TWI757141B - Display device and method for manufacturing the same - Google Patents
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
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- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/0665—Shaping the laser beam, e.g. by masks or multi-focusing by beam condensation on the workpiece, e.g. for focusing
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- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
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- H—ELECTRICITY
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- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H29/00—Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00
- H10H29/10—Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00
- H10H29/14—Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00 comprising multiple light-emitting semiconductor components
- H10H29/142—Two-dimensional arrangements, e.g. asymmetric LED layout
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Abstract
Description
本發明是有關於一種顯示裝置及其製造方法,且特別是有關於一種微型發光二極體顯示裝置及其製造方法。The present invention relates to a display device and a manufacturing method thereof, and in particular, to a miniature light emitting diode display device and a manufacturing method thereof.
由於微型發光二極體的尺寸極小,目前製作微型發光二極體顯示裝置的方法是採用巨量轉移(Mass Transfer)技術,亦即利用微機電陣列技術進行微型發光二極體晶粒取放,以將大量的微型發光二極體晶粒一次搬運到具有畫素電路的驅動基板上。目前持續有各種新的巨量轉移技術被發表,其中雷射轉移技術因具有效率上的優勢而獲青睞。Due to the extremely small size of the micro-LEDs, the current method of manufacturing the micro-LED display devices is to use the Mass Transfer technology, that is, to use the micro-electromechanical array technology to pick and place the micro-LED grains. In order to transport a large number of micro light-emitting diode crystal grains to the driving substrate with pixel circuit at one time. At present, various new mass transfer technologies have been published, among which laser transfer technology is favored due to its efficiency advantages.
雷射轉移技術藉由雷射與連接材發生光-物質反應而實現晶粒的分離,同時產生的衝擊力或驅動力可使晶粒脫離,並推動晶粒朝目標基板轉移。然而,在光-物質反應發生時,由於衝擊力或驅動力分布不均,造成晶粒脫離的方向不固定,導致晶粒無法被準確地轉移至目標基板上。The laser transfer technology realizes the separation of the die by the light-matter reaction between the laser and the connecting material, and the impact force or driving force generated at the same time can dislodge the die and push the die to transfer to the target substrate. However, when the light-matter reaction occurs, due to the uneven distribution of the impact force or the driving force, the direction of detachment of the crystal grains is not fixed, so that the crystal grains cannot be accurately transferred to the target substrate.
本發明提供一種顯示裝置,具有準確轉移的發光元件。The present invention provides a display device with accurately transferred light-emitting elements.
本發明提供一種顯示裝置的製造方法,可準確地轉移發光元件。The present invention provides a method of manufacturing a display device, which can accurately transfer light-emitting elements.
本發明的一個實施例提出一種顯示裝置,包括:電路基板;以及發光元件,與電路基板電性連接,且具有開口,其中開口位於發光元件鄰近或遠離電路基板的一側。An embodiment of the present invention provides a display device, including: a circuit substrate; and a light-emitting element, which is electrically connected to the circuit substrate and has an opening, wherein the opening is located on a side of the light-emitting element adjacent to or away from the circuit substrate.
在本發明的一實施例中,上述的開口於電路基板的正投影重疊於發光元件的重心於電路基板的正投影。In an embodiment of the present invention, the orthographic projection of the opening on the circuit board overlaps the orthographic projection of the center of gravity of the light-emitting element on the circuit board.
在本發明的一實施例中,上述的發光元件包括兩個電極,且開口至少部分位於兩個電極之外。In an embodiment of the present invention, the above-mentioned light-emitting element includes two electrodes, and the opening is at least partially located outside the two electrodes.
在本發明的一實施例中,上述的發光元件包括兩個電極,且開口位於兩個電極之間。In an embodiment of the present invention, the above-mentioned light-emitting element includes two electrodes, and the opening is located between the two electrodes.
在本發明的一實施例中,上述的開口位於發光元件的出光面或非出光面。In an embodiment of the present invention, the above-mentioned opening is located on the light-emitting surface or the non-light-emitting surface of the light-emitting element.
在本發明的一實施例中,上述的開口貫穿發光元件。In an embodiment of the present invention, the above-mentioned opening penetrates the light-emitting element.
在本發明的一實施例中,上述的開口的剖面具有正梯形或倒梯形。In an embodiment of the present invention, the cross section of the above-mentioned opening has a normal trapezoid or an inverted trapezoid.
在本發明的一實施例中,上述的開口內具有側向盲孔。In an embodiment of the present invention, the above-mentioned opening has lateral blind holes.
在本發明的一實施例中,上述的開口的口徑小於發光元件的寬度的1/3。In an embodiment of the present invention, the aperture of the above-mentioned opening is less than 1/3 of the width of the light-emitting element.
