[go: up one dir, main page]

TWI777205B - Calibration method of shape measuring device, reference device and detector - Google Patents

Calibration method of shape measuring device, reference device and detector Download PDF

Info

Publication number
TWI777205B
TWI777205B TW109125939A TW109125939A TWI777205B TW I777205 B TWI777205 B TW I777205B TW 109125939 A TW109125939 A TW 109125939A TW 109125939 A TW109125939 A TW 109125939A TW I777205 B TWI777205 B TW I777205B
Authority
TW
Taiwan
Prior art keywords
detector
displacement
workpiece
shape
straightness
Prior art date
Application number
TW109125939A
Other languages
Chinese (zh)
Other versions
TW202118580A (en
Inventor
高娜
市原浩一
Original Assignee
日商住友重機械工業股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商住友重機械工業股份有限公司 filed Critical 日商住友重機械工業股份有限公司
Publication of TW202118580A publication Critical patent/TW202118580A/en
Application granted granted Critical
Publication of TWI777205B publication Critical patent/TWI777205B/en

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042Calibration or calibration artifacts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/22Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapers; for testing the alignment of axes
    • G01B21/24Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapers; for testing the alignment of axes for testing alignment of axes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02049Interferometers characterised by particular mechanical design details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056Passive reduction of errors
    • G01B9/02061Reduction or prevention of effects of tilts or misalignment

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

[課題] 本發明提供一種形狀測量裝置,其在檢測儀的零點校正中不易產生零點位置的偏差。 [解決手段] 檢測儀包括排成一列之至少三個位移計,並藉由與測量對象物對向配置而檢測從至少三個位移計到測量對象物為止的距離的位移。藉由基準器支撐於支撐構件上而提供檢測儀的校正用基準面。控制裝置校正基準器。基準器具有在至少三個位移計排列之方向上在兩個部位支撐於支撐構件上之支撐結構。控制裝置在使至少三個位移計對向基準面之狀態下校正檢測儀。[Problem] The present invention provides a shape measuring device that is less likely to cause a deviation in the zero point position during zero point calibration of a detector. [Solution] The detector includes at least three displacement gauges arranged in a row, and is arranged to face the measurement object to detect the displacement of the distance from the at least three displacement gauges to the measurement object. A reference plane for calibration of the detector is provided by the reference device being supported on the support member. The control unit calibrates the reference. The reference device has a support structure supported on the support member at two locations in the direction in which the at least three displacement gauges are arranged. The control device calibrates the detectors in a state in which at least three displacement gauges face the reference plane.

Description

形狀測量裝置、基準器及檢測儀的校正方法Calibration method of shape measuring device, reference device and detector

本發明係關於形狀測量裝置、搭載於形狀測量裝置上之檢測儀的校正方法及用於校正該檢測儀之基準器。The present invention relates to a shape measuring device, a method for calibrating a detector mounted on the shape measuring device, and a reference device for calibrating the detector.

作為測量研磨對象物亦即工件上表面的直線度之方法,已知有一種在機測量方法,其利用研磨裝置的工件進給功能,在砂輪頭上安裝位移計而掃描加工表面。在機測量方法中,通常利用使用包括三個位移計之檢測儀之逐次三點法(例如專利文獻1)。在逐次三點法中,同時測量位於工件上表面的一條直線上之三點的高度方向的位置,根據測量結果求出平面的局部彎曲程度(曲率)。將該曲率進行二階積分並藉由計算而求出工件上表面的直線度。直線度係指目標形狀從幾何學上正確之直線偏離的程度。測量工件上表面的直線度等同於測量與工件上表面的高度方向有關的凹凸形狀。As a method of measuring the straightness of the upper surface of a workpiece, which is an object to be polished, there is known an on-machine measurement method in which a displacement gauge is attached to a grinding wheel head to scan the machined surface by utilizing the workpiece feeding function of a polishing apparatus. In the machine measurement method, the successive three-point method using a detector including three displacement gauges is generally used (for example, Patent Document 1). In the successive three-point method, the positions in the height direction of three points on a straight line on the upper surface of the workpiece are simultaneously measured, and the local curvature (curvature) of the plane is obtained from the measurement results. The straightness of the upper surface of the workpiece is obtained by calculating the second-order integral of the curvature. Straightness is the degree to which a target shape deviates from a geometrically correct straight line. Measuring the straightness of the upper surface of the workpiece is equivalent to measuring the concavo-convex shape related to the height direction of the upper surface of the workpiece.

為了對測量對象物表面的直線度高精度地進行測量,需要進行檢測儀的零點校正,以使三個位移計的零點位於幾何學上正確之平面上。為了進行檢測儀的零點校正而使用具有高直線度之基準面之基準器。當測量藉由研磨裝置而被研磨之工件上表面的直線度時,例如,在研磨後的工件的上表面放置基準器而進行檢測儀的零點校正,以使三個位移計的零點位於基準面上。 [先前技術文獻]In order to measure the straightness of the surface of the object to be measured with high accuracy, it is necessary to calibrate the zero point of the detector so that the zero points of the three displacement meters are located on a geometrically correct plane. A datum with a highly straight datum surface is used for zero calibration of the detector. When measuring the straightness of the upper surface of the workpiece ground by the grinding device, for example, a reference device is placed on the upper surface of the ground workpiece to perform zero point correction of the detector so that the zero points of the three displacement gauges are located on the reference plane superior. [Prior Art Literature]

[專利文獻1] 日本特開2016-166873號公報[Patent Document 1] Japanese Patent Laid-Open No. 2016-166873

[發明所欲解決之問題][Problems to be Solved by Invention]

在進行檢測儀的零點校正之後,若將基準器設置於工件上的其他位置而測量基準面的直線度,則理想的係直線度的幾何公差成為零。然而,明確得知若改變設置基準器之位置而測量基準面的直線度,則有基準面的直線度的幾何公差不為零的情況。這意味著根據放置基準器的位置而導致在零點校正後的零點的位置上產生偏差。若不進行高精度的零點校正,則會導致工件上表面的直線度的測量精度下降。After the zero point calibration of the detector is performed, if a reference is installed at another position on the workpiece and the straightness of the reference surface is measured, the geometrical tolerance of the ideal straightness becomes zero. However, it is clearly known that when the straightness of the reference plane is measured by changing the position where the reference device is installed, the geometrical tolerance of the straightness of the reference plane may not be zero. This means that there is a deviation in the position of the zero point after zero point correction depending on the position where the datum is placed. If high-precision zero point calibration is not performed, the measurement accuracy of the straightness of the upper surface of the workpiece will decrease.

本發明的目的係在於提供一種在檢測儀的零點校正中不易產生零點位置的偏差之形狀測量裝置及檢測儀的校正方法。本發明的另一個目的係在於提供一種可適用於該校正方法中之基準器。 [解決問題之技術手段]The object of the present invention is to provide a shape measuring device and a calibration method of the detector which are less likely to produce a deviation of the zero point position in the zero point calibration of the detector. Another object of the present invention is to provide a reference device applicable to the calibration method. [Technical means to solve problems]

根據本發明的一觀點,提供一種形狀測量裝置,其具有: 檢測儀,係包括排成一列之至少三個位移計,並藉由與測量對象物對向配置而檢測從前述至少三個位移計到前述測量對象物為止的距離的位移; 基準器,係藉由支撐於支撐構件上而提供前述檢測儀的校正用基準面;以及 控制裝置,係校正前述基準器, 前述基準器具有在前述至少三個位移計排列之方向上在兩個部位支撐於前述支撐構件上之支撐結構, 前述控制裝置在使前述至少三個位移計對向前述基準面之狀態下校正前述檢測儀。According to an aspect of the present invention, there is provided a shape measuring device, which has: a detector comprising at least three displacement gauges arranged in a row, and by being arranged opposite to the measurement object, to detect the displacement of the distance from the at least three displacement gauges to the measurement object; a datum, which is supported on a support member to provide a reference plane for calibration of the aforementioned detector; and control means for calibrating the aforesaid reference device, The reference device has a support structure supported on the support member at two locations in the direction in which the at least three displacement gauges are arranged, The control device calibrates the detector in a state in which the at least three displacement gauges face the reference plane.

根據本發明的另一觀點,提供一種形狀測量裝置,其具有: 檢測儀,係包括排成一列之至少三個位移計,並藉由與測量對象物對向配置而檢測從前述至少三個位移計的每一個到測量對象物為止的距離的位移; 基準器,係藉由支撐於支撐構件上而提供用於校正前述檢測儀的基準面;及 控制裝置,係校正前述基準器, 在將前述基準器支撐於前述支撐構件上之狀態下,因自重而產生撓曲,產生撓曲之狀態下的前述基準面的形狀具有不受前述支撐構件上表面的凹凸的影響之結構, 前述控制裝置在使前述至少三個位移計對向前述基準面之狀態下校正前述檢測儀。According to another aspect of the present invention, there is provided a shape measuring device having: a detector comprising at least three displacement gauges arranged in a row, and by being disposed opposite to the measurement object, to detect the displacement of the distance from each of the at least three displacement gauges to the measurement object; a datum that provides a datum for calibrating the detector by being supported on a support member; and control means for calibrating the aforesaid reference device, In a state where the reference tool is supported on the support member, deflection occurs due to its own weight, and the shape of the reference surface in the state of deflection has a structure that is not affected by the unevenness of the upper surface of the support member. The control device calibrates the detector in a state in which the at least three displacement gauges face the reference plane.

根據本發明的又一觀點,提供一種基準器,其具有: 基準面,係與排成一列之三個位移計相對向;及 三個支腳部,係從與前述基準面相反之一側的底面突出, 前述三個支腳部中的兩個支腳部配置於在前述基準面的長度方向上相同之位置。According to another aspect of the present invention, a reference device is provided, which has: the reference plane, which is opposite to the three displacement gauges arranged in a row; and three leg portions protruding from the bottom surface on the side opposite to the aforementioned reference surface, Two of the said three leg parts are arrange|positioned at the same position in the longitudinal direction of the said reference plane.

根據本發明的又一觀點,提供一種校正方法,其為檢測儀的校正方法,該檢測儀藉由使排成一列之至少三個位移計與測量對象物對向配置而檢測從前述至少三個位移計的每一個到前述測量對象物為止的距離的位移, 在使前述至少三個位移計對向基準器的基準面之姿勢下,使前述基準器在前述至少三個位移計排列之方向上在兩個部位支撐於支撐構件上, 在使前述至少三個位移計對向前述基準面之狀態下校正前述檢測儀。 [發明之效果]According to yet another aspect of the present invention, there is provided a calibration method for a tester that detects at least three displacement gauges by arranging at least three displacement gauges in a line to face an object to be measured. The displacement of the displacement meter for each distance to the aforementioned measurement object, With the at least three displacement gauges facing the reference plane of the reference device, the reference device is supported on the support member at two positions in the direction in which the at least three displacement gauges are arranged, The detector is calibrated in a state in which the at least three displacement gauges face the reference plane. [Effect of invention]

基準器的撓曲形狀不受支撐構件上表面的凹凸的影響。因此,提供當校正檢測儀時形狀偏差小的基準面,其結果,能夠抑制檢測儀的至少三個位移計的零點位置的由設置部位引起之偏差。The deflection shape of the datum is not affected by the unevenness of the upper surface of the support member. Therefore, a reference surface with little shape deviation is provided when the detector is calibrated, and as a result, the deviation of the zero point positions of the at least three displacement gauges of the detector due to the installation position can be suppressed.

