TWI771658B - Probe detecting equipment and 3d detecting method of probe - Google Patents
Probe detecting equipment and 3d detecting method of probe Download PDFInfo
- Publication number
- TWI771658B TWI771658B TW109107056A TW109107056A TWI771658B TW I771658 B TWI771658 B TW I771658B TW 109107056 A TW109107056 A TW 109107056A TW 109107056 A TW109107056 A TW 109107056A TW I771658 B TWI771658 B TW I771658B
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- magnetic
- magnet
- probes
- module
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 220
- 238000000034 method Methods 0.000 title abstract description 6
- 230000005540 biological transmission Effects 0.000 claims abstract description 47
- 239000000969 carrier Substances 0.000 claims abstract description 35
- 238000001514 detection method Methods 0.000 claims description 62
- 238000012545 processing Methods 0.000 claims description 9
- 239000013598 vector Substances 0.000 claims description 9
- 230000007547 defect Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 238000007689 inspection Methods 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000013500 data storage Methods 0.000 description 3
- 238000007619 statistical method Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 229910000828 alnico Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003116 impacting effect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000005426 magnetic field effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 229910001172 neodymium magnet Inorganic materials 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910000938 samarium–cobalt magnet Inorganic materials 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Images
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Description
本發明涉及一種檢測設備,尤其涉及一種探針檢測設備、探針的三維檢測方法、及探針定位載具。 The invention relates to a detection device, in particular to a probe detection device, a three-dimensional detection method of a probe, and a probe positioning carrier.
在現有探針之瑕疵檢測流程中,因為探針的重量極輕且體積極小,不易被自動化機器抓取(或吸取)及擺置;因此往往無法以自動化的方式進行360度全方位檢測,且因該類探針的瑕疵尺寸極小,往往小至微米(μm)等級,須搭配以高倍顯微鏡進行視覺的放大及影像檢測。 In the flaw detection process of the existing probes, because the probes are extremely light in weight and small in size, they are not easy to be grasped (or sucked) and placed by automated machines; therefore, it is often impossible to perform 360-degree all-round inspections in an automated way. And because the size of the flaws of such probes is extremely small, often as small as micron (μm), a high-power microscope must be used for visual magnification and image detection.
以往進行檢測時,該類探針需要藉由人工手動的方式將待測物平躺於平台上,置於顯微鏡下並進行待測物的翻撥以及人工視覺檢測。過程不但費時費力且人工辨識的正確度亦無法確認。 In the past, when testing, this type of probe needs to manually lay the object to be tested on the platform, place it under a microscope, and perform flipping and artificial visual inspection of the object to be tested. The process is not only time-consuming and labor-intensive, but also the accuracy of manual identification cannot be confirmed.
於是,本發明人認為上述缺陷可改善,乃特潛心研究並配合科學原理的運用,終於提出一種設計合理且有效改善上述缺陷的本發明。 Therefore, the inventor believes that the above-mentioned defects can be improved. Nate has devoted himself to research and application of scientific principles, and finally proposes an invention with reasonable design and effective improvement of the above-mentioned defects.
本發明實施例在於提供一種探針檢測設備、探針的三維檢測方法、及探針定位載具,其能有效地改善現有探針之瑕疵檢測流程所可能產生的缺陷。 The embodiments of the present invention provide a probe detection device, a three-dimensional probe detection method, and a probe positioning carrier, which can effectively improve the defects that may be generated by the defect detection process of the existing probe.
本發明實施例公開一種探針檢測設備,包括:多個探針定位載具,各用來供一探針沿任意方向置入;其中,每個所述探針定位載具包含:一絕緣座,具有一第一端面及自所述第一端面凹設的一限位槽;及一磁力單元,埋置於所述絕緣座內,並且所述磁力單元具有極性相反且位於相反側的一第一磁極端與一第二磁極端;其中,所述第一磁極端鄰設於所述限位槽,並且所述第一磁極端與所述限位槽的一槽底之間相距不大於3公厘(mm);其中,所述絕緣座能用來供一探針插入所述限位槽且彼此呈點接觸,並且所述第一磁極端吸附所述探針,以使所述探針保持直立於所述第一磁極端;一傳輸模組,定義有一傳輸路徑,並且多個所述探針定位載具通過所述傳輸模組而沿著所述傳輸路徑移動;以及一拍攝模組,對應於所述傳輸路徑設置,並且所述拍攝模組能用來對沿著所述傳輸路徑移動的至少一個所述探針定位載具上的所述探針拍攝。 An embodiment of the present invention discloses a probe detection device, comprising: a plurality of probe positioning carriers, each of which is used for placing a probe in any direction; wherein each of the probe positioning carriers includes: an insulating seat , which has a first end face and a limiting groove recessed from the first end face; and a magnetic force unit embedded in the insulating seat, and the magnetic force unit has a first end face with opposite polarity and located on the opposite side A magnetic end and a second magnetic end; wherein, the first magnetic end is adjacent to the limiting slot, and the distance between the first magnetic end and a slot bottom of the limiting slot is not more than 3 millimeters (mm); wherein, the insulating base can be used for a probe to be inserted into the limiting groove and make point contact with each other, and the first magnetic end attracts the probe, so that the probe remain upright on the first magnetic end; a transmission module defines a transmission path, and a plurality of the probe positioning carriers move along the transmission path through the transmission module; and a photographing module , corresponding to the transmission path, and the photographing module can be used to photograph the probe on at least one of the probe positioning carriers moving along the transmission path.
