[go: up one dir, main page]

TWI771658B - Probe detecting equipment and 3d detecting method of probe - Google Patents

Probe detecting equipment and 3d detecting method of probe Download PDF

Info

Publication number
TWI771658B
TWI771658B TW109107056A TW109107056A TWI771658B TW I771658 B TWI771658 B TW I771658B TW 109107056 A TW109107056 A TW 109107056A TW 109107056 A TW109107056 A TW 109107056A TW I771658 B TWI771658 B TW I771658B
Authority
TW
Taiwan
Prior art keywords
probe
magnetic
magnet
probes
module
Prior art date
Application number
TW109107056A
Other languages
Chinese (zh)
Other versions
TW202134638A (en
Inventor
林嘉洤
黃育辰
李敬賢
賴以昕
江泰霖
董為劭
Original Assignee
中國探針股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 中國探針股份有限公司 filed Critical 中國探針股份有限公司
Priority to TW109107056A priority Critical patent/TWI771658B/en
Publication of TW202134638A publication Critical patent/TW202134638A/en
Application granted granted Critical
Publication of TWI771658B publication Critical patent/TWI771658B/en

Links

Images

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

The present invention provides a probe detecting equipment, a 3D detecting method of probe, and a probe positioning carrier. The probe detecting equipment includes a plurality of probe positioning carriers, a transporting module, and a photographing module. Each of the probe positioning carriers includes an insulating base and a magnetic unit embedded in the insulating base. The magnetic unit has a first magnetic extreme and a second magnetic extreme with opposite polarities and located on opposite sides. The insulating base can be used for a probe to be inserted, and the first magnetic extreme attracts the probe to keep the probe upright. A plurality of the probe positioning carriers are moved through the transporting module, and the photographing module is used for photographing the probes on at least one of the probe positioning carriers moving on the transmission module.

Description

探針檢測設備及探針的三維檢測方法 Probe inspection equipment and probe three-dimensional inspection method

本發明涉及一種檢測設備,尤其涉及一種探針檢測設備、探針的三維檢測方法、及探針定位載具。 The invention relates to a detection device, in particular to a probe detection device, a three-dimensional detection method of a probe, and a probe positioning carrier.

在現有探針之瑕疵檢測流程中,因為探針的重量極輕且體積極小,不易被自動化機器抓取(或吸取)及擺置;因此往往無法以自動化的方式進行360度全方位檢測,且因該類探針的瑕疵尺寸極小,往往小至微米(μm)等級,須搭配以高倍顯微鏡進行視覺的放大及影像檢測。 In the flaw detection process of the existing probes, because the probes are extremely light in weight and small in size, they are not easy to be grasped (or sucked) and placed by automated machines; therefore, it is often impossible to perform 360-degree all-round inspections in an automated way. And because the size of the flaws of such probes is extremely small, often as small as micron (μm), a high-power microscope must be used for visual magnification and image detection.

以往進行檢測時,該類探針需要藉由人工手動的方式將待測物平躺於平台上,置於顯微鏡下並進行待測物的翻撥以及人工視覺檢測。過程不但費時費力且人工辨識的正確度亦無法確認。 In the past, when testing, this type of probe needs to manually lay the object to be tested on the platform, place it under a microscope, and perform flipping and artificial visual inspection of the object to be tested. The process is not only time-consuming and labor-intensive, but also the accuracy of manual identification cannot be confirmed.

於是,本發明人認為上述缺陷可改善,乃特潛心研究並配合科學原理的運用,終於提出一種設計合理且有效改善上述缺陷的本發明。 Therefore, the inventor believes that the above-mentioned defects can be improved. Nate has devoted himself to research and application of scientific principles, and finally proposes an invention with reasonable design and effective improvement of the above-mentioned defects.

本發明實施例在於提供一種探針檢測設備、探針的三維檢測方法、及探針定位載具,其能有效地改善現有探針之瑕疵檢測流程所可能產生的缺陷。 The embodiments of the present invention provide a probe detection device, a three-dimensional probe detection method, and a probe positioning carrier, which can effectively improve the defects that may be generated by the defect detection process of the existing probe.

本發明實施例公開一種探針檢測設備,包括:多個探針定位載具,各用來供一探針沿任意方向置入;其中,每個所述探針定位載具包含:一絕緣座,具有一第一端面及自所述第一端面凹設的一限位槽;及一磁力單元,埋置於所述絕緣座內,並且所述磁力單元具有極性相反且位於相反側的一第一磁極端與一第二磁極端;其中,所述第一磁極端鄰設於所述限位槽,並且所述第一磁極端與所述限位槽的一槽底之間相距不大於3公厘(mm);其中,所述絕緣座能用來供一探針插入所述限位槽且彼此呈點接觸,並且所述第一磁極端吸附所述探針,以使所述探針保持直立於所述第一磁極端;一傳輸模組,定義有一傳輸路徑,並且多個所述探針定位載具通過所述傳輸模組而沿著所述傳輸路徑移動;以及一拍攝模組,對應於所述傳輸路徑設置,並且所述拍攝模組能用來對沿著所述傳輸路徑移動的至少一個所述探針定位載具上的所述探針拍攝。 An embodiment of the present invention discloses a probe detection device, comprising: a plurality of probe positioning carriers, each of which is used for placing a probe in any direction; wherein each of the probe positioning carriers includes: an insulating seat , which has a first end face and a limiting groove recessed from the first end face; and a magnetic force unit embedded in the insulating seat, and the magnetic force unit has a first end face with opposite polarity and located on the opposite side A magnetic end and a second magnetic end; wherein, the first magnetic end is adjacent to the limiting slot, and the distance between the first magnetic end and a slot bottom of the limiting slot is not more than 3 millimeters (mm); wherein, the insulating base can be used for a probe to be inserted into the limiting groove and make point contact with each other, and the first magnetic end attracts the probe, so that the probe remain upright on the first magnetic end; a transmission module defines a transmission path, and a plurality of the probe positioning carriers move along the transmission path through the transmission module; and a photographing module , corresponding to the transmission path, and the photographing module can be used to photograph the probe on at least one of the probe positioning carriers moving along the transmission path.

本發明實施例也公開一種探針的三維檢測方法,包括:實施一前置步驟:提供如上所述的探針檢測設備;實施一載針步驟:於每個所述探針定位載具中置入一探針,以使所述探針插入所述限位槽且彼此呈點接觸,並且每個所述探針定位載具的所述第一磁極端吸附相對應所述探針,以使相對應所述探針保持直立於所述第一磁極端;以及實施一檢測步驟:以所述傳輸模組將多個所述探針定位載具及吸附於其上的多個所述探針沿著所述傳輸路徑移動,並且通過所述拍攝模組依序的對多個所述探針定位載具上的所述探針進行拍攝、以取得每個所述探針的一檢測資訊。 The embodiment of the present invention also discloses a three-dimensional detection method of a probe, which includes: implementing a pre-step: providing the probe detection device as described above; implementing a needle-carrying step: placing the probe in the middle of each probe positioning carrier A probe is inserted so that the probes are inserted into the limiting grooves and are in point contact with each other, and the first magnetic end of each probe positioning carrier attracts the corresponding probes, so that Correspondingly, the probes remain upright on the first magnetic end; and a detection step is performed: using the transmission module to position a plurality of the probes on a carrier and a plurality of the probes adsorbed thereon Moving along the transmission path, and sequentially photographing the probes on a plurality of the probe positioning carriers by the photographing module to obtain a detection information of each of the probes.