參閱圖1A~圖11B,對實施例的形狀測量裝置進行說明。 圖1A係組裝有本實施例的形狀測量裝置之研磨裝置的立體圖。研磨裝置包括可動工作台10、工作台引導機構11、砂輪頭15、砂輪16、導軌18、控制裝置20、輸入輸出裝置21、基準器30及檢測儀40。可動工作台10藉由工作台引導機構11而在水平面內的一方向上往復移動。被研磨物亦即工件12支撐於可動工作台10上。該工件12相當於藉由形狀測量裝置而被測量直線度之測量對象物。Referring to FIGS. 1A to 11B , the shape measuring apparatus of the embodiment will be described. FIG. 1A is a perspective view of a polishing apparatus in which the shape measuring apparatus of the present embodiment is assembled. The grinding device includes a movable table 10 , a table guide mechanism 11 , a grinding wheel head 15 , a grinding wheel 16 , a guide rail 18 , a control device 20 , an input and output device 21 , a reference device 30 and a detector 40 . The movable table 10 is reciprocated in one direction in the horizontal plane by the table guide mechanism 11 . The object to be ground, that is, the workpiece 12 is supported on the movable table 10 . The workpiece 12 corresponds to a measurement object whose straightness is measured by a shape measuring device.

砂輪頭15藉由導軌18而可升降地支撐於可動工作台10上的工件12的上方。砂輪頭15在水平面內在與可動工作台10的移動方向正交之方向上能夠移動。如下定義xyz正交坐標系:將可動工作台10的移動方向設為x軸方向,將砂輪頭15的移動方向設為y軸方向,將鉛垂朝下的方向設為z軸的正方向。The grinding wheel head 15 is supported above the workpiece 12 on the movable table 10 by means of the guide rail 18 so as to be ascendable and descendable. The grinding wheel head 15 is movable in a direction orthogonal to the moving direction of the movable table 10 in a horizontal plane. The xyz orthogonal coordinate system is defined as follows: the moving direction of the movable table 10 is the x-axis direction, the moving direction of the grinding wheel head 15 is the y-axis direction, and the vertical downward direction is the positive z-axis direction.

在砂輪頭15的下端部安裝有砂輪16。砂輪16具有圓柱狀形狀,其中心軸與y軸方向平行。使砂輪頭15下降至砂輪16接觸到工件12之程度,並藉由一邊使砂輪16旋轉,一邊使工件12在x軸方向上移動而進行工件12的研磨。藉由使砂輪頭15在y軸方向上移動並重複相同之處理而能夠研磨工件12的上表面的整個區域。A grindstone 16 is attached to the lower end of the grindstone head 15 . The grinding wheel 16 has a cylindrical shape whose central axis is parallel to the y-axis direction. The grinding wheel head 15 is lowered to such an extent that the grinding wheel 16 contacts the workpiece 12 , and the workpiece 12 is ground by moving the workpiece 12 in the x-axis direction while the grinding wheel 16 is rotated. The entire area of the upper surface of the workpiece 12 can be ground by moving the grinding wheel head 15 in the y-axis direction and repeating the same process.

控制裝置20控制可動工作台10向x軸方向的移動、砂輪頭15向y軸方向的移動及升降、砂輪16的旋轉。各種指令從輸入輸出裝置21輸入到控制裝置20,處理結果等藉由控制裝置20而輸出到輸入輸出裝置21。輸入輸出裝置21例如包括顯示器、定點設備、鍵盤等。The control device 20 controls the movement of the movable table 10 in the x-axis direction, the movement and elevation of the grindstone head 15 in the y-axis direction, and the rotation of the grindstone 16 . Various commands are input from the input/output device 21 to the control device 20 , and processing results and the like are output to the input/output device 21 via the control device 20 . The input/output device 21 includes, for example, a display, a pointing device, a keyboard, and the like.

檢測儀40可裝卸地安裝於砂輪頭15的側面。當研磨時,檢測儀40從砂輪頭15被卸除。當測量工件12的上表面的直線度時,檢測儀40被安裝於砂輪頭15。檢測儀40例如藉由磁鐵的吸引力、螺紋固定等而被安裝於砂輪頭15。以下,參閱圖1B對檢測儀40的結構進行詳述。當校正檢測儀40時,在工件12的上表面配置基準器30。基準器30藉由支撐於工件12的上表面而提供檢測儀40的校正用基準面。工件12作為在零點校正時用於支撐基準器30之支撐構件而發揮作用。The detector 40 is detachably attached to the side surface of the grinding wheel head 15 . When grinding, the detector 40 is removed from the grinding wheel head 15 . When measuring the straightness of the upper surface of the workpiece 12 , the tester 40 is attached to the grinding wheel head 15 . The detector 40 is attached to the grinding wheel head 15 by, for example, attractive force of a magnet, screwing, or the like. Hereinafter, the structure of the detector 40 will be described in detail with reference to FIG. 1B . When calibrating the detector 40 , the datum 30 is arranged on the upper surface of the workpiece 12 . The datum 30 is supported on the upper surface of the workpiece 12 to provide a reference surface for calibration of the detector 40 . The workpiece 12 functions as a support member for supporting the reference 30 during zero point calibration.

圖1B係在砂輪頭15上安裝有檢測儀40之狀態下之檢測儀40的側視圖。FIG. 1B is a side view of the tester 40 in a state where the tester 40 is mounted on the grinding wheel head 15 .

檢測儀40包括安裝於支撐基座41上並在x軸方向上排成一列之第1位移計42a、第2位移計42b、第3位移計42c。作為該等位移計,例如能夠使用非接觸式雷射位移計。由於第1位移計42a、第2位移計42b及第3位移計42c中的每一個與工件12對向配置,因此檢測從每個位移計到工件12為止的距離的位移。更具體而言,測定從各位移計的零點到工件12的上表面的被測定點為止在z軸方向上的距離。在檢測儀40所對向之位置配置有基準器30(圖1A)之狀態下,各位移計檢測基準器30的基準面的在z軸方向上的位移。The detector 40 includes a first displacement gauge 42a, a second displacement gauge 42b, and a third displacement gauge 42c that are mounted on the support base 41 and are aligned in the x-axis direction. As these displacement meters, for example, a non-contact laser displacement meter can be used. Since each of the 1st displacement gauge 42a, the 2nd displacement gauge 42b, and the 3rd displacement gauge 42c is arrange|positioned to oppose the workpiece|work 12, the displacement of the distance from each displacement gauge to the workpiece|work 12 is detected. More specifically, the distance in the z-axis direction from the zero point of each displacement gauge to the point to be measured on the upper surface of the workpiece 12 is measured. In a state where the reference device 30 ( FIG. 1A ) is disposed at the position facing the detector 40 , each displacement meter detects the displacement of the reference surface of the reference device 30 in the z-axis direction.

在支撐基座41上還安裝有溫度感測器45。溫度感測器45測定檢測儀40的溫度。第1位移計42a、第2位移計42b及第3位移計42c的測定值及溫度感測器45的測定值被輸入到控制裝置20(圖1A)。A temperature sensor 45 is also mounted on the support base 41 . The temperature sensor 45 measures the temperature of the detector 40 . The measurement values of the first displacement gauge 42a, the second displacement gauge 42b, and the third displacement gauge 42c and the measurement value of the temperature sensor 45 are input to the control device 20 (FIG. 1A).

其次,參閱圖2,對測量工件12的上表面的直線度的方法進行說明。 圖2係表示測量對象亦即工件12的上表面及檢測儀40之示意圖。工件12的上表面與xy面大致平行地配置。另外,在圖2中放大示出工件12的上表面的微小的凹凸。檢測儀40的第1位移計42a、第2位移計42b及第3位移計42c在x軸方向上以間距P排成一列。Next, referring to FIG. 2 , a method of measuring the straightness of the upper surface of the workpiece 12 will be described. FIG. 2 is a schematic diagram showing the upper surface of the workpiece 12 , which is a measurement object, and the detector 40 . The upper surface of the workpiece 12 is arranged substantially parallel to the xy plane. In addition, in FIG. 2, the micro unevenness|corrugation of the upper surface of the workpiece|work 12 is enlarged and shown. The first displacement gauge 42a, the second displacement gauge 42b, and the third displacement gauge 42c of the detector 40 are arranged in a row with a pitch P in the x-axis direction.

若進行三個位移計的零點校正,則理想的係第1位移計42a、第2位移計42b及第3位移計42c各自的零點A0 、B0 、C0 在與x軸大致平行的一條直線上以間距P排列。另外,在本實施例中,如以下參閱圖7A及圖7B進行說明,三個零點A0 、B0 、C0 並非嚴格地配置在一條直線上,但是在此假定三個零點A0 、B0 、C0 配置在一條直線上。If the zero point calibration of the three displacement meters is performed, ideally, the zero points A 0 , B 0 , and C 0 of the first displacement meter 42 a , the second displacement meter 42 b , and the third displacement meter 42 c are on a line substantially parallel to the x-axis. They are arranged with a pitch P on a straight line. In addition, in this embodiment, as described below with reference to FIGS. 7A and 7B , the three zero points A 0 , B 0 , and C 0 are not strictly arranged on a straight line, but here it is assumed that the three zero points A 0 , B . 0 and C 0 are arranged on a straight line.

第1位移計42a測定從零點A0 到工件12的上表面的被測定點A為止的距離Da 。同樣,第2位移計42b及第3位移計42c分別測定從零點B0 到被測定點B為止的距離Db 、以及從零點C0 到被測定點C為止的距離DcThe first displacement gauge 42a measures the distance D a from the zero point A 0 to the point A to be measured on the upper surface of the workpiece 12 . Similarly, the second displacement meter 42b and the third displacement meter 42c measure the distance Db from the zero point B 0 to the point B to be measured, and the distance D c from the zero point C 0 to the point C to be measured, respectively.

將連接被測定點A和C的線段與被測定點B在z軸方向上的距離稱為偏移量g。偏移量g由以下式來表示。

Figure 02_image001
The distance between the line segment connecting the points A and C to be measured and the point B to be measured in the z-axis direction is referred to as the offset amount g. The offset amount g is represented by the following equation.
Figure 02_image001

在第2位移計42b的被測定點B上的工件12的上表面的曲率d2 z/dx2 (x=B)能夠由以下式來表示。

Figure 02_image003
The curvature d 2 z/dx 2 (x=B) of the upper surface of the workpiece 12 at the point B to be measured of the second displacement gauge 42b can be represented by the following equation.
Figure 02_image003

一邊使檢測儀40和工件12中的一個相對於另一個在x軸方向上移動,一邊藉由式(1)而測量偏移量g。藉由對使用式(1)及(2)來求出之工件12的上表面的曲率分佈進行二階積分而能夠求出上表面的直線度(亦即,xz剖面中的表面形狀)。While moving one of the detector 40 and the workpiece 12 relative to the other in the x-axis direction, the offset amount g is measured by the formula (1). The straightness of the upper surface (that is, the surface shape in the xz cross-section) can be obtained by second-order integration of the curvature distribution of the upper surface of the workpiece 12 obtained using equations (1) and (2).

其次,參閱圖3,對檢測儀40的零點校正的原理進行說明。 圖3係表示檢測儀40的第1位移計42a、第2位移計42b、第3位移計42c與基準器30的位置關係之示意圖。Next, referring to FIG. 3 , the principle of zero point calibration of the detector 40 will be described. FIG. 3 is a schematic diagram showing the positional relationship between the first displacement gauge 42 a , the second displacement gauge 42 b , and the third displacement gauge 42 c of the detector 40 and the reference tool 30 .

將基準器30放置在工件12的上表面上,並使基準面31對向檢測儀40。在該狀態下,將第1位移計42a、第2位移計42b及第3位移計42c各自的基準面31上的被測定點分別設定為第1位移計42a、第2位移計42b及第3位移計42c的零點A0 、B0 、C0The datum 30 is placed on the upper surface of the workpiece 12 with the datum surface 31 facing the detector 40 . In this state, the measured points on the reference plane 31 of the first displacement meter 42a, the second displacement meter 42b, and the third displacement meter 42c are set as the first displacement meter 42a, the second displacement meter 42b, and the third displacement meter, respectively. Zero points A 0 , B 0 , and C 0 of the displacement meter 42c.

