[go: up one dir, main page]

TWI768460B - Plasma antenna module and plasma processing device - Google Patents

Plasma antenna module and plasma processing device Download PDF

Info

Publication number
TWI768460B
TWI768460B TW109130843A TW109130843A TWI768460B TW I768460 B TWI768460 B TW I768460B TW 109130843 A TW109130843 A TW 109130843A TW 109130843 A TW109130843 A TW 109130843A TW I768460 B TWI768460 B TW I768460B
Authority
TW
Taiwan
Prior art keywords
plasma antenna
plasma
detour
path
antenna
Prior art date
Application number
TW109130843A
Other languages
Chinese (zh)
Other versions
TW202117779A (en
Inventor
金亨源
李允誠
鄭熙錫
Original Assignee
南韓商吉佳藍科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 南韓商吉佳藍科技股份有限公司 filed Critical 南韓商吉佳藍科技股份有限公司
Publication of TW202117779A publication Critical patent/TW202117779A/en
Application granted granted Critical
Publication of TWI768460B publication Critical patent/TWI768460B/en

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32091Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H01J37/3211Antennas, e.g. particular shapes of coils
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • H01J37/32183Matching circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q1/00Details of, or arrangements associated with, antennas
    • H01Q1/12Supports; Mounting means
    • H01Q1/22Supports; Mounting means by structural association with other equipment or articles
    • H01Q1/26Supports; Mounting means by structural association with other equipment or articles with electric discharge tube
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Plasma Technology (AREA)
  • Absorbent Articles And Supports Therefor (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)

Abstract

Disclosed are a plasma antenna module and a plasma processing device. The plasma antenna module includes a plasma antenna, a ground part electrically connected to a side of the plasma antenna, a power supply part for supplying power to the other side of the plasma antenna, and a roundabout part situated between the plasma antenna and the power supply part or between the plasma antenna and the ground part. The turnaround part is situated at a multiple of mutually connected contact points on a first path. In the condition of two or more of the contact points being connected to each other, the turnaround part forms a second path different from the first path. The turnaround part controls the value of current flowing into the plasma antenna according to the quantity of contact points included in the second path.

Description

等離子體天線模組及等離子體處理裝置Plasma antenna module and plasma processing device

本公開涉及一種等離子體天線模組,更詳細地涉及一種用於單獨控制向各個等離子體天線流入的電流的等離子體天線模組。The present disclosure relates to a plasma antenna module, and more particularly, to a plasma antenna module for individually controlling the current flowing into each plasma antenna.

等離子體處理裝置大體上有感應耦合等離子體源(Inductively Coupled Plasma Source,ICP)型和電容耦合等離子體源(Capacitively Coupled Plasma Source,CCP)型,也在使用能夠製造更高的等離子體密度的新的等離子體源型即線圈波等離子體和ECR(電子迴旋共振等離子體,Electron cyclotron resonance plasma)等離子體源型等。Plasma processing apparatuses are generally of the Inductively Coupled Plasma Source (ICP) type and the Capacitively Coupled Plasma Source (CCP) type, and new technologies capable of producing higher plasma densities are also being used. The plasma source type is coil wave plasma and ECR (Electron cyclotron resonance plasma) plasma source type, etc.

等離子體處理裝置可以通過供應到等離子體天線的電源而將工藝氣體形成為等離子體,能夠利用所形成的等離子體來處理基板(例如,蝕刻、蒸鍍等)。在此情況下,等離子體的密度可以成為決定基板的處理速度的重要要素中一個。The plasma processing apparatus can form a process gas into plasma by the power supply to the plasma antenna, and can process a substrate (eg, etching, vapor deposition, etc.) using the formed plasma. In this case, the density of the plasma can be one of the important factors for determining the processing speed of the substrate.

但是,根據處理等離子體的環境條件,等離子體的密度發生變化,因此存在並不是基板整體以相同的速度被處理而處理速度局部性不同的問題,例如可能發生基板一部分以快的速度被處理而另一部分以慢的速度被處理的問題。進而,在被供應向等離子體天線供應的高電壓的電源的情況下,存在應穩定地控制向等離子體天線流入的電流的必要性。However, since the density of the plasma varies depending on the environmental conditions for processing the plasma, there is a problem that the entire substrate is not processed at the same speed but the processing speed is locally different. For example, a part of the substrate may be processed at a high speed and Another part of the problem is being dealt with at a slow rate. Furthermore, when a high-voltage power supply to be supplied to the plasma antenna is supplied, there is a need to stably control the current flowing into the plasma antenna.

本說明書中公開的實施例提供一種通過單獨控制向各個等離子體天線流入的電流而能夠局部性調節等離子體密度的等離子體天線模組。The embodiments disclosed in this specification provide a plasma antenna module capable of locally adjusting the plasma density by individually controlling the current flowing into each plasma antenna.

本公開的一實施例的等離子體天線模組包括:等離子體天線;接地部,電連接於等離子體天線的一側;電源供應部,向等離子體天線的另一側供應電源;以及迂回部,介於等離子體天線和電源供應部之間或者等離子體天線和接地部之間。迂回部包括位於第一路徑上的彼此連接的多個接點。在多個接點中2個以上的附加地彼此接點連接的情況下,迂回部形成與第一路徑不同的第二路徑。迂回部根據包括在第二路徑中的接點的數量,控制向等離子體天線流入的電流值。A plasma antenna module according to an embodiment of the present disclosure includes: a plasma antenna; a ground portion, electrically connected to one side of the plasma antenna; a power supply portion, for supplying power to the other side of the plasma antenna; and a detour portion, between the plasma antenna and the power supply or between the plasma antenna and the ground. The detour includes a plurality of contacts connected to each other on the first path. When two or more of the plurality of contacts are additionally connected to each other, the detour portion forms a second route different from the first route. The detour section controls the value of the current flowing into the plasma antenna according to the number of contacts included in the second path.

本公開的一實施例的等離子體天線模組包括:第一等離子體天線;接地部,電連接於第一等離子體天線的一側;電源供應部,向第一等離子體天線的另一側供應電源;以及迂回部,介於第一等離子體天線和電源供應部之間或者第一等離子體天線和接地部之間。迂回部包括位於第一路徑上的彼此連接的多個接點。在多個接點中2個以上的接點附加地彼此連接的情況下,迂回部形成具有比第一路徑短的長度的第二路徑來控制向第一等離子體天線流入的電流值。A plasma antenna module according to an embodiment of the present disclosure includes: a first plasma antenna; a grounding portion, electrically connected to one side of the first plasma antenna; and a power supply portion, supplied to the other side of the first plasma antenna a power supply; and a detour part, interposed between the first plasma antenna and the power supply part or between the first plasma antenna and the ground part. The detour includes a plurality of contacts connected to each other on the first path. When two or more of the plurality of contacts are additionally connected to each other, the detour portion forms a second path having a length shorter than that of the first path, and controls the current value flowing into the first plasmonic antenna.

本公開的一實施例的等離子體天線模組包括:第一等離子體天線;第一接地部,電連接於第一等離子體天線的一側;電源供應部,向第一等離子體天線的另一側供應電源;以及第一迂回部,介於第一等離子體天線和電源供應部之間或者第一等離子體天線和第一接地部之間。第一迂回部包括:第一接點,位於第一路徑上;第二接點,與第一接點隔開而位於第一路徑上;第一基本電路,通過第一接點和第二接點彼此連接來形成,並包括在第一路徑中;以及第一迂回電路,將第一接點和第二接點附加地彼此連接來形成,並包括在與第一路徑不同的第二路徑中。第一迂回電路具有比第一基本電路短的長度,從而控制向第一等離子體天線流入的電流值。A plasma antenna module according to an embodiment of the present disclosure includes: a first plasma antenna; a first ground portion, electrically connected to one side of the first plasma antenna; and a power supply portion, connected to the other side of the first plasma antenna a side power supply; and a first detour part, interposed between the first plasma antenna and the power supply part or between the first plasma antenna and the first ground part. The first detour part includes: a first contact, located on the first path; a second contact, separated from the first contact and located on the first path; a first basic circuit, through the first contact and the second contact points are connected to each other to be formed and included in the first path; and a first detour circuit that additionally connects the first contact and the second contact to each other to be formed and included in a second path different from the first path . The first detour circuit has a shorter length than the first basic circuit, thereby controlling the value of the current flowing into the first plasma antenna.

本公開的一實施例的等離子體天線模組包括:多個等離子體天線;多個迂回部,分別連接於多個等離子體天線,並包括彼此連接的多個接點;移送單元,用於將包括在各迂回部中的多個接點中2個以上的接點選擇性附加地彼此連接;存儲介質,存儲有與根據連接的接點的數量控制向各等離子體天線流入的電流值而由各等離子體天線形成的等離子體密度相關的資訊;以及控制部,為了根據存儲於存儲介質的資訊來調節各迂回部的連接的接點的數量,控制移送單元。A plasma antenna module according to an embodiment of the present disclosure includes: a plurality of plasma antennas; a plurality of detours, respectively connected to the plurality of plasma antennas, and including a plurality of contacts connected to each other; a transfer unit for transferring Two or more contacts among the plurality of contacts included in each detour portion are selectively and additionally connected to each other; the storage medium stores and stores the value of the current flowing into each plasma antenna according to the number of the connected contacts. information on plasma density formed by each plasma antenna; and a control unit that controls the transfer unit in order to adjust the number of contacts connected to each detour unit based on the information stored in the storage medium.

本公開的一實施例的等離子體處理裝置具備被調節等離子體密度的等離子體天線,其中,等離子體處理裝置包括:電源供應部,向第一等離子體天線的一側供應電源;第一接地部,電連接於第一等離子體天線的另一側;以及第一迂回部,介於第一等離子體天線和電源供應部之間或者第一等離子體天線和第一接地部之間,第一迂回部包括:基本電路,形成第一路徑;多個接點,在第一路徑上彼此隔開設置且彼此連接;以及迂回電路,形成有用於緊固於多個接點的緊固孔,通過在緊固孔中選擇性地緊固多個接點,第一迂回部形成具有比第一路徑短的長度的第二路徑。A plasma processing apparatus according to an embodiment of the present disclosure includes a plasma antenna whose plasma density is adjusted, wherein the plasma processing apparatus includes: a power supply part for supplying power to one side of the first plasma antenna; a first grounding part , electrically connected to the other side of the first plasma antenna; and a first detour part, interposed between the first plasma antenna and the power supply part or between the first plasma antenna and the first ground part, the first detour part The part includes: a basic circuit that forms a first path; a plurality of contacts that are spaced apart and connected to each other on the first path; and a detour circuit that is formed with fastening holes for fastening to the plurality of contacts, A plurality of contacts are selectively fastened in the fastening hole, and the first roundabout portion forms a second path having a length shorter than that of the first path.

本公開的一實施例的等離子體處理裝置具備被調節等離子體密度的等離子體天線,其中,等離子體處理裝置包括:電源供應部,向彼此隔開設置的第一等離子體天線、第二等離子體天線、第三等離子體天線以及第四等離子體天線各自的一側並列供應電源;第一接地部,電連接於第一等離子體天線、第二等離子體天線、第三等離子體天線以及第四等離子體天線各自的另一側;以及多個迂回部,電連接於第一等離子體天線、第二等離子體天線、第三等離子體天線以及第四等離子體天線各自和電源供應部之間或者第一等離子體天線、第二等離子體天線、第三等離子體天線以及第四等離子體天線各自和第一接地部之間,多個迂回部各自包括:基本電路,形成第一路徑;多個接點,在第一路徑上彼此隔開設置且彼此連接;以及迂回電路,形成用於緊固於多個接點的緊固孔,通過在緊固孔中選擇性地緊固多個接點,多個迂回部各自形成具有比第一路徑短的長度的第二路徑,第一等離子體天線位於第二等離子體天線、第三等離子體天線以及第四等離子體天線的內側,第二等離子體天線、第三等離子體天線以及所述第四等離子體天線佈置成均等分割等離子體處理區域。A plasma processing apparatus according to an embodiment of the present disclosure includes a plasma antenna whose plasma density is adjusted, wherein the plasma processing apparatus includes a power supply unit, a first plasma antenna and a second plasma antenna provided to be spaced apart from each other. One side of the antenna, the third plasma antenna and the fourth plasma antenna supply power in parallel; the first ground part is electrically connected to the first plasma antenna, the second plasma antenna, the third plasma antenna and the fourth plasma antenna the other side of each of the body antennas; and a plurality of detours, electrically connected between the first plasma antenna, the second plasma antenna, the third plasma antenna and the fourth plasma antenna and the power supply part or the first plasma antenna Between each of the plasma antenna, the second plasma antenna, the third plasma antenna, and the fourth plasma antenna and the first ground portion, each of the plurality of detour portions includes: a basic circuit, forming a first path; a plurality of contacts, The first paths are spaced apart from each other and are connected to each other; and a detour circuit, forming fastening holes for fastening to a plurality of contacts, and by selectively fastening a plurality of contacts in the fastening holes, a plurality of The detours each form a second path having a shorter length than the first path, the first plasma antenna is located inside the second plasma antenna, the third plasma antenna, and the fourth plasma antenna, the second plasma antenna, the third plasma antenna The three plasma antennas and the fourth plasma antenna are arranged to equally divide the plasma processing area.