本發明實施例還公開一種探針定位載具,包括:一絕緣座,具有一第一端面及自所述第一端面凹設的一限位槽;及一磁力單元,埋置於所述絕緣座內,並且所述磁力單元具有極性相反且位於相反側的一第一磁極端與一第二磁極端;其中,所述第一磁極端鄰設於所述限位槽,並且所述第一磁 極端與所述限位槽的一槽底之間相距不大於3公厘(mm);其中,所述絕緣座能用來供一探針插入所述限位槽且彼此呈點接觸,並且所述第一磁極端吸附所述探針,以使所述探針保持直立於所述第一磁極端。 An embodiment of the present invention also discloses a probe positioning carrier, comprising: an insulating seat having a first end surface and a limiting groove recessed from the first end surface; and a magnetic force unit embedded in the insulating seat inside the seat, and the magnetic unit has a first magnetic end and a second magnetic end with opposite polarities and located on opposite sides; wherein, the first magnetic end is adjacent to the limiting slot, and the first magnetic end magnetic The distance between the extreme end and a groove bottom of the limiting groove is not more than 3 millimeters (mm); wherein, the insulating seat can be used for a probe to be inserted into the limiting groove and are in point contact with each other, and all the The first magnetic end attracts the probe to keep the probe upright on the first magnetic end.

綜上所述,本發明的有益效果在於,本發明所提供的一種探針檢測設備、探針的三維檢測方法、及探針定位載具,其能藉由所述磁力單元吸引探針,使探針直立於所述探針定位載具,讓所述拍攝模組能對探針進行360度全方位的顯微影像拍攝,並快速地進行瑕疵圖像檢測,據以有效解決人工檢測所帶來的種種問題。 To sum up, the beneficial effects of the present invention are that the present invention provides a probe detection device, a three-dimensional probe detection method, and a probe positioning carrier, which can attract the probe by the magnetic force unit, so that the probe can be attracted by the magnetic force unit. The probe is upright on the probe positioning carrier, so that the shooting module can take a 360-degree omnidirectional microscopic image shooting of the probe, and quickly perform defect image detection, so as to effectively solve the problems caused by manual inspection. various problems to come.

為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。 In order to further understand the features and technical content of the present invention, please refer to the following detailed description and accompanying drawings of the present invention, but these descriptions and drawings are only used to illustrate the present invention, rather than make any claims to the protection scope of the present invention. limit.

100:探針檢測設備 100: Probe Inspection Equipment

1:探針定位載具 1: Probe positioning vehicle

11:絕緣座 11: Insulation seat

111:第一端面 111: The first end face

112:限位槽 112: Limit slot

113:條碼 113: Barcode

12:磁力單元 12: Magnetic unit

121:第一磁鐵 121: The first magnet

1211:第一磁極端 1211: The first magnetic pole

122:第二磁鐵 122: Second magnet

1221:第二磁極端 1221: second magnetic pole

2:傳輸模組 2: Transmission module

21:傳輸路徑(輸送皮帶) 21: Transmission path (conveyor belt)

22:主動輪 22: driving wheel

24:托輥 24: idler

25:定位擋板 25: Positioning the baffle

3:拍攝模組 3: Shooting module

31:高倍顯微鏡 31: High Power Microscope

32:攝影機 32: Camera

33:顯示螢幕 33: Display screen

4:處理模組 4: Processing modules

41:資料儲存單元 41: Data storage unit

42:資料轉換單元 42: Data conversion unit

43:資料統計分析單元 43: Data Statistical Analysis Unit

44:掃描裝置 44: Scanning device

5:連續載具裝置 5: Continuous carrier device

51:容納槽 51: accommodating slot

200:探針 200: Probe

201:針頭 201: Needle

202:中間段 202: Middle section

S1:前置步驟 S1: Preliminary step

S2:載針步驟 S2: Needle loading step

S3:檢測步驟 S3: Detection step

θ1:限位角度 θ1: limit angle

θ2:夾角 θ2: included angle

A:錐面 A: Cone

d:間隔 d: interval

圖1為本發明實施例一的探針檢測設備的立體示意圖。 FIG. 1 is a schematic perspective view of a probe detection device according to Embodiment 1 of the present invention.

圖2為本發明實施例一的單個探針定位載具的立體示意圖。 FIG. 2 is a schematic perspective view of a single probe positioning carrier according to Embodiment 1 of the present invention.

圖3為本發明實施例一的傳輸模組以及拍攝模組的立體示意圖。 FIG. 3 is a three-dimensional schematic diagram of a transmission module and a photographing module according to Embodiment 1 of the present invention.

圖4為本發明實施例一的傳輸模組拍攝單個探針定位載具的示意圖。 FIG. 4 is a schematic diagram of photographing a single probe positioning carrier by the transmission module according to the first embodiment of the present invention.

圖5為本發明實施例一的磁力單元磁力線的平面示意圖。 FIG. 5 is a schematic plan view of the magnetic force lines of the magnetic force unit according to the first embodiment of the present invention.

圖6為本發明實施例一的絕緣座沿圖2剖線VI-VI的示意圖(省略探針)。 FIG. 6 is a schematic diagram of the insulating seat according to the first embodiment of the present invention along the line VI-VI of FIG. 2 (the probe is omitted).

圖7為本發明實施例一的限位槽立體示意圖。 FIG. 7 is a three-dimensional schematic diagram of the limiting groove according to the first embodiment of the present invention.

圖8為圖6的另一態樣的剖視示意圖。 FIG. 8 is a schematic cross-sectional view of another aspect of FIG. 6 .

圖9為圖6的又一態樣的剖視示意圖。 FIG. 9 is a schematic cross-sectional view of another aspect of FIG. 6 .

圖10為圖2沿剖線VI-VI的剖視示意圖。 FIG. 10 is a schematic cross-sectional view along the section line VI-VI of FIG. 2 .

圖11為圖6的再一態樣的剖視示意圖。 FIG. 11 is a schematic cross-sectional view of still another aspect of FIG. 6 .

圖12為本發明實施例二的探針的三維檢測方法步驟流程圖。 FIG. 12 is a flowchart showing the steps of the three-dimensional detection method of the probe according to the second embodiment of the present invention.

圖13為本發明實施例二的處理模組的功能方塊示意圖。 FIG. 13 is a functional block diagram of the processing module according to the second embodiment of the present invention.

圖14為本發明實施例二的探針的三維檢測方法的檢測步驟示意圖。 FIG. 14 is a schematic diagram of the detection steps of the three-dimensional detection method of the probe according to the second embodiment of the present invention.

圖15為圖14的局部放大示意圖。 FIG. 15 is a partial enlarged schematic view of FIG. 14 .

以下是通過特定的具體實施例來說明本發明所公開有關探針檢測設備的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。 The following are specific specific examples to illustrate the embodiments of the probe detection device disclosed in the present invention, and those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are merely schematic illustrations, and are not drawn according to the actual size, and are stated in advance. The following embodiments will further describe the related technical contents of the present invention in detail, but the disclosed contents are not intended to limit the protection scope of the present invention.

應當可以理解的是,雖然本文中可能會使用到“第一”、“第二”、“第三”等術語來描述各種元件或者信號,但這些元件或者信號不應受這些術語的限制。這些術語主要是用以區分一元件與另一元件,或者一信號與另一信號。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。 It should be understood that although terms such as "first", "second" and "third" may be used herein to describe various elements or signals, these elements or signals should not be limited by these terms. These terms are primarily used to distinguish one element from another element, or a signal from another signal. In addition, the term "or", as used herein, should include any one or a combination of more of the associated listed items, as the case may be.