另外,可以一邊使基準器30相對於檢測儀40在x軸方向上移動,一邊進行複數次測定,並根據測定值的平均值來設定零點A0 、B0 、C0 。將一邊使基準器30在x軸方向上移動,一邊進行複數次測定之處理稱為掃描。基準器30的移動係藉由由工作台引導機構11使工件12在x軸方向上移動而實現者。藉由採用該方法,能夠減小由基準面31的表面粗糙引起之零點的偏差。此外,可以改變基準面31上的被測定點在y軸方向上的位置進行複數次掃描,並根據藉由複數次掃描而得到之測定值的平均值來設定零點A0 、B0 、C0 。另外,即使第1位移計42a、第2位移計42b及第3位移計42c在支撐基座41上的安裝位置在z軸方向上偏離,若基準面31係幾何學上正確之平面,則零點A0 、B0 、C0 藉由零點校正而位於一條直線上。In addition, while moving the reference device 30 relative to the detector 40 in the x-axis direction, a plurality of measurements may be performed, and the zero points A 0 , B 0 , and C 0 may be set based on the average value of the measured values. The process of performing a plurality of measurements while moving the reference device 30 in the x-axis direction is called scanning. The movement of the reference tool 30 is realized by moving the workpiece 12 in the x-axis direction by the table guide mechanism 11 . By adopting this method, the deviation of the zero point caused by the surface roughness of the reference surface 31 can be reduced. In addition, a plurality of scans may be performed while changing the position of the point to be measured on the reference plane 31 in the y-axis direction, and the zero points A 0 , B 0 , and C 0 may be set based on the average value of the measured values obtained by the plurality of scans. . In addition, even if the mounting positions of the first displacement gauge 42a, the second displacement gauge 42b, and the third displacement gauge 42c on the support base 41 deviate in the z-axis direction, if the reference plane 31 is a geometrically correct plane, the zero point A 0 , B 0 , C 0 are located on a straight line by zero point correction.

其次,參閱圖4A及圖4B,對使用比較例的基準器30來校正檢測儀40之方法進行說明。Next, referring to FIGS. 4A and 4B , a method for calibrating the detector 40 using the reference device 30 of the comparative example will be described.

圖4A及圖4B係將比較例的基準器30放置在工件12的上表面上之狀態的剖面圖。當校正檢測儀40時,在工件12的上表面上,長方體形狀的基準器30被設置成其長度方向與x軸平行。研磨後的工件12的上表面大致平坦,但是實際上殘留有微小的凹凸。因此基準器30在其長度方向上在大致兩點處支撐於工件12上。基準器30例如由楊氏模量約為130GPa左右的不易變形之陶瓷材料形成,但是以接觸到工件12之部位為支點因自重而稍微產生撓曲。4A and 4B are cross-sectional views of a state in which the reference tool 30 of the comparative example is placed on the upper surface of the workpiece 12 . When calibrating the detector 40, on the upper surface of the workpiece 12, the reference 30 in the shape of a rectangular parallelepiped is provided so that its longitudinal direction is parallel to the x-axis. The upper surface of the polished workpiece 12 is substantially flat, but actually has minute irregularities remaining. The datum 30 is thus supported on the workpiece 12 at approximately two points along its length. The reference tool 30 is formed of, for example, a ceramic material that is not easily deformed with a Young's modulus of about 130 GPa, but slightly deflects due to its own weight at a point where it contacts the workpiece 12 as a fulcrum.

在圖4A所示例中,基準器30在長度方向的兩端附近接觸到工件12而被支撐。此時,在基準器30上產生朝下方凸出形狀的撓曲。在圖4B所示例中,基準器30在長度方向的中央附近接觸到工件12而被支撐。此時,在基準器30上產生朝上方凸出形狀的撓曲。若在基準面31上產生有撓曲之狀態下進行檢測儀40的零點校正,則三個零點A0 、B0 、C0 不位於一條直線上。又,根據設置基準器30之位置,導致在三個零點A0 、B0 、C0 的相對位置關係上產生偏差。In the example shown in FIG. 4A , the reference tool 30 is supported in contact with the workpiece 12 in the vicinity of both ends in the longitudinal direction. At this time, deflection in a downwardly convex shape is generated in the reference tool 30 . In the example shown in FIG. 4B , the reference tool 30 is supported in contact with the workpiece 12 in the vicinity of the center in the longitudinal direction. At this time, deflection in the shape of an upward convex is generated in the reference tool 30 . If the zero point calibration of the detector 40 is performed in a state where deflection occurs on the reference plane 31, the three zero points A 0 , B 0 , and C 0 are not located on a straight line. Further, depending on the position where the reference device 30 is installed, a deviation occurs in the relative positional relationship of the three zero points A 0 , B 0 , and C 0 .

在基準器30上產生之撓曲受到其支撐表面(亦即,工件12的上表面)的凹凸形狀的影響。因此,無法正確地推斷出產生撓曲之狀態下之基準面31的形狀。從而,難以校正三個零點A0 、B0 、C0 而使其配置在一條直線上。The deflection produced on the datum 30 is influenced by the concavo-convex shape of its support surface (ie, the upper surface of the workpiece 12). Therefore, the shape of the reference surface 31 in the state where the deflection occurs cannot be accurately estimated. Therefore, it is difficult to correct and arrange the three zero points A 0 , B 0 , and C 0 on a straight line.

其次,參閱圖5~圖7B,對利用在本實施例的形狀測量裝置中使用之基準器30進行檢測儀40的零點校正之方法進行說明。Next, referring to FIGS. 5 to 7B , a method for performing zero point calibration of the detector 40 using the reference device 30 used in the shape measuring apparatus of the present embodiment will be described.

圖5係從斜下方觀察在實施例的形狀測量裝置中使用之基準器30之立體圖。基準器30包括具有在一方向上長的長方體形狀之主體構件32。主體構件32的上表面被設為基準面31。在主體構件32的與基準面31相反之一側的底面上安裝有三個支腳部33。一個支腳部33被安裝於基準器30的底面的在長度方向上的一個端部,其他兩個支腳部33被安裝於另一個端部。又,該兩個支腳部33在與長度方向正交之寬度方向上隔開間隔地被安裝。亦即,該兩個支腳部33安裝於在長度方向上相同之位置,並且在寬度方向上被安裝於不同的位置。FIG. 5 is a perspective view of the reference tool 30 used in the shape measuring apparatus of the embodiment as viewed obliquely from below. The datum 30 includes a main body member 32 having a rectangular parallelepiped shape long in one direction. The upper surface of the main body member 32 is set as the reference surface 31 . Three leg portions 33 are attached to the bottom surface of the main body member 32 on the side opposite to the reference surface 31 . One leg portion 33 is attached to one end portion in the longitudinal direction of the bottom surface of the reference tool 30 , and the other two leg portions 33 are attached to the other end portion. Moreover, these two leg parts 33 are attached at intervals in the width direction orthogonal to the longitudinal direction. That is, the two leg portions 33 are installed at the same position in the longitudinal direction, and are installed at different positions in the width direction.

每個支腳部33具有半球形狀,並在平坦之表面上黏接於主體構件32的底面。在支腳部33的黏接中能夠使用黏接劑或雙面膠帶等。在支腳部33中例如使用氧化鋯等硬質材料。支腳部33的高度例如為2mm以上且15mm以下,典型地為7mm。然而,支腳部33的高度並不限定於該範圍。在將基準器30放置在工件12的上表面上之狀態下,支腳部33的高度只要係基準器30的主體構件32的底面不接觸到工件12的上表面之程度的高度即可。Each leg portion 33 has a hemispherical shape and is bonded to the bottom surface of the main body member 32 on a flat surface. An adhesive, a double-sided tape, or the like can be used for the adhesion of the leg portion 33 . For the leg portion 33, a hard material such as zirconia is used, for example. The height of the leg part 33 is 2 mm or more and 15 mm or less, for example, and is typically 7 mm. However, the height of the leg portion 33 is not limited to this range. When the reference tool 30 is placed on the upper surface of the workpiece 12 , the height of the leg portion 33 may be such that the bottom surface of the main body member 32 of the reference tool 30 does not touch the upper surface of the workpiece 12 .

圖6A及圖6B係將在實施例的形狀測量裝置中使用之基準器30放置在工件12的上表面上之狀態的剖面圖。圖6A及圖6B中所示出之工件12的上表面的凹凸形狀分別與圖4A及圖4B中所示出之工件12的上表面的凹凸形狀相同。在圖6A及圖6B中的任一種情況下,基準器30藉由三個支腳部33接觸到工件12的上表面而支撐於工件12的上表面。基準器30在除了三個支腳部33以外的部位不會接觸到工件12。6A and 6B are cross-sectional views showing a state in which the reference tool 30 used in the shape measuring apparatus of the embodiment is placed on the upper surface of the workpiece 12 . The concavo-convex shape of the upper surface of the workpiece 12 shown in FIGS. 6A and 6B is the same as the concavo-convex shape of the upper surface of the workpiece 12 shown in FIGS. 4A and 4B , respectively. In either case of FIGS. 6A and 6B , the reference tool 30 is supported on the upper surface of the workpiece 12 by the three legs 33 contacting the upper surface of the workpiece 12 . The reference tool 30 does not come into contact with the workpiece 12 except for the three leg portions 33 .

由於三個支腳部33中的兩個支腳部配置於在長度方向上相同之位置,因此基準器30在長度方向上的兩個部位支撐於工件12的上表面。因此,基準器30具有兩端支撐均布荷重的樑結構。基準器30不取決於支撐表面的凹凸形狀,而始終在長度方向上的兩個部位支撐於支撐表面上,因此基準器30的撓曲的形狀及大小不受支撐表面的凹凸形狀的影響。Since two of the three leg portions 33 are arranged at the same position in the longitudinal direction, the reference tool 30 is supported on the upper surface of the workpiece 12 at two locations in the longitudinal direction. Therefore, the reference device 30 has a beam structure that supports evenly distributed loads at both ends. The reference tool 30 is always supported on the support surface at two locations in the longitudinal direction regardless of the uneven shape of the support surface, so the shape and size of the deflection of the reference tool 30 are not affected by the uneven shape of the support surface.

圖7A係具有兩端支撐均布荷重的樑結構之基準器30的示意圖。若由L表示基準器30的長度,由w表示每單位長度的荷重,由E表示楊氏模量,由I表示彈性二維力矩,則與一個端部的距離為x的點的撓曲量δ(x)由以下式來表示。

Figure 02_image005
FIG. 7A is a schematic diagram of a datum 30 having a beam structure with uniformly distributed loads supported at both ends. If the length of the reference device 30 is denoted by L, the load per unit length is denoted by w, the Young's modulus is denoted by E, and the two-dimensional moment of elasticity is denoted by I, the deflection amount at a point at a distance x from one end δ(x) is represented by the following formula.
Figure 02_image005

當將基準器30放置在工件12的上表面上時,能夠使用式(3)預先求出在基準面31上產生之撓曲的形狀及大小。定義該撓曲的形狀之資訊被存儲於控制裝置20(圖1A)。When the reference tool 30 is placed on the upper surface of the workpiece 12 , the shape and size of the deflection generated on the reference surface 31 can be obtained in advance using the equation (3). Information defining the shape of the deflection is stored in the control device 20 (FIG. 1A).