根據本公開的各種實施例,通過精密地單獨控制向各個等離子體天線流入的電流值,能夠單獨地調節通過各個等離子體天線形成的等離子體的密度。According to various embodiments of the present disclosure, it is possible to individually adjust the density of plasma formed by each of the plasma antennas by precisely individually controlling the value of the current flowing into each of the plasma antennas.

根據本公開的各種實施例,通過單獨調節通過各個等離子體天線形成的等離子體密度,能夠局部性控制腔室內部的等離子體密度,由此能夠均勻地處理基板整體。According to various embodiments of the present disclosure, by individually adjusting the plasma density formed by each plasma antenna, the plasma density inside the chamber can be locally controlled, whereby the entire substrate can be uniformly processed.

根據本公開的各種實施例,通過調節向各等離子體天線流入的電流值間的比例,能夠局部性控制腔室內部的等離子體密度,由此能夠均勻地處理基板整體。According to various embodiments of the present disclosure, by adjusting the ratio between the current values flowing into the plasma antennas, the plasma density inside the chamber can be locally controlled, whereby the entire substrate can be uniformly processed.

根據本公開的各種實施例,由於可以選擇迂回部所具有的多個接點中希望的接點來彼此連接,能夠精密地單獨控制向各個等離子體天線流入的電流值。According to various embodiments of the present disclosure, since a desired contact point among a plurality of contact points included in the detour portion can be selected and connected to each other, the value of the current flowing into each plasma antenna can be precisely and individually controlled.

根據本公開的各種實施例,由於可以容易地調節在線圈形態的迂回部中電流流動的轉數,能夠精密地單獨控制向各個等離子體天線流入的電流值。According to various embodiments of the present disclosure, since the number of revolutions of current flowing in the detour portion of the coil form can be easily adjusted, the value of the current flowing to each plasma antenna can be precisely and individually controlled.

根據本公開的各種實施例,通過在迂回部以簡單的物理形態實現迂回電路,能夠穩定且精密地單獨控制高電壓的電流。According to various embodiments of the present disclosure, by implementing a detour circuit in a detour portion in a simple physical form, it is possible to stably and precisely control a high-voltage current individually.

根據本公開的各種實施例,通過在迂回部物理實現迂回電路,在被供應高電壓的電源的情況下也能夠穩定地控制向等離子體天線流入的電流。According to various embodiments of the present disclosure, by physically implementing a detour circuit in the detour portion, it is possible to stably control the current flowing into the plasma antenna even when a high-voltage power supply is supplied.

本公開的效果不限於以上提及的效果,本領域技術人員可以從權利要求書的記載清楚地理解未提及的其它效果。The effects of the present disclosure are not limited to the effects mentioned above, and other effects not mentioned can be clearly understood by those skilled in the art from the description of the claims.

以下,參照附圖來詳細說明用於實施本公開的具體內容。但是,在以下的說明中,當可能會沒必要地混淆本公開的主旨時,將會省略對眾所周知的功能或構成的具體說明。Hereinafter, specific content for implementing the present disclosure will be described in detail with reference to the accompanying drawings. However, in the following description, detailed descriptions of well-known functions or configurations will be omitted when it may unnecessarily obscure the gist of the present disclosure.

在詳述本公開的實施例之前,可以是,圖的上邊指稱為其圖中示出的構成的“上方”或者“上側”,其下邊指稱為“下方”或者“下側”。另外,圖中示出的構成的除上方和下方之間或者上方和下方以外的剩餘部分可以指稱為“側方”或者“側面”。Before describing the embodiments of the present disclosure in detail, the upper side of a figure may be referred to as "above" or "upper side" of the constituents shown in the figures, and the lower side thereof may be referred to as "below" or "lower side". In addition, the remaining parts of the configuration shown in the drawings except between or between the upper and lower sides may be referred to as "sides" or "sides".

在本公開整體中,可以是,圖的左邊指稱為其圖中示出的構成的“左”或者“左側”,其右邊指稱為“右”或者“右側”。In the present disclosure as a whole, the left side of a figure may be referred to as "left" or "left side" of the composition shown in the figure, and the right side may be referred to as "right" or "right side".

在本公開整體中,當某部分與其它部分“連接”時,其不僅包括“直接連接”的情況,還包括在其中間介有其它構成要件而“電連接”的情況。In the present disclosure as a whole, when a part is "connected" to another part, it includes not only the case of "direct connection" but also the case of "electrical connection" with other constituent elements interposed therebetween.

在附圖中,在相同或對應的構成要件中標注有相同的附圖標記。另外,在以下的實施例說明中,可能會省略重複敘述相同或對應的構成要件。但是,即使省略了針對構成要件的敘述,並不意味為其構成要件不包括在某實施例中。這種“上方”、“上側”等之類相對性用語可以為了說明圖中示出的構成間的關係而使用,本公開不限於其用語。In the drawings, the same or corresponding components are denoted by the same reference numerals. In addition, in the following description of the embodiments, repeated description of the same or corresponding constituent elements may be omitted. However, even if the description of the constituent elements is omitted, it does not mean that the constituent elements are not included in a certain embodiment. Such relative terms such as "above", "upper side" and the like may be used to describe the relationship between the components shown in the drawings, and the present disclosure is not limited to the terms.

下面,參照附圖來詳細說明本申請的實施例,以使得本申請所屬技術領域中具有通常知識的人員能夠容易地實施。但是,本申請可以以各種不同的形式實施,不限於在此說明的實施例。Hereinafter, the embodiments of the present application will be described in detail with reference to the accompanying drawings, so that those having ordinary knowledge in the technical field to which the present application pertains can be easily implemented. However, the present application may be embodied in various different forms and is not limited to the embodiments described herein.

圖1是根據本公開的一實施例設置於腔室的等離子體天線模組的概要圖。等離子體天線模組可以包括電源供應部100、接地部200、等離子體天線300以及迂回部400。FIG. 1 is a schematic diagram of a plasma antenna module disposed in a chamber according to an embodiment of the present disclosure. The plasma antenna module may include a power supply portion 100 , a ground portion 200 , a plasma antenna 300 and a detour portion 400 .

如圖1所示,等離子體天線300可以佈置於腔室的上方而向佈置於腔室內部的基板提供均勻的等離子體密度。等離子體天線300可以包括第一等離子體天線310、第二等離子體天線320、第三等離子體天線330以及第四等離子體天線340。等離子體天線300可以彼此隔開一定間隔而佈置於腔室的上方。As shown in FIG. 1 , the plasma antenna 300 may be disposed above the chamber to provide a uniform plasma density to the substrate disposed inside the chamber. The plasma antenna 300 may include a first plasma antenna 310 , a second plasma antenna 320 , a third plasma antenna 330 and a fourth plasma antenna 340 . The plasma antennas 300 may be arranged above the chamber with a certain interval from each other.

根據一實施例,第一等離子體天線310可以與第二等離子體天線320隔開而位於第二等離子體天線320的內側。另外,第二等離子體天線320可以與第三等離子體天線330隔開而位於第三等離子體天線330的內側,第三等離子體天線330可以與第四等離子體天線340隔開而位於第四等離子體天線340的內側。在此,各個等離子體天線300可以是位於相同平面上的直徑彼此不同的圓形形式。According to an embodiment, the first plasma antenna 310 may be spaced apart from the second plasma antenna 320 and located inside the second plasma antenna 320 . In addition, the second plasma antenna 320 may be spaced apart from the third plasma antenna 330 and located inside the third plasma antenna 330, and the third plasma antenna 330 may be spaced apart from the fourth plasma antenna 340 and located in the fourth plasma antenna inside the body antenna 340 . Here, the respective plasmonic antennas 300 may be in the form of circles with different diameters from each other located on the same plane.

等離子體天線300的數量和佈置不限於圖1。等離子體天線300可以根據等離子體源類型而設置於腔室的內部、外部、上方或者側面,並可以調整等離子體天線300間的佈置間隔。另外,各個等離子體天線300可以佈置於相同平面上,或者可以佈置於彼此不同平面上。The number and arrangement of the plasma antennas 300 are not limited to FIG. 1 . The plasma antennas 300 may be disposed inside, outside, above or on the side of the chamber according to the type of the plasma source, and the arrangement interval between the plasma antennas 300 may be adjusted. In addition, the respective plasmonic antennas 300 may be arranged on the same plane, or may be arranged on different planes from each other.

在等離子體天線300的一側可以電連接接地部200,在另一側可以連接用於向等離子體天線300供應電源的電源供應部100。The ground portion 200 may be electrically connected to one side of the plasma antenna 300 , and the power supply portion 100 for supplying power to the plasma antenna 300 may be connected to the other side.

根據一實施例,在第一等離子體天線310的一側可以電連接第一接地部210,在第二等離子體天線320的一側可以電連接第二接地部220。另外,在第三等離子體天線330的一側可以電連接第三接地部230,在第四等離子體天線340的一側可以電連接第四接地部240。此時,各個等離子體天線300可以從電源供應部100接收並列供應電源。如圖1所示,電源供應部100可以向第一等離子體天線310的另一側、第二等離子體天線320的另一側、第三等離子體天線330的另一側以及第四等離子體天線340的另一側並列供應電源。According to an embodiment, one side of the first plasma antenna 310 may be electrically connected to the first ground portion 210 , and one side of the second plasma antenna 320 may be electrically connected to the second ground portion 220 . In addition, the third ground portion 230 may be electrically connected to one side of the third plasma antenna 330 , and the fourth ground portion 240 may be electrically connected to one side of the fourth plasma antenna 340 . At this time, each of the plasma antennas 300 may receive parallel supply power from the power supply unit 100 . As shown in FIG. 1 , the power supply part 100 may extend to the other side of the first plasma antenna 310 , the other side of the second plasma antenna 320 , the other side of the third plasma antenna 330 and the fourth plasma antenna The other side of the 340 is powered in parallel.

迂回部400可以介於各個等離子體天線300和電源供應部100之間或者各個等離子體天線300和接地部200之間。迂回部400可以包括第一迂回部410、第二迂回部420、第三迂回部430以及第四迂回部440。The detour part 400 may be interposed between each of the plasma antennas 300 and the power supply part 100 or between each of the plasma antennas 300 and the ground part 200 . The detour portion 400 may include a first detour portion 410 , a second detour portion 420 , a third detour portion 430 , and a fourth detour portion 440 .

根據一實施例,如圖1所示,迂回部400可以介於各個等離子體天線300和與其電連接的各個接地部200之間。例如,第一迂回部410可以介於第一等離子體天線310和第一接地部210之間,第二迂回部420可以介於第二等離子體天線320和第二接地部220之間。另外,第三迂回部430可以介於第三等離子體天線330和第三接地部230之間,第四迂回部440可以介於第四等離子體天線340和第四接地部240之間。According to an embodiment, as shown in FIG. 1 , the detour portion 400 may be interposed between each of the plasma antennas 300 and each of the ground portions 200 electrically connected thereto. For example, the first detour portion 410 may be interposed between the first plasma antenna 310 and the first ground portion 210 , and the second detour portion 420 may be interposed between the second plasma antenna 320 and the second ground portion 220 . In addition, the third detour portion 430 may be interposed between the third plasma antenna 330 and the third ground portion 230 , and the fourth detour portion 440 may be interposed between the fourth plasma antenna 340 and the fourth ground portion 240 .