在本發明的一實施例中,上述的開口的口徑小於或等於3 μm。In an embodiment of the present invention, the diameter of the above-mentioned opening is less than or equal to 3 μm.
在本發明的一實施例中,上述的開口的深度大於或等於1 μm。In an embodiment of the present invention, the depth of the above-mentioned opening is greater than or equal to 1 μm.
在本發明的一實施例中,上述的電路基板包括主動元件陣列。In an embodiment of the present invention, the above-mentioned circuit substrate includes an active element array.
在本發明的一實施例中,上述的顯示裝置還包括連接柱,連接柱至少部分位於開口中。In an embodiment of the present invention, the above-mentioned display device further includes a connecting column, and the connecting column is at least partially located in the opening.
在本發明的一實施例中,上述的連接柱包括多個層,且多個層具有不同的濃度、光吸收率或光穿透率。In an embodiment of the present invention, the above-mentioned connecting column includes a plurality of layers, and the plurality of layers have different concentrations, light absorption rates or light transmittances.
本發明的一個實施例提出一種顯示裝置的製造方法,包括:提供發光元件,發光元件位於第一載板上;於發光元件遠離第一載板的表面上形成開口;於表面上形成連接層,且連接層填入開口中;將第二載板固定於連接層上,使得發光元件位於第一載板與第二載板之間;移除第一載板;移除連接層,且保留開口與第二載板之間的連接層而形成連接柱;提供第三載板,並將發光元件與第三載板對位,其中發光元件位於第二載板與第三載板之間;以及將雷射光束聚焦於連接柱,以分離發光元件與第二載板,而使發光元件轉移至第三載板上。One embodiment of the present invention provides a method for manufacturing a display device, which includes: providing a light-emitting element, the light-emitting element is located on a first carrier; forming an opening on a surface of the light-emitting element away from the first carrier; forming a connection layer on the surface, and the connection layer is filled in the opening; the second carrier is fixed on the connection layer, so that the light-emitting element is located between the first carrier and the second carrier; the first carrier is removed; the connection layer is removed and the opening is retained forming a connection column with a connection layer between the second carrier and the second carrier; providing a third carrier, and aligning the light-emitting element and the third carrier, wherein the light-emitting element is located between the second carrier and the third carrier; and The laser beam is focused on the connecting column to separate the light-emitting element and the second carrier, so that the light-emitting element is transferred to the third carrier.
在本發明的一實施例中,上述的開口位於發光元件的出光面或非出光面。In an embodiment of the present invention, the above-mentioned opening is located on the light-emitting surface or the non-light-emitting surface of the light-emitting element.
在本發明的一實施例中,上述的開口於表面的正投影重疊於發光元件的重心於表面的正投影。In an embodiment of the present invention, the orthographic projection of the above-mentioned opening on the surface overlaps the orthographic projection of the center of gravity of the light-emitting element on the surface.
在本發明的一實施例中,上述的開口貫穿發光元件。In an embodiment of the present invention, the above-mentioned opening penetrates the light-emitting element.
在本發明的一實施例中,上述的第三載板為電路基板。In an embodiment of the present invention, the above-mentioned third carrier is a circuit substrate.
在本發明的一實施例中,上述的連接層包括多個層,且多個層具有不同的濃度、光吸收率或光穿透率。In an embodiment of the present invention, the above-mentioned connecting layer includes multiple layers, and the multiple layers have different concentrations, light absorption rates or light transmittances.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more obvious and easy to understand, the following embodiments are given and described in detail with the accompanying drawings as follows.