圖7B係表示在實施例的形狀測量裝置中使用之基準器30與檢測儀40的位置關係之示意圖。基準面31如圖7A所示撓曲。在圖7B中,撓曲量由實際的撓曲量放大示出。藉由檢測儀40的第1位移計42a、第2位移計42b及第3位移計42c而檢測該基準面31的高度並進行零點校正。藉此,在基準面31上設定有零點A0 、零點B0 及零點C0FIG. 7B is a schematic diagram showing the positional relationship between the reference device 30 and the detector 40 used in the shape measuring apparatus of the embodiment. The reference surface 31 is deflected as shown in FIG. 7A . In FIG. 7B, the amount of deflection is shown enlarged from the actual amount of deflection. The height of the reference plane 31 is detected by the first displacement gauge 42a, the second displacement gauge 42b, and the third displacement gauge 42c of the detector 40, and zero point correction is performed. Thereby, the zero point A 0 , the zero point B 0 , and the zero point C 0 are set on the reference plane 31 .

將通過零點B0 並平行於z軸之直線與連接零點A0 和零點C0 之線段的交點設為第2位移計42b的真零點B01 。將零點B0 與真零點B01 的距離設為零點偏移量g0 。基準面31的撓曲形狀能夠由式(3)藉由計算而求出,由於定義該形狀之資訊預先存儲在控制裝置20(圖1A)中,因此能夠藉由計算而求出零點偏移量g0 。控制裝置20存儲藉由計算而求出之零點偏移量g0 。為了嚴格地計算真零點B01 處的工件12的上表面的直線度,使用真零點B01 作為第2位移計42b的零點為較佳。亦即,對偏移量g(圖2)進行相當於零點偏移量g0 之校正為較佳。具體而言,由以下式來代替式(1)而計算偏移量g為較佳。

Figure 02_image007
The intersection of the straight line passing through the zero point B 0 and parallel to the z-axis and the line segment connecting the zero point A 0 and the zero point C 0 is defined as the true zero point B 01 of the second displacement meter 42b. Let the distance between the zero point B 0 and the true zero point B 01 be the zero point offset g 0 . The deflection shape of the reference plane 31 can be obtained by calculation from the formula (3). Since the information defining the shape is stored in the control device 20 ( FIG. 1A ) in advance, the zero point offset amount can be obtained by calculation g 0 . The control device 20 stores the zero offset amount g 0 obtained by the calculation. In order to strictly calculate the straightness of the upper surface of the workpiece 12 at the true zero point B01 , it is preferable to use the true zero point B01 as the zero point of the second displacement gauge 42b. That is, it is preferable to correct the offset amount g ( FIG. 2 ) corresponding to the zero point offset amount g 0 . Specifically, it is preferable to calculate the offset amount g by the following formula instead of formula (1).
Figure 02_image007

其次,參閱圖8A~圖9B,對為了確認基準器30的撓曲形狀不受工件12的上表面的凹凸的影響而進行之評價實驗及其結果進行說明。Next, with reference to FIGS. 8A to 9B , an evaluation experiment and results of an evaluation experiment performed to confirm that the deflection shape of the reference tool 30 is not affected by the unevenness of the upper surface of the workpiece 12 will be described.

圖8A~圖8C係表示當進行評價實驗時的工件12、基準器30及檢測儀40的位置關係之圖。首先,如圖8A所示,將基準器30放置在工件12的區域R1上,並由進行零點校正之檢測儀40使用式(1)來測量偏移量g(圖2)。在區域R1內使基準器30移動,並使用式(1)來測量複數次偏移量g。8A to 8C are diagrams showing the positional relationship of the workpiece 12 , the reference device 30 , and the detector 40 when the evaluation experiment is performed. First, as shown in FIG. 8A , the datum 30 is placed on the region R1 of the workpiece 12 , and the offset g ( FIG. 2 ) is measured by the detector 40 performing zero point correction using equation (1). The reference device 30 is moved within the region R1, and the offset amount g of plural times is measured using the equation (1).

其次,如圖8B所示,使基準器30在工件12的區域R2上移動,並以相同之方式複數次測量偏移量g。此外,如圖8C所示,使基準器30在工件12的區域R3上移動,並以相同之方式複數次測量偏移量g。Next, as shown in FIG. 8B, the reference tool 30 is moved on the region R2 of the workpiece 12, and the offset amount g is measured a plurality of times in the same manner. Further, as shown in FIG. 8C, the reference 30 is moved on the region R3 of the workpiece 12, and the offset amount g is measured a plurality of times in the same manner.

圖9A係表示使用不具有支腳部33之長方體形狀的基準器30來測量之偏移量g的分佈之圖表。圖9B係使用在實施例的形狀測量裝置中使用之基準器30(圖5)亦即具有支腳部33之基準器30來測量之偏移量g的分佈之圖表。圖9A及圖9B的圖表的橫軸對應於區域R1、R2、R3,縱軸表示偏移量g。圖表中的一個黑色圓圈符號表示藉由一次測量而計算出之偏移量g。在一個區域內顯示有複數個黑色圓圈符號,係因為在每個區域R1、R2、R3中使基準器30在區域內移動並進行了複數次測量。FIG. 9A is a graph showing the distribution of the offset amount g measured using the reference device 30 having the rectangular parallelepiped shape without the leg portion 33 . 9B is a graph of the distribution of the offset amount g measured using the reference device 30 ( FIG. 5 ) used in the shape measuring apparatus of the embodiment, that is, the reference device 30 having the leg portion 33 . The horizontal axis of the graphs of FIGS. 9A and 9B corresponds to the regions R1 , R2 , and R3 , and the vertical axis represents the offset amount g. A black circle symbol in the graph represents the offset g calculated by one measurement. A plurality of black circle symbols are displayed in one area because the reference 30 is moved in each area R1, R2, R3 and a plurality of measurements are performed.

在使用不具有支腳部33之基準器30之情況下,如圖9A所示,在將基準器30放置在區域R1上測量之情況和放置在區域R2或R3上測量之情況下,在偏移量g上產生大的差異。總體上,在偏移量g上產生約0.075μm左右的偏差。這意味著,基準器30撓曲後的基準面31的形狀根據設置基準器30的位置而不同。In the case of using the reference device 30 without the leg portion 33, as shown in FIG. 9A, in the case where the reference device 30 is placed on the region R1 for measurement and in the case where the reference device 30 is placed on the region R2 or R3 for measurement, the offset A large difference occurs in the shift amount g. In general, a deviation of about 0.075 μm occurs in the offset amount g. This means that the shape of the reference surface 31 after the reference tool 30 is deflected varies depending on the position where the reference tool 30 is installed.

相對於此,在使用具有支腳部33之基準器30之情況下,如圖9B所示,即使將基準器30放置在區域R1、R2、R3中的任一個區域上,在偏移量g上亦不會產生大的差異。偏移量g的偏差在0.02μm以下範圍內。這意味著,基準器30撓曲後的基準面31的形狀不取決於設置基準器30的位置而大致恆定。又,偏移量g的計算值與零點偏移量g0 (圖7B)大致相等。On the other hand, when the reference device 30 having the leg portion 33 is used, as shown in FIG. 9B , even if the reference device 30 is placed on any one of the regions R1 , R2 , and R3 , the offset amount g There will be no big difference. The deviation of the offset amount g is within the range of 0.02 μm or less. This means that the shape of the reference surface 31 after the reference tool 30 is deflected is substantially constant regardless of the position where the reference tool 30 is installed. In addition, the calculated value of the offset amount g is substantially equal to the zero point offset amount g 0 ( FIG. 7B ).

根據圖8A~圖9B中所示出之評價實驗確認到,藉由使用具有支腳部33之基準器30,基準器30的撓曲形狀幾乎不取決於支撐基準器30之支撐表面的凹凸形狀。It was confirmed from the evaluation experiments shown in FIGS. 8A to 9B that, by using the datum 30 having the legs 33 , the deflection shape of the datum 30 hardly depends on the concavo-convex shape of the supporting surface supporting the datum 30 .

其次,參閱圖10~圖11B,對由實施例的形狀測量裝置來測量工件12(圖1A)的上表面的直線度之方法進行說明。Next, referring to FIGS. 10 to 11B , a method of measuring the straightness of the upper surface of the workpiece 12 ( FIG. 1A ) by the shape measuring apparatus of the embodiment will be described.

圖10係實施例的形狀測量方法的流程圖。 若工件12的研磨結束,則操作人員將檢測儀40安裝於砂輪頭15(步驟SA01),並將基準器30設置於工件12的上表面(步驟SA02)。然後,利用基準器30的基準面31進行檢測儀40的零點校正。若檢測儀40的零點校正結束,則從工件12的上表面移除基準器30。FIG. 10 is a flowchart of the shape measurement method of the embodiment. When the grinding of the workpiece 12 is completed, the operator attaches the detector 40 to the grinding wheel head 15 (step SA01 ), and sets the reference 30 to the upper surface of the workpiece 12 (step SA02 ). Then, the zero point calibration of the detector 40 is performed using the reference surface 31 of the reference device 30 . When the zero point calibration of the detector 40 is completed, the reference tool 30 is removed from the upper surface of the workpiece 12 .

使砂輪頭15(圖1A)在y軸方向上移動至工件12的測量部位(步驟SA05)。然後,測量工件12的上表面的沿著平行於x軸方向之一條線之直線度(步驟SA06)。具體而言,控制裝置20(圖1A)一邊使工件12在x軸方向上移動,一邊從檢測儀40的第1位移計42a、第2位移計42b及第3位移計42c以一定的時間間隔獲取測定值。根據所獲取之測定值,並藉由參閱圖2已說明之逐次三點法而求出工件12的上表面的形狀。此時,使用式(4)來計算偏移量g。The grinding wheel head 15 (FIG. 1A) is moved to the measurement position of the workpiece 12 in the y-axis direction (step SA05). Then, the straightness of the upper surface of the workpiece 12 along a line parallel to the x-axis direction is measured (step SA06). Specifically, the control device 20 ( FIG. 1A ) moves the workpiece 12 in the x-axis direction, while the first displacement meter 42 a , the second displacement meter 42 b , and the third displacement meter 42 c of the detector 40 are moved at constant time intervals. Obtain measured values. Based on the acquired measurement values, the shape of the upper surface of the workpiece 12 is obtained by the successive three-point method described with reference to FIG. 2 . At this time, the offset amount g is calculated using Equation (4).

在測量工件12的上表面的沿著一條線之直線度之後,將測量結果輸出到輸入輸出裝置21(圖1A)(步驟SA07)。在測量沿著另一條線之直線度之情況下,重複進行從將基準器30設置於工件12的上表面之製程(步驟SA02)到輸出測量結果之製程(步驟SA07)(步驟SA08)。在測量工件12的上表面的應測量的沿著所有線之直線度之後結束測量。After measuring the straightness along a line of the upper surface of the workpiece 12, the measurement result is output to the input/output device 21 (FIG. 1A) (step SA07). In the case of measuring the straightness along another line, the process from the process of disposing the reference 30 on the upper surface of the workpiece 12 (step SA02 ) to the process of outputting the measurement result (step SA07 ) (step SA08 ) is repeated. The measurement ends after measuring the straightness of the upper surface of the workpiece 12 along all lines to be measured.

圖11A係表示控制裝置20在輸入輸出裝置21的顯示器上顯示之控制窗口的圖像之圖。控制窗口包括測定值顯示視窗22、基本設定視窗23及校正視窗24。此外,在控制窗口上顯示測定開始按鈕26。FIG. 11A is a diagram showing an image of a control window displayed on the display of the input/output device 21 by the control device 20 . The control window includes a measurement value display window 22 , a basic setting window 23 and a calibration window 24 . In addition, a measurement start button 26 is displayed on the control window.