根據又另一實施例,迂回部400可以介於各個等離子體天線300和與其並列電連接的電源供應部100之間。例如,第一迂回部410可以介於第一等離子體天線310和電源供應部100之間,第二迂回部420可以介於第二等離子體天線320和電源供應部100之間。另外,第三迂回部430可以介於第三等離子體天線330和電源供應部100之間,第四迂回部440可以介於第四等離子體天線340和電源供應部100之間。According to yet another embodiment, the detour portion 400 may be interposed between each of the plasma antennas 300 and the power supply portion 100 electrically connected in parallel therewith. For example, the first detour part 410 may be interposed between the first plasma antenna 310 and the power supply part 100 , and the second detour part 420 may be interposed between the second plasma antenna 320 and the power supply part 100 . In addition, the third detour portion 430 may be interposed between the third plasma antenna 330 and the power supply portion 100 , and the fourth detour portion 440 may be interposed between the fourth plasma antenna 340 and the power supply portion 100 .

針對迂回部400控制向各個等離子體天線300流入的電流來控制腔室內部的等離子體密度的過程,在下面更詳細說明。The process of controlling the current flowing into each plasma antenna 300 by the detour unit 400 to control the plasma density inside the chamber will be described in more detail below.

圖2是示出根據本公開的一實施例在迂回部400形成的第一路徑P1以及第二路徑P2的例示圖。第一路徑P1以及第二路徑P2意指電流的物理路徑,相當於彼此不同長度的路徑。將在迂回部400中形成第一路徑P1以及第二路徑P2的原理以第一迂回部410為基準進行說明的話如下,該原理不僅適用於第一迂回部410,還可以適用於其它迂回部。FIG. 2 is a diagram illustrating a first path P1 and a second path P2 formed in the detour portion 400 according to an embodiment of the present disclosure. The first path P1 and the second path P2 refer to physical paths of current, and correspond to paths of different lengths from each other. The principle of forming the first path P1 and the second path P2 in the detour portion 400 will be described with reference to the first detour portion 410 as follows. This principle can be applied not only to the first detour portion 410 but also to other detour portions.

第一迂回部410可以包括彼此隔開的多個接點500,多個接點500可以位於第一路徑P1上。根據一實施例,如圖2的(a)所示,第一迂回部410可以包括第一接點510、第二接點520、第三接點530、第四接點540、第五接點550以及第六接點560。The first detour part 410 may include a plurality of contacts 500 spaced apart from each other, and the plurality of contacts 500 may be located on the first path P1. According to an embodiment, as shown in FIG. 2( a ), the first detour portion 410 may include a first contact 510 , a second contact 520 , a third contact 530 , a fourth contact 540 , and a fifth contact 550 and the sixth contact 560.

當各個接點沒有彼此連接時,通過迂回部400流動的電流沿著第一路徑P1。在多個接點中2個以上的接點連接的情況下,形成與第一路徑P1不同的第二路徑P2,通過迂回部400流動的電流沿著第二路徑P2。根據包括在第二路徑P2中的接點500的數量,即彼此連接的接點500的數量,可以調節第二路徑P2的長度。例如,包括在第二路徑P2中的接點500的數量越增加,第二路徑P2的長度可以越縮減。根據在第一迂回部410中彼此連接的接點的數量,控制第二路徑P2的長度,從而控制向連接於第一迂回部410的第一等離子體天線310流入的電流值而能夠調節通過第一等離子體天線310形成的等離子體密度。When the respective contacts are not connected to each other, the current flowing through the detour portion 400 follows the first path P1. When two or more of the plurality of contacts are connected, a second path P2 is formed that is different from the first path P1, and the current flowing through the detour portion 400 follows the second path P2. The length of the second path P2 may be adjusted according to the number of the contacts 500 included in the second path P2, that is, the number of the contacts 500 connected to each other. For example, the more the number of contacts 500 included in the second path P2 increases, the more the length of the second path P2 can be reduced. By controlling the length of the second path P2 according to the number of contacts connected to each other in the first detour portion 410, the current value flowing into the first plasmonic antenna 310 connected to the first detour portion 410 can be controlled to adjust the value of the current flowing through the first detour portion 410. The plasma density formed by a plasma antenna 310 .

根據一實施例,如圖2的(a)所示,第一路徑P1可以包括曲線形態的基本電路,即第一基本電路610、第二基本電路620以及第三基本電路630(參考圖2的(a)的箭頭所示)。另外,第一路徑P1可以包括連接第二接點520和第三接點530之間的電路以及連接第四接點540和第五接點550之間的電路。曲線形態和直線形態只不過是用於比較電路的曲線形態的長度比直線形態的長度長的物理長度的例示,這些形態並不限定本發明。According to an embodiment, as shown in (a) of FIG. 2 , the first path P1 may include basic circuits in the form of curves, that is, a first basic circuit 610 , a second basic circuit 620 and a third basic circuit 630 (refer to FIG. 2 (a) indicated by the arrow). In addition, the first path P1 may include a circuit connecting between the second contact 520 and the third contact 530 and a circuit connecting between the fourth contact 540 and the fifth contact 550 . The curved form and the straight form are merely examples of the physical length in which the length of the curved form used for the comparison circuit is longer than the length of the straight form, and these forms do not limit the present invention.

根據一實施例,如圖2(b)所示,第二路徑P2可以包括第一接點510和第二接點520彼此新連接而形成的直線形態的第一迂回電路710、第三接點530和第四接點540彼此新連接而形成的直線形態的第二迂回電路720、第五接點550和第六接點560彼此新連接而形成的直線形態的第三迂回電路730(參考圖2(b)的箭頭所示)。另外,第二路徑P2可以包括連接第二接點520和第三接點530之間的電路以及連接第四接點540和第五接點550之間的電路。接點以直線形態彼此連接而形成的迂回電路710、720、730的長度比現有曲線形態的基本電路610、620、630的長度短。因此,具備迂回電路710、720、730的第二路徑P2的長度比具備基本電路610、620、630的第一路徑P1的長度短。According to an embodiment, as shown in FIG. 2( b ), the second path P2 may include a first detour circuit 710 and a third contact in a straight line formed by newly connecting the first contact 510 and the second contact 520 to each other. 530 and the fourth contact 540 are newly connected to each other to form a second detour circuit 720 in the form of a straight line, and the fifth contact 550 and the sixth contact 560 are newly connected to each other. 2(b) indicated by the arrow). In addition, the second path P2 may include a circuit connecting the second contact point 520 and the third contact point 530 and a circuit connecting the fourth contact point 540 and the fifth contact point 550 . The detour circuits 710 , 720 , and 730 in which the contacts are connected in a straight line are shorter in length than the conventional basic circuits 610 , 620 and 630 in a curved shape. Therefore, the length of the second path P2 including the detour circuits 710 , 720 , and 730 is shorter than the length of the first path P1 including the basic circuits 610 , 620 , and 630 .

與第一迂回部410所具有的迂回電路的數量或者彼此連接的接點的數量成比例地,第二路徑P2形成為路徑的長度比第一路徑P1的路徑的長度短,從而第二路徑P2能夠相比於第一路徑P1縮減電阻值。若縮減第二路徑P2的電阻值,則經過第一迂回部410的電流沿著第二路徑P2。由此,向連接於第一迂回部410的第一等離子體天線310流入的電流能夠增加。因電流的增加,由第一等離子體天線310形成的等離子體密度能夠增加。In proportion to the number of detour circuits that the first detour portion 410 has or the number of contacts connected to each other, the second path P2 is formed such that the length of the path is shorter than that of the first path P1, so that the second path P2 The resistance value can be reduced compared to the first path P1. If the resistance value of the second path P2 is reduced, the current passing through the first detour portion 410 follows the second path P2. Thereby, the current flowing into the first plasmonic antenna 310 connected to the first detour portion 410 can be increased. The plasma density formed by the first plasma antenna 310 can be increased due to the increase of the current.

根據第一迂回部410所具有的迂回電路的數量或者彼此連接的接點的數量,可以變更第二路徑P2的長度。若第一迂回部410所具有的迂回電路的數量或者彼此連接的接點的數量縮減而第二路徑P2的長度變長,則由於第二路徑P2的電阻值增加而電流值減少,其結果,通過連接於第一迂回部410的第一等離子體天線310形成的等離子體密度減少。另外,若第一迂回部410所具有的迂回電路的數量或者彼此連接的接點的數量增加而第二路徑P2的長度變短,則由於第二路徑P2的電阻值減少而電流值增加,其結果,通過連接於第一迂回部410的第一等離子體天線310形成的等離子體密度增加。The length of the second path P2 can be changed according to the number of detour circuits or the number of contacts connected to each other in the first detour portion 410 . When the number of detour circuits or the number of contacts connected to each other in the first detour portion 410 is reduced and the length of the second path P2 is increased, the resistance value of the second path P2 increases and the current value decreases. As a result, The plasma density formed by the first plasma antenna 310 connected to the first detour portion 410 is reduced. In addition, if the number of detour circuits included in the first detour portion 410 or the number of contacts connected to each other increases and the length of the second path P2 is shortened, the resistance value of the second path P2 decreases and the current value increases, which As a result, the plasma density formed by the first plasma antenna 310 connected to the first detour portion 410 increases.

雖然說明為迂回電路700比基本電路短,但不限於此,相反地,可以通過使一部分或者全部迂回電路700比基本電路600長來調節第二路徑P2的長度。Although the detour circuit 700 is described as being shorter than the base circuit, it is not limited to this, and instead, the length of the second path P2 can be adjusted by making a part or all of the detour circuit 700 longer than the base circuit 600 .

可以利用與第二等離子體天線320、第三等離子體天線330以及第四等離子體天線340分別連接的第二迂回部420、第三迂回部430以及第四迂回部440以及上述的原理而控制向第二等離子體天線320、第三等離子體天線330以及第四等離子體天線340流入的電流值,單獨控制通過第二等離子體天線320、第三等離子體天線330以及第四等離子體天線340形成的等離子體密度。進而,由於能夠單獨控制向各個等離子體天線300流入的電流值,能夠調節從電源供應部100接收並列供應電源的各個等離子體天線300的電流值間的比例。Direction can be controlled by using the second detour portion 420 , the third detour portion 430 , and the fourth detour portion 440 connected to the second plasmonic antenna 320 , the third plasmonic antenna 330 , and the fourth plasmonic antenna 340 , respectively, and the above-described principle. The current values flowing into the second plasma antenna 320 , the third plasma antenna 330 and the fourth plasma antenna 340 are individually controlled by the second plasma antenna 320 , the third plasma antenna 330 and the fourth plasma antenna 340 . Plasma Density. Furthermore, since the current value flowing into each plasma antenna 300 can be individually controlled, the ratio between the current values of each plasma antenna 300 that receives parallel power supply from the power supply unit 100 can be adjusted.

例如,在與第一等離子體天線310連接的第一迂回部410的第二路徑P2中包括2個迂回電路,在與第二等離子體天線320連接的第二迂回部420的第二路徑P2中包括3個迂回電路700,從而能夠使第一等離子體天線310的電流值的比例減少並使第二等離子體天線320的電流值的比例增加。或者,相反地,在與第一等離子體天線310連接的第一迂回部410的第二路徑P2中包括3個迂回電路,在與第二等離子體天線320連接的第二迂回部420的第二路徑P2中包括2個迂回電路,從而能夠使第一等離子體天線310的電流值的比例增加並使第二等離子體天線320的電流值的比例減少。For example, two detour circuits are included in the second path P2 of the first detour portion 410 connected to the first plasmonic antenna 310 , and two detour circuits are included in the second path P2 of the second detour portion 420 connected to the second plasmonic antenna 320 By including three detour circuits 700, the ratio of the current value of the first plasma antenna 310 can be decreased and the ratio of the current value of the second plasma antenna 320 can be increased. Or, conversely, three detour circuits are included in the second path P2 of the first detour portion 410 connected to the first plasmonic antenna 310 , and the second route P2 of the second detour portion 420 connected to the second plasmonic antenna 320 includes three detour circuits. The path P2 includes two detour circuits, so that the ratio of the current value of the first plasma antenna 310 can be increased and the ratio of the current value of the second plasma antenna 320 can be decreased.