圖1A至圖1I為本發明一實施例的顯示裝置10的製造方法的步驟流程的剖面示意圖。首先,請參照圖1A,提供生長於源基板110的發光元件120,發光元件120包括第一型半導體層121、第二型半導體層122、位於第一型半導體層121與第二型半導體層122之間的發光層123、以及分別與第一型半導體層121及第二型半導體層122電性連接的多個電極121a、122a。在本實施例中,多個電極121a、122a位於第一型半導體層121的同一側。也就是說,發光二極體元件120為水平式(Lateral)微型發光二極體。FIG. 1A to FIG. 1I are schematic cross-sectional views of the steps of a manufacturing method of a
在本實施例中,還可包括分別於電極121a、122a上形成接墊121b、122b,其中接墊121b電性連接電極121a,接墊122b電性連接電極122a,且接墊121b的頂面與接墊122b的頂面切齊,但不以此為限。接墊121b、122b的材質為金屬,但本發明不限於此。在其他實施例中,接墊121b、122b也可以使用其他導電材料,例如:合金、金屬材料的氮化物、金屬材料的氧化物、金屬材料的氮氧化物、石墨稀、金屬材料的堆疊層或是其它導電材料的堆疊層。In this embodiment,
接著,請參照圖1B,提供塗有黏著層130的載板C1,並將發光元件120貼附於黏著層130,此時發光元件120可位於源基板110與載板C1之間。隨後,移除源基板110,而露出第一型半導體層121遠離載板C1的表面121S。移除源基板110的方式例如可採用雷射剝離(Laser Lift Off)製程,但本發明不以此為限。1B , a carrier C1 coated with an
接著,請參照圖1C,於第一型半導體層121的表面121S上形成開口O1。在本實施例中,開口O1可以完全位於第一型半導體層121中,且可位於發光元件120的出光面。另外,開口O1於表面121S的正投影可重疊於發光元件120的重心於表面121S的正投影,但本發明不以此為限。在本實施例中,開口O1的剖面可以呈現上窄下寬的正梯形,但本發明不限於此。在一些實施例中,開口O1還可以向下延伸至貫穿第一型半導體層121或更深。形成開口O1的方式可以採用微影蝕刻製程。舉例而言,在本實施例中,可以藉由乾蝕刻製程搭配濕蝕刻製程來製作剖面呈正梯形的開口O1。Next, referring to FIG. 1C , an opening O1 is formed on the
接著,請參照圖1D,於發光元件120及黏著層130上形成連接層150,且連接層150填入開口O1中。連接層150的材質是可與雷射光反應而分解(例如燒蝕)的材料。在本實施例中,連接層150可具有黏性,但本發明不以此為限。在一些實施例中,當連接層150不具黏性時,可於連接層150上形成一層黏著層。Next, referring to FIG. 1D , a
接著,請參照圖1E,於連接層150上貼附載板C2,此時發光元件120位於載板C1與載板C2之間。之後,將載板C1移除。移除載板C1例如可採用加熱的方式,但本發明不以此為限。Next, referring to FIG. 1E , a carrier C2 is attached on the
接著,請參照圖1F,移除黏著層130,而露出接墊121b、122b。移除黏著層130的方式可採用濕蝕刻製程,但本發明不以此為限。Next, referring to FIG. 1F , the
接著,請參照圖1G,移除大部分的連接層150,但保留開口O1與載板C2之間的部分連接層150,而形成連接柱150a,且連接柱150a至少部分位於開口O1中。移除連接層150的方式可採用濕蝕刻製程,但本發明不以此為限。Next, referring to FIG. 1G , most of the
接著,請參照圖1H,提供電路基板170,且電路基板170可以包括多個接墊170a、170b,並將發光元件120與電路基板170對位,使得發光元件120位於載板C2與電路基板170之間。具體而言,在本實施例中,對位步驟是將發光元件120的接墊121b、122b分別對齊電路基板170的接墊170a、170b,但本發明不限於此,也可以採用其他適合的對位方式。1H, a
之後,將雷射器180發出的雷射光束LB聚焦於連接柱150a。具體而言,連接柱150a可包括位於開口O1外的頸部NP以及位於開口O1內的底部BP。在本實施例中,可將雷射光束LB聚焦於連接柱150a的頸部NP,以使連接柱150a的頸部NP與雷射光束LB反應而分解,且連接柱150a的底部BP可殘留於開口O1內。當連接柱150a的頸部NP分解而斷裂時,發光元件120便可以類似自由落體的方式朝正下方垂直掉落,而準確地轉移至電路基板170上,進而使接墊121b、122b能夠分別接觸接墊170a、170b,如圖1I所示。此時,在形成的顯示裝置10中,發光元件120的電極121a、122a可位於第一型半導體層121與電路基板170之間。After that, the laser beam LB emitted by the
在一些實施例中,可將雷射光束LB聚焦於連接柱150a的底部BP,以使連接柱150a的底部BP與雷射光束LB反應而產生衝擊力或驅動力。詳細而言,連接柱150a的底部BP與雷射光束LB反應所產生的橫向衝擊力或驅動力可因作用於開口O1的側壁而相互抵銷,使得其淨衝擊力或驅動力為縱向向下的合力。藉此向下合力,可使發光元件120朝正下方前進而準確地轉移至電路基板170上,進而使接墊121b、122b能夠分別對接接墊170a、170b。In some embodiments, the laser beam LB can be focused on the bottom BP of the connecting
在一些實施例中,於前述步驟之後還可以包括電性連接發光元件120的接墊121b與電路基板170的接墊170a,以及電性連接發光元件120的接墊122b與電路基板170的接墊170b。電性連接接墊121b與接墊170a以及接墊122b與接墊170b的方法可以採用共晶接合或其他類似的方法,但本發明不以此為限。In some embodiments, after the aforementioned steps, it may further include electrically connecting the