在測定值顯示視窗22中包括顯示第1位移計42a、第2位移計42b及第3位移計42c的測定值之輸出字段。在基本設定的視窗23中顯示工件12的長度(x軸方向的尺寸)、測量時可動工作台10的移動速度、輸入測定往復次數的資料輸入字段。測定往復次數例如以下拉選單形式被輸入。在校正視窗24中顯示有顯示零點值之輸出字段及校正開始按鈕25。The measured value display window 22 includes output fields for displaying the measured values of the first displacement meter 42a, the second displacement meter 42b, and the third displacement meter 42c. The basic setting window 23 displays the length of the workpiece 12 (dimension in the x-axis direction), the moving speed of the movable table 10 during measurement, and a data input field for inputting the number of times of reciprocation. The number of times of measurement reciprocation is input, for example, in the form of a pull-down menu. In the calibration window 24, an output field displaying the zero point value and a calibration start button 25 are displayed.

若操作人員選擇校正開始按鈕25,則控制裝置20(圖1A)進行檢測儀40的零點校正(步驟SA03)。按鈕的選擇例如藉由將滑鼠的指標對準按鈕點擊滑鼠之操作、觸摸按鈕之操作等而進行。在零點的輸出字段中顯示使用式(1)來計算出之偏移量g值。在進行了零點校正之時刻,由於距離Da 、Db 、Dc (圖2)全部重置為零,因此在零點的輸出字段中顯示之數值成為0。When the operator selects the calibration start button 25, the control device 20 (FIG. 1A) performs zero-point calibration of the detector 40 (step SA03). The selection of the button is performed by, for example, aligning the pointer of the mouse on the button and clicking the mouse, or by touching the button. The value of the offset g calculated using the formula (1) is displayed in the output field of the zero point. When the zero point correction is performed, since the distances D a , D b , and D c ( FIG. 2 ) are all reset to zero, the value displayed in the zero point output field becomes 0.

若操作人員選擇測定開始按鈕26,則控制裝置20執行工件12的上表面的沿著一條線之直線度的測量(步驟SA06)。When the operator selects the measurement start button 26, the control device 20 executes the measurement of the straightness along a line of the upper surface of the workpiece 12 (step SA06).

圖11B係表示在輸入輸出裝置21的顯示器上顯示之測量結果的圖像的一例之圖。在顯示器上,以圖表形式顯示工件12的上表面在高度方向上的位置。橫軸表示工件12在長度方向(x軸方向)上的位置,縱軸表示表面位移量(z軸方向上的位置)。另外,高度變動的線性成分被去除,表面位移量被校正為使工件12的兩端的高度均成為0。在圖11B中示出中央部分具有比兩端低的形狀之示例。工件12的上表面在從0起的位移量最大的位置(圖11B中曲線的最低點)上的值的絕對值相當於直線度的幾何公差。在圖11B所示例中,直線度的幾何公差約為22μm。FIG. 11B is a diagram showing an example of an image of the measurement result displayed on the display of the input/output device 21 . On the display, the position of the upper surface of the workpiece 12 in the height direction is displayed graphically. The horizontal axis represents the position of the workpiece 12 in the longitudinal direction (x-axis direction), and the vertical axis represents the surface displacement amount (position in the z-axis direction). In addition, the linear component of the height fluctuation is removed, and the surface displacement amount is corrected so that the heights of both ends of the workpiece 12 become zero. An example in which the central portion has a lower shape than both ends is shown in FIG. 11B . The absolute value of the value of the upper surface of the workpiece 12 at the position where the displacement amount from 0 is the largest (the lowest point of the curve in FIG. 11B ) corresponds to the geometric tolerance of straightness. In the example shown in FIG. 11B , the geometrical tolerance of straightness is about 22 μm.

其次,對上述實施例的優異之效果進行說明。 在上述實施例中,當零點校正時,基準器30的撓曲形狀不取決於設置基準器30之工件12上的位置而恆定。因此,能夠使三個零點A0 、B0 、C0 的相對位置關係恆定。此外,在上述實施例中,第1位移計42a的零點A0 、第2位移計42b的真零點B01 及第3位移計42c的零點C0 位於一條直線上。藉由以位於一條直線上之三個零點A0 、B01 、C0 為基準而測量工件12的上表面的直線度,能夠提高直線度的測量精度。Next, the excellent effect of the above-mentioned embodiment will be described. In the above-described embodiment, when the zero point is corrected, the deflection shape of the reference device 30 is constant regardless of the position on the workpiece 12 on which the reference device 30 is provided. Therefore, the relative positional relationship of the three zero points A 0 , B 0 , and C 0 can be made constant. In addition, in the above-mentioned embodiment, the zero point A 0 of the first displacement meter 42a, the true zero point B 01 of the second displacement meter 42b, and the zero point C 0 of the third displacement meter 42c are located on a straight line. By measuring the straightness of the upper surface of the workpiece 12 with reference to the three zero points A 0 , B 01 , and C 0 located on a straight line, the measurement accuracy of the straightness can be improved.

其次,參閱圖12~圖14,對另一實施例的形狀測量裝置及形狀測量方法進行說明。以下,對於與圖1A~圖11B所示之實施例相同之結構省略進行說明。Next, referring to FIGS. 12 to 14 , a shape measuring apparatus and a shape measuring method according to another embodiment will be described. Hereinafter, descriptions of the same structures as those of the embodiment shown in FIGS. 1A to 11B are omitted.

圖12係本實施例的形狀測量方法的流程圖。 在圖10所示之實施例中,每次測量工件12的上表面的沿著一條線之直線度時(步驟SA06),在測量之前進行檢測儀40的零點校正(步驟SA03)。相對於此,在圖12所示之實施例中,在基於溫度感測器45(圖1B)之當前時刻的溫度測定值與上一次進行了零點校正時的溫度測定值之差為閾值以下的情況下,省略零點校正處理(步驟SA02~SA04)(步驟SA10)。僅在基於溫度感測器45(圖1B)之當前時刻的溫度測定值與上一次進行了零點校正時的溫度測定值之差超過閾值之情況下,再次執行零點校正處理(步驟SA02~ SA04)。FIG. 12 is a flowchart of the shape measurement method of the present embodiment. In the embodiment shown in FIG. 10, each time the straightness of the upper surface of the workpiece 12 along a line is measured (step SA06), the zero point calibration of the detector 40 is performed before the measurement (step SA03). On the other hand, in the embodiment shown in FIG. 12 , the difference between the temperature measurement value at the current time by the temperature sensor 45 ( FIG. 1B ) and the temperature measurement value at the time of the previous zero point calibration is equal to or less than the threshold value. In this case, the zero point correction processing (steps SA02 to SA04) is omitted (step SA10). Only when the difference between the temperature measurement value at the current time based on the temperature sensor 45 ( FIG. 1B ) and the temperature measurement value at the time when the zero point correction was performed last time exceeds the threshold value, the zero point correction process is executed again (steps SA02 to SA04 ) .

圖13係表示控制裝置20在輸入輸出裝置21(圖1A)的顯示器上顯示之控制窗口的圖像之圖。在本實施例中,在校正視窗24內,除了零點輸出字段及校正開始按鈕25以外,還顯示分別顯示校正時溫度、校正時刻及當前溫度之輸出字段。還顯示溫度測定按鈕27。FIG. 13 is a diagram showing an image of a control window displayed by the control device 20 on the display of the input/output device 21 (FIG. 1A). In the present embodiment, in the calibration window 24, in addition to the zero point output field and the calibration start button 25, output fields respectively displaying the temperature during calibration, the calibration time and the current temperature are displayed. A temperature measurement button 27 is also displayed.

在校正時溫度的輸出字段中,控制裝置20顯示當最近零點校正時由溫度感測器45測定之溫度測定值。在校正時刻的輸出字段中,控制裝置20顯示最近零點校正時的時刻。在當前溫度的輸出字段中,控制裝置20顯示由溫度感測器45測定之當前時刻的溫度測定值。若操作人員選擇溫度測定按鈕27,則控制裝置20從溫度感測器45獲取當前時刻的溫度測定值,並更新顯示於當前溫度的輸出字段中之測定值。In the output field of the temperature at the time of calibration, the control device 20 displays the temperature measurement value measured by the temperature sensor 45 at the time of the latest zero-point calibration. In the output field of the correction time, the control device 20 displays the time of the latest zero point correction. In the output field of the current temperature, the control device 20 displays the temperature measurement value at the current time measured by the temperature sensor 45 . If the operator selects the temperature measurement button 27, the control device 20 acquires the temperature measurement value at the current time from the temperature sensor 45, and updates the measurement value displayed in the output field of the current temperature.

在最近零點校正時溫度與當前溫度之差超過閾值之情況下,控制裝置20在校正視窗24內顯示督促再次執行零點校正之訊息28。另外,可以代替訊息28而輸出其他警報資訊,例如提高零點校正效率之聲音、警報聲等。When the difference between the temperature during the latest zero-point calibration and the current temperature exceeds the threshold, the control device 20 displays a message 28 in the calibration window 24 urging to perform the zero-point calibration again. In addition, other alarm information can be output instead of the message 28, such as a sound for improving the efficiency of zero point calibration, an alarm sound, and the like.

圖14係表示工件12的上表面的直線度的幾何公差的測量結果及由溫度感測器45(圖1B)測定之溫度的測定值的經時變化之圖表。進行10次對工件12的上表面的沿著平行於x軸之六條線L1~L6中的每條線之直線度進行測量之處理,並針對每個測量處理求出直線度的幾何公差。圖14所示之複數個黑色圓圈符號中的每一個表示藉由一次測量處理而得到之直線度的幾何公差的計算結果。FIG. 14 is a graph showing changes over time in the measurement result of the geometrical tolerance of the straightness of the upper surface of the workpiece 12 and the measurement value of the temperature measured by the temperature sensor 45 ( FIG. 1B ). The process of measuring the straightness of the upper surface of the workpiece 12 along each of the six lines L1 to L6 parallel to the x-axis is performed 10 times, and the geometrical tolerance of the straightness is obtained for each measurement process. Each of the plurality of black circle symbols shown in FIG. 14 represents the calculation result of the geometric tolerance of the straightness obtained by one measurement process.

在測量沿著線L1之直線度之前,進行了檢測儀40的零點校正。然後,從測量沿著線L1之直線度到測量沿著線L5之直線度為止,未進行檢測儀40的零點校正。在測量沿著線L5之直線度之後,在測量沿著線L6之直線度之前進行了檢測儀40的零點校正。Before measuring the straightness along the line L1, a zero point calibration of the detector 40 is performed. Then, from the measurement of the straightness along the line L1 to the measurement of the straightness along the line L5, the zero point calibration of the detector 40 is not performed. After measuring the straightness along the line L5, a zero point calibration of the detector 40 is performed before measuring the straightness along the line L6.

在從開始測量沿著線L1之直線度時到結束測量沿著線L4之直線度為止的期間,基於溫度感測器45之溫度測定值幾乎不變。在從溫度幾乎恆定的期間測量之線L1到線L4為止,沿著每條線之直線度的幾何公差的測量值大致恆定。During the period from when the measurement of the straightness along the line L1 is started to when the measurement of the straightness along the line L4 is completed, the temperature measurement value by the temperature sensor 45 hardly changes. From the line L1 to the line L4 measured during a period when the temperature is almost constant, the measured value of the geometrical tolerance of the straightness along each line is substantially constant.

在測量沿著線L4之直線度之後,溫度因外部因素而開始上升。若在溫度上升之狀態下測量沿著線L5之直線度,則直線度的幾何公差的測量值從在溫度上升之前測量之直線度的幾何公差大幅發生變化。After measuring the straightness along line L4, the temperature starts to rise due to external factors. When the straightness along the line L5 is measured in a state where the temperature rises, the measured value of the geometrical tolerance of the straightness greatly changes from the geometrical tolerance of the straightness measured before the temperature rises.