[實施例一] [Example 1]

請參閱圖1至圖11所示,其為本發明的實施例一,需先說明的 是,本實施例對應附圖所提及的相關數量與外型,僅用來具體地說明本發明的實施方式,以便於了解本發明的內容,而非用來侷限本發明的保護範圍。 Please refer to FIG. 1 to FIG. 11 , which are Embodiment 1 of the present invention, which needs to be explained first. Yes, this embodiment corresponds to the relevant numbers and appearances mentioned in the accompanying drawings, and is only used to specifically describe the embodiments of the present invention to facilitate understanding of the content of the present invention, rather than to limit the protection scope of the present invention.

如圖1所示,本實施例公開一種探針檢測設備100,其包括多個探針定位載具1、一傳輸模組2、及一拍攝模組3。所述探針定位載具1可為各種形狀的載針盒,並不予以限制,可以是呈長方體形或者梯形體形的載針盒。所述探針定位載具1用來供一探針200(如:probe、terminal、or pogo pin)沿任意方向置入,並使得所述探針200置入所述探針定位載具1後呈直立狀。需額外說明的是,所述探針定位載具1於本實施例中是以搭配於上述傳輸模組2與拍攝模組3來說明,但在本發明未繪示的其他實施例中,所述探針定位載具1也可以是單獨地應用(如:販賣)或是搭配其他構件使用。 As shown in FIG. 1 , the present embodiment discloses a probe detection device 100 , which includes a plurality of probe positioning carriers 1 , a transmission module 2 , and a photographing module 3 . The probe positioning carrier 1 can be a needle-carrying box of various shapes, which is not limited, and can be a needle-carrying box in the shape of a cuboid or a trapezoid. The probe positioning carrier 1 is used for a probe 200 (eg probe, terminal, or pogo pin) to be placed in any direction, and after the probe 200 is placed in the probe positioning carrier 1 Upright. It should be noted that the probe positioning carrier 1 is described as being matched with the above-mentioned transmission module 2 and the photographing module 3 in this embodiment, but in other embodiments not shown in the present invention, the The probe positioning carrier 1 can also be used alone (eg, sold) or used in conjunction with other components.

如圖2所示,上述探針200於本實施例中可以是應用於電子連接器測試,所述探針200具有兩個針頭201及一中間段202,所述兩個針頭201位於所述探針200的兩端,所述中間段202位於探針200的中間,但本發明並不受限於此。其中,所述探針200的總長度及其中間段202的形狀可依實際需求進行調整,並且所述中間段202用以供機械手臂或吸頭夾持所述探針,以避免損傷所述針頭201。 As shown in FIG. 2 , in this embodiment, the probe 200 can be applied to electronic connector testing. The probe 200 has two needles 201 and a middle section 202 , and the two needles 201 are located in the probe. At both ends of the needle 200, the middle section 202 is located in the middle of the probe 200, but the present invention is not limited thereto. Wherein, the overall length of the probe 200 and the shape of the middle section 202 can be adjusted according to actual needs, and the middle section 202 is used for the robot arm or suction head to hold the probe, so as to avoid damage to the probe Needle 201.

如圖3所示,於本實施例中,所述傳輸模組2為直線式皮帶輸送機,但本發明並不以此為限。舉例來說,所述傳輸模組2也可以是板式輸送機、小車式運輸機或其他形式的運輸機,但較佳是排除滾筒運輸機或螺旋式運輸機,因為此類運輸機上的被運輸物件經常處於搖晃的狀態,容易影響所述探針200的測量結果。 As shown in FIG. 3 , in this embodiment, the transmission module 2 is a linear belt conveyor, but the present invention is not limited to this. For example, the conveying module 2 can also be a slat conveyor, a trolley conveyor or other forms of conveyors, but it is preferable to exclude roller conveyors or screw conveyors, because the objects to be transported on such conveyors are often in The shaking state easily affects the measurement results of the probe 200 .

進一步地說,所述傳輸模組2於本實施例中包含一輸送皮帶21、直接驅動輸送皮帶21的兩個主動輪22、間接支撐並使輸送皮帶21連續運行的多個從動輪、直接支撐輸送皮帶21的多個托輥24、位於輸送皮帶21兩側 的多個定位擋板25、一皮帶張緊機構以及一電機驅動系統。其中,為便於圖式呈現所述傳輸模組2,所以圖式未繪示上述從動輪、皮帶張緊機構、及電機驅動系統。再者,所述傳輸模組2(於本實施例中是依據所述輸送皮帶21)定義有一傳輸路徑21,多個所述探針定位載具1經由機械手臂或吸頭置入所述探針200後,被放置於所述傳輸模組2的傳輸路徑21上,多個所述探針定位載具1通過所述傳輸模組2而沿著所述傳輸路徑21移動。 Further, the transmission module 2 in this embodiment includes a conveying belt 21, two driving pulleys 22 that directly drive the conveying belt 21, a plurality of driven pulleys that indirectly support the conveying belt 21 and make the conveying belt 21 run continuously, directly support A plurality of idlers 24 of the conveying belt 21 are located on both sides of the conveying belt 21 A plurality of positioning baffles 25, a belt tensioning mechanism and a motor drive system are provided. Wherein, for the convenience of showing the transmission module 2 in the drawings, the above-mentioned driven pulley, belt tensioning mechanism, and motor drive system are not shown in the drawings. Furthermore, the transmission module 2 (in this embodiment, according to the conveying belt 21 ) defines a transmission path 21 , and a plurality of the probe positioning carriers 1 are placed into the probe through a robotic arm or a suction head. After the needles 200 are placed on the transmission path 21 of the transmission module 2 , a plurality of the probe positioning carriers 1 are moved along the transmission path 21 through the transmission module 2 .

為方便說明,圖3僅示出輸送皮帶21、主動輪22、多個托輥24以及定位擋板25以方便進行說明,此外,由於上述傳輸模組2的結構元件並非本發明的改良處,所以本實施例後續不加以贅述。 For the convenience of description, FIG. 3 only shows the conveying belt 21, the driving pulley 22, the plurality of idlers 24 and the positioning baffle 25 for the convenience of description. In addition, since the structural elements of the above-mentioned transmission module 2 are not improvements of the present invention, Therefore, this embodiment will not be described in detail in the following.

所述拍攝模組3於本實施例中包含多個攝影機32、與上述多個攝影機32電性連接一顯示螢幕33、及設置於多個攝影機32鏡頭前的多個高倍顯微鏡31。其中,所述顯示螢幕33是透過外接影像傳輸線的方式與所述攝影機32連接,所述高倍顯微鏡31可間隔地設置於攝影機32鏡頭前,也可以直接重疊在攝影機32鏡頭上。需要說明的是,當所述攝影機32進行攝影時,攝影畫面可經由所述高倍顯微鏡31放大,以方便對待測物的表面進行瑕疵偵測,且攝影畫面可經由顯示螢幕33直接呈現以供現場檢測人員觀察。 In this embodiment, the photographing module 3 includes a plurality of cameras 32 , a display screen 33 electrically connected to the plurality of cameras 32 , and a plurality of high-power microscopes 31 disposed in front of the lenses of the plurality of cameras 32 . The display screen 33 is connected to the camera 32 by means of an external image transmission line. The high-power microscope 31 can be arranged in front of the lens of the camera 32 at intervals, or can be directly overlapped on the lens of the camera 32 . It should be noted that, when the camera 32 is photographing, the photographic image can be magnified by the high-power microscope 31 to facilitate defect detection on the surface of the object to be measured, and the photographic image can be directly displayed through the display screen 33 for on-site use inspectors observe.