本發明實施例也公開一種探針的三維檢測方法,包括:實施一前置步驟:提供如上所述的探針檢測設備;實施一載針步驟:於每個所述探針定位載具中置入一探針,以使所述探針插入所述限位槽且彼此呈點接觸,並且每個所述探針定位載具的所述第一磁極端吸附相對應所述探針,以使相對應所述探針保持直立於所述第一磁極端;以及實施一檢測步驟:以所述傳輸模組將多個所述探針定位載具及吸附於其上的多個所述探針沿著所述傳輸路徑移動,並且通過所述拍攝模組依序的對多個所述探針定位載具上的所述探針進行拍攝、以取得每個所述探針的一檢測資訊。 The embodiment of the present invention also discloses a three-dimensional detection method of a probe, which includes: implementing a pre-step: providing the probe detection device as described above; implementing a needle-carrying step: placing the probe in the middle of each probe positioning carrier A probe is inserted so that the probes are inserted into the limiting grooves and are in point contact with each other, and the first magnetic end of each probe positioning carrier attracts the corresponding probes, so that Correspondingly, the probes remain upright on the first magnetic end; and a detection step is performed: using the transmission module to position a plurality of the probes on a carrier and a plurality of the probes adsorbed thereon Moving along the transmission path, and sequentially photographing the probes on a plurality of the probe positioning carriers by the photographing module to obtain a detection information of each of the probes.
本發明實施例還公開一種探針定位載具,包括:一絕緣座,具有一第一端面及自所述第一端面凹設的一限位槽;及一磁力單元,埋置於所述絕緣座內,並且所述磁力單元具有極性相反且位於相反側的一第一磁極端與一第二磁極端;其中,所述第一磁極端鄰設於所述限位槽,並且所述第一磁 極端與所述限位槽的一槽底之間相距不大於3公厘(mm);其中,所述絕緣座能用來供一探針插入所述限位槽且彼此呈點接觸,並且所述第一磁極端吸附所述探針,以使所述探針保持直立於所述第一磁極端。 An embodiment of the present invention also discloses a probe positioning carrier, comprising: an insulating seat having a first end surface and a limiting groove recessed from the first end surface; and a magnetic force unit embedded in the insulating seat inside the seat, and the magnetic unit has a first magnetic end and a second magnetic end with opposite polarities and located on opposite sides; wherein, the first magnetic end is adjacent to the limiting slot, and the first magnetic end magnetic The distance between the extreme end and a groove bottom of the limiting groove is not more than 3 millimeters (mm); wherein, the insulating seat can be used for a probe to be inserted into the limiting groove and are in point contact with each other, and all the The first magnetic end attracts the probe to keep the probe upright on the first magnetic end.
綜上所述,本發明的有益效果在於,本發明所提供的一種探針檢測設備、探針的三維檢測方法、及探針定位載具,其能藉由所述磁力單元吸引探針,使探針直立於所述探針定位載具,讓所述拍攝模組能對探針進行360度全方位的顯微影像拍攝,並快速地進行瑕疵圖像檢測,據以有效解決人工檢測所帶來的種種問題。 To sum up, the beneficial effects of the present invention are that the present invention provides a probe detection device, a three-dimensional probe detection method, and a probe positioning carrier, which can attract the probe by the magnetic force unit, so that the probe can be attracted by the magnetic force unit. The probe is upright on the probe positioning carrier, so that the shooting module can take a 360-degree omnidirectional microscopic image shooting of the probe, and quickly perform defect image detection, so as to effectively solve the problems caused by manual inspection. various problems to come.
為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。 In order to further understand the features and technical content of the present invention, please refer to the following detailed description and accompanying drawings of the present invention, but these descriptions and drawings are only used to illustrate the present invention, rather than make any claims to the protection scope of the present invention. limit.
