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TWI753631B - Cooling system - Google Patents

Cooling system Download PDF

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Publication number
TWI753631B
TWI753631B TW109137509A TW109137509A TWI753631B TW I753631 B TWI753631 B TW I753631B TW 109137509 A TW109137509 A TW 109137509A TW 109137509 A TW109137509 A TW 109137509A TW I753631 B TWI753631 B TW I753631B
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Taiwan
Prior art keywords
cooling
cooling plate
flow channel
plate
channel structure
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TW109137509A
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Chinese (zh)
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TW202217024A (en
Inventor
黃一原
劉鎰誠
盧木森
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凌嘉科技股份有限公司
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Priority to TW109137509A priority Critical patent/TWI753631B/en
Application granted granted Critical
Publication of TWI753631B publication Critical patent/TWI753631B/en
Publication of TW202217024A publication Critical patent/TW202217024A/en

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Abstract

A processing system for processing a workpiece, comprising: a processing enclosure having an entrance end for receiving and an exit end for unloading a workpiece; a conveyor equipment that provides a returning path external of the process enclosure, the returning path is configured to move the workpiece from the exit end to the entrance end; and a cooling module in the returning path arranged in fluid communication with the ambient environment outside the processing enclosure. The cooling module includes: a heat dissipation plate having a cooling surface configured to contact the workpiece; and a liquid interface generating module arranged on the heat dissipation plate, configured to generate a liquid interface between the cooling surface and the workpiece.

Description

冷卻系統 cooling system

本公開涉及製程系統,並且特別地涉及具有冷卻裝置的鍍膜系統。 The present disclosure relates to process systems, and in particular, to coating systems with cooling devices.

真空鍍膜技術可以被應用在許多技術領域。舉例來說,PVD鍍膜技術可以被用在系統級封裝(System in package,SiP)的共形屏蔽(Conformal Shielding)製作,以達到微小化、輕量化、高效率防制電磁波干擾(Electro-magnetic interference,EMI)的效果。舉例來說,早期電子裝置(例如智能手機)的晶片模組(例如射頻前端模組(RF front end module),通訊模組(WiFi/BT),功率模組,或NAND Flash閃存記憶體等模組)的EMI屏蔽技術大多是採用電路板級(Board Level)的沖壓金屬屏蔽罩,但其占用PCB面積及電子裝置的內部空間;封裝級(Package Level)的共形屏蔽技術則是採用PVD鍍膜,將屏蔽層覆蓋於封裝芯片上。該共形屏蔽技術有幾項優點:1.減少封裝芯片受到相鄰元件的干擾或被干擾,尤其是5G高頻通訊,高速運算(HPC)等需求;2.封裝尺寸幾乎不變,節省裝置空間;3.縮短設計週期;4.提高生產效率,減少特殊遮罩部件加工與組裝成本。此外,真空鍍膜技術還可以用在可攜式3C電子裝置外殼上鍍覆防電磁波干擾(Electro-magnetic interference,EMI)鍍膜、甚或是在透明基板上鍍覆透明防電磁波干擾(Electro-magnetic interference,EMI)鍍膜或鍍覆有光學鍍膜(optical film)等情境。 Vacuum coating technology can be applied in many technical fields. For example, PVD coating technology can be used in the conformal shielding (Conformal Shielding) fabrication of system-in-package (SiP) to achieve miniaturization, light weight, and high-efficiency prevention of electromagnetic interference (Electro-magnetic interference). , EMI) effect. For example, chip modules (such as RF front end modules), communication modules (WiFi/BT), power modules, or NAND Flash flash memory modules of early electronic devices (such as smart phones) Most of the EMI shielding technologies at the board level use a stamped metal shield at the board level, but it occupies the PCB area and the internal space of the electronic device; the conformal shielding technology at the package level uses PVD coating. , and cover the shielding layer on the packaged chip. This conformal shielding technology has several advantages: 1. Reduce the interference or interference of the packaged chip by adjacent components, especially the requirements of 5G high-frequency communication, high-speed computing (HPC), etc.; 2. The package size is almost unchanged, saving equipment 3. Shorten the design cycle; 4. Improve production efficiency and reduce the processing and assembly costs of special mask components. In addition, the vacuum coating technology can also be used to coat an anti-electromagnetic interference (EMI) coating on the casing of a portable 3C electronic device, or even coat a transparent anti-electromagnetic interference (Electro-magnetic interference, EMI) coating on a transparent substrate. EMI) coating or coating with optical film (optical film) and other situations.

採用連續式多腔體(multi-chamber)PVD鍍膜技術的系統因為擁有速度快、產量高、鍍覆品質優良、良率高,及能大幅地降低生產成本等優點,而廣泛地應用於大規模生產的鍍膜製程中。然而,該系統執行鍍膜製程時,工件的載具常因處於電漿環境而升溫,從而可能影響或損壞鍍膜品質或待鍍物。 The system using continuous multi-chamber PVD coating technology is widely used in large-scale applications because of its advantages of high speed, high output, good coating quality, high yield, and the ability to greatly reduce production costs. in the coating process of production. However, when the system performs the coating process, the carrier of the workpiece is often heated up due to the plasma environment, which may affect or damage the quality of the coating or the object to be plated.

本公開的一方面提供了一種冷卻板,組配來承載待降溫物,包括:板體,其具有承載面,所述承載面具有兩側邊區域、及位於所述側邊區域之間的中央區域;第一流道結構,分佈在所述側邊區域,配置來輸送第一相態的流體,所述第一流道結構具有多個分佈在所述兩個側邊區域且開口形成在所述板體的承載面的噴口,所述噴口的設置位置避開所述中央區域;及第二流道結構,埋設於所述板體且對應所述中央區域,配置來輸送第二相態的流體;其中,在正交於所述側邊區域的方向上,所述板體的寬度小於所述待降溫物的寬度。 One aspect of the present disclosure provides a cooling plate assembled to support an object to be cooled, comprising: a plate body having a bearing surface, the bearing surface having two side regions, and a center located between the side regions region; a first flow channel structure distributed in the side region and configured to transport fluid in a first phase, the first flow channel structure having a plurality of distribution in the two side regions and openings formed in the plate a spout on the bearing surface of the body, the spout is arranged to avoid the central area; and a second flow channel structure, embedded in the plate body and corresponding to the central area, configured to transport the fluid in the second phase; Wherein, in the direction orthogonal to the side region, the width of the plate body is smaller than the width of the object to be cooled.

本公開的一方面提供了一種冷卻系統,配置來冷卻待降溫物,所述冷卻系統包含:冷卻模組,包括用來承載所述待降溫物的冷卻板,所述冷卻板具有兩側邊區域、及位於所述側邊區域之間的中央區域;感測模組,組配來感測所述冷卻板所在環境的溫度及濕度狀態其中至少一者,並產生感測結果;及處理模組,訊號連接所述感測模組及所述冷卻模組,配置來根據來自所述感測模組的感測結果,獲得所述環境的露點溫度條件,並控制所述冷卻模組的溫度設定,使所述冷卻板的溫度狀態不高於所述環境的露點溫度,藉此使冷卻板凝露。 An aspect of the present disclosure provides a cooling system configured to cool an object to be cooled, the cooling system comprising: a cooling module including a cooling plate for carrying the object to be cooled, the cooling plate having two side edge regions , and a central area between the side areas; a sensing module, configured to sense at least one of the temperature and humidity of the environment where the cooling plate is located, and generate a sensing result; and a processing module , the signal is connected to the sensing module and the cooling module, and is configured to obtain the dew point temperature condition of the environment according to the sensing result from the sensing module, and to control the temperature setting of the cooling module , so that the temperature state of the cooling plate is not higher than the dew point temperature of the environment, thereby condensing the cooling plate.

本公開的一方面提供了一種製程系統,配置來對工件進行製程, 包含製程站,包括入口端及出口端,組配來自該入口端接收所述工件,並由該出口端將所述工件移出該製程站;迴流設備,包括設置在該製程站外的迴流軌道,所述迴流軌道組配來使所述工件自所述出口端往所述入口端移動;及冷卻模組,設於所述迴流軌道且與外界環境流體連通。所述冷卻模組包括:冷卻板,具有組配來接觸所述工件的冷卻面,所述冷卻面定義有兩側邊區域、及位於所述側邊區域之間的中央區域;及液態介面生成模組,設於所述冷卻板,且組配來在所述冷卻面及所述工件之間生成液態介面。 One aspect of the present disclosure provides a process system configured to process a workpiece, Including a process station, including an inlet end and an outlet end, and assembled from the inlet end to receive the workpiece, and the outlet end to move the workpiece out of the process station; reflow equipment, including a reflow track set outside the process station, The return track is assembled to move the workpiece from the outlet end to the inlet end; and a cooling module is arranged on the return track and is in fluid communication with the external environment. The cooling module includes: a cooling plate with a cooling surface configured to contact the workpiece, the cooling surface defines two side regions and a central region between the side regions; and a liquid interface generation The module is arranged on the cooling plate and assembled to generate a liquid interface between the cooling surface and the workpiece.

100:製程系統 100: Process System

11:製程站 11: Process Station

111:真空腔體 111: Vacuum chamber

111a:緩衝區間 111a: between buffers

111b:鍍膜區間 111b: Coating interval

112:陰極濺鍍靶組合 112: Cathode sputtering target combination

112a:靶材 112a: Target

113:傳輸機構 113: Transmission Mechanism

114:入口閥門 114: Inlet valve

115:出口閥門 115: Outlet valve

116:載出腔 116: Load Out Cavity

117:載入腔 117: Load Cavity

118:預處理腔 118: Pretreatment cavity

12:迴流設備 12: Reflow equipment

121、122:升降裝置 121, 122: Lifting device

123:迴流軌道 123: Return Track

1231:沉降段 1231: Settlement Section

1232:攀升段 1232: Climbing segment

1233:中繼段 1233: hop

100a:冷卻系統 100a: Cooling system

100b、100c:冷卻系統 100b, 100c: Cooling system

14:準直式溫度計 14: Collimating Thermometer

x、y、z:方向 x, y, z: direction

C:載具 C: vehicle

200b:冷卻系統 200b: Cooling System

2233:中繼段 2233: hop

223a:輸送輪 223a: Conveyor Wheel

25:驅動機構 25: Drive mechanism

210:冷卻板 210: Cooling Plate

216:凹口 216: Notch

300b:冷卻系統 300b: Cooling System

31:冷卻模組 31: Cooling Module

310:冷卻板 310: Cooling Plate

311:板體 311: Board body

311a:側邊區域 311a: Side Area

311b:中央區域 311b: Central Area

316:凹口 316: Notch

314:流體供應系統 314: Fluid Supply Systems

312:第一流道結構 312: First runner structure

313:第二流道結構 313: Second runner structure

312a:噴口 312a: spout

315:緩衝腔室 315: Buffer chamber

41a、41b、42a、42b:曲線 41a, 41b, 42a, 42b: Curves

501、502:曲線 501, 502: Curves

610:冷卻板 610: Cooling Plate

611:板體 611: Board body

611c:主板層 611c: Motherboard layer

611d:上板層 611d: Upper board layer

611c’:主板層 611c’: Motherboard layer

611d’:上板層 611d’: Upper board layer

611e:下子層 611e: Lower sublayer

611f:上子層 611f: Upper sublayer

613a:溝道 613a: Trench

613c:第二流道結構 613c: Second runner structure

710:冷卻板 710: Cooling Plate

711:板體 711: Board body

711a:側邊區域 711a: Side Area

711b:中央區域 711b: Central Area

716:凹口 716: Notch

712:第一流道結構 712: First runner structure

712x:第一方向流道 712x: first direction runner

712y:第二方向流道 712y: second direction runner

712z:第三方向流道 712z: 3rd directional runner

810:冷卻板 810: Cooling Plate

811:板體 811: Board body

811a:側邊區域 811a: Side Area

811b:中央區域 811b: Central Area

812:第一流道結構 812: First runner structure

812x:第一方向流道 812x: first direction runner

812y:第二方向流道 812y: second direction runner

812z:第三方向流道 812z: 3rd directional runner

812c:進氣道 812c: Intake port

813:第二流道結構 813: Second runner structure

911:板體 911: Board body

911a:側邊區域 911a: Side Area

911b:中央區域 911b: Central Area

912:第一流道結構 912: First runner structure

912x:第一方向流道 912x: first direction runner

912y:第二方向流道 912y: second direction runner

912z:第三方向流道 912z: 3rd directional runner

912c:進氣道 912c: Air intake

913a:溝道 913a: Channel

913b:溝道蓋板 913b: Channel Cover

D1:第一深度 D 1 : first depth

D2:第二深度 D 2 : Second depth

為可仔細理解本案以上記載之特徵,參照實施態樣可提供簡述如上之本案的更特定描述,一些實施態樣係說明於隨附圖式中。然而,要注意的是,隨附圖式僅說明本案的典型實施態樣並且因此不被視為限制本案的範圍,因為本案可承認其他等效實施態樣。 For a detailed understanding of the above-described features of the present case, a more specific description of the present case, briefly described above, may be provided with reference to embodiments, some of which are illustrated in the accompanying drawings. It is to be noted, however, that the appended drawings illustrate only typical implementations of this case and are therefore not to be considered limiting of its scope, as this case may admit other equivalent implementations.

圖1示出了根據本公開的一些實施例的製程系統的示意圖;圖2示出了根據本公開的一些實施例的冷卻系統的立體示意圖;圖3示出了根據本公開的一些實施例的冷卻系統的俯視示意圖;圖4a及4b分別示出了根據本公開的一些實施例的實驗數據;圖5示出了根據本公開的一些實施例的模擬實驗數據;圖6a及6b分別示出了根據本公開的一些實施例的冷卻板的剖示示意圖;圖7示出了根據本公開的一些實施例的冷卻板的立體示意圖;圖8示出了根據本公開的一些實施例的冷卻板的仰視示意圖;及圖9示出了根據本公開的一些實施例的冷卻板的剖示示意圖。 Figure 1 shows a schematic diagram of a process system according to some embodiments of the present disclosure; Figure 2 shows a schematic perspective view of a cooling system according to some embodiments of the present disclosure; Figure 3 shows a schematic diagram of a cooling system according to some embodiments of the present disclosure Schematic top view of the cooling system; Figures 4a and 4b respectively show experimental data according to some embodiments of the present disclosure; Figure 5 shows simulated experimental data according to some embodiments of the present disclosure; Figures 6a and 6b respectively show A schematic cross-sectional view of a cooling plate according to some embodiments of the present disclosure; FIG. 7 shows a schematic perspective view of a cooling plate according to some embodiments of the present disclosure; FIG. 8 shows a schematic diagram of a cooling plate according to some embodiments of the present disclosure and FIG. 9 shows a schematic cross-sectional view of a cooling plate according to some embodiments of the present disclosure.

