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TWI772656B - 濺鍍成膜裝置 - Google Patents

濺鍍成膜裝置 Download PDF

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Publication number
TWI772656B
TWI772656B TW108122913A TW108122913A TWI772656B TW I772656 B TWI772656 B TW I772656B TW 108122913 A TW108122913 A TW 108122913A TW 108122913 A TW108122913 A TW 108122913A TW I772656 B TWI772656 B TW I772656B
Authority
TW
Taiwan
Prior art keywords
sputtering
target
film
magnet
forming apparatus
Prior art date
Application number
TW108122913A
Other languages
English (en)
Chinese (zh)
Other versions
TW202014542A (zh
Inventor
阪上弘敏
大野哲宏
Original Assignee
日商愛發科股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商愛發科股份有限公司 filed Critical 日商愛發科股份有限公司
Publication of TW202014542A publication Critical patent/TW202014542A/zh
Application granted granted Critical
Publication of TWI772656B publication Critical patent/TWI772656B/zh

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Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/35Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3441Dark space shields

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
TW108122913A 2018-06-28 2019-06-28 濺鍍成膜裝置 TWI772656B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018123681 2018-06-28
JP2018-123681 2018-06-28

Publications (2)

Publication Number Publication Date
TW202014542A TW202014542A (zh) 2020-04-16
TWI772656B true TWI772656B (zh) 2022-08-01

Family

ID=68984940

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108122913A TWI772656B (zh) 2018-06-28 2019-06-28 濺鍍成膜裝置

Country Status (5)

Country Link
JP (1) JP6959447B2 (ja)
KR (1) KR102351170B1 (ja)
CN (1) CN111417741B (ja)
TW (1) TWI772656B (ja)
WO (1) WO2020004619A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12359338B2 (en) 2020-11-16 2025-07-15 Ebara Corporation Plate, apparatus for plating, and method of manufacturing plate
JP7745578B2 (ja) * 2023-01-18 2025-09-29 株式会社アルバック スパッタリング装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5736021A (en) * 1996-07-10 1998-04-07 Applied Materials, Inc. Electrically floating shield in a plasma reactor
US20080110747A1 (en) * 1999-10-08 2008-05-15 Applied Materials, Inc. Self-ionized and inductively-coupled plasma for sputtering and resputtering

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4450472B2 (ja) * 2000-03-08 2010-04-14 株式会社アルバック スパッタリング装置
KR100993046B1 (ko) * 2001-11-14 2010-11-08 어플라이드 머티어리얼스, 인코포레이티드 스퍼터링 및 재스퍼터링을 위한 자기-이온화 및 유도 결합플라즈마
WO2008149891A1 (ja) * 2007-06-04 2008-12-11 Canon Anelva Corporation 成膜装置
KR101305114B1 (ko) * 2008-08-01 2013-09-05 샤프 가부시키가이샤 스퍼터링 장치
KR20120130335A (ko) 2010-03-01 2012-11-30 가부시키가이샤 알박 스퍼터링 장치
JP5265811B2 (ja) * 2010-06-03 2013-08-14 株式会社アルバック スパッタ成膜装置
JP5824072B2 (ja) * 2011-12-27 2015-11-25 キヤノンアネルバ株式会社 スパッタリング装置
KR102182674B1 (ko) * 2013-12-20 2020-11-26 삼성디스플레이 주식회사 스퍼터링 장치

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5736021A (en) * 1996-07-10 1998-04-07 Applied Materials, Inc. Electrically floating shield in a plasma reactor
US20080110747A1 (en) * 1999-10-08 2008-05-15 Applied Materials, Inc. Self-ionized and inductively-coupled plasma for sputtering and resputtering

Also Published As

Publication number Publication date
WO2020004619A1 (ja) 2020-01-02
KR20200083568A (ko) 2020-07-08
CN111417741B (zh) 2022-05-10
TW202014542A (zh) 2020-04-16
JPWO2020004619A1 (ja) 2020-12-17
KR102351170B1 (ko) 2022-01-14
JP6959447B2 (ja) 2021-11-02
CN111417741A (zh) 2020-07-14

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