如圖3及圖4所示,所述拍攝模組3對應於所述傳輸路徑21設置,並且所述拍攝模組3能用來對沿著所述傳輸路徑21移動的至少一個所述探針定位載具1上的所述探針200拍攝。更詳細地說,所述拍攝模組3於所述傳輸路徑21的兩側各設置一個所述攝影機32及一個所述高倍顯微鏡31,由所述傳輸路徑21末端往起始端的方向看,所述探針定位載具1及其所定位的探針200位於正中間,位於兩側的攝影機32各可拍攝到探針200的左右側總計360度的影像,實施三維顯微攝影。需要說明的是,所述拍攝模組3在未繪示的其他實施例中,可依實際需求增加其他硬體設備。 As shown in FIG. 3 and FIG. 4 , the photographing module 3 is disposed corresponding to the transmission path 21 , and the photographing module 3 can be used to detect at least one of the probes moving along the transmission path 21 . The probe 200 on the positioning carrier 1 is photographed. In more detail, the photographing module 3 is provided with a camera 32 and a high-power microscope 31 on both sides of the transmission path 21. When viewed from the end of the transmission path 21 toward the starting end, so The probe positioning carrier 1 and its positioned probe 200 are located in the center, and the cameras 32 located on both sides can capture a total of 360-degree images of the left and right sides of the probe 200 to perform three-dimensional photomicrography. It should be noted that, in other embodiments not shown in the photographing module 3, other hardware devices may be added according to actual needs.

舉例來說,在未繪示的另一實施例中,所述拍攝模組3可對應所述傳輸路徑21設置三個攝影機32,並且所述拍攝模組3於所述傳輸路徑21左側設置兩個攝影機32,並且所述傳輸路徑21的右側設置一個攝影機32,上述三個攝影機32呈等距離且等角度設置,據以對所述探針200進行360度的影像拍攝,實施三維顯微攝影。 For example, in another embodiment not shown, the photographing module 3 may be provided with three cameras 32 corresponding to the transmission path 21 , and the photographing module 3 may be provided with two cameras 32 on the left side of the transmission path 21 . There are two cameras 32, and one camera 32 is arranged on the right side of the transmission path 21. The three cameras 32 are arranged at equal distances and at equal angles, so that the probe 200 can be photographed at 360 degrees to perform three-dimensional microphotography. .

基於本實施例中的多個探針定位載具1的具體結構大致相同,所以為方便說明,本實施例中僅以一個探針定位載具1來說明,但本發明不受限於此。舉例來說,在本發明未繪示的其他實施例中,多個探針定位載具1之間也可以略有差異。 Since the specific structures of the plurality of probe positioning carriers 1 in this embodiment are substantially the same, for convenience of description, only one probe positioning carrier 1 is used for description in this embodiment, but the present invention is not limited thereto. For example, in other embodiments not shown in the present invention, there may be slight differences among the probe positioning carriers 1 .

如圖2及圖5所示,所述探針定位載具1包含一絕緣座11以及一磁力單元12,且所述磁力單元12埋置於所述絕緣座11內。需要說明的是,埋置於所述絕緣座11的磁力單元12具有極性相反且位於相反側的兩個磁極端1211、1221,且兩個磁極端1211、1221之間會形成一封閉環狀的磁力線分布曲線。如圖5所示,兩個磁極端1211、1221的垂直部分皆有一小段垂直磁場的領空區域,在此空間區域內,磁力線會趨於一直立直線。 As shown in FIG. 2 and FIG. 5 , the probe positioning carrier 1 includes an insulating base 11 and a magnetic force unit 12 , and the magnetic force unit 12 is embedded in the insulating base 11 . It should be noted that, the magnetic unit 12 embedded in the insulating base 11 has two magnetic poles 1211 and 1221 with opposite polarities and located on opposite sides, and a closed annular shape is formed between the two magnetic poles 1211 and 1221 Magnetic field line distribution curve. As shown in FIG. 5 , the vertical portions of the two magnetic poles 1211 and 1221 both have a small airspace area of a vertical magnetic field. In this space area, the magnetic field lines tend to be straight lines.

當機械手臂或吸嘴將所述探針200置於探針定位載具1上方時,也就是說,所述探針200位於所述磁力單元12任一磁極端1211、1221上方的領空區域時,所述探針200會受到趨於直線的磁力線影響,因而被所述磁力單元12的磁極端1211、1221強而有力地吸附並與所述絕緣座11接觸且站立於絕緣座11的表面,藉此,所述拍攝模組3可以對探針200進行360度全方位的顯微攝影。 When the robot arm or the suction nozzle places the probe 200 above the probe positioning carrier 1 , that is, when the probe 200 is located in the airspace area above any of the magnetic poles 1211 and 1221 of the magnetic unit 12 , the probe 200 will be affected by the magnetic line of force that tends to be straight, so it is strongly adsorbed by the magnetic poles 1211 and 1221 of the magnetic force unit 12 and is in contact with the insulating seat 11 and stands on the surface of the insulating seat 11 , Thereby, the photographing module 3 can perform a 360-degree omnidirectional microphotograph on the probe 200 .

如圖2及圖6所示,所述絕緣座11為一體成形的立方體,所述絕緣座11具有一第一端面111、及自所述第一端面111凹設形成的一限位槽112。更詳細地說,所述第一端面111為所述絕緣座11的頂面,所述頂面下方為所述 磁力單元12。在其他未繪示的實施例中,所述第一端面111可以是位於可拆卸式的蓋體上,換句話說,將所述頂蓋掀開即可看見所述磁力單元12。 As shown in FIG. 2 and FIG. 6 , the insulating seat 11 is an integrally formed cube. The insulating seat 11 has a first end surface 111 and a limiting groove 112 recessed from the first end surface 111 . In more detail, the first end surface 111 is the top surface of the insulating seat 11 , and the bottom surface of the top surface is the top surface of the insulating seat 11 . Magnetic unit 12 . In other non-illustrated embodiments, the first end surface 111 may be located on a detachable cover, in other words, the magnetic unit 12 can be seen by opening the top cover.

在其他未繪示的實施例中,所述第一端面111可進一步包含一溝槽,所述溝槽自第一端面111的任意一邊延伸至所述限位槽112。更詳細地說,所述溝槽自第一端面111的任意一邊的中心點凹設並延伸至所述限位槽112(所述限位槽112的頂緣),用以讓攜帶所述探針200的機械手臂或吸頭,方便沿所述溝槽通往限位槽112的方向行進。 In other not-shown embodiments, the first end surface 111 may further include a groove, and the groove extends from any side of the first end surface 111 to the limiting groove 112 . In more detail, the groove is recessed from the center point of any side of the first end surface 111 and extends to the limiting groove 112 (the top edge of the limiting groove 112 ), so as to allow the probe to carry the probe. The mechanical arm or suction head of the needle 200 is convenient to travel along the direction from the groove to the limit groove 112 .

所述限位槽112凹設於所述第一端面111的中心,且所述限位槽112的空間也近似一立方體,但本發明並不受限於此,在其他未繪示的實施例中,所述限位槽112也可以設置鄰近於所述第一端面111的任意一邊,而所述限位槽112的空間也可以近似一橢圓體。 The limiting slot 112 is recessed in the center of the first end face 111 , and the space of the limiting slot 112 is similar to a cube, but the present invention is not limited to this, in other embodiments not shown , the limiting groove 112 can also be disposed adjacent to any side of the first end surface 111 , and the space of the limiting groove 112 can also be approximately an ellipsoid.