然而,應注意的是,附圖僅示出了本公開的示例性實施例,並且因此不應被認為是對其範圍的限制,因為本公開可以允許其他等效的實施例。 It is to be noted, however, that the appended drawings illustrate only exemplary embodiments of this disclosure and are therefore not to be considered limiting of its scope, for the disclosure may admit to other equally effective embodiments.

應該注意的是,這些附圖意在說明在某些示例實施例中使用的方法,結構和/或材料的一般特性,並補充下面提供的書面描述。然而,這些附圖不是按比例繪製的,並且可能不能精確地反映任何給定實施例的精確的結構或性能特徵,並且不應被解釋為定義或限制示例實施例所涵蓋的值或特性的範圍。例如,為了清楚起見,可以減小或放大層,區域和/或結構元件的相對厚度和位置。在各個附圖中使用相似或相同的附圖標記旨在指示相似或相同的元件或特徵的存在。 It should be noted that these drawings are intended to illustrate the general characteristics of the methods, structures and/or materials used in certain example embodiments and to supplement the written description provided below. These drawings, however, are not to scale and may not accurately reflect the precise structural or performance characteristics of any given embodiment, and should not be construed to define or limit the range of values or characteristics encompassed by example embodiments . For example, the relative thicknesses and positions of layers, regions and/or structural elements may be reduced or exaggerated for clarity. The use of similar or identical reference numbers throughout the various figures is intended to indicate the presence of similar or identical elements or features.

以下描述將參考附圖以更全面地描述本公開內容。附圖中所示為本公開的示例性實施例。然而,本公開可以以許多不同的形式來實施,並且不應所述被解釋為限於在此闡述的示例性實施例。提供這些示例性實施例是為了使本公開透徹和完整,並且將本公開的範圍充分地傳達給本領域技術人員。類似的附圖標記表示相同或類似的元件。 The following description will refer to the accompanying drawings to more fully describe the present disclosure. Exemplary embodiments of the present disclosure are shown in the accompanying drawings. This disclosure may, however, be embodied in many different forms and should not be construed as limited to the exemplary embodiments set forth herein. These exemplary embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art. Like reference numbers refer to the same or similar elements.

本文使用的術語僅用於描述特定示例性實施例的目的,而不意圖限制本公開。如本文所使用的,除非上下文另外清楚地指出,否則單數形式“一”,“一個”和“所述”旨在也包括複數形式。此外,當在本文中使用時,“包括”和/或“包含”或“包括”和/或“包括”或“具有”和/或“具有”,整數,步驟,操作,元件和/或組件,但不排除存在或添加一個或多個其它特徵,區域,整數,步驟,操作,元件,組件和/或其群組。 The terminology used herein is for the purpose of describing particular exemplary embodiments only and is not intended to limit the present disclosure. As used herein, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. Furthermore, when used herein, "include" and/or "include" or "include" and/or "include" or "have" and/or "have", integers, steps, operations, elements and/or components , but does not preclude the presence or addition of one or more other features, regions, integers, steps, operations, elements, components and/or groups thereof.

除非另外定義,否則本文使用的所有術語(包括技術和科學術語)具有與本公開所屬領域的普通技術人員通常理解的相同的含義。此外,除非文中明確定義,諸如在通用字典中定義的那些術語應所述被解釋為具有與其在相關技術和本公開內容中的含義一致的含義,並且將不被解釋為理想化或過於正式的含義。 Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. Furthermore, unless explicitly defined in context, terms such as those defined in general dictionaries are to be said and construed as having meanings consistent with their meanings in the related art and this disclosure, and are not to be construed as idealized or overly formal meaning.

將結合圖1至圖9中的附圖對示例性實施例進行描述。具體實施方式將參考附圖來詳細描述本公開,其中,所描繪的元件不必按比例示出,並且通過若干視圖,相同或相似的附圖標記由相同或相似的附圖標記表示相同或相似的元件。 Exemplary embodiments will be described in conjunction with the drawings in FIGS. 1 to 9 . DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present disclosure will be described in detail with reference to the accompanying drawings, wherein the depicted elements are not necessarily to scale and wherein the same or similar reference numerals are designated by the same or similar reference numerals throughout the several views element.

圖1示出了根據本公開的一些實施例的製程系統的示意圖。為了說明簡單和清楚起見,示例性系統的一些細節/子組件未在本圖中明確標記/示出。 1 shows a schematic diagram of a process system in accordance with some embodiments of the present disclosure. For simplicity and clarity of illustration, some details/subcomponents of the exemplary system are not explicitly labeled/shown in this figure.

參閱圖1,製程系統100包括用來對工件進行製程的製程站11。 在一些實施例中,製程站(例如製程站11)組配來(configured to)對工件(例如載具C以及承載其上的待鍍物)進行鍍膜,並包含真空腔體(例如真空腔體111)、設於所述真空腔體的陰極濺鍍靶組合(例如陰極濺鍍靶組合112)、及組配來運輸工件(例如載具C以及承載其上的待鍍物)的傳輸機構113。 Referring to FIG. 1, a processing system 100 includes a processing station 11 for processing workpieces. In some embodiments, a process station (eg, process station 11 ) is configured to coat a workpiece (eg, carrier C and the object to be plated thereon), and includes a vacuum chamber (eg, a vacuum chamber) 111), a cathode sputtering target assembly (eg, cathode sputtering target assembly 112 ) disposed in the vacuum chamber, and a transport mechanism 113 configured to transport the workpiece (eg, the carrier C and the objects to be plated thereon) .

在一些實施例中,製程系統100被實施為一種具有連續式多腔體(multi-chamber)的鍍膜系統,其中真空腔體(例如真空腔體111)包括多個交替設置的緩衝區間(例如緩衝區間111a)及鍍膜區間(例如鍍膜區間111b),且各該鍍膜區間的兩端皆設有該緩衝區間。例如,真空腔體111具有沿排列方向x交替設置的四個緩衝區間111a及三個鍍膜區間111b。 In some embodiments, the process system 100 is implemented as a coating system having a continuous multi-chamber, wherein a vacuum chamber (eg, vacuum chamber 111 ) includes a plurality of alternately arranged buffer spaces (eg, buffer chambers) section 111a) and a coating section (eg, coating section 111b), and both ends of each coating section are provided with the buffer section. For example, the vacuum chamber 111 has four buffer zones 111a and three coating zones 111b alternately arranged along the arrangement direction x.

製程站11包含入口端(例如入口閥門114)及出口端(例如出口閥門115),分別供工件進入及移出該製程站。在圖示的實施例中,該入口端(例如入口閥門114)設置於該真空腔體11對應於第一個緩衝區111a之一端(即,如圖1所顯示之最左側的緩衝區間111a的左端)。該出口端(例如出口閥門115)設置於該真空腔體11對應於最末個緩衝區間111a之另一端(即,如圖1所顯示之最右側的緩衝區間111a的右端)。 The processing station 11 includes an inlet port (eg, inlet valve 114 ) and an outlet port (eg, outlet valve 115 ) for workpieces to enter and remove the processing station, respectively. In the illustrated embodiment, the inlet end (eg, the inlet valve 114 ) is disposed at one end of the vacuum chamber 11 corresponding to the first buffer zone 111 a (ie, the leftmost buffer zone 111 a as shown in FIG. 1 ) left end). The outlet end (eg, the outlet valve 115 ) is disposed at the other end of the vacuum chamber 11 corresponding to the last buffer space 111 a (ie, the right end of the rightmost buffer space 111 a as shown in FIG. 1 ).

在一些實施例中,所述製程站100還包含至少一個耦接於該真空腔體11的抽真空單元(圖未示出),組配來對所述真空腔體11抽真空,以令該真空腔體11之各緩衝區間111a與各鍍膜區間111b具有一工作壓力。 In some embodiments, the process station 100 further includes at least one vacuum unit (not shown in the figure) coupled to the vacuum chamber 11, and configured to vacuum the vacuum chamber 11, so that the vacuum chamber 11 can be evacuated. Each buffer space 111a and each coating space 111b of the vacuum chamber 11 have a working pressure.

在圖示的實施例中,所述陰極濺鍍靶組合112的數量為三,分別地設置於所述鍍膜區間111b,即該等待鍍物進行鍍膜的位置,換言之,該製程站11可以同時對三個待鍍物進行鍍膜製程。每一陰極濺鍍靶組合112具有至少一靶材(例如靶材112a)。例如,在一些實施例中,陰極濺鍍靶組合12具有兩個靶材112a;該等靶材112a可以包含相同或不同的材料。在一些操作情況中,所述待鍍物可以是封裝元件、光學元件、或電子產品的機殼等等。 In the illustrated embodiment, the number of the cathode sputtering target combinations 112 is three, which are respectively disposed in the coating section 111b, that is, the positions where the objects to be coated are coated. In other words, the process station 11 can simultaneously process The three objects to be plated are subjected to the coating process. Each sputtering target assembly 112 has at least one target (eg, target 112a). For example, in some embodiments, the sputtering target assembly 12 has two targets 112a; the targets 112a may comprise the same or different materials. In some operating situations, the object to be plated may be a package element, an optical element, or a housing of an electronic product, or the like.

該傳輸機構113設置於該真空腔體11,並且在所述x方向上延伸經過該等緩衝區間111a及該等鍍膜區間111b。該傳輸機構113組配來傳輸工件(例如載具C以及承載其上的待鍍物),使得該等工件在真空腔體11中於所述x方向上移動。該傳輸機構113可以被設計為同時使所述多個載具C分別地停留、前進或後退。例如,傳輸機構113可以被實施為包含多個組配來傳輸工件的輸送組件(例如多個在所述x方向上排列的滾輪)、及多個組配來驅動所述輸送組件的驅動元件(例如馬達);各該緩衝區間111a與各該鍍膜區間111b皆設置有一個該輸送組件。藉由控制各該驅動元件的作動或不作動,可以達到使各該載具C在所述x方向上停留、前進或後退的效果。在其他實施例中,輸送組件可以具有多個在所述x方向上排列的滾輪、輸送帶或其組合。 The transmission mechanism 113 is disposed in the vacuum chamber 11 and extends through the buffer spaces 111 a and the coating spaces 111 b in the x-direction. The transfer mechanism 113 is configured to transfer the workpieces (eg, the carrier C and the objects to be plated thereon), so that the workpieces move in the x-direction in the vacuum chamber 11 . The transfer mechanism 113 may be designed to simultaneously stop, advance or reverse the plurality of carriers C, respectively. For example, the transfer mechanism 113 may be implemented to include a plurality of conveying assemblies (eg, a plurality of rollers arranged in the x-direction) configured to transfer workpieces, and a plurality of driving elements (eg, a plurality of driving elements configured to drive the conveying assemblies) For example, a motor); each of the buffer zones 111a and each of the coating zones 111b is provided with one of the conveying components. By controlling the actuation or non-actuation of each of the driving elements, the effect of making each of the carriers C stay, advance or retreat in the x-direction can be achieved. In other embodiments, the conveyor assembly may have a plurality of rollers, conveyor belts, or a combination thereof aligned in the x-direction.

在一些實施例中,在執行各鍍膜程序前,該傳輸機構113令各載具C沿該排列方向x行經該入口閥門114並依序輪流進入該等緩衝區間111a與該等鍍膜區間111b,以便執行各鍍膜程序。於執行鍍膜程序期間,該傳輸機構113將載具C於該鍍膜區間111b(於此區間載具C將暴露在靶材112a下的電漿環境)及位於其前後的兩緩衝區間111a(於此區間載具C將遠離靶材 112a)三者間往復移動。如此,可避免待鍍物因長時間連續暴露在靶材112a下的電漿環境中,從而減緩待鍍物過熱的問題。可以視製程需求設定來回位移的次數,或是停留在各緩衝區間111a內的時間。此外,各載具13能對應在各鍍膜區間111b同步執行各鍍膜程序,可避免鍍膜區間111b處於閒置狀態,故能夠有效地提高產能並縮減無效工時。 In some embodiments, before each coating process is performed, the conveying mechanism 113 makes each carrier C pass through the inlet valve 114 along the arrangement direction x and enter the buffer spaces 111 a and the coating spaces 111 b in turn in turn, so that Perform each coating procedure. During the coating process, the transmission mechanism 113 moves the carrier C in the coating area 111b (in this area the carrier C will be exposed to the plasma environment under the target 112a) and the two buffer areas 111a before and after it (in this area). Interval vehicle C will be far away from the target 112a) Reciprocating movement among the three. In this way, the object to be plated can be prevented from being continuously exposed to the plasma environment under the target material 112a for a long time, thereby reducing the problem of overheating of the object to be plated. The number of back-and-forth displacements, or the time spent in the buffer zones 111a can be set according to process requirements. In addition, each carrier 13 can synchronously execute each coating procedure corresponding to each coating section 111b, which can prevent the coating section 111b from being in an idle state, thereby effectively improving productivity and reducing ineffective man-hours.

在一些實施例中,該製程站11還包括載出腔116及載入腔117。 此外,該製程站11還具有兩抽氣幫浦(圖未示出),分別耦接於該載出腔116與該載入腔117,組配來使該載出腔116與該載入腔117內的壓力分別實質趨近於位於兩相反端的兩個緩衝區間111a內的工作壓力。在本實施例中,該傳輸機構113不僅在x方向上延伸經過該真空腔體111,更進一步擴及載出腔116與載入腔117,以便將載具C連同待鍍物在該真空腔體111、載出腔116、載入腔117之間移動。在一些實施例中,該製程站11還包括預處理腔118,其銜接該真空腔體111的入口閥門114,用來對待鍍物進行電漿處理(例如蝕刻,表面清潔或表面活化改質等製程)。在一些操作情境中,在預處理腔118執行的所述蝕刻工藝可以用來去除於前次鍍膜程序中殘留在該載具C週緣處的鍍膜物。 In some embodiments, the process station 11 further includes a load-out chamber 116 and a load-in chamber 117 . In addition, the process station 11 also has two pumping pumps (not shown in the figure), which are respectively coupled to the load-out chamber 116 and the load-in chamber 117 , and are assembled to make the load-out chamber 116 and the load-in chamber 116 . The pressure in 117 is substantially close to the working pressure in the two buffer spaces 111a at opposite ends respectively. In this embodiment, the transfer mechanism 113 not only extends through the vacuum chamber 111 in the x direction, but also extends to the load-out chamber 116 and the load-in chamber 117 , so as to transfer the carrier C and the object to be plated in the vacuum chamber The body 111 , the load-out cavity 116 , and the load-in cavity 117 move among them. In some embodiments, the process station 11 further includes a pretreatment chamber 118, which is connected to the inlet valve 114 of the vacuum chamber 111, and is used for plasma treatment (eg, etching, surface cleaning or surface activation modification, etc.) of the object to be plated. Process). In some operational scenarios, the etching process performed in the pretreatment chamber 118 may be used to remove the coating material remaining on the periphery of the carrier C in the previous coating process.