作為又另一例示,在第一迂回部410中不生成第二路徑P2而在第二迂回部420中生成第二路徑P2,或者在第一迂回部410中生成第二路徑P2而在第二迂回部420中不生成第二路徑P2,從而能夠調節各個等離子體天線300的電流值的比例。As yet another example, the second path P2 is not generated in the first detour part 410 and the second path P2 is generated in the second detour part 420, or the second path P2 is generated in the first detour part 410 and the second path P2 is generated in the second detour part 410. Since the second path P2 is not generated in the detour portion 420 , the ratio of the current value of each plasma antenna 300 can be adjusted.

如此,各個等離子體天線300的電流值間的比例,隨著通過迂回部400調節第二路徑P2的長度,各個等離子體天線300的電阻值被調節,因此能夠調節向各個等離子體天線300流入的電流值的比例。In this way, the ratio between the current values of the respective plasma antennas 300 is adjusted as the length of the second path P2 is adjusted by the detour portion 400 , and the resistance value of the respective plasma antennas 300 is adjusted, so that the flow rate of the current flowing into the respective plasma antennas 300 can be adjusted. The ratio of the current value.

根據處理等離子體的環境條件,利用各個迂回部400來控制向各個等離子體天線300流入的電流值,從而單獨地調節通過各個等離子體天線300形成的等離子體的密度而能夠使得基板整體以相同的處理速度被處理。According to the environmental conditions for processing plasma, the current value flowing into each plasma antenna 300 is controlled by each detour portion 400, and the density of the plasma formed by each plasma antenna 300 can be adjusted individually, so that the entire substrate can be made to have the same value. Processing speed is processed.

在另一實施例中,第一迂回部410的第二接點520和第三接點530,以及第四接點540和第五接點550可以形成於相同的位置。例如,在第一迂回部410以線圈形狀形成的情況下,如圖2的(c)以及圖2的(d)所示,第二接點520和第三接點530,以及第四接點540和第五接點550可以形成於相同的位置。由於是這種結構,如圖2的(c)所示,第一路徑P1可以形成為第二基本電路620從第一基本電路610延伸,第三基本電路630從第二基本電路620延伸。另外,如圖2的(d)所示,第二路徑P2可以形成為第二迂回電路720從第一迂回電路710延伸,第三迂回電路730從第二迂回電路720延伸。In another embodiment, the second contact 520 and the third contact 530, and the fourth contact 540 and the fifth contact 550 of the first detour portion 410 may be formed at the same location. For example, when the first detour portion 410 is formed in a coil shape, as shown in FIG. 2( c ) and FIG. 2( d ), the second contact point 520 , the third contact point 530 , and the fourth contact point 540 and the fifth contact 550 may be formed at the same location. Due to this structure, as shown in FIG. 2( c ), the first path P1 can be formed such that the second basic circuit 620 extends from the first basic circuit 610 and the third basic circuit 630 extends from the second basic circuit 620 . In addition, as shown in FIG. 2( d ), the second path P2 may be formed such that the second detour circuit 720 extends from the first detour circuit 710 and the third detour circuit 730 extends from the second detour circuit 720 .

關於調節被連接的接點數量的方式,下面以第一迂回部410為基準並參照圖3至5來詳細說明,也可以適用於其它迂回部。The method of adjusting the number of contacts to be connected will be described in detail below with reference to the first detour portion 410 and with reference to FIGS. 3 to 5 , and it can also be applied to other detour portions.

圖3是示出根據本公開的一實施例以滑動方式連接迂回部400的多個接點的過程的例示圖。根據一實施例,迂回電路700構成為通過滑動方式的移送單元能夠移動而與包括在迂回部400中的各個接點連接。FIG. 3 is an illustration diagram illustrating a process of slidingly connecting a plurality of contacts of the detour portion 400 according to an embodiment of the present disclosure. According to an embodiment, the detour circuit 700 is configured to be connected to each contact included in the detour portion 400 by being movable by a sliding-type transfer unit.

根據一實施例,迂回電路700可以形成為板材形狀。迂回電路700可以形成有緊固孔H以與包括在迂回部400中的各個接點緊固。此時,各接點可以形成為能夠與圖6中示出的迂回電路700的緊固孔H緊固的形狀。According to an embodiment, the detour circuit 700 may be formed in a plate shape. The detour circuit 700 may be formed with fastening holes H to be fastened with respective contacts included in the detour part 400 . At this time, each contact may be formed in a shape that can be fastened to the fastening hole H of the detour circuit 700 shown in FIG. 6 .

第一接點510和第二接點520通過迂回電路700連接。由此,形成第一迂回電路710而能夠形成與第一路徑P1不同的第二路徑P2。如圖3的(a)所示,形成具有比曲線形態的第一基本電路610短的長度的第一迂回電路710,從而第二路徑P2的長度相比於第一路徑P1縮減,由此,第二路徑P2的電阻值縮減而經過迂回部400的電流沿著第二路徑P2。因此,由於通過電源供應部100提供的電壓相同,能夠增加向與相應迂回部400連接的等離子體天線流入的電流值。此時,可以是,第一路徑P1與第二路徑P2間的差異相當於第一基本電路610與第一迂回電路710間的差異而剩餘路徑相同。即,第一路徑P1與第二路徑P2間的差異相當於基本電路與對應於其而新生成的迂回電路間的長度差異,這種原理不僅可以適用於滑動方式,還可以適用於後述的升降方式、鉸鏈方式等各種方式。The first contact 510 and the second contact 520 are connected by a detour circuit 700 . Thereby, the first detour circuit 710 is formed, and the second path P2 different from the first path P1 can be formed. As shown in (a) of FIG. 3 , by forming the first detour circuit 710 having a length shorter than that of the first basic circuit 610 in the curved form, the length of the second path P2 is reduced compared to that of the first path P1, whereby, The resistance value of the second path P2 is reduced, and the current passing through the detour portion 400 follows the second path P2. Therefore, since the voltage supplied by the power supply part 100 is the same, the value of the current flowing into the plasma antenna connected to the corresponding detour part 400 can be increased. At this time, the difference between the first path P1 and the second path P2 may be equivalent to the difference between the first basic circuit 610 and the first detour circuit 710, and the remaining paths may be the same. That is, the difference between the first path P1 and the second path P2 corresponds to the difference in length between the basic circuit and the detour circuit newly generated corresponding to it, and this principle can be applied not only to the sliding method, but also to the later-described lifting and lowering method. method, hinge method, etc.

根據一實施例,迂回電路700可以構成為能夠向右側方向(圖中示出的箭頭方向)滑移。在這種結構中,如圖3的(b)所示,第二接點520和第三接點530通過迂回電路700附加連接而能夠從第一迂回電路710延伸形成第二迂回電路720。通過附加形成第二迂回電路720,相比於圖3的(a)中示出的第二路徑P2的長度,圖3的(b)中示出的第二路徑P2的長度能夠縮短第二迂回電路720與第二基本電路620的長度差量。因此,第二路徑P2的電阻值比圖3的(a)中示出的第二路徑P2進一步減少而能夠進一步增加向相應等離子體天線流入的電流值。According to an embodiment, the detour circuit 700 may be configured to be slidable in the right direction (the direction of the arrow shown in the figure). In this structure, as shown in FIG. 3( b ), the second contact 520 and the third contact 530 are additionally connected by the bypass circuit 700 to extend from the first bypass circuit 710 to form the second bypass circuit 720 . By additionally forming the second detour circuit 720 , the length of the second path P2 shown in FIG. 3( b ) can be shortened compared to the length of the second path P2 shown in FIG. 3( a ) The length difference between the circuit 720 and the second basic circuit 620 . Therefore, the resistance value of the second path P2 is further reduced than that of the second path P2 shown in FIG. 3( a ), so that the value of the current flowing into the corresponding plasma antenna can be further increased.

如圖3的(c)所示,第三接點530和第四接點540還通過迂回電路700連接,能夠從第二迂回電路720延伸而附加形成第三迂回電路730。由此,第二路徑P2以直線路徑形成而長度相比於第一路徑P1顯著縮減。因此,所形成的第二路徑P2的電阻值顯著縮減而在等離子體天線中流動的電流值能夠大幅增加。As shown in FIG. 3( c ), the third contact 530 and the fourth contact 540 are further connected by the detour circuit 700 , and the third detour circuit 730 can be additionally formed by extending from the second detour circuit 720 . Thus, the second path P2 is formed as a straight path and the length is significantly reduced compared to the first path P1. Therefore, the resistance value of the formed second path P2 can be significantly reduced and the current value flowing in the plasma antenna can be greatly increased.

如此,調節通過迂回電路700連接的接點的數量而能夠精密地控制向各個等離子體天線300流入的電流值,能夠控制通過各個等離子體天線300形成的等離子體密度。進而,通過將迂回電路700以簡單的物理形態實現,能夠穩定且精密地單獨控制高電壓的電流。In this way, by adjusting the number of contacts connected by the detour circuit 700 , the current value flowing into each plasma antenna 300 can be precisely controlled, and the plasma density formed by each plasma antenna 300 can be controlled. Furthermore, by realizing the detour circuit 700 in a simple physical form, the high-voltage current can be individually controlled stably and precisely.

圖4是示出根據公開的一實施例以升降方式連接迂回部400的多個接點的過程的例示圖。根據一實施例,迂回電路700通過升降方式的移送單元800構成為能夠移動而能夠連接包括在迂回部400中的各個接點。FIG. 4 is an illustrative diagram illustrating a process of connecting a plurality of contacts of the detour portion 400 in an ascending and descending manner according to an embodiment of the disclosure. According to an embodiment, the detour circuit 700 is configured so as to be movable by the lift-type transfer unit 800 so as to be able to connect the respective contacts included in the detour portion 400 .

迂回電路700通過移送單元800例如能夠向上下方向(圖中箭頭方向)移動。如圖4所示,第一迂回電路710通過移送單元800向上側方向移動而接觸於第一接點510以及第二接點520,從而能夠將第一接點510和第二接點520彼此連接。第二迂回電路720還通過移送單元800向下側方向移動而接觸於第三接點530以及第四接點540,從而能夠將第三接點530和第四接點540彼此連接。The detour circuit 700 can be moved, for example, in the up-down direction (in the direction of the arrow in the figure) by the transfer unit 800 . As shown in FIG. 4 , when the transfer unit 800 moves upward, the first detour circuit 710 comes into contact with the first contact 510 and the second contact 520 , so that the first contact 510 and the second contact 520 can be connected to each other. . The second detour circuit 720 also comes into contact with the third contact 530 and the fourth contact 540 when the transfer unit 800 moves in the downward direction, so that the third contact 530 and the fourth contact 540 can be connected to each other.

構成為通過移送單元800能夠單獨移動迂回電路700,從而能夠僅將希望的任意位置的接點彼此連接,能夠使得經迂回部400流動的電流沿通過迂回電路700形成的第二路徑P2流動。因此,能夠更精密地控制向各個等離子體天線300流入的電流值。The detour circuit 700 can be moved independently by the transfer unit 800 , so that only contacts at desired arbitrary positions can be connected to each other, and the current flowing through the detour portion 400 can flow along the second path P2 formed by the detour circuit 700 . Therefore, the current value flowing into each plasma antenna 300 can be controlled more precisely.

圖5是示出根據本公開的一實施例以鉸鏈方式連接迂回部400的多個接點的過程的例示圖。根據一實施例,迂回電路700構成為利用鉸鏈方式的移送單元而能夠移動,從而能夠連接包括在迂回部400中的各個接點。FIG. 5 is an illustration diagram illustrating a process of hingedly connecting a plurality of contacts of the detour portion 400 according to an embodiment of the present disclosure. According to an embodiment, the detour circuit 700 is configured to be movable by a hinge-type transfer unit, so that each contact included in the detour portion 400 can be connected.