所述限位槽112主要用來供所述探針200插入,且所述探針200與所述限位槽112呈點接觸。也就是說,所述探針200的針頭201與所述限位槽112的槽底的接觸位置為一個點。當探針200進行檢測時若遇到外部氣流干擾,所述限位槽112可有效避免氣流直接衝擊探針200與限位槽112槽底的接觸點,防止探針200偏倒或者過度歪斜導致檢測結果有誤。 The limiting groove 112 is mainly used for inserting the probe 200 , and the probe 200 is in point contact with the limiting groove 112 . That is to say, the contact position between the needle head 201 of the probe 200 and the groove bottom of the limiting groove 112 is one point. If the probe 200 encounters external airflow interference during detection, the limiting groove 112 can effectively prevent the airflow from directly impacting the contact point between the probe 200 and the bottom of the limiting groove 112, preventing the probe 200 from being slanted or excessively skewed. The test result is wrong.

如圖6和圖7所示,所述限位槽112的頂緣定義有以所述槽底的中心點為頂點的一錐面A。其中,所述錐面A與所述限位槽112的槽底的所述法向量相夾有不小於10度的一限位角度θ1。也就是說,所述限位槽112頂緣的任意一點與所述限位槽112槽底的中心點相連形成一直線,所述直線與所述限位槽112槽底平行的方向向量相夾的角度小於80度。 As shown in FIG. 6 and FIG. 7 , the top edge of the limiting groove 112 defines a conical surface A with the center point of the groove bottom as the vertex. Wherein, the taper surface A and the normal vector of the groove bottom of the limiting groove 112 contain a limiting angle θ 1 which is not less than 10 degrees. That is to say, any point on the top edge of the limiting slot 112 is connected with the center point of the bottom of the limiting slot 112 to form a straight line, and the straight line is sandwiched by the direction vector parallel to the bottom of the limiting slot 112 The angle is less than 80 degrees.

如圖8所示,所述兩個磁極端1211、1221於本實施例中可以分別定義為一第一磁極端1211與一第二磁極端1221。也就是說,所述第一磁極端1211與第二磁極端1221各為N極或S極的其中之一。為方便說明,所述第 一磁極端1211於本實施例中是N極,所述第二磁極端1221是S極,但本發明不以此為限。此外,所述第一磁極端1211與所述第二磁極端1221於本實施例中近似圓柱體,且所述第一磁極端1211的體積小於所述第二磁極端1221。從另一個角度來看,所述磁力單元12的外型近似砝碼,所述的第一磁極端1211的形狀對應於砝碼的頂部,所述第二磁極端1221的形狀則對應於砝碼的本體,但本發明不以此為限。 As shown in FIG. 8 , the two magnetic poles 1211 and 1221 can be respectively defined as a first magnetic pole 1211 and a second magnetic pole 1221 in this embodiment. That is to say, each of the first magnetic end 1211 and the second magnetic end 1221 is one of N pole or S pole. For the convenience of description, the A magnetic end 1211 is an N pole in this embodiment, and the second magnetic end 1221 is an S pole, but the invention is not limited to this. In addition, the first magnetic end 1211 and the second magnetic end 1221 are approximately cylindrical in this embodiment, and the volume of the first magnetic end 1211 is smaller than that of the second magnetic end 1221 . From another perspective, the shape of the magnetic unit 12 is similar to a weight, the shape of the first magnetic end 1211 corresponds to the top of the weight, and the shape of the second magnetic end 1221 corresponds to the weight body, but the present invention is not limited to this.

如圖8及圖9所示,所述第一磁極端1211鄰設於所述限位槽112,並且所述第一磁極端1211與所述限位槽112槽底之間相距不大於3公厘(mm)。更詳細地說,所述磁力單元12被埋置於所述限位槽112正下方,且所述磁力單元12與所述限位槽112的槽底有一間隔d,上述間隔d的範圍在0~3公厘(mm)之間。其中,當間隔d為0公厘(mm)時,所述第一磁極端1211的至少局部構成所述限位槽112的所述槽底(如:圖9),更明確的說,此時所述第一磁極端1211的頂面為所述限位槽112的槽底。 As shown in FIG. 8 and FIG. 9 , the first magnetic end 1211 is adjacent to the limiting slot 112 , and the distance between the first magnetic end 1211 and the bottom of the limiting slot 112 is not more than 3 meters centimeters (mm). More specifically, the magnetic force unit 12 is buried directly under the limiting slot 112 , and there is a gap d between the magnetic force unit 12 and the bottom of the limiting slot 112 , and the range of the interval d is 0 Between ~3 millimeters (mm). Wherein, when the interval d is 0 millimeters (mm), at least part of the first magnetic pole 1211 constitutes the groove bottom of the limiting groove 112 (eg, FIG. 9 ). More specifically, at this time, The top surface of the first magnetic end 1211 is the groove bottom of the limiting groove 112 .

如圖10所示,當所述限位槽112插設有探針200時,所述第一磁極端1211能吸附所述探針200,以使所述探針200的長度方向與所述槽底的法向量所相夾的一夾角θ2保持小於10度。也就是說,由剖面來看,所述探針200的長度方向與所述限位槽112槽底平行的方向向量所相夾的角度保持在80度到90度間。從另一方面來看,所述探針200的長度方向與所述限位槽112槽底的法向量所相夾的所述夾角θ2至多與所述錐面A與所述限位槽112的槽底的所述法向量相夾有不小於10度的所述限位角度θ1相合(最大夾角θ2與最小限位角度θ1相等)。 As shown in FIG. 10 , when the probe 200 is inserted into the limiting groove 112 , the first magnetic end 1211 can absorb the probe 200 , so that the length direction of the probe 200 is aligned with the groove. An angle θ 2 contained by the normal vectors of the base remains less than 10 degrees. That is to say, in cross-section, the angle between the length direction of the probe 200 and the direction vector parallel to the groove bottom of the limiting groove 112 is maintained between 80 degrees and 90 degrees. On the other hand, the angle θ 2 between the length direction of the probe 200 and the normal vector of the groove bottom of the limiting groove 112 is at most the same as the tapered surface A and the limiting groove 112 The normal vector of the bottom of the groove is contained by the limit angle θ 1 which is not less than 10 degrees (the maximum included angle θ 2 is equal to the minimum limit angle θ 1).

如圖11所示,所述磁力單元12也可以是由彼此相吸附的一第一磁鐵121與一第二磁鐵122組成,且所述第一磁鐵121的尺寸小於所述第二磁鐵122。需要說明的是,所述第一磁鐵121與第二磁鐵122於本實施例中各自是一 永久磁鐵,所述永久磁鐵可以是選自由鋁鎳鈷合金磁鐵、釤鈷磁鐵與釹鐵硼磁鐵所構成的之群組。於其他未繪示的實施例中,所述第一磁鐵121與第二磁鐵122也可以是電磁鐵。 As shown in FIG. 11 , the magnetic unit 12 may also be composed of a first magnet 121 and a second magnet 122 that are attracted to each other, and the size of the first magnet 121 is smaller than that of the second magnet 122 . It should be noted that in this embodiment, the first magnet 121 and the second magnet 122 are each a Permanent magnets, the permanent magnets may be selected from the group consisting of AlNiCo magnets, Samarium Cobalt magnets and NdFeB magnets. In other not-shown embodiments, the first magnet 121 and the second magnet 122 may also be electromagnets.

