributed loads at both ends, and [ Fig. 7B ] is a schematic diagram showing the positional relationship between the datum and the detector used in the shape measuring device of the embodiment. [FIG. 8A to FIG. 8C] are diagrams showing the positional relationship between the workpiece, the benchmark, and the detector in the evaluation experiment. [ Fig. 9A ] is a graph showing the distribution of the offset amount g measured using a reference device having a rectangular parallelepiped shape without legs, and [ Fig. 9B ] is a graph showing a reference device ( Fig. 5) is a graph of the distribution of the offset g measured by the reference device with the feet. 10 is a flowchart of the shape measurement method of the embodiment. 11A is a diagram showing an image of a control window displayed by the control device on the display of the input/output device, and [ FIG. 11B ] is a diagram showing an example of an image of a measurement result displayed on the display of the input/output device. [ Fig. 12 ] A flowchart of a shape measurement method according to another embodiment. 13 is a diagram showing an example of an image of a control window displayed on the display of the input/output device ( FIG. 1A ) by the control device of the embodiment shown in FIG. 12 . [ Fig. 14 ] It is a graph showing the measurement result of the geometrical tolerance of the straightness of the upper surface of the workpiece and the time-dependent change of the temperature measurement value measured by the temperature sensor ( Fig. 1B ). [ Fig. 15A ] A diagram showing an example of an image of a control window displayed on the display of the input/output device ( Fig. 1A ) by the control device of the shape measuring device according to another embodiment, and [ Fig. 15B ] A diagram of an example of an image displayed on the display of FIG. 1A). 16A to 16D are perspective views of a reference device of a modification example of the embodiment shown in FIG. 5 as viewed obliquely from below. [ Fig. 17A ] is a side view of the reference device in a weightless state according to another modification of the embodiment shown in Fig. 5 , and [ Fig. 17B ] is a side view of the reference device in a state of being installed on the upper surface of a workpiece.
12:工件12: Workpiece
30:基準器30: Benchmark
31:基準面31: Datum plane
32:主體構件32: Main components
33:支腳部33: Legs
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| US8899535B2 (en) * | 2012-04-05 | 2014-12-02 | The Boeing Company | Mount for a calibration standard |
| WO2014100598A1 (en) * | 2012-12-21 | 2014-06-26 | Hexagon Metrology, Inc. | Calibration artifact and method of calibrating a coordinate measuring machine |
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| JP7296334B2 (en) * | 2020-03-26 | 2023-06-22 | 住友重機械工業株式会社 | Straightness measurement system, displacement sensor calibration method, and straightness measurement method |
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