當再次執行零點校正而測量沿著線L6之直線度的幾何公差時,得到與溫度上升之前測量之沿著線L1~L4中的每條線之直線度的幾何公差的測量值大致相等的測量值。另外,在測量沿著線L5之直線度之後,溫度因外部因素而稍微下降,但是維持比測量沿著線L1~L4中的每條線之直線度時的溫度更高的狀態。When the zero point correction is performed again to measure the geometrical tolerance of the straightness along the line L6, a measurement approximately equal to the measured value of the geometrical tolerance of the straightness along each of the lines L1 to L4 measured before the temperature rise is obtained value. In addition, after measuring the straightness along the line L5, the temperature was slightly lowered due to external factors, but remained higher than when the straightness along each of the lines L1 to L4 was measured.

從圖14所示之測量結果,得到以下兩種見解。 第一,若檢測儀40周圍的溫度沒有變動,則不進行零點校正便能夠高精度地測量直線度。第二,在檢測儀40周圍的溫度發生一定程度的變化之情況下,直線度的測量精度下降,但是藉由再次執行零點校正,能夠使直線度的測量精度恢復到原始的高精度。From the measurement results shown in Fig. 14, the following two insights were obtained. First, if the temperature around the detector 40 does not fluctuate, the straightness can be measured with high accuracy without performing zero point calibration. Second, when the temperature around the detector 40 changes to a certain extent, the measurement accuracy of straightness decreases, but by performing the zero point calibration again, the measurement accuracy of straightness can be restored to the original high accuracy.

其次,對圖12~圖14所示之實施例的優異之效果進行說明。 在本實施例中,如圖13所示,在輸入輸出裝置21(圖1A)的顯示器上顯示最近零點校正時的溫度及當前時刻的溫度。操作人員查看該溫度顯示便能夠容易判斷是否再次進行零點校正。具體而言,若溫度變化超過閾值,則可以再次執行零點校正。該閾值可以根據在直線度的測量中所要求之精度而預先確定。例如,作為閾值,可以設定為0.5℃。又,藉由顯示訊息28以督促進行零點校正,能夠預先防止操作人員忘記執行零點校正的情況。Next, the excellent effects of the embodiments shown in FIGS. 12 to 14 will be described. In this embodiment, as shown in FIG. 13 , the temperature at the time of the latest zero point correction and the temperature at the current time are displayed on the display of the input/output device 21 ( FIG. 1A ). The operator can easily judge whether to perform zero calibration again by viewing the temperature display. Specifically, if the temperature change exceeds the threshold, the zero point correction can be performed again. The threshold value can be predetermined according to the required accuracy in the measurement of straightness. For example, as the threshold value, it can be set to 0.5°C. In addition, by displaying the message 28 to supervise the execution of the zero point calibration, it is possible to prevent the operator from forgetting to execute the zero point calibration in advance.

又,在本實施例中,顯示最近進行了零點校正之時刻。在檢測儀40具有因某種因素而隨著時間的經過在測定值中產生浮動之特性之情況下,操作人員根據從最近進行了零點校正之時刻起的經過時間,能夠判斷是否應該再次執行零點校正。In addition, in this embodiment, the time when the zero point correction was performed most recently is displayed. When the detector 40 has the characteristic that the measured value fluctuates with the passage of time due to some factor, the operator can judge whether or not to perform the zero point again based on the elapsed time from the time when the zero point calibration was most recently performed. Correction.

此外,在本實施例中,如圖12所示,在溫度變化為閾值以下的情況下不進行零點校正,而測量工件12的上表面的沿著下一條線之直線度,因此能夠縮短在測量一個工件12的上表面的直線度時所需的總時間。In addition, in this embodiment, as shown in FIG. 12 , when the temperature change is below the threshold value, the zero point correction is not performed, and the straightness of the upper surface of the workpiece 12 along the next line is measured, so that the measurement time can be shortened. The total time required for the straightness of the upper surface of a workpiece 12.

其次,參閱圖15A及圖15B,對又一實施例的形狀測量裝置進行說明。以下,對於與圖1A~圖11B所示之實施例相同之結構省略進行說明。Next, referring to FIGS. 15A and 15B , a shape measuring apparatus according to another embodiment will be described. Hereinafter, descriptions of the same structures as those of the embodiment shown in FIGS. 1A to 11B are omitted.

圖15A係表示控制裝置20在輸入輸出裝置21(圖1A)的顯示器上顯示之控制窗口的圖像之圖。在本實施例中,在控制窗口內顯示過去測量結果的視窗29。在過去測量結果的視窗29內顯示“選擇過去測量結果”按鈕。FIG. 15A is a diagram showing an image of a control window displayed by the control device 20 on the display of the input/output device 21 (FIG. 1A). In the present embodiment, the window 29 of past measurement results is displayed within the control window. A "select past measurement result" button is displayed in the window 29 of the past measurement result.

若操作人員選擇“選擇過去測量結果”按鈕,則控制裝置20(圖1A)將過去測量並存儲之直線度的測量資料的存儲位置的列表顯示於顯示器。操作人員能夠從該列表中選擇至少一個直線度的測量資料。If the operator selects the button of "select past measurement results", the control device 20 (FIG. 1A) displays a list of storage locations of the measurement data of the straightness measured in the past and stored on the display. The operator can select at least one straightness measurement from this list.

圖15B係表示在輸入輸出裝置21(圖1A)的顯示器上顯示之圖像的一例之圖。在圖11B所示之實施例中,相當於在當前時刻測量之直線度之表面形狀以圖表形式顯示於顯示器。相對於此,在本實施例中,在當前時刻測量之直線度和操作人員選擇之過去測量之直線度作為表面位移量的分佈而重疊顯示於一個圖表上。在圖15B中,粗實線及細實線分別表示在當前時刻測量之直線度及過去測量之直線度。FIG. 15B is a diagram showing an example of an image displayed on the display of the input/output device 21 ( FIG. 1A ). In the embodiment shown in FIG. 11B, the surface shape corresponding to the straightness measured at the current time is displayed on the display in the form of a graph. On the other hand, in this embodiment, the straightness measured at the current time and the straightness measured in the past selected by the operator are superimposed and displayed on one graph as the distribution of the surface displacement amount. In FIG. 15B , the thick solid line and the thin solid line represent the straightness measured at the current moment and the straightness measured in the past, respectively.

其次,對本實施例的優異之效果進行說明。 在本實施例中,操作人員能夠容易比較在當前時刻測量之工件12的上表面的直線度和過去測量之工件12的上表面的直線度。例如,在對一個工件12進行第一次研磨加工之後,增大砂輪16的切入深度而進行第二次研磨加工之情況下,能夠容易比較第一次研磨加工之後的直線度和第二次研磨加工之後的直線度。該比較結果作為推定追加研磨加工的必要性、或進行追加研磨加工時之加工條件例如砂輪16的追加切入深度之基礎資訊係有利的。Next, the excellent effects of the present embodiment will be described. In the present embodiment, the operator can easily compare the straightness of the upper surface of the workpiece 12 measured at the current moment with the straightness of the upper surface of the workpiece 12 measured in the past. For example, in the case where the cutting depth of the grinding wheel 16 is increased after the first grinding process is performed on one workpiece 12 and the second grinding process is performed, the straightness after the first grinding process and the second grinding process can be easily compared. Straightness after machining. This comparison result is advantageous as basic information for estimating the necessity of additional grinding, or processing conditions when performing additional grinding, for example, the additional depth of cut of the grinding wheel 16 .

其次,參閱圖16A~圖16D,對圖5所示之實施例的變形例的基準器30進行說明。Next, referring to FIGS. 16A to 16D , the reference device 30 according to the modification of the embodiment shown in FIG. 5 will be described.

圖16A~圖16D係從斜下方觀察圖5所示之實施例的變形例的基準器30之立體圖。在圖5所示之實施例中,半球狀的三個支腳部33被安裝於主體構件32的底面的在長度方向上的兩端。相對於此,在圖16A所示之變形例中,三個支腳部33安裝在比主體構件32的底面的在長度方向上的兩端稍微靠內側的位置。與圖5所示之實施例同樣,三個支腳部33中的兩個支腳部33安裝於在長度方向上相同之位置。因此,基準器30在長度方向上的兩個部位支撐於工件12的上表面。16A to 16D are perspective views of the reference device 30 according to the modified example of the embodiment shown in FIG. 5 as viewed obliquely from below. In the embodiment shown in FIG. 5 , three hemispherical leg portions 33 are attached to both ends in the longitudinal direction of the bottom surface of the main body member 32 . On the other hand, in the modification shown in FIG. 16A , the three leg portions 33 are attached to positions slightly inward of both ends of the bottom surface of the main body member 32 in the longitudinal direction. Like the embodiment shown in FIG. 5 , two of the three leg portions 33 are installed at the same position in the longitudinal direction. Therefore, the reference tool 30 is supported on the upper surface of the workpiece 12 at two locations in the longitudinal direction.

在圖16B所示之變形例中,支腳部33具有在主體構件32的寬度方向上長的長方體形狀。兩個支腳部33分別被安裝於主體構件32的底面的在長度方向上的兩端。即使在圖16B所示之變形例中,基準器30亦在長度方向上的兩個部位支撐於工件12的上表面。In the modification shown in FIG. 16B , the leg portion 33 has a rectangular parallelepiped shape long in the width direction of the main body member 32 . The two leg portions 33 are respectively attached to both ends in the longitudinal direction of the bottom surface of the main body member 32 . Even in the modification shown in FIG. 16B , the reference tool 30 is supported on the upper surface of the workpiece 12 at two locations in the longitudinal direction.

在圖16C所示之變形例中,支腳部33具有在主體構件32的寬度方向上長的半圓柱形狀。兩個支腳部33以圓柱面朝下方的姿勢分別安裝於主體構件32的底面的在長度方向上的兩端。即使在圖16C所示之變形例中,基準器30亦在長度方向上的兩個部位支撐於工件12的上表面。另外,在圖16B所示之變形例中,支腳部33面接觸於工件12,但是在圖16C所示之變形例中,支腳部33線接觸於工件12。因此,在圖16C所示之變形例中,與圖16B所示之變形例相比,能夠將基準器30更穩定地支撐於工件12的上表面。另外,支腳部33的形狀未必一定是半圓柱狀,只要是在與主體構件32的寬度方向平行之直線上與平面線接觸之形狀即可。In the modification shown in FIG. 16C , the leg portion 33 has a semi-cylindrical shape long in the width direction of the main body member 32 . The two leg portions 33 are respectively attached to both ends in the longitudinal direction of the bottom surface of the main body member 32 with a cylindrical surface facing downward. Even in the modification shown in FIG. 16C , the reference tool 30 is supported on the upper surface of the workpiece 12 at two locations in the longitudinal direction. In addition, in the modification shown in FIG. 16B , the leg portion 33 is in surface contact with the workpiece 12 , but in the modification shown in FIG. 16C , the leg portion 33 is in line contact with the workpiece 12 . Therefore, in the modification shown in FIG. 16C , compared with the modification shown in FIG. 16B , the reference tool 30 can be more stably supported on the upper surface of the workpiece 12 . In addition, the shape of the leg part 33 does not necessarily have to be a semi-cylindrical shape, and may be a shape that is in contact with a plane line on a straight line parallel to the width direction of the main body member 32 .

在圖16D所示之變形例中,半球狀的四個支腳部33被安裝於主體構件32的底面的四個角。即使在圖16D所示之變形例中,基準器30在長度方向上的兩個部位支撐於工件12的上表面。In the modification shown in FIG. 16D , four hemispherical legs 33 are attached to the four corners of the bottom surface of the main body member 32 . Even in the modification shown in FIG. 16D , the reference tool 30 is supported on the upper surface of the workpiece 12 at two locations in the longitudinal direction.