製程系統100還包括迴流設備12,其組配來運輸工件(例如載具C及待鍍膜物),使其自該出口端(例如出口閥門115)往該入口端(例如入口閥門114)移動。該迴流設備12包含迴流軌道123,其組配來使工件(例如載具C及待鍍膜物)自所述載出腔116往所述載入腔117移動。在圖示的實施例中,該迴流軌道123具有鄰近載出腔116的沉降段1231、鄰近載入腔117的攀升段1232、及配置在該製程站11的下方並且位於該沉降段1231與該攀升段1232之間的中繼段1233。此外,該迴流設備12還更包括升降裝置121、122,其分別用來驅動該沉降段1231與該攀升段1232的升降移動。在一 些實施例中,升降裝置121、122可以是氣壓缸式升降裝置,電動缸式升降裝置,或是螺桿式驅動升降裝置。在一些實施例中,該沉降段1231、該攀升段1232、及該中繼段1233三者分別具有一輸送組件(例如相同於前述傳輸機構的輸送組件),及一用以驅動其輸送組件的驅動元件(例如馬達)。 The process system 100 also includes a reflow apparatus 12 configured to transport workpieces (eg, carrier C and objects to be coated) from the outlet end (eg, outlet valve 115 ) to the inlet end (eg, inlet valve 114 ). The reflow apparatus 12 includes a reflow track 123 configured to move the workpiece (eg, the carrier C and the object to be coated) from the load-out cavity 116 to the load-in cavity 117 . In the illustrated embodiment, the return track 123 has a settling section 1231 adjacent to the load-out chamber 116, a climbing section 1232 adjacent to the load-out cavity 117, and is disposed below the process station 11 and located between the settling section 1231 and the settling section 1232. Relay segment 1233 between climb segments 1232 . In addition, the return device 12 further includes lifting devices 121 and 122 , which are respectively used to drive the lifting and lowering of the settling section 1231 and the climbing section 1232 . In a In some embodiments, the lifting devices 121 and 122 may be pneumatic cylinder lifting devices, electric cylinder lifting devices, or screw driving lifting devices. In some embodiments, the settling section 1231, the climbing section 1232, and the relay section 1233 respectively have a conveying component (eg, the same as the conveying component of the aforementioned transmission mechanism), and a conveying component for driving the conveying component. Drive elements (eg motors).

鍍膜程序結束後,該傳輸機構113將載具C連同待鍍物依序送往該出口閥門115、該載出腔116、及該沉降段1231上,接著,可以透過一機械手臂或人工方式拿取完成品並淨空載具C。然後,沉降段1231受升降裝置121驅動連同載具C向下移動至與中繼段1233銜接,使得載具C可以藉由該中繼段1233被輸送至該攀升段1232。攀升段1232在接收來自該中繼段1233的載具C後,受升降裝置122驅動連同載具C向上移動,並且將載具C輸送至該載入腔117,以便使載具C重新接收待鍍物及再次執行各鍍膜程序。 After the coating process is finished, the transmission mechanism 113 sends the carrier C and the object to be plated to the outlet valve 115, the load-out cavity 116, and the settling section 1231 in sequence. Take the finished product and clear Vehicle C. Then, the settling section 1231 is driven by the lifting device 121 and moves downward together with the carrier C to engage with the relay section 1233 , so that the carrier C can be conveyed to the climbing section 1232 through the relay section 1233 . After the climbing section 1232 receives the carrier C from the relay section 1233, it is driven by the lifting device 122 to move upward together with the carrier C, and transports the carrier C to the loading cavity 117, so that the carrier C can receive the waiting Coating and performing each coating procedure again.

製程系統100還包括組配來冷卻載具C及承載於其上待鍍物/工件的冷卻系統(例如冷卻系統100a),其設置在所述真空腔體111的該等緩衝腔體111a其中一者內。在圖示的實施例中,冷卻系統100a位於最接近所述出口閘門115的緩衝腔體111a內。在其他的實施例中,冷卻系統位於鄰近所述出口閘門115的鍍膜區間111b兩側之緩衝腔體111a內。在這樣的實施例中,載具C及承載其上的待鍍物在抵達冷卻系統100a之前,已經在三個鍍膜區間111b中執行過鍍膜程序,故具有相對較高溫度狀態,使得冷卻系統100a及載具C之間產生較大的溫差,從而提升降溫效率。在一些實施例中,冷卻系統100a位於所述傳輸機構113的傳輸路徑,且載具C連同待鍍物可以被傳輸機構113運送至該冷卻系統100a上方;當冷卻系統100a接收載具C連同待鍍物時可以將其冷卻。在一些實施例中,所述第一冷卻系統100a可以是組配來與所述載具C接觸的液冷式的冷卻系統。 The process system 100 further includes a cooling system (eg, a cooling system 100 a ) configured to cool the carrier C and the object/workpiece to be plated thereon, which is disposed in one of the buffer chambers 111 a of the vacuum chamber 111 within. In the illustrated embodiment, the cooling system 100a is located within the buffer cavity 111a closest to the outlet gate 115 . In other embodiments, the cooling system is located in the buffer cavity 111 a adjacent to the two sides of the coating area 111 b of the outlet gate 115 . In such an embodiment, the carrier C and the objects to be plated carried on it have already performed the coating process in the three coating sections 111b before reaching the cooling system 100a, so they have a relatively high temperature state, so that the cooling system 100a has a relatively high temperature state. A large temperature difference is generated between the vehicle and the carrier C, thereby improving the cooling efficiency. In some embodiments, the cooling system 100a is located in the conveying path of the conveying mechanism 113, and the carrier C and the object to be plated can be transported by the conveying mechanism 113 to the top of the cooling system 100a; when the cooling system 100a receives the carrier C together with the object to be plated It can be cooled while plating. In some embodiments, the first cooling system 100a may be a liquid-cooled cooling system configured to contact the carrier C.

在圖示的實施例中,該製程系統100還包含準直式光學高溫度 計(Optical pyrometer)14,其安裝在所述真空腔體111且位置對應於所述冷卻系統100a,組配來量測位於所述冷卻系統100a上的載具C所乘載的待鍍物的溫度狀態。在圖示的實施例中,所述準直式光學溫度計14位於所述冷卻系統100a正上方。在一些實施例中,該製程系統還包含處理模組(圖未示出,可以包含一個或多個處理器),數據連接所述準直式光學溫度計14及所述冷卻系統100a,組配來根據所述準直式光學溫度計14的感測結果動態地控制所述冷卻系統100a的參數(例如供液的溫度設定);在這樣的實施例當中,可以減少待鍍物的溫度狀態的變異性,從而提升成品的良率。 In the illustrated embodiment, the process system 100 also includes a collimated optical high temperature An Optical pyrometer 14, which is installed in the vacuum chamber 111 and whose position corresponds to the cooling system 100a, is configured to measure the amount of the object to be plated carried by the carrier C on the cooling system 100a. temperature status. In the illustrated embodiment, the collimated optical thermometer 14 is located directly above the cooling system 100a. In some embodiments, the process system further includes a processing module (not shown in the figure, may include one or more processors), which is data-connected to the collimated optical thermometer 14 and the cooling system 100a, and is assembled to The parameters of the cooling system 100a (eg, the temperature setting of the liquid supply) are dynamically controlled according to the sensing results of the collimated optical thermometer 14; in such an embodiment, the variability of the temperature state of the object to be plated can be reduced , thereby improving the yield of finished products.

製程系統100還包括設置在所述迴流設備12的冷卻系統100b、100c,其組配來對處於迴流設備12的載具C進行降溫。需說明者,冷卻系統100b、100c安裝在所述迴流設備12的位置是與外界(例如,暴露於製程系統100所在的廠房環境)流體連通。舉例來說,第二冷卻系統100b、100c可被設置在所述迴流軌道123的中繼段1233,而所述中繼段1233可被設置在開放式機架(圖未示出)上而與外界流體連通(例如,大氣連通)。在一些實施例中,所述迴流軌道123的整體皆與外界流體連通。相似於所述冷卻系統100a,所述冷卻系統100b、100c分別組配來對(被所述中繼段1233運送至)其上的載具C進行降溫。 The process system 100 further includes cooling systems 100 b and 100 c disposed in the reflow apparatus 12 , which are configured to cool the carrier C in the reflow apparatus 12 . It should be noted that the cooling systems 100b and 100c are installed at the location of the reflow apparatus 12 to be in fluid communication with the outside world (eg, exposed to the plant environment where the process system 100 is located). For example, the second cooling system 100b, 100c may be disposed on the hop 1233 of the return track 123, and the hop 1233 may be placed on an open rack (not shown) to be connected with the External fluid communication (eg, atmospheric communication). In some embodiments, the entirety of the return track 123 is in fluid communication with the outside world. Similar to the cooling system 100a, the cooling systems 100b, 100c are respectively assembled to cool the carrier C (transported by the hop 1233) thereon.

在一些實施例中,所述製程系統100還具有設置在所述所述冷卻系統(例如冷卻系統100b)的溫度傳感器(例如圖3所示的溫度傳感器321)、以及與所述冷卻系統(例如冷卻系統100b)及所述溫度傳感器數據連接的處理模組(例如圖3所示的處理模組33)。所述處理模組組配來根據溫度傳感器的感測結果動態控制所述冷卻系統(例如冷卻系統100b)的溫度設定,例如藉由控制冷卻系統(例如冷卻系統100b)的液冷系統的流體輸出(例如液體的溫度或流量設定)來控制冷卻系統(例如冷卻系統100b)的冷卻板的溫度 設定。如此能持續根據載具C溫度狀態來即時的調控所述冷卻系統(例如冷卻系統100b)的溫度設定,藉此動態地調整載具溫度狀態。在一些情況中,進料前載具C可容許的最高溫度於為40℃;在一些實施態樣中,所述溫度為30℃以下。在一些實施態樣中,所述溫度為25℃以下。在一些實施態樣中,所述溫度為20℃以下。 In some embodiments, the process system 100 further includes a temperature sensor (eg, the temperature sensor 321 shown in FIG. 3 ) disposed in the cooling system (eg, the cooling system 100b ), and a temperature sensor (eg, the temperature sensor 321 shown in FIG. The cooling system 100b) and the processing module (eg, the processing module 33 shown in FIG. 3 ) to which the temperature sensor data is connected. The processing module is configured to dynamically control the temperature setting of the cooling system (eg, the cooling system 100b ) according to the sensing result of the temperature sensor, for example, by controlling the fluid output of the liquid cooling system of the cooling system (eg, the cooling system 100b ) (eg temperature or flow settings of the liquid) to control the temperature of the cooling plates of the cooling system (eg cooling system 100b) set up. In this way, the temperature setting of the cooling system (eg, the cooling system 100b ) can be continuously adjusted in real time according to the temperature state of the carrier C, thereby dynamically adjusting the temperature state of the carrier. In some cases, the maximum allowable temperature of Carrier C before feeding is 40°C; in some embodiments, the temperature is below 30°C. In some embodiments, the temperature is below 25°C. In some embodiments, the temperature is below 20°C.

在圖示的實施例中,冷卻系統100b的安裝位置可以被設計為鄰近所述載出腔116,以就近承接高溫載具C,致使冷卻系統100b及載具C之間產生較大的溫差(例如60~70度C),藉此提升降溫效率。例如,在圖示的實施例中,冷卻系統100b設置在所述中繼段1233的首端(位於圖1的右方的末端)。另一方面,冷卻系統100c的安裝位置可以被設計為鄰近所述載入腔117,如此,可以在運送載具C進入載入腔117(進料)前準確控制載具C的溫度狀態(例如處於25℃),有利於維持鍍膜製程條件的一致性。例如,在圖示的實施例中,冷卻系統100c設置在所述中繼段1233的尾端(位於圖1的左方的末端)。 In the illustrated embodiment, the installation position of the cooling system 100b can be designed to be adjacent to the load-out cavity 116 to receive the high-temperature carrier C nearby, resulting in a large temperature difference between the cooling system 100b and the carrier C ( For example, 60~70 degrees C), thereby improving the cooling efficiency. For example, in the illustrated embodiment, the cooling system 100b is provided at the head end of the hop 1233 (the end on the right in FIG. 1 ). On the other hand, the installation position of the cooling system 100c can be designed to be adjacent to the loading chamber 117, so that the temperature state of the carrier C can be accurately controlled before the carrier C enters the loading chamber 117 (feeding) (eg, at 25°C), which is conducive to maintaining the consistency of the coating process conditions. For example, in the illustrated embodiment, the cooling system 100c is disposed at the trailing end of the hop 1233 (the left end in FIG. 1).

在一些實施例中,所述冷卻系統100b或100c可擇一組配來對(被所述中繼段1233運送至)其上的載具C進行降溫。例如,在一些實施例中,製程系統僅配置冷卻系統100b。在這樣的態樣中,即使載具在被冷卻系統100b冷卻時背面沾附些微的露水(詳述於後),則在載具被輸送至進料端的過程中,露水已經蒸發,如此能避免露水影響載入腔的真空狀態;此外能使載具的溫度狀態不至於低於室溫,能減輕載具表面結露的狀況。 In some embodiments, the cooling system 100b or 100c may select a set of pairings to cool the carrier C (transported by the hop 1233) thereon. For example, in some embodiments, the process system only configures the cooling system 100b. In such a state, even if the backside of the carrier is cooled by the cooling system 100b with a little dew on the back (described in detail later), the dew has evaporated in the process of the carrier being transported to the feed end, which can avoid The dew affects the vacuum state of the loading cavity; in addition, the temperature state of the carrier can not be lower than the room temperature, which can reduce the dew condensation on the surface of the carrier.

圖2示出了根據本公開的一些實施例的冷卻系統的示意圖。為了說明簡單和清楚起見,示例性系統的一些細節/子組件未在本圖中明確標記/示出。冷卻系統200b可以被設置在迴流設備(例如迴流設備12)而與外界流體連通。例如,圖2所示的冷卻系統200b被設置在中繼段2233的鄰接沉降段 (例如沉降段1231)的一端。為了顯示出所述中繼段2233、冷卻系統200b、及載具C的相對位置,圖2隱藏了所述載具C的一部分。 2 shows a schematic diagram of a cooling system according to some embodiments of the present disclosure. For simplicity and clarity of illustration, some details/subcomponents of the exemplary system are not explicitly labeled/shown in this figure. Cooling system 200b may be positioned in a return device (eg, return device 12) in fluid communication with the outside world. For example, the cooling system 200b shown in FIG. 2 is positioned adjacent to the settling section of the hop 2233 (eg settling section 1231). In order to show the relative positions of the hop 2233, the cooling system 200b, and the carrier C, a portion of the carrier C is hidden from FIG. 2 .

在圖示的實施例中,中繼段2233具有多個輸送輪223a及組配來驅動輸送輪223a的驅動元件(例如馬達,圖未示出)。輸送輪223a排列在x方向上且組配來承載所述載具C的兩個延伸在x方向上的長邊區域;藉由控制驅動元件的作動方式,可以控制載具C在x方向上的移動。 In the illustrated embodiment, the relay section 2233 has a plurality of conveying wheels 223a and a driving element (eg, a motor, not shown) assembled to drive the conveying wheels 223a. The conveying wheels 223a are arranged in the x-direction and assembled to carry the two long side regions of the carrier C extending in the x-direction; by controlling the actuation mode of the driving element, the movement of the carrier C in the x-direction can be controlled. move.

冷卻系統200b包含冷卻板210,其組配來接觸並冷卻所述載具C。在圖示的實施例中,所述冷卻板210在y方向上位於所述輸送輪223a之間。此外,製程系統還包含驅動機構25,其組配來驅動冷卻系統200b的冷卻板210的升降移動(在z方向上)。在圖示的情境中,載具C已經被輸送輪223a輸送到冷卻板210上方;冷卻板210的當前位置在z方向上與所述載具C彼此相間隔。此時,冷卻板210受到驅動機構25的驅使,可以升高而接觸或支撐載具C,從而經由熱傳導的方式冷卻載具C。 The cooling system 200b includes a cooling plate 210 configured to contact and cool the carrier C. In the illustrated embodiment, the cooling plate 210 is located between the conveying wheels 223a in the y-direction. In addition, the process system further includes a driving mechanism 25, which is configured to drive the lifting and lowering movement (in the z direction) of the cooling plate 210 of the cooling system 200b. In the illustrated situation, the carrier C has been transported over the cooling plate 210 by the transport wheel 223a; the current position of the cooling plate 210 is spaced from said carrier C to each other in the z-direction. At this time, the cooling plate 210 is driven by the driving mechanism 25 and can be lifted up to contact or support the carrier C, so as to cool the carrier C through heat conduction.

為避免輸送輪223a干擾或阻擋冷卻板210的升降移動,冷卻板210被設計為形成有多個從其外緣向內凹陷的凹口216,所述凹口216在冷卻板210的升降方向(z方向)上投影地重疊於所述輸送輪223a。在圖示的實施例中,所述凹口216間隔排列在冷卻板210的長邊(延伸在x方向上),且沿y方向朝冷卻板210內部凹陷。凹口216的設計能允許所述冷卻板210的在y方向上的寬度W1大於在y方向上成對的輸送輪223a之間的距離,進而增加所述冷卻板210的面積,提升散熱效率。在其他的實施例中,冷卻板若無凹口的設計,則其寬度須小於前述輸送輪223a之間的距離,以避免其升降移動被輸送輪阻擋。在一些實施例中,所述冷卻板210的頂面(用作承載面或冷卻面)的面積至少為載具C面積的50%;凹口216的設計能在不影響冷卻板210的垂直往覆移動的前提下,增加冷卻板216的寬度W1並將冷卻面的面積提升到載 具C面積的70%以上。在一些實施例中,所述冷卻板210具有高熱傳導率的材料,例如鋁。 In order to prevent the conveying wheel 223a from interfering with or blocking the lifting and lowering movement of the cooling plate 210, the cooling plate 210 is designed to be formed with a plurality of notches 216 recessed inward from its outer edge. z-direction) is projected and superimposed on the conveying wheel 223a. In the illustrated embodiment, the notches 216 are arranged at intervals on the long side of the cooling plate 210 (extending in the x-direction), and are recessed toward the interior of the cooling plate 210 along the y-direction. The design of the notch 216 allows the width W1 of the cooling plate 210 in the y direction to be greater than the distance between the paired conveying wheels 223a in the y direction, thereby increasing the area of the cooling plate 210 and improving the heat dissipation efficiency. In other embodiments, if the cooling plate is not designed with a notch, its width must be smaller than the distance between the aforementioned conveying wheels 223a, so as to avoid the up-and-down movement of the cooling plate being blocked by the conveying wheels. In some embodiments, the area of the top surface of the cooling plate 210 (used as a bearing surface or cooling surface) is at least 50% of the area of the carrier C; On the premise of moving the cover, increase the width W1 of the cooling plate 216 and increase the area of the cooling surface to With more than 70% of the C area. In some embodiments, the cooling plate 210 has a high thermal conductivity material, such as aluminum.

在一些實施例中,載具C的在x方向上的寬度大約為30~100公分。在一些實施例中,該寬度範圍是介於40~70公分,例如45公分。在一些實施例中,該x方向寬度範圍是介於60~65公分,例如60公分。在一些實施例中,該x方向寬度範圍是介於75~90公分。在一些實施例中,載具C的在y方向上的寬度大約為30~100公分,例如70公分。在一些實施例中,載具C的在y方向寬度大約為70~90公分,例如85公分。在一些實施例中,載具C的厚度為5mm以上,例如10mm。在一些實施例中,載具C的材料包含金屬材料,例如鋁或鋁合金、銅或銅合金、不鏽鋼、鈦或鈦合金。在一些實施例中,載具C的材料包含陶瓷材料,例如氧化鋁、氮化鋁。在一些實施例中,載具C的材料包含複合材料。 In some embodiments, the width of the carrier C in the x-direction is about 30-100 cm. In some embodiments, the width ranges from 40 cm to 70 cm, such as 45 cm. In some embodiments, the width in the x-direction ranges from 60 cm to 65 cm, such as 60 cm. In some embodiments, the width in the x-direction ranges from 75 cm to 90 cm. In some embodiments, the width of the carrier C in the y direction is about 30-100 cm, for example, 70 cm. In some embodiments, the width of the carrier C in the y direction is about 70-90 cm, for example, 85 cm. In some embodiments, the thickness of the carrier C is 5 mm or more, eg, 10 mm. In some embodiments, the material of the carrier C includes a metallic material, such as aluminum or aluminum alloys, copper or copper alloys, stainless steel, titanium or titanium alloys. In some embodiments, the material of the carrier C includes a ceramic material, such as aluminum oxide, aluminum nitride. In some embodiments, the material of carrier C comprises a composite material.

圖3示出了根據本公開的一些實施例的冷卻系統的俯視示意圖。 為了說明簡單和清楚起見,示例性系統的一些細節/子組件未在本圖中明確標記/示出。 3 shows a schematic top view of a cooling system according to some embodiments of the present disclosure. For simplicity and clarity of illustration, some details/subcomponents of the exemplary system are not explicitly labeled/shown in this figure.

冷卻系統300b包含冷卻模組31,其包括組配來承載待降溫物(例如圖2所示的載具C)的冷卻板310。圖3示出了冷卻板310的示例性俯視輪廓,其板體311大致具有兩個側邊區域311a、及位於所述側邊區域311a之間的中央區域311b。所述側邊區域311a可以被定義為從板體311的兩個長邊(延伸在x方向上)朝向板體311內部(沿y方向)延伸一定距離的區域;所述距離的數值大致為板體311在y方向的寬度的數值的10~20%,例如15%。冷卻板310被設計為形成有多個從其外緣向內凹陷的凹口316。在圖示的實施例中,所述凹口316是間隔排列在冷卻板310的長邊(延伸在x方向上),且沿y方向朝冷卻板310內部凹陷。在一些實施例中,所述板體311包含高導熱 性材料,例如金屬。 The cooling system 300b includes a cooling module 31 including a cooling plate 310 configured to carry the object to be cooled (eg, the carrier C shown in FIG. 2 ). FIG. 3 shows an exemplary top view profile of the cooling plate 310 , the plate body 311 of which generally has two side regions 311 a and a central region 311 b located between the side regions 311 a. The side area 311a may be defined as an area extending a certain distance from the two long sides of the plate body 311 (extending in the x direction) toward the interior of the plate body 311 (in the y direction); the value of the distance is approximately the value of the plate body 311. The value of the width of the body 311 in the y direction is 10-20%, for example, 15%. The cooling plate 310 is designed to be formed with a plurality of notches 316 recessed inwardly from its outer edge. In the illustrated embodiment, the notches 316 are arranged at intervals on the long side of the cooling plate 310 (extending in the x-direction), and are recessed toward the interior of the cooling plate 310 along the y-direction. In some embodiments, the plate body 311 includes high thermal conductivity material, such as metal.

冷卻模組31還包含組配來冷卻所述冷卻板310的流體供應系統314。所述板體311具有承載面(例如頂面),所述承載面形成有與流體供應系統314流體連通的第一流道結構312及第二流道結構313;當低溫的流體被提供到第一流道結構312或第二流道結構313,所述冷卻板310的溫度狀態降低以能冷卻待降溫物。例如,所述流體供應系統314組配來提供第二相態的流體至所述冷卻板310的第二流道結構313,藉此降低板體311的溫度狀態。 在圖示的實施例中,所述第二流道結構313具有彎折延伸的輪廓,且其分佈區域大致佔據了所述板體311的中央區域311b的大部分俯視面積;如此,當來自流體供應系統314的低溫的流體流經所述第二流道結構313,能具有較佳的冷卻效果。在一些實施態樣中,所述第二相態的流體為液體,換言之,所述第二流道結構313可以是配置來輸送液體的液體流道。在其他的實施例中,除了流體供應系統314,可以改為或者進一步在冷卻板下方設置制冷晶片或風扇來冷卻冷卻板。 The cooling module 31 also includes a fluid supply system 314 configured to cool the cooling plate 310 . The plate body 311 has a bearing surface (such as a top surface), and the bearing surface is formed with a first flow channel structure 312 and a second flow channel structure 313 that are in fluid communication with the fluid supply system 314; when the low-temperature fluid is supplied to the first flow channel The channel structure 312 or the second flow channel structure 313, the temperature state of the cooling plate 310 is lowered so as to cool the object to be cooled. For example, the fluid supply system 314 is configured to provide the fluid in the second phase to the second flow channel structure 313 of the cooling plate 310 , thereby reducing the temperature state of the plate body 311 . In the illustrated embodiment, the second flow channel structure 313 has a curved and extended outline, and its distribution area roughly occupies most of the plan area of the central area 311b of the plate body 311 ; The low-temperature fluid of the supply system 314 flows through the second flow channel structure 313, which can have a better cooling effect. In some embodiments, the fluid in the second phase state is liquid, in other words, the second flow channel structure 313 may be a liquid flow channel configured to transport liquid. In other embodiments, in addition to the fluid supply system 314, a cooling wafer or a fan may be provided instead or further below the cooling plate to cool the cooling plate.

在一些實施例中,所述第一流道結構312具有多個分佈在兩個(在x方向上延伸的)側邊區域311a、且開口形成在所述板體311的承載面(例如頂面)的噴口312a。在圖示的實施例中,所述噴口312a朝上(朝z方向),且可以被實施為(在z方向上)貫穿所述板體311的頂面及底面的貫孔,並且流體連通於位在板體311的底面並且沿著所述兩個側邊區域311a延伸的緩衝腔室315。在其他的實施例中,所述贯孔可以傾斜設置(例如朝向所述板体311的承載面的中間區域)。所述流體供應系統314組配來提供第一相態的流體到所述第一流道結構。例如,流體供應系統314耦接於所述緩衝腔室315的一端(如圖3淺色粗體箭頭所示),並通過緩衝腔室315與所述噴口312a流體連通,並能對緩衝腔室315注入第一相態的流體。在一些實施例中,所述 第一相態的流體可以是氣體,且所述噴口312a配置來允許氣體經由緩衝腔室315朝向冷卻板311頂面(沿z方向)噴出。在一些實施例中,所述噴口312a的直徑不大於2mm,約為0.5~1mm。若噴口直徑過大(例如大於2mm),則需要耗費大量的氣體,而且噴出的氣體可能造成載具氣浮,進而增加載具與冷卻系統的間距,導致界面熱阻過大。此外,所述直徑過大還可能引起揚塵影響載具潔淨度。反之,若噴口直徑太小,則不易加工。在一些實施例中,第一、第二流道結構312、313之間未流體連通。在其他的實施例中,所述第一相態及第二相態的流體可以相同,例如同為液體。 In some embodiments, the first flow channel structure 312 has a plurality of side regions 311a distributed in two (extending in the x-direction), and openings are formed on the bearing surface (eg, the top surface) of the plate body 311 . the spout 312a. In the illustrated embodiment, the spout 312a faces upwards (towards the z direction), and may be implemented as through holes (in the z direction) passing through the top and bottom surfaces of the plate body 311, and fluidly communicates with the The buffer chamber 315 is located on the bottom surface of the plate body 311 and extends along the two side regions 311a. In other embodiments, the through holes may be disposed obliquely (for example, toward the middle area of the bearing surface of the plate body 311 ). The fluid supply system 314 is configured to provide a first phase of fluid to the first flow channel structure. For example, the fluid supply system 314 is coupled to one end of the buffer chamber 315 (as shown by the light-colored bold arrow in FIG. 3 ), and is in fluid communication with the spout 312 a through the buffer chamber 315 , and is capable of supplying the buffer chamber 315 Inject the fluid in the first phase. In some embodiments, the The fluid in the first phase may be a gas, and the nozzles 312a are configured to allow the gas to be ejected through the buffer chamber 315 toward the top surface (in the z-direction) of the cooling plate 311 . In some embodiments, the diameter of the spout 312a is not greater than 2 mm, about 0.5-1 mm. If the diameter of the nozzle is too large (for example, larger than 2mm), a large amount of gas will be consumed, and the ejected gas may cause the carrier to float, thereby increasing the distance between the carrier and the cooling system, resulting in excessive thermal interface resistance. In addition, the excessively large diameter may also cause dust to affect the cleanliness of the carrier. Conversely, if the diameter of the nozzle is too small, it is difficult to process. In some embodiments, there is no fluid communication between the first and second flow channel structures 312 and 313 . In other embodiments, the fluids in the first phase state and the second phase state may be the same, for example, both are liquids.

在一些實施例中,所述第一、第二流道結構312、313在所述冷卻板310的沿厚度方向(例如圖示的z方向)的投影範圍呈錯位設置。例如,所述第一流道結構312分佈在所述板體311的外圍區域;第二流道結構313則埋設於所述板體311且對應所述中央區域311b,且避開所述側邊區域311a。 在圖示的實施例中,所述噴口312a的分佈位置避開所述板體311的中央區域311b;埋設於所述冷卻板的液體流道312則在y方向上位於所述噴口312a之間而與噴口312a呈錯位設置。 In some embodiments, the first and second flow channel structures 312 and 313 are arranged in a staggered manner in the projection range of the cooling plate 310 along the thickness direction (eg, the z-direction shown in the figure). For example, the first flow channel structures 312 are distributed in the peripheral region of the plate body 311 ; the second flow channel structures 313 are embedded in the plate body 311 and correspond to the central region 311b and avoid the side regions 311a. In the illustrated embodiment, the distribution positions of the nozzles 312a avoid the central area 311b of the plate body 311 ; the liquid flow channel 312 embedded in the cooling plate is located between the nozzles 312a in the y direction And the nozzle 312a is dislocated.

在一些情況中,所述待降溫物(例如圖1所示的載具C)因長時間經歷鍍膜製程而驟升,或者經過噴砂處理,都可能導致其溫度升高而形變及/或表面平整度被破壞。此時,當冷卻板310的頂面承載待降溫物(例如圖1所示的載具C)的底面時,兩者之間將形成空隙。由於存在於空隙中的空氣的導熱率值(大約為0.026Wm-1K-1)極低,故會破壞所述待降溫物(例如圖1所示的載具C)與所述冷卻板310之間的熱傳效率。為了減少所述冷卻板310及載具C之間的空隙,可以在冷卻板310的頂面覆蓋導熱墊,如此,即使載具C型形變,其底面也預期會與所述導熱墊有較佳的密合。然而,現有的導熱墊無法完全適形地密合,造成界面熱阻太高,可能使導熱效率顯著降低。 In some cases, the object to be cooled (such as the carrier C shown in FIG. 1 ) rises sharply due to a long-term coating process, or undergoes sandblasting, which may cause its temperature to rise and deform and/or the surface to be flat. degree destroyed. At this time, when the top surface of the cooling plate 310 supports the bottom surface of the object to be cooled (eg, the carrier C shown in FIG. 1 ), a gap will be formed between the two. Since the thermal conductivity of the air in the gap (about 0.026Wm -1 K -1 ) is extremely low, the object to be cooled (eg, the carrier C shown in FIG. 1 ) and the cooling plate 310 will be damaged. heat transfer efficiency between. In order to reduce the gap between the cooling plate 310 and the carrier C, a thermal pad can be covered on the top surface of the cooling plate 310, so that even if the carrier C is deformed, its bottom surface is expected to be better than the thermal pad. the tightness. However, the existing thermal pads cannot fully conformally fit, resulting in too high interfacial thermal resistance, which may significantly reduce the thermal conductivity.

在一些實施例中,所述冷卻系統300b還包含液態介面生成模組,其組配來在所述述冷卻板310的冷卻面(例如頂面)及所述工件(例如載具C)之間生成液態介面。在一些實施例中,冷卻系統300b的冷卻板310設置在迴流系統(例如迴流系統12)的中繼段(例如中繼段2233)而與外界流體連通,在這樣的實施例中,此液態介面生成模組可以被設計為使冷卻板310的溫度狀態下降至鄰近於(例如不高於)露點溫度(Dew point temperature),以使其頂面凝結出露水,從而產生該液態介面。當露水(導熱率大約為0.6Wm-1K-1)取代了所述空隙中的空氣(導熱率大約為0.026Wm-1K-1),能彌補因為空氣而犧牲的熱傳效率,降低界面熱阻。以下將說明液態介面生成模組如何來使冷卻板310低於露點溫度。 In some embodiments, the cooling system 300b further includes a liquid interface generation module configured between the cooling surface (eg, the top surface) of the cooling plate 310 and the workpiece (eg, the carrier C) Generate liquid interface. In some embodiments, the cooling plate 310 of the cooling system 300b is disposed in a relay section (eg, relay section 2233 ) of the return system (eg, the return system 12 ) to be in fluid communication with the outside world. In such embodiments, the liquid interface The generating module can be designed to lower the temperature state of the cooling plate 310 to a temperature close to (eg, not higher than) the dew point temperature, so that dew water is condensed on the top surface of the cooling plate 310 to generate the liquid interface. When dew (thermal conductivity is about 0.6Wm -1 K -1 ) replaces the air in the void (thermal conductivity is about 0.026Wm -1 K -1 ), it can make up for the heat transfer efficiency sacrificed by air and reduce the interface thermal resistance. The following will describe how the liquid interface generation module makes the cooling plate 310 lower than the dew point temperature.

在圖示的實施例中,液態介面生成模組包含感測模組32及處理模組33。感測模組32組配來感測所述冷卻板310的所在環境的溫度及濕度狀態其中至少一者,並產生感測結果。例如,在圖示的實施例中,所述感測模組32包含設於(例如貼附)所述冷卻板310頂面的五個溫度傳感器321(例如熱電耦),分別位於所述冷卻板310的四個角落及中央區域。在其他的實施態樣中,溫度傳感器的數量及設置位置不以圖示為限。需說明者,冷卻系統300b位於中繼段(例如中繼段1233)而與外界流體連通,故所述溫度傳感器321的感測結果便反應出外界的溫度狀態。在一些實施例中,所述感測模組32進一步包含濕度計(圖未示出),其組配來感測所述冷卻板310所在環境的相對濕度。所述濕度計可以設置在與外界流體連通的中繼段(例如中繼段1233),而能感測到外界的濕度狀態。 In the illustrated embodiment, the liquid interface generation module includes a sensing module 32 and a processing module 33 . The sensing module 32 is configured to sense at least one of the temperature and humidity of the environment where the cooling plate 310 is located, and generate a sensing result. For example, in the illustrated embodiment, the sensing module 32 includes five temperature sensors 321 (eg, thermocouples) disposed on (eg, attached to) the top surface of the cooling plate 310 , which are respectively located on the cooling plate The four corners and central area of the 310. In other implementations, the number and arrangement positions of the temperature sensors are not limited to the drawings. It should be noted that the cooling system 300b is located in the relay section (eg, the relay section 1233 ) and is in fluid communication with the outside world, so the sensing result of the temperature sensor 321 reflects the temperature state of the outside world. In some embodiments, the sensing module 32 further includes a hygrometer (not shown) configured to sense the relative humidity of the environment where the cooling plate 310 is located. The hygrometer can be arranged in a relay section (eg, relay section 1233 ) that is in fluid communication with the outside world, and can sense the humidity state of the outside world.

處理模組33可以包含一個或多個處理器,數據連接所述感測模組32與冷卻模組31,配置來根據來自所述感測模組32的感測結果,獲得環境的露點溫度條件,並控制所述冷卻模組31的溫度設定,使所述冷卻板310的溫 度狀態鄰近(例如不高於)於所述環境的露點溫度,藉此使冷卻板310凝露。 舉例而言,在一操作情境中,當處理模組33根據所述感測模組32的感測結果取得冷卻板所在環境的相對濕度為50%,溫度為25度C,則處理模組33根據該相對濕度及溫度計算出露點溫度為15度C。據此,處理模組33控制冷卻模組31的流體供應系統314所供應到冷卻板310的流體(例如液體)輸出(例如液體的溫度或流量之設定),藉此使冷卻板310的溫度下降到露點溫度15度C以下。如此,冷卻板310便能凝結出露水。(露點溫度的定義:空氣在氣壓和濕度狀態保持不變的狀況下,若逐漸降低其溫度,一直到水汽量達到飽和,開始凝結為露水時的溫度。)在一些操作情境中,為了進一步使凝結在冷卻板310的露水形成一個水膜而獲得較佳的冷卻效果,處理模組33進一步配置來控制所述冷卻模組31的溫度設定,使所述冷卻板310的溫度狀態較所述環境的露點溫度低10至20度C,例如15度C。在一些實施例中,所述溫度的設定進一步以冷卻板不結冰為原則。在一些實施例中,可以對冷卻模組31採用定溫的溫度設定(或以人為的方式設定),使得冷卻板的溫度狀態不高於露點溫度,也能達到使冷卻板凝露的效果。 The processing module 33 may include one or more processors, data-connected to the sensing module 32 and the cooling module 31, and configured to obtain the dew point temperature condition of the environment according to the sensing result from the sensing module 32 , and control the temperature setting of the cooling module 31 to make the temperature of the cooling plate 310 The temperature state is near (eg, not higher than) the dew point temperature of the environment, thereby causing the cooling plate 310 to condense. For example, in an operation situation, when the processing module 33 obtains according to the sensing result of the sensing module 32 that the relative humidity of the environment where the cooling plate is located is 50% and the temperature is 25 degrees C, the processing module 33 Based on the relative humidity and temperature, the dew point temperature is calculated to be 15°C. Accordingly, the processing module 33 controls the output of the fluid (eg, liquid) supplied by the fluid supply system 314 of the cooling module 31 to the cooling plate 310 (eg, the setting of the temperature or flow rate of the liquid), thereby reducing the temperature of the cooling plate 310 To the dew point temperature below 15 degrees C. In this way, the cooling plate 310 can condense dew water. (Definition of dew point temperature: The temperature at which the air, under the condition of constant air pressure and humidity, gradually reduces its temperature until the amount of water vapor reaches saturation and begins to condense into dew.) In some operating situations, in order to further The dew condensed on the cooling plate 310 forms a water film to obtain a better cooling effect. The processing module 33 is further configured to control the temperature setting of the cooling module 31, so that the temperature state of the cooling plate 310 is higher than that of the environment. The dew point temperature is 10 to 20 degrees C lower, for example 15 degrees C. In some embodiments, the setting of the temperature is further based on the principle that the cooling plate does not freeze. In some embodiments, the cooling module 31 can be set at a constant temperature (or set artificially), so that the temperature state of the cooling plate is not higher than the dew point temperature, and the effect of condensation on the cooling plate can also be achieved.

圖4a及4b分別示出了根據本公開的一些實施例的兩個實驗的結果。在所述兩個實驗中,冷卻板(例如冷卻板310)的頂面與載具的面積比被設定為70%;流體供應模組(例如流體供應模組314)提供至液體流道(例如第二流道結構313)的液體的溫度被設定為18度C。所述兩個實驗的不同處在於,對應於圖4a的實驗採用了導熱率值為12Wm-1K-1的導熱墊片,並將其設置在載具及冷卻板之間;而圖4b的實驗則使冷卻板凝露(例如採用前述的液態介面生成模組),而未採用導熱墊片。曲線41a、41b所代表的是設置在冷卻板(例如冷卻板310)中央的溫度傳感器(例如熱電耦321)的感測結果;曲線42a、42b所代表的是設置在冷卻板(例如冷卻板310)角落的溫度傳 感器(例如熱電耦321)的感測結果。比較圖4a及4b可以知道,若採用導熱墊片,需要大約250~400秒才能使載具C降溫到接近30度C;若改採用使冷卻板凝露則僅需要150~200秒,降溫的速率明顯較快。 Figures 4a and 4b respectively show the results of two experiments according to some embodiments of the present disclosure. In the two experiments, the area ratio of the top surface of the cooling plate (eg, cooling plate 310 ) to the carrier was set to 70%; the fluid supply module (eg, fluid supply module 314 ) was provided to the liquid flow channel (eg, The temperature of the liquid of the second flow channel structure 313) was set to 18°C. The difference between the two experiments is that the experiment corresponding to Fig. 4a used a thermal pad with a thermal conductivity value of 12Wm -1 K -1 and set it between the carrier and the cooling plate; In the experiment, the cooling plate was condensed (for example, using the aforementioned liquid interface generation module), but the thermal pad was not used. Curves 41a and 41b represent the sensing results of a temperature sensor (eg, thermocouple 321 ) disposed in the center of the cooling plate (eg, cooling plate 310 ); ) the sensing result of the temperature sensor (eg, thermocouple 321 ) in the corner. Comparing Figures 4a and 4b, it can be seen that if the thermal pad is used, it takes about 250~400 seconds to cool the carrier C to nearly 30 degrees C; The rate is significantly faster.

回顧圖3,在一些實施例中,液態介面生成模組可以被設計為進一步包含流體拘束模組,以進一步將生成在所述冷卻板310頂面的露水拘束在冷卻板310的中央區域311b,從而進一步提升載具C的散熱效率。在圖示的實施例中,由於所述噴口312a的分佈位置是在冷卻板310的外圍區域,因此,當所述流體供應系統314提供氣體(例如經由緩衝腔室315)至所述噴口312a,則經由噴口312a噴出的氣體會將已經形成的露水拘束在所述板體311的中央區域311b。基於這個拘束流體的功能,所述第一流道結構312(例如噴口312a)及所述流體供應系統314可以共同作為流體拘束模組。在其他的實施例中,流體拘束模組被實施為形成在冷卻板頂面的環狀疏水區,其環繞冷卻板的中央區域311b,藉此來達到拘束露水的目的。 Referring back to FIG. 3 , in some embodiments, the liquid interface generation module may be designed to further include a fluid confinement module to further confine the dew generated on the top surface of the cooling plate 310 to the central region 311b of the cooling plate 310 , Thus, the heat dissipation efficiency of the carrier C is further improved. In the illustrated embodiment, since the distribution position of the nozzles 312a is in the peripheral area of the cooling plate 310, when the fluid supply system 314 provides gas (for example, via the buffer chamber 315) to the nozzles 312a, Then, the gas ejected through the nozzle 312 a will confine the formed dew in the central area 311 b of the plate body 311 . Based on the function of constraining the fluid, the first flow channel structure 312 (eg, the spout 312a ) and the fluid supply system 314 can jointly serve as a fluid confinement module. In other embodiments, the fluid confinement module is implemented as an annular hydrophobic area formed on the top surface of the cooling plate, which surrounds the central region 311b of the cooling plate, thereby achieving the purpose of confining dew.

為了將露水拘束在中央區域311b,噴口312a的分佈區域大致對稱於所述板體311的中央。依此設計規則,在其他的實施例中,噴口可以被設計為分佈在所述板體的兩個短邊(例如圖示的板體311沿著y方向延伸的側邊)區域;或分佈在大致呈矩型的板體的四個側邊區域而環繞所述第二流道結構313。 In order to restrain the dew in the central area 311b, the distribution area of the spout 312a is approximately symmetrical to the center of the plate body 311. According to this design rule, in other embodiments, the nozzles can be designed to be distributed in the regions of the two short sides of the plate body (for example, the sides of the plate body 311 extending along the y direction in the figure); The four side regions of the substantially rectangular plate body surround the second flow channel structure 313 .

在一些實施例中,流體拘束模組可以進一步使露水朝板體311的中央區域311b集中。舉例來說,噴口(例如噴口212a、312a)的分佈位置可以被設計為當冷卻板(例如冷卻板210、310)承載所述待降溫物(例如載具C)時,得以被所述待降溫物覆蓋,此外,還可以進一步在所述冷卻板310接收所述待降溫物(例如載具C)期間使(例如經由處理模組33的控制)所述流體供應系統314提供氣體至所述噴口312a;當氣體經由所述噴口312a釋放, 氣體的一部分將會沿著載具C底面,從冷卻板310的側邊區域311a朝向中央區域311b集中,從而吹拂露水朝所述板體311的中央區域311b集中。 In some embodiments, the fluid confinement module can further concentrate dew toward the central region 311b of the plate body 311 . For example, the distribution positions of the nozzles (eg, the nozzles 212a, 312a) can be designed so that when the cooling plate (eg, the cooling plate 210, 310) supports the object to be cooled (eg, the carrier C), the object to be cooled (eg, the carrier C) is cooled by the cooling plate (eg, the cooling plate 210, 310). In addition, during the period when the cooling plate 310 receives the object to be cooled (eg, the carrier C), the fluid supply system 314 may be further enabled (eg, controlled by the processing module 33 ) to provide gas to the spout 312a; when the gas is released through the nozzle 312a, A part of the gas will be concentrated along the bottom surface of the carrier C from the side region 311a of the cooling plate 310 toward the central region 311b, so that the blowing dew will be concentrated toward the central region 311b of the plate body 311 .

回顧圖2,噴口212a被設計為分佈在冷卻板210的延伸在x方向的兩個側邊區域(長邊區域)211a,且避開中央區域211b,另一方面,板體211在y方向(正交於側邊區域211a的方向)上的寬度W1被設計為小於所述待降溫物(例如載具C)的寬度W2;此結構設計允許載具C在被冷卻板210承載時覆蓋噴口212a。在其他的實施例中,噴口可以被設計為分佈在冷卻板的延伸在y方向的兩個側邊區域(短邊區域),且板體在x方向上的寬度被設計為小於待降溫物(例如載具C)的寬度,也可以使噴口被待降溫物覆蓋。 Referring back to FIG. 2, the nozzles 212a are designed to be distributed in the two side regions (long side regions) 211a of the cooling plate 210 extending in the x direction, and avoid the central region 211b, on the other hand, the plate body 211 is in the y direction ( The width W1 in the direction orthogonal to the side region 211a) is designed to be smaller than the width W2 of the object to be cooled (eg, the carrier C); this structural design allows the carrier C to cover the spout 212a when it is carried by the cooling plate 210 . In other embodiments, the nozzles can be designed to be distributed in two side regions (short side regions) of the cooling plate extending in the y direction, and the width of the plate body in the x direction is designed to be smaller than the object to be cooled ( For example, the width of the carrier C) can also make the spout covered by the object to be cooled.

為了適當的集中或拘束露水,在一些實施例中,所述流體供應系統314所提供的氣體的壓力大約介於0.1kg/cm2到2kg/cm2之間。在一些情境中,當所述壓力大於上限值(例如2kg/cm2)時,氣體可能將沾附在載具C上的鍍膜材料吹落,而污染製程系統,或造成載具氣浮。在一些情境中,當所述壓力小於下限值(例如0.1kg/cm2)時,所述氣體吹拂露水的效果將明顯降低。 In order to properly concentrate or confine dew, in some embodiments, the pressure of the gas provided by the fluid supply system 314 is approximately between 0.1 kg/cm 2 and 2 kg/cm 2 . In some situations, when the pressure is greater than the upper limit (eg, 2 kg/cm 2 ), the gas may blow off the coating material adhering to the carrier C, contaminating the process system, or causing the carrier to float. In some scenarios, when the pressure is less than a lower limit (eg, 0.1 kg/cm 2 ), the dew-blowing effect of the gas will be significantly reduced.

圖5示出了根據本公開的一些實施例的模擬實驗數據。在圖5的實驗設定中,載具的溫度被設定為110度C;流體供應模組(例如流體供應模組314)提供至所述液體流道(例如液體流道313)的液體的溫度被設定為20度C。曲線501所代表的實驗並未利用流體拘束模組來拘束露水;而曲線502所代表的實驗則運用了根據本案實施例所述的流體拘束模組來拘束露水。 從實驗結果圖可看出,應用了流體拘束模組的實驗曲線502得到更佳的降溫效率。例如,在第75秒時,曲線502相較於曲線501,載具的溫度狀態相對低了8度C。 FIG. 5 shows simulated experimental data according to some embodiments of the present disclosure. In the experimental setup of FIG. 5 , the temperature of the carrier is set to 110°C; the temperature of the liquid supplied by the fluid supply module (eg, the fluid supply module 314 ) to the liquid flow channel (eg, the liquid flow channel 313 ) is set by Set to 20 degrees C. The experiment represented by curve 501 did not use the fluid confinement module to confine dew; while the experiment represented by curve 502 used the fluid confinement module according to the present embodiment to confine dew. It can be seen from the experimental result graph that the experimental curve 502 using the fluid confinement module achieves better cooling efficiency. For example, at the 75th second, the temperature state of the vehicle in the curve 502 is relatively lower by 8 degrees C compared to the curve 501 .

圖6a及6b示出了根據本公開的一些實施例的冷卻板的示意圖。 為了說明簡單和清楚起見,示例性系統的一些細節/子組件未在本圖中明確標記/示出。在一些實施例中,圖6a及6b可以是沿著平行於圖3所示的平面P3的剖面的剖面示意圖。 6a and 6b show schematic diagrams of cooling plates according to some embodiments of the present disclosure. For simplicity and clarity of illustration, some details/subcomponents of the exemplary system are not explicitly labeled/shown in this figure. In some embodiments, FIGS. 6 a and 6 b may be schematic cross-sectional views along a cross-section parallel to the plane P3 shown in FIG. 3 .

如圖6a所示,在一些實施例中,為了近一步增加z方向的熱傳導效率,冷卻板610的板體611可以採用複合金屬結構。例如,圖6a所示的板體611包含具有第一導熱材料的主板層611c、及設於所述主板層611c上且具有第二導熱材料的上板層611d,其中所述第一導熱材料的導熱係數小於所述第二導熱材料的導熱係數。所述主板層611c的第一導熱材料可以包含鋁(導熱率237Wm-1K-1),而所述上板層611d的第二導熱材料可以包含銅(導熱率400Wm-1K-1)。所述主板層611c及上板層611d可以具有大致相同的俯視輪廓(從z方向觀看)。在一些實施例中,噴口(例如噴口312a)可以被實施為貫穿所述主板層611c及上板層611d。在一些實施例中,主板層(例如圖6a的611c)與上板層(例如圖6b的611d)可以採用同質材料。在一些實施例中,主板層(例如圖6b的主板層611c’)與上板層(例如圖6b的上板層611d’)可以採用異質材料或同質材料。在一些實施例中,主板層611c’與上板層611d’可以採用金屬材料,例如銅、銅合金、鋁、鋁合金、不鏽鋼、鈦、鈦合金等。在一些實施例中,上板層611d’材料的導熱率等於或大於主板層611c’的導熱率。如圖6b所示的實施例,當主板層611c’與上板層611d’為異質材料,兩者的接合可以採用磨擦焊接、電子束焊接、雷射焊接、真空硬焊、O型圈封合、或是深孔鑽加工等技術。第二流道結構可以形成在所述主板層。例如,在圖6b所示的實施例中,所述第二流道結構613’可以使用電腦數值控制(Computer Numerical Control;CNC)工藝來形成。例如,第二流道結構613’的形成可以包括:使用電腦數值控制(Computer Numerical Control;CNC)工藝在主板層611c’頂面形成彎折延伸的溝道613a’、將上板層611d’接合於(例如採用磨擦焊 接、電子束焊接、雷射焊接、真空硬焊、O型圈封合、或是深孔鑽加工等技術)所述主板層611c’頂面且封閉所述溝道613a’,從而形成第二流道結構613’。 當所述主板層(例如611c’)採用與所述上板層(611d’)相同的材質,可以減少兩者材料之間的熱膨脹係數差異,降低因為溫度變化而導致上子層611f剝離或翹曲的機會,從而避免液體流道(第二流道結構613)被破壞。 As shown in FIG. 6a, in some embodiments, in order to further increase the heat conduction efficiency in the z-direction, the plate body 611 of the cooling plate 610 may adopt a composite metal structure. For example, the board body 611 shown in FIG. 6a includes a main board layer 611c having a first thermally conductive material, and an upper board layer 611d disposed on the mainboard layer 611c and having a second thermally conductive material, wherein the first thermally conductive material is The thermal conductivity is less than the thermal conductivity of the second thermally conductive material. The first thermal conductive material of the main board layer 611c may contain aluminum (thermal conductivity 237Wm -1 K -1 ), and the second thermal conductive material of the upper board layer 611d may contain copper (thermal conductivity 400 Wm -1 K -1 ). The main board layer 611c and the upper board layer 611d may have substantially the same top-view profile (viewed from the z-direction). In some embodiments, a spout (eg, spout 312a) may be implemented through the main board layer 611c and the upper board layer 611d. In some embodiments, the main board layer (eg, 611c of FIG. 6a ) and the upper board layer (eg, 611d of FIG. 6b ) can be made of homogeneous materials. In some embodiments, the main board layer (eg, the main board layer 611c ′ of FIG. 6b ) and the upper board layer (eg, the upper board layer 611d ′ of FIG. 6b ) may use heterogeneous materials or homogeneous materials. In some embodiments, the main board layer 611c' and the upper board layer 611d' can be made of metal materials, such as copper, copper alloy, aluminum, aluminum alloy, stainless steel, titanium, titanium alloy, and the like. In some embodiments, the thermal conductivity of the material of the upper board layer 611d' is equal to or greater than that of the main board layer 611c'. In the embodiment shown in FIG. 6b, when the main board layer 611c' and the upper board layer 611d' are made of different materials, friction welding, electron beam welding, laser welding, vacuum brazing, and O-ring sealing can be used to join the two. , or deep hole drilling and other technologies. The second flow channel structure may be formed on the main board layer. For example, in the embodiment shown in FIG. 6 b , the second flow channel structure 613 ′ can be formed using a computer numerical control (Computer Numerical Control; CNC) process. For example, the formation of the second flow channel structure 613' may include: using a computer numerical control (CNC) process to form a curved and extended channel 613a' on the top surface of the main board layer 611c', and joining the upper plate layer 611d' (for example, by friction welding, electron beam welding, laser welding, vacuum brazing, O-ring sealing, or deep hole drilling, etc.) on the top surface of the main board layer 611c' and close the channel 613a' , thereby forming the second flow channel structure 613 ′. When the main board layer (eg 611c') is made of the same material as the upper board layer (611d'), the difference in thermal expansion coefficient between the two materials can be reduced, and the peeling or warping of the upper sub-layer 611f due to temperature changes can be reduced. Therefore, the liquid flow channel (the second flow channel structure 613 ) is prevented from being damaged.

在圖6a所示的實施例中,所述主板層611c具有雙層結構而包含下子層611e及上子層611f。在一些實施例中,第二流道結構613的形成可以包括:使用電腦數值控制(Computer Numerical Control;CNC)工藝在主板層611c的下子層611e頂面形成彎折延伸的溝道613a、將上子層611f接合於(例如採用磨擦焊接、電子束焊接、雷射焊接、真空硬焊、O型圈封合、或是深孔鑽加工等技術)所述下子層611e頂面且封閉所述溝道613a,從而形成第二流道結構613。所述上子層611f可以採用與所述下子層611e相同的材質,以減少兩者材料之間的熱膨脹係數差異,降低因為溫度變化而導致上子層611f剝離或翹曲的機會,從而避免液體流道(第二流道結構613)被破壞。在一些實施例中,主板層(例如圖6a的主板層611c)的上/下子板層(例如圖6a的611e/f)可以採用異質材料。在一些實施例中,上子層611f與下子層611e可以採用金屬材料,例如銅、銅合金、鋁、鋁合金、不鏽鋼、鈦、鈦合金等。 In the embodiment shown in FIG. 6a, the main board layer 611c has a double-layer structure including a lower sub-layer 611e and an upper sub-layer 611f. In some embodiments, the formation of the second flow channel structure 613 may include: using a computer numerical control (CNC) process to form a curved and extended channel 613a on the top surface of the lower sub-layer 611e of the main board layer 611c, The sublayer 611f is bonded (eg, by friction welding, electron beam welding, laser welding, vacuum brazing, O-ring sealing, or deep hole drilling, etc.) to the top surface of the lower sublayer 611e and closes the trench The channel 613a is formed, thereby forming the second flow channel structure 613 . The upper sub-layer 611f can be made of the same material as the lower sub-layer 611e, so as to reduce the difference in thermal expansion coefficient between the two materials, and reduce the chance of peeling or warping of the upper sub-layer 611f due to temperature changes, so as to avoid liquid The flow channel (second flow channel structure 613) is destroyed. In some embodiments, the upper/lower daughter board layers (eg, 611e/f of FIG. 6a ) of the main board layer (eg, the main board layer 611c of FIG. 6a ) may employ heterogeneous materials. In some embodiments, the upper sub-layer 611f and the lower sub-layer 611e may be made of metal materials, such as copper, copper alloy, aluminum, aluminum alloy, stainless steel, titanium, titanium alloy, and the like.

在一些實施例中,當板體採用複合板結構時,為了在所述主板層形成所述第二流道結構且維持所述主板層的結構強度,異質板層之間的厚度比例大約設定在4到5之間,例如4.2到4.4之間。例如,如圖6a所示,主板層611c厚度的下限大約為9~15mm,例如13mm;異質上板層611d的厚度下限為大約為2~4mm,例如3mm。在另一些實施例中,例如圖6b所示,主板層611c’厚度的下限為9~13mm;異質上板層611d’的厚度下限為2mm,例如3mm或6mm。在一些實施例中,上板層(例如上板層611d)可以被實 施為利用冷噴鍍或化銅或電鍍銅等製程方法,形成在所述主板層(例如主板層611c)上的銅金屬層、或被實施為利用焊接的方式接合於所述主板層(例如主板層611c’)的銅板層(例如上板層611d’);後者具有較好的材料緻密性及附著於主板層(例如主板層611c’)的附著力,而擁有相對較佳的導熱性。 In some embodiments, when the plate body adopts a composite plate structure, in order to form the second flow channel structure in the main plate layer and maintain the structural strength of the main plate layer, the thickness ratio between the heterogeneous plate layers is approximately set at about Between 4 and 5, for example between 4.2 and 4.4. For example, as shown in FIG. 6a, the lower limit of the thickness of the main board layer 611c is about 9~15mm, eg 13mm; the lower limit of the thickness of the heterogeneous upper board layer 611d is about 2~4mm, eg 3mm. In other embodiments, such as shown in FIG. 6b, the lower limit of the thickness of the main board layer 611c' is 9-13mm; the lower limit of the thickness of the heterogeneous upper board layer 611d' is 2mm, such as 3mm or 6mm. In some embodiments, an upper ply (eg, upper ply 61 Id) may be implemented The copper metal layer is formed on the main board layer (such as the main board layer 611c) by a process method such as cold spraying or copper plating or copper electroplating, or is implemented to be joined to the main board layer (such as the main board layer 611c) by welding. The copper layer (such as the upper board layer 611d') of the main board layer 611c') has good material density and adhesion to the main board layer (such as the main board layer 611c'), and has relatively good thermal conductivity.

圖7示出了根據本公開的一些實施例的冷卻系統的冷卻板的立體示意圖,其大致呈現了冷卻板的頂面。為了說明簡單和清楚起見,示例性系統的一些細節/子組件未在本圖中明確標記/示出。 7 shows a schematic perspective view of a cooling plate of a cooling system, generally representing a top surface of the cooling plate, in accordance with some embodiments of the present disclosure. For simplicity and clarity of illustration, some details/subcomponents of the exemplary system are not explicitly labeled/shown in this figure.

冷卻板710的板體711大致呈矩型,並具有兩個側邊區域(例如側邊區域711a)、及位於所述側邊區域之間的中央區域(例如中央區域711b)。所述側邊區域711a可以被定義為從板體711的兩個延伸在x方向上的長邊,沿y方向朝向板體711內部延伸一定距離的區域;所述距離的數值大致為板體711在y方向的寬度的數值的10~20%,例如15%。冷卻板710被設計為形成有多個從其外緣向內凹陷的凹口716。在圖示的實施例中,所述凹口716是間隔排列在冷卻板710的長邊(延伸在x方向上),且沿y方向朝冷卻板710內部凹陷。在一些實施例中,所述板體711包含高導熱性材料,例如金屬。 The plate body 711 of the cooling plate 710 is substantially rectangular, and has two side regions (eg, the side regions 711 a ) and a central region (eg, the central region 711 b ) located between the side regions. The side area 711a can be defined as an area extending a certain distance from the two long sides of the board body 711 in the x-direction and toward the interior of the board body 711 along the y-direction; the value of the distance is approximately the board body 711 10~20% of the value of the width in the y direction, such as 15%. The cooling plate 710 is designed to be formed with a plurality of notches 716 recessed inwardly from its outer edge. In the illustrated embodiment, the notches 716 are arranged at intervals on the long side of the cooling plate 710 (extending in the x-direction), and are recessed toward the interior of the cooling plate 710 along the y-direction. In some embodiments, the plate body 711 includes a high thermal conductivity material, such as metal.

所述板體711形成有第一流道結構712,其組配來接收來自流體供應系統(例如流體供應系統314)所提供的第一相態的流體。在圖示的實施例中,所述第一流道結構712具有分別沿x、y、z方向延伸的第一方向流道712x、第二方向流道712y、及第三方向流道712z,且第一、二、三方向流道被設計為相互流體連通。在一些實施例中,第一、二方向流道712x、712y包含(在x、y方向上)從所述板體711的側面凹陷的盲孔;第三方向流道712z則包含(在z方向上)從所述板體711的頂面向下凹陷的盲孔,其朝上(朝z方向)的開口界定出噴口712a。所述第一流道結構712的分佈位置被設計為 避開所述板體711的中央區域711b。在圖示的實施例中,噴口712a的分佈區域對稱於所述板體711的中央。依照相同的設計規則,在其他的實施例中,噴口可以被設計為分佈在所述板體的兩個短邊(例如圖示的板體711沿著y方向延伸的側邊)區域;或者,噴口可以被設計為分佈在大致呈矩型的板體的四個側邊區域而環繞第二流道結構(例如第二流道結構813)。 The plate body 711 is formed with a first flow channel structure 712 configured to receive a first phase of fluid provided by a fluid supply system (eg, the fluid supply system 314 ). In the illustrated embodiment, the first flow channel structure 712 has a first direction flow channel 712x, a second direction flow channel 712y, and a third direction flow channel 712z extending along the x, y, and z directions, respectively. One-, two-, and three-directional flow channels are designed to be in fluid communication with each other. In some embodiments, the first and second direction flow channels 712x, 712y include (in the x, y directions) blind holes recessed from the side of the plate body 711; the third direction flow channel 712z includes (in the z direction) top) a blind hole recessed downward from the top surface of the plate body 711 , and its upward (toward z-direction) opening defines a spout 712a. The distribution position of the first flow channel structure 712 is designed as The central area 711b of the plate body 711 is avoided. In the illustrated embodiment, the distribution area of the spout 712 a is symmetrical to the center of the plate body 711 . According to the same design rules, in other embodiments, the nozzles can be designed to be distributed in the regions of the two short sides of the plate body (for example, the sides of the plate body 711 in the figure extending along the y direction); or, The nozzles may be designed to be distributed in four side regions of the substantially rectangular plate body to surround the second flow channel structure (eg, the second flow channel structure 813 ).

圖8示出了根據本公開的一些實施例的冷卻系統的冷卻板的仰視示意圖。為方便說明,圖8中的陰影遮蔽區塊以透視的方式呈現,且省略溝道蓋板(例如溝道蓋板913b)。 8 shows a schematic bottom view of a cooling plate of a cooling system according to some embodiments of the present disclosure. For the convenience of description, the shaded block in FIG. 8 is shown in a see-through manner, and the channel cover (eg, the channel cover 913b ) is omitted.

第一流道結構812分佈在冷卻板810的板體811的側邊區域811a,具有彼此流體連通的第一方向流道812x、第二方向流道812y、第三方向流道(第三方向流道在當前示圖中被遮蔽)、及噴口(在當前示圖中被遮蔽)。在一些實施例中,第一流道結構812還具有形成在板體811的底面、側面及\或頂面的進氣道(例如進氣道812c),其組配來耦接流體供應系統(例如流體供應系統314)。例如,進氣道812c從所述板體811底面沿z方向朝頂面延伸並且與第一方向流道812x流體連通。在一些實施例中,流體供應系統具有組配來連接於進氣道812c的接頭(圖未示出),並通過進氣道與所述第一流道結構812流體連通,並能對進氣道注入第一相態的流體,使得第一相態的流體從噴口812a噴出。在一些實施例中,冷卻板810還具有多個栓塞810,分別組配來填滿所述第一、第二方向流道812x、812y的分別面向x、y方向的開口,藉此抑制x、y方向的出氣。 The first flow channel structure 812 is distributed in the side region 811a of the plate body 811 of the cooling plate 810, and has a first direction flow channel 812x, a second direction flow channel 812y, and a third direction flow channel (the third direction flow channel) which are in fluid communication with each other. shaded in the current view), and the spout (masked in the current view). In some embodiments, the first flow channel structure 812 further has an air intake channel (such as the air intake channel 812c) formed on the bottom surface, side surface and/or top surface of the plate body 811, which is configured to be coupled to a fluid supply system (such as an air intake channel 812c). fluid supply system 314). For example, the air intake channel 812c extends from the bottom surface of the plate body 811 toward the top surface in the z direction and is in fluid communication with the first direction flow channel 812x. In some embodiments, the fluid supply system has a fitting (not shown) configured to connect to the air inlet 812c, and is in fluid communication with the first flow channel structure 812 through the air inlet, and is capable of providing access to the air inlet. The fluid in the first phase is injected so that the fluid in the first phase is ejected from the nozzle 812a. In some embodiments, the cooling plate 810 further has a plurality of plugs 810, which are respectively assembled to fill the openings facing the x and y directions of the first and second direction flow channels 812x and 812y, thereby suppressing the x, y, and y directions. Exhale in the y direction.

第二流道結構813具有組配來與流體供應系統耦接的入口端813e及出口端813f;流體供應系統具有組配來連接於入口端813e及出口端813f的接頭(圖未示出),並能對第二流道結構813注入第二相態的流體,使板體811冷卻。在圖8所示的實施例中,第二流道結構813具有彎折延伸的輪 廓,且其分佈不僅對應所述中央區域811b還更擴及所述側邊區域811a,從而佔據了所述板體811的大部分俯視面積;如此,當來自流體供應系統的低溫的流體流經所述第二流道結構813,能獲得較佳的冷卻效果。在一些實施例中,第二流道結構813在z方向上投影的範圍的重疊於所述第一流道結構812。例如,第二流道結構813的彎折的區段、及延伸在x方向上的區段與所述第一流道結構812呈投影重疊。 The second flow channel structure 813 has an inlet end 813e and an outlet end 813f configured to be coupled to a fluid supply system; the fluid supply system has a joint (not shown) configured to be connected to the inlet end 813e and the outlet end 813f, In addition, the fluid in the second phase can be injected into the second channel structure 813 to cool the plate body 811 . In the embodiment shown in FIG. 8 , the second flow channel structure 813 has a wheel that is bent and extended and its distribution not only corresponds to the central region 811b but also extends to the side regions 811a, thus occupying most of the top-view area of the plate body 811; in this way, when the low-temperature fluid from the fluid supply system flows through the The second flow channel structure 813 can obtain a better cooling effect. In some embodiments, the projected range of the second flow channel structure 813 in the z direction overlaps the first flow channel structure 812 . For example, the bent section and the section extending in the x-direction of the second flow channel structure 813 are projected and overlapped with the first flow channel structure 812 .

圖9示出了根據本公開的一些實施例的冷卻系統的冷卻板的剖示示意圖。在一些實施例中,圖9可以是沿著平行於圖8所示的平面P8的剖面的剖面示意圖。 9 shows a schematic cross-sectional view of a cooling plate of a cooling system according to some embodiments of the present disclosure. In some embodiments, FIG. 9 may be a schematic cross-sectional view along a cross-section parallel to the plane P8 shown in FIG. 8 .

參閱圖9,第一流道結構912的第一、二、三方向流道912x、912y、912z呈流體連通。在一些實施例中,第一流道結構912還具有進氣道912c,其從所述板體911底面沿z方向朝頂面延伸並且與第一方向流道912x流體連通。流體供應系統(例如流體供應系統314)通過進氣道912c與所述第一流道結構912流體連通,並能對進氣道912c注入第一相態的流體,使得第一相態流體(例如氣體)從噴口912a朝向冷卻板911頂面(沿z方向)噴出。 在圖示的實施例中,所述三方向流道912z沿著所述z方向延伸;在其他的實施例中,所述三方向流道可以被設計為傾斜設置(例如朝向所述冷卻板911頂面的中間區域延伸)。 Referring to FIG. 9 , the first, second, and third direction flow channels 912x, 912y, and 912z of the first flow channel structure 912 are in fluid communication. In some embodiments, the first flow channel structure 912 further has an air intake channel 912c, which extends from the bottom surface of the plate body 911 toward the top surface along the z direction and is in fluid communication with the first direction flow channel 912x. The fluid supply system (for example, the fluid supply system 314 ) is in fluid communication with the first flow channel structure 912 through the air inlet 912c, and can inject the first phase fluid into the air inlet 912c, so that the first phase fluid (for example, the gas ) is ejected from the nozzle 912a toward the top surface of the cooling plate 911 (in the z direction). In the illustrated embodiment, the three-directional flow channel 912z extends along the z-direction; in other embodiments, the three-directional flow channel can be designed to be inclined (for example, toward the cooling plate 911 ). the middle area of the top surface extends).

在冷卻板911的側邊區域911a中,所述第一、二流道結構912、913兩者的分佈範圍在厚度方向(z方向)上呈錯位設置。例如,在圖示的實施例中,第一、二、三方向流道912x、912y、912z在z方向上的分佈範圍相對高於(相對於板體911底面)第二流道結構913在z方向上的分佈範圍。這樣的高度差設計允許第二流道結構913在z方向的投影範圍與第一流道結構912重疊,有助於最大化第二流道結構913的分佈範圍,從而於提升冷卻效率。 In the side region 911 a of the cooling plate 911 , the distribution ranges of the first and second flow channel structures 912 and 913 are staggered in the thickness direction (z direction). For example, in the illustrated embodiment, the distribution range of the first, second, and third direction flow channels 912x, 912y, and 912z in the z direction is relatively higher (relative to the bottom surface of the plate body 911 ) than the second flow channel structure 913 in the z direction. distribution in the direction. Such a height difference design allows the projection range of the second flow channel structure 913 in the z direction to overlap with the first flow channel structure 912 , which helps to maximize the distribution range of the second flow channel structure 913 , thereby improving cooling efficiency.

在一些實施例中,第二流道結構913具有對應於側邊區域911a的第一深度D1及對應於中央區域911b的第二深度D2。所述第一深度D1被設計為相對淺於第二深度D2。在一些實施例中,這樣的設計可以同時達到允許第二流道結構913與第一流道結構912在z方向上的投影區域相互重疊,以及維持第二流道結構913對應所述中央區域的容積的效果。 In some embodiments, the second flow channel structure 913 has a first depth D 1 corresponding to the side region 911 a and a second depth D 2 corresponding to the central region 911 b. The first depth D 1 is designed to be relatively shallower than the second depth D 2 . In some embodiments, such a design can simultaneously allow the projected regions of the second flow channel structure 913 and the first flow channel structure 912 to overlap each other in the z-direction, and maintain the volume of the second flow channel structure 913 corresponding to the central region. Effect.

在一些實施例中,第二流道結構913的形成可以包括:使用電腦數值控制(Computer Numerical Control;CNC)工藝在板體911底面形成彎折延伸的溝道913a、將彎折延伸的溝道蓋板913b接合於(例如採用焊接工藝)所述板體911且封閉所述溝道913a,從而形成第二流道結構913。所述板體911可以採用與所述溝道蓋板911b相同的材質,以減少兩者材料之間的熱膨脹係數差異,降低因為溫度變化而導致液體流道被破壞。在圖9所示的實施例中,當板體911採用的蓋體相同的材料時,板體911厚度的下限值可為約12mm;此厚度範圍能允許利用CNC工藝在板體911加工(在z方向上)相互投影重疊的第一流道結構912及第二流道結構913,且能維持所述板體911的結構強度。在一些實施例中,當板體(例如板體911)採用高強度金屬(例如高強度鋁合金,高強度銅合金,不鏽鋼,鈦或鈦合金),其厚度的下限值可下修為約6mm。 In some embodiments, the formation of the second flow channel structure 913 may include: using a computer numerical control (Computer Numerical Control; CNC) process to form a bent and extended channel 913 a on the bottom surface of the plate body 911 , and the bent and extended channel The cover plate 913b is joined (eg, by welding) to the plate body 911 and closes the channel 913a, thereby forming the second flow channel structure 913 . The plate body 911 can be made of the same material as the channel cover plate 911b, so as to reduce the difference in thermal expansion coefficient between the two materials and reduce the damage of the liquid flow channel caused by the temperature change. In the embodiment shown in FIG. 9 , when the plate body 911 is made of the same material as the cover body, the lower limit of the thickness of the plate body 911 can be about 12 mm; this thickness range can allow machining ( In the z direction), the first flow channel structure 912 and the second flow channel structure 913 are projected and overlapped with each other, and the structural strength of the plate body 911 can be maintained. In some embodiments, when the plate body (such as the plate body 911 ) is made of high-strength metal (such as high-strength aluminum alloy, high-strength copper alloy, stainless steel, titanium or titanium alloy), the lower limit of the thickness can be reduced to about 6mm.

因此,本公開的一方面提供了一種冷卻板,組配來承載待降溫物,包括:板體,其具有承載面,所述承載面具有兩側邊區域、及位於所述側邊區域之間的中央區域;第一流道結構,分佈在所述側邊區域,配置來輸送第一相態的流體,所述第一流道結構具有多個分佈在所述兩個側邊區域且開口形成於所述板體的所述承載面的噴口,所述噴口的設置位置避開所述中央區域;及第二流道結構,埋設於所述板體且對應所述中央區域,配置來輸送第二相態的流體;其中,在正交於所述側邊區域的方向上,所述板體的寬度小於所述待 降溫物的寬度。 Therefore, an aspect of the present disclosure provides a cooling plate assembled to support an object to be cooled, comprising: a plate body having a bearing surface, the bearing surface having two side regions and located between the side regions the central area of the radiator; the first flow channel structure, distributed in the side area, is configured to transport the fluid of the first phase, the first flow channel structure has a plurality of distribution in the two side areas and the opening is formed in the a spout on the bearing surface of the plate body, the spout is arranged to avoid the central area; and a second flow channel structure, embedded in the plate body and corresponding to the central area, configured to transport the second phase state fluid; wherein, in the direction orthogonal to the side region, the width of the plate body is smaller than the width of the to-be-to-be- The width of the cooling object.

在一些實施態樣中,所述板體具有:主板層,具有第一導熱材料,其中,所述第二流道結構被設在所述主板層中;上板層,設於所述主板層上,具有第二導熱材料;其中,所述第一導熱材料的導熱係數小於所述第二導熱材料的導熱係數。 In some embodiments, the board body has: a main board layer with a first thermally conductive material, wherein the second flow channel structure is provided in the main board layer; an upper board layer is provided on the main board layer There is a second thermally conductive material; wherein, the thermal conductivity of the first thermally conductive material is smaller than that of the second thermally conductive material.

在一些實施態樣中,所述主板層及所述上板層之間的厚度比大約在4到5之間。 In some embodiments, the thickness ratio between the main board layer and the upper board layer is about 4 to 5.

因此,本公開的一方面提供了一種冷卻系統,配置來冷卻待降溫物,所述冷卻系統包含:冷卻模組,包括用來承載所述待降溫物的冷卻板,所述冷卻板具有兩側邊區域、及位於所述側邊區域之間的中央區域;感測模組,組配來感測所述冷卻板所在環境的溫度及濕度狀態其中至少一者,並產生感測結果;及處理模組,訊號連接所述感測模組及所述冷卻模組,配置來根據來自所述感測模組的感測結果,獲得所述環境的露點溫度條件,並控制所述冷卻模組的溫度設定,使所述冷卻板的溫度狀態不高於所述環境的露點溫度,藉此使冷卻板凝露。 Accordingly, an aspect of the present disclosure provides a cooling system configured to cool an object to be cooled, the cooling system comprising: a cooling module including a cooling plate for carrying the object to be cooled, the cooling plate having two sides a side area, and a central area between the side areas; a sensing module, configured to sense at least one of the temperature and humidity of the environment where the cooling plate is located, and generate a sensing result; and processing a module, the signal is connected to the sensing module and the cooling module, and is configured to obtain the dew point temperature condition of the environment according to the sensing result from the sensing module, and to control the cooling module The temperature is set so that the temperature state of the cooling plate is not higher than the dew point temperature of the environment, thereby causing condensation of the cooling plate.

在一些實施態樣中,所述冷卻板還形成有流道結構;所述冷卻模組還包含流體供應系統,組配來提供流體至所述冷卻板的流道結構;所述處理模組還訊號連接所述流體供應系統,組配來根據所述感測結果控制所述流體供應系統的流體輸出。 In some embodiments, the cooling plate is further formed with a flow channel structure; the cooling module further includes a fluid supply system configured to provide fluid to the flow channel structure of the cooling plate; the processing module further includes The signal is connected to the fluid supply system and configured to control the fluid output of the fluid supply system according to the sensing result.

在一些實施態樣中,所述冷卻板形成有多個與所述流體供應系統流體連通且開口向上的噴口;所述噴口的位置避開冷卻板的中央區域;所述噴口被設置為當所述冷卻板承載所述待降溫物時,得以被所述待降溫物覆蓋;所述處理模組還配置來使所述流體供應系統在所述冷卻板接收所述待降溫件期間釋放流體至所述噴口。 In some embodiments, the cooling plate is formed with a plurality of nozzles in fluid communication with the fluid supply system and opening upward; the nozzles are located away from a central region of the cooling plate; the nozzles are positioned when all When the cooling plate carries the object to be cooled, it is covered by the object to be cooled; the processing module is further configured to make the fluid supply system release fluid to the cooling plate during the period when the cooling plate receives the object to be cooled the nozzle.

因此,本公開的一方面提供了一種製程系統,配置來對工件進行製程,包含製程站,包括入口端及出口端,組配來自該入口端接收所述工件,並由該出口端將所述工件移出該製程站;迴流設備,包括設置在該製程站外的迴流軌道,所述迴流軌道組配來使所述工件自所述出口端往所述入口端移動;及冷卻模組,設於所述迴流軌道且與外界環境流體連通。所述冷卻模組包括:冷卻板,具有組配來接觸所述工件的冷卻面,所述冷卻面定義有兩側邊區域、及位於所述側邊區域之間的中央區域;及液態介面生成模組,設於所述冷卻板,且組配來在所述冷卻面及所述工件之間生成液態介面。 Accordingly, one aspect of the present disclosure provides a processing system configured to process a workpiece, comprising a processing station including an inlet port and an outlet port, configured to receive the workpiece from the inlet port, and to process the workpiece by the outlet port The workpiece is moved out of the process station; the reflow device includes a recirculation track arranged outside the process station, the reflow track is assembled to make the workpiece move from the outlet end to the inlet end; and a cooling module, located in The return track is in fluid communication with the external environment. The cooling module includes: a cooling plate with a cooling surface configured to contact the workpiece, the cooling surface defines two side regions and a central region between the side regions; and a liquid interface generation The module is arranged on the cooling plate and assembled to generate a liquid interface between the cooling surface and the workpiece.

在一些實施態樣中,所述液態介面生成模組包含流體拘束模組,其組配來拘束位於所述冷卻面的流體。 In some implementations, the liquid interface generation module includes a fluid confinement module configured to constrain the fluid on the cooling surface.

在一些實施態樣中,所述流體拘束模組具有多個噴口,其開口朝上且分佈在所述冷卻板的外圍區域且避開所述中央區域而設置;及流體供應系統,組配來在所述冷卻板接收所述工件期間提供流體至所述噴口;其中,所述噴口被配置為當所述工件被所述冷卻板承載時,被所述工件覆蓋。 In some implementations, the fluid confinement module has a plurality of nozzles, the openings of which are upward and distributed in a peripheral area of the cooling plate and are disposed away from the central area; and a fluid supply system, assembled to Fluid is provided to the spout during receipt of the workpiece by the cooling plate; wherein the spout is configured to be covered by the workpiece when the workpiece is carried by the cooling plate.

在一些實施例中,所述系統還包含驅動機構,組配來驅動所述冷卻板的升降移動;其中,所述迴流軌道具有多個輸送輪,組配來輸送所述工件;其中,所述冷卻板形成有多個從其外緣向內凹陷的凹口;及其中,所述凹口投影地重疊於所述輸送輪。 In some embodiments, the system further includes a driving mechanism configured to drive the lifting and lowering movement of the cooling plate; wherein, the return track has a plurality of conveying wheels configured to convey the workpiece; wherein, the The cooling plate is formed with a plurality of notches recessed inward from its outer edge; and wherein the notches projectively overlap the conveying wheel.

惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。 However, the above are only examples of the present invention, and should not limit the scope of the present invention. All simple equivalent changes and modifications made according to the scope of the application for patent of the present invention and the contents of the patent specification are still within the scope of the present invention. within the scope of the invention patent.

100:製程系統 100: Process System

11:製程站 11: Process Station

111:真空腔體 111: Vacuum chamber

111a:緩衝區間 111a: between buffers

111b:鍍膜區間 111b: Coating interval

112:陰極濺鍍靶組合 112: Cathode sputtering target combination

112a:靶材 112a: Target

113:傳輸機構 113: Transmission Mechanism

114:入口閥門 114: Inlet valve

115:出口閥門 115: Outlet valve

116:載出腔 116: Load Out Cavity

117:載入腔 117: Load Cavity

118:預處理腔 118: Pretreatment cavity

12:迴流設備 12: Reflow equipment

121、122:升降裝置 121, 122: Lifting device

123:迴流軌道 123: Return Track

1231:沉降段 1231: Settlement Section

1232:攀升段 1232: Climbing segment

1233:中繼段 1233: hop

100a:冷卻系統 100a: Cooling system

100b、100c:冷卻系統 100b, 100c: Cooling system

14:準直式溫度計 14: Collimating Thermometer

x、y、z:方向 x, y, z: direction

C:載具 C: vehicle

Claims (3)

一種冷卻系統,配置來冷卻待降溫物,所述冷卻系統包含:冷卻模組,包括用來承載所述待降溫物的冷卻板,所述冷卻板包括:板體,其具有承載面,所述承載面具有中央區域及位於所述中央區域外側的外圍區域;第一流道結構,分佈在所述外圍區域,配置來輸送氣態的流體,所述第一流道結構具有多個分佈在所述外圍區域且開口形成在所述板體的所述承載面的噴口,所述噴口的設置位置避開所述中央區域;及第二流道結構,埋設於所述板體且對應所述中央區域,配置來輸送液態的流體以控制所述冷卻板的溫度,使所述冷卻板的溫度不高於所述冷卻板所在環境的露點溫度,藉此使所述冷卻板凝露;其中,所述冷卻系統更包含流體供應系統,其被配置為將所述氣態的流體以及所述液態的流體分別提供至所述冷卻板的所述第一流道結構以及第二流道結構,其中,所述流體供應系統更被配置為使所述氣態的流體在所述冷卻板接觸地承載所述待降溫物的期間經由所述噴口自所述承載面釋出,並控制所述氣態的流體的壓力,以在不使所述待降溫物氣浮的情況下,令形成於所述冷卻板上的露水的至少 一部分經由所述待降溫物與所述承載面之間的空隙向所述中央區域集中。 A cooling system configured to cool an object to be cooled, the cooling system comprising: a cooling module, including a cooling plate for carrying the object to be cooled, the cooling plate comprising: a plate body having a bearing surface, the The bearing surface has a central area and a peripheral area outside the central area; a first flow channel structure, distributed in the peripheral area, is configured to transport gaseous fluid, and the first flow channel structure has a plurality of flow channel structures distributed in the peripheral area and an opening is formed on a spout on the bearing surface of the plate body, and the setting position of the spout avoids the central area; and a second flow channel structure is embedded in the plate body and corresponding to the central area, and is arranged to deliver liquid fluid to control the temperature of the cooling plate, so that the temperature of the cooling plate is not higher than the dew point temperature of the environment where the cooling plate is located, thereby causing the cooling plate to condense; wherein, the cooling system It further includes a fluid supply system configured to supply the gaseous fluid and the liquid fluid to the first flow channel structure and the second flow channel structure of the cooling plate, respectively, wherein the fluid supply system It is further configured to allow the gaseous fluid to be released from the bearing surface through the nozzle during the period when the cooling plate is in contact with the object to be cooled, and to control the pressure of the gaseous fluid so as not to In the case of making the object to be cooled air float, make at least the dew formed on the cooling plate A part is concentrated to the central area through the gap between the object to be cooled and the bearing surface. 如請求項1所述的冷卻系統,其中,在正交於所述外圍區域的方向上,所述板體的寬度小於所述待降溫物的寬度。 The cooling system of claim 1, wherein, in a direction orthogonal to the peripheral region, the width of the plate body is smaller than the width of the object to be cooled. 如請求項1所述的冷卻系統,還包含:感測模組,訊號連接所述處理模組,所述感測模組被配置為感測所述環境的溫度狀態及濕度狀態其中至少一者,並產生感測結果;其中,所述處理模組更被配置為根據所述感測結果獲得所述環境的露點溫度條件,並根據所述露點溫度條件控制所述冷卻板的溫度設定。 The cooling system according to claim 1, further comprising: a sensing module connected to the processing module by a signal, the sensing module is configured to sense at least one of a temperature state and a humidity state of the environment , and generate a sensing result; wherein, the processing module is further configured to obtain the dew point temperature condition of the environment according to the sensing result, and control the temperature setting of the cooling plate according to the dew point temperature condition.
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