100:探針檢測設備 100: Probe Inspection Equipment
1:探針定位載具 1: Probe positioning vehicle
11:絕緣座 11: Insulation seat
111:第一端面 111: The first end face
112:限位槽 112: Limit slot
113:條碼 113: Barcode
12:磁力單元 12: Magnetic unit
121:第一磁鐵 121: The first magnet
1211:第一磁極端 1211: The first magnetic pole
122:第二磁鐵 122: Second magnet
1221:第二磁極端 1221: second magnetic pole
2:傳輸模組 2: Transmission module
21:傳輸路徑(輸送皮帶) 21: Transmission path (conveyor belt)
22:主動輪 22: driving wheel
24:托輥 24: idler
25:定位擋板 25: Positioning the baffle
3:拍攝模組 3: Shooting module
31:高倍顯微鏡 31: High Power Microscope
32:攝影機 32: Camera
33:顯示螢幕 33: Display screen
4:處理模組 4: Processing modules
41:資料儲存單元 41: Data storage unit
42:資料轉換單元 42: Data conversion unit
43:資料統計分析單元 43: Data Statistical Analysis Unit
44:掃描裝置 44: Scanning device
5:連續載具裝置 5: Continuous carrier device
51:容納槽 51: accommodating slot
200:探針 200: Probe
201:針頭 201: Needle
202:中間段 202: Middle section
S1:前置步驟 S1: Preliminary step
S2:載針步驟 S2: Needle loading step
S3:檢測步驟 S3: Detection step
θ1:限位角度 θ1: limit angle
θ2:夾角 θ2: included angle
A:錐面 A: Cone
d:間隔 d: interval
圖1為本發明實施例一的探針檢測設備的立體示意圖。
FIG. 1 is a schematic perspective view of a probe detection device according to
圖2為本發明實施例一的單個探針定位載具的立體示意圖。
FIG. 2 is a schematic perspective view of a single probe positioning carrier according to
圖3為本發明實施例一的傳輸模組以及拍攝模組的立體示意圖。
FIG. 3 is a three-dimensional schematic diagram of a transmission module and a photographing module according to
圖4為本發明實施例一的傳輸模組拍攝單個探針定位載具的示意圖。 FIG. 4 is a schematic diagram of photographing a single probe positioning carrier by the transmission module according to the first embodiment of the present invention.
圖5為本發明實施例一的磁力單元磁力線的平面示意圖。 FIG. 5 is a schematic plan view of the magnetic force lines of the magnetic force unit according to the first embodiment of the present invention.
圖6為本發明實施例一的絕緣座沿圖2剖線VI-VI的示意圖(省略探針)。 FIG. 6 is a schematic diagram of the insulating seat according to the first embodiment of the present invention along the line VI-VI of FIG. 2 (the probe is omitted).
圖7為本發明實施例一的限位槽立體示意圖。 FIG. 7 is a three-dimensional schematic diagram of the limiting groove according to the first embodiment of the present invention.
圖8為圖6的另一態樣的剖視示意圖。 FIG. 8 is a schematic cross-sectional view of another aspect of FIG. 6 .
圖9為圖6的又一態樣的剖視示意圖。 FIG. 9 is a schematic cross-sectional view of another aspect of FIG. 6 .
圖10為圖2沿剖線VI-VI的剖視示意圖。 FIG. 10 is a schematic cross-sectional view along the section line VI-VI of FIG. 2 .
圖11為圖6的再一態樣的剖視示意圖。 FIG. 11 is a schematic cross-sectional view of still another aspect of FIG. 6 .
圖12為本發明實施例二的探針的三維檢測方法步驟流程圖。 FIG. 12 is a flowchart showing the steps of the three-dimensional detection method of the probe according to the second embodiment of the present invention.
圖13為本發明實施例二的處理模組的功能方塊示意圖。 FIG. 13 is a functional block diagram of the processing module according to the second embodiment of the present invention.
圖14為本發明實施例二的探針的三維檢測方法的檢測步驟示意圖。 FIG. 14 is a schematic diagram of the detection steps of the three-dimensional detection method of the probe according to the second embodiment of the present invention.
圖15為圖14的局部放大示意圖。 FIG. 15 is a partial enlarged schematic view of FIG. 14 .
以下是通過特定的具體實施例來說明本發明所公開有關探針檢測設備的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。 The following are specific specific examples to illustrate the embodiments of the probe detection device disclosed in the present invention, and those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are merely schematic illustrations, and are not drawn according to the actual size, and are stated in advance. The following embodiments will further describe the related technical contents of the present invention in detail, but the disclosed contents are not intended to limit the protection scope of the present invention.
應當可以理解的是,雖然本文中可能會使用到“第一”、“第二”、“第三”等術語來描述各種元件或者信號,但這些元件或者信號不應受這些術語的限制。這些術語主要是用以區分一元件與另一元件,或者一信號與另一信號。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。 It should be understood that although terms such as "first", "second" and "third" may be used herein to describe various elements or signals, these elements or signals should not be limited by these terms. These terms are primarily used to distinguish one element from another element, or a signal from another signal. In addition, the term "or", as used herein, should include any one or a combination of more of the associated listed items, as the case may be.
[實施例一] [Example 1]
請參閱圖1至圖11所示,其為本發明的實施例一,需先說明的
是,本實施例對應附圖所提及的相關數量與外型,僅用來具體地說明本發明的實施方式,以便於了解本發明的內容,而非用來侷限本發明的保護範圍。
Please refer to FIG. 1 to FIG. 11 , which are
如圖1所示,本實施例公開一種探針檢測設備100,其包括多個探針定位載具1、一傳輸模組2、及一拍攝模組3。所述探針定位載具1可為各種形狀的載針盒,並不予以限制,可以是呈長方體形或者梯形體形的載針盒。所述探針定位載具1用來供一探針200(如:probe、terminal、or pogo pin)沿任意方向置入,並使得所述探針200置入所述探針定位載具1後呈直立狀。需額外說明的是,所述探針定位載具1於本實施例中是以搭配於上述傳輸模組2與拍攝模組3來說明,但在本發明未繪示的其他實施例中,所述探針定位載具1也可以是單獨地應用(如:販賣)或是搭配其他構件使用。
As shown in FIG. 1 , the present embodiment discloses a
如圖2所示,上述探針200於本實施例中可以是應用於電子連接器測試,所述探針200具有兩個針頭201及一中間段202,所述兩個針頭201位於所述探針200的兩端,所述中間段202位於探針200的中間,但本發明並不受限於此。其中,所述探針200的總長度及其中間段202的形狀可依實際需求進行調整,並且所述中間段202用以供機械手臂或吸頭夾持所述探針,以避免損傷所述針頭201。
As shown in FIG. 2 , in this embodiment, the
如圖3所示,於本實施例中,所述傳輸模組2為直線式皮帶輸送機,但本發明並不以此為限。舉例來說,所述傳輸模組2也可以是板式輸送機、小車式運輸機或其他形式的運輸機,但較佳是排除滾筒運輸機或螺旋式運輸機,因為此類運輸機上的被運輸物件經常處於搖晃的狀態,容易影響所述探針200的測量結果。
As shown in FIG. 3 , in this embodiment, the
進一步地說,所述傳輸模組2於本實施例中包含一輸送皮帶21、直接驅動輸送皮帶21的兩個主動輪22、間接支撐並使輸送皮帶21連續運行的多個從動輪、直接支撐輸送皮帶21的多個托輥24、位於輸送皮帶21兩側
的多個定位擋板25、一皮帶張緊機構以及一電機驅動系統。其中,為便於圖式呈現所述傳輸模組2,所以圖式未繪示上述從動輪、皮帶張緊機構、及電機驅動系統。再者,所述傳輸模組2(於本實施例中是依據所述輸送皮帶21)定義有一傳輸路徑21,多個所述探針定位載具1經由機械手臂或吸頭置入所述探針200後,被放置於所述傳輸模組2的傳輸路徑21上,多個所述探針定位載具1通過所述傳輸模組2而沿著所述傳輸路徑21移動。
Further, the
為方便說明,圖3僅示出輸送皮帶21、主動輪22、多個托輥24以及定位擋板25以方便進行說明,此外,由於上述傳輸模組2的結構元件並非本發明的改良處,所以本實施例後續不加以贅述。
For the convenience of description, FIG. 3 only shows the conveying
所述拍攝模組3於本實施例中包含多個攝影機32、與上述多個攝影機32電性連接一顯示螢幕33、及設置於多個攝影機32鏡頭前的多個高倍顯微鏡31。其中,所述顯示螢幕33是透過外接影像傳輸線的方式與所述攝影機32連接,所述高倍顯微鏡31可間隔地設置於攝影機32鏡頭前,也可以直接重疊在攝影機32鏡頭上。需要說明的是,當所述攝影機32進行攝影時,攝影畫面可經由所述高倍顯微鏡31放大,以方便對待測物的表面進行瑕疵偵測,且攝影畫面可經由顯示螢幕33直接呈現以供現場檢測人員觀察。
In this embodiment, the photographing
如圖3及圖4所示,所述拍攝模組3對應於所述傳輸路徑21設置,並且所述拍攝模組3能用來對沿著所述傳輸路徑21移動的至少一個所述探針定位載具1上的所述探針200拍攝。更詳細地說,所述拍攝模組3於所述傳輸路徑21的兩側各設置一個所述攝影機32及一個所述高倍顯微鏡31,由所述傳輸路徑21末端往起始端的方向看,所述探針定位載具1及其所定位的探針200位於正中間,位於兩側的攝影機32各可拍攝到探針200的左右側總計360度的影像,實施三維顯微攝影。需要說明的是,所述拍攝模組3在未繪示的其他實施例中,可依實際需求增加其他硬體設備。
As shown in FIG. 3 and FIG. 4 , the photographing
舉例來說,在未繪示的另一實施例中,所述拍攝模組3可對應所述傳輸路徑21設置三個攝影機32,並且所述拍攝模組3於所述傳輸路徑21左側設置兩個攝影機32,並且所述傳輸路徑21的右側設置一個攝影機32,上述三個攝影機32呈等距離且等角度設置,據以對所述探針200進行360度的影像拍攝,實施三維顯微攝影。
For example, in another embodiment not shown, the photographing
基於本實施例中的多個探針定位載具1的具體結構大致相同,所以為方便說明,本實施例中僅以一個探針定位載具1來說明,但本發明不受限於此。舉例來說,在本發明未繪示的其他實施例中,多個探針定位載具1之間也可以略有差異。
Since the specific structures of the plurality of
如圖2及圖5所示,所述探針定位載具1包含一絕緣座11以及一磁力單元12,且所述磁力單元12埋置於所述絕緣座11內。需要說明的是,埋置於所述絕緣座11的磁力單元12具有極性相反且位於相反側的兩個磁極端1211、1221,且兩個磁極端1211、1221之間會形成一封閉環狀的磁力線分布曲線。如圖5所示,兩個磁極端1211、1221的垂直部分皆有一小段垂直磁場的領空區域,在此空間區域內,磁力線會趨於一直立直線。
As shown in FIG. 2 and FIG. 5 , the
當機械手臂或吸嘴將所述探針200置於探針定位載具1上方時,也就是說,所述探針200位於所述磁力單元12任一磁極端1211、1221上方的領空區域時,所述探針200會受到趨於直線的磁力線影響,因而被所述磁力單元12的磁極端1211、1221強而有力地吸附並與所述絕緣座11接觸且站立於絕緣座11的表面,藉此,所述拍攝模組3可以對探針200進行360度全方位的顯微攝影。
When the robot arm or the suction nozzle places the
如圖2及圖6所示,所述絕緣座11為一體成形的立方體,所述絕緣座11具有一第一端面111、及自所述第一端面111凹設形成的一限位槽112。更詳細地說,所述第一端面111為所述絕緣座11的頂面,所述頂面下方為所述
磁力單元12。在其他未繪示的實施例中,所述第一端面111可以是位於可拆卸式的蓋體上,換句話說,將所述頂蓋掀開即可看見所述磁力單元12。
As shown in FIG. 2 and FIG. 6 , the insulating
在其他未繪示的實施例中,所述第一端面111可進一步包含一溝槽,所述溝槽自第一端面111的任意一邊延伸至所述限位槽112。更詳細地說,所述溝槽自第一端面111的任意一邊的中心點凹設並延伸至所述限位槽112(所述限位槽112的頂緣),用以讓攜帶所述探針200的機械手臂或吸頭,方便沿所述溝槽通往限位槽112的方向行進。
In other not-shown embodiments, the
所述限位槽112凹設於所述第一端面111的中心,且所述限位槽112的空間也近似一立方體,但本發明並不受限於此,在其他未繪示的實施例中,所述限位槽112也可以設置鄰近於所述第一端面111的任意一邊,而所述限位槽112的空間也可以近似一橢圓體。
The limiting
所述限位槽112主要用來供所述探針200插入,且所述探針200與所述限位槽112呈點接觸。也就是說,所述探針200的針頭201與所述限位槽112的槽底的接觸位置為一個點。當探針200進行檢測時若遇到外部氣流干擾,所述限位槽112可有效避免氣流直接衝擊探針200與限位槽112槽底的接觸點,防止探針200偏倒或者過度歪斜導致檢測結果有誤。
The limiting
如圖6和圖7所示,所述限位槽112的頂緣定義有以所述槽底的中心點為頂點的一錐面A。其中,所述錐面A與所述限位槽112的槽底的所述法向量相夾有不小於10度的一限位角度θ1。也就是說,所述限位槽112頂緣的任意一點與所述限位槽112槽底的中心點相連形成一直線,所述直線與所述限位槽112槽底平行的方向向量相夾的角度小於80度。
As shown in FIG. 6 and FIG. 7 , the top edge of the limiting
如圖8所示,所述兩個磁極端1211、1221於本實施例中可以分別定義為一第一磁極端1211與一第二磁極端1221。也就是說,所述第一磁極端1211與第二磁極端1221各為N極或S極的其中之一。為方便說明,所述第
一磁極端1211於本實施例中是N極,所述第二磁極端1221是S極,但本發明不以此為限。此外,所述第一磁極端1211與所述第二磁極端1221於本實施例中近似圓柱體,且所述第一磁極端1211的體積小於所述第二磁極端1221。從另一個角度來看,所述磁力單元12的外型近似砝碼,所述的第一磁極端1211的形狀對應於砝碼的頂部,所述第二磁極端1221的形狀則對應於砝碼的本體,但本發明不以此為限。
As shown in FIG. 8 , the two
如圖8及圖9所示,所述第一磁極端1211鄰設於所述限位槽112,並且所述第一磁極端1211與所述限位槽112槽底之間相距不大於3公厘(mm)。更詳細地說,所述磁力單元12被埋置於所述限位槽112正下方,且所述磁力單元12與所述限位槽112的槽底有一間隔d,上述間隔d的範圍在0~3公厘(mm)之間。其中,當間隔d為0公厘(mm)時,所述第一磁極端1211的至少局部構成所述限位槽112的所述槽底(如:圖9),更明確的說,此時所述第一磁極端1211的頂面為所述限位槽112的槽底。
As shown in FIG. 8 and FIG. 9 , the first
如圖10所示,當所述限位槽112插設有探針200時,所述第一磁極端1211能吸附所述探針200,以使所述探針200的長度方向與所述槽底的法向量所相夾的一夾角θ2保持小於10度。也就是說,由剖面來看,所述探針200的長度方向與所述限位槽112槽底平行的方向向量所相夾的角度保持在80度到90度間。從另一方面來看,所述探針200的長度方向與所述限位槽112槽底的法向量所相夾的所述夾角θ2至多與所述錐面A與所述限位槽112的槽底的所述法向量相夾有不小於10度的所述限位角度θ1相合(最大夾角θ2與最小限位角度θ1相等)。
As shown in FIG. 10 , when the
如圖11所示,所述磁力單元12也可以是由彼此相吸附的一第一磁鐵121與一第二磁鐵122組成,且所述第一磁鐵121的尺寸小於所述第二磁鐵122。需要說明的是,所述第一磁鐵121與第二磁鐵122於本實施例中各自是一
永久磁鐵,所述永久磁鐵可以是選自由鋁鎳鈷合金磁鐵、釤鈷磁鐵與釹鐵硼磁鐵所構成的之群組。於其他未繪示的實施例中,所述第一磁鐵121與第二磁鐵122也可以是電磁鐵。
As shown in FIG. 11 , the
其中,所述第一磁鐵121具有所述第一磁極端1211,所述第二磁鐵122具有所述第二磁極端1221,所述第一磁鐵121相較於所述第二磁鐵122更為鄰近於所述限位槽112。當所述第一磁極端1211與所述限位槽112槽底的距離越近,則所述探針200受到的磁力越強,所述探針200的長度方向與所述限位槽112槽底的法向量所相夾的夾角θ2也就越接近0度。
The
[實施例二] [Example 2]
請參閱圖12至圖15所示,其為本發明的實施例二,需先說明的是,本實施例類似於上述實施例一,所以兩個實施例的相同處則不再加以贅述(如:所述探針檢測設備100);再者,本實施例對應附圖所提及的相關數量與外型,僅用來具體地說明本發明的實施方式,以便於了解本發明的內容,而非用來侷限本發明的保護範圍。 Please refer to FIG. 12 to FIG. 15 , which are the second embodiment of the present invention. It should be noted that this embodiment is similar to the above-mentioned first embodiment, so the similarities between the two embodiments will not be repeated. : the probe detection device 100); furthermore, this embodiment corresponds to the relevant quantity and appearance mentioned in the accompanying drawings, and is only used to specifically describe the embodiments of the present invention, so as to facilitate understanding of the content of the present invention, and It is not intended to limit the protection scope of the present invention.
如圖12所示,本實施例公開一種探針的三維檢測方法,其依序包括一前置步驟S1、一載針步驟S2以及一檢測步驟S3。需說明的是,以下每個步驟的技術特徵說明可依據設計需求而加以調整變化,並不以本實施例所載為限。 As shown in FIG. 12 , this embodiment discloses a three-dimensional detection method of a probe, which sequentially includes a pre-step S1 , a needle loading step S2 and a detection step S3 . It should be noted that, the description of the technical features of each step below can be adjusted and changed according to design requirements, and is not limited to what is described in this embodiment.
其中,所述前置步驟S1:提供如實施例一所述的探針檢測設備100。進一步地說,所述前置步驟S1於本實施例中還可進一步提供一連續載具裝置5,其具有多個可放置所述探針定位載具1的容納槽51,所述操作人員可依需求將多個探針定位載具1設置於所述連續載具裝置5以進行大量檢測。本實施例是以三個探針定位載具1配合連續載具裝置5進行說明,但本發明不以此為限。舉例來說,在本發明未繪示的其他實施例中,所述連續載具裝置5也
可以容納兩個或四個以上的探針定位載具1。
Wherein, the pre-step S1: providing the
如圖14及圖15所示,所述每個所述探針定位載具1的所述絕緣座11在其外表面可進一步設有一條碼113。其中,所述條碼113於本實施例中是寬度不等的多個黑條和空白,按照一定的編碼規則排列,用以表達一組資訊的圖形識別碼。再者,每個所述條碼113相對應於每個所述探針200,也就是說,每個所述條碼113相當於每個探針200的編號。然而,在本發明未繪示的其他實施例中,所述條碼113也可以是其他類型的條碼(如:QRcode)。
As shown in FIG. 14 and FIG. 15 , the insulating
所述載針步驟S2:於每個所述探針定位載具1中置入一探針200,以使所述探針200插入所述限位槽112且彼此呈點接觸,並且每個所述探針定位載具1的所述第一磁極端1211吸附相對應所述探針200,以使相對應所述探針200保持直立於所述第一磁極端1211。
The needle loading step S2: inserting a
更詳細地說,所述載針步驟S2:利用機械手臂或吸頭將待測探針200夾出,並在每個所述探針定位載具1中置入一個探針200,將所述探針200插入所述限位槽112且彼此呈點接觸。也就是說,所述探針200的針頭201與所述限位槽112槽底接觸。當所述探針200與限位槽112槽底接觸時,所述探針定位載具1的第一磁極端1211吸附相對應的所述探針200,並藉由第一磁極端1211所發出的垂直磁力線,利用磁場效應使相對應所述探針200保持直立於所述第一磁極端1211。
In more detail, the needle loading step S2: the
所述檢測步驟S3:以所述傳輸模組2將多個所述探針定位載具1及吸附於其上的多個所述探針200沿著所述傳輸路徑21移動,並且通過所述拍攝模組3依序的對多個所述探針定位載具1上的所述探針200進行拍攝、以取得每個所述探針200的一檢測資訊。
The detection step S3: using the
更詳細地說,於所述檢測步驟S3中,先將多個所述探針定位載具1及吸附於其上的多個探針200配合連續載具裝置5設置於所述傳輸模組2,
使多個所述探針定位載具1沿著所述傳輸路徑21移動。當多個所述探針定位載具1通過所述拍攝模組3時,位於所述拍攝模組3兩側的攝影機32依序對多個所述探針定位載具1上的所述探針200進行拍攝,以取得每個所述探針200的所述檢測資訊。
More specifically, in the detection step S3 , firstly, a plurality of the
再者,如圖13所示,接著,將每個所述探針200的檢測資訊傳輸至一處理模組4,所述處理模組4包含一資料儲存單元41、一資料轉換單元42以及一資料統計分析單元43。所述檢測資訊首先進入所述資料儲存單元41進行儲存,接著檢測資訊會進入所述資料轉換單元42,將資料轉換為可以大量進行運算的資料形式。舉例來說,所述檢測資訊為影像資訊,所述資料轉換單元42可將所述影像資訊的各項資料轉換為具體數值,如影像的明暗度等,以利後續進行分析。最後檢測資訊進入資料統計分析單元43,檢測資訊經分析後將輸出檢測結果。
Furthermore, as shown in FIG. 13 , then, the detection information of each
另,所述檢測步驟S3可進一步提供一掃描裝置44,其可對任一個所述探針定位載具1的所述條碼113進行掃描,以使所述掃描裝置44能通過無線傳輸而自所述處理模組4取得相對應所述探針200的所述檢測資訊。其中,所述掃描裝置44可為激光掃描器或CCD掃描器。
In addition, the detection step S3 may further provide a
綜上所述,本發明的有益效果在於,本發明所提供的一種探針檢測設備、探針的三維檢測方法、及探針定位載具,其能藉由所述磁力單元吸引探針,使探針直立於所述探針定位載具,讓所述拍攝模組能對探針進行360度全方位的顯微影像拍攝,並快速地進行瑕疵圖像檢測,據以有效解決人工檢測所帶來的種種問題。 To sum up, the beneficial effects of the present invention are that the present invention provides a probe detection device, a three-dimensional probe detection method, and a probe positioning carrier, which can attract the probe by the magnetic force unit, so that the probe can be attracted by the magnetic force unit. The probe is upright on the probe positioning carrier, so that the shooting module can take a 360-degree omnidirectional microscopic image shooting of the probe, and quickly perform defect image detection, so as to effectively solve the problems caused by manual inspection. various problems to come.
此外,本發明所提供的一種探針檢測設備、探針的三維檢測方法、及探針定位載具還進一步包含設置在所述絕緣座外表面的條碼以及處理模組,處理模組可有效分析並整合利用所述探針的檢測資訊,配合條碼 進行編號以進行大數據分析,進而提供製程缺憾矯正。 In addition, the probe detection equipment, the three-dimensional detection method of the probe, and the probe positioning carrier provided by the present invention further include a barcode and a processing module arranged on the outer surface of the insulating base, and the processing module can effectively analyze And integrate the detection information of the probe, with the barcode Numbering is performed for big data analysis to provide process defect correction.
以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的專利範圍內。 The content disclosed above is only a preferred feasible embodiment of the present invention, and is not intended to limit the patent scope of the present invention. Therefore, any equivalent technical changes made by using the contents of the description and drawings of the present invention are included in the patent scope of the present invention. Inside.
100:探針檢測設備 100: Probe Inspection Equipment
1:探針定位載具 1: Probe positioning vehicle
2:傳輸模組 2: Transmission module
3:拍攝模組 3: Shooting module
31:高倍顯微鏡 31: High Power Microscope
32:攝影機 32: Camera
33:顯示螢幕 33: Display screen
200:探針 200: Probe
Claims (8)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109107056A TWI771658B (en) | 2020-03-04 | 2020-03-04 | Probe detecting equipment and 3d detecting method of probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109107056A TWI771658B (en) | 2020-03-04 | 2020-03-04 | Probe detecting equipment and 3d detecting method of probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202134638A TW202134638A (en) | 2021-09-16 |
| TWI771658B true TWI771658B (en) | 2022-07-21 |
Family
ID=78777277
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109107056A TWI771658B (en) | 2020-03-04 | 2020-03-04 | Probe detecting equipment and 3d detecting method of probe |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI771658B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116698751A (en) * | 2023-06-17 | 2023-09-05 | 苏州嘉展科技有限公司 | A semiconductor chip micro-probe imaging detection stage structure |
| CN116953590B (en) * | 2023-09-21 | 2023-12-05 | 上海泽丰半导体科技有限公司 | Omnibearing probe measuring device and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200811443A (en) * | 2006-08-25 | 2008-03-01 | Mjc Probe Inc | Vertical probing apparatus |
| CN208368760U (en) * | 2018-07-14 | 2019-01-11 | 厦门强力巨彩光电科技有限公司 | A kind of novel magnet wire tooling |
| CN208986264U (en) * | 2018-11-16 | 2019-06-14 | 深圳市创卓鑫五金电子有限公司 | A kind of magnetic control fast connector component |
-
2020
- 2020-03-04 TW TW109107056A patent/TWI771658B/en active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200811443A (en) * | 2006-08-25 | 2008-03-01 | Mjc Probe Inc | Vertical probing apparatus |
| CN208368760U (en) * | 2018-07-14 | 2019-01-11 | 厦门强力巨彩光电科技有限公司 | A kind of novel magnet wire tooling |
| CN208986264U (en) * | 2018-11-16 | 2019-06-14 | 深圳市创卓鑫五金电子有限公司 | A kind of magnetic control fast connector component |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202134638A (en) | 2021-09-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108188043B (en) | Appearance detection equipment and method for lithium battery cell | |
| TWI771658B (en) | Probe detecting equipment and 3d detecting method of probe | |
| US5459330A (en) | Process and device for the inspection of glass | |
| KR101464852B1 (en) | Specimen information detecting device and specimen information detecting method | |
| CN109060827A (en) | A kind of intelligent visual detection identification equipment | |
| CN101887025A (en) | Visual detection device and visual detection method thereof | |
| TWI690704B (en) | Appearance inspection apparatus for cylindrical component | |
| CN109909175A (en) | A kind of volume key appearance AOI detection device and its detection method | |
| CN108609381A (en) | A kind of Systems for optical inspection | |
| CN109092701A (en) | Battery aluminum shell detection device | |
| US8860802B2 (en) | Method and apparatus for detecting defects and embedded objects in sealed sterilized packaging | |
| TWI767876B (en) | Probe positioning carrier | |
| US20090073426A1 (en) | Multiple Surface Inspection System and Method | |
| KR20110018081A (en) | Cylindrical Secondary Battery Side Inspection Device | |
| CN211403010U (en) | Foreign body positioning device for display panel | |
| CN114235684A (en) | Macroscopic and microscopic detection equipment and detection method | |
| CN208752015U (en) | Product appearance checking device | |
| CN206990465U (en) | The defects of liquid crystal panel detection means | |
| CN213239953U (en) | Three-dimensional automatic optical detection equipment | |
| JP6438703B2 (en) | Foreign matter inspection apparatus, foreign matter inspection system, and foreign matter inspection method | |
| CN111701890A (en) | A colorimeter mobile testing mechanism | |
| TWI769060B (en) | Macroscopic and microscopic testing equipment and testing methods | |
| CN219180096U (en) | Machine vision comprehensive training platform | |
| CN118913103A (en) | Sensitive dangerous goods size measurement system | |
| CN209692942U (en) | A kind of camera function test device for electronic product |