請參照圖1I,在本實施例中,顯示裝置10包括電路基板170以及發光元件120。發光元件120與電路基板170電性連接,且具有開口O1,開口O1位於發光元件120遠離電路基板170的一側。藉由發光元件120的開口O1來調整雷射轉移過程中雷射光束的作用範圍,可使發光元件120能夠準確地轉移至電路基板170上,從而使顯示裝置10具有準確巨量轉移的發光元件120陣列。Referring to FIG. 1I , in this embodiment, the
在一些實施例中,電路基板170可以包括底板171、元件層172及多個接墊170a、170b。可以利用薄膜沉積製程、光罩製程以及蝕刻製程,在底板171上形成包括主動元件T的陣列(例如,薄膜電晶體陣列)的元件層172。在形成了元件層172之後,可繼續利用薄膜沉積製程、光罩製程以及蝕刻製程,在元件層172上形成多個電極170a、170b。In some embodiments, the
開口O1於發光元件120的位置並無特殊限制。在顯示裝置10中,開口O1於電路基板170的正投影可重疊於發光元件120的重心於電路基板170的正投影,但本發明不以此為限。具體而言,發光元件120的重心位置可以藉由計算發光元件120的各個層的面積及密度分布來獲得。利用開口O1於電路基板170的正投影重疊於發光元件120的重心於電路基板170的正投影,可在藉由連接柱150a將發光元件120懸吊於載板C2上時使發光元件120保持理想的平衡,如圖1H所示。The position of the opening O1 on the light-emitting
開口O1的形狀並無特殊限制。在本實施例中,開口O1的剖面具有上窄下寬的正梯形,但本發明不以此為限。在一些實施例中,開口O1的剖面也可以具有上寬下窄的倒梯形。在其他實施例中,藉由於開口O1內進一步形成側向盲孔,可使開口O1的剖面具有刺毛狀的外形。The shape of the opening O1 is not particularly limited. In this embodiment, the cross-section of the opening O1 has a regular trapezoid shape with an upper narrow and a lower width, but the invention is not limited to this. In some embodiments, the cross-section of the opening O1 may also have an inverted trapezoid shape that is wide at the top and narrow at the bottom. In other embodiments, by further forming lateral blind holes in the opening O1, the cross-section of the opening O1 can have a burr-like shape.
開口O1的尺寸可以盡可能地小,以免影響發光元件120的光學性質及電性質,但本發明不以此為限。在本實施例中,開口O1的口徑Da可以小於發光元件120的寬度W的1/3,亦即Da<1/3W。在一些實施例中,開口O1的口徑Da可以小於或等於3 μm,例如口徑Da為3 μm、2 μm或1.5 μm,可以視需要選擇適當的口徑Da。The size of the opening O1 can be as small as possible so as not to affect the optical properties and electrical properties of the
開口O1可以具有足夠的深度,以例如確保連接柱150a與雷射光束LB反應所產生的淨衝擊力或驅動力為方向朝下的力。在一些實施例中,開口O1的深度Dt可以大於或等於1 μm,例如深度Dt為1 μm、2 μm或3 μm以上,但本發明不以此為限。在一些實施例中,開口O1中可殘留部分的連接柱150a。The opening O1 may have a sufficient depth to, for example, ensure that the net impact or driving force generated by the reaction of the connecting
圖2A至圖2G為本發明一實施例的顯示裝置20的製造方法的步驟流程的剖面示意圖。以下沿用圖1A至圖1I的實施例的元件標號與相關內容,其中,採用相同的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明,可參考圖1A至圖1I的實施例,在以下的說明中不再重述。2A to FIG. 2G are schematic cross-sectional views illustrating the steps of a method for manufacturing the
首先,請參照圖2A,提供生長於源基板110的發光元件220,發光元件220包括第一型半導體層121、第二型半導體層122、位於第一型半導體層121與第二型半導體層122之間的發光層123、以及分別與第一型半導體層121及第二型半導體層122電性連接的多個電極121a、122a。First, referring to FIG. 2A , a light-emitting
接著,請參照圖2B,於電極122a及第二型半導體層122中形成開口O2。在本實施例中,開口O2位於電極122a及第二型半導體層122中,但本發明不以此為限。在一些實施例中,開口O2還可貫穿發光層123,且延伸至第一型半導體層121。Next, referring to FIG. 2B , an opening O2 is formed in the
在本實施例中,還可進一步於開口O2內形成至少2個側向盲孔,使得開口O2具有刺毛狀的外形,藉以提升後續形成於開口O2內的連接柱150a的支撐力,進而提升連接柱150a懸掛發光元件220時的穩定性。舉例而言,可於開口O2內形成側向盲孔B1、B2、B3、B4,但本發明不以此為限。In this embodiment, at least two lateral blind holes may be further formed in the opening O2, so that the opening O2 has a burr-like shape, so as to improve the supporting force of the connecting
形成刺毛狀的開口O2可採用多道蝕刻製程來實現。舉例而言,在本實施例中,可先採用兩道蝕刻製程來形成開口O2的主要部分,其中上述兩道蝕刻製程分別使用可選擇性蝕刻電極122a及第二型半導體層122的蝕刻劑。之後,可使用對於電極122a的特定晶格方位具有選擇性的蝕刻劑來形成側向盲孔B1、B2,隨後再使用對於第二型半導體層122的特定晶格方位具有選擇性的蝕刻劑來形成側向盲孔B3、B4。在其他實施例中,可以視實際需求依序選用對特定材料具有選擇性的蝕刻劑來形成各種形狀的開口O2。The formation of the burr-like openings O2 may be achieved by using multiple etching processes. For example, in this embodiment, two etching processes may be used to form the main part of the opening O2 first, wherein the two etching processes use an etchant that can selectively etch the
接著,請參照圖2C,於發光元件220及源基板110上形成連接層150,且連接層150填入開口O2中。Next, referring to FIG. 2C , a
接著,請參照圖2D,於連接層150上貼附載板C3,此時發光元件220位於源基板110與載板C3之間,然後移除源基板110。移除源基板110例如可採用雷射剝離的方式,但本發明不以此為限。Next, referring to FIG. 2D , the carrier C3 is attached on the
接著,請參照圖2E,移除大部分的連接層150,但保留開口O2與載板C3之間的部分連接層150,而形成連接柱150a,且連接柱150a填充開口O2而具有刺毛狀的剖面形狀。如此一來,刺毛狀的連接柱150a可具有提升的支撐力而穩定地懸掛發光元件220。在本實施例中,移除連接層150的方式例如可採用濕蝕刻製程,但本發明不以此為限。Next, referring to FIG. 2E , most of the
接著,請參照圖2F,提供電路基板170,且電路基板170可以包括位於其表面上的多個接墊170a、170b。將發光元件220與電路基板170對位,使得發光元件220位於載板C3與電路基板170之間,且發光元件220於電路基板170的正投影位於電路基板170的接墊170a、170b之間。之後,將雷射器180發出的雷射光束LB聚焦於連接柱150a的底部BP,以使使發光元件220朝正下方前進而準確地轉移至電路基板170上。Next, referring to FIG. 2F, a
接著,請參照圖2G,形成連接導線121c、122c,其中連接導線121c連接發光元件220的電極121a與電路基板170的接墊170a,連接導線122c連接發光元件220的電極122a與電路基板170的接墊170b,即可完成本實施例的顯示裝置20。Next, referring to FIG. 2G , connecting
與圖1I所示的顯示裝置10相比,如圖2G所示的顯示裝置20的不同之處在於:在顯示裝置20中,開口O2具有刺毛狀的外形且位於發光元件220的非出光面,發光元件220的第一型半導體層121位於電極121a、122a與電路基板170之間,且發光元件220的電極121a、122a分別透過連接導線121c、122c與電路基板170的接墊170a、170b連接。Compared with the
圖3A至圖3H為本發明一實施例的顯示裝置30的製造方法的步驟流程的剖面示意圖。以下沿用圖1A至圖1I的實施例的元件標號與相關內容,其中,採用相同的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明,可參考圖1A至圖1I的實施例,在以下的說明中不再重述。3A to FIG. 3H are schematic cross-sectional views of the steps of a method for manufacturing the
首先,請參照圖3A,提供生長於源基板110的發光元件320,發光元件320包括第一型半導體層321、第二型半導體層322、位於第一型半導體層321與第二型半導體層322之間的發光層323、以及分別與第一型半導體層321及第二型半導體層322電性連接的多個電極321a、322a。在本實施例中,發光二極體元件320可以是覆晶式(Flip-chip)微型發光二極體。First, referring to FIG. 3A , a light-emitting
接著,請參照圖3B,提供塗有黏著層330的載板C4,並將發光元件320的第一型半導體層321貼附於黏著層330,此時發光元件320可位於源基板110與載板C4之間。隨後,移除源基板110,而露出發光元件320的電極321a、322a,且電極321a、322a之間具有開口O3。移除源基板110的方式例如可採用雷射剝離(Laser Lift Off)製程,但本發明不以此為限。Next, referring to FIG. 3B , a carrier C4 coated with an
接著,請參照圖3C,於發光元件320及黏著層330上形成連接層350,且連接層350填入電極321a、322a之間的開口O3中。在本實施例中,連接層350可以包括多個層。舉例而言,連接層350可以包括第一層351、第二層352以及第三層353,其中第二層352位於第一層351與第三層353之間,但本發明不以此為限。在本實施例中,第一層351、第二層352以及第三層353可以具有相對於後續使用的雷射光束LB依序遞增的光穿透率。在一些實施例中,第一層351、第二層352以及第三層353可以具有相對於後續使用的雷射光束LB依序遞減的光穿透率。在某些實施例中,第一層351、第二層352以及第三層353可以具有相對於後續使用的雷射光束LB先遞增後遞減的光吸收率。在一些實施例中,第一層351、第二層352以及第三層353可以具有相對於後續使用的雷射光束LB先遞減後遞增的光吸收率。在一些實施例中,第一層351、第二層352以及第三層353也可以包含雷射光吸收材料,且第一層351、第二層352以及第三層353中的雷射光吸收材料的濃度可依序遞增、依序遞減、先遞增後遞減、或先遞減後遞增。Next, referring to FIG. 3C , a
連接層350的材質是可與雷射光反應而分解的材料。連接層350可具有黏性,但本發明不以此為限。在一些實施例中,當連接層350的第三層353不具黏性時,可於第三層353上形成一層黏著層。The material of the
接著,請參照圖3D,於連接層350上貼附載板C5,此時發光元件320位於載板C5與載板C4之間,然後移除載板C4。在一些實施例中,移除載板C4的同時還可一併移除黏著層330。移除載板C4及黏著層330例如可採用加熱的方式,但本發明不以此為限。Next, referring to FIG. 3D , the carrier C5 is attached on the
接著,請參照圖3E,移除大部分的連接層350,但保留開口O3與載板C5之間的部分連接層350,而形成連接柱350a,其中連接柱350a包括第一層351a、第二層352a以及第三層353a,且連接柱350a至少部分位於開口O3中。在本實施例中,第一層351a、第二層352a以及第三層353a可以具有相對於雷射光束LB依序遞增的光穿透率。Next, referring to FIG. 3E , most of the
在一些實施例中,第一層351a、第二層352a以及第三層353a可以具有相對於雷射光束LB依序遞減的光穿透率。在一些實施例中,第一層351a、第二層352a以及第三層353a可以具有相對於雷射光束LB先遞增後遞減的光吸收率。在某些實施例中,第一層351a、第二層352a以及第三層353a可以具有相對於雷射光束LB先遞減後遞增的光吸收率。在一些實施例中,第一層351a、第二層352a以及第三層353a也可以包含雷射吸收材料,且第一層351a、第二層352a以及第三層353a中的雷射吸收材料的濃度可依序遞增、依序遞減、先遞增後遞減、或先遞減後遞增。藉由上述遞增或遞減的光穿透率、光吸收率或雷射吸收材料濃度,可調控連接柱350a與雷射光束LB反應之後的斷裂位置,以使發光元件320的巨量轉移達到最佳化。In some embodiments, the
在一些實施例中,當從載板C5往發光元件320的方向俯視觀看發光元件320時,電極321a、322a之間的間距D1可以小於電極321a、322a在垂直於間距D1的方向上的長度,此時,開口O3可以是位於電極321a、322a之間的長溝,使得連接柱350a具有長條狀的俯視外形,在此情況下,可以保留開口O3中段的連接柱350a,且完全移除開口O3中其餘部分的連接柱350a,以使連接柱350a具有近似圓柱形的外形。In some embodiments, when the light-emitting
接著,請參照圖3F,提供載板C6,且載板C6的一個表面上塗有黏著層340,並將發光元件320置於黏著層340上方,且使發光元件320位於載板C6與載板C5之間。之後,將雷射器180發出的雷射光束LB聚焦於連接柱350a的第一層351a,以使連接柱350a的第一層351a與雷射光束LB反應而產生方向向下的淨衝擊力或驅動力,從而使發光元件320朝正下方前進而轉移至載板C6,如圖3G所示。在本實施例中,由於第三層353a及第二層352a具有相對於第一層351a較高的光穿透率,因此相對較大部分的雷射光束LB可穿透第三層353a及第二層352a而到達第一層351a,從而提高雷射光束LB作用於第一層351a的光利用率。Next, referring to FIG. 3F , a carrier C6 is provided, and one surface of the carrier C6 is coated with an
接著,請參照圖3H,提供電路基板170,且電路基板170可以包括多個接墊170a、170b。之後,將發光元件320置於電路基板170上,並使發光元件320的電極321a、322a分別對接電路基板170的接墊170a、170b。Next, referring to FIG. 3H, a
在一些實施例中,於前述步驟之後還可以包括連接發光元件320的電極321a與電路基板170的接墊170a,以及電性連接320的電極322a與電路基板170的接墊170b。電性連接電極321a與接墊170a的方法以及電性連接電極322a與接墊170b的方法例如包括共晶接合或其他類似的方法,但本發明不以此為限。In some embodiments, after the aforesaid steps, it may further include connecting the
與圖1I所示的顯示裝置10相比,如圖3H所示的顯示裝置30的不同之處在於:在顯示裝置30中,開口O3位於發光元件320鄰近電路基板170的一側,開口O3採用電極321a、322a之間的間隔空間,因此開口O3不需額外使用微影蝕刻製程來形成,且開口O3位於發光元件320的非出光面。Compared with the
圖4A至圖4G為本發明一實施例的顯示裝置40的製造方法的步驟流程的剖面示意圖。以下沿用圖2A至圖2G的實施例的元件標號與相關內容,其中,採用相同的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明,可參考圖2A至圖2G的實施例,在以下的說明中不再重述。4A to FIG. 4G are schematic cross-sectional views of the steps of a method for manufacturing the
首先,請參照圖4A,提供生長於源基板110的發光元件420,發光元件420包括第一型半導體層421、第二型半導體層422、位於第一型半導體層421與第二型半導體層422之間的發光層423、以及分別與第一型半導體層421及第二型半導體層422電性連接的多個電極421a、422a。在本實施例中,多個電極421a、422a分別位於發光層423的相對兩側。也就是說,發光元件420為垂直式(Vertical)微型發光二極體。First, referring to FIG. 4A , a light-emitting
接著,請參照圖4B,於電極421a、第一型半導體層421、發光層423、第二型半導體層422以及電極422a中形成開口O4。在本實施例中,開口O4貫穿發光元件420的各個層,而具有更深的深度。如此一來,可增加後續形成於開口O4中的連接柱450a對發光元件420的支撐力,進而提升連接柱450a懸掛發光元件420時的穩定性。形成開口O4可採用多道蝕刻製程來實現,且可以視實際需求依序選用對發光元件420的各個層具有選擇性的蝕刻劑來形成開口O4。4B, an opening O4 is formed in the
接著,請參照圖4C,於發光元件420及源基板110上形成連接層450,且連接層450填入開口O4中。在本實施例中,可以依序形成第一層451、第二層452、第三層453以及第四層454而形成連接層450,其中第三層453的光吸收率大於第四層454的光吸收率,第四層454的光吸收率大於第二層452的光吸收率,且第二層452的光吸收率大於第一層451的光吸收率。連接層450中至少第三層453或第四層454是可與雷射光反應而分解的材料。Next, referring to FIG. 4C , a
在本實施例中,連接層450可以完全填滿開口O4,但本發明不以此為限。在一些實施例中,連接層450也可以填入局部的開口O4中。連接層450的第四層454可具有黏性,但本發明不以此為限。在一些實施例中,當連接層450的第四層454不具黏性時,可於第四層454上形成一層黏著層。In this embodiment, the
接著,請參照圖4D,於連接層450上貼附載板C7,此時發光元件420位於源基板110與載板C7之間,然後移除源基板110。Next, referring to FIG. 4D , the carrier C7 is attached on the
接著,請參照圖4E,移除大部分的連接層450,但保留開口O4與載板C7之間的部分連接層450,而形成連接柱450a,其中連接柱450a包括第一層451a、第二層452a、第三層453a以及第四層454a。Next, referring to FIG. 4E , most of the
接著,請參照圖4F,提供電路基板170,且電路基板170可以包括位於其表面上的多個接墊170a、170b。然後,將發光元件420與電路基板170對位,使得發光元件420位於載板C7與電路基板170之間,且發光元件420於電路基板170的正投影重疊電路基板170的接墊170b。之後,將雷射器180發出的雷射光束LB聚焦於連接柱450a的第三層453a,以例如燒毀第三層453a,從而使發光元件420能夠朝正下方落下而轉移至電路基板170上,並使發光元件420的電極422a直接接觸接墊170b。由於連接柱450a的第三層453a在連接柱450a中具有最大的光吸收率,因此,雷射光束LB可以藉由與第三層453a的反應而輕易地分解第三層453a。Next, referring to FIG. 4F, a
在一些實施例中,於前述步驟之後還可以包括電性連接發光元件420的電極422a與電路基板170的接墊170b。電性連接發光元件420的電極422a與電路基板170的接墊170b的方法例如包括共晶接合或其他類似的方法,但本發明不以此為限。In some embodiments, after the foregoing steps, it may further include electrically connecting the
接著,請參照圖4G,可先於電極422a與接墊170b靠近接墊170a的一側上形成絕緣層IS,之後再形成連接導線421c,即可完成本實施例的顯示裝置40。在本實施例中,連接導線421c連接發光元件420的電極421a與電路基板170的接墊170a,且絕緣層IS可避免連接導線421c與電極422a或接墊170b短路。Next, referring to FIG. 4G , the insulating layer IS can be formed on the side of the
與圖2G所示的顯示裝置20相比,如圖4G所示的顯示裝置40的不同之處在於:在顯示裝置40中,發光元件420為垂直式微型發光二極體;開口O4貫穿發光元件420的電極421a、第一型半導體層421、發光層423、第二型半導體層422以及電極422a而不具側向盲孔;以及連接柱450a包括多個層。另外,發光元件420的電極421a透過連接導線421c連接電路基板170的接墊170a,且發光元件420的電極422a直接連接電路基板170的接墊170b。Compared with the
綜上所述,本發明實施例的顯示裝置中,利用發光元件中的開口來調整雷射轉移過程中雷射光束的作用範圍,可使發光元件能夠準確地轉移至電路基板上,從而使顯示裝置具有準確巨量轉移的發光元件陣列。To sum up, in the display device of the embodiment of the present invention, the opening in the light-emitting element is used to adjust the action range of the laser beam during the laser transfer process, so that the light-emitting element can be accurately transferred to the circuit substrate, thereby enabling the display The device has an array of light-emitting elements that are accurately mass-transferred.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed above by the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, The protection scope of the present invention shall be determined by the scope of the appended patent application.
10、20、30、40:顯示裝置
110:源基板
120、220、320、420:發光元件
121、321、421:第一型半導體層
121a、321a、421a:電極
121b:接墊
121c、421c:連接導線
121S:表面
122、322、422:第二型半導體層
122a、322a、422a:電極
122b:接墊
122c:連接導線
123、323、423:發光層
130、330、340:黏著層
150、350、450:連接層
150a、350a、450a:連接柱
170:電路基板
170a、170b:接墊
171:底板
172:元件層
180:雷射器
351、351a、451、451a:第一層
352、352a、452、452a:第二層
353、353a、453、453a:第三層
454、454a:第四層
B1、B2、B3、B4:側向盲孔
BP:底部
C1、C2、C3、C4、C5、C6、C7:載板
D1:間距
Da:口徑
Dt:深度
IS:絕緣層
LB:雷射光束
NP:頸部
O1、O2、O3、O4:開口
T:主動元件
W:寬度
10, 20, 30, 40: Display device
110:
圖1A至圖1I為本發明一實施例的顯示裝置10的製造方法的步驟流程的剖面示意圖。
圖2A至圖2G為本發明一實施例的顯示裝置20的製造方法的步驟流程的剖面示意圖。
圖3A至圖3H為本發明一實施例的顯示裝置30的製造方法的步驟流程的剖面示意圖。
圖4A至圖4G為本發明一實施例的顯示裝置40的製造方法的步驟流程的剖面示意圖。
FIG. 1A to FIG. 1I are schematic cross-sectional views of the steps of a manufacturing method of a
10:顯示裝置 10: Display device
120:發光元件 120: Light-emitting element
121:第一型半導體層 121: first type semiconductor layer
121a:電極 121a: Electrodes
121b:接墊 121b: Pad
122:第二型半導體層 122: the second type semiconductor layer
122a:電極 122a: Electrodes
122b:接墊 122b: Pad
123:發光層 123: Light-emitting layer
150a:連接柱 150a: connecting column
170:電路基板 170: circuit substrate
170a、170b:接墊 170a, 170b: pads
171:底板 171: Bottom Plate
172:元件層 172: Component layer
Da:口徑 Da: caliber
Dt:深度 Dt: depth
O1:開口 O1: Opening
T:主動元件 T: Active element
W:寬度 W: width
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| TW201530809A (en) * | 2013-12-20 | 2015-08-01 | 樂福科技股份有限公司 | Light-emitting diode with current injection limited trench |
| US20190334058A1 (en) * | 2018-04-27 | 2019-10-31 | Facebook Technologies, Llc | Led surface modification with ultraviolet laser |
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| US20140061610A1 (en) * | 2012-08-31 | 2014-03-06 | Hyo-Young MUN | Organic light emitting device and manufacturing method thereof |
| TWI520376B (en) * | 2013-12-06 | 2016-02-01 | 隆達電子股份有限公司 | Method for manufacturing light-emitting diode element |
| WO2017220026A1 (en) * | 2016-06-23 | 2017-12-28 | 亿光电子工业股份有限公司 | Light emitting diode and manufacturing method therefor |
| CN112259495A (en) * | 2020-10-22 | 2021-01-22 | 绍兴同芯成集成电路有限公司 | A wafer printing process |
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| TW201530809A (en) * | 2013-12-20 | 2015-08-01 | 樂福科技股份有限公司 | Light-emitting diode with current injection limited trench |
| US20190334058A1 (en) * | 2018-04-27 | 2019-10-31 | Facebook Technologies, Llc | Led surface modification with ultraviolet laser |
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