其中,所述第一磁鐵121具有所述第一磁極端1211,所述第二磁鐵122具有所述第二磁極端1221,所述第一磁鐵121相較於所述第二磁鐵122更為鄰近於所述限位槽112。當所述第一磁極端1211與所述限位槽112槽底的距離越近,則所述探針200受到的磁力越強,所述探針200的長度方向與所述限位槽112槽底的法向量所相夾的夾角θ2也就越接近0度。 The first magnet 121 has the first magnetic end 1211 , the second magnet 122 has the second magnetic end 1221 , and the first magnet 121 is closer to the second magnet 122 in the limiting groove 112 . When the distance between the first magnetic end 1211 and the bottom of the limiting groove 112 is closer, the magnetic force received by the probe 200 is stronger. The angle θ 2 contained by the normal vectors of the base is also closer to 0 degrees.

[實施例二] [Example 2]

請參閱圖12至圖15所示,其為本發明的實施例二,需先說明的是,本實施例類似於上述實施例一,所以兩個實施例的相同處則不再加以贅述(如:所述探針檢測設備100);再者,本實施例對應附圖所提及的相關數量與外型,僅用來具體地說明本發明的實施方式,以便於了解本發明的內容,而非用來侷限本發明的保護範圍。 Please refer to FIG. 12 to FIG. 15 , which are the second embodiment of the present invention. It should be noted that this embodiment is similar to the above-mentioned first embodiment, so the similarities between the two embodiments will not be repeated. : the probe detection device 100); furthermore, this embodiment corresponds to the relevant quantity and appearance mentioned in the accompanying drawings, and is only used to specifically describe the embodiments of the present invention, so as to facilitate understanding of the content of the present invention, and It is not intended to limit the protection scope of the present invention.

如圖12所示,本實施例公開一種探針的三維檢測方法,其依序包括一前置步驟S1、一載針步驟S2以及一檢測步驟S3。需說明的是,以下每個步驟的技術特徵說明可依據設計需求而加以調整變化,並不以本實施例所載為限。 As shown in FIG. 12 , this embodiment discloses a three-dimensional detection method of a probe, which sequentially includes a pre-step S1 , a needle loading step S2 and a detection step S3 . It should be noted that, the description of the technical features of each step below can be adjusted and changed according to design requirements, and is not limited to what is described in this embodiment.

其中,所述前置步驟S1:提供如實施例一所述的探針檢測設備100。進一步地說,所述前置步驟S1於本實施例中還可進一步提供一連續載具裝置5,其具有多個可放置所述探針定位載具1的容納槽51,所述操作人員可依需求將多個探針定位載具1設置於所述連續載具裝置5以進行大量檢測。本實施例是以三個探針定位載具1配合連續載具裝置5進行說明,但本發明不以此為限。舉例來說,在本發明未繪示的其他實施例中,所述連續載具裝置5也 可以容納兩個或四個以上的探針定位載具1。 Wherein, the pre-step S1: providing the probe detection device 100 described in the first embodiment. Furthermore, in the present embodiment, the pre-step S1 may further provide a continuous carrier device 5 having a plurality of accommodating grooves 51 in which the probe positioning carrier 1 can be placed. The operator can A plurality of probe positioning carriers 1 are arranged on the continuous carrier device 5 as required to perform a large number of inspections. In this embodiment, three probe positioning carriers 1 cooperate with the continuous carrier device 5 for description, but the present invention is not limited to this. For example, in other embodiments not shown in the present invention, the continuous carrier device 5 is also Two or more probe positioning carriers 1 can be accommodated.

如圖14及圖15所示,所述每個所述探針定位載具1的所述絕緣座11在其外表面可進一步設有一條碼113。其中,所述條碼113於本實施例中是寬度不等的多個黑條和空白,按照一定的編碼規則排列,用以表達一組資訊的圖形識別碼。再者,每個所述條碼113相對應於每個所述探針200,也就是說,每個所述條碼113相當於每個探針200的編號。然而,在本發明未繪示的其他實施例中,所述條碼113也可以是其他類型的條碼(如:QRcode)。 As shown in FIG. 14 and FIG. 15 , the insulating base 11 of each probe positioning carrier 1 may further be provided with a barcode 113 on the outer surface thereof. The barcode 113 in this embodiment is a plurality of black bars and blanks with different widths, arranged according to certain coding rules, and used to express a graphic identification code of a group of information. Furthermore, each of the barcodes 113 corresponds to each of the probes 200 , that is, each of the barcodes 113 corresponds to the number of each probe 200 . However, in other embodiments not shown in the present invention, the barcode 113 may also be other types of barcodes (eg, QRcode).

所述載針步驟S2:於每個所述探針定位載具1中置入一探針200,以使所述探針200插入所述限位槽112且彼此呈點接觸,並且每個所述探針定位載具1的所述第一磁極端1211吸附相對應所述探針200,以使相對應所述探針200保持直立於所述第一磁極端1211。 The needle loading step S2: inserting a probe 200 into each of the probe positioning carriers 1, so that the probes 200 are inserted into the limiting grooves 112 and are in point contact with each other, and each The first magnetic end 1211 of the probe positioning carrier 1 attracts the corresponding probe 200 to keep the corresponding probe 200 upright on the first magnetic end 1211 .

更詳細地說,所述載針步驟S2:利用機械手臂或吸頭將待測探針200夾出,並在每個所述探針定位載具1中置入一個探針200,將所述探針200插入所述限位槽112且彼此呈點接觸。也就是說,所述探針200的針頭201與所述限位槽112槽底接觸。當所述探針200與限位槽112槽底接觸時,所述探針定位載具1的第一磁極端1211吸附相對應的所述探針200,並藉由第一磁極端1211所發出的垂直磁力線,利用磁場效應使相對應所述探針200保持直立於所述第一磁極端1211。 In more detail, the needle loading step S2: the probe 200 to be tested is clamped out by a robotic arm or a suction head, and a probe 200 is placed in each probe positioning carrier 1, and the probe The probes 200 are inserted into the limiting grooves 112 and are in point contact with each other. That is, the needle head 201 of the probe 200 is in contact with the bottom of the limiting groove 112 . When the probe 200 is in contact with the bottom of the limiting groove 112 , the first magnetic end 1211 of the probe positioning carrier 1 attracts the corresponding probe 200 and is emitted by the first magnetic end 1211 The vertical magnetic line of force is used to keep the corresponding probe 200 upright on the first magnetic pole 1211 by using the magnetic field effect.

所述檢測步驟S3:以所述傳輸模組2將多個所述探針定位載具1及吸附於其上的多個所述探針200沿著所述傳輸路徑21移動,並且通過所述拍攝模組3依序的對多個所述探針定位載具1上的所述探針200進行拍攝、以取得每個所述探針200的一檢測資訊。 The detection step S3: using the transmission module 2 to move a plurality of the probe positioning carriers 1 and the plurality of the probes 200 adsorbed thereon along the transmission path 21, and pass the The photographing module 3 sequentially photographs the probes 200 on a plurality of the probe positioning carriers 1 to obtain a detection information of each of the probes 200 .

更詳細地說,於所述檢測步驟S3中,先將多個所述探針定位載具1及吸附於其上的多個探針200配合連續載具裝置5設置於所述傳輸模組2, 使多個所述探針定位載具1沿著所述傳輸路徑21移動。當多個所述探針定位載具1通過所述拍攝模組3時,位於所述拍攝模組3兩側的攝影機32依序對多個所述探針定位載具1上的所述探針200進行拍攝,以取得每個所述探針200的所述檢測資訊。 More specifically, in the detection step S3 , firstly, a plurality of the probe positioning carriers 1 and the plurality of probes 200 adsorbed thereon are arranged on the transmission module 2 in cooperation with the continuous carrier device 5 , A plurality of the probe positioning carriers 1 are moved along the transport path 21 . When a plurality of the probe positioning carriers 1 pass through the photographing module 3 , the cameras 32 located on both sides of the photographing module 3 sequentially monitor the probes on the plurality of the probe positioning carriers 1 . The needles 200 are photographed to obtain the detection information of each of the probes 200 .

再者,如圖13所示,接著,將每個所述探針200的檢測資訊傳輸至一處理模組4,所述處理模組4包含一資料儲存單元41、一資料轉換單元42以及一資料統計分析單元43。所述檢測資訊首先進入所述資料儲存單元41進行儲存,接著檢測資訊會進入所述資料轉換單元42,將資料轉換為可以大量進行運算的資料形式。舉例來說,所述檢測資訊為影像資訊,所述資料轉換單元42可將所述影像資訊的各項資料轉換為具體數值,如影像的明暗度等,以利後續進行分析。最後檢測資訊進入資料統計分析單元43,檢測資訊經分析後將輸出檢測結果。 Furthermore, as shown in FIG. 13 , then, the detection information of each probe 200 is transmitted to a processing module 4 , and the processing module 4 includes a data storage unit 41 , a data conversion unit 42 and a Data statistical analysis unit 43 . The detection information first enters the data storage unit 41 for storage, and then the detection information enters the data conversion unit 42 to convert the data into a data form that can be operated on in large quantities. For example, the detection information is image information, and the data conversion unit 42 can convert various data of the image information into specific values, such as the brightness of the image, etc., to facilitate subsequent analysis. Finally, the detection information enters the data statistical analysis unit 43, and the detection result is output after the detection information is analyzed.

另,所述檢測步驟S3可進一步提供一掃描裝置44,其可對任一個所述探針定位載具1的所述條碼113進行掃描,以使所述掃描裝置44能通過無線傳輸而自所述處理模組4取得相對應所述探針200的所述檢測資訊。其中,所述掃描裝置44可為激光掃描器或CCD掃描器。 In addition, the detection step S3 may further provide a scanning device 44, which can scan the barcode 113 of any one of the probe positioning carriers 1, so that the scanning device 44 can transmit from all the probes through wireless transmission. The processing module 4 obtains the detection information corresponding to the probe 200 . Wherein, the scanning device 44 can be a laser scanner or a CCD scanner.

綜上所述,本發明的有益效果在於,本發明所提供的一種探針檢測設備、探針的三維檢測方法、及探針定位載具,其能藉由所述磁力單元吸引探針,使探針直立於所述探針定位載具,讓所述拍攝模組能對探針進行360度全方位的顯微影像拍攝,並快速地進行瑕疵圖像檢測,據以有效解決人工檢測所帶來的種種問題。 To sum up, the beneficial effects of the present invention are that the present invention provides a probe detection device, a three-dimensional probe detection method, and a probe positioning carrier, which can attract the probe by the magnetic force unit, so that the probe can be attracted by the magnetic force unit. The probe is upright on the probe positioning carrier, so that the shooting module can take a 360-degree omnidirectional microscopic image shooting of the probe, and quickly perform defect image detection, so as to effectively solve the problems caused by manual inspection. various problems to come.

此外,本發明所提供的一種探針檢測設備、探針的三維檢測方法、及探針定位載具還進一步包含設置在所述絕緣座外表面的條碼以及處理模組,處理模組可有效分析並整合利用所述探針的檢測資訊,配合條碼 進行編號以進行大數據分析,進而提供製程缺憾矯正。 In addition, the probe detection equipment, the three-dimensional detection method of the probe, and the probe positioning carrier provided by the present invention further include a barcode and a processing module arranged on the outer surface of the insulating base, and the processing module can effectively analyze And integrate the detection information of the probe, with the barcode Numbering is performed for big data analysis to provide process defect correction.

以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的專利範圍內。 The content disclosed above is only a preferred feasible embodiment of the present invention, and is not intended to limit the patent scope of the present invention. Therefore, any equivalent technical changes made by using the contents of the description and drawings of the present invention are included in the patent scope of the present invention. Inside.

100:探針檢測設備 100: Probe Inspection Equipment

1:探針定位載具 1: Probe positioning vehicle

2:傳輸模組 2: Transmission module

3:拍攝模組 3: Shooting module

31:高倍顯微鏡 31: High Power Microscope

32:攝影機 32: Camera

33:顯示螢幕 33: Display screen

200:探針 200: Probe

Claims (8)

一種探針檢測設備,包括:多個探針定位載具,各用來供一探針沿任意方向置入;其中,每個所述探針定位載具包含:一絕緣座,具有一第一端面及自所述第一端面凹設的一限位槽;及一磁力單元,埋置於所述絕緣座內,並且所述磁力單元具有極性相反且位於相反側的一第一磁極端與一第二磁極端;其中,所述第一磁極端鄰設於所述限位槽,並且所述第一磁極端與所述限位槽的一槽底之間相距不大於3公厘(mm);其中,所述絕緣座能用來供一探針插入所述限位槽且彼此呈點接觸,並且所述第一磁極端吸附所述探針,以使所述探針保持直立於所述第一磁極端;一傳輸模組,定義有一傳輸路徑,並且多個所述探針定位載具通過所述傳輸模組而沿著所述傳輸路徑移動;以及一拍攝模組,對應於所述傳輸路徑設置,並且所述拍攝模組能用來對沿著所述傳輸路徑移動的至少一個所述探針定位載具上的所述探針拍攝。 A probe detection device, comprising: a plurality of probe positioning carriers, each used for placing a probe in any direction; wherein, each probe positioning carrier comprises: an insulating seat with a first an end face and a limiting slot recessed from the first end face; and a magnetic force unit embedded in the insulating seat, and the magnetic force unit has a first magnetic pole with opposite polarity and located on the opposite side and a magnetic force unit The second magnetic end; wherein, the first magnetic end is adjacent to the limiting slot, and the distance between the first magnetic end and a groove bottom of the limiting slot is not more than 3 millimeters (mm) ; wherein, the insulating seat can be used for a probe to be inserted into the limiting groove and make point contact with each other, and the first magnetic end attracts the probe, so that the probe is kept upright on the a first magnetic end; a transmission module defining a transmission path, and a plurality of the probe positioning carriers move along the transmission path through the transmission module; and a photographing module corresponding to the A transmission path is provided, and the photographing module can be used to photograph the probes on at least one of the probe positioning carriers moving along the transmission path. 如請求項1所述的探針檢測設備,其中,於任一個所述探針定位載具中,所述第一磁極端的至少局部構成所述限位槽的所述槽底。 The probe detection device according to claim 1, wherein, in any one of the probe positioning carriers, at least a part of the first magnetic end forms the groove bottom of the limiting groove. 如請求項1所述的探針檢測設備,其中,當任一個所述探針定位載具的所述限位槽插設有一探針時,所述第一磁極端能吸附所述探針,以使所述探針的長度方向與所述槽底的法向量所 相夾的一夾角保持小於10度。 The probe detection device according to claim 1, wherein when a probe is inserted in the limit groove of any one of the probe positioning carriers, the first magnetic end can adsorb the probe, so that the length direction of the probe is equal to the normal vector of the groove bottom An included angle between the phases is kept less than 10 degrees. 如請求項3所述的探針檢測設備,其中,於任一個所述探針定位載具中,所述限位槽的頂緣定義有以所述槽底的中心點為頂點的一錐面,並且所述錐面與所述槽底的所述法向量相夾有不小於10度的一限位角度。 The probe detection device according to claim 3, wherein, in any one of the probe positioning carriers, the top edge of the limiting groove defines a conical surface with the center point of the groove bottom as the vertex , and the tapered surface and the normal vector of the groove bottom contain a limit angle of not less than 10 degrees. 如請求項1所述的探針檢測設備,其中,於任一個所述探針定位載具中,所述磁力單元包含有彼此相吸附的一第一磁鐵與一第二磁鐵,所述第一磁鐵具有所述第一磁極端,所述第二磁鐵具有所述第二磁極端,所述第一磁鐵的尺寸小於所述第二磁鐵,並且所述第一磁鐵相較於所述第二磁鐵更為鄰近於所述限位槽。 The probe detection device according to claim 1, wherein, in any one of the probe positioning carriers, the magnetic force unit includes a first magnet and a second magnet that are attracted to each other, the first magnet The magnet has the first magnetic end, the second magnet has the second magnetic end, the size of the first magnet is smaller than that of the second magnet, and the first magnet is larger than the second magnet more adjacent to the limiting groove. 如請求項5所述的探針檢測設備,其中,任一個所述探針定位載具的所述第一磁鐵與所述第二磁鐵各進一步限定為一永久磁鐵。 The probe detection device according to claim 5, wherein each of the first magnet and the second magnet of any one of the probe positioning carriers is further defined as a permanent magnet. 一種探針的三維檢測方法,包括:實施一前置步驟:提供如請求項1所述的探針檢測設備;實施一載針步驟:於每個所述探針定位載具中置入一探針,以使所述探針插入所述限位槽且彼此呈點接觸,並且每個所述探針定位載具的所述第一磁極端吸附相對應所述探針,以使相對應所述探針保持直立於所述第一磁極端;以及實施一檢測步驟:以所述傳輸模組將多個所述探針定位載具及吸附於其上的多個所述探針沿著所述傳輸路徑移動,並且通過所述拍攝模組依序的對多個所述探針定位載具上的所述探 針進行拍攝、以取得每個所述探針的一檢測資訊。 A three-dimensional detection method for a probe, comprising: implementing a pre-step: providing the probe detection device according to claim 1; implementing a needle-carrying step: placing a probe in each of the probe positioning carriers needles, so that the probes are inserted into the limiting grooves and are in point contact with each other, and the first magnetic end of each probe positioning carrier attracts the corresponding probes, so that the corresponding probes are The probes are kept upright on the first magnetic end; and a detection step is performed: using the transmission module to position a plurality of the probes on a carrier and a plurality of the probes adsorbed thereon along the The transmission path moves, and the probes on a plurality of probes are positioned on the carrier in sequence by the shooting module. The needles are photographed to obtain a detection information of each of the probes. 如請求項7所述的探針的三維檢測方法,其中,於所述檢測步驟中,所述拍攝模組所取得的每個所述探針的所述檢測資訊傳輸至一處理模組;其中,每個所述探針定位載具的所述絕緣座在其外表面設有一條碼,用以供一掃描裝置對任一個所述探針定位載具的所述條碼進行掃描,以使所述掃描裝置能通過無線傳輸而自所述處理模組取得相對應所述探針的所述檢測資訊。 The three-dimensional detection method of a probe according to claim 7, wherein, in the detection step, the detection information of each probe obtained by the photographing module is transmitted to a processing module; wherein , the insulating seat of each probe positioning carrier is provided with a bar code on its outer surface, which is used for a scanning device to scan the bar code of any one of the probe positioning carriers, so that the The scanning device can obtain the detection information corresponding to the probe from the processing module through wireless transmission.
TW109107056A 2020-03-04 2020-03-04 Probe detecting equipment and 3d detecting method of probe TWI771658B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW109107056A TWI771658B (en) 2020-03-04 2020-03-04 Probe detecting equipment and 3d detecting method of probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW109107056A TWI771658B (en) 2020-03-04 2020-03-04 Probe detecting equipment and 3d detecting method of probe

Publications (2)

Publication Number Publication Date
TW202134638A TW202134638A (en) 2021-09-16
TWI771658B true TWI771658B (en) 2022-07-21

Family

ID=78777277

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109107056A TWI771658B (en) 2020-03-04 2020-03-04 Probe detecting equipment and 3d detecting method of probe

Country Status (1)

Country Link
TW (1) TWI771658B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116698751A (en) * 2023-06-17 2023-09-05 苏州嘉展科技有限公司 A semiconductor chip micro-probe imaging detection stage structure
CN116953590B (en) * 2023-09-21 2023-12-05 上海泽丰半导体科技有限公司 Omnibearing probe measuring device and method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200811443A (en) * 2006-08-25 2008-03-01 Mjc Probe Inc Vertical probing apparatus
CN208368760U (en) * 2018-07-14 2019-01-11 厦门强力巨彩光电科技有限公司 A kind of novel magnet wire tooling
CN208986264U (en) * 2018-11-16 2019-06-14 深圳市创卓鑫五金电子有限公司 A kind of magnetic control fast connector component

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200811443A (en) * 2006-08-25 2008-03-01 Mjc Probe Inc Vertical probing apparatus
CN208368760U (en) * 2018-07-14 2019-01-11 厦门强力巨彩光电科技有限公司 A kind of novel magnet wire tooling
CN208986264U (en) * 2018-11-16 2019-06-14 深圳市创卓鑫五金电子有限公司 A kind of magnetic control fast connector component

Also Published As

Publication number Publication date
TW202134638A (en) 2021-09-16

Similar Documents

Publication Publication Date Title
CN108188043B (en) Appearance detection equipment and method for lithium battery cell
TWI771658B (en) Probe detecting equipment and 3d detecting method of probe
US5459330A (en) Process and device for the inspection of glass
KR101464852B1 (en) Specimen information detecting device and specimen information detecting method
CN109060827A (en) A kind of intelligent visual detection identification equipment
CN101887025A (en) Visual detection device and visual detection method thereof
TWI690704B (en) Appearance inspection apparatus for cylindrical component
CN109909175A (en) A kind of volume key appearance AOI detection device and its detection method
CN108609381A (en) A kind of Systems for optical inspection
CN109092701A (en) Battery aluminum shell detection device
US8860802B2 (en) Method and apparatus for detecting defects and embedded objects in sealed sterilized packaging
TWI767876B (en) Probe positioning carrier
US20090073426A1 (en) Multiple Surface Inspection System and Method
KR20110018081A (en) Cylindrical Secondary Battery Side Inspection Device
CN211403010U (en) Foreign body positioning device for display panel
CN114235684A (en) Macroscopic and microscopic detection equipment and detection method
CN208752015U (en) Product appearance checking device
CN206990465U (en) The defects of liquid crystal panel detection means
CN213239953U (en) Three-dimensional automatic optical detection equipment
JP6438703B2 (en) Foreign matter inspection apparatus, foreign matter inspection system, and foreign matter inspection method
CN111701890A (en) A colorimeter mobile testing mechanism
TWI769060B (en) Macroscopic and microscopic testing equipment and testing methods
CN219180096U (en) Machine vision comprehensive training platform
CN118913103A (en) Sensitive dangerous goods size measurement system
CN209692942U (en) A kind of camera function test device for electronic product