如上前述,即使在圖16A~圖16D所示之變形例中,基準器30亦具有在長度方向上的兩個部位支撐之支撐結構。因此,與圖5所示之實施例的情況同樣,在設置於工件12的上表面上之狀態下,基準面31的撓曲形狀不取決於工件12的上表面的凹凸形狀。因此,藉由使用基準器30以參閱圖7B已說明之方法進行檢測儀40的零點校正,能夠將零點偏移量g0 確定為使三個第1位移計42a的零點A0 、第2位移計42b的真零點B01 及第3位移計42c的零點C0 位於一條直線上。As described above, even in the modified example shown in FIGS. 16A to 16D , the reference device 30 has a support structure supported by two parts in the longitudinal direction. Therefore, as in the case of the embodiment shown in FIG. 5 , the deflection shape of the reference surface 31 does not depend on the concavo-convex shape of the upper surface of the workpiece 12 when it is provided on the upper surface of the workpiece 12 . Therefore, by using the reference device 30 to perform the zero point calibration of the detector 40 by the method described with reference to FIG. 7B , the zero point offset amount g 0 can be determined as the zero point A 0 and the second displacement of the three first displacement meters 42 a . The true zero point B 01 of the gauge 42b and the zero point C 0 of the third displacement gauge 42c are located on a straight line.

其次,參閱圖17A及圖17B,對圖5所示之實施例的另一變形例的基準器30進行說明。Next, referring to FIGS. 17A and 17B , a reference device 30 according to another modification of the embodiment shown in FIG. 5 will be described.

圖17A係失重狀態下之基準器30的側視圖,圖17B係設置於工件12的上表面上之狀態下之基準器30的側視圖。在圖5所示之實施例中,在將基準器30設置於工件12的上表面上之狀態下,在基準面31上產生朝下方凸出之撓曲。相對於此,在本變形例中,在失重狀態下,基準面31(圖17A)以朝上方凸出之方式彎曲。若將基準器30設置於工件12的上表面上,則因自重而在基準器30上產生撓曲。撓曲後的基準面31(圖17B)的形狀成為在幾何學上正確之平面。FIG. 17A is a side view of the reference tool 30 in a weightless state, and FIG. 17B is a side view of the reference tool 30 in a state where it is installed on the upper surface of the workpiece 12 . In the embodiment shown in FIG. 5 , in a state in which the reference tool 30 is set on the upper surface of the workpiece 12 , the reference surface 31 has a deflection that protrudes downward. On the other hand, in this modification, in the weightless state, the reference surface 31 ( FIG. 17A ) is curved so as to protrude upward. When the reference tool 30 is installed on the upper surface of the workpiece 12, the reference tool 30 is deflected due to its own weight. The shape of the deflected reference plane 31 (FIG. 17B) becomes a geometrically correct plane.

在圖17A及圖17B所示之變形例中,在將基準器30設置於工件12的上表面上之狀態下,基準面31成為平面,因此檢測儀40的零點偏移量g0 成為0。因此,不使用式(4)而能夠使用式(1)來計算偏移量g。In the modification shown in FIGS. 17A and 17B , the reference plane 31 becomes a flat surface in a state where the reference device 30 is set on the upper surface of the workpiece 12 , so the zero offset g 0 of the detector 40 becomes zero. Therefore, the offset amount g can be calculated using Equation (1) instead of Equation (4).

在上述實施例中,檢測儀40具有第1位移計42a、第2位移計42b及第3位移計42c共計三個位移計,但是亦可構成為具有四個以上的位移計。In the above-described embodiment, the detector 40 has three displacement meters in total, the first displacement meter 42a, the second displacement meter 42b, and the third displacement meter 42c, but may be configured to include four or more displacement meters.

上述各實施例及變形例係示例,當然,在不同實施例中所示結構能夠部分替換或組合。關於複數個實施例的基於相同結構的相同之作用效果,對每個實施例不逐一說明。此外,本發明並非係受上述實施例的限制者。對於本領域技術人員而言,很顯然能夠進行各種變更、改進、組合等。The above embodiments and modifications are examples. Of course, the structures shown in different embodiments can be partially replaced or combined. The same functions and effects based on the same structure of the plurality of embodiments will not be described one by one for each embodiment. In addition, the present invention is not limited by the above-mentioned embodiments. It will be apparent to those skilled in the art that various alterations, improvements, combinations and the like can be made.

10:可動工作台 11:工作台引導機構 12:工件 15:砂輪頭 16:砂輪 18:導軌 20:控制裝置 21:輸入輸出裝置 22:測定顯示視窗 23:基本設定視窗 24:校正視窗 25:校正開始按鈕 26:測定開始按鈕 27:溫度測定按鈕 28:督促零點校正之訊息 29:過去測量結果視窗 30:基準器 31:基準面 32:主體構件 33:支腳部 40:檢測儀 41:支撐基座 42a:第1位移計 42b:第2位移計 42c:第3位移計 45:溫度感測器10: Movable workbench 11: Workbench guide mechanism 12: Workpiece 15: Wheel head 16: Grinding wheel 18: Rails 20: Control device 21: Input and output device 22: Measurement display window 23: Basic Settings Window 24: Correction window 25: Calibration start button 26: Measurement start button 27: Temperature measurement button 28: Message to urge zero point calibration 29: Past measurement results window 30: Benchmark 31: Datum plane 32: Main components 33: Legs 40: Detector 41: Support base 42a: 1st Displacement Gauge 42b: 2nd displacement gauge 42c: 3rd displacement gauge 45: Temperature sensor

[圖1A]係組裝有實施例的形狀測量裝置之研磨裝置的立體圖,[圖1B]係在砂輪頭上安裝有檢測儀之狀態下之檢測儀的側視圖。 [圖2]係表示測量對象亦即工件的上表面及檢測儀之示意圖。 [圖3]係表示檢測儀的第1位移計、第2位移計、第3位移計與基準器的位置關係之示意圖。 [圖4A]及[圖4B]係在將比較例的檢測儀的校正方法中使用之基準器放置在工件上表面上之狀態的剖面圖。 [圖5]係從斜下方觀察在實施例的形狀測量裝置中使用之基準器之立體圖。 [圖6A]及[圖6B]係將在實施例的形狀測量裝置中使用之基準器放置在工件的上表面上之狀態的剖面圖。 [圖7A]係具有兩端支撐均布荷重的樑結構之基準器的示意圖,[圖7B]係表示在實施例的形狀測量裝置中使用之基準器與檢測儀的位置關係之示意圖。 [圖8A~圖8C]係評價實驗中之工件、基準器及檢測儀的位置關係之圖。 [圖9A]係表示使用不具有支腳部之長方體形狀的基準器來測量之偏移量g的分佈之圖表,[圖9B]係表示使用在實施例的形狀測量裝置中使用之基準器(圖5)亦即具有支腳部之基準器來測量之偏移量g的分佈之圖表。 [圖10]係實施例的形狀測量方法的流程圖。 [圖11A]係表示控制裝置在輸入輸出裝置的顯示器上顯示之控制窗口的圖像之圖,[圖11B]係表示在輸入輸出裝置的顯示器上顯示之測量結果的圖像的一例之圖。 [圖12]係另一實施例的形狀測量方法的流程圖。 [圖13]係表示圖12所示之實施例的控制裝置在輸入輸出裝置(圖1A)的顯示器上顯示之控制窗口的圖像的一例之圖。 [圖14]係表示工件上表面的直線度的幾何公差的測量結果、及由溫度感測器(圖1B)測定之溫度測定值的經時變化之圖表。 [圖15A]係表示又一實施例的形狀測量裝置的控制裝置在輸入輸出裝置(圖1A)的顯示器上顯示之控制窗口的圖像的一例之圖,[圖15B]係在輸入輸出裝置(圖1A)的顯示器上顯示之圖像的一例之圖。 [圖16A~圖16D]係從斜下方觀察圖5所示之實施例的變形例的基準器之立體圖。 [圖17A]係圖5所示之實施例的另一變形例的基準器在失重狀態下之側視圖,[圖17B]係設置於工件上表面上之狀態下的基準器的側視圖。FIG. 1A is a perspective view of a grinding device incorporating the shape measuring device of the embodiment, and FIG. 1B is a side view of the tester in a state where the tester is attached to the grinding wheel head. Fig. 2 is a schematic diagram showing the upper surface of the workpiece, which is the measurement object, and the detector. Fig. 3 is a schematic diagram showing the positional relationship between the first displacement gauge, the second displacement gauge, the third displacement gauge, and the reference device of the detector. [ Fig. 4A ] and [ Fig. 4B ] are cross-sectional views of a state in which a reference device used in the calibration method of the detector of the comparative example is placed on the upper surface of the workpiece. [ Fig. 5] Fig. 5 is a perspective view of the reference tool used in the shape measuring device of the embodiment as viewed obliquely from below. [ Fig. 6A ] and [ Fig. 6B ] are cross-sectional views of a state in which the reference tool used in the shape measuring device of the embodiment is placed on the upper surface of the workpiece. Fig. 7A is a schematic diagram of a datum having a beam structure supporting uniformly distributed loads at both ends, and [ Fig. 7B ] is a schematic diagram showing the positional relationship between the datum and the detector used in the shape measuring device of the embodiment. [FIG. 8A to FIG. 8C] are diagrams showing the positional relationship between the workpiece, the benchmark, and the detector in the evaluation experiment. [ Fig. 9A ] is a graph showing the distribution of the offset amount g measured using a reference device having a rectangular parallelepiped shape without legs, and [ Fig. 9B ] is a graph showing a reference device ( Fig. 5) is a graph of the distribution of the offset g measured by the reference device with the feet. 10 is a flowchart of the shape measurement method of the embodiment. 11A is a diagram showing an image of a control window displayed by the control device on the display of the input/output device, and [ FIG. 11B ] is a diagram showing an example of an image of a measurement result displayed on the display of the input/output device. [ Fig. 12 ] A flowchart of a shape measurement method according to another embodiment. 13 is a diagram showing an example of an image of a control window displayed on the display of the input/output device ( FIG. 1A ) by the control device of the embodiment shown in FIG. 12 . [ Fig. 14 ] It is a graph showing the measurement result of the geometrical tolerance of the straightness of the upper surface of the workpiece and the time-dependent change of the temperature measurement value measured by the temperature sensor ( Fig. 1B ). [ Fig. 15A ] A diagram showing an example of an image of a control window displayed on the display of the input/output device ( Fig. 1A ) by the control device of the shape measuring device according to another embodiment, and [ Fig. 15B ] A diagram of an example of an image displayed on the display of FIG. 1A). 16A to 16D are perspective views of a reference device of a modification example of the embodiment shown in FIG. 5 as viewed obliquely from below. [ Fig. 17A ] is a side view of the reference device in a weightless state according to another modification of the embodiment shown in Fig. 5 , and [ Fig. 17B ] is a side view of the reference device in a state of being installed on the upper surface of a workpiece.