根據一實施例,迂回電路700構成為能夠旋轉而能夠連接包括在迂回部400中的各個接點。例如,迂回電路700可以形成為能夠以鉸鏈方式與迂回部400緊固的板材形狀,並構成為能夠將以鉸鏈方式緊固部分的中心點作為基準進行旋轉。此時,迂回電路700可以如圖6所示那樣形成緊固孔H以能夠與包括在迂回部400中的各個接點緊固。如圖5所示,第一迂回電路710與第一接點510連接並以第一接點510為中心向上側方向旋轉,從而能夠將第一接點510和第二接點520彼此連接並將第三接點530和第四接點540彼此連接,能夠形成第二路徑P2。另外,第二迂回電路720與第六接點560連接並以第六接點560為中心向上側方向旋轉而接觸於第五接點550,從而能夠將第五接點550和第六接點560彼此連接。According to an embodiment, the detour circuit 700 is configured to be rotatable and connectable to the respective contacts included in the detour portion 400 . For example, the detour circuit 700 may be formed in a plate shape that can be hingedly fastened to the detour portion 400 , and may be configured to be rotatable with reference to the center point of the hinged portion. At this time, the detour circuit 700 may be formed with fastening holes H as shown in FIG. 6 so as to be able to be fastened to the respective contacts included in the detour portion 400 . As shown in FIG. 5 , the first detour circuit 710 is connected to the first contact 510 and is rotated upward with the first contact 510 as the center, so that the first contact 510 and the second contact 520 can be connected to each other and The third contact point 530 and the fourth contact point 540 are connected to each other, and the second path P2 can be formed. In addition, the second detour circuit 720 is connected to the sixth contact 560 and is rotated upward about the sixth contact 560 to contact the fifth contact 550 , so that the fifth contact 550 and the sixth contact 560 can be connected. connected to each other.

圖6是示出與本公開的一實施例的等離子體天線模組所具備的第一等離子體天線310以及第一等離子體天線310連接的主要構件的立體圖。根據一實施例,第一等離子體天線310可以構成為與圓形類似的形態,第一等離子體天線310可以是一側與電源供應部100連接,另一側與第一接地部210連接。FIG. 6 is a perspective view showing a first plasma antenna 310 and main components connected to the first plasma antenna 310 included in the plasma antenna module according to an embodiment of the present disclosure. According to an embodiment, the first plasma antenna 310 may be formed in a shape similar to a circle, and one side of the first plasma antenna 310 may be connected to the power supply portion 100 and the other side to the first ground portion 210 .

第一迂回部410可以介於第一等離子體天線310和第一接地部210之間。如圖6所示,第一迂回部410可以是在相同面積下能夠確保最大限度長度的線圈形狀。在如此具有線圈形態的情況下,具有在利用迂回電路700時能夠顯著縮短電路長度的效果。The first detour part 410 may be interposed between the first plasma antenna 310 and the first ground part 210 . As shown in FIG. 6 , the first detour portion 410 may have a coil shape that can ensure the maximum length within the same area. In the case of having the coil form as described above, there is an effect that the circuit length can be significantly shortened when the detour circuit 700 is used.

迂回電路700可以形成為板材形狀,並形成有緊固孔H而能夠與位於第一路徑P1,即線圈形狀的接點500緊固,如圖6所示,接點500可以包括多個。此時,第一迂回部410的各接點可以具有被與迂回電路700的緊固孔H緊固的形狀。例如,如圖6所示,各接點可以具有在內部形成有螺紋的凸起形狀,以能夠與經緊固孔H插入的螺絲緊固。The detour circuit 700 may be formed in the shape of a plate, and the fastening hole H may be formed to be fastened to the first path P1, that is, the coil-shaped contact 500. As shown in FIG. 6, the contact 500 may include a plurality of contacts. At this time, each contact of the first detour portion 410 may have a shape that is fastened to the fastening hole H of the detour circuit 700 . For example, as shown in FIG. 6 , each contact may have a convex shape with a thread formed therein so as to be able to be fastened with a screw inserted through the fastening hole H. As shown in FIG.

通過調整利用迂回電路700連接的接點的數量,能夠控制向第一等離子體天線310流入的電流值,能夠控制通過第一等離子體天線310形成的等離子體密度。以上僅說明了等離子體天線模組的第一等離子體天線310以及與其連接的主要部分,但是等離子體天線模組所具備的剩餘等離子體天線320、330、340可以具有與第一等離子體天線310以及與其連接的主要部分相同的結構,能夠通過與各個等離子體天線320、330、340連接的各個迂回部420、430、440來控制各等離子體天線320、330、340的電流。By adjusting the number of contacts connected by the detour circuit 700 , the value of the current flowing into the first plasma antenna 310 can be controlled, and the plasma density formed by the first plasma antenna 310 can be controlled. The above only describes the first plasma antenna 310 of the plasma antenna module and the main parts connected thereto, but the remaining plasma antennas 320 , 330 and 340 of the plasma antenna module may have the same configuration as the first plasma antenna 310 . The configuration of the main parts connected thereto is the same, and the currents of the plasma antennas 320 , 330 , and 340 can be controlled by the detours 420 , 430 , and 440 connected to the plasma antennas 320 , 330 , and 340 .

圖7是示出本公開的一實施例的迂回部400的立體圖。根據一實施例,迂回部400可以形成為線圈形狀。如圖7所示,迂回部例如可以是各個基本電路延伸形成並具有4次轉(turn)數的螺旋形的線圈形狀。此時,迂回部400可以構成為包括位於第一路徑P1上的多個接點。FIG. 7 is a perspective view illustrating a detour portion 400 according to an embodiment of the present disclosure. According to an embodiment, the detour portion 400 may be formed in a coil shape. As shown in FIG. 7 , the detour portion may be, for example, a spiral coil shape formed by extending each basic circuit and having a number of turns of 4 times. At this time, the detour portion 400 may be configured to include a plurality of contacts located on the first path P1.

在一實施例中,多個接點可以在各個繞線的每個形成各一個而位於相同線上。例如,如圖7所示,多個接點可以以凸起形狀形成4個接點510、520、530、540。In one embodiment, a plurality of contacts may be formed one on each of the individual windings on the same line. For example, as shown in FIG. 7, a plurality of contacts may form four contacts 510, 520, 530, 540 in a convex shape.

圖8是示出本公開的一實施例的第一接點510和第二接點520連接的例子的立體圖,圖9是示出本公開的一實施例的第一接點510、第二接點520以及第三接點530連接的例子的立體圖,圖10是示出本公開的一實施例的第一接點510、第二接點520、第三接點530以及第四接點540連接的例子的立體圖。FIG. 8 is a perspective view showing an example of connection between the first contact 510 and the second contact 520 according to an embodiment of the present disclosure, and FIG. 9 is a perspective view showing the first contact 510 and the second contact according to an embodiment of the present disclosure. A perspective view of an example of the connection between the point 520 and the third contact point 530 , FIG. 10 is a diagram showing the connection of the first contact point 510 , the second contact point 520 , the third contact point 530 and the fourth contact point 540 according to an embodiment of the present disclosure A perspective view of an example.

如圖8所示,迂回電路700可以是板材形狀,並可以形成多個緊固孔H以能夠與多個接點500緊固。在此,緊固孔H可以形成與接點的數量相同數的量以能夠與多個接點500緊固。如圖8所示,第一接點510、第二接點520、第三接點530以及第四接點540可以形成4個緊固孔以能夠與經各個緊固孔H插入的螺絲緊固。在迂回部400形成的多個接點500可以具有與迂回電路700的緊固孔H緊固的形狀。例如,如圖所示,各個接點500可以具有形成有螺紋的凸起形狀以能夠與經各個緊固孔H插入的螺絲緊固。As shown in FIG. 8 , the detour circuit 700 may be in the shape of a plate, and a plurality of fastening holes H may be formed so as to be able to be fastened to the plurality of contacts 500 . Here, the fastening holes H may be formed in the same number as the number of contacts so as to be able to be fastened to the plurality of contacts 500 . As shown in FIG. 8 , the first contact 510 , the second contact 520 , the third contact 530 and the fourth contact 540 may form four fastening holes so as to be fastened with screws inserted through the respective fastening holes H . The plurality of contacts 500 formed in the detour portion 400 may have a shape to be fastened to the fastening hole H of the detour circuit 700 . For example, each of the contacts 500 may have a convex shape formed with threads to be able to be fastened with a screw inserted through each of the fastening holes H, as shown.

向各個等離子體天線300流入的電流值可以根據包括在第二路徑P2中的接點的數量來控制。通過迂回電路700的緊固孔H而連接第一接點510和第二接點520,從而能夠如圖8所示那樣形成第一迂回電路710且形成與第一路徑P1不同的第二路徑P2。在此情況下,第二路徑P2的長度比轉(turn)4次的第一路徑P1縮短轉(turn)1次的量,向迂回部流入的電流能夠沿第二路徑P2僅轉(turn)3次來流動。因此,向等離子體天線流入的電流的值能夠增加。The value of the current flowing into each plasma antenna 300 can be controlled according to the number of contacts included in the second path P2. By connecting the first contact point 510 and the second contact point 520 through the fastening hole H of the bypass circuit 700, as shown in FIG. 8, the first bypass circuit 710 can be formed and the second path P2 different from the first path P1 can be formed . In this case, the length of the second path P2 is shorter than that of the first path P1, which is turned four times, by one turn, and the current flowing into the detour portion can be turned only along the second path P2. 3 times to flow. Therefore, the value of the current flowing into the plasma antenna can be increased.

為了進一步增加電流的值,如圖9所示,可以通過迂回電路700將第二接點520和第三接點530附加連接。若通過迂回電路700連接第二接點520和第三接點530,則能夠附加形成第二迂回電路720。在此情況下,與第一路徑P1相比,第二路徑P2的長度縮短轉(turn)2次的量,向迂回部流入的電流沿第二路徑P2轉(turn)2次來流動而電流的值能夠進一步增加。In order to further increase the value of the current, as shown in FIG. 9 , the second contact 520 and the third contact 530 may be additionally connected through a detour circuit 700 . If the second contact 520 and the third contact 530 are connected by the bypass circuit 700, the second bypass circuit 720 can be additionally formed. In this case, the length of the second path P2 is shortened by the amount of two turns compared to the first path P1, and the current flowing into the detour portion flows twice along the second path P2, and the current flows. can be further increased.

如圖10所示,第三接點530和第四接點540還附加連接而附加形成第三迂回電路730,從而能夠使電流的值增加。此時,電流沿第二路徑P2僅轉(turn)1次來流動,與圖8以及圖9的實施例相比,電流的值能夠更進一步增加。As shown in FIG. 10 , the third contact point 530 and the fourth contact point 540 are additionally connected to form a third detour circuit 730 , so that the value of the current can be increased. At this time, the current flows only one turn along the second path P2 , and the value of the current can be further increased compared to the embodiments of FIGS. 8 and 9 .

如此,利用簡單的結構來調節線圈轉(turn)數而能夠控制向各個等離子體天線300流入的電流。In this way, the electric current flowing into each plasma antenna 300 can be controlled by adjusting the number of turns of the coil with a simple structure.

圖11是示出本公開的另一實施例的迂回部400的例示圖。根據一實施例,迂回部400可以構成為具備多個線圈形狀。例如,如圖11所示,迂回部400可以是2個線圈1110、1120彼此以一定間隔隔開來形成。通過將多個線圈形狀彼此隔開來形成迂回部400,能夠調節更多數的線圈轉(turn)數。因此,能夠進一步精密地控制等離子體密度。FIG. 11 is an illustration diagram showing a detour portion 400 of another embodiment of the present disclosure. According to an embodiment, the detour portion 400 may be configured to have a plurality of coil shapes. For example, as shown in FIG. 11 , the detour portion 400 may be formed by two coils 1110 and 1120 being spaced apart from each other. By forming the detour portion 400 by separating a plurality of coil shapes from each other, a larger number of coil turns can be adjusted. Therefore, the plasma density can be controlled more precisely.

圖12是本公開的另一實施例的等離子體天線模組的概要圖。根據一實施例,迂回部400可以介於各個等離子體天線300和與其並列電連接的電源供應部100之間。如圖12所示,第一迂回部410可以介於第一等離子體天線310和電源供應部100之間,第二迂回部420可以介於第二等離子體天線320和電源供應部100之間。另外,第三迂回部430可以介於第三等離子體天線330和電源供應部100之間,第四迂回部440可以介於第四等離子體天線340和電源供應部100之間。如圖1以及圖12所示,各個等離子體天線可以具有彼此不同直徑的圓形並佈置於相同平面上,這種等離子體天線的佈置可以適合於CCP(電容耦合等離子體源,Capacitively Coupled Plasma)型。12 is a schematic diagram of a plasma antenna module according to another embodiment of the present disclosure. According to an embodiment, the detour portion 400 may be interposed between each of the plasma antennas 300 and the power supply portion 100 electrically connected in parallel therewith. As shown in FIG. 12 , the first detour portion 410 may be interposed between the first plasma antenna 310 and the power supply portion 100 , and the second detour portion 420 may be interposed between the second plasma antenna 320 and the power supply portion 100 . In addition, the third detour portion 430 may be interposed between the third plasma antenna 330 and the power supply portion 100 , and the fourth detour portion 440 may be interposed between the fourth plasma antenna 340 and the power supply portion 100 . As shown in FIG. 1 and FIG. 12 , each plasma antenna may have circular shapes with different diameters and be arranged on the same plane, and the arrangement of the plasma antenna may be suitable for CCP (Capacitively Coupled Plasma). type.

圖13是本公開的又另一實施例的等離子體天線模組的概要圖。根據一實施例,等離子體天線模組可以是一個以上的等離子體天線310、320佈置於腔室的側面來構成。如圖13所示,等離子體天線模組可以包括第一等離子體天線310以及第二等離子體天線320,各個等離子體天線310、320可以彼此以一定間隔上下隔開而佈置於腔室的側面。例如,第一等離子體天線310可以位於第二等離子體天線320的上側。通過將等離子體天線310、320佈置於腔室的側面,能夠向基板提供高強度的等離子體。這種等離子體天線的佈置可以適合於ICP(感應耦合等離子體源,Inductively Coupled Plasma)型。13 is a schematic diagram of a plasma antenna module according to yet another embodiment of the present disclosure. According to an embodiment, the plasma antenna module may be formed by arranging more than one plasma antenna 310 and 320 on the side of the chamber. As shown in FIG. 13 , the plasma antenna module may include a first plasma antenna 310 and a second plasma antenna 320 , and the plasma antennas 310 and 320 may be spaced up and down with a certain interval from each other and arranged on the side of the chamber. For example, the first plasma antenna 310 may be located on the upper side of the second plasma antenna 320 . By arranging the plasma antennas 310, 320 on the sides of the chamber, high-intensity plasma can be supplied to the substrate. This plasma antenna arrangement may be suitable for ICP (Inductively Coupled Plasma) type.

圖14是本公開的一實施例的等離子體天線的俯視圖。各個等離子體天線300可以形成將基板用等離子體進行處理的區域即第一處理區域1410、第二處理區域1420、第三處理區域1430、第四處理區域1440。在此,為了形成各處理區域,第一等離子體天線310、第二等離子體天線320、第三等離子體天線330以及第四等離子體天線340可以佈置於各個處理區域內。各個處理區域可以對應於佈置有各個等離子體天線300的位置來形成,但不限於此。14 is a top view of a plasma antenna according to an embodiment of the present disclosure. Each of the plasma antennas 300 may form a first processing area 1410 , a second processing area 1420 , a third processing area 1430 , and a fourth processing area 1440 , which are areas for processing the substrate with plasma. Here, in order to form each processing area, the first plasma antenna 310 , the second plasma antenna 320 , the third plasma antenna 330 , and the fourth plasma antenna 340 may be arranged in each processing area. The respective processing regions may be formed corresponding to the positions where the respective plasma antennas 300 are arranged, but are not limited thereto.

根據一實施例,如圖14的(a)所示,第一處理區域1410可以位於基板的內側。第二處理區域1420、第三處理區域1430以及第四處理區域1440可以位於基板的外側,並可以均等分割基板的外側。此時,各處理區域可以彼此局部重疊。According to an embodiment, as shown in (a) of FIG. 14 , the first processing area 1410 may be located inside the substrate. The second processing area 1420, the third processing area 1430, and the fourth processing area 1440 may be located outside the substrate, and the outside of the substrate may be equally divided. At this time, the respective processing regions may partially overlap each other.

通過與各個等離子體天線300連接的各個迂回部400而能夠調節各個等離子體天線300的電流值,能夠調節通過電流值分別形成的等離子體的密度。各個等離子體天線300進行處理的處理區域可以根據各個等離子體天線300的形狀而不同。The current value of each plasma antenna 300 can be adjusted by each detour portion 400 connected to each plasma antenna 300, and the density of plasma formed by the current value can be adjusted. The processing region processed by each plasma antenna 300 may vary according to the shape of each plasma antenna 300 .

根據另一實施例,如圖14的(b)所示,第一處理區域1410可以通過第一等離子體天線310位於最內側來形成,第二處理區域1420可以通過第二等離子體天線320位於第一處理區域1410的外側來形成。另外,可以是,第三處理區域1430通過第三等離子體天線330形成於第二處理區域1420的外側,第四處理區域1440通過第四等離子體天線340形成於第三處理區域1430的外側。此時,各處理區域可以彼此局部重疊。根據各個等離子體天線300所形成的形狀,在基板進行處理的處理領域可以以各種圖案形成,等離子體密度也可以以各種圖案形成。According to another embodiment, as shown in (b) of FIG. 14 , the first processing area 1410 may be formed by the first plasma antenna 310 being positioned at the innermost side, and the second processing area 1420 may be formed by the second plasma antenna 320 being positioned at the first A processing area 1410 is formed outside. In addition, the third processing area 1430 may be formed outside the second processing area 1420 through the third plasma antenna 330 , and the fourth processing area 1440 may be formed outside the third processing area 1430 through the fourth plasma antenna 340 . At this time, the respective processing regions may partially overlap each other. Depending on the shape formed by each of the plasma antennas 300 , various patterns may be formed in the processing field in which the substrate is processed, and the plasma density may be formed in various patterns.

根據一實施例,可以將與各個等離子體天線300連接的迂回部400中被連接的接點的數量、根據被連接的接點的數量向相應等離子體天線流入的電流值、根據被連接的接點的數量通過各個等離子體天線300形成的等離子體密度以及基板的處理狀態彼此建立對應關係並將與其相關的資訊存儲於存儲介質。控制部基於存儲於存儲介質的資料並根據基板的變更、外部環境的變化等需要而利用移送單元單獨調節各個迂回部400中被連接的接點的數量,從而單獨控制通過各個等離子體天線300形成的等離子體密度而能夠精密地控制基板整體的處理狀態。According to an embodiment, the number of connected contacts in the detour portion 400 connected to each plasma antenna 300 , the current value flowing into the corresponding plasma antenna according to the number of the connected contacts, and the number of connected contacts can be determined. The number of dots establishes a corresponding relationship with each other through the plasma density formed by each plasma antenna 300 and the processing state of the substrate, and the related information is stored in the storage medium. The control unit uses the transfer unit to individually adjust the number of contacts to be connected in each detour unit 400 based on the data stored in the storage medium and according to needs such as changes in the substrate, changes in the external environment, etc., so as to individually control the formation of the plasma antennas 300. The plasma density of the whole substrate can be precisely controlled.

上述的本發明的優選實施例以例示的目的公開,具有通常知識的本領域技術人員可以在本發明的構思和範圍內對本發明進行各種修改、變更以及附加,應視為這樣的修改、變更以及附加屬於所述的權利要求書範圍內。The above-mentioned preferred embodiments of the present invention are disclosed for the purpose of illustration, and those skilled in the art with ordinary knowledge can make various modifications, changes and additions to the present invention within the spirit and scope of the present invention, and should be regarded as such modifications, changes and additions. Additional are within the scope of the stated claims.

在本發明所屬技術領域中具有通常知識的人員可以在不脫離本發明的技術構思的範圍內進行各種替換、變形以及變更,因此本發明並不限於前述的實施例以及附圖。Those with ordinary knowledge in the technical field to which the present invention pertains can make various replacements, modifications, and changes within the scope of the technical idea of the present invention, so the present invention is not limited to the foregoing embodiments and drawings.

100:電源供應部 200:接地部 210:第一接地部 220:第二接地部 230:第三接地部 240:第四接地部 300:等離子體天線 310:第一等離子體天線 320:第二等離子體天線 330:第三等離子體天線 340:第四等離子體天線 400:迂回部 410:第一迂回部 420:第二迂回部 430:第三迂回部 440:第四迂回部 500:接點 510:第一接點 520:第二接點 530:第三接點 540:第四接點 550:第五接點 560:第六接點 600:基本電路 610:第一基本電路 620:第二基本電路 630:第三基本電路 700:迂回電路 710:第一迂回電路 720:第二迂回電路 730:第三迂回電路 800:移送單元 1110、1120:線圈 1410:第一處理區域 1420:第二處理區域 1430:第三處理區域 1440:第四處理區域 P1:第一路徑 P2:第二路徑 H:緊固孔100: Power Supply Department 200: Ground 210: First ground 220: Second ground 230: The third ground 240: Fourth ground 300: Plasma Antenna 310: First Plasma Antenna 320: Second Plasma Antenna 330: Third Plasma Antenna 340: Fourth Plasma Antenna 400: Detour 410: First Detour 420: Second Detour 430: The Third Detour 440: Fourth Detour 500: Contact 510: First Contact 520: Second Contact 530: Third Contact 540: Fourth Contact 550: Fifth Contact 560: Sixth Contact 600: Basic Circuits 610: First Basic Circuit 620: Second Basic Circuit 630: Third Basic Circuit 700: Detour circuit 710: First Detour Circuit 720: Second Detour Circuit 730: Third Detour Circuit 800: Transfer unit 1110, 1120: Coil 1410: First processing area 1420: Second processing area 1430: Third processing area 1440: Fourth processing area P1: first path P2: Second Path H: Fastening hole

本公開的實施例將參照以下說明的附圖而進行說明,在此,類似的附圖標記表示類似的要件,但不限於此。Embodiments of the present disclosure will be described with reference to the accompanying drawings described below, wherein like reference numerals denote like elements, but are not limited thereto.

圖1是根據本公開的一實施例設置於腔室的等離子體天線模組的概要圖。FIG. 1 is a schematic diagram of a plasma antenna module disposed in a chamber according to an embodiment of the present disclosure.

圖2是示出根據本公開的一實施例在迂回部形成的第一路徑以及第二路徑的例示圖。FIG. 2 is a diagram illustrating a first path and a second path formed in a detour according to an embodiment of the present disclosure.

圖3是示出根據本公開的一實施例以滑動方式連接迂回部的多個接點的過程的例示圖。FIG. 3 is a diagram illustrating a process of slidingly connecting a plurality of contacts of a detour portion according to an embodiment of the present disclosure.

圖4是示出根據本公開的一實施例以升降方式連接迂回部的多個接點的過程的例示圖。FIG. 4 is a diagram illustrating a process of connecting a plurality of contacts of a detour portion in an ascending and descending manner according to an embodiment of the present disclosure.

圖5是示出根據本公開的一實施例以鉸鏈方式連接迂回部的多個接點的過程的例示圖。5 is an illustration diagram illustrating a process of hingedly connecting a plurality of joints of a detour according to an embodiment of the present disclosure.

圖6是示出與本公開的一實施例的等離子體天線模組所具備的第一等離子體天線以及第一等離子體天線連接的主要構件的立體圖。6 is a perspective view showing a first plasma antenna and main components connected to the first plasma antenna included in the plasma antenna module according to the embodiment of the present disclosure.

圖7是示出本公開的一實施例的迂回部的立體圖。FIG. 7 is a perspective view showing a detour portion of an embodiment of the present disclosure.

圖8是示出本公開的一實施例的第一接點和第二接點連接的例子的立體圖。8 is a perspective view showing an example of connection of a first contact and a second contact according to an embodiment of the present disclosure.

圖9是示出本公開的一實施例的第一接點、第二接點和第三接點連接的例子的立體圖。9 is a perspective view showing an example of connection of the first contact, the second contact, and the third contact according to an embodiment of the present disclosure.

圖10是示出本公開的一實施例的第一接點、第二接點、第三接點和第四接點連接的例子的立體圖。10 is a perspective view showing an example of connection of the first contact, the second contact, the third contact, and the fourth contact according to an embodiment of the present disclosure.

圖11是示出本公開的另一實施例的迂回部的例示圖。FIG. 11 is an illustration diagram showing a detour of another embodiment of the present disclosure.

圖12是本公開的另一實施例的等離子體天線模組的概要圖。12 is a schematic diagram of a plasma antenna module according to another embodiment of the present disclosure.

圖13是本公開的又另一實施例的等離子體天線模組的概要圖。13 is a schematic diagram of a plasma antenna module according to yet another embodiment of the present disclosure.

圖14是本公開的一實施例的等離子體天線的俯視圖。14 is a top view of a plasma antenna according to an embodiment of the present disclosure.

100:電源供應部100: Power Supply Department

200:接地部200: Ground

210:第一接地部210: First ground

220:第二接地部220: Second ground

230:第三接地部230: The third ground

240:第四接地部240: Fourth ground

300:等離子體天線300: Plasma Antenna

310:第一等離子體天線310: First Plasma Antenna

320:第二等離子體天線320: Second Plasma Antenna

330:第三等離子體天線330: Third Plasma Antenna

340:第四等離子體天線340: Fourth Plasma Antenna

400:迂回部400: Detour

410:第一迂回部410: First Detour

420:第二迂回部420: Second Detour

430:第三迂回部430: The Third Detour

440:第四迂回部440: Fourth Detour

Claims (21)

一種等離子體天線模組,包括:等離子體天線;接地部,電連接於所述等離子體天線的一側;電源供應部,向所述等離子體天線的另一側供應電源;以及迂回部,介於所述等離子體天線和所述電源供應部之間或者所述等離子體天線和所述接地部之間,所述迂回部包括位於第一路徑上的彼此連接的多個接點,在所述多個接點中2個以上的接點附加地彼此連接的情況下,所述迂回部形成與所述第一路徑不同的第二路徑,所述迂回部根據包括在所述第二路徑中的接點的數量,控制向所述等離子體天線流入的電流值。 A plasma antenna module, comprising: a plasma antenna; a grounding part, electrically connected to one side of the plasma antenna; a power supply part, supplying power to the other side of the plasma antenna; Between the plasma antenna and the power supply portion or between the plasma antenna and the ground portion, the detour portion includes a plurality of contacts connected to each other on a first path, and the detour portion is located on a first path. When two or more contacts among the plurality of contacts are additionally connected to each other, the detour portion forms a second path different from the first path, and the detour portion forms a second path according to the The number of contacts controls the value of the current flowing into the plasma antenna. 一種等離子體天線模組,包括:第一等離子體天線;接地部,電連接於所述第一等離子體天線的一側;電源供應部,向所述第一等離子體天線的另一側供應電源;以及迂回部,介於所述第一等離子體天線和所述電源供應部之間或者所述第一等離子體天線和所述接地部之間,所述迂回部包括位於第一路徑上的彼此連接的多個接點,在所述多個接點中2個以上的接點附加地彼此連接的情況下,所述迂回部形成具有比所述第一路徑短的長度的第二路徑來控制向所述第一等離子體天線流入的電流值。 A plasma antenna module, comprising: a first plasma antenna; a ground portion electrically connected to one side of the first plasma antenna; a power supply portion for supplying power to the other side of the first plasma antenna ; and a detour portion, interposed between the first plasma antenna and the power supply portion or between the first plasma antenna and the ground portion, the detour portions including each other on the first path In the case where two or more of the connected contacts are additionally connected to each other, the detour portion forms a second path having a length shorter than the first path to control the The value of the current flowing into the first plasma antenna. 如請求項2所述的等離子體天線模組,其中,所述等離子體天線模組還包括:第二等離子體天線,與所述第一等離子體天線隔開設置,所述電源供應部向所述第一等離子體天線以及所述第二等離子體天線並列供應電源,通過所述第一等離子體天線的所述第二路徑,調節所述第一等離子體天線的電流值與所述第二等離子體天線的電流值間的比例。 The plasma antenna module according to claim 2, wherein the plasma antenna module further comprises: a second plasma antenna, which is arranged apart from the first plasma antenna, and the power supply part is directed to the The first plasma antenna and the second plasma antenna are supplied with power in parallel, and the current value of the first plasma antenna and the second plasma antenna are adjusted through the second path of the first plasma antenna. The ratio between the current values of the bulk antenna. 一種等離子體天線模組,包括:第一等離子體天線;第一接地部,電連接於所述第一等離子體天線的一側;電源供應部,向所述第一等離子體天線的另一側供應電源;以及第一迂回部,介於所述第一等離子體天線和所述電源供應部之間或者所述第一等離子體天線和所述第一接地部之間,所述第一迂回部包括:第一接點,位於第一路徑上;第二接點,與所述第一接點隔開而位於所述第一路徑上;第一基本電路,通過所述第一接點和所述第二接點彼此連接來形成,並包括在所述第一路徑中;以及第一迂回電路,將所述第一接點和所述第二接點附加地彼此連接來形成,並包括在與所述第一路徑不同的第二路徑中,所述第一迂回電路具有比第一基本電路短的長度,從而控制向所述第一等離子體天線流入的電流值。 A plasma antenna module, comprising: a first plasma antenna; a first ground portion electrically connected to one side of the first plasma antenna; and a power supply portion connected to the other side of the first plasma antenna supplying power; and a first detour portion interposed between the first plasma antenna and the power supply portion or between the first plasma antenna and the first ground portion, the first detour portion Including: a first contact, located on the first path; a second contact, separated from the first contact and located on the first path; a first basic circuit, through the first contact and all the second contacts are formed by being connected to each other and are included in the first path; and a first detour circuit is formed by additionally connecting the first contacts and the second contacts to each other and is included in the In the second path different from the first path, the first detour circuit has a length shorter than that of the first basic circuit, thereby controlling the value of the current flowing into the first plasma antenna. 如請求項4所述的等離子體天線模組,其中,所述第一迂回部還包括:第三接點,位於所述第一路徑上;第四接點,與所述第三接點隔開而位於所述第一路徑上;第二基本電路,將所述第三接點和所述第四接點彼此連接來形成,並包括在所述第一路徑中;以及第二迂回電路,將所述第三接點和所述第四接點彼此連接來形成,並包括在所述第二路徑中,所述第二迂回電路具有比所述第二基本電路短的長度。 The plasma antenna module according to claim 4, wherein the first detour part further comprises: a third contact located on the first path; a fourth contact separated from the third contact open and located on the first path; a second basic circuit formed by connecting the third contact and the fourth contact to each other and included in the first path; and a second detour circuit, The third contact and the fourth contact are formed by connecting each other and included in the second path, and the second detour circuit has a length shorter than that of the second basic circuit. 如請求項5所述的等離子體天線模組,其中,所述第二接點和所述第三接點形成於相同的位置。 The plasma antenna module of claim 5, wherein the second contact and the third contact are formed at the same position. 如請求項5所述的等離子體天線模組,其中,所述第二迂回電路從所述第一迂回電路延伸,所述第一迂回電路以及所述第二迂回電路形成為板材形狀,在所述第一迂回電路以及所述第二迂回電路中形成能夠與所述第一接點、所述第二接點、所述第三接點以及所述第四接點緊固的緊固孔。 The plasma antenna module according to claim 5, wherein the second detour circuit extends from the first detour circuit, the first detour circuit and the second detour circuit are formed in the shape of a plate, and the Fastening holes that can be fastened to the first contact, the second contact, the third contact, and the fourth contact are formed in the first and second bypass circuits. 如請求項5所述的等離子體天線模組,其中,所述第二基本電路從所述第一基本電路延伸,所述第一基本電路以及所述第二基本電路形成為線圈形狀。 The plasma antenna module of claim 5, wherein the second base circuit extends from the first base circuit, and the first base circuit and the second base circuit are formed in a coil shape. 如請求項5或8所述的等離子體天線模組,其中, 所述第一迂回部介於所述第一等離子體天線和所述電源供應部之間或者所述第一等離子體天線和所述第一接地部之間,並彼此隔開來形成多個。 The plasma antenna module according to claim 5 or 8, wherein, The first detour portions are interposed between the first plasma antenna and the power supply portion or between the first plasma antenna and the first ground portion, and are separated from each other to form a plurality of portions. 如請求項4所述的等離子體天線模組,其中,所述等離子體天線模組還包括:第二等離子體天線,與所述第一等離子體天線隔開設置;第二接地部,電連接於所述第二等離子體天線的一側;以及第二迂回部,介於所述第二等離子體天線和所述電源供應部之間或者所述第二等離子體天線和所述第二接地部之間,所述電源供應部向所述第一等離子體天線的另一側以及所述第二等離子體天線的另一側並列供應電源,在所述第二迂回部包括位於第一路徑上的多個接點,並且所述多個接點中2個以上的接點附加地彼此連接的情況下,形成具有比所述第一路徑短的長度的第二路徑。 The plasma antenna module according to claim 4, wherein the plasma antenna module further comprises: a second plasma antenna, which is arranged apart from the first plasma antenna; and a second ground portion, which is electrically connected on one side of the second plasma antenna; and a second detour part, interposed between the second plasma antenna and the power supply part or the second plasma antenna and the second ground part the power supply part supplies power to the other side of the first plasma antenna and the other side of the second plasma antenna in parallel, and the second detour part includes a power supply located on the first path When a plurality of contacts are additionally connected to each other among the plurality of contacts, a second path having a length shorter than that of the first path is formed. 如請求項10所述的等離子體天線模組,其中,所述第一等離子體天線位於所述第二等離子體天線的內側。 The plasma antenna module of claim 10, wherein the first plasma antenna is located inside the second plasma antenna. 如請求項10所述的等離子體天線模組,其中,所述第一等離子體天線位於所述第二等離子體天線的上側。 The plasma antenna module of claim 10, wherein the first plasma antenna is located on the upper side of the second plasma antenna. 如請求項10所述的等離子體天線模組,其中,所述等離子體天線模組還包括:第三等離子體天線;第三接地部,電連接於所述第三等離子體天線的一側; 第三迂回部,介於所述第三等離子體天線和所述電源供應部之間或者所述第三等離子體天線和所述第三接地部之間;第四等離子體天線;第四接地部,電連接於所述第四等離子體天線的一側;第四迂回部,介於所述第四等離子體天線和所述電源供應部之間或者所述第四等離子體天線和所述第四接地部之間,所述第一等離子體天線、所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線彼此隔開設置,所述電源供應部向所述第一等離子體天線的另一側、所述第二等離子體天線的另一側、所述第三等離子體天線的另一側以及所述第四等離子體天線的另一側並列供應電源,所述第三迂回部包括位於第一路徑上的多個接點,並在所述第三迂回部的所述多個接點中2個以上的接點附加地彼此連接的情況下形成具有比所述第一路徑短的長度第二路徑,所述第四迂回部包括位於第一路徑上的多個接點,並在所述第四迂回部的所述多個接點中2個以上的接點附加地彼此連接的情況下形成具有比所述第一路徑短的長度的第二路徑。 The plasma antenna module according to claim 10, wherein the plasma antenna module further comprises: a third plasma antenna; a third ground portion, electrically connected to one side of the third plasma antenna; a third detour part, interposed between the third plasma antenna and the power supply part or between the third plasma antenna and the third ground part; a fourth plasma antenna; a fourth ground part , which is electrically connected to one side of the fourth plasma antenna; the fourth detour part is interposed between the fourth plasma antenna and the power supply part or the fourth plasma antenna and the fourth plasma antenna Between the ground parts, the first plasma antenna, the second plasma antenna, the third plasma antenna, and the fourth plasma antenna are spaced apart from each other, and the power supply part supplies the first plasma antenna to the first plasma antenna. The other side of a plasma antenna, the other side of the second plasma antenna, the other side of the third plasma antenna, and the other side of the fourth plasma antenna are supplied with power in parallel. The third detour portion includes a plurality of contacts located on the first path, and is formed to have a higher density than the The first path has a short length, a second path, the fourth detour portion includes a plurality of contacts located on the first path, and there are two or more contacts among the plurality of contacts in the fourth detour portion A second path having a shorter length than the first path is formed in addition to each other. 如請求項13所述的等離子體天線模組,其中,所述第一等離子體天線位於所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線的內側,所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線佈置成均等分割等離子體處理區域。 The plasma antenna module of claim 13, wherein the first plasma antenna is located inside the second plasma antenna, the third plasma antenna and the fourth plasma antenna, so The second plasma antenna, the third plasma antenna, and the fourth plasma antenna are arranged to equally divide the plasma processing region. 如請求項14所述的等離子體天線模組,其中,通過由所述第一迂回部、所述第二迂回部、所述第三迂回部以及所述第四迂回部分別形成的第二路徑的數量的組合,調節所述第一等離子體天線、所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線的各電流值,調節由所述第一等離子體天線、所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線分別形成的等離子體的密度。 The plasma antenna module according to claim 14, wherein the second path formed by the first detour portion, the second detour portion, the third detour portion, and the fourth detour portion passes through respectively , adjust the current values of the first plasma antenna, the second plasma antenna, the third plasma antenna and the fourth plasma antenna, and adjust the current value of the first plasma antenna Densities of plasmas formed by the antenna, the second plasma antenna, the third plasma antenna, and the fourth plasma antenna, respectively. 一種等離子體天線模組,包括:多個等離子體天線;多個迂回部,分別連接於多個等離子體天線和多個電源供應部之間或者多個等離子體天線和多個接地部之間,並包括各自在所述迂回部中彼此連接的多個接點;移送單元,將包括在各迂回部中的多個接點中2個以上的接點選擇性附加地彼此連接;存儲介質,存儲有與根據連接的所述接點的數量控制向各等離子體天線流入的電流值而由各等離子體天線形成的等離子體密度相關的資訊;以及控制部,為了根據存儲於所述存儲介質的資訊來調節各迂回部的連接的接點的數量,控制所述移送單元。 A plasma antenna module, comprising: a plurality of plasma antennas; a plurality of detours, respectively connected between a plurality of plasma antennas and a plurality of power supply parts or between a plurality of plasma antennas and a plurality of grounding parts, and includes a plurality of contacts each connected to each other in the detour portion; a transfer unit for selectively and additionally connecting two or more contacts to each other among the plurality of contacts included in each detour portion; a storage medium for storing There is information on plasma density formed by each plasma antenna by controlling the value of current flowing to each plasma antenna according to the number of the connected contacts; and a control unit for controlling the information stored in the storage medium based on the information The transfer unit is controlled by adjusting the number of contacts connected to each detour portion. 一種等離子體處理裝置,具備被調節等離子體密度的等離子體天線,其中,所述等離子體處理裝置包括:電源供應部,向第一等離子體天線的一側供應電源; 第一接地部,電連接於所述第一等離子體天線的另一側;以及第一迂回部,介於所述第一等離子體天線和所述電源供應部之間或者所述第一等離子體天線和所述第一接地部之間,所述第一迂回部包括:基本電路,形成第一路徑;多個接點,在所述第一路徑上彼此隔開設置且彼此連接;以及迂回電路,形成有用於緊固於所述多個接點的緊固孔,通過在所述緊固孔中選擇性地緊固所述多個接點,所述第一迂回部形成具有比所述第一路徑短的長度的第二路徑。 A plasma processing apparatus including a plasma antenna whose plasma density is adjusted, wherein the plasma processing apparatus comprises: a power supply unit for supplying power to one side of the first plasma antenna; a first ground part electrically connected to the other side of the first plasma antenna; and a first detour part, interposed between the first plasma antenna and the power supply part or the first plasma Between the antenna and the first ground portion, the first detour portion includes: a basic circuit that forms a first path; a plurality of contacts that are spaced apart and connected to each other on the first path; and a detour circuit , a fastening hole for fastening to the plurality of contacts is formed, and by selectively fastening the plurality of contacts in the fastening hole, the first detour portion is formed to have a larger diameter than the second A second path of short length. 如請求項17所述的等離子體處理裝置,其中,所述基本電路形成為線圈形狀。 The plasma processing apparatus of claim 17, wherein the basic circuit is formed in a coil shape. 如請求項18所述的等離子體處理裝置,其中,所述第一迂回部形成彼此隔開的多個。 The plasma processing apparatus according to claim 18, wherein a plurality of the first detours are formed to be spaced apart from each other. 一種等離子體處理裝置,具備被調節等離子體密度的等離子體天線,其中,所述等離子體處理裝置包括:電源供應部,向彼此隔開設置的第一等離子體天線、第二等離子體天線、第三等離子體天線以及第四等離子體天線各自的一側並列供應電源;第一接地部,電連接於所述第一等離子體天線、所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線各自的另一側;以及多個迂回部,電連接於所述第一等離子體天線、所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線各自和所述電源供 應部之間或者所述第一等離子體天線、所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線各自和所述第一接地部之間,所述多個迂回部各自包括:基本電路,形成第一路徑;多個接點,在所述第一路徑上彼此隔開設置且彼此連接;以及迂回電路,形成用於緊固於所述多個接點的緊固孔,通過在所述緊固孔中選擇性地緊固所述多個接點,所述多個迂回部各自形成具有比所述第一路徑短的長度的第二路徑,所述第一等離子體天線位於所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線的內側,所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線佈置成均等分割等離子體處理區域。 A plasma processing apparatus including a plasma antenna whose plasma density is adjusted, wherein the plasma processing apparatus includes a power supply unit, a first plasma antenna, a second plasma antenna, a first plasma antenna, and a One side of each of the three plasma antennas and the fourth plasma antenna is supplied with power in parallel; the first ground part is electrically connected to the first plasma antenna, the second plasma antenna, the third plasma antenna and the the other side of each of the fourth plasma antennas; and a plurality of detours, electrically connected to the first plasma antenna, the second plasma antenna, the third plasma antenna, and the fourth plasma antenna Plasma antennas each and the power supply between the corresponding parts or between each of the first plasma antenna, the second plasma antenna, the third plasma antenna and the fourth plasma antenna and the first ground part, the multiple Each of the detours includes: a base circuit forming a first path; a plurality of contacts on the first path spaced apart from each other and connected to each other; and a detour circuit formed for fastening to the plurality of contacts the fastening hole, by selectively fastening the plurality of contacts in the fastening hole, the plurality of detours each form a second path having a length shorter than the first path, the The first plasma antenna is located inside the second plasma antenna, the third plasma antenna and the fourth plasma antenna, the second plasma antenna, the third plasma antenna and the The fourth plasma antenna is arranged to equally divide the plasma processing region. 如請求項20所述的等離子體處理裝置,其中,通過由所述多個迂回部各自形成的第二路徑的數量的組合,調節所述第一等離子體天線、所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線的各電流值,調節由所述第一等離子體天線、所述第二等離子體天線、所述第三等離子體天線以及所述第四等離子體天線分別形成的等離子體的密度。 The plasma processing apparatus according to claim 20, wherein the first plasma antenna, the second plasma antenna, the The current values of the third plasma antenna and the fourth plasma antenna are adjusted by the first plasma antenna, the second plasma antenna, the third plasma antenna and the fourth plasma antenna The density of the plasma formed by the plasma antenna respectively.
TW109130843A 2019-10-29 2020-09-09 Plasma antenna module and plasma processing device TWI768460B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2019-0135706 2019-10-29
KR1020190135706A KR102137913B1 (en) 2019-10-29 2019-10-29 Plasma antenna module

Publications (2)

Publication Number Publication Date
TW202117779A TW202117779A (en) 2021-05-01
TWI768460B true TWI768460B (en) 2022-06-21

Family

ID=71892599

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109130843A TWI768460B (en) 2019-10-29 2020-09-09 Plasma antenna module and plasma processing device

Country Status (3)

Country Link
KR (1) KR102137913B1 (en)
CN (1) CN111952142B (en)
TW (1) TWI768460B (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1662114A (en) * 2004-02-25 2005-08-31 周星工程股份有限公司 Plasma antenna
US20080073202A1 (en) * 2004-07-30 2008-03-27 Amarante Technologies, Inc. Plasma Nozzle Array for Providing Uniform Scalable Microwave Plasma Generation
CN102737943A (en) * 2011-03-30 2012-10-17 东京毅力科创株式会社 Plasma processing apparatus
TWI595807B (en) * 2009-03-31 2017-08-11 Tokyo Electron Ltd Plasma processing equipment

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100440736B1 (en) * 2001-02-19 2004-07-15 오범환 Direct Inductance Controller for Coaxial Parallel ICP Antenna
KR100692420B1 (en) * 2005-12-09 2007-03-13 주식회사 플라즈마트 Antenna Structure of Inductively Coupled Plasma Generator
JP5851681B2 (en) * 2009-10-27 2016-02-03 東京エレクトロン株式会社 Plasma processing equipment
JP5554099B2 (en) * 2010-03-18 2014-07-23 東京エレクトロン株式会社 Plasma processing apparatus and plasma processing method
JP2013105664A (en) * 2011-11-15 2013-05-30 Tokyo Electron Ltd High frequency antenna circuit and inductively coupled plasma treatment apparatus
JP5894785B2 (en) * 2011-12-19 2016-03-30 東京エレクトロン株式会社 Inductively coupled plasma antenna unit and inductively coupled plasma processing apparatus
KR101643674B1 (en) * 2014-12-05 2016-07-28 인베니아 주식회사 Antenna assembly for plasma processing apparatus and plasma processing apparatus comprising the same
KR101817210B1 (en) * 2016-08-01 2018-01-15 세메스 주식회사 Apparatus for generating plasma, apparatus for treating substrate comprising the same, and method for controlling the same
US20190088449A1 (en) * 2017-09-21 2019-03-21 Semes Co., Ltd. Substrate treating apparatus and substrate treating method
KR20190055607A (en) * 2017-11-15 2019-05-23 삼성전자주식회사 Plasma processing apparatus
KR101934982B1 (en) * 2018-08-16 2019-01-03 세메스 주식회사 Substrate treating apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1662114A (en) * 2004-02-25 2005-08-31 周星工程股份有限公司 Plasma antenna
TW200534533A (en) * 2004-02-25 2005-10-16 Jusung Eng Co Ltd Plasma antenna
US20080073202A1 (en) * 2004-07-30 2008-03-27 Amarante Technologies, Inc. Plasma Nozzle Array for Providing Uniform Scalable Microwave Plasma Generation
TWI595807B (en) * 2009-03-31 2017-08-11 Tokyo Electron Ltd Plasma processing equipment
CN102737943A (en) * 2011-03-30 2012-10-17 东京毅力科创株式会社 Plasma processing apparatus

Also Published As

Publication number Publication date
TW202117779A (en) 2021-05-01
KR102137913B1 (en) 2020-07-24
CN111952142B (en) 2021-06-22
CN111952142A (en) 2020-11-17

Similar Documents

Publication Publication Date Title
CN109104807B (en) Plasma processing apparatus
TWI810290B (en) Filter device and plasma processing apparatus
CN101720502B (en) Array of Conductive Elements for Minimizing Plasma Radial Non-uniformity
TWI554160B (en) Plasma processing device and plasma processing method
JP6226746B2 (en) Substrate support with symmetrical feeding structure
CN104994676B (en) Plasma processing apparatus
CN101460002B (en) Method and apparatus for producing uniform processing rates
JP5851681B2 (en) Plasma processing equipment
JP5740304B2 (en) Field-enhanced inductively coupled plasma processing system and plasma forming method
TWI585847B (en) Plasma processing device and plasma processing method
JP5031377B2 (en) Plasma process apparatus, ICP source and ICP apparatus
CN102845137A (en) Method and apparatus for an induction coil apparatus for a plasma processing system
TWI701706B (en) Plasma processing apparatus
TW202036661A (en) Recursive coils for inductively coupled plasmas
US20090278459A1 (en) Induction coil, a plasma generator and a plasma generating method
TWI768460B (en) Plasma antenna module and plasma processing device
TW202536957A (en) Plasma processing apparatus
TW201841300A (en) Ion directional electrostatic chuck
US20220148854A1 (en) Filter circuit
JP2015130350A (en) plasma processing apparatus and plasma processing method
KR102773262B1 (en) Stage, film forming device and film processing device
CN107179796A (en) Regulator circuit, integrated transformer and the method for manufacturing integrated transformer
CN117174468A (en) Multi-coil induction device
WO2023248406A1 (en) Plasma processing apparatus
KR20250132218A (en) Plasma source and substrate processing apparatus