12:工件12: Workpiece

30:基準器30: Benchmark

31:基準面31: Datum plane

32:主體構件32: Main components

33:支腳部33: Legs

Claims (9)

一種形狀測量裝置,其特徵為係具有:檢測儀,係包括排成一列之至少三個位移計,並藉由與測量對象物對向配置而檢測從前述至少三個位移計到前述測量對象物為止的距離的位移;基準器,係藉由支撐於支撐構件上而提供前述檢測儀的校正用基準面;以及控制裝置,係校正前述基準器,前述基準器具有在前述至少三個位移計排列之方向上在兩個部位支撐於前述支撐構件上的支撐結構,前述控制裝置,藉由在使前述至少三個位移計對向前述基準面之狀態下校正前述檢測儀,用以校正前述至少三個檢測儀的上下位置的偏差。 A shape measuring device is characterized by having: a detector including at least three displacement gauges arranged in a row, and by being arranged opposite to the measurement object to detect the distance from the at least three displacement gauges to the measurement object Displacement of the distance up to; a reference device, which is supported on a support member to provide a reference plane for calibration of the detector; and a control device for calibrating the reference device, the reference device having the at least three displacement meters arranged in the above-mentioned The support structure is supported on the support member at two positions in the direction of the control device, and the control device is used to calibrate the at least three displacement gauges by calibrating the detector in a state where the at least three displacement gauges face the reference plane. The deviation of the upper and lower positions of each detector. 如請求項1所述之形狀測量裝置,其中,前述基準器具有在一方向上長的形狀,前述支撐結構包括從與前述基準面相反之一側的底面突出之三個支腳部,前述三個支腳部中的兩個支腳部配置於在前述基準器的長度方向上相同之位置。 The shape measuring device according to claim 1, wherein the reference tool has a shape elongated in one direction, the support structure includes three leg portions protruding from a bottom surface on a side opposite to the reference surface, the three Two of the leg portions are arranged at the same position in the longitudinal direction of the reference tool. 一種形狀測量裝置,其特徵為係具有:檢測儀,係包括排成一列之至少三個位移計,並藉由與測量對象物對向配置而檢測從前述至少三個位移計的每一個到前述測量對象物為止的距離的位移;基準器,係藉由支撐於支撐構件上而提供用於校正前述檢測儀的基準面;以及 控制裝置,係校正前述基準器,在將前述基準器支撐於前述支撐構件上之狀態下,因自重而產生撓曲,產生撓曲的狀態下之前述基準面的形狀具有不受前述支撐構件上表面的凹凸的影響之結構,前述控制裝置在使前述至少三個位移計對向前述基準面之狀態下校正前述檢測儀。 A shape measuring device is characterized by having: a detector including at least three displacement gauges arranged in a row, and by being arranged opposite to a measurement object to detect from each of the at least three displacement gauges to the above Displacement of the distance to the measurement object; a reference device, which is supported on a support member to provide a reference plane for calibrating the detector; and A control device for calibrating the reference device, in a state where the reference device is supported on the support member, deflection occurs due to its own weight, and the shape of the reference surface in the state where the deflection occurs has a shape that is not affected by the support member. In the structure affected by the unevenness of the surface, the control device calibrates the detector in a state in which the at least three displacement gauges face the reference plane. 如請求項1至請求項3中任一項所述之形狀測量裝置,其中,前述控制裝置存儲有當將前述基準器放置在支撐構件上時在前述基準面上產生之撓曲的形狀,並依據所存儲之撓曲的形狀來校正前述檢測儀。 The shape measuring device according to any one of Claims 1 to 3, wherein the control means stores the shape of the deflection generated on the reference plane when the reference device is placed on the support member, and The detector is calibrated according to the stored shape of the deflection. 如請求項1至請求項3中任一項所述之形狀測量裝置,係還具有:輸入輸出裝置,係向前述控制裝置輸入指令,並且藉由前述控制裝置進行輸出測量結果;以及溫度感測器,係測定前述檢測儀的溫度被反映之部位的溫度,前述控制裝置將最近校正時基於前述溫度感測器之測定值及當前時刻的基於前述溫度感測器之測定值輸出到前述輸入輸出裝置。 The shape measuring device according to any one of claim 1 to claim 3, further comprising: an input/output device for inputting an instruction to the control device, and for outputting a measurement result by the control device; and a temperature sensing device The device measures the temperature of the part where the temperature of the detector is reflected, and the control device outputs the measured value based on the temperature sensor at the latest calibration and the measured value based on the temperature sensor at the current time to the input and output device. 如請求項5所述之形狀測量裝置,其中,若最近校正時基於前述溫度感測器之測定值與當前時刻的基於前述溫度感測器之測定值之差超過閾值,則前述控制裝置使督促校正前述檢測儀之警報資訊從前述輸入輸 出裝置輸出。 The shape measuring device according to claim 5, wherein if the difference between the measured value based on the temperature sensor at the latest calibration and the measured value based on the temperature sensor at the current time exceeds a threshold value, the control means makes the prompt Correct the alarm information of the aforementioned detector from the aforementioned input output from the device. 如請求項5所述之形狀測量裝置,其中,前述控制裝置一邊使測量對象物及前述檢測儀中的一個相對於另一個在前述至少三個位移計排列之方向移動,一邊測量並存儲測量對象物表面的直線度,將測量對象物表面的直線度的複數個測量結果以能夠比較之態樣輸出到前述輸入輸出裝置。 The shape measuring device according to claim 5, wherein the control device measures and stores the measurement object while moving one of the measurement object and the detector relative to the other in the direction in which the at least three displacement meters are arranged For the straightness of the object surface, a plurality of measurement results of the straightness of the surface of the object to be measured are output to the aforementioned input/output device in a form that can be compared. 一種基準器,其特徵為係具有:基準面,係與排成一列之三個位移計相對向;以及三個支腳部,係從與前述基準面相反之一側的底面突出,前述三個支腳部中的兩個支腳部配置於在前述基準面的長度方向上相同之位置。 A reference device is characterized in that it has: a reference plane, which is opposite to three displacement meters arranged in a row; Two of the leg portions are arranged at the same position in the longitudinal direction of the reference plane. 一種校正方法,其為檢測儀的校正方法,該檢測儀藉由使排成一列之至少三個位移計與測量對象物對向配置而檢測從前述至少三個位移計的每一個到前述測量對象物為止的距離的位移,前述校正方法的特徴為:在使前述至少三個位移計對向基準器的基準面之姿勢下,使前述基準器在前述至少三個位移計排列之方向上在兩個部位支撐於支撐構件上,藉由在使前述至少三個位移計對向前述基準面之狀態下校正前述檢測儀,用以校正前述至少三個檢測儀的上下位置的偏差。 A calibration method, which is a calibration method of a detector that detects from each of the at least three displacement meters to the measurement object by arranging at least three displacement meters in a row to face the measurement object The characteristic of the above-mentioned calibration method is to make the above-mentioned at least three displacement gauges face the reference plane of the reference device in two positions in the direction in which the above-mentioned at least three displacement gauges are arranged. Each position is supported on the support member, and the detector is calibrated in a state where the at least three displacement gauges face the reference plane, so as to correct the deviation of the upper and lower positions of the at least three detectors.
TW109125939A 2019-08-30 2020-07-31 Calibration method of shape measuring device, reference device and detector TWI777205B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019-158610 2019-08-30
JP2019158610A JP7296279B2 (en) 2019-08-30 2019-08-30 Shape measuring device and detector calibration method

Publications (2)

Publication Number Publication Date
TW202118580A TW202118580A (en) 2021-05-16
TWI777205B true TWI777205B (en) 2022-09-11

Family

ID=74733491

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109125939A TWI777205B (en) 2019-08-30 2020-07-31 Calibration method of shape measuring device, reference device and detector

Country Status (4)

Country Link
JP (1) JP7296279B2 (en)
KR (1) KR102871123B1 (en)
CN (1) CN112444229B (en)
TW (1) TWI777205B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20250116513A1 (en) * 2023-10-06 2025-04-10 Pratt & Whitney Canada Corp. Machining system and method for validating dimensional measurement device operation
CN119609760B (en) * 2025-02-13 2025-06-20 山东大学 Machine tool straightness error calculation method and system based on linear guide deformation

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020148275A1 (en) * 2001-03-02 2002-10-17 Mitutoyo Corporation Method and apparatus for calibrating measuring machines
CN1912542A (en) * 2005-08-08 2007-02-14 东芝机械株式会社 Double-side shape measuring device and method for substrate
TW201017096A (en) * 2008-10-29 2010-05-01 Sumitomo Heavy Industries Straightness measuring method and straightness measuring apparatus

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006029983A (en) * 2004-07-16 2006-02-02 Yokogawa Electric Corp Displacement measuring device
DE102004054876B3 (en) * 2004-11-12 2006-07-27 Sirona Dental Systems Gmbh Measuring device for 3D measurement of tooth models, sliding plate and method
JP2007187499A (en) * 2006-01-12 2007-07-26 Nikon Corp Measuring device
JP2009128014A (en) * 2007-11-19 2009-06-11 Sanyo Electric Co Ltd Beam irradiation apparatus
JP5494446B2 (en) * 2010-12-02 2014-05-14 株式会社ニコン Flatness measuring device
US8899535B2 (en) * 2012-04-05 2014-12-02 The Boeing Company Mount for a calibration standard
WO2014100598A1 (en) * 2012-12-21 2014-06-26 Hexagon Metrology, Inc. Calibration artifact and method of calibrating a coordinate measuring machine
CN105937886B (en) * 2015-03-04 2020-01-10 住友重机械工业株式会社 Shape measuring device, machining device, and method for correcting shape measuring device
JP2017219333A (en) * 2016-06-03 2017-12-14 オリンパス株式会社 Shape measurement device and shape measurement method
WO2018158994A1 (en) * 2017-02-28 2018-09-07 パナソニックIpマネジメント株式会社 Displacement measuring apparatus and displacement measuring method
JP7296334B2 (en) * 2020-03-26 2023-06-22 住友重機械工業株式会社 Straightness measurement system, displacement sensor calibration method, and straightness measurement method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020148275A1 (en) * 2001-03-02 2002-10-17 Mitutoyo Corporation Method and apparatus for calibrating measuring machines
CN1912542A (en) * 2005-08-08 2007-02-14 东芝机械株式会社 Double-side shape measuring device and method for substrate
TW201017096A (en) * 2008-10-29 2010-05-01 Sumitomo Heavy Industries Straightness measuring method and straightness measuring apparatus
CN101726279A (en) * 2008-10-29 2010-06-09 住友重机械工业株式会社 Linearly measurement method and device

Also Published As

Publication number Publication date
TW202118580A (en) 2021-05-16
KR20210027079A (en) 2021-03-10
JP2021038940A (en) 2021-03-11
CN112444229B (en) 2022-06-24
JP7296279B2 (en) 2023-06-22
CN112444229A (en) 2021-03-05
KR102871123B1 (en) 2025-10-14

Similar Documents

Publication Publication Date Title
US7376261B2 (en) Surface scan measuring device and method of forming compensation table for scanning probe
EP2090861B1 (en) Method of measuring front and back surfaces of target object
TWI777205B (en) Calibration method of shape measuring device, reference device and detector
TWI534410B (en) Linear shape measurement method and linear shape measuring device
JP7296334B2 (en) Straightness measurement system, displacement sensor calibration method, and straightness measurement method
CN103512493B (en) Position-measurement device
TWI609171B (en) Shape measuring device, processing device, and shape measuring device calibration method
EP2085739B1 (en) Probe straightness measuring method
CN107525457B (en) Industrial machine
JP4931867B2 (en) Variable terminal
JP5642213B2 (en) Machine tool level adjustment method and apparatus
JP4531685B2 (en) Shape measuring device and shape measuring method
US9664604B2 (en) Measurement apparatus, measurement method, and method of manufacturing article
JP2019152554A (en) Lens thickness measuring device
JP6128639B2 (en) Measuring method
JP2008216122A (en) Surface property measuring device
JP2008524576A (en) Sequential multi-probe method for straightness measurement of straight rulers
JP5051567B2 (en) Surface shape displacement measuring device and measuring method
JP5715365B2 (en) Straightness measuring device and straightness measuring method
JP2014137274A (en) Geometric quantity acquisition device and geometric quantity acquisition method
JPH02253112A (en) Form measuring instrument

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent